Test fixture and test system

Abstract

The invention discloses a test fixture and a test system. The test fixture comprises a base, a junction box, a test connection assembly and a supporting plate, the base comprises a shell, a first groove formed in the upper surface of the shell and a test connecting end arranged on the shell, and the test connecting end is used for being connected with test equipment; a first clamping terminal is arranged on the side wall of the first groove; the first clamping terminal is electrically connected with the test connecting end; a second clamping terminal corresponding to the first clamping terminal is arranged on the outer wall of the junction box; the junction box is embedded in the first groove, and the first clamping terminal is clamped with the second clamping terminal; the test connection assembly is arranged on the junction box and comprises a test ejector pin, and the test ejector pin is electrically connected with the second clamping terminal; the supporting plate is provided with a via hole, is arranged on the test connection assembly and is used for placing the PCB; the test ejector pin penetrates through the via hole and is electrically connected with a test bonding pad on the PCB, and the test equipment is used for testing the PCB. The technical scheme can reduce the test cost and improve the test efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of testing, and particularly relates to a testing fixture and a testing system. Background Art

[0002] At present, electric vehicles are increasingly recognized and chosen by people, and the technical requirements for electric vehicle charging piles are constantly increasing. When an electric vehicle charging pile leaves the factory, generally, an ex-factory test is carried out on the electric vehicle charging pile to ensure the reliability of the product.

[0003] With the continuous improvement of the intelligence of charging piles, the testing system of charging piles has not been updated, and the testing technology has not been innovated. However, the traditional ex-factory test of charging piles requires different testing fixtures to be formulated for different charging pile control boards, resulting in high testing costs and being inconvenient for efficiently testing different charging pile control boards. Summary of the Invention

[0004] Embodiments of the present invention provide a testing fixture and a testing system to solve the problem of relatively high testing costs for testing different charging pile control boards.

[0005] A testing fixture includes a base, a junction box, a test connection component, and a tray; The base includes a housing, a first groove provided on the upper surface of the housing, and a test connection end provided on the housing, and the test connection end is used for connecting a test device; a first clamping terminal is provided on the side wall of the first groove; the first clamping terminal is electrically connected to the test connection end; A second clamping terminal corresponding to the first clamping terminal is provided on the outer wall of the junction box; the junction box is embedded in the first groove, and the first clamping terminal is clamped with the second clamping terminal; The test connection component is provided on the junction box, and the test connection component includes a test ejector pin, and the test ejector pin is electrically connected to the second clamping terminal; The tray is provided with a through hole and is arranged on the test connection component for placing a PCB board; the test ejector pin passes through the through hole and is electrically connected to a test pad on the PCB board, and the test device is used for testing the PCB board.

[0006] Further, the testing fixture further includes a fixing component, and the fixing component is connected to the junction box and is used for fixing the PCB board on the tray.

[0007] Further, the fixing component includes a fixing bracket, a guide rod, a buckle fixing plate, and a buckle handle; the fixing bracket is arranged on the junction box; a guide groove is provided in the middle of the fixing bracket; the guide rod is slidably connected to the guide groove; the buckle fixing plate is connected to the guide rod; the buckle handle is connected to the guide rod and is used to drive the guide rod to slide relative to the guide groove so that the buckle fixing plate fixes the PCB board on the tray.

[0008] Further, the test connection component includes a thimble fixing plate and the test thimble; A thimble fixing platform is provided on the thimble fixing plate, and the test thimble is arranged on the thimble fixing platform.

[0009] A test system includes a test device and the above-mentioned test fixture; The test device is connected to the test connection end of the test fixture and is used to test the PCB board on the test fixture.

[0010] Further, the PCB board is a charging pile control board; the test device is used to perform vehicle charging tests and vehicle discharging tests on the PCB board.

[0011] Further, the test connection end includes a power connection end, a load connection end, and a first signal connection end; the power connection end is arranged on the first outer wall of the housing; the load connection end is arranged on the second outer wall of the housing; the first signal connection end is arranged on the third outer wall of the housing; The test device includes a main control device, an adjustable power supply, a load tester, and a multi-functional load; The output end of the adjustable power supply is connected to the power connection end or the load connection end, and the second signal connection end of the adjustable power supply is connected to the first signal connection end; The input end of the multi-functional load is connected to the load connection end or the power connection end, and the third signal connection end of the multi-functional load is connected to the first signal connection end; The load tester is connected to the load connection end and the first signal connection end, or the load tester is connected to the power connection end and the first signal connection end; The main control device is connected to the adjustable power supply, the load tester, and the multi-functional load.

[0012] Further, a charging gun seat, a plug, a socket, and a wire pressing terminal block are also provided on the upper surface of the housing; The first clamping terminal is electrically connected to the charging gun seat, the plug, the socket, and the wire pressing terminal block.

[0013] Further, the test device further includes a leakage switch; an output end of the adjustable power supply is connected to the power connection end or the load connection end through the leakage switch; the main control device is further connected to the leakage switch.

[0014] Further, the test system further includes a rotatable pan-tilt; the rotatable pan-tilt is used for placing the test fixture.

[0015] An embodiment of the present invention provides a test fixture and a test system. The test fixture includes a base, a junction box, a test connection component, and a support plate. The base includes a housing, a first groove provided on an upper surface of the housing, and a test connection end provided on the housing. The test connection end is used for connecting a test device. A first clamping terminal is provided on a side wall of the first groove; the first clamping terminal is electrically connected to the test connection end. A second clamping terminal corresponding to the first clamping terminal is provided on an outer wall of the junction box; the junction box is embedded in the first groove, and the first clamping terminal is clamped with the second clamping terminal. The test connection component is provided on the junction box. The test connection component includes a test thimble, and the test thimble is electrically connected to the second clamping terminal. The support plate is provided with a through hole and is arranged on the test connection component for placing a PCB board; the test thimble passes through the through hole and is electrically connected to a test pad on the PCB board. The test device is used for testing the PCB board. Thus, when replacing the PCB board for testing, only the layout of the test thimbles in the test connection component and the circuit connected to the test thimbles in the junction box need to be readjusted, and then the replaced PCB board can be retested, avoiding replacing the entire test fixture, thereby reducing the test cost and improving the test efficiency. Description of the Drawings

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following will briefly introduce the drawings required to be used in the description of the embodiments of the present invention. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0017] Figure 1 is a top view of a test fixture in an embodiment of the present invention; Figure 2 is a schematic diagram of a test fixture in an embodiment of the present invention; Figure 3 is another schematic diagram of a test fixture in an embodiment of the present invention; Figure 4 is a schematic diagram of a test system in an embodiment of the present invention; Figure 5 is another schematic diagram of a test system in an embodiment of the present invention.

[0018] In the figure: 1. Test fixture; 11. Base; 111. First clamping terminal; 112. Test connection end; 113. Charging gun seat; 114. Plug; 115. Socket; 116. Terminal block for wire pressing; 12. Junction box; 121. Second clamping terminal; 13. Test connection assembly; 131. Thimble fixing plate; 132. Test thimble; 14. Support plate; 15. Fixing assembly; 151. Fixing bracket; 152. Guide rod; 153. Clamping plate fixing plate; 2. Main control device; 3. Adjustable power supply; 4. Load tester; 5. Multifunctional load; 6. Leakage switch; 7. Rotatable cloud platform; 8. PCB board. Detailed implementation manners

[0019] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0020] It should be understood that the present invention can be implemented in different forms and should not be construed as limited to the embodiments presented herein. On the contrary, providing these embodiments will make the disclosure thorough and complete, and will fully convey the scope of the present invention to those skilled in the art. In the drawings, for clarity, the dimensions and relative dimensions of layers and regions may be exaggerated. The same reference numerals denote the same elements throughout the drawings.

[0021] It should be understood that when an element or layer is referred to as being "on", "adjacent to", "connected to" or "coupled to" another element or layer, it can be directly on, adjacent to, connected or coupled to the other element or layer, or there may be intervening elements or layers. In contrast, when an element is referred to as being "directly on", "directly adjacent to", "directly connected to" or "directly coupled to" another element or layer, there are no intervening elements or layers. It should be understood that although the terms first, second, third, etc. may be used to describe various elements, components, regions, layers and / or parts, these elements, components, regions, layers and / or parts should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or part from another element, component, region, layer or part. Therefore, without departing from the teachings of the present invention, the first element, component, region, layer or part discussed below may be denoted as the second element, component, region, layer or part.

[0022] Spatial relationship terms such as "under", "below", "beneath", "underneath", "above", "upper", etc. may be used herein for convenience of description to describe the relationship of one element or feature shown in the figures with other elements or features. It should be understood that, in addition to the orientation shown in the figures, spatial relationship terms are also intended to include different orientations of the device in use and operation. For example, if the device in the figures is flipped, then an element or feature described as "under other elements" or "beneath them" or "underneath them" will be oriented "above" the other elements or features. Thus, the exemplary terms "under" and "beneath" can include both an upper and a lower orientation. The device may be otherwise oriented (rotated 90 degrees or other orientations) and the spatial descriptors used herein are to be interpreted accordingly.

[0023] The purpose of the terms used herein is only to describe specific embodiments and not to limit the present invention. As used herein, the singular forms "a", "an" and "the" are also intended to include the plural forms unless the context clearly dictates otherwise. It should also be understood that the terms "comprising" and / or "including", when used in this specification, specify the presence of the features, integers, steps, operations, elements and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or groups. As used herein, the term "and / or" includes any and all combinations of the related listed items.

[0024] To fully understand the present invention, detailed structures and steps will be set forth in the following description to illustrate the technical solutions proposed by the present invention. The preferred embodiments of the present invention are described in detail below. However, in addition to these detailed descriptions, the present invention may have other embodiments.

[0025] This embodiment provides a test fixture 1, as Figures 1 to 3 shown, including a base 11, a junction box 12, a test connection assembly 13 and a pallet 14; the base 11 includes a housing, a first groove provided on the upper surface of the housing, and a test connection end 112 provided on the housing, the test connection end 112 being used to connect a test device; a first clamping terminal 111 is provided on the side wall of the first groove; the first clamping terminal 111 is electrically connected to the test connection end 112; a second clamping terminal 121 corresponding to the first clamping terminal 111 is provided on the outer wall of the junction box 12; the junction box 12 is embedded in the first groove, and the first clamping terminal 111 is clamped with the second clamping terminal 121; the test connection assembly 13 is provided on the junction box 12, the test connection assembly 13 includes a test ejector pin 132, and the test ejector pin 132 is electrically connected to the second clamping terminal 121; the pallet 14 is provided with a through hole and is provided on the test connection assembly 13 for placing a PCB board 8; the test ejector pin 132 passes through the through hole and is electrically connected to the test pads on the PCB board 8, and the test device is used to test the PCB board 8.

[0026] Among them, the PCB board 8 is the charging pile control board in the charging pile. Exemplarily, the testing device is used to perform vehicle charging tests and vehicle discharging tests on the PCB board 8.

[0027] It can be understood that the quantity and positions of the first card slot terminal 111, the second card slot terminal 121, and the test connection end 112 can be determined according to the actually tested PCB board 8, and no limitation is imposed herein.

[0028] As an example, the test connection end 112 is connected to the testing device by means of an adapter plug 114, so as to facilitate replacement according to the test requirements.

[0029] As an example, the PCB board 8 can be fixed on the pallet 14 by an additional fixing component 15, or the PCB can be fixed on the pallet 14 by the fixing structure on the pallet 14. The fixing structure can be a limiting structure or a snap structure. To ensure the accuracy and reliability of the test results.

[0030] As an example, when testing the PCB board 8, the PCB board 8 is arranged on the pallet 14, and it is ensured that the test pads on the PCB board 8 are electrically connected to the test thimbles 132, so that the test pads are electrically connected to the testing device through the test thimbles 132, the circuits in the junction box 12, the second card slot terminal 121, the first card slot terminal 111, and the test connection end 112, so that the testing device can test the PCB. When it is necessary to replace the PCB board 8 for testing, only the pallet 14, the test connection assembly 13, and the junction box 12 need to be removed in sequence, and the layout of the test thimbles 132 in the test connection assembly 13 and the circuits connected to the test thimbles 132 in the junction box 12 are readjusted, then the replaced PCB board 8 can be tested again, avoiding replacing the entire test fixture 1, thereby reducing the test cost and improving the test efficiency.

[0031] Furthermore, the test fixture 1 further includes a junction box fixing structure; the junction box fixing structure is connected to the base 11 and the junction box 12, and is used to fix the junction box 12 in the first groove when the junction box 12 is inserted into the first groove. Exemplarily, the junction box fixing structure includes a snap structure; the snap structure includes a snap and a limiting member; one of the snap and the limiting member is arranged on the base 11, and the other is arranged on the junction box 12, and the snap cooperates or disengages from the limiting member. Optionally, the quantity of the snap structure can be selected according to actual requirements, and no limitation is imposed herein.

[0032] In this embodiment, the test fixture 1 includes a base 11, a junction box 12, a test connection assembly 13, and a pallet 14; the base 11 includes a housing, a first groove provided on the upper surface of the housing, and a test connection end 112 provided on the housing, and the test connection end 112 is used to connect to a test device; a first clamping terminal 111 is provided on the side wall of the first groove; the first clamping terminal 111 is electrically connected to the test connection end 112; a second clamping terminal 121 corresponding to the first clamping terminal 111 is provided on the outer wall of the junction box 12; the junction box 12 is embedded in the first groove, and the first clamping terminal 111 is clamped with the second clamping terminal 121; the test connection assembly 13 is provided on the junction box 12, and the test connection assembly 13 includes a test thimble 132, and the test thimble 132 is electrically connected to the second clamping terminal 121; the pallet 14 is provided with a through hole, is provided on the test connection assembly 13, and is used to place the PCB board 8; the test thimble 132 passes through the through hole and is electrically connected to the test pads on the PCB board 8, and the test device is used to test the PCB board 8. Therefore, when replacing the PCB board 8 for testing, only the layout of the test thimbles 132 in the test connection assembly 13 and the circuit connected to the test thimbles 132 in the junction box 12 need to be readjusted, and then the replaced PCB board 8 can be retested, avoiding replacing the entire test fixture 1, thereby reducing the test cost and improving the test efficiency.

[0033] In one embodiment, the test fixture 1 further includes a fixing component 15, and the fixing component 15 is connected to the test box and is used to fix the PCB board 8 on the pallet 14.

[0034] In this embodiment, the fixing component 15 is connected to the test box and is used to fix the PCB board 8 on the pallet 14, so as to fix the PCB board 8 on the pallet 14 when testing the PCB board 8, ensuring the stability and reliability during the test process and improving the accuracy of the test results.

[0035] In one embodiment, the fixing component 15 includes a fixing bracket 151, a guide rod 152, a buckle fixing plate 153, and a buckle handle; the fixing bracket 151 is provided on the test box; a guide groove is provided in the middle of the fixing bracket 151; the guide rod 152 is slidably connected to the guide groove; the buckle fixing plate 153 is connected to the guide rod 152; the buckle handle is connected to the guide rod 152 and is used to drive the guide rod 152 to slide relative to the guide groove, so that the buckle fixing plate 153 fixes the PCB board 8 on the pallet 14.

[0036] As an example, the fixing bracket 151 is fixedly provided on the test box, and the user adjusts the relative sliding of the guide rod 152 and the guide groove through the buckle handle, so that the guide rod 152 drives the buckle fixing plate 153 to fix the PCB board 8 on the pallet 14, or loosens the PCB board 8 to replace different PCB boards 8 for testing.

[0037] As an example, a buckle projection is provided on the side of the buckle fixing plate 153 facing the PCB board 8. When the buckle fixing plate 153 fixes the PCB board 8 on the pallet 14, the buckle projection abuts against the PCB board 8. Exemplarily, the number and position of the buckle projections can be set according to actual requirements. The buckle fixing plate 153 is detachably connected to the guide rod 152 to facilitate the replacement of different buckle fixing plates 153 to adapt to different PCB boards 8.

[0038] In this embodiment, it is arranged on the test box through the fixing bracket 151; a guide groove is provided in the middle of the fixing bracket 151; the guide rod 152 is slidably connected to the guide groove; the buckle fixing plate 153 is connected to the guide rod 152; the buckle handle is connected to the guide rod 152 and is used to drive the guide rod 152 to slide relative to the guide groove so that the buckle fixing plate 153 fixes the PCB board 8 on the pallet 14, with a simple structure and ensuring the stability and reliability of the PCB board 8 during the test process.

[0039] In one embodiment, the test connection component 13 includes a thimble fixing plate 131 and test thimbles 132; a thimble fixing platform is provided on the thimble fixing plate 131, and the test thimbles 132 are arranged on the thimble fixing platform.

[0040] As an example, one side of the thimble fixing plate 131 is arranged on the junction box 12, and a thimble fixing platform is provided on the other side. The number, position, and height of the thimble fixing platform can be set according to actual requirements for fixing the test thimbles 132. The test thimbles 132 pass through the thimble fixing platform and are electrically connected to the circuits in the junction box 12, thereby realizing the transmission of electrical signals.

[0041] In this embodiment, the test connection component 13 includes a thimble fixing plate 131 and test thimbles 132; a thimble fixing platform is provided on the thimble fixing plate 131, and the test thimbles 132 are arranged on the thimble fixing platform to fix the test thimbles 132 through the thimble fixing platform and ensure the more stability of the test thimbles 132 during the test process.

[0042] This embodiment provides a test system, as Figure 4 shown, including a test device and the above-mentioned test fixture 1; the test device is connected to the test connection end 112 of the test fixture 1 and is used to test the PCB board 8 on the test fixture 1.

[0043] In one embodiment, the PCB board 8 is a charging pile control board; the test device is used to perform vehicle charging tests and vehicle discharging tests on the PCB board 8.

[0044] In the related art, the vehicle charging test and vehicle discharging test of the charging pile control board only perform metering tests on pure resistive loads and a single detection port. In this embodiment, the vehicle charging test and vehicle discharging test include multi-gear adjustment of the power supply input to the charging pile control board, as well as multi-load cycle tests with resistive, inductive, and capacitive load switching, so as to avoid potential safety hazards caused by missing detection of a single output port of the charging pile control board.

[0045] In one embodiment, the test connection end 112 includes a power connection end, a load connection end, and a first signal connection end; the power connection end is arranged on the first outer wall of the housing; the load connection end is arranged on the second outer wall of the housing; the first signal connection end is arranged on the third outer wall of the housing; the test equipment includes a main control device 2, an adjustable power supply 3, a load tester 4, and a multi-functional load 5; the output end of the adjustable power supply 3 is connected to the power connection end or the load connection end, and the second signal connection end of the adjustable power supply 3 is connected to the first signal connection end; the input end of the multi-functional load 5 is connected to the load connection end or the power connection end, and the third signal connection end of the multi-functional load 5 is connected to the first signal connection end; the load tester 4 is connected to the load connection end and the first signal connection end, or the load tester 4 is connected to the power connection end and the first signal connection end; the main control device 2 is connected to the adjustable power supply 3, the load tester 4, and the multi-functional load 5.

[0046] Among them, the first signal connection end, the second signal connection end, and the third signal connection end are used to test the CC signal and the CP signal.

[0047] As an example, when performing the vehicle charging test, the adjustable power supply 3 serves as an external power supply, and the multi-functional load 5 serves as a vehicle to implement the vehicle charging test of the PCB board 8. When performing the vehicle discharging test, the adjustable power supply 3 discharges as a vehicle, and the multi-functional load 5 serves as an electrical load to implement the vehicle discharging test of the PCB.

[0048] As an example, the PCB board 8 is fixed by the test fixture 1 and electrically connected to the main control device 2, the adjustable power supply 3, the load tester 4, and the multi-functional load 5. The user can configure the operating parameters of the adjustable power supply 3, the load tester 4, and the multi-functional load 5 through the main control device 2. Then, the main control device 2 receives information such as voltage, current, frequency, leakage value, ground continuity, and CP value feedback from the adjustable power supply 3, the load tester 4, the test fixture 1, and the multi-functional load 5, and performs test analysis. Exemplarily, the main control device 2 comprehensively judges normality and abnormality based on the information feedback from the adjustable power supply 3, the load tester 4, and the multi-functional load 5. If all the information is normal, all the test data of the PCB board 8 are stored and the unique SN code of the PCB board 8 is written into the Flash of the PCB board 8; if there is an abnormality in the information, an alarm prompt is given on the display interface of the main control device 2; further, the abnormal item can be tested step by step until the test data is normal; further, if the abnormal item is eliminated, the test process needs to be completed from the beginning to ensure that all the test items are normal at one time.

[0049] Exemplarily, the operating state of the multi-functional load 5 can be adjusted. For example, the multi-functional load 5 is adjusted to resistive and half-load output, the multi-functional load 5 is adjusted to resistive and full-load output, the multi-functional load 5 is adjusted to resistive and 1.25 times load output, the multi-functional load 5 is adjusted to capacitive and full-load output, the multi-functional load 5 is adjusted to inductive and full-load output, etc., so as to more perfectly improve the test conditions and adapt to different test environments.

[0050] Exemplarily, leakage voltage and current are injected through the adjustable power supply 3; for example, the adjustable power supply 3 is controlled to adjust the standard leakage voltage and current value injected according to the type B leakage standard; the adjustable power supply 3 is controlled to adjust 85% of the standard leakage voltage and current value injected according to the type B leakage standard; the adjustable power supply 3 is controlled to adjust 115% of the standard leakage voltage and current value injected according to the type B leakage standard, so as to test the performance of the PCB board 8 under different leakage conditions.

[0051] In this embodiment, the test equipment includes a main control device 2, an adjustable power supply 3, a load tester 4, and a multi-functional load 5; the output end of the adjustable power supply 3 is connected to the power connection end or the load connection end, and the second signal connection end of the adjustable power supply 3 is connected to the first signal connection end; the input end of the multi-functional load 5 is connected to the load connection end or the power connection end, and the third signal connection end of the multi-functional load 5 is connected to the first signal connection end; the load tester 4 is connected to the load connection end and the first signal connection end, or the load tester 4 is connected to the power connection end and the first signal connection end; the main control device 2 is connected to the adjustable power supply 3, the load tester 4, and the multi-functional load 5, so as to be able to perform multi-gear adjustment on the power input to the charging pile control board, and perform multi-load cycle tests for resistive, inductive, and capacitive load switching, so as to avoid potential safety hazards caused by missing detection of a single output port of the charging pile control board.

[0052] In one embodiment, a charging gun holder 113, a plug 114, a socket 115 and a wire pressing terminal block 116 are further provided on the upper surface of the housing; the first clamping terminal 111 is electrically connected to the charging gun holder 113, the plug 114, the socket 115 and the wire pressing terminal block 116.

[0053] As an example, the test device can not only be electrically connected to the PCB board 8 through the test connection end 112, but also be electrically connected to the PCB board 8 through the charging gun holder 113, the plug 114, the socket 115 and the wire pressing terminal block 116 provided on the upper surface of the housing, improving the flexibility of electrical connection.

[0054] Exemplarily, a first charging gun holder 113, a second charging gun holder 113, a plug 114, a socket 115, a first wire pressing terminal block 116 and a second wire pressing terminal block 116 are provided on the upper surface of the housing. The first charging gun holder 113, the first wire pressing terminal block 116 and the plug 114 are sequentially arranged on one side of the first groove, and the second charging gun holder 113, the second wire pressing terminal block 116 and the socket 115 are arranged on the other side of the first groove. The first charging gun holder 113 and the socket 115 are used in combination, the plug 114 and the second charging gun holder 113 are used in combination, and the first wire pressing terminal block 116 and the second wire pressing terminal block 116 are used in combination.

[0055] In one embodiment, the test device further includes a leakage switch 6; the output end of the adjustable power supply 3 is connected to the power connection end or the load connection end through the leakage switch 6; the main control device 2 is also connected to the leakage switch 6. In this embodiment, the output end of the adjustable power supply 3 is connected to the power connection end or the load connection end through the leakage switch 6; the main control device 2 is also connected to the leakage switch 6, so that the main control device 2 can also perform a leakage test on the PCB board 8. Exemplarily, the leakage switch 6 can be a type A leakage switch 6 with a leakage parameter of 30 mA. During the test, it can be observed manually whether the leakage switch 6 trips automatically as a judgment on whether the system leakage parameter and the CCID parameter are normal.

[0056] In one embodiment, as Figure 5 shown, the test system further includes a rotatable cloud platform 7; the rotatable cloud platform 7 is used to place the test fixture 1. In this embodiment, when the vehicle charging test is adjusted to the vehicle discharging test, the rotatable cloud platform 7 can be rotated 180 degrees to adjust the relative positions of the first outer wall, the second outer wall and the third outer wall of the base 11 housing relative to the adjustable power supply 3, the load tester 4 and the multi-functional load 5, so as to adjust the relative positions of the power connection end, the load connection end and the first signal connection end, facilitating the interface wiring when the vehicle charging test is adjusted to the vehicle discharging test.

[0057] The above-described embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention, and should all be included within the protection scope of the present invention.

Claims

1. A test fixture, characterized in that, It includes a base, a junction box, a test connection component and a pallet; The base includes a housing, a first groove provided on the upper surface of the housing, and a test connection end provided on the housing, and the test connection end is used to connect a test device; a first clamping terminal is provided on the side wall of the first groove; the first clamping terminal is electrically connected to the test connection end; A second clamping terminal corresponding to the first clamping terminal is provided on the outer wall of the junction box; the junction box is embedded in the first groove, and the first clamping terminal is clamped with the second clamping terminal; The test connection component is provided on the junction box, and the test connection component includes a test thimble, and the test thimble is electrically connected to the second clamping terminal; The pallet is provided with a through hole, is provided on the test connection component, and is used to place a PCB board; the test thimble passes through the through hole and is electrically connected to the test pads on the PCB board, and the test device is used to test the PCB board.

2. The test fixture according to claim 1, characterized in that, The test fixture further includes a fixing component, and the fixing component is connected to the junction box and is used to fix the PCB board on the pallet.

3. The test fixture according to claim 2, characterized in that The fixing component includes a fixing bracket, a guide rod, a buckle fixing plate and a buckle handle; the fixing bracket is provided on the junction box; a guide groove is provided in the middle of the fixing bracket; the guide rod is slidably connected to the guide groove; the buckle fixing plate is connected to the guide rod; the buckle handle is connected to the guide rod and is used to drive the guide rod to slide relative to the guide groove so that the buckle fixing plate fixes the PCB board on the pallet.

4. The test fixture according to claim 1, wherein The test connection component includes a thimble fixing plate and the test thimble; A thimble fixing platform is provided on the thimble fixing plate, and the test thimble is provided on the thimble fixing platform.

5. A test system, characterized in that, It includes a test device and the test fixture according to any one of claims 1 to 4; The test device is connected to the test connection end of the test fixture and is used to test the PCB board on the test fixture.

6. The test system according to claim 5, characterized in that, The PCB board is a charging pile control board; the test device is used to perform vehicle charging tests and vehicle discharging tests on the PCB board.

7. The test system according to claim 6, wherein, The test connection end includes a power connection end, a load connection end and a first signal connection end; the power connection end is provided on the first outer wall of the housing; the load connection end is provided on the second outer wall of the housing; the first signal connection end is provided on the third outer wall of the housing; The test device includes a main control device, an adjustable power supply, a load tester and a multi-functional load; The output end of the adjustable power supply is connected to the power connection end or the load connection end, and the second signal connection end of the adjustable power supply is connected to the first signal connection end; The input end of the multi-functional load is connected to the load connection end or the power connection end, and the third signal connection end of the multi-functional load is connected to the first signal connection end; The load tester is connected to the load connection end and the first signal connection end, or the load tester is connected to the power connection end and the first signal connection end; The main control device is connected to the adjustable power supply, the load tester, and the multi-functional load.

8. The test system according to claim 6, wherein A charging gun holder, a plug, a socket, and a wire pressing terminal block are further provided on the upper surface of the housing; The first clamping terminal is electrically connected to the charging gun holder, the plug, the socket, and the wire pressing terminal block.

9. The test system according to claim 7, characterized in that, The test device further includes a leakage switch; the output end of the adjustable power supply is connected to the power connection end or the load connection end through the leakage switch; the main control device is also connected to the leakage switch.

10. The test system according to claim 7, wherein The test system further includes a rotatable cloud platform; the rotatable cloud platform is used for placing the test fixture.

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