Device, system and method for dynamic measurement of ablated particles based on wide-spectrum X-rays

Abstract

The invention discloses a device, a system and a method for dynamic measurement of ablated particles based on wide-spectrum X-rays, and solves the problem that in the prior art, X-ray imaging equipment cannot meet the ultrafast imaging requirement in a complex environment, the device utilizes a wide-spectrum and high-repetition-frequency ultrafast X-ray modulation emission source capable of generating ps pulse X-rays, and the X-ray imaging equipment can generate the ps pulse X-rays. According to the device and the method, continuous acquisition of particle dynamic information, rapid imaging of particles in a plasma sheath, analysis of distribution and motion characteristics of time-domain ablated particles and feature extraction of plasma transient dynamics are realized through a high-resolution X-ray photon imaging detector and a high-resolution X-ray photon imaging detector. The identification capability of the ablation plasma is improved, and a guarantee means for establishing, inspecting and evaluating an ablation particle spatio-temporal distribution evolution model is formed.

Description

Technical Field

[0001] The present invention relates to a particle dynamics measurement device and method, and in particular to a broad-spectrum X-ray-based ablation particle dynamics measurement device, system and method. Background Art

[0002] Under extreme conditions, such as during aircraft re-entry, ultrafast laser ablation of solid surfaces, explosive detonations, or high-speed impacts, the generation and evolution of ablated particles is a complex process involving high temperatures, high pressures, intense light, and dramatic thermodynamic changes. For example, ultrafast laser manufacturing technology has already played a significant role in laser processing and surface modification. This process involves the interaction of ultrafast lasers with surfaces, generating ablated particles that are then used as a localized micro-additive process to deposit layered surface structures. Due to the intense light and heat associated with this process, conventional visible light imaging methods struggle to record and analyze this process at high speed. Despite improvements in visible light imaging technology using powerful illumination equipment, semi-silvered mirrors, simultaneous impact and critical calibration techniques, and other equipment, it still cannot provide the required information in strong light, smoke, and complex environments. Currently, efficient methods for detecting ablated particles are lacking. The development of a measurement system for ablated particles in complex environments is crucial. By imaging ablated particles, models of their spatiotemporal distribution and evolution can be established and evaluated. The introduction of X-ray imaging technology, leveraging its strong penetrating power and robust interference immunity, enables clear imaging in harsh environments.

[0003] Traditional X-ray imaging techniques can be divided into transmission imaging and scattering imaging. Both methods use a DC X-ray source and image the target by adding a "shutter" to the detector. The single-shot imaging time is highly dependent on detector performance and is typically on the order of milliseconds.

[0004] Although flash X-ray radiography can achieve single-shot ultrafast imaging, due to limitations in its discharge mechanism, the emitted X-ray energy of flash X-ray sources is limited to above 150 keV, and the output pulse width and repetition rate are random, resulting in poor temporal characteristics. Therefore, existing X-ray imaging equipment cannot meet the requirements of ultrafast imaging in complex environments. To achieve particle imaging with timescales superior to microseconds (including but not limited to plasma ablation particles), a modulated X-ray emission source with pulse widths below microseconds and high temporal precision is required. Summary of the Invention

[0005] In order to solve the technical problem in the prior art that although flash X-ray radiography can achieve single-shot ultrafast imaging, due to the limitations of its discharge mechanism, the output X-ray energy of the flash X-ray source is above 150keV, and the output pulse width and repetition frequency are random, with poor time characteristics, resulting in the X-ray imaging equipment being unable to meet the ultrafast imaging requirements in complex environments, the present invention provides a device, system and method for measuring the particle dynamics of ablated particles based on wide-spectrum X-rays.

[0006] The inventive concept of the present invention:

[0007] Utilizing a broad-spectrum, high-repetition-rate ultrafast X-ray modulated emission source capable of producing ps pulsed X-rays, along with a high-resolution X-ray photon imaging detector, we can continuously acquire particle dynamics information, rapidly image particles within the plasma sheath, analyze the distribution and motion characteristics of ablated particles in the time domain, and extract features of the plasma's transient dynamics. This will enhance the ability to identify ablative plasmas and provide a means to establish, test, and evaluate models for the spatiotemporal distribution and evolution of ablated particles.

[0008] In order to achieve the above objectives and complete the above invention concept, the present invention adopts the following technical solutions:

[0009] A device for measuring particle dynamics of ablated particles based on wide spectrum X-rays, which is special in that it includes a high voltage power supply, an X-ray source, a first single photon imaging detector, a time resolution gating module, an image recognition module, and a data analysis and processing module;

[0010] The high-voltage power supply is connected to the X-ray source and is used to provide voltages of different magnitudes to the X-ray source;

[0011] The light emitting end of the X-ray source is directed toward the ablation particle cloud to be measured, and its signal output end is connected to the input end of the time resolution gating module, and is used to emit pulsed light of different energies toward the ablation particle cloud to be measured under the action of different voltages, and at the same time send a start signal to the time resolution gating module;

[0012] The output end of the time resolution gating module is connected to the signal input end of the first single-photon imaging detector, and is used to perform time domain control on the first single-photon imaging detector when receiving the start signal, so that the first single-photon imaging detector performs detection within a single pulse time;

[0013] The detection surface of the first single-photon imaging detector corresponds to the emission end of the X-ray source, and is used to detect a single pulse of light that passes through the cloud of ablated particles to be detected, obtain a corresponding optical signal, and convert the optical signal into an electrical signal;

[0014] The input end of the image recognition module is connected to the signal output end of the first single-photon imaging detector, and is used to receive the electrical signal and convert it into a corresponding single-pulse image;

[0015] The input end of the data analysis and processing module is connected to the output end of the image recognition module, and is used to receive the single pulse image and analyze and process it to obtain particle dynamics information of the ablation particle cloud to be measured.

[0016] Furthermore, it also includes a voltage modulation module;

[0017] The input end of the voltage modulation module is connected to the output end of the data analysis and processing module, and the output end is connected to the input end of the high-voltage power supply. It is used to modulate the high-voltage power supply to output a voltage different from the previous size according to the acquired particle dynamics information, so that the X-ray source outputs a single pulse light with an energy size different from the previous one.

[0018] Furthermore, it also includes a spectrometer, a second single-photon imaging detector and an anode target;

[0019] The beam splitter is arranged outside the light output end of the X-ray source, and is used to split the pulse light emitted by the X-ray source into two paths, forming a first beam split and a second beam split; the detection end of the first single-photon imaging detector corresponds to the first beam split;

[0020] The anode target is arranged between the spectrometer and the cloud of ablated particles to be measured, and is located on the optical path of the second split light, and is used to adjust the energy of the second split light;

[0021] The detection end of the second single-photon imaging detector corresponds to the anode target, its signal input end is connected to the output end of the time resolution gating module, and its signal output end is connected to the input end of the image recognition module. It is used to detect the second spectroscopic light after energy adjustment and scattering by the cloud of ablated particles to be measured, obtain the corresponding light signal, and convert the light signal into an electrical signal.

[0022] Furthermore, it also includes a focusing lens assembly;

[0023] The focusing lens group is arranged at the light emitting end of the X-ray source and is used for collimating and focusing the single pulse light emitted therefrom.

[0024] Furthermore, the X-ray source is a cold cathode X-ray source, a photocathode X-ray source or a flash X-ray source.

[0025] A broad spectrum X-ray based ablation particle dynamics measurement system, which is special in that: it comprises N broad spectrum X-ray based ablation particle dynamics measurement devices as described above; N ≥ 3;

[0026] N ablation particle dynamics measurement devices based on wide spectrum X-rays are arranged at different positions of the ablation particle cloud to be measured, for obtaining particle dynamics information at different positions of the ablation particle cloud to be measured;

[0027] The data analysis and processing modules in each wide-spectrum X-ray-based ablation particle dynamics measurement device are interconnected to perform three-dimensional reconstruction on N groups of particle dynamics information to obtain distribution information of the ablation particle cloud to be measured in three-dimensional space.

[0028] A method for measuring particle dynamics of ablated particles based on wide-spectrum X-rays, using the above-mentioned device for measuring particle dynamics of ablated particles based on wide-spectrum X-rays, is characterized in that it includes the following steps:

[0029] Step 1: Start the high-voltage power supply, which provides voltage to the X-ray source;

[0030] Step 2: emitting pulsed light to the ablation particle cloud to be measured through an X-ray source, and simultaneously sending a start signal to the time resolution gating module;

[0031] Step 3: When the time resolution gating module receives the start signal, it performs time domain control on the first single-photon imaging detector so that the first single-photon imaging detector detects the pulse light passing through the ablation particle cloud to be measured within a single pulse time, obtains a corresponding optical signal, and converts the optical signal into a corresponding electrical signal.

[0032] Step 4: The image recognition module receives the electrical signal and converts it into a corresponding single pulse image;

[0033] Step 5: The data analysis and processing module receives the single pulse image and analyzes and processes it to obtain particle dynamics information of the ablation particle cloud to be measured.

[0034] Furthermore, it also includes:

[0035] Step 6: The voltage modulation module modulates the high-voltage power supply to output a voltage different from the previous voltage based on the acquired particle dynamics information, so that the X-ray source outputs pulsed light with a different energy level than the previous voltage. At the same time, a start signal is sent to the time resolution gating module. Steps 3 to 5 are then repeated to obtain particle dynamics information of different sizes in the ablation particle cloud to be measured.

[0036] Step 7: Repeat step 6 until all particle dynamics information of the ablation particle cloud to be measured is obtained.

[0037] Furthermore, step 2 specifically includes emitting pulsed light to the ablation particle cloud to be measured through an X-ray source, and simultaneously sending a start signal to the time resolution gating module; the pulsed light is divided into a first split light and a second split light by a beam splitter, and the energy of the second split light is adjusted by the anode target;

[0038] Specifically, step 3 includes: when the time resolution gating module receives the start signal, performing time domain control on the first single-photon imaging detector and the second single-photon imaging detector respectively, so that the first single-photon imaging detector detects the first split light that passes through the ablation particle cloud to be measured within a single pulse time, obtains a corresponding light signal, and converts the light signal into a corresponding electrical signal; and the second single-photon imaging detector detects the second split light that is energy-adjusted and scattered by the ablation particle cloud to be measured within a single pulse time, obtains a corresponding light signal, and converts the light signal into a corresponding electrical signal;

[0039] Specifically, step 4 includes: the image recognition module receiving the electrical signals outputted by the first single-photon imaging detector and the second single-photon imaging detector respectively and converting them into corresponding single-pulse images.

[0040] Furthermore, in step 5:

[0041] The particle dynamics information includes the size, density, material, position distribution, velocity, mass and momentum of the particles.

[0042] Beneficial effects of the present invention:

[0043] 1. The present invention provides an ablation particle dynamics measurement device, system, and method based on wide-spectrum X-rays. A time-resolution gating module is set for the first single-photon imaging detector. The X-ray source sends a start signal to the time-resolution gating module. When the time-resolution gating module receives the start signal, it controls the first single-photon imaging detector to operate within a single pulse time to obtain a single-pulse image, thereby reducing the interference of background noise, optimizing the single-shot imaging effect, and enabling it to adapt to more complex environments.

[0044] 2. The present invention provides an ablation particle dynamics measurement device, system and method based on wide-spectrum X-rays, which is equipped with a voltage modulation module for the X-ray source. The voltage modulation module can accurately control the voltage output by the high-voltage power supply, and then accurately control the X-ray source to emit pulsed light of different energies to obtain the particle dynamics information of particles of different sizes in the ablation particle cloud to be measured, and can fully obtain all the information of the ablation particle cloud to be measured.

[0045] 3. The present invention provides an ablation particle dynamics measurement device, system and method based on wide-spectrum X-rays. Its first single-photon imaging detector adopts a cold cathode X-ray source, a photocathode X-ray source or a flash X-ray source, which can capture transient images and has a microsecond time resolution, thereby improving the measurement accuracy of ablation particle dynamics.

[0046] 4. The wide-spectrum X-ray-based ablation particle dynamics measurement device, system and method provided by the present invention are also equipped with a spectrometer, a second single-photon imaging detector and an anode target, which can simultaneously measure the metal particles and non-metallic particles in the ablation particle cloud to be measured, making the measurement results more comprehensive.

[0047] 5. The ablation particle dynamics measurement system based on wide-spectrum X-rays provided by the present invention can measure different orientations of the ablation particle cloud to be measured, obtain two-dimensional images of the ablation particle cloud to be measured at different angles, and then perform three-dimensional reconstruction to obtain information on the distribution of ablation particles in three-dimensional space. It can completely reconstruct the three-dimensional structure of ablation, provide comprehensive three-dimensional information, overcome the limitations of single-angle imaging, and improve measurement quality and efficiency.

[0048] 6. The wide-spectrum X-ray-based ablation particle dynamics measurement system provided by this invention, through the rational arrangement of multiple wide-spectrum X-ray-based ablation particle dynamics measurement devices, can cover a large imaging area, enabling the monitoring and precise location of ablation particles over a wide range. For specific key areas, the system can perform detailed scanning, achieving high-resolution, fine imaging, capturing more details and accurately obtaining more dynamic information. Its application will significantly enhance the ability to identify ablation particles in complex environments and provide important support for the establishment and evaluation of ablation particle spatiotemporal distribution evolution models. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] Figure 1 This is a schematic structural diagram of a first embodiment of a broad spectrum X-ray based ablation particle dynamics measurement device according to the present invention;

[0050] Figure 2 This is a diagram of the projection imaging principle in Example 1 of the present invention, where A represents the X-ray source, B represents a particle in the cloud of ablated particles to be measured (with a radius of R1), C represents the projection of the particle on the first single-photon imaging detector (with a radius of R2), d1 is the distance between the X-ray source exit end face and the particle, and d2 is the distance between the particle and the detection surface of the first single-photon imaging detector.

[0051] Figure 3 This is a schematic structural diagram of a second embodiment of a broad spectrum X-ray based ablation particle dynamics measurement device according to the present invention;

[0052] Figure 4 It is a structural schematic diagram of an embodiment of an ablation particle dynamics measurement system based on wide spectrum X-rays of the present invention. DETAILED DESCRIPTION

[0053] The following will clearly and completely describe the technical solutions of the present invention in conjunction with the accompanying drawings and embodiments. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0054] Example 1:

[0055] A device for measuring the dynamics of ablation particles based on wide spectrum X-rays, such as Figure 1 As shown, it includes a high-voltage power supply, an X-ray source, a first single-photon imaging detector, a time resolution gating module, an image recognition module, a data analysis and processing module, a voltage modulation module and a focusing lens group;

[0056] The high-voltage power supply is connected to the X-ray source to provide voltages of different sizes to the X-ray source and accurately control the working state of the X-ray source, including energy regulation and stability management, to ensure consistent X-ray output under experimental conditions.

[0057] The light emitting end of the X-ray source is directed toward the ablation particle cloud to be measured, and its signal output end is connected to the input end of the time resolution gating module, and is used to emit pulsed light in the energy range of 1keV to 100keV to the ablation particle cloud to be measured under the action of different voltages, and at the same time send a start signal to the time resolution gating module; in this embodiment, the X-ray source can generate ultrafast, high dynamic range, and high repetition rate X-rays for fine imaging of targets under high brightness, high heat, and complex electromagnetic fields, including but not limited to cold cathode X-ray sources, photocathode X-ray sources, and flash X-ray sources. Here, a photocathode X-ray source is used as an example. A photocathode is a photocathode based on the photoelectric effect (including but not limited to S20), which can convert time-varying photon signals in a certain wavelength range into time-varying electron pulses. Under the action of a high-voltage power supply controller, the electron pulses, combined with the high voltage on the anode and the focusing and acceleration of the electron optical elements, achieve precise collision of the electron beam with the metal anode, thereby generating time-resolved pulsed X-rays. X-ray sources generate X-rays by bombarding targets such as metals with high-speed electrons. This process involves the emission, acceleration, and interaction of electrons with the target, producing a continuous spectrum of bremsstrahlung radiation and characteristic energy-level signature X-rays. The pulsed X-ray source achieved by this method has many advantages, including small size, low cost, small focal spot, and high intensity. The pulsed light generated by the X-ray source radiates outward at a certain divergence angle. After transmitting a certain distance, it illuminates the cloud of ablated particles to be measured with a certain irradiation area. At the same time, the energy of the emitted X-rays can be adaptively modulated according to the target characteristics, achieving imaging within the time of a single pulse on the first-photon imaging detector.

[0058] When there are particles or microparticles in the transmission path of X-ray photons, the X-ray photons interact with them and are blocked, and the X-rays pass through the particles with a certain transmittance. The energy of the X-rays determines its ability to penetrate matter. In this embodiment, the ablation particles are mainly C, Si (non-metallic), and metal debris, and their two-dimensional size is less than 100 microns. Through simulation and experimental results, it can be seen that when the X-ray energy is greater than 10keV, the X-ray energy penetrates non-metallic particles and can image metal particles. When the X-ray energy is between 1keV and 10keV, the X-rays can image some metal particles and non-metallic ablation particles. When the X-ray energy is only 1keV, its penetration ability is very limited and it cannot penetrate the ablation particles. Therefore, the energy of the emitted X-rays is required to have a wide dynamic adjustment range to adapt to different working modes, so that it can penetrate the ablation particles without excessive attenuation, and ensure that the imaging equipment can capture effective image information.

[0059] The output of the time-resolution gating module is connected to the signal input of the first single-photon imaging detector. Upon receiving a start signal, the module performs temporal control of the first single-photon imaging detector, ensuring detection within a single pulse. The module precisely controls the signal acquisition of the first single-photon imaging detector, capturing X-ray signals at specific moments within a short time window, thereby achieving microsecond-level time resolution. This time-gating technology reduces background noise interference and optimizes single-shot imaging.

[0060] The first single-photon imaging detector has a microsecond time resolution. Its detection surface corresponds to the emission end of the X-ray source. It is used to detect single pulse light that passes through the cloud of ablated particles to be measured, obtain the corresponding light signal, and convert the light signal into an electrical signal. The first single-photon imaging detector can have inductive and direct detection mechanisms. Taking into account the aforementioned wide energy spectrum range characteristics, the MCP detector is used here as an example. The detector is based on microchannel plate (MCP) technology, which converts X-ray signals into visible light signals and amplifies them to achieve counting and imaging of photon events. In order to adapt to low photon number environments, the detector design can be gain optimized to ensure that the imaging resolution remains within the resolution range. At the same time, through multi-channel output and high dynamic range electronics modules, the detector can achieve synchronous measurement of spatial and intensity distributions.

[0061] The input of the image recognition module is connected to the signal output of the first single-photon imaging detector, receiving the electrical signal and converting it into a corresponding single-pulse image. This two-dimensional image represents the particle distribution at a single moment (within the time scale corresponding to the pulse width), from which particle size, density, material, and position distribution can be calculated. Combined with the high repetition rate characteristics of the X-ray source, continuous dynamic measurement can be achieved, thereby determining the particle velocity, mass, and momentum, and ultimately forming a model of the spatiotemporal distribution evolution.

[0062] The input end of the data analysis and processing module is connected to the output end of the image recognition module, and is used to receive the single pulse image and analyze and process it to obtain the particle dynamics information of the ablation particle cloud to be measured.

[0063] The input end of the voltage modulation module is connected to the output end of the data analysis and processing module, and the output end of the voltage modulation module is connected to the input end of the high-voltage power supply. The voltage modulation module is used to modulate the high-voltage power supply to output a voltage different from the previous voltage based on the acquired particle dynamics information, so that the X-ray source outputs a single pulse light with an energy level different from the previous pulse light.

[0064] The focusing lens group is arranged at the light output end of the X-ray source and is used to collimate and focus the single pulse light outputted therefrom.

[0065] The measurement device is used to measure the cloud of ablation particles to be measured, including the following steps:

[0066] Step 1: Start the high-voltage power supply, which provides voltage to the X-ray source;

[0067] Step 2: The X-ray source emits pulsed light toward the particle cloud to be measured and simultaneously sends a start signal to the time resolution gating module;

[0068] Step 3: When the time resolution gating module receives the start signal, it performs time domain control on the first single-photon imaging detector so that the first single-photon imaging detector detects the pulse light passing through the ablation particle cloud to be measured within a single pulse time, obtains a corresponding optical signal, and converts the optical signal into a corresponding electrical signal.

[0069] Step 4: The image recognition module receives the corresponding electrical signal and converts it into a corresponding single pulse image;

[0070] Step 5: The data analysis and processing module receives the single pulse image and analyzes and processes it to obtain particle dynamics information of the particle cloud to be measured. Particle dynamics information includes particle size, density, material, position distribution, velocity, mass, and momentum.

[0071] Step 6: The voltage modulation module modulates the high-voltage power supply to output a voltage different from the previous voltage based on the acquired particle dynamics information, so that the X-ray source outputs a pulse light with an energy different from the previous voltage. At the same time, a start signal is sent to the time resolution gating module. Then, steps 3 to 5 are repeated to obtain the particle dynamics information of different sizes in the particle cloud to be measured.

[0072] Step 7: Repeat step 6 until all particle dynamics information of the ablation particle cloud to be measured is obtained.

[0073] Example 2:

[0074] The ablation particle dynamics measurement device based on wide spectrum X-ray provided in this embodiment has the same structure as the device provided in the first embodiment, except that Figure 3 As shown, the measuring device of this embodiment further includes a spectrometer, a second single-photon imaging detector and an anode target;

[0075] The beam splitter is arranged outside the light output end of the X-ray source, and is used to split the pulse light emitted by the X-ray source into two paths, forming a first beam split and a second beam split; the detection end of the first single-photon imaging detector corresponds to the first beam split;

[0076] The anode target is arranged on the optical path of the second split light;

[0077] The detection end of the second single-photon imaging detector corresponds to the anode target, its signal input end is connected to the output end of the time resolution gating module, and its signal output end is connected to the input end of the image recognition module. It is used to cooperate with the anode target to detect the pulse light of non-metallic particles in the cloud of ablation particles to be tested, obtain the corresponding light signal, and convert the light signal into an electrical signal.

[0078] The measurement device is used to measure the cloud of ablation particles to be measured, including the following steps:

[0079] Step 1: Start the high-voltage power supply, which provides voltage to the X-ray source;

[0080] Step 2: The X-ray source emits pulsed light toward the cloud of ablated particles to be measured, and simultaneously sends a start signal to the time resolution gating module. The pulsed light is focused and collimated by a focusing lens assembly to form a parallel beam, which is then split into a first beam and a second beam by a beam splitter. The anode target (e.g., a tungsten target) can adjust the energy of the second beam to optimize the imaging conditions for metals (requiring high penetration) and non-metals (requiring high-resolution scattering).

[0081] At this time, the first spectroscopic light penetrates the metal ablation particles. Since metal materials have high density and high atomic number, their absorption coefficient for X-rays is significantly higher than that of non-metallic materials. The structural differences within the metal particles (such as pores and thickness changes) will cause the X-ray intensity distribution after penetration to show a significant attenuation gradient. After the second spectroscopic light interacts with the anode target, the scattered second spectroscopic light continues to interact with the non-metallic ablation particles. The atoms of non-metallic materials (such as ceramics or polymers) are loosely arranged or have a specific crystal structure, which triggers Compton scattering of the second spectroscopic light. The scattered photons carry the material's microstructural information and composition characteristics (such as the content of light elements).

[0082] Step 3: When the time resolution gating module receives the start signal, the time domain control is performed on the first single-photon imaging detector and the second single-photon imaging detector respectively, so that the first single-photon imaging detector detects the first split light that passes through the ablation particle cloud to be measured within a single pulse time, obtains a corresponding light signal, and converts the light signal into a corresponding electrical signal, and the second single-photon imaging detector detects the second split light that is energy-adjusted and scattered by the ablation particle cloud to be measured within a single pulse time, obtains a corresponding light signal, and converts the light signal into a corresponding electrical signal;

[0083] At this point, the first single-photon imaging detector captures the intensity distribution of the transmitted first split light to generate a high-contrast two-dimensional image, clearly showing the macroscopic morphology, size distribution, and internal defects (such as cracks or pores) of the metal particles. The second single-photon imaging detector receives scattered signals within a specific angle range and, combined with energy spectrum analysis, can analyze the phase composition, grain orientation, and structural distortion caused by surface ablation of non-metallic particles.

[0084] Step 4: The image recognition module receives the electrical signals outputted by the first single-photon imaging detector and the second single-photon imaging detector respectively and converts them into corresponding single-pulse images;

[0085] Step 5: The data analysis and processing module receives the single pulse image and analyzes and processes it to obtain the particle dynamics information of the ablation particle cloud to be measured; the particle dynamics information includes the particle size, density, material, position distribution, velocity, mass and momentum.

[0086] Step 6: The voltage modulation module modulates the high-voltage power supply to output a voltage different from the previous voltage based on the acquired particle dynamics information, so that the X-ray source outputs pulsed light with a different energy level than the previous voltage. At the same time, a start signal is sent to the time resolution gating module. Steps 3 to 5 are then repeated to obtain particle dynamics information of different sizes in the ablation particle cloud to be measured.

[0087] Step 7: Repeat step 6 until all particle dynamics information of the ablation particle cloud to be measured is obtained.

[0088] The measurement device and its measurement method can perform collaborative detection: the transmission and scattering paths are separated to avoid signal crosstalk, while being compatible with the simultaneous analysis of metallic and non-metallic heterogeneous particles;

[0089] The embodiment of the present invention also provides a system for measuring the dynamics of ablated particles based on wide spectrum X-rays, such as Figure 4 As shown, it includes 3-6 ablation particle dynamics measurement devices based on wide spectrum X-rays provided in the above embodiment 1 or embodiment 2;

[0090] 3-6 ablation particle dynamics measurement devices based on wide spectrum X-rays are arranged at different positions of the ablation particle cloud to be measured, so as to obtain particle dynamics information at different positions of the ablation particle cloud to be measured;

[0091] The data analysis and processing modules in each wide-spectrum X-ray-based ablation particle dynamics measurement device are interconnected to perform three-dimensional reconstruction of the four sets of particle dynamics information. X-ray tomography technology combined with numerical calculations is used to reconstruct the density and spatial distribution of the ablation particles. The interaction mechanism between other physical parameters and the ablation particle distribution is then reconstructed through relevant physical equations to obtain information on the distribution of the ablation particle cloud to be measured in three-dimensional space.

[0092] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any changes or substitutions within the technical scope disclosed in the present invention shall be covered by the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be subject to the scope of protection of the claims.

Claims

1. A device for measuring particle dynamics of ablated particles based on wide spectrum X-rays, characterized by: It includes a high-voltage power supply, an X-ray source, a first single-photon imaging detector, a time-resolution gating module, an image recognition module, and a data analysis and processing module; The high-voltage power supply is connected to the X-ray source and is used to provide voltages of different magnitudes to the X-ray source; The light emitting end of the X-ray source is directed toward the ablation particle cloud to be measured, and its signal output end is connected to the input end of the time resolution gating module, and is used to emit pulsed light of different energies toward the ablation particle cloud to be measured under the action of different voltages, and at the same time send a start signal to the time resolution gating module; The output end of the time resolution gating module is connected to the signal input end of the first single-photon imaging detector, and is used to perform time domain control on the first single-photon imaging detector when receiving the start signal, so that the first single-photon imaging detector performs detection within a single pulse time; The detection surface of the first single-photon imaging detector corresponds to the emission end of the X-ray source, and is used to detect a single pulse of light that passes through the cloud of ablated particles to be detected, obtain a corresponding optical signal, and convert the optical signal into an electrical signal; The input end of the image recognition module is connected to the signal output end of the first single-photon imaging detector, and is used to receive the electrical signal and convert it into a corresponding single-pulse image; The input end of the data analysis and processing module is connected to the output end of the image recognition module, and is used to receive the single pulse image and analyze and process it to obtain particle dynamics information of the ablation particle cloud to be measured.

2. The ablation particle dynamics measurement device based on wide spectrum X-rays according to claim 1, characterized in that: Also included is a voltage modulation module; The input end of the voltage modulation module is connected to the output end of the data analysis and processing module, and the output end is connected to the input end of the high-voltage power supply. It is used to modulate the high-voltage power supply to output a voltage different from the previous size according to the acquired particle dynamics information, so that the X-ray source outputs a single pulse light with an energy size different from the previous one.

3. The ablation particle dynamics measurement device based on wide spectrum X-rays according to claim 1 or 2, characterized in that: Also included is a beam splitter, a second single-photon imaging detector, and an anode target; The beam splitter is arranged outside the light output end of the X-ray source, and is used to split the pulse light emitted by the X-ray source into two paths, forming a first beam split and a second beam split; the detection end of the first single-photon imaging detector corresponds to the first beam split; The anode target is arranged between the spectrometer and the cloud of ablated particles to be measured, and is located on the optical path of the second split light, and is used to adjust the energy of the second split light; The detection end of the second single-photon imaging detector corresponds to the anode target, its signal input end is connected to the output end of the time resolution gating module, and its signal output end is connected to the input end of the image recognition module. It is used to detect the second spectroscopic light after energy adjustment and scattering by the cloud of ablated particles to be measured, obtain the corresponding light signal, and convert the light signal into an electrical signal.

4. The ablation particle dynamics measurement device based on wide spectrum X-rays according to claim 3, characterized in that: Also includes focusing lens assembly; The focusing lens group is arranged at the light emitting end of the X-ray source and is used for collimating and focusing the single pulse light emitted therefrom.

5. The ablation particle dynamics measurement device based on wide spectrum X-rays according to claim 4, characterized in that: The X-ray source is a cold cathode X-ray source, a photocathode X-ray source or a flash X-ray source.

6. A broad spectrum X-ray based ablation particle dynamics measurement system, characterized by: Comprising N ablation particle dynamics measurement devices based on wide spectrum X-rays according to any one of claims 1 to 5; N ≥ 3; N ablation particle dynamics measurement devices based on wide spectrum X-rays are arranged at different positions of the ablation particle cloud to be measured, for obtaining particle dynamics information at different positions of the ablation particle cloud to be measured; The data analysis and processing modules in each wide-spectrum X-ray-based ablation particle dynamics measurement device are interconnected to perform three-dimensional reconstruction on N groups of particle dynamics information to obtain distribution information of the ablation particle cloud to be measured in three-dimensional space.

7. A method for measuring particle dynamics of ablated particles based on wide-spectrum X-rays, using the device for measuring particle dynamics of ablated particles based on wide-spectrum X-rays according to any one of claims 1 to 5, characterized in that: The following steps are involved: Step 1: Start the high-voltage power supply, which provides voltage to the X-ray source; Step 2: emitting pulsed light to the ablation particle cloud to be measured through an X-ray source, and simultaneously sending a start signal to the time resolution gating module; Step 3: When the time resolution gating module receives the start signal, it performs time domain control on the first single-photon imaging detector so that the first single-photon imaging detector detects the pulse light passing through the ablation particle cloud to be measured within a single pulse time, obtains a corresponding optical signal, and converts the optical signal into a corresponding electrical signal. Step 4: The image recognition module receives the electrical signal and converts it into a corresponding single pulse image; Step 5: The data analysis and processing module receives the single pulse image and analyzes and processes it to obtain particle dynamics information of the ablation particle cloud to be measured.

8. The method for measuring ablation particle dynamics based on wide spectrum X-rays according to claim 7, characterized in that: Also includes: Step 6: The voltage modulation module modulates the high-voltage power supply to output a voltage different from the previous voltage based on the acquired particle dynamics information, so that the X-ray source outputs pulsed light with a different energy level than the previous voltage. At the same time, a start signal is sent to the time resolution gating module. Steps 3 to 5 are then repeated to obtain particle dynamics information of different sizes in the ablation particle cloud to be measured. Step 7: Repeat step 6 until all particle dynamics information of the ablation particle cloud to be measured is obtained.

9. The method for measuring ablation particle dynamics based on wide spectrum X-rays according to claim 8, characterized in that: Step 2 specifically includes emitting pulsed light to the cloud of ablated particles to be measured through an X-ray source, and simultaneously sending a start signal to the time resolution gating module; the pulsed light is split into a first beam and a second beam by a beam splitter, and the energy of the second beam is adjusted by the anode target; Specifically, step 3 includes: when the time resolution gating module receives the start signal, performing time domain control on the first single-photon imaging detector and the second single-photon imaging detector respectively, so that the first single-photon imaging detector detects the first split light that passes through the ablation particle cloud to be measured within a single pulse time, obtains a corresponding light signal, and converts the light signal into a corresponding electrical signal; and the second single-photon imaging detector detects the second split light that is energy-adjusted and scattered by the ablation particle cloud to be measured within a single pulse time, obtains a corresponding light signal, and converts the light signal into a corresponding electrical signal; Specifically, step 4 includes: the image recognition module receiving the electrical signals outputted by the first single-photon imaging detector and the second single-photon imaging detector respectively and converting them into corresponding single-pulse images.

10. The method for measuring ablation particle dynamics based on wide spectrum X-rays according to claim 9, characterized in that: In step 5, the particle dynamics information includes the particle size, density, material, position distribution, velocity, mass and momentum.

Images