Anti-interference detector test system
By designing an anti-interference detector test system, using a dark box to isolate external interference, vacuum unit vacuum and temperature control mechanism to adjust temperature, the problems of weak anti-interference ability and poor temperature control in the existing system are solved, and more accurate detector testing is achieved.
Patent Information
- Application Number
- CN202510619658.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-14
- Publication Date
- 2025-08-08
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
The existing X-ray detector test system has weak anti-interference ability, and the interference of external light and electromagnetic signals leads to inaccurate test results, and poor temperature control affects the photoconductivity response.
An anti-interference detector testing system is designed, including a concealer, a vacuum unit, a temperature control mechanism and a regulation component. By isolating external interference, vacuuming and temperature regulation, it provides a stable testing environment, and meets the testing accuracy and speed requirements through parameter analyzers and electrometers.
It improves the accuracy and reliability of detector testing, meets the needs under different testing conditions, and enhances the practicality of the system.
Smart Images
Figure CN120447019A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of electrical parameter testing of photoelectric detectors, in particular to an anti-interference detector testing system. Background Art
[0002] The core of X-ray detector performance lies in testing its photoconductive response to X-rays, which directly determines the detector's sensitivity and reliability in practical applications. However, there is currently no standardized X-ray detector testing equipment on the market. Many research institutions and companies often design and build their own testing systems based on their own needs. While these systems meet testing requirements to a certain extent, they generally have some shortcomings.
[0003] One of the main drawbacks of existing test systems is their poor anti-interference capabilities. Interference from external light or other electromagnetic signals often results in inaccurate test results, a particularly significant issue in scenarios requiring high-sensitivity measurements. Homegrown test systems often lack precise temperature control, which significantly affects the detector's photoconductive response.
[0004] Based on this, an anti-interference detector testing system is now provided to eliminate the drawbacks of existing devices. Summary of the Invention
[0005] The object of the present invention is to provide an interference-resistant detector testing system to solve the problem of reducing interference generated during testing in the background art.
[0006] To achieve the above object, the present invention provides the following technical solutions:
[0007] An anti-interference detector testing system includes a radiation detector and an X-ray light source, wherein several radiation detectors are mounted on a PCB board, the PCB board is mounted inside an installation box, the installation box is fixed at the bottom end of a dark box, a sealing plate is mounted on one side of the installation box, a test window is provided at the upper end of the installation box, the X-ray light source is mounted above the installation box, and several ray emission ends are provided at the bottom end of the X-ray light source, an adjustment component for adjusting the working height of the X-ray light source is provided inside the dark box, a parameter analyzer, an electrometer and a source measurement unit are provided on one side of the dark box, the parameter analyzer, electrometer and source measurement unit are all electrically connected to the PCB board, and a temperature control mechanism for adjusting the detection temperature inside the dark box is provided on one side of the dark box.
[0008] On the basis of the above technical solutions, the present invention also provides the following optional technical solutions:
[0009] In an optional solution: a first power box and a second power box are provided on one side of the dark box, the first power box and the second power box are electrically connected to the ray detector and the X-ray light source respectively, the X-ray light source is electrically connected to an X-ray light source controller, and the X-ray light source controller is fixed on one side of the dark box.
[0010] In an optional solution: an air pipe is provided inside the installation box, the other end of the air pipe is connected to the output end of the vacuum unit, and the vacuum unit is fixedly arranged on one side of the dark box.
[0011] In an optional scheme: the adjustment component includes a sliding side plate, sliding side plates are fixed on both sides of the X-ray light source, guide slide rods are slidably provided on the sliding side plates, and the guide slide rods are fixed inside the dark box. A threaded plate is fixed on one side of the X-ray light source, and a threaded hole is provided at the upper end of the threaded plate. A threaded rod is fitted in the threaded hole, and a rotating plate is rotatably provided at one end of the threaded rod, and the rotating plate is fixed inside the dark box. The other end of the threaded rod is fixedly connected to the output end of the motor, and the motor is fixed at the bottom end inside the dark box.
[0012] In an optional scheme: the temperature control mechanism includes an air distribution pipe, the air distribution pipe is fixed on one side of the dark box, a plurality of exhaust holes are provided on one side of the air distribution pipe, one end of the air distribution pipe is connected to an air inlet pipe, one end of the air inlet pipe extends to the outside of the dark box, a return pipe is fixed in the mounting hole on one side of the dark box, one end of the return pipe extends to the inside of the dark box, a first switching baffle is slidingly provided inside the air distribution pipe, a fixing rod is fixed on one side of the first switching baffle, a second switching baffle is fixed on the other end of the fixing rod, the second switching baffle is slidably provided in a sliding groove at one end of the return pipe, an air inlet hole is provided on the second switching baffle, the second switching baffle is fixed on one end of the mounting bracket, the mounting bracket is fixed on the output end of the electric push rod, and the electric push rod is fixed inside the dark box.
[0013] In an optional solution: a connecting pipe is provided inside the installation box, a third switching baffle is slidably provided in a sliding groove at one end of the connecting pipe, an air inlet is provided on one side of the third switching baffle, and the third switching baffle is fixed to the other end of the installation frame.
[0014] In an optional solution: the outer sides of the dark box and the door are sprayed with radiation-proof black paint, and the dark box and the door are made of highly sealed materials.
[0015] Compared with the prior art, the present invention has the following beneficial effects:
[0016] The present invention provides a dark box and a door to effectively isolate external light and other electromagnetic interference, providing a stable test environment for the detector. By providing a vacuum unit, the interior of the installation box is evacuated, thereby reducing the impact of air on the radiation detector during testing. By providing a temperature control mechanism, it is convenient to adjust the test temperature inside the dark box to meet different test requirements. By providing an adjustment component, it is convenient to adjust the working height of the X-ray light source. By providing a parameter analyzer, an electrometer and a source measurement unit, the requirements of test accuracy, speed, function, etc. are met, thereby increasing the practicality of the detector test system. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 It is a structural schematic diagram of the present invention.
[0018] Figure 2 This is a schematic diagram of the installation of the X-ray light source controller, parameter analyzer, electrometer and source measurement unit of the present invention.
[0019] Figure 3 It is a schematic diagram of the internal structure of the dark box of the present invention.
[0020] Figure 4 Schematic diagram of the X-ray light source structure of the present invention.
[0021] Figure 5 This is a schematic diagram of the installation of the radiation detector of the present invention.
[0022] Figure 6 This is a schematic diagram of the installation of the first switching baffle, the second switching baffle and the third switching baffle of the present invention.
[0023] Notes on the reference numerals: 11 dark box, 12 box door, 13 installation box, 14 test window, 15 ray detector, 16 PCB board, 17 first power supply box, 18 X-ray light source, 19 ray emission end, 20 guide slide, 21 threaded rod, 22 motor, 23 second power supply box, 24 vacuum unit, 25 X-ray light source controller, 26 parameter analyzer, 27 electrometer, 28 source measurement unit, 29 gas distribution pipe, 30 air inlet pipe, 31 return pipe, 32 first switching baffle, 33 second switching baffle, 34 third switching baffle, 35 electric push rod. DETAILED DESCRIPTION
[0024] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments.
[0025] In one embodiment, Figures 1-6As shown, an anti-interference detector testing system includes a radiation detector 15 and an X-ray light source 18. Several of the radiation detectors 15 are mounted on a PCB board 16. The PCB board 16 is installed inside an installation box 13. The installation box 13 is fixed at the bottom end of a dark box 11. A sealing plate is installed on one side of the installation box 13. A test window 14 is provided at the upper end of the installation box 13. The X-ray light source 18 is installed above the installation box 13. The bottom end of the X-ray light source 18 is provided with a plurality of ray emission ends 19. An adjustment component for adjusting the working height of the X-ray light source 18 is provided inside the dark box 11. A parameter analyzer 26, an electrometer 27, and a source measurement unit 28 are provided on one side of the dark box 11. The parameter analyzer 26, the electrometer 27, and the source measurement unit 28 are all electrically connected to the PCB board 16. A temperature control mechanism for adjusting the detection temperature inside the dark box 11 is provided on one side of the dark box 11. The temperature control mechanism facilitates the adjustment of the detection temperature inside the dark box 11.
[0026] A first power box 17 and a second power box 23 are provided on one side of the dark box 11. The first power box 17 and the second power box 23 are electrically connected to the ray detector 15 and the X-ray light source 18 respectively. The X-ray light source 18 is electrically connected and is provided with an X-ray light source controller 25. The X-ray light source controller 25 is fixed on one side of the dark box 11. When in use, the first power box 17 and the second power box 23 can provide stable power to the ray detector 15 and the X-ray light source 18 respectively, and the X-ray light source controller 25 can control the X-ray light source 18.
[0027] An air pipe is provided inside the installation box 13, and the other end of the air pipe is connected to the output end of the vacuum unit 24. The vacuum unit 24 is fixed on one side of the dark box 11. When in use, when the radiation detector 15 is tested, the vacuum unit 24 can collect the air inside the installation box 13, so that the interior of the installation box 13 is in a vacuum state, reducing the impact of air on the radiation detector 15 during testing.
[0028] The adjusting assembly includes a sliding side plate, and sliding side plates are fixed on both sides of the X-ray light source 18, and guide slide bars 20 are slidably provided on the sliding side plates, and the guide slide bars 20 are fixed inside the dark box 11. A threaded plate is fixed on one side of the X-ray light source 18, and a threaded hole is provided on the upper end of the threaded plate. A threaded rod 21 is matched with the threaded hole, and a rotating plate is rotatably provided at one end of the threaded rod 21, and the rotating plate is fixed inside the dark box 11. The other end of the threaded rod 21 is fixedly connected to the output end of the motor 22, and the motor 22 is fixedly provided at the bottom end inside the dark box 11. When in use, when the working height of the X-ray light source 18 needs to be adjusted, the motor 22 is started, and the output end of the motor 22 drives the threaded rod 21 to rotate. Under the action of the thread, the X-ray light source 18 moves along the axial direction of the guide slide bar 20, thereby meeting the test of different distances.
[0029] The temperature control mechanism includes an air distribution pipe 29, which is fixed on one side of the dark box 11. A plurality of exhaust holes are provided on one side of the air distribution pipe 29. One end of the air distribution pipe 29 is connected to an air inlet pipe 30. One end of the air inlet pipe 30 extends to the outside of the dark box 11. A return pipe 31 is fixed in a mounting hole on one side of the dark box 11. One end of the return pipe 31 extends to the inside of the dark box 11. A first switching baffle 32 is slidingly provided inside the air distribution pipe 29. A fixing rod is fixed on one side of the first switching baffle 32, and a second switching baffle 33 is fixed on the other end of the fixing rod. The second switching baffle 33 is slidably provided in a sliding groove at one end of the return pipe 31. An air inlet hole is provided on the second switching baffle 33. The second switching baffle 33 is fixed at one end of the mounting bracket. The mounting bracket is fixed at the output end of the electric push rod 35. The electric push rod 35 is fixed with Inside the dark box 11, during use, when it is necessary to adjust the internal detection temperature of the dark box 11, the air inlet pipe 30 is connected to the output end of the external air supply component, and the return pipe 31 is connected to the input end of the external gas recovery component. Then, the output end of the electric push rod 35 is controlled to retract, and the output end of the electric push rod 35 drives the second switching baffle 33 to slide through the mounting frame. The second switching baffle 33 drives the first switching baffle 32 to slide through the fixed rod, so that the air inlet hole on one side of the second switching baffle 33 is aligned with one end of the return pipe 31, and the first switching baffle 32 moves to the end of the air distribution pipe 29. Then, the external air supply component transports hot gas or cold gas to the inside of the air distribution pipe 29, and the air distribution pipe 29 is discharged through the exhaust hole, thereby adjusting the internal temperature of the dark box 11. Then, the gas is discharged through the return pipe 31, thereby causing the gas inside the dark box 11 to flow, so that the internal temperature of the dark box 11 remains constant.
[0030] The interior of the installation box 13 is connected with a connecting pipe, and a third switching baffle 34 is slidingly provided in a sliding groove at one end of the connecting pipe. An air inlet hole is provided on one side of the third switching baffle 34, and the third switching baffle 34 is fixedly provided at the other end of the mounting bracket. During use, when the output end of the electric push rod 35 drives the mounting bracket to move, the mounting bracket drives the third switching baffle 34 to slide, so that the air inlet hole on one side of the third switching baffle 34 is aligned with one end of the connecting pipe, thereby allowing the air inside the dark box 11 to enter the interior of the installation box 13, thereby realizing testing at different temperatures. At this time, the interior of the installation box 13 is not vacuumed during testing.
[0031] The exterior of the dark box 11 and the door 12 are sprayed with radiation-proof black paint. Both are made of highly sealed materials, effectively isolating them from external light and other electromagnetic interference during use, providing a stable testing environment for the radiation detector 15. Made of highly sealed materials, they completely block the penetration of external light, ensuring that the radiation detector 15 is only affected by the X-ray source during testing.
[0032] The above embodiment discloses an anti-interference detector testing system, wherein, when conducting a test, the radiation detector 15 is electrically connected to the parameter analyzer 26, the electrometer 27 and the source measurement unit 28 through a wire, and then the motor 22 is started according to the required test spacing, and the motor 22 drives the threaded rod 21 to rotate, and the X-ray light source 18 is moved under the action of the thread, and then the vacuum unit 24 is opened according to the test requirements to vacuum the inside of the installation box 13, and the box door 12 is closed. The X-ray light source controller 25 controls the X-ray light source 18 to start, and the first power supply box 17 and the second power supply box 23 provide power to the radiation detector 15 and the X-ray light source 18 respectively, and the parameter analyzer 26 is turned on, and the curve to be tested is set, and the curve is returned to the curve after the test, and the X-ray light source 18 is turned on, and the required voltage and current, as well as the irradiation duration, are set, and the radiation detector 15 and the parameter analyzer are turned on. The instrument 26 is used to perform current and time curve tests under X-ray irradiation. When the internal detection temperature of the dark box 11 needs to be adjusted, the air inlet pipe 30 is connected to the output end of the external air supply component, and the return pipe 31 is connected to the input end of the external gas recovery component. Then the output end of the electric push rod 35 is controlled to retract, and the output end of the electric push rod 35 drives the second switching baffle 33 to slide through the mounting frame. The second switching baffle 33 drives the first switching baffle 32 to slide through the fixed rod, so that the air inlet hole on one side of the second switching baffle 33 is aligned with one end of the return pipe 31, and the first switching baffle 32 moves to the end of the air distribution pipe 29. Then the external air supply component transports hot gas or cold gas to the inside of the air distribution pipe 29, and the air distribution pipe 29 is discharged through the exhaust hole, thereby adjusting the internal temperature of the dark box 11. Then the gas is discharged through the return pipe 31, thereby causing the gas inside the dark box 11 to flow, so that the internal temperature of the dark box 11 remains constant.
[0033] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of the present application. Therefore, the scope of protection of the present application should be based on the scope of protection of the claims.
Claims
1. An anti-interference detector test system, comprising a ray detector (15) and an X-ray light source (18), wherein a plurality of the ray detectors (15) are mounted on a PCB board (16), the PCB board (16) is mounted inside a mounting box (13), the mounting box (13) is fixed at the bottom end of a dark box (11), a sealing plate is mounted on one side of the mounting box (13), a test window (14) is provided at the upper end of the mounting box (13), the X-ray light source (18) is mounted above the mounting box (13), and a plurality of ray emission ends (19) are provided at the bottom end of the X-ray light source (18), characterized in that: An adjustment component for adjusting the working height of the X-ray light source (18) is provided inside the dark box (11); a parameter analyzer (26), an electrometer (27), and a source measurement unit (28) are provided on one side of the dark box (11); the parameter analyzer (26), the electrometer (27), and the source measurement unit (28) are all electrically connected to the PCB board (16); and a temperature control mechanism for adjusting the detection temperature inside the dark box (11) is provided on one side of the dark box (11).
2. The anti-interference detector testing system according to claim 1, characterized in that: A first power supply box (17) and a second power supply box (23) are provided on one side of the dark box (11). The first power supply box (17) and the second power supply box (23) are electrically connected to the ray detector (15) and the X-ray light source (18), respectively. The X-ray light source (18) is electrically connected to an X-ray light source controller (25). The X-ray light source controller (25) is fixed on one side of the dark box (11).
3. The anti-interference detector testing system according to claim 1, characterized in that: The interior of the installation box (13) is connected to an air pipe, the other end of which is connected to the output end of a vacuum unit (24), and the vacuum unit (24) is fixed on one side of the dark box (11).
4. The anti-interference detector testing system according to claim 1, characterized in that: The adjustment assembly includes a sliding side plate, and sliding side plates are fixed on both sides of the X-ray light source (18). Guide slide rods (20) are slidably provided on the sliding side plates. The guide slide rods (20) are fixed inside the dark box (11). A threaded plate is fixed on one side of the X-ray light source (18). A threaded hole is provided at the upper end of the threaded plate. A threaded rod (21) is matched in the threaded hole. A rotating plate is rotatably provided at one end of the threaded rod (21). The rotating plate is fixed inside the dark box (11). The other end of the threaded rod (21) is fixedly connected to the output end of the motor (22). The motor (22) is fixed at the bottom end inside the dark box (11).
5. The anti-interference detector testing system according to claim 1, characterized in that: The temperature control mechanism includes an air distribution pipe (29), the air distribution pipe (29) is fixedly arranged on one side of the interior of the dark box (11), a plurality of exhaust holes are provided on one side of the air distribution pipe (29), one end of the air distribution pipe (29) is connected to an air inlet pipe (30), one end of the air inlet pipe (30) extends to the outside of the dark box (11), a return pipe (31) is fixedly arranged in a mounting hole on one side of the dark box (11), one end of the return pipe (31) extends to the interior of the dark box (11), and a sliding air outlet is provided inside the air distribution pipe (29). A first switching baffle (32) is fixedly provided with a fixing rod on one side of the first switching baffle (32), and a second switching baffle (33) is fixedly provided on the other end of the fixing rod. The second switching baffle (33) is slidably arranged in a sliding groove at one end of the return pipe (31), and an air inlet is provided on the second switching baffle (33). The second switching baffle (33) is fixedly provided at one end of a mounting frame, and the mounting frame is fixedly provided at the output end of an electric push rod (35), and the electric push rod (35) is fixedly provided inside the dark box (11).
6. The anti-interference detector testing system according to claim 5, characterized in that: The interior of the installation box (13) is connected with a connecting pipe, a third switching baffle (34) is slidably provided in a sliding groove at one end of the connecting pipe, an air inlet is provided on one side of the third switching baffle (34), and the third switching baffle (34) is fixedly provided at the other end of the installation frame.
7. The anti-interference detector testing system according to claim 1, characterized in that: The outer sides of the dark box (11) and the box door (12) are sprayed with radiation-proof black paint.
8. The anti-interference detector testing system according to claim 7, characterized in that: The dark box (11) and the box door (12) are both made of highly sealing materials.