Defect estimation device, numerical control device, additive manufacturing device, and defect estimation method

By using a defect estimation device to determine the collision, friction, and gap phenomena between unmelted material and weld, internal defects of 3D objects can be estimated. This solves the problems of complex equipment and increased processing time in existing technologies, and achieves simplified detection and efficient understanding of internal defect morphology.

CN120456999BActive Publication Date: 2026-04-21MITSUBISHI ELECTRIC CORP
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
MITSUBISHI ELECTRIC CORP
Filing Date
2023-02-08
Publication Date
2026-04-21

AI Technical Summary

Technical Problem

Existing technologies for detecting internal defects in 3D objects involve complex equipment structures, high costs, and increased processing time, making it difficult to effectively grasp the morphology of internal defects.

Method used

The defect estimation device uses a light beam to melt the material to form a weld bead, determines the collision between the unmelted material and the workpiece, the friction of the weld bead, and the gap between the weld bead, and estimates the morphology of internal defects, simplifying the structure without increasing processing time.

Benefits of technology

It enables the effective understanding of the morphology of internal defects in objects through a simple structure without increasing processing time, thus simplifying the inspection process.

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Abstract

The defect estimation device estimates the morphology of internal defects, i.e., gaps formed inside the shape, by feeding material to a workpiece and stacking weld beads formed by melting the material using a light beam. The defect estimation device has a defect estimation unit (27) that determines the presence or absence of at least one of the following phenomena: a first phenomenon, where unmelted material collides with the workpiece; a second phenomenon, where unmelted material rubs against the weld beads and leaves a mark on the weld beads; and a third phenomenon, where gaps are formed between adjacent weld beads. Based on the determination result, defect information representing the morphology of the internal defects is obtained.
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Description

Technical Field

[0001] This invention relates to a defect estimation device, a numerical control device, an auxiliary manufacturing device, and a defect estimation method for estimating internal defects of 3D objects. Background Technology

[0002] Additive Manufacturing (AM) is known as a 3D form of manufacturing.

[0003] One method of shaping objects. In one of the many methods of additive manufacturing, namely Directed Energy Deposition (DED), energy is deposited onto the workpiece...

[0004] A beam of light is irradiated, supplying material to the irradiated location, thereby melting the material and shaping it.

[0005] Internal defects sometimes occur in objects manufactured through additive manufacturing. Internal defects are gaps formed within the object. They arise because material cannot reach certain areas during manufacturing. Locations with internal defects are prone to becoming the starting point for cracking, and thus, internal defects can reduce the object's mechanical strength. From a traceability perspective, it is important to know the presence, location, and size of internal defects in an object.

[0006] One method for evaluating internal defects is destructive testing. However, destructive testing is difficult to use for full-scale inspection, so it is used for sampling. Other evaluation methods include radiographic testing via X-ray CT (Computed Tomography) or ultrasonic testing to detect internal defects. In these cases, limitations exist regarding the shape or material of the object being inspected, making it sometimes difficult to detect internal defects. Furthermore, these evaluation methods also require a measurement process, independent of the forming process, to determine the location or size of internal defects. Because of this measurement process, processing time increases accordingly.

[0007] Patent Document 1 discloses an additional manufacturing system for shaping using a welding torch mounted on a robot, which measures the surface temperature distribution of a weld bead formed by molten material and detects internal defects based on the temperature gradient derived from the surface temperature distribution of the weld bead.

[0008] Patent Document 1: Japanese Patent Application Publication No. 2020-189324 Summary of the Invention

[0009] According to the prior art described in Patent Document 1 above, measurements are performed on the formed weld bead in order to detect internal defects. According to the prior art, an additional manufacturing system needs to be equipped with measuring instruments for detecting internal defects, thus presenting the following problem:

[0010] That is, the structures used for detecting internal defects become more complex, increasing equipment costs. Furthermore,

[0011] According to existing technology, there is a problem that the processing time increases accordingly when measuring the formed weld bead. Therefore, there is a need to determine the morphology of internal defects in a shape using a simple structure without increasing processing time.

[0012] The present invention was made in view of the above circumstances, and its object is to provide a defect estimation device that can determine the morphology of internal defects in a shaped object through a simple structure without increasing processing time.

[0013] To address the aforementioned issues and achieve the objective, the defect estimation apparatus of the present invention estimates the morphology of internal defects, i.e., gaps formed within the interior of a workpiece, by layering weld beads formed from material melted using a light beam. The defect estimation apparatus of the present invention includes a defect estimation unit that determines the presence or absence of at least one of the following phenomena: a first phenomenon (unmelted material colliding with the workpiece), a second phenomenon (unmelted material rubbing against the weld bead and leaving a mark on the weld bead), and a third phenomenon (gap forming between adjacent weld beads). Based on the determination result, defect information representing the morphology of the internal defects is obtained.

[0014] The effects of the invention

[0015] The defect estimation device involved in this invention has the following effect: it can determine the morphology of internal defects in a shape with a simple structure and without increasing processing time. Attached Figure Description

[0016] Figure 1 This is a diagram illustrating a structural example of the additional manufacturing apparatus involved in Embodiment 1.

[0017] Figure 2 This is a diagram illustrating an example of the functional structure of the NC device in the additional manufacturing apparatus according to Embodiment 1.

[0018] Figure 3 This is a diagram used to illustrate the case of forming a shape using the additional manufacturing apparatus according to Embodiment 1.

[0019] Figure 4 This is a diagram used to explain the calculation of the wire melting position in Embodiment 1.

[0020] Figure 5 This is a diagram used to explain the calculation of the weld height in Embodiment 1.

[0021] Figure 6 This is a schematic diagram of the molten pool image used to calculate the weld width in Implementation Method 1.

[0022] Figure 7 This is a diagram used to illustrate the occurrence of residual phenomena in the additional manufacturing apparatus according to Embodiment 1.

[0023] Figure 8 Figure 1 is used to illustrate the relationship between the morphology of the residual phenomenon and internal defects that occur in the additional manufacturing apparatus according to Embodiment 1.

[0024] Figure 9 It means in Figure 8 A diagram illustrating an example of an internal defect that occurs in case (a) shown.

[0025] Figure 10 It means in Figure 8 A diagram illustrating an example of an internal defect that occurs in scenario (b).

[0026] Figure 11 This is Figure 2, used to explain the relationship between the morphology of the residual phenomenon and internal defects that occur in the additional manufacturing apparatus according to Embodiment 1.

[0027] Figure 12 It means in Figure 11 A diagram illustrating an example of an internal defect that occurs in the situation shown.

[0028] Figure 13 Figure 3 is used to illustrate the relationship between the morphology of the residual phenomenon and the internal defects that occur in the additional manufacturing apparatus according to Embodiment 1.

[0029] Figure 14 It means in Figure 13 A diagram illustrating an example of an internal defect that occurs in the situation shown.

[0030] Figure 15 Figure 4 is used to explain the relationship between the morphology of the residual phenomenon and the internal defects that occur in the additional manufacturing apparatus according to Embodiment 1.

[0031] Figure 16 This is a diagram used to illustrate the occurrence of wire friction in the additional manufacturing apparatus according to Embodiment 1.

[0032] Figure 17 Figure 1 is used to illustrate the relationship between wire friction phenomena and internal defects occurring in the additional manufacturing apparatus according to Embodiment 1.

[0033] Figure 18 It means in Figure 17 A diagram illustrating an example of an internal defect that occurs in case (a) shown.

[0034] Figure 19 It means in Figure 17 A diagram illustrating an example of an internal defect that occurs in scenario (b).

[0035] Figure 20 This is Figure 2, used to illustrate the relationship between wire friction phenomena and internal defects occurring in the additional manufacturing apparatus according to Embodiment 1.

[0036] Figure 21 This is a diagram used to illustrate the occurrence of weld gap phenomenon in the additional manufacturing apparatus according to Embodiment 1.

[0037] Figure 22 Figure 1 shows a state in which weld beads are formed adjacent to each other by the additional manufacturing apparatus according to Embodiment 1.

[0038] Figure 23 yes Figure 22 The cross-sectional view of the weld bead along line XXIII-XXIII shown.

[0039] Figure 24 It means in Figure 23 The diagram shows a cross-sectional view of a weld bead layered on top of each other.

[0040] Figure 25 Figure 2 shows a state in which weld beads are formed adjacent to each other by the additional manufacturing apparatus according to Embodiment 1.

[0041] Figure 26 yes Figure 25 The cross-sectional view of the weld bead at line XXVI-XXVI shown.

[0042] Figure 27 It means in Figure 26 The diagram shows a cross-sectional view of a weld bead layered on top of each other.

[0043] Figure 28 This is a diagram used to illustrate the relationship between weld width and threshold in the additional manufacturing apparatus according to Embodiment 1.

[0044] Figure 29This diagram is used to explain the method of attaching information to the model through the defect information depiction unit in Embodiment 1.

[0045] Figure 30 This is a flowchart showing the sequence of actions performed by the additional manufacturing apparatus according to Embodiment 1.

[0046] Figure 31 This is a diagram used to illustrate a method for obtaining weld height data using the additional manufacturing apparatus described in Embodiment 2.

[0047] Figure 32 This is a diagram illustrating a structural example of the additional manufacturing apparatus involved in Embodiment 3.

[0048] Figure 33 Figure 1 is used to illustrate the case where the load sensor of the additional manufacturing apparatus according to Embodiment 3 detects the force and torque acting on the wire.

[0049] Figure 34 Figure 2 is used to illustrate the case where the load sensor of the additional manufacturing apparatus according to Embodiment 3 detects the force and torque acting on the wire.

[0050] Figure 35 This is a diagram illustrating the detection of the oscillation width of a wire based on an image of a molten pool taken by a camera from the auxiliary manufacturing apparatus described in Embodiment 3.

[0051] Figure 36 This is a diagram illustrating an example of the structure of the control circuit involved in embodiments 1 to 3.

[0052] Figure 37 This is a diagram illustrating a structural example of the dedicated hardware circuit involved in embodiments 1 to 3. Detailed Implementation

[0053] The defect estimation device, CNC device, auxiliary manufacturing device, and defect estimation method involved in the embodiments will now be described in detail based on the accompanying drawings.

[0054] Implementation method 1.

[0055] Internal defects can arise from a variety of reasons. In particular, in addition manufacturing using the DED method, when wire is used as the material, sometimes the unmelted tip of the wire collides with the workpiece during forming, resulting in a residual residue and thus causing internal defects. Alternatively, sometimes unmelted wire outside the beam's irradiation range rubs against the unsolidified weld bead, resulting in wire friction leaving strip-like marks on the weld bead, thus causing internal defects. Or, sometimes when multiple weld beads are arranged side by side, the weld bead width becomes narrower than intended, resulting in a weld gap phenomenon where gaps are created between adjacent weld beads, thus causing internal defects. In Embodiment 1, the following example is given: in addition manufacturing using the DED method, at least one of the following is determined: the presence or absence of a residual residue, wire friction, or weld gap phenomenon. Based on the determination result, the morphology of the internal defect is estimated.

[0056] Figure 1 This diagram illustrates a structural example of the auxiliary manufacturing apparatus 100 according to Embodiment 1. The auxiliary manufacturing apparatus 100 is a DED (Dual Engagement Equipment) type auxiliary manufacturing apparatus. The auxiliary manufacturing apparatus 100 supplies material to the workpiece 19 and manufactures a shaped object 17 by stacking weld beads 16 formed from material melted using a light beam. The light beam is a heat source that melts the material, such as a laser beam L or an electron beam. In Embodiment 1, a laser beam L is used as an example. Furthermore, in Embodiment 1, the material is a metal wire 14.

[0057] The auxiliary manufacturing apparatus 100 supplies wire 14 to a designated position while irradiating the wire 14 and the workpiece 19 with a laser beam L, thereby forming weld beads 16. Multiple weld beads 16 are arranged on a substrate 18 to form a layer of weld beads 16. The layers of weld beads 16 are stacked to form a deposit of weld beads 16, i.e., a shaped object 17. As described above, the auxiliary manufacturing apparatus 100 stacks weld beads 16 to manufacture a shaped object 17 as a 3D shaped object. Figure 1 The substrate 18 shown is a sheet material. The substrate 18 can also be an object other than a sheet material. The workpiece 19 is an object to which molten material is applied, comprising the substrate 18 and the shaping element 17 in the shaping process. The shaping element 17 is formed on the substrate 18.

[0058] The X, Y, and Z axes are three mutually perpendicular axes. The X and Y axes are two horizontal axes. The Z axis is the vertical axis. In each of the X, Y, and Z axes, the direction indicated by the arrow is set to positive, and the opposite direction is set to negative. The positive Z direction is the vertical direction. Weld bead 16 is stacked in the positive Z direction.

[0059] The auxiliary manufacturing apparatus 100 includes a numerical control (NC) device 1, a laser oscillator 2, an axis drive device 3, a gas supply device 4, a material supply device 5, an analytical device 6, a camera 7, a processing head 8, and a worktable 21. A substrate 18 is fixed to the worktable 21. The laser oscillator 2, axis drive device 3, gas supply device 4, material supply device 5, processing head 8, and worktable 21 constitute a structure that supplies material to the workpiece 19 and manufactures the shaped part of the shaped object 17 by layering weld beads 16 formed from the material molten using a laser beam L.

[0060] The laser oscillator 2, serving as the beam source, outputs a laser beam L. The laser oscillator 2 is an example of a heat source generating device. The laser beam L output from the laser oscillator 2 is transmitted within the optical fiber 20, which serves as the light transmission path, and is directed into the processing head 8. An optical system, such as a collimating optical system or a focusing optical system, is disposed inside the processing head 8. The diagram of the optical system is omitted. The laser oscillator 2, the optical fiber 20, and the processing head 8 constitute an irradiation section that directs the laser beam L toward the workpiece 19.

[0061] The processing head 8 is equipped with a beam nozzle through which the laser beam L emitted from the processing head 8 passes and a gas nozzle 9 that sprays protective gas G toward the processing point. The central axis of the beam nozzle is aligned with the optical axis of the optical system. The central axis of the beam nozzle is also aligned with the Z-axis. That is, the central axis of the laser beam L irradiating the workpiece 19 is aligned with the Z-axis. The laser beam L passes through the internal optical system of the processing head 8 and exits from the processing head 8 through the beam nozzle. The processing point is the position on the workpiece 19 irradiated by the laser beam L, which is the area where the attached wire 14 is applied. In the additional processing of the molten material, the attachment manufacturing apparatus 100 moves the processing point along a moving path.

[0062] The gas supply device 4 supplies protective gas G from a gas supply source to the gas nozzle 9. An example of a gas supply source is a gas cylinder. The gas supply source is connected to the gas nozzle 9 via piping. Illustrations of the gas supply source and piping are omitted. Based on gas supply commands from the NC device 1, the gas supply device 4 can adjust the flow rate of the protective gas G. The injection of the protective gas G reduces oxidation near the processing point and cools the molded object 17. The protective gas G is preferably an inert gas such as argon.

[0063] The material supply device 5 supplies wire 14 towards the processing point. The material supply device 5 has a material supply source 12 and a material supply nozzle 13. The material supply device 5 supplies the wire 14 drawn from the material supply source 12 to the processing point through the material supply nozzle 13. Figure 1The diagram shows an example of a side-supply method where the wire 14 is supplied from a material supply nozzle 13 positioned diagonally above the processing point. The material supply device 5 may also supply the wire 14 from a center position, where it is supplied from the material supply nozzle 13 positioned directly above the processing point, rather than from a side-supply method. The material supply device 5 is operated by a servo motor and can change the supply speed of the wire 14 based on material supply commands from the NC device 1.

[0064] The axis drive unit 3 moves the machining head 8, material supply device 5, and height measuring instrument 11 in the X, Y, and Z axes based on the movement speed command from the NC device 1. The positional relationship between the machining head 8, material supply device 5, and height measuring instrument 11 is fixed. An example of the axis drive unit 3 is a servo motor that moves the machining head 8, material supply device 5, and height measuring instrument 11 in the X-axis direction, a servo motor that moves the machining head 8, material supply device 5, and height measuring instrument 11 in the Y-axis direction, and a servo motor that moves the machining head 8, material supply device 5, and height measuring instrument 11 in the Z-axis direction. Illustrations of each servo motor are omitted. The auxiliary manufacturing device 100 actuates each servo motor, thereby enabling the laser beam L irradiation position, the wire 14 supply position, and the measurement position involved by the height measuring instrument 11 to be moved to any position within the travel range of the machining head 8, material supply device 5, and height measuring instrument 11.

[0065] Camera 7 is an imaging device that takes pictures of the area containing the processing points in the workpiece 19 from a vertical position. As an example, camera 7 acquires an image of the area containing the processing points and outputs the acquired image to the analysis device 6.

[0066] The analysis device 6 analyzes the image input from the camera 7, thereby detecting the width of the weld bead 16 formed in the molten pool 15, i.e., the weld bead width. In other words, the analysis device 6 detects the weld bead width of the weld bead 16 in the forming process. The analysis device 6 outputs the weld bead width detection result to the NC device 1. The molten pool 15 is an accumulation of molten metal that appears when the workpiece 19 and the wire 14 are melted by the irradiation of the laser beam L.

[0067] The height measuring instrument 11 measures the distance, or height, along the Z-axis from a reference position. The height measuring instrument 11 is positioned so that it can move along the X, Y, and Z axes via the axis drive device 3. As an example, the height measuring instrument 11 is a laser displacement sensor. The height measuring instrument 11 outputs the height measurement result to the NC device 1.

[0068] The NC device 1 is a control device that controls the entire auxiliary manufacturing apparatus 100. The NC device 1 controls the auxiliary manufacturing apparatus 100 according to the machining program 23 and machining conditions 22. The machining program 23 describes the movement instructions for moving the machining head 8 and the material supply device 5 in a pre-set path. The machining conditions 22 include information required for the formation of the weld bead 16, such as the output of the laser beam L generated by the laser oscillator 2 (laser output), the speed at which the irradiation position of the laser beam L and the supply position of the wire 14 are moved (movement speed), the speed at which the wire 14 is supplied by the material supply device 5 (material supply speed), and the flow rate of the shielding gas G (gas flow rate).

[0069] The NC device 1 controls the axis drive device 3 according to the machining program 23. The axis drive device 3, under the control of the NC device 1, moves the machining head 8 and the material supply device 5 along a pre-set movement path. Furthermore, the NC device 1 can also correct the Z-axis position of the movement path based on the height measurement of the upper surface of the workpiece 19 obtained by the height measuring instrument 11, in a manner that the movement path conforms to the undulations of the upper surface of the workpiece 19. The upper surface of the workpiece 19 is the machining surface in the workpiece 19 where the weld bead 16 is formed.

[0070] The NC device 1 outputs a laser output command to the laser oscillator 2 according to processing condition 22, thereby controlling the laser oscillator 2. The laser oscillator 2 outputs a laser beam L according to the laser output command. The NC device 1 outputs a material supply command to the material supply device 5 according to processing condition 22, thereby controlling the material supply device 5. The material supply device 5 supplies wire 14 at a material supply speed according to the material supply command. The NC device 1 outputs a movement speed command to the axis drive device 3 according to processing condition 22. The axis drive device 3 moves the irradiation position of the laser beam L and the supply position of the wire 14 at a movement speed according to the movement speed command. The NC device 1 outputs a gas supply command to the gas supply device 4 according to processing condition 22, thereby controlling the gas supply device 4. The gas supply device 4 supplies protective gas G at a gas flow rate according to the gas supply command.

[0071] In Embodiment 1, the NC device 1 functions as a defect estimation device that estimates the morphology of gaps, i.e., internal defects, formed inside the molded object 17. Furthermore, Figure 1 The NC device 1 shown is built into the auxiliary manufacturing apparatus 100. That is, the NC device 1 is one of the structural elements of the auxiliary manufacturing apparatus 100. The NC device 1 can also be an external device of the auxiliary manufacturing apparatus 100.

[0072] The display device 10 displays information related to internal defects via a screen. The display device 10 may be a liquid crystal display (LCD) or an organic EL (Organic Electroluminescence) display, etc. The display device 10 may also display an operation screen for operating the auxiliary manufacturing apparatus 100. As the display device 10, a display from an external computer system of the auxiliary manufacturing apparatus 100 may be used.

[0073] Next, a summary of the operation of the auxiliary manufacturing apparatus 100 will be described. After the substrate 18 is fixed on the worktable 21, the auxiliary manufacturing apparatus 100 operates the laser oscillator 2, the axis drive device 3, the gas supply device 4, and the material supply device 5 under control via the NC device 1. The auxiliary manufacturing apparatus 100 operates the laser oscillator 2, thereby irradiating the processing point with a laser beam L. The auxiliary manufacturing apparatus 100 operates the material supply device 5, thereby supplying wire 14 to the processing point. The auxiliary manufacturing apparatus 100 operates the gas supply device 4, thereby injecting protective gas G towards the processing point. The auxiliary manufacturing apparatus 100 operates the axis drive device 3, thereby moving the processing point along the movement path.

[0074] A molten pool 15 is formed on the workpiece 19 by irradiation with a laser beam L. A weld bead 16 is formed by the formation of the molten pool 15 and the movement of the processing point. The solidified weld beads 16 are stacked to form a shape 17. The auxiliary manufacturing apparatus 100 can measure the height of the upper surface of the workpiece 19 by a height measuring instrument 11 before forming the weld beads 16, and correct the movement path instructed by the processing program 23 accordingly.

[0075] Next, the functions of NC device 1 will be explained. Figure 2 This diagram illustrates an example of the functional structure of the NC device 1 included in the auxiliary manufacturing apparatus 100 according to Embodiment 1. Processing conditions 22 are input to the NC device 1, thereby assigning information on laser output, movement speed, material supply speed, and gas flow rate to the NC device 1. A processing program 23 is input to the NC device 1, thereby instructing the NC device 1 to move along a path.

[0076] The NC device 1 includes a control input / output unit 24, a melt position calculation unit 25, a weld height calculation unit 26, a defect estimation unit 27, a defect information evaluation unit 31, a defect information storage unit 33a, and a defect information depiction unit 34. The defect information storage unit 33a maintains the processing data storage table 33.

[0077] Processing conditions 22 and processing program 23 are input to the control input / output unit 24. The result of measuring the height of the upper surface of the workpiece 19 using the height measuring instrument 11 is also input to the control input / output unit 24. The control input / output unit 24 can correct the movement path instructed by the processing program 23 in accordance with the height of the upper surface of the workpiece 19. Based on the input processing conditions 22 and the input processing program 23, the control input / output unit 24 generates laser output commands, movement speed commands, material supply commands, and gas supply commands.

[0078] The control input / output unit 24 outputs a laser output command to the laser oscillator 2. The control input / output unit 24 outputs a movement speed command to the shaft drive device 3. The control input / output unit 24 outputs a material supply command to the material supply device 5. The control input / output unit 24 outputs a gas supply command to the gas supply device 4. Furthermore, in... Figure 2 The gas supply device 4 is omitted from the diagram. The laser output, moving speed, and material supply speed can sometimes be varied through control during modeling.

[0079] The control input / output unit 24 obtains feedback values ​​of the laser output from the laser oscillator 2. The control input / output unit 24 obtains feedback values ​​of the movement speed and movement path from the shaft drive device 3. The control input / output unit 24 obtains feedback values ​​of the material supply speed from the material supply device 5. As described above, the control input / output unit 24 obtains these feedback values ​​as a result of the auxiliary manufacturing device 100 actually operating according to each instruction. The control input / output unit 24 outputs the obtained feedback values ​​to the melt position calculation unit 25 and the weld height calculation unit 26.

[0080] The feedback value output from the control input / output unit 24 is used in the calculation of the wire melting position in the melting position calculation unit 25 and the calculation of the weld height in the weld height calculation unit 26. The wire melting position is the location where the temperature of the wire 14 reaches its melting point. In other words, the wire melting position is the position at the tip of the portion of the wire 14 that causes a change in state from solid to liquid. In the following description, the wire melting position is sometimes simply referred to as the melting position. The weld height is the height of the weld 16 in the direction of the weld 16 stacking, i.e., in the Z-axis direction.

[0081] The melting position calculation unit 25 calculates the wire melting position based on the material supply speed and laser output. Feedback values ​​for laser output, material supply speed, and movement path are input to the melting position calculation unit 25. The melting position calculation unit 25 calculates the wire melting position based on these feedback values, the physical property values ​​of the wire 14, and the mechanical parameters of the auxiliary manufacturing apparatus 100. Here, the physical property values ​​are various physical properties related to the melting of the wire 14, such as melting point, absorptivity of the laser beam L, heat capacity, or thermal conductivity. The mechanical parameters are geometric information such as the wire supply angle or the laser beam diameter. The wire supply angle is the angle between the direction of travel of the wire 14 supplied to the workpiece 19 and the X-axis. The laser beam diameter is the diameter of the laser beam L incident on the workpiece 19. The melting position calculation unit 25 outputs the calculated wire melting position to the defect estimation unit 27.

[0082] The weld height calculation unit 26 receives feedback values ​​for material supply speed, moving speed, and moving path, as well as the weld width detection result obtained from the analysis device 6. Based on these feedback values ​​and the weld width of the weld 16 being shaped, the weld height calculation unit 26 calculates the weld height of the weld 16 being shaped. Alternatively, the weld height calculation unit 26 can also assume that the laser beam diameter is the same as the weld width and calculate the weld height based on these feedback values ​​and the laser beam diameter. The weld height calculation unit 26 outputs the calculated weld height to the defect estimation unit 27.

[0083] The defect estimation unit 27 determines the presence or absence of the first, second, and third phenomena, and based on the determination result, calculates defect information representing the morphology of internal defects. The first phenomenon is the collision of unmelted material with the workpiece 19, which is the aforementioned residual root phenomenon. The second phenomenon is the formation of a mark on the weld bead 16 due to friction of unmelted material, which is the aforementioned wire friction phenomenon. The third phenomenon is the formation of a gap between adjacent weld beads 16, which is the aforementioned weld bead gap phenomenon. The defect information includes at least one piece of information: the presence or absence of internal defects, the number of internal defects, the length of internal defects, and the size of internal defects. The length of the internal defect is the length in the direction of travel of the movement path when forming the weld bead 16. The size of the internal defect is the area of ​​the internal defect in a plane perpendicular to the travel direction.

[0084] The defect estimation unit 27 is input with the calculation results of the wire melting position, the calculation results of the weld height, and the detection results of the weld width obtained by the analysis device 6. The defect estimation unit 27 has a first determination unit 28, a second determination unit 29, and a third determination unit 30.

[0085] The first determination unit 28 determines the presence or absence of residual root phenomenon based on the melt position calculated by the melt position calculation unit 25. If residual root phenomenon is determined to have occurred, the first determination unit 28 calculates defect information related to internal defects caused by the residual root phenomenon. Based on the duration of the residual root phenomenon, the number of times the residual root phenomenon occurs, and the collision depth of the wire 14 towards the workpiece 19, the first determination unit 28 calculates first defect information including at least one of the following: the number of internal defects, the size of the internal defects, and the length of the internal defects. The first determination unit 28 outputs the calculated first defect information to the defect information evaluation unit 31.

[0086] The second determination unit 29 determines the presence or absence of wire friction based on the weld height calculated by the weld height calculation unit 26. If wire friction is determined to have occurred, the second determination unit 29 calculates defect information related to internal defects caused by the wire friction. Based on the duration of the wire friction, the number of times the wire friction occurs, and the interference depth between the wire 14 and the weld 16, the second determination unit 29 calculates at least one second defect information, including the number of internal defects, the size of the internal defects, and the length of the internal defects. The second determination unit 29 outputs the calculated second defect information to the defect information evaluation unit 31. Furthermore, when the upper surface of the workpiece 19 is inclined relative to the XY plane, the second determination unit 29 considers the inclination of the upper surface of the workpiece 19 when determining the presence or absence of wire friction.

[0087] The third determination unit 30 determines the presence or absence of a weld gap phenomenon based on the movement path and weld width. If a weld gap phenomenon is determined to have occurred, the third determination unit 30 calculates defect information related to internal defects caused by the weld gap phenomenon. Based on the duration of the weld gap phenomenon, the number of times the weld gap phenomenon occurs, and the width of the gap, the third determination unit 30 calculates at least one third defect information, including the number of internal defects, the size of the internal defects, and the length of the internal defects. The third determination unit 30 outputs the calculated third defect information to the defect information evaluation unit 31.

[0088] The defect information evaluation unit 31 writes at least one of the defect information calculated by the defect estimation unit 27—namely, the first defect information, the second defect information, and the third defect information—to the processing data storage table 33. By writing the defect information to the processing data storage table 33, the defect information is stored in the defect information storage unit 33a. By storing the defect information, the morphology of the internal defects contained in the overall form of the object 17 can be determined after shaping.

[0089] The defect information evaluation unit 31 calculates the defect impact degree, which is a numerical representation of the magnitude of the impact of internal defects on the quality of the molded object 17, based on the defect information, and thereby evaluates the internal defects. The defect information evaluation unit 31 calculates the defect impact degree for each location of the molded object 17 based on at least one of the first defect information calculated by the first determination unit 28, the second defect information calculated by the second determination unit 29, and the third defect information calculated by the third determination unit 30. The calculated defect impact degree data is associated with location information and time information and stored in the processing data storage table 33. The location information indicates the location within the molded object 17. The time information indicates the time during which the molding process was performed.

[0090] Furthermore, in the processing data storage table 33, the forming model 32, the image of the molten pool, the processing program 23, the processing conditions 22, and various feedback values ​​obtained through the control input / output unit 24 are stored in association with position and time information. The user of the auxiliary manufacturing device 100 can refer to the various information stored in the processing data storage table 33 after processing. Since this information is associated with position and time information, it can be used for traceability by comparing data related to the location of internal defects in the forming object 17. In addition, Figure 2 The shape model 32 shown is input to the NC device 1 independently of the machining program 23. The NC device 1 can generate information equivalent to the shape model 32 based on the machining program 23 or the machining conditions 22, and use the generated information instead of the shape model 32.

[0091] The defect information depiction unit 34 reads defect impact data from the processing data storage table 33. The defect information depiction unit 34 generates an image that visually represents the distribution of values ​​stored in the defect information storage unit 33a through a model of the object 17. The defect information depiction unit 34 appends the defect impact data to the model 32, thereby visualizing the quality evaluation results related to the object 17. Appending the defect impact data may involve, for example, appending a color representing the range of defect impact values ​​to the model 32. The defect information depiction unit 34 outputs the generated image to the display device 10. The user can visually confirm the quality of the object 17 based on the image displayed on the display device 10. Furthermore, the data appended to the model 32 is not limited to defect impact data. The defect information depiction unit 34 may also append any information stored in the processing data storage table 33 to the model 32.

[0092] Next, the method for calculating the melting position of the wire implemented by the melting position calculation unit 25 will be explained. Figure 3 This diagram illustrates the case where the shaped object 17 is formed using the additional manufacturing apparatus 100 according to Embodiment 1. Figure 3 The diagram schematically illustrates the formation of weld beads 16 on the workpiece 19.

[0093] “θ” is the angle between the direction of travel of the wire 14 from the material supply nozzle 13 toward the workpiece 19 and the X-axis, which is perpendicular to the center line CN of the laser beam L. “θ” indicates the direction of the wire 14 supplied to the workpiece 19. “R” is the diameter of the laser beam L in the plane perpendicular to the center line CN. The tip position MP of the wire 14 is the position within the wire 14 where the temperature reaches the melting point of the wire 14 after being irradiated by the laser beam L.

[0094] The intersection of the centerline CN of the laser beam L and the travel direction of the wire 14 is called the machining reference point RP. In the case of shaping via standard program instructions, shaping begins from the position where the machining reference point RP coincides with the upper surface of the workpiece 19. Furthermore, the intersection of the boundary line LN of the direction in which the wire 14 enters the laser beam L and the travel direction of the wire 14 is called the wire entry point LP.

[0095] "h" is the distance along the Z-axis from the upper surface of the workpiece 19 to the machining reference point RP, and is the offset distance of the machining head 8. The auxiliary manufacturing device 100 can change "h" before or during machining.

[0096] "H" is the distance along the Z-axis from the upper surface of the workpiece 19 to the front end position MP. That is, "H" is the distance between the position in the wire 14 that causes the change from solid to liquid state and the upper surface of the workpiece 19, and the distance between the molten position of the wire and the processing surface.

[0097] L m "L" is the distance along the Z-axis between the wire entry point LP and the front end position MP. m "It can be described as the distance that wire 14 moves from the point where it protrudes into the irradiation range of the laser beam L until it reaches its melting point. The melting position calculation unit 25 calculates the melting position of the wire, which refers to the distance representing the melting position of the wire, i.e., "L". m "Perform calculations."

[0098] Figure 4 This is a diagram used to illustrate the calculation of the wire melting position in Embodiment 1. Figure 4 The diagram illustrates "L" in two scenarios where the laser output or material supply speeds differ from each other. m ".exist Figure 4 In the case shown in (a), with Figure 4Compared to scenario (b), the laser output is sometimes higher or the material supply rate is slower. In scenario (a), the temperature of wire 14 reaches its melting point much faster than in scenario (b). Therefore, in scenario (a), the "L"... m "L in case (b)" m "Shorter. As mentioned above, the front end position MP changes depending on the processing conditions, "L" m "Also changed. Accompanied by "L" m The letter "H" also changes with the change in the character "".

[0099] Here, it is assumed that the heat applied to the wire 14, other than the heat absorbed by the laser beam L, is sufficiently small compared to the absorbed heat. That is, heat conduction from the workpiece 19 to the wire 14 is negligible, and the temperature of the wire 14 within the laser beam L is determined solely by the irradiation of the laser beam L.

[0100] L m "It is expressed by the following formula (1)."

[0101] L m =K×(F WC / P C ) · · · (1)

[0102] “F WC "P" is a feedback value indicating the material supply rate. C " is the feedback value of the laser output. "K" is a constant obtained by summing the physical properties of the wire 14 and the mechanical parameters of the auxiliary manufacturing device 100, i.e., sinθ. The command values ​​for the material supply speed and the laser output are included in the processing conditions 22.

[0103] Next, the method for calculating the weld height implemented by the weld height calculation unit 26 will be explained. Figure 5 This is a diagram used to explain the calculation of the weld bead height in Embodiment 1. In Figure 5 The YZ cross-section of weld 16 is shown. The weld height calculation unit 26 calculates the weld height, i.e., "h", based on the cross-sectional area of ​​weld 16, the cross-sectional shape of weld 16, and the weld width W. b "It is estimated that the cross-sectional area of ​​weld 16 is the area of ​​the YZ section of weld 16. The cross-sectional shape is the shape of the YZ section of weld 16."

[0104] The weld bead height calculation unit 26 calculates the volume of the weld bead 16 per unit length in the travel direction based on the "h" value. b The calculation is performed. The weld height calculation unit 26 can also calculate the height based on the material supply speed, the moving speed of the laser beam L in the workpiece 19, and the width of the weld 16. bThe calculation is performed. The weld height calculation unit 26 can treat the result obtained by dividing the material supply speed by the moving speed as the cross-sectional area. If the cross-sectional shape is assumed to be a circle containing an arc, then the weld width W is the width in the direction perpendicular to the stacking direction and the traveling direction. In addition, the weld height calculation unit 26 can also estimate the weld height by methods other than those described in Embodiment 1.

[0105] Figure 6 This is a schematic diagram of the molten pool image used to calculate the weld width W in Embodiment 1. The molten pool image is an image obtained by taking a picture of the weld 16 in the shape from directly above in the Z-axis direction. The analysis device 6 calculates the weld width W related to the weld 16 in the shape based on the molten pool image taken by the camera 7. The weld height calculation unit 26 may also replace the weld width W by using the diameter of the laser beam L, i.e., "R", to calculate "h". b "Calculations are performed. The weld height calculation unit 26 uses the geometric relationships inherent in a circle to calculate "h". b "Perform calculations."

[0106] Next, we will explain how to determine the presence or absence of residual root phenomena and how to calculate defect information related to internal defects caused by residual root phenomena. Figure 7 This diagram illustrates the occurrence of residual root phenomenon in the auxiliary manufacturing apparatus 100 according to Embodiment 1. The first determination unit 28 determines the presence or absence of residual root phenomenon based on the calculated positional relationship between the melting position and the processing surface in the workpiece 19 where the weld bead 16 is formed.

[0107] exist Figure 7 In this context, the front end position MP is set to be lower than the upper surface of the workpiece 19. If the depth of the molten pool in the workpiece 19 is disregarded, the presence or absence of residual material can be determined based on the value of "H". "H" can be determined based on... Figure 3 The positional relationship shown is used to determine “H”. “L” is calculated using equation (1). m ", is represented by the following formula (2).

[0108] H = h + (R / 2) · tanθ - L m · · · (2)

[0109] When "H" is positive, the change in state from solid to liquid in wire 14 occurs above the upper surface of the workpiece 19, therefore no residual root occurs. When "H" is negative, as... Figure 7As shown, the change in state from solid to liquid of the wire 14 occurs below the upper surface of the workpiece 19. In actual forming, the leading edge position MP does not travel downwards compared to the upper surface of the workpiece 19, thus causing a residual root phenomenon where the wire 14 collides with the workpiece 19. If the first determination unit 28 determines that a residual root phenomenon has occurred, it determines that an internal defect has been generated. When "H" is negative, the absolute value of "H" represents the collision depth of the wire 14 with the workpiece 19. The larger the absolute value of "H" is, the more intense the collision between the wire 14 and the workpiece 19. As described above, the first determination unit 28 determines the presence or absence of a residual root phenomenon based on the positional relationship between the molten position of the wire and the processing surface in the workpiece 19 where the weld bead 16 is formed.

[0110] The first determination unit 28 determines defect information related to internal defects caused by the occurrence of residual root phenomenon based on at least one of the following: the number of times the residual root phenomenon occurs, the duration of the residual root phenomenon, and the distance between the wire melting position and the processing surface.

[0111] Figure 8 This is Figure 1, used to explain the relationship between the morphology of the residual phenomenon and the internal defects that occur in the auxiliary manufacturing apparatus 100 according to Embodiment 1. Figure 9 It means in Figure 8 A diagram illustrating an example of an internal defect that occurs in case (a) shown. Figure 10 It means in Figure 8 A diagram illustrating an example of an internal defect arising in scenario (b). Figure 8 In cases (a) and (b) shown, "H" is negative, indicating a residual root phenomenon. In case (b), the absolute value of "H" is larger than that in case (a). Figure 10 The size of the internal defect 36 shown is greater than Figure 9 The dimensions of the internal defect 36 are shown. The first determination unit 28 can estimate the dimensions of the internal defect 36 based on the calculated value of "H".

[0112] Figure 11 This is Figure 2, used to illustrate the relationship between the morphology of the residual phenomenon and internal defects that occur in the auxiliary manufacturing apparatus 100 according to Embodiment 1. Figure 12 It means in Figure 11 A diagram illustrating an example of an internal defect that occurs in the situation shown. Figure 11 The diagram shows the case where the shape continues to form while "H" remains negative. Residual root phenomena continuously occur within interval 37, thereby forming an internal defect 36 that extends throughout interval 37. The first determination unit 28 can estimate the length of the internal defect 36 by determining the interval 37 where "H" is negative.

[0113] Figure 13 Figure 3 is used to explain the relationship between the morphology of the residual phenomenon and the internal defects that occur in the auxiliary manufacturing apparatus 100 according to Embodiment 1. Figure 14 It means in Figure 13 A diagram illustrating an example of an internal defect that occurs in the situation shown. Figure 13 This indicates that "H" changes from a positive value to a negative value multiple times per unit distance. The first determination unit 28 determines that an internal defect 36 has occurred each time "H" changes from a positive value to a negative value. The first determination unit 28 counts the number of times "H" changes from a positive value to a negative value, thereby estimating the number N of internal defects 36 per unit distance.

[0114] Figure 15 Figure 4 is used to illustrate the relationship between the morphology of residual phenomena and internal defects occurring in the auxiliary manufacturing apparatus 100 according to Embodiment 1. Figure 15 The image shows an example of the relationship between the trajectory of the front-end position MP during shaping and the internal defect 36 generated by the residual root phenomenon.

[0115] The front-end position MP is plotted based on "H" calculated according to various feedback values, thereby determining the position of the front-end position MP in the Z-axis direction relative to the upper surface of the workpiece 19. Based on the trajectory of the front-end position MP, it is visually possible to determine that an internal defect 36 will occur in the interval 38 where "H" is negative, i.e., lower than the upper surface of the workpiece 19. The first determination unit 28 analyzes the duration of the negative "H" value and the number of times "H" changes from positive to negative per unit distance, thereby determining defect information including at least one of the following: the number of internal defects 36, the size of the internal defects 36, and the length of the internal defects 36. Thus, the first determination unit 28 estimates the first defect information, which includes at least one of the following: the number of internal defects 36, the length of the internal defects 36, and the size of the internal defects 36. Furthermore, the first determination unit 28 can also determine the first defect information including information other than the number of internal defects 36, the size of the internal defects 36, or the length of the internal defects 36.

[0116] Next, we will explain how to determine the presence or absence of wire friction and how to calculate defect information related to internal defects caused by wire friction. Figure 16 This diagram illustrates the occurrence of wire friction in the auxiliary manufacturing apparatus 100 according to Embodiment 1. The second determination unit 29 determines the presence or absence of wire friction based on the calculated relationship between the weld bead height and the wire protrusion point LP.

[0117] exist Figure 16The image shows the state where the leading end of the wire 14 enters the unsolidified weld bead 16, i.e., interference occurs between the wire 14 and the weld bead 16. The second determination unit 29 can determine the weld bead 16 based on the "h" value. b The offset distance between the wire and the processing head 8, i.e., "h", is used to determine whether or not there is wire friction.

[0118] according to Figure 16 Given the geometrical positional relationship between the wire 14 and the weld bead 16, when the uppermost part of the weld bead 16 is positioned higher than the wire protrusion point LP, interference will occur between the wire 14 and the weld bead 16 outside the irradiation range of the laser beam L. Consequently, wire friction will occur if equation (3) is satisfied.

[0119] h b >R / 2·tanθ+h · · · (3)

[0120] When equation (3) holds, that is, when wire friction occurs, the interference distance I is expressed by the following equation (4).

[0121] I = h b -(R / 2·tanθ+h) · · · (4)

[0122] The interference distance I is the distance in the Z-axis direction between the upper surface of weld bead 16 and the wire protrusion LP. The interference distance I shown in equation (4) is the difference obtained by subtracting the right side of equation (3) from the left side of equation (3). As described above, the second determination unit 29 is based on "h b The relationship between the wire and the wire protrusion LP is used to determine whether or not there is wire friction.

[0123] The second determination unit 29 determines, based on at least one of the following: the number of times the wire friction phenomenon occurs, the duration of the wire friction phenomenon, and the distance between the processing surface and the wire protrusion LP, the defect information related to the internal defects caused by the occurrence of the wire friction phenomenon.

[0124] Figure 17 This is Figure 1, used to illustrate the relationship between wire friction phenomena and internal defects occurring in the additional manufacturing apparatus 100 according to Embodiment 1. Figure 18 It means in Figure 17 A diagram illustrating an example of an internal defect that occurs in case (a) shown. Figure 19 It means in Figure 17 A diagram illustrating an example of an internal defect arising in scenario (b). Figure 17In cases (a) and (b) shown, equation (3) is satisfied, and wire friction occurs. In case (b), the interference distance I is longer than in case (a). The longer the interference distance I, the deeper the wire 14 penetrates into the weld bead 16.

[0125] Figure 19 The size of the internal defect 36 shown is greater than Figure 18 The dimensions of the internal defect 36 are shown. The second determination unit 29 can estimate the dimensions of the internal defect 36 based on the calculated interference distance I. In addition, the second determination unit 29 calculates the length of the interval that satisfies equation (3), thereby estimating the length of the internal defect 36. Furthermore, the second determination unit 29 counts the number of times equation (3) is satisfied, thereby estimating the number of internal defects 36 per unit distance.

[0126] Figure 20 This is Figure 2, used to illustrate the relationship between wire friction phenomena and internal defects occurring in the auxiliary manufacturing apparatus 100 according to Embodiment 1. Figure 20 The diagram shows an example of the relationship between the trajectory of the wire protrusion LP during shaping and the internal defect 36 caused by wire friction.

[0127] Based on various feedback values ​​and "h" b "The wire protrusion LP is drawn so that the shape of the formed weld bead 16 overlaps with the trajectory of the wire protrusion LP. This allows for visual identification of the internal defect 36 that occurs in the interval 39 that satisfies equation (3). In addition, the magnitude of the interference distance I in the interval 39 can also be visually represented. Based on the drawing of the wire protrusion LP, the second determination unit 29 analyzes the interference distance I, the interval 39, and the number of times equation (3) is satisfied per unit distance. This allows for the determination of defect information, including the number of internal defects 36, the size of internal defects 36, or the length of internal defects 36. Thus, the second determination unit 29 estimates the second defect information, which includes at least one piece of information, namely the number of internal defects 36, the length of internal defects 36, and the size of internal defects 36. Furthermore, the second determination unit 29 can also determine the second defect information, which includes information other than the number of internal defects 36, the size of internal defects 36, or the length of internal defects 36."

[0128] exist Figures 17 to 20 The example shown is an instance where the presence or absence of wire friction is determined without considering the inclination of the upper surface of the workpiece 19. When the upper surface of the workpiece 19 is inclined relative to the XY plane, the second determination unit 29 determines the presence or absence of wire friction by considering the inclination of the upper surface of the workpiece 19.

[0129] Next, we will explain how to determine the presence or absence of weld gap phenomena and how to calculate defect information related to internal defects caused by weld gap phenomena. Figure 21 This diagram illustrates the occurrence of weld gap phenomenon in the auxiliary manufacturing apparatus 100 according to Embodiment 1. Figure 21 The image shows two weld beads 16 that are adjacent to each other in the X-axis direction as viewed from above, and a cross-section of the two weld beads 16. Figure 21 The cross-section shown is perpendicular to the Y-axis, which is the direction of travel when each weld pass 16 is formed. Figure 21 The two weld beads 16 shown are formed on the machined surface of the workpiece 19.

[0130] The third determination unit 30 determines the presence or absence of weld gap phenomenon based on a result obtained by comparing a threshold calculated according to the spacing between weld beads 16 arranged side by side in the machined surface and the width of the overlapping portion of weld beads 16 with the width of the weld beads 16.

[0131] After one of the two weld beads 16 is formed, another weld bead 16 is formed in the XY plane at a certain distance from the first weld bead. This distance is called the side-by-side spacing P. The width of the overlapping portion of the weld beads 16 is called the side-by-side overlap O. The width of the formed weld bead 16 is considered to be the same as the weld bead width W calculated by the analytical device 6. The weld gap phenomenon occurs when the weld bead width W of the weld bead 16 becomes too small relative to the side-by-side spacing P, because the material of the weld bead 16 does not wet and extend to the weld bead 16 adjacent to it.

[0132] Figure 22 Figure 1 shows a state in which adjacent weld beads 16 are formed by the additional manufacturing apparatus 100 according to Embodiment 1. Figure 23 yes Figure 22 A cross-sectional view of weld bead 16 along line XXIII-XXIII. Figure 24 It means in Figure 23 The cross-sectional view shown shows the state in which weld beads 16 are stacked. Figure 25 Figure 2 shows a state in which weld beads 16 adjacent to each other are formed by the additional manufacturing apparatus 100 according to Embodiment 1. Figure 26 yes Figure 25 The cross-sectional view of weld bead 16 at line XXVI-XXVI shown. Figure 27 It means in Figure 26 The cross-sectional view shown shows the state in which weld beads 16 are stacked.

[0133] exist Figures 22 to 24 The diagram shows a state where each weld bead 16 is formed with the desired weld bead width W. Figure 22 and Figure 23The image shows the state in which three weld passes 16 are formed sequentially in the negative Y direction. Figure 24 The text is a jumbled collection of characters and phrases, seemingly from different sources and lacking coherent sentences. A direct translation wouldn't be meaningful. Figure 22 and Figure 23 The diagram shows a state where three weld passes 16 are stacked on top of three existing weld passes 16. Figure 22 and Figure 23 In this configuration, each weld bead 16 is formed with a weld bead width W appropriate to the side-by-side spacing P, thus preventing gaps between weld beads 16. Therefore, as... Figure 24 As shown, even with 16 layers of weld beads, no internal defects 36 caused by weld bead gaps will occur.

[0134] exist Figure 25 and Figure 26 The diagram shows a portion of the third weld bead 16 formed out of three weld beads 16, where the width is reduced compared to the desired weld bead width W. (See diagram for example.) Figure 25 and Figure 26 As shown, in the portion where the width of weld bead 16 is reduced compared to the weld bead width W, gaps are created because weld bead 16 is not filled. Figure 27 As shown, if weld beads 16 are stacked, internal defects 36 caused by this gap will occur.

[0135] As described above, the weld gap phenomenon occurs when the weld width W of weld 16 becomes too small relative to the side-by-side spacing P. Therefore, the third determination unit 30 determines the presence or absence of the weld gap phenomenon based on the weld width W detected by the analysis device 6. The third determination unit 30 determines that a weld gap phenomenon has occurred if the following equation (5) is satisfied. T is a preset threshold.

[0136] W < T · · · (5)

[0137] The threshold T is represented, for example, by the side spacing P, side overlap O, and weld width W, as shown in Equation (6) below. δ is a coefficient representing the margin relative to the ideal weld width W.

[0138] T=(P+O)×δ · · · (6)

[0139] As described above, the third determination unit 30 determines the presence or absence of weld gap phenomenon based on the result obtained by comparing the threshold T calculated by the parallel spacing P and the parallel overlap O with the weld width W.

[0140] The third determination unit 30 calculates defect information related to the internal defect 36 caused by the weld gap phenomenon based on the number of times the weld gap phenomenon occurs, the duration of the weld gap phenomenon, the difference between the threshold T and the weld width W.

[0141] Figure 28This is a diagram used to explain the relationship between the weld width W and the threshold T in the additional manufacturing apparatus 100 according to Embodiment 1. Interval 40 is the interval where the weld width W is less than the threshold T, that is, the interval that satisfies equation (5). The smaller the weld width W is relative to the threshold T, the larger the gap is generated because adjacent welds 16 cannot contact each other, and thus a larger internal defect 36 is generated. Therefore, when equation (5) is satisfied, the third determination unit 30 can estimate the size of the internal defect 36 based on the difference obtained by subtracting the weld width W from the threshold T. In addition, the third determination unit 30 calculates the length of the interval 40 that satisfies equation (5), thereby estimating the length of the internal defect 36. Furthermore, the third determination unit 30 counts the number of times equation (5) is satisfied, thereby estimating the number of internal defects 36 per unit distance. Thus, the third determination unit 30 estimates the third defect information, which includes at least one piece of information: the number of internal defects 36, the length of internal defects 36, and the size of internal defects 36. In addition, the third determination unit 30 can also determine third defect information, which includes information other than the number of internal defects 36, the size of internal defects 36, or the length of internal defects 36.

[0142] Next, the evaluation method for internal defects implemented by the defect information evaluation unit 31 will be explained. The defect information evaluation unit 31 weights the data contained in the first defect information, the second defect information, and the third defect information, and quantifies the impact on quality for internal defects at each location of the shape 17.

[0143] The defect information includes values ​​for multiple items related to the morphology of internal defects, such as the number of internal defects, the length of internal defects, and the size of internal defects. The weighting method is, for example, by multiplying the value of each item in the defect information for a specific location by a coefficient. The defect information evaluation unit 31 sums the values ​​obtained by multiplying by the coefficients, thereby calculating the defect impact. As described above, the defect information evaluation unit 31 applies weights to the values ​​of each item according to coefficients set according to the item category, sums the values ​​of each item, and thereby calculates the defect impact.

[0144] The impact of a defect can be calculated, for example, by the following equation (7). The coefficients of α, β, and γ correspond to the impact on quality and can be arbitrarily set by the user for each item included in the defect information.

[0145] Defect impact = α × (number of internal defects) + β × (maximum size of internal defects) + γ × (length of internal defects) ... (7)

[0146] In equation (7), the number of internal defects is the number of internal defects present in each unit length interval in the direction of travel. The maximum size of the internal defect is the maximum size of the internal defect present in each unit length interval in the direction of travel. The length of the internal defect is the length of the internal defect present in each unit length interval in the direction of travel. The defect information evaluation unit 31 calculates the defect impact degree, thereby evaluating the impact of internal defects caused by at least one of the following—residual root phenomenon, wire friction phenomenon, and weld gap phenomenon—on the quality at each location of the form 17.

[0147] Next, the information stored in the processing data storage table 33 will be explained. The processing data storage table 33 includes information such as defect details, defect impact data, and the distance representing the wire melting location, i.e., "L". m "and weld height, i.e., "h" b "The information calculated by the NC device 1 is stored in association with position and time information. Furthermore, in the processing data storage table 33, the command values ​​for laser output, material supply speed, and movement speed, as well as the feedback values ​​for these parameters, are stored in association with position and time information. Additionally, in the processing data storage table 33, information from sensors, such as weld width W and molten pool image, and information prepared or set by the user, such as processing conditions 22, processing program 23, and model 32, are stored in association with position and time information."

[0148] This information is stored in the processing data storage table 33, allowing the NC device 1 to calculate the distribution of internal defects in the overall forming process or the average value of data in the overall forming process based on this stored data. Furthermore, the information stored in the processing data storage table 33 is associated with location and time information, allowing the NC device 1 to refer to data corresponding to any location or time by specifying the location or time. For example, the user can effectively use the movement path, laser output, or melt pool image of areas with high quality impact (i.e., areas with high defect impact) to confirm the state of the forming process or improve forming conditions. As described above, various information stored in the processing data storage table 33 can be used for traceability.

[0149] Next, the method of attaching the information stored in the processing data storage table 33 to the model 32 by the defect information depiction unit 34 will be explained. Figure 29 This diagram illustrates the method of attaching information to the model 32 via the defect information depiction unit 34 in Embodiment 1. Figure 29 An example of a model 32 with added data on the impact of defects is shown.

[0150] Figure 29 The example shown represents the magnitude of the defect impact value for each location in the model 32 using color differentiation. Figure 29 In this process, color differentiation is represented by the density of halftone dots. The defect information depiction unit 34 compares the positional information associated with the defect impact data with the positional information of the model 32, thereby applying color differentiation corresponding to the defect impact data to the model 32. The defect information depiction unit 34 outputs the generated image to the display device 10. The user can visually confirm the quality of the object 17 based on the image displayed on the display device 10. The user can easily grasp the quality of each position of the object 17.

[0151] The data attached to the model 32 is not limited to data on the degree of defect impact and can be specified by the user. The defect information depiction unit 34 attaches data related to the information specified from the information stored in the processing data storage table 33 to the model 32. The defect information depiction unit 34 attaches data to the model 32 by changing the color or texture of each position of the model 32 based on the range or symbol of the value. The user can visually confirm the data related to various information based on the image displayed on the display device 10. By referring to the model 32 with the information on the degree of defect impact and the model 32 with information such as laser output, moving speed, or material supply speed, the user can easily grasp the relationship between the quality of laser output, moving speed, or material supply speed.

[0152] Next, the sequence of actions performed by the additional manufacturing device 100 will be explained. Figure 30 This is a flowchart showing the sequence of operations performed by the auxiliary manufacturing apparatus 100 according to Embodiment 1.

[0153] In step S1, the auxiliary manufacturing device 100, through the NC device 1, causes the laser oscillator 2, the shaft drive device 3, the material supply device 5 and the gas supply device 4 to operate according to the processing program 23 and the processing conditions 22, thereby starting the shaping process.

[0154] In step S2, the auxiliary manufacturing apparatus 100 calculates the wire melting position based on the material supply rate and laser output using the melting position calculation unit 25. The melting position calculation unit 25 calculates the distance representing the wire melting position, i.e., "L". m "Perform calculations."

[0155] In step S3, the auxiliary manufacturing apparatus 100 calculates the weld height using the weld height calculation unit 26, based on the material supply speed, the moving speed, and the weld width W. The weld height calculation unit 26 calculates the weld height, i.e., "h", based on the material supply speed, the moving speed, and the weld width W detected by the analysis device 6. b "Perform calculations."

[0156] In step S4, the auxiliary manufacturing apparatus 100 determines the presence or absence of three phenomena: a first phenomenon (residual root phenomenon), a second phenomenon (wire friction phenomenon), and a third phenomenon (weld gap phenomenon) using the defect estimation unit 27, and calculates defect information based on the determination results. If the first determination unit 28 determines that a residual root phenomenon has occurred, the defect estimation unit 27 calculates first defect information related to internal defects caused by the residual root phenomenon. If the second determination unit 29 determines that a wire friction phenomenon has occurred, the defect estimation unit 27 calculates second defect information related to internal defects caused by the wire friction phenomenon. If the third determination unit 30 determines that a weld gap phenomenon has occurred, the defect estimation unit 27 calculates third defect information related to internal defects caused by the weld gap phenomenon.

[0157] In step S5, the auxiliary manufacturing apparatus 100 calculates the degree of defect impact based on defect information using the defect information evaluation unit 31. The defect information evaluation unit 31 weights the data contained in the first, second, and third defect information, and calculates the degree of defect impact by summing the weighted data.

[0158] In step S6, the auxiliary manufacturing apparatus 100 stores various data, including defect information and defect impact, in the defect information storage unit 33a in association with location information and time information.

[0159] In step S7, the auxiliary manufacturing device 100 determines whether to end the forming process via the NC device 1. If the determination is that the forming process should not end (step S7, No), the auxiliary manufacturing device 100 will sequentially return to step S2 to continue the forming process.

[0160] On the other hand, if the modeling process is deemed complete (step S7, Yes), the defect information depiction unit 34 generates an image that visually represents the distribution of values ​​stored in the defect information storage unit 33a through the model of the object 17. The defect information depiction unit 34 outputs the generated image to the display device 10. Furthermore, in step S8, the auxiliary manufacturing apparatus 100 displays the image visually representing the distribution of values ​​stored in the defect information storage unit 33a through the model of the object 17 on the display device 10. Thus, the auxiliary manufacturing apparatus 100 concludes. Figure 30 The actions performed in the sequence shown.

[0161] Furthermore, the NC device 1 can reflect the defect information calculated by the defect estimation unit 27 in the processing conditions 22 of the subsequent processing after the processing in which the defect information was calculated. That is, the NC device 1 can adjust the processing conditions 22 of the subsequent processing after the processing in which the defect information was calculated based on the defect information. When defect information is calculated in a certain processing, the NC device 1 adjusts the processing conditions 22 of the next processing, which is the same as that processing, based on the defect information. The NC device 1 makes adjustments to the laser output, moving speed, or material supply speed, etc., shown in the processing conditions 22 to prevent the generation of internal defects. As a result, the NC device 1 can reduce the generation of internal defects in future processing. In addition, the timing of reflecting the calculated defect information in the processing conditions 22 after the defect information is calculated is arbitrary. For example, the NC device 1 can adjust the processing conditions 22 of the next processing performed after a certain processing based on the defect information calculated in that processing. Alternatively, the NC device 1 can accumulate the calculated defect information and adjust the processing conditions 22 based on the result obtained by analyzing the accumulated defect information.

[0162] In the above description, the defect estimation unit 27 determines the presence or absence of the first phenomenon, the second phenomenon, and the third phenomenon. The defect estimation unit 27 is not limited to determining the presence or absence of all of the first, second, and third phenomena. The defect estimation unit 27 only needs to determine the presence or absence of at least one of the first, second, and third phenomena. That is, the defect estimation unit 27 only needs to have at least one of the first determination unit 28, the second determination unit 29, and the third determination unit 30.

[0163] According to Embodiment 1, the auxiliary manufacturing apparatus 100 determines the presence or absence of at least one of the following phenomena: a first phenomenon (residual root phenomenon), a second phenomenon (wire friction phenomenon), and a third phenomenon (weld gap phenomenon). Based on the determination result, it calculates defect information representing the morphology of internal defects. The auxiliary manufacturing apparatus 100 can calculate defect information using various feedback information during forming and information from sensors. The auxiliary manufacturing apparatus 100 does not require special measuring instruments for detecting internal defects; its simple structure allows it to estimate the morphology of internal defects. Furthermore, the auxiliary manufacturing apparatus 100 can calculate defect information using data measured during processing. Since the auxiliary manufacturing apparatus 100 does not require measurements for detecting internal defects after forming, it can estimate the morphology of internal defects without increasing processing time. In summary, the auxiliary manufacturing apparatus 100 has the effect of being able to grasp the morphology of internal defects in the formed object 17 with a simple structure and without increasing processing time.

[0164] The auxiliary manufacturing apparatus 100 stores defect impact data and defect information in the defect information storage unit 33a in association with location information or time information, thereby ensuring traceability related to the molded object 17. Furthermore, the user can easily assess the quality of each location on the molded object 17.

[0165] Implementation method 2.

[0166] In Embodiment 1, the weld height is calculated based on the material supply speed, the laser beam L's moving speed, and the weld width W. In Embodiment 2, an example is described where the weld height is obtained by measuring the height of the formed weld 16. The auxiliary manufacturing apparatus 100 in Embodiment 2, except that the weld height calculation unit 26 is omitted, has the same... Figure 1 The auxiliary manufacturing apparatus 100 shown has the same structure. In Embodiment 2, the same structural elements as in Embodiment 1 are labeled with the same reference numerals, and the main focus is on the operations that differ from those in Embodiment 1.

[0167] Figure 31 This diagram illustrates a method for obtaining weld height data using the auxiliary manufacturing apparatus 100 according to Embodiment 2. In Embodiment 2, the auxiliary manufacturing apparatus 100 measures the weld height, i.e., "h", of the shaped weld bead 16 using a height measuring instrument 11. b"Measurement is performed. Arrow 41 indicates the movement of the height measuring instrument 11 generated by the shaft drive device 3. The height measuring instrument 11 outputs the measurement result of the weld height to the defect estimation unit 27. The second determination unit 29 of the defect estimation unit 27 determines the presence or absence of the wire friction phenomenon as the second phenomenon based on the weld height obtained by measuring the height of the formed weld 16.

[0168] The auxiliary manufacturing apparatus 100 directly measures the weld height using the height measuring instrument 11, thereby obtaining more accurate weld height data. The defect estimation unit 27 can accurately estimate internal defects caused by wire friction.

[0169] The measurement of weld height using the height measuring instrument 11 is performed while associating the measurement result with position information. The measurement result obtained by the height measuring instrument 11 and the offset distance of the processing head 8, i.e., "h", are used in the calculations of equations (3) and (4) above. The value of "h" used in the calculation is the value at the position shown by the position information associated with the measurement result obtained by the height measuring instrument 11 during shaping.

[0170] According to Embodiment 2, the auxiliary manufacturing apparatus 100 determines the presence or absence of wire friction based on the weld height obtained by measuring the height of the formed weld bead 16. Therefore, the auxiliary manufacturing apparatus 100 can accurately estimate internal defects caused by wire friction.

[0171] Implementation method 3.

[0172] In embodiments 1 and 2, the weld width W obtained by the control input / output unit 24, the weld height h obtained by the analysis device 6, and the weld height calculated or measured are used as the basis for the weld width W obtained by the analysis device 6. b The presence or absence of residual wire and wire friction is determined. In Embodiment 3, an example of determining the presence or absence of residual wire and wire friction based on data obtained by a load sensor and an image of the molten pool will be described. In Embodiment 3, structural elements identical to those in Embodiment 1 or 2 will be labeled with the same reference numerals, and the operations that differ from those in Embodiment 1 or 2 will be mainly described.

[0173] Figure 32 This is a diagram illustrating a structural example of the auxiliary manufacturing apparatus 101 according to Embodiment 3. The auxiliary manufacturing apparatus 101 according to Embodiment 3 has the same... Figure 1The auxiliary manufacturing apparatus 100 shown has the same structure and load sensor 42. The load sensor 42 is mounted along the path of the wire 14. The load sensor 42 detects the force and torque acting on the wire 14 supplied to the workpiece 19. The load sensor 42 detects the force in the direction parallel to the wire 14 supplied to the workpiece 19 and the torque in the XZ plane.

[0174] The first determination unit 28 of the defect estimation unit 27 determines the presence or absence of a residual root phenomenon, which is the first phenomenon, based on the force and torque detected by the load sensor 42. Furthermore, the first determination unit 28 calculates information about the internal defects caused by the residual root phenomenon, i.e., the first defect information, based on the values ​​of the force and torque detected by the load sensor 42.

[0175] The second determination unit 29 of the defect estimation unit 27 determines the presence or absence of wire friction phenomenon, which is a second phenomenon, based on the force and torque detected by the load sensor 42. Furthermore, the second determination unit 29 calculates information about internal defects caused by wire friction phenomenon, i.e., second defect information, based on the values ​​of the force and torque detected by the load sensor 42.

[0176] Figure 33 Figure 1 is used to illustrate the case where the load sensor 42 of the additional manufacturing apparatus 101 according to Embodiment 3 detects the force and torque acting on the wire 14. Figure 34 Figure 2 is used to illustrate the situation where the load sensor 42 of the additional manufacturing apparatus 101 according to Embodiment 3 detects the force and torque acting on the wire 14. Figure 33 This schematically illustrates the detection of force and torque when residual root phenomena occur. Figure 34 This schematically illustrates the detection of force and torque when wire friction occurs.

[0177] exist Figure 33 In the state shown, the unmelted wire 14 collides with the workpiece 19, thereby applying a force 43 parallel to the direction in which the wire 14 is supplied to the workpiece 19 and a torque 44 in the XZ plane to the wire 14. Figure 34 In the state shown, the unmelted wire 14 interferes with the weld bead 16, thereby a force 43 in a direction parallel to the wire 14 supplied to the workpiece 19 and a torque 44 in the XZ plane act on the wire 14.

[0178] The absolute values ​​of force 43 and torque 44 when residual root phenomenon occurs and the absolute values ​​of force 43 and torque 44 when wire friction phenomenon occurs are different. By obtaining the forces 43 and torque 44 when residual root phenomenon occurs and the forces 43 and torque 44 when wire friction phenomenon occurs, the relationship between the forces 43 and torque 44 when residual root phenomenon occurs and the relationship between the forces 43 and torque 44 when wire friction phenomenon occurs are calculated in advance. Thus, the defect estimation unit 27 can distinguish between residual root phenomenon and wire friction phenomenon based on the calculated relationship in advance.

[0179] When the first determination unit 28 determines that a residual root phenomenon has occurred, it calculates the intensity of the residual root phenomenon based on the absolute value of force 43, the absolute value of torque 44, and the ratio of force 43 to torque 44. The intensity of the residual root phenomenon represents the intensity of the collision between the wire 14 and the workpiece 19. The first determination unit 28 can calculate the first defect information based on the intensity of the residual root phenomenon.

[0180] When the second determination unit 29 determines that wire friction has occurred, it calculates the intensity of the wire friction based on the absolute value of force 43, the absolute value of torque 44, and the ratio of force 43 to torque 44. The intensity of wire friction is the degree of interference between the wire 14 and the weld bead 16, and the deeper the wire 14 penetrates into the weld bead 16, the greater the intensity of wire friction. The second determination unit 29 can calculate the second defect information based on the intensity of wire friction.

[0181] Furthermore, the first determination unit 28 is not limited to determining the presence or absence of residual wire and calculating the first defect information based on either force 43 or torque 44. The second determination unit 29 is not limited to determining the presence or absence of wire friction and calculating the second defect information based on either force 43 or torque 44. In Embodiment 3, the first determination unit 28 can determine the presence or absence of residual wire and calculate the first defect information based on at least one of force 43 and torque 44. In Embodiment 3, the second determination unit 29 can determine the presence or absence of wire friction and calculate the second defect information based on at least one of force 43 and torque 44.

[0182] Figure 35 This diagram illustrates the detection of the oscillation width of the wire 14 based on an image of the molten pool captured by the camera 7 of the auxiliary manufacturing apparatus 101 according to Embodiment 3. Figure 35 The diagram illustrates the oscillation of the front end of wire 14.

[0183] The defect estimation unit 27 determines the presence or absence of residual root phenomenon and wire friction phenomenon based on the results obtained by observing the oscillation width of the front end of the wire 14 on the supply side to the workpiece 19. Based on the oscillation width of the front end of the wire 14 on the supply side to the workpiece 19, the defect estimation unit 27 calculates defect information related to internal defects caused by residual root phenomenon and defect information related to internal defects caused by wire friction phenomenon.

[0184] In the case of residual wire, the unmelted wire 14 collides with the workpiece 19, causing the leading edge of the wire 14 to oscillate in the XY plane. In the case of wire friction, the unmelted wire 14 interferes with the weld bead 16, causing the leading edge of the wire 14 to oscillate in the XY plane. In either the case of residual wire or the case of wire friction, the leading edge of the wire 14 oscillates in a direction perpendicular to the direction in which the wire 14 is supplied to the workpiece 19. Figure 35 In the example shown, the front end of wire 14 oscillates in the Y-axis direction.

[0185] The defect estimation unit 27 determines the oscillation width A of the leading end of the wire 14 based on the image of the molten pool. The defect estimation unit 27 then distinguishes between residual root phenomena and wire friction phenomena based on the oscillation width A. If the first determination unit 28 determines that a residual root phenomenon has occurred, it determines the intensity of the residual root phenomenon based on the magnitude of the oscillation width A. The first determination unit 28 can calculate the first defect information based on the intensity of the residual root phenomenon.

[0186] When the second determination unit 29 determines that wire friction has occurred, it calculates the intensity of wire friction based on the magnitude of the oscillation width A. The second determination unit 29 can calculate the second defect information based on the intensity of wire friction.

[0187] According to Embodiment 3, the auxiliary manufacturing apparatus 101 determines the presence or absence of residual root phenomenon and wire friction phenomenon based on at least one of force 43 and torque 44. The auxiliary manufacturing apparatus 101 calculates first defect information and second defect information based on at least one of force 43 and torque 44. Alternatively, the auxiliary manufacturing apparatus 101 determines the presence or absence of residual root phenomenon and wire friction phenomenon based on the result of observing the oscillation width A at the leading end of the wire 14. The auxiliary manufacturing apparatus 101 calculates first defect information and second defect information based on the result of observing the oscillation width A. Compared with the case of performing determination and calculation based on feedback values, the auxiliary manufacturing apparatus 101 can reduce the influence of calculation errors. Therefore, the auxiliary manufacturing apparatus 101 can accurately estimate internal defects caused by residual root phenomenon and internal defects caused by wire friction phenomenon.

[0188] Next, the hardware structure of the NC device 1 according to embodiments 1 to 3 will be described. The NC device 1 is implemented by a processing circuit. The processing circuit can be a circuit that executes software by a processor, or it can be a dedicated circuit.

[0189] When the processing circuit is implemented in software, the processing circuit is, for example, Figure 36 The control circuit 50 shown. Figure 36 This is a diagram illustrating a structural example of the control circuit 50 according to embodiments 1 to 3. The control circuit 50 includes an input unit 51, a processor 52, a memory 53, and an output unit 54.

[0190] The input unit 51 is an interface circuit that receives data from the outside of the control circuit 50 and provides it to the processor 52. The output unit 54 is an interface circuit that sends data from the processor 52 or the memory 53 to the outside of the control circuit 50. In the processing circuit... Figure 36 In the case of the control circuit 50 shown, the processor 52 reads and executes the program stored in the memory 53, thereby realizing the function of the NC device 1. The memory 53 is also used as temporary memory in the various processes implemented by the processor 52.

[0191] In the processing circuit Figure 36 In the case of the control circuit 50 shown, the NC device 1 is implemented by software, firmware, or a combination of software and firmware. The software or firmware is described as a program and stored in memory 53. The processing circuit reads the program stored in memory 53 and executes it, thereby realizing the various functions of the NC device 1. That is, the processing circuit has memory 53, which is used to store the program that the processing of the NC device 1 can ultimately execute. In addition, these programs can be described as the sequence and method by which the computer executes the NC device 1.

[0192] Processor 52 is a CPU (Central Processing Unit), processing device, arithmetic device, microprocessor, microcomputer, processor, or DSP (Digital Signal Processor). Memory 53 is, for example, non-volatile or volatile semiconductor memory such as RAM (Random Access Memory), ROM (Read Only Memory), flash memory, EPROM (Erasable Programmable Read Only Memory), EEPROM (Electrically Erasable Programmable Read Only Memory), disk, floppy disk, optical disk, compact disk, mini disk, or DVD (Digital Versatile Disc).

[0193] Figure 36 This is an example of hardware implementation of NC device 1 using a general-purpose processor 52 and memory 53, but NC device 1 can also be implemented using dedicated hardware circuitry. Figure 37 This is a diagram illustrating a structural example of the dedicated hardware circuit 55 involved in embodiments 1 to 3.

[0194] The dedicated hardware circuit 55 includes an input section 51, an output section 54, and a processing circuit 56. The processing circuit 56 can be a single circuit, a composite circuit, a programmable processor, a parallel-programmable processor, an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array), or a combination thereof. Furthermore, the NC device 1 can also be implemented by combining the control circuit 50 and the hardware circuit 55.

[0195] In embodiments 1 to 3, examples of NC device 1 having the function of a defect estimation device were described. The defect estimation device can also be an external device of NC device 1. The external device of NC device 1, i.e., the defect estimation device, is communicatively connected to NC device 1. The external defect estimation device of NC device 1 has the same structure as the melt position calculation unit 25, weld height calculation unit 26, defect estimation unit 27, defect information evaluation unit 31, defect information storage unit 33a, and defect information depiction unit 34 in the NC device 1 described in embodiments 1 to 3. The external defect estimation device of NC device 1 obtains information from NC device 1 and estimates the morphology of internal defects. The external defect estimation device of NC device 1 can... Figure 35 The control circuit 50 shown or Figure 36 It is implemented using the dedicated hardware circuit 55 shown.

[0196] The defect estimation device can be installed on a server device built in a cloud environment. The cloud environment includes computer resources provided by a cloud service platform. The specific ways in which the structural elements described in Embodiments 1 to 3 are distributed or integrated are not limited to the ways described in Embodiments 1 to 3. All or part of the structural elements of the defect estimation device can be configured by any unit distributed or integrated, either functionally or physically. The structural elements described in Embodiments 1 to 3 can be distributed between the NC device 1 and the server device. For example, the melt position calculation unit 25, the weld height calculation unit 26, the defect estimation unit 27, the defect information evaluation unit 31, and the defect information depiction unit 34 can be installed in the NC device 1, and the defect information storage unit 33a can be installed in the server device.

[0197] The structures shown in the above embodiments illustrate one example of the content of the present invention. The structures of each embodiment can be combined with other known technologies. The structures of each embodiment can also be appropriately combined with each other. A portion of the structure of each embodiment can be omitted or modified without departing from the spirit of the present invention.

[0198] Explanation of the label

[0199] 1. NC device, 2. Laser oscillator, 3. Axis drive device, 4. Gas supply device, 5. Material supply device, 6. Analysis device, 7. Camera, 8. Machining head, 9. Gas nozzle, 10. Display device, 11. Height measuring instrument, 12. Material supply source, 13. Material supply nozzle, 14. Wire, 15. Molten pool, 16. Weld bead, 17. Shape, 18. Substrate, 19. Workpiece, 20. Optical cable, 21. Worktable, 22. Machining conditions, 23. Machining program, 24. Control input / output unit, 25. Molten position calculation unit, 26. Weld bead height calculation unit, 27. Defect estimation unit, 28. First judgment unit, 29. Second judgment unit 30 Third Judgment Unit, 31 Defect Information Evaluation Unit, 32 Shaping Model, 33 Processing Data Storage Table, 33a Defect Information Storage Unit, 34 Defect Information Description Unit, 36 Internal Defect, 37, 38, 39, 40 Intervals, 41 Arrow, 42 Load Sensor, 43 Force, 44 Torque, 50 Control Circuit, 51 Input Unit, 52 Processor, 53 Memory, 54 Output Unit, 55 Hardware Circuit, 56 Processing Circuit, 100, 101 Additional Manufacturing Device, CN Centerline, G Protective Gas, L Laser Beam, LN Boundary Line, LP Wire Protrusion Point, MP Front End Position, RP Processing Reference Point.

Claims

1. A defect estimation apparatus for estimating the morphology of internal defects, i.e., gaps formed within a workpiece, by feeding material to a workpiece and stacking weld beads formed from the material melted by using a light beam. The defect estimation device is characterized by the fact that It has a defect estimation unit that determines whether or not a mark is formed on the weld due to friction between unmelted material and the weld bead, and calculates defect information representing the morphology of the internal defect based on the determination result. The defect estimation part, The presence or absence of the phenomenon is determined based on the height of the weld bead in the direction of weld bead stacking, i.e., the weld bead height. The presence or absence of the phenomenon is determined based on the relationship between the weld bead height and the position (i.e., the protrusion point) where the material protrudes into the irradiation range of the light beam. Based on at least one of the following: the number of times the phenomenon occurs, the duration of the phenomenon, and the distance between the surface forming the weld bead (i.e., the machined surface) and the protrusion point in the workpiece, the defect information related to the internal defect caused by the phenomenon is determined.

2. The defect estimation device according to claim 1, characterized in that, It has a weld height calculation unit that calculates the weld height based on the material supply speed, the movement speed of the light beam in the workpiece, and the width of the weld.

3. The defect estimation device according to claim 1, characterized in that, The defect estimation unit determines the presence or absence of a first phenomenon, in which the unmelted material collides with the workpiece, and a second phenomenon, in which the unmelted material rubs against the weld bead and leaves a mark on the weld bead. Based on the determination result, the defect information is calculated.

4. The defect estimation device according to claim 3, characterized in that, The defect estimation unit determines the presence or absence of the first phenomenon and the second phenomenon based on at least one of the force acting on the material supplied to the workpiece and the torque acting on the material supplied to the workpiece. Based on at least one of the value of the force and the value of the torque, it calculates the defect information related to the internal defect caused by the first phenomenon and the defect information related to the internal defect caused by the second phenomenon.

5. The defect estimation device according to claim 3, characterized in that, The defect estimation unit determines the presence or absence of the first phenomenon and the second phenomenon based on the results obtained by observing the oscillation width of the front end of the material supplied to the workpiece. Based on the oscillation width, it calculates the defect information related to the internal defect caused by the first phenomenon and the defect information related to the internal defect caused by the second phenomenon.

6. The defect estimation device according to claim 3, characterized in that, It has a melting position calculation unit that calculates the melting position, i.e., the position where the material's temperature reaches its melting point, based on the material's supply rate and the output of the light beam in the light source. The defect estimation unit determines the presence or absence of the first phenomenon based on the calculated melting location.

7. The defect estimation device according to claim 6, characterized in that, The defect estimation unit determines the presence or absence of the first phenomenon based on the calculated positional relationship between the melting location and the processing surface in the workpiece that forms the weld bead.

8. The defect estimation device according to claim 7, characterized in that, The defect estimation unit determines the defect information related to the internal defect caused by the first phenomenon based on at least one of the following: the number of times the first phenomenon occurs, the duration of the first phenomenon, and the distance between the melting location and the processed surface.

9. The defect estimation device according to claim 1, characterized in that, The defect estimation unit determines the presence or absence of the second phenomenon, namely, the phenomenon in which unmelted material rubs against the weld and leaves a mark on the weld, and the third phenomenon, which is the phenomenon in which gaps are formed between adjacent welds. Based on the determination result, the defect information is calculated.

10. The defect estimation device according to claim 9, characterized in that, The defect estimation unit determines the presence or absence of the third phenomenon based on a comparison between a threshold calculated according to the spacing between weld beads arranged side by side on the surface forming the weld bead in the workpiece, i.e., the processing surface, and the width of the portion of the weld beads overlapping each other.

11. The defect estimation device according to claim 10, characterized in that, The defect estimation unit calculates the defect information related to the internal defect caused by the third phenomenon based on the number of times the third phenomenon occurs, the duration of the third phenomenon, and the difference between the threshold and the width of the weld bead.

12. The defect estimation device according to claim 1, characterized in that, The defect estimation unit determines the presence or absence of a first phenomenon, namely, the collision between the unmelted material and the workpiece; a second phenomenon, namely, the friction between the unmelted material and the weld bead resulting in a mark on the weld bead; and a third phenomenon, namely, the gap between adjacent weld beads. Based on the determination results, the defect information is calculated.

13. The defect estimation device according to any one of claims 1 to 12, characterized in that, The device includes a defect information evaluation unit that calculates a defect impact degree, which is a numerical representation of the magnitude of the impact of the internal defect on the quality of the object, based on the defect information, and thereby evaluates the internal defect.

14. The defect estimation device according to claim 13, characterized in that, It has a defect information storage unit for storing the defect information. In the defect information storage unit, at least one of the following is stored in association with the defect impact degree, the image obtained by taking pictures of the formation of the weld bead, the feedback value of the material supply speed, the feedback value of the movement speed of the light beam in the workpiece, and the feedback value of the output of the light beam, and the defect information is associated with the location information or time information.

15. A numerical control device that controls an auxiliary manufacturing apparatus that supplies material to a workpiece and layers weld beads formed by melting the material using a light beam in the workpiece to manufacture a shape. The characteristic of this CNC device is that, It has a defect estimation unit that determines whether or not a trace is formed on the weld due to friction between unmelted material and the weld bead. Based on the determination result, it calculates defect information representing the morphology of the gap, i.e., the internal defect, formed inside the shape. The defect estimation part, The presence or absence of the phenomenon is determined based on the height of the weld bead in the direction of weld bead stacking, i.e., the weld bead height. The presence or absence of the phenomenon is determined based on the relationship between the weld bead height and the position (i.e., the protrusion point) where the material protrudes into the irradiation range of the light beam. Based on at least one of the following: the number of times the phenomenon occurs, the duration of the phenomenon, and the distance between the surface forming the weld bead (i.e., the machined surface) and the protrusion point in the workpiece, the defect information related to the internal defect caused by the phenomenon is determined.

16. An auxiliary manufacturing apparatus, characterized in that, have: The shaping section supplies material to the workpiece and stacks weld beads formed by melting the material using a light beam to create a shape. as well as A numerical control device that controls the shaping part. The CNC device has a defect estimation unit that determines whether or not a trace is formed on the weld due to friction between unmelted material and the weld bead. Based on the determination result, it calculates defect information representing the morphology of the gap, i.e., the internal defect, formed inside the object. The defect estimation part, The presence or absence of the phenomenon is determined based on the height of the weld bead in the direction of weld bead stacking, i.e., the weld bead height. The presence or absence of the phenomenon is determined based on the relationship between the weld bead height and the position (i.e., the protrusion point) where the material protrudes into the irradiation range of the light beam. Based on at least one of the following: the number of times the phenomenon occurs, the duration of the phenomenon, and the distance between the surface forming the weld bead (i.e., the machined surface) and the protrusion point in the workpiece, the defect information related to the internal defect caused by the phenomenon is determined.

17. A defect estimation method relating to a workpiece in which material is supplied to it, and a shape is manufactured by stacking weld beads formed by melting the material using a light beam, wherein a defect estimation device estimates the morphology of gaps, i.e., internal defects, formed within the shape. The characteristic of this defect estimation method is that... The process includes the following steps: determining whether a mark is formed on the weld due to friction between unmelted material and the weld bead; and based on the determination result, determining defect information representing the morphology of the internal defect. In the steps described, The presence or absence of the phenomenon is determined based on the height of the weld bead in the direction of weld bead stacking, i.e., the weld bead height. The presence or absence of the phenomenon is determined based on the relationship between the weld bead height and the position (i.e., the protrusion point) where the material protrudes into the irradiation range of the light beam. Based on at least one of the following: the number of times the phenomenon occurs, the duration of the phenomenon, and the distance between the surface forming the weld bead (i.e., the machined surface) and the protrusion point in the workpiece, the defect information related to the internal defect caused by the phenomenon is determined.

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