System and method for image reconstruction using structure illumination microscope
By combining spatial filtering and structural illumination microscope technology, the problem of background photon overload is solved by using confocal slits and galvanometer scanning technology, and efficient super-resolution imaging and image reconstruction are achieved, and image quality and resolution are improved.
Patent Information
- Application Number
- CN202380089367.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2022-12-27
- Filing Date
- 2023-12-20
- Publication Date
- 2025-08-15
AI Technical Summary
When the imaging depth of the existing structural illumination micromirror technology increases, background photon overload leads to a decrease in image reconstruction accuracy, high noise levels, artifact amplification, and rapid image quality deterioration, making it difficult to achieve super-resolution imaging.
Combining spatial filtering and structural illumination, super-resolution images are generated by filtering fluorescence emission through confocal slits, using galvanometer scanning and rescanning techniques, combined with Fourier transform and inverse matrix processing.
Effectively reduce background photons, reduce shot noise and laser intensity noise, enhance image acquisition speed, maintain image quality and resolution at high imaging depth, and achieve super-resolution imaging.