Downward pressing type small-size capacitor test seat
By designing a push-down small-size capacitor test socket and using the cooperation of manually pressing the upper cover and elastic contacts, the rapid installation of disc-shaped capacitors and the simultaneous measurement of multiple capacitors are achieved, solving the problems of cumbersome and inefficient testing in the existing technology and improving test efficiency.
Patent Information
- Application Number
- CN202510941322.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-09
- Publication Date
- 2025-09-09
AI Technical Summary
Existing capacitor test sockets cannot directly test disc-shaped capacitor devices with the positive pin located on the inner wall of the circular hole in the middle of the device and the negative pin located at the bottom of the device. In addition, traditional test sockets can only measure one capacitor device at a time, resulting in a cumbersome and inefficient testing process.
A downward-pressing small-size capacitor test socket was designed, which includes a test socket base, an upper cover, a reset spring, a guide assembly, an elastic pin, and a center probe. By manually pressing the upper cover to move the dial downward, the elastic contact pressure head is expanded, thereby realizing the rapid installation of disc-shaped capacitors. Multiple placement slots are reserved on the base to simultaneously measure multiple capacitor components.
It achieves fast and continuous measurement of disc-shaped capacitors, improves test efficiency, can measure multiple capacitor devices simultaneously, and solves the limitations of traditional test sockets.
Smart Images
Figure CN120610034A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of capacitance testing, and in particular to a push-down small-size capacitance testing socket. Background Art
[0002] In order to ensure that the quality and performance of capacitor products meet the design and use requirements and avoid unqualified capacitors being put into use, it is necessary to test the performance of capacitor components through capacitor test sockets and external test instruments after capacitor production.
[0003] The positive and negative pins of common capacitor devices currently on the market are generally on the same plane. When testing such capacitor devices, it is only necessary to contact the positive and negative pins on the capacitor device with the measuring probes in the regular capacitor test socket to test the performance of the capacitor device with the help of external equipment. However, the capacitor test socket in the prior art is only suitable for measuring capacitor devices whose positive and negative pins are on the same plane. For disc-shaped capacitor devices, since the positive pin on such devices is located on the inner wall of the middle circular hole of the device and the negative pin is located at the bottom of the device, the conventional test socket cannot directly test the disc-shaped capacitor to be tested, which makes the measurement process of the disc-shaped capacitor to be tested not continuous enough. At the same time, since the existing capacitor test socket can generally only measure one capacitor device at a time, the testing process of the disc-shaped capacitor to be tested is relatively cumbersome and the test efficiency is relatively low. Summary of the Invention
[0004] The purpose of the present invention is to provide a push-down small-size capacitor test socket in order to solve the above problems.
[0005] The present invention achieves the above-mentioned purpose through the following technical solutions:
[0006] A downward-pressing small-size capacitor test socket includes a test socket base, a test socket cover is provided on the upper side of the test socket base, a reset spring is installed at the four corners of the bottom end of the test socket cover, a test socket center probe is installed at the center position of the test socket base, and the top of the test socket base is located outside the test socket center probe and is reserved with a placement groove for placing a disc-shaped capacitor to be tested. There are no less than four placement grooves and the test socket center probe, and the placement grooves correspond to the test socket center probe one by one. Bottom grooves are opened on both sides of the test socket base, and elastic pins are installed in the bottom grooves. The elastic pins include elastic contact pieces and side pins. A top groove is installed on the test socket base at the upper part of the elastic contact piece, and the bottom of the elastic contact piece is connected to the side pin, and a shift block is installed at the opening of the top of the elastic contact piece at the bottom end of the test socket cover.
[0007] Furthermore, guide components are respectively installed between the two side walls of the test seat base and the test seat base, and the guide components include guide bars and guide grooves.
[0008] By adopting the above technical solution, the guide assembly is mainly used to ensure that the test seat cover moves stably up and down relative to the test seat base under the action of the reset spring.
[0009] Furthermore, the guide bar is integrally formed with the shell of the test seat upper cover, and the guide groove is reserved on the guide groove directly below the guide bar.
[0010] By adopting the above technical solution, a stable sliding fit between the guide strip and the guide groove can be achieved, thereby ensuring stable opening and closing of the test seat cover.
[0011] Furthermore, mounting grooves are reserved on both sides of the top of the test seat base, and the shift block is located in the mounting grooves.
[0012] By adopting the above technical solution, the design of the mounting groove allows a space to be reserved at the bottom of the test seat upper cover for accommodating the elastic contact piece, while facilitating the stable installation of the shift block.
[0013] Furthermore, the side of the shift block that contacts the elastic contact on the elastic pin is an arc-shaped structure, the top of the elastic contact on the elastic pin facing the shift block is a concave structure, and the elastic contact on the elastic pin has a pressure head that contacts the negative pole of the capacitor to be tested.
[0014] By adopting the above technical solution, when the shift block moves downward with the test seat cover, the pressure head on the elastic contact piece will be pushed toward the side away from the placement slot, thereby facilitating the convenient placement of the capacitor to be tested in the placement slot after the test seat cover is pressed.
[0015] Furthermore, the top end of the reset spring is plugged into the bottom end of the test seat upper cover, and the bottom end of the reset spring is plugged into the test seat base.
[0016] By adopting the above technical solution, after the capacitor to be tested is placed in the placement groove, the upper cover of the test seat can be lifted and reset under the action of the reset spring by simply loosening the upper cover of the test seat.
[0017] Furthermore, the parts of the test seat cover and the test seat base that cooperate with the reset spring are both concave structures.
[0018] By adopting the above technical solution, when the upper cover of the test seat is lifted and reset, the pressure head on the elastic contact piece will rebound and reset and press on the disc-shaped capacitor to be tested, and after pressing, the pressure head on the elastic contact piece will rebound and contact the negative pole of the disc-shaped capacitor to be tested.
[0019] Furthermore, the placement groove is formed on the test seat base, and the placement groove matches the size of the disc-shaped capacitor to be tested.
[0020] By adopting the above technical solution, the placement groove is matched with the size of the disc-shaped capacitor to be measured, which can ensure that the capacitor to be measured is stably placed in the placement groove.
[0021] Furthermore, the central probe of the test socket is plugged into the test socket base, and the central probe of the test socket is in contact with the positive lead on the capacitor to be tested.
[0022] By adopting the above technical solution, the central probe of the test socket is mainly used to connect the positive electrode of the disc-shaped capacitor to be tested to an external testing instrument.
[0023] Furthermore, the side pins on the elastic pins are plugged into the test socket base, and the side pins and the elastic contact pieces are integrally formed.
[0024] By adopting the above technical solution, the side pins are mainly used to connect the negative electrode of the disc-shaped capacitor to be tested to an external testing instrument.
[0025] The specific working principle is as follows: during measurement, the dial block is first moved downward by manually pressing the upper cover of the pressure test seat. When the dial block moves downward, the pressure head on the top of the elastic contact piece is stretched to both sides, and then no less than four disc-shaped capacitors to be measured are quickly placed into the placement slot to ensure that the center probe of the test seat is in contact with the positive electrode of the disc-shaped capacitor to be measured. After the disc-shaped capacitor to be measured is placed, it is only necessary to loosen the upper cover of the test seat, and the upper cover of the test seat can be moved up and reset under the action of the reset spring. When the upper cover of the test seat is moved up and reset, the pressure head on the elastic contact piece will be reset, so that the pressure head on the elastic contact piece is in contact with the capacitor to be measured. The negative electrode of the capacitor to be tested is contacted to facilitate the performance testing of the disc-shaped capacitor to be tested with the help of external detection equipment. Because under the action of this test socket, the disc-shaped capacitor to be tested can be quickly installed by pressing and placing it, so that the measurement process of the disc-shaped capacitor to be tested is more continuous; at the same time, by reserving no less than four placement slots on the test socket base, and symmetrically installing two elastic contact pieces at each placement slot on the test socket base, the capacitor test socket can simultaneously realize the measurement of multiple disc-shaped capacitors to be tested. Compared with the traditional single measurement method, the capacitor test socket has higher testing efficiency for the disc-shaped capacitor to be tested.
[0026] The beneficial effects of the present invention are:
[0027] 1. Through the coordinated design of the test seat cover, the dial block, the test seat base, the test seat center probe, the reset spring and the elastic pins composed of the elastic contact piece and the side pins, when the capacitor test seat is in use, the dial block can be directly moved down by manually pressing the test seat cover. When the dial block moves down, the pressure head on the top of the elastic contact piece will be spread to both sides to facilitate the quick placement of the disc-shaped capacitor to be measured into the placement slot, ensuring that the center probe of the test seat contacts the positive electrode of the disc-shaped capacitor to be measured, and the disc-shaped capacitor to be measured is in contact with the positive electrode of the disc-shaped capacitor to be measured. After the capacitor is placed, just loosen the test seat cover, and the test seat cover can be moved up and reset under the action of the reset spring. At the same time, the pressure head on the elastic contact piece will be reset, so that the pressure head on the elastic contact piece will contact the negative electrode of the capacitor to be tested, so that the performance of the disc-shaped test component can be tested with the help of external testing equipment. Because the disc-shaped capacitor to be tested can be quickly installed by pressing and placing it under the action of this test seat, the measurement process of the disc-shaped capacitor to be tested is more continuous.
[0028] 2. By reserving no less than four placement slots on the test seat base, and symmetrically installing two elastic contacts at each placement slot on the test seat base, the capacitor test seat can simultaneously measure multiple disc-shaped capacitors to be tested. Compared with the traditional single measurement method, the capacitor test seat has higher testing efficiency for disc-shaped capacitors to be tested. BRIEF DESCRIPTION OF THE DRAWINGS
[0029] Figure 1 This is a structural diagram of the push-down small-size capacitor test socket of the present invention;
[0030] Figure 2 This is a main cross-sectional view of the push-down small-size capacitor test socket of the present invention when the capacitor to be tested is placed but not pressed tightly;
[0031] Figure 3 This is a main cross-sectional view of the push-down small-size capacitor test socket of the present invention when the capacitor to be tested is placed and pressed tightly;
[0032] Figure 4 This is a bottom view of the push-down small-size capacitor test socket of the present invention.
[0033] The following are the descriptions of the reference numerals:
[0034] 1. Placement slot; 2. Test socket cover; 3. Reset spring; 4. Test socket base; 5. Guide bar; 6. Guide groove; 7. Top groove; 8. Bottom groove; 9. Test socket center probe; 10. Capacitor to be tested; 11. Dial block; 12. Elastic contact piece; 13. Side pin; 14. Mounting slot. DETAILED DESCRIPTION
[0035] The present invention will be further described below in conjunction with the accompanying drawings:
[0036] like Figures 1-4As shown, a downward-pressing small-size capacitor test socket includes a test socket base 4, a test socket cover 2 is provided on the upper side of the test socket base 4, and a reset spring 3 is installed at the four corners of the bottom end of the test socket cover 2. A test socket center probe 9 is installed at the center position of the test socket base 4, and the top of the test socket base 4 is located outside the test socket center probe 9 and is reserved for placing a placement groove 1 for placing a disc-shaped capacitor to be tested 10. There are no less than four placement grooves 1 and the test socket center probe 9, and the placement grooves 1 correspond one-to-one to the test socket center probe 9. Bottom grooves 8 are opened on both sides of the test socket base 4, and elastic pins are installed in the bottom grooves 8. The elastic pins include elastic contact pieces 12 and side pins 13. A top groove 7 is installed on the test socket base 4 at the upper part of the elastic contact piece 12, and the bottom of the elastic contact piece 12 is connected to the side pin 13. A shift block 11 is installed at the opening of the top of the elastic contact piece 12.
[0037] In this embodiment, guide components are respectively installed between the two side walls of the test seat base 4 and the test seat base 4. The guide components include guide bars 5 and guide grooves 6. The guide components are mainly used to ensure that the test seat cover 2 can move stably up and down relative to the test seat base 4 under the action of the reset spring 3.
[0038] In this embodiment, the guide bar 5 is integrally formed with the shell of the test seat cover 2, and the guide groove 6 is reserved on the guide groove 6 directly below the guide bar 5, which can achieve stable sliding cooperation between the guide bar 5 and the guide groove 6 to ensure stable opening and closing of the test seat cover 2.
[0039] In this embodiment, mounting grooves 14 are respectively reserved on both sides of the top of the test seat base 4, and the shift block 11 is located in the mounting grooves 14. The design of the mounting grooves 14 allows space to be reserved at the bottom of the test seat cover 2 for accommodating the elastic contact piece 12, while facilitating the stable installation of the shift block 11.
[0040] In this embodiment, the side of the shift block 11 that contacts the elastic contact 12 on the elastic pin is an arc-shaped structure, and the top of the elastic contact 12 on the elastic pin facing the shift block 11 is a concave structure, and the elastic contact 12 on the elastic pin has a pressure head that contacts the negative pole of the capacitor to be tested 10. When the shift block 11 moves downward with the test seat cover 2, the pressure head on the elastic contact 12 is stretched to the side away from the placement slot 1, thereby facilitating the convenient placement of the capacitor to be tested 10 in the placement slot 1 after the test seat cover 2 is pressed.
[0041] In this embodiment, the top end of the reset spring 3 is plugged into the bottom end of the test seat cover 2, and the bottom end of the reset spring 3 is plugged into the test seat base 4. After the capacitor 10 to be tested is placed in the placement slot 1, it is only necessary to loosen the test seat cover 2 to achieve the lifting and reset of the test seat cover 2 under the action of the reset spring 3.
[0042] In this embodiment, the parts of the test seat cover 2 and the test seat base 4 that cooperate with the reset spring 3 are both concave structures. When the test seat cover 2 is lifted and reset, the pressure head on the elastic contact piece 12 will rebound and reset and press on the disc-shaped capacitor to be tested 10, and the pressure head on the elastic contact piece 12 after being pressed will contact the negative pole of the disc-shaped capacitor to be tested 10.
[0043] In this embodiment, the placement groove 1 is formed on the test seat base 4, and the placement groove 1 matches the size of the disc-shaped capacitor to be tested 10. Matching the placement groove 1 with the size of the disc-shaped capacitor to be tested 10 can ensure that the capacitor to be tested 10 is stably placed in the placement groove 1.
[0044] In this embodiment, the test socket center probe 9 is plugged into the test socket base 4, and the test socket center probe 9 is in contact with the positive electrode on the capacitor to be tested 10. The test socket center probe 9 is mainly used to connect the positive electrode of the disc-shaped capacitor to be tested 10 to an external testing instrument.
[0045] In this embodiment, the side pin 13 on the elastic pin is plugged into the test socket base 4, and the side pin 13 and the elastic contact piece 12 are integrally formed. The side pin 13 is mainly used to connect the negative pole of the disc-shaped capacitor to be tested 10 to an external testing instrument.
[0046] The specific working principle is as follows: during measurement, the block 11 is first moved downward by manually pressing the pressure test seat cover 2. When the block 11 moves downward, the pressure head on the top of the elastic contact piece 12 is stretched to both sides, and then no less than four disc-shaped capacitors to be measured 10 are quickly placed into the placement slot 1 to ensure that the center probe 9 of the test seat is in contact with the positive pole of the disc-shaped capacitor 10 to be measured. After the disc-shaped capacitor 10 to be measured is placed, it is only necessary to loosen the test seat cover 2, and the test seat cover 2 can be moved up and reset under the action of the reset spring 3. When the test seat cover 2 is moved up and reset, the pressure head on the elastic contact piece 12 will be reset, so that the pressure head on the elastic contact piece 12 is in contact with the positive pole of the disc-shaped capacitor 10. The negative pole of the capacitor to be tested 10 is contacted to facilitate the performance testing of the disc-shaped component to be tested with the help of external detection equipment. Because under the action of this test socket, the disc-shaped capacitor to be tested 10 can be quickly installed by pressing and placing it, so that the measurement process of the disc-shaped capacitor to be tested 10 is more continuous; at the same time, by reserving no less than four placement slots 1 on the test socket base 4, and two elastic contact pieces 12 are symmetrically installed at each placement slot 1 on the test socket base 4, the capacitor test socket can simultaneously realize the measurement of multiple disc-shaped capacitors to be tested 10. Compared with the traditional single measurement method, the capacitor test socket has higher testing efficiency for the disc-shaped capacitor to be tested 10.
[0047] The basic principles, main features, and advantages of the present invention are shown and described above. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The above embodiments and descriptions are merely illustrative of the principles of the present invention. Various changes and modifications may be made to the present invention without departing from the spirit and scope of the present invention, and such changes and modifications fall within the scope of the invention as claimed.
Claims
1. Downward pressure small size capacitor test socket, characterized by: The invention comprises a test seat base (4), a test seat cover (2) is provided on the upper side of the test seat base (4), a reset spring (3) is respectively installed at the four corners of the bottom end of the test seat cover (2), a test seat center probe (9) is installed at the center position of the test seat base (4), and a placement groove (1) for placing a disc-shaped capacitor (10) to be tested is reserved at the top of the test seat base (4) on the outside of the test seat center probe (9), and the placement groove (1) and the test seat center probe (9) are both not less than four, and the placement groove (1) and the test seat center probe (9) are respectively provided with a plurality of the ... The center probes (9) of the test seat correspond one to one, bottom grooves (8) are opened on both sides of the test seat base (4), elastic pins are installed in the bottom grooves (8), and the elastic pins include elastic contact pieces (12) and side pins (13), a top groove (7) is installed on the test seat base (4) at the upper part of the elastic contact pieces (12), the bottom of the elastic contact pieces (12) are connected to the side pins (13), and a shift block (11) is installed at the bottom end of the test seat upper cover (2) facing the opening at the top end of the elastic contact pieces (12).
2. The push-down small-size capacitor test socket according to claim 1, characterized in that: Guide assemblies are respectively installed between the two side walls of the test seat base (4) and the test seat base (4), and the guide assemblies include guide bars (5) and guide grooves (6).
3. The push-down small-size capacitor test socket according to claim 2, characterized in that: The guide bar (5) is integrally formed with the shell of the test seat upper cover (2), and the guide groove (6) is reserved on the guide groove (6) directly below the guide bar (5).
4. The push-down small-size capacitor test socket according to claim 1, characterized in that: Mounting grooves (14) are respectively reserved on both sides of the top of the test seat base (4), and the shift block (11) is located in the mounting grooves (14).
5. The push-down small-size capacitor test socket according to claim 4, characterized in that: The side surface of the shift block (11) in contact with the elastic contact piece (12) on the elastic pin is an arc-shaped structure, the top of the elastic contact piece (12) on the elastic pin facing the shift block (11) is a concave structure, and the elastic contact piece (12) on the elastic pin is provided with a pressure head in contact with the negative electrode of the capacitor (10) to be measured.
6. The push-down small-size capacitor test socket according to claim 1, characterized in that: The top end of the reset spring (3) is plugged into the bottom end of the test seat upper cover (2), and the bottom end of the reset spring (3) is plugged into the test seat base (4).
7. The push-down small-size capacitor test socket according to claim 6, characterized in that: The parts of the test seat upper cover (2) and the test seat base (4) that cooperate with the reset spring (3) are both concave structures.
8. The push-down small-size capacitor test socket according to claim 1, characterized in that: The placement groove (1) is formed on the test seat base (4), and the placement groove (1) matches the size of the disc-shaped capacitor to be tested (10).
9. The push-down small-size capacitor test socket according to claim 1, characterized in that: The test seat center probe (9) is plugged into the test seat base (4), and the test seat center probe (9) is in contact with the positive electrode of the capacitor to be tested (10).
10. The push-down small-size capacitor test socket according to claim 9, characterized in that: The side pins (13) on the elastic pins are plugged into the test socket base (4), and the side pins (13) and the elastic contact sheet (12) are integrally formed.