Production quality tracing analysis method and system based on operation data

Abstract

The invention discloses a production quality traceability analysis method and system based on operation data, and relates to the technical field of production quality traceability, and the method comprises the steps: analyzing the defect type distribution approximation degree between different historical defect detection records in a factory, analyzing the defect correlation degree between production equipment and historical defect products in a defect record set; key production equipment is obtained; the method comprises the following steps: acquiring a defect detection record of a factory in a current period, analyzing the similarity degree of defect type distribution between the defect detection record and a defect record set, acquiring an equipment operation record of key production equipment of a similar defect record set in the current period, and tracing the production quality of defective products in the defect detection record. Obtaining target production equipment; and obtaining production plan data of the target production equipment in the current period, dispatching maintenance personnel of the factory to overhaul the target production equipment, and optimizing and adjusting a product production line in the factory.

Description

Technical Field

[0001] The present invention relates to the technical field of production quality tracing technology, and in particular to a production quality tracing analysis method and system based on operation data. Background Art

[0002] The quality of products produced during the factory production process determines the basis for the development and survival of the enterprise. The factory needs to rework and scrap defective products, which will greatly increase the total cost of production and processing. In addition, the presence of a large number of products with quality defects during the factory production process will also affect customers' trust in the factory, causing customer loss. There may even be major safety accidents due to users using problematic products, causing the factory to face huge compensation.

[0003] At present, the method of production quality traceability for factory-produced products is mainly to trace products by batch by assigning batch numbers to the processed products and recording information such as production time. However, this method makes it difficult to integrate batch information of products and also relies on manual recording and scanning. Especially in the case of high-speed production, errors are prone to occur. The root cause of product quality problems is the industrial equipment used to process and produce the products. However, the current equipment analysis of industrial equipment only uses thresholds to determine whether there are problems with the equipment. It is impossible to effectively combine the product production quality traceability analysis with the equipment's operating data. Not only will it waste a lot of time and energy on testing the production chain, but it will also fail to effectively solve product production quality problems. Summary of the Invention

[0004] The purpose of the present invention is to provide a production quality traceability analysis method and system based on operation data to solve the problems raised in the prior art.

[0005] To achieve the above-mentioned purpose, the present invention provides the following technical solution: a production quality traceability analysis method based on operation data, the method comprising:

[0006] Step S100: Acquire historical defect detection records in the factory, analyze the similarity of defect type distribution between different historical defect detection records in the factory, and aggregate historical defect detection records with similar product defect distribution states to obtain a defect record set;

[0007] Step S200: Obtain production equipment and production batch information of historical defective products in the defect record set, obtain historical equipment operation records of the production equipment based on the production batch information, analyze the degree of defect correlation between the production equipment and the historical defective products in the defect record set, and obtain key production equipment;

[0008] Step S300: Obtain the factory's defect detection records for the current cycle, analyze the similarity of defect type distribution between the defect detection records and the defect record set, obtain a similar defect record set, obtain the equipment operation records for the key production equipment in the similar defect record set for the current cycle, trace the production quality of the defective products in the defect detection records, and obtain the target production equipment;

[0009] Step S400: Obtain production plan data of the target production equipment in the current cycle, dispatch factory maintenance personnel to inspect and repair the target production equipment, and optimize and adjust the product production line in the factory.

[0010] Furthermore, step S100 includes:

[0011] Step S101: Acquire each historical defect detection record of the factory, wherein the historical products detected in each historical defect detection record are all of the same product model;

[0012] Obtain the total number M of historical defective products detected with defects from a certain historical defect detection record sum , obtain the total number A of historical products detected in a certain historical defect detection record, and calculate the product defect ratio B=M of a certain historical defect detection record sum / A;

[0013] Step S102: When the product defect ratio is greater than a preset threshold, it is determined that a historical product in a certain historical defect detection record has a defect anomaly, and the historical defect detection record is retained; otherwise, the historical defect detection record is deleted;

[0014] Step S103: Acquire several retained historical defect detection records, and obtain the total number of historical defective products corresponding to each defect type from the retained historical defect detection records;

[0015] Obtain the total number of historical defective products corresponding to a certain defect type in the historical defect detection records, and compare it with the ratio of each historical product detected in the historical defect detection records to obtain the type ratio of the certain defect type in the historical defect detection records. When the type ratio of a certain defect type is greater than a preset ratio threshold, record the certain defect type as the target defect type in the historical defect detection records. Obtain several target defect types in the historical defect detection records and aggregate them according to the size of the type ratio to obtain a target defect type set.

[0016] Step S104: Obtain target defect type sets of several historical defect detection records, and obtain the target defect type set U of the retained b-th historical defect detection record. b, obtain the target defect type set U of the retained c-th historical defect detection record c , where the target defect type set U b With the target defect type set U c The same target defect type exists in the first k target defect types, where k is a preset value. The similarity of the defect type distribution between the bth historical defect detection record and the cth historical defect detection record is analyzed. The specific analysis process is as follows:

[0017] Calculate the defect approximation D between the bth historical defect detection record and the cth historical defect detection record (b,c) =(U c ∩U b ) / (U c ∪U b ), when the defect approximation D (b,c) If the defect type distribution between the bth historical defect detection record and the cth historical defect detection record is greater than the preset defect approximation threshold, it is determined that the defect type distribution between the bth historical defect detection record and the cth historical defect detection record is similar;

[0018] Obtain and aggregate several historical defect detection records with defect type distributions similar to that of the bth historical defect detection record to obtain a defect record set, obtain several target defect types of the same type among the first k target defect types of the several historical defect detection records in the defect record set, and record the several target defect types as key target defect types of the defect record set.

[0019] Furthermore, step S200 includes:

[0020] Step S201: Obtain a defect record set of a factory, obtain a plurality of historical defect detection records from the defect record set, and obtain, from the plurality of historical defect detection records, each historical defective product whose defect type is the same as the key target defect type in the defect record set;

[0021] Step S202: Obtaining the production batch information of each historical defective product, and based on the production batch information, obtaining the historical equipment operation records of the production equipment that processed the product batch to which the historical defective product belongs, and recording them as marked historical equipment operation records;

[0022] Obtaining each tagged historical equipment operation record of the production equipment, and obtaining the product defect rate of historical products produced by each tagged historical equipment operation record, wherein the product defect rate is the ratio between the number of historical defective products and the number of historical products in a product batch processed by the historical tagged historical equipment operation record;

[0023] Obtain the average values ​​of various operating parameters of the production equipment from the operation records of each marked historical equipment, and aggregate them to obtain a marked parameter set of the production equipment;

[0024] Step S203: Acquire a plurality of historical equipment operation records of the production equipment, wherein the product type of the historical products processed by the production equipment in the plurality of historical equipment operation records is the same as the historical defective products, and the product defect rate of the historical products obtained in the plurality of historical equipment operation records is less than a preset threshold;

[0025] Obtain the average value of various operating parameters from several historical equipment operation records and record it as the control value of the production equipment;

[0026] Step S204: Analyze the degree of defect correlation between the production equipment and the key target defect types of the historical defective products in the defect record set. The specific analysis process is as follows:

[0027] Calculate the characteristic value F = |EE′| / E′ of the operating parameter of the marked historical equipment operation record in the marked parameter set, where E is the average value of the operating parameter in the marked historical equipment operation record, and E′ is the control value of the operating parameter in the production equipment;

[0028] Obtain the correlation value r between the operating parameters of the production equipment and the key target defect type;

[0029] Obtain the defect correlation values ​​of various operating parameters of production equipment and key target defect types, and calculate the defect correlation value L=max{r i ,i=1,2,...,m}, where m is the total number of operating parameters of the production equipment, r i is the correlation value between the i-th operating parameter of the production equipment and the key target defect type;

[0030] When the defect correlation value L is greater than the preset defect correlation threshold, it is determined that the production equipment has a defect correlation with the key target defect type in the defect record set, and the production equipment is recorded as a key production equipment of the key target defect type in the defect record set;

[0031] Several operating parameters of key production equipment whose defect correlation values ​​are greater than a defect correlation threshold are obtained, and the several operating parameters are recorded as key operating parameters of the key production equipment.

[0032] Furthermore, step S300 includes:

[0033] Step S301: Obtain the factory's defect detection records in the current cycle, where the product model of the detected product in the defect detection record is the same as the product model of the historical defective product in the defect record set, and obtain each defect record set with the product model;

[0034] Step S302: Obtain several defective products of the factory in the current cycle from the defect detection records, and obtain the key target defect type corresponding to each defect record set;

[0035] When the proportion of a key target defect type in a defect record set among the defect types of several defective products is greater than a preset proportion threshold, the defect type distribution between the defect detection record and the defect record set is determined to be similar, and the defect record set is recorded as a similar defect record set;

[0036] Step S303: Trace the production quality of the defective product to obtain the target production equipment. The specific process is as follows:

[0037] Obtain each similar defect record set of the defect detection record, and obtain the equipment operation records of the key production equipment in the similar defect record set in the current cycle;

[0038] Obtain the average values ​​of various key operating parameters of key production equipment from the equipment operation records, obtain the comparison values ​​of various key operating parameters of key production equipment, obtain the characteristic values ​​of various key operating parameters of key production equipment in the equipment operation records, and when the characteristic value of a certain key operating parameter is greater than a preset threshold, determine that the key production equipment has an impact on the production quality of products in the current cycle, and record the key production equipment as the target production equipment.

[0039] Furthermore, step S400 includes:

[0040] Step S401: Obtain each target production equipment of the factory in the current cycle, obtain production plan data of the target production equipment in the current cycle, and obtain the planned quantity and planned production duration of the products planned to be produced and processed by the target production equipment in the current cycle from the production plan data;

[0041] Step S402: dispatching maintenance personnel from the factory to inspect and repair the target production equipment and optimize and adjust the product production line in the factory. The specific optimization and adjustment process is as follows:

[0042] Obtain production equipment that processes products in the current cycle that have the same process as the target production equipment. When the ratio of the planned production quantity of the production equipment to the planned production time is less than the production rate threshold of the production equipment, it is determined that the production equipment has the ability to assist the production of the target production equipment. The production equipment is recorded as auxiliary production equipment of the target production equipment, and the products planned to be produced and processed by the target production equipment are transported to the auxiliary production equipment, and the auxiliary production equipment performs production and processing on the products.

[0043] The above steps not only repair the target production equipment, but also take into account that the target production equipment cannot continue to process and produce products during the maintenance process. Therefore, by obtaining the auxiliary production equipment of the target production equipment and allowing the auxiliary production equipment to assist the target production equipment, the impact of equipment maintenance on the factory production plan is reduced.

[0044] In order to better implement the above method, a production quality traceability analysis system based on operation data is also proposed. The system includes a defect type approximate analysis module, a defect correlation analysis module, a production quality traceability module, and a production adjustment module.

[0045] The defect type approximation analysis module is used to analyze the similarity of defect type distribution between different historical defect detection records in the factory, and to aggregate historical defect detection records with similar product defect distribution states to obtain a defect record set;

[0046] The defect correlation analysis module is used to analyze the degree of defect correlation between production equipment and historical defective products in the defect record set to obtain key production equipment;

[0047] The production quality traceability module is used to obtain the factory's defect detection records in the current cycle, and trace the production quality of defective products in the defect detection records based on the equipment operation records of key production equipment in the current cycle to obtain the target production equipment;

[0048] The production adjustment module is used to dispatch factory maintenance personnel to inspect and repair target production equipment, obtain the production plan data of the target production equipment in the current cycle, and optimize and adjust the product production line in the factory.

[0049] Furthermore, the defect type approximate analysis module includes a defect type classification unit and a defect type approximate analysis unit;

[0050] A defect type classification unit is used to classify the defect types in the historical defect detection records according to the type ratios of the defect types in the historical defect detection records to obtain target defect types;

[0051] The defect type approximation analysis unit is used to analyze the approximation degree of defect type distribution between different historical defect detection records, and to aggregate several historical defect detection records with similar defect type distribution to obtain a defect record set.

[0052] Furthermore, the defect correlation analysis module includes a parameter set acquisition unit and a defect correlation analysis unit;

[0053] A parameter set acquisition unit is used to obtain the average value of various operating parameters of the production equipment from various marked historical equipment operation records of the production equipment, and to aggregate them to obtain a marked parameter set of the production equipment;

[0054] The defect correlation analysis unit is used to analyze the defect correlation degree between the production equipment and the key target defect types in the defect record set to obtain the key production equipment.

[0055] Furthermore, the production quality traceability module includes a similarity analysis unit and a production quality traceability unit;

[0056] A similarity analysis unit is used to analyze the similarity of defect type distribution between the defect detection records in the factory and the defect record set to obtain a similar defect record set;

[0057] The production quality traceability unit is used to obtain the equipment operation records of key production equipment with similar defect record sets in the current cycle, trace the production quality of defective products in the defect detection records, and obtain the target production equipment.

[0058] Further, the production adjustment module includes a production adjustment unit;

[0059] The production adjustment unit is used to obtain the target production equipment of the factory in the current cycle, and dispatch the factory's maintenance personnel to repair the target production equipment according to the production plan data of the target production equipment in the current cycle, and optimize and adjust the product production lines in the factory.

[0060] Compared with the prior art, the beneficial effect of the present invention is that the present invention realizes the intelligent tracing of the production quality of products during the factory production process. Taking into account that the defect conditions of different historical defective products in the historical defect detection records are different, the historical defect detection records with similar product defects are obtained to obtain a defect record set. Subsequently, through the production batch information of the historical defective products in the defect record set, the production equipment for producing and processing the historical defective products can be quickly obtained. Because different defect record sets have different key target defect types, by obtaining the key production equipment of the defect record set, it is only necessary to perform defect type detection on the defective products produced by the factory in the future to quickly locate the corresponding key production equipment, and by analyzing the operating status of the key production equipment in the current cycle, the production quality of the factory can be accurately traced, and the root cause of the production quality problems of the defective products can be found, that is, the target production equipment of this application, and through equipment maintenance and product production line adjustment, the normal and efficient production of the factory is guaranteed to the greatest extent. BRIEF DESCRIPTION OF THE DRAWINGS

[0061] Figure 1is a method flow chart of the production quality traceability analysis method based on operation data of the present invention;

[0062] Figure 2 It is a module diagram of the production quality traceability analysis system based on operation data of the present invention. DETAILED DESCRIPTION

[0063] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0064] Example: Figure 1-Figure 2 As shown, the present invention provides a technical solution, a production quality traceability analysis method based on operation data, the method comprising:

[0065] Step S100: Acquire historical defect detection records in the factory, analyze the similarity of defect type distribution between different historical defect detection records in the factory, and aggregate historical defect detection records with similar product defect distribution states to obtain a defect record set;

[0066] Wherein, step S100 includes:

[0067] Step S101: Acquire each historical defect detection record of the factory, wherein the historical products detected in each historical defect detection record are all of the same product model;

[0068] Obtain the total number M of historical defective products detected with defects from a certain historical defect detection record sum , obtain the total number A of historical products detected in a certain historical defect detection record, and calculate the product defect ratio B=M of a certain historical defect detection record sum / A;

[0069] Step S102: When the product defect ratio is greater than a preset threshold, it is determined that a historical product in a certain historical defect detection record has a defect anomaly, and the historical defect detection record is retained; otherwise, the historical defect detection record is deleted;

[0070] Step S103: Acquire several retained historical defect detection records, and obtain the total number of historical defective products corresponding to each defect type from the retained historical defect detection records;

[0071] For example, various defect types include product damage, product functional defects, etc.

[0072] Obtain the total number of historical defective products corresponding to a certain defect type in the historical defect detection records, and compare it with the ratio of each historical product detected in the historical defect detection records to obtain the type ratio of the certain defect type in the historical defect detection records. When the type ratio of a certain defect type is greater than a preset ratio threshold, record the certain defect type as the target defect type in the historical defect detection records. Obtain several target defect types in the historical defect detection records and aggregate them according to the size of the type ratio to obtain a target defect type set.

[0073] Step S104: Obtain target defect type sets of several historical defect detection records, and obtain the target defect type set U of the retained b-th historical defect detection record. b , obtain the target defect type set U of the retained c-th historical defect detection record c , where the target defect type set U b With the target defect type set U c The same target defect type exists in the first k target defect types, where k is a preset value. The similarity of the defect type distribution between the bth historical defect detection record and the cth historical defect detection record is analyzed. The specific analysis process is as follows:

[0074] Calculate the defect approximation D between the bth historical defect detection record and the cth historical defect detection record (b,c) =(U c ∩U b ) / (U c ∪U b ), when the defect approximation D (b,c) If the defect type distribution between the bth historical defect detection record and the cth historical defect detection record is greater than the preset defect approximation threshold, it is determined that the defect type distribution between the bth historical defect detection record and the cth historical defect detection record is similar;

[0075] For example, U c ={a,b,c,e,f,g},U b = {e, k, p, r, a, b}, calculate the defect approximation D between the bth historical defect detection record and the cth historical defect detection record (b,c) =3 / 9=1 / 3;

[0076] Obtain and aggregate several historical defect detection records with defect type distributions similar to that of the bth historical defect detection record to obtain a defect record set, obtain several target defect types of the same type among the first k target defect types of the several historical defect detection records in the defect record set, and record the several target defect types as key target defect types of the defect record set;

[0077] Step S200: Obtain production equipment and production batch information of historical defective products in the defect record set, obtain historical equipment operation records of the production equipment based on the production batch information, analyze the degree of defect correlation between the production equipment and the historical defective products in the defect record set, and obtain key production equipment;

[0078] Wherein, step S200 includes:

[0079] Step S201: Obtain a defect record set of a factory, obtain a plurality of historical defect detection records from the defect record set, and obtain, from the plurality of historical defect detection records, each historical defective product whose defect type is the same as the key target defect type in the defect record set;

[0080] Step S202: Obtaining the production batch information of each historical defective product, and based on the production batch information, obtaining the historical equipment operation records of the production equipment that processed the product batch to which the historical defective product belongs, and recording them as marked historical equipment operation records;

[0081] For example, production batch information includes:

[0082] Batch number / production date of historically defective products: This can determine the production batch and specific production period of the product;

[0083] Product serial number: can obtain the production time, processing path and production equipment of a single product;

[0084] Product defect type: including the specific defect type of the product;

[0085] Obtaining each tagged historical equipment operation record of the production equipment, and obtaining the product defect rate of historical products produced by each tagged historical equipment operation record, wherein the product defect rate is the ratio between the number of historical defective products and the number of historical products in a product batch processed by the historical tagged historical equipment operation record;

[0086] Obtain the average values ​​of various operating parameters of the production equipment from the operation records of each marked historical equipment, and aggregate them to obtain a marked parameter set of the production equipment;

[0087] For example, various operating parameters include equipment voltage, equipment current, etc.;

[0088] Step S203: Acquire a plurality of historical equipment operation records of the production equipment, wherein the product type of the historical products processed by the production equipment in the plurality of historical equipment operation records is the same as the historical defective products, and the product defect rate of the historical products obtained in the plurality of historical equipment operation records is less than a preset threshold;

[0089] Obtain the average value of various operating parameters from several historical equipment operation records and record it as the control value of the production equipment;

[0090] Step S204: Analyze the degree of defect correlation between the production equipment and the key target defect types of the historical defective products in the defect record set. The specific analysis process is as follows:

[0091] Calculate the characteristic value F = |EE′| / E′ of the operating parameter of the marked historical equipment operation record in the marked parameter set, where E is the average value of the operating parameter in the marked historical equipment operation record, and E′ is the control value of the operating parameter in the production equipment;

[0092] For example, the average value E of the operating parameters in the marked historical equipment operation records is 10, and the control value E′ of the operating parameters in the production equipment is 20. The characteristic value F of the operating parameters in the marked historical equipment operation records in the marked parameter set is calculated as |20-10| / 20=0.5;

[0093] Obtain the correlation value r between the operating parameters of the production equipment and the key target defect type;

[0094] For example, the calculation formula for the correlation value r between the operating parameters of production equipment and key target defect types is:

[0095]

[0096] Where j is the total number of operation records of each marked historical device in the marked parameter set; F i is the characteristic value of the operating parameter of the i-th marking historical equipment operation record in the marking parameter set; G i The product defect rate of the historical product produced by the i-th marked historical equipment operation record; G △ The average value of the product defect rate of the historical products produced by each marked historical equipment operation record; F △ It is the average value of the characteristic values ​​of the operating parameters in the operating records of each marked historical device;

[0097] Obtain the defect correlation values ​​of various operating parameters of production equipment and key target defect types, and calculate the defect correlation value L=max{r i ,i=1,2,...,m}, where m is the total number of operating parameters of the production equipment, r i is the correlation value between the i-th operating parameter of the production equipment and the key target defect type;

[0098] When the defect correlation value L is greater than the preset defect correlation threshold, it is determined that the production equipment has a defect correlation with the key target defect type in the defect record set, and the production equipment is recorded as a key production equipment of the key target defect type in the defect record set;

[0099] Obtaining several operating parameters of key production equipment whose defect correlation values ​​are greater than a defect correlation threshold, and recording the several operating parameters as key operating parameters of the key production equipment;

[0100] Step S300: Obtain the factory's defect detection records for the current cycle, analyze the similarity of defect type distribution between the defect detection records and the defect record set, obtain a similar defect record set, obtain the equipment operation records for the key production equipment in the similar defect record set for the current cycle, trace the production quality of the defective products in the defect detection records, and obtain the target production equipment;

[0101] Wherein, step S300 includes:

[0102] Step S301: Obtain the factory's defect detection records in the current cycle, where the product model of the detected product in the defect detection record is the same as the product model of the historical defective product in the defect record set, and obtain each defect record set with the product model;

[0103] Step S302: Obtain several defective products of the factory in the current cycle from the defect detection records, and obtain the key target defect type corresponding to each defect record set;

[0104] When the proportion of a key target defect type in a defect record set among the defect types of several defective products is greater than a preset proportion threshold, the defect type distribution between the defect detection record and the defect record set is determined to be similar, and the defect record set is recorded as a similar defect record set;

[0105] Step S303: Trace the production quality of the defective product to obtain the target production equipment. The specific process is as follows:

[0106] Obtain each similar defect record set of the defect detection record, and obtain the equipment operation records of the key production equipment in the similar defect record set in the current cycle;

[0107] Obtaining average values ​​of various key operating parameters of key production equipment from equipment operation records, obtaining comparison values ​​of various key operating parameters of key production equipment, and obtaining characteristic values ​​of various key operating parameters of key production equipment in equipment operation records; when the characteristic value of a certain key operating parameter is greater than a preset threshold, determining that the key production equipment has an impact on the production quality of products in the current cycle, and recording the key production equipment as a target production equipment;

[0108] Step S400: Obtaining the production plan data of the target production equipment in the current cycle, dispatching factory maintenance personnel to inspect and repair the target production equipment, and optimizing and adjusting the product production line in the factory;

[0109] Wherein, step S400 includes:

[0110] Step S401: Obtain each target production equipment of the factory in the current cycle, obtain production plan data of the target production equipment in the current cycle, and obtain the planned quantity and planned production duration of the products planned to be produced and processed by the target production equipment in the current cycle from the production plan data;

[0111] Step S402: dispatching maintenance personnel from the factory to inspect and repair the target production equipment and optimize and adjust the product production line in the factory. The specific optimization and adjustment process is as follows:

[0112] Obtain production equipment that processes products in the current cycle that have the same process as the target production equipment. When the ratio of the planned production quantity of the production equipment to the planned production time is less than the production rate threshold of the production equipment, it is determined that the production equipment has the ability to assist the production of the target production equipment. The production equipment is recorded as auxiliary production equipment of the target production equipment, and the products planned to be produced and processed by the target production equipment are transported to the auxiliary production equipment, and the auxiliary production equipment performs production and processing on the products.

[0113] In order to better implement the above method, a production quality traceability analysis system based on operation data is also proposed. The system includes a defect type approximate analysis module, a defect correlation analysis module, a production quality traceability module, and a production adjustment module.

[0114] The defect type approximation analysis module is used to analyze the similarity of defect type distribution between different historical defect detection records in the factory, and to aggregate historical defect detection records with similar product defect distribution states to obtain a defect record set;

[0115] The defect correlation analysis module is used to analyze the degree of defect correlation between production equipment and historical defective products in the defect record set to obtain key production equipment;

[0116] The production quality traceability module is used to obtain the factory's defect detection records in the current cycle, and trace the production quality of defective products in the defect detection records based on the equipment operation records of key production equipment in the current cycle to obtain the target production equipment;

[0117] The production adjustment module is used to dispatch factory maintenance personnel to inspect and repair target production equipment, obtain the production plan data of the target production equipment in the current cycle, and optimize and adjust the product production line in the factory;

[0118] Among them, the defect type approximate analysis module includes a defect type classification unit and a defect type approximate analysis unit;

[0119] A defect type classification unit is used to classify the defect types in the historical defect detection records according to the type ratios of the defect types in the historical defect detection records to obtain target defect types;

[0120] The defect type approximation analysis unit is used to analyze the approximation of defect type distribution between different historical defect detection records, and aggregate several historical defect detection records with similar defect type distribution to obtain a defect record set;

[0121] Among them, the defect correlation analysis module includes a parameter set acquisition unit and a defect correlation analysis unit;

[0122] A parameter set acquisition unit is used to obtain the average value of various operating parameters of the production equipment from various marked historical equipment operation records of the production equipment, and to aggregate them to obtain a marked parameter set of the production equipment;

[0123] Defect correlation analysis unit, used to analyze the degree of defect correlation between production equipment and key target defect types in the defect record set to obtain key production equipment;

[0124] Among them, the production quality traceability module includes similarity analysis unit and production quality traceability unit;

[0125] A similarity analysis unit is used to analyze the similarity of defect type distribution between the defect detection records in the factory and the defect record set to obtain a similar defect record set;

[0126] The production quality traceability unit is used to obtain the equipment operation records of key production equipment with similar defect record sets in the current cycle, trace the production quality of defective products in the defect detection records, and obtain the target production equipment;

[0127] Wherein, the production adjustment module includes a production adjustment unit;

[0128] The production adjustment unit is used to obtain the target production equipment of the factory in the current cycle, and dispatch the factory's maintenance personnel to repair the target production equipment according to the production plan data of the target production equipment in the current cycle, and optimize and adjust the product production lines in the factory.

[0129] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above and that the invention can be embodied in other specific forms without departing from the spirit or essential characteristics of the invention. Therefore, the embodiments should be considered in all respects as illustrative and non-restrictive, and the scope of the invention is defined by the appended claims, not the foregoing description, and all variations within the meaning and range of equivalents of the claims are intended to be included therein. Any reference sign in a claim should not be construed as limiting the claim to which it relates.

Claims

1. A production quality traceability analysis method based on operation data, characterized in that: The method comprises: Step S100: Acquire historical defect detection records in the factory, analyze the similarity of defect type distribution between different historical defect detection records in the factory, and aggregate historical defect detection records with similar product defect distribution states to obtain a defect record set; Step S200: Obtaining production equipment and production batch information of historical defective products in the defect record set, obtaining historical equipment operation records of the production equipment based on the production batch information, analyzing the degree of defect correlation between the production equipment and the historical defective products in the defect record set, and obtaining key production equipment; Step S300: Obtain the defect detection records of the factory in the current cycle, analyze the similarity of the defect type distribution between the defect detection records and the defect record set to obtain a similar defect record set, obtain the equipment operation records of the key production equipment in the similar defect record set in the current cycle, trace the production quality of the defective products in the defect detection records, and obtain the target production equipment; Step S400: obtaining the production plan data of the target production equipment in the current cycle, dispatching maintenance personnel of the factory to inspect and repair the target production equipment, and optimizing and adjusting the product production line in the factory.

2. The production quality traceability analysis method based on operation data according to claim 1 is characterized in that: The step S100 includes: Step S101: Acquire each historical defect detection record of the factory, wherein the historical products detected in each historical defect detection record are all of the same product model; Obtain the total number M of historical defective products detected with defects from a certain historical defect detection record sum , obtain the total number A of historical products detected in the historical defect detection record, and calculate the product defect ratio B=M of the historical defect detection record sum / A; Step S102: When the product defect ratio is greater than a preset threshold, it is determined that a historical product in the historical defect detection record has a defect anomaly, and the historical defect detection record is retained; otherwise, the historical defect detection record is deleted; Step S103: Acquire several retained historical defect detection records, and obtain the total number of historical defective products corresponding to each defect type from the retained historical defect detection records; Obtaining a total number of historical defective products corresponding to a certain defect type in the historical defect detection record, and calculating a ratio of the total number of historical defective products to each of the historical products detected in the historical defect detection record to obtain a type ratio of the certain defect type in the historical defect detection record; when the type ratio of the certain defect type is greater than a preset ratio threshold, recording the certain defect type as a target defect type in the historical defect detection record; obtaining several target defect types in the historical defect detection record, and aggregating them based on the type ratios to obtain a target defect type set; Step S104: Obtain the target defect type set of the plurality of historical defect detection records, and obtain the target defect type set U of the retained b-th historical defect detection record. b , obtain the target defect type set U of the retained c-th historical defect detection record c , wherein the target defect type set U b With the target defect type set U c The same target defect type exists in the first k target defect types, where k is a preset value. The similarity of the defect type distribution between the bth historical defect detection record and the cth historical defect detection record is analyzed. The specific analysis process is as follows: Calculate the defect approximation D between the bth historical defect detection record and the cth historical defect detection record (b,c) =(U c ∩U b ) / (U c ∪U b ), when the defect approximation D (b,c) is greater than a preset defect approximation threshold, determining that the defect type distribution between the bth historical defect detection record and the cth historical defect detection record is similar; Obtain and aggregate several historical defect detection records with defect type distributions similar to that of the bth historical defect detection record to obtain a defect record set, obtain several target defect types of the same type among the first k target defect types of the several historical defect detection records in the defect record set, and record the several target defect types as key target defect types of the defect record set.

3. The production quality traceability analysis method based on operation data according to claim 2 is characterized in that: The step S200 includes: Step S201: obtaining the defect record set of the factory, obtaining a plurality of historical defect detection records from the defect record set, and obtaining, from the plurality of historical defect detection records, each historical defective product having a defect type identical to a key target defect type in the defect record set; Step S202: Obtaining production batch information of each of the historical defective products, and based on the production batch information, obtaining historical equipment operation records of production equipment that processed the product batch to which the historical defective products belong, and recording them as marked historical equipment operation records; Obtaining each marked historical equipment operation record of the production equipment, and obtaining a product defect rate of historical products produced by each marked historical equipment operation record, wherein the product defect rate is a ratio between the number of historical defective products and the number of historical products in a product batch processed by the historical marked historical equipment operation record; Obtaining average values ​​of various operating parameters of the production equipment from the various marked historical equipment operation records, and aggregating them to obtain a marked parameter set of the production equipment; Step S203: Acquire a plurality of historical equipment operation records of the production equipment, wherein the product type of historical products processed by the production equipment in the plurality of historical equipment operation records is the same as the historical defective product, and the product defect rate of the historical products obtained in the plurality of historical equipment operation records is less than a preset threshold; Obtaining an average value of each of the operating parameters from the plurality of historical equipment operation records, and recording the average value as a control value of the production equipment; Step S204: analyzing the degree of defect correlation between the production equipment and the key target defect types of the historical defective products in the defect record set. The specific analysis process is as follows: Calculating a characteristic value F=|EE′| / E′ of an operating parameter of the marked historical equipment operation record in the marked parameter set, where E is an average value of the operating parameter in the marked historical equipment operation record, and E′ is a control value of the operating parameter in the production equipment; Obtaining a correlation value r between the operating parameter of the production equipment and the key target defect type; Obtain the defect correlation value between the various operating parameters of the production equipment and the key target defect type, and calculate the defect correlation value L=max{r i , i=1, 2, ..., m}, where m is the total number of operating parameters of the production equipment, r i is the correlation value between the i-th operating parameter of the production equipment and the key target defect type; When the defect association value L is greater than a preset defect association threshold, it is determined that the production equipment has a defect association with the key target defect type in the defect record set, and the production equipment is recorded as a key production equipment of the key target defect type in the defect record set; Acquire several operating parameters of the key production equipment whose defect association values ​​are greater than the defect association threshold, and record the several operating parameters as key operating parameters of the key production equipment.

4. The production quality traceability analysis method based on operation data according to claim 3 is characterized in that: The step S300 includes: Step S301: Obtain defect detection records of the factory in the current cycle, wherein the detected products in the defect detection records have the same product model as the historical defective products in the defect record set, and obtain each defect record set with the same product model; Step S302: obtaining a number of defective products of the factory in the current cycle from the defect detection records, and obtaining a key target defect type corresponding to each defect record set; When a proportion of a key target defect type belonging to a certain defect record set in the defect types of the plurality of defective products is greater than a preset proportion threshold, it is determined that the defect type distribution between the defect detection record and the certain defect record set is similar, and the certain defect record set is recorded as a similar defect record set; Step S303: Tracing the production quality of the defective product to obtain the target production equipment. The specific process is as follows: Obtaining each similar defect record set of the defect detection record, and obtaining the equipment operation record of the key production equipment in the similar defect record set in the current cycle; Obtain the average values ​​of the key operating parameters of the key production equipment from the equipment operation record, obtain the comparison values ​​of the key operating parameters of the key production equipment, obtain the characteristic values ​​of the key operating parameters of the key production equipment in the equipment operation record; when the characteristic value of a key operating parameter is greater than a preset threshold, determine that the key production equipment has an impact on the production quality of the product in the current cycle, and record the key production equipment as the target production equipment.

5. The production quality traceability analysis method based on operation data according to claim 4 is characterized in that: The step S400 includes: Step S401: Acquire each target production equipment of the factory in the current cycle, acquire production plan data of the target production equipment in the current cycle, and acquire the planned quantity and planned production duration of the products planned to be produced and processed by the target production equipment in the current cycle from the production plan data; Step S402: dispatching maintenance personnel from the factory to inspect and repair the target production equipment, and optimizing and adjusting the product production line in the factory. The specific optimization and adjustment process is as follows: Obtain production equipment whose product processing process in the current cycle is the same as that of the target production equipment. When the ratio of the planned quantity of production and processing products of the production equipment to the planned production time is less than the production rate threshold of the production equipment, it is determined that the production equipment has auxiliary capabilities for the production of the target production equipment. The production equipment is recorded as the auxiliary production equipment of the target production equipment. The products planned to be produced and processed by the target production equipment are transported to the auxiliary production equipment, and the products are produced and processed by the auxiliary production equipment.

6. A production quality traceability analysis system based on operation data, used to execute the production quality traceability analysis method based on operation data according to any one of claims 1 to 5, characterized in that: The system includes a defect type approximate analysis module, a defect correlation analysis module, a production quality tracing module and a production adjustment module; The defect type approximation analysis module is used to analyze the degree of similarity in defect type distribution between different historical defect detection records in the factory, and to collect historical defect detection records with similar product defect distribution states to obtain a defect record set; The defect correlation analysis module is used to analyze the degree of defect correlation between production equipment and historical defective products in the defect record set to obtain key production equipment; The production quality tracing module is used to obtain the defect detection records of the factory in the current cycle, and trace the production quality of defective products in the defect detection records based on the equipment operation records of key production equipment in the current cycle to obtain the target production equipment; The production adjustment module is used to dispatch maintenance personnel of the factory to inspect and repair the target production equipment, obtain production plan data of the target production equipment in the current cycle, and optimize and adjust the product production line in the factory.

7. The production quality traceability analysis system based on operation data according to claim 6, characterized in that: The defect type approximate analysis module includes a defect type classification unit and a defect type approximate analysis unit; The defect type classification unit is configured to classify the defect types in the historical defect detection records according to the type ratios of the defect types in the historical defect detection records to obtain target defect types; The defect type approximation analysis unit is used to analyze the approximation degree of defect type distribution between different historical defect detection records, and to aggregate several historical defect detection records with similar defect type distribution to obtain a defect record set.

8. The production quality traceability analysis system based on operation data according to claim 6 is characterized in that: The defect correlation analysis module includes a parameter set acquisition unit and a defect correlation analysis unit; The parameter set acquisition unit is used to obtain the average value of each operating parameter of the production equipment from each marked historical equipment operation record of the production equipment, and aggregate them to obtain the marked parameter set of the production equipment; The defect correlation analysis unit is used to analyze the defect correlation degree between the production equipment and the key target defect type in the defect record set to obtain the key production equipment.

9. The production quality traceability analysis system based on operation data according to claim 6, characterized in that: The production quality tracing module includes a similarity analysis unit and a production quality tracing unit; The similarity analysis unit is used to analyze the similarity of defect type distribution between the defect detection records in the factory and the defect record set to obtain a similar defect record set; The production quality tracing unit is used to obtain the equipment operation records of the key production equipment of the similar defect record set in the current cycle, trace the production quality of the defective products in the defect detection records, and obtain the target production equipment.

10. The production quality traceability analysis system based on operation data according to claim 6, characterized in that: The production adjustment module includes a production adjustment unit; The production adjustment unit is used to obtain the target production equipment of the factory in the current cycle, and dispatch the factory's maintenance personnel to inspect and repair the target production equipment based on the production plan data of the target production equipment in the current cycle, and optimize and adjust the product production line in the factory.

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