LED lamp driving power supply test method and system, and storage medium

Abstract

The invention discloses an LED lamp driving power supply testing method and system and a storage medium, and relates to the technical field of driving power supply overcurrent protection testing. The LED lamp driving power supply testing method comprises the following steps of transient over-current test analysis, dynamic over-current test judgment and over-current test result output. According to the method, whether to send the transient over-current test interference suppression instruction or not is judged according to the obtained transient over-current test interference result, if yes, whether to execute dynamic over-current test analysis or not is judged after transient over-current test interference suppression is executed, and if not, the dynamic over-current test interference result is obtained. And finally, whether a test result output instruction is sent or not is judged based on the obtained dynamic over-current test interference result, so that the over-current protection test accuracy of the LED vehicle lamp driving power supply is improved. The problem that in the prior art, interference of ripples on a test is not fully considered when an over-current protection test is carried out on an LED vehicle lamp driving power supply in a simulated vehicle starting stage is solved.

Description

Technical Field

[0001] The present invention relates to the technical field of driving power supply overcurrent protection testing, and in particular to a method, system and storage medium for testing an LED lamp driving power supply. Background Art

[0002] As a core component in automotive lighting systems, LED (Light Emitting Diode) headlight drivers must deliver efficient and stable output performance. Overcurrent protection is a key safety feature of LED headlight drivers. If the driver fails to provide a stable current or an overcurrent condition occurs, it can damage the LEDs, cause overheating, or lead to power failure. In severe cases, this can even pose a safety hazard. LED headlight drivers must operate stably under various driving conditions, such as startup, stabilization, and shutdown. During these driving conditions, LED headlight drivers may be affected by fluctuations in battery voltage or current, causing the output current to exceed the safe operating range and generate overcurrent. Therefore, by simulating the various driving conditions of a vehicle and testing the performance of the LED headlight driver under different conditions, we can effectively prevent unsafe overcurrent events under dynamic operating conditions.

[0003] In the prior art, the main process for overcurrent protection testing of LED headlight drivers involves connecting the output of the LED headlight driver to an electronic load. A battery simulator is then used to simulate different driving phases and provide input voltage to the LED headlight driver. The electronic load then simulates the current changes in the LED headlight, gradually increasing the current until it exceeds the rated current of the driver. An oscilloscope is then used to monitor the output current waveform of the power supply in real time, capturing the current and voltage waveforms at the moment of overcurrent, as well as the protection response time, to observe the overcurrent protection behavior of the power supply, i.e., whether it cuts off the output current or enters a current limiting state. The overcurrent protection capability of the driver under varying loads is tested by dynamically varying the load current. This involves using an adjustable electronic load to simulate the load fluctuations of the LED headlight during driving. By adjusting the load current, the current fluctuations are continuously varied, and the power supply is checked to see if it can detect overcurrent in real time and enter a protection state.

[0004] For example, the Chinese patent application with publication number CN115586427A discloses an overcurrent test method and device for a backplane power protection switch, an electronic device, and a readable storage medium, including: obtaining the maximum current value of the backplane during the period from when all hard disks on the backplane are in a non-read / write state to when the reading and writing of all hard disks on the backplane are instantaneously started; subtracting the maximum current value from the current threshold of the power protection switch to obtain the difference; when the difference is greater than or equal to the current safety margin of the power protection switch, the overcurrent test corresponding to the state passes.

[0005] For example, the Chinese invention patent with announcement number CN113777520B discloses a test method, device, system and medium for on-board power supply overcurrent protection, including: when a load is connected to the power supply, controlling the output current of the power supply to increase to simulate an overcurrent protection test; obtaining the voltage value of the power supply detected by a multimeter connected to the power supply; when the voltage value meets a preset condition, reading the current value of the load as the overcurrent protection current value of the power supply.

[0006] The above technology has at least the following technical problems: The switching power supply in an LED headlight driver uses high-frequency switching elements for switching operations during the switching process, and is filtered by inductors and capacitors. During the simulated vehicle startup phase, the switching frequency inevitably generates ripple in the output voltage. The frequency of this ripple may interact with the frequency of the transient current being tested, causing signal distortion and affecting the test waveform. Furthermore, high-frequency ripple may overlap with the transient current waveform, causing waveform distortion during testing and preventing the test results from accurately reflecting the actual overcurrent protection behavior.

[0007] Another consideration is that during the simulated vehicle startup phase and the transition to the stable phase, transient changes in battery voltage can cause input power fluctuations, generating ripple interference. This ripple can cause rapid fluctuations in the output current. If the ripple amplitude is large, it can cause the current to temporarily exceed the set overcurrent protection threshold, triggering the overcurrent protection mechanism. However, this overcurrent is not caused by an actual load overload, but rather a false triggering caused by the ripple, which in turn affects the reliability of the test data. This suggests that the ripple interference in the overcurrent protection test of the LED headlight driver power supply during the simulated vehicle startup phase is not fully considered. Summary of the Invention

[0008] To address the technical problem in the prior art of not fully considering the interference of ripple on the test when performing overcurrent protection testing on an LED lamp driver power supply during a simulated vehicle startup phase, the present invention provides a method, system, and storage medium for testing an LED lamp driver power supply. The technical solution is as follows: On the one hand, a method for testing an LED lamp driving power supply is provided, the method comprising: performing a transient overcurrent test on the LED lamp driving power supply during a simulated vehicle startup phase, obtaining a transient overcurrent test interference result for reflecting the degree of ripple interference on the LED lamp driving power supply during the transient overcurrent test, and judging whether to send a transient overcurrent test interference suppression instruction based on the obtained transient overcurrent test interference result; if the transient overcurrent test interference suppression instruction is sent, judging whether to perform a dynamic overcurrent test analysis after performing the transient overcurrent test interference suppression, and obtaining a transient overcurrent test interference result for feedback after performing the dynamic overcurrent test analysis. The dynamic overcurrent test interference result is reflected, which reflects the degree of input fluctuation interference on the LED headlight driver power supply during the dynamic overcurrent test. If the dynamic overcurrent test analysis is not performed, a transient overcurrent test abnormality prompt is sent. If the transient overcurrent test interference suppression instruction is not sent, a dynamic overcurrent test is performed on the LED headlight driver power supply from the start-up stage to the stable stage of the simulated vehicle to obtain the dynamic overcurrent test interference result; based on the obtained dynamic overcurrent test interference result, it is determined whether to send the test result output instruction. If sent, the overcurrent test result is output. If not sent, the dynamic overcurrent test interference suppression is performed.

[0009] On the other hand, a LED lamp driving power supply test system is provided, including: a transient overcurrent test analysis module, a dynamic overcurrent test judgment module and an overcurrent test result output module; the transient overcurrent test analysis module is used to perform a transient overcurrent test on the LED headlight driving power supply during the simulated vehicle startup phase, obtain a transient overcurrent test interference result that reflects the degree of ripple interference on the LED headlight driving power supply during the transient overcurrent test, and judge whether to send a transient overcurrent test interference suppression instruction based on the obtained transient overcurrent test interference result; the dynamic overcurrent test judgment module is used to judge whether to execute the dynamic overcurrent test after executing the transient overcurrent test interference suppression if the transient overcurrent test interference suppression instruction is sent. Test analysis, obtain the dynamic overcurrent test interference result after executing the dynamic overcurrent test analysis, which is used to reflect the degree of interference of the LED headlight driver power supply by the input fluctuation during the dynamic overcurrent test process. If the dynamic overcurrent test analysis is not performed, a transient overcurrent test abnormality prompt is sent. If the transient overcurrent test interference suppression instruction is not sent, a dynamic overcurrent test is performed on the LED headlight driver power supply from the start-up stage to the stable stage of the simulated vehicle to obtain the dynamic overcurrent test interference result; the overcurrent test result output module is used to determine whether to send the test result output instruction based on the obtained dynamic overcurrent test interference result. If sent, the overcurrent test result is output. If not sent, the dynamic overcurrent test interference suppression is performed.

[0010] On the other hand, a computer-readable storage medium is provided, in which at least one instruction is stored. The at least one instruction is loaded and executed by a processor to implement the above-mentioned LED lamp driving power supply testing method.

[0011] The beneficial effects brought about by the technical solution provided by the embodiment of the present invention include at least: 1. During the overcurrent protection test of the LED headlight driver power supply during the simulated vehicle startup phase, the existence of the switching frequency often leads to the generation of ripples, which causes inaccurate results of the overcurrent protection test of the LED headlight driver power supply. This application effectively improves the accuracy of the ripple interference degree judgment in the transient overcurrent test by obtaining a transient overcurrent test interference result that reflects the degree of ripple interference of the LED headlight driver power supply in the transient overcurrent test. Then, based on the obtained transient overcurrent test interference result, it is determined whether to send a transient overcurrent test interference suppression instruction. If so, the transient overcurrent test interference suppression instruction is executed. After suppression, it is determined whether to perform dynamic overcurrent test analysis. If not, the dynamic overcurrent test interference result is obtained, thereby realizing effective correlation analysis between transient overcurrent test and dynamic overcurrent test of LED headlight driver power supply. Finally, based on the obtained dynamic overcurrent test interference result, it is determined whether to send the test result output instruction, which helps to reduce the influence of ripple interference on overcurrent test results, improves the accuracy of overcurrent protection test of LED headlight driver power supply, and solves the problem in the prior art that the interference of ripple on test is not fully considered when performing overcurrent protection test on LED headlight driver power supply during the simulated vehicle startup phase.

[0012] 2. By interactively processing the obtained transient test detection value and the test interference influence factor, a transient test interference score is obtained, and the degree of influence of ripple interference during the transient overcurrent test of the LED headlight driver power supply is numerically evaluated in a quantitative manner. Compared with the transient overcurrent test process of the prior art, the correlation and mutual influence relationship between various parameters are taken into account, and a more accurate judgment is achieved on the degree of influence of ripple interference during the transient overcurrent test process. Then, based on the obtained transient overcurrent test interference result, it is determined whether to send a transient overcurrent test interference suppression instruction, which effectively reduces the interference of the interaction between the ripple frequency and the transient current change frequency of the test on the test result, which helps to improve the reliability of the transient overcurrent test result of the LED headlight driver power supply.

[0013] 3. By judging whether the dynamic test interference score is within the preset test interference controllable range to obtain the dynamic overcurrent test interference result, it is helpful to more accurately analyze the degree to which the dynamic overcurrent test process is affected by input fluctuation interference to obtain a more accurate dynamic overcurrent test result. Then, based on the obtained dynamic overcurrent test interference result, it is judged whether to send the test result output instruction. If sent, the overcurrent test result is output. If not sent, dynamic overcurrent test interference suppression is performed. Dynamic overcurrent test interference suppression is used to smooth the output current waveform of the LED headlight driver power supply, reduce the instantaneous current changes caused by input fluctuations, and reduce the impact of input fluctuation interference on the accuracy of the test results during the dynamic overcurrent test. The filter capacitor capacity adjustment helps to reduce the power supply output voltage fluctuation caused by input voltage fluctuations, thereby reducing the ripple in the current waveform, effectively improving the accuracy and reliability of the test results of the LED headlight driver power supply overcurrent protection test. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0015] Figure 1 This is an overall logic diagram of a method for testing an LED lamp driving power supply provided by an embodiment of the present invention; Figure 2 A flow chart of a method for testing an LED lamp driving power supply provided by an embodiment of the present invention; Figure 3 A logic diagram for obtaining interference results from a dynamic overcurrent test of an LED lamp driver power supply test method provided by an embodiment of the present invention; Figure 4 A schematic diagram of the structure of an LED lamp drive power supply test system provided by an embodiment of the present invention; Figure 5 This is one of the transient overcurrent test interface diagrams of an LED lamp drive power supply test system provided by an embodiment of the present invention; Figure 6 This is one of the dynamic overcurrent test interface diagrams of an LED lamp drive power supply test system provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0016] The technical solution of the present invention is described below in conjunction with the accompanying drawings.

[0017] In the embodiments of the present invention, words such as "exemplarily" and "for example" are used to indicate examples, illustrations, or explanations. Any embodiment or design described as an "exemplary" in the present invention should not be interpreted as being preferred or advantageous over other embodiments or designs. Rather, the use of the word "exemplary" is intended to present concepts in a concrete manner. Furthermore, in the embodiments of the present invention, "and / or" can mean both or either of the two.

[0018] In the embodiments of the present invention, sometimes a subscript such as W1 may be written as a non-subscript such as W1. When the difference is not emphasized, the meanings to be expressed are the same.

[0019] The embodiment of the present invention provides an LED lamp driver power supply testing method, system and storage medium, which solves the problem in the prior art that the interference of ripple on the test is not fully considered when performing an overcurrent protection test on the LED lamp driver power supply during the simulated vehicle startup phase. The method performs a transient overcurrent test on the LED lamp driver power supply during the simulated vehicle startup phase, and obtains a transient overcurrent test interference result reflecting the degree of ripple interference on the LED lamp driver power supply during the transient overcurrent test. Then, based on the obtained transient overcurrent test interference result, it is determined whether to send a transient overcurrent test interference suppression instruction. If the transient overcurrent test interference suppression instruction is sent, it is determined whether to perform a dynamic overcurrent test after executing the transient overcurrent test interference suppression. Analysis is performed, and a dynamic overcurrent test interference result is obtained after the dynamic overcurrent test analysis is performed, which is used to reflect the degree of input fluctuation interference on the LED headlight driver power supply during the dynamic overcurrent test. If the dynamic overcurrent test analysis is not performed, a transient overcurrent test abnormality prompt is sent. If the transient overcurrent test interference suppression instruction is not sent, a dynamic overcurrent test is performed on the LED headlight driver power supply from the start-up stage to the stable stage of the simulated vehicle to obtain a dynamic overcurrent test interference result. Finally, based on the obtained dynamic overcurrent test interference result, it is determined whether to send a test result output instruction. If sent, the overcurrent test result is output. If not sent, the dynamic overcurrent test interference suppression is performed, thereby improving the accuracy of the overcurrent protection test of the LED headlight driver power supply.

[0020] The technical solution in the embodiment of the present invention is to solve the problem that the interference caused by ripple on the test is not fully considered when performing overcurrent protection test on the LED lamp driving power supply during the simulated vehicle startup phase. The overall idea is as follows: Whether to send a transient overcurrent test interference suppression instruction is determined by the obtained transient overcurrent test interference result. If sent, whether to perform dynamic overcurrent test analysis is determined after executing transient overcurrent test interference suppression. If not sent, the dynamic overcurrent test interference result is obtained, and finally it is determined whether to send a test result output instruction, thereby improving the accuracy of overcurrent protection testing of LED car light driver power supply.

[0021] In order to make the technical problems, technical solutions and advantages to be solved by the present invention clearer, a detailed description will be given below with reference to the accompanying drawings and specific embodiments.

[0022] like Figure 1 As shown in FIG, an overall logic diagram of a method for testing an LED lamp driving power supply provided by an embodiment of the present invention, the corresponding logic is: based on the obtained transient test interference score, a transient overcurrent test interference result is obtained, and the transient overcurrent test interference result is used to reflect the degree of ripple interference of the LED headlight driving power supply in the transient overcurrent test. If the transient overcurrent test interference result is a transient test interference abnormality, a transient overcurrent test interference suppression instruction is sent, and after executing the transient overcurrent test interference suppression, it is determined whether to perform a dynamic overcurrent test analysis. If so, the dynamic overcurrent test interference result is obtained, otherwise a transient overcurrent test abnormality prompt is sent. If the transient overcurrent test interference result is a transient test interference abnormality, a transient overcurrent test interference suppression instruction is sent, and after executing the transient overcurrent test interference suppression, it is determined whether to perform a dynamic overcurrent test analysis. If so, the dynamic overcurrent test interference result is obtained, otherwise a transient overcurrent test abnormality prompt is sent. If the transient overcurrent test interference warning is displayed, the transient overcurrent test interference suppression instruction will not be sent and the prompt will be given to execute the transient overcurrent test adjustment. If the transient overcurrent test interference result is that the transient test interference is controllable, the transient overcurrent test interference suppression instruction will not be sent and the dynamic overcurrent test interference result will be obtained. The dynamic overcurrent test interference result includes dynamic test interference controllable and dynamic test interference abnormal. If the dynamic overcurrent test interference result is that the dynamic test interference is controllable, the test result output instruction will be sent. If the dynamic overcurrent test interference result is that the dynamic test interference is abnormal, the prompt will be given to execute the dynamic overcurrent test interference suppression. The dynamic overcurrent test interference suppression includes PWM duty cycle adjustment and filter capacitor capacity adjustment.

[0023] As an embodiment of the first aspect, Figure 2 FIG. 1 is a flow chart of a method for testing a LED lamp driving power supply according to an embodiment of the present invention, referring to FIG. Figure 2 The method includes the following steps: transient overcurrent test analysis, dynamic overcurrent test judgment and overcurrent test result output.

[0024] Specifically, for the transient overcurrent test analysis of the first step, during the simulated vehicle startup phase, a transient overcurrent test is performed on the LED headlight driver power supply. The specific steps are as follows: First, obtain transient overcurrent test data and test interference monitoring data during the transient overcurrent test of the LED headlight driver power supply under the simulated vehicle startup phase; specifically, the transient overcurrent test data includes the maximum transient current, transient current change rate, and transient response time; the test interference monitoring data includes the ripple interference amplitude, ripple interference frequency, and ripple noise current; and obtain the transient overcurrent test data and test interference monitoring data by connecting a current probe deployed at the output end of the LED headlight driver power supply to an oscilloscope.

[0025] Secondly, based on the transient overcurrent test data, the corresponding transient overcurrent test relative deviation is obtained, and the transient overcurrent test relative deviation is correspondingly weighted coupled with the transient overcurrent test compensation value obtained from the preset database to obtain the transient test detection value; the transient overcurrent test compensation value is used to describe the degree of influence of the corresponding transient overcurrent test relative deviation on the transient test detection value.

[0026] Among them, the relative deviation of the transient overcurrent test includes the relative deviation of the maximum transient current, the relative deviation of the transient current change rate, and the relative deviation of the transient response time. The relative deviation of the transient overcurrent test represents the result of the absolute value of the difference operation between the transient overcurrent test data and the corresponding transient overcurrent test threshold, and the ratio operation with the corresponding transient overcurrent test threshold, wherein the ratio operation is a division operation; the transient overcurrent test threshold corresponding to the transient overcurrent test data is obtained from a preset database and is set by professionals according to the standards in the field.

[0027] Next, the results of the ripple interference amplitude ratio, the ripple interference frequency relative deviation and the ripple noise current ratio are adjusted and averaged and recorded as the test interference influencing factor; specifically, the ripple interference amplitude ratio result represents the result of the ratio analysis of the ripple interference amplitude and the ripple amplitude threshold, the ripple interference frequency ratio result represents the result of the ratio analysis of the ripple frequency reference value and the ripple interference frequency after the absolute value is calculated and the ripple frequency reference value is obtained; the ripple noise current ratio result represents the result of the ratio analysis of the ripple noise current and the ripple noise current threshold; among them, the ripple amplitude threshold, the ripple frequency reference value and the ripple noise current threshold are all set by professionals according to the standards in the field. For example, the ripple amplitude threshold is set to the maximum value of the collected historical ripple interference amplitude, the ripple frequency reference value is the result of averaging the collected historical ripple interference frequency, and the ripple noise current threshold is the maximum value of the collected historical ripple noise current.

[0028] At the same time, the obtained transient test detection value and the test interference influence factor are interactively processed to obtain a transient test interference score. The test interference influence interactive processing is a product operation. The transient test interference score is used to quantitatively determine the degree of influence of ripple interference on the transient overcurrent test process of the LED headlight driver power supply.

[0029] It's important to understand that the transient test interference score takes into account the interplay between various parameters. Specifically, as the test interference influence factor increases, the transient test detection value increases, indicating that the LED headlight driver power supply is increasingly affected by ripple interference during transient overcurrent testing, i.e., the transient test interference score increases. Furthermore, the transient test interference score incorporates multiple parameters from both the transient overcurrent test data and the test interference monitoring data, and there are correlations between these parameters. For example, if the LED headlight driver power supply experiences large current changes during transients, this may result in insufficient power supply filtering or significant switching frequency fluctuations, causing lower-frequency ripple. Large transient currents can disrupt the power supply's stable output, leading to the generation of low-frequency ripple. This means that the ripple interference frequency decreases as the maximum transient current increases. Furthermore, large transient currents mean the power supply is supplying a large amount of current in a short period of time, especially during the transition between power switches. This large current fluctuation can easily introduce high-frequency noise, resulting in an increase in ripple noise current. That is, as the transient test detection value increases, the test interference influence factor also increases. Through quantitative means, the transient test detection value and the test interference influence factor are interactively processed. Based on the correlation and mutual influence between the two, a quantitative judgment is made on the degree to which the LED headlight driver power supply is affected by ripple interference during the transient overcurrent test.

[0030] During the simulated vehicle startup phase, the load and voltage of the onboard power supply change rapidly, generating transient fluctuations. At this point, the transient response and ripple interference of the LED headlight driver may interact, causing additional impacts on the overcurrent test process. Ripple interference can cause false or inaccurate overcurrent data readings. Because ripple interference further significantly impacts the stability and reliability of the LED headlight driver, if not fully accounted for, erroneous transient overcurrent test results may be obtained, leading to a misjudgment of the LED headlight driver's performance. Therefore, accurate test data helps to precisely evaluate key parameters of the LED headlight driver, such as transient response, maximum current, and current variation, providing a scientific basis for testers to judge the overcurrent protection performance of the LED headlight driver.

[0031] During the simulated vehicle startup phase, after the LED headlight driver power supply is subjected to a transient overcurrent test, as a further solution, a transient overcurrent test interference result is obtained to reflect the degree of ripple interference on the LED headlight driver power supply during the transient overcurrent test, and based on the obtained transient overcurrent test interference result, it is determined whether to send a transient overcurrent test interference suppression instruction; the transient overcurrent test interference result is obtained by determining the obtained transient test interference score, and it is determined whether to send a transient overcurrent test interference suppression instruction, thereby effectively reducing the degree to which the LED headlight driver power supply is affected by ripple interference during the transient overcurrent test, so as to further improve the accuracy and reliability of the transient overcurrent test of the LED headlight driver power supply.

[0032] Among them, based on the obtained transient overcurrent test interference result, it is determined whether to send a transient overcurrent test interference suppression instruction. The specific process is as follows: First, the transient test interference score is compared with the test interference abnormality setting value obtained from the preset database. If the transient test interference score is greater than the test interference abnormality setting value, the corresponding transient overcurrent test interference result is output as transient test interference abnormality, and a transient overcurrent test interference suppression instruction is sent to execute transient overcurrent test interference suppression.

[0033] Secondly, if the transient test interference score is not greater than the test interference abnormality setting value, it is determined whether the transient test interference score is greater than the test interference warning setting value obtained from the preset database; the test interference abnormality setting value and the test interference abnormality setting value are both set by professionals according to standards in the field. For example, the test interference abnormality setting value is set to the maximum value of the collected historical transient test interference scores, and the test interference abnormality setting value is the result of averaging the collected historical transient test interference scores.

[0034] In addition, if the transient test interference score is greater than the test interference warning setting value, the corresponding transient overcurrent test interference result output is the transient test interference warning, the transient overcurrent test interference suppression instruction is not sent, and the prompt is to execute the transient overcurrent test adjustment; otherwise, the corresponding transient overcurrent test interference result output is the transient test interference controllable, the transient overcurrent test interference suppression instruction is not sent, and the dynamic overcurrent test interference result is obtained, while continuously monitoring whether the transient test interference score is not greater than the test interference warning setting value.

[0035] Specifically, the specific process of performing transient overcurrent test interference suppression is as follows: M1 inputs the PWM (Pulse Width Modulation) frequency adjustment strength into the PWM controller of the switching power supply in the LED headlight driver to update the initial PWM frequency. The PWM frequency adjustment strength is the result of inputting the transient test interference score into a preset database mapping the transient test interference score to the PWM frequency adjustment strength. As the transient test interference score increases, the PWM frequency adjustment strength increases accordingly, and the initial PWM frequency is increased by the PWM frequency adjustment strength.

[0036] M2, inputs the filter cutoff frequency adjustment force into the low-pass filter of the switching power supply in the LED car light driver power supply to update the initial filter cutoff frequency. The filter cutoff frequency adjustment force is the result of inputting the transient test interference score into a preset database and mapping the transient test interference score and the filter cutoff frequency adjustment force. Among them, as the transient test interference score increases, the filter cutoff frequency adjustment force increases accordingly, and the initial filter cutoff frequency is reduced by the filter cutoff frequency adjustment force.

[0037] M3, re-obtain the transient overcurrent test interference result. If the re-obtained transient overcurrent test interference result is a transient test interference abnormality, the PWM frequency adjustment strength and the filter cutoff frequency adjustment strength are updated based on the transient test interference score change coefficient and returned to M1. Otherwise, execute M4. The transient test interference score change coefficient represents the result of inputting the transient test interference score change degree into the mapping set of the transient test interference score change degree and the PWM frequency adjustment strength update value and the filter cutoff frequency adjustment strength update value constructed in the database. The transient test interference score change coefficient includes the PWM frequency adjustment change coefficient and the cutoff frequency adjustment change coefficient. The transient test interference score change degree represents the result of performing a proportion analysis on the transient test interference score after calculating the difference between the transient test interference score and the re-obtained transient test interference score.

[0038] M4: If the re-acquired transient overcurrent test interference result is a transient test interference warning, a transient overcurrent test interference suppression end prompt is sent, and transient overcurrent test adjustment is performed. By adjusting the PWM frequency, resonance with the natural frequency of the vehicle power supply can be avoided, reducing current or voltage fluctuations caused by resonance. By adjusting the cutoff frequency of the low-pass filter, high-frequency noise and ripple in the LED headlight driver power supply can be removed. Otherwise, M5 is executed; M5: If the re-acquired transient overcurrent test interference result shows that the transient test interference is controllable, a prompt indicating that the transient overcurrent test interference suppression is completed is sent, and the dynamic overcurrent test interference result is obtained.

[0039] It's important to understand that during the simulated vehicle startup phase, transient overcurrent testing of the LED headlight driver may be affected by ripple interference, potentially impacting the accuracy of test results. Adjusting the PWM frequency helps reduce high-frequency noise during transient overcurrent testing, thereby reducing electromagnetic interference (EMI) on the LED headlight driver. Furthermore, the primary function of a low-pass filter is to filter out high-frequency noise and ripple signals. When the LED headlight driver is subject to ripple interference, adjusting the low-pass filter's cutoff frequency helps optimize filter performance, reducing the impact of transient overcurrent testing on the LED headlight driver, and thereby improving the accuracy of the test.

[0040] Specifically, the specific process of performing transient overcurrent test adjustment is as follows: A1. Update the initial sampling rate of the oscilloscope during the transient overcurrent test of the LED headlight driver power supply to the test-optimized sampling rate. The test-optimized sampling rate represents the output of the sampling rate adjustment linear regression mapping model after inputting the deviation degree between the transient test interference score and the test interference warning set value.

[0041] A2 updates the initial bandwidth of the oscilloscope during the transient overcurrent test of the LED headlight driver to the test optimized bandwidth. The test optimized bandwidth represents the output of the bandwidth adjustment linear regression mapping model after inputting the deviation between the transient test interference score and the test interference warning set value.

[0042] A3, based on the test optimization sampling rate and test optimization bandwidth, performs a transient overcurrent test on the LED headlight driver power supply during the simulated vehicle startup phase, and determines whether the re-acquired transient overcurrent test interference result is controllable. If so, a transient overcurrent test adjustment end prompt is sent and the dynamic overcurrent test interference result is obtained. Otherwise, a test adjustment monitoring abnormality prompt is sent.

[0043] Among them, it should be noted that the sampling rate adjustment linear regression mapping model and the bandwidth adjustment linear regression mapping model are pre-trained linear regression models for fitting the mapping relationship between transient test interference scores and the corresponding test optimization sampling rates and test optimization bandwidths. The input of the linear regression model is the test optimization sampling rate data and the test optimization bandwidth data. The linear regression model is trained based on the least squares method through the scikit-learn framework to obtain the corresponding linear regression mapping model; the test optimization sampling rate data includes the transient test interference scores in the historical time period, and the test optimization sampling rates set by the preset staff according to the transient test interference scores. The test optimization bandwidth data includes the transient test interference scores in the historical time period, and the test optimization bandwidth set by the preset staff according to the transient test interference scores.

[0044] like Figure 3As shown, a dynamic overcurrent test interference result acquisition logic diagram of an LED lamp drive power supply test method provided by an embodiment of the present invention, the corresponding logic is: based on the dynamic-interference test quantification data, a dynamic test interference score is obtained, and it is judged whether the dynamic test interference score is within the preset test interference controllable range. If so, the dynamic overcurrent test interference result is that the dynamic test interference is controllable, a test result output instruction is sent, and it is continuously judged whether the dynamic test interference score is within the preset test interference controllable range obtained from the preset database. Otherwise, the dynamic overcurrent test interference result is a dynamic test interference anomaly, and dynamic overcurrent test interference suppression is executed. The dynamic overcurrent test interference suppression includes PWM duty cycle adjustment and filter capacitor capacity adjustment. The PWM duty cycle adjustment indicates that the initial PWM duty cycle is updated in combination with the PWM duty cycle adjustment strength, and the filter capacitor capacity adjustment indicates that the initial filter capacitor capacity is updated in combination with the filter capacitor capacity adjustment strength.

[0045] Specifically, the specific process for obtaining the dynamic overcurrent test interference results is as follows: N1. Obtain dynamic-interference test quantitative data during the dynamic overcurrent test of the LED headlight driver power supply within the dynamic overcurrent test monitoring period, perform test interference impact interactive processing on the dynamic interference coupling results and the voltage fluctuation ratio results, and obtain the dynamic test interference score.

[0046] The dynamic interference coupling result represents the coupling result after weighted operation of the relative deviation of the output current peak value and the relative deviation of the overcurrent response time, that is, the numerical expression of the dynamic test interference score. The relative deviation of the output current peak value indicates the result of calculating the ratio of the absolute value of the difference between the output current peak value and the corresponding output current reference peak value to the output current reference peak value. The relative deviation of the overcurrent response time indicates the result of calculating the ratio of the absolute value of the difference between the overcurrent response time and the corresponding overcurrent response reference time to the overcurrent response reference time. The output current reference peak value and the overcurrent response reference time are obtained from the preset database and are set by professionals according to the standards in the field. The voltage fluctuation ratio result indicates the result of analyzing the ratio of the input voltage fluctuation frequency to the input voltage reference fluctuation frequency, that is, the numerical expression of the dynamic test interference score. part.

[0047] The numerical expression of the dynamic test interference score is as follows: ; Where M represents the dynamic test interference score, F a Indicates the input voltage fluctuation frequency, F1 indicates the input voltage reference fluctuation frequency, C1 indicates the output current interference weight, C2 indicates the overcurrent response interference weight, I a Indicates the output current peak value, I bIndicates the output current reference peak value, T a Indicates the overcurrent response time, T b Indicates the overcurrent response reference time.

[0048] Among them, the dynamic-interference test quantitative data includes the output current peak, overcurrent response time and input voltage fluctuation frequency; specifically, the output current peak is obtained by connecting the current probe deployed at the output end of the LED headlight driver power supply to the oscilloscope, the overcurrent response time is obtained by connecting the oscilloscope probe to the output end of the LED headlight driver power supply, and the input voltage fluctuation frequency is obtained through a spectrum analyzer.

[0049] The dynamic test interference score is used to quantify the degree to which an LED headlight driver is affected by input fluctuations during dynamic overcurrent testing. The various parameters in the dynamic test interference score are closely interrelated and contribute to the assessment of the impact of input fluctuations during dynamic overcurrent testing. Specifically, the dynamic test interference score incorporates multiple parameters, quantifying their interplay and interdependence. The peak output current is typically closely related to the response time of the overcurrent protection mechanism. A longer overcurrent response time can result in higher peak currents, potentially exceeding safety thresholds and causing damage. As the frequency of input voltage fluctuations increases, the LED headlight driver may require more time to adapt to the fluctuations, increasing the overcurrent response time to prevent an overcurrent event. Extremely rapid and drastic input voltage fluctuations can prevent the driver from responding in a timely manner, leading to delayed overcurrent protection and impacting the overcurrent response time. Specifically, as the frequency of input voltage fluctuations increases, the dynamic interference coupling result increases, indicating a greater impact of input fluctuations during dynamic overcurrent testing, and the dynamic test interference score increases accordingly.

[0050] N2, determines whether the dynamic test interference score is not greater than the preset interference limit value obtained from the preset database. If so, the corresponding dynamic overcurrent test interference result is output as dynamic test interference controllable. Otherwise, the corresponding dynamic overcurrent test interference result is output as dynamic test interference abnormal. The dynamic overcurrent test interference results include dynamic test interference controllable and dynamic test interference abnormal. The preset test interference controllable range is set by professionals according to standards in the field.

[0051] Specifically, if a transient overcurrent test interference suppression instruction is sent, it is determined whether to perform a dynamic overcurrent test analysis after executing the transient overcurrent test interference suppression, and a dynamic overcurrent test interference result is obtained after executing the dynamic overcurrent test analysis, which is used to reflect the degree of interference of the LED headlight driver power supply by the input fluctuation during the dynamic overcurrent test. The dynamic overcurrent test analysis helps to evaluate the performance of the LED headlight driver power supply under the condition of input power fluctuation, and helps to reflect the stability of the LED headlight driver power supply under dynamic working conditions and its adaptability to input fluctuations, thereby providing an important basis for judging the overcurrent protection test of the LED headlight driver power supply, and realizing the effective association between the transient overcurrent test and the dynamic overcurrent test of the LED headlight driver power supply; if the dynamic overcurrent test analysis is not executed, a transient overcurrent test abnormality prompt is sent, and the LED headlight driver power supply is detected by sending a Sending a transient overcurrent test abnormality prompt helps to ensure the integrity of the overcurrent protection test results of the LED headlight driver power supply; if the transient overcurrent test interference suppression command is not sent, a dynamic overcurrent test is performed on the LED headlight driver power supply from the simulated vehicle startup phase to the stable phase to obtain the dynamic overcurrent test interference result; by performing transient overcurrent tests and dynamic overcurrent tests on the LED headlight driver power supply, it is helpful to accurately evaluate the overcurrent protection performance of the LED headlight driver power supply during the vehicle startup phase and from the startup phase to the stable phase, especially when subject to ripple interference or input fluctuations, which can help determine whether the power supply can maintain normal operation. At the same time, by taking interference suppression measures, the impact of ripple interference on the accuracy of the overcurrent protection test of the LED headlight driver power supply can be reduced, effectively improving the reliability of the test results.

[0052] Specifically, based on the obtained dynamic overcurrent test interference result, it is determined whether to send a test result output instruction. If sent, the overcurrent test result is output. If not sent, dynamic overcurrent test interference suppression is performed. The specific process of determining whether to send a test result output instruction based on the obtained dynamic overcurrent test interference result is as follows: First, if the dynamic overcurrent test interference result is that the dynamic test interference is controllable, a test result output instruction is sent, and it is continuously determined whether the dynamic test interference score is within a preset test interference controllable range obtained from a preset database.

[0053] Secondly, if the dynamic overcurrent test interference result is a dynamic test interference abnormality, the test result output instruction will not be sent, and a prompt will be given to execute dynamic overcurrent test interference suppression, which includes PWM duty cycle adjustment and filter capacitor capacity adjustment.

[0054] As a further supplement, the specific process of performing dynamic overcurrent test interference suppression is as follows: B1, PWM duty cycle adjustment refers to updating the initial PWM duty cycle in conjunction with the PWM duty cycle adjustment strength. Specifically, the PWM duty cycle adjustment strength is input into the PWM controller in the switching power supply to update the initial PWM duty cycle during the dynamic overcurrent test of the LED headlight driver. The PWM duty cycle adjustment strength is the result of inputting the dynamic test interference score into a preset database mapping dynamic test interference scores to PWM duty cycle adjustment strength. As the dynamic test interference score increases, the PWM duty cycle adjustment strength increases accordingly. By performing PWM duty cycle adjustment, the output current waveform of the LED headlight driver can be smoothed, reducing transient current changes caused by input fluctuations and minimizing the impact of input fluctuation interference on the accuracy of test results during the dynamic overcurrent test.

[0055] B2, filter capacitor capacity adjustment means updating the initial filter capacitor capacity in combination with the filter capacitor capacity adjustment strength. Specifically, the filter capacitor capacity adjustment strength is input into the capacitor filter in the switching power supply to update the initial filter capacitor capacity during the dynamic overcurrent test of the LED headlight driver power supply. The filter capacitor capacity adjustment strength is the result of inputting the dynamic test interference score into the mapping of the dynamic test interference score and the filter capacitor capacity adjustment strength constructed in the preset database; wherein, as the dynamic test interference score increases, the filter capacitor capacity adjustment strength increases accordingly. Filter capacitor capacity adjustment helps to reduce the power supply output voltage fluctuation caused by input voltage fluctuation, thereby reducing the ripple in the current waveform. During the dynamic overcurrent test, current ripple and voltage ripple may cause instability in the test results. By increasing the capacitor capacity, the current waveform can be smoothed and the impact of the ripple can be reduced.

[0056] B3, determine whether to send the test result output instruction. If sent, it will prompt that the dynamic overcurrent test interference suppression is completed. Otherwise, re-execute B1 until the test result output instruction is sent.

[0057] In this embodiment, the interference from input fluctuations primarily manifests as ripple and noise, leading to current instability in the LED driver power supply. Ripple interference can cause the output current of the LED headlight driver power supply to spike or fluctuate abnormally within a short period of time. If the overcurrent protection test performance is abnormal, the power supply may mistakenly interpret the current as a persistent overcurrent condition, triggering the overcurrent protection and halting output. This can cause false triggering during the dynamic overcurrent test and fail to accurately reflect the actual load-carrying capacity of the LED headlight driver power supply. During the dynamic overcurrent test, the LED driver power supply must maintain a stable current output during load changes. If input voltage fluctuations cause current output instability, the test results may be inaccurate, and may even lead to a misjudgment of system overcurrent.

[0058] This application helps to more accurately perform overcurrent protection tests on LED headlight driver power supplies by determining and suppressing the degree of ripple interference on the LED headlight driver power supply during transient overcurrent tests, as well as determining and suppressing the degree of input fluctuation interference during dynamic overcurrent tests, thereby ensuring improved accuracy and reliability of the test results of the LED headlight driver power supply overcurrent protection tests.

[0059] like Figure 4 The figure shows a schematic diagram of the structure of an LED lamp driving power supply test system provided by an embodiment of the present invention. The LED lamp driving power supply test system provided by an embodiment of the present invention includes: a transient overcurrent test analysis module, a dynamic overcurrent test judgment module and an overcurrent test result output module. Specifically, the transient overcurrent test analysis module is used to perform a transient overcurrent test on the LED headlight driving power supply during the simulated vehicle startup phase, obtain a transient overcurrent test interference result that reflects the degree of ripple interference on the LED headlight driving power supply during the transient overcurrent test, and judge whether to send a transient overcurrent test interference suppression instruction based on the obtained transient overcurrent test interference result; the dynamic overcurrent test judgment module is used to judge whether to perform a dynamic overcurrent test analysis after executing the transient overcurrent test interference suppression if a transient overcurrent test interference suppression instruction is sent, and obtain a transient overcurrent test interference result that reflects the degree of ripple interference on the LED headlight driving power supply after executing the dynamic overcurrent test analysis. The dynamic overcurrent test interference result of the driving power supply is obtained by the input fluctuation interference degree during the dynamic overcurrent test. If the dynamic overcurrent test analysis is not performed, a transient overcurrent test abnormality prompt is sent. If the transient overcurrent test interference suppression instruction is not sent, a dynamic overcurrent test is performed on the LED headlight driving power supply from the start-up stage to the stable stage of the simulated vehicle to obtain the dynamic overcurrent test interference result; the overcurrent test result output module is used to determine whether to send the test result output instruction based on the obtained dynamic overcurrent test interference result. If sent, the overcurrent test result is output. If not sent, the dynamic overcurrent test interference suppression is performed.

[0060] like Figure 5 FIG. 1 is one of the transient overcurrent test interfaces of an LED lamp driving power supply test system provided by an embodiment of the present invention; FIG. Figure 5It can be seen that the navigation bar of the driving power supply test system provided in the embodiment of the present application includes the home page, basic parameter test, protection function test, input characteristic test, load characteristic test, environmental adaptability test, dimming compatibility test and historical data query; among them, the protection function test includes overcurrent protection test, overvoltage protection test, short circuit protection test and overtemperature protection test, and the overcurrent protection test specifically includes transient overcurrent test and dynamic overcurrent test; the interface includes buttons for starting test, pausing test, emergency stop, resetting parameters and obtaining test results; at the same time, the output current change curve of the transient overcurrent test and the transient overcurrent test interference results are provided. In addition, it also includes the transient overcurrent test status, which is used to display the update status of the initial PWM frequency, initial sampling rate, initial oscillator cutoff frequency and initial bandwidth.

[0061] like Figure 6 As shown, it is one of the dynamic overcurrent test interface diagrams of an LED lamp driving power supply test system provided by an embodiment of the present invention; Figure 6 It can be seen that the dynamic overcurrent test interface of the driving power supply test system provided in the embodiment of the present application also includes buttons for starting the test, pausing the test, emergency stop, resetting parameters and obtaining test results; at the same time, the output current change curve of the dynamic overcurrent test and the dynamic overcurrent test interference results are provided. In addition, it also includes a dynamic overcurrent test status, which is used to display the update status of the initial PWM duty cycle, initial sampling rate, initial filter capacitor capacity and initial bandwidth.

[0062] An embodiment of the present invention provides a computer-readable storage medium, in which at least one instruction is stored. The at least one instruction is loaded and executed by a processor to implement the above-mentioned LED lamp driving power supply testing method.

[0063] In summary, in the embodiment of the present invention, during the process of performing an overcurrent protection test on the LED headlight driver power supply in the simulated vehicle startup phase, due to the existence of the switching frequency, ripples are often generated, causing inaccurate results of the overcurrent protection test on the LED headlight driver power supply. This application effectively improves the accuracy of the ripple interference degree judgment in the transient overcurrent test by obtaining a transient overcurrent test interference result that reflects the degree of ripple interference on the LED headlight driver power supply in the transient overcurrent test. Then, based on the obtained transient overcurrent test interference result, it is determined whether to send a transient overcurrent test interference suppression instruction. If so, the transient overcurrent test interference suppression instruction is executed. After the test interference is suppressed, it is determined whether to perform dynamic overcurrent test analysis. If not, the dynamic overcurrent test interference result is obtained, thereby realizing effective correlation analysis between transient overcurrent test and dynamic overcurrent test of LED headlight driver power supply. Finally, based on the obtained dynamic overcurrent test interference result, it is determined whether to send the test result output instruction, which helps to reduce the influence of ripple interference on overcurrent test results, improves the accuracy of overcurrent protection test of LED headlight driver power supply, and solves the problem in the prior art that ripple interference to the test is not fully considered when performing overcurrent protection test on LED headlight driver power supply during the simulated vehicle startup phase.

[0064] Those skilled in the art will appreciate that embodiments of the present invention may be provided as methods, systems, or computer program products. Thus, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to magnetic disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0065] The present invention is described with reference to flowcharts and / or block diagrams of systems, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowcharts and / or block diagrams, as well as combinations of processes and / or blocks in the flowcharts and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowcharts and / or block diagrams. Figure 1 a process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0066] These computer program instructions may also be stored in a computer readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 a process or multiple processes and / or boxes Figure 1 The function specified in one or more boxes.

[0067] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing the instructions executed on the computer or other programmable device for implementing the process. Figure 1 a process or multiple processes and / or boxes Figure 1 The steps for the function specified in one or more boxes.

[0068] Although the preferred embodiments of the present invention have been described, those skilled in the art may make additional changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the present invention.

[0069] Obviously, those skilled in the art may make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if such changes and modifications fall within the scope of the claims and their equivalents, the present invention is intended to include such changes and modifications.

[0070] It should also be understood that the memory in the embodiments of the present invention may be volatile memory or non-volatile memory, or may include both volatile and non-volatile memory. The non-volatile memory may be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. The volatile memory may be random access memory (RAM), which is used as an external cache. By way of example and not limitation, many forms of random access memory (RAM) are available, such as static RAM (SRAM), dynamic random access memory (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), and direct rambus RAM (DR RAM).

[0071] The above embodiments can be implemented in whole or in part via software, hardware (e.g., circuits), firmware, or any other combination thereof. When implemented using software, the above embodiments can be implemented in whole or in part in the form of a computer program product. The computer program product comprises one or more computer instructions or computer programs. When loaded or executed on a computer, the processes or functions described in accordance with the embodiments of the present invention are fully or partially performed. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired means (e.g., infrared, wireless, microwave, etc.). The computer-readable storage medium can be any available medium accessible by a computer or a data storage device such as a server or data center that contains a collection of one or more available media. The available medium can be magnetic media (e.g., floppy disks, hard disks, magnetic tapes), optical media (e.g., DVDs), or semiconductor media. The semiconductor media can be a solid-state drive.

[0072] It should be understood that the term "and / or" as used herein simply describes an association between related objects, indicating that three possible relationships exist. For example, "A and / or B" can represent: A alone, A and B together, or B alone. A and B can be singular or plural. Furthermore, the character " / " as used herein generally indicates an "or" relationship between the related objects, but it may also indicate an "and / or" relationship. For specific understanding, please refer to the context.

[0073] In this disclosure, "at least one" means one or more, and "plurality" means two or more. "At least one of the following" or similar expressions refers to any combination of these items, including any combination of single or plural items. For example, "at least one of a, b, or c" can mean: a, b, c, ab, ac, bc, or abc, where a, b, and c can be single or plural.

[0074] It should be understood that in various embodiments of the present invention, the size of the serial numbers of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention.

[0075] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present invention.

[0076] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described equipment, devices and units can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0077] In the several embodiments provided by the present invention, it should be understood that the disclosed devices, apparatuses and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another device, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interface, indirect coupling or communication connection of the device or unit, which can be electrical, mechanical or other forms.

[0078] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0079] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0080] If the functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the portion that contributes to the prior art, or the portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present invention. The aforementioned storage media include various media that can store program code, such as USB flash drives, mobile hard drives, read-only memories (ROM), random access memories (RAM), magnetic disks, or optical disks.

[0081] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any modifications or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in the present invention should be included in the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be based on the scope of protection of the claims.

Claims

1. A method for testing an LED lamp driving power supply, characterized in that: The following steps are involved: During the simulated vehicle startup phase, a transient overcurrent test is performed on the LED headlight driver power supply to obtain a transient overcurrent test interference result reflecting the degree of ripple interference on the LED headlight driver power supply during the transient overcurrent test, and based on the obtained transient overcurrent test interference result, a determination is made as to whether to send a transient overcurrent test interference suppression instruction; If a transient overcurrent test interference suppression instruction is sent, it is determined whether to perform a dynamic overcurrent test analysis after executing the transient overcurrent test interference suppression, and a dynamic overcurrent test interference result is obtained after executing the dynamic overcurrent test analysis, which is used to reflect the degree of input fluctuation interference on the LED headlight driver power supply during the dynamic overcurrent test. If the dynamic overcurrent test analysis is not performed, a transient overcurrent test abnormality prompt is sent. If the transient overcurrent test interference suppression instruction is not sent, a dynamic overcurrent test is performed on the LED headlight driver power supply from the start-up stage to the stable stage of the simulated vehicle to obtain a dynamic overcurrent test interference result. Based on the obtained dynamic overcurrent test interference result, it is determined whether to send a test result output instruction. If sent, the overcurrent test result is output; if not sent, dynamic overcurrent test interference suppression is performed.

2. A method for testing an LED lamp driving power supply according to claim 1, characterized in that: The specific steps of performing a transient overcurrent test on the LED car light driving power supply are as follows: Obtain transient overcurrent test data and test interference monitoring data of the LED headlight driver power supply during the transient overcurrent test under the simulated vehicle startup phase; The transient overcurrent test data includes the maximum transient current, the transient current change rate and the transient response time; The test interference monitoring data includes ripple interference amplitude, ripple interference frequency and ripple noise current; Obtaining a corresponding transient overcurrent test relative deviation based on the transient overcurrent test data, and performing corresponding weighted coupling processing on the transient overcurrent test relative deviation and the transient overcurrent test compensation value obtained from a preset database to obtain a transient test detection value; The transient overcurrent test relative deviation includes the maximum transient current relative deviation, the transient current change rate relative deviation and the transient response time relative deviation; The average of the ripple interference amplitude ratio, ripple interference frequency relative deviation, and ripple noise current ratio is recorded as the test interference influence factor. The ripple interference amplitude ratio result represents the result of the ratio analysis of the ripple interference amplitude and the ripple amplitude threshold; The obtained transient test detection value and the test interference influence factor are interactively processed to obtain a transient test interference score, which is used to quantitatively determine the degree of influence of ripple interference on the transient overcurrent test process of the LED headlight driver power supply.

3. The LED lamp driving power supply testing method according to claim 2, characterized in that: The specific process of determining whether to send a transient overcurrent test interference suppression instruction based on the obtained transient overcurrent test interference result is as follows: Compare the transient test interference score with the test interference abnormality setting value obtained from the preset database. If the transient test interference score is greater than the test interference abnormality setting value, output the corresponding transient overcurrent test interference result as transient test interference abnormality, and send a transient overcurrent test interference suppression instruction for executing transient overcurrent test interference suppression; If the transient test interference score is not greater than the test interference abnormality setting value, determining whether the transient test interference score is greater than the test interference warning setting value obtained from the preset database; If the transient test interference score is greater than the test interference warning setting value, the corresponding transient overcurrent test interference result is output as transient test interference warning, the transient overcurrent test interference suppression instruction is not sent, and the prompt is to execute transient overcurrent test adjustment; otherwise, the corresponding transient overcurrent test interference result is output as transient test interference controllable, the transient overcurrent test interference suppression instruction is not sent, and the dynamic overcurrent test interference result is obtained. At the same time, the transient test interference score is continuously monitored to see if it is not greater than the test interference warning setting value.

4. A method for testing an LED lamp driving power supply according to claim 3, characterized in that: The specific process of performing transient overcurrent test interference suppression is as follows: M1, inputting the PWM frequency adjustment strength into the PWM controller of the switching power supply in the LED headlight driver power supply to update the initial PWM frequency, wherein the PWM frequency adjustment strength is the result of inputting the transient test interference score into the mapping between the transient test interference score and the PWM frequency adjustment strength established in the preset database; M2, inputting a filter cutoff frequency adjustment force into a low-pass filter of a switching power supply in an LED headlight driver power supply to update an initial filter cutoff frequency, wherein the filter cutoff frequency adjustment force is a result of inputting a transient test interference score into a mapping set of transient test interference scores and filter cutoff frequency adjustment forces established in a preset database; M3: If the re-acquired transient overcurrent test interference result is a transient test interference anomaly, the PWM frequency adjustment strength and the filter cutoff frequency adjustment strength are updated based on the transient test interference score change coefficient and the process returns to M1; otherwise, M4 is executed, wherein the transient test interference score change coefficient represents the result of inputting the transient test interference score change degree into a mapping set of the transient test interference score change degree, the PWM frequency adjustment strength update value, and the filter cutoff frequency adjustment strength update value already constructed in the database, and mapping them respectively. The transient test interference score change coefficient includes the PWM frequency adjustment change coefficient and the cutoff frequency adjustment change coefficient. The transient test interference score change degree represents the result of performing a proportion analysis on the transient test interference score after calculating the difference between the transient test interference score and the re-acquired transient test interference score; M4: If the re-acquired transient overcurrent test interference result is a transient test interference warning, a prompt indicating that the transient overcurrent test interference suppression is completed is sent, and transient overcurrent test adjustment is performed; otherwise, M5 is executed; M5: If the re-acquired transient overcurrent test interference result shows that the transient test interference is controllable, a prompt indicating that the transient overcurrent test interference suppression is completed is sent, and the dynamic overcurrent test interference result is obtained.

5. A method for testing an LED lamp driving power supply according to claim 4, characterized in that: The specific process of performing transient overcurrent test adjustment is as follows: A1, updating the initial sampling rate of the oscilloscope during the transient overcurrent test of the LED headlight driver to the test optimized sampling rate, wherein the test optimized sampling rate is the result of inputting the deviation degree between the transient test interference score and the test interference warning set value into the sampling rate adjustment linear regression mapping model; A2, updating the initial bandwidth of the oscilloscope during the transient overcurrent test of the LED headlight driver to the test optimized bandwidth, wherein the test optimized bandwidth represents the output of the bandwidth adjustment linear regression mapping model after inputting the deviation degree between the transient test interference score and the test interference warning set value; A3, based on the test optimization sampling rate and test optimization bandwidth, performs a transient overcurrent test on the LED headlight driver power supply during the simulated vehicle startup phase, and determines whether the re-acquired transient overcurrent test interference result is controllable. If so, a transient overcurrent test adjustment end prompt is sent and the dynamic overcurrent test interference result is obtained. Otherwise, a test adjustment monitoring abnormality prompt is sent.

6. A method for testing an LED lamp driving power supply according to claim 5, characterized in that: The specific process of obtaining the dynamic overcurrent test interference result is as follows: Obtaining dynamic-interference test quantitative data during the dynamic overcurrent test of the LED headlight driver power supply within the dynamic overcurrent test monitoring period, interactively processing the dynamic interference coupling results and the voltage fluctuation ratio results to obtain a dynamic test interference score. The dynamic test interference score is used to quantitatively determine the degree to which the dynamic overcurrent test of the LED headlight driver power supply is affected by input fluctuation interference; The dynamic-interference test quantitative data includes output current peak value, overcurrent response time and input voltage fluctuation frequency; The dynamic interference coupling result represents the coupling result after weighted operation corresponding to the relative deviation of the output current peak value and the relative deviation of the overcurrent response time; The voltage fluctuation ratio result represents the result of the ratio analysis between the input voltage fluctuation frequency and the input voltage reference fluctuation frequency; Determine whether the dynamic test interference score is not greater than a preset interference limit value obtained from a preset database. If so, output the corresponding dynamic overcurrent test interference result as controllable; otherwise, output the corresponding dynamic overcurrent test interference result as abnormal. The dynamic overcurrent test interference results include dynamic test interference controllable and dynamic test interference abnormal.

7. A method for testing an LED lamp driving power supply according to claim 6, characterized in that: The specific process of determining whether to send a test result output instruction based on the obtained dynamic overcurrent test interference result is as follows: If the dynamic overcurrent test interference result is that the dynamic test interference is controllable, a test result output instruction is sent, and it is continuously determined whether the dynamic test interference score is within a preset test interference controllable range obtained from a preset database; If the dynamic overcurrent test interference result is abnormal, the test result output instruction will not be sent, and a prompt will be given to execute dynamic overcurrent test interference suppression; The dynamic overcurrent test interference suppression includes PWM duty cycle adjustment and filter capacitor capacity adjustment; The PWM duty cycle adjustment means updating the initial PWM duty cycle in combination with the PWM duty cycle adjustment strength; The filter capacitor capacity adjustment indicates updating the initial filter capacitor capacity in combination with the filter capacitor capacity adjustment strength.

8. The LED lamp driving power supply testing method according to claim 7, characterized in that: The specific process of performing dynamic overcurrent test interference suppression is as follows: B1, inputting a PWM duty cycle adjustment strength into a PWM controller in a switching power supply to update an initial PWM duty cycle during a dynamic overcurrent test of the LED headlight driver power supply, wherein the PWM duty cycle adjustment strength is a result of inputting a dynamic test interference score into a mapping set of dynamic test interference scores and PWM duty cycle adjustment strengths established in a preset database; B2, inputting a filter capacitor capacity adjustment force into a capacitor filter in a switching power supply to update an initial filter capacitor capacity during a dynamic overcurrent test of the LED headlight driver power supply, wherein the filter capacitor capacity adjustment force is a result of inputting a dynamic test interference score into a mapping set of dynamic test interference scores and filter capacitor capacity adjustment forces established in a preset database; B3, determine whether to send the test result output instruction. If sent, it will prompt that the dynamic overcurrent test interference suppression is completed. Otherwise, re-execute B1 and B2 until the test result output instruction is sent.

9. An LED lamp driving power supply test system, used to implement the LED lamp driving power supply test method according to any one of claims 1 to 8, characterized in that: The system includes: a transient overcurrent test analysis module, a dynamic overcurrent test judgment module and an overcurrent test result output module; The transient overcurrent test analysis module is used to perform a transient overcurrent test on the LED headlight driving power supply during the simulated vehicle startup phase, obtain a transient overcurrent test interference result reflecting the degree of ripple interference on the LED headlight driving power supply during the transient overcurrent test, and determine whether to send a transient overcurrent test interference suppression instruction based on the obtained transient overcurrent test interference result; The dynamic overcurrent test judgment module is used to determine whether to perform dynamic overcurrent test analysis after executing transient overcurrent test interference suppression if a transient overcurrent test interference suppression instruction is sent, and obtain a dynamic overcurrent test interference result after executing the dynamic overcurrent test analysis, which is used to reflect the degree of input fluctuation interference on the LED headlight driving power supply during the dynamic overcurrent test process; if the dynamic overcurrent test analysis is not performed, a transient overcurrent test abnormality prompt is sent; if the transient overcurrent test interference suppression instruction is not sent, a dynamic overcurrent test is performed on the LED headlight driving power supply from the start-up stage to the stable stage of the simulated vehicle to obtain a dynamic overcurrent test interference result; The overcurrent test result output module is used to determine whether to send a test result output instruction based on the obtained dynamic overcurrent test interference result. If sent, the overcurrent test result is output; if not sent, dynamic overcurrent test interference suppression is performed.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores program code, which can be called by a processor to execute the method according to any one of claims 1 to 8.

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