Projector test method, device and system, test equipment and medium

Abstract

The embodiment of the invention provides a test method, device and system for a projector, test equipment and a medium, and relates to the technical field of tests.According to the technical scheme, the test method comprises the steps that a collected image obtained by shooting a projection screen is obtained, the projection screen comprises a test image projected by a to-be-tested projector, and the test image is obtained; the test image includes a test line segment. Then image recognition is carried out on the collected image, the line segment width of a test line segment in the collected image is obtained, and the pixel width of a single pixel included in the test image in the collected image is determined; the projection halo of the projector to be tested is determined according to the line segment width and the pixel width, and the projection halo is the smear width generated after the single pixel is projected to the projection screen. The automatic projection halo test on the projector is realized, and the test efficiency is improved.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a method, device, system, testing equipment and medium for testing a projector. Background Art

[0002] As projectors enter millions of households, the projector market is booming, and projector production is also expanding. Testing projector performance is a mandatory step before each projector leaves the factory. Currently, projector testing typically uses illuminometers and other instruments to measure the brightness, colorimetry, and image integrity of the projected image. However, this testing method cannot detect the flare produced by the projected image.

[0003] If you need to test the flare generated by a projector's image, you need to manually compare the total width of the projected image with a film ruler and then manually infer the test results based on this. This testing method is overly dependent on manual labor, which is subject to subjective errors and makes it difficult to guarantee the accuracy of the test results. Manual testing also requires high labor costs and low testing efficiency. Summary of the Invention

[0004] The purpose of the embodiments of the present application is to provide a method, apparatus, system, test equipment, and medium for testing a projector to improve the efficiency of Flare testing. The specific technical solution is as follows:

[0005] In a first aspect, an embodiment of the present application provides a method for testing a projector, the method comprising:

[0006] Acquire a captured image obtained by photographing a projection screen, wherein the projection screen includes a test image projected by the projector to be tested, and the test image includes a test line segment;

[0007] Performing image recognition on the acquired image to obtain the line segment width of the test line segment in the acquired image;

[0008] Determining a pixel width of a single pixel included in the test image in the acquired image;

[0009] The projection halo of the projector to be tested is determined according to the line segment width and the pixel width, where the projection halo is the width of a streak generated when a single pixel is projected onto a projection screen.

[0010] Optionally, there are multiple test line segments, and the width of each test line segment includes a different number of pixels; and determining the pixel width of a single pixel included in the test image in the acquired image includes:

[0011] Fitting a straight line according to the line segment width of each test line segment in the acquired image and the number of pixels included in the width of each test line segment in the test image;

[0012] The slope of the straight line is obtained as the pixel width.

[0013] Optionally, determining the projection halo of the projector to be tested based on the line segment width and the pixel width includes:

[0014] Obtaining the intercept of the straight line;

[0015] A ratio of the intercept to the pixel width is determined as the projection halo.

[0016] Optionally, determining the pixel width of a single pixel included in the test image in the acquired image includes:

[0017] Obtaining a resolution of the test image, and extracting a total number of pixels including a width of the test image from the resolution;

[0018] Obtaining a pattern width of the test image in the acquired image;

[0019] The ratio of the pattern width to the total number of pixels is used as the pixel width.

[0020] Optionally, the number of pixels included in the width of the test line segment in the test image is 1, and determining the projection halo of the projector to be tested based on the line segment width and the pixel width includes:

[0021] Determining a difference between the line segment width and the pixel width;

[0022] The ratio of the difference to the pixel width is used as the projection halo.

[0023] Optionally, before acquiring the captured image obtained by photographing the projection screen, the method further includes:

[0024] Sending a test image to the projector, wherein the initial value of the number of pixels included in the width of a test line segment in the test image is a preset number, so that the projector projects the test image onto a projection screen;

[0025] Sending a shooting instruction to an image acquisition device so that the image acquisition device shoots the projection screen to obtain a captured image;

[0026] After acquiring the captured image obtained by photographing the projection screen, the method further includes:

[0027] Determining whether the number of pixels included in the width of the test line segment in the test image is a preset maximum number of pixels;

[0028] If so, executing the step of performing image recognition on the collected image;

[0029] If not, updating the test image, wherein the number of pixels included in the width of the test line segment in the updated test image is greater than the number of pixels included in the width of the test line segment in the test image before the update;

[0030] The updated test image is sent to the projector so that the projector projects the updated test image onto the projection screen, and the process returns to the step of sending the shooting instruction to the image acquisition device.

[0031] In a second aspect, an embodiment of the present application provides a device for testing a projector, the device comprising:

[0032] an acquisition module, configured to acquire an acquired image obtained by photographing a projection screen, wherein the projection screen includes a test image projected by the projector to be tested, and the test image includes a test line segment;

[0033] a recognition module, configured to perform image recognition on the acquired image acquired by the acquisition module to obtain the line segment width of the test line segment in the acquired image;

[0034] a determination module, configured to determine a pixel width of a single pixel included in the test image in the acquired image;

[0035] The determination module is further configured to determine a projection halo of the projector to be tested based on the line segment width identified by the recognition module and the pixel width determined by the determination module, wherein the projection halo is the width of a trailing image generated when a single pixel is projected onto a projection screen.

[0036] Optionally, there are multiple test line segments, and the width of each test line segment includes a different number of pixels; the determining module is specifically configured to:

[0037] Fitting a straight line according to the line segment width of each test line segment in the acquired image and the number of pixels included in the width of each test line segment in the test image;

[0038] The slope of the straight line is obtained as the pixel width.

[0039] Optionally, the determining module is specifically configured to:

[0040] Obtaining the intercept of the straight line;

[0041] A ratio of the intercept to the pixel width is determined as the projection halo.

[0042] Optionally, the determining module is specifically configured to:

[0043] Obtaining a resolution of the test image, and extracting a total number of pixels including a width of the test image from the resolution;

[0044] Obtaining a pattern width of the test image in the acquired image;

[0045] The ratio of the pattern width to the total number of pixels is used as the pixel width.

[0046] Optionally, the number of pixels included in the width of the test line segment in the test image is 1, and the determining module is specifically configured to:

[0047] Determining a difference between the line segment width and the pixel width;

[0048] The ratio of the difference to the pixel width is used as the projection halo.

[0049] Optionally, the device further includes:

[0050] a sending module, configured to send a test image to the projector before acquiring the captured image obtained by photographing the projection screen, wherein the initial value of the number of pixels included in the width of the test line segment in the test image is a preset number, so that the projector projects the test image onto the projection screen;

[0051] The sending module is further configured to send a shooting instruction to the image acquisition device, so that the image acquisition device shoots the projection screen to obtain a captured image;

[0052] a determination module configured to, after acquiring the captured image obtained by photographing the projection screen, determine whether the number of pixels included in the width of the test line segment in the test image is a preset maximum number of pixels; and if so, call the recognition module to execute the step of performing image recognition on the captured image;

[0053] an updating module, configured to update the test image if the judgment result of the judging module is negative, wherein the number of pixels included in the width of the test line segment in the updated test image is greater than the number of pixels included in the width of the test line segment in the test image before the update;

[0054] The sending module is further configured to send the updated test image to the projector so that the projector projects the updated test image onto the projection screen, and returns to the step of sending the shooting instruction to the image acquisition device.

[0055] In a third aspect, an embodiment of the present application provides a system for testing a projector, comprising:

[0056] a projector for projecting a test image onto a projection screen;

[0057] An image acquisition device, used to capture the projection screen to obtain an image;

[0058] A test device, used to execute the method described in any one of the first aspects above.

[0059] In a fourth aspect, an embodiment of the present application provides a test device, comprising a processor, a communication interface, a memory, and a communication bus, wherein the processor, the communication interface, and the memory communicate with each other via the communication bus;

[0060] Memory for storing computer programs;

[0061] The processor is configured to implement the method described in any one of the first aspects when executing a program stored in the memory.

[0062] In a fifth aspect, an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method described in any one of the first aspects is implemented.

[0063] In a sixth aspect, an embodiment of the present application further provides a computer program product comprising instructions, which, when executed on a computer, enables the computer to execute any of the above-described methods for testing a projector.

[0064] Beneficial effects of the embodiments of the present application:

[0065] The test method, device, system, test equipment and medium for a projector provided in the embodiments of the present application can obtain a captured image obtained by shooting a projection screen, wherein the projection screen includes a test image projected by the projector to be tested, and the test image includes a test line segment. Then, image recognition is performed on the captured image to obtain the line segment width of the test line segment included in the captured image, and the pixel width of a single pixel included in the test image in the captured image is determined. Then, based on the line segment width and the pixel width, the projection halo of the projector to be tested is determined, wherein the projection halo is the width of the trailing shadow generated after a single pixel is projected onto the projection screen. It can be seen that the embodiments of the present application can automatically test the Flare generated by the projected image of the projector based on the captured image, thereby reducing the dependence of the projector testing process on manual labor, ensuring the accuracy of the test results, reducing labor costs, and improving test efficiency.

[0066] Of course, it is not necessary to achieve all the advantages described above at the same time when implementing any product or method of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0067] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other embodiments can also be obtained based on these drawings.

[0068] Figure 1 This is an exemplary schematic diagram of the first type of image acquisition provided in an embodiment of the present application;

[0069] Figure 2 A flowchart of a first method for testing a projector provided in an embodiment of the present application;

[0070] Figure 3 This is an exemplary schematic diagram of the second type of image acquisition provided in an embodiment of the present application;

[0071] Figure 4 This is an exemplary schematic diagram of the third type of image acquisition provided in an embodiment of the present application;

[0072] Figure 5 A flowchart of a second method for testing a projector provided in an embodiment of the present application;

[0073] Figure 6 A straight line graph provided in an embodiment of the present application;

[0074] Figure 7 A flowchart of a third method for testing a projector provided in an embodiment of the present application;

[0075] Figure 8 Flowchart of the fourth method for testing a projector provided in an embodiment of the present application

[0076] Figure 9 A structural diagram of a projector testing system provided in an embodiment of the present application;

[0077] Figure 10 A test scene diagram for a projector provided in an embodiment of the present application;

[0078] Figure 11 Another test scene diagram for a projector provided in an embodiment of the present application;

[0079] Figure 12 A schematic structural diagram of a projector testing device provided in an embodiment of the present application;

[0080] Figure 13 A schematic diagram of the structure of a test device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0081] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field based on this application are within the scope of protection of this application.

[0082] First, the lens flare that needs to be tested in the embodiment of the present application is described.

[0083] In actual application scenarios, the projection process of a projector is subject to vertical axis lens aberration. Vertical axis lens aberration refers to the fact that when the projection light passes through the projector lens, due to factors such as the shape and refractive index of the lens, the light spot formed on the projection screen is not a point, but an area that spreads outward from the point.

[0084] Assume that the test image projected by the projector onto the screen includes a white line segment, and the rest of the test image is black. The width of the white line segment includes one pixel, so the white line segment can also be called a single-pixel line. Figure 1 , Figure 1 The image is obtained by shooting the screen after the projector projects the test image onto the screen. Figure 1 The width of the white line segment is P0, and the left and right sides of the white line segment include shadow areas. The shadow areas represent the smear of the white line segment, and the total width of the shadow areas and the white line segment is P1. Among them, Flare is the width of the smear produced when a single pixel is projected onto the projection screen, that is, Flare is:

[0085] Flare=(P1-P0) / P0 (1)

[0086] In order to improve the test efficiency of Flare, the embodiment of the present application provides a method for testing a projector, which is applied to a test device, for example, a server, a desktop computer or a laptop computer, etc., which has image processing capabilities. Figure 2 As shown, the projector testing method provided in the embodiment of the present application includes the following steps:

[0087] S201: Acquire a captured image obtained by photographing a projection screen.

[0088] The projector is positioned according to preset test requirements and projects a test image onto the projection screen. For example, the test requirements include: the test image projected by the projector can be fully displayed on the screen, and the area of ​​the screen occupied by the test image projected by the projector exceeds a preset area.

[0089] Optionally, the projection mode of the projector can also be adjusted to a specified mode, for example, the specified mode includes: the brightness reaches a specified brightness range, and the contrast reaches a specified contrast range, so as to ensure the clarity of the projected test image on the screen and improve the accuracy of the test.

[0090] The projection screen includes a test image projected by the projector to be tested, and the test image includes a test line segment. Since the higher the brightness of the projection light projected by the projector, the more obvious the Flare generated in the projection screen, the color of the test line segment can be set to a color with higher brightness, and the background of the test image other than the test line segment can be set to a color with lower brightness. For example, in the test image, the test line segment is white and the background is black. Among them, after being projected, the test image is located at a specified test position on the projection screen. For example, the specified test position is the center, upper left corner, upper right corner, lower left corner or lower right corner, etc., and the specific setting can be based on actual test requirements.

[0091] An image acquisition device, such as a camera or mobile phone, can be used to capture the screen after the projector projects the test image, thereby obtaining a captured image. The image acquisition device can be connected to the test device via a wired or wireless connection to transmit the captured image to the test device.

[0092] S202: Perform image recognition on the collected image to obtain the line segment width of the test line segment in the collected image.

[0093] It should be noted that, in the embodiment of the present application, the length of the short side of the test segment is referred to as the segment width. Figure 1 The horizontal length of the test line segment shown is called the line segment width.

[0094] An image segmentation algorithm, such as morphological operations or background subtraction algorithms, may be used to extract the test line segments in the captured image, and calculate the line segment width of the test line segments in the captured image.

[0095] S203: Determine the pixel width of a single pixel included in the test image in the acquired image.

[0096] The method for determining the pixel width may be referred to the following description.

[0097] The units of the line segment width in S202 and the pixel width in S203 are both pixels.

[0098] S204: Determine the projection halo of the projector to be tested based on the line segment width and the pixel width, wherein the projection halo is the width of the trailing image produced when a single pixel is projected onto the projection screen.

[0099] The projector testing method provided in the embodiment of the present application can obtain a captured image obtained by photographing the projection screen, wherein the projection screen includes a test image projected by the projector to be tested, and the test image includes a test line segment. Then, image recognition is performed on the captured image to obtain the line segment width of the test line segment included in the captured image, and the pixel width of a single pixel included in the test image in the captured image is determined. Then, based on the line segment width and the pixel width, the projection halo of the projector to be tested is determined, wherein the projection halo is the width of the trailing shadow generated after a single pixel is projected onto the projection screen. It can be seen that the embodiment of the present application can automatically test the Flare generated by the projected image of the projector based on the captured image, thereby reducing the dependence of the projector testing process on manual labor, ensuring the accuracy of the test results, reducing labor costs, and improving test efficiency.

[0100] The following is a detailed description of the projector testing method provided in the embodiment of the present application:

[0101] The embodiment of the present application involves two testing methods when testing Flare, namely an indirect measurement method and a direct measurement method.

[0102] In the indirect measurement method, the test process involves multiple test line segments, and the width of each test line segment in the test image includes a different number of pixels.

[0103] Optionally, the projector may project a different test image onto the projection screen multiple times, each time projecting a different test image. The width of the test line segments included in each of the different test images may include a different number of pixels. Accordingly, after each projection, the projector captures the projection screen using an image capture device to obtain a captured image, such that the width of the test line segments in each captured image may vary.

[0104] Alternatively, the test image may include multiple test line segments, and the width of each test line segment may vary in pixels. After the projector projects the test image onto the projection screen, an image capture device may capture each test line segment on the projection screen to obtain multiple captured images, each of which includes a test line segment, and the width of the test line segments in different captured images may vary.

[0105] For example, see Figure 3 , Figure 3There are three acquired images, where the white line segments represent test line segments. The test line segment in the left acquired image is denoted as line segment 1, the test line segment in the middle acquired image is denoted as line segment 2, and the test line segment in the right acquired image is denoted as line segment 3. Due to the existence of Flare during the projection process of the projector, there are shadow regions around the white line segments. The line width of line segment 1 in the acquired image is P1. Under ideal conditions without Flare and without scaling the test image during projection, the width of line segment 1 is N1×P0, where N1 is the number of pixels included in the width of line segment 1 in the test image, and P0 is the pixel width of a single pixel included in the test image in the acquired image. The line width of line segment 2 in the acquired image is P2. Under ideal conditions without Flare and without scaling the test image during projection, the width of line segment 2 is N2×P0, where N2 is the number of pixels included in the width of line segment 2 in the test image. The line width of line segment 3 in the acquired image is P3. Under ideal conditions without Flare and without scaling the test image during projection, the width of line segment 3 is N3×P0, where N3 is the number of pixels included in the width of line segment 3 in the test image, and N1 < N2 < N3.

[0106] Alternatively, the test image may include multiple test line segments, and the number of pixels included in the width of each test line segment is different. In this case, after the projector projects the test image onto the projection screen, the image acquisition device captures the projection screen, and the acquired image includes multiple test line segments, and the width of each test line segment is different.

[0107] For example, refer to Figure 4 , Figure 4 is an acquired image, where the white line segments represent test line segments. The left test line segment is denoted as line segment 4, and the right test line segment is denoted as line segment 5. Due to the existence of Flare during the projection process of the projector, there are shadow regions around the white line segments. The line width of line segment 4 in the acquired image is P4. Under ideal conditions without Flare and without scaling the test image during projection, the line width is N4×P0, where N4 is the number of pixels included in the width of line segment 4 in the test image, and P0 is the pixel width of a single pixel included in the test image in the acquired image. The line width of line segment 5 in the acquired image is P5. Under ideal conditions without Flare and without scaling the test image during projection, the line width is N5×P0, where N5 is the number of pixels included in the width of line segment 5 in the test image, and N4 < N5. In the actual application scenario, there are also Flare above and below the test line segments, Figure 3 and Figure 4 are not shown in

[0108] In the indirect measurement method, refer to Figure 5The above-mentioned method of determining the pixel width of a single pixel included in the test image in the captured image in S203 includes the following S2031 and S2032, and the method of determining the projection halo of the projector to be tested in S204 includes S2041 and S2042:

[0109] S2031 : Fit a straight line according to the width of each test line segment in the acquired image and the number of pixels included in the width of each test line segment in the test image.

[0110] For the convenience of description, the line segment width of the test line segment in the acquired image is denoted as P, and the number of pixels included in the width of the test line segment in the test image is denoted as N, that is, N is the number of pixels included in the short side of the test line segment in the test image, and the pixel width of a single pixel included in the test image in the acquired image is denoted as P0.

[0111] Without considering whether the test image is scaled during projection, the relationship between P, N and P0 is:

[0112] P=N×P0+Flare×P0 (2)

[0113] At this time, the collected line segment width P and the corresponding pixel number N are substituted into formula (2), and the fitted straight line can represent the linear relationship between P and N.

[0114] In some practical application scenarios, the projector may automatically scale the resolution of the test image to the resolution of the projector during projection. In order to reduce the test error caused by scaling, the projection scale needs to be considered.

[0115] When testing whether the image is scaled when considering projection, the relationship between P, N, scale and P0 is:

[0116] P=N×scale×P0+Flare×P0 (3)

[0117] Where scale represents the mapping scale when the projector projects the test image. If the projector does not scale the test image when projecting the test image, that is, it projects the test image at its original resolution, then scale = 1. To ensure the accuracy of the test, the original resolution of the test image must be less than or equal to the resolution of the projector, and the higher the original resolution of the test image, the more accurate the test result. If the projector automatically scales the test image to the resolution of the projector before projecting it, then when the angle between the normal direction of the test segment and the horizontal direction is 90°, scale = W. p / W i , W p Indicates the horizontal length of the projector's resolution, W iIndicates the horizontal length of the test image resolution; when the angle between the normal direction of the test line segment and the horizontal direction is 0°, scale = H P / H i , H P Indicates the vertical length of the projector's resolution, H i Indicates the vertical length of the test image's resolution. If the test image is scaled before being projected, the original resolution of the test image can be larger or smaller than the projector's resolution.

[0118] It should be noted that in the indirect measurement method, when scale = 1, the angle between the normal direction of the test segment and the horizontal direction can be any angle in the range of [0°, 180°]. This allows the test method provided in the embodiments of the present application to detect flares in different directions, improving the flexibility and comprehensiveness of the test. Specifically, when the angle between the normal direction of the test segment and the horizontal direction is 0° or 90°, the accuracy of the flare obtained by the test is the highest.

[0119] In the embodiment of the present application, the value of scale can be preset. For example, before each test, the test equipment receives the manually configured value of scale for this test, or the W used in this test. p and W i , or H P and H i , thereby calculating the value of the scale based on which this test is based.

[0120] Substituting the line segment width of each test line segment in the captured image and the number of pixels included in the width of the test line segment corresponding to the line segment width into formula (3), multiple equations can be obtained.

[0121] For example, combined with Figure 3 , let the width of the test line segment 1 in the acquired image be P1, and the number of pixels included in the width of the test line segment 1 in the test image be N1, and substitute them into formula (3), we can get:

[0122] P1=N1×scale×P0+Flare×P0 (4)

[0123] The width of the test line segment 2 in the acquired image is P2, and the number of pixels included in the width of the test line segment 2 in the test image is N2. Substituting P2 and N2 into formula (3), we can obtain:

[0124] P2=N2×scale×P0+Flare×P0 (5)

[0125] The width of the test line segment 3 in the acquired image is P3, and the number of pixels included in the width of the test line segment 3 in the test image is N3. Substituting them into formula (3), we can get:

[0126] P3=N3×scale×P0+Flare×P0 (6)

[0127] According to the relationship between P and N×scale reflected by formula (4), formula (5) and formula (6), a linear fit is performed on the relationship between P and N×scale to obtain a straight line reflecting the relationship between the two.

[0128] For example, see Figure 6 , Figure 6 The horizontal axis represents N×scale, and the vertical axis represents P. Figure 6 The straight line shown reflects the linear relationship between P and N×scale.

[0129] S2032. Obtain the slope of the straight line as the pixel width of a single pixel included in the test image in the acquired image.

[0130] Without considering whether the test image is scaled during projection, the straight line reflects the linear relationship between P and N. When considering whether the test image is scaled during projection, the straight line reflects the linear relationship between P and N×scale. Therefore, combining formulas (2) and (3), regardless of whether the test image is scaled, the slope of the straight line is P0, and the slope of the straight line is used as the pixel width.

[0131] S2041. Obtain the intercept of the straight line.

[0132] Combining formula (2) and formula (3), regardless of whether the test image is scaled or not, the intercept of the straight line is: Flare×P0.

[0133] S2042. Determine the ratio of the intercept to the pixel width as the projection halo.

[0134] That is, As Flare.

[0135] Through the above method, embodiments of the present application can fit the relationship between the line width P of a test line segment in the captured image and the number of pixels N included in the test image, thereby obtaining a flare. In this method, the more test line segments there are, the more accurate the fitted line is, and thus the more accurate the resulting flare is. Furthermore, due to the low complexity of this method, a larger number of test line segments can be set, thereby reducing the error in the resulting flare.

[0136] In the direct measurement method, the number of pixels included in the width of the test line segment in the test image is 1, that is, the line segment width obtained in S202 is: the line segment width of the single-pixel line in the test image in the captured image.

[0137] In direct measurement methods, see Figure 7 The above-mentioned method of determining the pixel width of a single pixel included in the test image in the captured image in S203 includes the following S2033 to S2035, and the method of determining the projection halo of the projector to be tested in S204 includes S2043 and S2044:

[0138] S2033: Obtain the resolution of the test image, and extract the total number of pixels included in the width of the test image from the resolution.

[0139] In an embodiment of the present application, the resolution of the test image can be preset. For example, assuming the test image format is 1080 progressive scan (P), the resolution of the test image is 1080×1920, indicating that the test image includes 1080 pixels vertically and 1920 pixels horizontally. The resolution of the test image is less than or equal to the resolution of the projector, and the projector does not scale the test image when projecting the test image.

[0140] S2034: Obtain the pattern width of the test image in the acquired image.

[0141] The captured image may be subjected to image recognition to obtain the pattern width of the test image in the captured image. For a specific image recognition method, reference may be made to the method of determining the line segment width of the test line segment in the captured image in S202 above, which will not be described in detail here.

[0142] The test image used as a basis for determining the line segment width in S202 and the test image used as a basis for determining the pattern width in S2034 may be the same or different. For example, the test image used as a basis for determining the line segment width in S202 may include a test line segment with a width of 1 pixel, the test line segment being white, and the remaining pixels in the test image being black. The test image used as a basis for determining the pattern width in S2034 may not include the test line segment, for example, all pixels in the test image may be white.

[0143] S2035. Use the ratio of the pattern width to the total number of pixels as the pixel width of a single pixel included in the test image in the acquired image.

[0144] That is, the pixel width is:

[0145] P0=W / W i (7)

[0146] Wherein, P0 is the pixel width of a single pixel included in the test image in the acquisition image, W is the pattern width of the test image in the acquisition image, and W i The total number of pixels included for the width of the test image.

[0147] In actual application scenarios, W may include Flare, but since W i Huge, so even if W includes Flare, when divided by W i After that, the Flare included in the obtained result is extremely small, that is, the error between the result and P0 is extremely small and can be ignored, so W / W i Can be used as P0.

[0148] S2043. Determine the difference between the line segment width and the pixel width.

[0149] S2044: Use the ratio of the difference value to the pixel width as the projection halo.

[0150] For ease of description, the width of the test line segment in the captured image is recorded as P, and the width of a single pixel included in the test image in the captured image is recorded as P0. That is, Flare = (P-P0) / P0.

[0151] Through the above method, the embodiment of the present application can test and obtain Flare using one test line segment, which reduces the number of projections and the number of shots of the projection screen during the test, and simplifies the calculation process of Flare. Therefore, the test process takes less time and has lower calculation amount, thereby improving the test efficiency.

[0152] Figure 5 and Figure 7 The specific implementation of other steps included can be referred to Figure 2 The relevant description in will not be repeated here.

[0153] In an embodiment of the present application, the test device can control the projector to project and control the image acquisition device to capture. That is, before acquiring the captured image obtained by capturing the projection screen in S201, the test device can also perform the following steps:

[0154] Step 1: Sending a test image to the projector, wherein the initial value of the number of pixels included in the width of the test line segment in the test image is a preset number, so that the projector projects the test image onto the projection screen.

[0155] For example, the preset number is 1 pixel.

[0156] The test device and the projector can be connected in a wired or wireless manner, thereby sending a test image to the projector.

[0157] Step 2: Send a shooting instruction to the image acquisition device so that the image acquisition device shoots the projection screen to obtain a captured image.

[0158] To reduce the possibility of the projector not completing projection while the image capture device is capturing, the test device can wait for a preset time after sending a test image to the projector before sending a capture command to the image capture device. For example, the preset time is 5 seconds. The test device can then execute S201 to obtain a captured image.

[0159] After acquiring the captured image obtained by photographing the projection screen in S201, the testing device may further perform the following steps:

[0160] Step 1: Determine whether the number of pixels included in the width of the test line segment in the test image is a preset maximum number of pixels. If yes, execute S202; if not, execute step 2.

[0161] The preset maximum number of pixels may be a number set by a tester. The test device may receive the preset maximum number of pixels input by the tester, or the test device may receive the preset maximum number of pixels sent by the test client, or the test device may obtain the preset maximum number of pixels through other means, which is not specifically limited in the embodiments of the present application.

[0162] Step 2: Update the test image.

[0163] The number of pixels included in the width of the test line segment in the updated test image is greater than the number of pixels included in the width of the test line segment in the test image before the update.

[0164] The difference between the number of pixels included in the width of the test line segment in the test image before and after the update is a fixed value, for example, the fixed value is 1 pixel.

[0165] Step 3: Send the updated test image to the projector so that the projector projects the updated test image onto the projection screen, and return to step 2.

[0166] Through the above method, the test device can update the test image, thereby obtaining multiple captured images. When there is only one captured image, the Flare is determined using the above direct measurement method; when there are multiple captured images, the Flare is determined using the above indirect measurement method. This increases the flexibility of the test method selection in the embodiments of the present application.

[0167] See also Figure 8 The following describes the overall process of the projector testing method provided in the embodiment of the present application:

[0168] S801. Receive the preset maximum number of pixels and the preset quantity input by the staff.

[0169] S802: Generate a test image and send the test image to the projector, wherein the width of the test line segment in the test image includes a preset number of pixels.

[0170] S803: Send a shooting instruction to the image acquisition device, so that the image acquisition device shoots the projection screen to obtain a captured image.

[0171] S804: Acquire an image from an image acquisition device.

[0172] S805: Determine whether the number of pixels included in the width of the test line segment in the test image is a preset maximum number of pixels. If yes, execute S808; if not, execute S806.

[0173] S806: Update the test image, wherein the difference between the number of pixels included in the width of the test line segment in the updated test image and the number of pixels included in the width of the test line segment in the test image before the update is 1 pixel.

[0174] S807 : Send the updated test image to the projector so that the projector projects the updated test image onto the projection screen, and return to S803 .

[0175] S808: Determine whether the preset maximum number of pixels is equal to the preset number. If yes, execute S809; if no, execute S810.

[0176] S809: Determine the projection halo by direct measurement.

[0177] S810. Determine the projection halo through an indirect measurement method.

[0178] The projector testing method provided in the embodiments of the present application can achieve automated flare testing, reducing manual intervention, reducing test errors, and improving test efficiency. Furthermore, the flare measurement method can be selected by simply setting a preset maximum number of pixels, providing high flexibility.

[0179] Based on the same inventive concept, the embodiment of the present application also provides a test system for a projector, such as Figure 9 As shown, the system includes: a projector 901, an image acquisition device 902 and a test device 903;

[0180] The projector 901 is used to project a test image onto a projection screen.

[0181] The image acquisition device 902 is used to capture the projection screen to obtain a captured image.

[0182] The testing device 903 is used to execute the steps of the method included in the above method embodiment.

[0183] The test system for a projector provided in an embodiment of the present application can obtain a captured image obtained by photographing a projection screen, wherein the projection screen includes a test image projected by the projector to be tested, and the test image includes a test line segment. Image recognition is then performed on the captured image to obtain the line segment width of the test line segment included in the captured image, and the pixel width of a single pixel included in the test image in the captured image is determined. Based on the line segment width and the pixel width, the projection halo of the projector to be tested is then determined, wherein the projection halo is the width of the trailing shadow generated after a single pixel is projected onto the projection screen. It can be seen that the embodiment of the present application can automatically test the Flare generated by the projected image of the projector based on the captured image, thereby reducing the dependence of the projector test process on manual labor, ensuring the accuracy of the test results, reducing labor costs, and improving test efficiency.

[0184] In an embodiment of the present application, in order to reduce test errors and improve test accuracy, the contrast between the background color and the test line segment color in the test image can be set higher than the preset contrast, for example, the background color is set to black and the test line segment color is set to white.

[0185] The lens plane of the image acquisition device may also be set to be parallel to the plane of the projection screen, thereby reducing perspective distortion of the test line segments in the projection screen in the acquired image.

[0186] In addition, in order to reduce the influence of perspective deformation and lens distortion, the image acquisition device can be calibrated in advance, and the lens center point of the image acquisition device can be adjusted to be perpendicular to the projection plane, and the foot of the perpendicular is the center point of the test line segment, thereby reducing the deformation influence of the test line segment in the captured image.

[0187] Furthermore, in order to improve the clarity of the captured image, the pixel width of a single pixel included in the test image in the captured image may be controlled to be higher than a preset threshold, for example, the preset threshold is 10 pixels.

[0188] The following is an example of the complete process of testing Flare using the test system in the embodiment of the present application:

[0189] See also Figure 10 Projector 1 projects a test image at each test position on projection screen 2. The test positions include: upper left corner 21, upper right corner 22, center 23, lower left corner 24, and lower right corner 25. The width of the test line segment in each test image varies by the number of pixels. If only one image acquisition device 3 is provided, image acquisition device 3 is controlled to move so that the center of the lens is perpendicular to the center of the test position for each test. Image acquisition device 3 then captures the projection screen to obtain a captured image.

[0190] Alternatively, see Figure 11In the case of multiple image acquisition devices 3, the lens center of each image acquisition device 3 is set to be perpendicular to the center of a test position. Whenever the projector 1 projects a test image at at least one test position, the image acquisition device 3 with the lens center perpendicular to the center of the test position is used to capture the projection screen to obtain a captured image. Among them, each image acquisition device 3 can be fixed separately, or as shown in FIG. Figure 11 As shown, each image acquisition device can be fixed uniformly through a fixed frame.

[0191] Afterwards, the test device determines the Flare based on each captured image.

[0192] Based on the same inventive concept, the embodiment of the present application also provides a testing device for a projector, such as Figure 12 As shown, the device includes: an acquisition module 1201, an identification module 1202 and a determination module 1203;

[0193] An acquisition module 1201 is configured to acquire an image captured by photographing a projection screen, where the projection screen includes a test image projected by the projector to be tested, and the test image includes a test line segment.

[0194] The recognition module 1202 is configured to perform image recognition on the acquired image acquired by the acquisition module 1201 to obtain the width of the test line segment in the acquired image;

[0195] A determination module 1203 is configured to determine the pixel width of a single pixel included in the test image in the acquired image;

[0196] The determination module 1203 is further configured to determine the projection halo of the projector to be tested based on the line segment width identified by the recognition module 1202 and the pixel width determined by the determination module 1203 . The projection halo is the width of the trailing image generated when a single pixel is projected onto the projection screen.

[0197] Optionally, there are multiple test line segments, and the width of each test line segment includes a different number of pixels; the determination module 1203 is specifically configured to:

[0198] Fitting a straight line according to the line segment width of each test line segment in the acquired image and the number of pixels included in the width of each test line segment in the test image;

[0199] Get the slope of the line, as pixel width.

[0200] Optionally, the determination module 1203 is specifically configured to:

[0201] Get the intercept of the line;

[0202] Determine the ratio of the intercept to the pixel width as the projected halo.

[0203] Optionally, the determination module 1203 is specifically configured to:

[0204] Get the resolution of the test image and extract the total number of pixels included in the width of the test image from the resolution;

[0205] Get the pattern width of the test image in the acquired image;

[0206] The ratio of the pattern width to the total number of pixels is used as the pixel width.

[0207] Optionally, the number of pixels included in the width of the test line segment in the test image is 1, and the determination module 1203 is specifically configured to:

[0208] Determine the difference between the line segment width and the pixel width;

[0209] The ratio of the difference to the pixel width is used as the projection halo.

[0210] Optionally, the device further includes:

[0211] a sending module, configured to send a test image to the projector before acquiring an image obtained by photographing the projection screen, wherein the initial value of the number of pixels included in the width of a test line segment in the test image is a preset number, so that the projector projects the test image onto the projection screen;

[0212] The sending module is further used to send a shooting instruction to the image acquisition device, so that the image acquisition device shoots the projection screen to obtain a captured image;

[0213] a determination module configured to, after acquiring an image captured by photographing the projection screen, determine whether the number of pixels included in the width of a test line segment in the test image is a preset maximum number of pixels; and if so, call the recognition module to perform an image recognition step on the captured image;

[0214] an updating module, configured to update the test image if the determination result of the determining module is negative, wherein the number of pixels included in the width of the test line segment in the updated test image is greater than the number of pixels included in the width of the test line segment in the test image before the update;

[0215] The sending module is further configured to send the updated test image to the projector so that the projector projects the updated test image onto the projection screen, and returns to the step of sending a shooting instruction to the image acquisition device.

[0216] The present application also provides a test device, such as Figure 13 As shown, it includes a processor 1301 , a communication interface 1302 , a memory 1303 and a communication bus 1304 , wherein the processor 1301 , the communication interface 1302 and the memory 1303 communicate with each other via the communication bus 1304 .

[0217] Memory 1303, used for storing computer programs;

[0218] The processor 1301 is configured to implement the steps performed by the testing device in the above method embodiment when executing the program stored in the memory 1303 .

[0219] The communication bus mentioned in the test equipment above can be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus. This communication bus can be divided into address buses, data buses, control buses, etc. For ease of illustration, only one thick line is used in the figure, but this does not mean that there is only one bus or only one type of bus.

[0220] The communication interface is used for communication between the above test equipment and other equipment.

[0221] The memory may include random access memory (RAM) or non-volatile memory (NVM), such as at least one disk storage. Alternatively, the memory may be at least one storage device located away from the processor.

[0222] The above-mentioned processor can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.

[0223] In another embodiment provided by the present application, a computer-readable storage medium is further provided, wherein a computer program is stored in the computer-readable storage medium. When the computer program is executed by a processor, the steps of any of the above-mentioned methods for testing a projector are implemented.

[0224] In another embodiment provided by the present application, a computer program product including instructions is further provided. When the computer program product is run on a computer, the computer is enabled to execute any one of the projector testing methods in the above embodiments.

[0225] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When software is used for implementation, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions can be transmitted from a website, computer, server or data center to another website, computer, server or data center via a wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) method. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more available media integrations. The available medium can be a magnetic medium (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state drive (SSD)).

[0226] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply the existence of any such actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or device comprising the element.

[0227] Each embodiment in this specification is described in a related manner. Similar portions between the embodiments can be referenced to each other. Each embodiment focuses on the differences from other embodiments. In particular, the device and system embodiments are generally similar to the method embodiments, so their descriptions are relatively simple. For related portions, reference can be made to the descriptions of the method embodiments.

[0228] The above description is only a preferred embodiment of the present application and is not intended to limit the scope of protection of the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application are included in the scope of protection of the present application.

Claims

1. A method for testing a projector, characterized in that: The method comprises: Acquire a captured image obtained by photographing a projection screen, wherein the projection screen includes a test image projected by the projector to be tested, and the test image includes a test line segment; Performing image recognition on the acquired image to obtain the line segment width of the test line segment in the acquired image; Determining a pixel width of a single pixel included in the test image in the acquired image; The projection halo of the projector to be tested is determined according to the line segment width and the pixel width, where the projection halo is the width of a streak generated when a single pixel is projected onto a projection screen.

2. The method according to claim 1, characterized in that There are a plurality of test line segments, each of which has a different number of pixels in width; and determining the pixel width of a single pixel in the test image in the acquired image includes: Fitting a straight line according to the line segment width of each test line segment in the acquired image and the number of pixels included in the width of each test line segment in the test image; The slope of the straight line is obtained as the pixel width.

3. The method according to claim 2, characterized in that The step of determining the projection halo of the projector to be tested based on the line segment width and the pixel width includes: Obtaining the intercept of the straight line; A ratio of the intercept to the pixel width is determined as the projection halo.

4. The method according to claim 1, wherein The determining of the pixel width of a single pixel included in the test image in the acquired image comprises: Obtaining a resolution of the test image, and extracting a total number of pixels including a width of the test image from the resolution; Obtaining a pattern width of the test image in the acquired image; The ratio of the pattern width to the total number of pixels is used as the pixel width.

5. The method according to claim 4, characterized in that The number of pixels included in the width of the test line segment in the test image is 1, and determining the projection halo of the projector to be tested based on the line segment width and the pixel width includes: Determining a difference between the line segment width and the pixel width; The ratio of the difference to the pixel width is used as the projection halo.

6. The method according to any one of claims 1 to 5, characterized in that Before acquiring the captured image obtained by photographing the projection screen, the method further includes: Sending a test image to the projector, wherein the initial value of the number of pixels included in the width of a test line segment in the test image is a preset number, so that the projector projects the test image onto a projection screen; Sending a shooting instruction to an image acquisition device so that the image acquisition device shoots the projection screen to obtain a captured image; After acquiring the captured image obtained by photographing the projection screen, the method further includes: Determining whether the number of pixels included in the width of the test line segment in the test image is a preset maximum number of pixels; If so, executing the step of performing image recognition on the collected image; If not, updating the test image, wherein the number of pixels included in the width of the test line segment in the updated test image is greater than the number of pixels included in the width of the test line segment in the test image before the update; The updated test image is sent to the projector so that the projector projects the updated test image onto the projection screen, and the process returns to the step of sending the shooting instruction to the image acquisition device.

7. A projector testing device, characterized in that: The device comprises: an acquisition module, configured to acquire an image captured by photographing a projection screen, wherein the projection screen includes a test image projected by the projector to be tested, and the test image includes a test line segment; a recognition module, configured to perform image recognition on the acquired image acquired by the acquisition module to obtain the line segment width of the test line segment in the acquired image; a determination module, configured to determine a pixel width of a single pixel included in the test image in the acquired image; The determination module is further configured to determine a projection halo of the projector to be tested based on the line segment width identified by the recognition module and the pixel width determined by the determination module, wherein the projection halo is the width of a trailing image generated when a single pixel is projected onto a projection screen.

8. The device according to claim 7, characterized in that There are multiple test line segments, and the width of each test line segment includes a different number of pixels; the determining module is specifically used to: Fitting a straight line according to the line segment width of each test line segment in the acquired image and the number of pixels included in the width of each test line segment in the test image; The slope of the straight line is obtained as the pixel width.

9. The device according to claim 8, characterized in that The determining module is specifically configured to: Obtaining the intercept of the straight line; A ratio of the intercept to the pixel width is determined as the projection halo.

10. The device according to claim 7, characterized in that The determining module is specifically configured to: Obtaining a resolution of the test image, and extracting a total number of pixels including a width of the test image from the resolution; Obtaining a pattern width of the test image in the acquired image; The ratio of the pattern width to the total number of pixels is used as the pixel width.

11. The device according to claim 10, characterized in that The number of pixels included in the width of the test line segment in the test image is 1, and the determining module is specifically configured to: Determining a difference between the line segment width and the pixel width; The ratio of the difference to the pixel width is used as the projection halo.

12. The device according to any one of claims 7 to 11, characterized in that: Also includes: a sending module, configured to send a test image to the projector before acquiring the captured image obtained by photographing the projection screen, wherein the initial value of the number of pixels included in the width of the test line segment in the test image is a preset number, so that the projector projects the test image onto the projection screen; The sending module is further configured to send a shooting instruction to the image acquisition device, so that the image acquisition device shoots the projection screen to obtain a captured image; a determination module configured to, after acquiring the captured image obtained by photographing the projection screen, determine whether the number of pixels included in the width of the test line segment in the test image is a preset maximum number of pixels; and if so, call the recognition module to execute the step of performing image recognition on the captured image; an updating module, configured to update the test image if the judgment result of the judging module is negative, wherein the number of pixels included in the width of the test line segment in the updated test image is greater than the number of pixels included in the width of the test line segment in the test image before the update; The sending module is further configured to send the updated test image to the projector so that the projector projects the updated test image onto the projection screen, and returns to the step of sending the shooting instruction to the image acquisition device.

13. A projector testing system, characterized in that: include: a projector for projecting a test image onto a projection screen; An image acquisition device, used to capture the projection screen to obtain an image; A test device for executing the method according to any one of claims 1 to 6.

14. A testing device, characterized in that: It includes a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other via the communication bus; Memory for storing computer programs; A processor, configured to implement the method according to any one of claims 1 to 6 when executing a program stored in a memory.

15. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method according to any one of claims 1 to 6 is implemented.

Images