Efficient test method and test device for electronic product and storage medium

Abstract

The invention relates to a test method of an electronic product, in particular to a high-efficiency test method of the electronic product, which comprises the following steps of: confirming a test result through a key needing to be tested during a component function test, and automatically entering a next component function test after the test result is confirmed; wherein the tests of part of the keys and the tests of the components are paired one by one, so that when the keys are pressed, the tests of the paired keys and the tests of the functions of the components are completed at the same time. According to the efficient testing method for the electronic product, testing of part of keys can be completed in function testing of other elements in advance, testing of more than 10 keys can be saved for the key testing link, and the effective efficiency is greatly improved.

Description

Technical Field

[0001] The present invention relates to a testing method for electronic products, in particular to a high-efficiency testing method, a testing device and a storage medium for electronic products. Background Art

[0002] Electronic products contain many components. To ensure they function properly after leaving the factory, they all need to be tested on the production line. The typical approach is to enter the test list, select the first test item, press OK to proceed, and after the test is complete, press the Back button to return to the test list. Select the second test item and continue testing according to the first test item, and so on.

[0003] Test list:

[0004] Serial number Test items 1 Flashlight Jane 2 earpiece 3 microphone 4 camera 5 motor 6 Bluetooth 7 earphone 8 trumpet 9 screen backlight 10 Key backlight 11 radio 12 SD card 13 SIM card 14 Screen Display 15 Charge 16 button

[0005] In addition, the test list includes a key test. There are 21 keys, namely 0-9 numeric keys, * key, # key, 4 direction keys (LF, RT, UP, DN), left soft key (LSK), right soft key (RSK), dial key (SND), hang-up key (END) and confirmation key (CSK). In order to ensure that these keys can work properly after leaving the factory, they need to be tested on the production line. The general practice is to display the characters or pictures of all keys on the screen, and mark the characters or pictures of the corresponding keys when a key is pressed. Therefore, each electronic product needs to be pressed 21 times to complete its key test. For example Figure 1 As shown in the figure, it is a schematic diagram of the button test not starting; Figure 2 The following is a schematic diagram after completing some key tests.

[0006] This method requires pressing more than 50 times for each test, resulting in low test efficiency. Summary of the Invention

[0007] To solve the above-mentioned problem of low testing efficiency, the present invention provides an efficient testing method for electronic products. The specific technical solution is as follows:

[0008] An efficient testing method for electronic products comprises the following steps: during a component function test, confirming the test result by using a key to be tested, and automatically entering the next component function test after confirming the test result; wherein, the test of some keys is paired with the test of components one by one, so that when a key is pressed, the test of the paired keys and the test of the component function are completed simultaneously.

[0009] An efficient testing device for electronic products comprises: a processor; and a memory storing a computer program that can be run on the processor; wherein the computer program, when executed by the processor, implements the steps of an efficient testing method for electronic products.

[0010] A computer-readable storage medium stores a data processing program, which implements the steps of an efficient testing method for electronic products when executed by a processor.

[0011] Compared with the prior art, the present invention has the following beneficial effects:

[0012] The present invention provides an efficient testing method for electronic products, which enables the testing of some buttons to be completed in advance during the functional testing of other components, thereby saving the testing of more than 10 buttons in the button testing link and greatly improving the effectiveness. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 This is a schematic diagram showing that the key test has not started;

[0014] Figure 2 This is a diagram after completing some key testing. DETAILED DESCRIPTION

[0015] The present invention will be further described with reference to the accompanying drawings.

[0016] An efficient testing method for electronic products comprises the following steps:

[0017] During component function test, the test result is confirmed by pressing the button to be tested, and the next component function test is automatically entered after the test result is confirmed;

[0018] The tests of some buttons are paired with the tests of components one by one, so that the tests of the paired buttons and the tests of the component functions are completed simultaneously when the buttons are pressed.

[0019] When testing component functions, the system directly proceeds to the first test item. After the first test item is completed, it automatically switches to the second test item, and so on. Each test requires confirming the test result by pressing the pass key (LSK key acts as the pass key) or the fail key (RSK key acts as the pass key). After confirming the result, the system automatically proceeds to the next test item, eliminating the need to enter the test list and switch back and forth between different test items. It also prevents missed tests or repeated tests.

[0020] Integrate the test operations of some buttons into the pass key of the component function test, such as using the LSK button as the pass key for the flashlight, the SND button as the pass key for the earpiece, the number 1 button as the pass key for the microphone, and so on (see the table below for the specific correspondence). Taking the flashlight test as an example, if the flashlight test passes, you can press the LSK button to enter the next test, and then the LSK button does not need to be tested again in the button test item. If the flashlight test fails, press the RSK button to enter the next test, and you need to continue testing the LSK button in the subsequent button test. The same logic applies to other corresponding buttons. In this way, the test of some buttons can be completed in advance during the test of other components, which can save more than 10 button tests for the button test link, greatly improving the effectiveness efficiency.

[0021] The specific process is as follows:

[0022] Step 1. Start the test device. The test program will automatically enter the flashlight test. If the flashlight test passes, press the LSK key to enter the handset test. If the flashlight test fails, press the RSK key to enter the next handset test.

[0023] Step 2. If the handset test passes, press the SND key to enter the microphone test. If the handset test fails, press the RSK key to enter the microphone test.

[0024] Step 3. If the microphone test passes, press 1 to enter the camera test. If the microphone test fails, press RSK to enter the camera test.

[0025] Step 4. If the camera test passes, press the 4 key to enter the motor test. If the camera test fails, press the RSK key to enter the motor test.

[0026] Step 5. If the motor test passes, press the 7 key to enter the Bluetooth test. If the motor test fails, press the RSK key to enter the Bluetooth test.

[0027] Step 6. If the Bluetooth test passes, press * to enter the headset test. If the Bluetooth test fails, press RSK to enter the headset test.

[0028] Step 7. If the headphone test passes, press the UP key to enter the speaker test. If the headphone test fails, press the RSK key to enter the speaker test.

[0029] Step 8. If the speaker test passes, press the CSK key to enter the screen backlight test. If the speaker test fails, press the RSK key to enter the screen backlight test.

[0030] Step 9. If the screen backlight test passes, press the LF key to enter the key backlight test. If the screen backlight test fails, press the RSK key to enter the key backlight test.

[0031] Step 10. If the key backlight test passes, press the RT key to enter the radio test. If the key backlight test fails, press the RSK key to enter the radio test.

[0032] Step 11. If the radio test passes, press the DN key to enter the SD card test. If the radio test fails, press the RSK key to enter the SD card test.

[0033] Step 12. If the SD card test passes, press the 2 key to enter the SIM card test. If the SD card test fails, press the RSK key to enter the SIM card test.

[0034] Step 13. If the SIM card test passes, press the 5 key to enter the screen display test. If the flashlight SIM card test fails, press the RSK key to enter the screen display test.

[0035] Step 14. If the screen shows that the test is passed, press the 8 key to enter the charging test. If the screen shows that the test fails, press the RSK key to enter the charging test.

[0036] Step 15. If the charging test passes, press the 0 key to complete the test. If the charging test fails, press the RSK key to complete the test.

[0037] During the test, if there is no response after pressing a button, it means that there is a problem with the button. You can directly press the RSK key to enter the next test and record the results of the button test and component function test.

[0038] During the test process, if a test item, such as the microphone test, fails, the operator presses the right soft key RSK. The right soft key RSK acts as a fail key. The test equipment records the result and switches to the next test item. However, when performing a subsequent key test, when the number 1 key is tested, the number 1 key needs to be retested to ensure that the key function is normal and the accuracy of the test associated with the microphone function.

[0039] Serial number Test items Corresponding pass key 1 flashlight LSK 2 earpiece SND 3 microphone 1 4 camera 4 5 motor 7 6 Bluetooth * 7 earphone UP 8 trumpet CSK 9 screen backlight LF 10 Key backlight RT 11 radio DN 12 SD card 2 13 SIM card 5 14 Screen Display 8 15 Charge 0

[0040] An efficient testing device for electronic products comprises: a processor; and a memory storing a computer program that can be run on the processor; wherein the computer program, when executed by the processor, implements the steps of an efficient testing method for electronic products.

[0041] The memory and processor are electrically connected, directly or indirectly, to enable data transmission or interaction. For example, these elements may be electrically connected to each other via one or more communication buses or signal lines, such as a bus connection. The memory stores computer-executable instructions for implementing the data access control method, including at least one software function module that can be stored in the memory in the form of software or firmware. The processor executes various functional applications and data processing by running the software programs and modules stored in the memory.

[0042] The memory may be, but is not limited to, random access memory (RAM), read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), and electrically erasable programmable read-only memory (EEPROM). The memory is used to store programs, and the processor executes the programs after receiving execution instructions.

[0043] The processor can be an integrated circuit chip with signal processing capabilities. The above-mentioned processor can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc. It can implement or execute the various methods, steps, and logic block diagrams disclosed in the embodiments of this application. The general-purpose processor can be a microprocessor or any conventional processor.

[0044] A computer-readable storage medium stores a data processing program, which implements the steps of an efficient testing method for electronic products when executed by a processor.

[0045] The embodiments of the present invention are described with reference to flowcharts of methods, terminal devices (systems), and computer program products according to the embodiments of the present invention. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing terminal device to produce a machine, such that execution of the instructions by the processor of the computer or other programmable data processing terminal device produces means for implementing the functions specified in the flowcharts and / or the flowcharts.

[0046] These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing terminal device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce a manufactured product including an instruction device that implements the functions specified in the flowchart.

[0047] These computer program instructions can also be loaded onto a computer or other programmable data processing terminal device so that a series of operating steps are executed on the computer or other programmable terminal device to produce computer-implemented processing, whereby the instructions executed on the computer or other programmable terminal device provide steps for implementing the functions specified in the flowchart.

[0048] The technical principles of the present invention have been described above with reference to specific embodiments. These descriptions are intended solely to illustrate the principles of the present invention and are not to be construed in any way as limiting the scope of protection of the present invention. Based on the explanations herein, those skilled in the art will readily devise other specific embodiments of the present invention without inventive effort, and such embodiments will fall within the scope of protection of the claims of the present invention.

Claims

1. An efficient testing method for electronic products, characterized in that: The following steps are involved: During component function test, the test result is confirmed by pressing the button to be tested, and the next component function test is automatically entered after the test result is confirmed; The tests of some buttons are paired with the tests of components one by one, so that the tests of the paired buttons and the tests of the component functions are completed simultaneously when the buttons are pressed.

2. An efficient testing device for electronic products, characterized in that: include: processor; a memory having stored thereon a computer program executable on the processor; Wherein, when the computer program is executed by the processor, the steps of the efficient testing method for electronic products as claimed in claim 1 are implemented.

3. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a data processing program, and when the data processing program is executed by a processor, the steps of the efficient testing method for electronic products according to claim 1 are implemented.

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