Sample analyzer, control method thereof, server and sample detection system

Abstract

The invention discloses a sample analyzer, a control method thereof, a server and a sample detection system. The sample analyzer comprises a first sample detection assembly and a processing assembly, the processing assembly is connected with the first sample detection assembly, and the processing assembly is used for obtaining a first detection result from the first sample detection assembly; if the second detection result of the second item detection of the sample is not obtained within the preset time, obtaining a preset default correction parameter; correcting the first detection result based on a preset default correction parameter to obtain a first correction result; after preset time, a second correction result of the first detection result is received from the external server, and the second correction result is obtained by correcting the first detection result by the external server according to the second detection result; and replacing the first correction result based on the second correction result. The sample analyzer is high in detection efficiency, can provide a temporary result, and provides assistance for a doctor to carry out temporary diagnosis.

Description

Technical Field

[0001] The present application relates to the field of in vitro diagnostic technology, and in particular to a sample analyzer and a control method thereof, a server, and a sample detection system. Background Art

[0002] In an assembly line sample testing system, if the sample testing system needs to perform multiple tests on the sample (for example, a blood test and a specific protein test), it is usually necessary to correct the test results of a specific item using the test results of another item.

[0003] In the related art, a sample analyzer that obtains a test result for a specific item often needs to constantly determine whether it has received a test result for another item. Once it has determined that a test result for another item has been received, it then performs data correction on the test result for the specific item. This method results in low working efficiency of the sample analyzer. Summary of the Invention

[0004] The present application provides a sample analyzer and a control method thereof, a server, and a sample detection system to solve the technical problem of low working efficiency of the sample analyzer in the related art.

[0005] In order to solve the above technical problems, a technical solution adopted by the present application is: to provide a sample analyzer, which is connected to an external server, and the sample analyzer includes: a first sample detection component and a processing component. The first sample detection component is used to receive a sample and perform a first item test on the sample to obtain a first test result; the processing component is connected to the first sample detection component. The processing component is used to: obtain the first test result from the first sample detection component; if the second test result of the second item test of the sample is not obtained within a preset time, obtain the preset default correction parameters; correct the first test result based on the preset default correction parameters to obtain a first corrected result; after a preset time, receive a second corrected result of the first test result from the external server, wherein the second corrected result is obtained by the external server correcting the first test result according to the second test result; and replace the first corrected result based on the second corrected result.

[0006] In some specific embodiments, the processing component is further configured to: after obtaining the first correction result, mark the first correction result; and send the marked first correction result to an external server.

[0007] In some specific embodiments, sample detection data is stored in an external server and / or a processing component, and the processing component is also used to: if a second detection result of a second item of detection of the sample is obtained within a preset time, then search for the first detection result corresponding to the sample from the sample detection data of that day; if it is confirmed that the first detection result of the sample does not exist in the sample detection data of that day, then search for the sample detection data within a first preset time period before the first current moment to obtain the first detection result of the sample, wherein the first current moment is the moment when the processing component receives the second detection result.

[0008] In some specific embodiments, the processing component is further configured to: obtain a second detection result within a preset time, and correct the first detection result using the second detection result to obtain a corrected result.

[0009] In some specific embodiments, the sample analyzer also includes a scanning component, and the processing component is further used to: obtain the detection mode of the sample through the scanning component; when it is confirmed that the detection mode of the sample is a joint detection mode of the first item detection and the second item detection, then execute the step of obtaining the preset default correction parameters if the second detection result of the second item detection of the sample is not obtained within the preset time.

[0010] In order to solve the above technical problems, another technical solution adopted in the present application is: providing a control method for a sample analyzer, which is based on the sample analyzer of any of the above embodiments, and the control method includes: obtaining a first test result of the sample from the first sample detection component; if the second test result of the second item test of the sample is not obtained within a preset time, obtaining a preset default correction parameter; correcting the first test result based on the preset default correction parameter to obtain a first corrected result; after a preset time, receiving a second corrected result of the first test result from an external server, wherein the second corrected result is obtained by the external server correcting the first test result according to the second test result; replacing the first corrected result based on the second corrected result.

[0011] To solve the above technical problems, another technical solution adopted in this application is: providing a server, which is connected to a second sample detection component and a sample analyzer of any of the above embodiments, the second sample detection component is used to perform a second item test on the sample to obtain a second test result, and the server is used to: obtain a first test result of the sample from the sample analyzer; after a preset time, obtain a second test result of the sample from the second sample detection component; correct the first test result based on the second test result to obtain a second corrected result; and send the second corrected result to the sample analyzer.

[0012] In some specific embodiments, the server is further configured to: obtain a first revised result with a mark from the sample analyzer; and after obtaining a second revised result, replace the first revised result with the mark based on the second revised result.

[0013] In some specific embodiments, sample detection data is stored in the server and / or the sample analyzer, and the server is also used to: if a second detection result of the sample is obtained from the second sample detection component, then search for the first detection result corresponding to the sample from the sample detection data of that day; if it is confirmed that the first detection result of the sample does not exist in the sample detection data of that day, then search for the sample detection data within a second preset time period before the second current moment to obtain the first detection result of the sample, wherein the second current moment is the moment when the server receives the second detection result.

[0014] To solve the above technical problems, another technical solution adopted in this application is: to provide a sample detection system, which includes: a sample analyzer of any of the above embodiments, a second sample detection component and a server of any of the above embodiments, the second sample detection component is used to perform a second item test on the sample to obtain a second test result; the server is connected to the sample analyzer and the second sample detection component.

[0015] The beneficial effects of this application are as follows: Unlike existing technologies, the sample analyzer of this application first corrects the first test result using preset default correction parameters when the second test result is not received in a timely manner, and then the correction process using the second test result is carried out on the server. This eliminates the need for the sample analyzer to wait for the second test result, improving the sample analyzer's detection efficiency and reducing the risk of pipeline stagnation. Furthermore, by first correcting the sample analyzer using the preset default correction parameters to obtain a provisional result, the timeliness of the report can be improved or guaranteed. Doctors can use this provisional result to assist in diagnosis, minimizing the need to miss critical diagnostic opportunities. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0017] Figure 1 is a schematic diagram of a framework of a sample detection system provided in some embodiments of the present application; Figure 2 is a schematic diagram of a framework of a sample analyzer provided in some embodiments of the present application; Figure 3This is a flow chart of an embodiment of a control method for a sample analyzer provided by some embodiments of the present application; Figure 4 This is a flow chart of a server control method provided in some embodiments of the present application. DETAILED DESCRIPTION

[0018] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. It will be understood that the specific embodiments described herein are only used to explain the present application, rather than to limit the present application. It should also be noted that, for ease of description, only some, rather than all, structures related to the present application are shown in the accompanying drawings. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0019] The terms "first," "second," and the like in this application are used to distinguish between different objects, not to describe a particular order. Furthermore, the terms "including," "having," and any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or apparatus comprising a series of steps or elements is not limited to the listed steps or elements, but may optionally include steps or elements not listed, or may optionally include other steps or elements inherent to the process, method, product, or apparatus.

[0020] References herein to "embodiments" mean that a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0021] This application provides a sample detection system, please refer to Figure 1 As shown, Figure 1 This is a schematic diagram of the framework of a sample testing system provided in some embodiments of the present application. The sample testing system 100 includes a server 30, a sample analyzer 10, and a second sample testing component 20. The server 30 is connected to the sample analyzer 10 and the second sample testing component 20. Relative to the sample analyzer 10, the server 30 is external.

[0022] The sample analyzer 10 can be used to perform a first test on the sample to obtain a first test result, and the second sample detection component 20 can be used to perform a second test on the sample to obtain a second test result.

[0023] Please refer to Figure 1 As shown, after obtaining the first test result, the sample analyzer 10 may send it to the server 30. After obtaining the second test result of the sample, the second sample detection component 20 may send the second test result to the server 30 and / or the sample analyzer 10. The sample analyzer 10 may obtain the second test result from the second sample detection component 20 or the server 30.

[0024] After the sample analyzer 10 obtains the first test result of the sample, the second sample detection component 20 may not have completed the second item test of the sample, that is, the second test result may not be available at this time. After obtaining the first test result, the sample analyzer 10 can wait for a preset time. If the second test result can be obtained within the preset time, the sample analyzer 10 can correct the first test result based on the second test result. If the sample analyzer 10 does not obtain the second test result within the preset time, the preset default correction parameters can be called to correct the first test result to obtain the first corrected result. After the second sample detection component 20 completes the sample detection, the second sample detection component 20 sends the second test result to the server 30, and the server 30 corrects the first test result based on the second test result to obtain the second corrected result. The server 30 can send the second corrected result to the sample analyzer 10 so that the sample analyzer 10 replaces the first corrected result with the second corrected result.

[0025] In the above-mentioned sample detection system 100, it is necessary to correct the first detection result of the sample by the second detection result. After obtaining the first detection result, if the sample analyzer 10 does not obtain the second detection result within the preset time, the sample analyzer 10 corrects the first detection result according to the preset default correction parameters set previously. In this way, on the one hand, it can improve or ensure the timeliness of the report. Some test results have very high timeliness requirements for clinical diagnosis. Doctors cannot wait for a long time. Doctors can use the above-mentioned temporary report to assist in diagnosis of the disease and avoid missing the key diagnosis opportunity. On the other hand, it can reduce the risk of blockage of the sample analyzer 10. A long wait for a sample may cause a backlog of subsequent samples. By correcting it with the preset default correction parameters, the risk of pipeline stagnation of the sample analyzer 10 can be reduced. Even if the second sample detection component 20 temporarily fails, the sample analyzer 10 can still continue to operate normally.

[0026] In the embodiments of the present application, the sample may be a blood sample. The first test item may include, but is not limited to, CRP (C-reactive protein), SAA (serum amyloid A), IL6 (interleukin-6), PCT (procalcitonin), etc. The second test item may be a routine blood test. For example, the CRP test result may be corrected using the HCT (hematocrit) in the routine blood test results. It is understood that in other embodiments, the sample may also be other samples, such as body fluid samples. The first test item and the second test item may be specifically determined based on the type of sample.

[0027] The structure and working process of the sample analyzer 10 and the server 30 in the sample detection system 100 will be described in detail below.

[0028] See also Figure 2 As shown, Figure 2 This is a schematic diagram of a sample analyzer provided in some embodiments of the present application. The sample analyzer 10 includes a first sample detection component 11 and a processing component 12. The first sample detection component 11 can receive a sample and perform a first test on the sample. For example, the first sample detection component 11 can include a sample analyzer for CRP testing.

[0029] The processing component 12 is connected to the first sample detection component 11 . The processing component 12 may be a processor used in conjunction with the host of the first sample detection component 11 and is used for data processing.

[0030] like Figure 3 As shown, Figure 3 1 is a flow chart of an embodiment of a control method for a sample analyzer provided in some embodiments of the present application. Specifically, the processing component 12 can be used to implement the following control method: S11: Obtain a first detection result from a first sample detection component.

[0031] After the first sample detection component 11 completes the first item detection on the sample, a first detection result is obtained. The processing component 12 can obtain the first detection result from the first sample detection component 11 .

[0032] S12: If the second test result of the second item of the sample is not obtained within the preset time, the preset default correction parameter is obtained.

[0033] When the first sample detection component 11 obtains the first detection result, the processing component 12 may query the server 30 for the second detection result of the second item corresponding to the sample. In other embodiments, the processing component 12 may also query the second sample detection component 20 for the second detection result corresponding to the sample. If the processing component 12 does not obtain the second detection result of the sample, it may wait for a preset time. If the processing component 12 still does not obtain the second detection result of the sample within the preset time, it obtains the preset default correction parameters.

[0034] If the processing component 12 obtains the second detection result within the preset time, the first detection result is corrected according to the second detection result to obtain a corrected result.

[0035] Specifically, after obtaining the first detection result, if the processing component 12 finds the second detection result, it will perform a normal correction on the first detection result using the second detection result and a preset correction formula. If the processing component 12 does not find the second detection result, it can wait for a preset time. If the second detection result is obtained within the preset waiting time, it can also directly correct the first detection result based on the second detection result to obtain a corrected result. If the processing component 12 does not obtain the second detection result within the preset time, it cannot correct the first detection result based on the second detection result. In this case, the processing component 12 uses the preset default correction parameters.

[0036] The preset default correction parameter may be the median of a normal range of a pre-set second detection result, so that the difference between the default correction parameter and the actual second detection result is smaller, thereby keeping the correction result within an acceptable error range.

[0037] S13: Correcting the first detection result based on preset default correction parameters to obtain a first corrected result.

[0038] After obtaining the preset default correction parameters, the processing component 12 corrects the first detection result using the preset default correction parameters, thereby obtaining a first corrected result of the first detection result.

[0039] Because the preset default correction parameters have smaller fluctuations than the second test result, the preset default correction parameters are used to correct the first test result, and the resulting first corrected result can provide a reference for doctors to diagnose diseases. Moreover, after correcting the first test result, the sample analyzer 10 can proceed to test the next sample, thereby improving the detection efficiency of the sample analyzer 10.

[0040] S14: After a preset time, a second correction result of the first detection result is received from the external server, wherein the second correction result is obtained by the external server correcting the first detection result according to the second detection result.

[0041] After a preset time, when the second sample detection component 20 completes the second test on the sample, it obtains a second test result. The second sample detection component 20 can send the second test result to the server 30. The server 30 receives the second test result and corrects the first test result based on the second test result to obtain a second corrected result of the first test result. The server 30 sends the obtained second corrected result to the sample analyzer 10.

[0042] According to the embodiment of the present application, the second correction of the first detection result is completed in the server 30 , and therefore, the computing power burden on the sample analyzer 10 is not increased.

[0043] S15: Replace the first correction result based on the second correction result.

[0044] After obtaining the second correction result, the processing component 12 replaces the first correction result with the second correction result, so that the actual correction value is stored in the sample analyzer 10 .

[0045] In the above embodiment, after the sample analyzer 10 completes the first item test on the sample and obtains the first test result, if the sample analyzer 10 fails to obtain the second test result of the sample within the preset time, the first test result is first corrected according to the preset default correction parameters to obtain the first corrected result. After the preset time, when the second sample detection component 20 obtains the second test result, the server 30 corrects the first test result for the second time based on the second test result to obtain the second corrected result. The sample analyzer 10 can obtain the second corrected result from the server 30 to replace the first corrected result. This method can not only reduce the sample backlog of the sample analyzer 10 and improve the detection efficiency of sample analysis. In addition, a temporary correction result can be obtained in time to provide a reference for the doctor's judgment of the disease and avoid patients missing the opportunity for treatment.

[0046] Furthermore, the processing component 12 may also be configured to: after obtaining the first correction result, mark the first correction result; and send the marked first correction result to the external server 30 .

[0047] For example, processing component 12 modifies the CRP and SAA results using the preset default correction parameter, the HCT correction parameter, to obtain a first modified result. Processing component 12 updates the parameter's flag for that item to &, indicating it is not in the unmodified state, and sends the result to server 30. Server 30 can identify the items that need to be updated by marking them, allowing server 30 to modify only specific data rather than performing a full calculation.

[0048] The sample analyzer 10 may further include a scanning component 13, and the processing component 12 is connected to the scanning component 13. The processing component 12 is further used to: obtain the detection mode of the sample through the scanning component; when it is confirmed that the detection mode of the sample is a joint detection mode of the first item detection and the second item detection, execute the step of obtaining the preset default correction parameters if the second detection result of the second item detection of the sample is not obtained within the preset time.

[0049] In some embodiments, the scanning component 13 can scan the barcode of the test tube rack to obtain the type of the test tube rack. The types of test tube racks include: venous whole blood test tube rack, which is used to place venous whole blood samples; micro whole blood test tube rack, which is used to place micro whole blood samples; quality control test tube rack, which is used to place quality control samples, etc. Further, the scanning component 13 scans the barcode of the test tube and determines the sample information through the test tube barcode. The sample information includes the sample type and the test type, etc. The sample type refers to information such as venous whole blood sample, micro whole blood sample, and quality control sample. Identify the test type of the sample, that is, identify whether the current sample is a joint test form. For example, the joint test form must include blood routine items and must include specific protein items. If it is determined that the detection mode of the sample is the above-mentioned joint test mode, the processing component 12 will revise the first test result of the sample through the above-mentioned control method.

[0050] Furthermore, before starting the above control method to perform the correction process, the processing component 12 is also used to confirm whether the sample is an audited sample. If it is an audited sample, the above correction process is not performed. If it is an unaudited sample, the above correction process is entered.

[0051] Reviewed data is usually archived, and frequent revisions can lead to a chaotic historical record. Processing only unreviewed samples can reduce unnecessary calculations and database operations.

[0052] Furthermore, the server 30 and / or the processing component 12 may store sample test data. The processing component 12 is further configured to: if a second test result of a second item of the sample is obtained within a preset time, search the sample test data for the first test result corresponding to the sample from the sample test data of that day; if it is confirmed that the sample test data for the first test result does not exist, search the sample test data within a first preset time period before a first current moment to obtain the first test result corresponding to the sample, wherein the first current moment is the moment when the processing component 12 receives the second test result.

[0053] For example, when the processing component 12 receives the blood test result data for sample A, the sample analyzer 10 can search the sample test data on the server 30 to see if there is test result data for other items of sample A. If not, it is determined that there may be a cross-day situation. In this case, the sample test data within a first preset time period before the first current moment can be searched to obtain the test result data for other items corresponding to the sample. The first current moment can be the moment when the sample analyzer 10 obtains the blood test result.

[0054] If the search spans multiple days, the start date of the associated sample will be calculated forward by a first preset time duration, which will be used as the starting point to search for test results for other items of sample A. For example, if the first preset time duration is 30 minutes and the first current moment of obtaining the second test result is 00:05:00 on August 17, 2023, the start time of the search can be 23:35:00 on August 16, 2023.

[0055] The sample analyzer 10 provided in the above embodiment has a high detection efficiency and can also obtain a temporary correction result in a timely manner, providing a reference for doctors to judge the disease.

[0056] The present application also provides a server 30, which is connected to the second sample detection component 20 and the sample analyzer 10 according to any of the above embodiments. The second sample detection component 20 is configured to perform a second test on the sample to obtain a second test result. The server 30 can be a computer, typically having strong computing capabilities. Compared to the sample analyzer 10, the server 30 is an external server.

[0057] like Figure 4 As shown, Figure 4 This is a flow chart of a server control method provided in some embodiments of the present application. The server 30 can be used to implement the following control method: S41: Obtain a first test result of the sample from the sample analyzer.

[0058] The server 30 may obtain the first detection result of the sample from the sample analyzer 10 .

[0059] S42: After a preset time, a second detection result of the sample is obtained from the second sample detection component.

[0060] For some samples, the second test results are not available within the specified time (preset time). Therefore, the sample analyzer 10 cannot correct the first test results of the sample based on the second test results. After the preset time, when the second sample detection component 20 completes the second test of the sample, the second test results can be sent to the server 30.

[0061] S43: Correcting the first detection result based on the second detection result to obtain a second corrected result.

[0062] After receiving the second detection result, the server 30 corrects the first detection result based on the second detection result, thereby obtaining a second corrected result of the first detection result.

[0063] S44: Send the second correction result to the sample analyzer.

[0064] After obtaining the second correction result, the server 30 may send the second correction result to the sample analyzer 10 .

[0065] In this way, the second correction of the first detection result can be performed in the server 30 , thereby reducing the workload of the sample analyzer 10 and improving the detection efficiency of the sample analyzer 10 .

[0066] Optionally, the server 30 can obtain a marked first correction result from the sample analyzer 10. Based on the mark, the server 30 can confirm that the corresponding sample requires a second correction. If the first correction result received by the server 30 does not carry the mark, the server 30 does not perform the correction operation. If the first correction result received by the server 30 carries the mark, after obtaining the first test result and the second test result of the corresponding sample, the server 30 revise the first test result using the second test result to obtain a second correction result. The marked first correction result is replaced by the second correction result. The revised second correction result is then sent to the sample analyzer 10, so that the sample analyzer 10 updates the correction result.

[0067] Optionally, the server 30 and / or the sample analyzer 10 stores sample detection data, and the server 30 is also used to: if a second detection result of the sample is obtained from the second sample detection component 20, then search for the first detection result corresponding to the sample from the sample detection data of that day; if it is confirmed that the first detection result of the sample does not exist in the sample detection data of that day, then search for the sample detection data within a second preset time period before the second current moment to obtain the first detection result of the sample, wherein the second current moment is the moment when the server 30 receives the second detection result.

[0068] For example, if the server 30 receives the blood test result data of sample A, it can search the sample test data on the server 30 to see if there are test result data for other items of sample A. If not, it is determined that there may be a situation where the data spans multiple days. In this case, the server 30 can search the sample test data within a second preset time period before the second current moment to obtain the test result data for other items corresponding to the sample.

[0069] If there is a situation where the search spans multiple days, the start date of the associated sample is calculated forward by the second preset time as the starting point to search for test results data for other items of sample A. For example, the second preset time can be 30 minutes, and the second current moment when the second test result is obtained is 00:05:00 on August 17, 2023, then the start time of the search is 23:35:00 on August 16, 2023. The above method can effectively solve the situation where the results of two associated test items span multiple days.

[0070] In the above embodiment, the server 30 can integrate the two revised result data and feed it back to the sample analyzer 10, notifying the sample analyzer 10 to update the sample status and project parameter result values. Even for joint inspection projects completed over multiple days, the test results of the same sample can be automatically obtained and revised.

[0071] The server 30 may also communicate with the Laboratory Information System (LIS) to inform the LIS of the second correction result.

[0072] To sum up, during the pipeline scheduling process, if the A test result value of the sample analyzer 10 needs to be corrected by other B test result values, when the sample analyzer 10 cannot obtain the B test result value in time due to the pipeline scheduling strategy, the sample analyzer 10 and the server 30 can cooperate with each other, and the server 30 can perform the final correction function and synchronize the results back to the sample analyzer 10. The above operation is adapted to the process of result correction on the sample analyzer 10. At the same time, it can also reduce the computing power pressure on the sample analyzer 10 to a certain extent.

[0073] The above description is only an implementation method of the present application and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the description and drawings of this application, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A sample analyzer, characterized in that: The sample analyzer is connected to an external server, and the sample analyzer includes: a first sample detection component, configured to receive a sample and perform a first test on the sample to obtain a first test result; a processing component connected to the first sample detection component, the processing component being configured to: Obtaining the first test result from the first sample detection component; If the second test result of the second item test of the sample is not obtained within the preset time, obtaining the preset default correction parameters; Correcting the first detection result based on the preset default correction parameter to obtain a first corrected result; After the preset time, a second revised result of the first detection result is received from the external server, wherein the second revised result is obtained by the external server revising the first detection result according to the second detection result; The first correction result is replaced based on the second correction result.

2. The sample analyzer according to claim 1, wherein: The processing component is further configured to: After obtaining the first correction result, marking the first correction result; The marked first correction result is sent to the external server.

3. The sample analyzer according to any one of claims 1 to 2, characterized in that: The external server and / or the processing component stores sample detection data, and the processing component is further configured to: If the second test result of the second item of the sample is obtained within the preset time, searching the first test result corresponding to the sample from the sample test data of that day; If it is confirmed that the first test result of the sample does not exist in the sample test data of the day, the sample test data within a first preset time period before the first current moment is searched to obtain the first test result of the sample, wherein the first current moment is the moment when the processing component receives the second test result.

4. The sample analyzer according to any one of claims 1 to 2, characterized in that: The processing component is further configured to: The second detection result is obtained within the preset time, and the first detection result is corrected according to the second detection result to obtain a corrected result.

5. The sample analyzer according to any one of claims 1 to 2, characterized in that: The sample analyzer further includes a scanning component, the processing component is connected to the scanning component, and the processing component is further configured to: acquiring a detection mode of the sample by the scanning component; When it is confirmed that the detection mode of the sample is a joint detection mode of the first item detection and the second item detection, the step of obtaining the preset default correction parameters if the second detection result of the second item detection of the sample is not obtained within the preset time is executed.

6. A control method for a sample analyzer, characterized in that: Based on the sample analyzer according to any one of claims 1 to 5, the control method includes: Obtaining a first test result of the sample from the first sample detection component; If the second test result of the second item test of the sample is not obtained within the preset time, obtaining the preset default correction parameters; Correcting the first detection result based on the preset default correction parameter to obtain a first corrected result; After the preset time, a second revised result of the first detection result is received from an external server, wherein the second revised result is obtained by the external server revising the first detection result according to the second detection result; The first correction result is replaced based on the second correction result.

7. A server, characterized in that: The server is connected to a second sample detection component and the sample analyzer according to any one of claims 1 to 5, wherein the second sample detection component is used to perform a second item detection on the sample to obtain a second detection result, and the server is used to: Obtaining a first test result of the sample from the sample analyzer; After a preset time, obtaining a second test result of the sample from the second sample detection component; Correcting the first detection result based on the second detection result to obtain a second corrected result; The second correction result is sent to the sample analyzer.

8. The server according to claim 7, wherein: The server is also used to: obtaining a first corrected result with a label from the sample analyzer; After obtaining the second correction result, the first correction result with the mark is replaced based on the second correction result.

9. The server according to claim 7, wherein: The server and / or the sample analyzer stores sample detection data, and the server is further configured to: If the second test result of the sample is obtained from the second sample detection component, searching for the first test result corresponding to the sample from the sample detection data of the day; If it is confirmed that the first test result of the sample does not exist in the sample test data of the day, the sample test data within a second preset time period before the second current moment is searched to obtain the first test result of the sample, wherein the second current moment is the moment when the server receives the second test result.

10. A sample detection system, characterized in that: The sample detection system comprises: The sample analyzer according to any one of claims 1 to 5; A second sample detection component is used to perform a second item detection on the sample to obtain a second detection result; The server according to any one of claims 7 to 9, wherein the server is connected to the sample analyzer and the second sample detection component.

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