A device for testing overvoltage performance of a chip capacitor

Abstract

The present application relates to capacitor testing device, especially to a kind of chip capacitor overvoltage performance testing device.The purpose of the present application is to provide a kind of chip capacitor overvoltage performance testing device, when current chip capacitor is tested, it is difficult to accurately align the outer electrode of chip capacitor, leading to poor contact or unstable signal, affect test accuracy;At the same time, sequentially carry out multi-step test, operation is complex and time-consuming.A kind of chip capacitor overvoltage performance testing device, including shell, two sides in shell are respectively equipped with one slide rail, and one electric sliding block is slidably arranged on the two slide rails.The present application is sequentially carried out vertical displacement by three drive frames, first conducting rod, second conducting rod and third conducting rod can be accurately contacted with two outer electrodes of chip capacitor, and different test equipment, such as LCR tester, voltage tester and leakage current tester, can be sequentially connected, so as to realize the comprehensive detection of the parameters of chip capacitor.

Description

TECHNICAL FIELD

[0001] The present application relates to a capacitor testing device, in particular to a chip capacitor overvoltage performance testing device. BACKGROUND

[0002] In the production process, the detection of chip capacitors usually adopts the way of sampling inspection, which means that a certain number of samples are randomly selected from batch production for detection, rather than full inspection of each product. This method can significantly reduce detection cost and time while ensuring quality control; the chip capacitors sampled out are detected by LCR tester, voltage tester and leakage current tester, which can comprehensively evaluate the electrical performance, insulation performance and reliability of the chip capacitors, and ensure that they meet the design requirements and work stably in actual application.

[0003] Firstly, the size of chip capacitors is inconsistent and generally small, which makes it difficult to accurately align the two outer electrodes on the chip capacitors when using LCR tester, voltage tester and leakage current tester for testing, resulting in poor contact or unstable test signal, which further affects the accuracy of test results; secondly, multiple steps of testing are required in the detection process, which is complex and time-consuming, not only reducing the detection efficiency, but also easily introducing errors due to human operation mistakes, further affecting the consistency and reliability of the test. SUMMARY

[0004] In order to overcome the current testing of chip capacitors, it is difficult to accurately align the outer electrodes of chip capacitors, resulting in poor contact or unstable signal, affecting the accuracy of the test; at the same time, multiple steps of testing are carried out in sequence, which is complex and time-consuming, reducing the detection efficiency and easily introducing human errors, affecting the consistency and reliability of the test. The purpose of the present application is to provide a chip capacitor overvoltage performance testing device, which can accurately correct and fix chip capacitors of different sizes, ensure stable contact of their outer electrodes with test probes, and then use different detection equipment to test chip capacitors efficiently, significantly improve the detection efficiency, reduce human operation errors, and improve the accuracy and consistency of test results.

[0005] The technical scheme is as follows: a kind of chip capacitor overvoltage performance testing device, including shell, two sides in shell are respectively equipped with one slide rail, one electric sliding block is slidably arranged on the two slide rails, one mounting plate is installed between the two electric sliding blocks, one sliding shell is installed on the top of mounting plate, sliding shell is slidably worn out shell, recess is opened in the top of sliding shell, chip capacitor is placed in the recess in the top of sliding shell, correction mechanism for correcting chip capacitor is arranged on shell and sliding shell, testing mechanism for testing chip capacitor is arranged on shell and sliding shell, driving mechanism is arranged on shell, mounting plate and testing mechanism.

[0006] As a further preferred scheme, the correction mechanism includes sliding plates, a sliding plate is slidably arranged on each of the two opposite sides of the sliding shell, a lead screw is rotatably arranged on the side of each of the two sliding plates away from each other, a gear is installed in the middle of the two lead screws, a fixed nut is installed on the two sides of the sliding shell close to the two sliding plates, the side of each of the two lead screws away from each other is threadedly connected with the two fixed nuts respectively, two movable racks are slidably arranged on the shell, two return springs are connected between the movable racks and the top of the shell, and the two movable racks are located on one side of the two gears respectively.

[0007] As a further preferred scheme, the testing mechanism includes first conductive rods, a first conductive rod, a second conductive rod and a third conductive rod are slidably arranged on the other two sides of the two sliding plates away from each other, a spring seat is installed on each of the two first conductive rods, the two second conductive rods and the two third conductive rods, a transverse spring is connected between each spring seat and the sliding shell, two first conductive plates, two second conductive plates and two third conductive plates are installed on the shell, and the two first conductive rods, the two second conductive rods and the two third conductive rods are in sliding contact with the two first conductive plates, the two second conductive plates and the two third conductive plates respectively.

[0008] As a further preferred scheme, a first conductive rod, a second conductive rod and a third conductive rod form a group of conductive rods, and there are two groups of conductive rods.

[0009] As a further preferred scheme, the driving mechanism includes driving frames, three driving frames are slidably arranged on the mounting plate, six transverse rods are slidably arranged on the sliding shell, a guide wheel is rotatably arranged on the side of each of the six transverse rods away from each other, a bottom wheel is rotatably arranged on the bottom of each driving frame, a bottom plate is installed on the shell, and three trapezoidal blocks are uniformly and spacedly installed on the bottom plate.

[0010] As a further preferred scheme, two inclined surfaces are provided on the upper part of each driving frame, and each guide wheel is in contact with the inclined surface on the upper part of the driving frame.

[0011] As a further preferred scheme, the three trapezoidal blocks are staggered on the base plate, and the three trapezoidal blocks correspond to the three base wheels respectively.

[0012] As a further preferred scheme, the two sliding plates are uniformly and evenly embedded with a plurality of balls on the side close to each other, and the balls are in rolling connection with the sliding plates.

[0013] As a further preferred scheme, the adjusting mechanism is arranged on the sliding shell and the movable rack, and the adjusting mechanism is used for adjusting the distance between the two sliding plates close to each other or away from each other, the adjusting mechanism comprises a contact block, one contact block is arranged on the side away from each other of the two movable racks, two chamfered surfaces are arranged on the contact block, two sliding plates are slidingly arranged on the two sides close to the two fixed nuts of the sliding shell, a roller is rotatably arranged on the bottom of each sliding plate, two threaded rods are threadedly connected to the sliding shell, and the other ends of the two threaded rods are rotatably connected to the two sliding plates respectively.

[0014] The application has the following advantages: 1. The three driving frames are vertically displaced in sequence, the first conductive rod, the second conductive rod and the third conductive rod can respectively realize precise contact with the two external electrodes of the chip capacitor, and this design enables the chip capacitor to be sequentially connected to different test equipment, such as LCR tester, voltage withstand tester and leakage current tester, after being fixed and calibrated, so as to realize comprehensive detection of key parameters such as capacitance value, insulation resistance, voltage withstand performance and leakage current, which not only significantly improves the detection efficiency, but also reduces human error through automatic operation, and ensures the accuracy and consistency of the test results.

[0015] 2. The two groups of conductive rods are moved towards each other, which can push the chip capacitor to displace, and the ball guide mechanism is used for precise positioning of the chip capacitor, so that the chip capacitor is always in the centered state during the test process, so that the first conductive rod, the second conductive rod and the third conductive rod can realize close and stable contact with the external electrodes on both sides of the chip capacitor, and through this high-reliability contact mode, the chip capacitor can be sequentially connected to LCR tester, voltage withstand tester and leakage current tester, etc. to quickly complete the detection of key parameters such as capacitance value, insulation resistance, voltage withstand performance and leakage current, which significantly improves the detection efficiency, reduces manual intervention, and further improves the consistency and repeatability of the test through high-precision guidance and contact design, which provides reliable guarantee for production quality control.

[0016] 3、When the size of the chip capacitor is inconsistent, the operator can drive the two high-precision threaded rods to rotate forward and backward by the inner hexagonal wrench. When the threaded rod rotates forward, it drives the sliding plate and the roller to move along the guide rail away from the fixed nut, thereby adjusting the contact time of the roller and the contact block, dynamically adjusting the distance between the sliding plates to adapt to chip capacitors of different sizes. This adjustable structure significantly improves the application range of the device, compatible with the detection needs of chip capacitors of various specifications, enhances the versatility and flexibility of the equipment, and at the same time, the adjustment mechanism is easy to operate, ensuring that chip capacitors of different sizes remain stable in position and contact state during detection, avoiding test errors caused by size differences, and greatly reducing equipment replacement or adjustment time, improving detection efficiency, and providing reliable protection for rapid and accurate detection of chip capacitors of various specifications. BRIEF DESCRIPTION OF DRAWINGS

[0017] Figure 1 It is a schematic diagram of the three-dimensional structure of the present application.

[0018] Figure 2 It is a schematic diagram of the cross-sectional three-dimensional structure of the present application.

[0019] Figure 3 It is a schematic diagram of the three-dimensional structure of the test mechanism and the driving mechanism of the present application.

[0020] Figure 4 It is a schematic diagram of the three-dimensional structure of the correction mechanism of the present application.

[0021] Figure 5 It is a schematic diagram of the three-dimensional structure of the test mechanism of the present application.

[0022] Figure 6 It is a schematic diagram of the cross-sectional three-dimensional structure of the test mechanism and the driving mechanism of the present application.

[0023] Figure 7 It is a schematic diagram of the three-dimensional structure of the driving mechanism of the present application.

[0024] Figure 8 It is a schematic diagram of the three-dimensional structure of the first conductive rod, the second conductive rod, the third conductive rod and the driving mechanism of the present application.

[0025] Figure 9 It is a schematic diagram of the exploded three-dimensional structure of the parts of the correction mechanism of the present application.

[0026] Figure 10 It is a schematic diagram of the exploded three-dimensional structure of the parts of the sliding rail, the electric sliding block, the mounting plate and the test mechanism of the present application.

[0027] Figure 11 It is a schematic diagram of the exploded three-dimensional structure of the parts of the driving mechanism of the present application.

[0028] Figure 12 It is a schematic diagram of the three-dimensional structure of the correction mechanism and the adjustment mechanism of the present application.

[0029] Figure 13 This is a three-dimensional structural diagram of some parts of the testing mechanism of the present invention.

[0030] Figure 14 This is a cross-sectional three-dimensional structural diagram of the correction mechanism and adjustment mechanism of the present invention.

[0031] Figure 15 This is a three-dimensional structural diagram of the sliding shell and the correction mechanism of the present invention.

[0032] Figure 16 This is a three-dimensional structural diagram of some parts of the adjustment mechanism of the present invention.

[0033] Wherein: 1-outer shell, 2-slide rail, 3-electric slider, 4-mounting plate, 5-sliding shell, 51-plate capacitor, 61-sliding plate, 62-lead screw, 63-gear, 64-fixed nut, 65-moving rack, 66-reset spring, 60-ball bearing, 711-first conductive rod, 712-second conductive rod, 713-third conductive rod, 74-spring seat, 75-horizontal spring, 761-first conductive plate, 762-second conductive plate, 763-third conductive plate, 81-drive frame, 82-crossbar, 83-guide wheel, 84-bottom wheel, 85-bottom plate, 86-trapezoidal block, 9-adjustment mechanism, 91-contact block, 92-slide plate, 93-roller, 94-threaded rod. Detailed Implementation

[0034] The technical solution will be further described below with reference to specific embodiments. It should be noted that the terms "up," "down," "left," and "right" used herein refer only to the position of the illustrated structure in the corresponding drawings. The component numbers used herein, such as "first," "second," etc., are merely for distinguishing the described objects and have no sequential or technical meaning. Furthermore, terms such as "connection" and "linkage," unless otherwise specified, include both direct and indirect connections.

[0035] Example 1: A device for testing the overcurrent performance of a surface-mount capacitor, such as... Figures 1-15 As shown, the device includes a housing 1. Two slide rails 2 are bolted to the inner sides of the housing 1. An electric slider 3 is slidably mounted on each of the two slide rails 2, sliding horizontally along the slide rails 2. A mounting plate 4 is bolted between the two electric sliders 3. A sliding shell 5 is mounted on the top of the mounting plate 4, sliding out of the housing 1. A groove is formed on the top of the sliding shell 5, and a chip capacitor 51 is placed within the groove. A correction mechanism for correcting the chip capacitor 51 is provided on the housing 1 and the sliding shell 5. A testing mechanism for testing the chip capacitor 51 is also provided on the housing 1 and the sliding shell 5. A drive mechanism is provided on the housing 1, the mounting plate 4, and the testing mechanism.

[0036] The correcting mechanism comprises sliding plates 61, two opposite sides of the sliding shell 5 are slidably provided with sliding plates 61 for correcting the chip capacitors 51, the sides away from each other of the two sliding plates 61 are rotatably provided with a lead screw 62, the middle parts of the two lead screws 62 are provided with a gear 63, the two sides of the sliding shell 5 close to the two sliding plates 61 are provided with a fixed nut 64, the sides away from each other of the two lead screws 62 are respectively connected with the two fixed nuts 64 through threads, the outer shell 1 is slidably provided with two movable racks 65, the movable racks 65 are connected with the inner top of the outer shell 1 through two return springs 66, the two movable racks 65 are respectively located on one side of the two gears 63, and the gears 63 are engaged with the movable racks 65 after moving.

[0037] The testing mechanism comprises first conductive rods 711, the other sides away from each other of the two sliding plates 61 are slidably provided with a first conductive rod 711, a second conductive rod 712 and a third conductive rod 713, the two first conductive rods 711, the two second conductive rods 712 and the two third conductive rods 713 are provided with a spring seat 74, each spring seat 74 is connected with the sliding shell 5 through a transverse spring 75, the outer shell 1 is provided with two first conductive plates 761, two second conductive plates 762 and two third conductive plates 763, and the two first conductive rods 711, the two second conductive rods 712 and the two third conductive rods 713 are respectively in sliding contact with the two first conductive plates 761, the two second conductive plates 762 and the two third conductive plates 763.

[0038] The first conductive rod 711, the second conductive rod 712 and the third conductive rod 713 form a group of conductive rods, and there are two groups of conductive rods in total.

[0039] The driving mechanism comprises driving frames 81, the mounting plate 4 is slidably provided with three driving frames 81, the sliding shell 5 is slidably provided with six transverse rods 82, the sides away from each other of the six transverse rods 82 are rotatably provided with a guide wheel 83, the bottom of each driving frame 81 is rotatably provided with a bottom wheel 84, the outer shell 1 is provided with a bottom plate 85, and the bottom plate 85 is uniformly and interval provided with three trapezoidal blocks 86.

[0040] The upper part of each driving frame 81 is provided with two inclined surfaces, and each guide wheel 83 is in contact with the inclined surfaces of the upper part of the driving frame 81.

[0041] The three trapezoidal blocks 86 are staggered on the bottom plate 85, and the three trapezoidal blocks 86 correspond to the three bottom wheels 84 respectively.

[0042] The two sides close to each other of the two sliding plates 61 are uniformly and interval embedded with a plurality of balls 60, and the balls 60 are in rolling connection with the sliding plates 61.

[0043] When detecting the chip capacitor 51, the operator connects two wires on two different test devices to the first conductive plates 761 and the third conductive plates 763 on different sides in sequence, connects the two wires on another test device to the two second conductive plates 762, places the chip capacitor 51 in the groove on the sliding shell 5, and places two sides of the chip capacitor 51 between the two sliding plates 61, places the two external electrodes on the chip capacitor 51 between the two groups of conductive rods, controls the two motorized sliders 3 to move along the two slide rails 2, and drives the mounting plate 4, the sliding shell 5, the chip capacitor 51, the two sliding plates 61, the two lead screws 62, the two gears 63, the two fixed nuts 64, the two first conductive rods 711, the two second conductive rods 712, the two third conductive rods 713, the six spring seats 74, the six cross springs 75, the three drive frames 81, the six cross rods 82, the six guide wheels 83, and the three bottom wheels 84 to move. The two first conductive rods 711, the two second conductive rods 712, and the two third conductive rods 713 slide along the two first conductive plates 761, the two second conductive plates 762, and the two third conductive plates 763. After the two gears 63 engage with the two movable racks 65, the two gears 63 drive the two lead screws 62 to rotate. Under the action of the two fixed nuts 64, the two lead screws 62 rotate and move towards each other. The two lead screws 62 drive the two sliding plates 61 and the two sides of the ball bearings 60 to move towards each other. The two sides of the ball bearings 60 push the chip capacitor 51 to move. The two sliding plates 61 contact two sides of the chip capacitor 51. After the two sides of the ball bearings 60 correct and fix the chip capacitor 51, the two gears 63 disengage from the two movable racks 65. Initially, the six cross springs 75 are in a stretched state. The movement of the three bottom wheels 84 will sequentially contact and separate from the three trapezoidal blocks 86. The three drive frames 81 will sequentially move up and down. When the chamfered surfaces on the two sides of the two drive frames 81 sequentially move upwards, under the action of the two cross springs 75 on the sides, the two cross rods 82 and the two guide wheels 83 on the sides will sequentially move towards each other. The two cross rods 82 on the sides will sequentially drive the first conductive plates 761 and the third conductive plates 763 on different sides to move towards each other. When the chamfered surface on the middle drive frame 81 moves upwards, under the action of the two cross springs 75 in the middle, the two cross rods 82 in the middle and the two guide wheels 83 in the middle will move towards each other. The two cross rods 82 in the middle will drive the two second conductive rods 712 to move towards each other.The first conductive rod 711, the second conductive rod 712 and the third conductive rod 713 can be in precise contact with the two external electrodes of the chip capacitor 51 by the vertical displacement of the three driving frames 81 in turn. After the chip capacitor 51 is fixed and calibrated, it can be connected to different test equipment such as LCR tester, voltage withstand tester and leakage current tester in turn, so as to realize comprehensive detection of key parameters such as capacitance value, insulation resistance, voltage withstand performance and leakage current. This design not only significantly improves the detection efficiency, but also reduces human error through automatic operation, ensuring the accuracy and consistency of test results. When the chamfered surfaces on the three driving frames 81 move downward in turn, the horizontal rods 82 drive the first conductive rod 711, the second conductive rod 712 and the third conductive rod 713 to move and reset in turn under the action of the horizontal springs 75. By moving the two groups of conductive rods towards each other, the chip capacitor 51 can be pushed to move. At the same time, the ball 60 guide mechanism is used to precisely position the chip capacitor 51, ensuring that it is always in the centered state during the test process. The first conductive rod 711, the second conductive rod 712 and the third conductive rod 713 can realize close and stable contact with the external electrodes on both sides of the chip capacitor 51. Through this high-reliability contact method, the chip capacitor 51 can be connected to LCR tester, voltage withstand tester and leakage current tester in turn to quickly complete the detection of key parameters such as capacitance value, insulation resistance, voltage withstand performance and leakage current. This scheme significantly improves the detection efficiency and reduces manual intervention. At the same time, through high-precision guidance and contact design, the consistency and repeatability of the test are further improved, providing reliable guarantee for production quality control. After the test of the chip capacitor 51 is completed, the operator controls the two electric sliding blocks 3 to move reversely along the two sliding rails 2. The two electric sliding blocks 3 drive the mounting plate 4, the sliding shell 5, the chip capacitor 51, the two sliding plates 61, the two lead screws 62, the two gears 63, the two fixed nuts 64, the two first conductive rods 711, the two second conductive rods 712, the two third conductive rods 713, the six spring seats 74, the six horizontal springs 75, the three driving frames 81, the six horizontal rods 82, the six guide wheels 83 and the three bottom wheels 84 to move reversely and reset.

[0044] In the embodiment 1, the first conductive rod 711, the second conductive rod 712 and the third conductive rod 713 are respectively connected to the two external electrodes of the chip capacitor 51 through the two groups of conductive rods, and the chip capacitor 51 can be connected to different test equipment such as LCR tester, voltage withstand tester and leakage current tester in turn, so as to realize comprehensive detection of key parameters such as capacitance value, insulation resistance, voltage withstand performance and leakage current. This design not only significantly improves the detection efficiency, but also reduces human error through automatic operation, ensuring the accuracy and consistency of test results. Figures 12-16As shown, the adjusting mechanism 9 is arranged on the sliding shell 5 and the movable rack 65, and is used to adjust the distance between the two sliding plates 61, the adjusting mechanism 9 comprises a contact block 91, and the two movable racks 65 are provided with the contact block 91 on the side away from each other, the contact block 91 is provided with two chamfered surfaces, and the sliding shell 5 is slidably provided with a sliding plate 92 on the two sides close to the two fixed nuts 64, and the bottom of the two sliding plates 92 is rotatably provided with a roller 93, and the sliding shell 5 is threadedly connected with two threaded rods 94, and the other end of the two threaded rods 94 is rotatably connected with the two sliding plates 92 respectively.

[0045] When the size of the chip capacitor 51 is inconsistent, the operator can drive the two threaded rods 94 to rotate forward and backward through the internal hexagonal wrench; when the threaded rod 94 rotates forward, the two threaded rods 94 synchronously drive the two sliding plates 92 and the rollers 93 mounted thereon to move along the guide rail away from the fixed nut 64, and when the threaded rod 94 reverses, the two threaded rods 94 synchronously drive the two sliding plates 92 and the rollers 93 mounted thereon to move along the guide rail to the direction close to the fixed nut 64; this design can adjust the contact timing between the two rollers 93 and the contact block 91, thereby dynamically adjusting the distance between the two sliding plates 61, so that it can flexibly adapt to chip capacitors 51 of different sizes; through this adjustable structure, the device significantly improves the application range, can adapt to the detection needs of chip capacitors 51 of various specifications, and enhances the versatility and flexibility of the equipment; at the same time, the adjusting mechanism 9 is easy to operate, and can ensure that chip capacitors 51 of different sizes always maintain stable alignment and contact state during the detection process, effectively avoiding test errors caused by size difference; in addition, the adjusting mechanism 9 also greatly reduces the time of equipment replacement or adjustment, further improves the detection efficiency, and provides reliable protection for the rapid and accurate detection of multi-specification chip capacitors 51.

[0046] The above is only a specific embodiment of the present application, but the protection scope of the present application is not limited thereto, any person skilled in the art can easily think of changes or replacements within the technical range disclosed by the present application, which should be covered within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A device for testing the overvoltage performance of a chip capacitor, characterized by: The utility model provides a chip capacitor testing device, including the shell (1), two sides are equipped with a slide rail (2) respectively in the shell (1), two slide rails (2) all are slidably equipped with an electric slide (3), install a mounting plate (4) between two electric slides (3), the top of mounting plate (4) is equipped with a slide shell (5), the slide shell (5) slidably passes out the shell (1), the top recess of slide shell (5) places a chip capacitor (51), the shell (1) and slide shell (5) are equipped with a correction mechanism for correcting chip capacitor (51), the shell (1) and slide shell (5) are equipped with a test mechanism for testing chip capacitor (51), the shell (1), mounting plate (4) and test mechanism are equipped with drive mechanism, The correction mechanism includes sliding plate (61), two opposite sides on the slide shell (5) are slidably equipped with a sliding plate (61), the side of mutual separation of two sliding plates (61) is rotatably equipped with a lead screw (62), the middle of two lead screws (62) is equipped with a gear (63), the two sides of slide shell (5) close to two sliding plates (61) are equipped with a fixed nut (64), the side of mutual separation of two lead screws (62) is respectively connected with two fixed nuts (64) through screw thread, the shell (1) is slidably equipped with two movable racks (65), two movable racks (65) are connected with two return springs (66) between the top of shell (1), two movable racks (65) are located on the side of two gears (63) respectively, The test mechanism includes first conducting rod (711), two sliding plates (61) are slidably equipped with a first conducting rod (711), a second conducting rod (712) and a third conducting rod (713) on the other two sides of mutual separation, two first conducting rods (711), two second conducting rods (712) and two third conducting rods (713) are equipped with a spring seat (74), each spring seat (74) is connected with a horizontal spring (75) between the slide shell (5), the shell (1) is equipped with two first conducting plates (761), two second conducting plates (762) and two third conducting plates (763), two first conducting rods (711), two second conducting rods (712) and two third conducting rods (713) are respectively slidably contacted with two first conducting plates (761), two second conducting plates (762) and two third conducting plates (763).

2. The chip capacitor overvoltage performance testing device according to claim 1, wherein: A first conducting rod (711), a second conducting rod (712) and a third conducting rod (713) are a group of conducting rods, and there are two groups of conducting rods.

3. The chip capacitor overvoltage performance testing device of claim 1, wherein: The driving mechanism comprises driving frames (81), three driving frames (81) are slidingly arranged on the mounting plate (4), six horizontal rods (82) are slidingly arranged on the sliding shell (5), one guide wheel (83) is rotatably arranged on the side of each horizontal rod (82) away from the other, one bottom wheel (84) is rotatably arranged on the bottom of each driving frame (81), one bottom plate (85) is arranged on the shell (1), and three trapezoidal blocks (86) are uniformly and interval arranged on the bottom plate (85).

4. The chip capacitor overvoltage performance testing device of claim 3, wherein: Two inclined surfaces are arranged on the upper portion of each driving frame (81), and each guide wheel (83) is in contact with the inclined surface on the upper portion of the driving frame (81).

5. The chip capacitor overvoltage performance testing device of claim 3, wherein: The three trapezoidal blocks (86) are staggered on the bottom plate (85), and the three trapezoidal blocks (86) correspond to the three bottom wheels (84) respectively.

6. The chip capacitor overvoltage performance testing device of claim 1, wherein: The ball (60) is embedded on the side of each sliding plate (61) away from the other, and the ball (60) is in rolling connection with the sliding plate (61).

7. The chip capacitor overvoltage performance testing device of claim 3, wherein: The adjusting mechanism (9) is arranged on the sliding shell (5) and the movable rack (65), the adjusting mechanism (9) is used for adjusting the distance between the two sliding plates (61) away from or close to each other, the adjusting mechanism (9) comprises a contact block (91), one contact block (91) is arranged on the side of each movable rack (65) away from the other, two chamfered surfaces are arranged on the contact block (91), one sliding plate (92) is slidingly arranged on the side of the sliding shell (5) close to the two fixed nuts (64), one roller (93) is rotatably arranged on the bottom of each sliding plate (92), two threaded rods (94) are threadedly connected on the sliding shell (5), and the other ends of the two threaded rods (94) are rotatably connected with the two sliding plates (92) respectively.

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