A flashlight circuit testing tool

Abstract

A flashlight circuit testing fixture includes: a fixed platform with guide posts; a floating platform slidably connected to the guide posts vertically, with a first spring between the floating platform and the fixed platform; a pressing assembly including a lifting drive, a pressure plate, a pressure rod, and a detection rod, the pressure plate being located above the floating platform, the pressure plate having a second spring, the upper end of the pressure rod being connected to the second spring and the lower end extending below the pressure plate, the detection rod being connected to the pressure plate and having a probe extending below the pressure plate; and a detector having a set of reverse contact points and a set of signal contacts facing the floating platform. This solution utilizes the height difference between the lower end of the pressure rod and the probe to integrate reverse connection testing and signal testing into a single fixture, completing both tests with a single pressing action. This effectively solves the fundamental problem of low efficiency caused by the need for two separate testing devices in existing technologies.

Description

Technical Field

[0001] This invention relates to the technical field of circuit testing fixtures, and more specifically to a flashlight circuit testing fixture. Background Technology

[0002] The main structure of a flashlight includes a housing and a lamp wick, a battery wick, and a circuit board located inside the housing. The circuit board has power terminals and signal terminals. The power terminals are electrically connected to the battery wick to provide power, while the signal terminals are used to control whether the lamp wick and the battery wick are connected, thus enabling the flashlight to be switched on and off.

[0003] To prevent the circuit board from being burned out by reverse current when the battery cells are installed backwards, reverse connection protection components are usually installed inside the circuit board. Additionally, the circuit board typically undergoes specific testing before leaving the factory. There are two main types of testing: one is a reverse connection test to check if the circuit board will burn out when the battery cells are installed backwards, and the other is a signal test to check if the signal terminals on the circuit board can output signals when the battery cells are supplying power normally. Currently, these two tests require two separate testing devices, resulting in low efficiency and hindering production efficiency. Summary of the Invention

[0004] The purpose of this invention is to solve the problem that in the prior art, two tests for flashlights need to be performed by two separate testing institutions, resulting in low efficiency and restricting production efficiency.

[0005] To address the above problems, the present invention provides a flashlight circuit testing fixture, comprising:

[0006] The fixed platform is equipped with guide posts along the vertical direction;

[0007] A floating platform is spaced above the fixed platform and slidably connected to the guide column in a vertical direction. A first spring in a vertical direction is provided between the floating platform and the fixed platform. The upper side of the floating platform is used to fix the test piece.

[0008] A pressing assembly includes a lifting drive, a pressure plate, a pressure rod, and a detection rod. The pressure plate is located above a floating platform and is lifted and lowered by the lifting drive. The pressure plate is provided with a second spring along the vertical direction. The upper end of the pressure rod is connected to the second spring and the lower end extends below the pressure plate. The detection rod is connected to the pressure plate and has a probe extending below the pressure plate. The probe is made of conductive material and is higher than the lower end of the pressure rod.

[0009] The detector is located to the side of the floating platform. The detector is equipped with a set of anti-contact points and a set of signal contacts facing the floating platform. The set of anti-contact points is located above the set of signal contacts. When the lifting drive moves the pressure plate down, the pressure rod pushes the floating platform down so that the test piece first makes contact with the set of anti-contact points, and at this time the probe and the test piece are not in contact. When the lifting drive continues to move the pressure plate down until the probe and the test piece are in contact, the test piece disengages from the set of anti-contact points and makes contact with the set of signal contacts.

[0010] In the above scheme, the reverse contact point group and the signal contact point group are configured to correspond to reverse connection test and signal test, respectively. Utilizing the height difference between the lower end of the pressure rod and the probe, when the lifting drive component drives the pressure plate to descend, the pressure rod pushes the floating platform to descend, causing the test piece to first connect with the reverse contact point group to achieve reverse connection test. At this time, the probe and the test piece are not in contact. When the lifting drive component continues to drive the pressure plate to descend until the probe and the test piece are in contact, the probe connects the corresponding circuit of the test piece, and at the same time, the test piece disengages from the reverse contact point group and connects with the signal contact point group to achieve signal test.

[0011] Compared with existing technologies, the advantages of the above solution include:

[0012] 1. Improved testing efficiency: By integrating reverse connection testing and signal testing into one fixture, both tests can be completed in a single crimping action, effectively solving the fundamental problem of low efficiency caused by the need for two separate testing devices in existing technologies;

[0013] 2. Simplified operation process: Operators only need to clamp the test piece once and start the crimping action once to obtain two test results. The operation is simple and reduces labor costs and error rate.

[0014] 3. Saves space and cost: Integrating two testing functions into one device saves space, production costs, and maintenance costs compared to two separate devices.

[0015] In an improved embodiment, the reverse contact group includes a pair of power supply terminals with positive and negative poles opposite to those of the device under test (DUT), and the signal contact group includes a pair of power supply terminals with positive and negative poles corresponding to those of the DUT and at least one detection terminal. The detection terminal is used to receive an output signal when the probe contacts the DUT, causing the corresponding circuit of the DUT to be connected, thereby enabling the reverse contact group to perform reverse connection testing and the signal contact group to perform signal testing.

[0016] In an improved embodiment, the pressure plate is provided with an adjusting screw hole that runs vertically through the plate, and the detection rod is provided with an external thread and screwed into the adjusting screw hole. Thus, the height of the detection rod relative to the pressure plate can be adjusted by rotating the detection rod, thereby precisely controlling the height difference between the probe and the lower end of the pressure rod, and making it compatible with circuit boards of different models / thicknesses.

[0017] In an improved embodiment, the pressure plate has an upward-facing mounting hole on its lower side. The second spring is mounted on the upper part of the mounting hole, and the upper end of the second spring is connected to the pressure plate. The upper end of the pressure rod is slidably inserted into the lower part of the mounting hole, and the upper end of the pressure rod is connected to the second spring. Thus, when the pressure rod abuts against the floating platform and is subjected to pressure, the second spring gradually compresses, and the upper end of the pressure rod gradually retracts into the mounting hole, ensuring the stability of the pressure rod when it moves relative to the pressure plate.

[0018] In an improved design, the lower end of the pressure bar is tapered to avoid interference with the test piece.

[0019] In an improved embodiment, there are at least two guide pillars spaced apart, and the floating platform has sliding holes for sliding engagement with the guide pillars, thereby ensuring the stability of the floating platform when moving up and down.

[0020] In an improved embodiment, the number of the first springs corresponds to the number of guide posts, and the first springs are fitted onto the guide posts one by one, thereby ensuring that the first springs can apply a stable elastic force to the floating platform.

[0021] In an improved embodiment, the floating stage is provided with a positioning groove for fixing the test piece, thereby ensuring the positional accuracy and stability of the test piece on the floating stage.

[0022] In an improved embodiment, the fixed platform is provided with a bracket and the bracket has a receiving portion extending above the floating platform. The lifting drive is installed on the receiving portion of the bracket and the output end of the lifting drive is set downward. The pressure plate is connected to the output end of the lifting drive, thereby making the layout reasonable and ensuring the lifting drive's lifting and lowering effect on the pressure plate. Attached Figure Description

[0023] Figure 1 A schematic diagram of an overall fixture for testing flashlight circuits;

[0024] Figure 2 This is a left-side schematic diagram of a flashlight circuit testing fixture;

[0025] Figure 3 This is a top view schematic diagram of a flashlight circuit testing fixture;

[0026] Figure 4 for Figure 3Cross-sectional view of section AA in the middle;

[0027] Figure 5 for Figure 3 sectional view of the BB section line;

[0028] Figure 6 This is a schematic diagram of a detector for a flashlight circuit testing fixture.

[0029] Explanation of reference numerals in the attached figures.

[0030] 1. Fixed platform; 11. Guide post; 12. First spring; 13. Bracket; 2. Floating platform; 21. Sliding hole; 22. Positioning groove; 3. Lifting drive component; 4. Pressure plate; 41. Second spring; 42. Adjusting screw hole; 43. Mounting hole; 5. Pressure rod; 6. Detection rod; 61. Probe; 7. Detector; 71. Anti-contact point group; 72. Signal contact point group. Detailed Implementation

[0031] It should be understood by those skilled in the art that the following embodiments are merely illustrative of the technical principles of the embodiments of this application and are not intended to limit the scope of protection of the embodiments of this application. Those skilled in the art can make adjustments as needed to adapt to specific application scenarios.

[0032] In the following description of the embodiments, it should be noted that, unless otherwise explicitly specified and limited, the terms "connected" and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in the embodiments of this application based on the specific circumstances.

[0033] In the embodiments of this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0034] The present application will now be described in further detail with reference to the accompanying drawings and specific embodiments.

[0035] Please see Figures 1-6 An embodiment of the present invention provides a flashlight circuit testing fixture, comprising:

[0036] The fixed platform 1 is provided with a vertical guide post 11;

[0037] A floating stage 2 is spaced above the fixed stage 1 and is slidably connected to the guide post 11 in a vertical direction. A first spring 12 in a vertical direction is provided between the floating stage 2 and the fixed stage 1. The upper side of the floating stage 2 is used to fix the part to be tested.

[0038] The pressing assembly includes a lifting drive 3, a pressure plate 4, a pressure rod 5, and a detection rod 6. The pressure plate 4 is located above the floating platform 2 and is driven to move up and down by the lifting drive 3. The pressure plate 4 is provided with a second spring 41 along the vertical direction. The upper end of the pressure rod 5 is connected to the second spring 41 and the lower end extends to the bottom of the pressure plate 4. The detection rod 6 is connected to the pressure plate 4 and has a probe 61 extending to the bottom of the pressure plate 4. The probe 61 is made of conductive material and is higher than the lower end of the pressure rod 5.

[0039] The detector 7 is located to the side of the floating platform 2. The detector 7 is provided with a reverse contact point group 71 and a signal contact group 72 facing the floating platform 2. The reverse contact point group 71 is located above the signal contact group 72. When the lifting drive 3 drives the pressure plate 4 to descend, the pressure rod 5 pushes the floating platform 2 to descend, so that the test piece first conducts with the reverse contact point group 71, and at this time the probe 61 is not in contact with the test piece. When the lifting drive 3 continues to drive the pressure plate 4 to descend until the probe 61 is in contact with the test piece, the test piece disengages from the reverse contact point group 71 and conducts with the signal contact group 72.

[0040] In the specific embodiment, the device under test is the circuit board to be tested. The circuit board is fixed to the upper side of the floating stage 2 with the power terminals and signal terminals facing the detector 7. The reverse contact group 71 and the signal contact group 72 are configured to correspond to reverse connection test and signal test, respectively. In the initial state, the floating stage 2 is relatively far from the fixed stage 1 due to the elastic support of the first spring 12. The lower end of the pressure rod 5 is lower than the probe 61, and the second spring 41 is in the extended state. When the lifting drive 3 drives the pressure plate 4 to descend, the pressure rod 5 pushes the floating stage 2 to descend. At this time, the first spring 12 and the second spring 41 are compressed synchronously. As the floating stage 2 descends, the test piece first connects with the anti-contact point group 71 to achieve reverse connection testing. At this time, the probe 61 and the test piece are still not in contact. When the lifting drive 3 continues to drive the pressure plate 4 to descend, the second spring 41 continues to compress, causing the height difference between the probe 61 and the lower end of the pressure rod 5 to continuously decrease until the probe 61 and the test piece are in contact. The probe 61 connects the corresponding circuit of the test piece. At the same time, the descent of the floating stage 2 causes the first spring 12 to continue to compress, causing the test piece to separate from the anti-contact point group 71 and connect with the signal contact group 72 to achieve signal testing.

[0041] Compared with existing technologies, the advantages of the above solution include:

[0042] 1. Improved testing efficiency: By integrating reverse connection testing and signal testing into one fixture, both tests can be completed in a single crimping action, effectively solving the fundamental problem of low efficiency caused by the need for two separate testing devices in existing technologies;

[0043] 2. Simplified operation process: Operators only need to clamp the test piece once and start the crimping action once to obtain two test results. The operation is simple and reduces labor costs and error rate.

[0044] 3. Saves space and cost: Integrating two testing functions into one device saves space, production costs, and maintenance costs compared to two separate devices.

[0045] Combination Figure 6 As shown, specifically in this embodiment, the reverse contact group 71 includes a pair of power supply terminals with positive and negative poles opposite to those of the device under test (DUT), thereby enabling reverse connection testing; the signal contact group 72 includes a pair of power supply terminals with positive and negative poles corresponding to those of the DUT and at least one detection terminal. The detection terminal is used to receive the output signal when the probe 61 contacts the DUT, causing the corresponding line of the DUT to conduct, thereby enabling signal testing. Of course, depending on the testing requirements, both the reverse contact group 71 and the signal contact group 72 can be replaced with other types of terminals, and this design does not limit this.

[0046] In this embodiment, the pressure plate 4 is provided with an adjustment screw hole 42 that runs vertically through it, and the detection rod 6 is provided with an external thread and screwed into the adjustment screw hole 42. Thus, by rotating the detection rod 6, the height of the detection rod 6 relative to the pressure plate 4 can be adjusted, and the height difference between the probe 61 and the lower end of the pressure rod 5 can be precisely controlled, making it compatible with different models / thicknesses of circuit boards to be tested.

[0047] Combination Figure 4 As shown, in this embodiment, the lower side of the pressure plate 4 is provided with an upwardly opening mounting hole 43. The second spring 41 is installed in the upper part of the mounting hole 43, and the upper end of the second spring 41 is connected to the upper side of the pressure plate 4. The upper end of the pressure rod 5 is slidably inserted into the lower part of the mounting hole 43, and the upper end of the pressure rod 5 is connected to the second spring 41. Thus, when the pressure rod 5 abuts against the floating platform 2 and is subjected to pressure, the second spring 41 is gradually compressed, and the upper end of the pressure rod 5 gradually retracts into the mounting hole 43, ensuring the stability of the pressure rod 5 when it moves relative to the pressure plate 4. The lower end of the pressure rod 5 is preferably tapered to avoid interference with the test piece.

[0048] There are at least two guide pillars 11, which are spaced apart. The floating platform 2 has sliding holes 21 for sliding engagement with the guide pillars 11, thereby ensuring the stability of the floating platform 2 when it moves up and down. In this embodiment, there are four guide pillars 11, which are distributed at the four corners of a rectangle. The four corners of the floating platform 2 are respectively provided with sliding holes 21, and the four sliders slide into the four guide pillars 11 one by one.

[0049] In this embodiment, the number of first springs 12 corresponds to the number of guide posts 11. The first springs 12 are sleeved on the guide posts 11 one by one. The upper end of the first spring 12 abuts against the floating platform 2 and the lower end abuts against the fixed platform 1, thereby ensuring that the first spring 12 can apply a stable elastic force to the floating platform 2.

[0050] In this embodiment, the floating stage 2 has a positioning groove 22 for fixing the test piece, thereby ensuring the accuracy and stability of the test piece's position on the floating stage 2. The specific shape of the positioning groove 22 can be designed according to the test piece, and this design does not limit it.

[0051] In this embodiment, the fixed platform 1 is provided with a bracket 13 and the bracket 13 has a receiving part extending above the floating platform 2. The lifting drive 3 is preferably a cylinder and is installed on the receiving part of the bracket 13. The output end of the lifting drive 3 is set downward, and the pressure plate 4 is connected to the output end of the lifting drive 3, so that the layout is reasonable and the lifting drive 3 drives the pressure plate 4 to lift.

[0052] It should be noted that in the description of this application, the terms "inner" and "outer," etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings. This is only for the convenience of description and does not indicate or imply that the device or component must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation of this application. All directional indications (such as up, down, left, right, front, back, inner, and outer) are only used to explain the relative positional relationships and movement between components in a specific posture. If the specific posture changes, the directional indication will also change accordingly.

[0053] In the description of this application, the references to terms such as "an embodiment," "some embodiments," "in this embodiment," "specific example," or "some examples," etc., refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in a suitable manner in any one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0054] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A flashlight circuit testing fixture, characterized in that, include: The fixed platform is equipped with guide posts along the vertical direction; A floating platform is spaced above the fixed platform and slidably connected to the guide column in a vertical direction. A first spring in a vertical direction is provided between the floating platform and the fixed platform. The upper side of the floating platform is used to fix the test piece. A pressing assembly includes a lifting drive, a pressure plate, a pressure rod, and a detection rod. The pressure plate is located above a floating platform and is lifted and lowered by the lifting drive. The pressure plate is provided with a second spring along the vertical direction. The upper end of the pressure rod is connected to the second spring and the lower end extends below the pressure plate. The detection rod is connected to the pressure plate and has a probe extending below the pressure plate. The probe is made of conductive material and is higher than the lower end of the pressure rod. The detector is located to the side of the floating platform. The detector is equipped with a set of anti-contact points and a set of signal contacts facing the floating platform. The set of anti-contact points is located above the set of signal contacts. When the lifting drive moves the pressure plate down, the pressure rod pushes the floating platform down so that the test piece first makes contact with the set of anti-contact points, and at this time the probe and the test piece are not in contact. When the lifting drive continues to move the pressure plate down until the probe and the test piece are in contact, the test piece disengages from the set of anti-contact points and makes contact with the set of signal contacts.

2. The flashlight circuit testing fixture according to claim 1, characterized in that, The reverse contact point group includes a pair of power supply terminals with positive and negative poles opposite to those of the device under test (DUT). The signal contact point group includes a pair of power supply terminals with positive and negative poles corresponding to those of the DUT and at least one detection terminal. The detection terminal is used to receive an output signal when the probe contacts the DUT, causing the corresponding circuit of the DUT to be connected.

3. The flashlight circuit testing fixture according to claim 1, characterized in that, The pressure plate is provided with an adjusting screw hole that runs vertically through it, and the detection rod is provided with an external thread and screwed into the adjusting screw hole.

4. The flashlight circuit testing fixture according to claim 1 or 3, characterized in that, The pressure plate has an upward-facing mounting hole on its lower side. The second spring is installed in the upper part of the mounting hole, and the upper end of the second spring is connected to the pressure plate. The upper end of the pressure rod is slidably inserted into the lower part of the mounting hole, and the upper end of the pressure rod is connected to the second spring.

5. The flashlight circuit testing fixture according to claim 4, characterized in that, The lower end of the pressure bar is tapered.

6. The flashlight circuit testing fixture according to claim 1, characterized in that, The guide posts are at least two and spaced apart, and the floating platform has sliding holes for sliding engagement with the guide posts.

7. The flashlight circuit testing fixture according to claim 6, characterized in that, The number of the first springs corresponds to the number of guide posts, and the first springs are sleeved onto the guide posts one by one.

8. The flashlight circuit testing fixture according to claim 1, 6, or 7, characterized in that, The floating table has a positioning groove for fixing the part to be tested.

9. The flashlight circuit testing fixture according to claim 1, characterized in that, The fixed platform is provided with a bracket, and the bracket has a receiving part extending above the floating platform. The lifting drive is installed on the receiving part of the bracket and the output end of the lifting drive is set downward. The pressure plate is connected to the output end of the lifting drive.

Images