Estimation and control methods, systems, media, programs, and electronic terminals for high-voltage relay life loss rate

Abstract

This application provides a method, system, medium, program, and electronic terminal for estimating and controlling the life loss rate of a high-voltage relay. By calculating the current influence factor and the temperature-related acceleration factor, the first historical life loss rate L1 caused by disconnection and conduction operations is finally obtained. At the same time, the second historical life loss rate L2 caused by contact temperature overheating is introduced, making the obtained life prediction results more accurate. It is suitable for the harsh working conditions of new energy vehicles going uphill for a long time, and does not require the addition of complex hardware circuits.

Description

Technical Field

[0001] This application relates to the field of high-voltage relays, and in particular to a method, system, medium, program, and electronic terminal for estimating and controlling the life loss rate of high-voltage relays. Background Technology

[0002] In the field of new energy vehicles, the Battery Management System (BMS) manages the on / off state of the high-voltage circuit by controlling the closing and opening of high-voltage relays, thereby achieving precise control of vehicle start-stop. Therefore, the reliability of the high-voltage relays plays a crucial role in the smooth operation and safety of the entire vehicle.

[0003] However, high-voltage relays are not infinitely durable; their lifespan is finite. Due to prolonged current loads and frequent switching operations, the contacts of high-voltage relays will experience wear, corrosion, or other aging phenomena, leading to a gradual decline in their performance. When the durability of a high-voltage relay exceeds its predetermined lifespan threshold, it faces the risk of failure, posing a serious threat to the safe operation of the vehicle. Therefore, accurate estimation of the lifespan of high-voltage relays and effective protection are particularly important.

[0004] Currently, the main methods used to estimate the lifespan of high-voltage relays are:

[0005] (a) Estimating the lifespan of a high-voltage relay by statistically analyzing the frequency of its switching operations. This method requires the BMS to continuously track and record the number of times the high-voltage relay operates each time. However, this method does not consider the influence of temperature, resulting in poor accuracy in lifespan prediction.

[0006] (ii) Inferring the lifespan of a high-voltage relay by detecting changes in its contact resistance and coil resistance. This method requires the addition of complex hardware, such as shunts and high-precision resistance measurement circuits, which significantly increases the complexity and cost of the system and may affect the overall design of new energy vehicles.

[0007] (iii) Inferring the lifespan of a high-voltage relay by detecting changes in physical quantities such as magnetic induction intensity, contact gap, and spring pressure. This method usually requires placing sensors inside or near the high-voltage relay, which involves space installation, isolation protection, and calibration issues, making it difficult to apply effectively in new energy vehicles.

[0008] (iv) The lifespan of a high-voltage relay is estimated by analyzing its voltage and current changes, sometimes combined with ambient temperature. This is a common method, especially effective under normal operating conditions. However, when vehicles travel in mining areas, mountainous regions, or other areas requiring prolonged uphill driving or steep slopes, the high-voltage relay operates under high load and high current for extended periods. This causes a rapid rise in the contact temperature of the high-voltage relay, which, when it reaches a certain limit, significantly reduces its lifespan. This method does not consider the influence of contact temperature, therefore the resulting lifespan loss conclusions are not accurate. Summary of the Invention

[0009] In view of the shortcomings of the prior art described above, the purpose of this application is to provide a method, system, medium, program and electronic terminal for estimating and controlling the life loss rate of high voltage relays, so as to solve the above problems.

[0010] To achieve the above and other related objectives, a first aspect of this application provides a method for estimating the life loss rate of a high-voltage relay, comprising: obtaining a first current I1, a second current I2, a first temperature T1, and a second temperature T2; wherein, the first current I1 is the instantaneous current flowing through the load circuit within the working module where the high-voltage relay is located when the high-voltage relay is disconnected, the second current I2 is the instantaneous current flowing through the load circuit within the working module where the high-voltage relay is located when the high-voltage relay is turned on, the first temperature T1 is the temperature of the contacts inside the high-voltage relay when the high-voltage relay is disconnected, and the second temperature T2 is the temperature inside the high-voltage box of the high-voltage relay when the high-voltage relay is turned on; and calculating a first influence factor Q1 on the life loss rate when the high-voltage relay is disconnected and a second influence factor Q2 on the life loss rate when the high-voltage relay is turned on according to the current influence factor formula; wherein, I b I is the reference current of the high-voltage relay, k1 is the current exponent, and S is the voltage of the high-voltage relay at the reference current I. b The number of durability cycles, The first acceleration factor AF1 for the lifespan at which the high-voltage relay is disconnected and the second acceleration factor AF2 for the lifespan at which the high-voltage relay is turned on are calculated based on the Arrenius equation; where e is the Euler number, E a The activation energy is given by k2, where k is the Boltzmann constant and T is the activation energy. b This refers to the rated operating temperature of the high-voltage relay. The disconnection life loss rate L caused by a single disconnection of the high-voltage relay is calculated based on the first influence factor Q1, the second influence factor Q2, the first acceleration factor AF1, and the second acceleration factor AF2. 11 and the conduction life loss rate L caused by a single conduction 12 ;in,

[0011] In one embodiment of the first aspect of this application, the method further includes: obtaining a first historical lifespan attenuation rate L1 and a second historical lifespan attenuation rate L2; wherein the first historical lifespan attenuation rate L1 is the cumulative lifespan attenuation rate caused by the high-voltage relay being disconnected or turned on during historical operation, and the second historical lifespan attenuation rate L2 is the cumulative lifespan attenuation rate caused by the high-voltage relay exceeding the first temperature T1 during historical operation; wherein D is the cumulative operating time of the high-voltage relay exceeding the first temperature T1 during historical operation, D max The maximum operating time for the high-voltage relay to operate in an over-temperature state at a first temperature T1 until its lifespan is exhausted. When the high-voltage relay experiences a new disconnection or conduction, the first historical lifespan attrition rate L1 is updated; wherein, the process of updating the first historical lifespan attrition rate L1 includes: adjusting the disconnection lifespan attrition rate L caused by the new disconnection. 11 Or the conduction lifetime loss rate L caused by new conduction. 12 The time is added to the first historical life loss rate L1; when the high-voltage relay has a new operating time of exceeding the first temperature T1, the new operating time D1 is added to the cumulative operating time D of exceeding the first temperature T1, and a new second life loss rate L2 is calculated; the final life loss rate L of the high-voltage relay is max(L1, L2).

[0012] In one embodiment of the first aspect of this application, the disconnection lifetime loss rate L caused by the new disconnection 11 Or the conduction lifetime loss rate L caused by new conduction. 12 The process of accumulating the data into the first historical lifespan loss rate L1 includes: counting the number of disconnections N1 and the number of conductions N2 that occurred during a certain period of time, and calculating the total disconnection lifespan loss rate L caused by N1 disconnections. 11 The total conduction lifetime loss rate L caused by N2 conductions. 12 ', the total disconnection life loss rate L 11 The total conduction lifetime loss rate L caused by N2 conductions 12 Add it to the first historical lifetime loss rate L1.

[0013] To achieve the above and other related objectives, a second aspect of this application provides a method for controlling the lifespan attenuation rate of a high-voltage relay, applied to the battery management module of the high-voltage relay, comprising: acquiring a first temperature T1 of the high-voltage relay and the maximum allowable temperature T corresponding to its over-temperature. max ; Obtain the preset first threshold temperature T y1 Second threshold temperature T y2 Wherein, the first threshold temperature Ty1 Less than the maximum allowable temperature T max And greater than the second threshold temperature T y2 When the first temperature T1 exceeds the first threshold temperature T during the heating process... y1 When the battery management module operates in a specific mode, it executes a first current-limiting mode; otherwise, it executes a second current-limiting mode. The second current-limiting mode is defined as the battery management module's maximum output current I. max The peak current I that the battery can output sop_max .

[0014] In one embodiment of the second aspect of this application, the first current limiting mode includes: when the first temperature T1 exceeds a first threshold temperature T during the heating process. y1 At that time, the maximum output current I of the battery management module max for: Where C is the rated capacity of the battery, and B is the calibration parameter; and, in the first current-limiting mode, when the maximum output current I... max The value is reduced to equal the continuous current I that the battery can output. sop_con At that time, the battery management module executes the second current limiting mode.

[0015] To achieve the above and other related objectives, a third aspect of this application provides a system for estimating the life loss rate of a high-voltage relay, comprising: a current acquisition module for acquiring a first current I1 and a second current I2; wherein the first current I1 is the instantaneous current flowing through the load circuit within the working module where the high-voltage relay is located when the high-voltage relay is disconnected, and the second current I2 is the instantaneous current flowing through the load circuit within the working module where the high-voltage relay is located when the high-voltage relay is turned on; a temperature acquisition module for acquiring a first temperature T1 and a second temperature T2; wherein the first temperature T1 is the temperature of the contacts inside the high-voltage relay when the high-voltage relay is disconnected, and the second temperature T2 is the temperature inside the high-voltage box of the high-voltage relay when the high-voltage relay is turned on; and a life loss rate calculation module for calculating the life loss rate of the high-voltage relay; wherein: a first influence factor Q1 on the life loss rate when the high-voltage relay is disconnected and a second influence factor Q2 on the life loss rate when the high-voltage relay is turned on are calculated according to the current influence factor formula; wherein, I b I is the reference current of the high-voltage relay, k1 is the current exponent, and S is the voltage of the high-voltage relay at the reference current I. b The number of durability cycles, The first acceleration factor AF1 for the lifespan at which the high-voltage relay is disconnected and the second acceleration factor AF2 for the lifespan at which the high-voltage relay is turned on are calculated based on the Arrenius equation; where e is the Euler number, E a The activation energy is given by k2, where k is the Boltzmann constant and T is the activation energy.b This refers to the rated operating temperature of the high-voltage relay. The disconnection life loss rate L caused by a single disconnection of the high-voltage relay is calculated based on the first influence factor Q1, the second influence factor Q2, the first acceleration factor AF1, and the second acceleration factor AF2. 11 and the conduction life loss rate L caused by a single conduction 12 ;in,

[0016] To achieve the above and other related objectives, a fourth aspect of this application provides a control system for the life loss rate of a high-voltage relay, comprising: a temperature acquisition module for acquiring a first temperature T1 of the high-voltage relay and the maximum allowable temperature T corresponding to over-temperature. max ; Obtain the preset first threshold temperature T y1 Second threshold temperature T y2 Wherein, the first threshold temperature T y1 Less than the maximum allowable temperature T max And greater than the second threshold temperature T y2 The current limiting module is used to limit the current when the first temperature T1 exceeds the first threshold temperature T during the heating process. y1 When the battery management module operates in a specific condition, it executes a first current-limiting mode; otherwise, it executes a second current-limiting mode. The second current-limiting mode is defined by the battery management module's maximum output current I. max The peak current I that the battery can output sop_max .

[0017] To achieve the above and other related objectives, a fifth aspect of this application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the method described in any of the preceding claims.

[0018] To achieve the above and other related objectives, a sixth aspect of this application provides a computer program product including computer program code that, when executed on a computer, causes the computer to perform the method described in any of the preceding claims.

[0019] To achieve the above and other related objectives, a seventh aspect of this application provides an electronic terminal, including a memory, a processor, and a computer program stored in the memory, wherein the processor executes the computer program to implement the method described in any of the preceding claims.

[0020] As described above, this application has the following beneficial effects:

[0021] This invention calculates the current influence factor. and and temperature-related accelerators and Finally, the lifetime loss rates caused by disconnection and conduction operations were obtained. and This method makes the obtained lifespan prediction results more accurate and suitable for the harsh operating conditions of trams going uphill for extended periods. During long uphill climbs, the contact temperature of the high-voltage relay rises rapidly under prolonged high current conditions. When the contact temperature reaches a certain limit, it will cause significant wear and tear on the high-voltage relay's lifespan. Therefore, the contact temperature of the high-voltage relay should also be considered in the lifespan assessment. This method calculates the current influence factor... and temperature acceleration factor This allows for precise assessment of lifespan degradation caused by each switching on and off. Furthermore, in long uphill operating conditions, the relay's conduction period is longer, resulting in significant Joule heat generated as current flows through the relay contacts and coil. As current continues to flow, the relay's internal temperature gradually increases, eventually reaching thermal equilibrium. The high-voltage box temperature T2 becomes a crucial factor determining long-term aging. The calculation takes into account the effect of temperature on aging, effectively amplifying the long-term losses caused by temperature increases, thus avoiding damage from prolonged high-temperature operation. In this way, the lifespan loss due to thermal aging under high load conditions can be accurately calculated. Under long uphill operating conditions, relays are not only affected by high current but also face a gradual increase in temperature. If only instantaneous temperature is used to estimate lifespan loss, the thermal aging caused by prolonged high temperatures will be ignored; this oversimplified model underestimates the impact of long-term aging. However, by... and Separate calculations allow for the independent consideration of the effects of arcing and steady-state thermal aging, resulting in more accurate lifetime predictions under high current and high temperature conditions and avoiding the dual biases caused by arcing and long-term temperature rise. Furthermore, this method does not require complex additional hardware circuitry; instead, it uses existing current and temperature sensor data to achieve accurate relay lifetime estimation through calculation. Attached Figure Description

[0022] Figure 1 The diagram shown is a flowchart illustrating a method for estimating the life loss rate of a high-voltage relay according to an embodiment of this application.

[0023] Figure 2 The diagram shown is a flowchart illustrating a method for estimating the life loss rate of a high-voltage relay according to an embodiment of this application.

[0024] Figure 3 The diagram shown is a flowchart illustrating a method for controlling the lifespan loss rate of a high-voltage relay according to an embodiment of this application.

[0025] Figure 4 The diagram shown is a flowchart illustrating a method for controlling the lifespan loss rate of a high-voltage relay according to an embodiment of this application.

[0026] Figure 5 The diagram shown is a structural schematic of a high-voltage relay life loss rate estimation system according to an embodiment of this application.

[0027] Figure 6 The diagram shown is a structural schematic of a control system for the life loss rate of a high-voltage relay according to an embodiment of this application.

[0028] Figure 7 The diagram shown is a structural schematic of an electronic terminal according to an embodiment of this application. Detailed Implementation

[0029] The following specific examples illustrate the implementation of this application. Those skilled in the art can easily understand other advantages and effects of this application from the content disclosed in this specification. This application can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this application. It should be noted that, unless otherwise specified, the following embodiments and features in the embodiments can be combined with each other.

[0030] In the embodiments of this application, terms such as "first" and "second" are used to distinguish identical or similar items with essentially the same function and effect. For example, "first XX" and "second XX" are merely used to distinguish different XXs and do not limit their order. Those skilled in the art will understand that terms such as "first" and "second" do not limit the quantity or execution order, and that "first" and "second" do not necessarily imply that they are different.

[0031] It should be noted that, in the embodiments of this application, the words "exemplary" or "for example" indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary" or "for example" in this application should not be construed as being more preferred or advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present the relevant concepts in a concrete manner.

[0032] In this application embodiment, "at least one" refers to one or more, and "more than one" refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone, where A and B can be singular or plural. The character " / " generally indicates that the preceding and following related objects are in an "or" relationship. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one of a, b, or c can represent: a, b, c, ab, ac, bc, or abc, where a, b, and c can be single or multiple.

[0033] In view of the shortcomings of the prior art described above, the purpose of this application is to provide a method, system, medium, program and electronic terminal for estimating and controlling the life loss rate of high voltage relays, so as to solve the above problems.

[0034] The first aspect of this application provides a method for estimating the life loss rate of high-voltage relays, such as... Figure 1 As shown, it includes:

[0035] S1: Obtain the first current I1, the second current I2, the first temperature T1, and the second temperature T2; wherein, the first current I1 is the instantaneous current flowing through the load circuit in the working module where the high-voltage relay is located when the high-voltage relay is disconnected, the second current I2 is the instantaneous current flowing through the load circuit in the working module where the high-voltage relay is located when the high-voltage relay is turned on, the first temperature T1 is the temperature of the contacts inside the high-voltage relay when the high-voltage relay is disconnected, and the second temperature T2 is the temperature inside the high-voltage box of the high-voltage relay when the high-voltage relay is turned on.

[0036] It should be understood that each time a high-voltage relay switches on and off, it experiences a momentary surge of current. Especially when the current in the load circuit is high, an electric arc will form at the high-voltage relay contacts. The formation and persistence of this arc can lead to wear, melting, or corrosion of the high-voltage relay contacts, thus affecting the relay's lifespan. Particularly when high current flows, the energy of the arc increases, accelerating the aging of the high-voltage relay contacts. Therefore, the magnitude of the current directly determines the degree of wear on the high-voltage relay contacts, thus affecting the relay's lifespan. The instantaneous current value is usually highest when the high-voltage relay is switched on and off. Especially during disconnection, the electric arc at the high-voltage relay contacts is very strong, making the measurement of the instantaneous current crucial. By accurately collecting the instantaneous current during the switching on and off of the high-voltage relay, the maximum load the high-voltage relay bears during operation can be accurately assessed, as well as the impact of the resulting arc on the contacts, thereby understanding the high-voltage relay's load-bearing capacity.

[0037] Furthermore, high-voltage relays generate heat when switching current on and off. This heat causes the internal temperature of the high-voltage relay to rise, affecting components such as metal contacts, springs, and coils. High temperatures, in particular, accelerate contact oxidation and corrosion, gradually reducing contact performance. In addition, elevated temperatures can lead to thermal fatigue, where thermal expansion and contraction cause deformation or micro-cracks in internal components, impacting long-term stability and reliability. Excessive temperatures can also cause aging of the internal insulation materials, ultimately leading to electrical faults. When the high-voltage relay disconnects, the contacts experience an instantaneous arc upon current interruption, causing a rapid rise in contact surface temperature. Prolonged exposure to high temperatures accelerates contact material wear, reducing contact quality. Monitoring the contact temperature allows assessment of whether the high-voltage relay is operating at excessively high temperatures, thus predicting its lifespan. Conversely, when the high-voltage relay is conducting, the current flowing through the high-voltage circuit causes an increase in the internal temperature of the high-voltage relay's high-voltage housing. Temperature changes inside the high-voltage box reflect the internal thermal load and long-term stability of the high-voltage relay. High temperatures can cause aging of internal insulation materials and even electrical failure. Therefore, obtaining the temperature of the high-voltage box can help assess the thermal degradation of the high-voltage relay under continuous energization.

[0038] S2: The first influence factor Q1 on the lifespan at which the high-voltage relay is disconnected and the second influence factor Q2 on the lifespan at which it is turned on are calculated according to the current influence factor formula; where, I b I is the reference current of the high-voltage relay, k1 is the current exponent, and S is the voltage of the high-voltage relay at the reference current I. b The number of durability cycles.

[0039]

[0040] It should be understood that the current influence factors (first influence factor Q1 and second influence factor Q2) describe the proportion of current's impact on the lifespan degradation of high-voltage relays. They characterize the proportion of the impact of instantaneous current changes on the lifespan of the high-voltage relay. In other words, the current influence factors reflect the proportion of lifespan loss caused by each operation of the high-voltage relay under a certain current load, relative to the overall lifespan loss. Therefore, as the current increases, the current influence factors will increase, meaning that at higher currents, each operation (turning on or off) of the high-voltage relay will have a greater impact on its lifespan degradation.

[0041] The durability cycle S refers to the number of times a high-voltage relay can withstand operation under a standard reference current, typically provided by the manufacturer. The manufacturer specifies the maximum number of switching operations the high-voltage relay can achieve under standard test conditions (such as the set reference current and standard operating environment). This is the design life of the high-voltage relay. In practical applications, the current that the high-voltage relay withstands often exceeds the reference current. Therefore, it is necessary to consider the durability cycle under different currents (i.e., the shortening of lifespan under different current loads). Furthermore, the durability cycle S of a high-voltage relay will change under different current loads. For high currents, the arcing of the high-voltage relay contacts is stronger, and the lifespan deteriorates rapidly; while at low currents, the wear rate of the high-voltage relay contacts is slower, resulting in a longer lifespan. Generally speaking, the higher the current, the fewer the durability cycles of the high-voltage relay. The S provided by the manufacturer is a standard value under a reference current and needs to be adjusted according to changes in current during practical applications.

[0042] k1 is an empirical constant representing the degree of influence of current changes on the lifespan of a high-voltage relay. Its value is obtained by fitting experimental data and is usually closely related to the material properties, design, and operating environment of the high-voltage relay. k1 reflects the sensitivity of current to lifespan, that is, how much the current change will cause a reduction in lifespan. k1 is not fixed; it usually varies with the current range. In a smaller current range, k1 may be smaller, and the current's impact on lifespan is smaller. However, in a larger current range, k1 will be larger. Because high current passing through a high-voltage relay generates a stronger electric arc, the contacts and coil of the high-voltage relay will be subjected to greater thermal load and electrochemical damage. Therefore, high current will more significantly affect the lifespan of the high-voltage relay.

[0043] The degradation of high-voltage relay lifespan is primarily due to contact wear, melting, or oxidation caused by the electric arc generated when current flows through the relay contacts. The intensity of the arc is directly proportional to the current flowing through the high-voltage relay; therefore, at higher currents, the wear rate of the relay contacts accelerates, significantly shortening the relay's lifespan. By introducing a current influence factor Q, the contribution of current to lifespan degradation can be considered in the calculations, allowing for a dynamic assessment of the remaining lifespan of the high-voltage relay.

[0044] S3: Calculate the first acceleration factor AF1 for the lifespan at which the high-voltage relay is disconnected and the second acceleration factor AF2 for the lifespan at which the high-voltage relay is turned on, based on the Arrenius equation; where e is the Euler number, E... a The activation energy is given by k2, where k is the Boltzmann constant and T is the activation energy. b This refers to the rated operating temperature of the high-voltage relay.

[0045]

[0046] It should be understood that in step S2, the present invention has already estimated the proportion of lifespan degradation caused by each operation of the high-voltage relay using the current influence factor. Step S3 further introduces the influence of temperature on the lifespan of the high-voltage relay by introducing temperature acceleration factors (first acceleration factor AF1, second acceleration factor AF2) through the Arrhenius equation to account for the accelerating effect of temperature on the lifespan loss of the high-voltage relay. The Arrhenius equation is commonly used to describe the relationship between temperature and reaction rate, especially the accelerating effect of temperature changes on lifespan under high-temperature conditions. Here, the activation energy E... a This represents the energy barrier that must be overcome for the temperature to rise when current passes through a high-voltage relay. The higher the activation energy, the more significant the effect of temperature on accelerating the lifespan. k2 is the Boltzmann constant.

[0047] The reason for setting the peak contact temperature at the moment of disconnection is... Temperature inside the high-voltage box during conduction Substituting the steady-state temperatures into the Arrhenius equation reveals a fundamental difference: the two operating conditions trigger completely different failure mechanisms. When the high-voltage relay disconnects, the current is forcibly cut off, and a high-temperature arc is instantaneously formed between the contacts, with local temperature rises reaching thousands of degrees Celsius. The extreme thermal shock of the arc melts the contact surface, tears the micro-solder joints, and scatters molten droplets within milliseconds, resulting in "impact-type" wear. Almost all of the lifespan degradation occurs in that single instant. To accurately assess this wear, the measured peak temperature must be... Substituting the Arrhenius exponent term, we obtain the acceleration factor specifically corresponding to the disconnection action. If a lower steady-state temperature is used instead of the peak temperature, the model will severely underestimate the life-reducing effect of the arc. Conversely, during the conduction phase of the high-voltage relay, the contacts are closed, and current continuously generates Joule heat through the contact resistance and coil copper resistance, while surrounding power devices also transfer heat to the high-voltage box wall. After several seconds to several minutes, the high-voltage relay reaches thermal equilibrium, and the high-voltage box temperature... This becomes the dominant variable determining long-term "steady-state thermal aging." High-temperature environments accelerate slow degradation processes such as contact oxidation, spring creep, and coil insulation aging. These phenomena require time to accumulate, and their rates increase exponentially with temperature according to the Arrhenius law. The calculated AF2 amplifies the lifetime loss per unit time during conduction. If the instantaneous peak temperature is mistakenly applied to this stage, long-term aging will be infinitely magnified, resulting in an overly conservative lifetime estimate.

[0048] Therefore, introducing AF1 and AF2 separately can eliminate the double bias of the model. If only the peak temperature is taken, the entire model will be extremely sensitive to high-load disconnection and ignore steady-state aging. If only the box temperature is taken, the opposite is true. In high-current environments such as mining areas and long uphill slopes, the contacts may fail prematurely due to arc impact without warning. Calculating them separately gives impact wear and cumulative thermal aging their respective weights, and finally adds them to the life loss rate L according to the actual operating conditions. This is neither overly optimistic nor so conservative as to cause frequent false alarms.

[0049] S4: The disconnection life loss rate L caused by a single disconnection of the high-voltage relay is calculated based on the first influence factor Q1, the second influence factor Q2, the first acceleration factor AF1, and the second acceleration factor AF2. 11 and the conduction life loss rate L caused by a single conduction 12 .

[0050]

[0051] In step S4, the current influence factor obtained in the preceding steps is... and and temperature-related accelerators and The lifetime loss rate caused by disconnection and conduction operations was calculated. and By combining the effects of current and temperature, the system can calculate the lifespan loss rate of the high-voltage relay during each on-off and off-off cycle. This is a dynamically accumulated process; each time the high-voltage relay operates, its lifespan loss is updated based on the current current and temperature conditions until a certain threshold is reached. The BMS (Battery Management System) or other control systems can use this data to predict the remaining lifespan of the high-voltage relay and trigger measures such as early warnings, periodic maintenance, or replacement as needed. It should be understood that the module in an electric vehicle that collects the first current, second current, first temperature, and second temperature, and calculates the first and second lifespan loss rates, is typically a BMS. However, the aforementioned temperature and current collection and lifespan loss rate calculation can also be implemented by other structures or modules capable of performing the corresponding collection and calculation functions. Implementation by a BMS is a preferred technical solution in one embodiment of this application and does not constitute a limitation on the scope of protection of this application.

[0052] In some embodiments of the first aspect of this application, such as Figure 2 As shown, it also includes the following steps:

[0053] S5: Obtain the first historical lifespan loss rate L1 and the second historical lifespan loss rate L2; wherein, the first historical lifespan loss rate L1 is the cumulative lifespan loss rate caused by the high-voltage relay's disconnection or conduction during historical operation, and the second historical lifespan loss rate L2 is the cumulative lifespan loss rate caused by the high-voltage relay exceeding the first temperature T1 during historical operation; wherein, D is the cumulative operating time of the high-voltage relay exceeding the first temperature T1 during historical operation, D max The maximum operating time for the high-voltage relay to operate in an over-temperature state at a first temperature T1 until its lifespan is exhausted. .

[0054] It should be understood that the first historical lifespan attenuation rate L1 refers to the cumulative lifespan attenuation rate caused by the disconnection or connection of the high-voltage relay during its historical operation. It represents the cumulative percentage of lifespan degradation of the high-voltage relay from the start of its use to the last data update. The second historical lifespan attenuation rate L2 is the cumulative lifespan attenuation rate caused by the first temperature T1 exceeding the allowable temperature from the start of its use to the last data update. It should be understood that exceeding the allowable temperature T refers to the contact temperature of the high-voltage relay exceeding its maximum permissible temperature T. max The cumulative operating time D of the first temperature T1 exceeding the temperature refers to the time during which the operating temperature of the high-voltage relay exceeds its maximum allowable temperature T during operation. max Total operating time. High-voltage relays operating for more than T... max Operating at temperatures exceeding these limits accelerates aging and significantly shortens the lifespan of high-voltage relays. Therefore, the operating time exceeding this temperature is a crucial factor in evaluating the lifespan of high-voltage relays. Maximum operating time D max This refers to the first temperature T1 of the high-voltage relay at its maximum allowable temperature T. max This parameter specifies the maximum time the high-voltage relay can operate safely and stably. Exceeding this time may lead to performance degradation or failure. This parameter helps the system assess the safe operating time of the high-voltage relay under over-temperature conditions and provides a reference for maintenance and replacement.

[0055] S6: When the high-voltage relay experiences a new disconnection or conduction, update the first historical lifespan loss rate L1; wherein, the process of updating the first historical lifespan loss rate L1 includes: adjusting the disconnection lifespan loss rate L caused by the new disconnection. 11 Or the conduction lifetime loss rate L caused by new conduction. 12 The new operating time D1 is added to the first historical life loss rate L1. When the high-voltage relay experiences a new operating time exceeding the first temperature T1, the new operating time D1 is added to the cumulative operating time D exceeding the first temperature T1, and a new second life loss rate L2 is calculated.

[0056] In some embodiments of the first aspect of this application, the disconnection lifetime loss rate L caused by the new disconnection 11 Or the conduction lifetime loss rate L caused by new conduction. 12 The process of accumulating the data into the first historical lifespan loss rate L1 includes: counting the number of disconnections N1 and the number of conductions N2 that occurred during a certain period of time, and calculating the total disconnection lifespan loss rate L caused by N1 disconnections. 11 The total conduction lifetime loss rate L caused by N2 conductions. 12 ', the total disconnection life loss rate L 11 The total conduction lifetime loss rate L caused by N2 conductions 12 This is accumulated into the first historical lifetime loss rate L1. It should be understood that the advantage of this method is that it reduces the frequency of calculations. By summarizing over time periods to estimate lifetime loss, the burden of real-time calculations can be reduced, and it has good efficiency in some application scenarios that do not require extremely high precision.

[0057] It should be understood that the method for updating the first historical lifespan loss rate L1 also includes updating the first historical lifespan loss rate L1 promptly each time the high-voltage relay performs a disconnection or conduction operation. That is, after each disconnection operation, the lifespan loss rate L1 caused by the disconnection operation is calculated. 11 This is then added to the first historical lifetime attrition rate L1. After each conduction operation, the lifetime attrition rate L caused by the conduction operation is calculated. 12 This is then added to the first historical lifetime attrition rate L1. The advantage of this method is that it can track the lifetime impact of each operation in real time, making it suitable for systems that require very fine-grained tracking.

[0058] S7: The final life loss rate L of the high-voltage relay is max(L1, L2).

[0059] In the prediction of the life loss rate of the high-voltage relay in this invention, we divide the calculation of the life loss rate into two main lines: one is the first historical life loss rate L1, and the other is the second historical life loss rate L2. Specifically, the high-voltage relay is considered to have a contact temperature (first temperature T1) exceeding its maximum allowable temperature T. maxThe lifespan loss caused by the high-voltage relay during operation and the lifespan loss caused by the switching on and off of the high-voltage relay are calculated separately, and the larger value between the two is selected as the final lifespan loss rate of the high-voltage relay. The reason for selecting the larger value between L1 and L2 is that temperature loss and contact loss are two different types of attenuation, and their effects are usually independent. However, to ensure safety and equipment durability, we choose the most unfavorable scenario as the final lifespan loss rate. Therefore, selecting a larger loss rate is a conservative and reasonable method, ensuring that the remaining lifespan of the relay is evaluated under the most unfavorable conditions. The core purpose of this design is to ensure that the lifespan loss of the high-voltage relay under high-temperature conditions can be strictly controlled. When the first temperature T1 of the high-voltage relay exceeds the maximum allowable temperature T... max The historical runtime D exceeded the maximum runtime D max At this point, the temperature and pressure it experiences can cause a sharp increase in the risk of failure. Regardless of the first historical lifespan attrition rate L1, the high-voltage relay has entered an irreversible state, and the second historical lifespan attrition rate L2 directly escalates to 100%, meaning its lifespan is completely exhausted. Continued use should be avoided at this stage.

[0060] It should be understood that the disconnection life loss rate L in this invention 11 Conduction life loss rate L 12 The first historical life loss rate L1 and the second historical life loss rate L2 are both percentages of life loss. The remaining life of the high-voltage relay can be calculated based on the life loss rate, that is, the remaining life is (100%-L1) or (100%-L2).

[0061] like Figure 3 As shown, a second aspect of this application provides a method for controlling the lifespan loss rate of a high-voltage relay, applied to the battery management module of a high-voltage relay, comprising:

[0062] S1: Obtain the first temperature T1 of the high-voltage relay and the maximum allowable temperature T corresponding to over-temperature. max .

[0063] S2: Obtain the preset first threshold temperature T y1 Second threshold temperature T y2 Wherein, the first threshold temperature T y1 Less than the maximum allowable temperature T max And greater than the second threshold temperature T y2 .

[0064] S3: When the first temperature T1 exceeds the first threshold temperature T during the heating process. y1 At that time, the battery management module executes the first current limiting mode.

[0065] It should be understood that the battery management module of the high-voltage relay is usually a battery management system in electric vehicles, but it can also be implemented by other structures that can achieve the corresponding functions. The battery management system here is only a preferred technical solution in this embodiment and does not constitute a limitation on the scope of protection of this application.

[0066] S4: In other cases, the battery management module executes the second current limiting mode. The second current limiting mode is defined as the maximum output current I of the battery management module. max The peak current I that the battery can output sop_max .

[0067] For example, if the maximum allowable temperature T of the high-voltage relay is... max The first threshold temperature is 130℃. y1 The first threshold temperature is 125℃, and the second threshold temperature is 120℃. When the first temperature T1 of the high-voltage relay is 120℃ and the first current-limiting mode is not triggered, the second current-limiting mode is executed on the high-voltage relay, that is, the maximum output current Imax of its battery management module is set to the peak current I that the battery can output. sop_max When the first temperature T1 gradually rises until it is greater than or equal to 125°C, the first current limiting mode is triggered.

[0068] like Figure 4 As shown, in some embodiments of the second aspect of this application, when the first temperature T1 exceeds the first threshold temperature T during the heating process... y1 At that time, the maximum output current I of the battery management module max for: Where C represents the battery's rated capacity, and B represents the calibration parameter. Furthermore, in the first current-limiting mode, when the maximum output current I... max The value is reduced to equal the continuous current I that the battery can output. sop_con At that time, the battery management module executes the second current limiting mode.

[0069] Continuing with the previous example, suppose the maximum allowable temperature T of the high-voltage relay is... max The first threshold temperature is 130℃. y1 The first threshold temperature is 125℃, and the second threshold temperature is 120℃. When the first temperature T1 of the high-voltage relay gradually rises until it is greater than or equal to 125℃, the battery management module executes the first current-limiting mode—the battery management module begins to control the current output to the high-voltage relay, ensuring that the maximum output current is reached. That is, to make the maximum output current I max Gradually decrease. As the maximum output current I... max As the current gradually decreases, the first temperature T1 of the high-voltage relay also gradually decreases, until the maximum output current I... maxLess than or equal to the continuous current I that the battery can output sop_con The battery management module executes the second current limiting mode.

[0070] like Figure 5 As shown, a third aspect of this application provides a system for estimating the life loss rate of a high-voltage relay, comprising: a current acquisition module for acquiring a first current I1 and a second current I2; wherein the first current I1 is the instantaneous current flowing through the load circuit within the working module where the high-voltage relay is located when the high-voltage relay is disconnected, and the second current I2 is the instantaneous current flowing through the load circuit within the working module where the high-voltage relay is located when the high-voltage relay is turned on; a temperature acquisition module for acquiring a first temperature T1 and a second temperature T2; wherein the first temperature T1 is the temperature of the contacts inside the high-voltage relay when the high-voltage relay is disconnected, and the second temperature T2 is the temperature inside the high-voltage box of the high-voltage relay when the high-voltage relay is turned on; and a life loss rate calculation module for calculating the life loss rate of the high-voltage relay; wherein: a first influence factor Q1 on the life loss rate when the high-voltage relay is disconnected and a second influence factor Q2 on the life loss rate when the high-voltage relay is turned on are calculated according to the current influence factor formula; wherein, I b I is the reference current of the high-voltage relay, k1 is the current exponent, and S is the voltage of the high-voltage relay at the reference current I. b The number of durability cycles, The first acceleration factor AF1 for the lifespan at which the high-voltage relay is disconnected and the second acceleration factor AF2 for the lifespan at which the high-voltage relay is turned on are calculated based on the Arrenius equation; where e is the Euler number, E a The activation energy is given by k2, where k is the Boltzmann constant and T is the activation energy. b This refers to the rated operating temperature of the high-voltage relay. The disconnection life loss rate L caused by a single disconnection of the high-voltage relay is calculated based on the first influence factor Q1, the second influence factor Q2, the first acceleration factor AF1, and the second acceleration factor AF2. 11 and the conduction life loss rate L caused by a single conduction 12 ;in,

[0071] It should be understood that the specific processes by which each module performs the corresponding steps described above have been detailed in the above method embodiments, and will not be repeated here for the sake of brevity. It should also be understood that the module division in the embodiments of this application is illustrative and merely a logical functional division; other division methods may exist in actual implementation. Furthermore, the functional modules in the various embodiments of this application can be integrated into a single processor, exist as separate physical entities, or have two or more modules integrated into one module. The integrated modules described above can be implemented in hardware or as software functional modules.

[0072] like Figure 6 As shown, a fourth aspect of this application provides a control system for the life loss rate of a high-voltage relay, comprising: a temperature acquisition module for acquiring a first temperature T1 of the high-voltage relay and the maximum allowable temperature T corresponding to over-temperature. max ; Obtain the preset first threshold temperature T y1 Second threshold temperature T y2 Wherein, the first threshold temperature T y1 Less than the maximum allowable temperature T max And greater than the second threshold temperature T y2 The current limiting module is used to limit the current when the first temperature T1 exceeds the first threshold temperature T during the heating process. y1 When the battery management module operates in a specific condition, it executes a first current-limiting mode; otherwise, it executes a second current-limiting mode. The second current-limiting mode is defined by the battery management module's maximum output current I. max The peak current I that the battery can output sop_max .

[0073] It should be understood that the specific processes by which each module performs the corresponding steps described above have been detailed in the above method embodiments, and will not be repeated here for the sake of brevity. It should also be understood that the module division in the embodiments of this application is illustrative and merely a logical functional division; other division methods may exist in actual implementation. Furthermore, the functional modules in the various embodiments of this application can be integrated into a single processor, exist as separate physical entities, or have two or more modules integrated into one module. The integrated modules described above can be implemented in hardware or as software functional modules.

[0074] The fifth aspect of this application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the method described in any of the preceding claims.

[0075] A sixth aspect of this application provides a computer program product comprising computer program code that, when executed on a computer, causes the computer to perform the method described in any of the preceding claims.

[0076] like Figure 7As shown, a seventh aspect of this application provides an electronic terminal including a memory, a processor, and a computer program stored in the memory, wherein the processor executes the computer program to implement the method described in any of the preceding claims. The electronic terminal includes at least one processor 701, a memory 702, at least one network interface 703, and a user interface 705. The various components in the device are coupled together via a bus system 704. It is understood that the bus system 704 is used to implement communication between these components. In addition to a data bus, the bus system 704 also includes a power bus, a control bus, and a status signal bus.

[0077] The user interface 705 may include a monitor, keyboard, mouse, trackball, clicker, button, touchpad, or touch screen.

[0078] It is understood that memory 702 can be volatile memory or non-volatile memory, or both. Non-volatile memory can be read-only memory (ROM) or programmable read-only memory (PROM), used as an external cache. By way of example, but not limitation, many forms of RAM are available, such as static random access memory (SRAM) and synchronous static random access memory (SSRAM). The memories described in the embodiments of this invention are intended to include, but are not limited to, these and any other suitable categories of memory.

[0079] In this embodiment of the invention, the memory 702 is used to store various types of data to support the operation of the electronic terminal 700. Examples of this data include: any executable program for operation on the electronic terminal 700, such as operating system 7021 and application program 7022; operating system 7021 includes various system programs, such as framework layer, core library layer, driver layer, etc., for implementing various basic services and handling hardware-based tasks. Application program 7022 may include various applications, such as media player, browser, etc., for implementing various application services. The methods provided in this embodiment of the invention can be included in application program 7022.

[0080] The methods disclosed in the above embodiments of the present invention can be applied to or implemented by processor 701. Processor 701 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by the integrated logic circuit of the hardware in processor 701 or by instructions in software form. The processor 701 may be a general-purpose processor, a digital signal processor (DSP), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Processor 701 can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of the present invention. General-purpose processor 701 may be a microprocessor or any conventional processor, etc. The steps of the accessory optimization method provided in the embodiments of the present invention can be directly reflected as being executed by a hardware decoding processor, or being executed by a combination of hardware and software modules in the decoding processor. The software module may be located in a storage medium, which is located in memory. The processor reads the information in the memory and combines it with its hardware to complete the steps of the aforementioned method.

[0081] In an exemplary embodiment, the electronic terminal 700 may be used by one or more application-specific integrated circuits (ASICs), DSPs, programmable logic devices (PLDs), or complex programmable logic devices (CPLDs) to execute the aforementioned method.

[0082] The terms “component,” “module,” “system,” etc., used in this specification are used to refer to computer-related entities, hardware, firmware, combinations of hardware and software, software, or software in execution. For example, a component can be, but is not limited to, a process running on a processor, a processor, an object, an executable file, an execution thread, a program, and / or a computer. As illustrated, applications running on computing devices and computing devices can both be components. One or more components may reside in a process and / or an execution thread, and components may be located on a single computer and / or distributed among two or more computers. Furthermore, these components can be executed from various computer-readable media on which various data structures are stored. Components can communicate, for example, via local and / or remote processes based on signals having one or more data packets (e.g., data from two components interacting with another component between a local system, a distributed system, and / or a network, such as the Internet interacting with other systems via signals).

[0083] Those skilled in the art will recognize that the various illustrative logical blocks and steps described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this application.

[0084] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0085] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0086] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0087] In addition, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0088] In the above embodiments, the functions of each functional unit can be implemented entirely or partially through software, hardware, firmware, or any combination thereof. When implemented using software, it can be implemented entirely or partially in the form of a computer program product. A computer program product includes one or more computer instructions (programs). When the computer program instructions (programs) are loaded and executed on a computer, all or part of the flow or function according to the embodiments of this application is generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. Computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that integrates one or more available media. The available media can be magnetic media (e.g., floppy disks, hard disks, magnetic tapes), optical media (e.g., high-density digital video discs, DVDs), or semiconductor media (e.g., solid-state disks, SSDs, etc.).

[0089] If a function is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0090] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

[0091] In summary, this application effectively overcomes the various shortcomings of the prior art and has high industrial application value.

[0092] The above embodiments are merely illustrative of the principles and effects of this application and are not intended to limit this application. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of this application. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in this application should still be covered by the claims of this application.

Claims

1. A method for estimating the life loss rate of a high-voltage relay, characterized in that, include: Acquire a first current I1, a second current I2, a first temperature T1, and a second temperature T2; wherein, the first current I1 is the instantaneous current flowing through the load circuit within the working module where the high-voltage relay is located when the high-voltage relay is disconnected, the second current I2 is the instantaneous current flowing through the load circuit within the working module where the high-voltage relay is located when the high-voltage relay is turned on, the first temperature T1 is the temperature of the contacts inside the high-voltage relay when the high-voltage relay is disconnected, and the second temperature T2 is the temperature inside the high-voltage box of the high-voltage relay when the high-voltage relay is turned on; The first influence factor Q1 on the lifespan at which the high-voltage relay is disconnected and the second influence factor Q2 on the lifespan at which it is turned on are calculated according to the current influence factor formula; where, I b I is the reference current of the high-voltage relay, k1 is the current exponent, and S is the voltage of the high-voltage relay at the reference current I. b The number of durability cycles, The first acceleration factor AF1 for the lifespan at which the high-voltage relay is disconnected and the second acceleration factor AF2 for the lifespan at which the high-voltage relay is turned on are calculated based on the Arrenius equation; where e is the Euler number, E a The activation energy is given by k2, where k is the Boltzmann constant and T is the activation energy. b This refers to the rated operating temperature of the high-voltage relay. The disconnection life loss rate L caused by a single disconnection of the high-voltage relay is calculated based on the first influence factor Q1, the second influence factor Q2, the first acceleration factor AF1, and the second acceleration factor AF2. 11 and the conduction life loss rate L caused by a single conduction 12 ;in, 2. The method for estimating the life loss rate of a high-voltage relay according to claim 1, characterized in that, Also includes: Obtain the first historical lifespan loss rate L1 and the second historical lifespan loss rate L2; wherein, the first historical lifespan loss rate L1 is the cumulative lifespan loss rate caused by the high-voltage relay's disconnection or conduction during historical operation, and the second historical lifespan loss rate L2 is the cumulative lifespan loss rate caused by the high-voltage relay exceeding the first temperature T1 during historical operation; wherein, D is the cumulative operating time of the high-voltage relay exceeding the first temperature T1 during historical operation, D max The maximum operating time for the high-voltage relay to operate in an over-temperature state at a first temperature T1 until its lifespan is exhausted. When the high-voltage relay experiences a new disconnection or conduction, the first historical lifespan attrition rate L1 is updated; wherein, the process of updating the first historical lifespan attrition rate L1 includes: adjusting the disconnection lifespan attrition rate L caused by the new disconnection. 11 Or the conduction lifetime loss rate L caused by new conduction. 12 Add to the first historical lifetime loss rate L1; When the high-voltage relay experiences an additional operating time exceeding the first temperature T1, the additional operating time D1 is added to the cumulative operating time D of the first temperature T1 exceeding the first temperature, and a new second life loss rate L2 is calculated. The final lifespan loss rate L of the high-voltage relay is max(L1, L2).

3. The method for estimating the life loss rate of a high-voltage relay according to claim 2, characterized in that, The disconnection life loss rate L caused by the new disconnection. 11 Or the conduction lifetime loss rate L caused by new conduction. 12 The process of accumulating the first historical lifetime attrition rate L1 includes: The number of disconnections (N1) and the number of reconnections (N2) of the high-voltage relay over a period of time are statistically analyzed, and the total disconnection life loss rate (L) caused by N1 disconnections is calculated. 11 The total conduction lifetime loss rate L caused by N2 conductions. 12 ', the total disconnection life loss rate L 11 The total conduction lifetime loss rate L caused by N2 conductions 12 Add it to the first historical lifetime loss rate L1.

4. A method for controlling the lifespan attrition rate of a high-voltage relay, applied to the battery management module of a high-voltage relay, comprising the method for estimating the lifespan attrition rate of a high-voltage relay as described in any one of claims 1-3, characterized in that, include: Obtain the first temperature T1 of the high-voltage relay and the maximum allowable temperature T corresponding to its over-temperature. max ; Obtain the preset first threshold temperature T y1 Second threshold temperature T y2 Wherein, the first threshold temperature T y1 Less than the maximum allowable temperature T max And greater than the second threshold temperature T y2 ; When the first temperature T1 exceeds the first threshold temperature T during the heating process... y1 When the battery management module operates in a specific mode, it executes a first current-limiting mode; otherwise, it executes a second current-limiting mode. The second current-limiting mode is defined as the battery management module's maximum output current I. max The peak current I that the battery can output sop_max .

5. The method for controlling the life loss rate of a high-voltage relay according to claim 4, characterized in that, The first rate limiting mode includes: When the first temperature T1 exceeds the first threshold temperature T during the heating process... y1 At that time, the maximum output current I of the battery management module max for: Where C is the rated capacity of the battery and B is the calibration parameter; Furthermore, in the first current-limiting mode, when the maximum output current I... max The value is reduced to equal the continuous current I that the battery can output. sop_con At that time, the battery management module executes the second current limiting mode.

6. A system for estimating the lifespan loss rate of a high-voltage relay, characterized in that, include: A current acquisition module is used to acquire a first current I1 and a second current I2; wherein, the first current I1 is the instantaneous current flowing through the load circuit in the working module where the high-voltage relay is located when the high-voltage relay is disconnected, and the second current I2 is the instantaneous current flowing through the load circuit in the working module where the high-voltage relay is located when the high-voltage relay is turned on. A temperature acquisition module is used to acquire a first temperature T1 and a second temperature T2; wherein, the first temperature T1 is the temperature of the contacts inside the high-voltage relay when the high-voltage relay is disconnected, and the second temperature T2 is the temperature inside the high-voltage box of the high-voltage relay when the high-voltage relay is turned on; The lifespan attrition rate calculation module is used to calculate the lifespan attrition rate of the high-voltage relay; where: The first influence factor Q1 on the lifespan at which the high-voltage relay is disconnected and the second influence factor Q2 on the lifespan at which it is turned on are calculated according to the current influence factor formula; where, I b I is the reference current of the high-voltage relay, k1 is the current exponent, and S is the voltage of the high-voltage relay at the reference current I. b The number of durability cycles, The first acceleration factor AF1 for the lifespan at which the high-voltage relay is disconnected and the second acceleration factor AF2 for the lifespan at which the high-voltage relay is turned on are calculated based on the Arrenius equation; where e is the Euler number, E a The activation energy is given by k2, where k is the Boltzmann constant and T is the activation energy. b This refers to the rated operating temperature of the high-voltage relay. The disconnection life loss rate L caused by a single disconnection of the high-voltage relay is calculated based on the first influence factor Q1, the second influence factor Q2, the first acceleration factor AF1, and the second acceleration factor AF2. 11 and the conduction life loss rate L caused by a single conduction 12 ;in, 7. A control system for the life loss rate of a high-voltage relay, comprising a method for estimating the life loss rate of a high-voltage relay as described in any one of claims 1-3, characterized in that, include: The temperature acquisition module is used to obtain the first temperature T1 of the high-voltage relay and the maximum allowable temperature T corresponding to over-temperature. max ; Obtain the preset first threshold temperature T y1 Second threshold temperature T y2 Wherein, the first threshold temperature T y1 Less than the maximum allowable temperature T max And greater than the second threshold temperature T y2 ; The current limiting module is used to limit the current when the first temperature T1 exceeds the first threshold temperature T during the heating process. y1 When the battery management module operates in a specific condition, it executes a first current-limiting mode; otherwise, it executes a second current-limiting mode. The second current-limiting mode is defined by the battery management module's maximum output current I. max The peak current I that the battery can output sop_max .

8. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the method described in any one of claims 1-5.

9. A computer program product, characterized in that, The computer program product includes computer program code that, when run on a computer, causes the computer to implement the method as described in any one of claims 1-5.

10. An electronic terminal, comprising a memory, a processor, and a computer program stored in the memory, characterized in that, The processor executes the computer program to implement the method according to any one of claims 1-5.

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