Method and device for measuring wall thickness of single crystal blade, electronic equipment and storage medium

Abstract

The invention discloses a single crystal blade wall thickness measuring method and device, electronic equipment and a storage medium, the method and device are applied to the electronic equipment, and specifically, the wall thickness of one or more measuring points of a single crystal blade to be measured is detected based on calibrated ultrasonic thickness measuring equipment, and the wall thickness initial measurement values of the measuring points are obtained; checking a standard sound velocity value corresponding to the measurement point in a standard sound velocity value table; and correcting the wall thickness initial measurement value by using the standard sound velocity value to obtain the wall thickness value of the single crystal blade to be measured at each measurement point. According to the scheme, the initial wall thickness measurement value obtained by the ultrasonic thickness measurement equipment is corrected, and parameters used for correction are derived from the actual wall thickness of the sample of the single crystal blade by using the calibration test block, so that the method has relatively high credibility, and the wall thickness value obtained when the wall thickness of the single crystal blade is subjected to ultrasonic detection has relatively high accuracy; therefore, the measurement precision and the quality control effect can be prevented from being influenced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of engines, more particularly, to a wall thickness measurement method and device for single crystal blades, an electronic device and a storage medium. BACKGROUND

[0002] Single crystal blades play a key role in high-end equipment such as gas turbines and aero-engines, and their performance directly determines the power output and service life of the equipment. By precisely controlling the primary and secondary crystal orientations of the blades through processes such as the seed crystal method, the high-temperature creep resistance and fatigue strength of the blades can be improved, making single crystal blades have higher performance than traditional blades. Among them, the blade wall thickness is an important geometric size index of single crystal blades, and accurate detection of the blade wall thickness is an important link in the manufacturing and maintenance process of aero-engines.

[0003] At present, ultrasonic detection, as a mainstream non-destructive testing method, is widely used in blade wall thickness measurement because it does not cause damage to the blade during the ultrasonic detection process. However, due to the anisotropy of single crystal materials, the propagation speed of ultrasonic waves in the material also exhibits anisotropic characteristics, that is, the measured sound speed varies when the angle between the sound beam and the crystal orientation changes, resulting in a large error in the wall thickness obtained by ultrasonic detection, which seriously affects the measurement accuracy and quality control effect. SUMMARY

[0004] Therefore, the present application provides a wall thickness measurement method and device for single crystal blades, an electronic device and a storage medium, which can obtain accurate wall thickness values when ultrasonic detection is performed on the wall thickness of single crystal blades, thereby avoiding affecting the measurement accuracy and quality control effect.

[0005] To achieve the above purpose, the present scheme is as follows:

[0006] A wall thickness measurement method for single crystal blades, applied to an electronic device, the wall thickness measurement method comprising the steps of:

[0007] detecting the wall thickness of one or more measurement points of a single crystal blade to be measured based on an ultrasonic thickness measuring device calibrated by a calibration test block, to obtain a preliminary wall thickness value of the measurement points;

[0008] based on a standard sound speed value table, searching for a standard sound speed value corresponding to the measurement point, the standard sound speed value table including a plurality of measurement points and a plurality of standard sound speed values corresponding to the measurement points one by one;

[0009] correcting the preliminary wall thickness value by using the standard sound speed value, to obtain the wall thickness value of the single crystal blade to be measured at each measurement point.

[0010] Optionally, the wall thickness preliminary measurement value is corrected using the standard sound speed value to obtain a wall thickness value of the single crystal blade to be measured at each measurement point, comprising the steps of:

[0011] The wall thickness preliminary measurement value is corrected using the following formula:

[0012] H corr = v std (H0 / v0),

[0013] Wherein, the H corr is the wall thickness value obtained after correction, H0 is the wall thickness preliminary measurement value at the measurement point, v0 is the calibration block sound speed obtained by ultrasonic speed detection on the calibration block, and v std is the standard sound speed value at the measurement point.

[0014] Optionally, it further comprises the steps of:

[0015] A standard sound speed value table is constructed based on the measured data of the calibration block and a plurality of single crystal blade samples.

[0016] Optionally, the standard sound speed value table is constructed based on the measured data of the calibration block and a plurality of single crystal blade samples, comprising the steps of:

[0017] The ultrasonic thickness measuring device is calibrated based on the calibration block with accurate thickness measurement;

[0018] The thickness of a plurality of sample measurement points of each single crystal blade sample in the selected plurality of single crystal blade samples is measured using the calibrated ultrasonic thickness measuring device to obtain a plurality of sample wall thickness preliminary measurement values of each single crystal blade sample;

[0019] A plurality of measured wall thickness values obtained by actual dissection measurement of the single crystal blade sample are obtained;

[0020] Based on the plurality of sample wall thickness preliminary measurement values and the plurality of measured wall thickness values, the ultrasonic wave transmission speed corresponding to each sample measurement point in each single crystal blade sample is calculated;

[0021] A plurality of the ultrasonic wave transmission speeds are averaged to obtain a standard sound speed value of each measurement point;

[0022] A standard sound speed value table is constructed based on a plurality of the standard sound speed values.

[0023] Optionally, the ultrasonic wave transmission speed corresponding to each sample measurement point in each single crystal blade sample is calculated based on the plurality of sample wall thickness preliminary measurement values and the plurality of measured wall thickness values, comprising the steps of:

[0024] The ultrasonic transmission speed is calculated based on the following formula:

[0025]

[0026] In the formula, v i is the ultrasonic transmission speed of a measurement point on the i-th single crystal blade sample, is the measured wall thickness value of the measurement point of the i-th single crystal blade sample, is the sample wall thickness preliminary measurement value of the j-th measurement of the measurement point of the i-th single crystal blade sample, v0 is the speed of sound of the calibration block, and n is the number of measurements for each measurement point.

[0027] Optionally, the multiple ultrasonic transmission speeds are averaged to obtain a standard speed value of each measurement point, including the steps of:

[0028] Each ultrasonic transmission speed is calculated based on the following formula:

[0029]

[0030] v std is the standard speed value of each measurement point, v i is the ultrasonic transmission speed of the i-th measurement point, and n is the number of single crystal blade samples.

[0031] A wall thickness measurement device for a single crystal blade, applied to an electronic device, the wall thickness measurement device comprising:

[0032] A wall thickness preliminary measurement module configured to detect the wall thickness at one or more measurement points of a single crystal blade to be measured by an ultrasonic thickness measurement device calibrated by a calibration block, to obtain a wall thickness preliminary measurement value at the measurement point;

[0033] A table lookup operation module configured to look up a standard speed value corresponding to the measurement point in a standard speed value table, the standard speed value table including multiple measurement points and multiple standard speed values corresponding to the measurement points one by one;

[0034] A correction processing module configured to correct the wall thickness preliminary measurement value using the standard speed value to obtain a wall thickness value of the single crystal blade to be measured at each measurement point.

[0035] Optionally, it further comprises:

[0036] A table construction module configured to construct the standard speed value table based on the measured data of the calibration block and multiple single crystal blade samples.

[0037] An electronic device, comprising at least one processor and a memory connected with the processor, wherein:

[0038] The memory is used to store computer programs or instructions;

[0039] The processor is used to execute the computer programs or instructions, so that the electronic device implements the wall thickness measurement method as described above.

[0040] A computer-readable storage medium applied to an electronic device, the storage medium carrying one or more computer programs, the one or more computer programs being executable by the electronic device, so that the electronic device can implement the wall thickness measurement method as described above.

[0041] From the above technical solution, it can be seen that the present application discloses a wall thickness measurement method and device for single crystal blades, electronic devices and storage media. The method and device are applied to electronic devices, specifically, the wall thickness of one or more measurement points of a single crystal blade to be measured is detected based on an ultrasonic thickness measuring device calibrated by a calibration test block, and a standard sound velocity value corresponding to the measurement point is obtained from a standard sound velocity value table. The standard sound velocity value table includes a plurality of measurement points and a plurality of standard sound velocity values corresponding to the measurement points one by one. The standard sound velocity value is used to correct the wall thickness preliminary measurement value, and the wall thickness value of the single crystal blade to be measured at each measurement point is obtained. Since the wall thickness preliminary measurement value obtained by the ultrasonic thickness measuring device is corrected, and the parameters used for correction are derived from the actual wall thickness of the single crystal blade sample and the calibration test block, the wall thickness value obtained by ultrasonic detection of the wall thickness of the single crystal blade has high accuracy, thereby avoiding affecting the measurement precision and quality control effect. BRIEF DESCRIPTION OF DRAWINGS

[0042] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed in the embodiment or prior art description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and those skilled in the art can obtain other drawings according to these drawings without creative labor.

[0043] Figure 1 A flowchart of a wall thickness measurement method for a single crystal blade according to an embodiment of the present application;

[0044] Figure 2 A schematic diagram of a plurality of measurement points of a single crystal blade according to an embodiment of the present application;

[0045] Figure 3 A schematic diagram of a cutting section of a single crystal blade according to an embodiment of the present application;

[0046] Figure 4 A block diagram of a wall thickness measurement device of a single crystal blade according to an embodiment of the present application;

[0047] Figure 5 A block diagram of another wall thickness measurement device of a single crystal blade according to an embodiment of the present application;

[0048] Figure 6 A block diagram of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0049] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by a person of ordinary skill in the art without creative work fall within the protection scope of the present application.

[0050] The present application provides a wall thickness measurement scheme of a single crystal blade, which is applied to an electronic device and used for measuring the thickness of multiple points on a single crystal blade of a certain type. The electronic device can be understood as a computer, a server or a cloud platform with data calculation and information processing capabilities. The scheme of the present application takes a DD5 alloy single crystal blade as an example to specifically describe the wall thickness measurement scheme. The single crystal blade of the present application is a single crystal blade grown by a seed crystal method and with controlled crystal orientation. Because the first and second crystal orientations of this single crystal blade are controlled, the sound velocity at each point is stable, so the average value of the sound velocities at the same points of multiple typical blades can be taken as the standard sound velocity. The deviation of the first crystal orientation of the blade from the Z-axis of the blade casting is ≤10°, and the deviation of the second crystal orientation of the blade from the X-axis of the blade casting is ≤10°. The specific scheme is as follows.

[0051] Figure 1 A flowchart of a wall thickness measurement method of a single crystal blade according to an embodiment of the present application.

[0052] As shown in Figure 1 The wall thickness measurement method provided by the present embodiment specifically includes the following steps:

[0053] S1, detecting the wall thickness at one or more measurement points of a single crystal blade to be measured based on an ultrasonic thickness measurement device, to obtain a preliminary measurement value of the wall thickness at each measurement point.

[0054] The ultrasonic thickness measuring device is a thickness measuring instrument based on ultrasonic wave measuring principle, which measures the thickness by emitting ultrasonic signals to the surface of each measuring point on the single crystal blade through an ultrasonic probe and receiving the reflected ultrasonic signals. Before the ultrasonic thickness measuring device measures the wall thickness, it needs to be calibrated. In the calibration process, a calibration block with known wall thickness and same material and state as the single crystal blade to be measured is selected. Then the thickness of the calibration block is measured by using the ultrasonic thickness measuring device, and the sound velocity of the ultrasonic measuring device is adjusted at the same time, so that the obtained structure is the same as the known wall thickness, thereby completing the calibration.

[0055] After the ultrasonic thickness measuring device is calibrated, it is used to detect multiple measuring points on the single crystal blade. As shown in Figure 2 , the selected multiple measuring points are k1, k2, k3, k4, k5, k6, k7 and k8 respectively. The initial wall thickness H0 corresponding to each measuring point is obtained by measurement.

[0056] S2, searching for the standard sound velocity value corresponding to the measuring point based on the standard sound velocity value table.

[0057] A standard sound velocity value table is constructed in advance, which includes the numbers or positions of multiple measuring points, and also includes multiple standard sound velocity values v std corresponding to the measuring points one by one. The purpose of searching is to correct the previous initial wall thickness to obtain the accurate wall thickness.

[0058] S3, correcting the initial wall thickness by using the standard sound velocity value to obtain the wall thickness value of the single crystal blade to be measured at each measuring point.

[0059] After obtaining the standard sound velocity value by searching the table, the initial wall thickness of each measuring point, the standard sound velocity value and the calibration sound velocity value are calculated by using a preset formula, so as to obtain the wall thickness value H corr at each measuring point on the single crystal blade to be measured:

[0060] H corr = v std (H0 / v0)

[0061] In the formula, H corr is the corrected wall thickness value of the single crystal blade at a measuring point, H0 is the initial wall thickness of the measuring point, v0 is the calibration block sound velocity, and v std is the standard sound velocity value of the point. The calibration block sound velocity in the present application refers to the propagation speed of ultrasonic wave in the above-mentioned calibration block, that is, the ultrasonic wave transmission speed value when the thickness value displayed by the ultrasonic thickness measuring device is the same as the actual thickness value of the calibration block in the above-mentioned calibration process.

[0062] The results are verified by actual implementation of the above scheme, and the results of the following table are obtained.

[0063]

[0064]

[0065] From the above table, it can be seen that the above scheme can significantly improve the accuracy of single crystal blade wall thickness measurement, and the maximum measurement error is not more than 0.05mm. At the same time, through the standardization of measurement process and the correction mechanism of sound velocity, the detection efficiency is greatly improved, which effectively guarantees the production quality of single crystal blade and the operation reliability of aero-engine, and has engineering practical value.

[0066] From the above technical scheme, it can be seen that the embodiment provides a wall thickness measurement method of a single crystal blade. The method is applied to an electronic device, and specifically, an ultrasonic thickness measuring device calibrated based on a calibration test block is used to detect the wall thickness of one or more measurement points of a single crystal blade to be measured, to obtain a wall thickness preliminary measurement value at the measurement point. The corresponding standard sound velocity value in the standard sound velocity value table is searched based on the standard sound velocity value table, and the standard sound velocity value table includes a plurality of measurement points and a plurality of standard sound velocity values corresponding to the measurement points one by one. The standard sound velocity value is used to correct the wall thickness preliminary measurement value, to obtain the wall thickness value of the single crystal blade to be measured at each measurement point. Since the wall thickness preliminary measurement value obtained by the ultrasonic thickness measuring device is corrected, and the parameters used for correction are derived from the actual wall thickness of the calibration test block and the samples of the single crystal blade, the wall thickness value obtained by ultrasonic detection of the wall thickness of the single crystal blade has high accuracy, thereby avoiding affecting the measurement precision and quality control effect.

[0067] In one specific embodiment of the present application, the following steps are further included, which are used to construct the standard sound velocity value table based on the calibration test block and the actual measurement data of a plurality of single crystal blade samples. The specific process is as follows:

[0068] First, 5 typical blades with certain representative crystal orientations satisfying the design requirements are selected, and the primary and secondary crystal orientation deviation degrees of each blade are shown in the following table.

[0069]

[0070] The speed of sound was calibrated using DD5 alloy calibration block in a constant temperature (20°C ± 1°C) and constant humidity (40% ± 5%) environment, and was 5300 m / s using a NOVASCOPE 6000 ultrasonic thickness gauge produced by NDT Systems Inc. The wall thickness of each point of the five vanes was measured three times, and the average wall thickness was calculated. Subsequently, the vanes were dissected, and the real wall thickness of each point of the vanes was measured using a high-precision caliper, and the speed of sound of each point of the vanes was calculated. Subsequently, the average speed of sound of the same measurement points of the five typical vanes was calculated to form a speed of sound standard value table of the vanes of the model, as shown in the following table.

[0071]

[0072] By constructing the standard speed of sound value table, table lookup can be performed during actual measurement each time in the future, without the need to reconstruct each time.

[0073] The flow diagrams and block diagrams in the drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flow diagrams and block diagrams can represent a module, a segment, or a portion of code, which comprises one or more executable instructions for implementing the specified logical functions. It should also be noted that in some alternative implementations, the functions noted in the blocks can occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently or in the reverse order, depending on the functionality involved. It will also be noted that each block in the block diagrams and / or flow diagrams, and combinations of blocks in the block diagrams and / or flow diagrams, can be implemented by special purpose hardware-based systems that perform the specified functions or operations, or combinations of special purpose hardware and computer instructions.

[0074] Although the operations are depicted in a particular order, this should not be understood as requiring the operations to be performed in the particular order shown or in sequential order, in some circumstances, multitasking and parallel processing can be advantageous.

[0075] It should be understood that each of the steps of the method embodiments of the present disclosure can be performed in a different order, and / or in parallel. In addition, the method embodiments can include additional steps and / or omit performing the steps shown. The scope of the present disclosure is not limited in this regard.

[0076] Computer program code for carrying out operations of the present disclosure can be written in any combination of one or more programming languages, including an object oriented programming language such as Java, Smalltalk, C++ or the like, and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code can execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the latter scenario, the remote computer can be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or the connection can be made to an external computer (for example, through the Internet using an Internet Service Provider).

[0077] Figure 4 A block diagram of a wall thickness measuring device for a single crystal blade according to an embodiment of the present application.

[0078] As shown in Figure 4 , the wall thickness measuring device according to the present embodiment specifically includes a wall thickness preliminary measurement module 10, a table lookup operation module 20 and a correction processing module 30.

[0079] The wall thickness preliminary measurement module is configured to detect the wall thickness at one or more measurement points on the single crystal blade to be measured by using an ultrasonic thickness measuring device calibrated by using a calibration test block, to obtain a wall thickness preliminary measurement value at each measurement point.

[0080] The ultrasonic thickness measuring device is a thickness measuring instrument based on ultrasonic measurement principle, which is configured to measure the thickness by emitting ultrasonic signals to the surface of each measurement point on the single crystal blade by an ultrasonic probe and receiving the reflected ultrasonic signals. Before the ultrasonic thickness measuring device measures the wall thickness, it needs to be calibrated. In the present application, a calibration test block with known wall thickness and same material and state as the single crystal blade to be measured is selected. Then the thickness of the calibration test block is measured by using the ultrasonic thickness measuring device, and at the same time the sound velocity of the ultrasonic measuring device is adjusted so that the structure obtained is the same as the known wall thickness, thereby completing the calibration.

[0081] After the ultrasonic thickness measuring device is calibrated, it is used to detect a plurality of measurement points on the single crystal blade, as shown in Figure 2 , the selected plurality of measurement points are k1, k2, k3, k4, k5, k6, k7 and k8 respectively. The wall thickness preliminary measurement value H0 corresponding to each measurement point is obtained by measurement.

[0082] The table lookup operation module is configured to look up the standard sound velocity value corresponding to the measurement point based on a standard sound velocity value table.

[0083] The application will construct a standard sound velocity value table in advance, which includes the numbers or positions of multiple measuring points and multiple standard sound velocity values v std The purpose of the lookup is to correct the previous wall thickness preliminary value to obtain an accurate wall thickness value.

[0084] The correction processing module is used to correct the wall thickness preliminary value by using the standard sound velocity value to obtain the wall thickness value of the single crystal blade at each measuring point.

[0085] After obtaining the standard sound velocity value by looking up the table, the wall thickness preliminary value and the standard sound velocity value of each measuring point, and the calibrated sound velocity value are calculated by using a preset formula, so as to obtain the wall thickness value H corr :

[0086] H corr =v std (H0 / v0)

[0087] In the formula, H corr is the corrected wall thickness value of the single crystal blade at a measuring point, H0 is the wall thickness preliminary value of the measuring point, v0 is the calibrated test block sound velocity, and v std is the standard sound velocity value of the point. The calibrated test block sound velocity in the application refers to the propagation speed of the ultrasonic wave in the above-mentioned calibrated test block, that is, the ultrasonic transmission speed value when the thickness value displayed by the ultrasonic thickness measuring device is the same as the actual thickness value of the calibrated test block in the above-mentioned calibration process.

[0088] Through actual implementation of the above scheme, the result is verified to obtain the result content of the following table.

[0089]

[0090] As can be seen from the above table, the above scheme can significantly improve the accuracy of the single crystal blade wall thickness measurement, and the maximum measurement error is not more than-0.05mm. At the same time, through the standardized measurement process and the sound velocity correction mechanism, the detection efficiency is greatly improved, the single crystal blade production quality and the aviation engine operation reliability are effectively guaranteed, and the scheme has engineering practical value.

[0091] From the above technical solution can be seen, the embodiment provides a wall thickness measuring device of a single crystal blade, the device is applied to an electronic device, specifically, an ultrasonic thickness measuring device calibrated based on a calibration test block is used to detect the wall thickness of one or more measurement points of a single crystal blade to be measured, and an initial measurement value of the wall thickness at the measurement point is obtained; a standard sound velocity value corresponding to the measurement point is searched from a standard sound velocity value table, the standard sound velocity value table includes a plurality of measurement points and a plurality of standard sound velocity values corresponding to the measurement points one by one; the initial measurement value of the wall thickness is corrected by using the standard sound velocity value, and a wall thickness value of the single crystal blade to be measured at each measurement point is obtained. Since the initial measurement value of the wall thickness obtained by the ultrasonic thickness measuring device is corrected, and the parameter used for correction is derived from the actual wall thickness of the sample of the single crystal blade by using the calibration test block, the wall thickness value obtained by ultrasonic detection of the wall thickness of the single crystal blade has high accuracy, so that the measurement precision and the quality control effect can be avoided.

[0092] In one specific embodiment of the present application, a number table construction module 40 is further included, as shown in Figure 5 The number table construction module is used in the present step to construct the standard sound velocity value table based on the calibration test block and the measured data of the plurality of single crystal blade samples. The construction process has been provided above, and will not be described here.

[0093] The units described in the embodiments of the present disclosure can be implemented in a software manner or in a hardware manner. In some cases, the name of the unit does not constitute a limitation on the unit itself, for example, the first acquisition unit can also be described as an "acquisition unit of at least two internet protocol addresses".

[0094] The functions described above in the present disclosure can be performed at least in part by one or more hardware logic components. For example, non-limiting example types of hardware logic components that can be used include: field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), system on a chip (SOCs), complex programmable logic devices (CPLDs), and the like.

[0095] Figure 6 A block diagram of an electronic device according to an embodiment of the present application.

[0096] Reference will now be made to Figure 6FIG. 1 is a block diagram illustrating a structure of an electronic device according to an embodiment of the present disclosure. The electronic device can include a processor 120, a memory 130, a communication interface 140, and a display 150. The processor 120 can include one or more processors or processing circuits. The memory 130 can include one or more volatile and / or non-volatile memories. The communication interface 140 can include one or more communication interfaces. The display 150 can include one or more displays. The electronic device can further include other components, such as a user input interface, a power supply, etc. The electronic device is merely an example, and should not limit the scope of the embodiments of the present disclosure.

[0097] The electronic device can include a processing device (e.g., a central processor, a graphic processor, etc.) 601 that can perform various appropriate actions and processes according to programs stored in a read-only memory (ROM) 602 or loaded into a random access memory (RAM) 603 from an input device 606. In the RAM, various programs and data required for operations of the electronic device are also stored. The processing device, the ROM, and the RAM are connected to each other through a bus 604. An input / output (I / O) interface 605 is also connected to the bus 604.

[0098] Generally, the following devices can be connected to the I / O interface: input devices including, for example, a touch screen, a touch pad, a keyboard, a mouse, a camera, a microphone, an accelerometer, a gyroscope, etc.; output devices 607 including, for example, a liquid crystal display (LCD), a speaker, a vibrator, etc.; storage devices 608 including, for example, a magnetic tape, a hard disk, etc.; and communication devices 609. The communication devices 609 can allow the electronic device to communicate with other devices wirelessly or wired to exchange data. Although the electronic device is shown with various devices, it should be understood that all of the shown devices are not required to be implemented or possessed. More or less devices can be alternatively implemented or possessed.

[0099] The present application also provides a computer-readable storage medium embodiment.

[0100] The computer readable storage medium described above is applied to an electronic device and carries one or more computer programs, when the one or more computer programs are executed by the electronic device, the electronic device can detect the wall thickness at one or more measurement points of the single crystal blade to be measured based on an ultrasonic thickness measuring device calibrated by using a calibration test block, to obtain a wall thickness preliminary measurement value at the measurement point; based on a standard sound velocity value corresponding to the measurement point in a standard sound velocity value table, the standard sound velocity value table includes a plurality of measurement points and a plurality of standard sound velocity values corresponding to the measurement points one by one; the wall thickness preliminary measurement value is corrected by using the standard sound velocity value to obtain the wall thickness value of the single crystal blade to be measured at each measurement point. Since the wall thickness preliminary measurement value obtained by the ultrasonic thickness measuring device is corrected, and the parameters used for correction are derived from the actual wall thickness of the single crystal blade sample by using the calibration test block, the wall thickness value obtained by the ultrasonic detection of the wall thickness of the single crystal blade has high accuracy, thereby avoiding affecting the measurement precision and quality control effect.

[0101] It should be noted that the computer readable medium described above in the present disclosure can be a computer readable signal medium or a computer readable storage medium or any combination of the two. The computer readable storage medium may, for example, but is not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or component, or any combination thereof. More specific examples of computer readable storage media can include, but are not limited to, an electrical connection having one or more wires, a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0102] In the present disclosure, the computer readable storage medium can be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, device or component. In the present disclosure, the computer readable signal medium can include a data signal carried in a baseband or as a part of a carrier wave, which carries computer readable program code. Such a propagated data signal can take various forms, including but not limited to electromagnetic signals, optical signals or any suitable combination thereof. The computer readable signal medium can also be any computer readable medium other than the computer readable storage medium, which can send, propagate or transmit a program for use by or in conjunction with an instruction execution system, device or component. The program code contained on the computer readable medium can be transmitted by any suitable medium, including but not limited to a wire, a cable, an optical fiber, an RF (radio frequency) or the like, or any suitable combination thereof.

[0103] Various embodiments of the present specification are described in progressive manner, and each embodiment focuses on the difference from other embodiments, and the same or similar parts between various embodiments can be referred to each other.

[0104] Although the preferred embodiments of the embodiments of the present application have been described, those skilled in the art can make further changes and modifications to the embodiments once they know the basic inventive concept. Therefore, the appended claims are intended to cover all the preferred embodiments and all the changes and modifications falling within the scope of the embodiments of the present application.

[0105] Finally, it should also be noted that, in this document, the relationship terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between the entities or operations. Moreover, the terms "include", "contain" or any other variants thereof are intended to cover non-exclusive inclusion, so that the process, method, article or terminal device including a series of elements not only includes those elements, but also includes other elements not explicitly listed or inherent to such process, method, article or terminal device. Without more limitations, the element defined by the statement "including a" does not exclude the presence of other identical elements in the process, method, article or terminal device including the element.

[0106] The above describes the technical solutions provided by the present application in detail, and the principles and implementation manners of the present application are described by applying specific examples; the above embodiment description is only for helping to understand the method of the present application and its core idea; meanwhile, for those skilled in the art, according to the idea of the present application, the specific implementation manner and application range will have changes, and the above description of the present application should not be understood as a limitation of the present application.

Claims

1. A method of measuring a wall thickness of a single crystal blade, applied to an electronic device, characterized by, The wall thickness measurement method comprises the steps of: detecting the wall thickness at one or more measurement points of a single crystal blade to be measured by an ultrasonic thickness measuring device calibrated by a calibration test block, to obtain a preliminary wall thickness measurement value at the measurement point; obtaining a standard sound velocity value corresponding to the measurement point from a standard sound velocity value table comprising a plurality of measurement points and a plurality of standard sound velocity values corresponding to the measurement points one by one; correcting the preliminary wall thickness measurement value by using the standard sound velocity value to obtain the wall thickness value of the single crystal blade to be measured at each measurement point.

2. The wall thickness measurement method of claim 1, wherein The step of correcting the preliminary wall thickness measurement value by using the standard sound velocity value to obtain the wall thickness value of the single crystal blade to be measured at each measurement point comprises the steps of: correcting the preliminary wall thickness measurement value by using the following formula: H corr = v std (H0 / v0), Wherein, the H corr is the wall thickness value after correction, H0 is the initial wall thickness value at the measurement point, v0 is the calibration block sound velocity obtained by ultrasonic speed detection on the calibration block, v std is the standard sound velocity value at the measurement point.

3. The wall thickness measurement method according to claim 1 or 2, characterized by, The step of correcting the preliminary wall thickness measurement value by using the standard sound velocity value to obtain the wall thickness value of the single crystal blade to be measured at each measurement point further comprises the steps of: constructing the standard sound velocity value table based on the measured data of the calibration test block and a plurality of single crystal blade samples.

4. The wall thickness measurement method of claim 3, wherein The step of constructing the standard sound velocity value table based on the measured data of the calibration test block and a plurality of single crystal blade samples comprises the steps of: calibrating the ultrasonic thickness measuring device by using the calibration test block with accurate thickness measurement; measuring the thickness of a plurality of sample measurement points of each single crystal blade sample selected from the plurality of single crystal blade samples by using the calibrated ultrasonic thickness measuring device, to obtain a plurality of preliminary sample wall thickness measurement values of each single crystal blade sample; obtaining a plurality of actual measurement wall thickness values obtained by actually dissecting and measuring the single crystal blade samples; calculating the ultrasonic wave transmission speed corresponding to each sample measurement point in each single crystal blade sample based on the plurality of preliminary sample wall thickness measurement values and the plurality of actual measurement wall thickness values; averaging a plurality of the ultrasonic wave transmission speeds to obtain a standard sound velocity value of each measurement point; constructing the standard sound velocity value table based on a plurality of the standard sound velocity values.

5. The wall thickness measurement method of claim 4, wherein, The step of calculating the ultrasonic wave transmission speed corresponding to each sample measurement point in each single crystal blade sample based on the plurality of preliminary sample wall thickness measurement values and the plurality of actual measurement wall thickness values comprises the steps of: calculating the ultrasonic wave transmission speed based on the following formula: wherein v i is the ultrasonic wave transmission speed of the i-th single crystal blade sample at the measurement point, is the measured wall thickness value of the i-th single crystal blade sample at the measurement point, is the sample wall thickness preliminary measurement value of the i-th single crystal blade sample at the measurement point in the j-th measurement, v0 is the speed of sound of the calibration test block, and n is the number of measurements for each measurement point.

6. The wall thickness measurement method of claim 4, wherein, The step of averaging a plurality of the ultrasonic wave transmission speeds to obtain a standard sound velocity value of each measurement point comprises the steps of: calculating each ultrasonic wave transmission speed based on the following formula: v std is a standard sound velocity value for each of the measurement points, v i is the ultrasonic wave transmission speed of the i-th measurement point, and n is the number of the single crystal blade samples.

7. A wall thickness measuring device of a single crystal blade, applied to an electronic device, characterized by, The wall thickness measurement device comprises: a preliminary wall thickness measurement module configured to detect the wall thickness at one or more measurement points of a single crystal blade to be measured by an ultrasonic thickness measuring device calibrated by a calibration test block, to obtain a preliminary wall thickness measurement value at the measurement point; a table lookup operation module configured to obtain a standard sound velocity value corresponding to the measurement point from a standard sound velocity value table comprising a plurality of measurement points and a plurality of standard sound velocity values corresponding to the measurement points one by one; a correction processing module configured to correct the preliminary wall thickness measurement value by using the standard sound velocity value to obtain the wall thickness value of the single crystal blade to be measured at each measurement point.

8. The wall thickness measuring device of claim 7, wherein, Further comprising: A number table construction module is configured to construct the standard sound velocity value table based on the measured data of the calibration test block and the plurality of single crystal blade samples.

9. An electronic device, comprising: The electronic device includes at least one processor and a memory connected to the processor, wherein: The storage is used to store computer programs or instructions; The processor is used to execute the computer programs or instructions to enable the electronic device to implement the wall thickness measurement method according to any one of claims 1-6. 10.A storage medium readable by a computer, applied to an electronic device, and having stored thereon a plurality of instructions which, when executed by the electronic device, cause the electronic device to perform the method of any one of claims 1 to 9. The storage medium carries one or more computer programs, which can be executed by the electronic device, so that the electronic device can implement the wall thickness measurement method according to any one of claims 1-6.

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