Aging test system and method for power equipment

Abstract

The invention relates to the technical field of measurement and measurement, and particularly discloses an aging test system and method for power equipment, and the method comprises the steps: obtaining an operation change curve corresponding to the operation parameters of an energy storage power supply in two historical operation cycles closest to the current test time, obtaining a non-coincidence value of the curve based on the operation change curve, and obtaining a non-coincidence value of the non-coincidence value; selecting a target test parameter based on the non-coincidence value of the curve, and dividing the target test parameter into a key target test parameter and a non-key target test parameter based on the curve non-coincidence value corresponding to the target test parameter, the aging test time of the key target test parameters and the aging test time of the non-key target test parameters are distributed according to the performance values of the key target test parameters and the non-key target test parameters, and the aging test total time is distributed based on the key target test parameters and the non-key target test parameters; and respectively and specifically distributing the total time of the key target test parameters and the non-key target test parameters through curve non-coincidence values of the key target test parameters and the non-key target test parameters.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of measurement and measurement technology, and particularly relates to an aging test system and method for power equipment. BACKGROUND

[0002] With the rapid development of power technology, energy storage power supplies are increasingly widely used in the fields of power systems, electric vehicles, portable devices, etc. However, energy storage power supplies will be affected by various factors such as temperature, humidity, charge and discharge cycles during long-term use, resulting in gradual performance degradation. Therefore, it is particularly important to perform aging tests on energy storage power supplies to evaluate their reliability and durability in actual use.

[0003] In the prior art, the energy storage system is modularized to realize mutual aging test processes between energy storage modules, thereby saving the aging test cost of the energy storage system. However, there is a lack of analysis of the operating parameters of the energy storage power supply in the aging analysis process, which cannot reasonably allocate the aging test time, resulting in waste of test resources and low aging test efficiency.

[0004] Therefore, the present application provides an aging test system and method for power equipment. SUMMARY

[0005] In order to make up for the deficiencies of the prior art and solve at least one technical problem raised in the background art.

[0006] The technical scheme adopted by the present application to solve the technical problems is: an aging test system and method for power equipment, comprising: Step 1: obtaining the operating parameters of the energy storage power supply in the two nearest historical operating periods adjacent to the current test time, wherein the operating parameters include output current, output voltage and output power, constructing the operating change curve corresponding to the operating parameters in each historical operating period based on the operating parameters, and selecting the target test parameter among all operating parameters based on the analysis of the operating change curve; Step 2: based on the target test parameter, processing and analyzing the curve non-coincidence value corresponding to the target test parameter, and dividing the target test parameter into key target test parameters and non-key target test parameters; Step 3: based on the number of key target test parameters and non-key target test parameters and the curve non-coincidence value, processing to obtain the key target test parameter performance value ZB and the non-key target test parameter performance value FB, and allocating the total aging test time of the key target test parameters and the non-key target test parameters according to the key target test parameter performance value ZB and the non-key target test parameter performance value FB; Step four: based on the total aging test time of the key target test parameters and the non-key target test parameters and the curve non-coincidence value of the key target test parameters and the non-key target test parameters, the aging test time of the key target test parameters and the non-key target test parameters is specifically allocated.

[0007] As a further scheme of the present application: the acquisition method of the target test parameters is: The obtained curve non-coincidence value FC is compared with the preset curve non-coincidence threshold FY, and specifically: If the curve non-coincidence value FC corresponding to the operating parameter is greater than or equal to the curve non-coincidence threshold FY, the operating parameter is marked as a target test parameter; If the curve non-coincidence value FC corresponding to the operating parameter is less than the curve non-coincidence threshold FY, the operating parameter is marked as a non-target test parameter.

[0008] As a further scheme of the present application: the acquisition method of the curve non-coincidence value FC is: The obtained curve length deviation value CD and the curve area deviation value MD are processed, and the curve non-coincidence value FC is obtained through the formula

[0009] As a further scheme of the present application: the acquisition method of the curve length deviation value CD is: In some embodiments, the operating parameters in the historical running period are obtained, a two-dimensional rectangular coordinate system is constructed with time as the X-axis and the operating parameters as the Y-axis, the operating parameters in the historical running period are marked in the coordinate system to obtain the operating change curve in the historical running period; The same type of operating change curves in two historical running periods are compared and analyzed, and specifically: The horizontal length of the part of the curve that does not coincide between the two same type operating change curves is measured, and a ratio processing is performed on the horizontal length corresponding to the operating change curve to obtain the curve length deviation value, which is marked as CD.

[0010] As a further scheme of the present application: the acquisition method of the curve area deviation value MD is: The area surrounded by the part of the curve that does not coincide between the two same type operating change curves is measured and marked as the deviation area, and a ratio processing is performed on the deviation area and the deviation area threshold to obtain the curve area deviation value, which is marked as MD.

[0011] As a further scheme of the present application: the acquisition method of the key target test parameters and the non-key target test parameters is: The curve non-coincidence values FC corresponding to all target test parameters are summed and then averaged to obtain the curve non-coincidence average value corresponding to the target test parameters. ​The difference between the curve non-coincident value FC corresponding to the target test parameter and the mean of the curve non-coincident value is processed, and the absolute value of the difference is taken to obtain the curve non-coincident deviation value corresponding to the target test parameter. The mean value of the non-coincidence deviation of the curves corresponding to all target test parameters is obtained by summing and averaging the values. The obtained curve non-coincidence deviation values ​​corresponding to the target test parameters are compared with the mean curve non-coincidence deviation. Specifically: If the curve non-coincidence deviation value corresponding to the target test parameter is greater than the mean curve non-coincidence deviation, then the target test parameter is marked as a key target test parameter. If the non-coincidence deviation value of the running curve corresponding to the target test parameter is less than or equal to the mean non-coincidence deviation value of the curve, then the target test parameter is marked as a non-key target test parameter.

[0012] As a further aspect of the present invention: the method for obtaining the performance value ZB of the key target test parameter and the performance value FB of the non-key target test parameter is as follows: The number of test parameters for key targets is counted, and the ratio of the number of test parameters for key targets to the number of test parameters for all targets is calculated to obtain the proportion value of test parameters for key targets, ZMB. The number of non-key target test parameters is obtained by subtracting the number of target test parameters from the number of key target test parameters. The ratio of the number of non-key target test parameters to the number of target test parameters is then calculated to obtain the proportion value of non-key target test parameters (FMB). First, sum the non-coincident values ​​of the curves corresponding to the test parameters of all key targets to obtain the total non-coincident value FFZ of the curves corresponding to the test parameters of key targets. Then, take the average value of the total non-coincident value FFZ of the curves corresponding to the test parameters of key targets to obtain the average value ZFJ of the curves corresponding to the test parameters of key targets. First, sum the non-overlapping curve values ​​corresponding to all non-key target test parameters to obtain the total non-overlapping curve value FFC. Then, take the average value of the total non-overlapping curve value FFC corresponding to the non-key target test parameters to obtain the mean value FFJ of the non-overlapping curve value corresponding to the non-key target test parameters. Through formula Obtain the mean weight of the test parameters for key targets (ZJZ); Through formula Obtain the mean weight of test parameters for non-key targets (FJZ); Based on the test parameters of key targets, using the formula The performance values ​​ZB of the key target test parameters were obtained; Based on the test parameters of non-key targets, using the formula Obtain the performance values ​​(FB) of the test parameters for non-key targets.

[0013] As a further scheme of the present application: the obtaining method of the total aging test time of the key target test parameter and the non-key target test parameter is: Based on the key target test parameter, the total aging test time Tz of the key target test parameter is obtained through the formula Based on the non-key target test parameter, the total aging test time Tf of the non-key target test parameter is obtained through the formula

[0014] As a further scheme of the present application: the obtaining method of the specific aging test time of the key target test parameter and the non-key target test parameter is: Based on the target test parameter being the key target test parameter, the non-coincidence value FC of the key target test parameter, the total non-coincidence value FFZ of the curve corresponding to the key target test parameter, and the total aging test time Tz allocated to the key target test parameter are processed; According to the formula The aging test time Tzf of the key target test parameter is obtained; Based on the target test parameter being the non-key target test parameter, the non-coincidence value FC of the non-key target test parameter, the total non-coincidence value FFC of the curve corresponding to the non-key target test parameter, and the total aging test time Tf allocated to the non-key target test parameter are processed; According to the formula The aging test time Tff of the non-key target test parameter is obtained.

[0015] As a further scheme of the present application: The running parameter type analysis module: the running parameters of the energy storage power supply in the two nearest historical running periods adjacent to the current test time are obtained, wherein the running parameters include but are not limited to output current, output voltage, and output power, the running change curve corresponding to the running parameters in each historical running period is constructed based on the running parameters, and the target test parameter is selected from all running parameters based on the analysis of the running change curve; The target test parameter type analysis module: based on the target test parameter, the curve non-coincidence value corresponding to the target test parameter is processed and analyzed, and the target test parameter is divided into the key target test parameter and the non-key target test parameter; ​​aging test time allocation module: based on the number of key target test parameters and non-key target test parameters and the curve non-coincidence value, the key target test parameter performance value ZB and the non-key target test parameter performance value FB are obtained by processing, and the aging test total time of the key target test parameter and the non-key target test parameter is allocated according to the key target test parameter performance value ZB and the non-key target test parameter performance value FB; aging test time reallocation module: based on the aging test total time of the key target test parameter and the non-key target test parameter and the curve non-coincidence value of the key target test parameter and the non-key target test parameter, the aging test total time of the key target test parameter and the non-key target test parameter is allocated.

[0016] The beneficial effects of the present application are as follows: 1. Based on the operating parameters, the operating change curve corresponding to the operating parameters in each historical operating cycle is constructed and analyzed, and the target test parameters are selected; the curve non-coincidence value corresponding to the target test parameters is processed and analyzed, and the target test parameters are divided into key target test parameters and non-key target test parameters; after the target test parameters are selected from the operating parameters, they are divided into key target test parameters and non-key target test parameters; by analyzing the curve non-coincidence value corresponding to the operating parameters, the target test parameters are selected, which can clearly determine which operating parameters are the main test objects, so as to ensure that the limited test resources are accurately invested in these main test parameters, and then the target test parameters are divided into key target test parameters and non-key target test parameters, which can be more purposeful for the allocation of aging test time in the next step, thereby avoiding the waste and dispersion of aging test time and improving the utilization rate of aging test time.

[0017] 2. Based on the number of key target test parameters and non-key target test parameters and the curve non-coincidence value, the key target test parameter performance value ZB and the non-key target test parameter performance value FB are obtained by processing, and the aging test total time of the key target test parameter and the non-key target test parameter is allocated according to the performance value; based on the aging test total time of the key target test parameter and the non-key target test parameter and the curve non-coincidence value, the aging test total time is allocated; the aging test total time of the key target test parameter and the non-key target test parameter is obtained respectively, and then the aging test total time of the key target test parameter and the non-key target test parameter is allocated, so that the efficiency of the energy storage power supply in the aging test process is significantly improved. BRIEF DESCRIPTION OF DRAWINGS

[0018] The present application will be further described below with reference to the accompanying drawings.

[0019] Figure 1is a flow chart of steps of a power equipment aging test method according to Embodiment 1 of the present application; Figure 2 is a module diagram of a power equipment aging test system according to Embodiment 2 of the present application. DETAILED DESCRIPTION

[0020] In order to make the technical means, creative features, purposes and effects of the present application easy to understand, the present application will be further described below in conjunction with specific embodiments.

[0021] Embodiment 1 As shown in Figure 1 , the power equipment aging test method according to the present embodiment comprises: Step 1: Obtain the operating parameters of the energy storage power supply in the two adjacent historical operating periods closest to the current test time, wherein the operating parameters include but are not limited to output current, output voltage and output power, construct the operating change curve corresponding to the operating parameters in each historical operating period based on the operating parameters, and select the target test parameter among all operating parameters based on the analysis of the operating change curve; It should be noted that the cycle length of the two historical operating periods is the same; In some embodiments, the operating parameters in the historical operating period are obtained, a two-dimensional rectangular coordinate system is constructed with time as the X-axis and operating parameters as the Y-axis, the operating parameters in the historical operating period are marked in the coordinate system, and the operating change curve in the historical operating period is obtained; It should be noted that the time represented by the X-axis is the time in the historical operating period; The operating change curve includes but is not limited to the output voltage change curve, the output current change curve and the output power change curve; Compare and analyze the same type of operating change curves in the two historical operating periods, specifically: Measure the horizontal length of the part of the curve that does not overlap between the two same type operating change curves, and make a ratio of the horizontal length corresponding to the operating change curve to obtain the curve length deviation value, and mark it as CD; It should be noted that the horizontal length corresponding to each operating change curve is equal, because the historical operating period length corresponding to each operating change curve is equal; Measure the area enclosed between the part of the curve that does not overlap between the two same type operating change curves, and mark it as the deviation area, make a ratio of the deviation area to the deviation area threshold to obtain the curve area deviation value, and mark it as MD; Make data processing on the obtained curve length deviation value CD and the curve area deviation value MD, and obtain the target test parameter through the formula The non-coincidence value FC of the curve is obtained, and a1 and a2 are preset proportion coefficients; It should be noted that the meaning of the curve non-coincidence value FC is that the degree of coincidence of two historical operation change curves obtained in the aging test process of the same type of operation parameter is judged. The obtained curve non-coincidence value FC is compared with a preset curve non-coincidence threshold FY, and specifically: If the curve non-coincidence value FC corresponding to the operation parameter is greater than or equal to the curve non-coincidence threshold FY, the operation parameter is marked as a target test parameter. If the curve non-coincidence value FC corresponding to the operation parameter is less than the curve non-coincidence threshold FY, the operation parameter is marked as a non-target test parameter. Step 2: Based on the target test parameter, the curve non-coincidence value corresponding to the target test parameter is processed and analyzed, and the target test parameter is divided into a key target test parameter and a non-key target test parameter. The curve non-coincidence values FC corresponding to all target test parameters are summed and then averaged to obtain the curve non-coincidence average value corresponding to the target test parameter. The curve non-coincidence value FC corresponding to the target test parameter is subtracted from the curve non-coincidence average value, and the absolute value of the difference is obtained to obtain the curve non-coincidence deviation value corresponding to the target test parameter. The curve non-coincidence deviation values corresponding to all target test parameters are summed and averaged to obtain the curve non-coincidence deviation average value. The obtained curve non-coincidence deviation value corresponding to the target test parameter is compared with the curve non-coincidence deviation average value, and specifically: If the curve non-coincidence deviation value corresponding to the target test parameter is greater than the curve non-coincidence deviation average value, the target test parameter is marked as a key target test parameter. If the curve non-coincidence deviation value corresponding to the target test parameter is less than or equal to the curve non-coincidence deviation average value, the target test parameter is marked as a non-key target test parameter. The technical solution of this invention is as follows: Based on the operating parameters, construct the operating change curves corresponding to the operating parameters in each historical operating cycle, analyze them, and select the target test parameters; process and analyze the non-overlapping values ​​of the curves corresponding to the target test parameters, and divide the target test parameters into key target test parameters and non-key target test parameters; by selecting target test parameters through the analysis of the non-overlapping values ​​of the curves corresponding to the operating parameters, it is possible to clarify which operating parameters are the main test objects, so as to ensure that limited test resources are accurately invested in these key test parameters. Then, dividing the target test parameters into key target test parameters and non-key target test parameters can make the allocation of aging test time more purposeful, thereby avoiding the waste and dispersion of aging test time and improving the utilization rate of aging test time.

[0022] Example 2 like Figure 1 As shown in the embodiment of the present invention, an aging test method for power equipment includes: Step 3: Based on the number of key target test parameters and non-key target test parameters, as well as the non-overlapping value of the curves, process to obtain the performance value ZB of the key target test parameters and the performance value FB of the non-key target test parameters. Based on the performance value ZB of the key target test parameters and the performance value FB of the non-key target test parameters, allocate the total aging test time for the key target test parameters and the non-key target test parameters. The number of test parameters for key targets is counted, and the ratio of the number of test parameters for key targets to the number of test parameters for all targets is calculated to obtain the proportion value of test parameters for key targets, ZMB. The number of non-key target test parameters is obtained by subtracting the number of target test parameters from the number of key target test parameters. The ratio of the number of non-key target test parameters to the number of target test parameters is then calculated to obtain the proportion value of non-key target test parameters (FMB). First, sum the non-coincident values ​​of the curves corresponding to the test parameters of all key targets to obtain the total non-coincident value FFZ of the curves corresponding to the test parameters of key targets. Then, take the average value of the total non-coincident value FFZ of the curves corresponding to the test parameters of key targets to obtain the average value ZFJ of the curves corresponding to the test parameters of key targets. First, sum the non-overlapping curve values ​​corresponding to all non-key target test parameters to obtain the total non-overlapping curve value FFC. Then, take the average value of the total non-overlapping curve value FFC corresponding to the non-key target test parameters to obtain the mean non-overlapping curve value FFJ corresponding to the non-key target test parameters. Through formula Obtain the mean weight of the test parameters for key targets (ZJZ); Through formula Obtain the mean weight of test parameters for non-key targets (FJZ); Based on the test parameters of key targets, using the formula The performance values ​​ZB of the key target test parameters are obtained, where b1 and b2 are preset scaling coefficients; Based on the test parameters of non-key targets, using the formula The performance values ​​FB of the test parameters for non-key targets are obtained, where c1 and c2 are preset scaling coefficients. It should be noted that b1=c1 and b2=c2; The preset aging test time for the energy storage power supply is T; Based on the test parameters of key targets, using the formula The total aging test time Tz for obtaining the key target test parameters; Based on the test parameters of non-key targets, using the formula The total aging test time Tf for obtaining test parameters of non-key targets; Step 4: Based on the total aging test time for key target test parameters and non-key target test parameters, as well as the non-overlapping curve values ​​of key target test parameters and non-key target test parameters, allocate the total aging test time for key target test parameters and non-key target test parameters accordingly. Based on the target test parameters as the key target test parameters, the non-overlapping value FC of the key target test parameters, the total non-overlapping value FFZ of the curves corresponding to the key target test parameters, and the total aging test time Tz allocated to the key target test parameters are processed. According to the formula The key target test parameters and aging test time Tzf were obtained. Based on the fact that the target test parameters are non-key target test parameters, the non-overlapping value FC of the non-key target test parameters, the total non-overlapping value FFC of the curves corresponding to the non-key target test parameters, and the total aging test time Tf allocated to the non-key target test parameters are processed. According to the formula Obtain the aging test time Tff for non-key targets; The technical scheme of the embodiment of the present application is: based on the number of key target test parameters and non-key target test parameters and the curve non-coincidence value, the key target test parameter performance value ZB and the non-key target test parameter performance value FB are obtained by processing, and the total aging test time of the key target test parameters and the non-key target test parameters is allocated according to the performance values; based on the total aging test time of the key target test parameters and the non-key target test parameters and the curve non-coincidence value, the total aging test time is specifically allocated; the total aging test time of the key target test parameters and the non-key target test parameters is obtained respectively, and then the total aging test time of the key target test parameters and the non-key target test parameters is specifically allocated, so that the efficiency of the energy storage power supply in the aging test process is significantly improved.

[0023] Embodiment 3 As shown in Figure 2 , the energy storage power supply aging test system provided by the embodiment of the present application comprises: The running parameter type analysis module: the running parameters of the energy storage power supply in the two nearest historical running periods adjacent to the current test time are obtained, wherein the running parameters include but are not limited to output current, output voltage and output power, the running change curve corresponding to the running parameters in each historical running period is constructed based on the running parameters, and the target test parameters are selected from all the running parameters based on the analysis of the running change curve; The target test parameter type analysis module: based on the target test parameters, the curve non-coincidence value corresponding to the target test parameters is processed and analyzed, and the target test parameters are divided into key target test parameters and non-key target test parameters; The aging test time allocation module: based on the number of key target test parameters and non-key target test parameters and the curve non-coincidence value, the key target test parameter performance value ZB and the non-key target test parameter performance value FB are obtained by processing, and the total aging test time of the key target test parameters and the non-key target test parameters is allocated according to the key target test parameter performance value ZB and the non-key target test parameter performance value FB; The aging test time reallocation module: based on the total aging test time of the key target test parameters and the non-key target test parameters and the curve non-coincidence value of the key target test parameters and the non-key target test parameters, the total aging test time of the key target test parameters and the non-key target test parameters is specifically allocated; The above has described one embodiment of the present application in detail, but the content described is only the preferred embodiment of the present application, and cannot be considered as limiting the scope of the present application. Any equivalent changes and improvements made according to the scope of the present application should still belong to the patent coverage range of the present application.

Claims

1. A method of aging test of an electric power device, characterized by: The method comprises the following steps: Step 1: obtaining the operation parameters of the energy storage power supply in the two adjacent latest historical operation periods of the current test time, wherein the operation parameters comprise output current, output voltage and output power, constructing an operation change curve corresponding to the operation parameters in each historical operation period based on the operation parameters, and selecting the target test parameters from all operation parameters based on the analysis of the operation change curve; Step 2: based on the target test parameters, processing and analyzing the curve non-coincidence values corresponding to the target test parameters, and dividing the target test parameters into key target test parameters and non-key target test parameters; Step 3: based on the number of key target test parameters and non-key target test parameters and the curve non-coincidence values, processing to obtain the key target test parameter performance value ZB and the non-key target test parameter performance value FB, and distributing the total aging test time of the key target test parameters and the non-key target test parameters according to the key target test parameter performance value ZB and the non-key target test parameter performance value FB; Step 4: based on the total aging test time of the key target test parameters and the non-key target test parameters and the curve non-coincidence values of the key target test parameters and the non-key target test parameters, specifically distributing the aging test time of the key target test parameters and the non-key target test parameters.

2. The aging test method of the power equipment according to claim 1, wherein the target test parameters are obtained in the following manner: The obtained curve non-coincidence value FC is compared with the preset curve non-coincidence threshold FY, and specifically: If the curve non-coincidence value FC of the operation parameter is greater than or equal to the curve non-coincidence threshold FY, the operation parameter is marked as a target test parameter; If the curve non-coincidence value FC of the operation parameter is less than the curve non-coincidence threshold FY, the operation parameter is marked as a non-target test parameter.

3. The aging test method of the power equipment according to claim 2, wherein the curve non-coincidence value FC is obtained in the following manner:

4. The aging test method of the power equipment according to claim 3, wherein the curve length deviation value CD is obtained in the following manner: Obtaining the operation parameters in the historical operation period, constructing a two-dimensional rectangular coordinate system with time as the X-axis and the operation parameters as the Y-axis, marking the operation parameters in the historical operation period in the coordinate system to obtain the operation change curve in the historical operation period; The obtained curve length deviation value CD and the curve area deviation value MD are processed by the formula to obtain the curve non-coincidence value FC. Comparing and analyzing the same type of operation change curves in the two historical operation periods, specifically: Measuring the horizontal length of the part curve that does not coincide between the two same type operation change curves, and processing the ratio of the horizontal length of the part curve to the horizontal length of the operation change curve to obtain the curve length deviation value, and marking it as CD.

5. The aging test method of the power equipment according to claim 3, wherein the curve area deviation value MD is obtained in the following manner: ​ ​ ​ ​ The area surrounded by the part of the curves that do not coincide between the two same type operation change curves is measured, and is marked as a deviation area. The deviation area is processed by ratio with a deviation area threshold value to obtain a curve area deviation value, which is marked as MD.

6. The aging test method of the power equipment according to claim 1, characterized in that: The acquisition methods of the key target test parameters and the non-key target test parameters are: The curve non-coincidence values FC corresponding to all the target test parameters are summed and then averaged to obtain the curve non-coincidence average value corresponding to the target test parameters; The curve non-coincidence value FC corresponding to the target test parameter is processed by difference with the curve non-coincidence average value, and the absolute value of the difference is taken to obtain the curve non-coincidence deviation value corresponding to the target test parameter; The curve non-coincidence deviation values corresponding to all the target test parameters are summed and averaged to obtain the curve non-coincidence deviation average value; The obtained curve non-coincidence deviation value corresponding to the target test parameter is compared with the curve non-coincidence deviation average value, specifically: If the curve non-coincidence deviation value corresponding to the target test parameter is greater than the curve non-coincidence deviation average value, the target test parameter is marked as a key target test parameter; If the curve non-coincidence deviation value corresponding to the target test parameter is less than or equal to the curve non-coincidence deviation average value, the target test parameter is marked as a non-key target test parameter.

7. The aging test method of the power equipment according to claim 1, characterized in that: The acquisition methods of the key target test parameter performance value ZB and the non-key target test parameter performance value FB are: The number of key target test parameters is counted, and the number of key target test parameters is processed by ratio with the number of target test parameters to obtain a key target test parameter proportion value ZMB; The number of non-key target test parameters is obtained by difference processing of the number of target test parameters and the number of key target test parameters, and the number of non-key target test parameters is processed by ratio with the number of target test parameters to obtain a non-key target test parameter proportion value FMB; The curve non-coincidence values corresponding to all the key target test parameters are summed to obtain a curve non-coincidence total value FFZ corresponding to the key target test parameters, and then the curve non-coincidence total value FFZ corresponding to the key target test parameters is averaged to obtain a curve non-coincidence average value ZFJ corresponding to the key target test parameters; The curve non-coincidence values corresponding to all the non-key target test parameters are summed to obtain a curve non-coincidence total value FFC corresponding to the non-key target test parameters, and then the curve non-coincidence total value FFC corresponding to the non-key target test parameters is averaged to obtain a curve non-coincidence average value FFJ corresponding to the non-key target test parameters; By formula Obtain the mean proportion of the key target test parameter ZJZ; The mean proportion FJZ of the non-key target test parameters is obtained by the formula ​ Based on the key target test parameter, the performance value ZB of the key target test parameter is obtained through a formula wherein b1 and b2 are both preset proportion coefficients. Based on the non-key target test parameter, the performance value FB of the non-key target test parameter is obtained through a formula wherein c1 and c2 are both preset proportion coefficients.

8. The aging test method of the power equipment according to claim 1, characterized in that: The aging test total time of the key target test parameters and the non-key target test parameters is allocated in the following manner: Based on the key target test parameter, the total aging test time Tz of the key target test parameter is obtained through a formula ​ Based on the non-key target test parameters, the total aging test time Tf of the non-key target test parameters is obtained through the formula Tf = T0 + T1 + T2 + T3 + T4 + T5 + T6 + T7 + T8 9. The aging test method of the power equipment according to claim 1, characterized in that: The aging test time of the key target test parameters and the non-key target test parameters is allocated in the following manner: Based on the target test parameter being a key target test parameter, the non-coincidence value FC of the key target test parameter, the total non-coincidence value FFZ of the curve corresponding to the key target test parameter, and the total aging test time Tz allocated to the key target test parameter are processed; According to the formula The key target test parameter aging test time Tzf is obtained; Based on the target test parameter being a non-key target test parameter, the non-coincidence value FC of the non-key target test parameter, the total non-coincidence value FFC of the curve corresponding to the non-key target test parameter, and the total aging test time Tf allocated to the non-key target test parameter are processed; According to the formula The non-critical target test parameter aging test time Tff is obtained.

10. A system for performing an aging test of an electrical device, the system being configured to implement the method of any one of claims 1-9, wherein: It comprises: An operating parameter type analysis module: obtaining the operating parameters of the energy storage power supply in the two nearest historical operating cycles adjacent to the current test time, wherein the operating parameters include: output current, output voltage and output power, constructing the operating parameter corresponding operating change curve in each historical operating cycle based on the operating parameters, and selecting the target test parameter in all operating parameters based on the analysis of the operating change curve; A target test parameter type analysis module: based on the target test parameter, processing and analyzing the curve non-coincidence value corresponding to the target test parameter, and dividing the target test parameter into key target test parameters and non-key target test parameters; An aging test time allocation module: based on the number and curve non-coincidence value of the key target test parameter and the non-key target test parameter, the key target test parameter performance value ZB and the non-key target test parameter performance value FB are obtained, and the total aging test time of the key target test parameter and the non-key target test parameter is allocated according to the key target test parameter performance value ZB and the non-key target test parameter performance value FB; An aging test time re-allocation module: based on the total aging test time of the key target test parameter and the non-key target test parameter and the curve non-coincidence value of the key target test parameter and the non-key target test parameter, the aging test time of the key target test parameter and the non-key target test parameter is specifically allocated.

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