Mathematical and physical combination-based optical device parameter measurement method, medium and system

Abstract

The application relates to a kind of optical device parameter measurement methods based on mathematical physics combination, medium and system, to optoelectronic test technical field, it includes: the physical field simulation model of optical device is established and obtains port electromagnetic field distribution;Utilize waveguide mode orthogonality to the port electromagnetic field is carried out surface integration, obtains the frequency domain complex amplitude of each port;According to the frequency domain complex amplitude, calculate scattering matrix, extract optical device parameter.The optical device parameter measurement method provided by the application can reflect the physical characteristics of the optical device, and can be accurately fitted and optimized through mathematical algorithm, thereby improving the accuracy and efficiency of parameter extraction.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of photoelectric testing, in particular to a light device parameter measurement method based on mathematical physics combination, medium and system. BACKGROUND

[0002] In the field of design and optimization of optoelectronic devices, accurately extracting device parameters is a core task, which directly relates to the accuracy of device models and the reliability of performance prediction. However, traditional parameter extraction methods have some limitations that cannot be ignored when dealing with increasingly complex optoelectronic devices. First, complex optoelectronic devices often exhibit multi-dimensional and nonlinear characteristics, which makes it difficult for traditional parameter extraction methods to effectively cope with them, resulting in low extraction efficiency and insufficient parameter accuracy. Second, optoelectronic devices are affected by many factors in actual application, such as material inhomogeneity and environmental changes, and traditional methods are difficult to fully consider these factors, thereby reducing the robustness and generalization ability of the model. In addition, the shortcomings of traditional methods in capturing complex physical processes inside the device also lead to inaccurate extracted parameters, further affecting the design and optimization effect of the device. SUMMARY

[0003] Therefore, the purpose of the present application is to provide a light device parameter measurement method based on mathematical physics combination, which can quickly obtain preliminary parameters reflecting the essential characteristics of the device based on the direct extraction method of the physical model, and can achieve high-precision fitting and optimization based on the parameter fitting and optimization of mathematical algorithms, to improve the robustness and prediction ability of the model.

[0004] Another purpose of the present application is to provide a light device parameter measurement method based on mathematical physics combination, which aims to overcome the limitations of traditional methods in dealing with complexity, variability and insufficient accuracy, and to provide a new technical path for performance analysis and optimization of complex devices.

[0005] To achieve the above-mentioned purposes, the present application adopts the following technical solutions:

[0006] A light device parameter measurement method based on mathematical physics combination, comprising the following steps:

[0007] Establishing a physical field simulation model of the light device and obtaining the port electromagnetic field distribution;

[0008] Using waveguide mode orthogonality to perform surface integration on the port electromagnetic field to obtain the frequency domain complex amplitude of each port;

[0009] Calculating the scattering matrix according to the frequency domain complex amplitude and extracting the light device parameters.

[0010] Optionally, after extracting the light device parameters, the method further comprises the following steps:

[0011] The extracted optical device parameters are locally corrected by introducing an equivalent circuit analytical expression.

[0012] Optionally, after extracting the optical device parameters, the method further comprises the step of:

[0013] The scattering matrix is coupled with a preset mathematical optimization algorithm to iteratively optimize the extraction results to obtain a final parameter set of the optical device parameters that simultaneously satisfy physical interpretability and mathematical accuracy.

[0014] Optionally, the mathematical optimization algorithm comprises at least one of a gradient descent method, a genetic algorithm, and a reinforcement learning algorithm.

[0015] Optionally, the mathematical optimization algorithm is used to minimize an error function between simulation and measurement, or between simulation and an equivalent circuit model.

[0016] Optionally, the physical field simulation model is a three-dimensional finite-difference time-domain model, and the port electromagnetic field distribution is obtained by sampling the time-domain electric field component.

[0017] Optionally, the waveguide mode orthogonality integral is performed between two adjacent cross sections, the cross section spacing Δz is equal to the grid step of the three-dimensional finite-difference time-domain, and the integral result is converted to the frequency domain by Fourier transform.

[0018] Optionally, the scattering matrix is an N×N complex matrix, N is the total number of ports of the optical device, and the matrix elements contain amplitude information and phase information, which are used to completely characterize the power distribution, phase change and inter-port coupling of the optical signal inside the optical device.

[0019] Optionally, the optical device is suitable for a heterogeneous multi-material, multi-physical field coupling device; and the optical device is any one of an anisotropic material rectangular waveguide, a Y-type beam splitter, and a microwave photon link.

[0020] Optionally, the error function is a weighted mean square error, and the weights are dynamically assigned according to the importance of the frequency points to improve the parameter accuracy in the key frequency band.

[0021] Optionally, the final parameter set includes equivalent refractive index, coupling coefficient, transmission loss, reflection coefficient, group delay, and polarization-dependent loss, and all parameters maintain physical consistency under the same mathematical framework.

[0022] The application provides a kind of optical device parameter measurement method based on the combination of mathematical physics, its core is to comprehensively utilize the explainability of physical law and the rigor of mathematical algorithm, by constructing the unified modeling framework with physical intuitiveness and mathematical accuracy, realize the efficient and accurate extraction of device parameters.The application takes parameter matrix as the core representation tool of modeling, for describing the intrinsic transmission characteristics of each port of the device and the mutual coupling effect between ports.Through the accurate extraction of parameters, the research can effectively capture the dynamic transmission characteristics of the device under the condition of multiple frequencies and multiple ports, thereby laying a theoretical foundation for the performance evaluation and optimization design of complex devices.

[0023] The optical device parameter measurement method based on the combination of mathematical physics provided by the application combines the advantages of physical behavior and mathematical model of the device, overcomes the limitations of traditional methods in handling complexity, variability and insufficient precision, and provides a new technical path for performance analysis and optimization of complex devices.

[0024] The application further provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the method described above.

[0025] The application further provides an optoelectronic device design system, comprising:

[0026] The simulation module is configured to establish a physical field simulation model of the optical device and obtain a port electromagnetic field distribution.

[0027] The integral and transformation module is configured to perform surface integration on the port electromagnetic field using waveguide mode orthogonality to obtain a frequency domain complex amplitude of each port, and calculate a scattering matrix based on the frequency domain complex amplitude to extract optical device parameters.

[0028] The optimization module is configured to couple the scattering matrix with a preset mathematical optimization algorithm, iteratively optimize the extraction result, and obtain a final parameter set of the optical device parameters that satisfy both physical explainability and mathematical accuracy.

[0029] The output module is configured to feed back the final parameter set to an EDA tool to complete layout and performance iterative optimization of the optical device.

[0030] The optoelectronic device design system provided by the application also has high flexibility and expandability, and can adapt to the modeling needs of different types of optoelectronic devices.In the optimization extraction path, by introducing numerical optimization techniques (such as gradient descent method, genetic algorithm or reinforcement learning algorithm), the efficiency and accuracy of parameter extraction can be further improved.

[0031] Meanwhile, the optoelectronic device design system provided by this invention is also applicable to heterogeneous multi-material and multi-physical field coupled devices, and can provide a systematic solution for multi-dimensional parameter optimization of complex devices. Attached Figure Description

[0032] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings in the following description are only embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort.

[0033] Figure 1 This is a schematic diagram of the process for directly extracting optical device parameters based on the combination of mathematics and physics in the optical device parameter measurement method of the present invention;

[0034] Figure 2 This is a schematic diagram of the semi-analysis extraction process of an optical device parameter measurement method based on the combination of mathematics and physics according to the present invention;

[0035] Figure 3 This is a schematic diagram of the optimized extraction process of an optical device parameter measurement method based on the combination of mathematics and physics according to the present invention;

[0036] Figure 4 This is a schematic diagram of a 3D finite difference time-domain simulation of an anisotropic material rectangular waveguide in one embodiment of the present invention;

[0037] Figure 5 This is a schematic diagram of the simulated electric field distribution of a Y-junction beam splitter based on the finite difference time-domain method in one embodiment of the present invention;

[0038] Figure 6 for Figure 5 The parameter matrix amplitude of the Y-junction beam splitter shown;

[0039] Figure 7 for Figure 5 The phase parameter matrix of the Y-junction beam splitter shown;

[0040] Figure 8 This is a schematic diagram of a microwave photonic simulation chain built in a simulation system constructed in another embodiment of the present invention;

[0041] Figure 9 for Figure 8 The diagram shows the simulation model's optical frequency response results. Detailed Implementation

[0042] In order to make the purposes, technical solutions and beneficial effects of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative labor fall within the scope of protection of the present application.

[0043] In the field of design and optimization of optoelectronic devices, accurate extraction of device parameters is a core task that directly relates to the accuracy of device models and the reliability of performance prediction. The inventors of the present application found in their research that direct extraction methods based on physical models can quickly obtain preliminary parameters that reflect the essential characteristics of the device. However, for complex devices, relying solely on physical models may not fully describe their complex physical behavior, thereby limiting the accuracy of the extracted parameters. Parameter fitting and optimization based on mathematical algorithms can improve the robustness and predictive ability of the model through high-precision fitting and optimization. However, pure mathematical algorithms lack physical intuition and may result in parameters that do not match the physical characteristics of the device.

[0044] Based on this, the inventors propose an optoelectronic device parameter measurement method based on the combination of mathematics and physics, which is characterized by the comprehensive use of the explainability of physical laws and the rigor of mathematical algorithms. Through the construction of a unified modeling framework that combines physical intuition and mathematical accuracy, efficient and accurate extraction of device parameters is achieved. It specifically includes three technical paths of direct extraction, semi-analytical extraction, and optimization extraction to meet the needs of different complexity and application scenarios. In actual application, the three technical paths can be switched or cascaded according to the complexity and accuracy requirements of the device.

[0045] As shown in Figure 1 , it is a flowchart of direct extraction of optoelectronic device parameters in the optoelectronic device parameter measurement method based on the combination of mathematics and physics of the present application. It includes the following steps:

[0046] Step 100: Establish a physical field simulation model of the optoelectronic device and obtain the port electromagnetic field distribution;

[0047] Step 200: Perform surface integration on the port electromagnetic field using the waveguide mode orthogonality to obtain the frequency domain complex amplitudes of each port;

[0048] Step 300: Calculate the scattering matrix based on the frequency domain complex amplitudes and extract the optoelectronic device parameters.

[0049] In step 100, the physical field simulation model is a three-dimensional finite difference time domain model (FDTD simulation model), and the port electromagnetic field distribution is obtained by sampling the time domain electric field component.

[0050] Specifically, a three-dimensional finite-difference time-domain model is established, such as... Figure 4 As shown, this model can characterize a waveguide structure with length *a*, width *b*, and thickness *t*. In this model, the port electromagnetic field distribution is obtained through sampling of the time-domain electric field components. This physical field simulation model is applicable to heterogeneous multi-material, multi-physics coupled devices, such as anisotropic rectangular waveguides, Y-type beam splitters, and microwave photonic links. Figure 5 The electromagnetic field distribution diagram when this method is applied to a Y-type beam splitter is shown, clearly demonstrating the distribution of electromagnetic field intensity from the input optical signal at Port 1 to Port 2 and Port 3.

[0051] In step 200, the electromagnetic field at the ports is surface-integrated using the waveguide mode orthogonality to obtain the frequency domain complex amplitude at each port. For example... Figure 4 As shown, the waveguide mode orthogonality integral is performed between two adjacent cross sections, for example, in the region between cross sections (1)(2) and cross sections (3)(4). The spacing Δz between these adjacent cross sections is equal to the grid step size in the three-dimensional finite difference time domain. The integral result is transformed to the frequency domain by Fourier transform, thereby obtaining the frequency domain complex amplitude of each port.

[0052] In step 300, the scattering matrix is ​​calculated based on the frequency domain complex amplitude, and the optical device parameters are extracted. The scattering matrix is ​​an N×N complex matrix, where N is the total number of optical device ports. The matrix elements simultaneously contain amplitude and phase information, used to fully characterize the power distribution, phase changes, and inter-port coupling of the optical signal within the optical device. Figure 6 The diagram shows the parameters of the optical device scattering matrix extracted by this method, displaying the amplitude characteristics of the scattering matrix at different frequencies, including key parameters such as reflection coefficient and transmission coefficient.

[0053] The direct extraction technique can address the needs of varying complexity and application scenarios, enabling the rapid extraction of preliminary parameters that reflect the essential characteristics of the device, and offering the advantage of high efficiency.

[0054] like Figure 2 The diagram shown illustrates the semi-analytical extraction process of optical device parameter measurement based on a combination of mathematics and physics, as described in this invention. It adds the following steps after the direct extraction of optical device parameters:

[0055] Step 400: Introduce the equivalent circuit analytical formula to locally correct the extracted optical device parameters.

[0056] This step makes the extracted parameters more accurate and better reflects the actual physical characteristics of the optical device.

[0057] like Figure 3As shown, it is the flowchart of the optical device parameter measurement method based on the combination of mathematical physics according to the application. After the step of directly extracting the optical device parameters or semi-analytically extracting the optical device parameters, the following steps are added:

[0058] Step 500: coupling the scattering matrix with a preset mathematical optimization algorithm to iteratively optimize the extraction result to obtain a final parameter set of the optical device parameters that satisfy the physical interpretability and mathematical accuracy at the same time.

[0059] In step 500, the mathematical optimization algorithm includes at least one of the gradient descent method, the genetic algorithm and the reinforcement learning algorithm. These algorithms are used to minimize the error function between the simulation and the actual measurement, or between the simulation and the equivalent circuit model. Figure 7 The parameter diagram after iteratively optimizing the extraction result by the mathematical optimization algorithm is shown, which shows the phase, group delay and other parameter characteristics of the optical device at different frequencies after the optimization processing.

[0060] In the optimization process, the error function adopts the weighted mean square error, and the weight is dynamically allocated according to the importance of the frequency point to improve the parameter accuracy in the key frequency band. In this way, the accuracy of the parameters in a specific frequency range can be improved while ensuring the overall accuracy.

[0061] The final parameter set includes the equivalent refractive index, the coupling coefficient, the transmission loss, the reflection coefficient, the group delay and the polarization-dependent loss, and all the parameters maintain physical consistency under the same mathematical framework. These parameters comprehensively characterize the optical characteristics of the optical device, and provide a reliable theoretical basis for the design, manufacture and application of the optical device.

[0062] Figure 8 An embodiment diagram of the application of the method of the application to a microwave photon link is shown, which includes the complete microwave photon link structure of the optical frequency response output and the response measurement and the connection relationship of the key components. Figure 9 The optical device frequency response curve measured by the method of the application is shown, which shows the response gain variation characteristics in the wavelength range of 1500 to 1600 nm. From Figure 9 It can be seen that the method can accurately capture the frequency response characteristics of the optical device at different wavelengths, which provides strong support for the performance evaluation and optimization of the optical device.

[0063] The optical parameter extraction of a Y-type beam splitter will be described in detail below.

[0064] The anisotropic material is placed in the center of the rectangular waveguide, as shown in Figure 4are shown. Four adjacent cross-sections are chosen as observation planes inside the rectangular waveguide to obtain the electric field components. The extraction procedure here is based on the orthogonality of the waveguide modes on the rectangular waveguide cross-section. The distance of the observation planes to the adjacent planes is Δz, which is equal to the size of the z-direction cell in the FDTD simulation. According to the orthogonality of the waveguide modes, the scalar potential is calculated by the surface integral of the electric field components on the observation planes. According to the orthogonality of the waveguide modes, for the 1st and 2nd observation planes, the scalar potential can be expressed as

[0065]

[0066] where S is the surface integral area of the observation plane. Ex(x, y, z0, t) and Ex(x, y, z0+ Δz, t) are the electric field components on the 1st and 2nd observation planes at time t, respectively. The above equation can be transformed to the frequency domain by Fourier transform, expressed as

[0067]

[0068] where A(ω) and B(ω) are the amplitudes of the incident wave from the excitation source and the reflected wave from the material, respectively. If the reference point z0is set to zero, the above equation can be rewritten in the form of A(ω) and B(ω), expressed as

[0069]

[0070] From the above equation, it can be derived that the scattering parameter, i.e., the reflection coefficient (S11), is defined as the ratio of the reflected wave to the incident wave, expressed as

[0071]

[0072] In addition, to obtain the transmission coefficient of the rectangular waveguide, a similar procedure is applied to the other observation planes. Two adjacent cross-sections, i.e., the 3rd and 4th observation planes, are located after the discontinuity of the excitation source position on the rectangular waveguide. To purely obtain the transmitted wave on these observation planes, the region of the other waveguide end opposite to the excitation source should be adjusted in such a way that no field is reflected back to the observation planes. In this case, after applying the Fourier transform, the scalar potentials on the 3rd and 4th observation planes can be defined as

[0073]

[0074] where C(ω) is the amplitude of the transmitted wave from the excitation source and D(ω) is the amplitude of the reflected wave from the waveguide end far away from the excitation source. For the reference point z0equal to zero, the above equation can be redefined in terms of C(ω) and D(ω) as

[0075]

[0076] According to similar definitions, the transmission coefficient (S21) can be defined as the ratio between the transmitted wave and the incident wave, expressed as

[0077]

[0078] Based on the above S parameter extraction scheme, a 3D FDTD physical field simulation of a Y-junction splitter is used to extract the S parameter matrix of each port of the device. The Y-junction splitter can support optical signal distribution from port 1 to ports 2 and 3, while also supporting optical signal transmission from ports 2 and 3 to port 1. This bidirectional transmission characteristic makes it have important application value in optical communication networks and integrated optical systems, such as signal splitting, signal coupling, and multiplexing functions.

[0079] The full-scale S matrix of the Y-junction splitter consists of 36 components, which comprehensively describes the transmission relationship between port 1, port 2, and port 3, including the distribution characteristics of optical power and the phase change in the coupling process. Through this S parameter matrix, the transmission characteristics and reflection characteristics of the Y-junction splitter at different frequencies can be accurately characterized.

[0080] In actual operation, the input signals of port 1, port 2, and port 3 are expressed in the form of frequency domain complex amplitude, and multiplied by the S matrix to calculate the frequency domain complex amplitude of the output signals of port 1, port 2, and port 3. This process effectively formalizes the input-output relationship in the form of a mathematical model, facilitating the analysis of the transmission characteristics of optical signals in the frequency domain, including signal power distribution, phase change, and reflection loss, etc. This matrix calculation method not only improves the efficiency and accuracy of analysis, but also provides an important tool for device design, optimization, and performance prediction. The frequency domain complex amplitudes of the output signals of port 1, port 2, and port 3 are:

[0081]

[0082] Among them, the S parameter matrix contains the output information of all ports, mainly including polarization coupling, amplitude, and phase, etc. Based on the above S parameter extraction method, the amplitude and phase information of the S parameter matrix of the Y-junction splitter are shown in Figure 6 and Figure 7 .

[0083] From Figure 6 and Figure 7As can be seen, the S parameter matrix can be extracted from the physical simulation results of the Y junction beam splitter by using the parameter extraction method based on the equivalent circuit. The S parameter matrix can not only comprehensively reflect the transmission characteristics of the device, but also accurately describe the coupling behavior and energy distribution law. In practical applications, the S parameter matrix as an effective characterization method can provide reliable theoretical basis for performance evaluation and optimization design of the Y junction beam splitter in complex optoelectronic systems. At the same time, the extraction method based on the equivalent circuit can avoid the problems of high computational complexity or error accumulation in the traditional method, and has high computational efficiency and result accuracy.

[0084] The optical parameter extraction of the microwave photon device is taken as an example for detailed description.

[0085] The accurate cross-domain model of the microwave photon device is converted into a way of extracting scattering matrix parameters to realize the parameter extraction of the forward and reverse transmission efficiency of the microwave radio frequency signal of each port of the optoelectronic device. The S parameter matrix is used to characterize the intrinsic transmission characteristics of each device port and the mutual influence between them. This characterization method can accurately reflect the response performance of a certain optoelectronic device.

[0086] When a microwave photon device with N ports interacts with an optical signal, the S parameter matrix model of the microwave photon device can be represented in the following way:

[0087]

[0088] Where Sij (1≤j,i≤N) represents the S parameter of the transmission characteristics from the jth port to the ith port. When i=j, the current S parameter represents the reflection coefficient of the current port, and when i≠j, the current S parameter represents the transmission coefficient from the jth port to the ith port.

[0089] Figure 8 A microwave photon simulation link built in a simulation system is shown, which is designed to measure and analyze the optical frequency response characteristics of the microwave photon device. The device is constructed by the equivalent circuit model parameter extraction method, and the simulation link provides an accurate test and verification platform for it. In this link, the optical frequency response characteristics of the microwave photon device are completely measured and analyzed, which provides reliable data support for the performance evaluation and optimization of the device.

[0090] The simulation link is mainly composed of multiple coupled waveguide modules, among which the CTE_FE waveguide module serves as the core part and is interconnected with other simulation models by using two grating coupler modules. This modular design not only improves the flexibility and scalability of the simulation link, but also provides higher adaptability for modeling complex photonic systems. Through the built-in optical frequency response measurement function of the simulation system, the optical frequency response characteristics of the simulation link, especially the key parameters such as insertion loss, can be efficiently obtained. This function ensures the accuracy and reliability of the measurement results, providing high-precision support for the comparison between the simulation link and the actual device performance.

[0091] In addition, the highly integrated design of the simulation system allows detailed analysis of the interaction between multiple waveguide modules and grating couplers, providing a more comprehensive understanding of the response behavior of microwave photonic devices. Figure 9 The final optical frequency response results obtained through the simulation link are shown, which intuitively reflect the frequency characteristics of the link during the transmission of photonic signals, providing important reference for further optimizing the design and application of microwave photonic devices.

[0092] The application also provides a computer readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the aforementioned optical device parameter measurement method based on the combination of mathematical physics.

[0093] The computer readable storage medium can be a read-only memory (ROM), a random access memory (RAM), an electrically erasable programmable read-only memory (EEPROM), a flash memory, or other memory devices.

[0094] The computer program includes instruction codes for implementing the method steps described in the foregoing, and when the processor executes these instruction codes, the steps of establishing a physical field simulation model of the optical device and obtaining the port electromagnetic field distribution, performing surface integration on the port electromagnetic field to obtain the frequency domain complex amplitude of each port by utilizing the waveguide mode orthogonality, calculating the scattering matrix according to the frequency domain complex amplitude and extracting the optical device parameters, etc.

[0095] In a preferred embodiment, the computer program further includes instruction codes for introducing equivalent circuit analytical expressions to locally correct the extracted optical device parameters.

[0096] In another preferred embodiment, the computer program further includes instruction codes for coupling the scattering matrix with a preset mathematical optimization algorithm to iteratively optimize the extraction results, so as to obtain a final parameter set of the optical device parameters that simultaneously satisfy the physical interpretability and mathematical accuracy.

[0097] The mathematical optimization algorithm in the computer program comprises at least one of a gradient descent method, a genetic algorithm and a reinforcement learning algorithm, and is used for minimizing an error function between simulation and measurement or between simulation and an equivalent circuit model.

[0098] The computer program further comprises a code module for implementing a physical field simulation model, which is a three-dimensional finite-difference time-domain model, and a port electromagnetic field distribution is obtained by sampling a time-domain electric field component.

[0099] In terms of waveguide mode orthogonality processing, the computer program comprises a code for performing integration between two adjacent cross sections, wherein a cross section interval Δz is equal to a grid step of a three-dimensional finite-difference time-domain, and a result of the integration is converted to a frequency domain through Fourier transform.

[0100] For scattering matrix processing, the computer program comprises a code module for calculating an N×N complex matrix, wherein N is a total number of ports of an optical device, and a matrix element comprises amplitude information and phase information, and is used for completely characterizing power distribution, phase change and inter-port coupling of an optical signal in the optical device.

[0101] The computer program is suitable for processing optical device parameter measurement of a heterogeneous multi-material and multi-physical field coupling device, including an anisotropic material rectangular waveguide, a Y-type beam splitter and a microwave photon link.

[0102] In terms of error function processing, the computer program comprises a code module for calculating a weighted mean square error, and weights are dynamically allocated according to importance of frequency points, so as to improve parameter accuracy in a key frequency band.

[0103] The parameter set finally output by the computer program comprises equivalent refractive index, coupling coefficient, transmission loss, reflection coefficient, group delay and polarization-dependent loss, and all parameters are physically consistent in the same mathematical framework.

[0104] Through the computer program stored on the computer readable storage medium, all steps of the optical device parameter measurement method described in the foregoing embodiments can be implemented, and a convenient and efficient implementation manner is provided, so that the measurement method can be widely applied in a computer system.

[0105] The application further provides an optoelectronic device design system, which comprises a simulation module, an integration and transform module, an optimization module and an output module.

[0106] The simulation module is used to establish a physical field simulation model of the optical device and obtain the port electromagnetic field distribution. The module simulates the propagation characteristics of electromagnetic waves in the optical device by constructing a three-dimensional finite-difference time-domain model. The model can accurately describe a waveguide structure with a length of a, a width of b, and a thickness of t, and set the distance between adjacent two cross sections as Δz. The simulation module calculates the electromagnetic field distribution inside the optical device and at the port by solving Maxwell's equations, providing basic data for subsequent parameter extraction. Taking a Y-type beam splitter as an example, the module can clearly show the electromagnetic field intensity distribution of the optical signal after being distributed to Port 2 and Port 3 from Port 1.

[0107] The integration and transformation module is used to perform surface integration of the port electromagnetic field using waveguide mode orthogonality to obtain the frequency domain complex amplitude of each port; and calculate the scattering matrix according to the frequency domain complex amplitude to extract the optical device parameters. As shown in Figure 4 The integration and transformation module first calculates the mode field distribution of each port, and then orthogonally integrates the simulated electromagnetic field with these mode fields to obtain the frequency domain complex amplitude of each port. Based on these complex amplitude values, the system further calculates the parameters of the scattering matrix, including the reflection coefficient, the transmission coefficient, etc.

[0108] The optimization module is used to couple the scattering matrix with the preset mathematical optimization algorithm to iteratively optimize the extraction results to obtain the final parameter set of the optical device parameters that satisfy both physical interpretability and mathematical accuracy. The module uses a multi-objective optimization algorithm to comprehensively analyze and adjust the parameters of the scattering matrix. Physical constraints are considered during the optimization process to ensure that the optimized parameters are physically reasonable and mathematically accurate. Figure 7 The parameter graph after iterative optimization by the mathematical optimization algorithm is shown, including the phase, group delay, and other parameter characteristics of the optical device at different frequencies. The optimization module can effectively eliminate errors in the simulation and extraction process, improving the accuracy of the optical device parameters.

[0109] The output module is used to feed back the final parameter set to the EDA tool to complete the layout and performance iterative optimization of the optical device. The module outputs the optimized parameter set in a standard format, which can be directly imported into the electronic design automation (EDA) tool for layout design and performance optimization of the optical device. The output module supports multiple common EDA tool formats to ensure seamless parameter transfer. In this way, designers can quickly complete the layout design of the optical device based on the optimized parameters and perform further performance iterative optimization.

[0110] In a preferred embodiment, the simulation module adopts finite element method (FEM) or finite difference time domain method (FDTD) to construct a physical field simulation model, which can more accurately simulate the electromagnetic field distribution in a complex optical device.

[0111] In another preferred embodiment, the integral and transform module further comprises a frequency domain transform sub-module for converting the time domain electromagnetic field data into frequency domain data, facilitating the subsequent calculation and analysis of the scattering matrix.

[0112] In yet another preferred embodiment, the optimization module adopts genetic algorithm or particle swarm optimization algorithm as the preset mathematical optimization algorithm, which can more efficiently search for the optimal parameter combination.

[0113] In a further preferred embodiment, the output module further comprises a parameter verification sub-module for verifying the rationality of the parameters before feeding the final parameter set back to the EDA tool, ensuring that the parameters meet the physical constraint conditions.

[0114] The optical device design system realizes accurate extraction and optimization of optical device parameters through precise physical field simulation, rigorous mathematical transformation and efficient optimization algorithm, providing strong support for the design and manufacture of optoelectronic devices.

[0115] The above-described embodiments are merely exemplary descriptions of the present application and do not limit the scope of the present application. Without departing from the design spirit of the present application, various modifications and improvements to the technical solutions of the present application made by those of ordinary skill in the art shall fall within the scope of the present application.

Claims

1. A method for measuring parameters of an optical device based on a combination of mathematical physics, characterized in that, The method comprises the following steps: a physical field simulation model of the optical device is established, and port electromagnetic field distribution is obtained; waveguide mode orthogonality is used to perform surface integration on the port electromagnetic field, and frequency domain complex amplitudes of each port are obtained; a scattering matrix is calculated according to the frequency domain complex amplitudes, and optical device parameters are extracted; wherein four adjacent cross sections in the rectangular waveguide are selected as observation planes to obtain electric field components, and according to the orthogonality of waveguide modes, scalar potentials are calculated by performing surface integration on the electric field components on the observation planes, and for the first and second observation planes, the scalar potentials can be expressed as: ， S is the cross-sectional integration area of the observation plane, Ex(x, y, z0, t) and Ex(x, y, z0+Δz, t) are electric field components on the first and second observation planes at time t respectively, and then the Fourier transform is performed to transform to the frequency domain, and it is expressed as: ， wherein A(ω) and B(ω) are incident wave amplitudes from an excitation source and reflected wave amplitudes from a material respectively.

2. The optical device parameter measurement method according to claim 1, wherein After the optical device parameters are extracted, the method further comprises the steps of: an equivalent circuit analytical expression is introduced to locally correct the extracted optical device parameters.

3. The optical device parameter measurement method according to claim 1 or 2, wherein After the optical device parameters are extracted, the method further comprises the steps of: the scattering matrix is coupled with a preset mathematical optimization algorithm, and the extraction result is iteratively optimized to obtain a final parameter set of the optical device parameters that simultaneously satisfy physical interpretability and mathematical accuracy.

4. The optical device parameter measurement method according to claim 3, wherein The mathematical optimization algorithm comprises at least one of a gradient descent method, a genetic algorithm, and a reinforcement learning algorithm; The mathematical optimization algorithm is used to minimize an error function between simulation and actual measurement, or between simulation and an equivalent circuit model.

5. The optical device parameter measurement method according to claim 4, wherein The physical field simulation model is a three-dimensional finite difference time domain model, and the port electromagnetic field distribution is obtained by sampling time domain electric field components.

6. The optical device parameter measurement method according to claim 5, wherein The waveguide mode orthogonality integral is performed between adjacent cross sections, the cross section spacing Δz is equal to the grid step of the three-dimensional finite difference time domain, and the integral result is converted to the frequency domain by Fourier transform.

7. The optical device parameter measurement method according to claim 5, wherein The scattering matrix is an N×N complex matrix, N is the total number of optical device ports, and the matrix elements contain amplitude information and phase information, which are used to completely characterize the power distribution, phase change and port coupling of the optical signal inside the optical device.

8. The optical device parameter measurement method according to claim 5, wherein, The optical device is suitable for a heterogeneous multi-material, multi-physical field coupling device; and the optical device is any one of an anisotropic material rectangular waveguide, a Y-type beam splitter, and a microwave photon link.

9. The optical device parameter measurement method according to claim 4, wherein, The error function is a weighted mean square error, and the weights are dynamically allocated according to the importance of the frequency points to improve the parameter accuracy in the key frequency band.

10. The optical device parameter measurement method according to claim 3, wherein, The final parameter set includes equivalent refractive index, coupling coefficient, transmission loss, reflection coefficient, group delay and polarization dependent loss, and all parameters maintain physical consistency in the same mathematical framework.

11. A computer readable storage medium, characterized in that, The computer program is stored on the computer readable storage medium, and when the computer program is executed by the processor, the steps of the optical device parameter measurement method in any one of claims 1-10 are implemented.

12. An optoelectronic device design system, characterized by The computer readable storage medium of claim 11 comprises: a simulation module for establishing a physical field simulation model of the optical device and obtaining port electromagnetic field distribution; An integral and transform module is configured to perform a surface integral on the port electromagnetic field by using waveguide mode orthogonality to obtain a frequency domain complex amplitude of each port, and calculate a scattering matrix according to the frequency domain complex amplitude to extract optical device parameters; An optimization module is configured to couple the scattering matrix with a preset mathematical optimization algorithm, iteratively optimize the extraction result, and obtain a final parameter set of the optical device parameters that satisfy both physical interpretability and mathematical accuracy; An output module is configured to feed back the final parameter set to an EDA tool to complete layout and performance iterative optimization of the optical device.

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