Circuit board state monitoring method

Abstract

The invention discloses a circuit board state monitoring method, relates to the technical field of circuit boards, and solves the problems that traditional waveform analysis mostly depends on manual judgment of peak value differences, the incidence relation between waveform distortion and time delay is difficult to quantify, the traditional waveform analysis is easily interfered by external noise, and abnormal type positioning is fuzzy. According to the method, the rising edge and falling edge characteristics of the focusing waveform are tested through a high-speed signal, the identification logic of an unequal trend section is innovatively put forward, a waveform distortion area generated by the influence of a circuit board is accurately locked by comparing the amplitude trend difference of adjacent point positions, and the limitation that judgment only depends on a peak value in traditional waveform analysis is broken through; the screening mode based on'trend consistency 'can effectively eliminate interference of a stable waveform segment, directly position a core distortion area related to delay, provide accurate data support for subsequent anomaly type judgment, and avoid misjudgment of an anomaly root due to overall waveform fluctuation.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of circuit board, in particular to a circuit board state monitoring method. BACKGROUND

[0002] With the rapid development of electronic information industry, as the core carrier of electronic equipment, the integration, signal transmission rate and working environment complexity of circuit board continue to improve - from high-density mobile phone motherboard of consumer electronics, to high-reliability PLC module of industrial control, to high-speed signal transmission board of communication equipment, the performance stability of circuit board directly determines the running quality of terminal equipment.

[0003] However, in the production and actual operation process of circuit board, affected by factors such as welding process defects, component aging, line impedance mismatch and environmental interference, abnormal problems such as current and voltage fluctuation, signal transmission delay and waveform distortion are prone to occur. If not identified and processed in time, it may cause equipment failure, even safety accidents and serious economic losses.

[0004] Current circuit board state monitoring technology mainly includes two types: one is a monitoring method based on static parameter threshold, which compares the voltage, current and other parameters at a single time point with the preset fixed threshold to determine whether it is abnormal. Although this method is simple to operate, it is difficult to capture the dynamic change trend of parameters, and is prone to misjudgment and missed judgment due to transient interference or slow parameter drift, especially it cannot identify the hidden fault of "normal parameter value but mismatched change trend"; the other is a direct detection method based on high-speed signal waveform, which analyzes the rising edge, falling edge and peak value characteristics of the signal through oscilloscope and other equipment to locate the problems such as overshoot and undershoot.

[0005] However, this method needs to test all circuit boards one by one, which is extremely low in efficiency and not suitable for batch quality inspection or online monitoring scenarios; at the same time, traditional waveform analysis relies on manual judgment of peak value difference, which is difficult to quantify the correlation between waveform distortion and delay, and is easily disturbed by external noise, resulting in ambiguous abnormal type positioning. In addition, the existing monitoring technology generally has the problem of "disconnection between preliminary screening and precise inspection": either there is no efficient preliminary screening mechanism, resulting in a large number of qualified circuit boards entering the redundant precise inspection process, wasting detection resources; or the precise inspection stage cannot analyze the preliminary screening abnormal points, making it difficult to accurately locate the fault source (such as only finding delay abnormality, but unable to distinguish whether it is caused by overshoot or undershoot).

[0006] This "inefficient screening + ambiguous positioning" status has been difficult to meet the demand of modern electronic equipment for "high accuracy, high efficiency and high pertinence" of circuit board state monitoring, therefore, developing a circuit board state monitoring method that can balance the efficiency of preliminary screening and the accuracy of precise inspection, and realize quantitative positioning of abnormal types, has become a technical problem to be solved in the field. SUMMARY

[0007] In view of the deficiencies of the prior art, the present application provides a circuit board state monitoring method, which solves the problem that the conventional waveform analysis relies on manual judgment of peak value difference, is difficult to quantify the correlation between waveform distortion and delay, and is susceptible to external noise interference, resulting in ambiguous abnormal type positioning.

[0008] To achieve the above object, the present application is implemented by the following technical scheme: a circuit board state monitoring method, comprising the following steps: Step one, monitoring the operation of the circuit board, confirming a group of monitoring periods, and performing feature verification on the associated operation parameters in the monitoring period to identify whether the test meets the standard in the initial detection process of the circuit board, the specific method being: Confirming each item of operation parameters associated in the preset monitoring period, and generating an operation parameter change curve belonging to the corresponding operation parameter associated according to different operation parameters associated at different times in the monitoring period, the horizontal axis of the curve being a time line, and the vertical axis being the corresponding operation parameter, and the monitoring period being a preset period; Confirming the time period trend associated with adjacent time periods in different operation parameter change curves associated with different operation parameters: in the corresponding operation parameter change curve, the operation parameter associated with the initial time in the unit time is denoted as Yz1 i , the operation parameter associated with the end time is denoted as Yz2 i , and the trend Qs associated with the corresponding time period is confirmed by using: (Yz2 i -Yz1 i )=Qs, and a plurality of trend ratio columns of operation parameters associated with the corresponding time period are generated according to a preset ratio method, and it is identified whether the confirmed trend ratio column is located in the preset ratio column interval, if yes, a test meets the standard signal is generated, if not, a secondary verification signal is generated, and the corresponding time period is recorded as an abnormal time period; According to the confirmed abnormal time period, the time periods associated before and after the abnormal time period are recorded as subsidiary time periods, the time period trend associated with the subsidiary time periods is confirmed from the corresponding operation parameter change curve, and the three groups of time period trends confirmed are sorted according to the relationship between the time periods, to generate a trend column; According to the abnormal time period, different trend columns associated with different operation parameters are confirmed, a group of time period trends are randomly selected from different trend columns for ratio confirmation, the trend ratio column associated with the corresponding selection process is identified, and other time period trends are sequentially selected for ratio confirmation, to complete the confirmation process of the trend ratio column corresponding to different selection processes, and it is confirmed from the plurality of trend ratio columns associated with the abnormal time period whether there is a trend ratio column located in the ratio column interval, if yes, a delay exists signal is generated, if not, a test does not meet the standard signal is directly generated; Step two, for the relevant circuit board with delay in the initial detection process, using high-speed signal to test the relevant circuit board, from the test stage, confirm the rising edge section and falling edge section of the signal output waveform, and confirm the unequal trend section from the rising edge section and falling edge section, the specific way is: According to the generated delay existing signal, confirm the relevant circuit board, and test the relevant circuit board with preset high-speed signal, and confirm the signal output waveform generated in the test process; Confirm the rising edge section and falling edge section from the signal output waveform: from the initial point of the signal waveform, confirm the continuously rising waveform section from the back, and record the confirmed waveform section as the rising edge section, then from the end point of the rising edge section, confirm the continuously falling waveform section from the back, and record the confirmed waveform section as the falling edge section, wherein the intersection between the rising edge section and the falling edge section; Confirm the amplitude trend between adjacent point positions from the rising edge section and the falling edge section, confirm the amplitude difference between the back point position and the front point position, record the absolute value of the confirmed amplitude difference as the amplitude trend of the corresponding adjacent point position waveform section, and compare the several groups of amplitude trends confirmed between the rising edge section and the falling edge section, record the waveform section with consistent amplitude trend as the same type of waveform section, and record the waveform section with no comparison result as the unequal trend section, and mark in the rising edge section and the falling edge section respectively; Step three, according to the unequal trend section confirmed in the rising edge section and the falling edge section, confirm the difference characteristics between the unequal trend sections, and identify whether the relevant circuit board belongs to overshoot anomaly or undershoot anomaly according to the difference characteristics, and perform specific display of signal and delay, the specific way is: Record the unequal trend section confirmed in the rising edge section as the rising trend section, and record the unequal trend section confirmed in the falling edge section as the falling trend section, perform mean processing on the several groups of amplitude trends associated with the rising trend section, confirm the trend characteristics Tz1 associated with the rising trend section, and perform confirmation on the trend characteristics Tz2 associated with the falling trend section by using the same confirmation method; If Tz1>Tz2, directly generate an overshoot anomaly signal, directly confirm the time delay associated between the rising trend section and the falling trend section, record the confirmed time delay as the overshoot anomaly delay, and display the generated overshoot anomaly signal and the overshoot anomaly delay; If Tz1=Tz2, directly generate an error signal; If Tz1

[0009] The application provides a circuit board state monitoring method. The application takes the running parameter change trend ratio as the core judgment basis in the initial detection stage instead of a single static parameter threshold, significantly improving the accuracy of abnormality identification. By generating real-time change curves of current, voltage and power, calculating the trend values of adjacent time periods and constructing a trend ratio column, and verifying the corresponding standard ratio interval of the circuit board resistance, both "dynamic abnormality" (such as power abnormality caused by mismatched current and voltage change trends) and "real fault" and "transient interference" can be distinguished through the trend column cross verification of "abnormal period-attached period"; the preset monitoring period of 3 minutes meets the needs of "covering typical running scenarios" and "fast preliminary screening", can efficiently mark the circuit boards with delay risks, avoid invalid testing of qualified boards in the subsequent fine detection stage, and greatly improve the efficiency of the overall monitoring process. The rising and falling edge characteristics of the focused waveform are tested through high-speed signal testing, and the identification logic of "unequal trend section" is innovatively proposed - by comparing the amplitude trend differences of adjacent points, the waveform distortion area caused by the circuit board is accurately locked, breaking through the limitation of "only relying on peak value judgment" in traditional waveform analysis; this screening method based on "trend consistency" can effectively exclude the interference of smooth waveform sections, directly locate the core distortion area related to delay, provide accurate data support for subsequent abnormal type judgment, and avoid misjudgment of the root cause of abnormality due to overall waveform fluctuation. By calculating the mean trend characteristics (Tz1, Tz2) of the unequal trend sections of the rising and falling edges, the over-shoot and under-shoot abnormalities are quantitatively distinguished and the delay parameters are accurately extracted; when Tz1>Tz2, it is determined as over-shoot abnormality, and when Tz1 BRIEF DESCRIPTION OF DRAWINGS

[0010] Figure 1 The application provides a circuit board state monitoring method. DETAILED DESCRIPTION

[0011] With reference to the drawings and embodiments of the present application, the technical solutions in the embodiments of the present application will be clearly and completely described. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by a person of ordinary skill in the art without creative effort belong to the scope of protection of the present application.

[0012] First embodiment Please refer to Figure 1 The present application provides a circuit board state monitoring method, comprising the following steps: Step one, monitor the running of the circuit board, confirm a group of monitoring periods, and perform feature verification on the running parameters associated in the monitoring period to identify whether the circuit board meets the test standard in the preliminary detection process. Specifically, during the preliminary monitoring process, the running current, running voltage and running power associated with the circuit board need to be monitored. According to the real-time monitoring delay processing process, it is identified whether the associated indicators meet the standard. When the delay is excessive, the circuit board needs to be marked; The specific way to identify whether the circuit board meets the test standard in the preliminary detection process is: Confirm the various running parameters associated in the preset monitoring period, and generate the running parameter change curve associated with the corresponding running parameter according to the different running parameters associated at different times in the monitoring period. The horizontal axis of the curve is the time line, and the vertical axis is the corresponding running parameter. The monitoring period is the preset period, which is determined in advance by the operator according to experience, and generally takes 3 minutes; In the different running parameter change curves associated with different running parameters, confirm the time period trend associated with adjacent time periods: in the corresponding running parameter change curve, the running parameter associated with the initial time in the unit time is recorded as Yz1 i , the running parameter associated with the end time is recorded as Yz2 i , and the trend Qs associated with the corresponding time period is confirmed by using: (Yz2 i -Yz1 i ) = Qs, and a plurality of trend ratio columns of running parameters associated with the corresponding time period are generated according to the preset ratio method (for example: current: voltage: power), and it is identified whether the confirmed trend ratio column is located in the preset ratio column interval. If yes, a test standard meeting signal is generated, and if no, a secondary verification signal is generated, and the corresponding time period is recorded as an abnormal time period. Specifically, the ratio column interval is a preset interval, and the standard ratio column associated with the corresponding (current: voltage: power) exists in a numerical range. The corresponding numerical range is related to the internal resistance associated with the corresponding circuit board. The numerical range is a standard range, and the standard range is the ratio column interval. According to the confirmed abnormal period, the periods associated with the abnormal period before and after are recorded as affiliated periods, the period trends associated with the affiliated periods are confirmed from the corresponding operating parameter change curves, and the confirmed three groups of period trends are sorted according to the chronological relationship to generate a trend column; According to the abnormal period, different trend columns associated with different operating parameters are confirmed, a group of period trends are randomly selected from different trend columns for ratio confirmation, a trend ratio column associated with the selected process is identified, and other period trends are sequentially selected for ratio confirmation to complete the confirmation process of the trend ratio column corresponding to different selected processes. From the several groups of trend ratio columns associated with the abnormal period, it is confirmed whether there is a trend ratio column located in the ratio column interval. If there is, a delay exists signal is generated. If not, a test failure signal is directly generated. Specifically, in the actual test process, the corresponding circuit board has each parameter to be monitored. In the corresponding monitoring period, each parameter has a corresponding change trend in the same period. According to the corresponding trend confirmation process, the ratio between the corresponding change trends in the same period can be effectively confirmed. According to the corresponding trend ratio column associated with the ratio, it is comprehensively confirmed whether the change trend characteristics associated with the corresponding period are consistent. If it belongs to the standard range, it means that the changed parameters in the corresponding period belong to the normal change state. If it does not belong to the normal standard range, it means that the changed parameters in the corresponding period belong to the abnormal change state. Abnormal evaluation is needed to confirm whether there is a related delay. If there is a related delay, subsequent feature confirmation is needed to identify whether the delay is out of standard. If there is a real abnormality, the abnormal signal can be directly displayed. Step 2: For the related circuit board with delay in the initial detection process, a high-speed signal is used to test the related circuit board. From the test stage, the rising edge and falling edge of the signal output waveform are confirmed, and unequal trend segments are confirmed from the rising edge and falling edge. Specifically, the high-speed signal is a smooth and relatively consistent signal waveform when input. After passing through the circuit board, a group of output waveforms are generated. The signal waveform is affected by the circuit board, causing abnormal waveform changes, so that there are unequal trend segments in the trend segments before and after the signal waveform. The unequal trend segments are the related wave segments with unequal trends, which need to be confirmed for subsequent feature analysis process. The specific way to confirm the unequal trend segments is as follows: According to the generated delay existing signal, the associated related circuit board is confirmed, and a preset high-speed signal is used to test the related circuit board, and the signal output waveform generated in the test process is confirmed. Confirming the rising edge section and the falling edge section from the signal output waveform: starting from the initial point of the signal waveform, confirming the continuously rising waveform section from the back, and recording the confirmed waveform section as the rising edge section; then starting from the end point of the rising edge section, confirming the continuously falling waveform section from the back, and recording the confirmed waveform section as the falling edge section. The intersection point between the rising edge section and the falling edge section (i.e. the end point of the rising edge section or the start point of the falling edge section) is the continuously rising waveform section and the continuously falling waveform section. When the corresponding high-speed signal is input, the signal waveform is also from the continuously rising stage to the continuously falling stage, which is convenient for waveform verification. From the specific verification process, the specific characteristics between the rising edge section and the falling edge section are confirmed. Then confirming the unequal trend section from the rising edge section and the falling edge section: confirming the amplitude trend between adjacent points from the rising edge section and the falling edge section, confirming the amplitude difference between the latter point and the former point (i.e. the amplitude of the latter point minus the amplitude associated with the former point), recording the absolute value of the confirmed amplitude difference as the amplitude trend of the corresponding adjacent point section, and comparing the several groups of amplitude trends confirmed between the rising edge section and the falling edge section. The waveform section with consistent amplitude trend is recorded as the same type of waveform section, and the waveform section with inconsistent amplitude trend is recorded as the unequal trend section and marked in the rising edge section and the falling edge section. Specifically, in the corresponding waveform section, there is a change in amplitude trend, and the trend change characteristics associated between the former and the latter two waveform sections are consistent, which means that the corresponding waveform section belongs to the same type of trend waveform section. If the trend change characteristics associated between the former and the latter two waveform sections cannot be found to be consistent, it means that the corresponding waveform section belongs to different types of trend waveform section, i.e. unequal trend section. In the case of consistent high-speed signal trend, if the associated signal output waveform is inconsistent, it means that there is a delay, which needs to be confirmed and displayed for relevant personnel to check and take appropriate measures.

[0013] Second embodiment Step three: confirming the difference characteristics associated between the unequal trend sections according to the unequal trend sections confirmed in the rising edge section and the falling edge section, and identifying whether the related circuit board belongs to overshoot abnormality or undershoot abnormality according to the difference characteristics, and displaying the signal and the delay specifically; Specifically, the related circuit board is identified according to the difference characteristics as follows: Recording the unequal trend sections confirmed in the rising edge section as the rising trend sections, and recording the unequal trend sections confirmed in the falling edge section as the falling trend sections. The several groups of amplitude trends associated with the rising trend sections are processed by mean value to confirm the trend characteristics Tz1 associated with the rising trend sections. The same confirmation method is used to confirm the trend characteristics Tz2 associated with the falling trend sections. If Tz1>Tz2, it represents that the related circuit board has an overshoot behavior, an overshoot abnormal signal is directly generated, a time delay associated between the rising trend segment and the falling trend segment is directly confirmed, the confirmed time delay is recorded as an overshoot abnormal delay, and the generated overshoot abnormal signal and the overshoot abnormal delay are displayed; If Tz1=Tz2, an error signal is directly generated, which represents that the analysis is wrong and human intervention is needed, and the specific abnormal situation is identified. Why does this feature appear? Generally, there is a large interference in the output of the signal, which leads to a large difference between the waveforms before and after, but in fact there is no any overshoot or undershoot situation, but because of the waveform interference, there is a sharp fluctuation between the waveform segments; If Tz1<Tz2, it represents that the related circuit board has an undershoot behavior, an undershoot abnormal signal is directly generated, a time delay associated between the rising trend segment and the falling trend segment (that is, there is a time range between the corresponding trend segments, and there is a time difference value in the time range of the two trend segments, and the time difference value is the corresponding time delay) is directly confirmed, the confirmed time delay is recorded as an undershoot abnormal delay, and the generated undershoot abnormal signal and the undershoot abnormal delay are displayed; Specifically, according to the trend characteristics associated with the corresponding wave segment, the difference between different trend segments is confirmed, so as to lock the corresponding difference characteristics, then the locked difference characteristics are confirmed, whether the trend segment has an overshoot or an undershoot situation is identified, the specific delay characteristics are confirmed, and according to the actual confirmation result, the specific signal associated and the related delay are specifically displayed for the relevant operating personnel to view.

[0014] Some data in the above formula are dimensionless numerical calculations, and the contents not described in detail in the specification all belong to the prior art known to those skilled in the art.

[0015] The above embodiments are only used to illustrate the technical method of the present application and are not limited. Although the present application has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical method of the present application can be modified or replaced equivalently without departing from the spirit and scope of the technical method of the present application.

Claims

1. A method of monitoring the condition of a circuit board, characterized by, The method comprises the following steps: Step one, monitoring the circuit board, confirming a group of monitoring periods, and checking the characteristics of the operation parameters associated with the monitoring periods to identify whether the circuit board meets the test standards in the preliminary detection process; Step two, for the related circuit board with a delay in the preliminary detection process, using a high-speed signal to test the related circuit board, confirming the rising edge and falling edge of the signal output waveform from the test stage, and confirming the unequal trend section from the rising edge and falling edge; Step three, according to the unequal trend section confirmed in the rising edge and falling edge, confirming the difference characteristics associated between the unequal trend sections, and identifying whether the related circuit board belongs to overshoot anomaly or undershoot anomaly according to the difference characteristics, and specifically displaying the signal and delay.

2. A method of monitoring the condition of a circuit board as claimed in claim 1, wherein, In step one, the specific way to identify whether the circuit board meets the test standards in the preliminary detection process is: Confirming each operation parameter associated with the preset monitoring period, and generating an operation parameter change curve associated with the corresponding operation parameter according to different operation parameters associated with different times in the monitoring period, the horizontal axis of the curve is the time line, and the vertical axis is the corresponding operation parameter, and the monitoring period is the preset period; In the different operation parameter change curves associated with different operation parameters, the time period trend associated with adjacent time periods is confirmed: in the corresponding operation parameter change curve, the operation parameter associated with the initial time in unit time is recorded as Yz1 i , and the operation parameter associated with the terminal time is recorded as Yz2 i . The trend Qs associated with the corresponding time period is confirmed by using: (Yz2 i -Yz1 i )=Qs, and a plurality of trend ratio columns of the operation parameters in the corresponding time period are generated according to a preset ratio mode. Whether the confirmed trend ratio column is located in a preset ratio column interval is identified. If yes, a test reaching standard signal is generated. If no, a secondary verification signal is generated, and the corresponding time period is recorded as an abnormal time period.

3. A method of monitoring the condition of a circuit board as claimed in claim 2, wherein, In step one, the specific way to perform secondary verification on the circuit board according to the secondary verification signal is: According to the confirmed abnormal period, the time period associated with the abnormal period before and after the abnormal period is recorded as an auxiliary time period, the time period trend associated with the auxiliary time period is confirmed from the corresponding operation parameter change curve, and the confirmed three groups of time period trends are sorted according to the relationship between the time periods to generate a trend column; According to the abnormal period, different trend columns associated with different operation parameters are confirmed, a group of time period trends are randomly selected from different trend columns for ratio confirmation, a trend ratio column associated with the corresponding selection process is identified, and other time period trends are sequentially selected for ratio confirmation, and the confirmation process of the corresponding trend ratio column of different selection processes is completed, whether there is a trend ratio column in the ratio column interval is confirmed from the several groups of trend ratio columns associated with the abnormal period, if there is, a delay exists signal is generated, and if there is not, a test failure signal is directly generated.

4. A method of monitoring the condition of a circuit board as claimed in claim 3, wherein, In step two, the specific way to confirm the rising edge and falling edge of the signal output waveform is: According to the generated delay existing signal, the associated related circuit board is confirmed, a preset high-speed signal is used to test the related circuit board, and the signal output waveform generated in the test process is confirmed; The rising edge and falling edge are confirmed from the signal output waveform: starting from the initial point of the signal waveform, the continuously rising waveform section is confirmed, and the confirmed waveform section is recorded as the rising edge, then starting from the end point of the rising edge, the continuously falling waveform section is confirmed, and the confirmed waveform section is recorded as the falling edge, wherein the intersection point between the rising edge and the falling edge.

5. A method of monitoring the condition of a circuit board as claimed in claim 4, wherein, In step two, the specific way to confirm the unequal trend section is: The amplitude trend between adjacent points is confirmed in the rising edge section and the falling edge section, the amplitude difference between the latter point and the former point is confirmed, the absolute value of the confirmed amplitude difference is recorded as the amplitude trend of the corresponding adjacent point wave section, and several groups of amplitude trends confirmed between the rising edge section and the falling edge section are compared. The wave section with consistent amplitude trend is recorded as the same type wave section, and the wave section without comparison result is recorded as the unequal trend section, and is marked in the rising edge section and the falling edge section.

6. The method of claim 1, wherein, In step three, the specific way of identifying the related circuit board according to the difference characteristics is: The unequal trend section confirmed in the rising edge section is recorded as the rising trend section, and the unequal trend section confirmed in the falling edge section is recorded as the falling trend section. The mean value of several groups of amplitude trends associated with the rising trend section is processed to confirm the trend feature Tz1 associated with the rising trend section, and the same confirmation method is used to confirm the trend feature Tz2 associated with the falling trend section. If Tz1>Tz2, an overshoot abnormal signal is directly generated, the time delay between the rising trend section and the falling trend section is directly confirmed, the confirmed time delay is recorded as the overshoot abnormal delay, and the generated overshoot abnormal signal and the overshoot abnormal delay are displayed.

7. A method of monitoring the condition of a circuit board as claimed in claim 6, wherein, In step three, if Tz1=Tz2, an error signal is directly generated.

8. A method of monitoring the condition of a circuit board as defined in claim 6, wherein In step three, if Tz1 In step three, if Tz1 In step three, if Tz1

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