Test sorting machine and test sorting method thereof

Abstract

The invention provides a test sorting machine and a test sorting method thereof, and the test sorting machine comprises a vibration feeding module which is used for adjusting each device to be placed in a set surface and a set direction and then feeding; the operation module comprises an operation platform and a tray positioning device; the tray positioning device is arranged on the working table and drags the first tray to move and be fixed. The laser marking module is arranged above the operation module and is used for marking the to-be-operated device in the first tray; the test module comprises a test machine table and a second tray; the second tray is used for placing an abnormal test device; and the carrying module is arranged above the vibration feeding module, the operation module and the test module, a pickup suction nozzle is arranged at the bottom of the carrying module, and the carrying module is used for carrying the pickup suction nozzle to move and accurately position. The testing and sorting machine is applied to a reliability laboratory, the functions of testing, sorting, marking, plate placing, retesting and the like are integrated, the equipment size is small, the operation is suggested, and the stability is high.

Description

Technical Field

[0001] This invention relates to the field of semiconductor testing, and in particular to a test sorting machine and its test sorting method. Background Technology

[0002] Semiconductor testing is a crucial step in the semiconductor manufacturing process, ensuring the quality and reliability of semiconductor products after design, production, and packaging. This includes, but is not limited to, aging tests (Burn-in), high temperature operating life (HTOL) tests, low temperature operating life (LTOL) tests, high temperature storage life (HTSL) tests, durability and data retention performance tests, pretreatment tests, thermal cycling tests (TC), temperature and humidity storage tests (THS), temperature and humidity bias tests (THB), high-pressure furnace tests (PCT), galvanic corrosion tests, and mechanical factor reliability tests.

[0003] Devices are generally classified into two categories according to their connection method: through-hole (PTH) and surface mount (SMD). Currently, both are tested manually. Through-hole devices are easy to test and operate, as they can be inserted and removed. However, surface mount devices are difficult to test due to their small size, making it difficult to identify their orientation. They also require tweezers to pick them up during testing, which is difficult and inefficient for multiple batches. Furthermore, there is a risk of failure due to human error during testing.

[0004] Therefore, how to improve the testing efficiency of surface mount devices and avoid the risk of failure has become one of the problems that urgently need to be solved by those skilled in the art.

[0005] It should be noted that the above description of the technical background is only for the purpose of providing a clear and complete explanation of the technical solutions of the present invention and facilitating understanding by those skilled in the art. It should not be assumed that the above technical solutions are known to those skilled in the art simply because they have been described in the background section of this invention. Summary of the Invention

[0006] In view of the shortcomings of the prior art described above, the purpose of this invention is to provide a test sorting machine and its test sorting method to solve the problems of low testing efficiency and high failure risk of surface mount devices in the prior art.

[0007] To achieve the above and other related objectives, the present invention provides a test sorting machine for testing surface mount devices, the test sorting machine comprising at least:

[0008] Vibration feeding module is used to feed materials after adjusting each device to a set surface and a set direction.

[0009] The work module includes a worktable and a pallet positioning device; the pallet positioning device is set on the worktable and moves and fixes the first pallet.

[0010] A laser marking module is disposed above the working module and is used to mark the devices to be worked on in the first tray;

[0011] The test module includes a test bench and a second tray; the second tray is used to place faulty test devices.

[0012] The conveying module is located above the vibrating feeding module, the working module, and the testing module, and has a pick-up nozzle at the bottom for carrying the pick-up nozzle to move and accurately position it.

[0013] Optionally, the vibration feeding module includes a circular vibrator, a linear vibrator, a first sensor, a second sensor, and a purging device;

[0014] The circular vibrator vibrates each device and transports the devices along a circular trajectory to adjust the placement surface and orientation of each device.

[0015] The first sensor is mounted on the circular vibrator and is used to detect the placement surface of the device after the placement surface and orientation have been adjusted.

[0016] The second sensor is disposed on the circular vibrator and is used to detect the orientation of the device after the placement surface and orientation have been adjusted;

[0017] The purging device purges devices that do not meet the requirements of the set surface or set direction based on the detection results of the first sensor and the second sensor, so as to make readjustments;

[0018] The linear vibrator is connected to the output end of the circular vibrator, and sequentially sends out devices placed with a set surface and a set direction.

[0019] Alternatively, the vibration feeding module may further include a third sensor, a fourth sensor, and a fifth sensor;

[0020] The third sensor is located at the starting end of the linear vibration and is used to detect whether the device inside the linear vibration is full;

[0021] The fourth sensor is located at the middle of the vertical vibration and is used to detect whether the components inside the vertical vibration are lacking material.

[0022] The fifth sensor is located at the end of the linear vibrator and is used to detect whether the device inside the linear vibrator has reached the discharge port of the linear vibrator.

[0023] Optionally, the testing equipment includes a chip test socket, an adjustment platform, an X-axis adjustment mechanism, a Y-axis adjustment mechanism, an X-axis locking mechanism, and a Y-axis locking mechanism; the chip test socket is disposed on the adjustment platform; the X-axis adjustment mechanism adjusts the adjustment platform in the X-axis direction; the Y-axis adjustment mechanism adjusts the adjustment platform in the Y-axis direction; the X-axis locking mechanism restricts the movement of the adjustment platform in the X-axis direction; and the Y-axis locking mechanism restricts the movement of the adjustment platform in the Y-axis direction.

[0024] Optionally, at least two sets of pickup nozzles are provided below the transport module.

[0025] Optionally, both the first tray and the second tray include multiple grooves, each groove serving as a workstation for placing devices and having a drainage hole at its bottom.

[0026] To achieve the above and other related objectives, the present invention also provides a test sorting method, implemented based on the above-described test sorting machine, wherein the test sorting method includes at least:

[0027] A first tray loaded with devices is provided, and the first tray is fixed on a worktable based on the work module; the devices in the first tray are placed one by one into the test module for testing based on the transport module.

[0028] Return the qualified devices to their original positions in the first tray; place the unqualified devices in the second tray and record the tray and workstation number corresponding to the source of the unqualified device.

[0029] Optionally, the test sorting method further includes:

[0030] The first empty pallet is dragged and fixed in the work area by the working module; the device is adjusted to be placed with a set surface and a set direction by the vibration feeding module, and the adjusted devices are fed out in sequence.

[0031] The conveying module places each device output from the vibration feeding module into the workstation of the first tray one by one.

[0032] Alternatively, the test sorting method may further include: marking the devices in the first tray based on a laser marking module.

[0033] Optionally, the test sorting method further includes: after the test, retesting the unqualified devices; if the retest is successful, the successful devices are returned to their original positions in the first tray; if the unqualified devices are unqualified, they are still placed in the second tray.

[0034] As described above, the test sorting machine and test sorting method of the present invention have the following beneficial effects:

[0035] 1. The test sorting machine and its test sorting method of the present invention adopt automation to replace manual operation process, so that personnel do not come into contact with the device, avoiding ESD damage to the device during manual operation, and greatly reducing ESD risk.

[0036] 2. The test sorting machine and its test sorting method of the present invention use a suction nozzle to press the device down to the test seat. The downward pressure is uniform, and the device makes full and accurate contact with the spring needle, avoiding device arcing failure caused by human placement habits, thereby reducing the risk of damage to the test seat.

[0037] 3. The testing and sorting machine and its testing and sorting method of the present invention rationally set the positions of each module to reduce the moving distance; and adopt a mechanical operation method to greatly improve the efficiency of the testing process. As an example, manual testing takes 2 minutes for sorting, 2 minutes for marking, 15 minutes for testing, and 5 minutes for retesting; the present invention takes 1 minute for sorting, 10 seconds for marking, 4 minutes for testing, and 1 minute for retesting. Attached Figure Description

[0038] Figure 1 The diagram shown is a top view of the test sorting machine of the present invention.

[0039] Figure 2 The diagram shown is another top view of the test sorting machine of the present invention.

[0040] Figure 3 The diagram shown is a structural schematic of the test equipment of the present invention.

[0041] Figure 4 The diagram shown is a top view of the tray of the present invention.

[0042] Figure 5 The diagram shown is a schematic representation of the tray stacking structure of the present invention.

[0043] Figure 6 The diagram shown is a schematic of the host computer control interface of the present invention.

[0044] Component designation explanation

[0045] 1. Test sorting machine

[0046] 11 Vibration feeding module

[0047] 111 Circular Oscillation

[0048] 112 direct vibration

[0049] 12 Operation Modules

[0050] 121 Workbench

[0051] 122 Pallet Positioning Device

[0052] 13 Laser marking module

[0053] 14 Test Module

[0054] 141 Test Equipment

[0055] 141a Chip Test Socket

[0056] 141b Adjustment Platform

[0057] 141c X-axis adjustment mechanism

[0058] 141d Y-axis adjustment mechanism

[0059] 141e X-axis locking mechanism

[0060] 141f Y-direction locking mechanism

[0061] 142 Second tray

[0062] 15. Handling Module

[0063] 150 Pickup nozzle

[0064] 16 First tray

[0065] 17. Material rack module

[0066] 21 Grooves

[0067] 22 Drainage holes Detailed Implementation

[0068] The following specific examples illustrate the implementation of the present invention. Those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific embodiments, and various details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of the present invention.

[0069] Please see Figures 1-6 It should be noted that the illustrations provided in this embodiment are only schematic representations of the basic concept of the present invention. Therefore, the drawings only show the components related to the present invention and are not drawn according to the actual number, shape and size of the components in the actual implementation. In the actual implementation, the form, quantity and proportion of each component can be arbitrarily changed, and the layout of the components may also be more complex.

[0070] When surface-mount devices are manually tested in the laboratory, the testing process involves first placing the devices in sequence and a specific orientation on a tray (the tray needs to be covered with tape, which can attract impurities), labeling the devices, then picking them up with tweezers (risk of scratching the devices), placing them in the test fixture for testing, and then placing them back on the tray for the next process (including but not limited to aging). After the next process is completed, the above steps are repeated. This manual operation method is inefficient, carries the risk of losing devices during the picking process, and manually placing the devices into the chip test sockets can easily lead to placement deviations, causing the devices to arc and fail. Furthermore, repeated placement misalignments can cause the spring pins in the chip test sockets to collapse, affecting the test results.

[0071] This invention uses automated equipment to realize manual operation processes and changes the original device transfer method, thereby improving testing efficiency and testing quality.

[0072] like Figure 1 and Figure 2 As shown, the present invention provides a test sorting machine 1 for testing surface mount devices (hereinafter referred to as devices), comprising:

[0073] Vibration feeding module 11, operation module 12, laser marking module 13, testing module 14 and handling module 15.

[0074] like Figure 1 and Figure 2 As shown, the vibration feeding module 11 adjusts each device to the set surface and set direction before feeding.

[0075] Specifically, in this embodiment, the vibration feeding module 11 includes a circular vibrator 111, a linear vibrator 112, a first sensor (not shown in the figure), a second sensor (not shown in the figure), and a purging device (not shown in the figure). The circular vibrator 111 vibrates each device and transports the devices along a circular trajectory to adjust the placement surface and orientation of each device. The placement surface can be the front or back, and the placement orientation is the left-right direction (or polarity) of the device, which is set as needed. As an example, the circular vibrator 111 has a circular structure with a spiral conveying track on its inner sidewall, and the device moves along the conveying track inside the circular vibrator 111. The first sensor is mounted on the circular vibrator 111 and is used to detect the placement surface of the device after its placement surface and orientation have been adjusted. The second sensor is mounted on the circular vibrator 111 and is used to detect the orientation of the device after its placement surface and orientation have been adjusted. The first and second sensors can be set at any position that can detect the placement surface and orientation of the device within the conveyor track, including but not limited to being set above the circular vibrator 111. As an example, both the first and second sensors are implemented using fiber optic sensors. The first sensor determines the orientation of the device by learning the different reflective values ​​of the front and back sides of the device, and the second sensor determines the left and right orientation of the device by detecting whether the device reflects or blocks light. In actual use, any sensor that can achieve the above functions is applicable. A purging device is mounted on the circular vibrator 111 and, based on the detection results of the first and second sensors, purifies devices that do not meet the requirements for the set surface or set orientation for readjustment. The purging device can be set at any position that can blow the set device back to the center of the circular vibrator 111 and allow the circular vibrator 111 to readjust the placement surface and orientation. The linear vibrator 112 is connected to the output end of the circular vibrator 111, and sequentially delivers devices placed with a set surface and a set orientation. Any device capable of adjusting the placement surface and orientation of the devices is applicable to this invention and is not limited to this embodiment.

[0076] Furthermore, such as Figure 1 and Figure 2As shown, to achieve a high degree of automation, the vibratory feeding module 11 also includes a third sensor (not shown), a fourth sensor (not shown), and a fifth sensor (not shown). The third sensor is located at the starting end of the linear vibrator 112 and is used to detect whether the linear vibrator 112 is full. The components in the linear vibrator 112 are sequentially conveyed to the discharge port of the linear vibrator 112. When the third sensor detects a component, it indicates that the component in the linear vibrator 112 has been discharged from the discharge port to the starting end (feed port) of the linear vibrator 112, and the component at the discharge port of the linear vibrator 112 needs to be processed in time. The fourth sensor is located at the middle of the linear vibrator 112 and is used to detect whether the component in the linear vibrator 112 is short of components. When the fourth sensor cannot detect a component, it indicates that there are relatively few components in the linear vibrator 112, and they have not been discharged from the discharge port to the middle of the linear vibrator 112. The circular vibrator 111 needs to provide more components with adjusted placement surfaces and orientations (the circular vibrator 111 may be faulty). The fifth sensor is located at the end of the vertical vibrator 112 and is used to detect whether the device inside the vertical vibrator 112 has reached the discharge port of the vertical vibrator 112. When the fifth sensor detects a device, it indicates that the device has been delivered to the discharge port (material arrival), and the pick-up nozzle can remove the device from the discharge port. The operating status of the vibration feeding module 11 can also be comprehensively evaluated and corresponding subsequent operations can be performed based on the detection results of the third, fourth, and fifth sensors, which will not be elaborated here. As an example, the third, fourth, and fifth sensors are all implemented using fiber optic sensors. One end of the sensor emits a signal, and the other end receives the signal. If there is a device, the emitted signal is blocked, and the other end cannot receive the signal; if there is no device, the other end can receive the emitted signal. In actual use, any sensor that can achieve the above functions is applicable and is not limited to this embodiment.

[0077] like Figure 1 and Figure 2 As shown, the work module 12 includes a worktable 121 and a pallet positioning device 122. The pallet positioning device 122 is mounted on the worktable 121 and moves and fixes the first pallet 16.

[0078] Specifically, in this embodiment, the working module 12 is positioned between the vibratory feeding module 11 and the testing module 14 to reduce the path of the transported components and improve efficiency. In actual use, the position of the working module 12 can be set as needed. In this embodiment, a track is provided on the worktable 121, and the pallet positioning device 122 can drag the first pallet 16 back and forth on the track. As an example, the front end of the pallet positioning device 122 is magnetic, which can magnetically attract the first pallet 16, moving the first pallet 16 to the working area and fixing the first pallet 16.

[0079] like Figure 1 and Figure 2As shown, in another implementation of the present invention, the test sorting machine 1 further includes a material rack module 17 disposed at the end of the working module 12. The material rack module 17 includes a first set of material racks and a second set of material racks. The first set of material racks is used to place a first tray, on which the device to be tested or the device that has passed the test is placed. For example, the first set of material racks can hold five trays stacked sequentially. The second set of material racks is used to place a second tray, on which the device that has failed the test is placed. For example, the second set of material racks can hold five trays stacked sequentially. Further, the test sorting machine 1 also includes a lifting mechanism (not shown in the figure). The lifting mechanism can raise or lower the material rack to a designated position. For example, the first tray to be processed is raised to the height of the worktable 121 so that the tray positioning device 122 magnetically attracts the first tray to be processed and drags the first tray to be processed onto the worktable 121 for subsequent processing. In actual use, the pallet to be worked on can also be placed on the workbench 121 or the material rack at the same height as the workbench 121 manually, but this is more labor-intensive and there is a risk of failure caused by human factors.

[0080] like Figure 2 As shown, the laser marking module 13 is positioned above the working module 12 and is used to mark the devices to be worked on in the first tray 16.

[0081] Specifically, in this embodiment, the laser marking module 13 is fixed above the worktable 121 via a gantry frame and is used to mark the devices in the first tray 16 on the worktable 121. As an example, the laser marking module 13 can complete the marking of one tray in just 5 seconds, while manual handwriting is expected to take 2 minutes. Therefore, the laser marking module 13 can greatly improve efficiency. As another example, the laser marking module 13 can also be fixed on the transport module 15, and the movement of the transport module 15 drives the laser marking module 13 to move above the worktable 121. Any structure that can fix the laser marking module and set the laser marking module in a preset position is applicable to the present invention and is not limited to this embodiment.

[0082] like Figure 1 and Figure 2 As shown, test module 14 is used for device testing and classification.

[0083] Specifically, in this embodiment, the vibratory feeding module 11, the working module 12, and the testing module 14 are arranged sequentially from left to right. The testing module 14 includes a testing platform 141 and a second tray 142.

[0084] More specifically, the test equipment 141 is used to test various devices, such as Figure 3As shown in the example, the test fixture 141 includes a chip test socket 141a, an adjustment platform 141b, an X-axis adjustment mechanism 141c, a Y-axis adjustment mechanism 141d, an X-axis locking mechanism 141e, and a Y-axis locking mechanism 141f. The chip test socket 141a is mounted on the adjustment platform 141b, and the device under test (DUT) is placed in the mounting slot of the chip test socket 141a, making full contact and electrical connection with the spring pins within the chip test socket 141a. The chip test socket 141a provides test signals and reads the feedback signals from the DUT to complete the test. The X-axis adjustment mechanism 141c adjusts the adjustment platform 141b in the X-axis direction; in this example, the X-axis adjustment mechanism 141c adjusts the adjustment platform 141b using a knob. The Y-axis adjustment mechanism 141d adjusts the adjustment platform 141b in the Y-axis direction; in this example, the Y-axis adjustment mechanism 141d adjusts the adjustment platform 141b using a knob. The X-axis locking mechanism 141e is used to restrict the movement of the adjustment platform 141b in the X-axis direction to fix the adjustment platform 141b; in this example, the X-axis locking mechanism 141e is implemented by a knob. The Y-axis locking mechanism 141f is used to restrict the movement of the adjustment platform 141b in the Y-axis direction to fix the adjustment platform 141b; in this example, the Y-axis locking mechanism 141f is implemented by a knob. The chip test socket 141a, as a key component in the test module 14, suffers from high wear and tear and needs to be replaced regularly. This embodiment can achieve high-precision replacement and calibration, and the replacement and calibration are simple, requiring only the loosening of two locking screws (X-axis locking mechanism 141e and Y-axis locking mechanism 141f) for replacement.

[0085] More specifically, the second tray 142 is used to place defective test devices, while qualified test devices are returned to the first tray 16 on the workbench 121, thereby classifying qualified and unqualified devices. Figure 4 As shown, in this embodiment, both the first tray 16 and the second tray 142 include multiple grooves 21. For example, one tray has 80 grooves. Each groove 21 serves as a workstation for placing components, and each groove 21 has a drainage hole 22 at its bottom, allowing for direct moisture aging testing. When the tray is placed in a moisture chamber, water can drain away through the drainage hole 22, eliminating the risk of water accumulation and preventing components from floating. In this example, the drainage holes 22 are located at the four corners of each groove 21. In this embodiment, each tray is made of aviation-grade aluminum, capable of withstanding long-term temperature shocks from -55℃ to 175℃ without deformation or discoloration. The trays can also be stacked using supports at the four corners. Figure 5 As shown.

[0086] like Figure 1 and Figure 2As shown, the conveying module 15 is positioned above the vibrating feeding module 11, the working module 12 and the testing module 14, and has a pick-up nozzle 150 at the bottom for carrying the pick-up nozzle 150 to move and accurately position it.

[0087] Specifically, in this embodiment, the transport module 15 has a two-axis structure and is driven by a motor. It can carry the pick-up nozzle 150 to move within a plane and achieve precise positioning. In actual use, the transport module 15 can also move in three-dimensional space, not limited to this embodiment. In this example, the pick-up nozzle 150 includes at least two sets, enabling the transport of multiple devices at once, thereby saving time and improving efficiency. As an example, two sets of nozzles are set up, left and right. During testing, the device picked up by the left (or right) nozzle is being tested. While the testing is in progress, the right (or left) nozzle picks up another device. After the first device is tested, the left (or right) nozzle picks up the device, and the right (or left) nozzle immediately places the device into the chip test socket 141a to continue testing, improving the work rhythm and saving work time.

[0088] The test sorting machine 1 of the present invention can be used for device traying, marking, test sorting, and retesting. In actual use, testing can be performed according to a set sequence or as required. The following describes the test sorting method performed by the test sorting machine 1 of the present invention, using the sequence of traying, marking, test sorting, and retesting as an example. The test sorting method includes:

[0089] 1) Tray loading process: The first empty tray is dragged and fixed in the work area based on the work module 12; the device is adjusted to be placed with a set surface and a set direction based on the vibration feeding module 11, and the adjusted device is sent out in sequence; the device output by the vibration feeding module 11 is placed into the work station of the first tray 16 one by one based on the handling module 15.

[0090] Specifically, the following steps are included: 11) The material rack module 17 raises the first pallet to be loaded to the designated position (generally at the same height as the workbench), the pallet positioning device 122 moves forward to one end of the material rack module 17, and pulls the empty first pallet 16 on the material rack module 17 off the material rack module 17 through the charging magnetic component at the front end, and moves backward to fix it in the work area.

[0091] 12) The vibration module 11 conveys the components according to a specific placement surface and direction, automatically placing scattered components in a specific orientation and conveying them to the end of the vertical vibrator 112, awaiting tray loading. More specifically, the components to be tested are poured into the circular vibrator 111, and the vibratory plate begins to rotate and vibrate. During vibration, the first sensor first determines the orientation of the components; components that meet the requirements continue to be conveyed, while those that do not are blown away by the airflow of the purging device. The second sensor determines the orientation of the components; those that do not meet the requirements are blown into the circular vibrator 111, and those that meet the requirements finally enter the vertical vibrator 112 with a uniform surface and orientation. When the vertical vibrator 112 is fully loaded with components, the third sensor sends a signal to pause the continued flow of components from the circular vibrator 111 into the vertical vibrator 112. Sensors are evenly distributed at the middle and end of the vertical vibrator 112 to determine whether there are components inside the vertical vibrator 112 and whether the end components are in place, ensuring the smooth operation of the workflow.

[0092] 13) The transport module 15 moves the pick-up nozzle 150 to the discharge port of the direct vibration 112, picks up the device, and moves it again above the first tray 16. The pick-up nozzle 150 loads the device into trays of 80 pieces each. The full first tray 16 can be sent back to the rack module 17 based on the tray positioning device 122. The rack module 17 continues to rise or fall to perform the next tray operation until all devices are loaded into trays.

[0093] It should be noted that the devices can be tested directly after being mounted, or they can be subjected to other operations (including but not limited to marking) or aging tests before testing.

[0094] 2) Marking process: The laser marking module 13 marks the components in the first tray 16. Specifically, the first tray 16 containing the components is fixed in the work area, the laser marking module 13 moves above the first tray 16, and marks the surface of the components according to the marking values ​​and specified directions set in the program. The depth of the marking can be adjusted by setting the laser power.

[0095] 3) Testing and sorting process: Provide a first tray 16 loaded with devices, and fix the first tray 16 on the workbench 121 based on the work module 12; put the devices in the first tray 16 one by one into the test module 14 for testing based on the handling module 15; put the qualified devices back in their original positions in the first tray 16; put the unqualified devices into the second tray 142, and record the source of the unqualified device and the corresponding tray and workstation number.

[0096] Specifically, the steps include: 31) The first tray 16 containing the device is fixed on the worktable 121.

[0097] 32) The transport module 15 moves the pick-up nozzle 150 above the first tray 16. The pick-up nozzle 150 picks up the devices and presses them one by one onto the chip test socket 141a. The test signal is sent to the test machine 141 to perform electrical parameter testing on the devices. After the test is completed, the devices are removed. Based on the test results, the devices are classified. Qualified devices are returned to their original positions in the first tray 16, and unqualified devices are placed in the second tray 142. The first tray (number) from which the unqualified device came and the station number on that first tray are recorded. As an example, the two sets of pick-up nozzles 150 work alternately to improve the work rhythm and save work time.

[0098] 4) Retesting process: After the initial test, unqualified devices are retested. If the retest is successful, the successful devices are returned to their original positions in the first tray 16 to ensure data consistency; if the retest is unsuccessful, they are placed back in the second tray. The number of retests can be set as needed, which will not be elaborated here.

[0099] It should be noted that the testing and sorting process can be performed independently as needed. That is, if the devices are already loaded into the first tray according to a certain placement surface and orientation, the traying and marking processes in the example above are not required. The other three processes can also be performed depending on the settings. As an example, the traying, testing and sorting, and retesting steps can be performed as needed, or the testing and sorting and retesting steps can be performed, or the marking and testing and sorting steps can be performed. These will not be elaborated on here.

[0100] This invention also provides a test sorting and monitoring system, which allows for control and intuitive display of the test sorting machine 1 via a host computer. For example... Figure 6 As shown, the host computer control interface has a first tray information display area (Tray information), a second tray information display area (defective product tray), and a control area.

[0101] Specifically, the first tray information display area can switch between displaying information for five first trays (Tray-1, Tray-2, Tray-3, Tray-4, Tray-5), where 1 (80) indicates that the first tray number is 1 and the workstation number is 80. After the corresponding workstation test is completed, if the device passes, it returns to its original workstation, and the workstation will display the corresponding workstation information; if it fails, there is no device at that workstation and no information is displayed. The first tray information display area also displays the completed processes (packing, marking, testing and sorting) of the current first tray through different colors or different brightness.

[0102] Specifically, the second tray information display area shows the source of the non-conforming parts in the corresponding workstation (there are no non-conforming parts in the figure yet); when a non-conforming part is placed in the second tray, the source of the part is displayed at the workstation where the part is placed, such as 1 (80), which means that the part comes from workstation 80 of the first tray. The second tray information display area can also display the total number of parts to be retested, the total number of parts that have been retested and turned into good products, and the total number of parts that are still defective after retesting.

[0103] Specifically, the control area is equipped with start buttons for each process step (packing, marking, testing and sorting, and retesting). Selecting the corresponding process step will control the testing and sorting machine 1 to complete the corresponding operation. When automatic mode is selected, the process steps are executed sequentially in the order of 1-packing, 2-marking, 3-testing and sorting, and 4-retesting, without the need for manual start of each process. The control area is also equipped with pause buttons, stop buttons, internal light on buttons, and return buttons to improve operational flexibility.

[0104] In summary, this invention provides a test sorting machine and its test sorting method, comprising: a vibratory feeding module for feeding components after adjusting them to a set surface and orientation; a working module including a worktable and a tray positioning device; the tray positioning device is set on the worktable, dragging and fixing a first tray; a laser marking module, set above the working module, for marking the components to be processed in the first tray; a test module including a test machine and a second tray; the second tray is used to place abnormal test components; and a transport module, set above the vibratory feeding module, the working module, and the test module, with a pick-up nozzle at the bottom for carrying the pick-up nozzle and precise positioning. This invention applies the test sorting machine to a reliability laboratory, integrating testing, sorting, marking, tray placement, and retesting functions into one device. It features a small size, easy operation, and high stability; it solves the difficulties of picking up and marking components during SMT device testing, addresses abnormal failures caused by human factors, improves testing efficiency, and achieves fully automated laboratory testing. Therefore, this invention effectively overcomes the various shortcomings of the prior art and has high industrial application value.

[0105] The above embodiments are merely illustrative of the principles and effects of the present invention and are not intended to limit the invention. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in the present invention should still be covered by the claims of the present invention.

Claims

1. A test handler for testing of a surface mount device, characterized by The test sorting machine at least comprises: a vibration feeding module for adjusting each device to be placed in a set surface and a set direction and then feeding; a work module comprising a workbench and a tray positioning device; the tray positioning device is arranged on the workbench to move and fix the first tray; a laser marking module arranged above the work module for marking the devices to be worked in the first tray; a test module comprising a test bench and a second tray; the second tray is used to place the devices with test abnormalities; a carrying module arranged above the vibration feeding module, the work module and the test module, and provided with a pick-up suction nozzle at the bottom for carrying and accurately positioning the pick-up suction nozzle.

2. The test handler of claim 1, wherein: The vibration feeding module comprises a circular vibration, a straight vibration, a first sensor, a second sensor and a blowing device; the circular vibration vibrates each device and transports the device in a circular track to adjust the placement surface and direction of each device; the first sensor is arranged on the circular vibration to detect the placement surface of the device after the placement surface and direction are adjusted; the second sensor is arranged on the circular vibration to detect the direction of the device after the placement surface and direction are adjusted; the blowing device blows the device that does not meet the set surface or set direction requirements based on the detection results of the first sensor and the second sensor to adjust again; the straight vibration is connected to the output end of the circular vibration to sequentially send out the devices placed in the set surface and set direction.

3. The test handler of claim 2, wherein: The vibration feeding module further comprises a third sensor, a fourth sensor and a fifth sensor; the third sensor is arranged at the starting end of the straight vibration to detect whether the devices in the straight vibration are full; the fourth sensor is arranged at the middle end of the straight vibration to detect whether the devices in the straight vibration are short of material; the fifth sensor is arranged at the end of the straight vibration to detect whether the devices in the straight vibration reach the discharge port of the straight vibration.

4. The test handler of claim 1, wherein: The test bench comprises a chip test seat, an adjustment platform, an X-direction adjusting mechanism, a Y-direction adjusting mechanism, an X-direction locking mechanism and a Y-direction locking mechanism; the chip test seat is arranged on the adjustment platform; the X-direction adjusting mechanism adjusts the adjustment platform in the X-axis direction; the Y-direction adjusting mechanism adjusts the adjustment platform in the Y-axis direction; the X-direction locking mechanism is used to limit the movement of the adjustment platform in the X-axis direction; and the Y-direction locking mechanism is used to limit the movement of the adjustment platform in the Y-axis direction.

5. The test handler of claim 1, wherein: At least two groups of pick-up suction nozzles are arranged below the carrying module.

6. The test handler of claim 1, wherein: The first tray and the second tray each comprise a plurality of grooves, each groove serving as a work station for placing a device and being provided with a drain hole at the bottom.

7. A test handling method, implemented by a test handler according to any one of claims 1 to 6, characterized in that, The test sorting method at least comprises: providing a first tray loaded with devices, fixing the first tray on the workbench based on the work module, and placing the devices in the first tray one by one into the test module for testing based on the carrying module; placing the qualified devices back to the original positions in the first tray; placing the unqualified devices into the second tray, and recording the tray and work station number position corresponding to the source of the unqualified devices.

8. The test sorting method of claim 7, wherein: The test sorting method further comprises: The empty first tray is dragged and fixed in the working area based on the working module; each device is adjusted to be placed in a set surface and a set direction, and the adjusted devices are sent out in sequence based on the vibration feeding module; Each device output by the vibration feeding module is put into the working position of the first tray one by one based on the carrying module.

9. The test sorting method of claim 7 or 8, wherein: The test sorting method further comprises the step of marking the devices in the first tray based on the laser marking module.

10. The test handling method of claim 7, wherein: The test sorting method further comprises the steps of retesting the unqualified devices after the test, and putting the qualified devices back to the original position in the first tray if the retest is qualified, or still putting the unqualified devices into the second tray. The test sorting method further comprises the steps of retesting the unqualified devices after the test, and putting the qualified devices back to the original position in the first tray if the retest is qualified, or still putting the unqualified devices into the second tray.

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