Fault detection method and device, electronic equipment, storage medium and computer program product

Abstract

The invention relates to a fault detection method and device, electronic equipment, a storage medium and a computer program product. The method comprises the following steps: acquiring the actual times of various types of abnormal restart of the electronic equipment to be detected; wherein each type of abnormal restart corresponds to the limit number of times, and the limit number of times is determined by the historical number of times of abnormal restart of each abnormal device in the at least two abnormal device groups; comparing each actual number of times with the corresponding limit number of times to obtain comparison results corresponding to various types of abnormal restarts; and determining a maintenance strategy of the to-be-detected electronic equipment based on each comparison result. The maintenance strategy of the to-be-detected electronic equipment can be dynamically adjusted according to the actual fault detection result, the after-sale maintenance quality can be improved, secondary complaint of a user is avoided, meanwhile, unnecessary chip replacement can be avoided, and the after-sale maintenance cost is reduced.

Description

Technical Field

[0001] This disclosure relates to the field of fault detection, and more particularly to a fault detection method, apparatus, electronic device, storage medium, and computer program product. Background Technology

[0002] Chip-related issues can cause various hidden problems such as rebooting, freezing, overheating, and white screens. At authorized electronic device service centers, devices with these problems that cannot be resolved by flashing the firmware will be replaced. The replaced electronic devices are not immediately scrapped but are returned to the factory for refurbishment, which involves a deep firmware flash. After a deep firmware flash, the following processing methods are generally used:

[0003] The first method involves performing a simple test on the flashed device. If no problems are found, it can be shipped. The problem with this method is that a simple test may not be able to reproduce chip-related malfunctions such as rebooting. After shipping, users may still encounter similar problems while using this type of device.

[0004] The second method involves performing an aging test on the faulty device. If it passes, the device is considered to have no chip-related issues, and the normal repair process is initiated before shipment. Otherwise, the chip is replaced. The advantage of this method is that it can identify devices with genuine chip problems. However, the drawback is that the aging test adds 6-8 hours of time and impacts the lifespan of the electronic equipment. It is generally believed that electronic equipment should be scrapped after three aging tests; therefore, this method is typically not used in after-sales repair.

[0005] The third method involves preventatively replacing the chips on the motherboard of the replaced electronic device. The advantage of this method is that it resolves the chip issue. However, the problem is that some device restart failures may not be caused by a chip problem, making direct chip replacement wasteful.

[0006] In summary, current after-sales maintenance typically employs simple testing methods and preventative chip replacement to address faulty equipment. However, simple testing methods cannot identify chip-related faults, and preventative chip replacement methods result in chip waste. Summary of the Invention

[0007] To overcome the problems existing in related technologies, this disclosure provides a fault detection method, apparatus, electronic device, storage medium, and computer program product. This aims to solve the problems of poor after-sales repair quality and high costs for electronic equipment.

[0008] According to a first aspect of the present disclosure, a fault detection method is provided, comprising:

[0009] Obtain the actual number of times the electronic device under test has experienced various types of abnormal restarts; wherein, each type of abnormal restart has a limit number of times, and the limit number of times is determined by the historical number of abnormal restarts of each abnormal device in at least two abnormal device groups;

[0010] By comparing each actual number of times with the corresponding limit number of times, the comparison results corresponding to various types of abnormal restarts are obtained.

[0011] Based on the comparison results, a maintenance strategy for the electronic device under test is determined.

[0012] In some embodiments, determining the limit number based on the historical number of abnormal restarts of each abnormal device in at least two abnormal device groups includes:

[0013] Based on the historical number of various types of abnormal restarts of each first abnormal device in the first abnormal device group, determine the initial number of each type of abnormal restart;

[0014] Aging tests were performed on each of the second abnormal devices in the second abnormal device group to obtain the aging test results for each of the second abnormal devices.

[0015] Based on the aging test results corresponding to each of the second abnormal devices, the target abnormal device that has passed the aging test is determined from the second abnormal device group;

[0016] Based on the historical number of various types of abnormal restarts that occurred in the target abnormal device, the corresponding initial count is updated to obtain the maximum number of restarts for each type of abnormal restart.

[0017] In some embodiments, updating the initial count based on the historical number of various types of abnormal restarts of the target abnormal device to obtain the limit count for each type of abnormal restart includes:

[0018] Obtain the historical number of various types of abnormal restarts occurring in each of the target abnormal devices;

[0019] By traversing the data, the historical number of various types of abnormal restarts of each of the target abnormal devices is compared with the corresponding initial number to obtain the comparison result.

[0020] If the comparison result indicates that the historical number of at least one type of abnormal restarts of the target abnormal device is greater than the corresponding initial number, the initial number corresponding to the at least one type of abnormal restarts is updated to the historical number corresponding to the at least one type of abnormal restarts until a preset termination condition is reached.

[0021] The number of times each type of abnormal restart is updated when the preset termination condition is reached is determined as the limit number of restarts corresponding to each type of abnormal restart.

[0022] In some embodiments, the preset termination condition includes:

[0023] After traversing the target abnormal devices, and / or

[0024] The historical number of various types of abnormal restarts of the target abnormal device that have occurred in a continuously preset number of cycles is less than or equal to the corresponding initial number.

[0025] In some embodiments, determining the initial number of restarts for each type of abnormal restart based on the historical number of restarts of each first abnormal device in the first abnormal device group includes:

[0026] Obtain the historical number of various types of abnormal restarts for each first abnormal device in the first abnormal device group;

[0027] Based on a preset mapping relationship and the historical number of times each of the first abnormal devices has experienced various types of abnormal restarts, a test pass parameter is determined; wherein, the preset mapping relationship is used to indicate the correspondence between the number of times each abnormal device has experienced various types of abnormal restarts and the test pass parameter, and a set of the number of times each abnormal device has experienced various types of abnormal restarts corresponds to a test pass parameter;

[0028] The maximum value is determined from each of the test pass parameters, and the historical number corresponding to the maximum value is determined;

[0029] The historical count corresponding to the maximum value is determined as the initial count.

[0030] In some embodiments, the test pass parameters include: a preset pass quantity and a preset aging pass rate;

[0031] Determining the maximum value from each of the test pass parameters includes:

[0032] Determine the product between the preset pass quantity and the preset aging pass rate;

[0033] The largest product among all the products is determined as the maximum value.

[0034] In some embodiments, determining the repair strategy for the electronic device under test based on each of the comparison results includes:

[0035] If the comparison result indicates that the actual number of at least one type of abnormal restart is greater than the corresponding limit number, the maintenance strategy is set to replace the device chip;

[0036] If the comparison results indicate that the actual number of restarts for each type of abnormality is less than or equal to the corresponding limit number, the maintenance strategy is set to not replace the device chip.

[0037] According to a second aspect of the present disclosure, a fault detection apparatus is provided, comprising:

[0038] The acquisition module is configured to acquire the actual number of times the electronic device under test has experienced various types of abnormal restarts; wherein, each type of abnormal restart has a limit number of times, and the limit number of times is determined by the historical number of abnormal restarts of each abnormal device in at least two abnormal device groups;

[0039] The comparison module is configured to compare each actual number of times with the corresponding limit number of times to obtain the comparison results corresponding to various types of abnormal restarts;

[0040] The determination module is configured to determine the maintenance strategy for the electronic device under test based on each of the comparison results.

[0041] In some embodiments, the apparatus further includes:

[0042] Based on the historical number of various types of abnormal restarts of each first abnormal device in the first abnormal device group, determine the initial number of each type of abnormal restart;

[0043] Aging tests were performed on each of the second abnormal devices in the second abnormal device group to obtain the aging test results for each of the second abnormal devices.

[0044] Based on the aging test results corresponding to each of the second abnormal devices, the target abnormal device that has passed the aging test is determined from the second abnormal device group;

[0045] Based on the historical number of various types of abnormal restarts that occurred in the target abnormal device, the corresponding initial count is updated to obtain the maximum number of restarts for each type of abnormal restart.

[0046] In some embodiments, the apparatus further includes:

[0047] Obtain the historical number of various types of abnormal restarts occurring in each of the target abnormal devices;

[0048] By traversing the data, the historical number of various types of abnormal restarts of each of the target abnormal devices is compared with the corresponding initial number to obtain the comparison result.

[0049] If the comparison result indicates that the historical number of at least one type of abnormal restarts of the target abnormal device is greater than the corresponding initial number, the initial number corresponding to the at least one type of abnormal restarts is updated to the historical number corresponding to the at least one type of abnormal restarts until a preset termination condition is reached.

[0050] The number of times each type of abnormal restart is updated when the preset termination condition is reached is determined as the limit number of restarts corresponding to each type of abnormal restart.

[0051] In some embodiments, the apparatus further includes:

[0052] After traversing the target abnormal devices, and / or

[0053] The historical number of various types of abnormal restarts of the target abnormal device that have occurred in a continuously preset number of cycles is less than or equal to the corresponding initial number.

[0054] In some embodiments, the apparatus further includes:

[0055] Obtain the historical number of various types of abnormal restarts for each first abnormal device in the first abnormal device group;

[0056] Based on a preset mapping relationship and the historical number of times each of the first abnormal devices has experienced various types of abnormal restarts, a test pass parameter is determined; wherein, the preset mapping relationship is used to indicate the correspondence between the number of times each abnormal device has experienced various types of abnormal restarts and the test pass parameter, and a set of the number of times each abnormal device has experienced various types of abnormal restarts corresponds to a test pass parameter;

[0057] The maximum value is determined from each of the test pass parameters, and the historical number corresponding to the maximum value is determined;

[0058] The historical count corresponding to the maximum value is determined as the initial count.

[0059] In some embodiments, the apparatus further includes: the test pass parameters include: a preset pass quantity and a preset aging pass rate;

[0060] Determining the maximum value from each of the test pass parameters includes:

[0061] Determine the product between the preset pass quantity and the preset aging pass rate;

[0062] The largest product among all the products is determined as the maximum value.

[0063] In some embodiments, the apparatus further includes:

[0064] If the comparison result indicates that the actual number of at least one type of abnormal restart is greater than the corresponding limit number, the maintenance strategy is set to replace the device chip;

[0065] If the comparison results indicate that the actual number of restarts for each type of abnormality is less than or equal to the corresponding limit number, the maintenance strategy is set to not replace the device chip.

[0066] According to a third aspect of the present disclosure, an electronic device is provided, comprising:

[0067] processor;

[0068] Memory used to store computer programs or instructions;

[0069] The processor executes the computer program or instructions to implement the steps of the method described in any one of the first aspects above.

[0070] According to a fourth aspect of the present disclosure, a non-transitory computer-readable storage medium is provided, the storage medium storing a computer program or instructions that, when executed by a processor, implement the steps of the method described in any one of the first aspects.

[0071] According to a fifth aspect of the present disclosure, a computer program product is provided, including a computer program or instructions, which, when executed by a processor, implement the steps of the method described in any one of the first aspects.

[0072] The technical solutions provided by the embodiments of this disclosure may include the following beneficial effects:

[0073] In the fault detection method proposed in this embodiment, the actual number of times the electronic device under test has experienced various types of abnormal restarts is obtained; each actual number is compared with the corresponding limit number to obtain the comparison results corresponding to each type of abnormal restart; and a maintenance strategy for the electronic device under test is determined based on each comparison result.

[0074] In other words, the actual number of times the electronic device under test experienced various types of abnormal restarts during operation is first obtained. Then, each actual number is compared with the corresponding limit number of times for each type to obtain the comparison results for each type of abnormal restart. Based on the comparison results, the maintenance strategy for the electronic device under test is dynamically determined. This allows for dynamic adjustment of the maintenance strategy based on the actual fault detection results, which can improve the quality of after-sales maintenance, avoid secondary complaints from users, and also avoid unnecessary chip replacements, thereby reducing after-sales maintenance costs.

[0075] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0076] The accompanying drawings, which are incorporated in and form a part of this specification, illustrate embodiments consistent with this disclosure and, together with the description, serve to explain the principles of this disclosure.

[0077] Figure 1 This is a flowchart illustrating a fault detection method according to an exemplary embodiment.

[0078] Figure 2 This is an application scenario diagram illustrating a fault detection method according to an exemplary embodiment.

[0079] Figure 3 This is an example image of the aging test results obtained from the aging test.

[0080] Figure 4 This is a module call flowchart illustrating a fault detection method according to an exemplary embodiment.

[0081] Figure 5 This is a block diagram illustrating a fault detection device according to an exemplary embodiment.

[0082] Figure 6 This is a structural block diagram of an apparatus 600 according to an exemplary embodiment.

[0083] Figure 7 This is a block diagram illustrating a fault detection apparatus 700 according to an exemplary embodiment. Detailed Implementation

[0084] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numerals in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this disclosure. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this disclosure as detailed in the appended claims.

[0085] Figure 1 This is a flowchart illustrating a fault detection method according to an exemplary embodiment. Figure 1 As shown, the method mainly includes the following steps:

[0086] In step 101, the actual number of times the electronic device under test has experienced various types of abnormal restarts is obtained; wherein, each type of abnormal restart has a limit number of times, and the limit number of times is determined by the historical number of abnormal restarts of each abnormal device in at least two abnormal device groups;

[0087] In step 102, each actual number of times is compared with the corresponding limit number of times to obtain the comparison results corresponding to various types of abnormal restarts;

[0088] In step 103, a repair strategy for the electronic device under test is determined based on the comparison results.

[0089] It should be noted that the fault detection method proposed in this disclosure can be applied to electronic devices. Here, electronic devices can include terminal devices, such as mobile terminals or fixed terminals. Mobile terminals can include mobile phones, tablets, laptops, wearable electronic devices, etc. Fixed terminals can include desktop computers, smart TVs, in-vehicle devices, etc. Figure 2 As shown, Figure 2 This is an application scenario diagram of a fault detection method according to an exemplary embodiment, including a test computer 201 and an electronic device under test 202. The test computer 201 is used to send a data acquisition instruction to the electronic device under test 202, acquire abnormal restart information in the electronic device under test 202, and run the fault detection method to detect faults in the electronic device under test 202.

[0090] Here, the electronic device under test refers to a device that has various abnormal faults such as restarting, freezing, overheating, and white screen.

[0091] It should be noted that the various abnormal restarts and their actual occurrence counts in the electronic device under test are accurately obtained through the device's built-in data tracking mechanism. In electronic devices, data tracking is a crucial data collection method that comprehensively tracks and records various information during device operation, including but not limited to abnormal fault records, network communication data, and application runtime information. This mechanism is typically implemented by embedding specific code or tools at the device's operating system level or in hardware components; once the device meets preset conditions or performs certain preset operations, this code or tool is automatically activated and begins collecting relevant data. In this way, a deeper and more detailed understanding of the device's operating status can be obtained, providing a solid data foundation for subsequent abnormal fault detection, diagnosis, and repair.

[0092] Understandably, by implementing a data tracking mechanism within the equipment, it is possible to quickly, instantly, and accurately capture various types of abnormal restarts encountered during operation and their corresponding actual number of times. This mechanism provides after-sales maintenance personnel with a window into the equipment's health status, enabling them to keenly detect potential restart anomalies and immediately take corresponding repair measures. This real-time and accurate data feedback not only significantly improves the efficiency and accuracy of handling abnormal restart faults but also lays a solid foundation for ensuring the continuous and stable operation of the equipment.

[0093] Here, the types of abnormal restarts include, but are not limited to, kernel panic issues, watchdog timeouts, and framework resets. By utilizing the device's built-in tracking mechanism, it is possible to accurately obtain each type of abnormal restart and its corresponding actual number of occurrences.

[0094] Here, the limit number represents the threshold number of faults for various types of abnormal restarts, that is, the maximum number of faults for various types of abnormal restarts, which is used to determine the maintenance strategy for the electronic equipment under test.

[0095] The fault detection method proposed in this disclosure involves obtaining the actual number of various types of abnormal restarts of the electronic device under test; comparing each actual number with the corresponding limit number to obtain the comparison result for each type of abnormal restart; and determining the maintenance strategy for the electronic device under test based on the comparison results. In other words, it first obtains the actual number of various types of abnormal restarts that occur during the operation of the electronic device under test, then compares each actual number with the corresponding limit number to obtain the comparison result for each type of abnormal restart, and then dynamically determines the maintenance strategy for the electronic device under test based on the comparison results. This allows for dynamic adjustment of the maintenance strategy based on actual fault detection results, improving after-sales maintenance quality, avoiding secondary user complaints, and also avoiding unnecessary chip replacements, thus reducing after-sales maintenance costs.

[0096] In some embodiments, determining the limit number based on the historical number of abnormal restarts of each abnormal device in at least two abnormal device groups includes:

[0097] Based on the historical number of various types of abnormal restarts of each first abnormal device in the first abnormal device group, determine the initial number of each type of abnormal restart;

[0098] Aging tests were performed on each of the second abnormal devices in the second abnormal device group to obtain the aging test results for each second abnormal device.

[0099] Based on the aging test results corresponding to each second abnormal device, the target abnormal device that passes the aging test is determined from the second abnormal device group;

[0100] Based on the historical number of restarts of various types of abnormal devices, the corresponding initial counts are updated to obtain the maximum number of restarts for each type of abnormal device.

[0101] Here, the first abnormal device group and the second abnormal device group are collections of several devices that have various abnormal faults such as restarting, freezing, overheating, and white screen. The first abnormal device group is used to determine the initial number of restarts corresponding to various types of abnormal restarts, and the second abnormal device group is used to update the initial number of restarts corresponding to various types of abnormal restarts after the aging test is passed.

[0102] Here, the first abnormal device and the second abnormal device refer to devices that have multiple abnormal faults such as restarting, freezing, overheating, and white screen.

[0103] Here, aging test refers to continuous functional testing of various modules of electronic devices, such as screen, motor, camera, and speaker, to verify the stability of the entire device. It generally lasts for 6 to 8 hours.

[0104] Here, the aging test results are categorized as pass (PASS) and fail (FAIL). A chip that passes the aging test is generally considered to be functioning correctly; a chip that fails the aging test is generally considered to have a potential chip problem. For example... Figure 3 As shown, Figure 3 This is an example diagram of the aging test results, including information on various types of abnormal restarts that occurred during the equipment test and their corresponding historical counts. Devices marked in gray highlighting are those that failed the aging test, while those not marked in gray highlighting are those that passed the aging test.

[0105] It's important to note that the devices included in the first and second abnormal device groups can be the same or different. These two groups are not mutually exclusive but are divided based on specific purposes and requirements. The first abnormal device group focuses on the historical number of various types of abnormal restarts experienced by each device. This data is used to determine the initial number of restarts for each type, providing initial data for subsequent analysis and comparison. Devices in this group may have exhibited various abnormal faults during actual use, such as restarts, crashes, overheating, and white screens. The second abnormal device group, on the other hand, focuses on aging tests. By conducting aging tests on these devices, the actual performance of different devices in the aging test can be obtained, and target abnormal devices that pass the aging test can be selected. These target abnormal devices may exhibit better stability during actual use; therefore, their abnormal restart data is of significant reference value for updating the initial number of restarts.

[0106] Understandably, if a device is used to determine the initial number of cycles in both the first and second abnormal device groups, the initial number of cycles can be updated based on the device's actual performance. Maintaining the independence of the two abnormal device groups, ensuring no overlap between them, allows for a comprehensive analysis and assessment of device malfunctions from two different perspectives. This facilitates a more thorough analysis of potential malfunctions and provides a more solid foundation for future fault detection and repair.

[0107] In this embodiment, by analyzing and judging the historical number of various types of abnormal restarts occurring in the devices of the first abnormal device group, the initial number of restarts for each type can be determined. Subsequently, an aging test is performed on the second abnormal device group to screen out target abnormal devices that pass the aging test. Based on the historical number of various types of abnormal restarts occurring in these target abnormal devices, the initial number is updated to obtain the maximum number of restarts corresponding to each type, providing an important reference for fault detection and after-sales maintenance of abnormal devices.

[0108] In some embodiments, updating the initial count based on the historical number of various types of abnormal restarts of the target abnormal device to obtain the limit count for each type of abnormal restart includes:

[0109] Obtain the historical number of various types of abnormal restarts occurring on each target abnormal device;

[0110] By iterating through the data, the historical number of restarts for each type of abnormal device is compared with the corresponding initial number to obtain the comparison results.

[0111] If the comparison result indicates that the historical number of at least one type of abnormal restarts of the target abnormal device is greater than the corresponding initial number, the initial number corresponding to at least one type of abnormal restarts will be updated to the historical number corresponding to at least one type of abnormal restarts until the preset termination condition is met.

[0112] The number of times each type of abnormal restart is updated when the preset termination condition is reached is determined as the limit number of restarts corresponding to each type of abnormal restart.

[0113] It should be noted that the historical number of various types of abnormal restarts of each target abnormal device is obtained through the data entry mechanism in the target abnormal device.

[0114] For example, a target abnormal device is assumed to have three types of abnormal restarts, labeled err1, err2, and err3. The device's tracking mechanism can accurately capture the historical counts of these three types of abnormal restarts, denoted as a1, a2, and a3, with specific values ​​of 3, 2, and 5 respectively. Simultaneously, the initial counts are also set to include abnormal restarts of err1, err2, and err3, denoted as A1, A2, and A3, with values ​​of 3, 1, and 4 respectively. Next, the historical counts and initial counts of each type of abnormal restart are compared one by one. The comparison results show that the historical count a1 of abnormal restarts of type err1 is equal to the initial count A1, while the historical counts a2 and a3 of abnormal restarts of types err2 and err3 are greater than their corresponding initial counts A2 and A3, respectively. Based on this result, the initial counts are updated, setting the values ​​of A2 and A3 to the values ​​of a2 and a3, respectively, i.e., 2 and 5. Finally, the initial counts A1, A2, and A3 are updated to 3, 2, and 5. After completing this update, continue to process other abnormal target devices using the same procedure, continuously iterating and updating the initial number of iterations until the preset termination condition is met.

[0115] For example, the initial count can be set to be updated only after the update condition has been met a certain number of times. For instance, in the example above, the historical count a1 of abnormal restarts of type err1 is equal to the initial count A1, while the historical counts a2 and a3 of abnormal restarts of types err2 and err3 are greater than their corresponding initial counts A2 and A3, respectively. Setting the number of times the update condition needs to be met to be 2 allows us to update the initial count based on this comparison result after this comparison has occurred twice, ensuring the accuracy of the initial count.

[0116] Understandably, when the initial count update meets the preset termination condition, the initial count can be considered to have reached the target value. This initial count represents the maximum number of abnormal restarts corresponding to various types of abnormal restarts, signifying the maximum number of abnormal restarts of each type used to determine if the device has a chip problem.

[0117] In this embodiment, the historical number of different types of abnormal restarts of each target abnormal device is obtained, and these numbers are compared with the corresponding initial numbers one by one to obtain the comparison results. When it is found that the historical number of at least one type of abnormal restart of the target abnormal device exceeds the corresponding initial number, the initial number of that type is updated to the corresponding historical number. This process continues until a preset termination condition is met. Finally, the updated initial number is determined as the limit number of abnormal restarts for each type, improving the accuracy and flexibility of the limit number determination.

[0118] In some embodiments, the preset termination condition includes:

[0119] After traversing the target abnormal device, and / or

[0120] The historical number of restarts of various types of abnormal devices that have occurred in a continuously preset number of target abnormal devices is less than or equal to the corresponding initial number.

[0121] Understandably, since the number of target abnormal devices is finite, once all target abnormal devices have been traversed and processed accordingly, the initial number of restarts corresponding to each type of abnormality obtained from the update can be determined as the final limit number.

[0122] For example, a preset count is set to 3, and the initial count includes three types of abnormal restarts: err1, err2, and err3, with initial counts of 5, 3, and 7 respectively. Simultaneously, the historical counts of abnormal restarts of types err1, err2, and err3 in target abnormal device 1 are set to 2, 1, and 6 respectively; the corresponding historical counts in target abnormal device 2 are 4, 2, and 7; and the historical counts in target abnormal device 3 are 1, 3, and 4. Next, the historical counts of the three types of abnormal restarts in these three target abnormal devices are continuously acquired and compared with the initial counts one by one. The comparison results show that in target abnormal devices 1, 2, and 3, the historical counts of all types of abnormal restarts are less than or equal to the corresponding initial counts, satisfying the preset termination condition, i.e., the historical counts of all types of abnormal restarts occurring in three consecutive target abnormal devices are less than or equal to their corresponding initial counts. Therefore, in this case, the traversal process can be terminated, and the update of the initial counts can be stopped.

[0123] For example, if the preset number is 3, and the historical counts of various types of abnormal restarts of two consecutive target abnormal devices are less than or equal to their corresponding initial counts, while the historical counts of various types of abnormal restarts of the third target abnormal device are greater than their corresponding initial counts, then the preset termination condition that the historical counts of various types of abnormal restarts of three consecutive target abnormal devices are less than or equal to their corresponding initial counts is not met. In this case, it is necessary to start counting again from 0 until the historical counts of various types of abnormal restarts of three consecutive target abnormal devices are less than or equal to their corresponding initial counts.

[0124] Understandably, the preset quantity has a significant impact on the final initial number of updates and the determination of the limit number of updates. When the preset quantity is small, the number of target abnormal devices required to meet the preset termination condition is limited, and the judgment of the condition to end the initial number of updates may have a high degree of randomness, resulting in a large fluctuation range in the limit number of updates and relatively low accuracy. Conversely, when the preset quantity is large, the number of target abnormal devices required to meet the preset termination condition increases, and the final limit number of updates will be more stable and can more accurately reflect the actual situation of abnormal device restarts. Therefore, in practical applications, the preset quantity should be reasonably set according to specific needs and scenarios to balance the relationship between accuracy and resource investment.

[0125] In this embodiment of the disclosure, the preset termination condition includes traversing the target abnormal device and / or the historical number of various types of abnormal restarts of the target abnormal device being less than or equal to the corresponding initial number. By presetting different termination conditions, appropriate termination conditions can be dynamically adopted according to the actual situation to obtain an accurate limit number of times and improve the accuracy of fault detection.

[0126] In some embodiments, determining the initial number of restarts for each type of abnormal restart based on the historical number of restarts of each first abnormal device in the first abnormal device group includes:

[0127] Obtain the historical number of various types of abnormal restarts for each first abnormal device in the first abnormal device group;

[0128] Based on the preset mapping relationship and the historical number of times each first abnormal device has restarted for various types of abnormalities, the test pass parameters are determined; wherein, the preset mapping relationship is used to indicate the correspondence between the number of times each abnormal device has restarted for various types of abnormalities and the test pass parameters, and a set of the number of times each abnormal device has restarted for various types of abnormalities corresponds to a test pass parameter;

[0129] Determine the maximum value from the parameters passed by each test, and determine the historical number of times the maximum value corresponds to it;

[0130] The historical count corresponding to the maximum value is determined as the initial count.

[0131] It should be noted that the historical number of various types of abnormal restarts of each first abnormal device in the first abnormal device group is obtained through the instrumentation mechanism in the target abnormal device.

[0132] For example, the target abnormal devices are set to include three types of abnormal restarts: err1, err2, and err3. The historical restart counts for err1, err2, and err3 in target abnormal device 1 are 2, 5, and 8 respectively, forming a historical count array (2,5,8). The corresponding historical count array in target abnormal device 2 is (6,2,4), and the response historical count array in target abnormal device 3 is (8,5,8). Then, the preset mapping relationship can be: historical count array (2,5,8) corresponds to the test pass parameter (100,0.5), historical count array (6,2,4) corresponds to the test pass parameter (80,0.6), and historical count array (8,5,8) corresponds to the test pass parameter (50,0.9).

[0133] It should be noted that the relationship between historical subarrays and test pass parameters can be one-to-one or one-to-many. Different historical subarrays can correspond to different test pass parameters, or they can correspond to the same test pass parameters.

[0134] In this embodiment, the historical number of different types of abnormal restarts for each of the first abnormal devices in the first abnormal device group is first obtained, and a preset mapping relationship is used to determine the corresponding test pass parameters. This mapping relationship reflects the correspondence between the number of abnormal restarts and the test pass parameters, ensuring that the combination of the number of different types of abnormal restarts for each abnormal device can correspond to a single test pass parameter. Then, the maximum value is determined from these test pass parameters, and the historical number corresponding to this maximum value is determined. Finally, the historical number corresponding to the maximum value is determined as the initial number, which can improve the accuracy of the initial number selection.

[0135] In some embodiments, the test pass parameters include: a preset pass quantity and a preset aging pass rate;

[0136] Determining the maximum value from each test pass parameter includes:

[0137] Determine the product between the preset pass quantity and the preset aging pass rate;

[0138] The largest product among all products is determined as the maximum value.

[0139] Here, the preset pass count and preset aging pass rate can be obtained through experiments. The preset pass count refers to the number of devices that can pass the fault detection when the historical number of various types of abnormal restarts of any first abnormal device is taken as the limit. The preset aging pass rate refers to the proportion of devices that can also pass the aging test among the devices that have passed the fault detection.

[0140] Here, the product of the preset pass count and the preset aging pass rate represents the number of chips that can be saved in after-sales maintenance.

[0141] For example, the historical number of tests (2,5,8) corresponds to the test pass parameter (100,0.5), the historical number of tests (6,2,4) corresponds to the test pass parameter (80,0.6), and the historical number of tests (8,5,8) corresponds to the test pass parameter (50,0.9). Then, the product of the preset number of passes and the preset aging pass rate in the test pass parameter (100,0.5) is 100×0.5=50, the product of the preset number of passes and the preset aging pass rate in the test pass parameter (80,0.6) is 80×0.6=48, and the product of the preset number of passes and the preset aging pass rate in the test pass parameter (50,0.9) is 50×0.9=45. The maximum value of the product is 50. Therefore, the historical number of tests 2, 5, and 8 corresponding to the maximum product value of 50 are determined as the initial number of tests.

[0142] For example, the maximum value can also be determined from the various test pass parameters by calculating the sum between the preset pass count and the preset aging pass rate, and the historical number corresponding to the maximum sum between the preset pass count and the preset aging pass rate is determined as the initial number. The historical number of tests (1,3,9) corresponds to the test pass parameter (120,0.5), the historical number of tests (7,5,9) corresponds to the test pass parameter (100,0.8), and the historical number of tests (3,6,1) corresponds to the test pass parameter (60,0.9). Therefore, the sum of the preset pass count and preset aging pass rate in the test pass parameter (120,0.5) is 120 + 0.5 = 120.5, the sum of the preset pass count and preset aging pass rate in the test pass parameter (100,0.8) is 100 + 0.8 = 100.8, and the sum of the preset pass count and preset aging pass rate in the test pass parameter (60,0.9) is 60 + 0.9 = 60.9. The maximum sum is 120.5. Therefore, the historical number of tests 1, 3, and 9, corresponding to the maximum sum of 120.5, are determined as the initial number of tests.

[0143] For example, the preset number of passes in the test pass parameters can be weighted and then multiplied or summed with the preset aging pass rate, and the historical number corresponding to the maximum value of the product or sum can be determined as the initial number.

[0144] It should be noted that different initial counts can be determined for different types of equipment or different system platforms within the same type of equipment, and thus different limit counts can be determined.

[0145] In this embodiment of the disclosure, the test pass parameters include a preset pass quantity and a preset aging pass rate. To determine the maximum value among the various test pass parameters, the product between the preset pass quantity and the preset aging pass rate for each test pass parameter can be calculated, and the maximum product among all products can be determined as the maximum value. This simplifies the selection process of the maximum value, comprehensively evaluates the selection effect of the initial number of runs, and improves the accuracy of the initial number of runs selection.

[0146] In some embodiments, determining the repair strategy for the electronic device under test based on the comparison results includes:

[0147] If the comparison results indicate that the actual number of at least one type of abnormal restart exceeds the corresponding limit, the maintenance strategy will be set to replace the device chip.

[0148] If the comparison results indicate that the actual number of restarts for each type of abnormality is less than or equal to the corresponding limit number, the maintenance strategy will be set to not replace the device chip.

[0149] It should be noted that different limits of the number of tests can be selected for different types of equipment or different system platforms within the same type of equipment to detect equipment faults and determine maintenance strategies.

[0150] For example, the electronic device under test is configured to include three types of abnormal restarts: err1, err2, and err3, with corresponding maximum counts of 5, 3, and 7, respectively. If the actual number of abnormal restarts of the corresponding types of the electronic device under test is 3, 1, and 6, since the actual number of restarts for all three types is less than the corresponding maximum count, the maintenance strategy can be set to not replace the device chip. If the actual number of abnormal restarts of the corresponding types of the electronic device under test is 6, 4, and 6, since the actual number of abnormal restarts for err1 and err2 is greater than the corresponding maximum count, the maintenance strategy can be set to replace the device chip. If the actual number of abnormal restarts of the corresponding types of the electronic device under test is 2, 2, and 8, since the actual number of abnormal restarts for err3 is greater than the corresponding maximum count, the maintenance strategy can be set to replace the device chip.

[0151] In this embodiment of the disclosure, if the comparison result indicates that the actual number of at least one type of abnormal restart is greater than the corresponding limit number, the maintenance strategy is set to replace the device chip; if the comparison result indicates that the actual number of all types of abnormal restarts is less than or equal to the corresponding limit number, the maintenance strategy is set to not replace the device chip. By dynamically adjusting the maintenance strategy of the electronic device under test based on the comparison result, the maintenance quality under different fault conditions can be improved, unnecessary chip waste can be avoided, and maintenance costs can be reduced.

[0152] In the fault detection method proposed in this embodiment, the actual number of times the electronic device under test has experienced various types of abnormal restarts is obtained; each actual number is compared with the corresponding limit number to obtain the comparison results corresponding to each type of abnormal restart; and a maintenance strategy for the electronic device under test is determined based on each comparison result.

[0153] In other words, the actual number of times the electronic device under test experienced various types of abnormal restarts during operation is first obtained. Then, each actual number is compared with the corresponding limit number of times for each type to obtain the comparison results for each type of abnormal restart. Based on the comparison results, the maintenance strategy for the electronic device under test is dynamically determined. This allows for dynamic adjustment of the maintenance strategy based on the actual fault detection results, which can improve the quality of after-sales maintenance, avoid secondary complaints from users, and also avoid unnecessary chip replacements, thereby reducing after-sales maintenance costs.

[0154] Figure 4 This is a module call flowchart illustrating a fault detection method according to an exemplary embodiment, such as... Figure 4 As shown, the main steps include:

[0155] In step 401, the abnormal restart acquisition module is invoked;

[0156] Here, the abnormal restart acquisition module is used to acquire the number of times various types of abnormal restarts have occurred in the device.

[0157] In step 402, it is determined whether the initial count update phase has ended. If it has ended, the abnormal restart detection module is called; otherwise, step 403 is executed.

[0158] Here, the abnormal restart detection module is used to detect faults in the equipment during the formal testing phase and obtain the test results, and then determine the equipment maintenance strategy based on the test results.

[0159] It should be noted that the initial count update phase refers to the stage where the initial count needs to be updated before the preset end conditions are met. Once the preset end conditions are met, the final limit count will be obtained. After the initial count update phase is completed, the formal testing phase will begin. In this phase, based on the previously determined limit count, accurate and effective fault detection of the equipment can be performed.

[0160] In step 403, the aging detection module is invoked;

[0161] Here, the aging detection module is used to perform aging detection on the equipment and obtain the aging detection results.

[0162] In step 404, the abnormal restart detection module is invoked;

[0163] Here, the abnormal restart detection module is used to compare the number of various types of abnormal restarts in the device obtained by the abnormal restart acquisition module with the initial number during the initial count update phase, so as to obtain the comparison result.

[0164] In step 405, the initial count update module is invoked;

[0165] Here, the initial count update module is used to update the initial count based on the comparison result obtained from the abnormal restart detection module.

[0166] Figure 5 This is a block diagram illustrating a fault detection device according to an exemplary embodiment. Figure 5 As shown, the device mainly includes:

[0167] The acquisition module 501 is configured to acquire the actual number of times the electronic device under test has experienced various types of abnormal restarts; wherein, each type of abnormal restart has a limit number of times, and the limit number of times is determined by the historical number of abnormal restarts of each abnormal device in at least two abnormal device groups;

[0168] Comparison module 502 is configured to compare each actual number of times with the corresponding limit number of times to obtain the comparison results corresponding to various types of abnormal restarts;

[0169] The determination module 503 is configured to determine the maintenance strategy for the electronic device under test based on the comparison results.

[0170] In some embodiments, the device 500 further includes:

[0171] Based on the historical number of various types of abnormal restarts of each first abnormal device in the first abnormal device group, determine the initial number of each type of abnormal restart;

[0172] Aging tests were performed on each of the second abnormal devices in the second abnormal device group to obtain the aging test results for each of the second abnormal devices.

[0173] Based on the aging test results corresponding to each of the second abnormal devices, the target abnormal devices that have passed the aging test are determined from the second abnormal device group;

[0174] Based on the historical number of restarts of various types of abnormal devices, the corresponding initial counts are updated to obtain the maximum number of restarts for each type of abnormal device.

[0175] In some embodiments, the device 500 further includes:

[0176] Obtain the historical number of various types of abnormal restarts occurring on each target abnormal device;

[0177] By iterating through the data, the historical number of restarts for each type of abnormal device is compared with the corresponding initial number to obtain the comparison results.

[0178] If the comparison result indicates that the historical number of at least one type of abnormal restarts of the target abnormal device is greater than the corresponding initial number, the initial number corresponding to at least one type of abnormal restarts will be updated to the historical number corresponding to at least one type of abnormal restarts until the preset termination condition is met.

[0179] The number of times each type of abnormal restart is updated when the preset termination condition is reached is determined as the limit number of restarts corresponding to each type of abnormal restart.

[0180] In some embodiments, the device 500 further includes:

[0181] After traversing the target abnormal device, and / or

[0182] The historical number of restarts of various types of abnormal devices that have occurred in a continuously preset number of target abnormal devices is less than or equal to the corresponding initial number.

[0183] In some embodiments, the device 500 further includes:

[0184] Obtain the historical number of various types of abnormal restarts for each first abnormal device in the first abnormal device group;

[0185] Based on the preset mapping relationship and the historical number of times each first abnormal device has restarted for various types of abnormalities, the test pass parameters are determined; wherein, the preset mapping relationship is used to indicate the correspondence between the number of times each abnormal device has restarted for various types of abnormalities and the test pass parameters, and a set of the number of times each abnormal device has restarted for various types of abnormalities corresponds to a test pass parameter;

[0186] Determine the maximum value from the parameters passed by each test, and determine the historical number of times the maximum value corresponds to it;

[0187] The historical count corresponding to the maximum value is determined as the initial count.

[0188] In some embodiments, the apparatus 500 further includes: test pass parameters including: preset pass quantity and preset aging pass rate;

[0189] Determining the maximum value from each test pass parameter includes:

[0190] Determine the product between the preset pass quantity and the preset aging pass rate;

[0191] The largest product among all products is determined as the maximum value.

[0192] In some embodiments, the device 500 further includes:

[0193] If the comparison results indicate that the actual number of at least one type of abnormal restart exceeds the corresponding limit, the maintenance strategy will be set to replace the device chip.

[0194] If the comparison results indicate that the actual number of restarts for each type of abnormality is less than or equal to the corresponding limit number, the maintenance strategy will be set to not replace the device chip.

[0195] Regarding the apparatus in the above embodiments, the specific manner in which each module performs its operation has been described in detail in the embodiments related to the method, and will not be elaborated upon here.

[0196] Figure 6 This is a structural block diagram illustrating a device 600 according to an exemplary embodiment. For example, device 600 may be a mobile phone, computer, digital broadcasting terminal, messaging device, game console, tablet device, medical device, fitness equipment, personal digital assistant, etc.

[0197] Reference Figure 6 The device 600 may include one or more of the following components: processing component 602, memory 604, power supply component 606, multimedia component 608, audio component 610, input / output (I / O) interface 612, sensor component 614, and communication component 616.

[0198] Processing component 602 typically controls the overall operation of device 600, such as operations associated with at least one of display, telephone call, data communication, camera operation, and recording operation. Processing component 602 may include one or more processors 620 to execute instructions to perform all or part of the steps of the methods described above. Furthermore, processing component 602 may include one or more modules to facilitate interaction between processing component 602 and other components. For example, processing component 602 may include a multimedia module to facilitate interaction between multimedia component 608 and processing component 602.

[0199] Memory 604 is configured to store various types of data to support operation on device 600. Examples of such data include at least one of the following: instructions for any application or method operating on device 600, contact data, phonebook data, messages, pictures, and videos. Memory 604 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as Static Random Access Memory (SRAM), Electrically Erasable Programmable Read Only Memory (EEPROM), Erasable Programmable Read-Only Memory (EPROM), Programmable Read Only Memory (PROM), Read-Only Memory (ROM), magnetic storage, flash memory, magnetic disk, or optical disk.

[0200] Power supply component 606 provides power to various components of device 600. Power supply component 606 may include at least one of the following: a power management system, one or more power supplies, and other components associated with generating, managing, and distributing power to device 600.

[0201] Multimedia component 608 includes a screen that provides an output interface between device 600 and the user. In some embodiments, the screen may include a Liquid Crystal Display (LCD) and a Touch Panel (TP). If the screen includes a Touch Panel, the screen may be implemented as a touchscreen to receive input signals from the user. The Touch Panel includes one or more touch sensors to sense touches, swipes, and gestures on the Touch Panel. The touch sensors may sense not only the boundaries of touch or swipe actions but also the duration and pressure associated with the touch or swipe operation. In some embodiments, multimedia component 608 includes a front-facing camera and / or a rear-facing camera. When device 600 is in an operating mode, such as a shooting mode or a video mode, the front-facing camera and / or rear-facing camera may receive external multimedia data. Each front-facing camera and rear-facing camera may be a fixed optical lens system or have focal length and optical zoom capabilities.

[0202] Audio component 610 is configured to output and / or input audio signals. For example, audio component 610 includes a microphone (MIC) configured to receive external audio signals when device 600 is in an operating mode, such as call mode, recording mode, and voice recognition mode. The received audio signals may be further stored in memory 604 or transmitted via communication component 616. In some embodiments, audio component 610 also includes a speaker for outputting audio signals.

[0203] I / O interface 612 provides an interface between processing component 602 and peripheral interface modules, such as keyboards, click wheels, and buttons. These buttons may include, but are not limited to, home buttons, volume buttons, power buttons, and lock buttons.

[0204] Sensor assembly 614 includes one or more sensors for providing state assessments of various aspects of device 600. For example, sensor assembly 614 may detect the on / off state of device 600, the relative positioning of components such as the display and keypad of device 600, changes in the position of device 600 or one of its components, the presence or absence of user contact with device 600, the orientation or acceleration / deceleration of device 600, and temperature changes of device 600. Sensor assembly 614 may include a proximity sensor configured to detect the presence of nearby objects without any physical contact. Sensor assembly 614 may also include an optical sensor, such as a complementary metal-oxide-semiconductor (CMOS) or charge-coupled device (CCD) image sensor, for use in imaging applications. In some embodiments, sensor assembly 614 may also include, but is not limited to, at least one of the following: an accelerometer, a gyroscope, a magnetometer, a pressure sensor, and a temperature sensor.

[0205] Communication component 616 is configured to facilitate wired or wireless communication between device 600 and other devices. Device 600 can access wireless networks based on communication standards, such as Wi-Fi, 4G, 5G, or combinations thereof. In one exemplary embodiment, communication component 616 receives broadcast signals or broadcast-related information from an external broadcast management system via a broadcast channel. In one exemplary embodiment, communication component 616 also includes a Near Field Communication (NFC) module to facilitate short-range communication. For example, the NFC module may be implemented based on Radio Frequency Identification (RFID), Infrared Data Association (IrDA), Ultra Wide Band (UWB), Bluetooth (BT), and other technologies.

[0206] In an exemplary embodiment, device 600 may be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components.

[0207] In an exemplary embodiment, a non-transitory computer-readable storage medium including instructions is also provided, such as a memory 604 including executable instructions or a computer program, which can be executed by the processor 620 of the device 600 to perform the above-described method. For example, the non-transitory computer-readable storage medium may be a ROM, random access memory (RAM), a compact disc read-only memory (CD-ROM), magnetic tape, floppy disk, and optical data storage device, etc.

[0208] A non-transitory computer-readable storage medium, when instructions in the storage medium are executed by a processor of a mobile terminal, enables the mobile terminal to perform any of the fault detection methods described in the embodiments of this disclosure. For example, the method includes:

[0209] Obtain the actual number of times the electronic device under test has experienced various types of abnormal restarts; among them, each type of abnormal restart has a limit number of times, which is determined by the historical number of abnormal restarts of each abnormal device in at least two abnormal device groups;

[0210] By comparing each actual number of times with the corresponding limit number of times, the comparison results corresponding to various types of abnormal restarts are obtained.

[0211] Based on the comparison results, a repair strategy for the electronic device under test is determined.

[0212] This disclosure provides a computer program product comprising a computer program or executable instructions stored in a computer-readable storage medium. A processor of a computer device reads the computer program or executable instructions from the computer-readable storage medium and executes the computer program or executable instructions, causing the computer device to perform any of the fault detection methods described in this disclosure.

[0213] Figure 7 This is a block diagram illustrating an apparatus 700 for fault detection according to an exemplary embodiment. For example, apparatus 700 may be provided as a server. (Refer to...) Figure 7 The device 700 includes a processing component 722, which further includes one or more processors, and memory resources represented by memory 732 for storing instructions, such as application programs, that can be executed by the processing component 722. The application programs stored in memory 732 may include one or more modules, each corresponding to a set of instructions. Furthermore, the processing component 722 is configured to execute instructions to perform any of the aforementioned fault detection methods. For example, the method includes:

[0214] Obtain the actual number of times the electronic device under test has experienced various types of abnormal restarts; among them, each type of abnormal restart has a limit number of times, which is determined by the historical number of abnormal restarts of each abnormal device in at least two abnormal device groups;

[0215] By comparing each actual number of times with the corresponding limit number of times, the comparison results corresponding to various types of abnormal restarts are obtained.

[0216] Based on the comparison results, a repair strategy for the electronic device under test is determined.

[0217] Device 700 may also include a power supply component 726 configured to perform power management of device 700, a wired or wireless network interface 750 configured to connect device 700 to a network, and an input / output (I / O) interface 758. Device 700 can operate an operating system stored in memory 732, such as Windows Server™, Mac OS X™, Unix™ Linux™, FreeBSD™, or similar.

[0218] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This disclosure is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the claims.

[0219] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

Claims

1. A fault detection method, characterized in that, include: Obtain the actual number of times the electronic device under test has experienced various types of abnormal restarts; wherein, each type of abnormal restart has a limit number of times, and the limit number of times is determined by the historical number of abnormal restarts of each abnormal device in at least two abnormal device groups; By comparing each actual number of times with the corresponding limit number of times, the comparison results corresponding to various types of abnormal restarts are obtained. Based on the comparison results, a maintenance strategy for the electronic device under test is determined.

2. The method according to claim 1, characterized in that, The determination of the limit number based on the historical number of abnormal restarts of each abnormal device in at least two abnormal device groups includes: Based on the historical number of various types of abnormal restarts of each first abnormal device in the first abnormal device group, determine the initial number of each type of abnormal restart; Aging tests were performed on each of the second abnormal devices in the second abnormal device group to obtain the aging test results for each of the second abnormal devices. Based on the aging test results corresponding to each of the second abnormal devices, the target abnormal device that has passed the aging test is determined from the second abnormal device group; Based on the historical number of various types of abnormal restarts that occurred in the target abnormal device, the corresponding initial count is updated to obtain the maximum number of restarts for each type of abnormal restart.

3. The method according to claim 2, characterized in that, The method involves updating the initial count based on the historical number of various types of abnormal restarts of the target abnormal device to obtain the maximum number of restarts for each type of abnormal restart, including: Obtain the historical number of various types of abnormal restarts occurring in each of the target abnormal devices; By traversing the data, the historical number of various types of abnormal restarts of each of the target abnormal devices is compared with the corresponding initial number to obtain the comparison result. If the comparison result indicates that the historical number of at least one type of abnormal restarts of the target abnormal device is greater than the corresponding initial number, the initial number corresponding to the at least one type of abnormal restarts is updated to the historical number corresponding to the at least one type of abnormal restarts until a preset termination condition is reached. The number of times each type of abnormal restart is updated when the preset termination condition is reached is determined as the limit number of restarts corresponding to each type of abnormal restart.

4. The method according to claim 3, characterized in that, The preset termination conditions include: After traversing the target abnormal devices, and / or The historical number of various types of abnormal restarts of the target abnormal device that have occurred in a continuously preset number of cycles is less than or equal to the corresponding initial number.

5. The method according to claim 2, characterized in that, The determination of the initial number of restarts for each type of abnormal restart based on the historical number of restarts of each first abnormal device in the first abnormal device group includes: Obtain the historical number of various types of abnormal restarts for each first abnormal device in the first abnormal device group; Based on a preset mapping relationship and the historical number of times each of the first abnormal devices has experienced various types of abnormal restarts, a test pass parameter is determined; wherein, the preset mapping relationship is used to indicate the correspondence between the number of times each abnormal device has experienced various types of abnormal restarts and the test pass parameter, and a set of the number of times each abnormal device has experienced various types of abnormal restarts corresponds to a test pass parameter; The maximum value is determined from each of the test pass parameters, and the historical number corresponding to the maximum value is determined; The historical count corresponding to the maximum value is determined as the initial count.

6. The method according to claim 5, characterized in that, The test parameters include: preset pass count and preset aging pass rate; Determining the maximum value from each of the test pass parameters includes: Determine the product between the preset pass quantity and the preset aging pass rate; The largest product among all the products is determined as the maximum value.

7. The method according to any one of claims 1 to 6, characterized in that, The step of determining the repair strategy for the electronic device under test based on each of the comparison results includes: If the comparison result indicates that the actual number of at least one type of abnormal restart is greater than the corresponding limit number, the maintenance strategy is set to replace the device chip; If the comparison results indicate that the actual number of restarts for each type of abnormality is less than or equal to the corresponding limit number, the maintenance strategy is set to not replace the device chip.

8. A fault detection device, characterized in that, include: The acquisition module is configured to acquire the actual number of times the electronic device under test has experienced various types of abnormal restarts; wherein, each type of abnormal restart has a limit number of times, and the limit number of times is determined by the historical number of abnormal restarts of each abnormal device in at least two abnormal device groups; The comparison module is configured to compare each actual number of times with the corresponding limit number of times to obtain the comparison results corresponding to various types of abnormal restarts; The determination module is configured to determine the maintenance strategy for the electronic device under test based on each of the comparison results.

9. An electronic device, characterized in that, include: processor; Memory used to store computer programs or instructions; The processor executes the computer program or instructions to implement the steps of the method according to any one of claims 1 to 7.

10. A non-transitory computer-readable storage medium storing a computer program or instructions, characterized in that, When the computer program or instructions in the storage medium are executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

11. A computer program product, comprising a computer program or instructions, characterized in that, When the computer program or instructions are executed by a processor, they implement the steps of the method according to any one of claims 1 to 7.

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