A method for correcting longitudinal distortion of a confocal microscopic image based on electromagnetic driving MEMS micromirror

Abstract

This invention discloses a method for correcting longitudinal distortion in confocal microscopy images based on electromagnetically driven MEMS micromirrors. The method includes: sampling the piezoresistive feedback signal of the slow-axis drive signal of the micromirror using a high-speed data acquisition card; fitting the sampled data using a polynomial; performing linear fitting on the data points in the left and right intervals of the midpoint of the sampled data time series; mapping the polynomial fitting curve to the linear fitting curve according to the actual position of the corresponding micromirror; and finally, using upper-computer imaging software based on the mapping relationship to achieve longitudinal distortion correction of the confocal microscopy image. This invention can effectively correct longitudinal distortion in electromagnetically driven MEMS micromirror confocal microscopy, improving image quality.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of microscopes, and in particular to a method for correcting longitudinal distortion of a confocal microscopic image based on an electromagnetic driving MEMS micromirror. BACKGROUND

[0002] Electromagnetic driving is an execution mechanism commonly used for MEMS micromirrors, and its core principle is that a conductive coil is integrated on the micromirror device, and when current is passed through the coil, a Lorentz torque is generated according to the left-hand rule under the action of an external magnetic field, causing the micromirror to deflect around the support shaft. This method has the advantages of large driving force, fast response speed, high control precision, and is suitable for large-angle and high-frequency micromirror scanning applications. Compared with electrostatic driving, electromagnetic driving has lower requirements for driving voltage and is more suitable for low-voltage and high-power driving occasions; at the same time, it has strong structural stability and is suitable for laser scanning, spectral imaging, three-dimensional ranging and other application scenarios.

[0003] Laser scanning confocal microscopy is one of the most widely used fluorescence imaging devices at present. By setting a conjugate pinhole, it effectively suppresses out-of-focus light signals, thereby significantly improving the image signal-to-noise ratio and endowing the system with optical tomographic imaging capability. Confocal imaging is usually achieved by point scanning, and the common implementation approach for laser scanning is to use a galvanometer scanning system composed of a galvanometer mirror and a resonant mirror (see: Wang, Jiafu, et al., Engineering, 2015; Xu, Baoteng, et al., Optics Communications, 2022). However, the traditional galvanometer system has problems such as large size and complex optical and mechanical debugging, which limits its application in miniaturization and portable imaging devices. In contrast, micro galvanometers based on MEMS technology have the advantages of compact structure and easy integration, which can effectively overcome the above shortcomings. There are currently related researches on applying MEMS micromirrors to confocal microscopic imaging systems (such as: a handheld laser scanning confocal microscope based on MEMS, publication number: CN213715590U, publication date: July 16, 2021, application number: CN202022648855.9).

[0004] Although MEMS micromirror can effectively reduce the system volume and adjustment difficulty, it is known that MEMS micromirror, like galvanometer, will introduce specific image distortion. Generally speaking, the main distortion generated by MEMS micromirror includes fan-shaped geometric distortion caused by the change of light beam incidence angle with position, and image transverse stretching distortion caused by fast-axis sinusoidal wave driving signal. However, in actual application, the slow axis working in quasi-static scanning mode should be theoretically driven by ideal sawtooth wave, but due to the limitation of driving mode, circuit board design and system response, the actual driving signal often has distortion, which leads to the introduction of longitudinal stretching distortion in the imaging process.

[0005] Therefore, it is necessary to provide a confocal microscopic image longitudinal distortion correction method for electromagnetic driving MEMS micromirror, so as to compensate for the longitudinal distortion caused by non-ideal slow-axis driving of micromirror, so as to realize the correction of longitudinal distortion. SUMMARY

[0006] The purpose of the present application is to overcome the shortcomings of the prior art, and to provide a confocal microscopic image longitudinal distortion correction method based on electromagnetic driving MEMS micromirror, which can realize confocal microscopic imaging by using electromagnetic MEMS micromirror, and can effectively correct the longitudinal distortion caused by non-ideal slow-axis driving of MEMS micromirror.

[0007] The technical solution for achieving the purpose of the present application is: on the one hand, a confocal microscopic image longitudinal distortion correction method based on electromagnetic driving MEMS micromirror is provided, which effectively corrects the longitudinal distortion introduced by MEMS micromirror by establishing the mapping relationship between the slow-axis piezoresistive feedback signal of MEMS micromirror and each row of image.

[0008] Further, the method comprises the following steps:

[0009] Step 1, synchronously collecting multiple frames of confocal microscopic image data and piezoresistive feedback data;

[0010] Step 2, pre-processing the multiple frames of piezoresistive feedback data to obtain data for longitudinal distortion correction;

[0011] Step 3, curve fitting is performed on the data obtained in step 2;

[0012] Step 4, determining the mapping target interval according to the fitted curve;

[0013] Step 5, establishing the mapping relationship according to the mapping target interval;

[0014] Step 6, realizing image longitudinal distortion correction according to the mapping relationship.

[0015] Further, in step 1, the sampling rate is f sThe high-speed data acquisition card uses the logical AND of the frame synchronization signal and the line synchronization signal output by the MEMS micromirror driver as the trigger condition for data acquisition.

[0016] Further, step 2 involves preprocessing the multi-frame piezoresistive feedback data to obtain data for longitudinal distortion correction. The specific process includes:

[0017] Step 2-1: Averaging the multi-frame piezoresistive feedback data to obtain the average frame data. The calculation formula is as follows:

[0018] ;

[0019] In the formula, For average frame data, This represents the piezoresistive feedback data for the m-th frame, where M represents the total number of frames. This represents the average value across multiple frames for the nth data point in the hth row.

[0020] Step 2-2: Average all sampling points in each row to obtain the final data used for longitudinal distortion correction. The calculation formula is:

[0021]

[0022] In the formula, The h-th row contains data used for longitudinal distortion correction, where N represents the total number of sampled data points. This is the average value of all sampled data points in row h.

[0023] Furthermore, step 3, which involves curve fitting of the data obtained in step 2, specifically includes:

[0024] Step 3-1, for each row of data used for longitudinal distortion correction With row number h as the x-axis, the corresponding numerical value Use the vertical axis to plot a scatter plot;

[0025] Step 3-2: Fit a cubic function curve to all data. The fitted curve is denoted as [Formula omitted]. ;

[0026] Step 3-3: Apply linear fitting to the data points representing p% of the total data to the left and right of the center point. The fitted curve is denoted as... .

[0027] Furthermore, step 4, determining the target mapping interval based on the fitted curve, specifically includes:

[0028] Average value of all rows The maximum value in and minimum value As upper and lower bounds, determine the minimum number of rows corresponding to the linear function. With the maximum number of rows The specific formula is as follows:

[0029]

[0030] Then, the target interval for mapping is determined to be r ∈ [r min , r max ].

[0031] Furthermore, step 5, which involves establishing a mapping relationship based on the target mapping interval, specifically includes:

[0032] Step 5-1, based on the determined mapping target interval r ∈ [r min , r max Substitute each row of r into the fitted curve. To obtain the ideal value :

[0033]

[0034] Step 5-2, set the ideal value for the r-th row. As the fitted curve The output is used to calculate the original row number corresponding to the ideal value. :

[0035] .

[0036] Furthermore, step 6, which involves correcting the longitudinal distortion of the image based on the mapping relationship, specifically includes:

[0037] Given an original image with resolution p1×q1, the pixel value in row h and column i is... The pixel value in the r-th row and i-th column of the image without vertical distortion is ;

[0038] Based on the mapping relationship, the first image in the original image is selected using a Gaussian weighted average. The data in rows q above and below the point in column i are mapped to row r and column i of the image without vertical distortion, thus achieving vertical distortion correction. The specific formula is as follows:

[0039]

[0040] in,

[0041]

[0042] In the formula, Weights for the data points used in the interpolation; The original row number corresponding to the ideal value of the r+jth row.

[0043] In another aspect, a confocal microscopic image longitudinal distortion correction system based on an electromagnetic driving MEMS micromirror is provided, and the system comprises:

[0044] A first module is configured to synchronously collect multiple frames of confocal microscopic image data and piezoresistive feedback data.

[0045] A second module is configured to pre-process the multiple frames of piezoresistive feedback data to obtain data for longitudinal distortion correction.

[0046] A third module is configured to perform curve fitting on the data obtained by the second module.

[0047] A fourth module is configured to determine a mapping target interval according to the fitted curve.

[0048] A fifth module is configured to establish a mapping relationship according to the mapping target interval.

[0049] A sixth module is configured to correct the longitudinal distortion of the image according to the mapping relationship.

[0050] In another aspect, a computer device is provided, which comprises a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the confocal microscopic image longitudinal distortion correction method based on the electromagnetic driving MEMS micromirror when executing the computer program.

[0051] Compared with the prior art, the present application has the following advantages:

[0052] (1) The method can compensate for the longitudinal stretching distortion caused by non-ideal slow-axis scanning drive, significantly improve the geometric accuracy of the image, and improve the imaging quality.

[0053] (2) The method is a software-level correction method, which can be directly integrated into the image acquisition and processing process, avoiding the need to modify the hardware level design of the existing imaging system, and facilitating the popularization and application.

[0054] (3) The present application first proposes a mapping compensation correction method for the longitudinal image distortion problem caused by non-ideal (such as sawtooth wave distortion) drive signal of the electromagnetic driving MEMS micromirror during slow-axis scanning.

[0055] (4) The method has low computational complexity, is suitable for embedded platforms or edge processing systems, can realize real-time correction during image acquisition, and is suitable for high-speed scanning requirements.

[0056] The present application will be described in further detail below with reference to the accompanying drawings. BRIEF DESCRIPTION OF DRAWINGS

[0057] Figure 1 Figure 1 is a flow chart of a method for correcting longitudinal distortion of a confocal microscopic image based on an electromagnetic driving MEMS micromirror in an embodiment.

[0058] Figure 2 Figure 2 is a corresponding graph of the piezoresistive feedback signal and the line information collected in an embodiment, in which a linear fitting curve and a cubic function fitting curve of the piezoresistive feedback signal are plotted.

[0059] Figure 3 Figure 3 is a structural diagram of a confocal microscope system based on an electromagnetic driving MEMS micromirror in an embodiment.

[0060] Figure 4 Figure 4 is a schematic diagram of the result of correcting longitudinal distortion of a MEMS confocal microscopic image by the method of the present application in an embodiment, in which Figure 4 (a) in Figure 4 is a longitudinally distorted image when the system images the end face of a fiber bundle; Figure 4 (b) in Figure 4 is a fiber core structure at the center position of the MEMS micromirror scanning; Figure 4 (c) in Figure 4 is a fiber core structure at the position below the MEMS micromirror scanning; Figure 4 (d) in Figure 4 is an image after longitudinal distortion correction; Figure 4 (e) in Figure 4 is a fiber core structure at the center position of the MEMS micromirror scanning; Figure 4 (f) in Figure 4 is a fiber core structure at the position below the MEMS micromirror scanning. DETAILED DESCRIPTION

[0061] In order to make the objects, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and not used to limit the present application.

[0062] It should be noted that if the embodiments of the present application involve directional indications (such as up, down, left, right, front, back, etc.), the directional indications are only used to explain the relative positional relationship, movement condition, etc. between components in a certain specific posture (as shown in the drawings), and if the specific posture changes, the directional indications will also change accordingly.

[0063] In addition, if the description of "first", "second" and the like is involved in the embodiments of the present application, the description of "first", "second" and the like is only for the purpose of description, and cannot be understood as indicating or implying the relative importance of the indicated technical features or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first", "second" can be explicitly or implicitly included at least one of the features. In addition, the technical solutions of various embodiments can be combined with each other, but it must be based on the realization of ordinary skilled in the art, when the combination of technical solutions appears contradictory or unachievable, it should be considered that the combination of technical solutions does not exist, and is not within the protection scope required by the present application.

[0064] In one embodiment, in combination Figure 1 , a confocal microscopic image longitudinal distortion correction method based on electromagnetic driving MEMS micromirror is provided, which effectively corrects the longitudinal distortion introduced by the MEMS micromirror by establishing the mapping relationship between the slow-axis piezoresistive feedback signal of the MEMS micromirror and each row of the image.

[0065] Further, in one of the embodiments, the method comprises the following steps:

[0066] S1, synchronously collecting multiple frames of confocal microscopic image data and piezoresistive feedback data;

[0067] S2, pre-processing the multiple frames of piezoresistive feedback data to obtain data for longitudinal distortion correction;

[0068] S3, performing curve fitting on the data obtained in step 2;

[0069] S4, determining the mapping target interval according to the fitted curve;

[0070] S5, establishing the mapping relationship according to the mapping target interval;

[0071] S6, realizing the longitudinal distortion correction of the image according to the mapping relationship.

[0072] Further, in one of the embodiments, in S1, a high-speed data acquisition card with a sampling rate of f s is used, and the logic and of the frame synchronization signal and the line synchronization signal output by the MEMS micromirror drive is used as the trigger condition for data acquisition. N data points are collected each time the trigger event occurs. It is assumed that each frame contains H line synchronization signals (corresponding to the vertical resolution of the image being H pixels). In order to realize the longitudinal distortion correction of the image, the system needs to continuously save M frames of collected data.

[0073] Wherein, the data of the hth row and nth point of the original slow-axis piezoresistive feedback signal data is denoted as , and the mth frame of data is denoted as The data of each frame is arranged in rows, and forms an HxM row-column structure as a whole, and is represented as:

[0074]

[0075] Further, in one embodiment, S2 is directed to pre-processing the multi-frame piezoresistive feedback data to obtain data for longitudinal distortion correction, and the specific process includes:

[0076] S2-1, the multi-frame piezoresistive feedback data is averaged to obtain average frame data, and the calculation formula is:

[0077]

[0078] In the formula, is the average frame data, is the mth frame piezoresistive feedback data, and M represents the total number of frames, is the multi-frame average value of the hth row and nth data point;

[0079] S2-2, all sampling points in each row are averaged to obtain the final data for longitudinal distortion correction , and the calculation formula is:

[0080]

[0081] In the formula, is the hth row data for longitudinal distortion correction, and N represents the total number of sampling data points, is the average value of all sampling data points in the hth row.

[0082] Further, in one embodiment, S3 is directed to curve fitting the data obtained in step 2, and specifically includes:

[0083] S3-1, for each row of data for longitudinal distortion correction , the row number h is taken as the abscissa, and the corresponding value is taken as the ordinate, and a scatter plot is drawn;

[0084] S3-2, all data is fitted using a cubic function curve, and the fitted curve is denoted as ;

[0085] S3-3, the data points each accounting for p% of the total data on the left and right of the center point are fitted using a linear function, and the fitted curve is denoted as .

[0086] Here, preferably, p% is 5%.

[0087] Further, in one embodiment, S4 is directed to determining the mapping target interval according to the fitted curve, and specifically includes:

[0088] The maximum value and the minimum value in all the row average values The minimum row number and the maximum row number corresponding to the linear function are determined as the upper and lower bounds The specific formula is as follows:

[0089]

[0090] The mapping target interval is determined as r ∈ [r min , r max ].

[0091] Here, the decimal result is specifically rounded up.

[0092] Further, in one embodiment, S5 establishes the mapping relationship according to the mapping target interval, specifically comprising:

[0093] S5-1, according to the determined mapping target interval r ∈ [r min , r max ], each row r is substituted into the fitting curve to obtain the ideal value :

[0094]

[0095] S5-2, the ideal value of the rth row is taken as the output of the fitting curve , and the original row number corresponding to the ideal value is calculated reversely:

[0096] .

[0097] Further, in one embodiment, S6 realizes the longitudinal distortion correction of the image according to the mapping relationship, specifically comprising:

[0098] Suppose there is an original image with a resolution of p1×q1, the pixel value of the ith column in the hth row is , and the pixel value of the ith column in the rth row of the image without longitudinal distortion is .

[0099] According to the mapping relationship, the data of the q rows above and below the ith column in the rth row of the original image are mapped to the ith column in the rth row of the image without longitudinal distortion by the Gaussian weighting method, to realize the longitudinal distortion correction of the image, and the specific formula is as follows:

[0100] ​​​​​

[0101] wherein,

[0102]

[0103] wherein, is the weight of the interpolated data point; is the original row number corresponding to the ideal value of the r+jth row.

[0104] Here, preferably, q takes the value 3.

[0105] In one embodiment, a confocal microscopic system based on an electromagnetic-driven MEMS micromirror is provided, to which the method for correcting longitudinal distortion of confocal microscopic images based on the electromagnetic-driven MEMS micromirror can be applied. The confocal microscopic system should be based on the principle of reflective confocal imaging or the principle of fluorescence imaging. The confocal microscopic system comprises:

[0106] a confocal microscope for confocal detection and imaging of a sample;

[0107] a MEMS micromirror driving device for driving the MEMS micromirror, giving a piezoresistive feedback signal of a trigger signal and a MEMS slow-axis driving signal;

[0108] a high-speed signal acquisition card for acquisition of photoelectric signals;

[0109] a signal processor for processing data acquired by the acquisition card and implementing distortion correction by the method for correcting longitudinal distortion of confocal microscopic images, and outputting images.

[0110] Preferably, the confocal microscope adopts, but is not limited to, one of the following: including a laser, a photomultiplier tube / avalanche photodiode, and an electromagnetic-driven MEMS micromirror.

[0111] Preferably, the signal processor comprises:

[0112] continuously receives data output by the high-speed acquisition card;

[0113] corrects the distorted images.

[0114] In another aspect, a confocal microscopic image longitudinal distortion correction system based on an electromagnetic-driven MEMS micromirror is provided, and the system comprises:

[0115] a first module for synchronously acquiring multiple frames of confocal microscopic image data and piezoresistive feedback data;

[0116] a second module for pre-processing the multiple frames of piezoresistive feedback data to obtain data for longitudinal distortion correction;

[0117] a third module configured to perform curve fitting on the data obtained by the second module;

[0118] a fourth module configured to determine a mapping target interval according to the fitted curve;

[0119] a fifth module configured to establish a mapping relationship according to the mapping target interval;

[0120] a sixth module configured to realize image longitudinal distortion correction according to the mapping relationship.

[0121] For specific definitions of the confocal microscopic image longitudinal distortion correction system based on the electromagnetic driving MEMS micromirror, reference can be made to the definitions of the confocal microscopic image longitudinal distortion correction method based on the electromagnetic driving MEMS micromirror in the foregoing, which will not be repeated here. The modules in the confocal microscopic image longitudinal distortion correction system based on the electromagnetic driving MEMS micromirror can be realized by software, hardware, or a combination thereof, in whole or in part. The modules can be embedded in or independent of the processor in the computer device in hardware form, or stored in the memory in the computer device in software form, so as to be called and executed by the processor to perform the operations corresponding to the modules.

[0122] In one embodiment, a computer device is provided, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the following when executing the computer program:

[0123] Step 1: synchronously acquiring multiple frames of confocal microscopic image data and piezoresistive feedback data;

[0124] Step 2: pre-processing the multiple frames of piezoresistive feedback data to obtain data for longitudinal distortion correction;

[0125] Step 3: performing curve fitting on the data obtained in Step 2;

[0126] Step 4: determining a mapping target interval according to the fitted curve;

[0127] Step 5: establishing a mapping relationship according to the mapping target interval;

[0128] Step 6: realizing image longitudinal distortion correction according to the mapping relationship.

[0129] For specific definitions of each step, reference can be made to the definitions of the confocal microscopic image longitudinal distortion correction method based on the electromagnetic driving MEMS micromirror in the foregoing, which will not be repeated here.

[0130] In one embodiment, a computer readable storage medium is provided, which stores a computer program, and the computer program is executed by a processor to implement the following:

[0131] Step 1: Simultaneously acquire multiple frames of confocal microscopic image data and piezoresistive feedback data;

[0132] Step 2: Preprocess the multi-frame piezoresistive feedback data to obtain data for longitudinal distortion correction;

[0133] Step 3: Perform curve fitting on the data obtained in Step 2;

[0134] Step 4: Determine the target mapping interval based on the fitted curve;

[0135] Step 5: Establish a mapping relationship based on the target mapping interval;

[0136] Step 6: Correct the longitudinal distortion of the image according to the mapping relationship.

[0137] For specific limitations on each step, please refer to the limitations on the longitudinal distortion correction method of confocal microscopy images based on electromagnetically driven MEMS micromirrors mentioned above, which will not be repeated here.

[0138] As a specific example, the invention is further illustrated in one embodiment.

[0139] The collected piezoresistive feedback signal data is as follows Figure 2 As shown, the original data and the linear fitting curve were plotted. ) and cubic function fitting curve ( (and mark the main data points).

[0140] Confocal microscopy systems based on electromagnetically driven MEMS micromirrors, such as Figure 3 As shown, the light emitted from laser 1 is reflected after passing through dichroic mirror 3 and then incident on MEMS micromirror 4. Through two-dimensional scanning by MEMS micromirror 4, the laser can scan the sample within the objective-sample module 5. The sample-reflected light passes through dichroic mirror 3 via the original path and is detected by photodetector 2. MEMS micromirror driving circuit 6 drives the MEMS micromirror and outputs the MEMS micromirror motion synchronization signal and driving voltage feedback signal. Data acquisition card 7 receives the photodetector signal during imaging and receives the slow-axis drive feedback signal when obtaining the longitudinal distortion correction lookup table. Signal processor 8 performs image reconstruction and image distortion correction functions.

[0141] The specific correction results using the method of this invention are as follows: Figure 4 As shown. Figure 4 (a) and Figure 4 (d) shows the images with and without longitudinal distortion correction, respectively. The lower half, which was severely stretched longitudinally, has returned to normal after correction. Figure 4 (b) and Figure 4Figure (e) in the above figure is an enlarged view of the fiber core at the center of the image, which shows that the fiber core is a uniform circular structure. Figure 4 Figure (c) and Figure 4 Figure (f) in the above figure is an enlarged view of the fiber core at the position where the image distortion is obvious, before and after correction. It can be seen that the fiber core is obviously elongated in the longitudinal direction before correction, and the regular circular fiber core is restored after correction. This proves the effectiveness of the distortion correction method of the present application.

[0142] The basic principles, main features and advantages of the present application are shown and described above. It should be understood by those skilled in the art that the present application is not limited by the above examples, and the above examples and descriptions in the specification are only to illustrate the principles of the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principles of the present application shall be included in the protection scope of the present application without departing from the spirit and scope of the present application.

Claims

1. A method for correcting longitudinal distortion of a confocal microscopic image based on an electromagnetic driving MEMS micromirror, characterized in that, The method effectively corrects the longitudinal distortion introduced by the MEMS micro mirror by establishing a mapping relationship between a slow-axis piezoresistive feedback signal of the MEMS micro mirror and each row of images; The method comprises the following steps: Step 1, synchronously collecting multiple frames of confocal microscopic image data and piezoresistive feedback data; Step 2, performing average processing on the multiple frames of piezoresistive feedback data to obtain data for longitudinal distortion correction; Step 3, performing curve fitting on the data obtained in step 2; Step 4, determining a mapping target interval according to the fitted curve; Step 5, establishing a mapping relationship according to the mapping target interval; Step 6, realizing longitudinal distortion correction of images according to the mapping relationship; Step 5, the method of establishing a mapping relationship according to the mapping target interval, specifically comprising: Step 5-1, according to the determined mapping target interval r, substitute each row r into the fitting curve , to obtain the ideal value : ； Step 5-2, find the ideal value of the rth row As the output of the fitted curve , the original row number corresponding to the ideal value is calculated inversely : ； Step 6, the method of realizing longitudinal distortion correction of images according to the mapping relationship, specifically comprising: There is a p1 x q1 resolution of the original image, the first h row i column pixel value is , the pixel value of the rth row ith column of the image without longitudinal distortion is ; Based on the mapping relationship, the first image in the original image is selected using a Gaussian weighted average. The data in rows q above and below the point in column i are mapped to row r and column i of the image without vertical distortion, thus achieving vertical distortion correction. The specific formula is as follows: ； Wherein, ； wherein is the weight of the interpolated data point participating; is the original row number corresponding to the ideal value of the r + j row.

2. The method for correcting longitudinal distortion of a confocal microscopic image based on an electromagnetic driving MEMS micromirror according to claim 1, wherein In step 1, a high-speed data acquisition card with a sampling rate of f s is used to collect data using the logical AND of the frame synchronization signal and the row synchronization signal output by the MEMS micromirror drive as a trigger condition.

3. The method for correcting longitudinal distortion of a confocal microscopic image based on an electromagnetic driving MEMS micromirror according to claim 2, wherein Step 2, the method of performing preprocessing on the multiple frames of piezoresistive feedback data to obtain data for longitudinal distortion correction, specifically comprising: Step 2-1, performing average processing on the multiple frames of piezoresistive feedback data to obtain average frame data, and the calculation formula is: ； In the formula, is the average frame data, is the mth frame piezoresistive feedback data, M represents the total number of frames, is the multi-frame average value of the nth data point in the hth row; Step 2-2, average all the sampling points of each row to obtain the final data for longitudinal distortion correction The calculation formula is: ； wherein N is the total number of sampling data points, is the average value of all sampling data points in the hth row.

4. The method for correcting longitudinal distortion of a confocal microscopic image based on an electromagnetic driving MEMS micromirror according to claim 3, wherein Step 3, the method of performing curve fitting on the data obtained in step 2, specifically comprising: Step 3-1, for each row of data for longitudinal distortion correction with the row number h as the abscissa and the corresponding value as the ordinate, a scatter plot is drawn; Step 3-2, a cubic function curve fitting is used for all data, the fitted curve is denoted as ; Step 3-3, Linear fitting is used to the data points which are on the left and right of the center point, and the fitted curve is denoted as .

5. The method for correcting longitudinal distortion of a confocal microscopic image based on an electromagnetic driving MEMS micromirror according to claim 4, wherein Step 4, the method of determining a mapping target interval according to the fitted curve, specifically comprising: The maximum value in the average value of all rows The minimum value in the average value of all rows As the upper and lower bounds, the minimum row number and the maximum row number corresponding in the linear function are determined The minimum row number and the maximum row number corresponding in the linear function are determined The minimum row number and the maximum row number corresponding in the linear function are determined The specific formula is: ； Then, the mapping target interval is determined as r ∈ [r min , r max ].

6. A system for correcting longitudinal distortions in confocal microscopic images based on the method according to any one of claims 1 to 5, characterized in that The system comprises: A first module for synchronously collecting multiple frames of confocal microscopic image data and piezoresistive feedback data; A second module for performing preprocessing on the multiple frames of piezoresistive feedback data to obtain data for longitudinal distortion correction; A third module for performing curve fitting on the data obtained by the second module; A fourth module for determining a mapping target interval according to the fitted curve; A fifth module for establishing a mapping relationship according to the mapping target interval; A sixth module for realizing longitudinal distortion correction of images according to the mapping relationship.

7. A computer device comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, characterized in that, The processor executes the computer program to realize the method of any one of claims 1 to 5.

8. A computer-readable storage medium having stored thereon a computer program, characterized in that, The computer program is executed by the processor to realize the method of any one of claims 1 to 5.

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