Ablation analysis method and system for light-absorbing impurity aggravated accumulated snow

Abstract

The invention discloses a light-absorbing impurity aggravated accumulated snow ablation analysis method and system, and the method comprises the steps: obtaining the LAIs concentration of light-absorbing impurity aggravated accumulated snow, the LAIs concentration comprises a first LAIs concentration in which the snowfall mass in the snowfall stage is not less than the minimum mass, a second LAIs concentration in which the snowfall mass in the snowfall stage is less than the minimum mass, and a third LAIs concentration in the sublimation stage; inputting the LAIs concentration into a pre-constructed snow albedo model, and outputting the snow albedo model to obtain an albedo; and inputting the albedo into a pre-constructed air temperature index model, and outputting the air temperature index model to obtain an ablation effect of intensifying accumulated snow ablation by the light-absorbing impurities.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of ice and snow ablation analysis, and particularly relates to a method and system for analyzing the aggravation of snow ablation caused by light-absorbing impurities. BACKGROUND

[0002] Black carbon aerosols not only cause strong warming, but also settle on the surface of snow and ice, reducing albedo and increasing solar radiation absorption, thereby exacerbating glacier ablation. Black carbon emissions exacerbate snow and ice ablation, and the enrichment of surface layer black carbon and the increase of concentration due to ablation further exacerbate ablation. Existing simulation studies of the impact of black carbon emissions on snow and ice changes are limited to the evaluation of surface ablation, lack of simulation of continuous enrichment caused by post-deposition processes, and underestimate the impact of black carbon concentration and its impact on snow and ice ablation, thereby leading to unclear positive feedback processes and mechanisms of black carbon and snow and ice ablation. Building a quantitative module and clarifying the positive feedback mechanism is a breakthrough point for solving the underestimation and understanding the impact of rapid snow and ice ablation on hydrological processes.

[0003] The core link of light-absorbing impurities represented by black carbon exacerbating snow and ice ablation is albedo, and how to more accurately depict its spatiotemporal variation is the core of understanding this problem. In recent decades, radiation transfer models used to quantify albedo changes have been widely used, and have undergone development from simple approximation calculations to detailed multi-stream processing and then to complex Monte Carlo methods, and have made significant improvements in depicting snow particle morphology and calculating single scattering properties of snow particles. The main understanding is that non-spherical snow particles have lower symmetry than spherical snow particles, which can significantly reduce the penetration of solar radiation into the snow layer and increase the albedo; the influence of non-spherical snow particles on snow single scattering albedo and material extinction cross section is relatively small (<10%), and the use of effective spherical particle size to represent natural snow particles is the most widely used in previous studies. In addition, there are simplified parameterization schemes of albedo as functions of snow characteristics indicators and environmental variables, which are widely used in weather and climate models due to their low input parameters and high computational efficiency.

[0004] Black carbon is an important carbonaceous aerosol component with extremely strong light absorption, and the concentration of snow and ice black carbon, snow particle size, waveband, snow characteristics, and light conditions will change the degree of black carbon affecting albedo. Moreover, the mixing state of black carbon and snow particles will also change the ability of black carbon to absorb radiation. Previous studies have assumed that black carbon and snow particles are in an external mixing state; however, recent studies have found that internal mixing of black carbon has a stronger light absorption capacity than external mixing. However, due to limited observations, the true state of black carbon particles being wrapped in snow is still unclear. Existing studies that assume external mixing of black carbon and snow particles believe that the global-scale annual mean radiative forcing caused by black carbon is 0.01~0.09 W / m2, which is more significant in the Qinghai-Tibet Plateau and northern China, especially in spring.

[0005] The snow on the glacier (called snow in glaciology) has a long existence time, thick snow layer and complex structure. After deposition, it will undergo a series of migration and transformation processes such as enrichment and loss under the action of post-deposition processes, significantly changing the concentration of snow and ice black carbon, leading to more complex and severe snow and ice ablation. This is a key process that needs to be improved in the current research on the impact of black carbon on snow and ice ablation. The content of black carbon in different types of snow and ice (new snow, old snow, granular ice, etc.) differs by 1-2 orders of magnitude. In the southeast of the Qinghai-Tibet Plateau, the contribution of black carbon in old snow to the acceleration of snow and ice ablation can reach 15%, while the contribution of black carbon in new snow to the acceleration of snow and ice ablation is less than 5%. There are few observations of the impact of post-deposition processes on black carbon on the Qinghai-Tibet Plateau, and this process will significantly change the concentration of black carbon on the surface of snow and ice and the impact of black carbon with the same content on albedo. Unfortunately, such observation research is still weak in supporting the simulation of continuous changes in black carbon and its impact on the whole glacier. SUMMARY

[0006] The present application provides a method and system for analyzing the acceleration of snow ablation by light-absorbing impurities, which solves the technical problem of inaccurate snow ablation analysis.

[0007] In a first aspect, the present application provides a method for analyzing the acceleration of snow ablation by light-absorbing impurities, comprising: obtaining the LAIs concentration of light-absorbing impurities accelerating snow, wherein the LAIs concentration includes a first LAIs concentration when the snowfall mass in the snowfall stage is not less than the minimum value mass a second LAIs concentration when the snowfall mass in the snowfall stage is less than the minimum value mass and a third LAIs concentration in the sublimation stage, and the expression for calculating the first LAIs concentration is: , wherein, is the first LAI concentration after the snowfall stage of the Nth layer, is the content of light-absorbing impurities per unit area, is the snowfall mass per unit area; the expression for calculating the second LAIs concentration is: , wherein, is the second LAI concentration after the snowfall stage of the Nth layer, is the content of light-absorbing impurities in the uppermost layer before mixing, is the snow mass of the mixed layer per unit area, is the snow mass of the surface layer per unit area; the expression for calculating the third LAIs concentration is: , wherein, is the concentration of light-absorbing impurities of the p2th layer, is the content of light-absorbing impurities per unit area, is the concentration of light-absorbing impurities of the p1th layer at the i th moment, is the number of top layers of snow, is the thickness of snow mass of the p1th layer at the i th moment, is the sublimation mass; is the sublimation mass; inputting the LAIs concentration into a pre-constructed snow albedo model, the snow albedo model outputting an albedo; inputting the albedo into a pre-constructed air temperature index model, the air temperature index model outputting an ablation effect of light-absorbing impurities on accelerated snow ablation.

[0008] In a second aspect, the present application provides a system for analyzing light-absorbing impurities accelerating snow ablation, comprising: an acquisition module configured to acquire LAIs concentration of light-absorbing impurities accelerating snow and snow particle mixing ratio, wherein the LAIs concentration includes a first LAIs concentration when snowfall mass in a snowfall stage is not less than a minimum value mass , a second LAIs concentration when snowfall mass in a snowfall stage is less than a minimum value mass , and a third LAIs concentration in a sublimation stage, and an expression for calculating the first LAIs concentration is: , wherein, is the first LAI concentration of the Nth layer after the snowfall stage, is the content of light-absorbing impurities per unit area, is the snowfall mass per unit area; an expression for calculating the second LAIs concentration is: , wherein, is the second LAI concentration of the Nth layer after the snowfall stage, is the content of light-absorbing impurities of the uppermost layer before mixing, is the snow mass of the mixed layer per unit area, is, is the moment; an expression for calculating the third LAIs concentration is: , wherein, is the concentration of light-absorbing impurities of the p2th layer, is the content of light-absorbing impurities per unit area, is the concentration of light-absorbing impurities of the p1th layer at the i th moment, The number of the top layer of snow. For the first Snow thickness mass at time p1 To enhance quality; The first output module is configured to input the LAIs concentration into a pre-constructed snow albedo model, and the snow albedo model outputs the albedo. The second output module is configured to input the albedo into a pre-constructed temperature index model, and the temperature index model outputs the ablation effect of light-absorbing impurities exacerbating snow melting.

[0009] Thirdly, an electronic device is provided, comprising: at least one processor, and a memory communicatively connected to the at least one processor, wherein the memory stores instructions executable by the at least one processor, the instructions being executed by the at least one processor to enable the at least one processor to perform the steps of the analysis method for light-absorbing impurities that exacerbate snow melting according to any embodiment of the present invention.

[0010] Fourthly, the present invention also provides a computer-readable storage medium having a computer program stored thereon, wherein when the program instructions are executed by a processor, the processor performs the steps of the method for analyzing the amplification of snow melt caused by light-absorbing impurities according to any embodiment of the present invention.

[0011] This application presents a method and system for analyzing the agglomeration of snow cover caused by light-absorbing impurities. Compared with existing snow cover ablation analysis methods, it not only considers the impact of light-absorbing impurities such as black carbon and dust on snow cover ablation, but also further quantifies the dynamic changes of light-absorbing impurities caused by new snowfall and post-deposition processes such as snow ablation and sublimation. It innovatively constructs a dynamic simulation framework for the vertical distribution of light-absorbing impurities (LAIs)—considering both the input of atmospheric deposition flux and the subsurface migration of impurity concentration through the melt-refreezing process, thereby establishing a quantitative correlation between particle mixing ratio and the deposition amount of light-absorbing impurities, snowfall, snow evaporation, and melting. For the first time, it achieves dynamic analysis of particle mixing ratio throughout the entire cycle from aerosol deposition to snow cover ablation through a multi-process coupling mechanism, overcoming the deficiency of underestimation in existing methods that agglomerate ablation, and advancing the characterization capability and depth of understanding of snow cover simulation. Attached Figure Description

[0012] To more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the following description of the embodiments will be briefly introduced. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0013] Figure 1 A flowchart of an analysis method for amplifying snow melting caused by light-absorbing impurities, provided in an embodiment of the present invention; Figure 2 This is a structural block diagram of an analysis system for analyzing light-absorbing impurities that exacerbate snow melting, provided in an embodiment of the present invention. Figure 3 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention. Detailed Implementation

[0014] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0015] Please see Figure 1 The flowchart of an analytical method for analyzing the acceleration of snow melting by light-absorbing impurities is shown in this application.

[0016] like Figure 1 As shown, the analytical method for analyzing how light-absorbing impurities exacerbate snow melting specifically includes the following steps: Step S101: Obtain the concentration of light-absorbing impurities (LAIs) that exacerbate snow accumulation and the snow particle mixing ratio, wherein the LAI concentration includes snowfall mass during the snowfall phase that is not less than the minimum mass. The first LAI concentration, the snowfall mass during the snowfall phase is less than the minimum mass. The concentration of the second LAIs and the concentration of the third LAIs during the sublimation stage.

[0017] In this step, a novel snow surface parameterization model—the Snow LAI Redistribution (SLAIR) model—was coupled into the SNICAR Adv4 radiative transfer model to investigate the mechanism by which light-absorbing impurities on the snow surface accelerate snow ablation by reducing snow surface albedo and promoting snow particle degradation. This model quantifies the impact of LAI concentration and snow particle mixing ratio on albedo, systematically revealing the ablation effect of LAIs: dynamic changes in the snow layer (controlled by three physical processes—snow accumulation, snow sublimation, and surface melting) drive aerosol deposition and redistribution, leading to dynamic changes in the particle mixing ratio of light-absorbing impurities in the snow layer. This study innovatively constructs a dynamic simulation framework for the vertical distribution of LAIs—considering both the input of atmospheric deposition flux and the subsurface migration of impurity concentration through the melt-refreezing process, thereby establishing a quantitative correlation between the particle mixing ratio and the amount of light-absorbing impurity deposition, snowfall, snow evaporation, and melting. It is particularly noteworthy that the parameterization scheme designed for "surface ablation" in the model has shown excellent performance through field testing. Based on this, this study focuses on simulating the subsurface deposition process of LAIs in the later stage of snow and ice ablation, and for the first time realizes the dynamic analysis of particle mixing ratio throughout the entire cycle from aerosol deposition to snow ablation through a multi-process coupling mechanism.

[0018] To dynamically represent the vertical distribution of LAI (Liquid Acid) such as black carbon and dust in the snow layer, a minimum mass is assigned to each snow layer. =0.75kg. When the mass of a layer is less than this value, the layer will merge with the layer below. The vertical structure and distribution of the snow layer are calculated in three sub-steps in the order of snowfall stage, surface sublimation stage, and surface melting stage.

[0019] When the snowfall mass is greater than At this time, a new snow layer forms on top of the existing snow layer. The particle mixing ratio of the light-absorbing impurities in this top layer is only affected by the daily snowfall and the daily deposition flux of light-absorbing impurities (the sum of dry and wet deposition). The concentration of the uppermost light-absorbing impurities is the first LAI concentration, expressed as: , In the formula, This represents the first LAI concentration after the snowfall stage in layer N. The content of light-absorbing impurities per unit area. Snowfall mass per unit area; When the snowfall mass is less than In the latter case, the total amount of snow will remain unchanged. New snow and newly deposited particles merge with the existing top layer, and assuming immediate mixing, the concentration of the second LAIs is obtained, expressed as: , In the formula, This represents the second LAI concentration after the snowfall stage in layer N. This represents the content of light-absorbing impurities in the top layer before mixing. The mass of snow in the mixed layer per unit area. The mass of surface snow per unit area. For a specific moment; Sublimation can be categorized into three possibilities: 1) The mass of the top layer of snow remains greater than 20% after sublimation. At that time, the mass of the topmost layer of snow after sublimation is less than The sublimated mass is greater than the top layer of snow. When the sublimated mass is less than the top layer of snow, the total number of snow layers remains unchanged, and the mass of the top layer will be updated to the difference between the mass before and after sublimation. If the sublimated mass is greater than the top layer of snow, multiple snow layers will be removed from the top of the snowdrift, making the total mass of the removed layers equal to the sublimated mass. The expression for calculating the concentration of the third LAIs is: , In the formula, The concentration of light-absorbing impurities in the p2 layer. The content of light-absorbing impurities per unit area. Let be the concentration of light-absorbing impurities in layer p1 at time i. The number of the top layer of snow. For the first Snow thickness mass at time p1 To enhance quality; This work employs the surface melting strategy from the SLAIR method. Specifically, the contribution of each snow layer to the total melt is set so that all meltwater originates from the top of the snow layer; surface melting provides the amplification effect for maximum melt. Assuming no lateral or longitudinal water mass transport, if the top layer thickness after melting is less than... Then this layer will merge with the layer below. For the surface melting mode, the calculation is similar to that of sublimation: remove one or more snow layers from the top of the snow cover to make it equal to the total melting thickness. The concentration of LAI in the uppermost post-melting layer N' depends on the species-specific meltwater removal efficiency. It is the percentage of LAI carried by meltwater, and its concentration is related to the size of LAI particles and the properties of water. The formula for calculating the concentration is: , In the formula, The concentration of light-absorbing impurities in the snow layer at time t+1. Let be the concentration of light-absorbing impurities in layer p2 at time i. Let p2 be the snow thickness mass at time i. For the number of floors, For melting quality, For water removal efficiency.

[0020] Step S102: Input the LAIs concentration into the pre-constructed snow albedo model, and the snow albedo model outputs the albedo.

[0021] In this step, the snow albedo model adopts the SNICAR (The Snow, Ice, and AerosolRadiative) model. The SNICAR model is constructed by combining multilayer dual-flow radiative transfer theory with the microphysical properties of snow cover and is incorporated into the NCAR Community Climate System Model to simulate the vertical distribution of snow albedo and solar radiation. With the deepening of research and its widespread application in global and regional climate models, SNICAR has been widely used to explore the radiative effects of LAPs in snow cover and their response to climate. Recent version updates have included: for example, the introduction of the delta Eddington adding-doubling solver into the SNICAR model to improve the accuracy of calculating near-infrared (NIR) snow albedo spectra under diffuse radiation (cloudy) conditions; and the addition of new parameterization schemes such as the non-spherical nature of snow particles and the BC snow mixing effect to improve the model's physical properties. This application uses SNICAR-Adv4 as the main radiative framework.

[0022] In the two-stream approximation algorithm, the optical properties of each snow layer depend on the mixing ratio of all light-absorbing components within the layer. The single-layer optical thickness of component n is... Depends on its mass extinction cross section and its mass in that layer The expression is: ; The monolayer mass of each component can be obtained through its mass mixing ratio. ( ,unit: The expression is: ; In the formula, It is the thickness of that snow layer. This is the density of snow within the snow layer, and this density includes ice and all other present components in the snow, consistent with the snow density obtained from ground observations. Then, by assuming that the mass of snow containing all non-light-absorbing impurities is ice, the mass of ice can be deduced from the snow density. The expression is: ; During radiative transport, when the interparticle distance is greater than the wavelength of the scattered light, the scattering between particles is independent. Although this assumption is not strictly valid in the radiative process of snow, it is valid when the snow density is less than... Its influence on the bias in snow albedo modeling is minimal. Under this assumption, the overall optical properties of the snow layer can be calculated, if the single-layer optical thickness of each component in the snow layer is defined as... Therefore, the total optical thickness of this snow layer can be expressed as the sum of the optical thicknesses of all n components, as shown in the following expression: ; The single-scattering albedo of this layer of snow and asymmetric factors The single-scattering albedo of different components can be used to determine the albedo. and asymmetric factors After weighting, the expression is: , , and define The equation uses After the function was adjusted and introduced... The forward scattering coefficient of the snow layer is calculated using the cosine of the solar zenith angle, and the expression is as follows: , , , , , , , , In the formula, Forward scattering coefficient, To calculate the shape parameters of the forward scattering phase function, This is a forward scattering effect. For reflectivity, Transmittance; The snow layer is sensitive to direct radiation. reflectivity at and transmittance for: , , The reflectivity of the scattered radiation from the snow layer is obtained by integrating the direct radiation at different incident angles. and transmittance The expression is: , , After obtaining the optical properties of each snow layer, the next step is to combine these properties using an adding-doubling scheme to obtain the overall optical properties of the multi-layered snow cover. Taking two adjacent snow layers as an example, assuming layer 1 covers layer 2, and radiation is incident from top to bottom on the surface of layer 1, then the overall direct reflectance of the two snow layers at the surface of layer 1 is... and transmittance The expressions are as follows: , , In the formula, The reflectivity of layer 1, The transmittance of layer 1, The optical thickness of layer 1, The scattering reflectance at the surface of layer 2, The scattering reflectance at the surface of layer 1, The reflectivity of layer 2, For complex refractive index, The scattering transmittance of layer 1, The scattering transmittance of layer 2; Scattering reflectance of the two snow layers at the surface of layer 1 and transmittance The expressions are as follows: , , The above calculation assumes radiation incident from top to bottom on the surface of layer 1. If the radiation incident from bottom to top on the surface of layer 2, the result is equivalent, and the total optical properties of both snow layers at the surface of layer 2 can be obtained. Similarly, this method can be used to calculate the cumulative upward and downward radiative transfer values ​​on any plane within the snow layer and obtain the optical properties at that plane. The expression for calculating the cumulative downward direct radiation on a plane is: , In the formula, The cumulative downward direct radiation on any plane, The optical thickness from the snow surface to any plane. It represents the overall transmittance of the snow layer surface to downward direct radiation between any plane and the snow layer surface. The reflectivity of the entire snow layer below any plane to downward direct radiation. The reflectivity of the entire snow layer above any plane to upward-scattered radiation. Let be the reflectivity of the entire snow layer below any plane to downward scattered radiation. To observe the cosine value of the zenith angle; The expression for calculating the cumulative upward direct radiation on a plane is: , In the formula, The cumulative upward direct radiation for any plane; The expression for calculating the cumulative downward scattered radiation in the plane is: , In the formula, The cumulative downward scattered radiation for any plane, The overall transmittance of the snow layer surface to downward scattered radiation between any plane; The expression for calculating the cumulative upward scattered radiation in a plane is: , In the formula, The cumulative upward scattered radiation for any plane.

[0023] Finally, the overall albedo of the snow layer surface can be calculated by calculating the cumulative upward and downward radiation at the snow layer surface, as expressed by: , In the formula, The overall albedo of the snow surface. For direct upward shortwave radiation, It is upward scattered radiation. For direct downward shortwave radiation, It is downward scattered radiation.

[0024] Step S103: The albedo is input into a pre-constructed temperature index model, and the temperature index model outputs the ablation effect of light-absorbing impurities exacerbating snow melting.

[0025] In this step, the temperature index model is specifically the ETIM (Enhance Temperature Index Model), which incorporates changes in incident radiation and albedo into ablation calculations, as well as separating temperature-dependent and temperature-independent energy. Compared to the standard temperature index method, the main feature of the ETIM model is the inclusion of shortwave radiation balance in ablation calculations. Albedo determines the amount of incident shortwave radiation absorbed on the snow or ice surface, thus significantly influencing the spatiotemporal evolution of the ablation rate. Therefore, this invention introduces ETIM as a representation of the ablation effect induced by light-absorbing impurities. The expression is: , In the formula, Light-absorbing impurities exacerbate the ablation effect of snow accumulation. This is the empirical coefficient for shortwave radiation. The albedo of snow surface free of light-absorbing impurities. The albedo of snow surface containing light-absorbing impurities. For temperature, This represents the temperature threshold.

[0026] Please see Figure 2 The diagram shows a structural block diagram of an analytical system for analyzing light-absorbing impurities that exacerbate snow melting, as described in this application.

[0027] like Figure 2 As shown, the light-absorbing impurities exacerbate snow melting analysis system 200, including... The acquisition module 210 is configured to acquire the concentration of light-absorbing impurities (LAIs) that exacerbate snow accumulation and the snow particle mixing ratio, wherein the LAI concentration includes snowfall mass during the snowfall phase that is not less than a minimum value mass. The first LAI concentration, the snowfall mass during the snowfall phase is less than the minimum mass. The expression for calculating the concentration of the first LAIs is: (Concentrations of the second LAIs and the third LAIs during the sublimation stage). , In the formula, This represents the first LAI concentration after the snowfall stage in layer N. The content of light-absorbing impurities per unit area. Snowfall mass per unit area; The expression for calculating the concentration of the second LAIs is: , In the formula, This represents the second LAI concentration after the snowfall stage in layer N. This represents the content of light-absorbing impurities in the top layer before mixing. The mass of snow in the mixed layer per unit area. The mass of surface snow per unit area; The expression for calculating the concentration of the third LAIs is as follows: , In the formula, The concentration of light-absorbing impurities in the p2 layer. The content of light-absorbing impurities per unit area. Let be the concentration of light-absorbing impurities in layer p1 at time i. The number of the top layer of snow. For the first Snow thickness mass at time p1 To enhance quality; The first output module 220 is configured to input the LAIs concentration into a pre-constructed snow albedo model, and the snow albedo model outputs the albedo. The second output module 230 is configured to input the albedo into a pre-constructed temperature index model, and the temperature index model outputs the ablation effect of light-absorbing impurities exacerbating snow melting.

[0028] It should be understood that Figure 2 The modules and references described in the document Figure 1 The steps described in the text correspond to those in the method described above. Therefore, the operations, features, and corresponding technical effects described above also apply to the method described in the text. Figure 2 The various modules in the document will not be described in detail here.

[0029] In other embodiments, the present invention also provides a computer-readable storage medium having a computer program stored thereon, wherein when the program instructions are executed by a processor, the processor performs the analysis method for snow melting caused by light-absorbing impurities in any of the above method embodiments. In one embodiment, the computer-readable storage medium of the present invention stores computer-executable instructions, which are configured as follows: The concentration of light-absorbing impurities (LAIs) and the snow particle mixing ratio that exacerbate snow accumulation are obtained, wherein the LAI concentration includes a minimum mass of snowfall during the snowfall phase. The first LAI concentration, the snowfall mass during the snowfall phase is less than the minimum mass. The concentration of the second LAIs and the concentration of the third LAIs during the sublimation stage; The concentration of LAIs is input into a pre-constructed snow albedo model, and the snow albedo model outputs the albedo. The albedo is input into a pre-constructed temperature index model, which outputs the ablation effect of light-absorbing impurities exacerbating snow melting.

[0030] Computer-readable storage media may include a stored program area and a stored data area, wherein the stored program area may store an operating system and an application program required for at least one function; the stored data area may store data created based on the use of the light-absorbing impurities-induced snow melting analysis system, etc. Furthermore, the computer-readable storage medium may include high-speed random access memory, and may also include memory, such as at least one disk storage device, flash memory device, or other non-volatile solid-state storage device. In some embodiments, the computer-readable storage medium may optionally include memory remotely located relative to a processor, which can be connected to the light-absorbing impurities-induced snow melting analysis system via a network. Examples of such networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.

[0031] Figure 3 This is a schematic diagram of the structure of the electronic device provided in the embodiment of the present invention, such as... Figure 3 As shown, the device includes a processor 310 and a memory 320. The electronic device may also include an input device 330 and an output device 340. The processor 310, memory 320, input device 330, and output device 340 can be connected via a bus or other means. Figure 3 Taking a bus connection as an example, the memory 320 is the computer-readable storage medium described above. The processor 310 executes various server functions and data processing by running non-volatile software programs, instructions, and modules stored in the memory 320, thereby implementing the above-described method embodiment for analyzing the method of light-absorbing impurities that exacerbate snow melting. The input device 330 can receive input digital or character information and generate key signal inputs related to user settings and function control of the system for analyzing the method of light-absorbing impurities that exacerbate snow melting. The output device 340 may include a display screen or other display device.

[0032] The aforementioned electronic device can execute the method provided in the embodiments of the present invention, and has the corresponding functional modules and beneficial effects for executing the method. Technical details not described in detail in this embodiment can be found in the method provided in the embodiments of the present invention.

[0033] In one implementation, the above-described electronic device is applied in a system for analyzing snow melting caused by light-absorbing impurities, and is used as a client. It includes: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, which, when executed by the at least one processor, enable the at least one processor to: The concentration of light-absorbing impurities (LAIs) and the snow particle mixing ratio that exacerbate snow accumulation are obtained, wherein the LAI concentration includes a minimum mass of snowfall during the snowfall phase. The first LAI concentration, the snowfall mass during the snowfall phase is less than the minimum mass. The concentration of the second LAIs and the concentration of the third LAIs during the sublimation stage; The concentration of LAIs is input into a pre-constructed snow albedo model, and the snow albedo model outputs the albedo. The albedo is input into a pre-constructed temperature index model, which outputs the ablation effect of light-absorbing impurities exacerbating snow melting.

[0034] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., including several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods of various embodiments or some parts of embodiments.

[0035] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for analyzing the acceleration of snow melting by light-absorbing impurities, characterized in that, include: The concentration of light-absorbing impurities (LAIs) that exacerbate snow accumulation is obtained, wherein the LAI concentration includes a minimum mass of snowfall during the snowfall phase. The first LAI concentration, the snowfall mass during the snowfall phase is less than the minimum mass. The expression for calculating the concentration of the first LAIs is: (Concentrations of the second LAIs and the third LAIs during the sublimation stage). ， In the formula, This represents the first LAI concentration after the snowfall stage in layer N. The content of light-absorbing impurities per unit area. Snowfall mass per unit area; The expression for calculating the concentration of the second LAIs is: ， In the formula, This represents the second LAI concentration after the snowfall stage in layer N. This represents the content of light-absorbing impurities in the top layer before mixing. The mass of snow in the mixed layer per unit area. The mass of surface snow per unit area; The expression for calculating the concentration of the third LAIs is as follows: ， In the formula, The concentration of light-absorbing impurities in the p2 layer. The content of light-absorbing impurities per unit area. Let be the concentration of light-absorbing impurities in layer p1 at time i. The number of the top layer of snow. For the first Snow thickness mass at time p1 To enhance quality; The concentration of LAIs is input into a pre-built snow albedo model, and the albedo model outputs the albedo. The albedo is input into a pre-constructed temperature index model, which outputs the ablation effect of light-absorbing impurities exacerbating snow melting.

2. The method for analyzing the acceleration of snow melting by light-absorbing impurities according to claim 1, characterized in that, in, The LAIs concentration also includes a fourth LAIs concentration during the melting phase, wherein the expression for calculating the fourth LAIs concentration is: ， In the formula, The concentration of light-absorbing impurities in the snow layer at time t+1. Let be the concentration of light-absorbing impurities in layer p2 at time i. Let p2 be the snow thickness mass at time i. For the number of floors, For melting quality, For water removal efficiency.

3. The method for analyzing the exacerbation of snow melting by light-absorbing impurities according to claim 1, characterized in that, in, The expression for the snow albedo model is: ， In the formula, The overall albedo of the snow surface. For direct upward shortwave radiation, It is upward scattered radiation. For direct downward shortwave radiation, It is downward scattered radiation.

4. The method for analyzing the acceleration of snow melting by light-absorbing impurities according to claim 3, characterized in that, in, The expression for the cumulative downward direct radiation on the plane is as follows: ， In the formula, The cumulative downward direct radiation on any plane, The optical thickness from the snow surface to any plane. It represents the overall transmittance of the snow layer surface to downward direct radiation between any plane and the snow layer surface. The reflectivity of the entire snow layer below any plane to downward direct radiation. The reflectivity of the entire snow layer above any plane to upward-scattered radiation. Let be the reflectivity of the entire snow layer below any plane to downward scattered radiation. The cosine zenith angle; The expression for calculating the cumulative upward direct radiation on a plane is: ， In the formula, The cumulative upward direct radiation for any plane The expression for calculating the cumulative downward scattered radiation in the plane is: ， In the formula, The cumulative downward scattered radiation for any plane, The overall transmittance of the snow layer surface to downward scattered radiation between any plane; The expression for calculating the cumulative upward scattered radiation in a plane is: ， In the formula, The cumulative upward scattered radiation for any plane.

5. The method for analyzing the acceleration of snow melting by light-absorbing impurities according to claim 1, characterized in that, in, The expression for the temperature index model is: ， In the formula, Light-absorbing impurities exacerbate the ablation effect of snow accumulation. This is the empirical coefficient for shortwave radiation. The albedo of snow surface free of light-absorbing impurities. The albedo of snow surface containing light-absorbing impurities. For temperature, This represents the temperature threshold.

6. A system for analyzing the effects of light-absorbing impurities on snow melting, characterized in that, include: The acquisition module is configured to acquire the concentration of light-absorbing impurities (LAIs) that exacerbate snow accumulation and the snow particle mixing ratio, wherein the LAI concentration includes snowfall mass during the snowfall phase that is not less than a minimum value mass. The first LAI concentration, the snowfall mass during the snowfall phase is less than the minimum mass. The expression for calculating the concentration of the first LAIs is: (Concentrations of the second LAIs and the third LAIs during the sublimation stage). ， In the formula, This represents the first LAI concentration after the snowfall stage in layer N. The content of light-absorbing impurities per unit area. Snowfall mass per unit area; The expression for calculating the concentration of the second LAIs is: ， In the formula, This represents the second LAI concentration after the snowfall stage in layer N. This represents the content of light-absorbing impurities in the top layer before mixing. The mass of snow in the mixed layer per unit area. The mass of surface snow per unit area. For a specific moment; The expression for calculating the concentration of the third LAIs is as follows: ， In the formula, The concentration of light-absorbing impurities in the p2 layer. The content of light-absorbing impurities per unit area. Let be the concentration of light-absorbing impurities in layer p1 at time i. The number of the top layer of snow. For the first Snow thickness mass at time p1 To enhance quality; The first output module is configured to input the LAIs concentration into a pre-constructed snow albedo model, and the snow albedo model outputs the albedo. The second output module is configured to input the albedo into a pre-constructed temperature index model, and the temperature index model outputs the ablation effect of light-absorbing impurities exacerbating snow melting.

7. An electronic device, characterized in that, include: At least one processor, and a memory communicatively connected to the at least one processor, wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method according to any one of claims 1 to 5.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by the processor, it implements the method described in any one of claims 1 to 5.

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