Element irradiation dose prediction method, imaging system, and storage medium

Abstract

The embodiment of the present application relates to the technical field of imaging detection, in particular to a component irradiation dose prediction method, an imaging system and a storage medium, the prediction method is applied to the imaging system, and the imaging system comprises a ray source and a detector. Through obtaining the actually measured dose of the concerned component under the irradiation of the ray source, fitting the irradiation intensity distribution of the ray source and the actually measured dose, obtaining the ray intensity dose distribution, mapping the path of the relative position change of the concerned component to the path of the height layer of the detector based on the ray intensity dose distribution, obtaining the irradiation dose of the concerned component under the standard height and the standard current, and finally correcting the irradiation dose according to the actual situation of the concerned component, the predicted irradiation dose of the concerned component is obtained, in this way, the irradiation dose of the concerned component can be accurately predicted by combining the ray intensity distribution of the ray source and the actual situation of the concerned component, the accuracy of the irradiation dose prediction is improved, and the irradiation dose error is reduced.

Description

Technical Field

[0001] The present invention relates to the field of imaging detection technology, and in particular to a method for predicting element irradiation dose, an imaging system, and a storage medium. Background Technology

[0002] In the field of industrial nondestructive testing, in detection and imaging systems that include X-ray sources and detectors, in order to meet the different irradiation dose requirements of different components, it is necessary to have the ability to accurately predict the required irradiation dose of each component, so as to emit rays of corresponding energy through the X-ray source.

[0003] In related technologies, the radiation dose of an element is predicted by calculating the radiation angle of the radiation source and the relative position of the radiation source and the element of interest. The radiation intensity (radiation dose) at the element is only related to the distance between the element and the radiation source. This does not match the actual radiation intensity distribution of the radiation source, and the predicted radiation dose has a large error and cannot be accurately predicted. Summary of the Invention

[0004] In view of this, one objective of the present invention is to provide a method for predicting element irradiation dose, an imaging system, and a storage medium to improve the situation where the prediction error of irradiation dose is large in the related art.

[0005] To address the aforementioned technical problems, the embodiments of the present invention provide the following technical solutions:

[0006] In a first aspect, embodiments of the present invention provide a method for predicting element irradiation dose, applied to an imaging system, the imaging system including a radiation source and a detector, the method comprising:

[0007] The intensity distribution of the radiation source is collected by a detector;

[0008] Measure the element of interest to obtain the measured dose;

[0009] The measured dose is fitted to the radiation intensity distribution to map the radiation intensity distribution to the radiation intensity dose distribution;

[0010] The relative position change path of the element of interest is mapped to the path of the detector height layer, and the radiation dose at standard height and standard current is obtained based on this path and the radiation intensity dose distribution.

[0011] The radiation dose is adjusted based on the actual situation of the element of interest to obtain the predicted radiation dose of the element of interest.

[0012] In some embodiments, the acquisition of the radiation intensity distribution of the radiation source by the detector includes:

[0013] The radiation range of the radiation source is divided into several blocks according to the detector size;

[0014] Control the detector to move to the corresponding block, and collect the X-ray intensity grayscale image for each block;

[0015] By stitching together the grayscale images of the radiation intensity, the radiation intensity distribution of the radiation source is obtained, which is presented in grayscale.

[0016] In some embodiments, the stages in which the radiation source generates an irradiation dose after being energized include a boosting stage and a stabilization stage, and the measurement of the element of interest to obtain the measured dose includes:

[0017] The radiation source is energized, and the radiation dose of the element of interest is obtained under the same radiation intensity and different irradiation time. The radiation dose includes the boost dose during the boost phase and the stable dose during the steady phase.

[0018] The irradiated dose is fitted based on the irradiation time to obtain the measured dose of the element of interest.

[0019] In some embodiments, fitting the measured dose to the radiation intensity distribution to map the radiation intensity distribution to a radiation intensity dose distribution includes:

[0020] Under the same radiation intensity, multiple sets of measured doses with different irradiation times were obtained through testing;

[0021] The measured dose is fitted to the radiation intensity distribution based on the irradiation time, so as to map the radiation intensity distribution to the radiation intensity dose distribution.

[0022] In some embodiments, mapping the relative position change path of the element of interest to the path of the detector height layer, and obtaining the radiation dose at standard height and standard current based on this path and the radiation intensity dose distribution, includes:

[0023] The radiation range of the radiation source is divided into several blocks according to the detector size. Different blocks are located at different relative positions in the detector height layer. The detector height layer is the relative height layer between the detector and the radiation source in the vertical direction.

[0024] The relative positional change path between the detector and the element of interest in a single image is mapped onto a coordinate system with the detector as the origin to obtain the reference path at the detector's height level.

[0025] By performing discrete integration on the reference path based on the radiation intensity dose distribution corresponding to a single image, the radiation dose under standard height and standard current in a single image is obtained.

[0026] In some embodiments, the actual situation of the element of concern includes the current height of the element of concern, and the step of correcting the radiation dose based on the actual situation of the element of concern to obtain the predicted radiation dose of the element of concern includes:

[0027] The first height coefficient, the second height coefficient, and the third height coefficient were fitted using grayscale testing.

[0028] The radiation dose is corrected based on the first altitude coefficient, the second altitude coefficient, and the third altitude coefficient to obtain the predicted radiation dose of the element of interest at the current altitude.

[0029] In some embodiments, the actual situation of the element of concern further includes the current current, and the step of correcting the radiation dose based on the actual situation of the element of concern to obtain the predicted radiation dose of the element of concern includes:

[0030] Obtain the current of the element of interest and the radiation dose of the element of interest at the standard current;

[0031] The radiation dose is corrected based on the current, standard current, and standard current dose under standard current to obtain the predicted radiation dose of the element of interest.

[0032] In some embodiments, the actual situation of the element of concern further includes circuit board attenuation, and the step of correcting the radiation dose based on the actual situation of the element of concern to obtain the predicted radiation dose of the element of concern includes:

[0033] When the element of interest is on the side facing away from the radiation source, the first attenuation coefficient and the second attenuation coefficient are obtained by fitting the measured dose data.

[0034] The radiation dose is corrected based on the original radiation dose, the first attenuation coefficient, the second attenuation coefficient, and the circuit board thickness to obtain the predicted radiation dose of the component of interest.

[0035] In a second aspect, embodiments of the present invention provide an imaging system, comprising:

[0036] A controller and a radiation source and a detector communicatively connected to the controller, wherein the radiation source is used to emit radiation and the detector is used to capture projected images;

[0037] The controller includes:

[0038] A processor and a memory communicatively connected to the processor;

[0039] The memory stores computer program instructions executable by the processor, which, when executed by the processor, cause the controller to perform any of the element irradiation dose prediction methods proposed in the first aspect.

[0040] In a third aspect, embodiments of the present invention provide a computer-readable storage medium storing processor-executable computer program instructions, which, when executed by a processor, cause the computer to perform any of the element irradiation dose prediction methods proposed in the first aspect.

[0041] The embodiments of the present invention have the following beneficial effects: Unlike related technologies, the element irradiation dose prediction method provided by the embodiments of the present invention is applied to an imaging system, which includes a radiation source and a detector. The method includes: acquiring the radiation intensity distribution of the radiation source through the detector; measuring the element of interest to obtain the measured dose; fitting the measured dose with the radiation intensity distribution to map the radiation intensity distribution to a radiation intensity dose distribution; mapping the relative position change path of the element of interest to the path of the detector height layer; obtaining the irradiation dose at standard height and standard current based on the path and the radiation intensity dose distribution; and correcting the irradiation dose according to the actual situation of the element of interest to obtain the predicted irradiation dose of the element of interest.

[0042] This invention obtains the measured dose of the element of interest under radiation source irradiation by acquiring the radiation source intensity distribution and the measured dose, thereby obtaining the radiation intensity dose distribution. Based on the path of the radiation intensity dose distribution and the relative position change path of the element of interest to the detector height layer, the radiation dose of the element of interest under standard height and standard current is obtained. Finally, the radiation dose is corrected according to the actual situation of the element of interest to obtain the predicted radiation dose of the element of interest. In this way, the radiation dose of the element of interest can be accurately predicted by combining the radiation source intensity distribution and the actual situation of the element of interest, thereby improving the accuracy of radiation dose prediction and reducing radiation dose error. Attached Figure Description

[0043] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the accompanying drawings used in the description of the prior art or embodiments will be briefly introduced below. Obviously, the drawings described below only show some embodiments of the present invention and should not be considered as limiting the scope of protection. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0044] Figure 1a This is a schematic diagram illustrating an application scenario of the element irradiation dose prediction method in some embodiments of the present invention;

[0045] Figure 1b This is a schematic diagram illustrating the application scenario of the element irradiation dose prediction method in some embodiments of the present invention. Figure 2 ;

[0046] Figure 1cThis is a schematic diagram illustrating the application scenario of the element irradiation dose prediction method in some embodiments of the present invention. Figure 3 ;

[0047] Figure 2 These are schematic diagrams of the imaging system provided in some embodiments of the present invention;

[0048] Figure 3 This is a schematic diagram of the structure of the controller in an imaging system provided in some embodiments of the present invention;

[0049] Figure 4 This is a schematic flowchart of an element irradiation dose prediction method provided in some embodiments of the present invention;

[0050] Figure 5 This is a schematic diagram of the radiation dose data of the circuit board test in some embodiments of the present invention. Detailed Implementation

[0051] To make the objectives and advantages of the embodiments of the present invention more readily understood, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. The detailed description of the embodiments of the present invention in the accompanying drawings is not intended to limit the scope of protection claimed by the present invention, but only to illustrate selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0052] It should be noted that, unless there is a conflict, the various technical features involved in the embodiments of the present invention described below can be combined with each other, and all are within the protection scope of the present invention. Furthermore, although functional modules are divided in the device or structural schematic diagram and a logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than the module division in the device or the order in the flowchart. In addition, the terms "first," "second," "third," and other similar expressions used herein do not limit the data or execution order, but are only for illustrative purposes and to distinguish identical or similar items with substantially the same function and effect, and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features.

[0053] Unless otherwise defined, the technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the invention. It should be understood that the term "and / or" as used herein includes any and all combinations of one or more of the listed items.

[0054] In the field of industrial non-destructive testing, X-rays are used in specific scenarios when inspecting components. During the inspection and imaging process, which includes X-ray sources and detectors, some components, such as memory chips, are sensitive to X-ray doses. In order to ensure the safety of the components and meet the different irradiation dose requirements of different components, it is necessary to have the ability to accurately predict the required irradiation dose of each component, so as to emit rays of corresponding energy through the X-ray source.

[0055] In related technologies, the radiation dose of an element is predicted by calculating the radiation angle of the radiation source and the relative position of the radiation source and the element of interest. The radiation intensity (radiation dose) at the element is only related to the distance between the element and the radiation source, which does not match the actual radiation intensity distribution of the radiation source. The radiation dose predicted by this method has a large error and cannot accurately predict the radiation dose of the element.

[0056] The component irradiation dose prediction method provided in this invention obtains the measured dose of the component of interest under radiation source irradiation, fits the radiation intensity distribution of the radiation source with the measured dose to obtain the radiation intensity dose distribution, and maps the radiation intensity dose distribution and the relative position change path of the component of interest to the detector height layer to obtain the radiation dose of the component of interest at standard height and standard current. Finally, the radiation dose is corrected according to the actual situation of the component of interest to obtain the predicted radiation dose of the component of interest. In this way, the radiation intensity distribution of the radiation source and the actual situation of the component of interest can be combined to accurately predict the radiation dose of the component of interest, improve the accuracy of radiation dose prediction, reduce radiation dose error, and at the same time, allow radiation dose sensitive customers to detect the radiation dose of the component in real time when making programs, avoiding the need to re-measure every time the detection parameters are adjusted.

[0057] Please see Figures 1a to 1c , Figures 1a to 1c The illustration shows a schematic diagram of an application scenario for the element irradiation dose prediction method provided in an embodiment of the present invention.

[0058] like Figure 1a As shown, this application scenario includes an imaging system 100, which includes a controller ( Figure 1a (Not shown in the image) and a radiation source 120 and a detector 130 that are respectively connected to the controller for communication. The radiation source 120 is used to emit radiation, the detector 130 is used to capture projected images, and the controller is used to control the radiation source 120 and the detector 130 to work together to complete the prediction of the element irradiation dose.

[0059] For example, in this embodiment of the invention, the detector 130 is used to collect the radiation intensity distribution of the radiation source 120, that is, the radiation source 120 is controlled to emit radiation, the detector 130 takes and collects multiple grayscale images, obtains the grayscale value of the pixel in each grayscale image, calculates the average grayscale value of the pixel at the corresponding position in all grayscale images, and uses the grayscale values ​​of the pixel at all positions as the radiation intensity distribution of the radiation source 120.

[0060] In some embodiments, the radiation range of the radiation source 120 is divided into several blocks, for example... Figure 1a The sections A1 to A4 shown are irradiated by radiation source 120 (e.g., ...). Figure 1a The radiation (in red) is emitted to each block. The detector 130 takes multiple grayscale images of each block and calculates the average grayscale value of the corresponding pixels in the multiple grayscale images to obtain the radiation intensity grayscale image of each block. The radiation intensity grayscale images of all blocks are stitched together to obtain the radiation intensity distribution of the radiation source 120.

[0061] Please see Figure 1b In this embodiment of the invention, the radiation source 120 is controlled to emit radiation in real time and move along a preset moving path SL to measure the actual dose received by the element of interest 200. Clearly, the preset moving path SL is a circular path moving clockwise in the direction N. The radiation source 120 moves clockwise in the direction N along the preset moving path SL to measure the actual radiation dose received by the element of interest 200, thus obtaining the measured dose of the element of interest 200. It should be noted that since each customer sets a safe dose for their own element before testing, such as 3 rad, in order to ensure that the dose for the corresponding element of different customers is safe, the measured dose will be appropriately increased in this step. That is, a safe value is added to the measured dose as a new measured dose. The safe value is an empirical value; for example, if the safe value is set to 50, the measured dose is increased by 50 as the new measured dose.

[0062] For example, the measured dose of the element of interest 200 is fitted with the radiation intensity distribution of the radiation source 120 to obtain the mapping relationship between the radiation intensity distribution and the irradiated dose, that is, the radiation intensity distribution of the radiation source 120 is mapped to the radiation intensity dose distribution.

[0063] Please see Figure 1cIn this embodiment of the invention, the relative position change path L1 of the element of interest 200 is mapped to the path L2 of the detector height layer. Based on this path L2 and the radiation intensity dose distribution of the radiation source 120, the radiation dose of the element of interest 200 at standard height and standard current is obtained. It should be understood that the relative position change path refers to the movement path of the radiation source 120 as captured by the detector 130 when the radiation source 120 measures the element of interest 200 to obtain the measured dose. The relative position change path is used to represent the change path of the detector 130 relative to the element of interest 200. It should be understood that path L2 is the path formed by transforming the relative position change path L1 to the detector height layer (or the plane where the detector 130 is located).

[0064] Finally, based on the actual situation of the element of interest 200 (such as the voltage value of the radiation source 120 and the current height and current of the element of interest 200), the radiation dose (that is, the radiation dose of the element of interest 200 at the standard height and standard current) is corrected to obtain the predicted radiation dose of the element of interest 200.

[0065] It should be understood that, Figures 1a to 1c The illustrated application scenario is merely an illustrative representation of one instance in which the imaging system 100 predicts the radiation dose of the element of interest 200 in some embodiments of the present invention, and does not limit the structure, type, or number of imaging systems in other application scenarios or embodiments. For example, in other application scenarios or embodiments, the imaging system may also include more than Figures 1a to 1c The structure shown has more or fewer components, or has the same... Figures 1a to 1c The structures shown have different configurations.

[0066] To facilitate understanding of the element irradiation dose prediction method provided in the embodiments of the present invention, the imaging system provided in the embodiments of the present invention will first be described in detail.

[0067] Please see Figure 2 , Figure 2 A schematic diagram of the imaging system in some embodiments of the present invention is shown.

[0068] like Figure 2 As shown, the imaging system 100 includes a controller 110 and a radiation source 120 and a detector 130 that are respectively connected to the controller 110 in communication. The radiation source 120 is used to emit radiation, the detector 130 is used to capture projected images, and the controller 110 is used to control the radiation source 120 and the detector 130 to work together to complete the prediction of the radiation dose to the element.

[0069] It is worth noting that the radiation source 120 and detector 130 can be placed in any suitable location, as long as they are suitable for emitting radiation to the element of interest and for capturing projected images. The radiation source 120 and detector 130 can be any suitable type of device, equipment, or other component.

[0070] Please see Figure 3 , Figure 3 The schematic diagram illustrates the structure of the controller in the imaging system provided by some embodiments of the present invention.

[0071] See Figure 3 As shown, the controller 110 includes at least one processor 111 and a memory 112 that are communicatively connected. Figure 3 Taking a bus system 113 and a processor 111 as an example, the various components in the controller 110 are coupled together through the bus system 113, which is used to realize the connection and communication between the various components. It is easy to understand that the bus system 113 may include, in addition to the data bus, a power bus, a control bus, and a status signal bus, etc. However, for the sake of clarity and brevity, in... Figure 3 The general labels all buses as Bus System 113. Understandably, Figure 3 The structures shown in the embodiments are merely illustrative and do not limit the structure of the controller described above. For example, the controller may also include components that are more... Figure 3 The structure shown has more or fewer components, or has the same as Figure 3 The diagram shows different configurations of the structure.

[0072] The processor 111 provides computational and control capabilities to support the controller 110 in executing corresponding business logic and functions. For example, it supports the controller 110 in executing any of the element irradiation dose prediction methods provided in this embodiment of the invention, or in executing the steps of any possible implementation of any of the element irradiation dose prediction methods provided in this embodiment of the invention. Those skilled in the art will understand that the processor 111 can be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it can also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.

[0073] The memory 112, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs, non-transitory computer-executable programs, instructions, and modules, such as the program, instructions, and modules corresponding to the element irradiation dose prediction method in the embodiments of the present invention. In some embodiments, the memory 112 may include a program storage area and a data storage area. The program storage area may store the operating system and application programs required for at least one function, and the data storage area may store data created according to the use of the processor 111. The processor 111 executes various functional applications and data processing of the controller 110 by running the non-transitory software programs, instructions, and modules stored in the memory 112, thereby implementing any element irradiation dose prediction method provided in the embodiments of the present invention, or executing the steps in any possible implementation of any element irradiation dose prediction method provided in the embodiments of the present invention. In some embodiments, the memory 112 may include high-speed random access memory and may also include non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device. In some embodiments, the memory 112 may also include memory remotely located relative to the processor 111, and these remotely located memories may be connected to the processor 111 through a communication network. It is understood that examples of the aforementioned communication networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0074] As can be understood from the above, the implementing entity of any element irradiation dose prediction method provided in the embodiments of the present invention can be any suitable type of controller with certain calculation and control capabilities, such as the controller 110 of the imaging system 100 described above. In some feasible implementations, any element irradiation dose prediction method provided in the embodiments of the present invention can be implemented by a processor executing computer program instructions stored in memory.

[0075] The following will describe in detail the element irradiation dose prediction method provided by the embodiments of the present invention, with reference to exemplary applications and implementations of the imaging system provided in the embodiments of the present invention.

[0076] Please see Figure 4 , Figure 4 The schematic diagram illustrates a flowchart of an element irradiation dose prediction method provided in some embodiments of the present invention.

[0077] Understandably, the component irradiation dose prediction method provided in this embodiment of the invention can be applied to the aforementioned controller (e.g., the controller 110 of the imaging system 100). Specifically, the controller of the imaging system is the executing entity of the component irradiation dose prediction method.

[0078] For example, such as Figure 4As shown, the element irradiation dose prediction method provided in this embodiment of the invention includes, but is not limited to, the following steps S41-S45:

[0079] S41: The intensity distribution of the radiation source is collected by a detector.

[0080] In this embodiment of the invention, the rays emitted by the radiation source (e.g., an X-ray tube) pass through the air or part of the structure and reach the detector surface. The photosensitive units of the detector (e.g., a scintillator + photodiode array, a flat panel detector, or a CMOS sensor array) respond to the radiation energy. Each photosensitive unit converts the received radiation energy into an electrical signal (e.g., a voltage signal or a current signal), which is then processed by a readout circuit to form a digital signal. After processing, the digital signal forms a two-dimensional image, where each pixel value corresponds to the radiation intensity at that location, thus obtaining the radiation intensity distribution of the radiation source on the detector plane.

[0081] It's easy to understand that different acquisition methods can be used depending on the type of imaging system. For example, for CT equipment and digital X-ray inspection systems, static irradiation acquisition is used. Without obstruction from the measured component or other objects, the X-ray source directly irradiates the detector, and the projected image acquired by the detector is the X-ray intensity distribution. It should be understood that when the X-ray beam emitted by the source is conical or fan-shaped, the detector acquires a complete two-dimensional X-ray intensity map. As another example, for industrial CT and X-ray linear array scanning systems, scanning acquisition can be used. The X-ray source or detector is moved on the scanning transmission mechanism, acquiring X-ray intensity data multiple times at different angles / directions or positions (including height and horizontal positions). The X-ray intensity data from each position are then stitched together or reconstructed to obtain a two-dimensional or three-dimensional X-ray intensity distribution.

[0082] Understandably, acquiring the radiation intensity distribution of a radiation source through a detector is essentially to determine the energy distribution of the radiation emitted by the source in various directions or at various pixel locations in space. The radiation intensity distribution is represented by one or more two-dimensional radiation intensity grayscale images, reflecting the output uniformity and energy distribution characteristics or patterns of the radiation source. It should be understood that, in this embodiment of the invention, various different voltages and currents are applied to the radiation source, and the radiation intensity distribution of the radiation source under different voltages and currents is acquired to provide basic reference data for subsequent dose calculation.

[0083] S42: Measure the element of interest to obtain the measured dose.

[0084] In this embodiment, depending on the accuracy requirements and the size of the element of interest, the measured dose of the element of interest can be obtained by the following three methods.

[0085] 1) Direct measurement with a dosimeter: Place a dosimeter on the surface of the element of interest or its equivalent position and record its response value during irradiation. Dosimeter types include, but are not limited to, thermoluminescent dosimeters (TLDs), photoluminescent dosimeters (OSLDs), ionization chamber dosimeters, and semiconductor dosimeters (such as Si detectors). This method is suitable for high-precision calibration or irradiation testing of small-volume elements.

[0086] 2) Radiation-sensitive film or imaging plate measurement: A layer of radiation-sensitive film or imaging plate is laid at the irradiation location of the element of interest. The radiation dose of the radiation source is indirectly reflected by the grayscale change after exposure. The film (e.g., Gafchromic Film) or imaging plate will produce color changes in the irradiated area. By scanning and analyzing the correspondence between grayscale and dose, a dose distribution map can be obtained. This method is suitable for two-dimensional dose distribution measurement and uniformity verification.

[0087] 3) Detection array or embedded sensing method: When the element of interest is complex (e.g., module or chip array), multiple miniature sensors (such as PIN diodes or small TLD arrays) can be embedded in key locations to synchronously collect the irradiation response. This method can measure the spatial dose distribution information of each part of the element of interest.

[0088] In this embodiment of the invention, the element of interest is positioned at a standard height (e.g., 15). To obtain the actual radiation dose received by the element of interest under known radiation conditions (including current, voltage, distance, and radiation time), the dosimeter or sensor is placed on the surface of the element of interest or its equivalent height plane. Different voltages and currents are used to drive the radiation source to work so that the radiation irradiates the element of interest. The irradiation time, radiation parameters (including current, voltage, distance, and irradiation time) and spatial orientation of the element of interest are recorded.

[0089] S43: Fit the measured dose to the radiation intensity distribution to map the radiation intensity distribution to the radiation intensity dose distribution.

[0090] The detector output is either intensity or count (which can be recorded as pixel value). The irradiated dose is the actual energy density absorbed by the substance being tested. The purpose of fitting is to calculate a value from... arrive function such that any point satisfies .

[0091] Specifically, the measured dose and radiation intensity distribution are first preprocessed by subtracting the detector dark current / dark field image from the radiation intensity distribution, and using a flat field image to correct pixel response differences. The radiation source current, voltage, and exposure time are then recorded and normalized. (Converting to the response per unit time and unit current), the dosimeter measurement points are spatially aligned with the pixels of the projected image, and the detector projection image is downsampled or locally averaged accordingly to match the irradiated dose with the resolution of the projected image, thus obtaining the processed measured dose and radiation intensity distribution data.

[0092] In this step, the embodiments of the present invention establish a mapping model based on the preprocessed measured dose and radiation intensity distribution data. Different mapping models are used to characterize the correspondence between the measured dose and radiation intensity distribution for different actual situations; for example, a linear mapping model is used. The linear mapping model is suitable for scenarios with single energy, near-linear detector count and dose response, and minimal influence from scattering and the spectrum. Data points with broad coverage from measured dose and radiation intensity distribution data (e.g., different...) are selected. By considering different values, geometric locations, and energy spectrum conditions, an uncertainty estimate (i.e., mean and standard deviation) is established. Then, a suitable fitting algorithm (such as ordinary least squares (OLS), weighted least squares (WLS), machine learning regression, etc.) is used to fit the selected data points to obtain a well-fitted mapping model, thereby mapping the radiation intensity distribution to the radiation intensity dose distribution.

[0093] S44: Map the path of the relative position change of the element of interest to the path of the detector height layer, and obtain the radiation dose at standard height and standard current based on the path and the radiation intensity dose distribution.

[0094] For example, for any point on the path of relative position change, based on the positional relationship between the X-ray source and the detector (including pose, distance, etc.), the projection point corresponding to it on the detector plane (i.e., the detector height layer) is obtained. X-ray intensity / dose distribution is sampled on the detector, and the sampled values ​​are normalized / converted to values ​​under standard height and standard current. The dose mapping obtained on the detector represents the dose response at the detector position or standard height. The absorbed dose of the element of interest at its own position needs to be calculated. As the element of interest moves along the path over time, the cumulative dose is the time integral (or path integral). The dose is weighted and summed according to the corresponding pixel on the detector (the weight is the time or percentage spent at that pixel). Thus, the irradiated dose of the element of interest in a single exposure under standard height and standard current is calculated. The standard height refers to the distance between the element of interest and the detector, which is a preset resolution height, such as 15. Standard current refers to the current applied to the component of interest; it is a preset current value, such as 100. .

[0095] S45: Adjust the radiation dose based on the actual situation of the element of interest to obtain the predicted radiation dose of the element of interest.

[0096] In this embodiment of the invention, corresponding correction parameters are calculated based on actual conditions such as the exposure time of the element of interest, the voltage applied by the radiation source, the current applied by the radiation source, the positional relationship between the radiation source and the element of interest, the position of the circuit board where the element is located, and the material and thickness of the circuit board. The radiation dose of the element of interest is corrected according to the correction parameters, and finally the predicted radiation dose of the element of interest is obtained.

[0097] This invention obtains the measured dose of the element of interest under radiation source irradiation by acquiring the radiation intensity distribution of the radiation source and the measured dose, thereby obtaining the radiation intensity dose distribution. Based on the path of the radiation intensity dose distribution and the relative position change path of the element of interest to the detector height layer, the radiation dose of the element of interest under standard height and standard current is obtained. Finally, the radiation dose is corrected according to the actual situation of the element of interest to obtain the predicted radiation dose of the element of interest. In this way, the radiation intensity distribution of the radiation source and the actual situation of the element of interest can be combined to accurately predict the radiation dose of the element of interest, thereby improving the accuracy of radiation dose prediction and reducing radiation dose error.

[0098] In some embodiments, the radiation intensity distribution of the radiation source is acquired by a detector, specifically including but not limited to the following steps S411-S413:

[0099] S411: Divide the radiation source range into several blocks according to the detector size.

[0100] S412: Control the detector to move to the corresponding block and collect the ray intensity grayscale image for each block.

[0101] S413: The grayscale images of radiation intensity are stitched together to obtain the radiation intensity distribution of the radiation source.

[0102] In this embodiment, the ray intensity distribution is a grayscale distribution, that is, the grayscale value of the pixel in the grayscale image is used to represent the ray intensity distribution.

[0103] For example, please refer to Figure 1a The detector size is Figure 1a The elliptical blue area represents the radiation source's range, which covers the detector's size range. The radiation source's range is divided into several blocks according to the detector's size, for example... Figure 1aThe diagram shows four blocks, A1 to A4. In this embodiment of the invention, the detector is moved to the corresponding block, and the X-ray source is controlled to emit X-rays to each block. The detector captures multiple projection images / grayscale images of each block. Based on the multiple projection images / grayscale images, the X-ray intensity grayscale image corresponding to each block is calculated. The X-ray intensity grayscale images corresponding to all blocks are stitched together to obtain the X-ray intensity distribution of the X-ray source within the detector size range.

[0104] In some embodiments, the measured dose of the element of interest is obtained by measurement, including but not limited to the following steps S421-S422:

[0105] S421: Power on the radiation source and obtain the radiation dose of the element of interest under the same radiation intensity but different irradiation times.

[0106] S422: Fit the irradiated dose according to the irradiation time to obtain the measured dose of the element of interest.

[0107] In this embodiment, the stages in which the radiation source generates radiation dose after being powered on include a voltage ramp-up stage and a stabilization stage. The radiation dose generated by the radiation source during the voltage ramp-up stage is the voltage ramp-up dose, and the radiation dose generated by the radiation source during the stabilization stage is the stabilization dose. The voltage ramp-up stage refers to the process from when the radiation source starts working and ramps up its voltage until it reaches a stable operating voltage.

[0108] It is understandable that a radiation source needs a certain amount of time to increase its pressure before reaching stable operation, during which a radiation dose is generated. When measuring the actual dose of the element of interest, since a single dose measurement cannot exclude the radiation source's pressure increase process, it is necessary to measure the radiation dose at the same radiation intensity for multiple irradiation times and perform a linear fit between the irradiation time and the radiation dose. Since the pressure increase dose is the same for the same radiation intensity, the dose effect caused by the radiation source's pressure increase (i.e., the pressure increase dose) can be calculated through the above linear fit. The dose fitted to the radiation intensity distribution (i.e., the measured dose) is the measured radiation dose minus the pressure increase dose.

[0109] For example, after the radiation source is powered on, the radiation dose of the element of interest is obtained under the same radiation intensity but different irradiation times. The radiation dose includes the boost dose during the boosting phase and the stable dose during the stabilization phase. A reference function relationship is obtained by linearly fitting the radiation dose to the irradiation time. This reference function relationship characterizes the boost dose, irradiation time, and measured dose. After obtaining the reference function relationship, the measured dose of the corresponding element of interest can be calculated based on different irradiation times; that is, the measured dose of the element of interest is calculated by substituting the irradiation time into the reference function relationship.

[0110] In some embodiments, the measured dose is fitted to the radiation intensity distribution to map the radiation intensity distribution to a radiation intensity dose distribution, specifically including but not limited to the following steps S431-S432:

[0111] S431: Under the same radiation intensity, multiple sets of measured doses with different irradiation times were obtained through testing.

[0112] S432: Fit the measured dose to the radiation intensity distribution based on the irradiation time, so as to map the radiation intensity distribution to the radiation intensity dose distribution.

[0113] For example, a test dose patch is placed on the element of interest, and test conditions are set (such as the voltage of the radiation source, the current of the element of interest, and the irradiation time). The test dose patch is tested under test conditions with the same radiation intensity but different irradiation times, and test data of the test dose patch (including the measured dose (i.e., the dose received by the center of the element of interest in a single image)) is collected. Based on the measured doses of multiple sets of different irradiation times under the same radiation intensity, the measured dose is fitted to the radiation intensity distribution according to the irradiation time to obtain the mapping relationship between the radiation intensity distribution (i.e., the pixel grayscale values ​​in the radiation intensity grayscale image) and the radiation intensity dose distribution (the measured dose of the element of interest). Any suitable model, such as a linear or nonlinear model, can be used to fit the mapping relationship between the radiation intensity distribution and the radiation intensity dose distribution according to actual needs; this embodiment of the invention does not impose any limitations on this.

[0114] In some exemplary embodiments, the path of the relative position change of the element of interest is mapped to the path of the detector height layer. Based on this path and the radiation intensity dose distribution, the radiation dose at standard height and standard current is obtained, specifically including but not limited to the following steps S441-S443:

[0115] S441: Divide the radiation source range into several blocks according to the detector size.

[0116] S442: Map the relative positional change path between the detector and the element of interest during a single image capture onto a coordinate system with the detector as the origin to obtain the reference path at the detector's altitude layer.

[0117] S443: Based on the radiation intensity dose distribution corresponding to a single image, the reference path is discretely integrated to obtain the radiation dose at standard height and standard current in a single image.

[0118] For example, please refer to Figure 1a The detector size is Figure 1aThe elliptical blue area represents the radiation source's radiation range, which covers the detector's size range. The radiation source's radiation range is divided into several blocks according to the detector's size. These different blocks occupy different relative positions within the detector's height layer, which is the vertical height level between the detector and the radiation source. For example, the radiation source's radiation range is divided into... Figure 1a The four blocks shown are block A1, block A2, block A3, and block A4, and they are located at different relative positions in the detector's height layer.

[0119] Specifically, a target coordinate system is established with the center of the plane where the detector is located as the origin (i.e., a coordinate system with the detector as the origin). Each path point in the relative position change path is mapped to the target coordinate system, resulting in multiple target pixels. These multiple target pixels constitute the reference path of the relative position change path at the detector's height level. For example, please refer to... Figure 1c After mapping the relative position change path L1 between the detector and the element of interest in a single image to the target coordinate system, the reference path L2 is obtained. The reference path L2 is the path of the relative position change path at the detector's height layer.

[0120] In this embodiment of the invention, after mapping the relative position change path to a reference path, the corresponding irradiation conditions (including voltage and current of the radiation source) for a single shot are obtained. The corresponding radiation intensity dose distribution is determined according to the irradiation conditions. The irradiation dose corresponding to each pixel in the reference path is added to the radiation intensity dose distribution (i.e., the reference path is discretely integrated based on the radiation intensity dose distribution corresponding to a single shot). Finally, the irradiation dose of the element of interest under standard height and standard current in a single shot is obtained.

[0121] For example, by using the radiation intensity dose distribution corresponding to a single shot to discretely integrate the reference path L2, that is, to calculate the sum of the radiation doses corresponding to each pixel in the reference path L2, the radiation dose of the element of interest under standard height and standard current in a single shot can be obtained.

[0122] In some embodiments, the radiation dose is corrected according to the actual situation of the element of interest to obtain the predicted radiation dose of the element of interest, specifically including but not limited to the following steps S451-S452:

[0123] S451: Fit the first height coefficient, second height coefficient and third height coefficient through grayscale testing.

[0124] Specifically, the detector is controlled at different resolution heights (including 6 / 8 / 10 / 15 / 20 / 25 / 30). The same element of interest is captured under different conditions. The sum of the gray values ​​of the pixels within the range of the element of interest is calculated as the dose magnitude at the current resolution height. A model representing the correspondence between resolution height and dose is established. The parameters of the model are fitted based on the dose data of all resolution heights to obtain the final model.

[0125] It is understood that the radiation intensity (i.e., the radiation dose) is approximately inversely proportional to the square of the height (i.e., the distance between the element of interest and the detector). In this embodiment of the invention, the model is represented by the following formula: ,in, To monitor the predicted radiation dose of the component, This refers to the standard height dose, which is the radiation dose received by the element of interest at a standard height. , , These are the first height coefficient, the second height coefficient, and the third height coefficient, respectively. To focus on the current height of the element (i.e., the distance between the element and the detector), which is the distance between the element and the detector at the current moment.

[0126] S452: The radiation dose is corrected based on the first altitude coefficient, the second altitude coefficient and the third altitude coefficient to obtain the predicted radiation dose of the element of interest at the current altitude.

[0127] In this embodiment, the actual situation of the element of interest includes its current height. After fitting the model parameters (i.e., the first height coefficient, the second height coefficient, and the third height coefficient), the current height of the element of interest is substituted into the model, and the radiation dose is corrected by the model calculation to obtain the predicted radiation dose of the element of interest.

[0128] In some embodiments, the radiation dose is corrected according to the actual situation of the element of interest to obtain the predicted radiation dose of the element of interest, specifically including but not limited to the following steps S453-S454:

[0129] S453: Obtain the current of the element of interest and the radiation dose of the element of interest at the standard current.

[0130] S454: Based on the current current, standard current, and standard current dose under standard current, the irradiation dose is corrected to obtain the predicted irradiation dose of the element of interest.

[0131] In this embodiment, the actual situation of the element of interest also includes the current current of the element of interest, which refers to the current applied to the element of interest at the current moment. It is understood that the radiation intensity (i.e., the radiation dose) is linearly related to the magnitude of the radiation source current, as stated in this embodiment of the invention by the following formula: The radiation dose is corrected, among which, To monitor the predicted radiation dose of the component, Standard current dose, i.e., the radiation dose received by the component of interest under standard current. For the current, This is the standard current.

[0132] For example, in this embodiment of the invention, the current current of the element of interest is obtained by sampling with a current sensor disposed on the element of interest, and the radiation dose of the element of interest under a standard current is obtained by measuring with a dosimeter disposed on the element of interest. The current current, the standard current, and the standard current dose under the standard current are then substituted into the formula. The radiation dose is then calculated and corrected using a formula to obtain the predicted radiation dose of the element of interest.

[0133] In some embodiments, the radiation dose is corrected according to the actual situation of the element of interest to obtain the predicted radiation dose of the element of interest, specifically including but not limited to the following steps S455-S456:

[0134] S455: When the element of interest is on the side facing away from the radiation source, the first attenuation coefficient and the second attenuation coefficient are obtained by fitting the measured dose data.

[0135] S456: The radiation dose is corrected based on the original radiation dose, the first attenuation coefficient, the second attenuation coefficient, and the circuit board thickness to obtain the predicted radiation dose of the component of interest.

[0136] In this embodiment, the actual situation of the element of interest also includes circuit board attenuation. Circuit board attenuation refers to the attenuation of radiation after passing through the circuit board. The attenuation rate is related to the thickness and material of the circuit board. If the element of interest is located on the side of the circuit board facing away from the radiation source, a model is established to establish the correspondence between the dose before correction and the dose after correction. The first attenuation coefficient and the second attenuation coefficient of the model are obtained by fitting the measured dose data of the element of interest (i.e., the radiation dose of the element of interest before and after attenuation through the circuit board) to obtain the final model.

[0137] In this embodiment of the invention, the model is represented by the following formula: ,in, To determine the predicted radiation dose to the component of interest, i.e., the corrected radiation dose, The radiation dose before correction. It is a natural constant, and its value is approximately equal to , The first attenuation coefficient, This is the second attenuation coefficient. For the circuit board thickness. Specifically, obtain the circuit board thickness and substitute the circuit board thickness and the radiation dose received by the component of interest before correction into the formula. The radiation dose is then calculated and corrected using a formula to obtain the predicted radiation dose of the element of interest.

[0138] Understandably, when the element of interest is located on the side of the circuit board facing the radiation source, there is no need to consider the radiation dose prediction error caused by the circuit board attenuation factor. It is only necessary to correct the radiation dose based on the current height and current of the element of interest to obtain the predicted radiation dose of the element of interest.

[0139] For example, in some embodiments, the measured dose and predicted exposure dose of the element of interest are shown in Tables 1 and 2 below:

[0140] Table 1:

[0141]

[0142] Table 2:

[0143]

[0144] It is understandable that the data in Tables 1 and 2 are from tests conducted at different resolution heights, voltages, and currents at the center of the detector's field of view. Table 1 shows the dose at a resolution height of 6... 10 15 20 and 30 The voltage and current are 90KV and 200kV respectively. The test data, shown in Table 2, is for a resolution height of 6. 10 15 20 and 30 The voltage and current are 120KV and 100kV respectively. The test data were linearly fitted to test data under the same radiation intensity (i.e., the same test voltage) but different irradiation times (i.e., different numbers of projected images) to obtain the functional relationship between the boosted dose, irradiation time, and measured dose. The obtained intercept For the fitted booster dose, the coefficients are... To fit the stable dose per unit time, Given the irradiation time, the measured doses in Tables 1 and 2 are calculated based on this functional relationship. The dose used to fit the radiation intensity distribution (i.e., the measured dose) is the dose obtained by subtracting the boosting dose from the measured irradiated dose.

[0145] Please see Figure 5 The test used a blank circuit board 300 with a thickness of 2mm to measure the radiation dose data at different locations. Location markings were affixed to the circuit board 300, such as... Figure 4 The test points are marked as 1 to 13, and their locations are as follows: Figure 4 The green square frame is shown. After attaching the dose strip to the corresponding test point, flip the circuit board 300 along its short side so that the dose strip is located on the side of the circuit board 300 facing away from the radiation source. The detector's field of view center is position 1, and the resolution height is selected as 6. 10 20 Each resolution height uses 120KV voltage and 200 The current was tested, and 4 to 6 test points were selected for each resolution height. The test data are shown in Tables 3 to 5 below:

[0146] Table 3:

[0147]

[0148] Table 4:

[0149]

[0150] Table 5:

[0151]

[0152] Among them, the test dose data of the element of interest shown in Tables 3 to 5 (i.e., the radiation dose of the element of interest after the circuit board attenuation) can be combined with the radiation dose of the element of interest before the circuit board attenuation to fit the first attenuation coefficient and the second attenuation coefficient, so as to obtain the final model used to characterize the correspondence between the dose before correction and the dose after correction.

[0153] In summary, the embodiments of the present invention obtain the measured dose of the element of interest under the irradiation of the radiation source, fit the irradiation intensity distribution of the radiation source with the measured dose to obtain the radiation intensity dose distribution, and map the radiation intensity dose distribution and the relative position change path of the element of interest to the path of the detector height layer to obtain the irradiation dose of the element of interest at standard height and standard current. Finally, the irradiation dose is corrected according to the actual situation of the element of interest to obtain the predicted irradiation dose of the element of interest. In this way, the irradiation dose of the element of interest can be accurately predicted by combining the radiation intensity distribution of the radiation source and the actual situation of the element of interest, thereby improving the accuracy of irradiation dose prediction and reducing irradiation dose error.

[0154] This invention provides a computer-readable storage medium storing processor-executable computer program instructions. When executed by a processor, the computer program instructions cause the computer to perform the element irradiation dose prediction method provided in this invention, or to perform the steps in any possible implementation of the element irradiation dose prediction method provided in this invention.

[0155] In some embodiments, the storage medium may be a flash memory, a hard disk, an optical disk, a register, a magnetic surface memory, a removable disk, a CD-ROM, a random access memory (RAM), a read-only memory (ROM), an electrically programmable ROM, and an electrically erasable programmable ROM, or any other form of storage medium known in the art, or various devices including one or any combination of the above storage media.

[0156] In some embodiments, computer program instructions may take the form of programs, software, software modules, scripts, or code, written in any form of programming language (including compiled or interpreted languages, or declarative or procedural languages), and may be deployed in any form, including as stand-alone programs or as modules, components, subroutines, or other units suitable for use in a computing environment.

[0157] As an example, computer program instructions may, but do not necessarily, correspond to files in a file system, and may be stored as part of a file that holds other programs or data, for example, in one or more scripts in an HTML (Hypertext Markup Language) document, or in a single file dedicated to the program in question, or in multiple collaborative files (e.g., a file that stores one or more modules, subroutines, or code sections).

[0158] As an example, computer program instructions can be deployed to execute on a single computing device (including devices such as smart terminals and servers), or on multiple computing devices located in one location, or on multiple computing devices distributed across multiple locations and interconnected via a communication network. It is readily understood that all or part of the steps of the methods described in the embodiments of the present invention above can be implemented directly using electronic hardware or processor-executable computer program instructions, or a combination of both.

[0159] Those skilled in the art will understand that the embodiments provided by this invention are merely illustrative. The order in which the steps in the methods of the embodiments are written does not imply a strict execution order and does not constitute any limitation on the implementation process. The order can be adjusted, merged, and deleted according to actual needs. Modules or sub-modules, units or sub-units in the apparatus or system of the embodiments can be merged, divided, and deleted according to actual needs. For example, the division of units is only a logical functional division, and there may be other division methods in actual implementation. For another example, multiple units or components can be combined or integrated into another device, or some features can be ignored or not executed.

[0160] Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented using software plus a general-purpose hardware platform, and of course, it can also be implemented using hardware. Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. This computer program can be stored in a computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. It should be understood that the storage medium can be flash memory, hard disk, optical disk, register, magnetic surface memory, removable disk, CD-ROM, random access memory (RAM), read-only memory (ROM), electrically programmable ROM, and electrically erasable programmable ROM, etc.

[0161] It should be noted that the above embodiments are for illustrating the technical concept and features of the present invention, and are intended to enable those skilled in the art to understand the content of the present invention and implement it accordingly. They should not be construed as limiting the scope of protection of the present invention. Those skilled in the art can understand that all or part of the processes of the above embodiments can be implemented by modifying the technical solutions described in the embodiments of the present invention, or by making equivalent substitutions for some of the technical features. It is understood that these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention, and should be considered as equivalent changes and modifications made based on the embodiments of the present invention, all of which should fall within the scope of the claims of the present invention.

Claims

1. A method for predicting element irradiation dose, applied to an imaging system, characterized in that, The imaging system includes a radiation source and a detector, and the method includes: The intensity distribution of the radiation source is collected by a detector; Measure the element of interest to obtain the measured dose; The measured dose is fitted to the radiation intensity distribution to map the radiation intensity distribution to the radiation intensity dose distribution; The process involves mapping the relative position change path of the element of interest to the path of the detector height layer. Based on this path and the radiation intensity dose distribution, the radiation dose at standard height and standard current is obtained. This includes: dividing the radiation range of the radiation source into several blocks according to the detector size, with different blocks located at different relative positions within the detector height layer, where the detector height layer is the relative height level between the detector and the radiation source in the vertical direction; mapping the relative position change path of the detector and the element of interest in a single image to a coordinate system with the detector as the origin, obtaining a reference path at the detector height layer; and performing discrete integration on the reference path based on the radiation intensity dose distribution corresponding to a single image to obtain the radiation dose at standard height and standard current in a single image, where the standard height is the distance between the element of interest and the detector, and the standard current is the current applied to the element of interest. The radiation dose is adjusted based on the actual situation of the element of interest to obtain the predicted radiation dose of the element of interest.

2. The method according to claim 1, characterized in that, The acquisition of the radiation intensity distribution of the radiation source by the detector includes: The radiation range of the radiation source is divided into several blocks according to the detector size; Control the detector to move to the corresponding block, and collect the X-ray intensity grayscale image for each block; By stitching together the grayscale images of the radiation intensity, the radiation intensity distribution of the radiation source is obtained, which is presented in grayscale.

3. The method according to claim 1, characterized in that, The stages in which the radiation source generates an irradiation dose after being energized include a voltage boosting stage and a stabilization stage. The measurement of the element of interest to obtain the measured dose includes: The radiation source is energized, and the radiation dose of the element of interest is obtained under the same radiation intensity and different irradiation time. The radiation dose includes the boost dose during the boost phase and the stable dose during the steady phase. The irradiated dose is fitted based on the irradiation time to obtain the measured dose of the element of interest.

4. The method according to claim 3, characterized in that, The process of fitting the measured dose to the radiation intensity distribution to map the radiation intensity distribution to a radiation intensity dose distribution includes: Under the same radiation intensity, multiple sets of measured doses with different irradiation times were obtained through testing; The measured dose is fitted to the radiation intensity distribution based on the irradiation time, so as to map the radiation intensity distribution to the radiation intensity dose distribution.

5. The method according to claim 1, characterized in that, The actual situation of the element of concern includes the current height of the element of concern. The step of correcting the radiation dose based on the actual situation of the element of concern to obtain the predicted radiation dose of the element of concern includes: The first height coefficient, the second height coefficient, and the third height coefficient were fitted using grayscale testing. The radiation dose is corrected based on the first altitude coefficient, the second altitude coefficient, and the third altitude coefficient to obtain the predicted radiation dose of the element of interest at the current altitude.

6. The method according to claim 1, characterized in that, The actual situation of the element of interest also includes the current current. The step of correcting the radiation dose based on the actual situation of the element of interest to obtain the predicted radiation dose of the element of interest includes: Obtain the current of the element of interest and the radiation dose of the element of interest at the standard current; The radiation dose is corrected based on the current, standard current, and standard current dose under standard current to obtain the predicted radiation dose of the element of interest.

7. The method according to claim 1, characterized in that, The actual situation of the component of interest also includes circuit board attenuation. The step of correcting the radiation dose based on the actual situation of the component of interest to obtain the predicted radiation dose of the component of interest includes: When the element of interest is on the side facing away from the radiation source, the first attenuation coefficient and the second attenuation coefficient are obtained by fitting the measured dose data. The radiation dose is corrected based on the original radiation dose, the first attenuation coefficient, the second attenuation coefficient, and the circuit board thickness to obtain the predicted radiation dose of the component of interest.

8. An imaging system, characterized in that, include: A controller and a radiation source and a detector communicatively connected to the controller, wherein the radiation source is used to emit radiation and the detector is used to capture projected images; The controller includes: A processor and a memory communicatively connected to the processor; The memory stores computer program instructions executable by the processor, which, when executed by the processor, cause the controller to perform the element irradiation dose prediction method as described in any one of claims 1-7.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores processor-executable computer program instructions, which, when executed by the processor, cause the computer to perform the element irradiation dose prediction method as described in any one of claims 1-7.

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