Contact search method and device based on dichotomy and gradient descent method

Abstract

The invention provides a contact search method and device based on a dichotomy and a gradient descent method, and relates to the field of contact mechanical simulation, and the method comprises the steps: carrying out the global search through a space box, and carrying out the preliminary coarse screening of a potential contact main surface; refining grids of the coarsely screened potential contact main surface by using a dichotomy method; and for the refined potential contact main surface, traversing a line unit where the slave node is located, and performing contact detection by using a gradient descent method to obtain a detection result.

Description

Technical Field

[0001] This invention relates to the field of contact mechanics simulation, and more specifically to contact search methods, particularly to a contact search method and apparatus based on the bisection method and gradient descent method. Background Technology

[0002] Currently, widely used local search algorithms mainly include discrete point-based contact search algorithms and surface-based contact search algorithms. Among them, discrete point-based search algorithms are widely used in most commercial software such as ABAQUS, ANSYS, and LS-DYNA due to their simplicity and low computational cost.

[0003] In contact search, principal and slave surfaces are important concepts used to describe the interface between two objects, primarily in numerical methods such as finite element analysis. The principal surface is typically the relatively hard, rougher, or geometrically simpler surface in the contact pair. In numerical calculations, the node positions of the principal surface remain relatively fixed during the contact process, serving as a reference surface for contact constraints. The slave surface is typically the relatively softer, smoother, or geometrically more complex surface in the contact pair. In contact constraints, the displacement of the slave surface nodes is restricted, preventing them from penetrating the principal surface.

[0004] In practical engineering problems, there are often complex geometries, large deformations, and large sliding conditions. In such cases, traditional discrete point-based search algorithms are prone to missed detections. When the mesh size varies greatly, traditional algorithms can only search for the nearest master node instead of the nearest master segment, leading to incorrect contact behavior judgments. For example, in metal forming simulations, when the die mesh becomes discontinuous due to wear or fracture, traditional algorithms will experience a significant number of missed detections.

[0005] If the master surface is discontinuous, it can lead to the problem of failing to detect contact even when it actually occurs. In complex geometries such as sharp-corner contacts (e.g., gear meshing, tool cutting), traditional algorithms also struggle to effectively detect actual contact. For example, the discrete-point-based incremental node search method commonly used in LS-DYNA first searches for the nearest master node for each slave node. After finding the nearest master node, it searches for the nearest master segment around that node, finally checking for penetration before applying a contact force. While this method is simple and efficient, it requires the mesh on the master surface to be continuous.

[0006] Existing contact search algorithms often face a trade-off between computational accuracy and computational efficiency when dealing with complex contact problems. Improving search accuracy requires denser grids and more complex algorithms, which leads to a sharp increase in computational costs. On the other hand, simplifying the algorithm to improve efficiency can easily lead to missed contacts and a decrease in accuracy. Summary of the Invention

[0007] The present invention aims to at least partially solve one of the technical problems in the related art.

[0008] Therefore, the first objective of this invention is to propose a contact search method based on the bisection method and gradient descent method.

[0009] The second objective of this invention is to propose a contact search device based on the bisection method and gradient descent method.

[0010] The third objective of this invention is to provide an electronic device.

[0011] The fourth objective of this invention is to provide a computer-readable storage medium.

[0012] The fifth objective of this invention is to provide a computer program product.

[0013] To achieve the above objectives, a first aspect of the present invention proposes a contact search method based on the bisection method and gradient descent method, comprising: Step 1: Use the space box to perform a global search to initially screen potential contact surfaces; Step 2: Refine the mesh of the potential contact principal surfaces after coarse screening using the bisection method; Step 3: For the refined potential contact master surface, traverse the line elements where the nodes are located and use the gradient descent method to perform contact detection to obtain the detection results.

[0014] In one embodiment of the present invention, step 1 using the spatial box algorithm further includes: The spatial box search algorithm is used to divide the three-dimensional space into regular grid cells, i.e., bounding boxes, and to assign objects to the corresponding spatial cells according to their bounding boxes; where a bounding box is a bounding body that contains all the nodes of the object.

[0015] In this embodiment, a spatial box search algorithm is used to divide the three-dimensional space into regular grid cells, i.e., bounding boxes, and to assign objects to the corresponding spatial cells according to their bounding boxes; wherein a bounding box is a bounding body that contains all the nodes of an object.

[0016] In one embodiment of the present invention, step 2 further includes: Step 21: Calculate the area of ​​all potential contact sheets on the contact master surface; Step 22: Sort the areas of all potential contact master sheets; Step 23: Determine the maximum potential contact area Is it less than the minimum potential contact area? If the value is twice the original value, proceed to step 3; otherwise, proceed to step 24. Step 24: Divide the largest potential contact master piece into two parts with approximately equal areas, and return to step 22.

[0017] In one embodiment of the present invention, step 3 further includes: Step 31: Use gradient descent to determine slave nodes and its adjacent nodes If all projection points are located within the contact main sheet, proceed to step 32; otherwise, proceed to step 33. Step 32: From node and its adjacent nodes The projection points are all located within the contact main piece, determining the position of the node. Does it penetrate the contact plate of the main chip? Step 33: From node and its adjacent nodes If all projection points are located outside the contact main film, the process ends; otherwise, proceed to step 2.

[0018] In one embodiment of the present invention, step 31 further includes: Step 311: Select a point on the main face As the iteration point, the initial iteration point The isoparametric coordinates are selected as , compute nodes With iteration point The Euclidean distance between them; Step 312: Using the square of the Euclidean distance as the objective function, iteratively solve for the minimum objective function using gradient descent. The formula for calculating the objective function is:

[0019] in, For nodes coordinate, For iteration points coordinate, The learning rate; Calculate gradient and use Update Iteration Points isoparametric coordinates ; Step 313: Determine the iteration point All isoparametric coordinate components Is it located in the interval? If yes, proceed to step 313; otherwise, determine the node. Located outside the main content, iteration stops; Step 314: Determine the gradient Are all components less than the threshold value? If so, then find the node. The projection point, from node If the location is within the contact master slice, stop the iteration; otherwise, proceed to step 312. Step 315: Based on step 31, use the same steps to determine adjacent nodes. Whether the projection point is located within the contact main film.

[0020] In one embodiment of the present invention, step 32 further includes: Step 321: Calculate the slave node projection point unit outward normal vector ; Step 322: Calculate the vector with vector The included angle If the included angle Then determine from node Penetrates and contacts the master chip, with the penetration distance being equal to that of the slave node. to projection point The distance; if the included angle Then determine from node The contact with the main film was not penetrated; Step 323: Based on step 32, use the same steps to determine... Whether it penetrates the contact plate.

[0021] To achieve the above objectives, a second aspect of the present invention provides a contact search device based on the bisection method and gradient descent method, comprising: The search module is used to perform a global search using space boxes to conduct a preliminary coarse screening of potential contact surfaces. The refinement module is used to refine the mesh of potential contact surfaces that have been coarsely screened using a bisection method; The contact detection module is used to perform contact detection on the refined potential contact master surface by traversing the line elements where the nodes are located and using the gradient descent method to obtain the detection results.

[0022] To achieve the above objectives, a third aspect of the present invention provides an electronic device, comprising: a processor, and a memory communicatively connected to the processor; The memory stores computer-executed instructions; The processor executes computer execution instructions stored in the memory to implement the method as described in any one of the first aspects.

[0023] To achieve the above objectives, a fourth aspect of the present invention provides a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, are used to implement the method as described in any one of the first aspects.

[0024] To achieve the above objectives, a fifth aspect of the present invention provides a computer program product that, when executed by a processor, implements the method described in any one of the first aspects.

[0025] This invention combines the geometric adaptability of mesh refinement using the bisection method with the physical contact characterization of nodal projection using gradient descent, overcoming the performance bottleneck of traditional algorithms under complex conditions. It provides a high-precision, high-efficiency, and highly robust solution for contact problems in engineering. Its advantages include resolving the missed detection problem caused by mesh discontinuities in traditional nodal contact algorithms and accurately capturing edge contact and large sliding behaviors. Compared to traditional global refinement methods, this invention refines the mesh only in necessary areas, significantly reducing computational load and memory usage while maintaining accuracy. Through algorithmic innovation, it significantly improves the reliability of contact analysis, which is of great significance for promoting the application of finite element simulation technology under extreme conditions.

[0026] Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0027] The above and / or additional aspects and advantages of the present invention will become apparent and readily understood from the following description of the embodiments taken in conjunction with the accompanying drawings, wherein: Figure 1 This is a flowchart illustrating a contact search method based on the bisection method and gradient descent method provided in an embodiment of the present invention. Figure 2 This is a flowchart of a contact search method provided in an embodiment of the present invention; Figure 3 This is a schematic diagram of a contact search device based on the bisection method and gradient descent method provided in an embodiment of the present invention. Detailed Implementation

[0028] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the present invention, and should not be construed as limiting the present invention.

[0029] To address this problem, embodiments of the present invention provide a contact search method based on the bisection method and gradient descent method. Figure 1 This is a schematic flowchart of a contact search method based on the bisection method and gradient descent method provided in an embodiment of the present invention. Figure 2 This is a flowchart illustrating a contact search method provided in an embodiment of the present invention. Figure 1 Figure 2 As shown, the method includes the following steps: Step 1: Use the space box to perform a global search to initially screen potential contact surfaces.

[0030] To obtain the area of ​​all potential contact principal surfaces on the contact principal surface, the spatial box algorithm is used to coarsely screen the global potential contact principal surfaces.

[0031] The spatial box search algorithm is a search technique used to efficiently find the intersection or proximity relationships between "boxes" (i.e., multidimensional rectangular regions) in a multidimensional space.

[0032] In this embodiment of the application, a spatial box search algorithm is used to divide the three-dimensional space into regular grid cells, i.e., bounding boxes, and to assign objects to the corresponding spatial cells according to their bounding boxes; wherein the bounding box is a bounding body that contains all the nodes of the object.

[0033] The space box search algorithm divides three-dimensional space into regular grid units, or "space boxes," each with a specific location and number.

[0034] The algorithm then creates a bounding box for each object in the scene. Once the objects are enclosed in the bounding box, they are precisely placed into their corresponding spatial units based on their respective positions.

[0035] In this way, the contact detection work, which originally needed to be carried out in the entire three-dimensional space, is instantly reduced to adjacent spatial units. This means that only the objects in adjacent cells need to be checked to see if they are pressing against each other, which greatly reduces the detection range and the amount of calculation, making the coarse screening of potential contact surfaces both efficient and accurate.

[0036] Through the above steps, the use of the spatial box search algorithm not only reduces the amount of computation, but also lays the foundation for subsequent refinement of the mesh of potential contact principal surfaces using the bisection method.

[0037] Step 2: Use the bisection method to refine the mesh of the potential contact surfaces that have been coarsely screened.

[0038] To refine the mesh of potential contact surfaces, the area of ​​the largest potential contact surface is determined and then divided using a bisection method.

[0039] Step 21: Calculate the area of ​​all potential contact sheets on the contact master surface.

[0040] The first step is to process the individual surface units on the contact master surface, i.e., the contact master pieces. In this embodiment, the area of ​​each master piece is calculated using the cross product of vectors. If higher-order surface units with non-linear edges are encountered, a value close to the actual area can also be calculated using the cross product of vectors.

[0041] It should be noted that for higher-order surface elements, the cross product of vectors is used to calculate an approximate value of the contact area of ​​the main sheet.

[0042] Step 22: Sort all potential contact areas.

[0043] After calculating the area of ​​all the main pieces, arrange them in order of size.

[0044] Step 23: Determine the maximum potential contact area Is it less than the minimum potential contact area? twice, that is If yes, proceed to step 3; otherwise, proceed to step 24.

[0045] Step 24: Divide the largest potential contact master piece into two parts of approximately equal area. Return to step 22.

[0046] In this embodiment, if the contact main piece is a quadrilateral unit, then connect the two ends of any diagonal to find a diagonal line to divide the contact main piece into two triangular units; if the contact main piece is a triangular unit, then connect any vertex to the midpoint of the opposite side to divide the contact main piece into two triangular units.

[0047] After cutting, return to step 22 to reorder and compare the size of all main pieces until the areas of all main pieces are not much different.

[0048] Through the above steps, the mesh is continuously cut and refined, becoming more uniform, which lays the foundation for subsequent contact detection using the gradient descent method.

[0049] Step 3: For the refined potential contact master surface, traverse the line elements where the nodes are located and use the gradient descent method to perform contact detection to obtain the detection results.

[0050] To determine whether a potential contacting main piece and a contacting main surface are in contact, the nodes are judged. and Whether the projection point penetrates and contacts the main sheet, and whether it is from the node A comprehensive judgment is made based on whether the contact with the main film is achieved.

[0051] Step 31: Use gradient descent to determine slave nodes and its adjacent nodes If all projection points are located within the contact main film, proceed to step 32; otherwise, proceed to step 33.

[0052] Step 311: Select a point on the main face As the iteration point, the initial iteration point The isoparametric coordinates are selected as , compute nodes With iteration point The Euclidean distance between them.

[0053] Step 312: Using the square of the Euclidean distance as the objective function, iteratively solve for the minimum objective function using gradient descent. The formula for calculating the objective function is:

[0054] in, For nodes coordinate, For iteration points coordinate, This is the learning rate.

[0055] Calculate gradient and use Update Iteration Points isoparametric coordinates .

[0056] Step 313: Determine the iteration point All isoparametric coordinate components Is it located in the interval? If yes, proceed to step 313; otherwise, determine the node. Located outside the main content, stop iterating.

[0057] Step 314: Determine the gradient Are all components less than the threshold value? If so, then find the node. The projection point, from node If the contact is within the main chip, stop the iteration; otherwise, proceed to step 312.

[0058] Step 315: Based on step 31, use the same steps to determine adjacent nodes. Whether the projection point is located within the contact main film.

[0059] Step 32: From node and its adjacent nodes The projection points are all located within the contact main piece, determining the position of the node. Whether it penetrates the contact plate.

[0060] Step 321: Calculate the slave node projection point unit outward normal vector .

[0061] Step 322: Calculate the vector with vector The included angle If the included angle Then determine from node Penetrates and contacts the master chip, with the penetration distance being equal to that of the slave node. to projection point The distance; if the included angle Then determine from node The contact with the main film was not penetrated.

[0062] Step 323: Based on step 32, use the same steps to determine... Does it penetrate the contact plate of the main chip? Step 33: From node and its adjacent nodes If all projection points are located outside the contact main film, the process ends; otherwise, proceed to step 2.

[0063] Through the above steps, it was successfully determined whether there was contact between the potential contact substrate and the contact substrate, achieving more accurate and efficient contact detection.

[0064] To achieve the above embodiments, the present invention also proposes a contact search device based on the bisection method and gradient descent method. Figure 3 This is a schematic diagram of a contact search device based on the bisection method and gradient descent method, provided as an embodiment of the present invention. Figure 3 As shown, the device includes: Search module 100 is used to perform a global search using space boxes to conduct a preliminary coarse screening of potential contact surfaces; Refinement module 200 is used to refine the mesh of the coarsely screened potential contact surfaces using a bisection method; The contact detection module 300 is used to perform contact detection on the refined potential contact master surface by traversing the line elements where the nodes are located and using the gradient descent method to obtain the detection results.

[0065] Regarding the apparatus in the above embodiments, the specific manner in which each module performs its operation has been described in detail in the embodiments related to the method, and will not be elaborated upon here.

[0066] To implement the above embodiments, the present invention also proposes an electronic device, comprising: a processor, and a memory communicatively connected to the processor; the memory stores computer execution instructions; the processor executes the computer execution instructions stored in the memory to implement the method provided in the foregoing embodiments.

[0067] To implement the above embodiments, the present invention also proposes a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, are used to implement the methods provided in the foregoing embodiments.

[0068] To implement the above embodiments, the present invention also proposes a computer program product, including a computer program that, when executed by a processor, implements the methods provided in the foregoing embodiments.

[0069] The collection, storage, use, processing, transmission, provision, and disclosure of user personal information involved in this invention all comply with the provisions of relevant laws and regulations and do not violate public order and good morals.

[0070] It should be noted that personal information collected from users should be used for legitimate and reasonable purposes and should not be shared or sold outside of these legitimate uses. Furthermore, such collection / sharing should only be conducted after receiving the user's informed consent, including but not limited to notifying the user to read the user agreement / user notice and sign an agreement / authorization that includes authorization of relevant user information before the user uses the function. In addition, any necessary steps must be taken to protect and safeguard access to such personal information data and ensure that others with access to personal information data comply with their privacy policies and procedures.

[0071] This invention is intended to provide implementation schemes for users to selectively prevent the use or access to personal information data. That is, this disclosure is intended to provide hardware and / or software to prevent or block access to such personal information data. Once personal information data is no longer needed, risks can be minimized by restricting data collection and deleting data. Furthermore, where applicable, such personal information can be de-identified to protect user privacy.

[0072] In the foregoing descriptions of the embodiments, the terms "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0073] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0074] Any process or method description in the flowchart or otherwise herein can be understood as representing a module, segment, or portion of code comprising one or more executable instructions for implementing custom logic functions or processes, and the scope of preferred embodiments of the invention includes additional implementations in which functions may be performed not in the order shown or discussed, including substantially simultaneously or in reverse order depending on the functions involved, as should be understood by those skilled in the art to which embodiments of the invention pertain.

[0075] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a processor-included system, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transmit programs for use by, or in conjunction with, an instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of computer-readable media include: an electrical connection having one or more wires (electronic device), a portable computer disk drive (magnetic device), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). Alternatively, the computer-readable medium may be paper or other suitable media on which the program can be printed, since the program can be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, interpreting, or otherwise processing as necessary, and then stored in a computer memory.

[0076] It should be understood that various parts of the present invention can be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware as in another embodiment, it can be implemented using any of the following techniques known in the art, or a combination thereof: discrete logic circuits having logic gates for implementing logical functions on data signals, application-specific integrated circuits (ASICs) having suitable combinational logic gates, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.

[0077] Those skilled in the art will understand that all or part of the steps of the methods in the above embodiments can be implemented by a program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, the program includes one or a combination of the steps of the method embodiments.

[0078] Furthermore, the functional units in the various embodiments of the present invention can be integrated into a processing module, or each unit can exist physically separately, or two or more units can be integrated into a module. The integrated module can be implemented in hardware or as a software functional module. If the integrated module is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium.

[0079] The storage medium mentioned above can be a read-only memory, a disk, or an optical disk, etc. Although embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions, and variations to the above embodiments within the scope of the present invention.

[0080] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and this is not limited herein.

[0081] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. A contact search method based on dichotomy and gradient descent method, characterized in that, include: Step 1: Use the space box to perform a global search to initially screen potential contact surfaces; Step 2: Refine the mesh of the potential contact principal surfaces after coarse screening using the bisection method; Step 3: For the refined potential contact master surface, traverse the line elements where the nodes are located and use the gradient descent method to perform contact detection to obtain the detection results.

2. The method of claim 1, wherein, Step 1 using the spatial box algorithm also includes: The spatial box search algorithm is used to divide the three-dimensional space into regular grid cells, i.e., bounding boxes, and to assign objects to the corresponding spatial cells according to their bounding boxes; where a bounding box is a bounding body that contains all the nodes of the object.

3. The method of claim 2, wherein, Step 2 also includes: Step 21: Calculate the area of ​​all potential contact sheets on the contact master surface; Step 22: Sort the areas of all potential contact master sheets; Step 23: Determine if the maximum potential contact area is less than twice the minimum potential contact area Step 24: If yes, go to step 3; if no, go to step 25 Step 25: Determine if the maximum potential contact area is less than the minimum potential contact area Step 24: Divide the largest potential contact master piece into two parts with approximately equal areas, and return to step 22.

4. The method of claim 3, wherein, Step 3 also includes: Step 31: Use gradient descent to determine slave nodes and its adjacent nodes If all projection points are located within the contact main sheet, proceed to step 32; otherwise, proceed to step 33. Step 32: From node and its adjacent nodes The projection points are all located within the contact main piece, determining the position of the node. Does it penetrate the contact plate of the main chip? Step 33: From node and its adjacent nodes If all projection points are located outside the contact main film, the process ends; otherwise, proceed to step 2.

5. The method as described in claim 4, characterized in that, Step 31 further includes: Step 311: Select a point on the main face As the iteration point, the initial iteration point The isoparametric coordinates are selected as , compute nodes With iteration point The Euclidean distance between them; Step 312: Using the square of the Euclidean distance as the objective function, iteratively solve for the minimum objective function using gradient descent. The formula for calculating the objective function is: in, For nodes coordinate, For iteration points coordinate, The learning rate; Calculate gradient and use Update Iteration Points isoparametric coordinates ; Step 313: Determine the iteration point All isoparametric coordinate components Is it located in the interval? If yes, proceed to step 313; otherwise, determine the node. Located outside the main content, iteration stops; Step 314: Determine the gradient Are all components less than the threshold value? If so, then find the node. The projection point, from node If the location is within the contact master slice, stop the iteration; otherwise, proceed to step 312. Step 315: Based on step 31, use the same steps to determine adjacent nodes. Whether the projection point is located within the contact main film.

6. The method as described in claim 5, characterized in that, Step 32 further includes: Step 321: Calculate the slave node projection point unit outward normal vector ; Step 322: Calculate the vector with vector The included angle If the included angle Then determine from node Penetrates and contacts the master chip, with the penetration distance being equal to that of the slave node. to projection point The distance; if the included angle Then determine from node The contact with the main film was not penetrated; Step 323: Based on step 32, use the same steps to determine... Whether it penetrates the contact plate.

7. A contact search device based on the bisection method and gradient descent method, characterized in that, include: The search module is used to perform a global search using space boxes to conduct a preliminary coarse screening of potential contact surfaces. The refinement module is used to refine the mesh of potential contact surfaces that have been coarsely screened using a bisection method; The contact detection module is used to perform contact detection on the refined potential contact master surface by traversing the line elements where the nodes are located and using the gradient descent method to obtain the detection results.

8. An electronic device, characterized in that, include: A processor, and a memory communicatively connected to the processor; The memory stores computer-executed instructions; The processor executes computer execution instructions stored in the memory to implement the method as described in any one of claims 1-6.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-executable instructions, which, when executed by a processor, are used to implement the method as described in any one of claims 1-6.

10. A computer program product, characterized in that, Includes a computer program that, when executed by a processor, implements the method of any one of claims 1-6.

Images