Modified metal surface defect detection method and device and medium

By acquiring multi-angle reflection image sequences and material property databases of modified metal surfaces, a defect-sensitive parameter set is generated for collaborative feature enhancement and joint detection. This solves the problem of insufficient defect features in traditional detection methods and achieves high-precision defect detection of modified metal surfaces.

CN121453774APending Publication Date: 2026-02-03SHAANXI CHANGAN PIONEER IND INNOVATION CENTER CO LTD +1
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Patent Information

Application Number
CN202511418850.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-09-30
Publication Date
2026-02-03

AI Technical Summary

Technical Problem

Traditional detection methods fail to fully combine the characteristics of modified metal materials and optical reflection features, making it difficult to comprehensively capture the spatial geometric and physical properties of defects. They are also susceptible to interference from surface textures and environmental noise, leading to misjudgment or missed detection of defects, and thus cannot meet the requirements for high-precision detection.

Method used

By acquiring multi-angle reflection image sequences of modified metal surfaces under multispectral light source illumination, and combining them with a pre-set modified metal material property database, a defect-sensitive parameter set is generated. Collaborative feature enhancement and joint anomaly detection are then performed to identify potential defect areas and conduct morphological quantitative analysis.

Benefits of technology

It enables accurate identification of defects on modified metal surfaces, improves the comprehensiveness and reliability of detection results, reduces misjudgment, amplifies weak feature signals in defect areas, and enhances the identifiability of defect features.

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Abstract

The invention provides a modified metal surface defect detection method and device and a medium, and the method comprises the steps: obtaining a multi-angle reflection image sequence of a modified metal surface under the irradiation of a multi-spectral light source, and generating a defect sensitive parameter set based on a preset modified metal material characteristic database and in combination with the spectral reflectivity distribution information of the multi-angle reflection image sequence; performing cooperative feature enhancement on the multi-angle reflection image sequence and the defect sensitive parameter set, and enhancing the feature contrast of a defect area and a normal area through weight distribution to obtain an enhanced defect feature set; joint anomaly detection of a spatial domain and a spectral domain is carried out on the enhanced defect feature set, a potential defect region of the modified metal surface is obtained through identification, and a defect region feature descriptor is generated; and performing defect morphological quantitative analysis according to the defect region feature descriptors, and determining the type, position and severity level of the modified metal surface defect. According to the invention, the comprehensiveness and reliability of a defect detection result can be improved.
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