Reconfigurable test system and method for multi-channel microwave transmit-receive assembly

Abstract

The invention discloses a reconfigurable test system and method for a multi-channel microwave transceiving assembly. The system comprises a channel change-over switch network, an instrument selection matrix type network, an auxiliary source, a synchronous network and a power supply control circuit. The method comprises the following steps: firstly, initializing a test system, and connecting the test system with a corresponding test instrument; then a certain channel of the reference component is connected to the reference channel, and a receiving / transmitting channel of the component to be tested is connected to a corresponding path of the channel change-over switch network; respectively connecting an auxiliary source and a clock signal and a local oscillator signal of the synchronous network to a to-be-tested assembly, respectively connecting an instrument synchronous clock signal to a corresponding instrument, and ensuring coherence of all instruments; and finally, controlling the working state of the all-digital transceiver assembly, controlling a switch of the test system, and selecting a corresponding test instrument to test the assembly. According to the invention, the generalization level of the multi-channel microwave transceiver assembly test system is improved, the cost of the test system is reduced, and the test efficiency is improved.

Description

Technical Field

[0001] This invention relates to the field of testing technology for multi-channel digital / analog microwave transceivers, and in particular to a reconfigurable testing system and method for multi-channel microwave transceivers. Background Technology

[0002] Microwave transceiver components are an important part of radar detection systems and electronic countermeasures systems. The electrical performance testing of microwave transceiver components is a key link to ensure their quality and reliability, mainly involving the measurement of core indicators such as output power, frequency stability, noise figure, and return loss.

[0003] Currently, radar detection systems and electronic countermeasures systems are mostly developing towards phased array architectures, and the number of channels in microwave transceiver components is also increasing. A microwave transceiver component consists of a transmitting channel and a receiving channel. The transmitting channel mainly performs filtering, frequency conversion, amplitude and phase control, and power amplification on the signal output from the DA converter; the receiving channel mainly performs low-noise amplification, amplitude and phase control, frequency conversion, and filtering on the large signal received by the antenna. Therefore, the electrical performance testing of microwave transceiver components is divided into uplink transmitting performance testing and downlink receiving performance status testing. For multi-channel microwave transceiver components, there are many types, many channels, and complex test parameters, making manual testing extremely labor-intensive. Automated testing systems are mostly customized, and conventional transceiver drilling testing systems cannot meet the current diverse needs. Therefore, there is an urgent need to invent a multi-channel microwave transceiver component testing system and method that can shorten the customized development cycle of the testing system, reduce the cost of the testing system, improve testing efficiency, and ensure a comprehensive evaluation of the transceiver component's performance. Summary of the Invention

[0004] The purpose of this invention is to provide a multi-channel microwave transceiver component testing system and method that can be applied to both multi-channel digital transceiver components and multi-channel analog transceiver components, effectively shorten the customized R&D cycle, improve the versatility of the testing system, reduce the cost of the testing system, and improve the testing efficiency.

[0005] The technical solution to achieve the purpose of this invention is: a reconfigurable test system for multi-channel microwave transceiver components, including a channel switching network, an instrument selection matrix network, an auxiliary source and synchronization network, and a power control circuit;

[0006] The channel switching network and the instrument selection matrix network are interconnected via radio frequency cables. The channel switching network is connected to the component under test (DUT), which is a multi-channel transceiver component. The instrument selection matrix network is connected to the test instrument, thus completing the interconnection between the DUT and the test instrument.

[0007] The auxiliary source and synchronization network are used to provide clock signals and local oscillator signals to the component under test, and to provide synchronous clock signals to the test instruments to ensure that all instruments are coherent.

[0008] The power control circuit is used to provide the voltage required within the test system, receive external control commands, and provide power supply voltage and control signals to the switches in the channel switching network, instrument selection matrix network, auxiliary source, and synchronization network.

[0009] Furthermore, the channel switching network consists of Y N-to-1 switches, where the N-to-1 switch is the smallest replaceable unit in the channel switching network, and the number Y of the N-to-1 switches is determined according to the number of channels of the transceiver component under test.

[0010] Furthermore, the power control circuit receives information through the network interface and controls the switches in the channel switching network and instrument selection matrix network to select the corresponding channels of the multi-channel transceiver components and the test instruments.

[0011] Furthermore, the auxiliary source and synchronization network integrates a power divider network for clock and local oscillator signals, and an internal / external reference source selection switch; the auxiliary source and synchronization network internally generates coherent clock and local oscillator signals, or connects to external instruments as references; all output signals maintain coherent characteristics and are distributed via the power divider network.

[0012] Furthermore, the power control circuit consists of a power module, a control module, and a network module. The power module provides the voltage required within the test system, and the control module receives external control commands through the network module to control the switching on and off of switches in the channel switching network, the instrument selection matrix network, the auxiliary source, and the synchronization network.

[0013] A reconfigurable test method for multi-channel microwave transceiver components, the method being based on the reconfigurable test system, includes a test method for multi-channel all-digital microwave transceiver components and a test method for multi-channel analog microwave transceiver components.

[0014] Furthermore, the testing method for the multi-channel microwave all-digital transceiver component includes the following steps:

[0015] Step 1.1: Initialize all components of the test system;

[0016] Step 1.2: Connect the test system to the corresponding test instruments;

[0017] Step 1.3: Connect one channel of the reference component to the reference channel;

[0018] Step 1.4: Connect the transmit / receive channel of the component under test to the 1~N path of switch SW11 in the channel switching network, and connect the remaining components under test to the corresponding paths of switches SW12~SW1Y in the channel switching network respectively.

[0019] Step 1.5: Connect the clock signal and local oscillator signal of the auxiliary source and synchronization network to the component under test respectively, and connect the instrument synchronization clock signal to the corresponding instrument respectively to ensure that all instruments are correlated;

[0020] Step 1.6: Control the working status of the all-digital transceiver component;

[0021] Step 1.7: Control the switch of the test system and select the appropriate test instrument;

[0022] Step 1.8: Obtain and save the test results to complete the component testing.

[0023] Furthermore, the testing method for the multi-channel microwave analog transceiver component includes the following steps:

[0024] Step 2.1: Initialize each component module of the test system;

[0025] Step 2.2: Connect the test system to the corresponding test instruments;

[0026] Step 2.3: Connect one channel of the reference component to the reference channel;

[0027] Step 2.4: Connect the transmit / receive channel of the component under test to path 1 of the channel switching network SW11~SW1Y, and connect the remaining components under test to the corresponding paths 2~N of the channel switching network SW11~SW1Y respectively.

[0028] Step 2.5: Connect the clock signal and local oscillator signal of the auxiliary source and synchronization network to the component under test respectively, and connect the instrument synchronization clock signal to the corresponding instrument respectively to ensure that all instruments are correlated;

[0029] Step 2.6: Control the working status of the all-digital transceiver component;

[0030] Step 2.7: Control the switch of the test system and select the appropriate test instrument;

[0031] Step 2.8: Obtain and save the test results to complete the component testing.

[0032] Compared with the prior art, the present invention has the following significant advantages: (1) The present invention effectively controls each switch through a multi-channel switching network and a power control circuit, realizing batch testing of multiple transceiver components; (2) It reduces disassembly and assembly time, lowers the cost of the test system, and improves test efficiency; (3) It is applicable to both multi-channel digital transceiver components and multi-channel analog transceiver components, and has the ability to perform automated testing of multiple transceiver components at the same time, improving the generalization level of the test system and shortening the customized development cycle of the test system. Attached Figure Description

[0033] Figure 1 This is a schematic diagram of the structure of a reconfigurable test system for a multi-channel microwave transceiver assembly according to the present invention.

[0034] Figure 2 This is a test connection diagram of a reconfigurable test system for a 16-channel microwave digital transceiver assembly in an embodiment of the present invention.

[0035] Figure 3 This is a test connection diagram of a reconfigurable test system for a 16-channel microwave analog transceiver assembly in an embodiment of the present invention. Detailed Implementation

[0036] like Figure 1 As shown, the present invention provides a reconfigurable test system for multi-channel microwave transceiver components, including a channel switching network 1, an instrument selection matrix network 2, an auxiliary source and synchronization network 3, and a power control circuit 4.

[0037] The channel switching network 1 and the instrument selection matrix network 2 are interconnected via an RF cable. The channel switching network 1 is connected to the component under test, which is a multi-channel transceiver component. The instrument selection matrix network 2 is connected to the test instrument, thus completing the interconnection between the component under test and the test instrument.

[0038] The auxiliary source and synchronization network 3 are used to provide clock signals and local oscillator signals for the component under test, and to provide synchronous clock signals for the test instruments to ensure that all instruments are correlated.

[0039] The power control circuit 4 is used to provide the voltage required in the test system, receive external control commands, and provide power supply voltage and control signals to the switches in the channel switching network 1, the instrument selection matrix network 2, and the auxiliary source and synchronization network 3.

[0040] As a specific example, the channel switching network 1 consists of Y N-to-1 switches, where the N-to-1 switch is the smallest replaceable unit in the channel switching network 1, and the number Y of the N-to-1 switches is determined according to the number of channels of the transceiver component under test.

[0041] As a specific example, the power control circuit 4 uses the information received through the network interface to control the switches in the channel switching network 1 and the instrument selection matrix network 2, thereby selecting the corresponding channels of the multi-channel transceiver component and the test instruments.

[0042] As a specific example, the auxiliary source and synchronization network 3 integrates a power divider network for clock and local oscillator signals, and an internal / external reference source selection switch; the auxiliary source and synchronization network 3 internally generates coherent clock and local oscillator signals, or connects to an external instrument as a reference; all output signals maintain coherent characteristics and are distributed via the power divider network.

[0043] As a specific example, the power control circuit 4 consists of a power module, a control module, and a network module. The power module provides the voltage required within the test system, and the control module receives external control commands through the network module to control the switching on and off of switches in the switching network 1, the instrument selection matrix network 2, and the auxiliary source and synchronization network 3.

[0044] Once the test system is set up, partial circuitry can be replaced for components with different numbers of channels, enabling rapid system setup. It can automatically test multi-channel microwave transceiver components and perform calibration without the need for connector plugging and unplugging. This test system effectively improves component testing efficiency and allows for a reconfigurable design.

[0045] The present invention also provides a reconfigurable testing method for multi-channel microwave transceiver components. The method is based on the reconfigurable testing system and includes a testing method for multi-channel microwave all-digital transceiver components and a testing method for multi-channel microwave analog transceiver components.

[0046] As a specific example, the testing method for the multi-channel microwave all-digital transceiver assembly includes the following steps:

[0047] Step 1.1: Initialize all components of the test system;

[0048] Step 1.2: Connect the test system to the corresponding test instruments;

[0049] Step 1.3: Connect one channel of the reference component to the reference channel;

[0050] Step 1.4: Connect the transmit / receive channel of the component under test to the 1~N path of switch SW11 in channel switching network 1, and connect the remaining components under test to the corresponding paths of switches SW12~SW1Y in channel switching network 1 respectively.

[0051] Step 1.5: Connect the clock signal and local oscillator signal of the auxiliary source and synchronization network 3 to the component under test respectively, and connect the instrument synchronization clock signal to the corresponding instrument respectively to ensure that all instruments are correlated;

[0052] Step 1.6: Control the working status of the all-digital transceiver component;

[0053] Step 1.7: Control the switch of the test system and select the appropriate test instrument;

[0054] Step 1.8: Obtain and save the test results to complete the component testing.

[0055] As a specific example, the test method for the multi-channel microwave analog transceiver component includes the following steps:

[0056] Step 2.1: Initialize each component module of the test system;

[0057] Step 2.2: Connect the test system to the corresponding test instruments;

[0058] Step 2.3: Connect one channel of the reference component to the reference channel;

[0059] Step 2.4: Connect the transmit / receive channel of the component under test to path 1 of the switches SW11~SW1Y in the channel switching network 1, and connect the remaining components under test to the corresponding paths 2~N of the switches SW11~SW1Y in the channel switching network 1 respectively;

[0060] Step 2.5: Connect the clock signal and local oscillator signal of the auxiliary source and synchronization network 3 to the component under test respectively, and connect the instrument synchronization clock signal to the corresponding instrument respectively to ensure that all instruments are correlated;

[0061] Step 2.6: Control the working status of the all-digital transceiver component;

[0062] Step 2.7: Control the switch of the test system and select the appropriate test instrument;

[0063] Step 2.8: Obtain and save the test results to complete the component testing.

[0064] This invention effectively controls each switch through a multi-channel switching network and a power control circuit, enabling batch testing of multiple transceiver components, reducing disassembly and assembly time. It also has the ability to simultaneously and automatically test multiple digital transceiver components, improving testing efficiency and reducing testing time.

[0065] The present invention will now be described in further detail with reference to the accompanying drawings and specific embodiments.

[0066] Example 1

[0067] This embodiment uses the testing of a 16-channel all-digital transceiver module as an example for illustration.

[0068] The test connection relationship of the 16-channel all-digital transceiver component is as follows: Figure 2 As shown, the test system is connected to three external components: Device Under Test (DUT) 1, DUT 2, and a reference device. The test system can simultaneously measure two transceiver components. DUT 1's output ports 1 to 8 are connected to switch SW11 in channel switching network 1, and ports 9 to 16 are connected to switch SW12 in channel switching network 1. DUT 2's output ports 1 to 8 are connected to switch SW13 in channel switching network 1, and ports 9 to 16 are connected to switch SW14 in channel switching network 1. The instrument selection uses a 4-channel power divider PD1 in matrix network 2, with the same number of output ports as the switches in channel switching network 1. All test instruments, DUTs, and reference devices are synchronized with a 10MHz clock via an auxiliary source and synchronization network 3 to ensure all instruments are from the same source. By switching the switches, component 1 is tested in transmit mode, and component 2 is tested in receive mode. After this test is completed, component 1's receive performance is tested, and component 2's transmit performance is tested.

[0069] Example 2

[0070] This embodiment uses the test of a 16-channel analog transceiver component as an example for illustration.

[0071] The connection relationship for testing the 16-channel analog transceiver component is as follows: Figure 3 As shown, the test system is externally connected to three components: Device Under Test (DUT) 1, DUT 2, and a reference device. Output ports 1 to 16 of DUT 1 are connected to channel 1 of switch SW11 to SW1(16) in channel switching network 1. Output ports 1 to 16 of DUT 2 are connected to channel 2 of switch SW11 to SW1(16) in channel switching network 1. The power divider PD1 in matrix network 2 is selected as having 16 channels, with the number of its output ports matching the number of switches in channel switching network 1. All test instruments, DUTs, and reference devices are synchronized with a 10MHz clock via an auxiliary source and synchronization network 3 to ensure all instruments are from the same source. The switching ensures that component 2 is tested only after component 1 has been tested for both transmit and receive states.

[0072] The above are merely preferred embodiments of the present invention. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principle of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A reconfigurable test system for a multi-channel microwave transceiver assembly, characterized by, The channel switching switch network (1), the instrument selection matrix network (2), the auxiliary source and synchronization network (3), and the power supply control circuit (4) are connected through a radio frequency cable. The channel switching switch network (1) is connected to a measured component, and the measured component is a multi-channel transceiver component. The auxiliary source and synchronization network (3) is used for providing a clock signal and a local oscillator signal for the measured component, and providing a synchronous clock signal for the test instrument to ensure that all the instruments are in phase. The power supply control circuit (4) is used for providing a voltage required in the test system, receiving an external control command, and providing a power supply voltage and a control signal for switches in the channel switching switch network (1), the instrument selection matrix network (2), and the auxiliary source and synchronization network (3).

2. The reconfigurable test system for multi-channel microwave transceivers assembly according to claim 1, characterized in that, The channel switching switch network (1) is composed of Y N-select-1 switches, and the N-select-1 switch is the smallest replaceable unit in the channel switching switch network (1), and the number Y of the N-select-1 switches is determined according to the number of channels of the measured transceiver component.

3. The reconfigurable test system for multi-channel microwave transceivers assembly of claim 1, wherein, The power supply control circuit (4) receives information through a network interface, controls the switches in the channel switching switch network (1) and the instrument selection matrix network (2), and selects the corresponding channel of the multi-channel transceiver component and the test instrument.

4. The reconfigurable test system for multi-channel microwave transceivers assembly of claim 1, wherein, The auxiliary source and synchronization network (3) integrates a power division network of the clock and the local oscillator signal and an internal / external reference source selection switch.

5. The reconfigurable test system for multi-channel microwave transceivers assembly of claim 1, wherein, The power supply control circuit (4) is composed of a power supply module, a control module, and a network module, the power supply module provides a voltage required in the test system, the control module receives an external control command through the network module, and controls the on-off of the switches in the channel switching switch network (1), the instrument selection matrix network (2), and the auxiliary source and synchronization network (3).

6. A reconfigurable test method for a multi-channel microwave transceiver assembly, characterized by, The method is based on the reconfigurable test system of any one of claims 1-5, and includes a test method of a multi-channel microwave full-digital transceiver component and a test method of a multi-channel microwave analog transceiver component.

7. The reconfigurable test method for a multi-channel microwave transceiver assembly of claim 6, wherein, The test method of the multi-channel microwave full-digital transceiver component includes the following steps: Step 1.1, initializing each component module of the test system; Step 1.2, connecting the corresponding test instrument to the test system; Step 1.3, connecting a channel of a reference component to a reference channel; Step 1.4, connecting a receive / transmit channel of a to-be-tested component to a path from 1 to N of a switch SW11 of the channel switching switch network (1), and connecting the remaining to-be-tested components to corresponding paths of switches SW12-SW1Y of the channel switching switch network (1) respectively; Step 1.5, connecting a clock signal and a local oscillator signal of the auxiliary source and synchronization network (3) to the to-be-tested component respectively, and connecting an instrument synchronous clock signal to the corresponding instrument to ensure that all the instruments are in phase; Step 1.6, controlling the working state of the full-digital transceiver component; Step 1.7, control the switch of the test system, select the corresponding test instrument; Step 1.8, obtain the test result and save, complete the component test.

8. The reconfigurable test method for a multi-channel microwave transceiver assembly of claim 6, wherein, The test method of the multi-channel microwave analog transceiver component comprises the following steps: Step 2.1, initialize each component module of the test system; Step 2.2, connect the corresponding test instrument to the test system; Step 2.3, connect a channel of the reference component to the reference channel; Step 2.4, connect the receive / transmit channel of the component to be tested to the path 1 of the switch SW11~SW1Y of the channel switching switch network (1), and connect the remaining components to be tested to the corresponding paths 2~N of the switch SW11~SW1Y of the channel switching switch network (1) respectively; Step 2.5, connect the auxiliary source and the clock signal and the local oscillator signal of the synchronization network (3) to the component to be tested respectively, connect the instrument synchronization clock signal to the corresponding instrument respectively, and ensure that all instruments are coherent; Step 2.6, control the working state of the full-digital transceiver component; Step 2.7, control the switch of the test system, select the corresponding test instrument; Step 2.8, obtain the test result and save, complete the component test.

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