Copper-based dust analysis system and method

Abstract

Disclosed herein is a copper-based dust analysis system according to the present disclosure, the copper-based dust analysis system comprising: a digital microscope configured to generate respective images of a sample and a reference sample, and to convert the images into digitized image signals; and a central processing device configured to process the digitized image signal transmitted from the digital microscope to generate image data, and detect copper-based dust in the image data of the sample based on reference data including image information of the copper-based dust, the central processing device is configured to perform color correction processing on the image of the sample and the image of the reference sample, respectively, to distinguish the copper-based dust from other materials based on colors.

Description

Technical Field

[0001] This application claims the benefit of Korean Patent Application No. 10-2024-0039764, filed on March 22, 2024, the disclosure of which is incorporated herein by reference.

[0002] This disclosure relates to a copper-based dust analysis system and method that can detect copper-based dust in various dusts dispersed in an electrode manufacturing facility and quantitatively determine the distribution level of the copper-based dust. Background Technology

[0003] In recent years, rechargeable batteries have been widely used as an energy source for wireless mobile devices. They have also gained attention as an energy source for electric vehicles and hybrid electric vehicles, which have been proposed as a way to address air pollution from conventional gasoline and diesel vehicles using fossil fuels. Therefore, the types of applications using rechargeable batteries are diversifying due to their advantages, and it is expected that they will be applied to even more fields and products in the future.

[0004] Based on the shape of the battery casing, these secondary batteries are classified as: cylindrical batteries and prismatic batteries, in which the electrode assembly is embedded in a cylindrical or prismatic metal can; and pouch batteries, in which the electrode assembly is embedded in a pouch-shaped casing of aluminum laminate, and the electrode assembly embedded in the battery casing is a power generation device capable of being charged and discharged and having a positive electrode, a negative electrode, and a separator structure between the positive and negative electrodes.

[0005] The positive and negative electrodes are manufactured through the following operations: applying a positive electrode slurry containing positive electrode active material and a negative electrode slurry containing negative electrode active material to a positive electrode current collector and a negative electrode current collector, respectively, to form a positive electrode active material layer and a negative electrode active material layer; a coating process of drying the positive electrode slurry and the negative electrode slurry; a rolling process of rolling the dried electrodes; and a grooving and cutting process of forming electrode sheets and stamping them into individual electrodes.

[0006] In various manufacturing facilities used in the series of processes for manufacturing electrodes, various types of dust, both metallic and non-metallic, may be present. This dust may be incorporated into the electrodes during the manufacturing process, and the inclusion of dust in the electrodes may lead to performance degradation of the battery. In particular, metallic dust may grow into dendrites, which can cause internal short circuits in the secondary battery, resulting in battery failure, damage, or even fire.

[0007] Therefore, it is necessary to quantitatively identify the distribution levels of metal dust, especially among the various types of dust present in manufacturing facilities such as coating facilities, drying facilities, rolling facilities, grooving facilities, and slitting and cutting facilities, and it is also necessary to manage the dust levels in manufacturing facilities. However, existing technologies for detecting or analyzing metal dust in the field of secondary batteries are limited to detecting and analyzing dust in products (batteries), and there is no standardized method for rapidly detecting and quantifying dust—especially metal dust—in electrode manufacturing facilities. Furthermore, conventional methods for detecting and analyzing dust require capturing it with tape and then analyzing it using scanning electron microscopy (SEM) or X-ray fluorescence (XRF), which is very time-consuming, unclear in identifying metallic components, and inaccurate in measuring dust size.

[0008] Therefore, there is a need to develop a standardized method for detecting metal dust and analytical methods that include this standardized method to improve electrode quality.

[0009] Existing technology

[0010] (Patent Document 0001) Korean Patent Publication No. 10-2022-0111364 Summary of the Invention

[0011] Technical issues

[0012] The technical problem solved by this disclosure is to provide a standardized analytical system and method for selectively detecting and quantifying copper-based dust, particularly in various types of dust present in electrode manufacturing facilities or electrode manufacturing sites.

[0013] This disclosure aims to provide a copper-based dust analysis system and method optimized for detecting and analyzing copper-based dust in a variety of dusts, and particularly for detecting and analyzing copper-based dust, while minimizing the time required for detection and analysis without complicating the process.

[0014] Technical solution

[0015] The present disclosure, which addresses the aforementioned problems, provides a copper-based dust analysis system. According to an exemplary embodiment, a copper-based dust analysis system includes: a digital microscope configured to generate corresponding images of a sample and a reference sample, and to convert the images into digital image signals; and a central processing unit configured to process the digital image signals transmitted from the digital microscope to generate image data, and to detect copper-based dust in the image data of the sample based on the reference data including image information of copper-based dust, wherein the central processing unit is configured to perform color correction processing on the images of the sample and the reference sample, respectively, to distinguish copper-based dust from other materials based on color.

[0016] In an exemplary embodiment, the central processing unit is configured to perform color correction processing on an image of the sample or an image of a reference sample using a blue hue to facilitate the differentiation of copper-based dust.

[0017] In an exemplary embodiment, the central processing unit is configured to filter the copper-based dust such that the copper-based dust appears in a color opposite to the blue hue in the color-corrected image of the sample or the color-corrected image of the reference sample.

[0018] In an exemplary embodiment, the central processing unit is configured to remove dust particles with a size lower than a reference value from an image of a reference sample.

[0019] In an exemplary embodiment, the central processing unit is configured to automatically calculate the quantity and size of copper-based dust detected in an image of the sample.

[0020] In an exemplary embodiment, the digital microscope is configured to divide the sample into multiple regions and to photograph each of the multiple regions.

[0021] The copper-based dust analysis system according to an exemplary embodiment further includes: an output unit configured to output images transmitted from a digital microscope and image data generated by a central processing unit; an input unit for inputting processing information for processing images of a sample or images of a reference sample; a first memory unit for storing image data of a reference sample processed by the central processing unit; and a second memory unit for storing image data of a sample processed by the central processing unit.

[0022] The copper-based dust analysis system according to an exemplary embodiment further includes a component analysis unit configured to analyze the composition of the detected copper-based dust.

[0023] In an exemplary embodiment, the component analysis unit is configured to perform component analysis by laser-induced breakdown spectroscopy (LIBS).

[0024] In an exemplary embodiment, the digital microscope includes: a stage configured to hold a sample or reference sample; an illumination unit configured to illuminate the stage with light; a camera configured to acquire each image of the sample or reference sample; and an optical unit for acquiring high-magnification images of the sample or reference sample.

[0025] The present disclosure, which addresses the aforementioned problems, provides a method for analyzing copper-based dust. According to an exemplary embodiment, the method includes: generating reference data including image information of copper-based dust using a copper-based dust analysis system; producing a sample by capturing dust from a test article; obtaining an image of the sample using the copper-based dust analysis system, and processing the image of the sample to facilitate the detection of copper-based dust in the image of the sample; and detecting copper-based dust in the image of the sample, wherein the detection of copper-based dust is performed based on the reference data.

[0026] In an exemplary embodiment, the copper-based dust analysis system may be the copper-based dust analysis system described above. For example, the copper-based dust analysis system includes: a digital microscope configured to generate corresponding images of a sample and a reference sample, and to convert the images into digital image signals; and a central processing unit configured to process the digital image signals transmitted from the digital microscope to generate image data, and to detect copper-based dust in the image data of the sample based on the reference data including image information of copper-based dust, wherein the central processing unit is configured to perform color correction processing on the images of the sample and the reference sample, respectively, to distinguish copper-based dust from other materials based on color.

[0027] In an exemplary embodiment, the process of producing a sample includes: an initial capture process, which captures dust present on the surface of the test article by initially rolling a dust-cleaning roller on the surface of the test article; and a secondary capture process, which transfers the dust adhering to the dust-cleaning roller to the capture paper by rolling the initially rolled dust-cleaning roller a second time onto the capture paper, wherein the adhesive component of the capture paper has a greater adhesive force than the adhesive component of the dust-cleaning roller.

[0028] In an exemplary embodiment, the process of generating reference data includes: producing a reference sample comprising copper-based dust; obtaining an image of the reference sample and processing the image of the reference sample to facilitate the detection of copper-based dust in the image of the reference sample; and storing the processed image of the reference sample as reference data.

[0029] In an exemplary embodiment, the process of processing an image of a reference sample includes: color-correcting the image of the reference sample to blue, such that the image of the reference sample facilitates the identification of copper-based dust; and filtering the image of the reference sample such that a color opposite to blue is displayed in the color-corrected image of the reference sample.

[0030] In an exemplary embodiment, the process of processing an image of a reference sample further includes removing noise from a color-corrected or filtered image of the reference sample, wherein the noise removal process includes: removing dust particles below a threshold from the color-corrected or filtered image of the reference sample; and filling blank areas in the color-corrected or filtered image of the reference sample.

[0031] In an exemplary embodiment, the reference sample includes, in addition to copper-based dust, at least one of electrode material and iron.

[0032] In an exemplary embodiment, the process of processing the image of the sample includes: color-correcting the image of the sample to blue to facilitate the identification of copper-based dust in the image of the sample; and filtering the color-corrected image of the sample so that a color opposite to blue can be seen in the color-corrected image of the sample.

[0033] In an exemplary embodiment, the process of detecting copper-based dust includes: measuring the size of the dust detected in an image of the sample, and counting the number of dust particles.

[0034] Following the detection of copper-based dust, the copper-based dust analysis method according to an exemplary embodiment of the present disclosure further includes: analyzing the composition of the detected copper-based dust, wherein the process of analyzing the composition of the copper-based dust uses laser-induced breakdown spectroscopy (LIBS).

[0035] Beneficial effects

[0036] Exemplary embodiments of this disclosure provide a standardized method for capturing dust present in an electrode manufacturing facility or manufacturing site and for detecting and analyzing copper-based dust.

[0037] According to exemplary embodiments of the present disclosure, the detection and analysis of copper-based dust can be automated by converting an image of the sample to be analyzed into a digital signal, generating color-corrected or color-corrected and filtered image data to facilitate the detection of copper-based dust, and detecting copper-based dust in the image data, thereby significantly reducing detection and analysis time.

[0038] According to an exemplary embodiment of the present disclosure, copper-based dust is detected by generating processed reference data that clearly distinguishes copper-based dust by color and applying the reference data to image data of a sample to detect copper-based dust, thereby improving the reliability of copper-based dust detection. Attached Figure Description

[0039] Figure 1 This is a schematic diagram of a copper-based dust analysis system according to an exemplary embodiment of the present disclosure.

[0040] Figure 2 This is a diagram illustrating the image before color correction processing performed by the central processing unit.

[0041] Figure 3 This is a diagram illustrating the image after color correction processing performed by the central processing unit.

[0042] Figure 4 It is a diagram pair Figure 3 The image is filtered to display an image with colors inverted from the blue hue.

[0043] Figure 5 This is a diagram of the screen of the output unit, which shows the color adjustment process performed by the input unit for filtering processing.

[0044] Figure 6 This is a flowchart illustrating a copper-based dust analysis method according to an exemplary embodiment of the present disclosure.

[0045] Figure 7 This is a flowchart illustrating a process for generating reference data according to an exemplary embodiment of the present disclosure.

[0046] Figure 8 This is a flowchart illustrating the process of producing a sample according to an exemplary embodiment of the present disclosure.

[0047] Figure 9 This is a diagram illustrating the initial capture process according to an exemplary embodiment of the present disclosure.

[0048] Figure 10 This is a diagram illustrating a secondary capture process according to an exemplary embodiment of the present disclosure.

[0049] Explanation of reference numerals in the attached figures

[0050] 100: Copper-based dust analysis system

[0051] 110: Digital Microscope

[0052] 120: Central Processing Equipment

[0053] 130: Output Department

[0054] 140: Input Section

[0055] 150: First memory section

[0056] 160: Second Memory Section

[0057] 1: Test Items

[0058] 2: Dust cleaning roller

[0059] 3: Capture Paper

[0060] 4: Capture Cover Detailed Implementation

[0061] Preferred embodiments of the present disclosure will be described in detail below with reference to the accompanying drawings. It should be noted that the terms and words used in this specification and claims should not be interpreted in their ordinary or dictionary sense, but rather are based on the principle that the inventor may define the concepts of the terms as needed to best describe the content of his disclosure, and are interpreted in a meaning and concept consistent with the technical spirit of the present disclosure.

[0062] Therefore, it should be understood that the embodiments described herein and the configurations shown in the accompanying drawings are merely the most preferred embodiments of this disclosure and are not an exhaustive list of the technical ideas of this disclosure, and various equivalents and modifications may exist to replace them at the time of submission.

[0063] Furthermore, in describing this disclosure, detailed descriptions of relevant known configurations or features are omitted where such descriptions would obscure the essence of this disclosure.

[0064] Because the embodiments of this disclosure are provided to explain the disclosure more fully to those skilled in the art, the shapes and dimensions of the components in the drawings may be exaggerated, omitted, or shown schematically for clarity. Therefore, the dimensions or proportions of each component do not necessarily indicate its actual size or proportion.

[0065] Copper-based dust analysis system

[0066] The copper-based dust analysis system according to this disclosure is described in detail below.

[0067] Figure 1 This is a schematic diagram of a copper-based dust analysis system according to an exemplary embodiment of the present disclosure. (Reference) Figure 1 The copper-based dust analysis system 100 according to an exemplary embodiment of the present disclosure may include a digital microscope 110, a central processing unit 120, an output unit 130, an input unit 140, and memory units 150 and 160.

[0068] According to this disclosure, the central processing unit 120 is configured to perform color correction processing on images of the sample and a reference sample, respectively, to distinguish copper-based dust from other materials based on color. Furthermore, the central processing unit 120 is configured to detect copper-based dust in the image data of the sample based on image data of the reference sample stored in a memory unit, making the analysis process relatively easy and enabling rapid detection of dust particles with small diameters. Moreover, the copper-based dust analysis system 100 according to this disclosure can standardize the detection of copper-based dust because the image data of the reference sample serves as a standardized reference for detecting copper-based dust in the image of the sample.

[0069] The digital microscope 110 can be configured to generate images of both the sample and the reference sample, and convert them into digital image signals. The digital microscope 110 can optionally be configured to generate high-magnification images of both the sample and the reference sample, and convert the high-magnification images into digital image signals.

[0070] Additionally, the digital microscope 110 can be configured to capture images of each of the sample and the reference sample to generate each image of the sample and each image of the reference sample. In some embodiments, the digital microscope 110 can be configured to segment the sample into multiple regions and capture images of each of the multiple segmented regions. This allows for detailed analysis of high-magnification images of the sample. The segmented images of the sample can be sent to the central processing unit 120, or they can be sent to and stored in the memory units 150, 160.

[0071] In an exemplary embodiment, the digital microscope 110 may include: a stage configured to hold a sample or reference sample; an illumination unit configured to illuminate the stage with light; a camera configured to acquire each image of the sample or reference sample; and an optical unit configured to acquire high-magnification images of the sample or reference sample.

[0072] The central processing unit 120 can be configured to process the digitized image signal sent from the digital microscope 110 to generate image data and detect copper-based dust in the image data.

[0073] The central processing unit 120 can be configured to perform color correction processing, etc., on images of the sample and a reference sample, respectively, to facilitate the differentiation of copper-based dust in the images of the sample and the reference sample. Furthermore, the central processing unit 120 is configured to apply image data of the reference sample to the color-corrected image data of the sample to detect copper-based dust in the image of the sample. Therefore, the analysis system 100 of this disclosure can be used to automate a series of processes for detecting copper-based dust in images of samples.

[0074] In some embodiments, the central processing unit 120 may be configured to color-correct images of the sample and / or the reference sample to a blue hue to facilitate the identification of copper-based dust. In some embodiments, color correction can be achieved by adjusting the RGB values ​​in the image of the sample or the reference sample. For example, the R value may be adjusted to 1.78, the G value to 1.00, and the B value to 7.00. By comparing the B value with the R and G values ​​and adjusting the RGB values ​​to be higher, materials whose inherent color is in the blue range can be converted to the blue range. Copper metal has an original yellow to orange hue, and blue is a complementary color that contrasts with yellow to orange. Therefore, in the image of the sample or the reference sample, if the B value is adjusted to be greater than the R and G values, the color contrast effect can clearly distinguish copper metal from other materials.

[0075] Figure 2 This is a diagram illustrating the image before color correction processing performed by the central processing unit 120, and Figure 3 These are illustrations of images after color correction processing performed by the central processing unit 120. Referring to these images, the color correction processing converts the electrode material, other dust, and background to a blue hue, and displays the yellow to orange copper-based dust in a red hue, as shown. Figure 3 As shown in the image. Therefore, the red copper-based dust can be clearly distinguished from other materials.

[0076] In some embodiments, the central processing unit 120 may be configured to filter the color-corrected image of the sample and / or the color-corrected image of the reference sample, such that the copper-based dust is displayed in a color opposite to the blue hue.

[0077] Figure 4 It is a diagram pair Figure 3 The image was filtered to show an image with colors opposite to the blue hue. (Reference) Figure 3 and Figure 4 As can be seen, the slightly reddish material within the circular dotted line is copper-based dust, and the filtering process makes the copper-based dust more clearly distinguishable.

[0078] In some embodiments, by selecting Figure 3 The image displays a slightly reddish area, and the operator performs filtering by adjusting one or more of the color, brightness, and saturation of the selected area. Specifically, the operator can select via input unit 140. Figure 3 The image shows areas highlighted in red, and the color values ​​can be adjusted so that the selected areas appear in a color opposite to the blue hue. The operator can also adjust the brightness and / or saturation values ​​appropriately to more clearly distinguish copper-based dust as needed.

[0079] Figure 5 This is a diagram of the output screen, where the output is processed by the color adjustment process of the input section for filtering. The operator can select via the input section 140. Figure 3 The portion of the image shown in red is set within a range of 139 to 199, approximately ±30 units from the center axis representing the blue wavelength. Figure 5 As shown, and input inversion processing. The central processing unit 120 can then process... Figure 3 The selected portion of the image is inverted, so that... Figure 3 The selected portion of the image is displayed in a more vibrant red color. This can facilitate the detection of copper-based dust, significantly reducing the time required for its detection.

[0080] In some embodiments, the central processing unit 120 may be configured to remove dust particles with sizes smaller than a reference value from an image of a reference sample. Here, the dust particles may be only copper-based dust particles, or they may be dust particles including copper-based dust. The image of the reference sample serves as reference data for detecting copper-based dust in an image of the sample to be analyzed. If dust particles with sizes smaller than the reference value are removed from the image of the reference sample, only dust particles with sizes larger than the reference value can be detected in the image of the sample, which can significantly reduce the detection time of copper-based dust. For example, if dust particles with a size smaller than 5 μm × 5 μm are removed from the image of the reference sample, only dust particles with a size of 5 μm × 5 μm or larger can be detected in the image of the sample, which can significantly reduce the detection time of copper-based dust.

[0081] Images of the samples show various types and diameters of metallic dust, and it is not necessary to know the distribution levels of all sizes of metallic dust. Instead, it may be of interest to know the distribution levels of metallic dust above a certain size, or the distribution levels of metallic dust within a specific range of sizes. According to this disclosure, copper-based dust can be selectively detected in images of the samples based on color information, and only metallic dust of a specific size or a predetermined range of sizes can be detected, and compositional analysis can be performed on the detected copper-based dust. Therefore, the distribution levels and composition of copper-based dust of significant sizes can be determined very quickly, and a standardized method for analyzing the distribution levels and detailed composition of copper-based dust present in electrode manufacturing facilities or manufacturing sites can be provided.

[0082] The central processing unit 120 can be configured to detect copper-based dust by retrieving reference data, including image information of copper-based dust stored in memory units 150 and 160, and applying it to a color-corrected image of the sample as described above. The reference data may include a color-corrected image of a reference sample, a color-corrected and filtered image of a reference sample, etc.

[0083] The central processing unit 120 is configured to apply reference data to a color-corrected image of the sample or a color-corrected and filtered image of the sample. Therefore, a portion of the color-corrected image of the sample or a color-corrected and filtered image of the sample that is identified as identical to the reference data can be detected as copper-based dust.

[0084] In some embodiments, the central processing unit 120 can be configured to automatically calculate the quantity and size of detected copper-based dust particles based on an image of the sample. According to this disclosure, copper-based dust particles appear slightly reddish in an image of the sample; therefore, the central processing unit 120 can quickly detect copper-based dust particles based on color, count the quantity of detected copper-based dust particles, and automatically calculate the size of the copper-based dust particles based on the number of pixels in the area where the copper-based dust particles are detected.

[0085] In some embodiments, the central processing device 120 can detect copper-based dust by applying image data from a reference sample in batches to each of the segmented images obtained by dividing the sample into multiple regions, and can automatically calculate the quantity and size of the detected copper-based dust.

[0086] The output unit 130 can be configured to output images transmitted from the digital microscope 110 and image data generated by the central processing unit 120. The output unit is not limited to any type, as long as it can output digital image signals.

[0087] The image transmitted from the digital microscope 110 may be an image prior to color correction processing performed by the central processing unit 120. The image transmitted from the digital microscope 110 may be... Figure 2 The high-magnification images of the reference sample and the sample are shown.

[0088] In some embodiments, the image data generated by the central processing device 120 may include a color-corrected high-magnification image of the sample, a color-corrected high-magnification image of the reference sample, a color-corrected and filtered high-magnification image of the sample, and a color-corrected and filtered high-magnification image of the reference sample.

[0089] Furthermore, the output unit 130 can also be configured to output various information inputs via the input unit 140. For example, such as Figure 5 As shown, the output unit 130 can output various processing information input by the input unit.

[0090] The input unit 140 can be configured to input processing information for processing an image of a sample or an image of a reference sample. For example, based on processing information such as R values, G values, and B values ​​input by the input unit 140, the central processing unit 120 can perform color correction on the image of the sample or on the image of the reference sample, in order to... Figure 2 Image data generation shown Figure 3 The image data shown. Furthermore, based on the color filtering information input by the input unit 140, the central processing unit 120 can filter the color-corrected image of the sample so that the copper-based dust is displayed in a color opposite to the blue hue, or it can filter the color-corrected image of the reference sample so that the copper-based dust is displayed in a color opposite to the blue hue, according to... Figure 3 Image data generation Figure 4 Image data.

[0091] In this way, images of the sample and the reference sample generated by the digital microscope can be stored in memory units 150 and 160, respectively. Additionally, images of the sample and the reference sample that have undergone color correction by the central processing unit can also be stored in memory units 150 and 160. Images of the sample and the reference sample that have undergone color correction and filtering by the central processing unit can also be stored in memory units 150 and 160.

[0092] In some embodiments, the memory section may be divided into a first memory section 150 and a second memory section 160.

[0093] The first memory unit 150 can be configured to store image data of a reference sample processed by the central processing unit 120. The image data of the reference sample processed by the central processing unit 120 may include color-corrected image data and filtered image data. In addition to the image data of the reference sample, the first memory unit 150 may also store images of the reference sample transmitted from a digital microscope.

[0094] The second memory unit 160 can be configured to store image data of the sample processed by the central processing unit 120. The image data of the reference sample processed by the central processing unit 120 may include color-corrected image data and filtered image data. In addition to the image data of the reference sample, the second memory unit 160 may also store images of the sample transmitted from the digital microscope.

[0095] In some embodiments, the analysis system 100 may further include a component analysis unit (not shown) configured to analyze the composition of the detected copper-based dust. The component analysis unit can be used to verify whether the copper-based dust detected in an image of the sample is indeed copper-based dust.

[0096] In some embodiments, the component analysis unit (not shown) can be configured to perform component analysis via laser-induced breakdown spectroscopy (LIBS). Laser-induced plasma spectroscopy (LIBS) is a spectroscopic analysis method that focuses a laser beam onto a sample and uses plasma generated by light energy similar to electrical discharge as an excitation source. It offers advantages such as qualitative and quantitative analysis of almost all elements regardless of the sample's state, no sample pretreatment required, and real-time analysis due to its short analysis time.

[0097] Copper-based dust analysis methods

[0098] The copper-based dust analysis method according to this disclosure is described in detail below.

[0099] Figure 6 This is a flowchart illustrating a copper-based dust analysis method according to an exemplary embodiment of the present disclosure. (Reference) Figure 6 The copper-based dust analysis method according to this disclosure may include generating reference data (P110), preparing a sample (P120), processing an image of the sample (P130), and detecting copper-based dust (P140).

[0100] According to this disclosure, the detection of copper-based dust in images of the sample to be analyzed is based on reference data including image information of copper-based dust, enabling rapid and accurate detection of copper-based dust in sample images. Furthermore, the reference data provides standardized criteria for detecting copper-based dust in sample images, allowing the copper-based dust analysis method according to this disclosure to standardize the detection of copper-based dust.

[0101] The copper-based dust analysis method according to this disclosure can be performed using the copper-based dust analysis system described above. For example, the copper-based dust analysis system may include: a digital microscope configured to generate corresponding images of a sample and a reference sample, and to convert the images into digital image signals; and a central processing unit configured to process the digital image signals transmitted from the digital microscope to generate image data, and to detect copper-based dust in the image data of the sample based on the reference data including image information of copper-based dust, wherein the central processing unit may be configured to perform color correction processing on the images of the sample and the reference sample, respectively, so as to enable the differentiation of copper-based dust from other materials based on color.

[0102] The process of generating reference data (P110) can be a process of generating reference data that includes image information of copper-based dust. The reference data can serve as a reference for detecting copper-based dust in an image of the sample to be analyzed. The reference data can be a color-corrected image of a reference sample, or color-corrected and filtered image data based on an image of a reference sample. In such image data, electrode materials, other dust particles, and the background, which are not copper-based dust, appear in a blue color that is an inversion of the inherent color of copper metal, while copper-based dust appears in yellow to orange colors. This allows copper-based dust to be clearly distinguished from other materials by color, thereby enabling rapid and accurate detection of copper-based dust in the image data of the sample.

[0103] Figure 7 This is a flowchart illustrating a process for generating reference data according to an exemplary embodiment of the present disclosure. Reference Figure 7 The process of generating reference data according to an exemplary embodiment of the present disclosure (P110) may include: preparing a reference sample including copper-based dust (P111); obtaining an image of the reference sample; processing the image of the reference sample to facilitate the detection of copper-based dust in the image of the reference sample (P112); and storing the processed image of the reference sample as reference data (P113).

[0104] The process of preparing the reference sample (P111) is the process of preparing a reference sample including copper-based dust to obtain reference data. In addition to copper-based dust, the reference sample may also include at least one of electrode material and iron. Since the electrode manufacturing facility or electrode manufacturing site contains electrode material and metals such as iron in addition to copper-based dust, and the sample is prepared by collecting the aforementioned dust dispersed in the electrode manufacturing facility or electrode manufacturing site, the reference sample is preferably prepared to include one or more of electrode material and iron in addition to copper-based dust. The reference sample can be prepared to have a shape and size suitable for mounting on the stage of the digital microscope 110.

[0105] The process of processing the reference sample image (P112) involves obtaining and processing an image of the reference sample to facilitate the detection of copper-based dust in the collected image of the reference sample. The image of the reference sample can be generated by a digital microscope 110. Since copper-based dust has a micrometer-scale size, the image of the reference sample is preferably a high-magnification image.

[0106] In some embodiments, a high-magnification image of a reference sample can be obtained by: mounting the reference sample on the stage of a digital microscope 110, using an illumination unit to illuminate the reference sample mounted on the stage, and appropriately adjusting the optical unit (e.g., illumination aperture, polarizing filter) to obtain a high-magnification image of the reference sample.

[0107] The digital microscope 110 can generate a high-magnification image of the reference sample, convert it into a digital image signal, and send it to the central processing unit 120. The central processing unit 120 can convert the high-magnification image of the reference sample to facilitate the detection of copper-based dust.

[0108] In some embodiments, the process P112 of processing the image of the reference sample may include: color correcting the image of the reference sample to blue to facilitate the identification of copper-based dust in the image of the reference sample (P112-1); and filtering the color-corrected image of the reference sample to display a color opposite to blue in the color-corrected image of the reference sample (P112-2).

[0109] Color correction processing (P112-1) may include adjusting the RGB values ​​of the reference sample image. For example, the RGB values ​​may be adjusted so that the B value is higher than the R and G values, such as an R value of 1.78, a G value of 1.00, and a B value of 7.00. Copper metal has an inherent color ranging from yellow to orange, and blue is the complementary color that contrasts with yellow to orange. Therefore, in the reference sample image, adjusting the color values ​​so that the B value is greater than the R and G values ​​can clearly distinguish copper metal from other materials through the effect of color contrast. The image before color correction processing (P112-1) can be transformed into a more accurate representation of the original image (see [link to image]). Figure 2 ) converted to Figure 3 The images shown are color-corrected. Referring to these figures, the color correction process converts the electrode material, other dust particles, and background to blue, causing copper-based dust particles, which range in color from yellow to orange, to appear in red, as shown. Figure 3 As shown in the diagram. Therefore, copper-based dust with its red color can be clearly distinguished from other materials.

[0110] The filtering process (P112-2) is the process of color filtering the color-corrected image of the reference sample so that the copper-based dust is displayed in a color opposite to the blue hue.

[0111] Figure 4 It is a diagram pair Figure 3 The image was filtered to show an image with colors opposite to the blue hue. (Reference) Figure 3 and Figure 4 As can be seen, the slightly reddish material inside the circular dotted line is copper-based dust, and the filter has the effect of making the copper-based dust more clearly distinguishable.

[0112] In some embodiments, by selecting Figure 3The image displays a slightly reddish area, and the operator performs filtering by adjusting one or more of the color, brightness, and saturation of the selected area. Specifically, the operator can select via input unit 140. Figure 3 The image shows areas highlighted in red, and the color values ​​can be adjusted so that the selected area appears in a color opposite to the blue hue. The operator can also adjust the brightness and / or saturation values ​​appropriately to more clearly distinguish copper-based dust.

[0113] Figure 5 This is a diagram of the output screen, where the output is a color adjustment process performed by the input unit for filtering. The operator can select via the input unit 140. Figure 3 The portion of the image shown in red is set within a range of 139 to 199, approximately ±30 units from the center axis representing the blue wavelength. Figure 5 As shown, and input inversion processing. The central processing unit 120 can then process... Figure 3 The selected portion of the image is inverted, so that... Figure 3 The selected portion of the image is displayed in a more vibrant red color. This can facilitate the detection of copper-based dust, significantly reducing the time required for its detection.

[0114] In some embodiments, the process of processing the image of the reference sample (P112) may further include noise removal from the color-corrected or filtered image of the reference sample (P112-3). The noise removal process (P112-3) may include: removing dust particles below a reference value from the color-corrected or filtered image of the reference sample (P112-3-1); and filling blank areas in the color-corrected or filtered image of the reference sample (P112-3-2).

[0115] In the process of removing dust particles (P112-3-1), the dust particles can be either copper-based dust particles or dust particles that include copper-based dust. Since the image of the reference sample serves as reference data for detecting copper-based dust in the image of the sample to be analyzed, when dust particles with sizes smaller than the reference value are removed from the image of the reference sample, only dust particles with sizes larger than the reference value can be detected in the image of the sample, thereby improving the efficiency of the analysis. Specifically, if dust particles with a size smaller than 5 μm × 5 μm are removed from the image of the reference sample, the detection time for dust particles with a size larger than 5 μm × 5 μm in the sample image can be reduced.

[0116] The process of filling blank areas (P112-3-2) can be a process of filling blank areas so that the blank areas are the same color as the background, because when dust with a size smaller than the reference value is removed from the color-corrected or filtered image of the reference sample, the removed area becomes blank.

[0117] Images of the reference samples that have undergone this process can be stored in the memory unit as reference data. Images of the reference samples, images of reference samples with color correction, and images of reference samples with color correction and filtering are stored in the memory unit as reference data, and the reference data stored in the memory unit is used when copper-based dust is detected in the images of the samples.

[0118] The sample preparation (P120) process can be a process of preparing a sample to capture dust from the test article and facilitate the detection of copper-based dust. The test article can refer to an electrode manufacturing facility or an electrode manufacturing site. An electrode manufacturing facility is any facility used to manufacture electrodes, including but not limited to facilities for manufacturing electrode slurries, facilities for coating electrode slurries, facilities for transferring current collector sheets, facilities for drying electrodes, facilities for rolling electrodes, facilities for grooving electrodes, and facilities for cutting electrodes.

[0119] Figure 8 This is a flowchart illustrating a process for preparing a sample according to an exemplary embodiment of the present disclosure. Reference Figure 8 The process of preparing sample P120 may include: the initial capture process P121; and the secondary capture process P122.

[0120] The initial capture process P121 can be a process of initially rolling a dust cleaning roller on the surface of the sample to capture dust present on the surface of the sample using the dust cleaning roller.

[0121] Figure 9 This is a diagram illustrating the initial capture process according to an exemplary embodiment of the present disclosure. Reference Figure 9 To capture dust present on the test item, the operator rolls a dust cleaning roller 2 positioned on the surface of the test item 1. The dust cleaning roller 2 can be configured to adhere dust present on the surface of the test item to its surface by rolling. For example, the surface of the dust cleaning roller 2 can be coated with an adhesive material so that dust present on the rolling portion of the test item can adhere to the surface of the dust cleaning roller 2.

[0122] The secondary capture process P122 can be a process of transferring dust adhering to the dust cleaning roller to the capture paper by rolling the dust cleaning roller that was rolled initially onto the capture paper a second time.

[0123] Figure 10 This is a diagram illustrating a secondary capture process according to an exemplary embodiment of the present disclosure. Reference Figure 10 When the dust cleaning roller 2, which is initially rolled, is rolled onto the capture paper 3, the dust adhering to the dust cleaning roller 2 is transferred to the capture paper 3 by the adhesive component of the capture paper 3. At this time, the dust is transferred to the capture paper 3 in a single layer.

[0124] To transfer dust adhering to the surface of the dust cleaning roller 2 to the trapping paper 3, the surface of the trapping paper 3 is coated with an adhesive component. This adhesive component is more viscous than the adhesive component of the dust cleaning roller. Therefore, when the dust cleaning roller 2 rolls over the surface of the trapping paper 3, the dust adhering to the dust cleaning roller 2 can be transferred to the trapping paper 3. The trapping paper 3, upon which dust has been transferred, is kept closed by a trapping cover 4 to prevent contamination of the trapping paper. The trapping cover 4 may include a transparent window 4a, which comprises a transparent film.

[0125] The process of processing the sample image (P130) can be a process of obtaining an image of the sample and processing the image of the sample to facilitate the detection of copper-based dust in the collected sample image. Furthermore, the process of processing the sample image (P130) can be the same as or similar to the process of processing the reference sample image described above (P112).

[0126] In some embodiments, the copper-based dust analysis system described above can be used to perform the process of processing the sample image (P130). Specifically, the sample image can be generated by the digital microscope 110. Since copper-based dust has a micrometer-scale size, the sample image is preferably a high-magnification image.

[0127] In some embodiments, a high-magnification image of the sample can be obtained by mounting the sample on the stage of the digital microscope 110, illuminating the sample mounted on the stage with light using the illumination unit, and appropriately adjusting the optical unit (e.g., illumination aperture, polarizing filter, etc.).

[0128] The digital microscope 110 can generate high-magnification images of the sample, convert them into digital image signals, and send them to the central processing unit 120. The central processing unit 120 can convert the high-magnification images of the sample to facilitate the detection of copper-based dust.

[0129] The process of processing the sample image (P130) may include color correcting the sample image to blue to facilitate the identification of copper-based dust in the sample image (P131); and filtering the sample image to display a color opposite to blue in the color-corrected image of the sample (P132).

[0130] Since the processes of color correction (P131) and filtering (P132) of the sample image are identical in content to the processes of color correction (P112-1) and filtering (P112-2) of the reference sample image described above, the repeated descriptions will be omitted.

[0131] Images of the samples that have undergone these processes can be stored in the memory unit as data. That is, the sample image, the color-corrected image of the sample, and the color-corrected and filtered image of the sample are stored in the memory unit as data.

[0132] The process of detecting copper-based dust in an image of a sample is performed based on reference data (P140). The image of the sample can be a color-corrected image of the sample or a color-corrected and filtered image of the sample. The reference data can include a color-corrected image of a reference sample or a color-corrected and filtered image of a reference sample. The color-corrected image of the sample, the color-corrected and filtered image of the sample, the color-corrected image of the reference sample, and the color-corrected and filtered image of the reference sample are all converted to clearly distinguish copper-based dust by correcting at least one of color, saturation, and brightness.

[0133] According to this disclosure, copper-based dust is detected by applying reference data to an image of a sample, wherein the reference data is processed and transformed so that the copper-based dust can be clearly distinguished by color, thereby improving the reliability of copper-based dust detection.

[0134] In some embodiments, the process of detecting copper-based dust in an image of a sample (P140) may include calculating the quantity and size of the detected copper-based dust. As described above, when using the copper-based dust analysis system according to this disclosure, the quantity and size of the copper-based dust can be calculated automatically because the copper-based dust is detected by processing image data that has been converted into a digital signal.

[0135] In some embodiments, the copper-based dust analysis method may further include analyzing the composition of the detected copper-based dust (P150). The process of analyzing the composition of the detected copper-based dust (P150) can be performed after the process of detecting copper-based dust (P140). The process of analyzing the composition of copper-based dust (P150) is a process of analyzing the composition of the copper-based dust detected by the process of detecting copper-based dust (P140) to further analyze the composition of copper metal. In some embodiments, the process of analyzing the composition of copper-based dust (P150) can utilize laser-induced breakdown spectroscopy (LIBS) for compositional analysis. Therefore, components other than copper can be identified in the detected copper-based dust.

[0136] The present disclosure has been described in more detail above with reference to the accompanying drawings and embodiments. However, it should be understood that the configurations described in the drawings or embodiments are merely one embodiment of the present disclosure and do not represent all the technical ideas of the present disclosure, and various equivalents and modifications that can replace them may exist at the time of filing this application.

Claims

1. A copper-based dust analysis system, comprising: A digital microscope configured to generate corresponding images of a sample and a reference sample, and to convert the images into digital image signals; as well as A central processing unit configured to process the digitized image signal transmitted from the digital microscope to generate image data, and to detect the copper-based dust in the image data of the sample based on reference data including image information of the copper-based dust, wherein... The central processing unit is configured to perform color correction processing on the images of the sample and the reference sample, respectively, to distinguish the copper-based dust from other materials based on color.

2. The copper-based dust analysis system according to claim 1, wherein... The central processing unit is configured to perform color correction processing on the image of the sample or the image of the reference sample using a blue tint to facilitate the differentiation of the copper-based dust.

3. The copper-based dust analysis system according to claim 1, wherein... The central processing unit is configured to filter the copper-based dust such that the copper-based dust appears in a color opposite to the blue hue in the color-corrected image of the sample or the color-corrected image of the reference sample.

4. The copper-based dust analysis system according to claim 1, wherein... The central processing unit is configured to remove dust particles with sizes smaller than the reference value from the image of the reference sample.

5. The copper-based dust analysis system according to claim 1, wherein... The central processing unit is configured to automatically calculate the quantity and size of copper-based dust detected in the image of the sample.

6. The copper-based dust analysis system according to claim 1, wherein... The digital microscope is configured to divide the sample into multiple regions and to photograph each of the multiple regions.

7. The copper-based dust analysis system according to claim 1 further includes: An output unit configured to output images transmitted from the digital microscope and image data generated by the central processing unit; An input unit is used to input processing information for processing the image of the sample or the image of the reference sample; A first memory unit stores image data of the reference sample processed by the central processing device; as well as A second memory unit stores image data of the sample processed by the central processing device.

8. The copper-based dust analysis system according to claim 1 further includes: A component analysis unit is configured to analyze the composition of detected copper-based dust.

9. The copper-based dust analysis system according to claim 8, wherein... The component analysis unit is configured to perform component analysis using laser-induced breakdown spectroscopy (LIBS).

10. The copper-based dust analysis system according to claim 1, wherein... The digital microscope includes: A stage configured to hold a sample or a reference sample; An illumination unit, configured to illuminate the stage; A camera, configured to acquire each image of the sample or reference sample; as well as An optical section, which is used to obtain a high-magnification image of the sample or reference sample.

11. A method for analyzing copper-based dust, comprising: A copper-based dust analysis system is used to generate reference data that includes image information of copper-based dust. Samples are produced by capturing dust from test items; The copper-based dust analysis system is used to obtain an image of the sample, and the image of the sample is processed to facilitate the detection of the copper-based dust in the image of the sample; as well as The copper-based dust was detected in the image of the sample, wherein The detection of the copper-based dust is performed based on the reference data.

12. The method for analyzing copper-based dust according to claim 11, wherein... The copper-based dust analysis system includes: A digital microscope configured to generate corresponding images of a sample and a reference sample, and to convert the images into digital image signals; as well as A central processing unit configured to process the digitized image signal transmitted from the digital microscope to generate image data, and to detect the copper-based dust in the image data of the sample based on reference data including image information of the copper-based dust, wherein... The central processing unit is configured to perform color correction processing on the images of the sample and the reference sample, respectively, to distinguish the copper-based dust from other materials based on color.

13. The method for analyzing copper-based dust according to claim 11, wherein... The process of producing the sample includes: The initial capture process captures dust present on the surface of the test item by initially rolling a dust cleaning roller on the surface of the test item. as well as The secondary capture process involves transferring dust adhering to the dust cleaning roller to the capture paper by rolling the initially rotating dust cleaning roller a second time onto the capture paper. The adhesive component of the capture paper has a greater adhesive strength than the adhesive component of the dust cleaning roller.

14. The method for analyzing copper-based dust according to claim 11, wherein... The process of generating the reference data includes: Production of reference samples including copper-based dust; An image of a reference sample is obtained, and the image of the reference sample is processed to facilitate the detection of the copper-based dust in the image of the reference sample; and The processed image of the reference sample is stored as the reference data.

15. The method for analyzing copper-based dust according to claim 14, wherein... The process of processing the image of the reference sample includes: The image of the reference sample is color-corrected to blue, so that the image of the reference sample facilitates the identification of the copper-based dust. and The image of the reference sample is filtered so that a color opposite to blue is displayed in the color-corrected image of the reference sample.

16. The method for analyzing copper-based dust according to claim 15, wherein... The process of processing the image of the reference sample further includes removing noise from the color-corrected or filtered image of the reference sample, wherein The process of removing the noise includes: Remove dust particles below a threshold from the color-corrected or filtered image of the reference sample; and Fill the blank areas in the color-corrected or filtered image of the reference sample.

17. The method for analyzing copper-based dust according to claim 14, wherein... In addition to the copper-based dust, the reference sample also includes: At least one of the electrode material and iron.

18. The method for analyzing copper-based dust according to claim 11, wherein... The process of processing the image of the sample includes: The image of the sample was color-corrected to blue to facilitate the identification of the copper-based dust in the image of the sample; and The color-corrected image of the sample is filtered so that a color opposite to blue can be seen in the color-corrected image of the sample.

19. The method for analyzing copper-based dust according to claim 11, wherein... The process of detecting the copper-based dust includes: The size of the dust particles detected in the image of the sample is measured, and the number of dust particles is counted.

20. The method for analyzing copper-based dust according to claim 11, wherein... Following the process of detecting the copper-based dust, the procedure also includes: Analysis of the detected copper-based dust composition, including The process of analyzing the composition of the copper-based dust includes using laser-induced breakdown spectroscopy (LIBS).

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