New quality simulation electrostatic field surveying instrument and use method thereof

Abstract

The invention discloses a new quality simulation electrostatic field surveying instrument and a use method thereof, and belongs to the technical field of physical experiment equipment. The experimental platform comprises a simulation layer, a surveying and mapping layer, a recording layer and a double-end probe which are sequentially arranged from top to bottom, the two ends of the double-end probe make contact with the simulation layer and the recording layer respectively, the simulation layer is used for providing a microcrystal conducting medium, an electrode and a simulation electrostatic field, the surveying and mapping layer is used for detecting and drawing different equipotential points on different equipotential lines, and the recording layer is used for recording the different equipotential points. The recording layer is used for setting coordinate paper, the coordinate paper is in contact with the double-end probe, and the intelligent metering and controlling module is used for controlling the experimental platform to complete data acquisition, communication, feedback, command and dotting of different equipotential points and drawing of equipotential lines; compared with the prior art, the new quality simulation electrostatic field surveying instrument and the use method not only realize high-end science and technology, but also enable experiments to have the advantages of high efficiency, high quality and high tech.

Description

Technical Field

[0001] This invention relates to the field of physical experimental equipment technology, and in particular to a novel mass simulation electrostatic field mapping instrument and its usage method. Background Technology

[0002] Whether it's the static spark generated by accidental contact between two people in daily life, or the practical applications of electrostatic fields in everyday activities like painting and protection, as well as their applications in high-end scientific research fields such as integrated circuit manufacturing, exploration of microscopic particle properties, and aerospace, all demonstrate the significant importance of understanding electrostatic fields. Accurate measurement of field strength and precise mapping of electric field lines play a crucial role in understanding the characteristics of electrostatic fields and expanding their applications. This is equally important in university physics experimental teaching—electrostatic fields are a fundamental element in the electromagnetic system, and electrostatic field mapping is a core experiment in electromagnetics teaching, directly affecting students' understanding of field distribution patterns. Simulation methods and direct measurement methods are two basic approaches.

[0003] In the application of traditional equipment such as simulated electrostatic field mapping instruments, which are currently widely used, it is necessary to first measure and record the relevant equipotential points in the simulated electrostatic field; then, based on their smoothness, symmetry, and other characteristics, draw equipotential lines with dashed lines; finally, draw the electric field lines of each set of electrode plates (long parallel wires, long parallel plates, etc.) according to the perpendicular relationship between the electric field lines and the equipotential lines. These traditional devices have inherent limitations, and these technical bottlenecks severely restrict the accuracy and efficiency of electrostatic field mapping, making it difficult to accurately present the subtle gradient changes and complex distribution characteristics of the electric field. Taking the GVZ-3 and YJ-MJ-IIA electrostatic field plotters as examples, both have a double-layer structure with solid and liquid conductive media, respectively. The main problems are as follows: The former is more precise to manufacture and more expensive, but the long-term movement of the probe causes wear on itself and the microcrystalline conductive layer, and there will be a fixed mechanical deviation when the upper probe is pressed to pick up points; The latter uses water as a conductive medium, which will cause uneven conductivity due to vibration, and manual operation is prone to probe tilting, laser deflection, and inaccurate positioning. The probe is easily damaged during movement, and the size of the coordinate paper is also not suitable; In addition, both have a common problem, that is, there will be a certain error when manually marking equipotential points.

[0004] To address the aforementioned problems, this invention provides a novel simulated electrostatic field mapping instrument and its usage method, thereby resolving the issue of poor accuracy in previous simulated electrostatic field mapping instruments. Summary of the Invention

[0005] The purpose of this invention is to provide a novel electrostatic field simulation mapping instrument and its usage method, so that the experiment can achieve high efficiency, high quality and high innovation.

[0006] To achieve the above objectives, the present invention provides the following solution: A novel simulated electrostatic field mapping instrument includes an experimental platform, an intelligent control module, and a power supply for providing power to the experimental platform and the intelligent control module. The experimental platform includes, from top to bottom, a simulation layer, a mapping layer, a recording layer, and a dual-headed probe with its two ends in contact with the simulation layer and the recording layer, respectively. The simulation layer provides a microcrystalline conductive medium, electrodes, and a simulated electrostatic field. The mapping layer is used to detect and plot different equipotential points on different equipotential lines. The recording layer is used to set coordinate paper, which is in contact with the dual-headed probe. The intelligent control module controls the experimental platform to complete data acquisition, communication, feedback, command, point marking, and equipotential line plotting for different equipotential points.

[0007] Preferably, the simulation layer includes a first plate, an implanted electrode disposed on the top surface of the first plate, and a microcrystalline conductive layer disposed on the bottom surface of the first plate, wherein the top of the dual-ended probe is in contact with the microcrystalline conductive layer.

[0008] Preferably, the first plate body includes four sub-base plates, which are connected by grooves and protrusions.

[0009] Preferably, the mapping layer includes a support beam and a bidirectional guide rail disposed on the support beam. The bidirectional guide rail includes a transverse guide rail and a longitudinal guide rail disposed on the transverse guide rail, and the dual-headed probe is disposed on the longitudinal guide rail.

[0010] Preferably, the upper detection end of the dual-headed probe is provided with a ball bearing and a spring, and the lower detection end of the probe is provided with a push-pull electromagnetic dotting device and a replaceable ink elastic pen.

[0011] Preferably, the recording layer includes a second plate and coordinate paper disposed on the second plate.

[0012] Preferably, the second plate is provided with a storage slot of the same size as the coordinate paper, and the four corners of the storage slot are provided with pressure grooves.

[0013] Preferably, the simulation layer, the mapping layer, and the recording layer are detachably connected by support columns.

[0014] A method for using a novel electrostatic field simulation mapping instrument includes the following steps: Step 1: Assemble the experimental platform, connect the intelligent measurement and control module, and place the graph paper; Step 2: Using the bidirectional guide rail, adjust the dual-headed probe to the lower right corner; Step 3: Turn on the power supply to the analog layer; Step 4: Fine-tune the ball bearings on the detection section above the dual-headed probe to ensure close contact with the microcrystalline conductive layer; Step 5: The bidirectional guide rail controls the dual-headed probe to move to the left, detect, and mark points; Step six: When the dual-headed probe is about to reach the leftmost end, stop moving. Step 7: The bidirectional guide rail controls the dual-headed probe to move upwards by 5mm; Step 8: The bidirectional guide rail controls the dual-headed probe to move to the right, detect, and mark points; Step nine: When the dual-headed probe is about to reach the far right end, stop moving. Step 10: The bidirectional guide rail controls the dual-headed probe to advance upwards by another 5mm; Repeat steps five through ten; When the dual-headed probe moves to the appropriate position in the upper left corner of the platform, the first equipotential line is automatically drawn and retrieved. Place the second set of coordinate paper and repeat steps 8 → 9 → 10 → 5 → 6 → 7 → 8. At this point, the vertical movement of the double-ended probe changes from upward to downward. When the dual-headed probe moves to the appropriate position in the lower right corner of the platform, the second set of equipotential lines is automatically drawn and retrieved. Place the third set of coordinate paper and repeat steps five through ten. Repeat this process until the drawing is complete.

[0015] Preferably, the simulation layer, mapping layer, and recording layer are leveled before the experiment.

[0016] The present invention achieves the following technical effects compared to the prior art: This invention eliminates human error and improves the accuracy of equipotential point positioning and equipotential line drawing by using intelligent automatic point finding and high-precision mechanical point marking technology, thus significantly improving the accuracy and reference value of experimental data. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the structure of the present invention; The components are: 1. Simulation layer; 2. Mapping layer; 3. Recording layer; 4. Dual-head probe; 5. Horizontal guide rail; 6. Vertical guide rail; 7. Storage slot; 8. Pressing slot. Detailed Implementation

[0019] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0020] The purpose of this invention is to provide a novel electrostatic field simulation mapping instrument and its usage method, so that the experiment can achieve high efficiency, high quality and high innovation.

[0021] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0022] refer to Figure 1 A novel electrostatic field simulation mapping instrument includes an experimental platform, an intelligent control module, and a power supply for providing power to the experimental platform and the intelligent control module. The experimental platform includes, from top to bottom, a simulation layer 1, a mapping layer 2, a recording layer 3, and a double-ended probe 4 with its two ends in contact with the simulation layer 1 and the recording layer 3, respectively. The simulation layer 1 is used to provide a microcrystalline conductive medium, electrodes, and a simulated electrostatic field. The mapping layer 2 is used to detect and plot different equipotential points on different equipotential lines. The recording layer 3 is used to set coordinate paper, which is in contact with the double-ended probe 4. The intelligent control module is used to control the experimental platform to complete the data acquisition, communication, feedback, command, point marking, and equipotential line plotting of different equipotential points.

[0023] refer to Figure 1 The simulation layer 1 includes a first plate, an implanted electrode disposed on the top surface of the first plate, and a microcrystalline conductive layer disposed on the bottom surface of the first plate. The top of the dual-headed probe 4 is in contact with the microcrystalline conductive layer. In addition, the microcrystalline conductive layer electrodes that can be placed in the simulation layer 1 also include parallel plate electrodes, spot plate electrodes, coaxial cylindrical surface electrodes, etc.

[0024] refer to Figure 1 The first plate consists of four sub-base plates, which are connected by grooves and protrusions to ensure the conductivity of the dielectric and the stability of the overall structure.

[0025] refer to Figure 1The surveying layer 2 includes a support beam and a bidirectional guide rail set on the support beam. The bidirectional guide rail includes a transverse guide rail 5 and a longitudinal guide rail 6 set on the transverse guide rail 5. The double-headed probe 4 is set on the longitudinal guide rail 6. The probe can be moved repeatedly in the longitudinal direction by the handle turning clockwise or counterclockwise, i.e., by the manual lead screw. That is, the distance between different equipotential points on the same equipotential line can be controlled at will. The longitudinal guide rail 6 is placed on the transverse guide rail 5, which is a combination of an optical axis cylindrical slide rod and a lead screw. The motor is fixed to the lead screw through a coupling, i.e., the motorized lead screw controls the transverse repeated movement of the longitudinal guide rail 6, thereby realizing full coverage of measurement and marking.

[0026] refer to Figure 1 The four corners of the mapping layer 2 have eight mounting slots (with threads) for the support columns, which connect to the upper simulation layer 1 and the lower recording layer 3.

[0027] refer to Figure 1 The probe's detection end features a ball bearing and spring, reducing friction with the conductive layer, increasing service life, and ensuring tight contact and good conductivity. The probe's height can be adjusted by rotating the probe head. A push-pull electromagnetic dotting device and a replaceable ink flexible pen are connected below the probe. The electromagnetic dotting device is fixed to the outer wall of the probe housing and incorporates an automatic control system (provided by the intelligent measurement and control module). When the probe detects the desired potential point, it informs the system, issues a command, and controls the electromagnetic dotting, eliminating the instability of manual operation and ensuring accurate data acquisition. Simultaneously, the flexible tip of the replaceable ink flexible pen allows for smoother dotting. Here, the detection end above the probe and the dotting end of the flexible pen are at the center of the same cylinder, eliminating the problem of overall tilting and incorrect dotting along the same line caused by manual movement or pressing of the probe in the original experimental instrument. The double-headed probe 4 housing is connected by 3D-printed threads, facilitating disassembly and installation and ensuring greater robustness.

[0028] refer to Figure 1 Recording layer 3 includes a second plate and coordinate paper mounted on it. The second plate has access slots 7 of the same size as the coordinate paper, designed with reference to the actual size of A4 coordinate paper to ensure the paper's flatness, stability, and ease of marking. Similarly, recording layer 3 is composed of four sub-base plates joined together using a groove and protrusion connection method. Pressure grooves 8 are added at the four corners of the slots to ensure correct coordinate positioning and prevent slippage. Four mounting slots (without threads) for support columns are drawn at the upper corners of recording layer 3, corresponding to the mapping layer 2.

[0029] refer to Figure 1The experimental platform is assembled with the support beam of the intermediate mapping layer 2 as the dividing line. Eight support columns with threads on both the top and bottom are screwed into the mounting slots of the top and bottom plates respectively. The other end of the support column with the finer thread is inserted into the corresponding mounting slots of the simulation layer 1 and the recording layer 3 respectively, and fixed with nuts.

[0030] refer to Figure 1 The intelligent control module is connected to the detection end and marking end of the dual-head probe 4, as well as the motor on the transverse guide rail 5, to complete the self-controlled marking. Its main working process is as follows: the dual-head probe 4 moves left and right by controlling the forward and reverse rotation of the motor. During the movement, the ADC module continuously collects the voltage on the microcrystalline conductive layer (taking ITO conductive glass as an example) and compares it with the target voltage value set in the program. When the real-time voltage value is equal to the target voltage value, the main control chip issues a command to control the electromagnetic telescopic rod through the relay to complete the marking work.

[0032] The hardware utilizes the high-performance STM32C8T6 integrated board (48 pins, configured with 64KB Flash and 20KB RAM) as the main control chip. Its high clock speed, abundant resources, and powerful functionality enable it to perform the necessary data acquisition, display, processing, and control functions. The main control board's built-in ADC is used as the primary data acquisition device, offering sensitive response, accurate measurement, and rapid communication with the main control chip to ensure real-time data acquisition. For driving, a classic 74HC245 and 74HC138 driver combination is employed, saving I / O resources and improving scanning efficiency. For power, a geared motor controls the movement in one dimension, powered by a separate switching power supply to ensure a stable operating voltage, complementing its high torque. Motor start-up and stopping are controlled by buttons and relays, in conjunction with instructions from the main control chip. The electromagnetic telescopic rod, the main marking device, also uses a switching power supply, controlled by instructions from the main control chip and relays. The device also features a 56-inch digital display to show the real-time measured voltage values.

[0033] In conjunction with the hardware, the software design of the intelligent metering and control module mainly completes functions such as information acquisition, algorithm design, communication management, and numerical visualization. It primarily comprises four parts: the ADC section, the digital tube section, the motor button control section, and the dot-matrix control section. The workflow of each part is as follows: First, the ADC section mainly involves configuring the ADC channel based on the STM32F103X series chip. After configuration, the external voltage can be obtained through the PA1 pin. To ensure stable voltage acquisition, mean filtering is performed after the voltage value is obtained from the ADC, making the acquired voltage value more stable. Second, after obtaining a stable voltage, with the cooperation of 74HC245 and 74HC138, the correct segment code and bit code are written, and the measured voltage value can be displayed through the digital tube. Here, a timer is introduced to scan the digital tube to avoid program blocking and save main program resources. Third, the motor button control also uses a timer to scan the buttons, completing the button scanning by capturing the release action. Software interlocking is implemented in the motor operation program to ensure that short circuits do not occur during the motor's forward and reverse switching. Fourth, the key to the dot control part is how to determine the dot timing. Here, the method of introducing an error value is adopted. By introducing a very small error value, the difference between the double data is judged. The dot timing is when the difference is less than the error value. After the dot device executes the dot command, it enters a short cooling period to prevent continuous dotting within the same error range in a very short time.

[0034] The program design is flexible; the specific data for the equipotential lines can be set arbitrarily as needed, and the number of sampling points on each equipotential line can also be controlled manually using a lead screw. The following code, "double targets[] ={2.00, 3.00, 4.00, 5.00, 6.00, 7.00, 8.00};", sets and stores the specific data for the equipotential lines to be drawn using an array. This command draws 7 equipotential lines with potential values ​​ranging from 2 V to 8 V.

[0035] The specific method of using this invention includes the following steps: Step 1: Assemble the experimental platform, connect the intelligent measurement and control module, and place the graph paper; Step 2: Using the bidirectional guide rail, adjust the dual-headed probe 4 to the lower right corner; Step 3: Turn on the power supply for simulation layer 1; Step 4: Fine-tune the ball bearings on the detection section above the dual-headed probe 4 to ensure close contact with the microcrystalline conductive layer; Step 5: The bidirectional guide rail controls the dual-headed probe 4 to move to the left, detect, and mark points; Step six: When the dual-headed probe 4 is about to reach the leftmost end, stop moving. Step 7: The bidirectional guide rail controls the dual-head probe 4 to move upward by 5mm; Step 8: The bidirectional guide rail controls the dual-headed probe 4 to move to the right, detect, and mark points; Step nine: When the dual-headed probe 4 is about to reach the rightmost end, stop moving. Step 10: The bidirectional guide rail controls the dual-head probe 4 to move upwards by another 5mm; Repeat steps five through ten; When the dual-headed probe 4 moves to the appropriate position in the upper left corner of the platform, the first equipotential line is automatically drawn and retrieved. Place the second set of coordinate paper and repeat steps 8 → 9 → 10 → 5 → 6 → 7 → 8. At this time, the vertical movement of the double-headed probe 4 changes from upward to downward. When the dual-headed probe 4 moves to the appropriate position in the lower right corner of the platform, the second set of equipotential lines is automatically drawn and retrieved. Place the third set of coordinate paper and repeat steps five through ten. Repeat this process until the drawing is complete.

[0036] Based on the characteristic that electric field lines are perpendicular to equipotential lines, the electric field lines of the simulated electrode (long parallel wire, long parallel plate, etc.) are drawn with arrows as solid lines, with the arrow pointing from the positive pole to the negative pole.

[0037] Disconnect the circuit, tidy up the site, and complete the experiment.

[0038] The following points should be noted: (a) Before the experiment, the experimental platform must be leveled and stabilized to ensure the parallelism and stability of the simulation layer 1, the mapping layer 2 and the recording layer 3, which is conducive to the flexible movement and accurate marking of the dual-head probe 4.

[0039] (b) Do not short-circuit the power output terminal of the instrument during use, otherwise the power supply will be burned out.

[0040] (c) After the experiment is completed, disconnect the electrode wiring.

[0041] (d) Regularly clean simulation layer 1 and check the sensitivity and accuracy of the dual-head probe 4 and the bidirectional track.

[0042] Compared with existing technologies, the new simulated electrostatic field mapping instrument not only realizes the high-end nature of science and technology, but also makes the experiment have the advantages of high efficiency, high quality and high innovation.

[0043] High-end refers to two aspects. First, the product fully utilizes software and hardware technologies such as big data, 3D printing, and modular design thinking in C language to integrate new productivity factors into the electrostatic field mapping device, resulting in a high level of technological content. Second, the product incorporates protective measures in small details such as adding ball bearings and springs to the probe detection end, adding pressure grooves at the four corners of the coordinate paper, and adding threads to the support column and mounting groove. These measures can improve testing results, reduce equipment wear, and enhance the product's stability.

[0044] High efficiency refers to the fact that, taking the currently popular YJ-MJ-IIA electrostatic field plotter as a reference, the intelligent control module's data acquisition, communication, feedback, positioning, and point marking processes replace manual data collection, judgment, and labeling. This allows the previously at least 60 minutes to complete seven unformed equipotential lines containing 63 different equipotential points, which can now be completed in just 20 minutes, creating seven automatically formed equipotential lines containing 119 different equipotential points. In other words, the efficiency of the new simulated electrostatic field plotter is three times that of the original equipment.

[0045] High quality refers to the fact that intelligent operation replaces manual operation, which can solve the errors of manual operation in many aspects such as judgment, bias and plotting in the original experiment, and can achieve the effects of rapid response, accurate positioning and smooth printing, thereby ensuring the accuracy of experimental measurement data.

[0046] High-tech innovation, including the upgrading and improvement of experimental platforms from two to three layers, the development trend of electrostatic field from planar simulation to three-dimensional simulation and mapping, and the further optimization of the scientific nature and integration of experiments through technologies such as Internet+ and big data, can expand the teaching and research fields of university physics experiments and bring innovative space for popular science education.

[0047] Specific examples have been used to illustrate the principles and implementation methods of this invention. The descriptions of the above embodiments are only for the purpose of helping to understand the method and core ideas of this invention. Furthermore, those skilled in the art will recognize that, based on the ideas of this invention, there will be changes in the specific implementation methods and application scope. Therefore, the content of this specification should not be construed as a limitation of this invention.

Claims

1. A novel electrostatic field simulating mapping instrument, characterized in that, The system includes an experimental platform, an intelligent control module, and a power supply for providing power to the experimental platform and the intelligent control module. The experimental platform includes, from top to bottom, a simulation layer, a mapping layer, a recording layer, and a dual-headed probe with its two ends in contact with the simulation layer and the recording layer, respectively. The simulation layer provides a microcrystalline conductive medium, electrodes, and a simulated electrostatic field. The mapping layer is used to detect and plot different equipotential points on different equipotential lines. The recording layer is used to set up coordinate paper, which is in contact with the dual-headed probe. The intelligent control module controls the experimental platform to complete data acquisition, communication, feedback, command, point marking, and equipotential line plotting for different equipotential points.

2. The novel simulated electrostatic field mapping instrument according to claim 1, characterized in that, The simulation layer includes a first plate, an implanted electrode disposed on the top surface of the first plate, and a microcrystalline conductive layer disposed on the bottom surface of the first plate, wherein the top of the dual-ended probe is in contact with the microcrystalline conductive layer.

3. The novel simulated electrostatic field mapping instrument according to claim 2, characterized in that, The first plate body includes four sub-base plates, which are connected by grooves and protrusions.

4. The novel simulated electrostatic field mapping instrument according to claim 1, characterized in that, The mapping layer includes a support beam and a bidirectional guide rail disposed on the support beam. The bidirectional guide rail includes a transverse guide rail and a longitudinal guide rail disposed on the transverse guide rail. The dual-headed probe is disposed on the longitudinal guide rail.

5. The novel simulated electrostatic field mapping instrument according to claim 4, characterized in that, The upper detection end of the dual-headed probe is equipped with a ball bearing and a spring, while the lower detection end of the probe is equipped with a push-pull electromagnetic dotting device and a replaceable ink elastic pen.

6. The novel simulated electrostatic field mapping instrument according to claim 1, characterized in that, The recording layer includes a second plate and coordinate paper disposed on the second plate.

7. The novel simulated electrostatic field mapping instrument according to claim 6, characterized in that, The second plate is provided with a storage slot of the same size as the coordinate paper, and the four corners of the storage slot are provided with pressure grooves.

8. The novel simulated electrostatic field mapping instrument according to claim 1, characterized in that, The simulation layer, mapping layer, and recording layer are detachably connected by support columns.

9. A method of using a novel mass-simulating electrostatic field mapping instrument, characterized in that, The novel electrostatic field simulation mapping instrument according to any one of claims 1 to 8 comprises the following steps: Step 1: Assemble the experimental platform, connect the intelligent measurement and control module, and place the graph paper; Step 2: Using the bidirectional guide rail, adjust the dual-headed probe to the lower right corner; Step 3: Turn on the power supply to the analog layer; Step 4: Fine-tune the ball bearings on the detection section above the dual-headed probe to ensure close contact with the microcrystalline conductive layer; Step 5: The bidirectional guide rail controls the dual-headed probe to move to the left, detect, and mark points; Step six: When the dual-headed probe is about to reach the leftmost end, stop moving. Step 7: The bidirectional guide rail controls the dual-headed probe to move upwards by 5mm; Step 8: The bidirectional guide rail controls the dual-headed probe to move to the right, detect, and mark points; Step nine: When the dual-headed probe is about to reach the far right end, stop moving. Step 10: The bidirectional guide rail controls the dual-headed probe to advance upwards by another 5mm; Repeat steps five through ten; When the dual-headed probe moves to the appropriate position in the upper left corner of the platform, the first equipotential line is automatically drawn and retrieved. Place the second set of coordinate paper and repeat steps 8 → 9 → 10 → 5 → 6 → 7 → 8. At this point, the vertical movement of the double-ended probe changes from upward to downward. When the dual-headed probe moves to the appropriate position in the lower right corner of the platform, the second set of equipotential lines is automatically drawn and retrieved. Place the third set of coordinate paper and repeat steps five through ten. Repeat this process until the drawing is complete.

10. The method of using the novel simulated electrostatic field mapping instrument according to claim 9, characterized in that, Before the experiment, the simulation layer, mapping layer, and recording layer were leveled.

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