Test device and test system

Abstract

The invention relates to the technical field of electronics, and provides a testing device and a testing system.The testing device comprises a switching module, an analysis module and a tested hard disk; wherein the switching module is respectively connected with the storage server to be tested, the analysis module and the hard disk to be tested; the switching module is used for respectively establishing a connection relationship between the analysis module and the storage server to be tested and a connection relationship between the analysis module and the hard disk to be tested under the condition that the interfaces corresponding to the analysis module and the storage server to be tested are not matched; the analysis module is used for analyzing a protocol packet for transmitting data between the to-be-tested storage server and the tested hard disk and outputting an analysis result; the analysis result is used for representing the link signal quality between the to-be-tested storage server and the tested hard disk. According to the invention, the protocol layer for transmitting data between the storage server to be tested and the hard disk can be analyzed, so that the accuracy of link signal quality judgment is improved.

Description

Technical Field

[0001] This invention relates to the field of electronic technology, and more particularly to a testing device and a testing system. Background Technology

[0002] With the rise and development of digital circuits, the speed and frequency of electronic signals on the link are getting higher and higher, which not only poses a severe challenge to printed circuit board (PCB) design, but also puts forward higher requirements for signal quality testing.

[0003] In related technologies, in server production, storage servers are usually used in conjunction with hard drives to read hard drive information or perform read / write tests for factory acceptance. However, this testing method can only make a preliminary judgment on signal quality at a macro level and cannot make an in-depth judgment. It is very likely that there will be misjudgments on long-term stability, thereby reducing the accuracy of judging the link signal quality. Summary of the Invention

[0004] This invention provides a testing device and a testing system to address the shortcomings of existing technologies that can only test the storage server under test at the macroscopic level, thus reducing the accuracy of link signal quality judgment, and to improve the accuracy of link signal quality judgment.

[0005] This invention provides a testing device, comprising: an adapter module, an analysis module, and a hard disk under test; wherein,

[0006] The adapter module connects to the storage server under test, the analysis module, and the hard drive under test, respectively. The adapter module is used to establish connections between the analysis module, the storage server under test, and the hard drive under test when the interfaces of the analysis module and the storage server under test are incompatible. The analysis module is used to analyze the protocol packets of data transmitted between the storage server under test and the hard drive under test, and output the analysis results; the analysis results are used to characterize the link signal quality between the storage server under test and the hard drive under test.

[0007] According to a testing apparatus provided by the present invention, the adapter module includes a first converter and a second converter; wherein, a first end of the first converter is connected to the storage server under test, and a second end of the first converter is connected to an analysis module; a first end of the second converter is connected to the analysis module, and a second end of the second converter is connected to the hard disk under test; the first converter is used to establish a connection between the analysis module and the storage server under test; the second converter is used to establish a connection between the analysis module and the hard disk under test.

[0008] According to a testing device provided by the present invention, a first converter includes: a first connector and a second connector; wherein the first connector is connected to the second connector and the storage server under test, and the second connector is connected to an analysis module; the first end interface of the first connector is matched with the interface in the storage server under test, and the second end interface of the second connector is matched with the interface in the analysis module.

[0009] According to a testing device provided by the present invention, the second converter includes a third connector and a fourth connector; wherein the third connector is connected to the hard disk under test and the fourth connector respectively, and the fourth connector is connected to the analysis module; the first end interface of the third connector is matched with the interface of the hard disk under test, and the first end interface of the fourth connector is matched with the interface of the analysis module.

[0010] According to a testing device provided by the present invention, the interface of the analysis module includes a first interface and a second interface, the first interface being connected to the second end of a first converter, and the second interface being connected to the first end of a second converter.

[0011] According to a testing device provided by the present invention, the testing device further includes a first MiniSAS cable and a second MiniSAS cable, the first MiniSAS cable being connected to the second end and the first interface of the first converter respectively, and the second MiniSAS cable being connected to the first end and the second interface of the second converter respectively.

[0012] According to a testing apparatus provided by the present invention, the storage server under test includes at least one hard disk slot, and a first converter is inserted into any one of the hard disk slots.

[0013] According to a testing apparatus provided by the present invention, the testing apparatus further includes a power module connected to a second converter; the power module is used to supply power to the hard disk under test based on the second converter.

[0014] According to a testing device provided by the present invention, the second converter further includes: a fifth connector and a voltage regulation circuit; wherein, a first end of the fifth connector is connected to a power supply module, a second end of the fifth connector is connected to an input end of the voltage regulation circuit, and an output end of the voltage regulation circuit is connected to the hard disk under test; the voltage regulation circuit is used to regulate the power supply voltage provided by the power supply module.

[0015] The present invention provides a testing system, including a display device and any of the above-mentioned testing apparatuses, wherein the display device is connected to the analysis module in the testing apparatus; the display device is used to display the analysis results determined by the analysis module.

[0016] The testing apparatus and system provided by this invention utilize a conversion module to connect the storage server under test (DUT), the analysis module, and the hard drive under test (DUT) respectively. This establishes connections between the analysis module and both the DUT and DUT, enabling them to interface with the analysis module. Simultaneously, the analysis module analyzes the protocol packets of data transmitted between the DUT and DUT, outputting analysis results to determine the link signal quality between them. Thus, by using the conversion and analysis modules to analyze the protocol layer of data transmission between the DUT and DUT to determine link signal quality, this further protocol-level analysis improves the accuracy of link signal quality assessment compared to a preliminary macroscopic assessment. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in this invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0018] Figure 1 This is one of the structural schematic diagrams of the testing device provided by the present invention.

[0019] Figure 2 This is the second schematic diagram of the testing device provided by the present invention.

[0020] Figure 3 This is the third schematic diagram of the testing device provided by the present invention.

[0021] Figure 4A This is a schematic diagram of the structure of the first connector provided by the present invention.

[0022] Figure 4B This is a schematic diagram of the structure of the second connector provided by the present invention.

[0023] Figure 5 This is a front view of the external structure of the first converter provided by the present invention.

[0024] Figure 6 This is the fourth schematic diagram of the testing device provided by the present invention.

[0025] Figure 7A This is a schematic diagram of the structure of the third connector provided by the present invention.

[0026] Figure 7B This is a schematic diagram of the structure of the fourth connector provided by the present invention.

[0027] Figure 8This is a schematic diagram of the first converter and the second converter provided by the present invention spliced ​​together.

[0028] Figure 9 This is the fifth schematic diagram of the testing device provided by the present invention.

[0029] Figure 10 This is a schematic diagram of the test system provided by the present invention.

[0030] Figure label: 100: Test device; 110: Adapter module; 120: Analysis module; 130: Hard disk under test; 200: Storage server under test; 111: First converter; 112: Second converter; 1111: First connector; 1112: Second connector; 1121: Third connector; 1122: Fourth connector; 140: Power module; 1000: Test system; 1010: Display device. Detailed Implementation

[0031] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention.

[0032] Currently, signal testing methods mainly include using an oscilloscope to observe the signal eye diagram, using internal tools provided by the chip to test the internal receive eye diagram of the signal, or reading information from the hard drive of the storage server system under test or performing certain read and write tests. However, high-speed signals generally involve complex protocols, such as the Peripheral Component Interconnect Express (PCIE) standard, the Serial Attached SCSI (SAS) interface, and the Transmission Control Protocol / Internet Protocol (TCP / IP). The above testing methods cannot evaluate the signal protocol layer and can only make a preliminary judgment on the signal quality at a macro level. They are very likely to misjudge long-term stability, thereby reducing the accuracy of the judgment on the link signal quality.

[0033] To address the aforementioned problems, this invention provides a testing device that uses a conversion module and an analysis module to analyze the protocol layer of data transmission between the storage server under test and the hard drive under test to determine the link signal quality. Compared to a preliminary judgment at the macro level, further judgment at the protocol layer improves the accuracy of link signal quality assessment.

[0034] The following is combined with Figures 1-8 The test apparatus of the present invention is described.

[0035] Figure 1 This is one of the structural schematic diagrams of the testing device provided by the present invention, such as... Figure 1 As shown, the testing device 100 includes: an adapter module 110, an analysis module 120, and a hard disk under test 130; wherein,

[0036] The adapter module 110 is connected to the storage server under test 200, the analysis module 120 and the hard disk under test 130 respectively; The adapter module 110 is used to establish a connection relationship between the analysis module 120 and the storage server under test 200 and the hard disk under test 130 respectively when the interfaces of the analysis module 120 and the storage server under test 200 are mismatched. The analysis module 120 is used to analyze the protocol packets of data transmitted between the storage server under test 200 and the hard disk under test 130, and output the analysis results; the analysis results are used to characterize the link signal quality between the storage server under test 200 and the hard disk under test 130.

[0037] Here, the hard drive 130 under test can be a mechanical hard drive, and the storage server 200 under test has a hard drive slot for connecting the hard drive 130 under test.

[0038] Analysis module 120 can be software or hardware with the ability to analyze SAS protocol packets, such as a SAS analyzer.

[0039] Protocol packets for transmitting data are encapsulated according to specific protocol rules and contain control information and actual content of the data. Common transmission protocols include TCP / IP and SAS protocols.

[0040] Specifically, the adapter module 110 can connect the storage server under test 200 and the analysis module 120, and the adapter module 110 can also connect the hard disk under test 130 and the analysis module 120. Therefore, the storage server under test 200 and the hard disk under test 130 can transmit data to each other through the adapter module 110 and the analysis module 120. The storage server under test 200, the hard disk under test 130 and the analysis module 120 can both receive and send signals. At the same time, during the data transmission process, the analysis module 120 can capture the protocol packets of the data and analyze the protocol packets to obtain the analysis results; the link signal quality is obtained from the analysis results.

[0041] In this embodiment of the invention, the storage server under test 200 is connected to the analysis module 120 through the conversion module 110, and the analysis module 120 is connected to the hard disk under test 130 through the conversion module 110. This establishes a data transmission link between the storage server under test 200 and the hard disk under test 130. The hard disk under test 130 sends a connection request to the storage server under test 200, which receives the request and establishes a connection. The hard disk under test 130 constructs a request message according to the SAS protocol format and sends it to the storage server under test 200 through the link. After processing the request message, the storage server under test 200 constructs a response message according to the SAS protocol format and sends it to the hard disk under test 130 through the link. During the transmission process, the message passes through the analysis module. The analysis module obtains the protocol packets in the request message and response message. The analysis module 120 analyzes the protocol packets to determine the link signal quality. Compared to a preliminary judgment at the macro level, further judgment at the protocol level improves the accuracy of the link signal quality assessment.

[0042] Figure 2 This is a second schematic diagram of the testing device provided by the present invention, as shown below. Figure 2 As shown, the adapter module 110 includes a first converter 111 and a second converter 112; wherein,

[0043] The first end of the first converter 111 is connected to the storage server under test 200, and the second end of the first converter 11 is connected to the analysis module 120; the first end of the second converter 112 is connected to the analysis module 120, and the second end of the second converter 112 is connected to the hard disk under test 130. The first converter 111 is used to establish a connection between the analysis module 120 and the storage server under test 200; The second converter 112 is used to establish the connection between the analysis module 120 and the hard disk under test 130.

[0044] It should be understood that the storage server under test 200, the analysis module 120, and the hard disk under test 130 each have their own interfaces. The interfaces of the storage server under test 200 and the analysis module 120 are incompatible, requiring the first converter 111 to establish a connection between them. Similarly, the interfaces of the hard disk under test 130 and the analysis module 120 are incompatible, requiring the second converter 112 to establish a connection between them. This ensures that the analysis module 120 can transmit data with both the storage server under test 200 and the hard disk under test 130.

[0045] Figure 3 This is the third schematic diagram of the testing device provided by the present invention, as shown below. Figure 3 As shown, the first converter 111 includes: a first connector 1111 and a second connector 1112; wherein,

[0046] The first connector 1111 is connected to the second connector 1112 and the storage server under test 200, respectively, and the second connector 1112 is connected to the analysis module 120; the first end interface of the first connector 1111 matches the interface in the storage server under test 200, and the second end interface of the second connector 1112 matches the interface in the analysis module 120.

[0047] Here, the first end interface of the first connector 1111 is an interface that matches the interface of the storage server under test 200. For example, the interface of the storage server under test 200 is generally a female SAS connector. In order to insert the first connector 1111, the first end interface of the first connector 1111 can be a male SAS connector that matches the female SAS connector. The second end interface of the second connector 1112 is an interface that matches the interface of the analysis module 120. For example, if the analysis module 120 is a SAS analyzer and its interface is a MiniSAS interface, the second connector 1112 can be a MiniSAS interface.

[0048] Here, the second connector 1112 can be directly connected to the analysis module 120, or it can be indirectly connected through a medium (such as a MiniSAS cable).

[0049] Furthermore, the first connector 1111 and the second connector 1112 are integrated on the PCB board by connecting them with lines. The first connector 1111 and the second connector 1112 are connected by wiring on the PCB board to form the first converter 111.

[0050] Figure 4A This is a schematic diagram of the structure of the first connector provided by the present invention, as shown below. Figure 4AAs shown, the first connector 1111 is an interface with 29 pins, including pins S1-S14 and pins P1-P15. Pins S4, S7, S8, S11, S14, P4, P5, P6, P10, and P12 in the first connector 1111 are grounded.

[0051] Figure 4B This is a schematic diagram of the structure of the second connector 1112 provided by the present invention, as shown below. Figure 4B As shown, the second connector 1112 is a MiniSAS interface, which includes pins A1-A9, B1-B9, C1-C9, D1-D9, and S1-S7. Pins A3, A6, A9, B3, B6, B9, C3, C6, C9, D3, D6, D9, and S1-S6 of the second connector 1112 are grounded (DGND).

[0052] It should be understood that Figure 4A The first connector 1111 in Figure 4B The second connector 1112 in the first converter 111 is connected to the storage server under test 200 and the analysis module 120 via a connecting cable. For example, the S2 pin of the first connector 1111 is connected to the D4 pin of the second connector 1112 via the MCU0 ANALYBER SATA 0P line; the S3 pin of the first connector 1111 is connected to the D5 pin of the second connector 1112 via the MCU0 ANALYBER SATA 0N line; the S5 pin of the first connector 1111 is connected to the B5 pin of the second connector 1112 via the ANALYBER MCU0 SATA 0N line; the S6 pin of the first connector 1111 is connected to the B4 pin of the second connector 1112 via the ANALYBER MCU0 SATA 0P line; the S9 pin of the first connector 1111 is connected to the C7 pin of the second connector 1112 via the MCU1 ANALYBER SATA 1P line; and the S10 pin of the first connector 1111 is connected to the MCU1 ANALYBER SATA 120 via the MCU1 ANALYBER SATA 1P line. The 1N line is connected to pin C8 of the second connector 1112. Pin S12 of the first connector 1111 is connected to pin A8 of the second connector 1112 via the ANALYBER MCU1 SATA 1N line. Pin S13 of the first connector 1111 is connected to pin A7 of the second connector 1112 via the ANALYBER MCU1 SATA 1P line. Lines named "MCU0 ANALYBER SATA" indicate data transmission, and lines named "ANALYBER MCU0 SATA" indicate data reception.

[0053] further, Figure 4A The first connector 1111 is fully inserted into the female connector in the storage server 200 under test. Figure 4B The second connector 1112 is connected to one end of the MiniSAS cable, and the other end of the MiniSAS cable is connected to the analysis module 120.

[0054] further, Figure 5 This is a front view of the external structure of the first converter provided by the present invention, as shown below. Figure 5 As shown, the middle part 501 of the main view is where the second connector 1112 is located, connected to the analysis module 120; the protruding part 502 at the top of the main view is where the first connector 1111 is located, connected to the storage server under test 200. Figure 5 The first connector 1111 and the second connector 1112 are connected by a wire.

[0055] In this embodiment of the invention, the storage server under test 200 is connected via a first connector 1111, and the analysis module 120 is connected via a second connector 1112. Then, the first connector 1111 and the second connector 1112 are integrated together to form a first converter 111, thereby realizing data transmission between the storage server under test 200 and the analysis module 120. This is beneficial for the analysis module 120 to capture and analyze protocol packets in the transmitted data.

[0056] Figure 6 This is the fourth schematic diagram of the testing device provided by the present invention, as shown below. Figure 6 As shown, the second converter 112 includes: a third connector 1121 and a fourth connector 1122; wherein,

[0057] The third connector 1121 is connected to the hard disk under test 130 and the fourth connector 1122 respectively, and the fourth connector 1122 is connected to the analysis module 120; the first end interface of the third connector 1121 matches the interface of the hard disk under test 130, and the first end interface of the fourth connector 1122 matches the interface of the analysis module 120.

[0058] Here, the third connector 1121 is an interface that matches the interface of the hard drive under test. For example, if the hard drive interface is typically a male SAS connector, the third connector 1121 can be a female SAS connector that matches the male SAS connector. The fourth connector 1122 is an interface that matches the interface of the analysis module 120. For example, if the analysis module 120 is a SAS analyzer and its interface is a MiniSAS interface, the fourth connector 1122 can be a MiniSAS interface.

[0059] Here, the fourth connector 1122 can be directly connected to the analysis module 120, or it can be indirectly connected through a medium.

[0060] Furthermore, the third connector 1121 and the fourth connector 1122 are integrated on the PCB board, and the third connector 1121 and the fourth connector 1122 are connected by wiring on the PCB board to form the second converter 112.

[0061] Figure 7A This is a schematic diagram of the structure of the third connector provided by the present invention, as shown below. Figure 7A As shown, both the third connector 1121 and the first connector 1111 are 29-pin interfaces. The identical parts of the third connector 1121 and the first connector 1111 will not be described again. The difference between the third connector 1121 and the first connector is that pins P7-P9 of the third connector 1121 are connected to a 5-volt voltage, and pins P13-P15 are connected to a 12-volt voltage. It should be understood that in this embodiment of the invention, the storage server under test 200 and the hard disk under test 130 are not directly connected. To ensure the normal operation of the hard disk under test 130, it needs to be provided with an independent power supply. Therefore, the third connector 1121 is connected to a power supply to power the hard disk under test 130.

[0062] Figure 7B This is a schematic diagram of the structure of the fourth connector provided by the present invention, as shown below. Figure 7B As shown, the schematic diagram of the fourth connector 1122 is the same as that of the second connector 1112. It is a MinsSAS connector. The description of the fourth connector 1122 can be referred to the schematic diagram description of the second connector 1112 mentioned above, and will not be repeated here.

[0063] It should be understood that Figure 7A The third connector 1121 in Figure 7BThe fourth connector 1122 uses wires with the same names to achieve the connection function of the first converter 111. For example, the S2 pin of the third connector 1121 is connected to the B4 pin of the fourth connector 1122 via the ANALYBER HDD0SATA 0P line; the S3 pin of the third connector 1121 is connected to the B5 pin of the fourth connector 1122 via the ANALYBER HDD0 SATA 0N line; the S5 pin of the third connector 1121 is connected to the D5 pin of the fourth connector 1122 via the HDD0 ANALYBER SATA 0N line; the S6 pin of the third connector 1121 is connected to the D4 pin of the fourth connector 1122 via the HDD0 ANALYBER SATA 0P line; the S9 pin of the third connector 1121 is connected to the A7 pin of the fourth connector 1122 via the ANALYBER HDD1 SATA 1P line; and the S10 pin of the third connector 1121 is connected via the ANALYBER HDD1 SATA 1P line. The 1N line is connected to pin A8 in the fourth connector 1122. Pin S12 in the third connector 1121 is connected to pin C8 in the fourth connector 1122 via the HDD1 ANALYBER SATA 1N line. Pin S13 in the third connector 1121 is connected to pin C7 in the fourth connector 1122 via the HDD1 ANALYBER SATA 1P line.

[0064] further, Figure 7A The third connector 1121 is connected to the hard drive 130 under test. Figure 7B The fourth connector 1122 can be connected to one end of the MiniSAS cable, and the other end of the MiniSAS cable is connected to the analysis module.

[0065] In this embodiment of the invention, the hard disk under test 130 is connected through the third connector 1121 and the analysis module 120 is connected through the fourth connector 1122. Then, the third connector 1121 and the fourth connector 1122 are integrated together to form the second converter 112, thereby realizing data transmission between the hard disk under test 130 and the analysis module 120.

[0066] In another embodiment of the present invention, when the first connector 1111 is a male SAS connector and the third connector 1121 is a female SAS connector, the first connector 1111 (male SAS connector) and the third connector 1121 (female SAS connector) are connected together. The MiniSAS interface of the second connector 1112 and the MiniSAS interface of the fourth connector 1122 are respectively connected to the first MiniSAS cable and the second MiniSAS cable. The free ends of the first MiniSAS cable and the second MiniSAS cable are respectively connected to the device to be connected, so that the two shorter cables can be combined with the first converter 111 and the second converter 112 to form a longer MiniSAS extension cable with a bit width of 2 for use.

[0067] Figure 8 This is a schematic diagram of the splicing of the first converter and the second converter provided by the present invention, as shown below. Figure 8 As shown, the first connector 1111 in the first converter 111 and the third connector 1121 in the second converter 112 are connected, and the second connector 1112 and the fourth connector 1122 are respectively connected to the MiniSAS cable 810.

[0068] In this embodiment of the invention, the length of the MiniSAS cable is extended and the flexibility of its use is improved by splicing the first converter and the second converter together as a bridge connecting the two MiniSAS cables.

[0069] The analysis module 120 has a first interface and a second interface. The first interface is connected to the second end of the first converter 111, and the second interface is connected to the first end of the second converter 112.

[0070] It should be understood that the data protocol analyzed by the analysis module 120 must be the same as the interface protocol of the analysis module 120 in order to perform the analysis. The analysis module 120 needs to be connected to the first converter 111 and the second converter 112 respectively. Therefore, the analysis module 120 includes a first interface and a second interface, wherein the first interface matches the second terminal interface of the first converter 111, and the second interface matches the first terminal interface of the second converter 112. For example, if the analysis module 120 is a SAS analyzer, the first interface and the second interface are SAS interfaces.

[0071] In this embodiment of the invention, the first interface and the second interface of the analysis module 120 are respectively connected to the first converter 111 and the second converter 112, thereby realizing data transmission between the storage server under test 200, the analysis module 120 and the hard disk under test 130. At the same time, the analysis module 120 captures the protocol packets of the transmitted data, analyzes the protocol packets, and judges the link signal quality based on the analysis structure, thereby improving the accuracy of the link signal quality judgment. Furthermore, the storage server under test 200 is optimized based on the link signal quality, thereby improving the production quality of the storage server under test 200.

[0072] The testing device also includes a first MiniSAS cable and a second MiniSAS cable. The first MiniSAS cable is connected to the second end of the first converter 111 and the first interface, respectively, and the second MiniSAS cable is connected to the first end of the second converter 112 and the second interface, respectively.

[0073] Here, the SAS cable can be a MiniSAS data transfer cable, used for transferring data between SAS storage devices (such as hard drives).

[0074] It should be noted that the SAS interface is compatible with Serial Advanced Technology Attachment (SATA), allowing the simultaneous use of SAS and SATA devices in the same system. Therefore, the test system provided by this invention can be applied to both SAS and SATA hard drives.

[0075] It should be understood that interfaces are basically paired, divided into male and female connectors. Here, the second end of the first converter 111, the first interface of the analysis module 120, the first end of the second converter 112, the second interface of the analysis module 120, and the cable interface can be matched and connected, without being restricted to male or female connectors.

[0076] In this embodiment of the invention, by using a first SAS cable to connect the first interface and the first converter 111 of the analysis module 120, and a second SAS cable to connect the second interface and the second converter 112 of the analysis module 120, the performance, availability, expandability, and transmission speed of the storage server 200 under test, the analysis module 120, and the hard disk 130 under test are improved. At the same time, the SAS cable supports both SAS protocol hard disks and SATA protocol hard disks, improving the compatibility of the test system.

[0077] The storage server under test 200 includes at least one hard disk slot, and the first converter 111 is inserted into any of the hard disk slots.

[0078] Specifically, the storage server under test 200 may have one or more hard disk slots, and the first converter 111 can be inserted into each hard disk slot to test each hard disk slot on the storage server 200. For example, the second end of the first converter 111 is connected in series with the analysis module 120, the second converter 112, and the hard disk under test 130. The first end of the first converter 111 is inserted into the first hard disk slot on the storage server under test 200. The analysis module 120 analyzes the protocol packets of data transmitted between the first hard disk slot and the hard disk under test 130 to obtain the analysis results. Based on the analysis results, the link signal quality between the first hard disk slot and the hard disk under test 130 is determined. Then, the first end of the first converter 111 is inserted into the second hard disk slot on the storage server under test 200. The analysis module 120 analyzes the protocol packets of data transmitted between the second hard disk slot and the hard disk under test 130 to obtain the analysis results. Based on the analysis results, the link signal quality between the second hard disk slot and the hard disk under test 130 is determined. ... The first end of the first converter 111 is repeatedly used to traverse each hard disk slot on the storage server under test 200.

[0079] Here, the quality of the link signal of one hard disk slot on the storage server under test 200 can be used to characterize the quality of the storage server under test 200, or the quality of the link signal of multiple hard disk slots on the storage server under test 200 can be used to characterize the quality of the storage server under test 200. The present invention does not limit this.

[0080] In this embodiment of the invention, the quality of the storage server under test 200 is determined by testing the link signal quality of any one or more hard disk slots on the storage server under test 200, which increases the diversity of judgment and further improves the production quality of the storage server under test 200.

[0081] Figure 9 This is the fifth schematic diagram of the testing device provided by the present invention, as shown below. Figure 9 As shown, the test device 100 also includes a power module 140, which is connected to the second converter 112; the power module 140 is used to supply power to the hard disk under test 130 based on the second converter 112.

[0082] Here, the power module 140 can provide DC or AC power. If the power module 140 has 12V and 5V interfaces, it can be directly connected to the hard drive under test 130 without voltage adjustment. If the digital power supply only has a 12V interface, it can be connected to the second converter for voltage adjustment to generate 5V voltage and supply it to the hard drive under test.

[0083] Here, the storage server under test 200 is not directly connected to the hard disk under test 130, and the storage server under test 200 and the hard disk under test 130 are connected through the first converter 111, the analysis module 120, the second converter 112 and the MiniSAS cable. Therefore, an independent power supply module is required to power the hard disk under test 130.

[0084] In this embodiment of the invention, the power supply module 140 provides power to the hard disk 130 under test separately to ensure the normal operation of the test.

[0085] The second converter 112 further includes: a fifth connector and a voltage regulation circuit; wherein,

[0086] The first end of the fifth connector is connected to the power module, the second end of the fifth connector is connected to the input end of the voltage regulation circuit, and the output end of the voltage regulation circuit is connected to the hard disk 130 under test. The voltage regulation circuit is used to regulate the power supply voltage provided by the power module.

[0087] Here, the fifth connector can be a socket or plug for connecting the power module, and the fifth connector can be a Mini-Fit connector.

[0088] Here, the voltage regulation circuit can be any suitable circuit, such as a boost circuit, a buck circuit, a DC to DC circuit, an AC to DC circuit, etc.

[0089] In this embodiment of the invention, a voltage regulation circuit is used to adjust the power supply voltage provided by the power module 140 to provide a suitable voltage to the hard disk 130 under test, ensuring the normal operation of the test.

[0090] The following are application scenarios of the testing device provided by this invention.

[0091] In this application scenario, a SAS analyzer is used as analysis module 120. The SAS analyzer includes a first SAS interface and a second SAS interface. The hard drive under test 130 is a hard drive that supports the SATA protocol. The SAS protocol is compatible with SATA, so the SAS cable is suitable for storage devices that support the SATA protocol.

[0092] Specifically, the storage server under test 200 is connected to the first end of the male SAS connector in the first converter 111 (i.e., the first connector 1111 mentioned above), the second end of the male SAS connector is connected to the first end of the first MiniSAS connector (i.e., the second connector 1112 mentioned above), the second end of the first MiniSAS connector is connected to the first MiniSAS interface (i.e., the first interface mentioned above) through the first MiniSAS cable, the second MiniSAS interface (i.e., the second interface mentioned above) is connected to the first end of the second MiniSAS connector (i.e., the fourth connector 1122 mentioned above) in the second converter 112 through the second MiniSAS cable, the second end of the second MiniSAS connector is connected to the first end of the female SAS connector (i.e., the third connector 1121 mentioned above), the second end of the female SAS connector is connected to the hard disk under test 130, and the third interface of the SAS analyzer is connected to the display device.

[0093] The present invention also provides a testing system. Figure 10 This is a schematic diagram of the testing system provided by the present invention, as shown below. Figure 10 As shown, the testing system includes a display device 1010 and a testing apparatus 100 as described in any of the above claims. The display device 1010 is connected to the analysis module 120 in the testing apparatus. The display device 1010 is used to display the analysis results determined by the analysis module 120.

[0094] Specifically, the display device 1010 can be a stand-alone display screen or a display screen integrated into the device.

[0095] In the testing system provided in this embodiment of the invention, a switching module 110 is used to connect the storage server under test 200, the analysis module 120, and the hard disk under test 130, respectively. This establishes a connection between the analysis module 120 and both the storage server under test 200 and the hard disk under test 130, enabling them to match the interface of the analysis module 120. Simultaneously, the analysis module 120 analyzes the protocol packets of the data transmitted between the storage server under test 200 and the hard disk under test 130, obtaining analysis results. A display device 1010, connected to the analysis module 120, displays the analysis results, and the link signal quality between the storage server under test 200 and the hard disk under test 130 is determined based on the displayed analysis results. Thus, by using the switching module 110 and the analysis module 120 to analyze the protocol layer of the data transmitted between the storage server under test 200 and the hard disk under test 130, and displaying the analysis results on the display device to determine the link signal quality, the further analysis of the protocol layer improves the accuracy of the link signal quality assessment compared to a preliminary judgment at the macro level.

[0096] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.

[0097] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments or some parts of the embodiments.

[0098] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A testing device, characterized in that, include: The module consists of an adapter module, an analysis module, and the hard drive under test; among which, The adapter module is connected to the storage server under test, the analysis module, and the hard disk under test, respectively. The adapter module is used to establish connection relationships between the analysis module, the storage server under test, and the hard disk under test when the interfaces of the analysis module and the storage server under test are mismatched. The analysis module is used to analyze the protocol packets of data transmitted between the storage server under test and the hard disk under test, and output the analysis results; the analysis results are used to characterize the link signal quality between the storage server under test and the hard disk under test.

2. The testing apparatus according to claim 1, characterized in that, The adapter module includes a first converter and a second converter; wherein... The first end of the first converter is connected to the storage server under test, and the second end of the first converter is connected to the analysis module; the first end of the second converter is connected to the analysis module, and the second end of the second converter is connected to the hard disk under test. The first converter is used to establish a connection between the analysis module and the storage server under test; The second converter is used to establish a connection between the analysis module and the hard disk under test.

3. The testing apparatus according to claim 2, characterized in that, The first converter includes: a first connector and a second connector; wherein, The first connector is connected to the second connector and the storage server under test, and the second connector is connected to the analysis module; the first end interface of the first connector matches the interface in the storage server under test, and the second end interface of the second connector matches the interface in the analysis module.

4. The testing apparatus according to claim 2, characterized in that, The second converter includes: a third connector and a fourth connector; wherein, The third connector is connected to the hard drive under test and the fourth connector, respectively, and the fourth connector is connected to the analysis module; the first end interface of the third connector matches the interface of the hard drive under test, and the first end interface of the fourth connector matches the interface of the analysis module.

5. The testing apparatus according to claim 3 or 4, characterized in that, The analysis module has an interface including a first interface and a second interface. The first interface is connected to the second end of the first converter, and the second interface is connected to the first end of the second converter.

6. The testing apparatus according to claim 5, characterized in that, The testing device also includes a first MiniSAS cable and a second MiniSAS cable. The first MiniSAS cable is connected to the second end of the first converter and the first interface, respectively, and the second MiniSAS cable is connected to the first end of the second converter and the second interface, respectively.

7. The testing apparatus according to any one of claims 2-4, characterized in that, The storage server under test includes at least one hard disk slot, and the first converter is inserted into any of the hard disk slots.

8. The testing apparatus according to claim 2, characterized in that, The testing device further includes a power module connected to the second converter; the power module is used to supply power to the hard drive under test based on the second converter.

9. The testing apparatus according to claim 8, characterized in that, The second converter further includes: a fifth connector and a voltage regulation circuit; wherein, The first end of the fifth connector is connected to the power module, the second end of the fifth connector is connected to the input end of the voltage regulation circuit, and the output end of the voltage regulation circuit is connected to the hard disk under test. The voltage regulation circuit is used to regulate the power supply voltage provided by the power module.

10. A testing system, characterized in that, The device includes a display device and a testing apparatus as described in any one of claims 1-9, wherein the display device is connected to an analysis module in the testing apparatus; the display device is used to display the analysis results determined by the analysis module.

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