Method and device for determining key performance of JPA work
By automating the adjustment of parameters of the JPA and room-temperature electronics, the problem of low screening efficiency of JPA in the prior art is solved, and rapid and accurate performance determination is achieved, ensuring that the JPA meets the requirements in multi-bit chip experiments.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-10-13
- Publication Date
- 2026-03-10
AI Technical Summary
The existing JPA screening method is inefficient and cannot quickly determine the signal gain and bandwidth required for multi-qubit chip experiments, leading to repeated changes and adjustments, which affects the performance of superconducting quantum chips.
By using preset preliminary adjustment conditions and initial value selection conditions, combined with optimizer and signal-to-noise ratio gain curve screening conditions, the parameters of JPA and room temperature electronics are automatically adjusted to achieve automatic screening of multiple sets of test parameter combinations and calculation and visualization of signal gain and signal-to-noise ratio gain curves.
This enables rapid and accurate assessment of JPA performance, reduces manual intervention, improves screening efficiency, and ensures that JPA meets performance requirements in multi-bit chip experiments.
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Figure CN121633649A_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of amplifier testing, for example to a method and device for determining the key performance of a JPA. BACKGROUND
[0002] A Josephson Parametric Amplifier (JPA) is a quantum-limited noise amplifier that uses the non-linear inductance of a Josephson junction to achieve parametric amplification. It works at microwave frequencies and is an important device for improving the readout fidelity of superconducting quantum bits. In simple terms, it is an extremely sensitive “amplifier” that can amplify extremely weak quantum signals (such as those from quantum bits) to a level that can be read by classical electronic devices, while introducing almost no additional noise (its noise can reach the quantum limit). In recent years, among quantum computing schemes, superconducting quantum computing is the most likely to be realized. Superconducting quantum bits are currently developing towards multi-bit and large-scale research. The signal and signal-to-noise ratio gain and bandwidth of the JPA play a crucial role in multiplexing quantum bit high-fidelity readout, and will play an increasingly important role as the scale expands. However, when the JPA is applied to the readout link of a multi-bit chip, if the JPA signal gain and insertion loss behavior are not suitable, the readout signal will be damaged, and only by raising and lowering the temperature can a new JPA be replaced. Repeatedly replacing and adjusting the JPA not only takes time, but also easily causes additional impact on the superconducting quantum chip. It is crucial to ensure in advance that the signal gain and bandwidth of the JPA meet the experimental requirements of the multi-bit chip. Therefore, for experimental research applied to multi-bit chips, pre-screening of the JPA is a key link.
[0003] The screening method in the related art is usually manual screening. The screening of the JPA usually involves the case that multiple key parameters need to be adjusted synchronously. The current method can only obtain the key performance corresponding to the combination of one key parameter at a time. In order to meet the actual application of multi-bit measurement, a large amount of time is needed to realize the test screening of the key parameter combination of the JPA, obtain the key performance of the JPA, and then determine whether the JPA is usable and whether it meets certain specific experimental requirements of the superconducting quantum bit. Therefore, the efficiency of the current method for determining the key performance is low. SUMMARY
[0004] The present application aims to provide a method and device for determining the key performance of a JPA.
[0005] According to an aspect of the present application, a method for determining the key performance of JPA is provided, comprising: adjusting the room-temperature electronic device connected with the JPA according to preset preliminary adjustment conditions and initial value selection conditions, to generate a parameter initial value combination corresponding to test requirements; determining a plurality of test parameter combinations according to the parameter initial value combination, preset optimizer and signal-to-noise ratio gain curve screening conditions; determining the signal gain curve, signal-to-noise ratio gain curve and initial screening parameter combination corresponding to the signal gain curve and signal-to-noise ratio gain curve according to the plurality of test parameter combinations and preset signal-to-noise ratio gain optimization conditions; selecting a qualified curve in the signal gain curve and signal-to-noise ratio gain curve according to preset JPA determination conditions, and determining a target pumping parameter combination corresponding to the qualified curve in the initial screening parameter combination, so as to determine the key performance of the JPA based on the signal gain curve and signal-to-noise ratio gain curve corresponding to the target pumping parameter combination.
[0006] According to an aspect of the present application, a device for determining the key performance of JPA is provided, comprising: An initial value determination module is configured to adjust the room-temperature electronic device connected with the JPA according to preset preliminary adjustment conditions and initial value selection conditions, to generate a parameter initial value combination corresponding to test requirements. A plurality of parameter determination modules are configured to determine a plurality of test parameter combinations according to the parameter initial value combination, preset optimizer and signal-to-noise ratio gain curve screening conditions. A screening module is configured to determine the signal gain curve, signal-to-noise ratio gain curve and initial screening parameter combination corresponding to the signal gain curve and signal-to-noise ratio gain curve according to the plurality of test parameter combinations, room-temperature electronic device and preset signal-to-noise ratio gain optimization conditions. A target parameter determination module is configured to select a qualified curve in the signal gain curve and signal-to-noise ratio gain curve according to preset JPA determination conditions, and determine a target pumping parameter combination corresponding to the qualified curve in the initial screening parameter combination, so as to determine the key performance of the JPA based on the signal gain curve and signal-to-noise ratio gain curve corresponding to the target pumping parameter combination.
[0007] According to an aspect of the present application, an electronic device is provided, comprising: a processor; a memory storing a computer program, when the computer program is executed by the processor, the computer program causes the processor to execute the method as described above.
[0008] According to an aspect of the present application, a non-transitory computer readable medium is provided, which stores readable instructions, when the instructions are executed by a processor, the instructions cause the processor to execute the method as described above.
[0009] It should be understood that the above general description and the following detailed description are only exemplary and do not limit the present application.
[0010] Advantages: Through the above-mentioned embodiments provided by the present application, by combining the preset preliminary adjustment conditions and initial value selection conditions with the preset characteristics of the optimizer, the automatic interaction of the JPA adjustment and the room temperature electronic device is realized. The method can simultaneously and automatically set and continuously change multiple combinations of key parameters such as pump frequency and power, and quickly traverse a large number of parameter spaces without manual intervention. According to a plurality of test parameter combinations, a room temperature electronic device and preset optimization conditions of signal-to-noise ratio gain, a signal-to-noise ratio calculation module is integrated in the automatic test program. The computing system directly executes the signal-to-noise ratio gain calculation algorithm using the collected raw data, and visualizes the result curve and the signal gain curve on the computer interface, solves the limitations of the measuring instrument function, provides key performance indicators that cannot be directly obtained by the traditional manual method, and thus realizes more comprehensive and more accurate judgment of the JPA performance. BRIEF DESCRIPTION OF DRAWINGS
[0011] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without departing from the scope of the present application.
[0012] Figure 1 The structure diagram of the JPA working key performance determination system provided by the embodiments of the present application; Figure 2 The flowchart of the JPA working key performance determination method provided by the embodiments of the present application; Figure 3 The two-dimensional graph of S21 phase information provided by the embodiments of the present application; Figure 4 The signal gain curve and signal-to-noise ratio gain curve schematic diagram provided by the embodiments of the present application; Figure 5 The block diagram of the JPA working key performance determination device provided by the embodiments of the present application; Figure 6 The structure schematic diagram of the electronic device provided by the embodiments of the present application. DETAILED DESCRIPTION
[0013] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments, however, can be implemented in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. Like reference numerals refer to like elements throughout the drawings, and thus description thereof will not be repeated.
[0014] Furthermore, the described features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. Numerous specific details are provided in the following description to give a thorough understanding of embodiments of this application. However, those skilled in the art will recognize that the technical solutions of this application can be practiced without one or more of the specific details, or other methods, components, apparatuses, steps, etc., can be employed. In other instances, well-known methods, apparatuses, implementations, or operations are not shown or described in detail to avoid obscuring various aspects of this application.
[0015] The block diagrams shown in the accompanying drawings are merely functional entities and do not necessarily correspond to physically independent entities. That is, these functional entities can be implemented in software, in one or more hardware modules or integrated circuits, or in different network and / or processor devices and / or microcontroller devices.
[0016] The flowcharts shown in the accompanying drawings are merely illustrative and do not necessarily include all content and operations / steps, nor do they necessarily have to be performed in the described order. For example, some operations / steps can be broken down, while others can be combined or partially combined; therefore, the actual execution order may change depending on the specific circumstances.
[0017] It should be understood that although the terms first, second, third, etc., may be used herein to describe various components, these components should not be limited by these terms. These terms are used to distinguish one component from another. Therefore, the first component discussed below may be referred to as the second component without departing from the teachings of this application. As used herein, the term "and / or" includes all combinations of any one and more of the associated listed items.
[0018] Figure 1 A schematic diagram of the structure of a system for determining the key performance characteristics of JPA operation provided in an embodiment of this application. (See attached diagram.) Figure 1 As shown, JPA10 is connected to the MXC (Mixing Chamber) panel 11 and the room temperature electronics device 12. The MXC panel 11 lowers the temperature, providing a suitable operating environment for JPA10. The room temperature electronics device 12 is connected to JPA10. In some implementations, JPA10 and the MXC panel 11 can be integrally housed within the refrigeration unit.
[0019] For specific implementation details, please refer to the following examples.
[0020] Figure 2 This is a flowchart illustrating a method for determining key performance characteristics of JPA operation as provided in an embodiment of this application. This method can be applied to a test server. Figure 2As shown, the method includes steps S20, S21, S22 and S23.
[0021] In step S20, the room-temperature electronic device connected with the JPA is adjusted according to preset preliminary adjustment conditions and initial value selection conditions, to generate a parameter initial value combination corresponding to the test requirement.
[0022] In this application, the preliminary adjustment conditions can be used to represent the adjustment range of each adjustment of the room-temperature electronic device, the adjustment range of each parameter, etc., and the initial value selection conditions can be used to represent the selection method of each group of parameters generated in different adjustment processes, for example, the parameter combination value corresponding to the maximum gain is taken as the required parameter initial value. Referring to Figure 1 , the JPA is connected with the room-temperature electronic device. The room-temperature electronic device can include a microwave source, a direct current source and a vector network analyzer.
[0023] In some implementations, the room-temperature electronic device can be adjusted based on the preliminary adjustment conditions. For different adjusted parameters, the corresponding gain and other values of interest can be obtained, and the value meeting the initial value selection condition is taken as the parameter initial value combination of the test requirement. The parameter initial value combination can be used as the basis for further adjustment. The parameter initial value combination can include four important variable parameters: pump microwave frequency, pump microwave power, direct current bias and signal input power.
[0024] In step S21, a plurality of test parameter combinations are determined according to the parameter initial value combination, a preset optimizer and a signal-to-noise ratio gain curve screening condition.
[0025] The optimizer in this application can be an open source and mature optimizer. The parameters of the optimizer can be configured in advance, so that a plurality of test parameter combinations associated with the parameter initial value combination can be obtained based on the configured parameters. The signal-to-noise ratio gain curve screening condition can be a preset gain curve shape, so that the selected optimizer is optimized towards the preset gain curve to obtain a plurality of test parameter combinations associated with the parameter initial value combination.
[0026] In some implementations, the parameter initial value combination and the signal-to-noise ratio gain curve screening condition are taken as the input of the optimizer, and the optimizer can directly output a plurality of test parameter combinations.
[0027] In step S22, a signal gain curve, a signal-to-noise ratio gain curve and an initial screening parameter combination corresponding to the signal gain curve and the signal-to-noise ratio gain curve are determined according to a plurality of test parameter combinations and a preset signal-to-noise ratio gain optimization condition.
[0028] In the present application, the optimization condition of the signal-to-noise ratio gain can be preset, and the condition can be that the signal-to-noise ratio gain is greater than 5 dB, and the bandwidth greater than 5 dB is greater than 200 MHz. For a plurality of test parameter combinations, the original data generated by the JPA in operation is obtained by a vector network analyzer in a room temperature electronic device, and the voltage value of the original data corresponding to each combination of parameters can be calculated to obtain a signal gain curve and a signal-to-noise ratio gain curve under each combination of parameters. The output curves are compared with the preset condition to determine which combination of parameters meets the condition, and the combination meeting the condition is used as the preliminary screening parameter combination.
[0029] In step S23, according to the preset JPA determination condition, a qualified curve is selected from the signal gain curve and the signal-to-noise ratio gain curve, and a target pumping parameter combination corresponding to the qualified curve is determined in the preliminary screening parameter combination, so as to determine the key performance of the JPA in operation based on the signal gain curve and the signal-to-noise ratio gain curve corresponding to the target pumping parameter combination.
[0030] In the present application, the JPA determination condition can be a more specific screening condition, and the purpose is to select a more suitable combination from the preliminary screening parameter combination, and use the parameters in the combination as the target pumping parameters. The JPA determination condition can be specifically preset based on the performance qualification requirement.
[0031] In some implementations, the parameters corresponding to the signal gain curve are compared with the JPA determination condition to obtain the most qualified curve, and the combination corresponding to the qualified curve in the preliminary screening parameter combination is used as the target pumping parameter combination. The combination can be directly used as the input parameter of the JPA in use, and the signal gain curve and the signal-to-noise ratio gain curve corresponding to the combination are the best performance curves, based on which the key performance can be obtained. In the present application, the key performance can be used to represent the optimal signal gain and the optimal signal bandwidth, and the optimal signal-to-noise ratio gain and the optimal signal-to-noise ratio bandwidth.
[0032] The application realizes the driving of the room-temperature electronic device and the JPA by the automatic program through the preset preliminary adjustment condition, the initial value selection condition, the preset optimizer and the signal-to-noise ratio gain screening condition. The method can simultaneously and automatically set and continuously change multiple combinations of key parameters such as pump frequency and power, and quickly traverse a large number of parameter spaces without manual intervention. According to multiple sets of test parameter combinations, the room-temperature electronic device and the preset signal-to-noise ratio gain optimization condition, a signal-to-noise ratio calculation module is integrated in the automatic test program. The calculation system directly executes the signal-to-noise ratio gain calculation algorithm by using the collected voltage raw data, and visualizes the signal-to-noise ratio gain curve corresponding to the target pump parameter combination and the signal gain curve on the computer interface, solves the limitation of the measuring instrument function, provides the key performance indicators that cannot be directly obtained by the traditional manual method, and thus realizes the more comprehensive and more accurate judgment of the JPA performance.
[0033] According to some embodiments, the room-temperature electronic device can be adjusted multiple times according to the preliminary adjustment condition to generate multiple sets of parameter combinations; gain curves of the multiple sets of parameter combinations are obtained; and a parameter initial value combination is determined from the multiple sets of parameter combinations according to the gain curves and the initial value selection condition.
[0034] In some implementations, the preliminary adjustment condition can include: a process in which the output voltage is gradually increased from -1 V to 1 V, and one direct current bias is selected every 20 mV, and a total of 101 direct current bias values are set.
[0035] In the application, the room-temperature electronic device is generally three, which can be adjusted multiple times based on the preliminary adjustment condition. Each adjustment needs to adjust the parameters of the three room-temperature electronic devices synchronously, and each adjustment corresponds to a set of parameter combinations, and thus multiple sets of parameter combinations are obtained. The gain curve generated by the vector network analyzer in the room-temperature electronic device for each set of parameter combinations can be directly obtained, and the parameter initial value combination corresponding to the curve meeting the condition in the gain curve is selected by using the initial value selection condition.
[0036] In some implementations, the adjustment of the room-temperature electronic device can also be manual. The technician can first prepare the JPA chip by micro-nano processing means and wire-bonding packaging into an aluminum sample box, install the box in the internal installation of the refrigerator, the JPA can be individually composed into a line or can be connected in series with the bit on the output line of the transmission line, and the input end is added with a 70 dB attenuator and an infrared filter element. Through the circulator, the input line and the output line are connected to the S end of the JPA, and the pump line is connected to the P end of the JPA; after the wiring is completed, the refrigerator is vacuumized, and the refrigeration system is started, and the MXC disc temperature of the refrigerator is waited to be reduced to below 20 mK. The microwave source, the direct current source and the vector network analyzer are three room-temperature electronic devices, which are connected to the internal refrigerator and form a loop with the JPA.
[0037] The JPA signal gain curve is manually adjusted to obtain four key parameters, namely the combination of initial values of signal input power (generated by the vector network analyzer), pump microwave frequency (generated by the microwave source), pump microwave power (generated by the microwave source), and DC bias (generated by the DC source). In the specific manual operation process, by setting the DC bias on the DC source, the DC bias is scanned from 1 V to 1 V, and 101 DC bias values are selected at every 20 mV. The input signal range is set to 6 GHz-8 GHz on the vector network analyzer, and the S21 phase curve in the input signal frequency range under different DC biases is observed on the vector network analyzer. Therefore, the two-dimensional graph of the S21 phase information output by the vector network analyzer is obtained, as shown in the figure. The vertical coordinate Frequency is used to represent the input signal frequency, the horizontal coordinate DC_bias is used to represent the DC bias value, and the top JPA_FB_13 S21 VS Flux is used to represent the JPA number and the name of the graph (the relationship between the S21 phase information, the DC bias, and the input signal frequency). Figure 3 The phase modulation of the JPA is shown to exhibit periodic changes with the DC bias. The phase diagram is a key data graph for determining whether the JPA device can work initially, and can guide the technician to obtain the DC bias value corresponding to the maximum phase change at 7 GHz. The DC bias value corresponding to the maximum phase change is periodic, and in order to avoid the introduction of heat, the ideal value is selected as the minimum value on the DC bias period without affecting the signal gain. After obtaining the DC bias value corresponding to the maximum phase change, the pump frequency is adjusted coarsely in the range of 13.5 GHz-14.5 GHz with a step of 10 MHz (this range is obtained based on the Josephson junction resistance corresponding to the JPA pump frequency of the JPA design), the pump power is adjusted coarsely in the range of -20 dBm-20 dBm with a step of 0.1 dBm, and the combination of the above three pump parameters (pump microwave frequency, pump microwave power, and DC bias) will obtain the initial S21 signal gain curve. Then, the pump frequency and the pump power are fine-tuned based on the values determined by the coarse adjustment. Specifically, the pump frequency is fine-tuned with a step of 1 MHz, the pump power is fine-tuned with a step of 0.01 dBm, and the DC bias is fine-tuned in the range of ±5 mV around the obtained DC bias value to determine a more accurate pump parameter combination value. An optimal S21 signal gain curve observed on the vector network analyzer is obtained (the curve needs to satisfy a signal gain of more than 10 dB, and the 10 dB signal gain bandwidth is greater than 200 MHz). Therefore, a set of parameter combinations is determined, which is defined as the initial parameter combination. Figure 3 The phase modulation of the JPA is shown to exhibit periodic changes with the DC bias. The phase diagram is a key data graph for determining whether the JPA device can work initially, and can guide the technician to obtain the DC bias value corresponding to the maximum phase change at 7 GHz. The DC bias value corresponding to the maximum phase change is periodic, and in order to avoid the introduction of heat, the ideal value is selected as the minimum value on the DC bias period without affecting the signal gain. After obtaining the DC bias value corresponding to the maximum phase change, the pump frequency is adjusted coarsely in the range of 13.5 GHz-14.5 GHz with a step of 10 MHz (this range is obtained based on the Josephson junction resistance corresponding to the JPA pump frequency of the JPA design), the pump power is adjusted coarsely in the range of -20 dBm-20 dBm with a step of 0.1 dBm, and the combination of the above three pump parameters (pump microwave frequency, pump microwave power, and DC bias) will obtain the initial S21 signal gain curve. Then, the pump frequency and the pump power are fine-tuned based on the values determined by the coarse adjustment. Specifically, the pump frequency is fine-tuned with a step of 1 MHz, the pump power is fine-tuned with a step of 0.01 dBm, and the DC bias is fine-tuned in the range of ±5 mV around the obtained DC bias value to determine a more accurate pump parameter combination value. An optimal S21 signal gain curve observed on the vector network analyzer is obtained (the curve needs to satisfy a signal gain of more than 10 dB, and the 10 dB signal gain bandwidth is greater than 200 MHz). Therefore, a set of parameter combinations is determined, which is defined as the initial parameter combination.
[0038] The application can obtain multiple sets of parameter combinations by adjusting the room-temperature electronic device multiple times according to the preset preliminary adjustment condition, comprehensively covers the parameter range that the JPA performance may involve, and provides a rich data basis for subsequent accurate optimization. The gain curves of the multiple sets of parameter combinations can intuitively present the performance and change trend of the JPA under different parameter combinations, and provide a quantitative basis for parameter screening. Finally, the parameter initial value combination is determined according to the gain curve and the initial value selection condition, which effectively improves the accuracy and scientificity of the parameter initial value selection, ensures that the JPA can operate with better performance parameters in the initial adjustment state, reduces the subsequent screening time and cost, and improves the efficiency of screening the JPA.
[0039] According to some embodiments, the parameter initial value combination includes a signal input power initial value and a pump parameter initial value. Based on the signal input power initial value, multiple sets of pump parameters can be determined according to the optimizer and the preset combination reselection condition; the signal-to-noise ratio gain curves corresponding to the multiple sets of pump parameters are obtained, and the preliminary target pump parameters are determined according to the signal-to-noise ratio gain curves and the signal-to-noise ratio gain curve screening condition; and the pump parameter initial value and the preliminary target pump parameters are determined as multiple sets of test parameter combinations.
[0040] In the application, the parameter initial value combination can include two parts, the input power initial value as one of the inputs and adjustable, and the pump parameter initial value as the input but fixed during the test. The pump parameter initial value includes a pump microwave frequency initial value, a pump microwave power initial value and a direct current bias initial value.
[0041] The combination reselection condition can be set in advance, which defines the selection method of the data "close" to the signal input power initial value. A data range that can represent "close" can be defined in advance.
[0042] In the case where the signal input power initial value is part of the input of the JPA, multiple sets of pump parameters with small differences from the parameter initial value combination can be selected according to the process of the above embodiments based on the optimizer and the combination reselection condition. The signal-to-noise ratio gain curves corresponding to the multiple sets of pump parameters can be obtained. In the application, a curve generation program can be set in advance, which is used to process the multiple sets of pump parameters to obtain the signal-to-noise ratio gain curve corresponding to each set of pump parameters. The signal-to-noise ratio gain curves are detected by using the signal-to-noise ratio gain curve screening condition, and multiple sets of pump parameters corresponding to the curves that meet the condition are determined as the preliminary target pump parameters. The pump parameter initial value in the original parameter initial value combination and the obtained preliminary target pump parameters are used as multiple sets of test parameter combinations.
[0043] The application explicitly combines the signal input power initial value and the pump parameter initial value, which lays a clear and key foundation for subsequent parameter optimization and testing, and makes the entire parameter adjustment process have a clear starting point and reference basis. In determining multiple sets of test parameter combinations, multiple pump parameters are determined based on the signal input power initial value, with the aid of a preset optimizer, combination reselection conditions, and signal-to-noise ratio gain curve screening conditions. This approach fully utilizes the intelligent analysis capabilities of the optimizer and the screening effect of the combination reselection conditions, and can efficiently and accurately explore multiple pump parameter combinations with different characteristics, greatly expanding the search range and possibilities of the parameters. Finally, the preliminary target pump parameters that meet the signal-to-noise ratio gain curve screening conditions are combined with the pump parameter initial value to form multiple sets of test parameter combinations, providing a rich and comprehensive parameter sample for subsequent testing work, which helps to screen out the best performance indicators of the JPA.
[0044] According to some embodiments, the signal gain curve and the signal-to-noise ratio gain curve can be analyzed based on the JPA determination condition to determine whether there is a qualified curve; in the case where there is a qualified curve, the optimal signal gain, the optimal signal bandwidth, the optimal signal-to-noise ratio gain, and the optimal signal-to-noise ratio bandwidth of the JPA operation are determined from the signal gain curve and the signal-to-noise ratio gain curve corresponding to the target pump parameter combination corresponding to the qualified curve, and the optimal signal gain, the optimal signal bandwidth, the optimal signal-to-noise ratio gain, and the optimal signal-to-noise ratio bandwidth are determined as the key performance; in the case where there is no qualified curve, the parameter initial value combination is updated.
[0045] In the application, the parameters displayed in the signal gain curve and the signal-to-noise ratio gain curve can be compared according to the JPA determination condition. If the comparison is successful, it indicates that there is a qualified curve, otherwise there is not.
[0046] In the case where there is a qualified curve, it can be considered that there is the most suitable parameter combination in the preliminary screening parameter combination. At this time, the pump parameters corresponding to the qualified curve can be taken as the target pump parameter combination, and the signal gain curve and the signal-to-noise ratio gain curve under this combination can be output by the room-temperature electronic device, and then the optimal signal gain, the optimal signal bandwidth, the optimal signal-to-noise ratio gain, and the optimal signal-to-noise ratio bandwidth can be selected as the key performance according to the requirements. This facilitates the selection of a suitable JPA for experiments according to the key performance when the JPA is put into use later.
[0047] If there is no qualified curve, the parameter initial value combination update method can be called to update the parameter initial value combination, and then the preliminary screening parameter combination is re-determined.
[0048] In some implementations, the pump frequency initial value variation range = ±10 MHz, the pump power initial value variation range = ±0.2 dBm, and the DC bias initial value variation range = ±20 mV. By performing the method of the present application, the initial values of the three key pump parameters are optimized according to the signal gain curve and the signal-to-noise ratio gain curve. At least 10 sets of data curves are collected by the vector network analyzer for the S21 signal raw data, which takes about 3 minutes. Each set of parameters collects S21 raw data for at least 40 curves, and calculates the average S21 signal gain and signal-to-noise ratio gain curve, as shown in Figure 4 Figure 4 The abscissa of (a) and (b) represents the scanning frequency range 6-8 GHz on the vector network analyzer; the ordinate of (a) represents the average signal of the logarithmic amplitude of S21 measured 40 times (the corresponding curve S21 Gain is the signal gain); the ordinate of (b) represents the signal-to-noise ratio (SNR) value of S21 measured 40 times (the corresponding curve SNR Gain is the signal-to-noise ratio gain). Figure 4 (a) and (b) can obtain the average gain curve and bandwidth of S21 signal and signal-to-noise ratio, wherein DC Bias@0.0440 and MWFrequency@13.890GHz represent that the DC bias value for obtaining this gain curve is 0.0440 V and the pump microwave frequency is 13.890 GHz. The corresponding values in the figure represent that the bandwidth of the signal gain greater than 10 dB is (7.35-6.54) GHz =810 MHz; the bandwidth of the signal-to-noise ratio gain greater than 5 dB is (7.54-6.34) GHz =1200 MHz. According to the JPA judgment condition in the present application, among the above-mentioned 10 sets of JPA pump signal gain and signal-to-noise ratio gain curves, select the qualified curve, and obtain the corresponding set of pump parameters as the target pump parameters.
[0049] The application analyzes the signal gain curve and the signal-to-noise ratio gain curve based on the preset JPA determination condition to determine whether there is a qualified curve, which provides clear and scientific judgment basis for subsequent operations. By strictly following the JPA determination condition, the specific performance curve can be accurately screened, the error caused by subjective judgment can be effectively avoided, and the accuracy and reliability of the curve screening are ensured. When there is a qualified curve, the target pump parameter corresponding to the qualified curve is used as the key parameter under the JPA input, which directly locks the parameter that can make the amplifier achieve the ideal performance state, providing parameter guidance for the actual operation of the amplifier. In the case where there is no qualified curve, the parameter initial value combination is updated in time, which reflects the flexibility and adaptability of the technical scheme. This dynamic adjustment mechanism can quickly respond according to the curve analysis result, explore new parameter space by adjusting the parameter initial value combination, provide new possibility for subsequent curve analysis and parameter determination, help to continuously optimize the performance of the amplifier, find the parameter combination that meets the requirements, and finally determine the JPA key performance, thereby improving the efficiency of the entire research and debugging process.
[0050] According to some embodiments, in the case where there is no qualified curve, a preset power adjustment mode can be selected based on the test requirement; the signal input power initial value in the parameter initial value combination is adjusted based on the power adjustment mode to determine a signal input power updated value; the signal input power updated value and the pump parameter initial value in the parameter initial value combination are taken as an updated parameter initial value combination, so as to determine an updated plurality of test parameter combinations based on the updated parameter initial value combination, the optimizer and the signal-to-noise ratio gain curve screening condition.
[0051] In the application, the power adjustment mode can be preset, which can include changing the output power setting of the vector network analyzer and directly connecting the attenuator on the room temperature input line. Among them, for the mode of directly connecting the attenuator on the room temperature input line, the attenuator with a certain attenuation can be connected in the refrigerator in advance, or the manual addition can be performed on the room temperature line part when needed.
[0052] The correspondence between different test requirements and power adjustment modes can be preset, and then the currently used power adjustment mode is determined. The signal input power is adjusted according to the power adjustment mode to obtain a signal input power updated value. Then the signal input power updated value and the previously determined pump parameter initial value can be taken as an updated parameter initial value combination, and then the updated parameter initial value combination, the optimizer and the signal-to-noise ratio gain curve screening condition are used to determine an updated plurality of test parameter combinations according to the process in the above embodiments, and if there is still no qualified curve, the steps of the embodiment are repeated until the qualified curve and the target pump parameter are determined.
[0053] The preset power adjustment mode is selected based on test requirements in the application, and the actual application scenarios and specific requirements are fully considered to ensure that the power adjustment has a clear goal orientation. The signal input power initial value in the parameter initial value combination is adjusted according to the selected power adjustment mode, so as to determine the signal input power update value. This process uses the preset adjustment rules and algorithms to accurately determine the signal input power update value that meets the test requirements. This accurate adjustment helps to explore the parameter space more carefully and find potential optimal parameter combinations, thereby improving the accuracy and efficiency of parameter optimization. The signal input power update value and the pump parameter initial value in the parameter initial value combination are used as a new parameter initial value combination, and the updated multiple test parameter combinations are determined based on the updated parameter initial value combination, the optimizer and the signal-to-noise ratio gain curve screening condition. This operation forms a closed-loop feedback mechanism for parameter adjustment, and continuously updates the parameter initial value combination to provide more diversified inputs for the optimizer, so that it can generate more targeted test parameter combinations. This dynamic adjustment and optimization process can significantly improve the probability of finding a JPA with good performance, speed up the development process of the JPA, and ensure that it can achieve ideal performance indicators in actual applications, thereby providing strong support for the technical development in related fields.
[0054] According to some embodiments, the parameter adjustment range can be extracted from the test requirements in the absence of a qualified curve; and the power adjustment mode is selected based on the parameter adjustment range.
[0055] In the application, different power adjustment modes are used for different scenarios, and the corresponding parameter adjustment ranges are different. In some implementations, if the parameter adjustment range is greater than a preset threshold, the power adjustment mode of increasing the attenuator is used, and if the parameter adjustment range is less than or equal to the preset threshold, the power adjustment mode of changing the output power setting of the vector network analyzer is used.
[0056] The application extracts the parameter adjustment range from the test requirements, which can ensure that the subsequent parameter adjustment work is closely related to the actual application scenarios, avoiding the blindness and randomness of parameter adjustment, making the adjustment process more in line with actual requirements, and improving the effectiveness of parameter optimization. Based on the extracted parameter adjustment range, the power adjustment mode is selected, different parameter adjustment ranges correspond to different power adjustment requirements, and by selecting the appropriate power adjustment mode according to the specific parameter adjustment range, the amplitude and direction of power adjustment can be matched with the actual requirements. This precise selection method helps to optimize and adjust the power within a reasonable range, which can avoid excessive adjustment that leads to unstable device performance, and prevent insufficient adjustment that cannot achieve ideal performance indicators, thereby improving the efficiency and accuracy of power adjustment.
[0057] According to some embodiments, the room temperature electronics device can be adjusted according to the preset preliminary adjustment condition and initial value selection condition to generate the parameter initial value combination when the temperature of the refrigerator connected with the JPA meets the preset JPA working condition.
[0058] In the present application, reference is made to Figure 1 , the refrigerator is connected with the JPA, and the temperature of the refrigerator is crucial for the test of the JPA. A suitable temperature threshold can be preset, and the temperature of the refrigerator is detected in real time until the temperature of the refrigerator is reduced below the temperature threshold, the room temperature electronics device is connected with the JPA, and the room temperature electronics device is adjusted to generate the parameter initial value combination to realize the test process.
[0059] The present application forms a logical and reasonable operation process by ensuring that the temperature of the refrigerator meets the condition first and then adjusting the room temperature electronics device to generate the parameter initial value combination. This process can effectively improve the performance debugging efficiency of the JPA, reduce repeated work caused by unreasonable environment factors and parameters, provide solid technical support for the performance optimization of the JPA, and has important value in the research and application in the related field.
[0060] The device embodiment of the present application is described below, which can be used to execute the method embodiment of the present application. For details not disclosed in the device embodiment of the present application, reference can be made to the method embodiment of the present application.
[0061] Figure 5 The block diagram of the JPA working key performance determination device provided in the present application embodiment is shown. As shown in Figure 5 , the JPA working key performance determination device 500 includes an initial value determination module 501, a plurality of parameter determination modules 502, a screening module 503, and a target parameter determination module 504.
[0062] The initial value determination module 501 is configured to adjust the room temperature electronics device connected with the JPA according to the preset preliminary adjustment condition and initial value selection condition to generate the parameter initial value combination corresponding to the test requirement. The plurality of parameter determination modules 502 are configured to determine a plurality of test parameter combinations according to the parameter initial value combination, the preset optimizer, and the signal-to-noise ratio gain curve screening condition. The screening module 503 is configured to determine the signal gain curve, the signal-to-noise ratio gain curve, and the initial screening parameter combination corresponding to the signal gain curve and the signal-to-noise ratio gain curve according to the plurality of test parameter combinations and the preset signal-to-noise ratio gain optimization condition. The target parameter determination module 504 is configured to select qualified curves from the signal gain curve and the signal-to-noise ratio gain curve according to a preset JPA determination condition, and determine a target pump parameter combination corresponding to the qualified curves in the preliminary screening parameter combination, so as to determine the key performance of the JPA operation based on the signal gain curve and the signal-to-noise ratio gain curve corresponding to the target pump parameter combination.
[0063] Optionally, the initial value determination module 501 is specifically configured to: synchronously adjust the room-temperature electronic device multiple times according to a preliminary adjustment condition to generate multiple sets of parameter combinations; obtain gain curves of the multiple sets of parameter combinations; determine a parameter initial value combination from the multiple sets of parameter combinations according to the gain curves and an initial value selection condition.
[0064] Optionally, the parameter initial value combination includes a signal input power initial value and a pump parameter initial value; and the multiple parameter determination module 502 is specifically configured to: determine multiple sets of pump parameters based on the signal input power initial value, an optimizer, and a preset combination reselection condition; obtain signal-to-noise ratio gain curves corresponding to the multiple sets of pump parameters, and determine a preliminary target pump parameter according to the signal-to-noise ratio gain curves and a signal-to-noise ratio gain curve screening condition; determine the pump parameter initial value and the preliminary target pump parameter as multiple sets of test parameter combinations.
[0065] Optionally, the target parameter determination module 504 is specifically configured to: analyze the signal gain curve and the signal-to-noise ratio gain curve based on the JPA determination condition to determine whether there is a qualified curve; in a case where there is a qualified curve, determine optimal signal gain, optimal signal bandwidth, optimal signal-to-noise ratio gain, and optimal signal-to-noise ratio bandwidth of the JPA operation from the signal gain curve and the signal-to-noise ratio gain curve corresponding to the target pump parameter combination corresponding to the qualified curve, and determine the optimal signal gain, the optimal signal bandwidth, the optimal signal-to-noise ratio gain, and the optimal signal-to-noise ratio bandwidth as the key performance; and in a case where there is no qualified curve, update the parameter initial value combination.
[0066] Optionally, in a case where the target parameter determination module 504 updates the parameter initial value combination in a case where there is no qualified curve, the target parameter determination module 504 is specifically configured to: select a preset power adjustment mode based on a test requirement in a case where there is no qualified curve; adjust the signal input power initial value in the parameter initial value combination based on the power adjustment mode to determine a signal input power updated value; The signal input power update value and the pump parameter initial value in the initial value combination are combined as an updated parameter initial value combination, and the updated parameter initial value combination, the optimizer and the signal-to-noise ratio gain curve screening condition are used to determine an updated test parameter combination.
[0067] Optionally, in a case where the target parameter determination module 504 selects a preset power adjustment mode based on a test requirement in a case where there is no qualified curve, the method specifically comprises the following steps. In a case where there is no qualified curve, a parameter adjustment range is extracted from the test requirement. Based on the parameter adjustment range, a power adjustment mode is selected.
[0068] Optionally, the initial value determination module 501 is specifically configured to: In a case where the temperature of the refrigerator connected to the JPA meets a preset JPA working condition, the room temperature electronics device is adjusted according to a preset preliminary adjustment condition and an initial value selection condition, so as to generate a parameter initial value combination.
[0069] The device performs similar functions to the method provided above, and other functions can be referred to the foregoing description, which will not be repeated here.
[0070] Figure 6 The structure of the electronic device provided in the embodiment of the present application is shown in FIG. 6. Figure 6 The electronic device 600 can include a memory 601 and a processor 602.
[0071] The computer program is stored on the memory 601, and when the computer program is executed by the processor 602, the foregoing processor 602 executes the method in the above embodiment.
[0072] The processor 602 and the memory 601 are connected, such as through a bus.
[0073] Optionally, the electronic device 600 can further include a transceiver. It should be noted that the transceiver in actual application is not limited to one, and the structure of the electronic device 600 does not constitute a limitation on the embodiments of the present application.
[0074] The processor 602 can be a CPU (Central Processing Unit), a general-purpose processor, a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array) or other programmable logic device, transistor logic device, hardware component, or any combination thereof. It can implement or execute various exemplary logical blocks, modules and circuits described in combination with the disclosure. The processor 602 can also be a combination of computing functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, etc.
[0075] The bus can include a path for transmitting information between the above-mentioned components. The bus can be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, only one thick line is shown in the figure, but it does not mean that there is only one bus or only one type of bus.
[0076] The memory 601 can be a ROM (Read Only Memory) or other type of static storage device that can store static information and instructions, a RAM (Random Access Memory) or other type of dynamic storage device that can store information and instructions, an EEPROM (Electrically Erasable Programmable Read Only Memory), a CD-ROM (Compact Disc Read Only Memory) or other optical disk storage, an optical disk storage (including a compact disk, a laser disk, an optical disk, a digital versatile disk, a Blu-ray disk, etc.), a magnetic disk storage medium or other magnetic storage device, or any other medium that can be used to carry or store desired program codes in the form of instructions or data structures and can be accessed by a computer, but not limited to.
[0077] The memory 601 is used to store application program codes for implementing the scheme of the present application, and is controlled by the processor 602 for execution. The processor 602 is used to execute the application program codes stored in the memory 601 to realize the content shown in the foregoing method embodiments.
[0078] The electronic device includes, but is not limited to, a mobile terminal such as a mobile phone, a notebook computer, a digital broadcast receiver, a PDA (Personal Digital Assistant), a PAD (Tablet Personal Computer), a PMP (Portable Multimedia Player), a car terminal (for example, a car navigation terminal), and the like, and a stationary terminal such as a digital TV, a desktop computer, and the like. It can also be a server or the like. Figure 6 The illustrated electronic device is merely an example and should not impose any limitation on the function and use range of the embodiments of the present application.
[0079] The electronic device of the embodiments can be used to execute the method of any of the above embodiments, and has similar implementation principles and technical effects, which will not be described here.
[0080] The present application also provides a non-transitory computer-readable storage medium having stored thereon computer readable instructions, which, when executed by a processor, cause the processor to perform the method in the above embodiments.
[0081] Those skilled in the art can understand that all or part of the steps of the above-mentioned method embodiments can be completed by program instructions related to hardware. The foregoing programs can be stored in a non-transitory computer-readable storage medium. The program, when executed, performs steps including the above-mentioned method embodiments; and the foregoing storage medium includes ROM, RAM, magnetic or optical disk, and various media that can store program codes.
[0082] The embodiments of the present application are described in detail above, and the specific examples are applied to the principles and implementation modes of the present application. The above description of the embodiments is only used to help understand the method of the present application and its core idea. Meanwhile, the changes or deformations made by the skilled in the art according to the idea of the present application, based on the specific implementation mode and application range of the present application, all belong to the scope of protection of the present application. In summary, the content of the specification should not be understood as a limitation of the present application.
Claims
1. A method for determining the key performance of JPA work, characterized in that, The method comprises the following steps: According to the preset preliminary adjustment condition and the initial value selection condition, the room temperature electronic device connected with the JPA is adjusted to generate the parameter initial value combination corresponding to the test requirement; According to the parameter initial value combination, the preset optimizer and the signal-to-noise ratio gain curve screening condition, a plurality of test parameter combinations are determined; According to the plurality of test parameter combinations and the preset signal-to-noise ratio gain optimization condition, the signal gain curve, the signal-to-noise ratio gain curve and the initial screening parameter combination corresponding to the signal gain curve and the signal-to-noise ratio gain curve are determined; According to the preset JPA determination condition, the qualified curve is selected from the signal gain curve and the signal-to-noise ratio gain curve, and the target pumping parameter combination corresponding to the qualified curve is determined in the initial screening parameter combination, so as to determine the key performance of the JPA based on the signal gain curve and the signal-to-noise ratio gain curve corresponding to the target pumping parameter combination.
2. The method of claim 1, wherein, According to the preset preliminary adjustment condition and the initial value selection condition, the room temperature electronic device connected with the JPA is adjusted to generate the parameter initial value combination corresponding to the test requirement, which comprises the following steps: According to the preliminary adjustment condition, the room temperature electronic device is adjusted for multiple times to generate a plurality of parameter combinations; The gain curve of the plurality of parameter combinations is obtained; According to the gain curve and the initial value selection condition, the parameter initial value combination is determined from the plurality of parameter combinations.
3. The method of claim 1, wherein, The parameter initial value combination comprises a signal input power initial value and a pumping parameter initial value; According to the parameter initial value combination, the preset optimizer and the signal-to-noise ratio gain curve screening condition, a plurality of test parameter combinations are determined, which comprises the following steps: On the basis of the signal input power initial value, a plurality of pumping parameters are determined according to the optimizer and the preset combination reselection condition; The signal-to-noise ratio gain curve corresponding to the plurality of pumping parameters is obtained, and the initial target pumping parameter is determined according to the signal-to-noise ratio gain curve and the signal-to-noise ratio gain curve screening condition; The pumping parameter initial value and the initial target pumping parameter are determined as the plurality of test parameter combinations.
4. The method of claim 1, wherein, According to the preset JPA determination condition, the qualified curve is selected from the signal gain curve and the signal-to-noise ratio gain curve, and the target pumping parameter combination corresponding to the qualified curve is determined in the initial screening parameter combination, so as to determine the key performance of the JPA based on the signal gain curve and the signal-to-noise ratio gain curve corresponding to the target pumping parameter combination, which comprises the following steps: Based on the JPA determination condition, the signal gain curve and the signal-to-noise ratio gain curve are analyzed to determine whether there is a qualified curve; In the case that the qualified curve exists, the optimal signal gain, the optimal signal bandwidth, the optimal signal-to-noise ratio gain and the optimal signal-to-noise ratio bandwidth of the JPA are determined from the signal gain curve and the signal-to-noise ratio gain curve corresponding to the target pumping parameter combination corresponding to the qualified curve, and the optimal signal gain, the optimal signal bandwidth, the optimal signal-to-noise ratio gain and the optimal signal-to-noise ratio bandwidth are determined as the key performance; In the case that the qualified curve does not exist, the parameter initial value combination is updated.
5. The method of claim 4, wherein, The updating of the parameter initial value combination in the absence of the qualified curve comprises: In the absence of the qualified curve, a preset power adjustment mode is selected based on the test requirement; Based on the power adjustment mode, the signal input power initial value in the parameter initial value combination is adjusted to determine a signal input power updated value; The signal input power updated value and the pump parameter initial value in the parameter initial value combination are taken as an updated parameter initial value combination, so as to determine an updated plurality of test parameter combinations based on the updated parameter initial value combination, the optimizer and the signal-to-noise gain curve screening condition.
6. The method of claim 5, wherein, The updating of the parameter initial value combination in the absence of the qualified curve comprises: In the absence of the qualified curve, a parameter adjustment range is extracted from the test requirement; Based on the parameter adjustment range, the power adjustment mode is selected.
7. The method of claim 1, wherein, The adjusting of the room-temperature electronic device connected with the JPA to generate the parameter initial value combination corresponding to the test requirement according to the preset preliminary adjustment condition and initial value selection condition comprises: In the case that the temperature of the refrigerator connected with the JPA satisfies the preset JPA working condition, the room-temperature electronic device is adjusted according to the preset preliminary adjustment condition and initial value selection condition to generate the parameter initial value combination.
8. An apparatus for determining key performance of JPA work, the apparatus comprising: a JPA work performance determination module configured to determine key performance of JPA work. Comprise: An initial value determination module is configured to adjust the room-temperature electronic device connected with the JPA to generate the parameter initial value combination corresponding to the test requirement according to the preset preliminary adjustment condition and initial value selection condition; A plurality of parameter determination modules are configured to determine a plurality of test parameter combinations according to the parameter initial value combination, a preset optimizer and a signal-to-noise gain curve screening condition; A screening module is configured to determine a signal gain curve, a signal-to-noise gain curve and an initial screening parameter combination corresponding to the signal gain curve and the signal-to-noise gain curve according to the plurality of test parameter combinations and a preset signal-to-noise gain optimization condition; A target parameter determination module is configured to select a qualified curve from the signal gain curve and the signal-to-noise gain curve according to a preset JPA determination condition, and determine a target pump parameter combination corresponding to the qualified curve from the initial screening parameter combination, so as to determine that the target pump parameter combination is a key performance for the JPA working based on the signal gain curve and the signal-to-noise gain curve corresponding to the target pump parameter combination.
9. An electronic device, comprising: Comprise: A processor; A memory storing a computer program, when the computer program is executed by the processor, the processor executes the method of any one of claims 1-7.
10. A non-transitory computer-readable storage medium, comprising: A computer readable instruction is stored thereon, when the instruction is executed by a processor, the processor executes the method of any one of claims 1-7.