Semi-cut battery piece testing and sorting method and device
By employing a non-contact testing method to process data before and after cutting half-cut solar cells and to test them before and after edge passivation deposition, the problem of metal grid line damage caused by contact testing is solved, thereby improving the accuracy and precision of electrical performance evaluation of half-cut solar cells.
Patent Information
- Application Number
- CN202511746481.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-25
- Publication Date
- 2026-03-17
AI Technical Summary
The existing half-cell battery undergoes contact testing before and after EPD, which damages the metal grid lines and affects electrical performance.
A non-contact testing method is adopted. The data is decomposed into test data of quasi-half-cut cells by testing the whole cell. Non-contact test data before and after cutting is generated. Non-contact tests are also performed before and after edge passivation deposition. The differences are calculated to determine the efficiency improvement data.
This effectively avoids damage to the grid lines on the surface of the half-cut solar cell caused by contact testing, improves the accuracy of efficiency data and testing precision, and enhances the performance evaluation of the half-cut solar cell before and after edge passivation deposition.
Smart Images
Figure CN121693100A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of testing technology, and in particular to a method and apparatus for testing and sorting half-cut battery cells. Background Technology
[0002] In the process of manufacturing photovoltaic crystalline silicon cells, a half-cutting process is required. The cut surface creates recombination centers, reducing the efficiency of the sliced cells. EPD (Edge Passivation Deposition) technology, as the primary method for passivating the cut surfaces of half-cells, plays a crucial role in improving cell efficiency. Current testing and sorting processes typically involve first testing and sorting the entire cell, then slicing it, followed by EPD passivation, and finally, testing and sorting the remaining half-cells again. Traditional testing methods often employ pressure-contact testing, where probes or electrodes directly contact the cell surface to measure IV characteristics and analyze electrical performance.
[0003] Existing half-cell solar cells typically undergo contact testing before and after EPD (Enhanced Product Development), which damages the metal grid lines of the half-cell and affects its electrical performance. Summary of the Invention
[0004] This invention provides a method and apparatus for testing and sorting half-cut solar cells, which solves the problem that existing half-cut solar cells are generally subjected to contact testing before and after EPD, resulting in damage to the metal grid lines of the half-cut solar cells and affecting their electrical performance.
[0005] To address the aforementioned technical problems, the present invention adopts the following technical solution:
[0006] This invention provides a method for testing and sorting half-cut battery cells, including:
[0007] The entire solar cell was tested, and the test data was broken down into test data of at least one quasi-half-cut solar cell.
[0008] Based on the test data of the standard battery cell and the quasi-half-cut battery cell, a non-contact test is performed on the cut half-cut battery cell to generate the first non-contact test data of the cut half-cut battery cell;
[0009] Edge passivation deposition is performed on the battery cell;
[0010] Based on the test data of the standard battery cell and the quasi-half-cut battery cell, a non-contact test is performed on the half-cut battery cell after edge passivation deposition to generate the second non-contact test data of the half-cut battery cell after edge passivation deposition.
[0011] Based on the difference between the first non-contact test data and the second non-contact test data, the efficiency improvement data of the half-cut battery cell after edge passivation deposition is determined.
[0012] Optionally, the step of performing non-contact testing on the cut half-cut battery cell based on the test data of the standard battery cell and the quasi-half-cut battery cell to generate the first non-contact test data of the cut half-cut battery cell includes:
[0013] The cut half-cell battery and the standard battery cell are excited to emit light;
[0014] Obtain the first luminescent image information of the cut half-cell battery cell and the reference luminescent image information of the standard battery cell;
[0015] Based on the quasi-half-cut battery cell test data, the first luminescent image information, and the reference luminescent image information, the first non-contact test data of the cut half-cut battery cell is calculated.
[0016] Optionally, the step of calculating the first non-contact test data of the cut half-cell battery cell based on the quasi-half-cell test data, the first luminescent image information, and the reference luminescent image information includes:
[0017] Based on the test data of the quasi-half-cut battery cell, the first luminescent image information and the reference luminescent image information, a multi-point fitting is performed to determine the first mapping model between the gray value and electrical performance parameters of the cut half-cut battery cell;
[0018] Based on the first mapping model and the baseline conversion efficiency value of the reference cell, the conversion efficiency and electrical performance parameters of the cut half-cell are calculated; wherein, the first non-contact test data includes the conversion efficiency and electrical performance parameters of the cut half-cell.
[0019] Optionally, based on the test data of the standard solar cell and the quasi-half-cut solar cell, the half-cut solar cell after edge passivation deposition is subjected to non-contact testing to generate second non-contact test data of the half-cut solar cell after edge passivation deposition, including:
[0020] The half-cut solar cell and the standard solar cell after edge passivation deposition were excited to emit light;
[0021] Acquire the second emission image information of the half-cut solar cell after edge passivation deposition and the reference emission image information of the standard solar cell;
[0022] Based on the quasi-half-cut solar cell test data, the second luminescent image information, and the reference luminescent image information, the second non-contact test data of the half-cut solar cell after edge passivation deposition is calculated.
[0023] Optionally, the step of calculating the second non-contact test data of the half-cut solar cell after edge passivation deposition based on the quasi-half-cut solar cell test data, the second luminescent image information, and the reference luminescent image information includes:
[0024] Based on the test data of the quasi-half-cut solar cell, the second luminescent image information, and the reference luminescent image information, a multi-point fitting is performed to determine a second mapping model between the grayscale value and electrical performance parameters of the half-cut solar cell after edge passivation deposition.
[0025] Based on the second mapping model and the baseline conversion efficiency value of the reference cell, the conversion efficiency and electrical performance parameters of the half-cut cell after edge passivation deposition are calculated; wherein, the second non-contact test data includes the conversion efficiency and electrical performance parameters of the half-cut cell after edge passivation deposition.
[0026] Optionally, before performing non-contact testing on the cut half-cut battery cell based on the test data of the standard battery cell and the quasi-half-cut battery cell to generate the first non-contact test data of the cut half-cut battery cell, the method further includes:
[0027] Information identifiers are set for the quasi-half-cut battery cells of the whole battery cell, and the data of the quasi-half-cut battery cells is synchronized to the information identifiers; wherein, the electrical performance data of the quasi-half-cut battery cells includes at least one of IV curves, electrical performance parameters and appearance data;
[0028] The whole battery cell is cut into at least two half-cut battery cells.
[0029] Optionally, prior to the edge passivation deposition of the solar cell, the method further includes:
[0030] Identify the quasi-half-cut battery cell data based on the information identifier;
[0031] Based on the difference between the quasi-half-cut battery cell data and the first non-contact test data of the corresponding cut half-cut battery cell, the damage data of the cutting process to the half-cut battery cell is determined.
[0032] Optionally, prior to the edge passivation deposition of the solar cell, the method further includes:
[0033] Synchronize the first non-contact test data to the information identifier;
[0034] Before determining the efficiency improvement data of the half-cut solar cell after edge passivation deposition based on the difference between the first non-contact test data and the second non-contact test data, the method further includes:
[0035] The first non-contact test data is identified based on the information identifier.
[0036] Optionally, determining the efficiency improvement data of the half-cut solar cell after edge passivation deposition based on the difference between the first non-contact test data and the second non-contact test data includes:
[0037] The efficiency improvement data of the half-cut solar cell after edge passivation deposition is determined based on the difference or quotient between the first non-contact test data and the second non-contact test data.
[0038] Optionally, after determining the efficiency improvement data of the half-cut solar cell after edge passivation deposition based on the difference between the first non-contact test data and the second non-contact test data, the method further includes:
[0039] Based on the first non-contact test data, the second non-contact test data, and the efficiency improvement data of the half-cut solar cell after edge passivation deposition, the half-cut solar cell after edge passivation deposition is sorted.
[0040] Optionally, the step of sorting the half-cut solar cells after edge passivation deposition based on the first non-contact test data, the second non-contact test data, and the efficiency improvement data of the half-cut solar cells after edge passivation deposition includes:
[0041] Based on the difference between the first non-contact test data and the second non-contact test data, a sorting model for half-cut battery cells is determined;
[0042] Based on the contribution of the efficiency improvement data of the half-cut solar cells after edge passivation deposition, the half-cut solar cells are divided into grades to obtain half-cut solar cells of the first frequency grade and half-cut solar cells of the second frequency grade; the proportion of the first frequency grade is greater than the proportion of the second frequency grade.
[0043] The half-cut battery cells of the first frequency range are sorted into boxes;
[0044] The half-cut battery cells in the second frequency range are then subjected to secondary sorting.
[0045] Secondly, this embodiment provides a half-cut battery cell testing and sorting device, comprising:
[0046] The contact test module is used to test the entire solar cell and decompose the test data into test data of at least one quasi-half-cut solar cell.
[0047] The non-contact testing module is used to perform non-contact testing on the cut half-cut battery cell based on the test data of the standard battery cell and the quasi-half-cut battery cell, and generate the first non-contact test data of the cut half-cut battery cell.
[0048] A passivation deposition module is used to perform edge passivation deposition on the battery cells;
[0049] The non-contact testing module is also used to perform non-contact testing on the semi-cut battery cell after edge passivation deposition based on the test data of the standard battery cell and the semi-cut battery cell, and generate the second non-contact test data of the semi-cut battery cell after edge passivation deposition;
[0050] The efficiency determination module is used to determine the efficiency improvement data of the half-cut battery cell after edge passivation deposition based on the difference between the first non-contact test data and the second non-contact test data.
[0051] The half-cut solar cell testing and sorting method provided in this embodiment of the invention employs non-contact testing of the half-cut solar cells before and after edge passivation deposition, effectively avoiding damage to the grid lines on the surface of the half-cut solar cells caused by contact testing. Furthermore, since the first non-contact test data used in this embodiment is data before edge passivation deposition, and the second non-contact test data is data after edge passivation deposition, this setup ensures that the efficiency improvement data of the half-cut solar cells after edge passivation deposition determined by the half-cut solar cell testing and sorting method eliminates the influence of cutting on the conversion efficiency of the half-cut solar cells. This makes the efficiency improvement data of the half-cut solar cells before and after edge passivation deposition more accurate, improving the testing accuracy of the efficiency improvement data before and after edge passivation deposition. Attached Figure Description
[0052] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments of the present invention will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the content of the embodiments of the present invention and these drawings without creative effort.
[0053] Figure 1 This is a flowchart of a half-cut battery cell testing and sorting method provided in an embodiment of the present invention;
[0054] Figure 2 This is a schematic diagram of the structure of a standardized area array photoluminescence (PL) imaging system provided in this embodiment;
[0055] Figure 3This is a flowchart of another half-cut battery cell testing and sorting method provided in an embodiment of the present invention;
[0056] Figure 4 This is a flowchart of another half-cut battery cell testing and sorting method provided in an embodiment of the present invention;
[0057] Figure 5 This is a flowchart of another half-cut battery cell testing and sorting method provided in an embodiment of the present invention. Detailed Implementation
[0058] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the scope of protection of the present invention.
[0059] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the invention described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover a non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.
[0060] Based on the above-mentioned technical problems, this embodiment proposes the following solutions:
[0061] Figure 1 This is a flowchart of a half-cut battery cell testing and sorting method provided in an embodiment of the present invention. See also... Figure 1 The half-cut battery cell testing and sorting method provided in this embodiment of the invention includes:
[0062] S101. Test the entire solar cell and decompose the test data into test data of at least one quasi-half-cut solar cell.
[0063] Specifically, a solar cell refers to a photovoltaic crystalline silicon solar cell. A complete solar cell is the cell before it is cut from a half-cut cell. Testing a complete solar cell allows for direct contact testing since it is uncut. The test data can include the electrical performance parameters, IV curve information, and appearance data of the complete solar cell.
[0064] Based on the physical regions of the entire solar cell, the test data of the entire cell is processed through multi-channel processing according to the expected segmentation regions of the entire cell, and decomposed into test data for quasi-half-cut solar cells. This setup facilitates the provision of test data for each half-cut solar cell before cutting.
[0065] S102. Based on the test data of the standard battery cell and the quasi-half-cut battery cell, perform non-contact testing on the cut half-cut battery cell to generate the first non-contact test data of the cut half-cut battery cell.
[0066] Specifically, using a reference cell as a comparison, the cut half-cell can be subjected to non-contact testing. Based on the test data of the quasi-half-cell and the comparison parameters of the reference cell, the first non-contact test data of the cut half-cell can be calculated. The first non-contact test data may include the electrical performance parameters and conversion efficiency value of the cut half-cell.
[0067] S103. Perform edge passivation deposition on the battery cell.
[0068] Specifically, edge passivation deposition (EPD) is performed on the solar cells. By forming a uniform passivation film layer at the cut edges of the solar cells, carrier recombination deposition in the edge regions is effectively reduced, thereby improving the photoelectric conversion efficiency of the half-cut solar cells. This helps reduce edge recombination losses and improve the efficiency and reliability of the half-cut solar cells. The edge of the half-cut solar cell treated with edge passivation deposition can reduce current loss caused by shading, enhancing the performance stability of the half-cut solar cells under complex lighting conditions. The edge of the half-cut solar cell treated with edge passivation deposition can reduce current loss caused by shading, enhancing the performance stability of the module under complex lighting conditions.
[0069] S104. Based on the test data of the standard battery cell and the quasi-half-cut battery cell, perform non-contact testing on the half-cut battery cell after edge passivation deposition to generate second non-contact test data of the half-cut battery cell after edge passivation deposition.
[0070] Specifically, using a reference cell as a control, the half-cut cell after edge passivation deposition can be subjected to non-contact testing. Based on the test data of the quasi-half-cut cell and the control parameters of the reference cell, a second non-contact test data for the half-cut cell after edge passivation deposition is calculated. The second non-contact test data may include the electrical performance parameters and conversion efficiency value of the half-cut cell after edge passivation deposition.
[0071] S105. Based on the difference between the first non-contact test data and the second non-contact test data, determine the efficiency improvement data of the half-cut battery cell after edge passivation deposition.
[0072] Specifically, the first non-contact test data represents the electrical performance parameters and conversion efficiency of the half-cut solar cell before edge passivation deposition. The second non-contact test data represents the electrical performance parameters and conversion efficiency of the half-cut solar cell after edge passivation deposition. The first and second non-contact test data are compared. For example, comparing the electrical performance parameters in the second and first non-contact test data determines the improvement in the electrical performance parameters of the half-cut solar cell after edge passivation deposition. Similarly, comparing the conversion efficiency in the second and first non-contact test data determines the improvement in the conversion efficiency of the half-cut solar cell after edge passivation deposition. This setup ensures that the efficiency improvement data for the half-cut solar cell after edge passivation deposition excludes the influence of cutting on the conversion efficiency of the half-cut solar cell, making the efficiency improvement data before and after edge passivation deposition more accurate.
[0073] The half-cut solar cell testing and sorting method provided in this embodiment employs non-contact testing of the half-cut solar cells before and after edge passivation deposition, effectively avoiding damage to the grid lines on the surface of the half-cut solar cells caused by contact testing. Furthermore, since the first non-contact test data used in this embodiment is data before edge passivation deposition, and the second non-contact test data is data after edge passivation deposition, this setup ensures that the efficiency improvement data of the half-cut solar cells after edge passivation deposition determined by the half-cut solar cell testing and sorting method in this embodiment excludes the influence of cutting on the conversion efficiency of the half-cut solar cells. This makes the efficiency improvement data of the half-cut solar cells before and after edge passivation deposition more accurate, improving the testing accuracy of the efficiency improvement data before and after edge passivation deposition.
[0074] Optionally, based on the above embodiments, see also... Figure 1 Step S102 in the above embodiment, which involves performing non-contact testing on the cut half-cut battery cell based on the test data of the standard battery cell and the quasi-half-cut battery cell, to generate the first non-contact test data of the cut half-cut battery cell, includes:
[0075] Step 1: Excite the cut half-cell battery cells and standard battery cells to emit light.
[0076] Step 2: Obtain the first luminescent image information of the cut half-cell battery cell and the reference luminescent image information of the standard battery cell.
[0077] Step 3: Calculate the first non-contact test data of the cut half-cell battery cell based on the quasi-half-cut battery cell test data, the first luminescent image information, and the reference luminescent image information.
[0078] Specifically, Figure 2 This is a schematic diagram of a standardized area-array photoluminescence (PL) imaging system provided in this embodiment. See also... Figure 2 A standardized area-array photoluminescence (PL) imaging system may include a laser source 10, a camera 20, a host computer 50, a stage, and a filter 30. The half-cut solar cell 40 to be tested can be placed on the stage together with a standard solar cell, isolating them from each other to avoid interference. Alternatively, the half-cut solar cell 40 to be tested and the standard solar cell can be placed on the stage in different test groups. For example, initially only the half-cut solar cell 40 to be tested can be placed on the stage for laser irradiation and indirect testing. Then, only the standard solar cell can be placed on the stage for laser irradiation and indirect testing. Alternatively, initially only the standard solar cell can be placed on the stage for laser irradiation and indirect testing. Then, only the half-cut solar cell 40 to be tested can be placed on the stage for laser irradiation and indirect testing; no limitations are imposed here.
[0079] A laser source excites the cut half-cell and standard cell to emit light. A filter and camera capture the first emission image of the cut half-cell and the reference emission image of the standard cell. A host computer analyzes the comparison between the first emission image of the half-cell and the reference emission image, and calculates the efficiency and electrical performance parameters of the half-cell based on the test data, without direct contact with the cell surface. For example, non-contact testing can be performed under laser irradiation intensity of 0.06-0.12 Sun.
[0080] In one alternative implementation, the impact of cutting a whole cell on the electrical performance of the cut half cell can be evaluated by using first non-contact test data obtained before edge passivation deposition and quasi-half-cut cell test data.
[0081] Another optional implementation, based on the above embodiments, step three, calculating the first non-contact test data of the cut half-cell battery cell based on the quasi-half-cut battery cell test data, the first luminescent image information, and the reference luminescent image information, includes:
[0082] Firstly, based on the test data of the quasi-half-cut battery cell, the first luminescent image information, and the reference luminescent image information, multi-point fitting is performed to determine the first mapping model between the grayscale value and electrical performance parameters of the cut half-cut battery cell.
[0083] Secondly, based on the first mapping model and the conversion efficiency benchmark value of the reference cell, the conversion efficiency and electrical performance parameters of the cut half-cell are calculated; wherein, the first non-contact test data includes the conversion efficiency and electrical performance parameters of the cut half-cell.
[0084] Specifically, since the first luminescent image information corresponds to the photoluminescence grayscale value of the half-cut solar cell before edge passivation deposition after cutting, and the quasi-half-cut solar cell test data corresponds to the IV test data of the half-cut solar cell, a first mapping model between the grayscale value and electrical performance parameters of the cut half-cut solar cell is determined by performing multi-point fitting based on the IV test data of the half-cut solar cell corresponding to the quasi-half-cut solar cell test data and the photoluminescence grayscale value corresponding to the first luminescent image information. The relationship between the photoluminescence grayscale value corresponding to the reference luminescent image information of the standard solar cell and the corresponding IV data information of the standard solar cell can be used as a reference. Based on the first mapping model and the conversion efficiency benchmark value of the reference solar cell, the conversion efficiency and electrical performance parameters of the cut half-cut solar cell are calculated. This setup effectively eliminates the damage and fragmentation problems of the half-cut solar cell caused by physical contact testing.
[0085] Optionally, based on the above embodiments, see also... Figure 1 Step S104 in the above embodiment, which involves performing non-contact testing on the half-cut battery cell after edge passivation deposition based on the test data of the standard battery cell and the quasi-half-cut battery cell, to generate second non-contact test data of the half-cut battery cell after edge passivation deposition, includes:
[0086] Firstly, the half-cut solar cell and the standard solar cell after edge passivation deposition are excited to emit light.
[0087] Secondly, the second emission image information of the half-cut solar cell after edge passivation deposition and the reference emission image information of the standard solar cell are obtained.
[0088] Third, based on the quasi-half-cut battery cell test data, the second luminescent image information, and the reference luminescent image information, calculate the second non-contact test data of the half-cut battery cell after edge passivation deposition.
[0089] For details, please refer to [link / reference]. Figure 2A laser source excites the half-cut solar cell and a standard solar cell after edge passivation deposition to emit light. A filter and a camera capture the first emission image of the half-cut solar cell and the reference emission image of the standard solar cell. A host computer analyzes the comparison between the second emission image of the half-cut solar cell and the reference emission image, and calculates the efficiency and electrical performance parameters of the half-cut solar cell based on the quasi-half-cut solar cell test data, without direct contact with the solar cell surface.
[0090] An optional implementation, based on the above embodiments, further includes, in step three, calculating the second non-contact test data of the half-cut solar cell after edge passivation deposition based on the quasi-half-cut solar cell test data, the second luminescent image information, and the reference luminescent image information, the following:
[0091] Based on the test data of the quasi-half-cut solar cell, the second luminescent image information, and the reference luminescent image information, a multi-point fitting is performed to determine a second mapping model between the grayscale value and electrical performance parameters of the half-cut solar cell after edge passivation deposition.
[0092] Based on the second mapping model and the baseline conversion efficiency value of the reference cell, the conversion efficiency and electrical performance parameters of the half-cut cell after edge passivation deposition are calculated; wherein, the second non-contact test data includes the conversion efficiency and electrical performance parameters of the half-cut cell after edge passivation deposition.
[0093] Specifically, since the second luminescent image information corresponds to the photoluminescence grayscale value of the half-cut solar cell after edge passivation deposition, the quasi-half-cut solar cell test data corresponds to the IV test data of the half-cut solar cell. Based on the IV test data of the half-cut solar cell corresponding to the quasi-half-cut solar cell test data and the photoluminescence grayscale value corresponding to the second luminescent image information, a multi-point fitting is performed to determine the second mapping model between the grayscale value and electrical performance parameters of the half-cut solar cell after cutting and edge passivation deposition. The relationship between the photoluminescence grayscale value corresponding to the reference luminescent image information of the standard solar cell and the corresponding IV data information of the standard solar cell can be used as a reference. Based on the second mapping model and the reference conversion efficiency benchmark value of the reference solar cell, the conversion efficiency and electrical performance parameters of the half-cut solar cell after cutting and edge passivation deposition are calculated. This setup further eliminates the damage and fragmentation problems of the half-cut solar cell caused by physical contact testing.
[0094] Optional, Figure 3 This is a flowchart of another half-cut battery cell testing and sorting method provided in an embodiment of the present invention. Based on the above embodiments, see [link to related documentation]. Figure 3 The half-cut battery cell testing and sorting method provided in this embodiment of the invention includes:
[0095] S201. Test the entire solar cell and decompose the test data into test data of at least one quasi-half-cut solar cell.
[0096] S202. Information identifiers are set for the quasi-half-cut battery cells of the whole battery cell, and the data of the quasi-half-cut battery cells is synchronized to the information identifiers; wherein, the electrical performance data of the quasi-half-cut battery cells includes at least one of IV curves, electrical performance parameters and appearance data.
[0097] Specifically, the information label can include a QR code or a DM code. An information label can be printed on the surface of each semi-cut solar cell after the intended division into halves using inkjet printing technology. Each semi-cut solar cell has a unique information label, facilitating information traceability. Therefore, the test data from semi-cut solar cells tested on whole solar cells can be traced through the information label, making it suitable for calculating the conversion efficiency of semi-cut solar cells before and after edge passivation deposition, thereby improving testing efficiency and shortening testing time.
[0098] S203. Cut the whole battery cell into at least two half-cut battery cells.
[0099] Specifically, laser cutting can be used to cut the entire solar cell along the desired segmentation area, forming at least two half-cut solar cells. The test data of the quasi-half-cut solar cells serve as the data for the cut half-cut solar cells.
[0100] S204. Based on the test data of the standard battery cell and the quasi-half-cut battery cell, perform non-contact testing on the cut half-cut battery cell to generate the first non-contact test data of the cut half-cut battery cell.
[0101] S205. Perform edge passivation deposition on the battery cell.
[0102] S206. Based on the test data of the standard battery cell and the quasi-half-cut battery cell, perform non-contact testing on the half-cut battery cell after edge passivation deposition to generate second non-contact test data of the half-cut battery cell after edge passivation deposition.
[0103] S207. Based on the difference between the first non-contact test data and the second non-contact test data, determine the efficiency improvement data of the half-cut battery cell after edge passivation deposition.
[0104] Optional, Figure 4 This is a flowchart of another half-cut battery cell testing and sorting method provided in an embodiment of the present invention. Based on the above embodiments, see [link to other embodiments]. Figure 4 The half-cut battery cell testing and sorting method provided in this embodiment of the invention includes:
[0105] S301. Test the entire solar cell and decompose the test data into test data of at least one quasi-half-cut solar cell.
[0106] S302. Information identifiers are set for the quasi-half-cut battery cells of the whole battery cell, and the data of the quasi-half-cut battery cells is synchronized to the information identifiers; wherein, the electrical performance data of the quasi-half-cut battery cells includes at least one of IV curves, electrical performance parameters and appearance data.
[0107] S303. Cut the whole battery cell into at least two half-cut battery cells.
[0108] S304. Based on the test data of the standard battery cell and the quasi-half-cut battery cell, perform non-contact testing on the cut half-cut battery cell to generate the first non-contact test data of the cut half-cut battery cell.
[0109] S305. Identify the quasi-half-cut battery cell data based on the information identifier.
[0110] Specifically, by using information identifiers, the data of quasi-half-cut solar cells can be read. Since the quasi-half-cut solar cell data includes the VI data information of the half-cut solar cell, there is no need to repeat the test after cutting or edge passivation deposition. The data can be directly read through the information identifiers, improving testing efficiency. For example, the test cycle time of the technical solution provided in this embodiment is significantly improved, from 0.85s / 2 half-cell in the traditional pressing test to 0.6s / 2 half-cell, which improves the testing efficiency by approximately 30%.
[0111] S306. Based on the difference between the quasi-half-cut battery cell data and the corresponding first non-contact test data of the cut half-cut battery cell, determine the damage data of the cutting process to the half-cut battery cell.
[0112] Specifically, the data of the quasi-half-cut solar cell is compared with the first non-contact test data of the corresponding cut half-cut solar cell. For example, the damage data of the cutting process to the half-cut solar cell can be determined based on the difference or quotient between the quasi-half-cut solar cell data and the first non-contact test data of the corresponding cut half-cut solar cell.
[0113] S307. Synchronize the first non-contact test data to the information identifier.
[0114] Specifically, the first non-contact test data is synchronized to the information identifier to facilitate association with the first non-contact test data before edge passivation deposition after cutting in subsequent test steps.
[0115] S308. Perform edge passivation deposition on the battery cell.
[0116] S309. Based on the test data of the standard battery cell and the quasi-half-cut battery cell, perform non-contact testing on the half-cut battery cell after edge passivation deposition to generate second non-contact test data of the half-cut battery cell after edge passivation deposition.
[0117] S310. Identify the first non-contact test data based on the information identifier.
[0118] Specifically, by scanning or reading information tags, the first non-contact test data before edge passivation deposition after cutting is associated. The combination of non-contact testing technology and information traceability such as QR codes enables precise tracking of the performance changes of the half-cut solar cells before and after edge passivation deposition, providing data support for the optimization of the edge passivation deposition (EPD) process.
[0119] S311. Based on the difference between the first non-contact test data and the second non-contact test data, determine the efficiency improvement data of the half-cut battery cell after edge passivation deposition.
[0120] Optionally, based on the above embodiments, determining the efficiency improvement data of the half-cut solar cell after edge passivation deposition based on the difference between the first non-contact test data and the second non-contact test data may include: determining the efficiency improvement data of the half-cut solar cell after edge passivation deposition based on the difference or quotient between the first non-contact test data and the second non-contact test data.
[0121] Specifically, the efficiency improvement data of the half-cut battery cell after cutting and edge passivation deposition is determined by dividing the difference between the conversion efficiency corresponding to the second non-contact test data and the conversion efficiency corresponding to the first non-contact test data by the first non-contact test data.
[0122] Optional, Figure 5 This is a flowchart of another half-cut battery cell testing and sorting method provided in an embodiment of the present invention. Based on the above embodiments, see [link to other embodiments]. Figure 5 The half-cut battery cell testing and sorting method provided in this embodiment of the invention includes:
[0123] S401. Test the entire solar cell and decompose the test data into test data of at least one quasi-half-cut solar cell.
[0124] S402. Based on the test data of the standard battery cell and the quasi-half-cut battery cell, perform non-contact testing on the cut half-cut battery cell to generate the first non-contact test data of the cut half-cut battery cell.
[0125] S403. Perform edge passivation deposition on the battery cell.
[0126] S404. Based on the test data of the standard battery cell and the quasi-half-cut battery cell, perform non-contact testing on the half-cut battery cell after edge passivation deposition to generate second non-contact test data of the half-cut battery cell after edge passivation deposition.
[0127] S405. Based on the difference between the first non-contact test data and the second non-contact test data, determine the efficiency improvement data of the half-cut battery cell after edge passivation deposition.
[0128] S406. Based on the first non-contact test data, the second non-contact test data, and the efficiency improvement data of the half-cut solar cell after edge passivation deposition, the half-cut solar cell after edge passivation deposition is sorted.
[0129] Specifically, by integrating and analyzing the test data before and after edge passivation deposition, the sorting of the half-cut solar cells after edge passivation deposition is improved, the testing equipment is simplified, the mechanical pressing components for direct testing are reduced, manual intervention is reduced, sorting efficiency is increased, and sorting costs are reduced.
[0130] Optionally, based on the above embodiments, see also... Figure 5 Step 406 above, the sorting of the half-cut solar cells after edge passivation deposition based on the first non-contact test data, the second non-contact test data, and the efficiency improvement data of the half-cut solar cells after edge passivation deposition, may include:
[0131] First, based on the difference between the first non-contact test data and the second non-contact test data, a sorting model for half-cut battery cells is determined.
[0132] Specifically, the first non-contact test data includes conversion efficiency, film color data, and electroluminescence or photoluminescence defects of the half-cut solar cell before edge passivation deposition. The second non-contact test data includes conversion efficiency, film color data, and electroluminescence or photoluminescence defects of the half-cut solar cell after edge passivation deposition. These non-contact test data before and after edge passivation deposition determine the performance changes of the half-cut solar cell before and after the deposition. Based on these performance changes, a sorting model for the half-cut solar cells is established.
[0133] The sorting model for half-cut solar cells is compatible with the conversion efficiency, film color data, electroluminescence defects or photoluminescence defects of half-cut solar cells before and after edge passivation deposition. It can evaluate the performance of half-cut solar cells before and after edge passivation deposition, as well as the disturbance brought by edge passivation deposition to the performance of half-cut solar cells, thus improving the yield of half-cut solar cells.
[0134] Secondly, based on the contribution of the efficiency improvement data of the half-cut solar cells after edge passivation deposition, the half-cut solar cells are divided into grades to obtain half-cut solar cells of the first frequency grade and half-cut solar cells of the second frequency grade; the proportion of the first frequency grade is greater than the proportion of the second frequency grade.
[0135] Specifically, the first frequency setting can be a high-frequency setting, and the second frequency setting can be a low-frequency setting. A multi-robotics automatic sorting system can be used to separate the high-frequency and low-frequency cells. From the first and second non-contact test data, the efficiency of each half-cut battery and the data from various tests can be determined, thus specifying the proportion of half-cut battery cells in each setting.
[0136] The allocation criteria for the proportion of the first frequency level and the proportion of the second frequency level can be set as needed. For example, a level with a proportion exceeding 2% can be considered a high-frequency level, or a level with a proportion exceeding 5% can be considered a high-frequency level; no restrictions are imposed here.
[0137] Third, the half-cut battery cells of the first frequency range are sorted into boxes.
[0138] Specifically, half-cut solar cells in the first frequency range, such as those accounting for more than 98%, are directly sorted into boxes. As for the sorting rules, they can be based on 0.1% conversion efficiency, 3-5 film color classifications from light blue to dark blue, and multiple defect levels such as A, B, and C, as long as they do not exceed the requirements of the test data granularity, and no restrictions are imposed here.
[0139] Fourth, the half-cut battery cells of the second frequency range are centrally sorted a second time.
[0140] Specifically, the first sorting process only separates the high-frequency batteries, while the low-frequency batteries are grouped together in one box. Then, the batteries in the second frequency range, such as the low-frequency batteries, are grouped together and further sorted using a second sorting process.
[0141] For example, without secondary sorting of the half-cut solar cells in the second frequency range, 120 boxes are needed for both high and low frequency ranges; with 10 production lines, this would require 1200 boxes. However, with secondary sorting, 10 production lines of 30 boxes each can handle 95% of the capacity in a single sorting operation. The remaining 5% (10 boxes) of half-cut solar cells in the low frequency range only requires one 120-box secondary sorting unit, totaling 300 + 120 = 420 boxes. Therefore, by centrally performing secondary sorting on the half-cut solar cells in the second frequency range, the sorting range design is optimized. The high and low frequency range separation strategy reduces the number of sorting axes by approximately 50%, lowering equipment investment and maintenance costs. This embodiment provides a sorting accuracy of ±0.05%, ensuring good matching of half-cut solar cells within the module and reducing the phenomenon of bright and dark half-cells. This setup provides real-time quality monitoring data for the production process. The comparison of conversion efficiency before and after edge passivation deposition (EPD) can directly reflect the process status of edge passivation deposition (EPD), enabling rapid detection and handling of process anomalies in edge passivation deposition (EPD) and further improving production testing efficiency.
[0142] Based on the same inventive concept, this embodiment provides a half-cut battery cell testing and sorting device, comprising:
[0143] The contact test module is used to test the entire solar cell and decompose the test data into test data of at least one quasi-half-cut solar cell.
[0144] The non-contact testing module is used to perform non-contact testing on the cut half-cut battery cells based on the test data of the standard battery cell and the quasi-half-cut battery cell, and generate the first non-contact test data of the cut half-cut battery cells.
[0145] A passivation deposition module is used to perform edge passivation deposition on the battery cells.
[0146] The non-contact testing module is also used to perform non-contact testing on the half-cut battery cell after edge passivation deposition based on the test data of the standard battery cell and the quasi-half-cut battery cell, and generate second non-contact test data of the half-cut battery cell after edge passivation deposition.
[0147] The efficiency determination module is used to determine the efficiency improvement data of the half-cut battery cell after edge passivation deposition based on the difference between the first non-contact test data and the second non-contact test data.
[0148] The half-cut solar cell testing and sorting device provided in this embodiment uses a non-contact testing module to perform non-contact testing on the half-cut solar cells before and after edge passivation deposition, thereby effectively avoiding damage to the grid lines on the surface of the half-cut solar cells caused by contact testing. Furthermore, since the first non-contact test data used in the half-cut solar cell testing and sorting method provided in this embodiment is data before edge passivation deposition, and the second non-contact test data is data after edge passivation deposition, this setup ensures that the efficiency improvement data of the half-cut solar cells after edge passivation deposition measured by the half-cut solar cell testing and sorting device in this embodiment excludes the influence of cutting on the conversion efficiency of the half-cut solar cells, making the efficiency improvement data before and after edge passivation deposition more accurate and improving the testing accuracy of the efficiency improvement data of the half-cut solar cells before and after edge passivation deposition.
[0149] Note that the above description is merely a preferred embodiment of the present invention and the technical principles employed. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, readjustments, and substitutions can be made without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments, and may include many other equivalent embodiments without departing from the concept of the present invention, the scope of which is determined by the scope of the appended claims.
Claims
1. A method for testing and sorting half-cut battery cells, characterized in that, The method comprises: testing the whole battery piece, and decomposing the test data into at least one quasi-half-cut battery piece test data; based on the standard battery piece and the quasi-half-cut battery piece test data, performing non-contact testing on the cut half-cut battery piece to generate first non-contact test data of the cut half-cut battery piece; performing edge passivation deposition on the battery piece; based on the standard battery piece and the quasi-half-cut battery piece test data, performing non-contact testing on the half-cut battery piece after edge passivation deposition to generate second non-contact test data of the half-cut battery piece after edge passivation deposition; determining the efficiency improvement data of the half-cut battery piece after edge passivation deposition according to the difference between the first non-contact test data and the second non-contact test data.
2. The method of claim 1, wherein, The method comprises: exciting the cut half-cut battery piece and the standard battery piece to emit light; obtaining first luminescence image information of the cut half-cut battery piece and reference luminescence image information of the standard battery piece; calculating the first non-contact test data of the cut half-cut battery piece according to the quasi-half-cut battery piece test data, the first luminescence image information, and the reference luminescence image information.
3. The method of claim 2, wherein, The method comprises: performing multi-point fitting according to the quasi-half-cut battery piece test data, the first luminescence image information, and the reference luminescence image information to determine a first mapping model of the gray value and the electrical performance parameter of the cut half-cut battery piece; calculating the conversion efficiency and the electrical performance parameter of the cut half-cut battery piece according to the first mapping model and the conversion efficiency reference value of the reference battery piece; wherein the first non-contact test data comprises the conversion efficiency and the electrical performance parameter of the cut half-cut battery piece.
4. The method according to any one of claims 1 to 3, characterized in that, The method comprises: exciting the half-cut battery piece after edge passivation deposition and the standard battery piece to emit light; obtaining second luminescence image information of the half-cut battery piece after edge passivation deposition and reference luminescence image information of the standard battery piece; calculating the second non-contact test data of the half-cut battery piece after edge passivation deposition according to the quasi-half-cut battery piece test data, the second luminescence image information, and the reference luminescence image information.
5. The method of claim 4, wherein, The method comprises: performing multi-point fitting according to the quasi-half-cut battery piece test data, the second luminescence image information, and the reference luminescence image information to determine a second mapping model of the gray value and the electrical performance parameter of the half-cut battery piece after edge passivation deposition. According to the quasi-half-cut cell test data, the second luminous image information and the reference luminous image information, multi-point fitting is performed to determine a second mapping model of a gray value of the half-cut cell after edge passivation deposition and an electrical performance parameter; According to the second mapping model and a conversion efficiency reference value of the reference cell, a conversion efficiency and an electrical performance parameter of the half-cut cell after edge passivation deposition are calculated; wherein the second non-contact test data includes the conversion efficiency and the electrical performance parameter of the half-cut cell after edge passivation deposition.
6. The method according to any one of claims 1 to 3, characterized in that, Before the non-contact test on the cut half-cut cell based on the standard cell and the quasi-half-cut cell test data, the method further includes: An information identifier corresponding to the quasi-half-cut cell of the whole cell is identified, and the quasi-half-cut cell data is synchronized to the information identifier; wherein the quasi-half-cut cell electrical performance data includes at least one of an IV curve, an electrical performance parameter and appearance data; The whole cell is cut to form at least two half-cut cells.
7. The method of claim 6, wherein, Before the edge passivation deposition on the cell, the method further includes: According to the information identifier, the quasi-half-cut cell data is identified; According to the difference between the quasi-half-cut cell data and the first non-contact test data of the corresponding cut half-cut cell, damage data of the half-cut cell caused by the cutting process is determined.
8. The method of claim 6, wherein, Before the edge passivation deposition on the cell, the method further includes: The first non-contact test data is synchronized to the information identifier; Before the efficiency improvement data of the half-cut cell after edge passivation deposition is determined according to the difference between the first non-contact test data and the second non-contact test data, the method further includes: According to the information identifier, the first non-contact test data is identified.
9. The method according to claim 1 or 8, characterized in that, The efficiency improvement data of the half-cut cell after edge passivation deposition is determined according to the difference between the first non-contact test data and the second non-contact test data, including: According to the difference or quotient between the first non-contact test data and the second non-contact test data, the efficiency improvement data of the half-cut cell after edge passivation deposition is determined.
10. The method of claim 1, wherein, After the efficiency improvement data of the half-cut cell after edge passivation deposition is determined according to the difference between the first non-contact test data and the second non-contact test data, the method further includes: According to the first non-contact test data, the second non-contact test data and the efficiency improvement data of the half-cut cell after edge passivation deposition, the half-cut cell after edge passivation deposition is sorted.
11. The method of claim 10, wherein, According to the first non-contact test data, the second non-contact test data and the efficiency improvement data of the half-cut cell after edge passivation deposition, the half-cut cell after edge passivation deposition is sorted, including: According to the difference between the first non-contact test data and the second non-contact test data, a sorting model of the half-cut cell is determined; According to the contribution degree of the efficiency improvement data of the semi-cut battery piece after edge passivation deposition, the semi-cut battery piece is graded to obtain semi-cut battery pieces of a first frequency grade and semi-cut battery pieces of a second frequency grade; the proportion of the first frequency grade is greater than the proportion of the second frequency grade; The semi-cut battery pieces of the first frequency grade are sorted into a box; The semi-cut battery pieces of the second frequency grade are concentrated for secondary sorting.
12. A half-cut battery cell testing and sorting device, characterized in that, Comprise: A contact test module is configured to test the whole battery piece, and decompose the test data into at least one quasi-semi-cut battery piece test data; A non-contact test module is configured to test the semi-cut battery piece after cutting based on the standard battery piece and the quasi-semi-cut battery piece test data, and generate first non-contact test data of the semi-cut battery piece after cutting; A passivation deposition module is configured to perform edge passivation deposition on the battery piece; The non-contact test module is further configured to test the semi-cut battery piece after edge passivation deposition based on the standard battery piece and the quasi-semi-cut battery piece test data, and generate second non-contact test data of the semi-cut battery piece after edge passivation deposition; An efficiency improvement determination module is configured to determine the efficiency improvement data of the semi-cut battery piece after edge passivation deposition according to the difference between the first non-contact test data and the second non-contact test data.