High-temperature-resistant molybdenum-based diffuse reflection automatic light shutter system for xenon lamp light path and control method thereof

Abstract

The invention provides a high-temperature-resistant molybdenum-based diffuse reflection automatic light shutter system for a xenon lamp light path and a control method of the high-temperature-resistant molybdenum-based diffuse reflection automatic light shutter system, which are used for solving the common defects of poor heat resistance, reflection performance degradation, short service life, insufficient reliability and the like in extreme working environments such as long-time high temperature, strong light and the like of the existing light shutter system. And the requirement of long-term stable operation of a xenon lamp light path is difficult to meet. According to the high-temperature-resistant molybdenum-based diffuse reflection automatic light shutter system for the xenon lamp light path provided by the invention, high-melting-point molybdenum is adopted as a shutter baffle base material, so that the structure of a shutter can still be kept stable in a high-power xenon lamp intense radiation environment; meanwhile, the micro-groove array is arranged in the center of the surface of the molybdenum shutter baffle, so that light from visible to near-infrared bands is scattered for multiple times in the micro-groove array structure, the reflectivity of the light is reduced, thermal deformation or failure of the shutter baffle is avoided, and the reliability of the light shutter system under the high-temperature working condition is remarkably improved.

Description

Technical Field

[0001] This invention relates to shutter systems and their control methods, and more particularly to a high-temperature resistant molybdenum-based diffuse reflection automatic shutter system and its control method for xenon lamp circuits. Background Technology

[0002] In the field of high-power light source systems, xenon lamps are widely used in simulating sunlight, testing the irradiation effect of materials, and conducting photocatalysis research due to their high energy flux density and spectral characteristics close to those of sunlight. However, xenon lamps generate high heat flux density during operation, especially in continuous operation mode, requiring repeated switching on and off of the lamp for testing, which significantly affects the lamp's lifespan. Therefore, this invention considers introducing an optical shutter system into the xenon lamp's optical path system. By precisely controlling the xenon lamp's light signal, it replaces the repeated switching on and off of the lamp, thereby improving system reliability. However, xenon lamps typically have high power, and existing optical shutter systems generally suffer from poor heat resistance, degraded reflectivity, short lifespan, and insufficient reliability under extreme operating environments such as prolonged high temperatures and strong light, making it difficult to meet the requirements for long-term stable operation of the xenon lamp path. Summary of the Invention

[0003] The purpose of this invention is to solve the technical problems that existing optical shutter systems generally suffer from poor heat resistance, degraded reflectivity, short lifespan, and insufficient reliability under extreme working environments such as long-term high temperature and strong light, making it difficult to meet the requirements of long-term stable operation of xenon lamp circuits. The invention provides a high-temperature resistant molybdenum-based diffuse reflection automatic optical shutter system and its control method for xenon lamp circuits.

[0004] To achieve the above objectives, the technical solution provided by the present invention is as follows: A high-temperature resistant molybdenum-based diffuse reflection automatic optical shutter system for xenon lamp circuits is characterized by comprising a high-power xenon lamp subsystem, an optical shutter subsystem, and a sample adjustment subsystem. The high-power xenon lamp subsystem is mounted on an optical platform and is used to radiate irradiance with adjustable heat flux density. The optical shutter subsystem includes a molybdenum shutter baffle, a heat insulation baffle, a slider, a drive mechanism, and a control unit; The sample adjustment subsystem includes a displacement stage set on an optical platform and a sample stage set on the displacement stage; the sample to be tested is placed on the sample stage, and the geometric center of the sample to be tested coincides with the focal position of the high-power xenon lamp subsystem. The slider is positioned between the high-power xenon lamp subsystem and the sample under test, and is horizontally mounted on the optical platform along a direction perpendicular to the optical axis of the irradiated light. The molybdenum shutter baffle and the heat insulation baffle are coaxially spaced on the slider along the transmission direction of the irradiated light. The surface of the molybdenum shutter baffle facing the high-power xenon lamp subsystem is frosted, and a microgroove array is provided at the center of the surface facing the high-power xenon lamp subsystem. The size of the microgroove array covers the light spot of the irradiated light on the corresponding surface of the molybdenum shutter baffle, so as to improve the diffuse reflection performance of the molybdenum shutter baffle in the visible to near-infrared band. The drive end of the drive mechanism is connected to the slider, which drives the slider to perform linear reciprocating motion, thereby causing the molybdenum shutter baffle to reciprocate between the initial blocking position and the shutter opening position, so as to block the beam of irradiated light or allow it to irradiate normally; the initial blocking position is when the center point of the molybdenum shutter baffle coincides with the optical axis of the irradiated light, and the spot of the irradiated light falls completely on the position of the microgroove array; the shutter opening position is any position on the outside of the molybdenum shutter baffle where there is no interference with the beam of irradiated light. The control unit is electrically connected to the drive mechanism. The control unit generates control commands according to a preset program and sends the control commands to the drive mechanism. The control unit is also used to monitor the operating status of the molybdenum shutter baffle in real time.

[0005] Furthermore, the optical shutter subsystem also includes a temperature sensor; The temperature sensor is installed at the center of the surface of the molybdenum shutter baffle on the side away from the high-power xenon lamp subsystem, and is used to monitor the operating temperature of the molybdenum shutter baffle in real time.

[0006] Furthermore, the heat insulation baffle is made of glass fiber honeycomb sandwich composite material.

[0007] Furthermore, the displacement stage is a three-dimensional displacement stage.

[0008] Furthermore, the microgroove array is a periodic microstructure surface formed by a regular arrangement of multiple frustum-shaped structures.

[0009] Furthermore, the temperature sensor is an N-type thermocouple.

[0010] Furthermore, the molybdenum-based material of the molybdenum shutter baffle has a purity greater than 99.95%.

[0011] Furthermore, the high-power xenon lamp subsystem includes a light source cavity, a xenon lamp light source installed in the light source cavity, an optical glass installed at one end of the light source cavity, and a xenon lamp control system electrically connected to the xenon lamp light source. The xenon lamp light source is used to radiate high-intensity irradiation light outward. The optical glass is installed on the light source cavity, directly opposite the xenon lamp light source radiation outlet, and the surface of the optical glass is perpendicular to the optical axis of the irradiation beam. The xenon lamp control system is used to output a high-voltage pulse to break down the xenon gas, start the discharge process, and precisely control the output power of the xenon lamp light source by adjusting the working current.

[0012] In addition, the present invention also provides a control method for the above-mentioned high-temperature molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits, which is characterized by including the following steps: Step 1: System initialization and self-test; Step 2: Fix the sample to be tested on the sample stage, and adjust the position of the sample to be tested by means of the displacement stage so that the geometric center of the sample to be tested coincides with the focal position of the high-power xenon lamp subsystem; at the same time, place the molybdenum shutter baffle at the initial blocking position. Step 3: Start the high-power xenon lamp subsystem to emit stable irradiance; Step 4: Start the control unit and control the drive mechanism according to the predetermined control program to drive the slider to move, thereby moving the molybdenum shutter baffle to the preset shutter opening position. At this time, the irradiation beam emitted by the high-power xenon lamp subsystem directly irradiates the surface of the sample to be tested, and the irradiation experiment of the sample to be tested begins. Step 5: After the predetermined irradiation time is reached, the control unit is restarted and the drive mechanism is controlled according to the predetermined control program to drive the slider to move, thereby driving the molybdenum shutter baffle back to the initial shutter opening position to block the irradiation light path of the high-power xenon lamp subsystem. Step 6: Replace the sample to be tested on the sample stage and return to Step 4 until all samples to be tested have been tested. Step 7: Turn off the high-power xenon lamp subsystem. After confirming that the molybdenum shutter baffle has returned to its initial blocking position, turn off the drive mechanism and control unit in sequence to complete the automated cyclic test of all samples to be tested.

[0013] Compared with the prior art, the beneficial effects of the present invention are as follows: 1. This invention provides a high-temperature resistant molybdenum-based diffuse reflection automatic optical shutter system for xenon lamp circuits. It uses high-melting-point molybdenum (melting point 2623°C) as the shutter baffle substrate to form a molybdenum shutter baffle. Combined with its low coefficient of thermal expansion and high thermal conductivity, the shutter maintains structural stability even under the intense radiation environment of a high-power xenon lamp. Simultaneously, a microgroove array is set at the center of the molybdenum shutter baffle surface, causing multiple scattering of light in the visible to near-infrared bands within the microgroove array structure. This reduces light reflectivity, decreases local absorption of the material, reduces heat accumulation, and avoids material damage caused by localized overheating. This prevents thermal deformation or failure of the shutter baffle, significantly improving the reliability of the optical shutter system under high-temperature conditions. This system possesses excellent high-temperature stability, efficient diffuse reflection characteristics, long service life, and high reliability, achieving safe, rapid, and repeatable dynamic control of high-power xenon lamp circuits. It can be widely applied to high-power light source systems, such as material irradiation effect testing platforms and extreme thermal environment simulation systems, for precise irradiation testing.

[0014] 2. The present invention provides a high-temperature molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits. The shutter baffle is made of molybdenum. Due to the excellent high-temperature strength and oxidation resistance of molybdenum material itself, and the self-carbonization ability and radiation resistance of its surface structure, the shutter can still maintain stable performance under long-term frequent opening and closing and strong light irradiation. The material has strong durability, significantly extends the service life of the equipment, and reduces maintenance costs.

[0015] 3. The present invention provides a high-temperature resistant molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits, which integrates a temperature sensor on the molybdenum shutter baffle. The system can monitor the high-temperature operating status of the molybdenum shutter baffle based on the real-time temperature of the molybdenum shutter baffle, thereby effectively improving operational safety.

[0016] 4. The present invention provides a high-temperature molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits, which designs the optical glass as a double-layer structure and sets a cooling channel containing a cooling medium in its interlayer, so that the cooling medium can circulate in the cooling channel of the optical glass to achieve heat dissipation of the xenon lamp light source.

[0017] 5. The present invention provides a control method for a high-temperature molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits. By controlling the xenon lamp irradiation process with high precision, it effectively reduces the frequent opening and closing actions in xenon lamp irradiation experiments, significantly extending the service life of the xenon lamp. At the same time, the molybdenum shutter baffle can realize multiple control modes such as normally open / normally closed, timed switch, and continuous modulation, flexibly adapting to different application scenarios, such as spectral acquisition and irradiation sample testing. Attached Figure Description

[0018] Figure 1This is a schematic diagram of an embodiment of a high-temperature molybdenum-based diffuse reflection automatic optical shutter system for xenon lamp circuits according to the present invention; Figure 2 This is a schematic diagram of the microgroove array on the molybdenum shutter baffle in an embodiment of the present invention.

[0019] The attached figures are labeled as follows: 11-Light source cavity; 12-Xenon lamp light source; 13-Optical glass; 14-Xenon lamp control system; 21-Molybdenum shutter baffle; 22-Heat insulation baffle; 23-Slider; 24-Drive mechanism; 25-Control unit; 26-Temperature sensor; 27-Microgroove array; 31-Sample stage; 32-Displacement stage; 33-Sample to be tested. Detailed Implementation

[0020] To make the advantages and features of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0021] like Figure 1 As shown, a high-temperature resistant molybdenum-based diffuse reflection automatic optical shutter system for xenon lamp circuits includes a high-power xenon lamp subsystem, an optical shutter subsystem, and a sample adjustment subsystem.

[0022] The high-power xenon lamp subsystem serves as the energy source for the entire system, providing high-intensity, wide-spectrum, and highly stable continuous irradiance to simulate extreme thermal radiation environments such as catastrophic fires. Specifically, the high-power xenon lamp subsystem includes a light source cavity 11, a xenon lamp light source 12, optical glass 13, and a xenon lamp control system 14.

[0023] The light source cavity 11 has a cylindrical structure and is mounted on an optical platform. The xenon lamp source 12, as the core high-energy radiation source, is installed inside the light source cavity 11. Specifically, the xenon lamp source 12 includes a xenon lamp and an ellipsoidal metal focusing mirror located outside the xenon lamp. The metal focusing mirror focuses the light emitted by the xenon lamp onto the target area. The optical glass 13 is circular and serves as the light source outlet. It is mounted on the light source cavity 11 directly opposite the radiation outlet of the xenon lamp source 12, and the surface of the optical glass 13 is perpendicular to the optical axis of the irradiated beam. The xenon lamp source 12 radiates high-intensity irradiated light outward through the optical glass 13. Both can be flexibly configured according to different irradiation conditions. In this embodiment, the xenon lamp source 12 has a radiation wavelength range of 350nm to 2500nm, a maximum output power of 10kW, and a spot diameter of 50mm at the focal point; the optical glass 13 has a diameter of 400mm and a thickness of 3mm.

[0024] The xenon lamp control system 14 is the core unit for achieving stable startup, safe operation, and precise power regulation of the xenon lamp light source 12. Electrically connected to the xenon lamp light source 12, it outputs a high-voltage pulse to break down the xenon gas, initiating the discharge process. It also precisely controls the output power of the xenon lamp light source 12 by adjusting the operating current, thereby regulating the heat flux density of the irradiated light. The recommended adjustment range for heat flux density in this invention is 20 W / cm² to 700 W / cm², which can be selected according to experimental needs. The high-power xenon lamp subsystem also includes a cooling system. Once the xenon lamp light source 12 is lit, the cooling system immediately activates, forming a circulating airflow to cool the xenon lamp light source 12.

[0025] The optical shutter subsystem automatically opens and closes the irradiation light path by moving the position of the molybdenum shutter baffle 21, and precisely controls the irradiation time of the sample 33 to be tested. It includes the molybdenum shutter baffle 21, the heat insulation baffle 22, the slider 23, the drive mechanism 24, the control unit 25, and the temperature sensor 26.

[0026] The molybdenum shutter baffle 21 is made of high-temperature resistant molybdenum-based material. Preferably, in this embodiment, the purity of the molybdenum-based material is greater than 99.95%, and its length and width are both 500 mm, with a thickness of 10 mm. The molybdenum shutter baffle 21 is positioned between the xenon lamp light source 12 and the sample 33 to be tested. The surface of the baffle facing the xenon lamp light source 12 is frosted to suppress specular reflection and effectively reduce stray light interference. The horizontal distance between the molybdenum shutter baffle 21 and the optical glass 13 is designed according to the parameters of the xenon lamp light source 12 and the dimensions of the optical glass 13. In this embodiment, the horizontal distance between the two is 200 mm to ensure sufficient thermal isolation and optical path adjustment space.

[0027] A microgroove array 27 is provided at the center of the surface of the molybdenum shutter baffle 21 on the side away from the xenon lamp source 12. This array is used to improve the diffuse reflection performance of the molybdenum shutter baffle 21 in the visible to near-infrared band, giving it excellent broadband diffuse reflection characteristics. This reduces energy absorption, improves thermal management capabilities, and effectively protects optical components and operator safety. Figure 2 As shown, the microgroove array 27 is a periodic microstructure surface formed by a regular arrangement of multiple frustum-shaped structures. The entire periodic microstructure surface is designed based on the effective area on which the irradiated light beam directly hits the molybdenum shutter baffle 21. In this embodiment, it is a 250mm × 250mm square area, which is formed by laser processing. The design principle of the frustum-shaped structure is based on the optical propagation laws, such as reflection, scattering, and diffraction characteristics, to optimize the diffuse reflection performance and thermal radiation management capability of the molybdenum shutter baffle 21 surface. In this embodiment, the slope of the frustum-shaped structure is 60°.

[0028] The slider 23 is positioned between the high-power xenon lamp subsystem and the sample 33 under test, and is horizontally mounted on the optical platform along a direction perpendicular to the irradiation light axis. It moves via a track at its bottom. A molybdenum shutter baffle 21 and a heat insulation baffle 22 are coaxially spaced on the slider 23 along the irradiation light transmission direction. The heat insulation baffle 22 is used to prevent the high heat flux density irradiation light from affecting the sample under test during non-testing periods. The heat insulation baffle 22 is made of glass fiber honeycomb sandwich composite material, a lightweight and high-strength structure with a glass fiber fabric panel and a glass fiber honeycomb core, bonded together with epoxy / phenolic resins. It has a thermal conductivity of 0.05–0.08 Wm⁻¹K⁻¹ and an operating temperature ≤180 degrees Celsius. In this embodiment, the heat insulation baffle 22 is 500 mm long and 500 mm wide, and 100 mm thick. The distance between the heat insulation baffle 22 and the molybdenum shutter baffle 21 is 15cm. This is mainly to isolate the heat generated by the long-term exposure of the molybdenum shutter baffle 21 to the xenon lamp, and to prevent the heat of the molybdenum shutter baffle 21 from being transferred to the surface of the sample 33 to be tested, thus affecting the subsequent measurement results.

[0029] The drive end of the drive mechanism 24 is connected to the slider 23. Through a cam mechanism, it converts the rotational motion of the motor into the linear reciprocating motion of the slider 23. The slider 23 drives the molybdenum shutter baffle 21 to reciprocate between the initial blocking position and the shutter open position, thereby blocking or allowing normal irradiation of the irradiated light beam. This precisely controls the on / off state of the illumination, enabling time-resolved optical response testing and meeting the requirements of high-precision optical experiments. The initial blocking position is where the center point of the molybdenum shutter baffle 21 coincides with the optical axis of the irradiated light, and the spot of the irradiated light beam falls completely on the surface of the molybdenum shutter baffle 21. The shutter open position is any position outside the irradiated light beam where there is no interference with the irradiated light beam. In this embodiment, the drive mechanism 24 uses an AC servo drive, single-phase 220VAC, with a speed range of 0–3000 rpm and an acceleration range of 0–5000 rpm / s². It can be configured with an S-shaped acceleration / deceleration control program according to actual motion requirements, achieving smooth start / stop, rapid response, and precise positioning—high dynamic performance. In this embodiment, the maximum single stroke of the molybdenum shutter baffle 21 reciprocating motion is 450mm, so as to flexibly adjust the on / off state of the light path and meet the illumination control requirements of different experimental modes.

[0030] The control unit 25 is electrically connected to the drive mechanism 24 and is used to generate control commands according to a preset program to control the drive mechanism 24, thereby driving the molybdenum shutter baffle 21 to perform precise opening and closing operations, and to realize real-time monitoring and feedback of the operating status. It supports multiple working modes (such as external triggering, timed control, etc.). In this embodiment, the response time of the control unit 25 is 10ms, which can precisely control the opening and closing of the molybdenum shutter baffle 21 according to the preset program.

[0031] Temperature sensor 26 is installed in the central area of ​​the rear surface of molybdenum shutter baffle 21. Preferably, an N-type thermocouple is used, with a temperature measurement range of 0°C to 1300°C and a measurement accuracy of ±1.5°C. Temperature sensor 26 is electrically connected to an alarm device. When the detected temperature exceeds 1000°C, the system automatically triggers an alarm to indicate an overheating condition, thus achieving real-time monitoring and safety protection of the operating temperature of molybdenum shutter baffle 21. In other embodiments of the invention, other types of temperature sensors, such as K-type, can also be selected.

[0032] The sample adjustment subsystem includes a displacement stage 32 mounted on the optical platform and a sample stage 31 mounted on the displacement stage 32, used to collaboratively perform the clamping, positioning, and fine-tuning functions of the sample 33 to be tested. The sample 33 to be tested is placed on the sample stage 31, and the geometric center of the sample 33 coincides with the focal point of the xenon lamp light source 12. That is, the distance between the geometric center of the sample 33 and the optical glass 13 is 380mm ± 5mm, and the distance between the sample 33 and the optical platform is 220mm ± 5mm, to ensure that the sample 33 to be tested is in the region where the energy of the irradiated light spot is most concentrated (the central irradiation region of the irradiated light). The displacement stage 32 is a three-dimensional displacement stage, which, through its three-dimensional continuous and precise fine-tuning, allows the sample 33 to be quickly positioned in the optimal irradiation position of the irradiated light, thereby improving the accuracy and repeatability of the experiment.

[0033] superior Narrative The control method for a high-temperature molybdenum-based diffuse reflection automatic shutter system used in xenon lamp circuits specifically includes the following steps: Step 1: System initialization and self-test.

[0034] Before starting the high-temperature molybdenum-based diffuse reflection automatic shutter system used in the xenon lamp circuit, the system initialization and self-test procedures are executed first. Specifically, the control unit 25 is started, and the working status of the drive mechanism 24, each communication interface and temperature sensor 26 are automatically detected to confirm that each module is powered on normally and the signal response is accurate, while ensuring that the system is in a safe and operable standby state.

[0035] Step 2: Prepare the sample to be tested 33 and the molybdenum shutter baffle 21.

[0036] The sample to be tested 33 is fixed on the sample stage 31, and the position and orientation of the sample to be tested 33 are adjusted by the displacement stage 32 so that the geometric center of the sample to be tested 33 coincides with the focal position of the high-power xenon lamp subsystem.

[0037] Next, place the molybdenum shutter baffle 21 in the initial blocking position. After placement, first check whether the feedback temperature of the temperature sensor 26 is within the room temperature range. If the temperature sensor 26 is verified to be working normally, then check and confirm that the molybdenum shutter baffle 21 is in the initial blocking position to ensure that the initial state of the system is the optical path blocking mode and put it in the standby mode.

[0038] Step 3, system adjustment.

[0039] Start the xenon lamp control system 14 to output a high-voltage pulse to break down the xenon gas and light up the light source. Then adjust the operating current to the lowest output power and observe the real-time reading of the temperature sensor 26 to confirm that there is no abnormal temperature rise in the system.

[0040] The xenon lamp control system 14 gradually adjusts the output power of the xenon lamp light source 12 to the preset target value and continuously monitors the data of the temperature sensor 26 to ensure that the set safety threshold is not exceeded; after the heat flux density of the irradiated light output by the xenon lamp light source 12 stabilizes for about 20 seconds, it enters a stable irradiation state.

[0041] Step 4: Irradiation test is performed on the sample 33 to be tested.

[0042] The control unit 25 is activated and the drive mechanism 24 is controlled according to the predetermined control program, so that it drives the slider 23 to move, thereby moving the molybdenum shutter baffle 21 to the preset shutter opening position. At this time, the irradiation light emitted by the xenon lamp light source 12 directly irradiates the surface of the sample 33 to be tested, and the irradiation experiment of the sample 33 to be tested begins.

[0043] Step 5: After the predetermined irradiation time is reached, the control unit 25 is restarted and the drive mechanism 24 is controlled according to the predetermined control program to drive the slider 23 to move, thereby driving the molybdenum shutter baffle 21 back to the initial blocking position to block the light path of the irradiation light.

[0044] Step 6: Replace the sample 33 to be tested on the sample stage 31 and return to step 4 until all samples 33 to be tested have been tested.

[0045] Step 7: Turn off the xenon lamp light source 12, and after confirming that the molybdenum shutter baffle 21 has returned to the initial blocking position, turn off the drive mechanism 24, control unit 25 and temperature sensor 26 in sequence to ensure that the system safely exits the operating state and completes the automated cyclic test of all samples 33 to be tested.

[0046] The above description is only used to illustrate the technical solutions of the present invention, and is not intended to limit them. For those skilled in the art, modifications can be made to the specific technical solutions described in the above embodiments, or equivalent substitutions can be made to some of the technical features. However, these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions protected by the present invention.

Claims

1. A high-temperature resistant molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits, characterized in that: This includes a high-power xenon lamp subsystem, an optical shutter subsystem, and a sample conditioning subsystem; The high-power xenon lamp subsystem is mounted on an optical platform and is used to radiate irradiance with adjustable heat flux density. The optical shutter subsystem includes a molybdenum shutter baffle (21), a heat insulation baffle (22), a slider (23), a drive mechanism (24), and a control unit (25). The sample adjustment subsystem includes a displacement stage (32) set on an optical platform and a sample stage (31) set on the displacement stage (32); the sample to be tested (33) is placed on the sample stage (31), and the geometric center of the sample to be tested (33) coincides with the focal position of the high-power xenon lamp subsystem. The slider (23) is positioned between the high-power xenon lamp subsystem and the sample to be tested (33), and is horizontally mounted on the optical platform in a direction perpendicular to the optical axis of the irradiation light; the molybdenum shutter baffle (21) and the heat insulation baffle (22) are coaxially spaced on the slider (23) in sequence along the transmission direction of the irradiation light; the surface of the molybdenum shutter baffle (21) facing the high-power xenon lamp subsystem is set as a frosted surface, and a microgroove array (27) is set at the center of the surface facing the high-power xenon lamp subsystem; the size of the microgroove array (27) covers the light spot of the irradiation light on the corresponding surface of the molybdenum shutter baffle (21) to improve the diffuse reflection performance of the molybdenum shutter baffle (21) in the visible to near-infrared band; The driving end of the driving mechanism (24) is connected to the slider (23) to drive the slider (23) to make linear reciprocating motion, thereby driving the molybdenum shutter baffle (21) to reciprocate between the initial blocking position and the shutter opening position, so as to block the beam of irradiated light or allow it to irradiate normally; the initial blocking position is when the center point of the molybdenum shutter baffle (21) coincides with the optical axis of the irradiated light, and the spot of the irradiated light falls completely on the position of the microgroove array (27); the shutter opening position is any position on the outside of the molybdenum shutter baffle (21) where it does not interfere with the beam of irradiated light. The control unit (25) is electrically connected to the drive mechanism (24). The control unit (25) generates control commands according to a preset program and sends the control commands to the drive mechanism (24). The control unit (25) is also used to monitor the operating status of the molybdenum shutter baffle (21) in real time.

2. The high-temperature molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits according to claim 1, characterized in that: The optical shutter subsystem also includes a temperature sensor (26). The temperature sensor (26) is installed at the center of the surface of the molybdenum shutter baffle (21) away from the high-power xenon lamp subsystem, and is used to monitor the working temperature of the molybdenum shutter baffle (21) in real time.

3. The high-temperature molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits according to claim 2, characterized in that: The heat insulation baffle (22) is made of glass fiber honeycomb sandwich composite material.

4. The high-temperature molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits according to claim 3, characterized in that: The displacement stage (32) is a three-dimensional displacement stage.

5. The high-temperature molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits according to any one of claims 1-4, characterized in that: The microgroove array (27) is a periodic microstructure surface formed by a regular arrangement of multiple frustum-shaped structures.

6. The high-temperature molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits according to claim 5, characterized in that: The temperature sensor (26) is an N-type thermocouple.

7. The high-temperature molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits according to claim 6, characterized in that: The molybdenum-based material of the molybdenum shutter baffle (21) has a purity greater than 99.95%.

8. The high-temperature molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits according to claim 1, characterized in that: The high-power xenon lamp subsystem includes a light source cavity (11), a xenon lamp light source (12) installed in the light source cavity (11), an optical glass (13) installed at one end of the light source cavity (11), and a xenon lamp control system (14) electrically connected to the xenon lamp light source (12). The xenon lamp light source (12) is used to radiate high-intensity irradiation light outward. The optical glass (13) is installed on the light source cavity (11) directly opposite the radiation outlet of the xenon lamp light source (12), and the surface of the optical glass (13) is perpendicular to the optical axis of the irradiation beam. The xenon lamp control system (14) is used to output a high-voltage pulse to break down the xenon gas, start the discharge process, and precisely control the output power of the xenon lamp light source (12) by adjusting the working current.

9. A control method for a high-temperature molybdenum-based diffuse reflection automatic shutter system for xenon lamp circuits as described in any one of claims 1-8, characterized in that, Includes the following steps: Step 1: System initialization and self-test; Step 2: Fix the sample to be tested (33) on the sample stage (31), and adjust the position of the sample to be tested (33) by means of the displacement stage (32) so that the geometric center of the sample to be tested (33) coincides with the focal position of the high-power xenon lamp subsystem; at the same time, place the molybdenum shutter baffle (21) at the initial blocking position. Step 3: Start the high-power xenon lamp subsystem to emit stable irradiance; Step 4: Start the control unit (25) and control the drive mechanism (24) according to the predetermined control program to make it drive the slider (23) to move, thereby driving the molybdenum shutter baffle (21) to move to the preset shutter opening position. At this time, the irradiation beam emitted by the high-power xenon lamp subsystem directly irradiates the surface of the sample to be tested (33) and the irradiation experiment of the sample to be tested (33) begins. Step 5: After the predetermined irradiation time is reached, the control unit (25) is restarted again and the drive mechanism (24) is controlled according to the predetermined control program to make the drive slider (23) move, thereby driving the molybdenum shutter baffle (21) back to the initial blocking position to block the irradiation light path of the high-power xenon lamp subsystem. Step 6: Replace the sample to be tested (33) on the sample stage (31) and return to step 4 until all samples to be tested (33) have been tested. Step 7: Turn off the high-power xenon lamp subsystem, and after confirming that the molybdenum shutter baffle (21) has returned to the initial blocking position, turn off the drive mechanism (24) and control unit (25) in sequence to complete the automated cyclic test of all samples (33) to be tested.

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