Test device
By designing a modular testing device that adapts to the perpendicularity of the positive and negative terminal pressing surfaces, stable and reliable surface contact is achieved, solving the problems of increased contact resistance and safety hazards, and improving testing accuracy and system flexibility.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHENZHEN YUANLICHUANG TECH CO LTD
- Filing Date
- 2026-02-28
- Publication Date
- 2026-05-22
AI Technical Summary
Existing technologies make it difficult to achieve stable and sufficient surface contact between modules with perpendicular positive and negative terminal pressing surfaces, resulting in increased contact resistance, affecting test accuracy and posing safety hazards.
A testing device was designed, including a fixture, a base, a testing component, and a crimping component. The positive and negative terminals of the module are crimped synchronously by horizontally and vertically arranged crimping parts to ensure large-area, stable and reliable surface contact. The adapter component compensates for processing and assembly errors.
It effectively reduces contact resistance and the risk of overheating, improves the safety and accuracy of the testing process, supports rapid adaptation to various packaging forms, and enhances the flexibility and efficiency of the testing system.
Smart Images
Figure CN121741433B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of high-power testing technology, and in particular to a testing device. Background Technology
[0002] Power semiconductor modules typically require quality and performance testing during manufacturing. This testing process involves crimping the copper busbars of the test system onto the terminals of the module under test.
[0003] With the development of module design, some modules adopt a structure where the positive and negative terminal crimping surfaces are perpendicular to each other, meaning one terminal's crimping surface is horizontal and the other's is vertical. If a conventional top-down vertical crimping method is used, the test copper busbar cannot easily form sufficient and stable surface contact with the module terminal's vertical crimping surface, resulting in limited contact area and increased contact resistance. During high-current testing, poor contact can easily lead to localized overheating, affecting test accuracy and potentially causing module damage or even explosion due to excessive temperature rise, posing a safety hazard. Summary of the Invention
[0004] Therefore, it is necessary to provide a testing device to address the above problems, which is compatible with modules where the positive and negative terminal pressing surfaces are perpendicular to each other.
[0005] This invention provides a testing device, including a module under test (DUT) for testing. The DUT includes a first terminal and a second terminal located on the same side. The crimping surface of the first terminal is horizontally arranged, and the crimping surface of the second terminal is vertically arranged. The testing device includes: a fixture, including a support position for supporting the DUT; a base, disposed on the top of the fixture and capable of moving closer to and further away from the fixture; a testing assembly disposed on the base, including a first test piece and a second test piece corresponding to the first terminal and the second terminal, respectively. The first test piece includes a horizontally arranged first crimping portion, and the second test piece includes a vertically arranged second crimping portion. When the base is close to the support position, the first crimping portion can crimp onto the crimping surface of the first terminal; and a second crimping assembly disposed on the fixture, which, when the base is close to the support position, can crimp the second crimping portion onto the crimping surface of the second terminal.
[0006] In the aforementioned testing device, when the base is close to the bearing position, the first crimping part can be crimped onto the crimping surface of the first terminal, and at the same time, the second crimping assembly can also crimp the second crimping part onto the crimping surface of the second terminal, thereby achieving simultaneous crimping and electrical performance testing of the mutually perpendicular first and second terminals on the module under test. Furthermore, the crimping surfaces of the first crimping part and the first terminal are crimped vertically, while the crimping surfaces of the second crimping part and the second terminal are crimped laterally, ensuring that a large-area, stable, and reliable surface contact can be formed between the first test piece and the first terminal, and between the second test piece and the second terminal. This effectively reduces contact resistance and the risk of overheating, and improves the safety of the testing process and the accuracy of the test results.
[0007] In one embodiment, the testing apparatus further includes an adapter assembly disposed on the fixture, the adapter assembly including a conductive adapter having at least two degrees of freedom, one end of the adapter being used to abut against the crimping surface of the second terminal, and the second crimping assembly being capable of crimping the second crimping portion onto the end of the adapter away from the second terminal.
[0008] With this configuration, the adapter can adaptively adjust its position during the side crimping process, compensate for processing and assembly errors, and ensure that the crimping surfaces of the second crimping part, the adapter, and the second terminal are completely fitted and in close contact.
[0009] In one embodiment, the adapter assembly further includes a base and a slider. The base is disposed on the fixture, the slider is disposed on the base and can slide towards / away from the bearing position in a horizontal preset direction, and the adapter is disposed on the slider.
[0010] This design allows the adapter to slide freely in a preset horizontal direction, ensuring that the adapter can be pressed accurately and smoothly against the second terminal, achieving reliable side crimping.
[0011] In one embodiment, the adapter assembly further includes an elastic element, the two ends of which abut against the end of the slider near the bearing position and the base, respectively.
[0012] With this configuration, the elastic element has a buffering capacity to protect the second terminal, the adapter, and the second crimping part, and enables the adapter to adaptively adjust its position to compensate for processing and assembly errors; after the test is completed, it can also automatically reset to its initial position under the action of the elastic element.
[0013] In one embodiment, the adapter assembly further includes an adjusting member disposed on the base and connected to the base via a threaded connection, one end of the adjusting member abutting against the end of the sliding member away from the bearing position.
[0014] This configuration allows the initial position of the slider to be adjusted via the adjusting mechanism, thereby adjusting the distance or preload between the adapter and the second terminal.
[0015] In one embodiment, the second crimping assembly includes a crimping member and a driving member. The crimping member is located on the side of the adapter away from the bearing position, and the driving member is disposed on the fixture and is capable of driving the crimping member to slide along the horizontal preset direction.
[0016] This configuration provides a stable and sufficient clamping force to the second crimping part, ensuring a reliable electrical connection between the second crimping part, the adapter, and the second terminal, and guaranteeing consistent crimping conditions for each test, thereby improving the accuracy of the test results.
[0017] In one embodiment, the adapter assembly further includes a rotating member disposed on the sliding member and capable of rotating about a preset axis, the adapter being disposed on the rotating member.
[0018] This design allows the adapter to rotate freely around a preset axis, adjusting its rotation according to the actual angle of the second terminal's crimping surface. This compensates for machining and assembly errors, ensuring a tight fit between the adapter and the crimping surface of the second terminal.
[0019] In one embodiment, the testing device further includes a first crimping component disposed on the base, wherein when the base is close to the bearing position, the first crimping component can crimp the first crimping portion onto the crimping surface of the first terminal.
[0020] This design makes the connection between the first crimping part and the first terminal more stable and reliable.
[0021] In one embodiment, both the first crimping component and the test component are detachably connected to the base.
[0022] This configuration allows for easy replacement or adjustment based on the terminal layout of different modules under test, supports rapid adaptation of multiple package types on the same test host, and improves the flexibility and changeover efficiency of the test system.
[0023] In one embodiment, the testing device further includes a pressing component disposed on the base, wherein when the base is close to the bearing position, the pressing component can press the module under test against the bearing position; and / or, the testing device further includes a probe plate assembly disposed on the base, wherein when the base is close to the bearing position, the probe plate assembly is electrically connected to the module under test.
[0024] This configuration ensures the stability and reliability of the module under test (DUT) at the bearing position, preventing displacement or shaking of the DUT during testing that could affect test results or cause damage. The testing device can simultaneously test the first terminal, the second terminal, and the signal terminals of the DUT without interference, thus improving testing efficiency. Attached Figure Description
[0025] To more clearly illustrate the technical solutions in the embodiments of this application or the conventional technology, the drawings used in the description of the embodiments or the conventional technology will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0026] Figure 1 This is a three-dimensional structural schematic diagram of a testing device according to one embodiment of the present invention;
[0027] Figure 2 Provided by the present invention Figure 1 A structural diagram from the main viewpoint;
[0028] Figure 3 Provided by the present invention Figure 2 Enlarged view of point A in the middle;
[0029] Figure 4 Provided by the present invention Figure 2 A partial structural diagram of the low-pressure component when it is far from the bearing position;
[0030] Figure 5 Provided by the present invention Figure 4 A schematic diagram of a partial three-dimensional structure;
[0031] Figure 6 Provided by the present invention Figure 5 Cross-sectional view of the intermediate transfer component;
[0032] Figure 7 Provided by the present invention Figure 5 A schematic diagram of the structure of the module under test.
[0033] Reference numerals: 1. Fixture; 11. Bearing position; 2. Base; 3. Test assembly; 31. First test piece; 311. First crimping part; 312. Conductive block; 32. Second test piece; 321. Second crimping part; 33. Capacitor; 4. First crimping assembly; 5. Second crimping assembly; 51. Crimping element; 52. Driving element; 6. Adapter assembly; 61. Adapter element; 62. Base; 63. Sliding element; 64. Adjusting element; 641. Threaded section; 642. Operating section; 6 5. Elastic component; 66. Guide rail; 67. Rotating component; 671. Rotating seat; 6711. Guide part; 672. Rotating shaft; 673. Bearing; 674. Collar; 675. Cover plate; 68. Nut; 7. Third test piece; 71. Third crimping part; 8. Third crimping assembly; 9. Pressing assembly; 10. Probe plate assembly; 20. Module under test; 201. First terminal; 202. Second terminal; 203. Third terminal; 204. Signal terminal; 30. Drive cylinder. Detailed Implementation
[0034] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.
[0035] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on the other component or there may be an intermediate component. When a component is considered to be "connected to" another component, it can be directly connected to the other component or there may be an intermediate component present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application's specification are for illustrative purposes only and do not represent the only possible implementation.
[0036] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0037] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature and the second feature are in indirect contact through an intermediate medium. Furthermore, "above," "over," and "on top" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0038] Unless otherwise defined, all technical and scientific terms used in this application have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and / or" as used in this application includes any and all combinations of one or more of the associated listed items.
[0039] Power semiconductor modules typically require quality and performance testing during manufacturing. This testing involves crimping the copper busbar of the test system onto the terminals of the module under test. Generally, the positive and negative terminals and the three-phase terminals are located on opposite sides of the module, with the crimping surfaces of the positive and negative terminals lying in parallel horizontal planes. However, with advancements in module design, some modules no longer have parallel crimping surfaces; instead, they employ a perpendicular structure, with one terminal's crimping surface horizontal and the other vertical. Using the conventional top-down vertical crimping method, the test copper busbar struggles to achieve sufficient and stable surface contact with the module terminals, resulting in limited contact area and increased contact resistance. During high-current testing, poor contact can easily lead to localized overheating, affecting test accuracy and potentially causing module damage or even explosion due to excessive temperature rise, posing a safety hazard.
[0040] To solve the above problems, such as Figures 1 to 7 As shown, the present invention provides a testing device to adapt to a module with the positive and negative end contact surfaces perpendicular to each other.
[0041] like Figure 1 and Figure 7 As shown, the testing device is used to test the module under test 20. The module under test 20 includes a first terminal 201 and a second terminal 202 located on the same side. The crimping surface of the first terminal 201 is horizontally arranged, and the crimping surface of the second terminal 202 is vertically arranged. Figures 2 to 4As shown, specifically, the testing device includes a fixture 1, a base 2, a testing component 3, and a second pressing component 5, wherein: the fixture 1 includes a bearing position 11 for supporting the module under test 20; the base 2 is located on top of the fixture 1 and can move closer to and further away from the fixture 1, which can be either the base 2 or the fixture 1; in this application, the lifting of the base 2 is taken as an example, and the movement method is not limited here; the testing component 3 is located on the base 2 and includes a first test piece 31 and a second test piece 32 corresponding to the first terminal 201 and the second terminal 202, respectively; the first test piece 31 includes a horizontally arranged first pressing part 311, and the second test piece 32 includes a vertically arranged second pressing part 321; when the base 2 is close to the bearing position 11, the first pressing part 311 can press against the pressing surface of the first terminal 201; the second pressing component 5 is located on the fixture 1, and when the base 2 is close to the bearing position 11, the second pressing component 5 can press the second pressing part 321 against the pressing surface of the second terminal 202.
[0042] In the testing device provided in this embodiment of the invention, when the base 2 is close to the bearing position 11, the first crimping part 311 can be crimped onto the crimping surface of the first terminal 201, and at the same time, the second crimping component 5 can also crimp the second crimping part 321 onto the crimping surface of the second terminal 202, so as to realize the simultaneous crimping and electrical performance testing of the first terminal 201 and the second terminal 202 that are perpendicular to each other on the module under test 20; and, the crimping surfaces of the first crimping part 311 and the first terminal 201 are crimped vertically, while the crimping surfaces of the second crimping part 321 and the second terminal 202 are crimped laterally, which ensures that a large area and stable and reliable surface contact can be formed between the first test piece 31 and the first terminal 201, and between the second test piece 32 and the second terminal 202, effectively reducing the contact resistance and the risk of heat generation during power-on, and improving the safety of the testing process and the accuracy of the test results.
[0043] like Figure 3 , Figure 4 and Figure 7 As shown, the testing device also includes a first crimping assembly 4 disposed on the base 2. When the base 2 is close to the bearing position 11, the first crimping assembly 4 can crimp the first crimping part 311 onto the crimping surface of the first terminal 201. This makes the connection between the first crimping part 311 and the first terminal 201 more stable and reliable. Furthermore, the first test piece 31 also includes a conductive block 312, which is disposed on the side of the first crimping part 311 facing the first terminal 201. The conductive block 312 can have a rough crimping surface to increase friction. When the base 2 is close to the bearing position 11, the first crimping assembly 4 crimps the first crimping part 311 onto the crimping surface of the first terminal 201 through the conductive block 312.
[0044] like Figures 3 to 4As shown, the testing apparatus also includes an adapter assembly 6 disposed on the fixture 1. The adapter assembly 6 includes a conductive adapter 61, which has at least two degrees of freedom. One end of the adapter 61 is used to abut against the crimping surface of the second terminal 202. The second crimping assembly 5 can crimp the second crimping portion 321 onto the end of the adapter 61 away from the second terminal 202. In this way, the adapter 61, as an intermediate conductive medium, can adaptively adjust its position during the side crimping process, compensate for processing and assembly errors, and ensure that the second crimping portion 321, the adapter 61, and the crimping surface of the second terminal 202 are completely fitted and in close contact, further reducing the risk of contact resistance and temperature rise.
[0045] like Figures 5 to 6 As shown, in one embodiment, the adapter assembly 6 further includes a base 62 and a slider 63. The base 62 is disposed on the fixture 1, and the slider 63 is disposed on the base 62 and can slide towards or away from the bearing position 11 in a horizontally preset direction. The adapter 61 is disposed on the slider 63. Specifically, the adapter 61 can slide towards the second terminal 202 in the +X direction along with the slider 63, and slide away from the second terminal 202 in the -X direction. The second crimping assembly 5 can crimp the second crimping portion 321 in the +X direction to the end of the adapter 61 away from the second terminal 202. In this way, the adapter 61 and the slider 63 have sliding degrees of freedom in the ±X directions, ensuring that the adapter 61 can be accurately and smoothly crimped onto the second terminal 202, achieving reliable side crimping.
[0046] like Figure 6 As shown, the adapter assembly 6 further includes an adjusting member 64 and an elastic member 65. The adjusting member 64 is disposed on the base 62 and connected to the base 62 by a threaded connection. One end of the adjusting member 64 abuts against the end of the sliding member 63 away from the bearing position 11. The two ends of the elastic member 65 abut against the end of the sliding member 63 near the bearing position 11 and the base 62, respectively. Thus, the adjusting member 64 and the base 62 are threaded together, which can adjust the initial position of the sliding member 63 on the base 62, thereby adjusting the distance or preload between the adapter 61 and the second terminal 202 to adapt to different tested modules 20; the elastic member 65 provides a certain buffering capacity for the sliding member 63 and the adapter 61 during the crimping process to protect the second terminal 202, the adapter 61 and the second crimping part 321, and can also adaptively adjust the position during the side crimping process to compensate for processing and assembly errors, maintain stable contact pressure, and ensure that the crimping surfaces of the second terminal 202, the adapter 61 and the second crimping part 321 are completely fitted and in close contact; after the test is completed, the second crimping assembly 5 removes the crimping force, and the sliding member 63 and the adapter 61 can automatically reset to the initial position under the action of the elastic member 65, improving the automation and efficiency of the test.
[0047] Specifically, the adjusting member 64 includes a threaded section 641 and an operating section 642. The adapter assembly 6 also includes a nut 68 disposed on the base 62. The base 62 is provided with a clearance hole (not shown) corresponding to the nut 68. The threaded section 641 passes through the clearance hole and is connected to the nut 68 by thread engagement. It is used to control the movement of the adjusting member 64 relative to the base 62 through the operating section 642. The end of the threaded section 641 away from the operating section 642 is used to push against the sliding member 63.
[0048] like Figure 6 As shown, the adapter assembly 6 further includes a guide rail 66 disposed on the base 62 and extending along a predetermined horizontal direction, with the slider 63 slidably disposed on the guide rail 66. Thus, the guide rail 66 provides a stable and precisely guided linear motion path for the adapter 61, ensuring that the slider 63 always slides along the ±X direction, guaranteeing that the adapter 61 can be aligned with the second terminal 202, improving crimping accuracy and consistency. Furthermore, the guide rail 66 also reduces operating resistance, making it easier and more controllable for the user to operate the adjustment component 64, and preventing the slider 63 from jamming.
[0049] like Figures 5 to 6 As shown, the adapter assembly 6 also includes a rotating member 67, which is disposed on the sliding member 63 and can rotate around a preset axis. The adapter 61 is disposed on the rotating member 67, that is, the adapter 61 is disposed on the sliding member 63 through the rotating member 67. Specifically, the preset axis is an axis perpendicular to the bearing position 11. In this way, the adapter 61 and the rotating member 67 have rotational freedom around the preset axis, so that the adapter 61 can be rotated and adjusted according to the actual angle of the pressing surface of the second terminal 202 during the pressing process, compensating for processing and assembly errors, and ensuring that the adapter 61 and the pressing surface of the second terminal 202 are tightly fitted.
[0050] like Figure 6 As shown, specifically, the rotating component 67 includes a rotating seat 671, a rotating shaft 672, a bearing 673, a collar 674, and a cover plate 675. One end of the rotating shaft 672 is fixedly connected to the top of the sliding component 63. The rotating seat 671 is rotatably connected to the rotating shaft 672 via the bearing 673, and the two ends of the bearing 673 are limited by the collar 674 and the cover plate 675. The adapter 61 is disposed on the rotating seat 671. A guide portion 6711 is also provided on the rotating seat 671 near the adapter 61. When the base 2 is close to the bearing position 11, the guide portion 6711 can guide the second pressing portion 321, ensuring that the second pressing portion 321 is in contact with the end of the adapter 61 away from the second terminal 202.
[0051] Of course, in other embodiments, the sliding direction of the slider 63 can also be adjusted to form an angle with the X direction as needed, and the rotation axis of the rotating member 67 can also be a horizontal axis perpendicular to the ±X direction. Alternatively, the adapter 61 can also have other degrees of freedom, such as rotational freedom relative to the rotating member 67 about a horizontal axis perpendicular to the ±X direction, as long as it is ensured that the adapter 61 can accurately and smoothly press against the second terminal 202. This embodiment of the invention does not impose specific limitations here.
[0052] like Figures 3 to 5 As shown, the second crimping assembly 5 includes a crimping member 51 and a driving member 52. The crimping member 51 is located on the side of the adapter 61 away from the bearing position 11. The driving member 52 is disposed on the fixture 1 and can drive the crimping member 51 to slide in a horizontal preset direction. Similarly, the driving member 52 can drive the crimping member 51 to slide towards the second terminal 202 in the +X direction and away from the second terminal 202 in the -X direction. In this way, by driving the crimping member 51 to slide towards the second terminal 202 through the driving member 52, a stable and sufficient clamping force is provided to the second crimping part 321, so that a reliable electrical connection is formed between the second crimping part 321, the adapter 61 and the second terminal 202, and the crimping conditions are consistent for each test, thereby improving the accuracy of the test results. The driving member 52 can be a linear drive structure such as a cylinder, hydraulic cylinder, or electric push rod, and the present invention does not impose specific limitations here.
[0053] like Figure 4 and Figure 7 As shown, the module under test 20 also includes a third terminal 203 located on the opposite side of the first terminal 201, with the crimping surface of the third terminal 203 arranged horizontally. The testing device also includes a third test piece 7 and a third crimping assembly 8 disposed on the base 2. The third test piece 7 includes a third crimping portion 71 corresponding to the third terminal 203 and arranged horizontally. When the base 2 is close to the bearing position 11, the third crimping assembly 8 can crimp the third crimping portion 71 onto the crimping surface of the third terminal 203. In this way, the testing device can simultaneously test the first terminal 201, the second terminal 202, and the third terminal 203, forming a complete circuit. Furthermore, the actions of the third test piece 7, the third crimping assembly 8, the test assembly 3, and the first crimping assembly 4 are all synchronized with the base 2, thereby reducing the driving structure and improving testing efficiency.
[0054] Specifically, the first crimping assembly 4 may include a crimping column (not shown) and an elastic portion (not shown). One end of the crimping column abuts against the first crimping portion 311, and both ends of the elastic portion are connected to the end of the crimping column away from the first crimping portion 311 and the base 2, respectively. Thus, when the base 2 approaches the bearing position 11, the crimping column presses the first crimping portion 311 against the first terminal 201. The elastic portion is compressed and provides continuous clamping force to the crimping column, ensuring sufficient and stable contact pressure between the first crimping portion 311 and the first terminal 201. The floating of the first crimping portion 311 and the first crimping assembly 4 allows the first test piece 31 to better adapt to changes in the size of the first terminal 201, expanding its applicability. Simultaneously, the elastic portion also provides a buffering effect, preventing damage to the first crimping portion 311 or the first terminal 201 due to excessive pressure or hard impact. Similarly, the crimping member 51 and the third crimping assembly 8 may also include a crimping portion (not shown) and an elastic portion (not shown), which will not be described in detail here.
[0055] like Figures 3 to 4 As shown, the testing device also includes a pressing component 9 disposed on the base 2. When the base 2 is close to the bearing position 11, the pressing component 9 can press the module under test 20 against the bearing position 11. Specifically, the pressing component 9 can be configured as a pressure column. In this way, the stability and reliability of the module under test 20 on the bearing position 11 are ensured, and the displacement or shaking of the module under test 20 during the test is avoided, which would affect the test results or cause damage.
[0056] like Figure 3 As shown, the testing device also includes a probe plate assembly 10 disposed on the base 2. When the base 2 is close to the bearing position 11, the probe plate assembly 10 is electrically connected to the module under test 20. In this way, the testing device can simultaneously test the first terminal 201, the second terminal 202, the third terminal 203, and the signal terminals of the module under test 20 without interference, thereby improving testing efficiency. The module under test 20 may also include a signal terminal 204, and the probe plate assembly 10 includes signal probes that can electrically contact and engage with the signal terminal 204, with the top surface of the pins of the signal terminal 204 contacting the signal probes.
[0057] like Figures 1 to 2As shown, in one embodiment, the first crimping assembly 4, the test assembly 3, the third test piece 7, the third crimping assembly 8, the pressing assembly 9, and the probe plate assembly 10 are all detachably connected to the base 2, and the second crimping assembly 5 and the adapter assembly 6 are all detachably connected to the fixture 1. This allows each component to be installed as an independent module on the fixture 1 or the base 2, facilitating replacement or adjustment according to the terminal layout of different tested modules 20. This supports rapid adaptation of multiple packaging forms on the same test host, improving the flexibility and changeover efficiency of the test system. Of course, in other embodiments, some or all components can be configured as non-detachable structures according to actual testing needs; this embodiment of the invention does not impose specific limitations here.
[0058] In the illustrated embodiment, the module under test 20 includes three sets of first terminals 201 and second terminals 202. The first terminal 201 is one of the positive and negative terminals, and the second terminal 202 is the other of the positive and negative terminals. The first test piece 31 and the second test piece 32 are respectively configured as positive and negative copper busbar assemblies, and the number of adapter components 6 is also correspondingly set to three sets. The test assembly 3 also includes a capacitor 33. The first test piece 31 extends downwards and then horizontally from one end of the capacitor 33 to form a first crimping portion 311, and the second test piece 32 extends downwards from one end of the capacitor 33 to form a second crimping portion 321. The module under test 20 also includes three third terminals 203, which are three-phase terminals. The third test piece 7 is correspondingly configured as a three-phase copper busbar assembly. Thus, simultaneous crimping and electrical performance testing of the two positive and negative terminals and the three-phase terminals on the module under test 20 can be achieved, improving testing efficiency. Of course, in other embodiments, the number and arrangement of test component 3, adapter component 6 and third test component 7 can also be adjusted according to the number and arrangement of terminals of the module under test 20. This embodiment of the invention does not impose specific limitations here.
[0059] like Figures 1 to 2 As shown, the testing device also includes a drive cylinder 30, the output end of which is connected to the base 2 and used to drive the base 2 to rise and fall. During the test, the drive cylinder 30 drives the base 2 closer to the bearing position 11. The pressing component 9 first contacts the module under test 20 and gradually applies pressure to press the module under test 20. During this process, the third test piece 7 contacts and fits tightly with the third terminal 203, the first test piece 31 contacts and fits tightly with the first terminal 201, and the second test piece 32 moves to the end of the adapter 61 away from the second terminal 202. Subsequently, the drive component 52 drives the pressing component 51 to slide closer to the second terminal 202, pushing the second test piece 32 to press against the adapter 61. The adapter 61 presses against the second terminal 202 and gradually applies pressure, so that the second test piece 32 and the second terminal 202 form a passage. After the test is completed, the drive component 52 and the drive cylinder 30 retract, and the adapter 6 returns to its initial position.
[0060] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0061] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the scope of protection of this application. Therefore, the patent protection scope of this application should be determined by the appended claims.
Claims
1. A testing apparatus for testing a module under test (20), the module under test (20) including a first terminal (201) and a second terminal (202) disposed on the same side, the crimping surface of the first terminal (201) being horizontally arranged, and the crimping surface of the second terminal (202) being vertically arranged, characterized in that, The testing apparatus includes: The fixture (1) includes a support position (11) for supporting the module under test (20). The base (2) is located on the top of the fixture (1) and is capable of moving closer to and further away from the fixture (1); The test component (3), disposed on the base (2), includes a first test piece (31) and a second test piece (32) corresponding to the first terminal (201) and the second terminal (202) respectively. The first test piece (31) includes a horizontally arranged first crimping portion (311), and the second test piece (32) includes a vertically arranged second crimping portion (321). When the base (2) is close to the bearing position (11), the first crimping portion (311) can be crimped onto the crimping surface of the first terminal (201); and, The second crimping assembly (5) is disposed on the fixture (1). When the base (2) is close to the bearing position (11), the second crimping assembly (5) can crimp the second crimping part (321) onto the crimping surface of the second terminal (202).
2. The testing apparatus according to claim 1, characterized in that, The testing device further includes an adapter assembly (6) disposed on the fixture (1). The adapter assembly (6) includes a conductive adapter (61) having at least two degrees of freedom. One end of the adapter (61) is used to abut against the crimping surface of the second terminal (202). The second crimping assembly (5) is capable of crimping the second crimping portion (321) onto the end of the adapter (61) away from the second terminal (202).
3. The testing apparatus according to claim 2, characterized in that, The adapter assembly (6) further includes a base (62) and a slider (63). The base (62) is disposed on the fixture (1). The slider (63) is disposed on the base (62) and can slide close to / away from the bearing position (11) in a horizontal preset direction. The adapter (61) is disposed on the slider (63).
4. The testing apparatus according to claim 3, characterized in that, The adapter assembly (6) further includes an elastic element (65), the two ends of which abut against the end of the sliding element (63) near the bearing position (11) and the base (62), respectively.
5. The testing apparatus according to claim 3 or claim 4, characterized in that, The adapter assembly (6) further includes an adjusting member (64), which is disposed on the base (62) and connected to the base (62) by a threaded engagement. One end of the adjusting member (64) abuts against the end of the sliding member (63) away from the bearing position (11).
6. The testing apparatus according to claim 3, characterized in that, The second crimping assembly (5) includes a crimping member (51) and a driving member (52). The crimping member (51) is located on the side of the adapter (61) away from the bearing position (11). The driving member (52) is disposed on the fixture (1) and can drive the crimping member (51) to slide along the preset horizontal direction.
7. The testing apparatus according to claim 3, characterized in that, The adapter assembly (6) further includes a rotating member (67), which is disposed on the sliding member (63) and can rotate around a preset axis. The adapter (61) is disposed on the rotating member (67).
8. The testing apparatus according to claim 1, characterized in that, The testing device also includes a first crimping assembly (4) disposed on the base (2). When the base (2) is close to the bearing position (11), the first crimping assembly (4) can crimp the first crimping part (311) onto the crimping surface of the first terminal (201).
9. The testing apparatus according to claim 8, characterized in that, The first crimping assembly (4) and the test assembly (3) are both detachably connected to the base (2).
10. The testing apparatus according to claim 1, characterized in that, The testing device further includes a pressing component (9) disposed on the base (2), wherein when the base (2) is close to the bearing position (11), the pressing component (9) can press the module under test (20) against the bearing position (11); and / or, The testing device also includes a probe plate assembly (10) disposed on the base (2). When the base (2) is close to the bearing position (11), the probe plate assembly (10) is electrically connected to the module under test (20).