Automatic test method and system for carrier rocket control combination

Abstract

The invention discloses a carrier rocket control combination automatic test method and a carrier rocket control combination automatic test system. The carrier rocket control combination automatic test system and the carrier rocket control combination automatic test method comprise the following steps: carrying out test initialization; after test initialization is completed, automatic test sequence execution is carried out; performing data interpretation and intelligent diagnosis according to an automatic test execution result; after data interpretation and intelligent diagnosis are completed, test report generation and data archiving are carried out. According to the invention, one-button test is realized, the test time is shortened from several hours to dozens of minutes, the test throughput rate is greatly improved, the requirement of high-density launch tasks is met, and the method has the advantages of high automation and high efficiency.

Description

Technical Field

[0001] This application relates to the aerospace field, specifically to an automated testing method and system for launch vehicle control assembly. Background Technology

[0002] The control assembly is the "brain" and "nerve center" of a launch vehicle, responsible for key functions such as navigation and guidance, attitude control, and timing logic. Its performance and reliability directly determine the success or failure of the launch mission. Therefore, it must be comprehensively and rigorously tested during the factory delivery, final assembly, and pre-launch stages. Current testing techniques have the following shortcomings: 1. Low system integration and poor versatility: Existing test systems often adopt a decentralized architecture, with each electrical system having its own independent ground test equipment. This leads to equipment duplication, increased costs, and poor system compatibility and reliability. Furthermore, existing systems are usually customized for specific rocket models, lacking versatility. When facing new rocket models or modularly designed rockets, existing test and control systems cannot meet testing requirements through simple state switching, which is detrimental to maintaining and training a professional testing team. 2. Low testing efficiency and insufficient automation: Traditional testing processes heavily rely on manual operation and interpretation. For example, in timing tests, users are required to monitor and interpret the data. This leads to low testing efficiency, time-consuming manual interpretation, and complex testing procedures. Pre-test state switching is required, and related tests are quite complex, hindering integrated system testing. Furthermore, the ground-based measurement, control, and control system has a long recovery cycle, requires a large number of on-site technical support personnel, and involves a significant amount of manual operation. 3. System reliability has shortcomings: In critical timing control systems, traditional designs may have single-point failure risks. For example, due to the large load current of timing control, the required power MOSFET discrete devices are large, making it difficult to achieve redundant design for a single unit under the constraint of unit size. This results in single-point failure modes, making it difficult to improve reliability. 4. Limited test coverage and diagnostic capabilities: Existing test systems have weak fault detection and diagnostic capabilities. Although some research has proposed introducing database-based fault diagnosis expert systems to improve fault detection capabilities, overall, the comprehensive diagnostic capabilities for complex systems still need to be strengthened to achieve object-oriented integration of ground power supply and distribution, testing, generation and control, and comprehensive diagnosis. 5. Insufficient application of intelligent and forward-looking technologies: Existing systems are still in the exploratory stage in terms of intelligent technology applications. For example, research on self-learning intelligent control of launch vehicles still faces challenges such as high computing power requirements, insufficient real data samples, and poor algorithm interpretability. Meanwhile, existing systems still have room for improvement in utilizing new technologies, such as building new launch and control systems based on industrial Ethernet and wireless network communication, in order to shorten recovery cycles, simplify operating procedures, reduce testing personnel, and improve system reliability.

[0003] Therefore, how to provide a testing method that can automate the testing process, standardize test criteria, and integrate test data management has become an urgent problem to be solved in this field. Summary of the Invention

[0004] The purpose of this application is to achieve full automation of the testing process, high integration of testing resources, and intelligent interpretation and management of test data, ultimately improving testing efficiency, ensuring testing quality, and enhancing testing capabilities.

[0005] To address the aforementioned issues, this application proposes an automated testing system for launch vehicle control assembly, comprising: a test control and management unit, an integrated test excitation and acquisition unit, a signal conditioning and interface adaptation unit, and a data management and analysis unit. The data management and analysis unit stores and manages all test-related data. The test control and management unit generates control commands based on the relevant configuration provided by the data management and analysis unit, executes the test, and sends the control commands to the integrated test excitation and acquisition unit. Before sending the control commands, it also sends a self-check command to the integrated test excitation and acquisition unit to perform a system self-check. Simultaneously, the test control and management unit sends data acquisition commands to the integrated test excitation and acquisition unit. The test system includes a test excitation and acquisition unit, which performs real-time analysis of the collected data and generates test reports and archives the data. A comprehensive test excitation and acquisition unit applies excitation signals to the device under test according to control commands, collects data according to data acquisition commands, and sends the collected data to the test control and management unit. A signal conditioning and interface adaptation unit conditions the excitation signals applied by the comprehensive test excitation and acquisition unit to the device under test, and converts the feedback signals from the device under test into digital data and sends them to the comprehensive test excitation and acquisition unit when the device under test provides feedback.

[0006] As described above, the automated test system for the launch vehicle control assembly includes a test control and management unit equipped with automated test software. The automated test software platform provides a graphical test process editor, a parameterized configuration interface for test items, a real-time data monitoring dashboard, an automated test sequence execution engine, and an automatic test report generator.

[0007] As described above, the automated test system for the launch vehicle control assembly includes a data management and analysis unit that stores and manages all test-related data, including a product model library, a test case library, a test parameter library, historical test data, a fault model library, and test reports.

[0008] The aforementioned automated test system for launch vehicle control assembly includes a comprehensive test excitation and acquisition unit comprising a programmable power supply module, a D / A module, an A / D module, a digital I / O module, a bus communication simulation and monitoring module, and a timing / synchronization module. The timing / synchronization module, upon receiving control commands, provides a high-precision clock and trigger signals to ensure synchronization of the actions of the remaining modules. The bus communication simulation and monitoring module provides simulation, communication, monitoring, and protocol analysis functions for commonly used buses. The programmable power supply module provides a precisely programmable DC power supply to the system and can simulate voltage fluctuations and instantaneous power outages. The D / A module generates analog excitation signals. The A / D module acquires analog response signals, such as voltage and current. The digital I / O module generates and acquires switching and discrete signals.

[0009] The automated test system for launch vehicle control assembly described above includes a signal conditioning and interface adaptation unit comprising various signal conditioning circuits.

[0010] An automated testing method for launch vehicle control assembly includes the following steps: performing test initialization; executing an automated test sequence after test initialization; performing data interpretation and intelligent diagnosis based on the automated test execution results; and generating a test report and archiving the data after completing the data interpretation and intelligent diagnosis.

[0011] The automated testing method for the launch vehicle control assembly described above includes the following sub-steps for test initialization: loading test items; and performing system self-test.

[0012] The automated testing method for the launch vehicle control assembly described above includes the following sub-steps for executing automated tests: generating corresponding control commands based on the test steps; applying excitation signals to the device under test based on the control commands; and issuing data acquisition commands after the excitation signals are applied to the device under test, acquiring data and uploading it.

[0013] The automated testing method for launch vehicle control assembly described above includes generating corresponding control commands based on the test steps, as well as generating trigger signals to ensure the synchronous execution of all modules of the entire system.

[0014] The automated testing method for launch vehicle control assembly described above includes, as described above, excitation signals such as analog excitation, digital excitation, and bus excitation signals.

[0015] This application has the following beneficial effects:

[0016] (1) This application realizes one-click testing, which shortens the testing time from several hours to tens of minutes, greatly improves the testing throughput, meets the requirements of high-density launch missions, and has the advantages of high automation and high efficiency.

[0017] (2) This application is fully automated, eliminating human error and interpretation errors, and the test results are objective, accurate and reliable. The test accuracy and reliability are high.

[0018] (3) This application can easily execute complex and large-scale test cases, especially to realize fault injection testing, comprehensively assess the fault tolerance capability of the control combination, and provide more comprehensive test coverage.

[0019] (4) Through the design of modular hardware, parameterized software and interface adapters, this application allows the system to quickly adapt to various control combinations by simply replacing the adapter and loading different test configuration files, thereby reducing the total life cycle cost and providing stronger versatility and scalability.

[0020] (5) This application realizes the digital management of test data throughout its entire lifecycle, providing strong data support for product quality control, fault prediction and health management, and model iteration and improvement. Attached Figure Description

[0021] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in this application. For those skilled in the art, other drawings can be obtained based on these drawings.

[0022] Figure 1 This is a schematic diagram of the internal structure of an automated test system for launch vehicle control assembly provided according to an embodiment of this application;

[0023] Figure 2 This is a flowchart illustrating the automated testing method for launch vehicle control assembly provided in the embodiments of this application. Detailed Implementation

[0024] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.

[0025] The testing system described in this application employs a three-layer reconfigurable architecture consisting of modular hardware, parameterized software, and interface adapters. The modular hardware (PXI / PXIe platform) provides the foundation for high precision and high synchronization. The parameterized software is not hard-coded for specific models but rather modifies its testing behavior by loading different model configuration files (containing test parameters, procedures, and criteria). This enables the system to test a variety of products. The dedicated interface adapter acts as a "universal key" for hardware connections. It transforms complex, non-standard cable connections into simple, standard "adapter plugging and unplugging," solving the core pain point of numerous interfaces and error-prone connections in aerospace testing.

[0026] Meanwhile, this application provides a simulation and testing environment that deeply integrates multiple bus protocols, integrating and realizing the simulation, monitoring, injection, and analysis capabilities of various typical buses in the launch vehicle field (such as 1553B, CAN, RS-422 / 485) in a single system. Based on the central data server's full lifecycle data management for testing, the system not only completes testing but also constructs a digital data chain covering the entire process of test preparation, execution, interpretation, reporting, archiving, and analysis.

[0027] During testing, this application encapsulates specific test steps, stimulus parameters, and pass / fail criteria in structured data files (such as XML or databases), rather than embedding them in the software code. Fault injection is seamlessly integrated into the automated test sequence as a standard, programmable test step. Simultaneously, while test data is being acquired, predefined rules (such as threshold comparison, waveform feature recognition, and protocol compliance checks) are used for real-time automatic interpretation, and preliminary diagnosis can be performed based on the fault tree.

[0028] Example 1

[0029] like Figure 1 As shown in the figure, this embodiment provides an automated test system for launch vehicle control assembly, which specifically includes: a test control and management unit 110, an integrated test excitation and acquisition unit 120, a signal conditioning and interface adaptation unit 130, and a data management and analysis unit 140.

[0030] The data management and analysis unit 140 is used to store and manage all test-related data.

[0031] The relevant data includes product model libraries, test case libraries, test parameter libraries, historical test data, fault model libraries, and test reports. This data enables rapid data retrieval, comparative analysis, and trend prediction.

[0032] The test control and management unit 110, connected to the data management and analysis unit 140, serves as the command center of the entire system. It generates control commands based on the configuration provided by the data management and analysis unit to execute tests and sends these commands to the integrated test stimulus and acquisition unit 120. Before sending control commands, it also sends a self-test command to the integrated test stimulus and acquisition unit 120 to perform a system self-test.

[0033] Meanwhile, in order to verify the results of the test command execution, the test control and management unit 110 sends a data acquisition command to the integrated test stimulus and acquisition unit 120. It then performs real-time analysis based on the acquired data fed back by the integrated test stimulus and acquisition unit 120, and finally archives the data to the data management and analysis unit 140.

[0034] The test control and management unit 110 is equipped with automated testing software. The automated testing software platform provides a graphical test process editor, a test project parameter configuration interface, a real-time data monitoring dashboard, an automated test sequence execution engine, and an automatic test report generator.

[0035] During the real-time interpretation of the collected data, the test control and management unit 110 automatically compares the collected data with the pass / fail criteria stored in the data management and analysis unit to obtain the interpretation result. The judgment result is "pass", "fail" or "warning".

[0036] The integrated test stimulus and acquisition unit 120 is connected to the test control and management unit 110. It receives control commands sent by the test control and management unit 110 and outputs corresponding stimulus signals to the device under test according to the control commands. At the same time, after the device under test performs the test, it will send a feedback signal to the test control and management unit 110. At this time, the integrated test stimulus and acquisition unit 120 acquires the data transmitted by the device under test through multiple channels according to the received data acquisition command, and sends the acquired data to the test control and management unit 110.

[0037] In the process of outputting excitation signals to the device under test, the integrated test excitation and acquisition unit 120 needs to send signals through the signal conditioning and interface adaptation unit 130, and when the device under test sends back signals, the signal conditioning and interface adaptation unit 130 converts the feedback signals into digital information data.

[0038] Specifically, the control commands sent by the test control and management unit 110 are distributed to various modules of the integrated test excitation and acquisition unit 120 (not shown in the figure), including: PXI / PXIe integrated test and control chassis, programmable power supply module, D / A module, A / D module, digital I / O module, bus communication simulation and monitoring module, and timing / synchronization module.

[0039] The timing / synchronization module receives control commands and provides a high-precision clock and trigger signal to ensure strict synchronization of the actions of all modules in the entire test system.

[0040] Bus communication simulation and monitoring module: Provides simulation, communication, monitoring and protocol analysis functions for commonly used rocket buses such as 1553B, CAN, RS-422 / 485, Ethernet, etc.

[0041] The programmable power supply module, located inside the chassis or as an independent unit, provides precise programmable DC power to the control assembly under test and can simulate operating conditions such as voltage fluctuations and instantaneous power outages.

[0042] The D / A module is used to generate analog excitation signals.

[0043] The PXI / PXIe integrated measurement and control chassis, as the core of the system hardware platform, provides high-precision, highly synchronized modular instruments.

[0044] A high-precision A / D module is used to acquire analog response signals, such as voltage and current.

[0045] Digital I / O modules are used to generate and acquire digital and discrete signals.

[0046] During the process of sending excitation signals to the device under test, when the timing / synchronization module reaches time T0, it outputs a trigger pulse. At the same time, the bus communication simulation and monitoring module initiates message transmission, injecting control commands into the bus. The D / A module locks in and outputs the specified analog voltage simultaneously. The programmable power supply module maintains a continuous and stable power supply to the system.

[0047] Upon receiving a data acquisition command, the A / D module acquires analog response signals at the trigger time set by the timing / synchronization module, the digital I / O module acquires switch and discrete signals, and the bus communication simulation and monitoring module switches to listening mode to synchronously capture any response or status messages sent by the device under test on the bus.

[0048] After data acquisition is complete, the A / D module, digital I / O module, and bus communication simulation and monitoring module upload the timestamped raw data to the test control and management unit 110 at high speed via the PXI backplane. The test control and management unit 110 then performs real-time analysis based on the acquired data.

[0049] The test control and management unit 110 immediately invokes the pass / fail criteria (including thresholds, waveform characteristics, protocol compliance, etc.) loaded from the data management and analysis unit 140 for automatic comparison. The interpretation engine in the test control and management unit 110 displays the interpretation result of this step in real time based on the comparison result. If the collected data matches the pass / fail criteria, the interpretation result is pass; otherwise, it is failure. If the interpretation result is failure, the test control and management unit 110 triggers a diagnostic process, retrieving the relevant fault tree model from the fault model library of the data management and analysis unit 140, combining the current test data and historical data to perform fault diagnosis and location, and providing maintenance suggestions.

[0050] Specifically, the signal conditioning and interface adaptation unit 130 is connected to the integrated test stimulus and acquisition unit 120. It is used to process the stimulus signal output by the integrated test stimulus and acquisition unit 120 and send it to the device under test, and to convert the signal fed back from the device under test into a data format and send it to the integrated test stimulus and acquisition unit 120. The integrated test stimulus and acquisition unit 120 feeds back the acquired data to the test control and management unit 110.

[0051] The signal conditioning and interface adaptation unit 130 includes various signal conditioning circuits, such as voltage attenuation / amplification, current conversion, opto-isolation, and relay driving, which are used to match the electrical characteristics between the device under test and the measurement and control module to protect both devices.

[0052] Preferably, both the signal conditioning and interface adaptation unit 130 and the integrated test excitation and acquisition unit 120 include a universal signal conditioning box. This box converts the excitation signal sent to the device under test (DUT) into an engineering signal acceptable to the DUT, such as for power amplification or driving relays. More importantly, it protects the DUT from damage caused by accidental excessive voltage or current output from the test system. When the DUT sends a response signal back to the system, the universal signal conditioning box converts the signal output by the DUT, which may contain high voltage, high current, or interference, into a signal that can be safely and accurately measured.

[0053] After the test is completed, the report generator in the test control and management unit 110 starts working and integrates all the information of this test (test overview, test environment, stimulus and response data for each step, interpretation results, diagnostic conclusions, etc.) into a test report.

[0054] The test control and management unit 110 packages the test report, raw data collection, process logs, etc., and uploads them to the central data server of the data management and analysis unit 140.

[0055] The data management and analysis unit 140 binds these data with corresponding product serial numbers, test times, operators and other information, stores them in the database, and forms an electronic resume.

[0056] Example 2

[0057] like Figure 2 As shown, this embodiment provides an automated test system and method for launch vehicle control assembly, specifically including the following steps:

[0058] Step S1: Perform test initialization.

[0059] The test initialization process includes the following sub-steps:

[0060] Step S11: Load the test project.

[0061] The central data service layer of the test control and management unit sends a request to obtain the test configuration file corresponding to the object under test.

[0062] The test configuration file includes the test process, stimulus parameters, criteria, and interface definitions.

[0063] The data management and analysis unit responds to the request and sends the configuration file to the test control and management unit.

[0064] The test control and management unit loads the configuration file, parses the test process and parameters, and displays the test sequence to be executed on the interface of the automated testing software.

[0065] Operators use the dedicated interface adapter in the signal conditioning and interface adaptation unit to connect the device under test and the test system, based on the information displayed on the interface.

[0066] Step S12: Perform a system self-test.

[0067] Meanwhile, the test control and management unit sends self-test commands through the integrated test stimulus and acquisition unit to perform self-tests on the hardware modules of the entire system to ensure that they are in normal condition.

[0068] Step S2: After completing the test initialization, execute the automated test.

[0069] The operator confirms that all preparations are complete on the software interface of the test control and management unit and clicks "Start Test".

[0070] The test execution engine of the test control and management unit starts running and executes each step of the test sequence one by one.

[0071] Each test step includes the following sub-steps:

[0072] Step S21: Generate corresponding control commands based on the test steps.

[0073] The test control and management unit generates corresponding control commands based on the test procedures. After generating the control commands, it also ensures strict synchronization of the actions of all modules in the entire test system by using the trigger signals of the timing / synchronization module in the integrated test stimulus and acquisition unit.

[0074] Step S22: Apply an excitation signal to the device under test according to the control command.

[0075] First, the test control and management unit sends control commands to the integrated test stimulus and acquisition unit.

[0076] If the control command is for power supply control, the control command is sent to the programmable power supply module to control its output voltage / current.

[0077] If the control command is an analog excitation, an analog signal is generated through the D / A module.

[0078] If the control command is a digital excitation, then a switching signal is generated through the digital I / O module.

[0079] If the control command is a bus excitation, then a specific bus message is sent through the bus communication simulation and monitoring module.

[0080] Furthermore, the excitation signal generated by the integrated test excitation and acquisition unit is applied to the device under test after passing through the signal conditioning and interface adaptation unit.

[0081] The excitation signals generated by the corresponding modules of the integrated test excitation and acquisition unit undergo level conversion, isolation and other conditioning operations in the general signal conditioning box of the signal conditioning and interface adaptation unit, and are applied to the device under test through a dedicated interface adapter.

[0082] The excitation signals generated by each module in the integrated test excitation and acquisition unit must be issued within the same clock cycle.

[0083] Step S23: After the excitation signal is applied to the device under test, a data acquisition command is issued to acquire and upload the data.

[0084] When the excitation signal is applied to the device under test, the test control and management unit controls the A / D module, digital I / O module, bus monitoring module, etc. of the integrated test excitation and acquisition unit to start acquisition.

[0085] The response signal of the device under test is returned to the A / D module, digital I / O module, and bus monitoring module of the integrated test excitation and acquisition unit through a dedicated interface adapter and a general signal conditioning box (for reverse conditioning).

[0086] The A / D module, digital I / O module, and bus monitoring module upload the collected data (with timestamps) to the test control and management unit in real time.

[0087] Step S3: Perform data interpretation and intelligent diagnosis based on the results of automated test execution.

[0088] Upon receiving the collected data after the test is executed, the test control and management unit immediately invokes the pass / fail criteria (including thresholds, waveform characteristics, protocol compliance, etc.) loaded from the data management and analysis unit for automatic comparison.

[0089] The judgment engine displays the judgment result in real time based on the comparison result. If the collected data is consistent with the qualified criteria, the judgment result is passed; otherwise, it is a failure.

[0090] If the interpretation result is a failure, the test control and management unit will trigger the diagnostic process, retrieve the relevant fault tree model from the fault model library of the data management and analysis unit, combine the current test data and historical data, perform fault diagnosis and location, and provide maintenance suggestions.

[0091] If the result is passed, proceed to the next test.

[0092] Step S4: After completing data interpretation and intelligent diagnosis, generate the test report and archive the data.

[0093] After all test steps are completed, the report generator of the test control and management unit starts working, integrating all the information of this test (test overview, test environment, stimulus and response data for each step, interpretation results, diagnostic conclusions, etc.) into a test report.

[0094] The test control and management unit packages test reports, raw data collection, process logs, etc., and uploads them to the central data server of the data management and analysis unit.

[0095] The data management and analysis unit binds these data with corresponding product serial numbers, test times, operators, and other information, stores them in the database, and forms an electronic resume.

[0096] This application also provides a computer storage medium storing computer instructions, which, when invoked, are used to execute the launch vehicle control assembly automated test system and test method.

[0097] The embodiments disclosed in this invention provide a computer-readable storage medium storing computer program instructions. When the computer program instructions are executed on a computer, the computer executes the aforementioned automated test system and test method for launch vehicle control assembly.

[0098] This invention provides a processor for processing the aforementioned automated test system and test method for launch vehicle control assembly.

[0099] In this embodiment of the invention, the processor can be an integrated circuit chip with signal processing capabilities. The processor can be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.

[0100] The various methods, steps, and logic diagrams disclosed in the embodiments of this invention can be implemented or executed. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the methods disclosed in the embodiments of this invention can be directly implemented by a hardware decoding processor, or implemented by a combination of hardware and software modules in the decoding processor. The software modules can reside in random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, registers, or other mature storage media in the art. The processor reads information from the storage medium and, in conjunction with its hardware, completes the steps of the above methods.

[0101] The storage medium can be memory, such as volatile memory or non-volatile memory, or may include both volatile and non-volatile memory.

[0102] Non-volatile memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. Volatile memory can be random access memory (RAM), which is used as an external cache. By way of example, but not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), Synchronous DRAM (SDRAM), Double Data Rate Synchronous DRAM (DDRSDRAM), Enhanced Synchronous DRAM (ESDRAM), Synchlink DRAM (SLDRAM), and Direct Rambus RAM (DRRAM).

[0103] This application has the following beneficial effects:

[0104] (1) This application realizes one-click testing, which shortens the testing time from several hours to tens of minutes, greatly improves the testing throughput, meets the requirements of high-density launch missions, and has the advantages of high automation and high efficiency.

[0105] (2) This application is fully automated, eliminating human error and interpretation errors, and the test results are objective, accurate and reliable. The test accuracy and reliability are high.

[0106] (3) This application can easily execute complex and large-scale test cases, especially to realize fault injection testing, comprehensively assess the fault tolerance capability of the control combination, and provide more comprehensive test coverage.

[0107] (4) Through the design of modular hardware, parameterized software and interface adapters, this application allows the system to quickly adapt to various control combinations by simply replacing the adapter and loading different test configuration files, thereby reducing the total life cycle cost and providing stronger versatility and scalability.

[0108] (5) This application realizes the digital management of test data throughout its entire lifecycle, providing strong data support for product quality control, fault prediction and health management, and model iteration and improvement.

[0109] Although the examples referenced in this application are described for illustrative purposes only and not for limiting the scope of this application, changes, additions and / or deletions to the implementation may be made without departing from the scope of this application.

[0110] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. An automated test system for launch vehicle control assembly, characterized in that, include: The test control and management unit, the integrated test stimulus and acquisition unit, the signal conditioning and interface adaptation unit, and the data management and analysis unit; The data management and analysis unit is used to store and manage all test-related data; The test control and management unit generates control commands to execute tests based on the relevant configurations provided by the data management and analysis unit, and sends the control commands to the integrated test stimulus and acquisition unit; before sending the control commands, it sends a self-test command to the integrated test stimulus and acquisition unit to perform a system self-test; At the same time, the test control and management unit sends data acquisition instructions to the integrated test stimulus and acquisition unit to acquire data from the device under test; In addition, the test control and management unit performs real-time interpretation of the feedback data collection results and generates test reports and archives the data. The integrated test excitation and acquisition unit is used to apply excitation signals to the device under test according to control commands, and to acquire data according to data acquisition commands, and send the acquired data to the test control and management unit; The signal conditioning and interface adaptation unit is used to condition the excitation signal when the integrated test excitation and acquisition unit applies the excitation signal to the device under test, and to convert the feedback signal into digital information and send it to the integrated test excitation and acquisition unit when the device under test provides feedback.

2. The automated test system for launch vehicle control assembly as described in claim 1, characterized in that, The test control and management unit installs automated testing software. The automated testing software platform provides a graphical test process editor, a parameterized configuration interface for test items, a real-time data monitoring dashboard, an automated test sequence execution engine, and an automatic test report generator.

3. The automated test system for launch vehicle control assembly as described in claim 1, characterized in that, The data management and analysis unit stores and manages all test-related data, including product model libraries, test case libraries, test parameter libraries, historical test data, fault model libraries, and test reports.

4. The automated test system for launch vehicle control assembly as described in claim 1, characterized in that, The integrated test stimulus and acquisition unit includes a programmable power supply module, a D / A module, an A / D module, a digital I / O module, a bus communication simulation and monitoring module, and a timing / synchronization module; After receiving control commands, the timing / synchronization module provides a high-precision clock and trigger signal to ensure the synchronization of the actions of the other modules. The bus communication simulation and monitoring module provides simulation, communication, monitoring, and protocol analysis functions for commonly used buses. Programmable power supply modules are used to provide precise programmable DC power to the system and can simulate operating conditions such as voltage fluctuations and instantaneous power outages; The D / A module is used to generate analog excitation signals; An A / D module is used to acquire analog response signals, such as voltage and current. Digital I / O modules are used to generate and acquire digital and discrete signals.

5. The automated test system for launch vehicle control assembly as described in claim 1, characterized in that, The signal conditioning and interface adaptation unit includes a variety of signal conditioning circuits.

6. An automated testing method for launch vehicle control assembly, characterized in that, Includes the following steps: Perform test initialization; After test initialization is complete, the automated test sequence will be executed. Perform data interpretation and intelligent diagnosis based on the results of automated test execution; After completing data interpretation and intelligent diagnosis, test reports are generated and data is archived.

7. The automated testing method for launch vehicle control assembly as described in claim 6, characterized in that, The test initialization process includes the following sub-steps: Load the test project; Perform a system self-check.

8. The automated testing method for launch vehicle control assembly as described in claim 6, characterized in that, Automated test execution includes the following sub-steps: Based on the test steps, generate corresponding control commands; Excitation signals are applied to the device under test according to control commands; After the excitation signal is applied to the device under test, a data acquisition command is issued to acquire and upload the data.

9. The automated testing method for launch vehicle control assembly as described in claim 8, characterized in that, According to the test procedure, generating corresponding control instructions also includes generating trigger signals to ensure that all modules of the entire system execute synchronously.

10. The automated testing method for launch vehicle control assembly as described in claim 8, characterized in that, Excitation signals include analog excitation, digital excitation, and bus excitation signals.

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