Optical path automatic alignment measurement system and method and computer storage medium

Abstract

The invention provides a light path automatic alignment measurement system and method and a computer storage medium, the system comprises a pattern plate support, a physical compensation mechanism, a sensor and a controller, the pattern plate support is used for bearing at least one pattern plate; the physical compensation mechanism is configured to be used for moving the pattern plate support; the sensor is configured to be used for detecting an alignment state of a light path and generating an alignment sensing signal; the controller is configured to, in response to the alignment sensing signal, drive the physical compensation mechanism to correct a physical position of the pattern plate holder to compensate for a physical misalignment of the optical path.

Description

Technical Field

[0001] This disclosure relates to the field of optical inspection technology, and in particular to an automatic optical path alignment measurement system, method, and computer storage medium. Background Technology

[0002] Head-up display (HUD) systems, especially those used in vehicles (such as car windshields) or aviation, are optical systems that project information (such as vehicle speed and navigation instructions) into the driver's or pilot's field of vision. These systems have extremely stringent requirements for optical performance (such as image distortion, brightness uniformity, and ghosting).

[0003] To inspect the quality of key optical components of a HUD system (such as freeform mirrors used for projection or special windshields serving as projection screens), a lightbox or pattern generator is typically used as a simulated light source. This lightbox is configured to simulate the optical path characteristics of an actual HUD projection unit, projecting specific test patterns (e.g., distorted grids, checkerboard patterns, etc.). A detection camera or imaging luminance meter then captures the pattern after reflection or transmission through the component under test (e.g., windshield), and the optical quality of the component is evaluated by analyzing changes in the pattern.

[0004] However, this lightbox-based detection system suffers from poor optical path stability in practical applications. Firstly, the system is a complex system composed of multiple optical and mechanical components (such as the pattern plate, lens group, and reflectors inside the lightbox). During long-term operation, the physical position and orientation of these components are easily subject to slight drifts due to thermal expansion and contraction caused by changes in ambient temperature or vibrations from surrounding equipment (such as production lines). This drift causes the actual emitted light path of the lightbox to deviate from its initially calibrated reference light path, resulting in physical misalignment. Summary of the Invention

[0005] This disclosure provides an automatic optical path alignment measurement system, method, and computer storage medium; it can solve the problem in related technologies that the optical path of the detection system is prone to physical misalignment, resulting in decreased detection accuracy and high misjudgment rate.

[0006] The technical solution disclosed herein is implemented as follows: In a first aspect, this disclosure provides an automatic optical path alignment measurement system for detecting head-up display devices, comprising: Pattern board support, used to support at least one pattern board; A physical compensation mechanism is configured to move the pattern plate support; The sensor is configured to detect the alignment status of the optical path and generate an alignment sensing signal; The controller is configured as follows: In response to the alignment sensing signal, the physical compensation mechanism is driven to correct the physical position of the pattern plate support, thereby compensating for the physical misalignment of the optical path.

[0007] Secondly, this disclosure provides an automatic optical path alignment measurement method for the detection of head-up display devices, including: Acquire the alignment sensing signal generated by the sensor during the detection of the optical path alignment status; In response to the alignment sensing signal, a physical compensation mechanism is driven to correct the physical position of the pattern plate support, thereby compensating for the physical misalignment of the optical path.

[0008] Thirdly, this disclosure provides a computer storage medium storing at least one instruction, which is executed by a processor to implement the automatic optical path alignment measurement method as described in the second aspect.

[0009] This disclosure provides an automatic optical path alignment measurement system, method, and computer storage medium. By setting sensors to detect the optical path alignment status in real time and using a controller to form a closed-loop feedback, the system actively drives a physical compensation mechanism to correct the physical position of the pattern board support. This automatically compensates for optical path physical misalignment caused by long-term detection (such as thermal drift) or mechanical movement. Compared with open-loop systems in related technologies that rely on periodic manual calibration or cannot detect drift, the embodiments of this disclosure significantly improve the optical path stability of the detection system through real-time closed-loop automatic correction, ensuring a high-precision optical metrological reference, thereby effectively reducing the detection error rate and improving the system's reliability and automation level. Attached Figure Description

[0010] Figure 1 The structural frame of an automatic optical path alignment measurement system provided in this embodiment of the disclosure is shown.

[0011] Figure 2 This is a schematic diagram of an automatic optical alignment measurement system provided in an embodiment of the present disclosure.

[0012] Figure 3 This is a schematic diagram of a main reflective element provided in an embodiment of the present disclosure.

[0013] Figure 4 This is a schematic diagram of another optical path automatic alignment measurement system provided in an embodiment of this disclosure.

[0014] Figure 5 This is a schematic diagram of a high signal strength provided in an embodiment of the present disclosure.

[0015] Figure 6 This is a schematic diagram of a first misalignment state provided in an embodiment of this disclosure.

[0016] Figure 7 This is a schematic diagram of a second misalignment state provided in an embodiment of this disclosure.

[0017] Figure 8 This is a control logic flowchart of a controller provided in an embodiment of the present disclosure.

[0018] Figure 9 This is a structural block diagram of a controller provided in an embodiment of the present disclosure.

[0019] Figure 10 This is a flowchart of an automatic optical path alignment measurement method provided in an embodiment of the present disclosure. Detailed Implementation

[0020] The technical solutions in this disclosure will now be clearly and completely described with reference to the accompanying drawings.

[0021] Please see Figure 1 , Figure 1 This is a schematic diagram of an automatic optical path alignment measurement system provided in an embodiment of the present disclosure. The automatic optical path alignment measurement system 100 is configured for the detection of HUD devices, for example, as a lightbox system simulating the projection optical path of a HUD.

[0022] The optical path automatic alignment measurement system 100 includes a pattern plate support 110, a physical compensation mechanism 120, a sensor 130, and a controller 140.

[0023] Pattern plate holder 110 is used to support at least one pattern plate. The pattern plate is a physically manufactured test pattern, such as a distorted grid pattern etched on glass. The pattern plate serves as the light source for the main projection light path of the HUD detection, or forms a pattern after being illuminated by the light source.

[0024] The physical compensation mechanism 120 is mechanically connected to the pattern plate holder 110 and is configured to move (e.g., rotate or translate) the pattern plate holder 110.

[0025] Sensor 130 is configured to detect the optical path alignment status inside the optical path automatic alignment measurement system 100 and generate an alignment sensing signal based on the status.

[0026] The controller 140 establishes communication connections with both the sensor 130 and the physical compensation mechanism 120. The controller 140 can be a programmable logic controller (PLC), an industrial computer (IPC), or a microcontroller unit (MCU), etc.

[0027] The core operating logic of the automatic optical path alignment measurement system 100 lies in its closed-loop feedback mechanism. During the operation of the automatic optical path alignment measurement system 100, the sensor 130 detects the current optical path alignment status in real time or periodically. For example, it detects whether a dedicated alignment beam is precisely located at its preset reference position.

[0028] When physical misalignment occurs, the alignment beam deviates from its reference position. Sensor 130 detects this deviation, and its generated alignment sensing signal changes, for example, the signal strength decreases or a positional deviation is reported.

[0029] The controller 140 is configured to continuously respond to the alignment sensing signal. When the controller 140 demodulates the misalignment information from the signal, it immediately calculates a correction amount and drives the physical compensation mechanism 120.

[0030] Driven by the controller 140, the physical compensation mechanism 120 performs a precise, minute movement (e.g., rotates it by -0.01 degrees or translates it by +5 micrometers) on the physical position of the pattern plate holder 110 to correct the physical position of the pattern plate holder.

[0031] The purpose of this calibration is to compensate for physical misalignment of the optical path. By moving the pattern plate support 110, the source of the main projection optical path, back to its precise reference position, the optical path of the entire detection system is restored to its calibrated state.

[0032] Reference Figure 2 In HUD detection systems, a large-aperture master reflector is typically required to simulate the projection optics of the HUD. Figure 2 In the illustrated embodiment, the main reflecting element 150 is this element (freeform mirror). Its main function is to collect the main projection beam from the pattern board support 110. Figure 2 (not shown in the image), and reflects it to form a projected light field for HUD glass detection. The primary reflecting element can be a concave mirror or a freeform mirror.

[0033] To achieve alignment monitoring, this embodiment employs a non-invasive optical path design. For example... Figure 2 As shown, the optical axis center of the main reflective element 150 has a through hole 152. The aperture of the through hole 152 (e.g., 1-2 mm) is very small relative to the total aperture of the main reflective element 150 (e.g., 100-200 mm).

[0034] A dedicated alignment beam 170 is configured to propagate along the main optical axis of the system. Due to the presence of the through-hole 152, the system optical path is split, and the main projection beam (occupying most of the area of ​​element 150) is reflected by the reflective surface of element 150 to perform HUD detection tasks. The alignment beam 170 may originate from a laser diode mounted at the center of the pattern plate holder 110, or from a beam transmitted from the central region of the pattern plate.

[0035] Reference Figure 3 The alignment beam 170 occupies only the central axis area, passes through the through hole 152, and is used to perform optical path alignment monitoring tasks.

[0036] The through-hole 152 feature enables non-invasive monitoring. The alignment beam 170 is physically separated from the main detection optical path (main projection beam), allowing the system to monitor the optical path alignment status in parallel and in real time without interrupting the main detection process. The size of the through-hole 152 is designed to be as small as possible to ensure that its impact on the imaging quality of the main projection beam is minimized.

[0037] Next, as Figure 4 As shown, the automatic optical path alignment measurement system 100 also includes a reflector 160. The reflector 160 is arranged behind the optical path of the main reflector element 150, that is, on the path of the alignment beam 170 passing through the through-hole 152.

[0038] The function of mirror 160 is not direct imaging, but rather to reflect the alignment beam 170 to sensor 130. For example... Figure 4 As shown, after the beam 170 passes through the through hole 152, it illuminates the reflector 160, is then reflected, and finally enters the photosensitive surface of the sensor 130.

[0039] By using the reflector 160 to fold the optical path, the sensor 130 can be flexibly installed in any convenient location near the side wall, base plate, or main reflector 150 of the optical path automatic alignment measurement system 100, greatly reducing the physical package size of the entire optical path automatic alignment measurement system 100.

[0040] In some examples, graphic patterns, such as a printed or etched crosshair, target ring, or coordinate grid, can also be formed on the surface of reflector 160. If sensor 130 is an image sensor, controller 140 will be able to simultaneously acquire the light spot formed by the incident alignment beam 170 and the background pattern on reflector 160. If controller 140 sees the light spot moving relative to the background pattern in the image, this indicates that the alignment beam 170 itself is off-center, i.e., the pattern plate support 110 is physically misaligned. In this case, physical compensation mechanism 120 should be triggered for correction. If controller 140 sees the light spot and background pattern moving together relative to the field of view center of sensor 130, this indicates that the position of reflector 160 or sensor 130 itself has shifted. In this case, triggering physical compensation mechanism 120 is ineffective, and the system should trigger an alarm, prompting maintenance of the rear optical path.

[0041] like Figure 4 As shown, the pattern plate support 110 is a columnar polyhedral structure. For example, Figure 4 A triangular prism structure is shown. The pattern plate support 110 has multiple sides, such as three sides 112a and 112b, and one unseen face. Specifically, the prism polyhedral structure can also be a tetragonal prism structure (or close to a cube).

[0042] Pattern plate holder 110 is used to support at least one pattern plate. Specifically, one pattern plate, for example, pattern plate A, is mounted on each of its sides. Different pattern plates can be mounted on different sides (e.g., pattern plate B is mounted on 112b, pattern plate C is mounted on the unseen side, etc.). These pattern plates A, B, and C are physical patterns used for different optical evaluation items of the HUD, for example: Pattern A is a distortion grid pattern used to measure image distortion in a HUD system. Pattern B is a brightness uniformity pattern, such as a full white field, used to measure brightness uniformity within the field of view. Pattern C is a contrast pattern, such as a checkerboard pattern, used to measure the system's contrast or modulation transfer function.

[0043] Furthermore, when the columnar polyhedral structure is not a square prism structure, it may also include a pattern plate D, which can be a ghosting pattern used to quantify the ghosting effect of the HUD. By integrating multiple pattern plates on the same pattern plate support 110, the optical path automatic alignment measurement system 100 can automatically switch between different test patterns through the movement of the physical compensation mechanism 120, which will be described later.

[0044] In this embodiment, the physical compensation mechanism 120 is designed as an integrated unit that simultaneously has switching and compensation functions.

[0045] like Figure 4As shown, the physical compensation mechanism 120 is a drive mechanism, specifically a high-precision servo rotary mechanism. The output shaft 122 of this servo rotary mechanism, or the turntable connected to it, is... Figure 3 The central axes of the columnar polyhedral support shown are connected.

[0046] The controller 140 is configured to drive the same servo rotary mechanism to perform two different types of motion, which may include switching motion and compensating motion.

[0047] The switching motion is used to switch between different pattern boards. When the system needs to switch from test item A (using pattern board A) to test item B (using pattern board B), the controller 140 sends a large-angle, high-speed rotation command to the physical compensation mechanism 120.

[0048] Compensation motion is used to correct physical position. There are two specific triggering conditions for this motion: immediately after a switching motion is completed and during a long detection process.

[0049] In both cases, sensor 130 detects optical path misalignment. In response to this misalignment signal, controller 140 sends a small-angle, high-precision step command (e.g., -0.05 degrees or -0.02 degrees) to the same physical compensation mechanism 120. This precisely corrects the physical position of the pattern board support 110, returning it to the ideal, calibrated alignment position. The automatic optical path alignment measurement system 100 uses only a single high-precision servo rotation mechanism to simultaneously achieve both coarse adjustment (wide-range switching) and fine adjustment (micro-range compensation) functions, simplifying the system structure and reducing hardware costs.

[0050] Based on the hardware architecture described above, this embodiment describes in detail how the controller 140 distinguishes different misalignment states and executes corresponding method steps.

[0051] In one specific embodiment, sensor 130 includes an image sensor. For example, a complementary metal-oxide-semiconductor (CMOS) image sensor or a charge-coupled device (CCD) camera.

[0052] An image sensor is configured to capture the spot signal formed by the incident alignment beam 170. Controller 140 analyzes the image frames captured by the sensor using image processing algorithms (e.g., thresholding, centroid calculation, pixel brightness accumulation) and generates an alignment sensing signal based on the analysis results.

[0053] In some examples, sensor 130 may be a single photodiode. The photodiode outputs a unique analog current or voltage signal, which is itself proportional to the total signal intensity of the incident light beam. The specific sensor type can be customized according to the device detection requirements, and will not be elaborated in this example embodiment.

[0054] In this embodiment, the controller 140 pays particular attention to the signal strength of the light spot signal. This can be calculated in various ways, such as calculating the sum of the brightness values ​​of all pixels within the light spot region, calculating the average brightness value within the light spot region, and calculating the peak brightness of the light spot.

[0055] When the pattern plate holder 110 is in a precisely aligned position, the alignment beam 170 passes completely and unobstructed through the through-hole 152 on the primary reflector 150. The sensor captures a bright, energy-concentrated spot 170a. Figure 5 As shown, the controller 140 calculates a high signal strength, for example, 95% after normalization.

[0056] When the pattern plate holder 110 experiences a slight physical shift (e.g., not rotating into place or slight thermal drift), the edge of the aligned beam 170 will be partially obscured by the edge portion of the through-hole 152. Figure 6 As shown, the total energy of the light spot 170b captured by sensor 132 decreases significantly, meaning the brightness of the light spot signal decreases. The signal strength calculated by controller 140 is significantly lower than normal (e.g., 40% after normalization). This state is described as very dim or very low brightness. This state corresponds to a correctable, small-range misalignment, i.e., the first misalignment state.

[0057] When the pattern plate holder 110 experiences a severe physical misalignment (e.g., rotated to a completely incorrect position, or a component becomes loose causing a large misalignment), the alignment beam 170 will be completely deviated from the through-hole 152, or completely blocked. Figure 7 As shown, there is no light spot signal in the field of view of sensor 132, which is the second misalignment state.

[0058] The signal strength calculated by controller 140 is close to zero (e.g., 0% after normalization). This state is described as having no light or no bright spots.

[0059] Please see Figure 8 , Figure 8 The logic flow that the controller 140 is configured to execute is shown, which enables the differentiation and response to the aforementioned misalignment states.

[0060] In step S810, the controller acquires an alignment sensing signal from the sensor.

[0061] In step S820, the first misalignment state and the second misalignment state are distinguished based on the signal strength of the alignment sensing signal.

[0062] This distinction is achieved by setting two thresholds: a low threshold T1 (e.g., 20%) and a high threshold T2 (e.g., 80%). The signal strength is represented by B.

[0063] The specific values ​​of T1 and T2 can be customized based on the required detection accuracy, which will not be elaborated here.

[0064] In step S830, it is determined whether the condition B is less than T1 is true.

[0065] If the signal strength is extremely low or zero, the system is determined to have entered the second misalignment state. The degree of misalignment in the second misalignment state is greater than that in the first misalignment state.

[0066] If so, proceed to step S835, whereby the controller triggers a system alarm or recalibration process.

[0067] An alarm is triggered (e.g., a red indicator light illuminates, and an error message pops up on the user interface), and the detection process is stopped. Simultaneously, the system automatically enters maintenance mode to perform a recalibration process, such as recalibrating the entire measurement system using a coordinate measuring machine.

[0068] If not, proceed to step S840 to determine whether B is less than T2.

[0069] If so, proceed to step S845, where the controller sends a fine-tuning command to the physical compensation mechanism.

[0070] The physical compensation mechanism 120 drives the pattern plate support 110 until the signal strength B is greater than or equal to T2.

[0071] If not, proceed to step S850 and determine the state as normal.

[0072] Then, step S855 is executed, and normal measurement can be performed. The process then returns to step S810 to continue the next round of monitoring.

[0073] Please see Figure 9 , Figure 9 This is an exemplary hardware structure block diagram 1200 of the controller 140 in an embodiment of this disclosure. The controller 140 may take many specific forms, such as, but not limited to, personal computers, industrial control computers, programmable logic controllers, embedded systems, or a system-on-a-chip, etc., and is not specifically limited herein.

[0074] like Figure 9As shown, the controller 140 may include at least one processor 1410, a memory 1420, a communication interface 1430, and a bus 1440.

[0075] At least one processor 1410, such as a central processing unit (CPU), microcontroller unit (MCU), or digital signal processor (DSP). The processor 1410 is the core of the controller, used to execute instructions and process data.

[0076] Memory 1420 is used to store instructions (e.g., program code) and data (e.g., thresholds T1, T2). Memory 1420 may include volatile memory (e.g., random access memory RAM) and non-volatile memory (e.g., read-only memory ROM, flash memory, hard disk).

[0077] The communication interface 1430 is used to communicate with other components in the optical path automatic alignment measurement system 100. For example, the interface 1430 can acquire alignment sensing signals from the sensor 130 via analog input (such as ADC) or digital interface (such as CameraLink, USB, GigE); and drive the physical compensation mechanism 120 to the physical compensation mechanism 120 via motion control interface (such as pulse / direction signal, CAN bus, EtherCAT).

[0078] Bus 1440 is used to transmit data and control signals between components such as processor 1410, memory 1420 and interface 1430.

[0079] In practice, the instructions stored in memory 1420 are loaded and executed by processor 1410. Processor 1410 receives real-time data from sensor 130 through interface 1430 and executes it internally (e.g., in registers or RAM). Figure 8 The system performs logical judgments and, based on the judgment results, sends corresponding control commands to the physical compensation mechanism 120 via interface 1430. For example, it may perform fine-tuning compensation or trigger system alarm lights connected to the I / O port.

[0080] The automatic optical path alignment measurement system provided in this disclosure constructs a real-time closed-loop feedback mechanism. Once the sensor detects that the optical path deviates from the reference, the controller can immediately drive the compensation mechanism to correct the physical position. Through the above-mentioned automatic correction, this disclosure ensures that the optical metrological reference (i.e., the optical path) of the detection system is always in an accurately calibrated state. This directly overcomes the problem of high-precision metrological failure caused by reference optical path offset in the prior art, thereby significantly reducing the detection misjudgment rate of optical components such as HUD glass and ensuring high-precision detection results. For slight and predictable misalignment, the system automatically performs fine-tuning compensation for self-repair. For severe and systematic misalignment, the system triggers an alarm or recalibrates, avoiding the control system from falling into an ineffective search loop hierarchical response mechanism, greatly improving the system's automation level and operational robustness.

[0081] By utilizing the same drive mechanism, such as a servo rotary mechanism, to simultaneously perform macroscopic pattern switching motion and microscopic compensation motion, the expensive and complex independent drive system required for fine-tuning is avoided, thereby simplifying the system's mechanical structure and reducing hardware costs.

[0082] In the specific optical path design, a through-hole is set in the center of the main reflective element, and the sensor is placed behind it, separating the main detection optical path from the alignment monitoring optical path. This achieves non-invasive real-time monitoring, meaning the system can check and calibrate its own optical path in parallel without interrupting the main detection task. It avoids the use of expensive beam splitters that introduce additional aberrations, and the overall system design is made more compact by folding the optical path.

[0083] Please see Figure 10 This disclosure also provides an automatic optical path alignment measurement method. This method can be achieved by... Figure 1 The controller 140 shown executes the commands. Specifically, this may include steps S1010 to S1020.

[0084] In step S1010, the alignment sensing signal generated by the sensor during the detection of the optical path alignment state is acquired.

[0085] In step S1020, a physical compensation mechanism is driven in response to the alignment sensing signal to correct the physical position of the pattern plate support, thereby compensating for the physical misalignment of the optical path.

[0086] It should be noted that the specific details of steps S1010 and S1020 can be found in the description of the optical path automatic alignment measurement system 100, and will not be repeated here.

[0087] This disclosure also provides a computer-readable storage medium storing at least one instruction, which is executed by a processor to implement the optical path automatic alignment measurement method of the various embodiments described above.

[0088] This disclosure also provides a computer program product including computer instructions stored in a computer-readable storage medium; a processor of a computing device reads the computer instructions from the computer-readable storage medium and executes the computer instructions, causing the computing device to perform the automatic optical path alignment measurement method described in the above embodiments.

[0089] Those skilled in the art will recognize that the functions described in this disclosure in one or more of the examples above can be implemented using hardware, software, firmware, or any combination thereof. When implemented in software, these functions can be stored in a computer-readable medium or transmitted as one or more instructions or code on a computer-readable medium. Computer-readable media include computer storage media and communication media, wherein communication media include any medium that facilitates the transfer of a computer program from one place to another. Storage media can be any available medium accessible to a general-purpose or special-purpose computer.

[0090] It should be noted that the technical solutions described in this disclosure can be combined arbitrarily as long as they do not conflict.

[0091] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. An automatic optical path alignment and measurement system for detecting head-up display devices, characterized in that, The system includes: Pattern board support, used to support at least one pattern board; A physical compensation mechanism is configured to move the pattern plate support; The sensor is configured to detect the alignment status of the optical path and generate an alignment sensing signal; The controller is configured as follows: In response to the alignment sensing signal, the physical compensation mechanism is driven to correct the physical position of the pattern plate support, thereby compensating for the physical misalignment of the optical path.

2. The automatic optical path alignment and measurement system according to claim 1, characterized in that, The system also includes: The main reflective element has a through hole at the center of the optical axis; The sensor is configured to detect the alignment beam passing through the through-hole to generate the alignment sensing signal.

3. The automatic optical path alignment and measurement system according to claim 2, characterized in that, The system also includes: A reflector, positioned behind the optical path of the main reflector element, is used to reflect the alignment beam to the sensor.

4. The automatic optical path alignment and measurement system according to claim 1, characterized in that, The pattern plate support is a columnar polyhedral structure.

5. The automatic optical path alignment and measurement system according to claim 1, characterized in that, The controller is configured to: Based on the signal strength of the alignment sensing signal, a first misalignment state and a second misalignment state are distinguished. When the first misalignment state is detected, the physical compensation mechanism is driven to perform fine-tuning compensation; When the second misalignment state is detected, a system alarm or recalibration process is triggered; The degree of inaccuracy in the second inaccuracy state is greater than that in the first inaccuracy state.

6. The automatic optical path alignment and measurement system according to claim 5, characterized in that, The sensor includes an image sensor; the image sensor generates the alignment sensing signal based on the detected light spot signal; The first misalignment state is a decrease in the brightness of the light spot signal; The second misalignment state is a signal without a light spot.

7. The automatic optical path alignment and measurement system according to any one of claims 1 to 6, characterized in that, The physical compensation mechanism is a drive mechanism; The controller is configured to drive the drive mechanism to perform switching movements for switching different pattern plates, and compensating movements for correcting the physical position.

8. An automatic optical path alignment measurement method for detecting head-up display devices, characterized in that, The method includes: Acquire the alignment sensing signal generated by the sensor during the detection of the optical path alignment status; In response to the alignment sensing signal, a physical compensation mechanism is driven to correct the physical position of the pattern plate support, thereby compensating for the physical misalignment of the optical path.

9. The automatic optical path alignment measurement method according to claim 8, characterized in that, The method further includes: Based on the signal strength of the alignment sensing signal, a first misalignment state and a second misalignment state are distinguished. When the first misalignment state is detected, the physical compensation mechanism is driven to perform fine-tuning compensation; When the second misalignment state is detected, a system alarm or recalibration process is triggered; The degree of inaccuracy in the second inaccuracy state is greater than that in the first inaccuracy state.

10. A computer storage medium, characterized in that, The computer storage medium stores at least one instruction, which is executed by a processor to implement the automatic optical path alignment measurement method as described in any one of claims 8 to 9.

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