Internet of Things electrical box monitoring method and system

Abstract

The invention relates to the technical field of data processing, and provides an Internet of Things electrical box monitoring method and system, and the method comprises the steps: obtaining a state change index according to the change of an element in a projection reference time sequence of each operation parameter of target equipment; obtaining a steady-state starting node according to the fluctuation change condition of the state change index; obtaining a steady-state contribution degree according to the steady-state starting node, and obtaining a steady-state flag parameter of the target equipment in combination with the steady-state starting node; according to state change indexes of elements in the projection real-time sequential sequence and the projection reference sequential sequence, obtaining a stability degree and a starting progress index, and further obtaining a starting completion probability; obtaining a progress abnormal degree according to the starting progress index; and adjusting the acquisition frequency of each operation parameter of each cinema electrical device according to the starting completion probability and the progress abnormal degree. According to the invention, the data acquisition efficiency is improved by adjusting the acquisition frequency of the operating parameters.

Description

Technical Field

[0001] This invention relates to the field of data processing technology, and specifically to an Internet of Things (IoT) electrical box monitoring method and system. Background Technology

[0002] The safe operation of cinema power distribution boxes and electrical cabinets directly affects the audience and related facilities, and traditional manual inspection methods are insufficient for real-time monitoring and early warning. By deploying sensing sensors using IoT technology, a real-time online monitoring system for the operating status of electrical cabinets can be established, which can significantly improve cinema power safety and operational efficiency.

[0003] In existing technologies, when monitoring the operating parameters of cinema electrical equipment controlled by the electrical box, multi-dimensional operating parameters of all cinema electrical equipment are collected to determine whether the operating status of the cinema electrical equipment is normal. When collecting multi-dimensional operating parameters of cinema electrical equipment, a fixed frequency is generally used according to a preset collection frequency. If the preset collection frequency is too high, high-frequency sampling during steady-state operation of the equipment has no practical value, but it continuously occupies computing, storage, and transmission resources. If the preset collection frequency is too low, transient faults during the startup phase may occur between two samplings, resulting in missed detections. This makes the collection efficiency of the IoT electrical box for the operating parameters of cinema electrical equipment low. Summary of the Invention

[0004] This invention provides a method and system for monitoring IoT electrical boxes, to solve the problem of low efficiency in collecting operating parameters of cinema electrical equipment using existing IoT electrical boxes. The specific technical solution adopted is as follows: This invention proposes a method for monitoring electrical boxes in the Internet of Things (IoT), which includes the following steps: The projection reference timing sequence is obtained by acquiring several operating parameters of each cinema's electrical equipment through the Internet of Things electrical box; Let any cinema electrical equipment be designated as the target equipment; in the projection reference time sequence of each operating parameter of the target equipment, obtain the state change index of each element according to the change of each element; according to the fluctuation of the state change index, obtain the steady-state start node of each operating parameter of the target equipment; according to the steady-state start node of each operating parameter of the target equipment, obtain the steady-state contribution of each operating parameter of the target equipment; and combine the steady-state start node to obtain the steady-state indicator parameter of the target equipment. Obtain the real-time timing sequence of each operating parameter of the target device; based on the state change index of the elements in the real-time timing sequence and the reference timing sequence, obtain the stability of the steady-state flag parameter of the target device at the current moment and the start-up progress index, and then obtain the probability of the target device completing the start-up at the current moment. Based on the startup progress index, the degree of progress anomaly of the target device at the current moment is obtained; The sampling frequency of each operating parameter of each cinema electrical device is adjusted based on the probability of startup completion and the degree of progress anomaly.

[0005] Furthermore, the specific method for obtaining the state change index of each element based on the changes of each element in the projection reference time sequence of each operating parameter of the target device includes: For any element in the projection reference time sequence of any operating parameter of the target device, a feature window of length A is established in the projection reference time sequence with that element as the end, and the mean of all elements in the feature window is obtained. Calculate the absolute value of the difference between the element and the mean of all elements within its feature window. Divide this absolute value by the maximum absolute value of all differences within the feature window, and the resulting ratio is denoted as the overall degree of change of the element. If the maximum absolute value of all differences within the feature window is 0, the overall degree of change of the element is denoted as 0 or 1. Subtract the absolute value of the difference between the element and its preceding adjacent element, and denote the local degree of change of the element. Multiply the overall degree of change of the element by the local degree of change, and denote the state change index of the element. Where A is the preset window length.

[0006] Furthermore, the specific method for obtaining the steady-state start node of each operating parameter of the target device based on the fluctuation of the state change index includes: The next cinema electrical device in the control logic of the target device is denoted as the target device's successor device; For any operating parameter of the target device, the projection reference timing sequence is obtained, and the time of the first element in the projection reference timing sequence of the operating parameter with a non-zero state change exponent is recorded as the start expression time of the operating parameter; the earliest start expression time among all the start expression times of the target device is recorded as the start time of the target device; the start time of each cinema electrical device is obtained. In the projection reference timing sequence of any operating parameter of the target device, if the target device has a downstream device, the start time of the downstream device is taken as the end time point; if the target device does not have a downstream device, the last time of the projection reference timing sequence is taken as the end time point, and the Bth time before the end time point is taken as the start time point. The resulting interval is denoted as the state judgment interval of the operating parameter; where B is a preset interval. In the projection reference time sequence of the operating parameter, the time interval from the start time of the target device's downstream device to the last sampling time of the projection reference time sequence of the target device's operating parameter is used as the steady-state reference interval of the operating parameter. In the projection reference time sequence of the operating parameter, the difference obtained by subtracting the variance of the state change index of all elements in the state judgment interval and steady-state reference interval of the operating parameter from the variance of the state change index of all elements in the steady-state reference interval of the operating parameter is used as the steady-state deviation index of the state judgment interval. The state judgment interval of the operating parameter is extended to obtain the steady-state deviation sequence of the operating parameter; For any element in the steady-state deviation sequence of any operating parameter of the target device, the difference between the element and the previous element is denoted as the steady-state difference index of the element. Among all elements of the steady-state deviation sequence of the operating parameter, the element with the largest steady-state difference index is recorded as the boundary element of the operating parameter; the starting point of the state judgment interval corresponding to the boundary element is recorded as the steady-state start node of the operating parameter.

[0007] Furthermore, the specific method for expanding the state judgment interval of the operating parameter to obtain the steady-state deviation sequence of the operating parameter includes: The start time point of the state judgment interval of this running parameter is... Using a step size, move towards the first element of the projection reference time series of the operating parameter. After each move, obtain the steady-state deviation index of the state judgment interval until the number of elements between the start point of the state judgment interval and the first element of the projection reference time series of the operating parameter is insufficient. When there are 1 element, the expansion of the stop state judgment interval is performed. The sequence of steady-state deviation indices obtained during the expansion process, arranged in the order of acquisition, is denoted as the steady-state deviation sequence of that operating parameter; where... This is the preset movement step size.

[0008] Furthermore, the specific method for obtaining the steady-state contribution of each operating parameter of the target device based on the steady-state start node of each operating parameter of the target device includes: In the projection reference time sequence of any operating parameter of the target device, obtain the mean of the state change exponents of all elements before the steady-state start node of the operating parameter, and subtract the mean of the state change exponents of all elements after the steady-state start node of the operating parameter from the mean of the state change exponents of all elements after the steady-state start node of the operating parameter. The maximum value between this difference and 0 is taken as the steady-state initial contribution of the operating parameter. The ratio of the steady-state initial contribution of the operating parameter to the sum of the steady-state initial contributions of all operating parameters of the target device is calculated and denoted as the steady-state contribution of the operating parameter.

[0009] Furthermore, the steady-state flag parameters of the target device are specifically obtained using the following method: For any operating parameter of the target device, the product of the ordinal number of the element corresponding to the steady-state start node of the operating parameter in the projection reference time series of the operating parameter and the steady-state contribution of the operating parameter is denoted as the steady-state determination index of the operating parameter. The operating parameter with the largest steady-state determination index is denoted as the steady-state characteristic parameter of the target device.

[0010] Furthermore, the specific method for obtaining the stability level and startup progress index of the steady-state flag parameters of the target device at the current moment, and thus obtaining the startup completion probability of the target device at the current moment, includes: Obtain the real-time timing sequence of each operating parameter of the target device; obtain the start-up expression time of the steady-state flag parameters of the target device in the real-time timing sequence of the projection; In the projection reference time sequence of the steady-state flag parameter of the target device, the sum of the state change indices of all elements in the time interval from the start expression time of the steady-state flag parameter of the target device to the steady-state start node is denoted as the start state reference index of the steady-state flag parameter of the target device. In the real-time time sequence of the steady-state flag parameters of the target device, the sum of the state change exponents of all elements from the start expression time of the steady-state flag parameters of the target device to the current time is denoted as the real-time start state exponent of the steady-state flag parameters of the target device at the current time. Subtract the current moment's steady-state flag parameter from the real-time exponent of the startup state at the current moment. The inversely proportional normalized result of the absolute value of the difference between the real-time index of the startup status at the corresponding moment 1 second ago is denoted as the stability of the steady-state indicator parameter of the target device at the current moment; where, The preset stability judgment duration; The ratio of the real-time startup status index of the target device's steady-state flag parameter at the current moment to the startup status reference index of the target device's steady-state flag parameter is used as the startup progress index of the target device's steady-state flag parameter at the current moment. The product of the stability of the steady-state flag parameter of the target device at the current moment and the start-up progress index is denoted as the probability of the target device completing the start-up at the current moment.

[0011] Furthermore, the specific method for obtaining the degree of progress anomaly of the target device at the current moment based on the startup progress index includes: Obtain the start-up progress index of the steady-state flag parameters of the target device at each moment in the projection reference time sequence; The current moment is taken as the reference moment in the projection reference time sequence of the target device's steady-state flag parameters, and the corresponding moment in the projection reference time sequence of the projection real-time ... The absolute value of the difference between the start-up progress index of the target device's steady-state indicator parameter at the current moment and the start-up progress index of the target device's steady-state indicator parameter at the reference moment is denoted as the degree of progress anomaly of the target device at the current moment.

[0012] Furthermore, the specific method for adjusting the collection frequency of each operating parameter of each cinema electrical device based on the startup completion probability and the degree of progress anomaly includes: The target device's first The method for calculating the frequency base of each operating parameter at the current moment is as follows: In the formula, For the target device The frequency base of each operating parameter at the current moment; The preset steady-state frequency base; The preset startup frequency base; This represents the probability that the target device will complete startup at the current moment. The target device's first The calculation method for the sampling frequency of each operating parameter at the current moment is as follows: In the formula, For the target device The sampling frequency of each operating parameter at the current moment; For the target device The preset acquisition frequency of each operating parameter; For the target device The frequency base of each operating parameter at the current moment; The degree of progress anomaly of the target device at the current moment; The floor symbol; At the current moment and at every moment thereafter, the corresponding operating parameters are collected according to the collection frequency of each operating parameter of the target device at each moment, and the real-time timing sequence of the projection is updated to obtain the projection update timing sequence of each operating parameter.

[0013] The present invention also proposes an Internet of Things (IoT) electrical box monitoring system, which includes a memory, a processor, and a computer program stored in the memory and running on the processor, wherein the processor executes the computer program to implement the steps of the above method.

[0014] The beneficial effects of this invention are as follows: In the process of automated smart projection through an IoT electrical box, the operating state of cinema electrical equipment is mainly divided into a startup phase and a steady-state phase. Since the startup phase is a highly dynamic phase, the parameter fluctuations tend to be smoother in the steady-state phase. Different frequencies of data collection are needed for different phases, thus requiring the division of the equipment's current phase. By acquiring the steady-state indicator parameters of the target equipment, the operating parameters that are the main basis for determining whether the target equipment has entered the steady-state phase are obtained. By analyzing the stability of the target equipment's steady-state indicator parameters and the startup progress index at the current moment, the probability of the target equipment completing startup at the current moment is obtained, thus determining whether the target equipment has entered the steady-state phase. When an anomaly occurs during startup, the frequency of collecting operating parameters should be further increased to provide more accurate data for detecting and judging equipment anomalies. Based on the startup progress index, the degree of progress anomaly of the target equipment at the current moment is obtained, thus determining whether a startup anomaly has occurred. Therefore, by adjusting the collection frequency of each operating parameter of each cinema electrical device through the startup completion probability and the degree of progress anomaly, the efficiency of data collection of the cinema electrical equipment's operating parameters by the IoT electrical box is improved. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0016] Figure 1 This is a schematic flowchart of an IoT electrical box monitoring method provided in one embodiment of the present invention. Detailed Implementation

[0017] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0018] Please see Figure 1 The diagram illustrates a flowchart of an IoT electrical box monitoring method according to an embodiment of the present invention, which includes the following steps: Step S001: Obtain the projection reference timing sequence of several operating parameters of each cinema electrical equipment through the IoT electrical box.

[0019] It should be noted that the main electrical equipment in a cinema includes projectors, playback servers, audio equipment, stage lights, and screens. When using an IoT electrical box to achieve automated smart projection, the IoT electrical box will read the corresponding preset configuration file after receiving commands from the cinema's TMS system, and then control the cinema's electrical equipment in a sequential and interval manner. However, during the equipment startup phase, malfunctions are prone to occur due to power fluctuations, mechanical jamming, or abnormal signal synchronization. Therefore, it is necessary to collect and monitor the operating parameters of the cinema's electrical equipment.

[0020] Specifically, the operating parameters of the projector, playback server, audio equipment, stage lights, and screen are monitored using an IoT electrical box; The operating parameters of the projector include, but are not limited to, current, voltage, power, cooling fan speed, and air outlet temperature. The operating parameters of the playback server include, but are not limited to, CPU load rate, GPU load rate, memory usage rate, and main control chip temperature. The operating parameters of the audio equipment include, but are not limited to, the RMS level of each channel, the power amplifier current, the heat sink temperature, and the fan speed. The operating parameters of the field lights include, but are not limited to, the current and voltage of each field light; The operating parameters of the curtain include, but are not limited to, motor current and vibration amplitude.

[0021] It should be noted that in order to ensure effective monitoring of the cinema's electrical equipment and avoid redundant data occupying storage and transmission resources, the acquisition frequency of each type of data needs to be dynamically adjusted. However, the dynamic adjustment of the acquisition frequency depends on the feature recognition of parameter value changes. Therefore, when monitoring the operating parameters of the equipment for the first time using the IoT electrical box, each parameter of the cinema's electrical equipment is acquired at a high and fixed preset acquisition frequency.

[0022] Specifically, the preset sampling frequency for the projector's current, voltage, and power is 20Hz; the preset sampling frequency for the projector's cooling fan speed is 5Hz; and the preset sampling frequency for the projector's air outlet temperature is 2Hz. The preset sampling frequency for the CPU load rate and GPU load rate of the playback server is 5Hz; the preset sampling frequency for the memory usage rate of the playback server is 1Hz; and the preset sampling frequency for the temperature of the main control chip of the playback server is 2Hz. The preset sampling frequency for the RMS level of the audio channel is 20Hz; the preset sampling frequency for the power amplifier current of the audio device is 10Hz; and the preset sampling frequency for the heat sink temperature and fan speed of the audio device is 2Hz. The preset sampling frequency for the current and voltage of the field lights is 20Hz; The preset sampling frequency for the motor current of the screen is 20Hz; the preset sampling frequency for the vibration amplitude of the screen is 200Hz. During the first automated smart projection using the IoT electrical box, when the IoT electrical box receives a command from the cinema's TMS system, it controls the cinema's electrical equipment according to the command. Simultaneously, the IoT electrical box collects data on each operating parameter of each piece of cinema electrical equipment at a preset frequency and standardizes the collected results until the command from the cinema's TMS system is executed, i.e., until the first automated smart projection ends. The standardized data of each operating parameter of each piece of cinema electrical equipment constitutes its projection reference timing sequence. The standardization process is a prior art technique used to eliminate dimensions, facilitating comparisons between operating parameters. It should be noted that to ensure the effectiveness of the data collection during the first automated smart projection, manual supervision is required to ensure the normal operation of all cinema electrical equipment.

[0023] Step S002: Denote any cinema electrical equipment as the target equipment; in the projection reference time sequence of each operating parameter of the target equipment, obtain the state change index of each element according to the change of each element; obtain the steady-state start node of each operating parameter of the target equipment according to the fluctuation of the state change index; obtain the steady-state contribution of each operating parameter of the target equipment according to the steady-state start node of each operating parameter of the target equipment; and obtain the steady-state flag parameter of the target equipment by combining the steady-state start node.

[0024] It should be noted that the equipment is in a high-dynamic phase during startup, and key parameters such as instantaneous current surges and temperature rises need to be collected at high frequency to capture abnormal signals. In the steady-state operation phase, parameter fluctuations tend to be gentle, and the frequency of collection can be reduced to low frequency to avoid redundant data occupying storage and transmission resources. Therefore, the projection reference time sequence of each operating parameter of each cinema electrical equipment is analyzed first to divide the startup phase and steady-state phase.

[0025] It should be further explained that during the operation of cinema electrical equipment, when the element values ​​of the projection reference time sequence of the operating parameters of the cinema electrical equipment change, it indicates that the operating state of the cinema electrical equipment has changed. And the abnormality of cinema electrical equipment often occurs with the change of the operating state of the cinema electrical equipment. Therefore, the first step is to determine the state change index of each operating parameter of each cinema electrical equipment at each moment.

[0026] Specifically, let any cinema electrical device be designated as the target device. For any element in the projection reference timing sequence of any operating parameter of the target device, establish a sequence of length [length missing] with that element as the end of the projection reference timing sequence. The feature window is used to obtain the mean of all elements within it. The absolute value of the difference between the element and the mean of all elements within the feature window is calculated. To clarify the magnitude of data change and prevent calculation errors, this absolute value is divided by the maximum absolute value of all differences within the feature window. The resulting ratio is recorded as the overall degree of change of the element. It should be noted that if the maximum absolute value of all differences within the feature window is 0 (i.e., no data fluctuation within the window), the overall degree of change of the element is directly recorded as 0 (or 1 as needed) to avoid the calculation error of division by zero. The absolute value of the difference between the element and its preceding adjacent element is recorded as the local degree of change of the element. The product of the overall degree of change and the local degree of change is recorded as the state change index of the element. As a preset window length, this embodiment uses Let's take an example to illustrate.

[0027] It should be noted that the control sequence of the cinema's electrical equipment is as follows: turn on the stage lights, start the projector, start the playback server, start the audio equipment, and turn off the stage lights after all audience members have entered. The cinema's electrical equipment operates in three phases throughout the projection process: startup, steady-state operation, and shutdown. Because the startup and shutdown phases involve highly dynamic processes such as power surges, mechanical movements, and signal synchronization, high-frequency data acquisition is required to capture momentary anomalies. However, once in steady-state operation, most core parameters tend to stabilize, and the fluctuation range significantly narrows. At this point, reducing the acquisition frequency can reduce the burden of redundant data on storage and transmission resources, while ensuring safety and stability through continuous monitoring of key steady-state indicators. Therefore, it is necessary to divide the operation phase of each cinema electrical device according to its core parameters. Since equipment startup involves highly dynamic processes such as power surges, mechanical component initialization, and signal synchronization, and high-risk trigger points for equipment failures are mostly concentrated in the startup phase, this embodiment only defines the boundary between the startup and steady-state phases.

[0028] It should be further explained that when the automated smart projection is started using the IoT electrical box, the cinema electrical equipment will be started sequentially and at intervals. The reason for the intervals is to ensure that the pre-starting logic device of each cinema electrical equipment can start normally. That is, during this automated smart projection process, when each cinema electrical equipment starts, the corresponding pre-starting logic device has already started normally, that is, the corresponding pre-starting logic device has entered a steady state. Therefore, the operation phase of each cinema electrical equipment is divided accordingly.

[0029] Specifically, the next cinema electrical device in the control logic of the target device is denoted as the target device's downstream device. Taking the projector as an example, in the control logic of the cinema electrical device at the start of automated intelligent projection, the playback server is started after the projector is started. Therefore, the playback server is the downstream device that starts the projector. It should be noted that there is no downstream device for the stage lights. Since the stage lights are in two states, on and off, and the power in the on state remains constant, the stage lights can be easily monitored based on the power in the on state. Therefore, this embodiment only calculates the start time of the stage lights and does not perform adaptive data acquisition and anomaly judgment on the operating state of the stage lights. For any operating parameter of the target device, the time of the first element in the projection reference time sequence where the state change exponent is not 0 is obtained and recorded as the start expression time of the operating parameter; the earliest start expression time among all the start expression times of the target device is recorded as the start time of the target device. The start-up time of each cinema electrical device is obtained using the method described above.

[0030] It should be noted that when the target device's downstream device starts up, it means that the target device has completed startup and entered a steady state. There is a steady state start node in the time interval between the startup time of the target device and the startup time of the target device's downstream device. Before this steady state start node, the target device is in the startup state, and after this steady state start node, the target device is in the steady state. In order to more effectively monitor the startup phase of the target device, it is necessary to obtain the steady state start node.

[0031] Specifically, in the projection reference timing sequence of any operating parameter of the target device, if the target device has a subsequent device (i.e., the target device is not the last device to start), then the start time of the subsequent device is taken as the end time point; if the target device does not have a subsequent device (i.e., the target device is the last device to start), then the last moment of the projection reference timing sequence is taken as the end time point, and the time before the end time point is taken as the end time point. Using a given moment as the starting point, the resulting interval is denoted as the state judgment interval for this operating parameter; where... As a preset interval, this embodiment uses Let's take an example to illustrate; In the projection reference time sequence of the operating parameter, the time interval from the start time of the target device's downstream device to the last sampling time of the projection reference time sequence of the target device's operating parameter is used as the steady-state reference interval of the operating parameter. In the projection reference time sequence of the operating parameter, the difference obtained by subtracting the variance of the state change index of all elements in the steady-state reference interval from the variance of the state change index of all elements in the state judgment interval and steady-state reference interval of the operating parameter is used as the steady-state deviation index of the state judgment interval. The state judgment interval of this operating parameter is expanded. Specifically, the expansion method is to use the starting point of the state judgment interval of the operating parameter as... Using a step size, move towards the first element of the projection reference time series of the operating parameter. After each move, obtain the steady-state deviation index of the state judgment interval until the number of elements between the start point of the state judgment interval and the first element of the projection reference time series of the operating parameter is insufficient. When there are 1 element, the expansion of the stop state judgment interval is performed. The sequence of steady-state deviation indices obtained during the expansion process, arranged in the order of acquisition, is denoted as the steady-state deviation sequence of that operating parameter; where... To preset the movement step size, this embodiment Let's take this as an example.

[0032] It should be noted that during the expansion of the state judgment interval, after the state judgment interval includes part of the start state interval, the state change exponent of the start state interval is relatively high, which will cause the steady-state deviation exponent to increase rapidly. Therefore, this is used to determine the steady-state start node of the operating parameters.

[0033] Specifically, for any element in the steady-state deviation sequence of any operating parameter of the target device, the difference between that element and the previous element is denoted as the steady-state difference index of that element; it should be noted that the steady-state difference index of the first element in the steady-state deviation sequence of the operating parameter is 0. Among all elements of the steady-state deviation sequence of the operating parameter, the element with the largest steady-state difference index is recorded as the boundary element of the operating parameter; the starting point of the state judgment interval corresponding to the boundary element is recorded as the steady-state start node of the operating parameter.

[0034] It should be noted that, due to the differences in the dynamic characteristics of the parameters themselves, the operating parameters of cinema electrical equipment include some continuously fluctuating parameters. For example, the speed of the cooling fan is subject to controlled fluctuations due to the adaptive adjustment mechanism of the equipment. Therefore, parameters whose state change exponents are not much different between the start-up state and the steady state do not contribute much to the judgment of whether the cinema electrical equipment has reached a steady state.

[0035] Specifically, in the projection reference time series of any operating parameter of the target device, the mean of the state change exponents of all elements before the steady-state start node of that operating parameter is obtained, and the difference between the mean of the state change exponents of all elements after the steady-state start node of that operating parameter and the maximum value between this difference and 0 (to avoid a negative difference) is taken as the initial steady-state contribution of that operating parameter. In order to accurately measure the relative importance of each parameter to the steady-state determination, the ratio of the initial steady-state contribution of that operating parameter to the sum of the initial steady-state contributions of all operating parameters of the target device is calculated, and denoted as the steady-state contribution of that operating parameter. The object of weight normalization is the initial steady-state contribution of all operating parameters of the target device.

[0036] It should be noted that the higher the steady-state contribution of an operating parameter, the better it is used to determine whether the equipment has transitioned from the startup state to a steady state. Different operating parameters enter a steady state at different times in the timing data. The overall steady-state of the cinema electrical equipment is determined based on the last operating parameter that enters a steady state. Therefore, this is used to determine the start time of the steady state of the cinema electrical equipment.

[0037] Specifically, for any operating parameter of the target device, the product of the ordinal number of the element corresponding to the steady-state start node of the operating parameter in the projection reference time series of the operating parameter and the steady-state contribution of the operating parameter is denoted as the steady-state determination index of the operating parameter. The operating parameter with the largest steady-state determination index is denoted as the steady-state characteristic parameter of the target device.

[0038] It should be noted that the steady-state start node of the steady-state flag parameter of the target device is the moment when the target device enters steady state. After this time, the target device enters steady state.

[0039] Step S003: Obtain the real-time timing sequence of each operating parameter of the target device; based on the state change index of the elements in the real-time timing sequence and the reference timing sequence, obtain the stability of the steady-state flag parameter of the target device at the current moment and the start-up progress index, and then obtain the start-up completion probability of the target device at the current moment.

[0040] It should be noted that after determining the steady-state start time of each cinema electrical device during the first automated smart screening, in each subsequent automated smart screening, the data collection frequency needs to be adjusted based on the comparison between the changes of each operating parameter of each cinema electrical device at the current moment of the automated smart screening and the corresponding operating parameters during the first automated smart screening.

[0041] It should be further explained that during automated intelligent projection, the startup phase is accompanied by a highly dynamic process, and instantaneous anomalies often occur within a millisecond window. High-frequency acquisition can accurately capture sudden signals and avoid missing key data due to excessively long sampling intervals. In the steady-state phase, the frequency is reduced after the parameters tend to level off, taking into account system resource efficiency. Therefore, it is necessary to determine the current phase.

[0042] Specifically, during the current automated smart projection process, any operating parameter of the target device is collected at a corresponding preset acquisition frequency. During this acquisition process, the startup time of the target device during the current automated smart projection is continuously acquired based on the acquisition method used during the first automated smart projection. This process continues until the startup time of the target device during the current automated smart projection exists. Then, the data is collected from the startup time of the target device during the current automated smart projection to the [number of]th [times] after the startup time. The sequence of all data collected within a second is denoted as the real-time timing sequence of the target device's operating parameter; the start-up expression time of the target device's steady-state indicator parameter in the real-time timing sequence is obtained according to the method of obtaining the start-up expression time of the target device's steady-state indicator parameter in the projection reference timing sequence; where, To preset the adjustment delay, this embodiment uses... Let's take an example to illustrate; In the projection reference time sequence of the steady-state flag parameter of the target device, the sum of the state change indices of all elements in the time interval from the start expression time of the steady-state flag parameter of the target device to the steady-state start node is denoted as the start state reference index of the steady-state flag parameter of the target device. In the real-time time sequence of the steady-state flag parameters of the target device, the sum of the state change exponents of all elements from the start expression time of the steady-state flag parameters of the target device to the current time is denoted as the real-time start state exponent of the steady-state flag parameters of the target device at the current time. Subtract the current moment's steady-state flag parameter from the real-time exponent of the startup state at the current moment. The inversely proportional normalized result of the absolute value of the difference between the real-time index of the startup status at the corresponding moment 1 second ago is denoted as the stability of the steady-state indicator parameter of the target device at the current moment; where, To preset a stable judgment time, this embodiment uses... Let's take an example to illustrate; The ratio of the real-time startup status index of the target device's steady-state flag parameter at the current moment to the startup status reference index of the target device's steady-state flag parameter is used as the startup progress index of the target device's steady-state flag parameter at the current moment.

[0043] At this point, as the device starts up, the real-time index gradually approaches the reference index, and the startup progress index gradually approaches 1, so that the final calculated startup completion probability approaches 1 when the device is running stably.

[0044] The product of the stability of the steady-state flag parameter of the target device at the current moment and the start-up progress index is denoted as the probability of the target device completing the start-up at the current moment.

[0045] It should be noted that since the internal component operating logic of the target device remains unchanged each time it performs automated intelligent projection, the startup status reference index of the target device's steady-state flag parameter reflects the total number of state change indices required for each automated intelligent projection. The startup progress of the target device can be determined by the difference between the real-time startup status index of the target device's steady-state flag parameter and the startup status reference index of the target device's steady-state flag parameter. If the difference is small and the stability of the target device's steady-state flag parameter is high at the current moment, it indicates that the target device has completed startup at the current moment.

[0046] Step S004: Based on the startup progress index, obtain the degree of progress anomaly of the target device at the current moment.

[0047] It should be noted that during the startup phase of cinema electrical equipment, in addition to increasing the frequency of collecting operating parameters of the cinema electrical equipment, when an abnormality occurs during the startup process, the frequency of collecting operating parameters should be further increased to provide more accurate data for detecting and judging equipment malfunctions.

[0048] Specifically, following the method for obtaining the start-up progress index of the steady-state flag parameter of the target device at the current moment, the start-up progress index of the steady-state flag parameter of the target device at each moment in the projection reference time sequence is obtained; The current moment is taken as the reference moment in the projection reference time sequence of the target device's steady-state flag parameters, and the corresponding moment in the projection real-time time sequence is taken as the reference moment of the current moment. The moment position is determined by the time distance between the current moment and the first moment in the projection real-time time sequence, and the reference moment is determined in the projection reference time sequence based on the time distance. The absolute value of the difference between the target device's steady-state flag parameter's startup progress index at the current moment and the target device's steady-state flag parameter's startup progress index at the reference moment is recorded as the degree of progress anomaly of the target device at the current moment. By calculating the absolute value, regardless of whether the device startup is delayed or ahead of schedule, as long as it deviates from the preset reference trajectory, the degree of anomaly is always positive. This increases the sampling frequency in subsequent calculations and prevents errors caused by negative values ​​leading to a decrease in frequency.

[0049] It should be noted that the larger the difference between the start-up progress index of the target device's steady-state flag parameter at the current moment and the start-up progress index of the target device's steady-state flag parameter at the reference moment at the current moment, the greater the probability that the target device will fail during startup, as the device was started at the same time in the current automated smart projection process but the start-up progress is different in the first automated smart projection process.

[0050] Step S005: Adjust the acquisition frequency of each operating parameter of each cinema electrical equipment according to the startup completion probability and the degree of progress abnormality.

[0051] It should be noted that when using an IoT electrical box to control cinema electrical equipment, it is necessary to collect the operating parameters of the cinema electrical equipment in order to monitor the operating status of the cinema electrical equipment. In order to maintain a balance between effective monitoring and reducing the consumption of storage and transmission resources, it is necessary to collect the operating parameters of the cinema electrical equipment at a high frequency during the startup phase, increase the sampling frequency when an abnormality occurs during startup, and collect them at a low frequency during the steady-state phase.

[0052] Specifically, the target device's first The method for calculating the frequency base of each operating parameter at the current moment is as follows: In the formula, For the target device The frequency base of each operating parameter at the current moment; To preset the steady-state frequency base, this embodiment uses... Let's take an example to illustrate; As a preset start-up frequency base, this embodiment uses Let's take an example to illustrate; This represents the probability of the target device completing startup at the current moment. It should be noted that the preset steady-state frequency base is for collecting data at a lower frequency when the target device is in a steady state, and the preset startup frequency base is for further increasing the collection frequency based on the low-frequency collection in the steady state when the target device is in the startup phase. The sum of the preset steady-state frequency base and the preset startup frequency base is less than 1. The target device's first The calculation method for the sampling frequency of each operating parameter at the current moment is as follows: In the formula, For the target device The sampling frequency of each operating parameter at the current moment; For the target device The preset acquisition frequency of each operating parameter; For the target device The frequency base of each operating parameter at the current moment; The degree of progress anomaly of the target device at the current moment; The floor symbol; At the current moment and at every moment thereafter, the corresponding operating parameters are collected according to the collection frequency of each operating parameter of the target device at each moment, and the real-time timing sequence of the projection is updated to obtain the projection update timing sequence of each operating parameter. The projection update time sequence of each operating parameter of the target device is obtained and compared with the corresponding projection reference time sequence. Specifically, for any element in the projection update time sequence of any operating parameter of the target device, the absolute value of the difference between the element and the element at the corresponding time in the first automated intelligent projection is obtained. The ratio of the absolute value to the element at the reference time in the first automated intelligent projection is recorded as the deviation degree of the element. If the deviation degree of the element is greater than the preset abnormal threshold, an alarm is triggered. Relevant personnel determine the fault of the device based on the difference between the projection update time sequence and the corresponding projection reference time sequence, and repair and maintain the target device. The preset abnormal threshold is 0.2, and this embodiment is described using this as an example.

[0053] This embodiment adopts The model is used to represent the inverse proportional relationship and for normalization processing. As input to the model, implementers can set inverse proportional functions and normalization functions according to the actual situation.

[0054] Another embodiment of the present invention provides an Internet of Things (IoT) electrical box monitoring system, which includes a memory, a processor, and a computer program stored in the memory and running on the processor. When the processor executes the computer program, it implements the above-described method steps S001 to S005.

[0055] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A method for monitoring an IoT electrical box, characterized in that, The method includes the following steps: The projection reference timing sequence is obtained by acquiring several operating parameters of each cinema's electrical equipment through the Internet of Things electrical box; Let any cinema electrical equipment be designated as the target equipment; in the projection reference time sequence of each operating parameter of the target equipment, obtain the state change index of each element according to the change of each element; according to the fluctuation of the state change index, obtain the steady-state start node of each operating parameter of the target equipment; according to the steady-state start node of each operating parameter of the target equipment, obtain the steady-state contribution of each operating parameter of the target equipment; and combine the steady-state start node to obtain the steady-state indicator parameter of the target equipment. Obtain the real-time timing sequence of each operating parameter of the target device; based on the state change index of the elements in the real-time timing sequence and the reference timing sequence, obtain the stability of the steady-state flag parameter of the target device at the current moment and the start-up progress index, and then obtain the probability of the target device completing the start-up at the current moment. Based on the startup progress index, the degree of progress anomaly of the target device at the current moment is obtained; The sampling frequency of each operating parameter of each cinema electrical device is adjusted based on the probability of startup completion and the degree of progress anomaly.

2. The IoT electrical box monitoring method according to claim 1, characterized in that, The specific method for obtaining the state change index of each element based on the changes in each element in the projection reference time sequence of each operating parameter of the target device includes: For any element in the projection reference time sequence of any operating parameter of the target device, establish a sequence of length [length missing] with that element as the end of the projection reference time sequence. The feature window is used to obtain the mean of all elements within that feature window; The absolute value of the difference between the element and the mean of all elements within its feature window is calculated. This absolute value is then divided by the maximum absolute value of all differences within the feature window, and the resulting ratio is denoted as the overall degree of change of the element. If the maximum absolute value of all differences within the feature window is 0, the overall degree of change of the element is recorded as 0 or 1. The absolute value of the difference between the element and its preceding adjacent element is denoted as the local degree of change of the element. The product of the overall degree of change and the local degree of change is denoted as the state change index of the element. This is the preset window length.

3. The IoT electrical box monitoring method according to claim 1, characterized in that, The specific method for obtaining the steady-state start node of each operating parameter of the target device based on the fluctuation of the state change index includes: The next cinema electrical device in the control logic of the target device is denoted as the target device's successor device; For any operating parameter of the target device, the projection reference timing sequence is obtained, and the time of the first element in the projection reference timing sequence of the operating parameter with a non-zero state change exponent is recorded as the start expression time of the operating parameter; the earliest start expression time among all the start expression times of the target device is recorded as the start time of the target device; the start time of each cinema electrical device is obtained. If the target device has a rear-end device, the start time of the rear-end device is taken as the end time point; if the target device does not have a rear-end device, the last moment of the projection reference timing sequence is taken as the end time point, and the time point preceding the end time point is taken as the end time point. Using a given moment as the starting point, the resulting interval is denoted as the state judgment interval for this operating parameter; where... Preset interval; In the projection reference time sequence of the operating parameter, the time interval from the start time of the target device's downstream device to the last sampling time of the projection reference time sequence of the target device's operating parameter is used as the steady-state reference interval of the operating parameter. In the projection reference time sequence of the operating parameter, the difference obtained by subtracting the variance of the state change index of all elements in the state judgment interval and steady-state reference interval of the operating parameter from the variance of the state change index of all elements in the steady-state reference interval of the operating parameter is used as the steady-state deviation index of the state judgment interval. The state judgment interval of the operating parameter is extended to obtain the steady-state deviation sequence of the operating parameter; For any element in the steady-state deviation sequence of any operating parameter of the target device, the difference between the element and the previous element is denoted as the steady-state difference index of the element. Among all elements of the steady-state deviation sequence of the operating parameter, the element with the largest steady-state difference index is recorded as the boundary element of the operating parameter; the starting point of the state judgment interval corresponding to the boundary element is recorded as the steady-state start node of the operating parameter.

4. The IoT electrical box monitoring method according to claim 3, characterized in that, The specific method for expanding the state judgment interval of the operating parameter to obtain the steady-state deviation sequence of the operating parameter includes: The start time point of the state judgment interval of this running parameter is... Using a step size, move towards the first element of the projection reference time series of the operating parameter. After each move, obtain the steady-state deviation index of the state judgment interval until the number of elements between the start point of the state judgment interval and the first element of the projection reference time series of the operating parameter is insufficient. When there are 1 element, the expansion of the stop state judgment interval is performed. The sequence of steady-state deviation indices obtained during the expansion process, arranged in the order of acquisition, is denoted as the steady-state deviation sequence of that operating parameter; where... This is the preset movement step size.

5. The IoT electrical box monitoring method according to claim 1, characterized in that, The specific method for obtaining the steady-state contribution of each operating parameter of the target device based on the steady-state start node of each operating parameter of the target device includes: In the projection reference time sequence of any operating parameter of the target device, obtain the mean of the state change exponents of all elements before the steady-state start node of the operating parameter, and subtract the mean of the state change exponents of all elements after the steady-state start node of the operating parameter from the mean of the state change exponents of all elements after the steady-state start node of the operating parameter. The maximum value between this difference and 0 is taken as the steady-state initial contribution of the operating parameter. The ratio of the steady-state initial contribution of the operating parameter to the sum of the steady-state initial contributions of all operating parameters of the target device is calculated and denoted as the steady-state contribution of the operating parameter.

6. The IoT electrical box monitoring method according to claim 1, characterized in that, The steady-state flag parameters of the target device are obtained using the following method: For any operating parameter of the target device, the product of the ordinal number of the element corresponding to the steady-state start node of the operating parameter in the projection reference time series of the operating parameter and the steady-state contribution of the operating parameter is denoted as the steady-state determination index of the operating parameter. The operating parameter with the largest steady-state determination index is denoted as the steady-state characteristic parameter of the target device.

7. The IoT electrical box monitoring method according to claim 3, characterized in that, The method for obtaining the stability level and startup progress index of the steady-state flag parameters of the target device at the current moment, and then obtaining the startup completion probability of the target device at the current moment, includes the following specific methods: Obtain the real-time timing sequence of each operating parameter of the target device; obtain the start-up expression time of the steady-state flag parameters of the target device in the real-time timing sequence of the projection; In the projection reference time sequence of the steady-state flag parameter of the target device, the sum of the state change indices of all elements in the time interval from the start expression time of the steady-state flag parameter of the target device to the steady-state start node is denoted as the start state reference index of the steady-state flag parameter of the target device. In the real-time time sequence of the steady-state flag parameters of the target device, the sum of the state change exponents of all elements from the start expression time of the steady-state flag parameters of the target device to the current time is denoted as the real-time start state exponent of the steady-state flag parameters of the target device at the current time. Subtract the current moment's steady-state flag parameter from the real-time exponent of the startup state at the current moment. The inversely proportional normalized result of the absolute value of the difference between the real-time index of the startup status at the corresponding moment 1 second ago is denoted as the stability of the steady-state indicator parameter of the target device at the current moment; where, The preset stability judgment duration; The ratio of the real-time startup status index of the target device's steady-state flag parameter at the current moment to the startup status reference index of the target device's steady-state flag parameter is used as the startup progress index of the target device's steady-state flag parameter at the current moment. The product of the stability of the steady-state flag parameter of the target device at the current moment and the start-up progress index is denoted as the probability of the target device completing the start-up at the current moment.

8. The IoT electrical box monitoring method according to claim 1, characterized in that, The specific method for obtaining the degree of progress anomaly of the target device at the current moment based on the startup progress index includes: Obtain the start-up progress index of the steady-state flag parameters of the target device at each moment in the projection reference time sequence; The current moment is taken as the reference moment in the projection reference time sequence of the target device's steady-state flag parameters, and the corresponding moment in the projection reference time sequence of the projection real-time ... The absolute value of the difference between the start-up progress index of the target device's steady-state indicator parameter at the current moment and the start-up progress index of the target device's steady-state indicator parameter at the reference moment is denoted as the degree of progress anomaly of the target device at the current moment.

9. The IoT electrical box monitoring method according to claim 1, characterized in that, The specific method for adjusting the collection frequency of each operating parameter of each cinema electrical device based on the startup completion probability and the degree of progress anomaly includes: The target device's first The method for calculating the frequency base of each operating parameter at the current moment is as follows: In the formula, For the target device The frequency base of each operating parameter at the current moment; The preset steady-state frequency base; The preset startup frequency base; This represents the probability that the target device will complete startup at the current moment. The target device's first The calculation method for the sampling frequency of each operating parameter at the current moment is as follows: In the formula, For the target device The sampling frequency of each operating parameter at the current moment; For the target device The preset acquisition frequency of each operating parameter; For the target device The frequency base of each operating parameter at the current moment; The degree of progress anomaly of the target device at the current moment; The floor symbol; At the current moment and at every moment thereafter, the corresponding operating parameters are collected according to the collection frequency of each operating parameter of the target device at each moment, and the real-time timing sequence of the projection is updated to obtain the projection update timing sequence of each operating parameter.

10. An Internet of Things (IoT) electrical box monitoring system, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the IoT electrical box monitoring method as described in any one of claims 1-9.

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