Single crystal test bar tool for Laue diffractometer and Laue detection method

Abstract

The invention provides a single crystal test bar tool for a Laue diffractometer and a Laue detection method. The single crystal test bar tool for the Laue diffractometer comprises a base and supporting frames, the supporting frames are arranged on the base and provided with a plurality of limiting grooves arranged at intervals, the limiting grooves are used for arranging and limiting single crystal test bars, the number of the supporting frames is at least two, the supporting frames are arranged in parallel at intervals, and the limiting grooves in the supporting frames are arranged in a one-to-one opposite mode. According to the single crystal test bar tool for the Laue diffractometer, the limiting grooves oppositely formed in the at least two supporting frames are used for bearing single crystal test bars and limiting the single crystal test bars, the single crystal test bars can meet the detection position requirement of the Laue diffractometer conveniently, the accuracy of a detection result is improved, meanwhile, due to the fact that the multiple limiting grooves are formed in the supporting frames, the accuracy of the detection result is improved, and the accuracy of the detection result is improved. Therefore, a plurality of single crystal test bars can be placed on the single crystal test bar tool at the same time to be detected by the Laue diffractometer, and the detection efficiency can be improved.

Description

Technical Field

[0001] This invention relates to the field of testing, specifically to a single-crystal test rod fixture for a Laue diffractometer and a Laue testing method. Background Technology

[0002] Single-crystal superalloy blades are critical hot-end components of aero-engines and gas turbines. Their performance is highly dependent on the orientation of the internal crystals. The angle θ between the blade's main growth direction and its design reference axis is a core parameter for evaluating the suitability of the crystal orientation. The mechanical properties of single-crystal blades are typically evaluated using single-crystal test specimens. Before mechanical property testing, it is usually necessary to test the crystal orientation θ angle of the single-crystal test specimen. Related technologies typically use a Laue diffractometer to determine the crystal orientation of the single-crystal test specimen. However, in these technologies, the single-crystal test specimen needs to be placed individually on the Laue diffractometer's testing platform, and then its position needs to be manually adjusted to meet the testing requirements, resulting in low testing efficiency and large errors. Summary of the Invention

[0003] The present invention aims to at least partially solve one of the technical problems in the related art.

[0004] Therefore, embodiments of the present invention provide a single-crystal test rod fixture for a Laue diffractometer, and a Laue detection method based on the single-crystal test rod fixture.

[0005] The single-crystal test rod fixture for a Laue diffractometer according to an embodiment of the present invention includes: The base and the support frame are provided. The support frame is mounted on the base and has a plurality of spaced-apart limiting grooves. The limiting grooves are used to set and limit the single crystal test rod. There are at least two support frames arranged in parallel and spaced apart, and the limiting grooves on the support frames are arranged opposite each other.

[0006] The single crystal test rod fixture for a Laue diffractometer according to embodiments of the present invention uses limiting grooves arranged opposite to each other on at least two support frames to support and limit the position of the single crystal test rod, which facilitates the single crystal test rod to meet the detection position requirements of the Laue diffractometer and improves the accuracy of the detection results. At the same time, since the support frame has multiple limiting grooves, the single crystal test rod fixture can hold multiple single crystal test rods at the same time for detection by the Laue diffractometer, which helps to improve detection efficiency.

[0007] In some embodiments, at least one end of the base is provided with an abutment plane along the spacing arrangement direction of the support frame, the abutment plane being used to abut against the reference plane of the detection platform of the Laue diffractometer.

[0008] In some embodiments, the projections of the opposing limiting grooves coincide on a projection plane orthogonal to the spacing direction of the support frame.

[0009] In some embodiments, the limiting grooves are all configured as V-shaped.

[0010] In some embodiments, the included angles of the oppositely positioned limiting grooves are the same.

[0011] In some embodiments, the included angle of the limiting groove is 60° to 120°.

[0012] In some embodiments, at least two of the support frames include a first support frame and a second support frame arranged at intervals and in parallel, and the limiting groove includes a first limiting groove and a second limiting groove. The first limiting groove is provided on a plurality of the first support frame, and the second limiting groove is provided on a plurality of the second support frame. The first limiting groove and the second limiting groove are arranged opposite to each other.

[0013] In some embodiments, along the spacing arrangement direction of the first support frame and the second support frame, one end of the base is provided with the first support frame, and the other end of the base is provided with the second support frame.

[0014] In some embodiments, at least two of the support frames further include a third support frame, which is disposed between the first support frame and the second support frame and is spaced apart from and arranged in parallel with the first support frame and the second support frame. The limiting groove further includes a third limiting groove, which is a plurality of the third limiting grooves disposed on the third support frame. The first limiting groove, the third limiting groove and the second limiting groove are arranged opposite to each other.

[0015] The Laue detection method of this invention is implemented based on the single-crystal test rod fixture for a Laue diffractometer as described in any of the above-mentioned embodiments, and the Laue detection method includes: The single crystal test rod fixture for the Laue diffractometer is mounted on the detection platform of the Laue diffractometer. The detection platform has a reference surface. At least one end of the base along the spacing direction of the support frame has an abutment plane. One of the abutment planes abuts against the reference surface. The single crystal test rod is placed on at least two limiting grooves that are at least partially opposite to each other. Adjust the position of each single crystal test rod along the relative setting direction of the limiting groove to adjust each single crystal test rod to the detection position of the Laue diffractometer; The single crystal test rod was sequentially tested using the Laue diffractometer. Replace the single crystal test rod fixture used in the Laue diffractometer or replace the single crystal test rod on the single crystal test rod fixture used in the Laue diffractometer.

[0016] The Laue detection method of this invention is implemented using the single crystal test rod fixture for the Laue diffractometer. By aligning the contact plane of the base with the reference plane of the detection platform, the positions of multiple single crystal test rods can be coarsely adjusted simultaneously. Then, the positions of the single crystal test rods along the relative setting direction of the limiting groove can be finely adjusted to meet the detection position requirements of the Laue diffractometer. This method is easy to operate and has high operating efficiency, thereby improving detection efficiency and the accuracy of detection results. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of a single crystal test rod fixture for a Laue diffractometer according to an embodiment of the present invention; Figure 2 yes Figure 1 A side view of the single crystal test rod fixture used in the Laue diffractometer.

[0018] Figure label: 1. Base; 11. Abutting plane; 2. Support frame; 21. First support frame; 22. Second support frame; 23. Third support frame; 3. Limiting groove; 31. First limiting groove; 32. Second limiting groove; 33. Third limiting groove. Detailed Implementation

[0019] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the present invention, and should not be construed as limiting the present invention.

[0020] The following is for reference. Figure 1 and Figure 2 This invention describes a single-crystal test rod fixture for a Laue diffractometer and a Laue detection method according to embodiments of the present invention.

[0021] like Figure 1 and Figure 2 As shown, the single crystal test rod fixture for a Laue diffractometer according to an embodiment of the present invention includes a base 1 and a support frame 2.

[0022] The support frame 2 is mounted on the base 1, and the support frame 2 can be configured to run along the base 1. Figure 1 Extending in the front-to-back direction as shown, and having a lateral direction as shown. Figure 1 The multiple limiting grooves 3 arranged at intervals in the front-back direction are shown. The limiting grooves 3 are used to set and limit the single crystal test rod. The support frame 2 is along the front-back direction. Figure 1 At least two of them are arranged in parallel and spaced apart in the left and right directions, and the limiting grooves 3 on the support frame 2 are set opposite to each other.

[0023] The single crystal test rod fixture for a Laue diffractometer in this embodiment of the invention supports and limits the single crystal test rods through limiting grooves 3 arranged opposite to each other on at least two support frames 2. This facilitates the single crystal test rods to meet the detection position requirements of the Laue diffractometer and improves the accuracy of the detection results. At the same time, since the support frame 2 is provided with multiple limiting grooves 3, the single crystal test rod fixture can simultaneously place multiple single crystal test rods for detection by the Laue diffractometer, which is beneficial to improving detection efficiency.

[0024] In some embodiments, such as Figure 1 As shown, along the spacing direction of support frame 2 (e.g.) Figure 1 (As shown in the left and right directions), at least one end of the base 1 is provided with an abutment plane 11. The abutment plane 11 is used to abut against the reference plane of the detection platform of the Laue diffractometer, thereby defining the position of the single crystal test rod tool on the detection platform, so that the single crystal test rod is in the detection position.

[0025] Optionally, the base 1 is a horizontal plate, and the left and right end faces of the base 1 are both planes and form abutment planes 11.

[0026] In some embodiments, such as Figure 1 and Figure 2 As shown, in the spacing direction orthogonal to support frame 2 (such as...) Figure 1 On the projection surface (shown in the left and right directions), the projections of the limiting grooves 3 that are arranged opposite to each other on at least two support frames 2 coincide. In other words, the shape and size of the limiting grooves 3 that are arranged opposite to each other are the same.

[0027] The opposing limiting grooves 3 are used to support the same single crystal test rod. Setting the shape and size of the opposing limiting grooves 3 to be consistent can better constrain the single crystal test rod and prevent one end of the single crystal test rod from shaking and affecting the test.

[0028] In some embodiments, such as Figure 1 and Figure 2 As shown, the limiting grooves 3 are all set in a V shape. The single crystal test rod is cylindrical. Setting the limiting grooves 3 in a V shape can better limit the single crystal test rod and prevent the single crystal test rod from shaking in the limiting grooves 3. At the same time, the limiting grooves 3 can support single crystal test rods of various diameters, such as single crystal test rods with diameters of 5mm, 10mm, 15mm, 20mm, 25mm and 30mm.

[0029] In some embodiments, such as Figure 1 and Figure 2 As shown, the included angle α of the relatively set limiting groove 3 is the same.

[0030] The opposing limiting grooves 3 are used to support the same single crystal test rod. Setting the included angle α of the opposing limiting grooves 3 to be consistent can better constrain the single crystal test rod and prevent one end of the single crystal test rod from shaking and affecting the test.

[0031] It should be noted that since each support frame 2 is provided with multiple limiting grooves 3, multiple sets of limiting grooves 3 are formed on at least two support frames 2. Each set of limiting grooves 3 includes limiting grooves 3 arranged opposite to each other. The included angle α of each set of limiting grooves 3 can be the same or different.

[0032] In some embodiments, such as Figure 2 As shown, the included angle α of the limiting groove 3 is 60° to 120°, such as 60°, 90°, 120°, etc., preferably 90°. This is so that the limiting groove 3 can support single crystal test rods of various diameters, such as single crystal test rods with diameters of 5mm, 10mm, 15mm, 20mm, 25mm and 30mm.

[0033] In some embodiments, such as Figure 1 As shown, at least two support frames 2 include optional features along... Figure 1 The first support frame 21 and the second support frame 22, which are spaced apart and arranged in parallel in the left-right direction, can be selected to be arranged along the following... Figure 1 The vertical plate extends in the front-to-back direction as shown.

[0034] The limiting groove 3 includes a first limiting groove 31 and a second limiting groove 32. The first limiting groove 31 consists of multiple grooves located at the top of the first support frame 21 and extending along... Figure 1 As shown, the second limiting grooves 32 are arranged at intervals in the front-back direction. Multiple second limiting grooves 32 are located at the top of the second support frame 22, and are arranged along... Figure 1 The front and rear directions are arranged at intervals, with the first limiting groove 31 and the second limiting groove 32 arranged opposite to each other.

[0035] Optionally, along orthogonal to such Figure 1 On the projection plane in the left and right directions shown, along as Figure 1 The first limiting groove 31 and the second limiting groove 32, which are spaced apart and arranged opposite to each other in the left and right directions, are projected to overlap.

[0036] Optionally, both the first limiting groove 31 and the second limiting groove 32 are V-shaped.

[0037] Optionally, along such Figure 1 The first limiting groove 31 and the second limiting groove 32, which are spaced apart and arranged opposite each other in the left and right directions, are set to have the same included angle α.

[0038] Optionally, in such Figure 1 A first limiting groove 31 and a second limiting groove 32, which are spaced apart and arranged opposite each other in the left and right directions, form a set of limiting grooves 3. Thus, multiple sets of limiting grooves 3 are formed on the first support frame 21 and the second support frame 22. The included angle α of each set of limiting grooves 3 can be the same or different, but the included angle α can be selected from 60° to 120°.

[0039] In some embodiments, such as Figure 1 As shown, along the spacing arrangement direction of the first support frame 21 and the second support frame 22 (e.g. Figure 1 (as shown in the left and right directions), one end of base 1 (such as...) Figure 1 The left end of the base 1 shown is provided with a first support frame 21, and the other end of the base 1 (as shown) is provided with a first support frame 21. Figure 1 The right end of the base 1 shown is provided with a second support frame 22 to ensure the stability of the single crystal test rod fixture after the single crystal test rod is placed.

[0040] Optionally, one end of the single crystal test rod is placed on the first limiting groove 31, and the other end of the single crystal test rod is placed on the second limiting groove 32.

[0041] In some embodiments, such as Figure 1 As shown, at least two support frames 2 also include a third support frame 23, which can be optionally arranged along... Figure 1 The vertical plate extending in the front-back direction is shown. The third support frame 23 is located between the first support frame 21 and the second support frame 22, and is aligned with both the first support frame 21 and the second support frame 22 along the same direction. Figure 1 The objects are arranged in parallel and spaced out in the left and right directions.

[0042] The limiting groove 3 also includes a third limiting groove 33, which consists of multiple third limiting grooves located at the top of the third support frame 23 and extending along... Figure 1 The front and rear directions are arranged at intervals, with the first limiting groove 31, the third limiting groove 33 and the second limiting groove 32 arranged opposite to each other.

[0043] A third support frame 23 is provided between the first support frame 21 and the second support frame 22 so that the single crystal test rod fixture can carry single crystal test rods of various lengths, such as single crystal test rods with a length of 95mm to 390mm, for example, 95mm, 195mm, 390mm, etc.

[0044] When the length of the single crystal test rod is relatively long, the single crystal test rod is sequentially supported on the edge along the curve. Figure 1 On the first limiting groove 31, the third limiting groove 33, and the second limiting groove 32, which are spaced apart and arranged opposite each other in the left and right directions, the third limiting groove 33 of the third support frame 23 supports and limits the middle part of the single crystal test rod to improve the placement stability of the single crystal test rod. When the length of the single crystal test rod is relatively short, the single crystal test rod can be supported along the... Figure 1 The first limiting groove 31 and the third limiting groove 33, which are spaced apart and arranged opposite each other in the left and right directions, can also be supported on the following: Figure 1The third limiting groove 33 and the second limiting groove 32, which are spaced apart and arranged opposite each other in the left-right direction, mean that the single crystal test rod can be supported on one of the first support frame 21 and the second support frame 22 and the third support frame 23. This allows the single crystal test rod fixture to be used for single crystal test rods whose length is less than the distance between the first support frame 21 and the second support frame 22.

[0045] Optionally, along orthogonal to such Figure 1 On the projection plane in the left and right directions shown, along as Figure 1 The first limiting groove 31, the third limiting groove 33, and the second limiting groove 32, which are spaced apart and opposite to each other in the left and right directions, are projected to overlap.

[0046] Optionally, the first limiting groove 31, the third limiting groove 33, and the second limiting groove 32 are all V-shaped.

[0047] Optionally, along such Figure 1 The first limiting groove 31, the third limiting groove 33, and the second limiting groove 32, which are spaced apart and arranged opposite each other in the left and right directions, are set to have the same included angle α.

[0048] Optionally, in such Figure 1 A first limiting groove 31, a third limiting groove 33, and a second limiting groove 32, which are spaced apart and arranged opposite each other in the left and right directions, form a set of limiting grooves 3. Thus, multiple sets of limiting grooves 3 are formed on the first support frame 21, the third support frame 23, and the second support frame 22. The included angle α of each set of limiting grooves 3 can be the same or different, but the included angle α can be selected from 60° to 120°.

[0049] The following is for reference. Figure 1 and Figure 2 The Laue detection method according to an embodiment of the present invention is described.

[0050] The Laue detection method of this invention is implemented based on the single crystal test rod tooling for the Laue diffractometer of this invention.

[0051] The Laue detection method of this invention includes: The single crystal test rod fixture for the Laue diffractometer is set on the detection platform of the Laue diffractometer. The detection platform has a reference surface. At least one end of the base 1 along the interval arrangement direction of the support frame 2 has an abutment plane 11. One of the abutment planes 11 abuts against the reference surface. The single crystal test rod is placed on at least two limiting grooves 3 that are at least partially opposite to each other.

[0052] Optionally, such as Figure 1 As shown, both the left and right ends of the base 1 are provided with abutment surfaces 11. Either abutment surface 11 can be abutted against the reference surface. In some embodiments, when the base 1 has only one abutment surface 11, that abutment surface 11 is abutted against the reference surface.

[0053] Optionally, the single crystal test rod fixture is provided with multiple sets of limiting grooves 3, each set of limiting grooves 3 is used to place a corresponding single crystal test rod. Multiple sets of limiting grooves 3 can all place the corresponding single crystal test rod, or some sets of limiting grooves 3 can place the corresponding single crystal test rod. Preferably, multiple sets of limiting grooves 3 all place the corresponding single crystal test rod.

[0054] Optionally, the single crystal test bar fixture can be placed on the single crystal test bar first, and then the single crystal test bar fixture can be placed on the testing platform. Alternatively, the single crystal test bar fixture can be placed on the testing platform first, and then the single crystal test bar can be placed on the single crystal test bar fixture.

[0055] Then adjust the position of each single crystal test rod along the relative setting direction of the limiting groove 3, in other words, along such a direction. Figure 1 Adjust the position of each single crystal specimen in the left-right direction as shown. This will align each single crystal specimen with the detection position on the Laue diffractometer.

[0056] Then, the single crystal test bars on the single crystal test bar fixture were tested sequentially using a Laue diffractometer.

[0057] Then replace the single crystal test bar fixture used for the Laue diffractometer or replace the single crystal test bar on the single crystal test bar fixture used for the Laue diffractometer.

[0058] Optionally, when changing the single crystal test rod fixture, the single crystal test rod that has been tested is removed from the testing platform along with the single crystal test rod fixture, and then the above steps are repeated to place the next single crystal test rod fixture on the testing platform. The next batch of single crystal test rods to be tested can be placed on the next single crystal test rod fixture first, or after the next single crystal test rod fixture is placed on the testing platform, and then placed and tested by the Laue diffractometer.

[0059] Optionally, when replacing the single crystal test bars on the single crystal test bar fixture used for the Laue diffractometer, the single crystal test bar fixture remains on the testing platform. Therefore, it is not necessary to repeat the steps of placing and adjusting the position of the single crystal test bar fixture. After placing the next batch of single crystal test bars to be tested on the single crystal test bar fixture, the steps of adjusting the position of each single crystal test bar along the relative setting direction of the limiting groove 3 and the steps of sequentially testing the single crystal test bars on the single crystal test bar fixture using the Laue diffractometer are repeated to complete the testing of the next batch of single crystal test bars to be tested.

[0060] The Laue detection method of this invention is implemented using the single crystal test rod fixture for the Laue diffractometer. By abutting the base 11 with the reference surface of the detection platform, the positions of multiple single crystal test rods can be coarsely adjusted simultaneously. Then, the positions of the single crystal test rods along the relative setting direction of the limiting groove 3 can be finely adjusted to meet the detection position requirements of the Laue diffractometer. This method is easy to operate and has high operating efficiency, thereby improving detection efficiency and the accuracy of detection results.

[0061] In some embodiments, after all the single crystal test rods to be tested have been tested, the single crystal test rod fixture is removed from the testing platform.

[0062] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0063] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0064] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection, an electrical connection, or a connection that allows communication between them; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0065] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "over," and "on top" of the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0066] In this invention, the terms "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., refer to a specific feature, structure, material, or characteristic described in connection with that embodiment or example, which is included in at least one embodiment or example of the invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0067] Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.

Claims

1. A single-crystal test rod fixture for a Laue diffractometer, characterized in that, include: The base (1) and the support frame (2) are provided on the base (1). The support frame (2) is provided with a plurality of spaced limiting grooves (3). The limiting grooves (3) are used to set and limit the single crystal test rod. The support frame (2) consists of at least two spaced and parallel ones, and the limiting grooves (3) on the support frame (2) are arranged opposite to each other.

2. The single-crystal test rod fixture for a Laue diffractometer according to claim 1, characterized in that, Along the spacing arrangement direction of the support frame (2), at least one end of the base (1) is provided with an abutment plane (11), which is used to abut against the reference plane of the detection platform of the Laue diffractometer.

3. The single-crystal test rod fixture for a Laue diffractometer according to claim 1, characterized in that, On the projection plane orthogonal to the spacing direction of the support frame (2), the projection of the limiting groove (3) is coincident.

4. The single-crystal test rod fixture for a Laue diffractometer according to claim 1, characterized in that, The limiting grooves (3) are all set to V-shape.

5. The single-crystal test rod fixture for a Laue diffractometer according to claim 4, characterized in that, The included angles of the relative limiting grooves (3) are consistent.

6. The single-crystal test rod fixture for a Laue diffractometer according to claim 4, characterized in that, The included angle of the limiting groove (3) is 60° to 120°.

7. The single-crystal test rod fixture for a Laue diffractometer according to any one of claims 1-6, characterized in that, At least two of the support frames (2) include a first support frame (21) and a second support frame (22) arranged at intervals and in parallel. The limiting groove (3) includes a first limiting groove (31) and a second limiting groove (32). The first limiting groove (31) is provided on the first support frame (21) in multiple ways, and the second limiting groove (32) is provided on the second support frame (22) in multiple ways. The first limiting groove (31) and the second limiting groove (32) are arranged opposite to each other.

8. The single-crystal test rod fixture for a Laue diffractometer according to claim 7, characterized in that, Along the interval arrangement direction of the first support frame (21) and the second support frame (22), one end of the base (1) is provided with the first support frame (21), and the other end of the base (1) is provided with the second support frame (22).

9. The single-crystal test rod fixture for a Laue diffractometer according to claim 7, characterized in that, At least two of the support frames (2) also include a third support frame (23), which is located between the first support frame (21) and the second support frame (22) and is spaced apart from and arranged in parallel with the first support frame (21) and the second support frame (22). The limiting groove (3) also includes a third limiting groove (33), which is a plurality of the third limiting grooves (33) located on the third support frame (23). The first limiting groove (31), the third limiting groove (33) and the second limiting groove (32) are arranged opposite to each other.

10. A Laue detection method, characterized in that, Based on the single-crystal test rod fixture for a Laue diffractometer according to any one of claims 1-9, the Laue detection method includes: The single crystal test rod fixture for the Laue diffractometer is installed on the detection platform of the Laue diffractometer. The detection platform has a reference surface. The base (1) has an abutment plane (11) at least one end along the spacing direction of the support frame (2). One of the abutment planes (11) abuts against the reference surface. The single crystal test rod is placed on at least two limiting grooves (3) that are at least partially opposite to each other. Adjust the position of each single crystal test rod along the relative setting direction of the limiting groove (3) to adjust each single crystal test rod to the detection position of the Laue diffractometer; The single crystal test rod was sequentially tested using the Laue diffractometer. Replace the single crystal test rod fixture used for the Laue diffractometer or replace the single crystal test rod on the single crystal test rod fixture used for the Laue diffractometer.

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