Method and device for evaluating service life of electromagnetic relay and electronic equipment

Abstract

The invention is suitable for the technical field of nuclear power, and provides an electromagnetic relay life evaluation method and device and electronic equipment, and the method comprises the steps: carrying out the task profile analysis of a to-be-evaluated electromagnetic relay, and obtaining the work information of the to-be-evaluated electromagnetic relay, the working information comprises the working environment temperature and / or the working environment humidity of the to-be-evaluated electromagnetic relay; performing an accelerated life test on the to-be-evaluated electromagnetic relay based on the working information to obtain target parameters which are parameters meeting failure criterion conditions; determining failure duration information of the to-be-evaluated electromagnetic relay based on the target parameter; according to the failure duration information, evaluating a corresponding first life of the to-be-evaluated electromagnetic relay in an accelerated life test; and evaluating a second service life corresponding to the actual work of the electromagnetic relay to be evaluated according to the first service life. Through the method, the accuracy of the obtained second service life can be improved.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of nuclear power, and particularly relates to a life evaluation method and device of an electromagnetic relay, an electronic device, a computer readable storage medium and a computer program product. BACKGROUND

[0002] As a core electrical component for low-voltage control of high-voltage and weak-current control of strong-current, the electromagnetic relay is widely used in the control system of a nuclear power plant. Its core function is to ensure operation safety, realize automatic switching control and isolate dangerous circuits, covering the safety operation and equipment control requirements of the nuclear power plant. Since the electromagnetic relay is a mechanical wear type component, its contact electrical life and mechanical life are limited, and the stability monotonically decreases with the number of on-off times / running time, therefore, the life of the electromagnetic relay needs to be evaluated, and a corresponding maintenance strategy needs to be formulated to reduce the harm to the operation of the nuclear power plant caused by the failure of the electromagnetic relay.

[0003] Currently, the life evaluation result of the electromagnetic relay has a certain deviation from the actual result, and therefore, the accuracy of the life evaluation result is low. SUMMARY

[0004] The embodiments of the application provide a life evaluation method and device of an electromagnetic relay and an electronic device, and can solve the problem of low accuracy of the life evaluation result of the existing electromagnetic relay.

[0005] In a first aspect, the embodiments of the application provide a life evaluation method of an electromagnetic relay, comprising: performing task profile analysis on a to-be-evaluated electromagnetic relay to obtain working information of the to-be-evaluated electromagnetic relay, wherein the working information comprises working environment temperature and / or working environment humidity of the to-be-evaluated electromagnetic relay; performing an accelerated life test on the to-be-evaluated electromagnetic relay based on the working information to obtain a target parameter, wherein the target parameter is a parameter meeting a failure criterion condition; determining failure duration information of the to-be-evaluated electromagnetic relay based on the target parameter; evaluating a first life of the to-be-evaluated electromagnetic relay corresponding to the accelerated life test according to the failure duration information; evaluating a second life of the to-be-evaluated electromagnetic relay corresponding to actual working according to the first life.

[0006] Compared with the prior art, the embodiments of the application have the beneficial effects that: In the embodiment of the present application, the task profile analysis is performed on the electromagnetic relay to be evaluated before the accelerated life test, and the working information of the electromagnetic relay to be evaluated is obtained, and then the accelerated life test is performed on the electromagnetic relay to be evaluated based on the working information. Since the working information includes the working environment temperature and / or the working environment humidity of the electromagnetic relay to be evaluated, the working environment temperature and / or the working environment humidity of the electromagnetic relay to be evaluated are considered when the accelerated life test is performed based on the working information, so that the target parameter obtained by the accelerated life test is more matched with the actual working environment of the electromagnetic relay to be evaluated, thereby improving the accuracy of the obtained target parameter and the accuracy of the failure duration information of the electromagnetic relay to be evaluated determined based on the target parameter. Since the target parameter is a parameter satisfying the failure criterion condition, subsequent evaluation of the first life of the electromagnetic relay to be evaluated corresponding to the accelerated life test and the second life of the electromagnetic relay to be evaluated corresponding to the actual working based on the failure duration information is also conducive to improving the accuracy of the obtained first life and second life.

[0007] In a second aspect, the embodiment of the present application provides a life evaluation device of an electromagnetic relay, comprising: a working information acquisition module configured to perform task profile analysis on an electromagnetic relay to be evaluated to obtain working information of the electromagnetic relay to be evaluated, the working information comprising a working environment temperature and / or a working environment humidity of the electromagnetic relay to be evaluated; a target parameter acquisition module configured to perform accelerated life test on the electromagnetic relay to be evaluated based on the working information to obtain a target parameter, the target parameter being a parameter satisfying a failure criterion condition; a failure duration information determination module configured to determine failure duration information of the electromagnetic relay to be evaluated based on the target parameter; a first life determination module configured to evaluate a first life of the electromagnetic relay to be evaluated corresponding to the accelerated life test according to the failure duration information; a second life determination module configured to evaluate a second life of the electromagnetic relay to be evaluated corresponding to the actual working according to the first life.

[0008] In a third aspect, the embodiment of the present application provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the method of the first aspect when executing the computer program.

[0009] In a fourth aspect, the embodiment of the present application provides a computer readable storage medium, and the computer readable storage medium stores a computer program, and the computer program is executable on a processor to implement the method of the first aspect.

[0010] In a fifth aspect, the embodiments of the present application provide a computer program product, which, when running on an electronic device, causes the electronic device to perform the method of the first aspect.

[0011] It can be understood that the beneficial effects of the second aspect to the fifth aspect can be referred to the related description in the first aspect, which will not be repeated here. BRIEF DESCRIPTION OF DRAWINGS

[0012] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or prior art description will be briefly introduced as follows.

[0013] Figure 1 is a flowchart of a life evaluation method of an electromagnetic relay provided by the embodiments of the present application; Figure 2 is a schematic diagram of a wiring circuit of an electromagnetic relay to be evaluated in a switching state provided by an embodiment of the present application; Figure 3 is a schematic diagram of a wiring circuit of an electromagnetic relay to be evaluated in a long excitation state provided by an embodiment of the present application; Figure 4 is a variation diagram of a contact voltage obtained by performing a degradation phenomenon test on an electromagnetic relay in a switching state provided by an embodiment of the present application; Figure 5 is a variation diagram of a contact resistance of a normally open contact obtained by performing a degradation phenomenon test on an electromagnetic relay in a switching state provided by another embodiment of the present application; Figure 6 is a variation diagram of a contact resistance of a normally closed contact obtained by performing a degradation phenomenon test on an electromagnetic relay in a switching state provided by an embodiment of the present application; Figure 7 is a variation diagram of a contact voltage obtained by performing a degradation phenomenon test on an electromagnetic relay in a long excitation state provided by another embodiment of the present application; Figure 8 is a variation diagram of a contact resistance of a normally open contact obtained by performing a degradation phenomenon test on an electromagnetic relay in a long excitation state provided by an embodiment of the present application; Figure 9 is a variation diagram of a contact resistance of a normally closed contact obtained by performing a degradation phenomenon test on an electromagnetic relay in a long excitation state provided by an embodiment of the present application; Figure 10 is a schematic diagram obtained by photographing a contact point of a test sample provided by an embodiment of the present application; Figure 11A long excitation state electromagnetic relay life failure probability distribution graph provided by the embodiment of the present application; Figure 12 A long excitation state electromagnetic relay 90% reliability life value graph provided by the embodiment of the present application; Figure 13 A switch state electromagnetic relay life failure probability distribution graph provided by the embodiment of the present application; Figure 14 A switch state electromagnetic relay 90% reliability life value graph provided by the embodiment of the present application; Figure 15 A structure block diagram of a life evaluation device of an electromagnetic relay provided by the embodiment of the present application; Figure 16 A structure schematic diagram of an electronic device provided by the embodiment of the present application. DETAILED DESCRIPTION

[0014] In the following description, specific details are set forth, such as particular system configurations, techniques, etc., in order to provide a thorough understanding of the embodiments of the present application. However, persons skilled in the art will understand that the present application can be practiced without these specific details. In other instances, well-known structures, devices, circuits, and methods have not been described in detail in order to avoid obscuring the description of the present application.

[0015] It should be understood that, when used in the specification and the appended claims of the present application, the term "comprising" indicates the presence of the described features, integers, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0016] It should also be understood that the term "and / or" used in the description of the present application and the appended claims indicates any combination of one or more of the associated listed items and all possible combinations thereof, and includes these combinations.

[0017] In addition, in the description of the present application and the appended claims, the terms "first", "second", etc. are only used for differentiation of description, and cannot be understood as indicating or implying relative importance.

[0018] References to "one embodiment" or "some embodiments" in this specification mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized.

[0019] Currently, the lifespan assessment of electromagnetic relays mainly considers mechanical lifespan, electrical lifespan, and high-temperature lifespan. Mechanical lifespan is assessed through mechanical life tests, electrical lifespan through electrical life tests, and high-temperature lifespan through high-temperature life tests. These three tests are as follows: 1. Mechanical life test Refer to GJB 1042A-2002 4.6.23 for the mechanical life test of the electromagnetic relay. Unless otherwise specified, the electromagnetic relay shall be tested according to the following requirements: Ambient temperature: Room temperature; Coil excitation voltage: rated voltage; Contact load: The load of each contact is 10mV~50mV (DC or AC peak). Cycle rate: 60 cycles per minute to 300 cycles per minute, the coil should be excited at rated voltage for (50±10)% of the time of each cycle. Unless otherwise specified, the number of iterations is 1.0 × 10⁻⁶. 6 Second-rate.

[0020] Criteria for qualification: The exterior is free from deformation or damage; Unless otherwise specified, the increase in contact resistance shall not exceed 50% of the initial specification requirement, the DC resistance of the coil shall meet the initial requirement, and the insulation resistance shall not be less than 1.0 × 10⁻⁶. 9 Ω.

[0021] 2. Electrical life test Refer to GJB1042A-2002 4.6.20 for the electrical life test of the electromagnetic relay. Unless otherwise specified, the electromagnetic relay shall be tested according to the following requirements: Ambient temperature: Room temperature; Coil excitation voltage: rated voltage; Contact load: Rated load; Unless otherwise specified, the number of iterations is 1.0 × 10⁻⁶. 5 Second-rate; Circulation rate: (10±2) times / min, closure time at least 50%.

[0022] Passing basis: No deformation or damage in appearance; Unless otherwise specified, the increase in contact resistance shall not exceed 50% of the initial specification requirement, the coil DC resistance shall meet the initial requirement, and the insulation resistance shall be not less than 1.0 x 10 9 Ω.

[0023] 3. High temperature life test According to the method 312 of GJB 360B-2009 and 4.6.21 of GJB 1042A-2002, the high temperature life test is performed on the electromagnetic relay. Unless otherwise specified, the electromagnetic relay is tested according to the following requirements: Ambient temperature: upper limit working temperature; Coil excitation voltage: rated voltage; Contact load: 100 mA, 125 V d.c.; Test duration: 1000 h.

[0024] Passing basis: No deformation or damage in appearance; Unless otherwise specified, the increase in contact resistance shall not exceed 50% of the initial specification requirement, the coil DC resistance shall meet the initial requirement, and the insulation resistance shall be not less than 1.0 x 10 9 Ω.

[0025] From the specific requirements of the above three tests, it can be seen that, in the test process, neither the mechanical life test, nor the electrical life test, nor the high temperature life test considers the actual application environment of the electromagnetic relay (such as not considering the ambient temperature in actual application, nor considering the ambient humidity in actual application, etc.), thereby leading to a certain deviation between the obtained life evaluation result and the actual result, and further leading to low accuracy of the life evaluation.

[0026] In order to improve the accuracy of the life evaluation result of the electromagnetic relay, the embodiment of the present application provides a life evaluation method of an electromagnetic relay. In the life evaluation method, first, task profile analysis is performed on the to-be-evaluated electromagnetic relay to obtain working information of the to-be-evaluated electromagnetic relay, then, according to the working information, an accelerated life test is performed on the to-be-evaluated electromagnetic relay, after a target parameter is obtained, the failure duration information of the to-be-evaluated electromagnetic relay is determined according to the target parameter, finally, according to the failure duration information, a first life corresponding to the accelerated life test of the to-be-evaluated electromagnetic relay is evaluated, and then, according to the first life, a second life corresponding to the actual work of the to-be-evaluated electromagnetic relay is evaluated.

[0027] Since the method considers the actual application environment of the electromagnetic relay to be evaluated when performing life evaluation, accuracy of the second life obtained subsequently is improved.

[0028] The life evaluation method of the electromagnetic relay provided by the embodiment of the present application is described below with reference to the accompanying drawings.

[0029] Figure 1 A flowchart of the life evaluation method of the electromagnetic relay provided by the embodiment of the present application is shown, which can be applied to an electronic device, and is described in detail as follows. S11, task profile analysis is performed on the electromagnetic relay to be evaluated to obtain working information of the electromagnetic relay to be evaluated, the working information including working environment temperature and / or working environment humidity of the electromagnetic relay to be evaluated.

[0030] The electromagnetic relay to be evaluated refers to the electromagnetic relay to be evaluated for life.

[0031] The task profile refers to a time sequence description of events and environment experienced by the electromagnetic relay to be evaluated within a specified task time.

[0032] In the embodiment of the present application, the working environment temperature refers to the environment temperature when the electromagnetic relay to be evaluated works, and the working environment humidity refers to the environment humidity when the electromagnetic relay to be evaluated works.

[0033] In the embodiment of the present application, the working information of the electromagnetic relay to be evaluated includes not only the working environment temperature and / or the working environment humidity, but also working conditions of the electromagnetic relay to be evaluated, which include rated voltage, working current, and power-on condition of the electromagnetic relay to be evaluated. In addition, the working information of the electromagnetic relay to be evaluated includes working states of the electromagnetic relay to be evaluated, which include relevant information for indicating the working states of the electromagnetic relay to be evaluated, and can also include series, parallel, and other information of the electromagnetic relay to be evaluated.

[0034] S12, an accelerated life test is performed on the electromagnetic relay to be evaluated based on the working information to obtain a target parameter, the target parameter being a parameter meeting a failure criterion condition; The accelerated life test (ALT) is a reliability evaluation method, which tests a product under a stress level higher than a normal use condition to accelerate the aging failure process of the product, and then extrapolates a life characteristic under the normal use condition by using a mathematical model.

[0035] In the embodiment of the present application, the parameter refers to a parameter related to the electromagnetic relay to be evaluated, which is predetermined, increases with an increase in test duration, and presents a degradation phenomenon.

[0036] In the embodiments of the present application, based on the working information of the electromagnetic relay to be evaluated, part of the information (such as the working environment temperature) or all of the information of the working information is adjusted to be more stringent information, and then the accelerated life test is performed according to the adjusted working information.

[0037] Optionally, the working information includes the working condition of the electromagnetic relay to be evaluated, and the accelerated life test is performed on the electromagnetic relay to be evaluated based on the working information to obtain the target parameter, including: The test environment information of the electromagnetic relay to be evaluated is determined according to the working environment temperature and / or the working environment humidity, and the accelerated life test is performed on the electromagnetic relay to be evaluated according to the test environment information and the working condition to obtain the target parameter.

[0038] In the embodiments of the present application, it is considered that the electromagnetic relay to be evaluated is applied in a switchboard, and the switchboard is composed of multiple switch compartments, and each switch compartment has the electromagnetic relay inside. The switchboard is in an air-conditioned room, and the temperature and humidity are approximately constant throughout the year. At the same time, it is considered that the damp heat stress is the main stress leading to the degradation and failure of the electromagnetic relay, as shown in Table 1, and therefore, in order to ensure that the stress damage formed by the accelerated life test is equivalent to the cumulative damage caused by the expected stress during the product life, the accelerated life test can be performed by making the temperature and / or humidity more stringent. For example, when the temperature in the air-conditioned room using the electromagnetic relay to be evaluated is 20-26℃, a higher temperature (such as 85℃) is used as the temperature in the test environment information, and a higher humidity (such as 85% relative humidity (RH)) is used as the humidity in the test environment information.

[0039] Table 1:

[0040] In the embodiments of the present application, the working condition can include the rated voltage and working current of the electromagnetic relay to be evaluated. For example, when the rated voltage of the electromagnetic relay to be evaluated is 125 Volts Direct Current (VDC), and the maximum contact current is not more than 0.1A when the contact is closed, the working condition can include: power-on voltage = 125VDC, contact current = 0.1A.

[0041] In the embodiments of the present application, the test environment information of the electromagnetic relay to be evaluated is obtained after the temperature and / or humidity of the working environment is harshened, and the electromagnetic relay to be evaluated is subjected to an accelerated life test according to the test environment information and the working condition of the electromagnetic relay to be evaluated. During the accelerated life test, the related electrical parameters of the electromagnetic relay to be evaluated and whether there is a degradation trend are monitored. If a current monitored electrical parameter has a degradation trend, such as a contact resistance, the data degradation is obvious or the failure criterion condition is met, the current monitored degradation electrical parameter is taken as the target parameter. Since the temperature and humidity of the application environment are the main factors affecting the life of the electromagnetic relay, when the accelerated life test is performed according to the test environment information determined in the above manner, the stress damage formed is equivalent to the cumulative damage caused by the expected stress in the product life period, so that when the accelerated life test is performed according to the test environment information determined in the above manner, the speed and accuracy of the obtained target parameter are improved.

[0042] In some embodiments, considering that the working states of the electromagnetic relays in the same application scenario can be different, the working state of the electromagnetic relay to be evaluated can be determined before the electromagnetic relay to be evaluated is subjected to the accelerated life test. Alternatively, the corresponding working state is divided according to the type of switching frequency of the electromagnetic relay to be evaluated in the field application. It is assumed that the type of switching frequency is: (1) long-term excitation type (long excitation state): under the normal working condition of the distribution board, the coil of the electromagnetic relay is always powered to maintain long-term excitation, and if an abnormal situation occurs to cause the normally open contact of the electromagnetic relay to be disconnected, the distribution board will issue a fault alarm; (2) frequent action type (switching state): the electromagnetic relay of this type is used to control the switching combination of the distribution board, and there are different switching frequencies, such as the highest switching frequency which can be about 10 times per day. The working state of the electromagnetic relay to be evaluated can be divided into the long excitation state and the switching state.

[0043] In the embodiments of the present application, when the working information further includes the working state of the electromagnetic relay to be evaluated, the accelerated life test of the electromagnetic relay to be evaluated is performed according to the working state, the test environment information and the working condition to obtain the target parameter. The accelerated life test of the electromagnetic relay to be evaluated is performed according to the working state, the test environment information and the working condition to obtain the target parameter.

[0044] Since the working state reflects the state of the electromagnetic relay to be evaluated, the accelerated life test in combination with the working state is beneficial to improve the accuracy of the obtained target parameter.

[0045] Alternatively, the accelerated life test of the electromagnetic relay to be evaluated is performed according to the working state, the test environment information and the working condition to obtain the target parameter. When the working state indicates that the to-be-evaluated electromagnetic relay belongs to the long excitation state, the to-be-evaluated electromagnetic relay in the test environment information is subjected to a continuous energization process according to the working condition, so as to obtain the target parameter. When the working state indicates that the to-be-evaluated electromagnetic relay belongs to the switch state, the to-be-evaluated electromagnetic relay in the test environment information is subjected to a corresponding energization and de-energization process according to the working condition, so as to obtain the target parameter.

[0046] In the embodiments of the present application, the long excitation state refers to that the coil of the to-be-evaluated electromagnetic relay is always in an energized state. Therefore, when it is analyzed that the working state of the to-be-evaluated electromagnetic relay belongs to the long excitation state, the coil of the to-be-evaluated electromagnetic relay is continuously energized. The switch state refers to that the coil of the to-be-evaluated electromagnetic relay is intermittently energized. Therefore, when it is analyzed that the working state of the to-be-evaluated electromagnetic relay belongs to the switch state, the coil of the to-be-evaluated electromagnetic relay is repeatedly energized and de-energized for a period of time. That is, the to-be-evaluated electromagnetic relay is subjected to an accelerated life test according to the working state of the to-be-evaluated electromagnetic relay, which is conducive to improving the accuracy of the obtained target parameter.

[0047] Optionally, the energization duration and the de-energization duration of the to-be-evaluated electromagnetic relay are determined according to the number of switchings of the to-be-evaluated electromagnetic relay in the working application scenario. For example, if the to-be-evaluated electromagnetic relay is switched 7 times a day in the actual working application scenario, the energization duration can be set to 2 hours and the de-energization duration can be set to 1 hour.

[0048] In the embodiments of the present application, if there are both electromagnetic relays in the long excitation state and electromagnetic relays in the switch state in the same application scenario, when the number of to-be-evaluated electromagnetic relays that need to be subjected to the accelerated life test is greater than 1, the to-be-evaluated electromagnetic relays that need to be subjected to the accelerated life test can be divided into two groups, one group being used for the accelerated life test of the electromagnetic relays in the long excitation state and the other group being used for the accelerated life test of the electromagnetic relays in the switch state. Optionally, the to-be-evaluated electromagnetic relays are grouped according to the electromagnetic relays in the long excitation state and the electromagnetic relays in the switch state in the application scenario. For example, if the number of electromagnetic relays in the long excitation state is greater than the number of electromagnetic relays in the switch state in the application scenario, when the number of to-be-evaluated electromagnetic relays is 17, 7 to-be-evaluated electromagnetic relays can be used for the accelerated life test of the electromagnetic relays in the switch state, and 10 to-be-evaluated electromagnetic relays can be used for the accelerated life test of the electromagnetic relays in the long excitation state. When the to-be-evaluated electromagnetic relays in the test environment information are subjected to the accelerated life test according to the working state and the working condition, the related information of the accelerated life test can be obtained as shown in Table 2.

[0049] Table 2:

[0050] Since the electromagnetic relays belonging to the long excitation state and the electromagnetic relays belonging to the switching state in the application scenario group the electromagnetic relays to be evaluated, the number of the electromagnetic relays to be evaluated subjected to the accelerated life test is more consistent with the application scenario, thereby facilitating the matching degree of the test results obtained after grouping with the actual situation.

[0051] Optionally, the electromagnetic relays to be evaluated can be subjected to the accelerated life test according to the connection mode of the electromagnetic relays in the application scenario. For example, if the coil control voltage of the electromagnetic relays in the application scenario is 125VDC, the electromagnetic relays to be evaluated can be subjected to parallel operation and external excitation in the test, but the controlled side of the electromagnetic relays is mostly connected in series in the switching mode in the application scenario, and then the switching side of the electromagnetic relays to be evaluated can be subjected to series operation and external excitation.

[0052] Optionally, in the embodiment of the application, the contact resistance of the electromagnetic relays to be evaluated is taken as the parameter showing the degradation phenomenon.

[0053] Optionally, the parameters showing the degradation phenomenon in the electromagnetic relays in the switching state and the electromagnetic relays in the long excitation state are determined in the following manner.

[0054] Suppose that the degradation phenomenon test in the switching state is performed on 7 samples (i.e., electromagnetic relays), and the degradation phenomenon test in the long excitation state is performed on 10 samples, the power-on voltage of the two tests = 125VDC, and the contact current = 0.1A, then the wiring circuit diagrams as shown in Figure 2 and Figure 3 are designed to build the corresponding test platform.

[0055] Figure 2 a wiring circuit diagram of an electromagnetic relay in the switching state is shown, Figure 3 a wiring circuit diagram of an electromagnetic relay in the long excitation state is shown.

[0056] According to Figure 2 and Figure 3 , the input end of the electromagnetic relay is electrically connected with the power input end, and the output end of the electromagnetic relay is connected with the load current end.

[0057] In Figure 2 , the coils of 7 electromagnetic relays are connected in parallel to 125VDC, and the coils after being powered on control the switches of the corresponding electromagnetic relays. For example, for Figure 2the leftmost to-be-evaluated electromagnetic relay K1 in the wiring circuit, when the coil of the K1 is not powered, the switch of the K1 is closed in the case that: the 07 end is connected with the 7 end, the 06 end is connected with the 6 end, the 05 end is connected with the 5 end, and the 04 end is connected with the 4 end. When the coil of the K1 is powered, the switch of the K1 is closed in the case that: the 07 end is connected with the 70 end, the 06 end is connected with the 60 end, the 05 end is connected with the 50 end, and the 04 end is connected with the 40 end. Then, the electromagnetic relay is placed in a high-temperature and high-humidity box, the temperature of the high-temperature and high-humidity box is set to a preset temperature, the humidity is set to a preset humidity, for example, in a specific test condition, the temperature is set to 85 DEG C, and the humidity is set to 85% RH. Then, intermittent power supply is performed on the electromagnetic relay according to the preset working condition, for example, power-on for 2 hours and power-off for 1 hour, and the test duration is 1000 hours.

[0058] In Figure 3 , the test condition is: 85 DEG C, 85% RH, the coil DC 125 V, and continuous power-on; each sample normally open contact is loaded with 0.1 A current, and the test duration is 1000 hours. The coils of 10 electromagnetic relays are connected in parallel to 125 V DC, and the specific implementation process is similar to Figure 2 , which will not be described here again. Since Figure 3 is a degradation phenomenon test on the electromagnetic relay in a long excitation state, long-time power supply is performed on the electromagnetic relay according to the preset working condition.

[0059] When the electromagnetic relay is connected in parallel, the coil voltage is controlled, and the current load is applied to the contact, the coil total current of the electromagnetic relay (the coil total current is obtained by dividing a coil current by the number of coils), the coil voltage (in Figure 2 , the coil voltage is 125 V DC), the contact current (in Figure 2 , the contact current is 0.1 A), the contact total voltage (which is the product of the contact resistance and the contact current), and the parameters can be tested by the electromagnetic relay automatic parameter tester. The tested parameters include the coil resistance, the contact resistance, the attraction / release voltage, the attraction / release time, and the like. The purpose of the parameter test is to confirm the functional performance and the related parameters of the electromagnetic relay, so as to identify the degradation information of the electromagnetic relay. Considering the actual situation that the storage space is limited, a time point sequence can be set in advance, and the parameter test is performed according to the time points of the time point sequence. Each time point of the time point sequence represents the duration of the degradation phenomenon test on the electromagnetic relay.

[0060] Optionally, considering that the probability of electromagnetic relay degradation is low in the early stage and high in the later stage, an intermediate time point can be determined based on the total test duration. Then, a first number of time points can be determined to the left of the intermediate time point, and a second number of time points can be determined to the right of the intermediate time point, with the first number being less than the second number. This reduces the number of time points that need to be detected in the early stage of the test, thereby reducing the amount of data to be analyzed. At the same time, increasing the number of time points that need to be detected in the later stage of the test can also increase the amount of data that can be analyzed, thereby improving the accuracy of the determined range of time points when electromagnetic relay degradation occurs.

[0061] For example, when the test duration is 1000 hours (h), 500h can be set as a time point. Then, a time point (such as 168h) can be set to the left of 500h, and two time points (750h and 1000h) can be set to the right of 500h. These time points form a time point sequence: 168h, 500h, 750h, 1000h.

[0062] When the required time point is reached at the preset time point, record the values ​​of the electromagnetic relay's coil voltage, contact current, total contact voltage, contact resistance, etc.

[0063] The graph showing the change in total contact voltage obtained from a degradation test on an electromagnetic relay in a switching state, based on the recorded values, is shown below. Figure 4 As shown in the figure, the change in contact resistance of the normally open contact is as follows: Figure 5 As shown in the figure, the change in contact resistance of the normally closed contact is as follows: Figure 6 As shown.

[0064] according to Figure 4 It can be seen that when the electromagnetic relay under evaluation with 7 switching states is subjected to degradation test, the total contact voltage increases with the increase of test time. Since the output current is fixed, the general trend of the total contact voltage is that the contact resistance increases with the increase of test time, which shows a degradation phenomenon.

[0065] according to Figure 5 It can be seen that the contact resistance of the normally open contacts of each electromagnetic relay increases with the increase of test duration, showing a degradation phenomenon.

[0066] according to Figure 6 It can be seen that the contact resistance of the normally closed contact of an electromagnetic relay increases with the increase of test duration, exhibiting a degradation phenomenon.

[0067] The following graph shows the change in contact voltage obtained from a degradation test of an electromagnetic relay under prolonged excitation: Figure 7 As shown in the figure, the change in contact resistance of the normally open contact is as follows:Figure 8 As shown in the figure, the change in contact resistance of the normally closed contact is as follows: Figure 9 As shown.

[0068] according to Figure 7 It can be seen that the total contact voltage of the 10 electromagnetic relays under long excitation increases with the increase of test time. Under the condition of fixed output current, the overall trend of the total contact voltage is that the contact resistance increases with the increase of test time, showing a degradation phenomenon.

[0069] according to Figure 8 and Figure 9 It can be seen that the contact resistance of the electromagnetic relay increases with the increase of the test duration, showing a degradation phenomenon.

[0070] The analysis results of the two sets of experimental data above both point to a degrading trend in the contact resistance of the electromagnetic relay. The contact points of the test sample were photographed; assuming the obtained images are as follows... Figure 10 As shown. For Figure 10 The results of energy spectrum analysis are shown in Table 3 below.

[0071] Table 3:

[0072] Table 3 shows that under conditions of 85%RH and 85 degrees Celsius, organic matter containing C, O and P elements is released inside the electromagnetic relay. This organic matter contaminates the contact point surface, thereby increasing the contact resistance of the electromagnetic relay.

[0073] Degradation verification was conducted based on the preliminary conclusions of the degradation analysis. The contact resistance of the electromagnetic relay was retested after wiping the contact surface with an alcohol swab. The test results are shown in Table 4 below.

[0074] Table 4:

[0075] In Table 4, "NC1~NC4" represent different contact surfaces. As shown in Table 4, after cleaning the surface contaminants, the corresponding contact resistance decreases significantly. Therefore, it can be determined that the contaminant is the main factor causing the increase in contact resistance. That is, the contact resistance reflects the degradation trend of the electromagnetic relay from the contact system, and it can be used for electromagnetic relay degradation trend analysis and lifespan prediction.

[0076] In this embodiment, if contact resistance is used as a parameter to evaluate the degradation of an electromagnetic relay, then during accelerated life testing of the electromagnetic relay to be evaluated, the contact resistance of the electromagnetic relay to be evaluated will be monitored, and the contact resistance that meets the failure criterion will be recorded to obtain the target parameter corresponding to the electromagnetic relay to be evaluated. The failure criterion can be: the contact resistance is greater than a preset threshold. This preset threshold can be set based on the contact resistance of the electromagnetic relay after a certain number of years of use. For example, assuming the contact resistance of a non-new sample is between 10 and 20 mΩ, while the contact resistance of a sample used for a certain number of years is above 50 mΩ, considering practical applications and retaining a certain margin, a contact resistance of 200 mΩ can be considered as the failure criterion for the electromagnetic relay, i.e., as the aforementioned preset threshold. That is, if the currently monitored contact resistance is greater than 200 mΩ, the currently monitored contact resistance can be considered as the target parameter.

[0077] It should be noted that accelerated life testing of the electromagnetic relay to be evaluated is similar to degradation testing of the sample. The difference is that accelerated life testing can focus only on the contact resistance of the electromagnetic relay to be evaluated, while degradation testing requires analysis of multiple types of values ​​to determine which type of value can reflect the degradation phenomenon of the electromagnetic relay.

[0078] S13, Based on the above target parameters, determine the failure duration information of the electromagnetic relay to be evaluated.

[0079] In this embodiment of the application, when the target parameter is obtained, the failure duration information of the electromagnetic relay to be evaluated is determined based on the test duration corresponding to the obtained target parameter.

[0080] In this embodiment of the application, when the contact resistance is used as a parameter for evaluating the degradation phenomenon of an electromagnetic relay, the parameter that satisfies the failure criterion (i.e., the target parameter) can be obtained in the following way: When a time point in the preset time sequence is reached, the parameters obtained by the electromagnetic relay to be evaluated during the accelerated life test are recorded; if the recorded parameters meet the failure criterion conditions, the recorded parameters are used as the target parameters.

[0081] Correspondingly, the failure duration information of the electromagnetic relay to be evaluated, determined based on the aforementioned target parameters, includes: Based on the time points corresponding to the above target parameters and the previous time point, the failure duration information of the electromagnetic relay to be evaluated is determined.

[0082] Assuming contact resistance is used as a parameter indicating degradation in the electromagnetic relay under evaluation, contact resistance is monitored at time points: 168h, 500h, 750h, and 1000h. If, at time point 168h, the contact resistance of the electromagnetic relay under evaluation is found to be within the preset threshold, but at the next adjacent time point 500h, the monitored contact resistance exceeds the preset threshold, then the interval [168h~500h] can be used as the failure duration information of the electromagnetic relay under evaluation.

[0083] Since the target parameter refers to the parameter that meets the failure criterion, when the parameter is monitored according to the time points of the time series, once it is determined that the currently monitored parameter meets the failure criterion at a certain time point, the currently monitored parameter will be obtained as the target parameter. Therefore, after obtaining the target parameter, the corresponding time point is determined based on the target parameter, and the previous time point in the time series is determined. Based on the two determined time points, the failure duration information of the electromagnetic relay to be evaluated is determined, which helps to improve the accuracy of the determined failure duration information.

[0084] Of course, in practice, the failure duration information mentioned above can also be determined using other methods. For example, after obtaining the target parameter, if it is determined that the target parameter is much larger than a preset threshold, then after determining the time point corresponding to the target parameter, the value corresponding to that time point can be reduced based on experience. Then, the failure duration information of the electromagnetic relay to be evaluated can be determined based on the previous time point in the time series corresponding to the time point corresponding to the target parameter. This process helps to narrow down the time period range corresponding to the failure duration information, reducing the amount of data that needs to be analyzed subsequently.

[0085] S14. Evaluate the first life of the electromagnetic relay to be evaluated during the accelerated life test based on the above failure duration information.

[0086] In this embodiment of the application, the first life of the electromagnetic relay to be evaluated during accelerated life testing can be estimated based on any one of the following models: Weibull distribution model, normal distribution model, logistic distribution model, and log-normal distribution model.

[0087] Optionally, considering that different models are typically applicable to different data, multiple distribution models can be first performed on the determined failure duration information, and the goodness of fit of the corresponding models can be determined. Then, based on the goodness of fit, a model matching the failure duration information can be selected to predict the aforementioned first lifetime. That is, the aforementioned assessment of the first lifetime of the electromagnetic relay to be evaluated during accelerated life testing based on the aforementioned failure duration information includes: Model the failure duration information using at least two distributions to obtain the goodness of fit of the corresponding models; select the model with the highest goodness of fit from the goodness of fit of each model, and evaluate the first life of the electromagnetic relay to be evaluated during accelerated life testing based on the model corresponding to the highest goodness of fit and the failure duration information.

[0088] The goodness of fit mentioned above reflects the degree of matching between the model's predicted values ​​and the actual observed values.

[0089] In this embodiment of the application, it is assumed that the failure duration information corresponding to the electromagnetic relay to be evaluated under the long excitation state is shown in Table 5 below.

[0090] Table 5:

[0091] In Table 5, the serial number represents the corresponding contact point. The data type "Failed" indicates that the contact resistance of the corresponding serial number meets the failure criterion condition within the corresponding start interval to end interval, while the data type "Censored" indicates that the contact resistance of the corresponding serial number does not meet the failure criterion condition within the corresponding start interval to end interval.

[0092] For example, the contact point corresponding to serial number "1" has a data type of "Failed". This means that the contact resistance of this contact point did not meet the failure criterion at 168h, but the contact resistance monitored at 500h met the failure criterion. Since the contact resistance is monitored according to time series points, the determined failure duration information includes [168h, 500h]. However, the contact point corresponding to serial number "26" has a data type of "Censored", and the contact resistance monitored at time point 1200h did not meet the failure criterion. Therefore, the failure duration information for serial number "26" cannot be determined.

[0093] When using the failure duration information in Table 5 to model the Weibull distribution, normal distribution, logistic distribution, and log-normal distribution, the corrected Akaike Information Criterion (AICc) and Bayesian Information Criterion (BIC) for the corresponding models are calculated, and the values ​​are shown in Table 6 below.

[0094] Table 6:

[0095] As shown in Table 6, the distribution models constructed for failure duration information under long-excitation conditions, when fitted using the Weibull distribution model, exhibit smaller AICc and BIC values. Smaller AICc and BIC values ​​indicate a higher goodness of fit, suggesting that the Weibull distribution is more accurate for modeling failure duration information under long-excitation conditions. Therefore, the Weibull distribution should be used to predict the first lifetime for failure duration under long-excitation conditions.

[0096] In this embodiment, the estimated first lifetime is selected as a lifetime with a reliability greater than a preset reliability threshold, which is selected according to actual needs. Optionally, the preset reliability threshold can be selected as 90%. The following explanation uses 90% as an example.

[0097] Assuming the Weibull distribution is used to predict the first lifetime of the electromagnetic relays in Table 5 above, the estimated information is shown in Table 7, and the probability distribution of electromagnetic relay lifetime failure under long-excitation conditions is shown in the figure below. Figure 11 As shown in the figure, the obtained lifetime value with 90% reliability is plotted as follows. Figure 12 As shown.

[0098] Table 7:

[0099] From Table 7 and Figure 11 and Figure 12 It can be seen that the first lifetime with 90% reliability under long excitation is 497 hours.

[0100] A similar estimation method can be used to estimate the first lifetime of the electromagnetic relay under evaluation in the switching state. Specifically, assume that the failure duration information corresponding to the electromagnetic relay under evaluation in the switching state is shown in Table 8 below.

[0101] Table 8:

[0102] When using the failure duration information in Table 8 to model the Weibull distribution, normal distribution, logistic distribution, and lognormal distribution, respectively, the AICc and BIC of the corresponding models are calculated, and the values ​​are shown in Table 9 below.

[0103] Table 9:

[0104] As shown in Table 9, the distribution model constructed for the failure duration information of the switching state, when fitted using the log-normal distribution model, exhibits smaller AICc and BIC values. Smaller AICc and BIC values ​​indicate a higher goodness of fit, thus demonstrating that modeling the failure duration information of the switching state using the log-normal distribution is more accurate. Therefore, the log-normal distribution should be used to predict the first lifetime of the switching state failure duration.

[0105] Assuming a log-normal distribution is used to estimate the first lifetime of Table 8 above, the estimated information is shown in Table 10, and the resulting probability distribution of electromagnetic relay lifetime failure in switching states is shown in the figure below. Figure 13 As shown in the figure, the obtained lifetime value with 90% reliability is plotted as follows. Figure 14 As shown.

[0106] Table 10:

[0107] From Table 10 and Figure 13 and Figure 14 It can be seen that the first lifetime with 90% reliability in the switching state is 546 hours.

[0108] S15, based on the first life assessment described above, evaluate the second life of the electromagnetic relay to be evaluated in actual operation.

[0109] In this embodiment of the application, the first lifetime is the estimated lifetime obtained after the working environment temperature and / or working environment humidity of the electromagnetic relay to be evaluated are degraded. Therefore, the value of the first lifetime can be increased and the increased first lifetime can be used as the second lifetime.

[0110] In this embodiment, before conducting accelerated life testing, a task profile analysis is performed on the electromagnetic relay to be evaluated to obtain its operating information. Then, the accelerated life test is conducted based on this operating information. Since the operating information includes the operating ambient temperature and / or humidity of the electromagnetic relay, the accelerated life test also considers these factors. This makes the target parameters obtained from the accelerated life test more closely match the actual operating environment of the electromagnetic relay, thereby improving the accuracy of the obtained target parameters and the accuracy of the failure duration information determined based on these target parameters. Furthermore, since these target parameters satisfy the failure criterion conditions, subsequent evaluations of the first lifespan of the electromagnetic relay during the accelerated life test and the second lifespan of the electromagnetic relay in actual operation based on this failure duration information also improve the accuracy of the obtained first and second lifespans.

[0111] In this embodiment, the value of the first lifetime can be increased using addition or multiplication operations. For example, the product of the first lifetime and a preset acceleration factor can be used as the second lifetime. In this case, evaluating the second lifetime of the electromagnetic relay under evaluation based on the first lifetime in actual operation includes: Based on the preset acceleration factor and the aforementioned first lifespan, the second lifespan of the electromagnetic relay to be evaluated in actual operation is assessed.

[0112] The acceleration factor mentioned above is a value greater than 1. It can be set empirically or determined based on information such as the test temperature used in the accelerated life test and the actual operating temperature of the electromagnetic relay being evaluated.

[0113] Optionally, the acceleration factor described above can be calculated in the following manner.

[0114] Obtain the test humidity and test temperature for accelerated life testing, and obtain the actual humidity and actual temperature corresponding to the actual operation of the electromagnetic relay to be evaluated; The preset acceleration factor is calculated based on the above-mentioned test humidity, test temperature, actual humidity, and actual temperature.

[0115] In this embodiment, considering that the sensitive stresses affecting sample degradation include charged action, high temperature, and damp heat, the corresponding Hallberg-Peck model for charged damp heat is expressed as follows: .

[0116] In the above formula, It can be the operating time before failure, or other measures of lifespan; It is a constant; Relative humidity, expressed as a percentage, with 100%RH representing saturated humidity; = Peck's relative humidity index, typically 3 for electronic devices; is the base of the natural logarithm; To activate the energy, based on engineering experience in evaluating the lifespan of electromagnetic relays, the following can be taken: =0.65eV; Boltzmann's constant is 8.62 × 10⁻⁶. -5 eV / K; Temperature (Kelvin).

[0117] The above Expressed as the acceleration factor (AF) of high temperature and high humidity relative to normal temperature and humidity:

[0118] in, For testing humidity, For actual humidity, To activate energy; For actual operating temperature, The temperatures mentioned above are all in Kelvin. is the Boltzmann constant.

[0119] Considering that the electromagnetic relay to be evaluated will be used in a temperature and humidity controlled environment, therefore, it can be set to... =25℃ (298K) =45%, set according to the test temperature and humidity conditions, substitute into The formula yields the following results: =468.88.

[0120] Assuming the first lifetime for the electromagnetic relay under long-excitation state with 90% reliability is 497 hours, the corresponding second lifetime is 497 * 468.88 = 26.6 years.

[0121] Assuming the first lifetime of the electromagnetic relay under evaluation with 90% reliability in the switching state is 546 hours, the corresponding second lifetime is 546 * 468.88 = 29.2 years.

[0122] In this embodiment, since the calculation of the acceleration factor considers not only the influence of temperature but also the influence of humidity, and the working environment of the electromagnetic relay to be evaluated is a constant temperature and humidity environment, the acceleration factor calculated in the above manner is more accurate, thereby improving the accuracy of the second lifetime calculated based on the acceleration factor.

[0123] It should be understood that the sequence number of each step in the above embodiments does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0124] Corresponding to the life assessment method for electromagnetic relays described in the above embodiments, Figure 15 This diagram illustrates a structural block diagram of an electromagnetic relay life assessment device provided in an embodiment of this application. For ease of explanation, only the parts relevant to the embodiment of this application are shown.

[0125] Reference Figure 15 The electromagnetic relay life assessment device 15 is applied to electronic equipment and includes: a working information acquisition module 151, a target parameter acquisition module 152, a failure duration information determination module 153, a first life determination module 154, and a second life determination module 155. Wherein: The working information acquisition module 151 is used to perform task profile analysis on the electromagnetic relay to be evaluated and obtain the working information of the electromagnetic relay to be evaluated, including the working environment temperature and / or working environment humidity of the electromagnetic relay to be evaluated.

[0126] The target parameter acquisition module 152 is used to conduct accelerated life tests on the electromagnetic relay to be evaluated based on the above working information in order to obtain target parameters, which are parameters that meet the failure criterion conditions.

[0127] The failure duration information determination module 153 is used to determine the failure duration information of the electromagnetic relay to be evaluated based on the above target parameters.

[0128] The first life determination module 154 is used to evaluate the first life of the electromagnetic relay to be evaluated during accelerated life testing based on the failure duration information.

[0129] The second life determination module 155 is used to assess the second life of the electromagnetic relay to be evaluated in actual operation based on the first life.

[0130] In this embodiment, before conducting accelerated life testing, a task profile analysis is performed on the electromagnetic relay to be evaluated to obtain its operating information. Then, the accelerated life test is conducted based on this operating information. Since the operating information includes the operating ambient temperature and / or humidity of the electromagnetic relay, the accelerated life test also considers these factors. This makes the target parameters obtained from the accelerated life test more closely match the actual operating environment of the electromagnetic relay, thereby improving the accuracy of the obtained target parameters and the accuracy of the failure duration information determined based on these target parameters. Furthermore, since these target parameters satisfy the failure criterion conditions, subsequent evaluations of the first lifespan of the electromagnetic relay during the accelerated life test and the second lifespan of the electromagnetic relay in actual operation based on this failure duration information also improve the accuracy of the obtained first and second lifespans.

[0131] Optionally, the above-mentioned working information includes the operating conditions of the electromagnetic relay to be evaluated, and the target parameter acquisition module 152 includes: The test environment information determination unit is used to determine the test environment information of the electromagnetic relay to be evaluated based on the above-mentioned working environment temperature and / or the above-mentioned working environment humidity. The accelerated life test unit is used to conduct accelerated life tests on the electromagnetic relay to be evaluated based on the above-mentioned test environment information and operating conditions in order to obtain the above-mentioned target parameters.

[0132] Optionally, the above-mentioned working information also includes the operating status of the electromagnetic relay to be evaluated, and the accelerated life test unit is specifically used for: Based on the above operating status, the above test environment information, and the above operating conditions, an accelerated life test was conducted on the electromagnetic relay to be evaluated to obtain the above target parameters.

[0133] Optionally, the above-mentioned accelerated life test is conducted on the electromagnetic relay to be evaluated based on the above-mentioned operating state, the above-mentioned test environment information, and the above-mentioned operating conditions to obtain the above-mentioned target parameters, including: When the above working state indicates that the electromagnetic relay to be evaluated is in a long excitation state, the electromagnetic relay to be evaluated under the above test environment information is continuously energized according to the above working conditions to obtain the above target parameters. When the above-mentioned working state indicates that the electromagnetic relay to be evaluated is in a switching state, the electromagnetic relay to be evaluated under the above-mentioned test environment information is energized and de-energized according to the above-mentioned working conditions in order to obtain the above-mentioned target parameters.

[0134] Optionally, obtaining the target parameters mentioned above includes: When the time point in the preset time point sequence is reached, record the above parameters obtained by the electromagnetic relay to be evaluated during the accelerated life test. If the recorded parameters meet the failure criterion conditions, then the recorded parameters will be used as the target parameters. Correspondingly, the aforementioned failure duration information determination module 153 is specifically used for: Based on the time points corresponding to the above target parameters and the previous time point, the failure duration information of the electromagnetic relay to be evaluated is determined.

[0135] Optionally, the first lifetime determination module 154 mentioned above includes: The goodness-of-fit determination unit is used to model at least two distributions of the above failure duration information to obtain the goodness-of-fit of the corresponding model. The first life assessment unit is used to select the highest goodness of fit from the goodness of fit of each model, and to assess the first life of the electromagnetic relay to be evaluated during accelerated life testing based on the model corresponding to the highest goodness of fit and the failure duration information.

[0136] In some embodiments, the second lifetime determination module 155 is specifically used for: Based on the preset acceleration factor and the aforementioned first lifespan, the second lifespan of the electromagnetic relay to be evaluated in actual operation is assessed.

[0137] Optionally, the electromagnetic relay life assessment device 15 provided in this application embodiment further includes: The temperature and humidity information acquisition module is used to acquire the test humidity and test temperature of the accelerated life test before evaluating the second life corresponding to the actual operation of the electromagnetic relay under evaluation based on the preset acceleration factor and the first life, and to acquire the actual humidity and actual temperature corresponding to the actual operation of the electromagnetic relay under evaluation. The acceleration factor determination module is used to calculate the preset acceleration factor based on the above-mentioned test humidity, test temperature, actual humidity, and actual temperature.

[0138] It should be noted that the information interaction and execution process between the above-mentioned devices / units are based on the same concept as the method embodiments of this application. For details on their specific functions and technical effects, please refer to the method embodiments section, and they will not be repeated here.

[0139] Figure 16 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application.Figure 16 As shown, the electronic device 16 of this embodiment includes: at least one processor 160 ( Figure 16 The diagram shows only one processor, a memory 161, and a computer program 162 stored in the memory 161 and executable on the at least one processor 160, wherein the processor 160 executes the computer program 162 to implement the steps in any of the above method embodiments.

[0140] The electronic device 16 may be a desktop computer, laptop, handheld computer, or cloud server, etc. This electronic device may include, but is not limited to, a processor 160 and a memory 161. Those skilled in the art will understand that... Figure 16 This is merely an example of electronic device 16 and does not constitute a limitation on electronic device 16. It may include more or fewer components than shown, or combine certain components, or different components, such as input / output devices, network access devices, etc.

[0141] The processor 160 may be a Central Processing Unit (CPU), or it may be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0142] In some embodiments, the memory 161 may be an internal storage unit of the electronic device 16, such as a hard disk or memory of the electronic device 16. In other embodiments, the memory 161 may be an external storage device of the electronic device 16, such as a plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, etc., equipped on the electronic device 16. Furthermore, the memory 161 may include both internal and external storage units of the electronic device 16. The memory 161 is used to store the operating system, applications, bootloader, data, and other programs, such as the program code of the computer program. The memory 161 can also be used to temporarily store data that has been output or will be output.

[0143] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the above-described division of functional units and modules is merely an example. In practical applications, the above functions can be assigned to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiments can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit. Furthermore, the specific names of the functional units and modules are only for easy differentiation and are not intended to limit the scope of protection of this application. The specific working process of the units and modules in the above system can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0144] This application also provides a network device, which includes: at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, wherein the processor executes the computer program to implement the steps in any of the above method embodiments.

[0145] This application also provides a computer-readable storage medium storing a computer program that, when executed by a processor, can implement the steps in the above-described method embodiments.

[0146] This application provides a computer program product that, when run on an electronic device, enables the electronic device to implement the steps described in the various method embodiments above.

[0147] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the methods of the above embodiments of this application can be implemented by a computer program instructing related hardware. The computer program can be stored in a computer-readable storage medium, and when executed by a processor, it can implement the steps of the various method embodiments described above. The computer program includes computer program code, which can be in the form of source code, object code, executable files, or certain intermediate forms. The computer-readable medium can include at least: any entity or device capable of carrying computer program code to a photographic device / electronic device, a recording medium, a computer memory, a read-only memory (ROM), a random access memory (RAM), an electrical carrier signal, a telecommunication signal, and a software distribution medium. Examples include USB flash drives, portable hard drives, magnetic disks, or optical disks. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electrical carrier signals or telecommunication signals.

[0148] In the above embodiments, the descriptions of each embodiment have different focuses. For parts that are not described in detail or recorded in a certain embodiment, please refer to the relevant descriptions of other embodiments.

[0149] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0150] In the embodiments provided in this application, it should be understood that the disclosed apparatus / network devices and methods can be implemented in other ways. For example, the apparatus / network device embodiments described above are merely illustrative. For instance, the division of modules or units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0151] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

Claims

1. A method for evaluating the lifespan of an electromagnetic relay, characterized in that, include: A task profile analysis is performed on the electromagnetic relay to be evaluated to obtain the operating information of the electromagnetic relay to be evaluated, including the operating ambient temperature and / or operating ambient humidity of the electromagnetic relay to be evaluated. Based on the working information, an accelerated life test is performed on the electromagnetic relay to be evaluated to obtain target parameters, which are parameters that meet the failure criterion conditions. The failure duration information of the electromagnetic relay to be evaluated is determined based on the target parameters; The first life of the electromagnetic relay under evaluation during accelerated life testing is assessed based on the failure duration information. The second life of the electromagnetic relay to be evaluated is determined based on the first life assessment, corresponding to its actual working life.

2. The life assessment method for electromagnetic relays as described in claim 1, characterized in that, The operating information includes the operating conditions of the electromagnetic relay to be evaluated. The accelerated life test of the electromagnetic relay to be evaluated based on the operating information to obtain target parameters includes: The test environment information of the electromagnetic relay to be evaluated is determined based on the ambient temperature and / or ambient humidity. Accelerated life testing was conducted on the electromagnetic relay to be evaluated based on the test environment information and the operating conditions to obtain the target parameters.

3. The life assessment method for electromagnetic relays as described in claim 2, characterized in that, The working information also includes the operating status of the electromagnetic relay to be evaluated. The accelerated life test of the electromagnetic relay to be evaluated based on the test environment information and the operating conditions to obtain the target parameters includes: Accelerated life testing is conducted on the electromagnetic relay to be evaluated based on the operating status, the test environment information, and the operating conditions to obtain the target parameters.

4. The life assessment method for electromagnetic relays as described in claim 1, characterized in that, The accelerated life test of the electromagnetic relay to be evaluated based on the operating state, the test environment information, and the operating conditions to obtain the target parameters includes: When the working state indicates that the electromagnetic relay to be evaluated is in a long-excitation state, the electromagnetic relay to be evaluated under the test environment information is continuously energized according to the working conditions to obtain the target parameters. When the operating status indicates that the electromagnetic relay to be evaluated is in a switching state, the electromagnetic relay to be evaluated under the test environment information is energized and de-energized according to the operating conditions to obtain the target parameters.

5. The life assessment method for an electromagnetic relay as described in any one of claims 1 to 4, characterized in that, The process of obtaining the target parameter includes: When a time point in the preset time sequence is reached, the parameters obtained by the electromagnetic relay to be evaluated during the accelerated life test are recorded. If the recorded parameters meet the failure criterion conditions, then the recorded parameters will be used as the target parameters; The process of determining the failure duration information of the electromagnetic relay to be evaluated based on the target parameters includes: The failure duration information of the electromagnetic relay to be evaluated is determined based on the time point corresponding to the recorded target parameter and the previous time point corresponding to the recorded target parameter.

6. The life assessment method for an electromagnetic relay as described in any one of claims 1 to 4, characterized in that, The step of evaluating the first lifetime of the electromagnetic relay under evaluation during accelerated life testing based on the failure duration information includes: The failure duration information is modeled using at least two distributions to obtain the goodness of fit of the corresponding models; The model with the highest goodness of fit is selected from the models, and the first life of the electromagnetic relay to be evaluated is assessed based on the model corresponding to the highest goodness of fit and the failure duration information.

7. The life assessment method for an electromagnetic relay as described in any one of claims 1 to 4, characterized in that, The step of evaluating the second life of the electromagnetic relay under evaluation based on the first life includes: Based on a preset acceleration factor and the first lifetime, the second lifetime of the electromagnetic relay under evaluation is assessed in actual operation.

8. The life assessment method for electromagnetic relays as described in claim 7, characterized in that, Before evaluating the second lifespan of the electromagnetic relay under evaluation based on a preset acceleration factor and the first lifespan, the method further includes: The test humidity and test temperature of the accelerated life test are obtained, as well as the actual humidity and actual temperature of the electromagnetic relay to be evaluated during actual operation. The preset acceleration factor is calculated based on the test humidity, the test temperature, the actual humidity, and the actual temperature.

9. A life assessment device for an electromagnetic relay, characterized in that, include: The working information acquisition module is used to perform task profile analysis on the electromagnetic relay to be evaluated and obtain the working information of the electromagnetic relay to be evaluated, including the working environment temperature and / or working environment humidity of the electromagnetic relay to be evaluated. The target parameter acquisition module is used to perform accelerated life testing on the electromagnetic relay to be evaluated based on the working information in order to obtain target parameters, wherein the target parameters are parameters that meet the failure criterion conditions. The failure duration information determination module is used to determine the failure duration information of the electromagnetic relay to be evaluated based on the target parameters. The first life determination module is used to evaluate the first life of the electromagnetic relay to be evaluated during accelerated life testing based on the failure duration information. The second life determination module is used to assess the second life of the electromagnetic relay to be evaluated in actual operation based on the first life.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the method as described in any one of claims 1 to 8.

11. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it implements the method as described in any one of claims 1 to 8.

12. A computer program product, characterized in that, Includes a computer program, which, when run, causes the method as described in any one of claims 1 to 8 to be performed.

Images