Beam measurement and model performance evaluation method, first device, second device, communication apparatus, communication system, storage medium, and program product

Abstract

The invention relates to a beam measurement and model performance evaluation method, first equipment, second equipment, a communication device, a communication system, a storage medium and a program product, a model is arranged in the first equipment, and the first equipment obtains a prediction result of a second beam set through the model according to a first measurement result of a first beam set; measuring the second beam set to obtain a second measurement result; wherein the prediction result and the second measurement result are used for determining the prediction performance of the model. In the embodiment of the invention, the first equipment can accurately and quickly monitor the prediction performance of the model according to the prediction result and the second measurement result, so that the beam can be accurately predicted through the model meeting the performance requirement, and the situation that the first equipment needs to measure the beam or the beam set of the second equipment is avoided; therefore, resources of the first equipment are saved.

Description

Beam measurement and model performance evaluation method, first device, second device, communication apparatus, communication system, storage medium and program product TECHNICAL FIELD

[0001] The present disclosure relates to the technical field of communication, and in particular, to a beam measurement and model performance evaluation method, a first device, a second device, a communication apparatus, a communication system, a storage medium and a program product. BACKGROUND

[0002] The second device and the first device can communicate based on beams. In the communication process, to ensure the quality of communication, the first device can need to consume a large amount of resources to measure the measurement result of each beam or a beam set in the second device. For example, the measurement result can be, but is not limited to, a reference signal received power (RSRP).

[0003] SUMMARY

[0004] Embodiments of the present disclosure provide a beam measurement and model performance evaluation method, a first device, a second device, a communication apparatus, a communication system, a storage medium and a program product, which are used to solve the technical problem that the first device needs to measure beams or beam sets in the communication process, resulting in a large amount of resources consumed by the first device.

[0005] According to a first aspect of embodiments of the present disclosure, a beam measurement and model performance evaluation method is provided, which is executed by a first device, the first device being provided with a model, and the method comprising:

[0006] obtaining, according to a first measurement result of a first beam set, a prediction result of a second beam set by the model;

[0007] measuring the second beam set to obtain a second measurement result; and

[0008] In embodiments of the present disclosure, the first device can obtain the prediction result of the second beam set by the model and the second measurement result of the second beam set by measurement, so as to accurately and quickly monitor the prediction performance of the model according to the prediction result and the second measurement result, thereby accurately predicting the beams by the model meeting the performance requirement, and performing switching of the model when the performance of the model does not meet the requirement, so as to avoid the first device needing to measure the beams or beam sets of the second device, thereby saving the resources of the first device.

[0009] According to a second aspect of embodiments of the present disclosure, a beam measurement and model performance evaluation method is provided, which is executed by a second device, and the method comprising:

[0010] obtaining a prediction result, the prediction result being a result of prediction of the second beam set by the first device through a model in the first device according to a first measurement result of the first beam set;

[0011] obtaining a second measurement result, the second measurement result being obtained by the first device through measurement on the second beam set;

[0012] determining a prediction performance of the model according to the prediction result and the second measurement result.

[0013] In the embodiments of the present disclosure, the second device can obtain the prediction result and the second measurement result, and then accurately and quickly determine the prediction performance of the model based on the prediction result and the second measurement result, so that the model meeting the performance requirement can be used to accurately predict the beam, thereby avoiding the first device from measuring each beam or each beam set of the second device and saving the resources of the first device.

[0014] According to a third aspect of the embodiments of the present disclosure, a first device is provided, the first device being provided with a model, and comprising:

[0015] a processing module, configured to obtain a prediction result of a second beam set through the model according to a first measurement result of a first beam set;

[0016] The processing module is further configured to obtain a second measurement result through measurement on the second beam set; and the prediction result and the second measurement result are used to determine a prediction performance of the model.

[0017] According to a fourth aspect of the embodiments of the present disclosure, a second device is provided, comprising:

[0018] a transceiver, configured to obtain a prediction result, the prediction result being a result of prediction of the second beam set by the first device through a model in the first device according to a first measurement result of the first beam set;

[0019] The transceiver is further configured to obtain a second measurement result, the second measurement result being obtained by the first device through measurement on the second beam set;

[0020] a processing module, configured to determine a prediction performance of the model according to the prediction result and the second measurement result.

[0021] According to a fifth aspect of the embodiments of the present disclosure, a communication apparatus is provided, comprising: one or more processors; and wherein the processor is configured to execute the beam measurement and model performance evaluation method of the first aspect.

[0022] According to a sixth aspect of the embodiments of the present disclosure, a communication apparatus is provided, comprising: one or more processors; and wherein the processor is configured to execute the beam measurement and model performance evaluation method of the second aspect.

[0023] According to a seventh aspect of the embodiments of the present disclosure, a communication system is provided, including a first device and a second device, wherein the first device is configured to implement the beam measurement and model performance evaluation method of the first aspect, and the second device is configured to implement the beam measurement and model performance evaluation method of the second aspect.

[0024] According to an eighth aspect of the embodiments of the present disclosure, a storage medium is provided, which stores instructions, when the instructions are run on a communication device, causing the communication device to perform the beam measurement and model performance evaluation method of the first aspect.

[0025] According to a ninth aspect of the embodiments of the present disclosure, a storage medium is provided, which stores instructions, when the instructions are run on a communication device, causing the communication device to perform the beam measurement and model performance evaluation method of the second aspect.

[0026] According to a tenth aspect of the embodiments of the present disclosure, a program product is provided, including a program and / or instructions, when the program and / or instructions are executed by a communication device, causing the communication device to perform the beam measurement and model performance evaluation method of the first aspect.

[0027] According to an eleventh aspect of the embodiments of the present disclosure, a program product is provided, including a program and / or instructions, when the program and / or instructions are executed by a communication device, causing the communication device to perform the beam measurement and model performance evaluation method of the second aspect. BRIEF DESCRIPTION OF DRAWINGS

[0028] In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure, the following describes the drawings required for the embodiments, and the following drawings are only some embodiments of the present disclosure, and do not specifically limit the protection scope of the present disclosure.

[0029] FIG. 1 is an architecture schematic diagram of a communication system according to an embodiment of the present disclosure.

[0030] FIG. 2a is an exemplary interaction schematic diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure.

[0031] FIG. 2b is an exemplary schematic diagram of an output of a model and an output according to an embodiment of the present disclosure.

[0032] FIG. 2c is an exemplary schematic diagram of an output of a model and an output according to an embodiment of the present disclosure.

[0033] FIG. 2d is an exemplary interaction schematic diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure.

[0034] FIG. 2e is an example interaction diagram illustrating a method of beam measurement and model performance evaluation, according to embodiments of the present disclosure.

[0035] FIG. 2f is an example interaction diagram illustrating a method of beam measurement and model performance evaluation, according to embodiments of the present disclosure.

[0036] FIG. 3a is an example flow diagram of a method of beam measurement and model performance evaluation, according to embodiments of the present disclosure.

[0037] FIG. 3b is an example flow diagram of a method of beam measurement and model performance evaluation, according to embodiments of the present disclosure.

[0038] FIG. 3c is an example flow diagram of a method of beam measurement and model performance evaluation, according to embodiments of the present disclosure.

[0039] FIG. 3d is an example flow diagram of a method of beam measurement and model performance evaluation, according to embodiments of the present disclosure.

[0040] FIG. 4a is an example flow diagram of a method of beam measurement and model performance evaluation, according to embodiments of the present disclosure.

[0041] FIG. 4b is an example flow diagram of a method of beam measurement and model performance evaluation, according to embodiments of the present disclosure.

[0042] FIG. 4c is an example flow diagram of a method of beam measurement and model performance evaluation, according to embodiments of the present disclosure.

[0043] FIG. 4d is an example flow diagram of a method of beam measurement and model performance evaluation, according to embodiments of the present disclosure.

[0044] FIG. 5a is an example interaction diagram illustrating a method of beam measurement and model performance evaluation, according to embodiments of the present disclosure.

[0045] FIG. 5b is an example flow diagram of a method of beam measurement and model performance evaluation, according to embodiments of the present disclosure.

[0046] FIG. 6a is an example structural diagram of a first device, according to embodiments of the present disclosure.

[0047] FIG. 6b is an example structural diagram of a second device, according to embodiments of the present disclosure.

[0048] FIG. 7a is an example structural diagram of a communication device, according to embodiments of the present disclosure.

[0049] FIG. 7b is an example structural diagram of a chip, according to embodiments of the present disclosure. DETAILED DESCRIPTION

[0050] The embodiments of the present disclosure provide a beam measurement and model performance evaluation method, a first device, a second device, a communication apparatus, a communication system, a storage medium and a program product, which are used to solve the technical problem that the first device consumes more resources due to frequent measurement of network signal parameters of each beam in the second device in the communication process.

[0051] In a first aspect, the embodiments of the present disclosure provide a beam measurement and model performance evaluation method, which is executed by a first device, and the first device is provided with a model, and the method comprises the following steps.

[0052] According to the first measurement result of the first beam set, a prediction result of a second beam set is obtained through the model;

[0053] A second measurement result is obtained by measuring the second beam set; and the prediction result and the second measurement result are used to determine the prediction performance of the model.

[0054] In the above embodiment, the first device can obtain the prediction result of the second beam set through the model and the second measurement result of the second beam set through measurement, so as to accurately and quickly determine the prediction performance of the monitoring according to the prediction result and the second measurement result, thereby accurately predicting the beam through the model meeting the performance requirement, and performing switching of the model when the model performance does not meet the requirement, so as to avoid the first device from measuring each beam or beam set of the second device, thereby saving the resources of the first device.

[0055] In combination with some embodiments of the first aspect, in some embodiments, the input of the model comprises the first measurement result;

[0056] The output of the model comprises the prediction result.

[0057] In the above embodiment, the model can predict the prediction result of the second beam set according to the first measurement result of the first beam set, so as to avoid the first device from measuring each beam or beam set of the second device, thereby saving the resources of the first device.

[0058] In combination with some embodiments of the first aspect, in some embodiments, the first measurement result is:

[0059] quality information of the beam obtained by measuring the first beam set through a specific RX beam; or

[0060] quality information of the beam obtained by measuring the first beam set through full RX beam scanning.

[0061] In the above embodiments, the first device can flexibly measure the quality information of the beams of the first beam set in any one of the specific RX beam or the full RX beam sweeping.

[0062] In some embodiments of the first aspect, the prediction result is:

[0063] at least one of the quality information or the beam index of the beam predicted on the second beam set by the specific RX beam; or

[0064] at least one of the quality information or the beam index of the beam predicted on the second beam set by the full RX beam sweeping.

[0065] The beam index is used to indicate the beam in the second beam set whose quality information meets the preset requirement.

[0066] In the above embodiments, the first device can flexibly predict the quality information of the beams of the second beam set in any one of the specific RX beam or the full RX beam sweeping.

[0067] In some embodiments of the first aspect, the specific RX beam is an RX beam in a preset direction.

[0068] In the above embodiments, the specific RX beam can be selected for the measurement and prediction of the beam set to reduce the waste of RX beams.

[0069] In some embodiments of the first aspect, the method further includes: sending, to the second device, a model capability of the model, the model capability being used to indicate the input and / or the output of the model.

[0070] In the above embodiments, the first device can send the model capability of the model to the second device, so that the second device can quickly determine the input and output of the model according to the model capability of the model.

[0071] In some embodiments of the first aspect, the model capability is used to indicate that the input of the model is a first input or a second input, and the output of the model is a first output or a second output.

[0072] In the above embodiments, the model capability can facilitate the second device to quickly distinguish the input and output of the model in the first device, wherein the first input is a first measurement result obtained by measuring the first beam set through the specific RX beam;

[0073] The second input is a first measurement result obtained by measuring the first beam set through the full RX beam sweeping.

[0074] In the above embodiments, through the first input and the second input, the second device can quickly distinguish the measurement manner of the first measurement result in the first device, so as to determine the prediction ability of the model based on the measurement manner.

[0075] The first output is a prediction result of predicting the second beam set by a specific RX beam;

[0076] The second output is a prediction result of predicting the second beam set by full RX beam scanning.

[0077] In the above embodiments, through the first output and the second output, the second device can quickly distinguish the prediction manner in which the model obtains the prediction result, so as to determine the prediction ability of the model based on the prediction manner.

[0078] In combination with some embodiments of the first aspect, in some embodiments, the model capability is a first capability, a second capability, a third capability, or a fourth capability, wherein,

[0079] The first capability is used to indicate that the input of the model is the first input, and the output of the model is the first output;

[0080] The second capability is used to indicate that the input of the model is the first input, and the output of the model is the second output;

[0081] The third capability is used to indicate that the input of the model is the second input, and the output of the model is the second output;

[0082] The fourth capability is used to indicate that the input of the model is the second input, and the output of the model is the first output.

[0083] In combination with some embodiments of the first aspect, in some embodiments, the model capability includes first indication information and second indication information, wherein,

[0084] The first indication information is used to indicate that the input of the model is the first input or the second input;

[0085] The second indication information is used to indicate that the output of the model is the first output or the second output.

[0086] In combination with some embodiments of the first aspect, in some embodiments, the first measurement result is a result of measuring the first beam set in the first resource set;

[0087] The prediction result is a result of predicting the second beam set in the second resource set;

[0088] The second measurement result is a result of measuring the second beam set in the third resource set.

[0089] In combination with some embodiments of the first aspect, in some embodiments, the method further includes:

[0090] receive the first configuration information, the first configuration information comprising an identity of the first resource set and an identity of the second resource set.

[0091] In the above embodiment, by obtaining the first configuration information of the second device, the first device can facilitate measurement on the first beam set and prediction on the second beam set.

[0092] In some embodiments of the first aspect, in some embodiments, the first configuration information further comprises third indication information, the third indication information being used to indicate a beam index and / or a beam type of the first beam sent by the first device to the second device, wherein,

[0093] The first beam is a receiving beam for predicting the second beam set.

[0094] In the above embodiment, the first device can quickly determine the information needed to be sent to the second device according to the third indication information in the first configuration information.

[0095] In some embodiments of the first aspect, in some embodiments, the beam type is a specific beam type or a full beam type.

[0096] In the above embodiment, RX beams of multiple beam types can be selected to measure or predict the beam set, so that the measurement and prediction of the beam set are more flexible.

[0097] In some embodiments of the first aspect, in some embodiments, the method further comprises:

[0098] receiving second configuration information, the second configuration information comprising an identity of a third resource set.

[0099] In the above embodiment, by obtaining the second configuration information of the second device, the first device can facilitate measurement on the second beam set.

[0100] In some embodiments of the first aspect, in some embodiments, the third resource set is the same as the second resource set, and wherein a mapping relationship between the beam index and the second resource set is different from a mapping relationship between the beam index and the third resource set.

[0101] In some embodiments of the first aspect, in some embodiments, the third resource set is different from the second resource set.

[0102] In some embodiments of the first aspect, in some embodiments, the second configuration information further comprises fourth indication information, the fourth indication information being used to indicate the first device to send at least one of the following to the second device:

[0103] a beam index of the first beam, the first beam being a receiving beam for predicting the second beam set.

[0104] a beam type of the first beam;

[0105] a prediction result and the second measurement result;

[0106] a reporting identifier corresponding to the prediction result; or

[0107] a relationship between the reporting identifier and the third resource set.

[0108] In the above embodiments, the first device can quickly determine the information that needs to be sent to the second device according to the fourth indication information in the second configuration information.

[0109] In some embodiments of the first aspect, the method further includes:

[0110] receiving third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set.

[0111] In the above embodiments, by obtaining the third configuration information of the second device, the first device can facilitate the measurement of the first beam set and the second beam set, and the prediction of the second beam set.

[0112] In some embodiments of the first aspect, the first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set.

[0113] In some embodiments of the first aspect, the third configuration information further includes fifth indication information, the fifth indication information being used to instruct the first device to send at least one of the following to the second device:

[0114] a beam index of the first beam, the first beam being a receiving beam for predicting the second beam set;

[0115] a beam type of the first beam;

[0116] a prediction result and the second measurement result;

[0117] a reporting identifier corresponding to the prediction result; or

[0118] a relationship between the reporting identifier and the third resource set.

[0119] In the above embodiments, the first device can quickly determine the information that needs to be sent to the second device according to the fifth indication information in the third configuration information.

[0120] In some embodiments of the first aspect, the method further includes:

[0121] The prediction result and the second measurement result are sent to the second device.

[0122] In the above embodiment, the first device can obtain the prediction result of the second beam set through the model, and obtain the second measurement result of the second beam set through measurement, so as to accurately and quickly monitor the prediction performance of the model according to the prediction result and the second measurement result, thereby accurately predicting the beam through the model meeting the performance requirement, and performing switching of the model when the model performance does not meet the requirement, so as to avoid the first device needing to measure each beam or beam set of the second device, and save the resources of the first device.

[0123] In combination with some embodiments of the first aspect, in some embodiments, the method further includes:

[0124] Determining the prediction performance of the model according to the prediction result and the second measurement result.

[0125] In the above embodiment, the first device can accurately and quickly monitor the prediction performance of the model based on the prediction result and the second measurement result, perform switching of the model when the model performance does not meet the requirement, thereby accurately predicting the beam through the model meeting the performance requirement, so as to avoid the first device needing to measure each beam or beam set of the second device, and save the resources of the first device.

[0126] In the second aspect, the embodiments of the present disclosure propose a beam measurement and model performance evaluation method, which is performed by a second device, and the method includes:

[0127] Obtaining a prediction result, the prediction result being a result of predicting a second beam set by a first device through a model in the first device according to a first measurement result of a first beam set;

[0128] Obtaining a second measurement result, the second measurement result being obtained by the first device through measurement on the second beam set;

[0129] Determining the prediction performance of the model according to the prediction result and the second measurement result.

[0130] In the above embodiment, the second device can obtain the prediction result and the second measurement result, and then accurately and quickly determine the prediction performance of the model based on the prediction result and the second measurement result, thereby accurately predicting the beam through the model meeting the performance requirement, so as to avoid the first device needing to measure each beam or beam set of the second device, and save the resources of the first device.

[0131] In combination with some embodiments of the first aspect, in some embodiments, the input of the model includes the first measurement result;

[0132] The output of the model includes the prediction result.

[0133] In some embodiments of the first aspect, the first measurement result is:

[0134] quality information of a beam obtained by measuring the first set of beams through a specific RX beam; or

[0135] quality information of a beam obtained by measuring the first set of beams through full RX beam sweeping.

[0136] In some embodiments of the first aspect, the prediction result is:

[0137] quality information or a beam index of a beam obtained by predicting the second set of beams through a specific RX beam; or

[0138] quality information or a beam index of a beam obtained by predicting the second set of beams through full RX beam sweeping.

[0139] The beam index is used to indicate a beam in the second set of beams whose quality information meets a preset requirement.

[0140] In some embodiments of the first aspect, the specific RX beam is an RX beam in a preset direction.

[0141] In some embodiments of the first aspect, the method further comprises:

[0142] receiving a model capability of the model sent by the first device, the model capability being used to indicate an input and / or an output of the model.

[0143] In some embodiments of the first aspect, the model capability is used to indicate that the input of the model is a first input or a second input, and the output of the model is a first output or a second output; wherein the first input is a first measurement result obtained by measuring the first set of beams through a specific RX beam;

[0144] the second input is a first measurement result obtained by measuring the first set of beams through full RX beam sweeping.

[0145] the first output is a prediction result obtained by predicting the second set of beams through a specific RX beam;

[0146] the second output is a prediction result obtained by predicting the second set of beams through full RX beam.

[0147] In some embodiments of the first aspect, the model capability is a first capability, a second capability, a third capability or a fourth capability, wherein

[0148] The first capability is used to indicate that the input of the model is the first input and the output of the model is the first output.

[0149] The second capability is used to indicate that the input of the model is the first input and the output of the model is the second output.

[0150] The third capability is used to indicate that the input of the model is the second input and the output of the model is the second output.

[0151] The fourth capability is used to indicate that the input of the model is the second input and the output of the model is the first output.

[0152] With reference to some embodiments of the first aspect, in some embodiments, the model capability includes first indication information and second indication information, wherein,

[0153] The first indication information is used to indicate that the input of the model is the first input or the second input.

[0154] The second indication information is used to indicate that the output of the model is the first output or the second output.

[0155] With reference to some embodiments of the first aspect, in some embodiments, the first measurement result is a result of measuring the first beam set in the first resource set.

[0156] The prediction result is a result of predicting the second beam set in the second resource set.

[0157] The second measurement result is a result of measuring the second beam set in the third resource set.

[0158] With reference to some embodiments of the first aspect, in some embodiments, the method further includes:

[0159] The first configuration information includes an identifier of the first resource set and an identifier of the second resource set.

[0160] With reference to some embodiments of the first aspect, in some embodiments, the first configuration information further includes third indication information, the third indication information being used to indicate a beam index and / or a beam type of the first beam sent by the first device to the second device, wherein,

[0161] The first beam is a receiving beam for predicting the second beam set.

[0162] With reference to some embodiments of the first aspect, in some embodiments, the beam type is a specific beam type or a full beam type.

[0163] With reference to some embodiments of the first aspect, in some embodiments, the method further includes:

[0164] transmit the second configuration information, the second configuration information comprising an identity of the third resource set.

[0165] In some embodiments in combination with the first aspect, in some embodiments, the third resource set is the same as the second resource set, and wherein the mapping relationship between the beam index and the second resource set is different from the mapping relationship between the beam index and the third resource set.

[0166] In some embodiments in combination with the first aspect, in some embodiments, the third resource set is different from the second resource set.

[0167] In some embodiments in combination with the first aspect, in some embodiments, the second configuration information further comprises fourth indication information, the fourth indication information being used to instruct the first device to transmit at least one of the following to the second device:

[0168] a beam index of a first beam, the first beam being a receive beam for predicting the second beam set;

[0169] a beam type of the first beam;

[0170] a prediction result and a second measurement result;

[0171] a reporting identity corresponding to the prediction result; or

[0172] a relationship between the reporting identity and the third resource set.

[0173] In some embodiments in combination with the first aspect, in some embodiments, the method further comprises:

[0174] transmitting third configuration information, the third configuration information comprising an identity of the first resource set, an identity of the second resource set, and an identity of the third resource set.

[0175] In some embodiments in combination with the first aspect, in some embodiments, the first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set.

[0176] In some embodiments in combination with the first aspect, in some embodiments, the third configuration information further comprises fifth indication information, the fifth indication information being used to instruct the first device to transmit at least one of the following to the second device:

[0177] a beam index of a first beam, the first beam being a receive beam for predicting the second beam set;

[0178] a beam type of the first beam;

[0179] a prediction result and a second measurement result;

[0180] a reporting identity corresponding to the prediction result; or

[0181] a relationship between the reporting identity and the third resource set.

[0182] In some embodiments combined with the first aspect, in some embodiments, the obtaining the prediction result comprises:

[0183] receiving the prediction result sent by the first device.

[0184] In some embodiments combined with the first aspect, in some embodiments, the obtaining the second measurement result comprises:

[0185] receiving the second measurement result sent by the first device.

[0186] In a third aspect, the embodiments of the present disclosure provide a first device, the first device being provided with a model, comprising:

[0187] a processing module, configured to obtain, by the model, a prediction result of a second beam set according to a first measurement result of a first beam set;

[0188] the processing module is further configured to measure the second beam set to obtain a second measurement result; wherein the prediction result and the second measurement result are used to determine a prediction performance of the model.

[0189] In a fourth aspect, the embodiments of the present disclosure provide a second device, comprising:

[0190] a transceiving module, configured to obtain a prediction result, the prediction result being a result of the first device predicting a second beam set by a model in the first device according to a first measurement result of a first beam set;

[0191] the transceiving module is further configured to obtain a second measurement result, the second measurement result being obtained by the first device measuring the second beam set;

[0192] a processing module, configured to determine a prediction performance of the model according to the prediction result and the second measurement result.

[0193] In a fifth aspect, the embodiments of the present disclosure provide a communication apparatus, comprising:

[0194] one or more processors;

[0195] wherein the processor is configured to execute the first aspect and the optional implementation manners of the first aspect.

[0196] In a sixth aspect, the embodiments of the present disclosure provide a communication apparatus, comprising:

[0197] one or more processors;

[0198] wherein the processor is configured to execute the second aspect and the optional implementation manners of the second aspect.

[0199] In a seventh aspect, the embodiments of the present disclosure provide a communication system, the communication system comprising: a first device configured to implement the first aspect and the optional implementation manners of the first aspect; and a second device configured to implement the second aspect and the optional implementation manners of the second aspect.

[0200] In an eighth aspect, the embodiments of the present disclosure provide a storage medium, the storage medium storing instructions which, when executed on a communication device, cause the communication device to perform the method described in the first aspect and the optional implementation manners of the first aspect.

[0201] In a ninth aspect, the embodiments of the present disclosure provide a storage medium, the storage medium storing instructions which, when executed on a communication device, cause the communication device to perform the method described in the second aspect and the optional implementation manners of the second aspect.

[0202] In a tenth aspect, the embodiments of the present disclosure provide a program product, the program product, when executed by a communication device, causing the communication device to perform the method described in the first aspect and the optional implementation manners of the first aspect.

[0203] In an eleventh aspect, the embodiments of the present disclosure provide a program product, the program product, when executed by a communication device, causing the communication device to perform the method described in the second aspect and the optional implementation manners of the second aspect.

[0204] In a twelfth aspect, the embodiments of the present disclosure provide a computer program, when executed on a computer, causing the computer to perform the method described in the first aspect and the optional implementation manners of the first aspect.

[0205] In a thirteenth aspect, the embodiments of the present disclosure provide a computer program, when executed on a computer, causing the computer to perform the method described in the second aspect and the optional implementation manners of the second aspect.

[0206] In a fourteenth aspect, the embodiments of the present disclosure provide a chip. The chip comprises processing circuitry configured to perform the method described in the first aspect and the optional implementation manners of the first aspect, or the method described in the second aspect and the optional implementation manners of the second aspect.

[0207] It can be understood that the first device, the second device, the communication apparatus, the communication system, the storage medium, the program product, the computer program, the chip or the chip system are all used to perform the method proposed in the embodiments of the present disclosure. Therefore, the beneficial effects they can achieve can refer to the beneficial effects in the corresponding method, which will not be described here.

[0208] The embodiments of the present disclosure provide a beam measurement and model performance evaluation method, a first device, a second device, a communication apparatus, a communication system, a storage medium and a program product.

[0209] In some embodiments, the beam measurement and model performance evaluation method and the beam measurement method, the model performance optimization method, the model optimization method, the model performance evaluation method, the model performance determination method, the model performance monitoring method, the model performance optimization method, the information processing method, the data processing method, the communication method, and the like can be replaced with each other, and the beam measurement and model performance evaluation apparatus and the beam measurement apparatus, the model performance optimization apparatus, the model optimization apparatus, the model performance evaluation apparatus, the model performance determination apparatus, the model performance monitoring apparatus, the model performance optimization apparatus, the information processing apparatus, the data processing apparatus, the communication apparatus, and the like can be replaced with each other.

[0210] The embodiments of the present disclosure are not exhaustive, but are only schematic of some embodiments, and are not specific limitations on the scope of protection of the present disclosure. In the case where there is no contradiction, each step in an embodiment can be implemented as an independent embodiment, and the steps can be combined arbitrarily, for example, the scheme after removing part of the steps in an embodiment can also be implemented as an independent embodiment, and the order of the steps in an embodiment can be exchanged arbitrarily, in addition, the optional implementation manners in an embodiment can be combined arbitrarily; in addition, the embodiments can be combined arbitrarily, for example, part or all of the steps of different embodiments can be combined arbitrarily, an embodiment can be combined with the optional implementation manners of other embodiments.

[0211] In the embodiments of the present disclosure, the terms and / or descriptions between the embodiments are consistent and can be referred to each other if there is no special description and logical conflict, and the technical features in different embodiments can be combined to form new embodiments according to their inherent logical relationship.

[0212] The terms used in the embodiments of the present disclosure are only for the purpose of describing specific embodiments, and not as a limitation on the present disclosure.

[0213] In the embodiments of the present disclosure, unless otherwise specified, the elements expressed in singular form, such as "one", "a", "the", "above", "the", "the", "this", etc., can represent "one and only one", or "one or more", "at least one", etc. For example, in the case of using articles such as "a", "an", "the" in English, the noun after the article can be understood as singular expression, or can be understood as plural expression.

[0214] In the embodiments of the present disclosure, "a plurality of" means two or more.

[0215] In some embodiments, the terms "at least one of," "one or more of," "a plurality of," "multiple," and the like can be used interchangeably.

[0216] In some embodiments, the recitations "at least one of A, B," "A and / or B," "in one case A, in another case B," "in response to a case A, in response to a case B," and the like can include the following technical solutions according to the case: in some embodiments A (A is executed regardless of B); in some embodiments B (B is executed regardless of A); in some embodiments, A and B are selectively executed (A and B are selectively executed); in some embodiments, A and B (A and B are executed). When there are more branches such as A, B, C, and the like, the above is similar.

[0217] In some embodiments, the recitations "A or B" and the like can include the following technical solutions according to the case: in some embodiments A (A is executed regardless of B); in some embodiments B (B is executed regardless of A); in some embodiments, A and B are selectively executed (A and B are selectively executed). When there are more branches such as A, B, C, and the like, the above is similar.

[0218] In some embodiments, the prefix words "first," "second," and the like in the disclosure are merely used to distinguish different description objects, and do not constitute a limitation on the position, order, priority, quantity, or content of the description objects. The description of the description objects should refer to the description in the claims or embodiments, and should not be limited by the prefix words. For example, the description objects are "fields," and the ordinal words before "fields" in "first field" and "second field" do not limit the positions or orders between "fields." "First" and "second" do not limit whether the "fields" they modify are in the same message, nor do they limit the order of "first field" and "second field." For another example, the description objects are "levels," and the ordinal words before "levels" in "first level" and "second level" do not limit the priority between "levels." For another example, the quantity of the description objects is not limited by the ordinal words, and can be one or more. For example, "first device," where the quantity of "devices" can be one or more. In addition, the objects modified by different prefix words can be the same or different, for example, the description objects are "devices," and "first device" and "second device" can be the same device or different devices, and their types can be the same or different. For another example, the description objects are "information," and "first information" and "second information" can be the same information or different information, and their contents can be the same or different.

[0219] In some embodiments, "comprising", "including", "to indicate", "carrying", can be interpreted as directly carrying A, or indirectly indicating A.

[0220] In some embodiments, the terms "in response to", "in response to determining", "in the case of", "when", "when", "if", "if" and the like can be replaced with each other.

[0221] In some embodiments, the terms "greater than", "greater than or equal to", "not less than", "more than", "more than or equal to", "not less than", "higher than", "higher than or equal to", "not less than", "above" and the like can be replaced with each other, and the terms "less than", "less than or equal to", "not greater than", "less than", "less than or equal to", "not more than", "lower than", "lower than or equal to", "not higher than", "below" and the like can be replaced with each other.

[0222] In some embodiments, the apparatus and device can be interpreted as physical or virtual, and its name is not limited to the name described in the embodiments, and in some cases can also be understood as "equipment", "device", "circuit", "network element", "node", "function", "unit", "section", "system", "network", "chip", "chip system", "entity", "subject" and the like.

[0223] In some embodiments, "network" can be interpreted as an apparatus included in the network, such as an access network device, a core network device, and the like.

[0224] In some embodiments, a "device," "terminal," "terminal equipment (TE)," or "terminal device" can be referred to as a "user equipment (UE)," a "user terminal," a "mobile station (MS)," a "mobile terminal (MT)," a subscriber station, a mobile unit, a subscriber unit, a wireless unit, a remote unit, a mobile device, a wireless device, a wireless communication device, a remote device, a mobile subscriber station, an access terminal, a mobile terminal, a wireless terminal, a remote terminal, a handset, a user agent, a mobile client, a client, and / or the like.

[0225] In some embodiments, data, information, and / or the like can be obtained in compliance with laws and regulations of a country in which the data, information, and / or the like is obtained.

[0226] In some embodiments, data, information, and / or the like can be obtained after obtaining consent of a user.

[0227] In addition, each element, each row, or each column in a table of an embodiment of the present disclosure can be implemented as an independent embodiment, and a combination of any element, any row, or any column can also be implemented as an independent embodiment.

[0228] FIG. 1 is a schematic diagram of an architecture of a communication system according to an embodiment of the present disclosure. As shown in FIG. 1, the communication system 100 includes a first device 101 and a second device 102. It should be understood that the number and form of devices shown in FIG. 1 are merely used for example and do not constitute a limitation on the embodiments of the present disclosure, and in actual applications, two or more first devices, two or more second devices, and two or more AI models can be included. The communication system shown in FIG. 1 is merely illustrated by taking one first device 101, one second device 102, and one AI model as an example.

[0229] In some embodiments, the first device 101 can be any terminal device that can be connected to a network.

[0230] In some embodiments, the second device 102 can be a terminal equipment (TE) or any device in a network (NW). Optionally, the NW can refer to various types of communication networks, including cellular networks (such as LTE, 5G), Wi-Fi networks, local area networks (LAN), wide area networks (WAN), etc. The NW can include various components such as base stations, core networks, gateways, etc. that work together to provide communication services. Optionally, the NW can be, for example, an access network device.

[0231] In some embodiments, the terminal device described above, for example, includes at least one of a mobile phone, a wearable device, an Internet of Things device, a car with communication function, a smart car, a tablet computer (Pad), a computer with wireless transceiver function, a virtual reality (VR) terminal device, an augmented reality (AR) terminal device, a wireless terminal device in industrial control, a wireless terminal device in self-driving, a wireless terminal device in remote medical surgery, a wireless terminal device in smart grid, a wireless terminal device in transportation safety, a wireless terminal device in smart city, a wireless terminal device in smart home, etc., but is not limited thereto.

[0232] In some embodiments, the above-mentioned "access network device (AN device)", can also be referred to as "radio access network device (RAN device)", "network (NW)", "base station (BS)", "radio base station", "fixed station", and in some embodiments can also be understood as "node", "access point", "transmission point (TP)", "reception point (RP)", "transmission / reception point (TRP)", "panel", "antenna panel", "antenna array", "cell", "macro cell", "small cell", "femto cell", "pico cell", "sector", "cell group", "serving cell", "carrier", "component carrier", "bandwidth part (BWP)", and the like.

[0233] In some embodiments, the second device 102 can be a base station, for example, including an International Mobile Telecommunications Base Station (IMT BS), such as a Macrocell Base Station, a Microcell Base Station, a Small Cell Base Station, and the like.

[0234] It can be understood that the communication system described in the embodiments of the present disclosure is for more clearly illustrating the technical solutions of the embodiments of the present disclosure, and does not constitute a limitation on the technical solutions proposed in the embodiments of the present disclosure. Those skilled in the art can know that, with the evolution of system architecture and the appearance of new business scenarios, the technical solutions proposed in the embodiments of the present disclosure are also applicable to similar technical problems.

[0235] The following embodiments of the present disclosure can be applied to the communication system 100 shown in FIG. 1, or part of the subjects, but are not limited thereto. The subjects shown in FIG. 1 are illustrative, and the communication system can include all or part of the subjects in FIG. 1, or other subjects other than those in FIG. 1. The number and form of each subject is arbitrary, each subject can be physical or virtual, the connection relationship between each subject is illustrative, each subject can not be connected or can be connected, and the connection can be in any manner, can be direct connection or indirect connection, can be wired connection or wireless connection.

[0236] Embodiments of the present disclosure can be applied to Long Term Evolution (LTE), LTE-Advanced (LTE-A), LTE-Beyond (LTE-B), SUPER 3G, IMT-Advanced, 4th generation mobile communication system (4G), 5th generation mobile communication system (5G), 5G new radio (NR), 6th generation communication system (6G), Future Radio Access (FRA), New-Radio Access Technology (RAT), New Radio (NR), New radio access (NX), Future generation radio access (FX), Global System for Mobile communications (GSM (registered trademark)), CDMA2000, Ultra Mobile Broadband (UMB), IEEE 802.11 (Wi-Fi (registered trademark)), IEEE 802.16 (WiMAX (registered trademark)), IEEE 802.20, Ultra-WideBand (UWB), Bluetooth (Bluetooth (registered trademark)), Public Land Mobile Network (PLMN) network, Device-to-Device (D2D) system, Machine to Machine (M2M) system, Internet of Things (IoT) system, Vehicle-to-Everything (V2X), system using other communication methods, next-generation system expanded based thereon, and the like. Further, a plurality of systems can be applied in combination (for example, combination of LTE or LTE-A and 5G, and the like).

[0237] The second device and the first device can communicate based on beams. In the communication process, the first device can need to consume more resources to measure the measurement result of each beam or a beam set in the second device in order to ensure the quality of the communication. Optionally, the measurement result can be, but is not limited to, beam quality information such as reference signal received power (RSRP).

[0238] To solve the above problems, the present disclosure provides a beam measurement and model performance evaluation method, a first device, a second device, a communication apparatus, a communication system, a storage medium, and a program product.

[0239] In some embodiments, a model (for example, the model can be an artificial intelligence (AI) model) can be arranged in the first device. The model can be used to predict the measurement result of the remaining beams in the second device based on the measurement result of part of the beams in the second device, so as to avoid the first device from measuring each beam or a beam set in the second device, and save the resources of the first device.

[0240] When the measurement result of the beam is predicted based on the model, the prediction performance of the model needs to be determined. In some embodiments, for any one beam or beam set, the prediction result of the beam or beam set can be predicted based on the model, and the reference measurement result of the beam or beam set can also be obtained. The prediction performance of the model can be determined by comparing and analyzing the prediction result of the beam or beam set with the reference measurement result.

[0241] In some embodiments, the prediction result can be a predicted RSRP.

[0242] In some embodiments, the prediction result can be a physical layer reference signal received power (L1-RSRP).

[0243] In some embodiments, for a multipath channel, the second device can determine the reference L1-RSRP by using multiple factors, which can include channel spatial domain information, channel time domain information, TX beamforming gain information, and UE implementation related information.

[0244] For example, the channel spatial domain information can include: Angle of Arrival (AOA), Direction of Arrival (DOA), Zenith Angle of Arrival (ZOA), Time of Arrival (TOA), and multipath power, etc. The channel time domain information can include moving direction, speed, power, and multipath power, etc. The first device implementation related information can include Receive (RX) beam sweeping.

[0245] In some embodiments, the RX hypothesis can be supported in the data or signal Transmission (TR) process, which illustrates the "Top-1 genie-aided Tx beam" technology for indicating that the best Tx beam can be selected by the genie system assistance, which can include the following two ways:

[0246] Way 1: This technology indicates that the Tx beam that produces the maximum L1-RSRP among all Tx beams and Rx beams is determined as the best Tx beam;

[0247] Way 2: This technology indicates that the Tx beam that produces the maximum L1-RSRP among all Tx beams with a specific Rx beam is determined as the best Tx beam.

[0248] According to the above-mentioned way 2, the input of the model can be the L1-RSRP measured by the specific RX beam, and the output of the model can also be the L1-RSRP predicted by the specific RX beam. When it is necessary to determine the performance of the model, the first device can measure the TX beam in the way of full RX beam sweeping to obtain the reference value L1-RSRP.

[0249] In some embodiments, the first device can predict the prediction result of the second beam set through the model according to the first measurement result of the first beam set, and can also measure the second measurement result of the second beam set, wherein the prediction result and the second measurement result can be used to determine the prediction performance of the model. Since the prediction result and the second measurement result can quickly and conveniently obtain the performance of the model. Therefore, the model that meets the performance requirement can be used to accurately predict the beam, so as to avoid the first device from measuring each beam or beam set of the second device, and save the resources of the first device.

[0250] It can be understood that the communication system described in the embodiments of the present disclosure is for more clearly illustrating the technical solutions of the embodiments of the present disclosure, and does not constitute a limitation on the technical solutions provided by the embodiments of the present disclosure. Those skilled in the art can know that, with the evolution of system architecture and the appearance of new business scenarios, the technical solutions provided by the embodiments of the present disclosure are also applicable to similar technical problems.

[0251] The beam measurement and model performance evaluation method, the first device, the second device, the communication apparatus, the communication system, the storage medium and the program product provided by the present disclosure will be described in detail below with reference to the accompanying drawings.

[0252] Referring to FIG. 2a, FIG. 2a is an exemplary interaction schematic diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure. As shown in FIG. 2a, the beam measurement and model performance evaluation method includes the following steps:

[0253] In step S2101, the first device sends a model capability of a model to a second device.

[0254] In some embodiments, the model capability includes any one of the following model capabilities: an identification of the model capability, or first indication information and second indication information.

[0255] In some embodiments, the second device can receive the model capability of the model, which can include any one of the following: an identification of the model capability, or first indication information and second indication information.

[0256] In some embodiments, the first device can be provided with a model. The first device can be provided with one or more models; or the first device can be provided with a combined model including multiple sub-models.

[0257] In some embodiments, the model can be an artificial intelligence (AI) model or a model with AI function.

[0258] In some embodiments, the AI model can be any one of an independent AI model, or the AI model can also be a combined model with AI function obtained by combining multiple AI models.

[0259] In some embodiments, the AI model can include, but is not limited to, at least one of the following: a Convolutional Neural Network (CNN) model, a Recurrent Neural Networks (RNN) model, or a model based on attention mechanism, etc.

[0260] In some embodiments, the model can be used for beam management (BM) of the first device.

[0261] In some embodiments, the model can be used to predict quality information or beam indices of beams of the beam set.

[0262] In some embodiments, the quality information can include, but is not limited to, at least one of: RSRP, reference signal received quality (RSRQ), or signal to interference plus noise ratio (SINR). In some examples, the SINR can also be referred to as “signal to noise ratio” or “signal to noise and interference ratio”.

[0263] In some embodiments, each beam can be pre-configured with a corresponding beam index to distinguish the beams by the beam indices.

[0264] In some embodiments, the first device can store the beam indices corresponding to each beam.

[0265] In some embodiments, the model capability can be used to indicate the input and / or output of the model.

[0266] In some embodiments, the input of the model can include the first measurement result, and the output of the model can include the prediction result.

[0267] In some embodiments, the first measurement result can be quality information of beams obtained by measuring the first beam set through a specific RX beam; or the first measurement result can be quality information of beams obtained by measuring the first beam set through full RX beam scanning.

[0268] In some embodiments, the prediction result can be quality information or beam indices of beams obtained by predicting the second beam set through a specific RX beam; or the prediction result can be quality information or beam indices of beams obtained by predicting the second beam set through full RX beam scanning, wherein the beam indices are used to indicate beams in the second beam set whose quality information meets a preset requirement.

[0269] In some embodiments, the second device can correspond to a plurality of beam sets, which can include the first beam set and the second beam set, and each beam set can include one or more transmit (TX) beams.

[0270] The first device can correspond to a plurality of RX beams, the first device can communicate with each of the beam sets on the second device side through the plurality of RX beams, and the plurality of RX beams can be used to measure the plurality of beam sets on the second device side to obtain a measurement result of each of the beam sets.

[0271] In some embodiments, the full RX beam can be used to indicate all RX beams of the first device.

[0272] In some embodiments, the specific beam can be an RX beam in a preset direction.

[0273] The full RX beam can include the specific RX beam, the full RX beam can include RX beams in a plurality of directions, and the specific beam can include RX beams in one or more preset directions. For example, the first device can include 8 RX beams respectively located in a first direction to an eighth direction, and the full RX beam can include the 8 RX beams. Assuming that the preset directions are the first direction, the third direction, and the fifth direction, the specific beam can include 3 RX beams located in the first direction, the third direction, and the fifth direction.

[0274] In some embodiments, the quality information of the beam can include an identifier of the quality information and a value of the quality information.

[0275] In some embodiments, the quality information of the beam can include an RSRP value.

[0276] In some embodiments, the quality information of the beam can include an L1-RSRP value.

[0277] In some embodiments, the preset requirement can be used to indicate that the value of the quality information of the beam in the second beam set is an optimal value, and the optimal value can be a maximum value. For example, there are 3 beams (beam 1 to beam 3) in the second beam set, and the values of the quality information of the 3 beams are sorted from large to small as beam 2> beam 3> beam 1. Assuming that the greater the quality information of the beam, the stronger the quality of the beam, it can be determined that the value of the quality information of beam 2 is the optimal value, and beam 2 can be determined as the second beam.

[0278] In some embodiments, the model capability can be used to indicate that the input of the model is the first input or the second input, and the output of the model is the first output or the second output. It can be understood that the model capability can be used to indicate any one of the following information: the first input and the first output, the first input and the second output, the second input and the first output, or the second input and the second output.

[0279] In some embodiments, the first input can be a first measurement result obtained by measuring the first beam set through the specific RX beam, and the second input can be a first measurement result obtained by measuring the first beam set through full RX beam scanning.

[0280] In some embodiments, the first output can be a prediction result of predicting the second set of beams by a specific RX beam; and the second output can be a prediction result of predicting the second set of beams by a full RX beam scan.

[0281] In some embodiments, the model capability can be a first capability, a second capability, a third capability, or a fourth capability, wherein,

[0282] The first capability can be used to indicate that the input of the model is the first input and the output of the model is the first output.

[0283] The second capability can be used to indicate that the input of the model is the first input and the output of the model is the second output.

[0284] The third capability can be used to indicate that the input of the model is the second input and the output of the model is the second output.

[0285] The fourth capability can be used to indicate that the input of the model is the second input and the output of the model is the first output.

[0286] In some embodiments, the identification of the model capability can be, but is not limited to, a name (for example, a Chinese name or an English name), a number, or an index number of the model capability. For example, the identification of the model capability can be the first capability, the second capability, the third capability, or the fourth capability; and the identification of the model capability can also be capability 1, capability 2, capability 3, or capability 4.

[0287] In some embodiments, the identification of the model capability can be obtained based on the identification of the input of the model and the identification of the output of the model indicated by the model. For example, if the identification of the first input of the model is “I1”, the identification of the second input is “I2”, the identification of the first output is “O1”, and the identification of the second input is “O2”, the identification of the first capability in the above model capability can be “I1-O1”, the identification of the second capability can be “I1-O2”, the identification of the third capability can be “I2-O2”, and the identification of the fourth capability can be “I2-O1”.

[0288] In some embodiments, the model capability can include first indication information and second indication information, wherein: the first indication information is used to indicate that the input of the model is the first input or the second input; and the second indication information is used to indicate that the output of the model is the first output or the second output.

[0289] In some embodiments, the first indication information can include an identifier of the first input or an identifier of the second input, and the second indication information can include an identifier of the first output or an identifier of the second output. For example, the first indication information can include “I1”, and the first device can indicate, according to “I1”, the input of the model of the second device as the first input; the second indication information can include “O2”, and the first device can indicate, according to “O2”, the output of the model of the second device as the second output.

[0290] In some embodiments, the first indication information and the second indication information can be stored or transmitted in a preset form.

[0291] In some embodiments, the preset form is not limited, and for example, it is “{first indication information, second indication information}”.

[0292] In order to facilitate understanding of the input and output of the model, the input and output of the model are exemplarily described below in combination with FIG. 2b and FIG. 2c.

[0293] FIG. 2b is an exemplary schematic diagram of the input and output of a model according to an embodiment of the present disclosure. As shown in FIG. 2b, five models are arranged in the first device, and each of the five models can correspond to a model capability. For example, model 1 corresponds to a first capability; model 2 corresponds to a second capability; model 3 corresponds to a third capability; and model 4 corresponds to a fourth capability.

[0294] In some embodiments, different models can correspond to the same model capability. For example, model 1 and model 5 can both correspond to the first capability.

[0295] FIG. 2c is an exemplary schematic diagram of the input and output of a model according to an embodiment of the present disclosure. As shown in FIG. 2c, one combined model is arranged in the first device, and the combined model includes five sub-models, and each of the sub-models can correspond to a model capability. For example, sub-model 1 corresponds to a first capability; sub-model 2 corresponds to a second capability; sub-model 3 corresponds to a third capability; and sub-model 4 corresponds to a fourth capability.

[0296] In some embodiments, different sub-models can correspond to the same model capability. For example, sub-model 1 and sub-model 5 can both correspond to the first capability.

[0297] In some embodiments, the above-mentioned model, model capability, first capability, second capability, first indication information, second indication information, first input, second input, first output and second output can not be limited to the names described in the embodiments, wherein the terms of “model”, “artificial intelligence model”, “preset model”, “test model”, “target model”, “beam prediction model”, “beam measurement result prediction model” and the like can be replaced with each other; the terms of “model capability”, “model capability information”, “model type”, “model information”, “model parameter” and the like can be replaced with each other; the terms of “first capability”, “second capability”, “first parameter”, “second parameter”, “first type”, “second type” and the like can be replaced with each other; the terms of “information”, “message”, “signal”, “signaling”, “report”, “configuration”, “indication”, “instruction”, “command”, “data” and the like can be replaced with each other.

[0298] In step S2102, the second device sends the first configuration information to the first device.

[0299] In some embodiments, the first configuration information includes, but is not limited to, any one of the following: identification of the first resource set and identification of the second resource set, or identification of the first resource set, identification of the second resource set and third indication information.

[0300] In some embodiments, the first device can receive any one of the following first configuration information: identification of the first resource set and identification of the second resource set, or identification of the first resource set, identification of the second resource set and third indication information.

[0301] In some embodiments, the first configuration information can include identification of the first resource set and identification of the second resource set.

[0302] In some embodiments, the first resource set or the second resource set can be used for the configuration process of the beam management of the first device.

[0303] In some embodiments, the identification of the first resource set can be, but is not limited to, the name (for example, Chinese name or English name) or index number of the first resource set. For example, if the name of the first resource set is “resource set 1”, the identification of the first resource set can be “resource set 1”; if the index number of the first resource set is “S-1”, the identification of the first resource set can be “S-1”.

[0304] In some embodiments, the identification of the second resource set can be, but is not limited to, a name (for example, a Chinese name or an English name) or an index number of the second resource set. For example, if the name of the second resource set is "resource set 2", the identification of the second resource set can be "resource set 2"; if the index number of the second resource set is "S-2", the identification of the second resource set can be "S-2".

[0305] In some embodiments, on the basis of including the identification of the first resource set and the identification of the second resource set, the first configuration information can further include third indication information, that is, the first configuration information includes the identification of the first resource set, the identification of the second resource set and the third indication information.

[0306] In some embodiments, the third indication information can be used to indicate the beam index and / or the beam type of the first beam sent by the first device to the second device, wherein the first beam can be a receiving beam for predicting the second beam set.

[0307] In some embodiments, the first beam can be the "specific RX beam" or the "full RX beam" described above.

[0308] In some embodiments, the first device can be pre-configured with the first beam for predicting the second beam set, for example, the first device can correspond to 5 RX beams (RX beam 1-RX beam 5), and the first device can pre-configure RX beam 1 (or RX beam 1-RX beam 5) to predict the second beam set.

[0309] In some embodiments, the beam type can be a specific beam type or a full beam type.

[0310] In some embodiments, the specific beam type can be used to indicate that the first device measures the second beam set through a specific RX beam.

[0311] In some embodiments, the full beam type can be used to indicate that the first device measures the second beam set through a full RX beam.

[0312] In some embodiments, the first configuration information and the third indication information can not be limited to the names described in the embodiments, wherein the terms "first configuration information", "first configuration parameter", "first configuration data" and the like can be replaced with each other, and the terms "third indication information", "RX beam information", "RX beam configuration information" and the like can be replaced with each other.

[0313] In some embodiments, the first resource set and the second resource set described above can not be limited to the names described in the embodiments, and the terms "first resource set", "measurement resource set", "measurement configuration information", "measurement configuration parameter", and the like can be replaced with each other; the terms "second resource set", "reporting configuration resource set", "reporting configuration information", "reporting configuration parameter", and the like can be replaced with each other.

[0314] In step S2103, the first device determines the first resource set according to the first configuration information, and performs measurement on the first beam set in the first resource set to obtain a first measurement result.

[0315] In some embodiments, the first configuration information can include an identifier of the first resource set, and the first device can determine the first resource set according to the identifier of the first resource set.

[0316] In some embodiments, the first resource set can be used in the measurement process of the first device on the first beam set.

[0317] In some embodiments, the first resource set can include a beam type and / or a beam index used for measurement of the first beam set.

[0318] In some embodiments, the first device can determine a full RX beam or a specific RX beam corresponding to the first beam set according to the first resource set, and perform measurement on the first beam set through the full RX beam or the specific RX beam.

[0319] In some embodiments, the first measurement result can be a result of measurement on the first beam set in the first resource set.

[0320] In some embodiments, the first measurement result can include an identifier of each RX beam of the first device corresponding to the first beam set for measurement, and an identifier of a target beam in the first beam set corresponding to each RX beam, where the target beam can be a beam in the first beam set measured by each RX beam whose quality information satisfies a preset requirement.

[0321] In some embodiments, for any one of the N RX beams, a target TX beam corresponding to the RX beam can be determined from the M TX beams of the first beam set, and the target TX beam can be a beam in the first beam set measured by the RX beam whose quality information satisfies a preset requirement.

[0322] In some embodiments, the identifier of the beam can include, but is not limited to, at least one of a beam index of the beam or a beam name of the beam.

[0323] In some embodiments, the preset requirement can be used to indicate that the value of the quality information of the beam in the first beam set measured by the RX beam is an optimal value, which can be a maximum value.

[0324] In some embodiments, assuming that the first beam set has M TX beams, the first device measures the first beam set by using N RX beams, each RX beam can be used to measure M TX beams, then there can be MxN measurement results, where M and N are integers greater than 1 or equal to 1.

[0325] In some embodiments, each measurement result can include the identification of the RX beam corresponding to the first device for measuring the first beam set and the identification of the measured TX beam. For example, the first device can measure TX beam 1 in the first beam set by RX beam 1 to obtain measurement result 1, and measurement result 1 can include the identification of RX beam 1 and the identification of TX beam 1.

[0326] For example, assuming there are 3 RX beams, which are RX beam 1, RX beam 2 and RX beam 3. Assuming there are 5 TX beams, which are TX beam 1, TX beam 2, TX beam 3, TX beam 4 and TX beam 5. When each RX beam measures these 5 TX beams, the greater the value of the quality information of the beam, the better the quality of the beam. After sorting each TX beam according to the value of the quality information from large to small, the sorting result is as follows:

[0327] RX beam 1: TX beam 1 > TX beam 2 > TX beam 3 > TX beam 4 > TX beam 5;

[0328] RX beam 2: TX beam 3 > TX beam 4 > TX beam 2 > TX beam 1 > TX beam 5;

[0329] RX beam 3: TX beam 4 > TX beam 1 > TX beam 5 > TX beam 2 > TX beam 3.

[0330] According to the preset requirement, the target TX beam of RX beam 1 is determined to be TX beam 1, the target TX beam of RX beam 2 is determined to be TX beam 3, and the target TX beam of RX beam 3 is determined to be TX beam 4. Then the first measurement result can include the identification of each RX beam and the identification of the target TX beam corresponding to each RX beam.

[0331] In some embodiments, the first measurement result can be stored or transmitted in a preset form, and the above-mentioned preset form is not limited. For example, the first measurement result can be in the following form: {(RX beam 1: TX beam 1), (RX beam 2: TX beam 3), (RX beam 3: TX beam 4)}.

[0332] In some embodiments, the first device can determine a measurement environment based on the RX beam assumption, and measure the first set of beams in the first resource set based on the measurement environment. The RX beam assumption can include parameters such as signal-to-noise ratio, Doppler, and channel type, and the RX beam assumption can adjust the measurement environment by adjusting the conditions of each parameter. For example, the RX beam assumption can set the signal-to-noise ratio of the measurement environment to be high signal-to-noise ratio.

[0333] In step S2104, the first device obtains a prediction result of the second set of beams from the model according to the first measurement result of the first set of beams and the first configuration information.

[0334] In some embodiments, the first configuration information can include an identifier of the second resource set, and the first device can determine the second resource set according to the identifier of the second resource set.

[0335] In some embodiments, the first device can input the first measurement result of the first set of beams into the model, and predict the second set of beams in the second resource set through the model to obtain the prediction result.

[0336] In some embodiments, the prediction result can be a result of predicting the second set of beams in the second resource set.

[0337] In some embodiments, the second resource set can be used by the first device to predict quality information or beam index of the beams of the second set of beams through the model.

[0338] In step S2105, the second device sends second configuration information to the first device.

[0339] In some embodiments, the second configuration information includes but is not limited to any one of the following: an identifier of a third resource set, or an identifier of the third resource set and fourth indication information.

[0340] In some embodiments, the first device receives the second configuration information, and the second configuration information can include any one of the following: an identifier of a third resource set, or an identifier of the third resource set and fourth indication information.

[0341] In some embodiments, the second configuration information can include an identifier of a third resource set, and the identifier of the third resource set can be but is not limited to a name (such as a Chinese name or an English name) or an index number of the third resource set.

[0342] In some embodiments, the third resource set can be used in the configuration process of the first device.

[0343] In some embodiments, the third resource set can be used in the measurement process of the first device on the second set of beams.

[0344] In some embodiments, the third resource set can be the same as the second resource set, and the mapping relationship between the beam index and the second resource set is different from the mapping relationship between the beam index and the third resource set.

[0345] In some embodiments, the third resource set can be different from the second resource set.

[0346] In some embodiments, based on the identification of the third resource set, the second configuration information can further include fourth indication information, and the fourth indication information can be used to indicate the first device to send at least one of the following to the second device:

[0347] a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set;

[0348] a beam type of the first beam;

[0349] a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set.

[0350] In some embodiments, the report identifier can include a Chinese name or an English name of the report.

[0351] In some embodiments, the relationship between the report identifier and the third resource set can be a one-to-one or one-to-many correspondence relationship.

[0352] In some embodiments, the second device can receive at least one of the following according to the fourth indication information:

[0353] a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set;

[0354] a beam type of the first beam;

[0355] a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set.

[0356] In step S2106, the first device determines the third resource set according to the second configuration information, and performs measurement on the second beam set in the third resource set to obtain a second measurement result.

[0357] In some embodiments, the second configuration information can include an identification of the third resource set, and the first device can determine the third resource set according to the identification of the third resource set.

[0358] In some embodiments, the second measurement result can be a result of measurement on the second beam set in the third resource set.

[0359] In some embodiments, the second measurement result can include an identification of a second beam in the second beam set or quality information of the second beam, wherein the second beam can be a beam in the second beam set measured by the first device and whose quality information satisfies a preset requirement.

[0360] In some embodiments, the beam satisfying the preset requirement can be a beam corresponding to an optimal value of the quality information of the second beam set, and the optimal value can be a maximum value, for example, a beam with a maximum RSRP value in the second beam set can be determined as the beam satisfying the preset requirement.

[0361] In some embodiments, the first device can determine a measurement environment based on an RX beam hypothesis, and measure the second beam set in the third resource set based on the measurement environment. The RX beam hypothesis can include parameters such as signal-to-noise ratio, Doppler, and channel type, and the measurement environment can be adjusted by adjusting the conditions of each parameter. For example, the RX beam hypothesis can set the signal-to-noise ratio of the measurement environment to be high signal-to-noise ratio. By setting the above different measurement environments, more accurate second measurement results can be obtained, so as to accurately determine the accuracy of the model prediction result based on the second measurement result, and further accurately evaluate the model performance.

[0362] Step S2107, the first device sends the prediction result and the second measurement result to the second device.

[0363] In some embodiments, the second device can receive the prediction result and the second measurement result.

[0364] In some embodiments, if the third indication information is included in the first configuration information, the first device can further send the beam index and / or the beam type of the first beam to the second device according to the third indication information.

[0365] In some embodiments, if the fourth indication information is included in the second configuration information, the first device can further send at least one of the following to the second device according to the fourth indication information: the beam index of the first beam, which is the receiving beam for predicting the second beam set; the beam type of the first beam; the prediction result and the second measurement result; the report identifier corresponding to the prediction result; or the relationship between the report identifier and the third resource set.

[0366] Step S2108, the second device determines the prediction performance of the model based on the prediction result and the second measurement result.

[0367] In some embodiments, the difference between the prediction result and the second measurement result can be determined, and the prediction performance of the model can be determined according to the difference and a preset threshold.

[0368] In some embodiments, the prediction result can include first quality information of a beam predicted by a specific RX beam on the second beam set; the second measurement result can include second quality information of a beam measured by the specific RX beam on the second beam set. Further, a difference between the first quality information and the second quality information is determined. If the difference is greater than or equal to a preset threshold, it indicates that the quality information of the beam satisfying the preset requirement predicted by the model is different from the quality information of the beam satisfying the preset requirement actually measured by the first device, and at this time, it is determined that the prediction performance of the model does not meet the preset performance requirement. If the difference is less than the preset threshold, it indicates that the quality information of the beam satisfying the preset requirement predicted by the model is the same as the quality information of the beam satisfying the preset requirement actually measured by the first device, and at this time, it is determined that the prediction performance of the model meets the preset performance requirement.

[0369] In some embodiments, the prediction result can include first beam index of a beam predicted by a specific RX beam on the second beam set; the second measurement result can include second beam index of a beam measured by the specific RX beam on the second beam set. Further, it is determined whether the first beam index and the second beam index are the same. If the first beam index and the second beam index are the same, it indicates that the beam satisfying the preset requirement predicted by the model is the same as the beam satisfying the preset requirement actually measured by the first device, and at this time, the prediction performance of the model meets the preset performance requirement. Correspondingly, if the first beam index and the second beam index are different, it indicates that the beam satisfying the preset requirement predicted by the model is different from the beam satisfying the preset requirement actually measured by the first device, and at this time, it is determined that the prediction performance of the model does not meet the preset performance requirement.

[0370] In some embodiments, the second device can send the prediction performance of the model to the first device.

[0371] In some embodiments, the second device can further send alarm information to the first device when the prediction performance of the model does not meet the preset performance requirement, and the alarm information is used to indicate that the prediction performance of the model of the first device does not meet the preset performance requirement.

[0372] In some embodiments, the switching of the model is performed when the performance of the model does not meet the requirement. Optionally, the first device can use other models meeting the preset performance requirement to predict the beam.

[0373] In some embodiments, the "obtaining", "acquiring", "getting", "receiving", "transmitting", "bidirectional transmitting", "sending and / or receiving" involved in the above embodiments can be replaced with each other, which can be interpreted as receiving from other subjects, obtaining from protocols, obtaining from higher layers, processing by itself, and various meanings such as autonomous implementation.

[0374] It should be noted that the beam measurement and model performance evaluation method involved in the embodiments of the present disclosure can include at least one of steps S2101-S2108.

[0375] For example, steps S2101-S2108 can be implemented as independent embodiments; steps S2102-S2106 can be implemented as independent embodiments; steps S2102-S2106 can be implemented as independent embodiments; steps S2102-S2108 can be implemented as independent embodiments; and steps S2107 and S2108 can be implemented as independent embodiments.

[0376] In some embodiments, steps S2101, S2107, and S2108 are optional, and one or more of these steps can be omitted or replaced in different embodiments.

[0377] In the embodiments of the present disclosure, the first device can obtain the prediction result of the second beam set through the model, and obtain the second measurement result of the second beam set through measurement, and send the prediction result and the second measurement result to the second device, so that the second device can conveniently and quickly determine the prediction performance of the model according to the prediction result and the second measurement result. By determining the prediction performance of the model, the model can be ensured to accurately predict the measurement result of the remaining beams in the second device, so as to avoid the first device from measuring each beam or beam set of the second device, thereby saving the resources of the first device.

[0378] Referring to FIG. 2d, FIG. 2d is an exemplary interactive schematic diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure. As shown in FIG. 2d, the beam measurement and model performance evaluation method includes the following steps:

[0379] In step S2401, the first device sends the model capability of the model to the second device.

[0380] In some embodiments, the model capability includes, but is not limited to, any one of the following model capabilities: an identifier of the model capability, or first indication information and second indication information.

[0381] The optional implementation of step S2401 can refer to the optional implementation of step S2101 of FIG. 2a and other associated parts in the embodiments involved in FIG. 2a, which will not be described here.

[0382] In step S2402, the second device sends third configuration information to the first device.

[0383] In some embodiments, the third configuration information comprises any one of the following: an identity of the first resource set, an identity of the second resource set, and an identity of the third resource set, or an identity of the first resource set, an identity of the second resource set, an identity of the third resource set, and the fifth indication information.

[0384] In some embodiments, the first device can receive third configuration information, which can comprise an identity of the first resource set, an identity of the second resource set, and an identity of the third resource set.

[0385] It should be noted that the "identity of the first resource set" and the "identity of the second resource set" in step S2402 can refer to the optional implementation of the "identity of the first resource set" and the "identity of the second resource set" in step S2102 of FIG. 2a, the "identity of the third resource set" in step S2402 can refer to the optional implementation of the "identity of the third resource set" in step S2105 of FIG. 2a, and other related parts in the embodiments involved in FIG. 2, which will not be repeated here.

[0386] In some embodiments, the first resource set and the second resource set can be the same.

[0387] In some embodiments, when the first resource set and the second resource set are the same, the third configuration information can comprise an identity of the first resource set and a use of the first resource set, without comprising an identity of the second resource set, wherein the use of the first resource set can comprise: measuring the first beam set, and predicting the second beam set.

[0388] In some embodiments, the second resource set and the third resource set can be the same.

[0389] In some embodiments, when the second resource set and the third resource set are the same, the third configuration information can comprise an identity of the second resource set and a use of the second resource set, without comprising an identity of the third resource set, wherein the use of the second resource set can comprise: measuring the second beam set, and predicting the second beam set.

[0390] In some embodiments, the first device can receive third configuration information, which can comprise an identity of the first resource set, an identity of the second resource set, an identity of the third resource set, and the fifth indication information.

[0391] In some embodiments, the fifth indication information can be used to instruct the first device to send at least one of the following to the second device: a beam index of the first beam, the first beam being a receiving beam for predicting the second beam set; a beam type of the first beam; a prediction result and a second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set.

[0392] It should be noted that the "first beam", "beam index", "beam type" in step S2402 can refer to the optional implementation of the "first beam", "beam index", "beam type" in step S2102 of FIG. 2a, the "prediction result" can refer to the optional implementation of the "prediction result" in step S2101 of FIG. 2a, the "reporting identifier" can refer to the optional implementation of the "reporting identifier" in step S2105 of FIG. 2a, and other related parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0393] In step S2403, the first device determines a first resource set according to the third configuration information, and measures the first beam set in the first resource set to obtain a first measurement result.

[0394] In some embodiments, the third configuration information can include an identifier of the first resource set, and the first device can determine the first resource set according to the identifier of the first resource set.

[0395] In some embodiments, the third configuration information can include an identifier of the first resource set and a purpose of the first resource set, and the first device can determine the first resource set for measuring the first beam set according to the identifier of the first resource set and the purpose of the first resource set.

[0396] The optional implementation of step S2403 can refer to the optional implementation of step S2103 of FIG. 2a and other related parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0397] In step S2404, the first device obtains a prediction result of a second beam set through a model according to the first measurement result of the first beam set and the third configuration information.

[0398] In some embodiments, the third configuration information can include an identifier of the second resource set, and the first device can determine the second resource set according to the identifier of the second resource set.

[0399] In some embodiments, the third configuration information can include an identifier of the first resource set and a purpose of the first resource set, and the first device can determine the second resource set for predicting the second beam set according to the identifier of the first resource set and the purpose of the first resource set.

[0400] In some embodiments, the third configuration information can include an identifier of the second resource set and a purpose of the second resource set, and the first device can determine the second resource set for predicting the second beam set according to the identifier of the second resource set and the purpose of the second resource set.

[0401] In some embodiments, the first device can input the first measurement result of the first beam set into the model, and predict the second beam set in the second resource set by the model to obtain a prediction result.

[0402] The optional implementation of step S2404 can refer to the optional implementation of step S2104 in FIG. 2a and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0403] In step S2405, the first device determines a third resource set according to the third configuration information, and measures the second beam set in the third resource set to obtain a second measurement result.

[0404] In some embodiments, the third configuration information can include an identifier of the third resource set, and the first device can determine the third resource set according to the identifier of the third resource set.

[0405] In some embodiments, the third configuration information can include an identifier of the second resource set and a use of the second resource set, and the first device can determine the third resource set for measuring the second beam set according to the identifier of the second resource set and the use of the second resource set.

[0406] In step S2406, the first device sends the prediction result and the second measurement result to the second device.

[0407] In step S2407, the second device determines the prediction performance of the model according to the prediction result and the second measurement result.

[0408] The optional implementation of step S2406 and step S2407 can refer to the optional implementation of step S2107 and step S2108 in FIG. 2a and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0409] In the embodiments of the present disclosure, the first device can obtain the prediction result of the second beam set by the model and the second measurement result of the second beam set by measurement, and send the prediction result and the second measurement result to the second device, so that the second device can conveniently and quickly determine the prediction performance of the model according to the prediction result and the second measurement result. By determining the prediction performance of the model, the model can accurately predict the measurement result of the remaining beams in the second device, so as to avoid the first device from measuring each beam or beam set of the second device, thereby saving the resources of the first device. Moreover, the second device only needs to send the configuration information to the first device once, which reduces the interaction times between the first device and the second device, and is conducive to reducing the consumption of the resources of the first device.

[0410] Referring to FIG. 2e, FIG. 2e is an exemplary interaction schematic diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure. As shown in FIG. 2e, the beam measurement and model performance evaluation method includes the following steps.

[0411] In step S2501, the first device sends model capability of the model to the second device.

[0412] In some embodiments, the model capability includes, but is not limited to, any one of the following: an identification of the model capability, or the first indication information and the second indication information.

[0413] In step S2502, the second device sends first configuration information to the first device.

[0414] In some embodiments, the first configuration information includes, but is not limited to, any one of the following: an identification of the first resource set and an identification of the second resource set, or the identification of the first resource set, the identification of the second resource set, and the third indication information.

[0415] In step S2503, the first device determines the first resource set according to the first configuration information, and measures the first beam set in the first resource set to obtain a first measurement result.

[0416] In step S2504, the first device obtains a prediction result of a second beam set by the model according to the first measurement result of the first beam set and the first configuration information.

[0417] In step S2505, the second device sends second configuration information to the first device.

[0418] In some embodiments, the second configuration information includes, but is not limited to, any one of the following: an identification of the third resource set, or the identification of the third resource set and the fourth indication information.

[0419] In step S2506, the first device determines the third resource set according to the second configuration information, and measures the second beam set in the third resource set to obtain a second measurement result.

[0420] The optional implementation manners of steps S2501-S2506 can refer to the optional implementation manners of steps S2101-S2106 of FIG. 2a and other associated parts in the embodiments of FIG. 2a, which will not be described here.

[0421] In step S2507, the first device determines the prediction performance of the model according to the prediction result and the second measurement result.

[0422] In some embodiments, the first device can be provided with a test program which can be used to determine the prediction performance of the model.

[0423] In some embodiments, the test program can also be used to analyze the accuracy of the prediction performance of the model, for example, the test program can design a test program for beam accuracy evaluation based on artificial intelligence.

[0424] In some embodiments, the first device needs to maintain the consistency of the RX beam when determining the prediction performance of the model. For example, the first device can determine that the best RX beam is the first beam based on the first measurement result, and if the first device predicts the second beam set based on the first beam through the model to obtain a prediction result; the first device also needs to measure the second beam set based on the first beam to obtain a second measurement result, to ensure the consistency of the RX beam when determining the prediction performance of the model.

[0425] The optional implementation of "the first device determines the prediction performance of the model according to the prediction result and the second measurement result" in step S2507 can refer to the optional implementation of "the second device determines the prediction performance of the model according to the prediction result and the second measurement result" in step S2108 of FIG. 2a and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0426] In some embodiments, the first device can send the determined prediction performance of the model to the second device.

[0427] In some embodiments, the first device can also optimize and train the model in the first device when the prediction performance of the model does not meet the preset performance requirement, until the prediction performance of the model meets the preset performance requirement.

[0428] In the embodiments of the present disclosure, the prediction result and the second measurement result of the second beam set can be obtained, and then the prediction performance of the model can be determined simply and quickly based on the prediction result and the second measurement result. By determining the prediction performance of the model, the model can accurately predict the measurement results of the remaining beams in the second device, and the first device does not need to measure each beam or beam set in the second device, thereby saving the resources of the first device.

[0429] Referring to FIG. 2f, FIG. 2f is an exemplary interactive schematic diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure. As shown in FIG. 2f, the beam measurement and model performance evaluation method includes the following steps:

[0430] In step S2601, the first device sends the model capability of the model to the second device.

[0431] In some embodiments, the model capability includes but is not limited to any one of the following: an identifier of the model capability, or first indication information and second indication information.

[0432] In step S2602, the second device sends third configuration information to the first device.

[0433] In some embodiments, the third configuration information comprises, but is not limited to, any one of the following: an identity of the first resource set, an identity of the second resource set, and an identity of the third resource set, or an identity of the first resource set, an identity of the second resource set, an identity of the third resource set, and the fifth indication information.

[0434] At step S2603, the first device determines the first resource set according to the third configuration information, and measures the first beam set in the first resource set to obtain a first measurement result.

[0435] At step S2604, the first device obtains a prediction result of the second beam set by the model according to the first measurement result of the first beam set and the third configuration information.

[0436] At step S2605, the first device measures the second beam set in the third resource set according to the third configuration information to obtain a second measurement result.

[0437] The optional implementation manners of steps S2601-S2605 can be referred to the optional implementation manners of steps S2401-S2405 of FIG. 2d and other associated parts in the embodiments related to FIG. 2d, which will not be described herein.

[0438] At step S2606, the first device determines the prediction performance of the model according to the prediction result and the second measurement result.

[0439] The optional implementation manner of “the first device determines the prediction performance of the model according to the prediction result and the second measurement result” in step S2606 can be referred to the optional implementation manner of “the second device determines the prediction performance of the model according to the prediction result and the second measurement result” in step S2108 of FIG. 2a and other associated parts in the embodiments related to FIG. 2a, which will not be described herein.

[0440] In the embodiments of the present disclosure, the second device can obtain the prediction result and the second measurement result, and then determine the prediction performance of the model based on the prediction result and the second measurement result. By determining the prediction performance of the model, the model can accurately predict the measurement results of the remaining beams in the second device, and the first device does not need to measure each beam or beam set in the second device, thereby saving the resources of the first device. In addition, the second device only needs to send the configuration information to the first device once, which reduces the interaction times between the first device and the second device, and is conducive to reducing the consumption of the resources of the first device.

[0441] FIG. 3a is an exemplary flow diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure. The execution subject of the beam measurement and model performance evaluation method according to the embodiment of the present disclosure is a first device. It should be understood that the beam measurement and model performance evaluation method can be executed alone, in combination with any of the embodiments of the present disclosure or possible implementation manners of the embodiments, or in combination with any of the related technologies.

[0442] As shown in FIG. 3a, the beam measurement and model performance evaluation method includes the following steps:

[0443] In step S3101, a model capability of a model is sent to a second device.

[0444] In some embodiments, the model capability includes, but is not limited to, any of the following: an identification of the model capability, or the first indication information and the second indication information.

[0445] The optional implementation manner of step S3101 can refer to the optional implementation manner of step S2101 of FIG. 2a and other associated parts in the embodiments related to FIG. 2a, which will not be repeated here.

[0446] In some embodiments, the first device can send the model capability of the model to the second device, but is not limited thereto, and can also send the model capability of the model to other subjects.

[0447] In some embodiments, the first device can send the model capability of the updated model to the second device when the model capability of the model is updated.

[0448] In some embodiments, the model capability can be used to indicate the input and / or output of the model of the second device.

[0449] In some embodiments, the model capability can be used to indicate that the input of the model of the second device is the first input or the second input, and the output of the model is the first output or the second output.

[0450] In step S3102, first configuration information is acquired.

[0451] In some embodiments, the first configuration information includes, but is not limited to, the identification of the first resource set and the identification of the second resource set, or the identification of the first resource set, the identification of the second resource set, and the third indication information.

[0452] The optional implementation manner of step S3102 can refer to the optional implementation manner of step S2102 of FIG. 2 and other associated parts in the embodiments related to FIG. 2a, which will not be repeated here.

[0453] In some embodiments, the first device receives the first configuration information sent by the second device, but is not limited thereto, and can also receive the first configuration information sent by other subjects.

[0454] In step S3103, the first resource set is determined according to the first configuration information, and the first beam set is measured in the first resource set to obtain the first measurement result.

[0455] In some embodiments, the first device can send the first measurement result to the second device, but is not limited thereto, and can also send the first measurement result to other subjects.

[0456] In step S3104, the prediction result of the second beam set is obtained by a model according to the first measurement result of the first beam set and the first configuration information.

[0457] In some embodiments, the first device can send the prediction result to the second device, but is not limited thereto, and can also send the prediction result to other subjects.

[0458] The optional implementation of step S3103 and step S3104 can refer to the optional implementation of step S2103 and step S2104 of FIG. 2 and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0459] In step S3105, the second configuration information is obtained.

[0460] In some embodiments, the second configuration information includes but is not limited to at least one of the following: the identification of the third resource set, or the identification of the third resource set and the fourth indication information.

[0461] The optional implementation of step S3105 can refer to the optional implementation of step S2105 of FIG. 2 and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0462] In some embodiments, the first device receives the second configuration information sent by the second device, but is not limited thereto, and can also receive the second configuration information sent by other subjects.

[0463] In step S3106, the third resource set is determined according to the second configuration information, and the second beam set is measured in the third resource set to obtain the second measurement result.

[0464] In step S3107, the prediction result and the second measurement result are sent to the second device.

[0465] The optional implementation of step S3106 and step S3107 can refer to the optional implementation of step S2106 and step S2107 of FIG. 2 and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0466] In some embodiments, the first device can send the prediction result and the second measurement result to the second device, but is not limited thereto, and can also send the prediction result and the second measurement result to other subjects.

[0467] In some embodiments, the first device can send the prediction result and the second measurement result to the second device in a separate sending manner.

[0468] In some embodiments, the first device can also send the prediction result and the second measurement result to the second device in a whole packaging manner.

[0469] In the embodiments of the present disclosure, the first device can obtain the prediction result of the second beam set through the model and the second measurement result of the second beam set through measurement, and send the prediction result and the second measurement result to the second device, so that the second device can conveniently and quickly determine the prediction performance of the model according to the prediction result and the second measurement result, and by determining the prediction performance of the model, the model can be ensured to accurately predict the measurement result of the remaining beams in the second device, so as to avoid the first device from measuring each beam or beam set of the second device, thereby saving the resources of the first device.

[0470] FIG. 3b is an exemplary flow diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure. The embodiments of the present disclosure relate to the execution subject of the beam measurement and model performance evaluation method being a first device. It should be understood that the beam measurement and model performance evaluation method can be executed alone, can be executed in combination with any embodiment or possible implementation manner in the present disclosure, and can also be executed in combination with any technical solution in the related art.

[0471] As shown in FIG. 3b, the beam measurement and model performance evaluation method includes the following steps:

[0472] Step S3201, sending a model capability of the model to a second device.

[0473] In some embodiments, the model capability includes but is not limited to any one of the following: an identification of the model capability, or first indication information and second indication information.

[0474] The optional implementation manner of step S3201 can refer to the optional implementation manner of step S2101 in FIG. 2a and other associated parts in the embodiments involved in FIG. 2a, which will not be described herein again.

[0475] Step S3202, obtaining third configuration information.

[0476] In some embodiments, the third configuration information comprises, but is not limited to, at least one of the following: an identity of the first resource set, an identity of the second resource set, and an identity of the third resource set, or an identity of the first resource set, an identity of the second resource set, an identity of the third resource set, and the fifth indication information.

[0477] The optional implementation of step S3202 can refer to the optional implementation of step S2402 in FIG. 2d and other associated parts in the embodiments involved in FIG. 2d, which will not be repeated here.

[0478] In some embodiments, the first device receives the third configuration information sent by the second device, but is not limited thereto, and can also receive the third configuration information sent by other subjects.

[0479] In some embodiments, the first device can obtain the third configuration information, which comprises: an identity of the first resource set, a use of the first resource set, and an identity of the third resource set, wherein the use of the first resource set can comprise: measuring the first beam set, and predicting the second beam set.

[0480] In some embodiments, the first device can obtain the third configuration information, which comprises: an identity of the first resource set, an identity of the second resource set, and a use of the second resource set, wherein the use of the second resource set can comprise: measuring the second beam set, and predicting the second beam set.

[0481] Step S3203: determining the first resource set according to the third configuration information, and measuring the first beam set in the first resource set to obtain a first measurement result.

[0482] Step S3204: obtaining a prediction result of the second beam set by the model according to the first measurement result of the first beam set and the third configuration information.

[0483] The optional implementation of steps S3203 and S3204 can refer to the optional implementation of steps S2403 and S2404 in FIG. 2d and other associated parts in the embodiments involved in FIG. 2d, which will not be repeated here.

[0484] In some embodiments, the first device can determine the second resource set according to the third configuration information; the first device can also input the first measurement result of the first beam set into the model, and predict the second beam set in the second resource set by the model to obtain a prediction result.

[0485] In some embodiments, the third configuration information can comprise an identity of the first resource set and a use of the first resource set, and the first device can determine the second resource set for predicting the second beam set according to the identity of the first resource set and the use of the first resource set.

[0486] In some embodiments, the third configuration information can comprise an identity of the second resource set and a use of the second resource set, and the first device can determine the second resource set for predicting the second beam set according to the identity of the second resource set and the use of the second resource set.

[0487] In step S3205, the third resource set is determined according to the third configuration information, and the second beam set is measured in the third resource set to obtain a second measurement result.

[0488] The optional implementation of step S3205 can refer to the optional implementation of step S2405 in FIG. 2d and other associated parts in the embodiments related to FIG. 2d, which will not be described here.

[0489] In some embodiments, the third configuration information can comprise an identity of the second resource set and a use of the second resource set, and the first device can determine the third resource set for measuring the second beam set according to the identity of the second resource set and the use of the second resource set.

[0490] In step S3206, the prediction result and the second measurement result are sent to the second device.

[0491] The optional implementation of step S3206 can refer to the optional implementation of step S2406 in FIG. 2d and other associated parts in the embodiments related to FIG. 3a, which will not be described here.

[0492] In the embodiments of the present disclosure, the first device can obtain the prediction result of the second beam set through the model and obtain the second measurement result of the second beam set through the measurement, and send the prediction result and the second measurement result to the second device, so that the second device can conveniently and quickly determine the prediction performance of the model according to the prediction result and the second measurement result. By determining the prediction performance of the model, the model can accurately predict the measurement result of the remaining beams in the second device, so as to avoid the first device from measuring each beam or beam set of the second device, thereby saving the resources of the first device. Moreover, the second device only needs to send the configuration information to the first device once, thereby reducing the interaction times between the first device and the second device, which is conducive to reducing the consumption of the resources of the first device.

[0493] FIG. 3c is an exemplary flow diagram of a method for beam measurement and model performance evaluation, according to an embodiment of the present disclosure. The method for beam measurement and model performance evaluation is performed by a first device. It should be understood that the method for beam measurement and model performance evaluation can be performed alone, in combination with any embodiment or possible implementation of the embodiments of the present disclosure, or in combination with any technical solution in the related art.

[0494] As shown in FIG. 3c, the method for beam measurement and model performance evaluation includes the following steps:

[0495] In step S3301, the model capability of the model is sent to a second device.

[0496] In some embodiments, the model capability includes, but is not limited to, at least one of the following: an identification of the model capability, or the first indication information and the second indication information.

[0497] In step S3302, first configuration information is obtained.

[0498] In some embodiments, the first configuration information includes, but is not limited to, at least one of the following: an identification of the first resource set and an identification of the second resource set, or the identification of the first resource set, the identification of the second resource set, and the third indication information.

[0499] In step S3303, the first resource set is determined according to the first configuration information, and a first beam set is measured in the first resource set to obtain a first measurement result.

[0500] In step S3304, a prediction result of a second beam set is obtained by the model according to the first measurement result of the first beam set and the first configuration information.

[0501] In step S3305, second configuration information is obtained.

[0502] In some embodiments, the second configuration information includes, but is not limited to, at least one of the following: an identification of the third resource set, or the identification of the third resource set and the fourth indication information.

[0503] In step S3306, the third resource set is determined according to the second configuration information, and a second beam set is measured in the third resource set to obtain a second measurement result.

[0504] The optional implementation of steps S3301-S3306 can be referred to the optional implementation of steps S2101-S2106 of FIG. 2a and other related parts of the embodiments involved in FIG. 2a, which will not be described here.

[0505] Step S3307. Determine the prediction performance of the model according to the prediction result and the second measurement result.

[0506] The optional implementation of "the first device determines the prediction performance of the model according to the prediction result and the second measurement result" in step S3307 can refer to the optional implementation of "the second device determines the prediction performance of the model according to the prediction result and the second measurement result" in step S2108 of FIG. 2a and other related parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0507] In some embodiments, the first device can further send the prediction performance of the model after determining the prediction performance of the model.

[0508] In some embodiments, the first device can send the prediction performance of the model to the second device, but is not limited thereto, and can also send the prediction performance of the model to other subjects.

[0509] In the embodiments of the present disclosure, the prediction result and the second measurement result of the second beam set can be obtained, and then the prediction performance of the model can be determined simply and quickly based on the prediction result and the second measurement result. By determining the prediction performance of the model, the model can be ensured to accurately predict the measurement results of the remaining beams of the second device, and the first device needs not to measure each beam or beam set of the second device, thereby saving the resources of the first device.

[0510] FIG. 3d is an exemplary flow diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure. The embodiments of the present disclosure relate to the execution subject of the beam measurement and model performance evaluation method being the first device. It should be understood that the beam measurement and model performance evaluation method can be executed alone, or in combination with any embodiment or possible implementation manner in the present disclosure, or in combination with any technical solution in the related art.

[0511] As shown in FIG. 3d, the beam measurement and model performance evaluation method includes the following steps:

[0512] Step S3401. Send the model capability of the model to the second device.

[0513] In some embodiments, the model capability includes, but is not limited to, any one of the following: an identifier of the model capability, or first indication information and second indication information.

[0514] Step S3402. Obtain third configuration information.

[0515] In some embodiments, the third configuration information comprises, but is not limited to, at least one of the following: an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set, or an identifier of the first resource set, an identifier of the second resource set, an identifier of the third resource set, and the fifth indication information.

[0516] In step S3403, the first resource set is determined according to the third configuration information, and the first beam set is measured in the first resource set to obtain a first measurement result.

[0517] In step S3404, the predicted result of the second beam set is obtained by the model according to the first measurement result of the first beam set and the third configuration information.

[0518] In step S3405, the third resource set is determined according to the third configuration information, and the second beam set is measured in the third resource set to obtain a second measurement result.

[0519] The optional implementation of steps S3401-S3405 can refer to the optional implementation of steps S2401-S2405 of FIG. 2d and other associated parts of the embodiments involved in FIG. 2d, which will not be repeated here.

[0520] In step S3406, the prediction performance of the model is determined according to the predicted result and the second measurement result.

[0521] The optional implementation of “the first device determines the prediction performance of the model according to the predicted result and the second measurement result” in step S3406 can refer to the optional implementation of “the second device determines the prediction performance of the model according to the predicted result and the second measurement result” in step S2108 of FIG. 2a and other associated parts of the embodiments involved in FIG. 2a, which will not be repeated here.

[0522] In the embodiments of the present disclosure, the predicted result of the second beam set and the second measurement result can be obtained, and then the prediction performance of the model can be determined simply and quickly based on the predicted result and the second measurement result. By determining the prediction performance of the model, the model can accurately predict the measurement results of the remaining beams of the second device, and the first device does not need to measure each beam or beam set of the second device, thereby saving the resources of the first device. Moreover, the second device only needs to send configuration information to the first device once, which reduces the number of interactions between the first device and the second device, and is conducive to reducing the consumption of resources of the first device.

[0523] FIG. 4a is an exemplary flow diagram of a method for beam measurement and model performance evaluation according to an embodiment of the present disclosure. The method for beam measurement and model performance evaluation according to the embodiment of the present disclosure is performed by a second device. It should be understood that the method for beam measurement and model performance evaluation can be performed alone, in combination with any of the embodiments of the present disclosure or possible implementation manners of the embodiments, or in combination with any of the related technologies.

[0524] As shown in FIG. 4a, the method for beam measurement and model performance evaluation includes the following steps:

[0525] In step S4101, a model capability of a model is acquired.

[0526] In some embodiments, the model capability includes, but is not limited to, any one of the following: an identification of the model capability, or first indication information and second indication information.

[0527] The optional implementation manner of step S4101 can refer to the optional implementation manner of step S2101 in FIG. 2a and other associated parts in the embodiments related to FIG. 2a, which will not be described here.

[0528] In some embodiments, the second device can receive the model capability of the model sent by the first device, but is not limited thereto, and can also receive the model capability of the model sent by another subject.

[0529] In some embodiments, the second device can also receive the model capability of the updated model sent by the first device.

[0530] In step S4102, first configuration information is sent to the first device.

[0531] In some embodiments, the first configuration information includes, but is not limited to, at least one of the following: an identification of a first resource set and an identification of a second resource set, or an identification of the first resource set, an identification of the second resource set, and third indication information.

[0532] The optional implementation manner of step S4102 can refer to the optional implementation manner of step S2102 in FIG. 2a and other associated parts in the embodiments related to FIG. 2a, which will not be described here.

[0533] In some embodiments, the second device can send the first configuration information to the first device, but is not limited thereto, and can also send the first configuration information to another subject.

[0534] In some embodiments, the second device can receive first response information of the first configuration information fed back by the first device, and the first response information is used to indicate whether the first device successfully receives the first configuration information.

[0535] Step S4103: obtaining the prediction result.

[0536] The prediction result can be a result of predicting, by the first device, the second beam set through a model in the first device according to the first measurement result of the first beam set.

[0537] In some embodiments, the second device can receive the prediction result sent by the first device, but is not limited thereto, and can also receive the prediction result sent by another subject.

[0538] In the embodiments of the present disclosure, the process of "predicting, by the first device, the second beam set through a model in the first device according to the first measurement result of the first beam set" can refer to the optional implementation in step S2104 of FIG. 2a and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0539] Step S4104: sending, to the first device, second configuration information.

[0540] In some embodiments, the second configuration information includes but is not limited to at least one of the following: an identifier of a third resource set, or an identifier of the third resource set and fourth indication information.

[0541] The optional implementation of step S4104 can refer to the optional implementation of step S2105 of FIG. 2a and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0542] In some embodiments, the second device can send the second configuration information to the first device, but is not limited thereto, and can also send the second configuration information to another subject.

[0543] In some embodiments, the second device can receive second response information of the second configuration information fed back by the first device, and the second response information is used to indicate whether the first device successfully receives the second configuration information.

[0544] Step S4105: obtaining a second measurement result.

[0545] The second measurement result can be obtained by the first device through measuring the second beam set.

[0546] In some embodiments, the second device can receive the second measurement result sent by the first device, but is not limited thereto, and can also receive the second measurement result sent by another subject.

[0547] In the embodiments of the present disclosure, the process of "measuring, by the first device, the second beam set to obtain the second measurement result" can refer to the optional implementation in step S2106 of FIG. 2a and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0548] In step S4106, the prediction performance of the model is determined according to the prediction result and the second measurement result.

[0549] The optional implementation of step S4104 can refer to the optional implementation of step S2108 in FIG. 2a and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0550] In some embodiments, the second device can send the prediction performance of the model to the first device, but is not limited thereto, and can also send the prediction performance of the model to other subjects.

[0551] In some embodiments, step S4106 can be omitted, and the second device can obtain the prediction performance of the model sent by the first device, but is not limited thereto, and can also receive the prediction performance of the model sent by other subjects.

[0552] It should be noted that the beam measurement and model performance evaluation method involved in the embodiments of the present disclosure can include at least one of steps S4101 to S4106.

[0553] For example, steps S4102 to S4106 can be implemented as an independent embodiment; steps S4101, S4102 and S4104 can be implemented as an independent embodiment; steps S4102 and S4104 can be implemented as an independent embodiment; steps S4103, S4105 and S4106 can be implemented as an independent embodiment; steps S4101, S4103, S4105 and S4106 can be implemented as an independent embodiment.

[0554] In some embodiments, steps S4101, S4102 and S4104 are optional, and one or more of these steps can be omitted or replaced in different embodiments.

[0555] In some embodiments, steps S4103 and S4104 can be exchanged in order or executed simultaneously.

[0556] In some embodiments, steps S4103 and S4105 can be exchanged in order or executed simultaneously.

[0557] FIG. 4b is an exemplary flow diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure. The execution subject of the beam measurement and model performance evaluation method according to the embodiment of the present disclosure is the second device. It should be understood that the beam measurement and model performance evaluation method can be executed alone, in combination with any of the embodiments of the present disclosure or possible implementation manners of the embodiments, or in combination with any of the related technical solutions.

[0558] As shown in FIG. 4b, the beam measurement and model performance evaluation method includes the following steps:

[0559] In step S4201, the model capability of the model is obtained.

[0560] In some embodiments, the model capability includes, but is not limited to, at least one of the following: an identification of the model capability, or the first indication information and the second indication information.

[0561] The optional implementation manner of step S4201 can refer to the optional implementation manner of step S4101 in FIG. 4a and other related parts in the embodiments related to FIG. 4a, which will not be described here.

[0562] In step S4202, the third configuration information is sent to the first device.

[0563] In some embodiments, the third configuration information includes, but is not limited to, at least one of the following: the identification of the first resource set, the identification of the second resource set, and the identification of the third resource set, or the identification of the first resource set, the identification of the second resource set, the identification of the third resource set, and the fifth indication information.

[0564] The optional implementation manner of step S4102 can refer to the optional implementation manner of step S2402 in FIG. 2d and other related parts in the embodiments related to FIG. 2d, which will not be described here.

[0565] In some embodiments, the second device can send the third configuration information to the first device, but is not limited thereto, and can also send the third configuration information to other subjects.

[0566] In some embodiments, the second device can receive third response information of the third configuration information fed back by the first device, and the third response information is used to indicate whether the first device successfully receives the third configuration information.

[0567] In step S4203, the prediction result is obtained.

[0568] The prediction result can be a result of predicting the second beam set by the model in the first device according to the first measurement result of the first beam set.

[0569] The optional implementation of step S4203 can refer to the optional implementation of step S4106 in FIG. 4a, and other associated parts in the embodiments involved in FIG. 4a, which will not be repeated here.

[0570] In step S4204, a second measurement result is obtained.

[0571] The second measurement result can be obtained by the first device performing measurement on the second set of beams.

[0572] The optional implementation of step S4204 can refer to the optional implementation of step S4105 in FIG. 4a, and other associated parts in the embodiments involved in FIG. 4a, which will not be repeated here.

[0573] In step S4205, a prediction performance of the model is determined according to the prediction result and the second measurement result.

[0574] The optional implementation of step S4205 can refer to the optional implementation of step S4106 in FIG. 4a, and other associated parts in the embodiments involved in FIG. 4a, which will not be repeated here.

[0575] It should be noted that the beam measurement and model performance evaluation method involved in the embodiments of the present disclosure can include at least one of steps S4201 to S4205.

[0576] For example, steps S4202 to S4205 can be implemented as an independent embodiment; steps S4201 and S4202 can be implemented as an independent embodiment; steps S4201, S4203 to S4205 can be implemented as an independent embodiment; steps S4203 to S4205 can be implemented as an independent embodiment.

[0577] In some embodiments, steps S4201 and S4202 are optional, and one or more of these steps can be omitted or replaced in different embodiments.

[0578] In some embodiments, steps S4203 and S4204 can be exchanged in order or performed simultaneously.

[0579] FIG. 4c is an exemplary flow diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure. The execution subject of the beam measurement and model performance evaluation method according to the embodiments of the present disclosure is a second device. It should be understood that the beam measurement and model performance evaluation method can be executed independently, or in combination with any embodiment or possible implementation of the embodiments in the present disclosure, or in combination with any technical solution in the related art.

[0580] As shown in FIG. 4c, the beam measurement and model performance evaluation method includes the following steps:

[0581] In step S4301, the model capability of the model is obtained.

[0582] Optional implementation of step S4301 can refer to optional implementation of step S4101 in FIG. 4a and other associated parts in the embodiments involved in FIG. 4a, which will not be repeated here.

[0583] In some embodiments, the model capability of the model can include an identification of the model capability.

[0584] In some embodiments, the model capability of the model can include first indication information and second indication information.

[0585] It should be noted that the terms and optional implementations of “model capability”, “identification of the model capability”, “first indication information” and “second indication information” can refer to the optional implementations of “model capability”, “identification of the model capability”, “first indication information” and “second indication information” in step S2101 in FIG. 2a and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0586] In step S4302, the first configuration information is sent to the first device.

[0587] Optional implementation of step S4301 can refer to optional implementation of step S4102 in FIG. 4a and other associated parts in the embodiments involved in FIG. 4a, which will not be repeated here.

[0588] In some embodiments, optional implementation of “first configuration information” can refer to optional implementation of “first configuration information” in step S2102 in FIG. 2a and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0589] In step S4303, the prediction result is obtained.

[0590] Optional implementation of step S4303 can refer to optional implementation of step S4103 in FIG. 4a and other associated parts in the embodiments involved in FIG. 4a, which will not be repeated here.

[0591] In step S4304, the second configuration information is sent to the first device.

[0592] Optional implementation of step S4304 can refer to optional implementation of step S4104 in FIG. 4a and other associated parts in the embodiments involved in FIG. 4a, which will not be repeated here.

[0593] In some embodiments, the optional implementation of the second configuration information can refer to the optional implementation of the second configuration information in step S2105 of FIG. 2a, and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0594] In some embodiments, the first device determines a third resource set according to the second configuration information, measures the second set of beams in the third resource set to obtain a second measurement result, and determines the prediction performance of the model according to the prediction result and the second measurement result.

[0595] In some embodiments, the implementation of the first device determining a third resource set according to the second configuration information, measuring the second set of beams in the third resource set to obtain a second measurement result can refer to the optional implementation of step S2506 of FIG. 2e, and other associated parts in the embodiments involved in FIG. 2e, which will not be repeated here.

[0596] The implementation of the first device determining the prediction performance of the model according to the prediction result and the second measurement result can refer to the optional implementation of step S2507 of FIG. 2e, and other associated parts in the embodiments involved in FIG. 2e, which will not be repeated here.

[0597] FIG. 4d is an exemplary flow diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure. The execution subject of the beam measurement and model performance evaluation method according to the embodiments of the present disclosure is the second device. It should be understood that the beam measurement and model performance evaluation method can be executed alone, or in combination with any embodiment or possible implementation of the embodiments in the present disclosure, or in combination with any technical solution in the related art.

[0598] As shown in FIG. 4d, the beam measurement and model performance evaluation method includes the following steps:

[0599] Step S4401, obtaining a model capability of the model.

[0600] The optional implementation of step S4401 can refer to the optional implementation of step S4301 of FIG. 4c, and other associated parts in the embodiments involved in FIG. 4c, which will not be repeated here.

[0601] Step S4402, sending third configuration information to the first device.

[0602] The optional implementation of step S4402 can refer to the optional implementation of step S4202 of FIG. 4b, and other associated parts in the embodiments involved in FIG. 4a, which will not be repeated here.

[0603] In some embodiments, the optional implementation of the "third configuration information" can refer to the optional implementation of the "third configuration information" in step S2402 of FIG. 2d and other associated parts in the embodiments involved in FIG. 2d, which will not be repeated here.

[0604] In some embodiments, the first device determines the first resource set according to the third configuration information, and measures the first beam set in the first resource set to obtain the first measurement result. The first device obtains the prediction result of the second beam set through the model according to the first measurement result of the first beam set and the third configuration information. The first device determines the prediction performance of the model according to the prediction result and the second measurement result.

[0605] In some embodiments, the implementation of the first device determining the first resource set according to the third configuration information and measuring the first beam set in the first resource set to obtain the first measurement result can refer to the optional implementation of step S2403 of FIG. 2d and other associated parts in the embodiments involved in FIG. 2d, which will not be repeated here.

[0606] In some embodiments, the implementation of the first device obtaining the prediction result of the second beam set through the model according to the first measurement result of the first beam set and the third configuration information can refer to the optional implementation of step S2404 of FIG. 2d and other associated parts in the embodiments involved in FIG. 2d, which will not be repeated here.

[0607] The optional implementation of the first device determining the prediction performance of the model according to the prediction result and the second measurement result can refer to the optional implementation of the "second device determining the prediction performance of the model according to the prediction result and the second measurement result" in step S2108 of FIG. 2a and other associated parts in the embodiments involved in FIG. 2a, which will not be repeated here.

[0608] FIG. 5a is an exemplary interaction schematic diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure. As shown in FIG. 5a, the embodiment of the present disclosure relates to a resource determination method, and the above method includes the following steps:

[0609] Step S5101, the first device obtains the prediction result of the second beam set through the model according to the first measurement result of the first beam set

[0610] The optional implementation of step S5101 can refer to the optional implementation of steps S2101-S2104 of FIG. 2a or steps S2401-S2404 of FIG. 2d and other associated parts in the embodiments involved in FIG. 2a or FIG. 2d, which will not be repeated here.

[0611] Step S5102, the first device measures the second beam set to obtain the second measurement result.

[0612] The optional implementation of step S5102 can refer to the optional implementation of steps S2105-S2106 in FIG. 2a, or the optional implementation of step S2405 in FIG. 2d, and other associated parts in the embodiments related to FIG. 2a or FIG. 2d, which will not be repeated here.

[0613] In step S5103, the first device sends the prediction result and the second measurement result to the second device.

[0614] The optional implementation of steps S5102 and S5103 can refer to the optional implementation of steps in FIG. 2a, and other associated parts in the embodiments related to FIG. 2a, which will not be repeated here.

[0615] In step S5104, the second device determines the prediction performance of the model according to the prediction result and the second measurement result.

[0616] The optional implementation of step S5104 can refer to the optional implementation of step S2108 in FIG. 2a, and other associated parts in the embodiments related to FIG. 2a, which will not be repeated here.

[0617] FIG. 5b is an exemplary flow diagram of a beam measurement and model performance evaluation method according to an embodiment of the present disclosure. The execution subject of the beam measurement and model performance evaluation method according to the embodiment of the present disclosure is a first device. It should be understood that the beam measurement and model performance evaluation method can be executed alone, or in combination with any embodiment or possible implementation of the embodiments in the present disclosure, or in combination with any technical solution in the related art.

[0618] As shown in FIG. 5b, the beam measurement and model performance evaluation method includes the following steps:

[0619] In step S5201, the first device obtains a prediction result of a second beam set by a model according to a first measurement result of a first beam set.

[0620] The optional implementation of step S5201 can refer to the optional implementation of steps S2101-S2104 in FIG. 2a, or the optional implementation of steps S2401-S2404 in FIG. 2d, and other associated parts in the embodiments related to FIG. 2a or FIG. 2d, which will not be repeated here.

[0621] In step S5202, the first device measures the second beam set to obtain a second measurement result.

[0622] The optional implementation of step S5202 can refer to steps S2105-S2106 in FIG. 2a, or the optional implementation of step S2405 in FIG. 2d, and other associated parts in the embodiments related to FIG. 2a or FIG. 2d, which are not described herein again.

[0623] In step S5203, the first device determines the prediction performance of the model according to the prediction result and the second measurement result.

[0624] The optional implementation of "the first device determines the prediction performance of the model according to the prediction result and the second measurement result" in step S5203 can refer to the optional implementation of "the second device determines the prediction performance of the model according to the prediction result and the second measurement result" in step S2108 in FIG. 2a, and other associated parts in the embodiments related to FIG. 2a, which are not described herein again.

[0625] In some embodiments, the above method can include the method of the above-mentioned embodiments of the first device side, the second device side, and the like, which are not described herein again.

[0626] In the embodiments of the present disclosure, part or all of the steps, the optional implementation thereof, can be combined with part or all of the steps in other embodiments, or can be combined with the optional implementation of other embodiments.

[0627] The embodiments of the present disclosure also propose a device for implementing any of the above methods, for example, a device including units or modules for implementing each step performed by the first device in any of the above methods. For another example, another device is also proposed, including units or modules for implementing each step performed by the second device in any of the above methods.

[0628] It should be understood that the division of each unit or module in the above apparatus is only a logical function division, and all or part of them can be integrated into a physical entity or physically separated in actual implementation. In addition, the units or modules in the apparatus can be implemented in the form of processor calling software: for example, the apparatus includes a processor, the processor is connected with a memory, the memory stores instructions, and the processor calls the instructions stored in the memory to realize any of the above methods or realize the functions of each unit or module of the above apparatus, wherein the processor is a general processor such as a central processing unit (CPU) or a microprocessor, and the memory is a memory in the apparatus or a memory outside the apparatus. Alternatively, the units or modules in the apparatus can be implemented in the form of hardware circuit, and the functions of part or all of the units or modules can be realized by the design of hardware circuit. The above hardware circuit can be understood as one or more processors; for example, in one implementation, the above hardware circuit is an application-specific integrated circuit (ASIC), and the functions of part or all of the units or modules are realized by the design of the logical relationship of elements in the circuit; for another example, in another implementation, the above hardware circuit is a programmable logic device (PLD), and a field programmable gate array (FPGA) is taken as an example, which can include a large number of logic gate circuits, and the connection relationship between the logic gate circuits is configured by a configuration file, so as to realize the functions of part or all of the above units or modules. All units or modules of the above apparatus can be all implemented in the form of processor calling software, or all implemented in the form of hardware circuit, or part implemented in the form of processor calling software and the remaining part implemented in the form of hardware circuit.

[0629] In the embodiments of the present disclosure, the processor is a circuit with signal processing capability. In one implementation, the processor can be a circuit with instruction reading and running capability, such as a central processing unit (CPU), a microprocessor, a graphics processing unit (GPU) (which can be understood as a microprocessor), a digital signal processor (DSP), or the like. In another implementation, the processor can implement certain functions through a logical relationship of hardware circuits, and the logical relationship of the hardware circuits is fixed or can be reconfigured. For example, the processor is a hardware circuit implemented by an application-specific integrated circuit (ASIC) or a programmable logic device (PLD), such as an FPGA. In the reconfigurable hardware circuit, the processor loads a configuration document to implement the configuration of the hardware circuit. It can be understood that the processor loads instructions to implement the functions of the above part or all units or modules. In addition, the hardware circuit can also be designed for artificial intelligence, which can be understood as an ASIC, such as a neural network processing unit (NPU), a tensor processing unit (TPU), a deep learning processing unit (DPU), or the like.

[0630] FIG. 6a is an exemplary structural schematic diagram of a first device according to an embodiment of the present disclosure. As shown in FIG. 6a, the first device 6100 can include at least one of a processing module 6101, a transceiver module 6102, and the like.

[0631] In some embodiments, the processing module 6101 is configured to obtain, by a model, a prediction result of a second beam set according to a first measurement result of a first beam set.

[0632] The processing module 6101 is further configured to measure the second beam set to obtain a second measurement result, and the prediction result and the second measurement result are used to determine a prediction performance of the model.

[0633] In some embodiments, an input of the model includes the first measurement result.

[0634] An output of the model includes the prediction result.

[0635] In some embodiments, the first measurement result is:

[0636] quality information of the beams obtained by measuring the first set of beams through a specific RX beam; or

[0637] quality information of the beams obtained by measuring the first set of beams through full RX beam sweeping.

[0638] In some embodiments, the prediction result is:

[0639] at least one of quality information of the beams or a beam index of the beams in the second set of beams predicted through the specific RX beam; or

[0640] at least one of quality information of the beams or a beam index of the beams in the second set of beams predicted through full RX beam sweeping.

[0641] The beam index is used to indicate a beam in the second set of beams whose quality information meets a preset requirement.

[0642] In some embodiments, the specific RX beam is an RX beam in a preset direction.

[0643] In some embodiments, the transceiver 6102 is further configured to:

[0644] send, to the second device, a model capability of the model, the model capability being used to indicate an input and / or an output of the model.

[0645] In some embodiments, the model capability is used to indicate that the input of the model is a first input or a second input, and the output of the model is a first output or a second output, wherein

[0646] The first input is a first measurement result obtained by measuring the first set of beams through a specific RX beam.

[0647] The second input is a first measurement result obtained by measuring the first set of beams through full RX beam sweeping.

[0648] The first output is a prediction result obtained by predicting the second set of beams through a specific RX beam.

[0649] The second output is a prediction result obtained by predicting the second set of beams through full RX beam sweeping.

[0650] In some embodiments, the model capability is a first capability, a second capability, a third capability or a fourth capability, wherein

[0651] The first capability is used to indicate that the input of the model is the first input, and the output of the model is the first output.

[0652] The second capability is used to indicate that the input of the model is the first input, and the output of the model is the second output.

[0653] The third capability is used to indicate that the input of the model is the second input, and the output of the model is the second output.

[0654] The fourth capability is used to indicate that the input of the model is the second input, and the output of the model is the first output.

[0655] In some embodiments, the model capability includes first indication information and second indication information, wherein,

[0656] The first indication information is used to indicate that the input of the model is the first input or the second input.

[0657] The second indication information is used to indicate that the output of the model is the first output or the second output.

[0658] In some embodiments, the first measurement result is a result of measuring the first beam set in the first resource set.

[0659] The prediction result is a result of predicting the second beam set in the second resource set.

[0660] The second measurement result is a result of measuring the second beam set in the third resource set.

[0661] In some embodiments, the transceiver 6102 is further configured to receive first configuration information, and the first configuration information includes an identifier of the first resource set and an identifier of the second resource set.

[0662] In some embodiments, the first configuration information further includes third indication information, and the third indication information is used to indicate a beam index and / or a beam type of the first beam sent by the first device to the second device, wherein,

[0663] The first beam is a receiving beam for predicting the second beam set.

[0664] In some embodiments, the beam type is a specific beam type or a full beam type.

[0665] In some embodiments, the transceiver 6102 is further configured to:

[0666] receive second configuration information, and the second configuration information includes an identifier of a third resource set.

[0667] In some embodiments, the third resource set is the same as the second resource set, and a mapping relationship between the beam index and the second resource set is different from a mapping relationship between the beam index and the third resource set.

[0668] In some embodiments, the third resource set is different from the second resource set.

[0669] In some embodiments, the second configuration information further includes fourth indication information, the fourth indication information being used to instruct the first device to send at least one of the following to the second device:

[0670] a beam index of the first beam, the first beam being a receiving beam for predicting the second beam set;

[0671] a beam type of the first beam;

[0672] the prediction result and the second measurement result;

[0673] a report identifier corresponding to the prediction result; or

[0674] a relationship between the report identifier and the third resource set.

[0675] In some embodiments, the transceiver 6102 is further configured to: receive third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set.

[0676] In some embodiments, the first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set.

[0677] In some embodiments, the third configuration information further includes fifth indication information, the fifth indication information being used to instruct the first device to send at least one of the following to the second device:

[0678] a beam index of the first beam, the first beam being a receiving beam for predicting the second beam set;

[0679] a beam type of the first beam;

[0680] the prediction result and the second measurement result;

[0681] a report identifier corresponding to the prediction result; or

[0682] a relationship between the report identifier and the third resource set.

[0683] In some embodiments, the transceiver 6102 is further configured to: send the prediction result and the second measurement result to the second device.

[0684] In some embodiments, the method further includes: determining a prediction performance of the model according to the prediction result and the second measurement result.

[0685] Optionally, the transceiver 6202 is configured to perform at least one of the communication steps (e.g., steps S2101, S2107, S2401, S2406, S2501, S2601, S3101, S3102, S3105, S3107, S3201, S3202, S3206, S3301, S3302, S3305, S3401, S3402, S5103, but are not limited thereto) of transmitting and / or receiving performed by the first device in any of the above methods. Details are not described herein again.

[0686] The processing module 6101 is configured to perform at least one of the other steps (e.g., steps S2103, S2104, S2106, S2403-S2405, S2503, S2504, S2506, S2507, S2603-S2606, but are not limited thereto) performed by the first device in any of the above methods. Details are not described herein again.

[0687] FIG. 6b is a schematic structural diagram of a second device according to an embodiment of the present disclosure. As shown in FIG. 6b, the second device 6200 can include at least one of a transceiver 6201, a processing module 6202, and the like.

[0688] In some embodiments, the transceiver 6201 is configured to obtain a prediction result, the prediction result being a result of predicting, by a model in the first device, a second beam set according to a first measurement result of a first beam set.

[0689] The transceiver 6201 is further configured to obtain a second measurement result, the second measurement result being obtained by measuring, by the first device, the second beam set.

[0690] The processing module 6202 is configured to determine a prediction performance of the model according to the prediction result and the second measurement result.

[0691] In some embodiments, an input of the model includes the first measurement result.

[0692] An output of the model includes the prediction result.

[0693] In some embodiments, the first measurement result is:

[0694] quality information of a beam obtained by measuring the first beam set through a specific RX beam; or

[0695] quality information of a beam obtained by measuring the first beam set through full RX beam scanning.

[0696] In some embodiments, the prediction result is:

[0697] quality information of the beam or a beam index of the beam that predicts the second set of beams through the specific RX beam; or

[0698] quality information of the beam or a beam index of the beam that predicts the second set of beams through the full RX beam sweeping;

[0699] The beam index is used to indicate a beam in the second set of beams, quality information of which meets a preset requirement.

[0700] In some embodiments, the specific RX beam is an RX beam in a preset direction.

[0701] In some embodiments, the transceiver 6201 is further configured to receive a model capability of the model sent by the first device, the model capability being used to indicate an input and / or an output of the model.

[0702] In some embodiments, the model capability is used to indicate that the input of the model is a first input or a second input, and the output of the model is a first output or a second output, wherein the first input is a first measurement result obtained by measuring the first set of beams through the specific RX beam;

[0703] The second input is a first measurement result obtained by measuring the first set of beams through the full RX beam sweeping;

[0704] The first output is a prediction result obtained by predicting the second set of beams through the specific RX beam;

[0705] The second output is a prediction result obtained by predicting the second set of beams through the full RX beam.

[0706] In some embodiments, the model capability is a first capability, a second capability, a third capability or a fourth capability, wherein

[0707] The first capability is used to indicate that the input of the model is the first input, and the output of the model is the first output;

[0708] The second capability is used to indicate that the input of the model is the first input, and the output of the model is the second output;

[0709] The third capability is used to indicate that the input of the model is the second input, and the output of the model is the second output;

[0710] The fourth capability is used to indicate that the input of the model is the second input, and the output of the model is the first output.

[0711] In some embodiments, the model capability includes first indication information and second indication information, wherein

[0712] The first indication information is used to indicate that the input of the model is the first input or the second input.

[0713] The second indication information is used to indicate that the output of the model is the first output or the second output.

[0714] In some embodiments, the first measurement result is a result of measuring the first beam set in the first resource set.

[0715] The prediction result is a result of predicting the second beam set in the second resource set.

[0716] The second measurement result is a result of measuring the second beam set in the third resource set.

[0717] In some embodiments, the transceiver 6201 is further configured to: send first configuration information, the first configuration information including an identifier of the first resource set and an identifier of the second resource set.

[0718] In some embodiments, the first configuration information further includes third indication information, the third indication information being used to indicate that the first device sends a beam index and / or a beam type of the first beam to the second device, wherein,

[0719] The first beam is a receiving beam for predicting the second beam set.

[0720] In some embodiments, the beam type is a specific beam type or a full beam type.

[0721] In some embodiments, the transceiver 6201 is further configured to:

[0722] send second configuration information, the second configuration information including an identifier of a third resource set.

[0723] In some embodiments, the third resource set is the same as the second resource set, and a mapping relationship between the beam index and the second resource set is different from a mapping relationship between the beam index and the third resource set.

[0724] In some embodiments, the third resource set is different from the second resource set.

[0725] In some embodiments, the second configuration information further includes fourth indication information, the fourth indication information being used to indicate that the first device sends at least one of the following to the second device:

[0726] a beam index of the first beam, the first beam being a receiving beam for predicting the second beam set;

[0727] a beam type of the first beam;

[0728] the prediction result and the second measurement result;

[0729] a report identifier corresponding to the prediction result; or

[0730] a relationship between the report identifier and the third resource set.

[0731] In some embodiments, the transceiver 6201 is further configured to: transmit third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set.

[0732] In some embodiments, the first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set.

[0733] In some embodiments, the third configuration information further includes fifth indication information, the fifth indication information being used to instruct the first device to transmit at least one of the following to the second device:

[0734] a beam index of the first beam, the first beam being a receiving beam for predicting the second beam set;

[0735] a beam type of the first beam;

[0736] the prediction result and the second measurement result;

[0737] a report identifier corresponding to the prediction result; or

[0738] a relationship between the report identifier and the third resource set.

[0739] In some embodiments, the transceiver 6201, when obtaining the prediction result, is specifically configured to: receive the prediction result transmitted by the first device.

[0740] In some embodiments, the transceiver 6201, when obtaining the second measurement result, is specifically configured to: receive the second measurement result transmitted by the first device.

[0741] Optionally, the transceiver 6201 is configured to perform at least one of the communication steps (e.g., steps S2102, S2105, S2402, S2502, S2505, S2602, S4103, S4104, S4202, S4302, S4304, S4402, but not limited to this) of transmitting and / or receiving performed by the first device in any of the above methods, and details are not described herein again.

[0742] The processing module 6202 is configured to perform at least one of the other steps (e.g., steps S2108, S2407, but not limited to this) performed by the first device in any of the above methods, and details are not described herein again.

[0743] FIG. 7a is a schematic diagram of an example structure of a communication device according to an embodiment of the present disclosure. The communication device can be the first device, the second device, a chip, a chip system, or a processor supporting the first device to implement any of the above methods, or a chip, a chip system, or a processor supporting the second device to implement any of the above methods. The communication device 7100 can be used to implement the methods described in the above method embodiments, which can be specifically referred to the descriptions in the above method embodiments.

[0744] As shown in FIG. 7a, the communication device 7100 includes one or more processors 7101. The processor 7101 can be a general processor or a special-purpose processor, for example, a baseband processor or a central processing unit. The baseband processor can be used to process communication protocols and communication data, and the central processing unit can be used to control the communication device (e.g., a base station, a baseband chip, a terminal device, a terminal device chip, a DU or a CU, etc.), execute programs, and process data of the programs. The communication device 7100 is configured to execute any of the above methods.

[0745] In some embodiments, the communication device 7100 further includes one or more memories 7102 configured to store instructions. Alternatively, all or part of the memory 7102 can also be located outside the communication device 7100.

[0746] In some embodiments, the communication device 7100 further includes one or more transceivers 7103. When the communication device 7100 includes one or more transceivers 7103, the transceiver 7103 performs at least one of the communication steps (e.g., steps S2101, S2107, S2401, S2406, S2501, S2601, S3101, S3102, S3105, S3107, S3201, S3202, S3206, S3301, S3302, S3305, S3401, S3402, S5103, S2102, S2105, S2402, S2502, S2505, S2602, S4103, S4104, S4202, S4302, S4304, S4402, but not limited to) of the above methods.

[0747] The processor 7101 performs at least one of the other steps (e.g., steps S2103, S2104, S2106, S2403-S2405, S2503, S2504, S2506, S2507, S2603-S2606, S2108, S2407, but not limited to).

[0748] In some embodiments, the transceiver can include a receiver and / or a transmitter, which can be separate or integrated together. Optionally, the terms transceiver, transceiving unit, transceiver, transceiving circuit, etc. can be replaced by each other, the terms transmitter, transmitting unit, transmitter, transmitting circuit, etc. can be replaced by each other, and the terms receiver, receiving unit, receiver, receiving circuit, etc. can be replaced by each other.

[0749] In some embodiments, the communication device 7100 can include one or more interface circuits 7104. Optionally, the interface circuit 7104 is connected with the memory 7102, and the interface circuit 7104 can be used to receive signals from the memory 7102 or other devices, and can be used to send signals to the memory 7102 or other devices. For example, the interface circuit 7104 can read instructions stored in the memory 7102 and send the instructions to the processor 7101.

[0750] The communication device 7100 described in the above embodiments can be a second device or a first device, but the scope of the communication device 7100 described in the present disclosure is not limited thereto, and the structure of the communication device 7100 can not be limited by Figure 7a. The communication device can be a standalone device or can be part of a larger device. For example, the communication device can be: 1) a standalone integrated circuit (IC), or a chip, or a chip system or subsystem; (2) a set of one or more ICs, which can optionally also include storage components for storing data, programs; (3) an ASIC, such as a modem; (4) a module that can be embedded in other devices; (5) a receiver, a first device, a smart first device, a cellular phone, a wireless device, a handset, a mobile unit, a vehicle-mounted device, a second device, a cloud device, an artificial intelligence device, etc.; (6) others, etc.

[0751] Figure 7b is an exemplary structural schematic diagram of a chip according to an embodiment of the present disclosure. For the case where the communication device is a chip or a chip system, the structural schematic diagram of the chip 7200 shown in Figure 7b can be referred to, but is not limited thereto.

[0752] The chip 7200 includes one or more processors 7201, and the chip 7200 is configured to execute any of the above methods.

[0753] In some embodiments, the chip 7200 further includes one or more interface circuits 7202. Optionally, the interface circuit 7202 is connected with the memory 7203, and the interface circuit 7202 can be configured to receive a signal from the memory 7203 or other devices, and the interface circuit 7202 can be configured to send a signal to the memory 7203 or other devices. For example, the interface circuit 7202 can read an instruction stored in the memory 7203 and send the instruction to the processor 7201.

[0754] In some embodiments, the interface circuit 7202 performs at least one of the communication steps (e.g., steps S2101, S2107, S2401, S2406, S2501, S2601, S3101, S3102, S3105, S3107, S3201, S3202, S3206, S3301, S3302, S3305, S3401, S3402, S5103, S2102, S2105, S2402, S2502, S2505, S2602, S4103, S4104, S4202, S4302, S4304, S4402, but not limited thereto) of the above-described methods.

[0755] The processor 7201 performs at least one of the other steps (e.g., steps S2103, S2104, S2106, S2403-S2405, S2503, S2504, S2506, S2507, S2603-S2606, S2108, S2407, but not limited thereto).

[0756] In some embodiments, the terms interface circuit, interface, transceiving pin, transceiver, etc. can be replaced with each other.

[0757] In some embodiments, the chip 7200 further includes one or more memories 7203 for storing instructions. Optionally, all or part of the memory 7203 can be outside the chip 7200.

[0758] The modules and / or devices described in each of the embodiments of the virtual device, the physical device, the chip, etc. can be combined or separated as appropriate. Optionally, part or all of the steps can also be performed by multiple modules and / or devices in cooperation, which is not limited herein.

[0759] The disclosure further provides a storage medium having instructions stored thereon that, when executed on the communication device 7100, cause the communication device 7100 to perform any of the above methods. Optionally, the storage medium is an electronic storage medium. Optionally, the storage medium is a computer-readable storage medium, but is not limited thereto, and can also be a storage medium readable by other apparatuses. Optionally, the storage medium can be a non-transitory storage medium, but is not limited thereto, and can also be a transitory storage medium.

[0760] The disclosure further provides a program product comprising a program and / or instructions that, when executed by the communication device 7100, cause the communication device 7100 to perform any of the above methods. Optionally, the program product is a computer program product.

[0761] The disclosure further provides a computer program that, when executed on a computer, causes the computer to perform any of the above methods.

[0762] Those skilled in the art can appreciate that the units and algorithm steps of the examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether the functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. A person skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the disclosure.

[0763] Those skilled in the art can clearly understand that, for the convenience and brevity of the description, the specific working processes of the above-described systems, devices and units can refer to the corresponding processes in the foregoing method embodiments, which will not be described here.

[0764] The above is only a specific implementation of the disclosure, but the protection scope of the disclosure is not limited thereto. Any person skilled in the art can easily think of changes or replacements within the technical scope disclosed by the disclosure, which should be covered within the protection scope of the disclosure. Therefore, the protection scope of the disclosure should be subject to the protection scope of the claims.

Claims

A method of beam measurement and model performance evaluation, characterized in that, The method is performed by a first device, wherein a model is configured in the first device, and the method comprises: obtaining, by the model, a prediction result of a second beam set according to a first measurement result of a first beam set; performing measurement on the second beam set to obtain a second measurement result; wherein the prediction result and the second measurement result are used to determine a prediction performance of the model. According to the method of claim 1, wherein an input of the model comprises the first measurement result; an output of the model comprises the prediction result. The method according to claim 1 or 2, characterized in that The first measurement result is: quality information of a beam obtained by performing measurement on the first beam set through a specific RX beam; or quality information of a beam obtained by performing measurement on the first beam set through full RX beam scanning. The method according to any one of claims 1 to 3, characterized in that The prediction result is: at least one of quality information of a beam or a beam index of a beam obtained by predicting the second beam set through a specific RX beam; or at least one of quality information of a beam or a beam index of a beam obtained by predicting the second beam set through full RX beam scanning; wherein the beam index is used to indicate a beam in the second beam set whose quality information meets a preset requirement. The method according to claim 3 or 4, characterized in that The specific RX beam is an RX beam in a preset direction. The method according to any one of claims 1 to 5, characterized in that The method further comprises: sending, to a second device, a model capability of the model, wherein the model capability is used to indicate an input and / or an output of the model. The method according to claim 6, characterized in that The model capability is used to indicate that the input of the model is a first input or a second input, and the output of the model is a first output or a second output; wherein the first input is a first measurement result obtained by performing measurement on the first beam set through a specific RX beam; the second input is a first measurement result obtained by performing measurement on the first beam set through full RX beam scanning; the first output is a prediction result obtained by predicting the second beam set through a specific RX beam; the second output is a prediction result obtained by predicting the second beam set through full RX beam scanning. The method of claim 7, wherein The model capability is a first capability, a second capability, a third capability or a fourth capability, wherein the first capability is used to indicate that the input of the model is the first input, and the output of the model is the first output; the second capability is used to indicate that the input of the model is the first input, and the output of the model is the second output; the third capability is used to indicate that the input of the model is the second input, and the output of the model is the second output; the fourth capability is used to indicate that the input of the model is the second input, and the output of the model is the first output. According to any one of claims 1-8, wherein the first measurement result is a result of performing measurement on the first beam set in a first resource set; the prediction result is a result of predicting the second beam set in a second resource set; the second measurement result is a result of performing measurement on the second beam set in a third resource set. The method of claim 9, wherein The method further includes receiving first configuration information, wherein the first configuration information includes an identity of the first resource set and an identity of the second resource set. The method of claim 10, wherein The first configuration information further includes third indication information, wherein the third indication information is used to indicate, to a second device, at least one of the following: a beam index of a first beam, the first beam being a receiving beam used for predicting the second beam set; or The method according to any one of claims 9-11, characterized in that a beam type of the first beam. The method of claim 12, wherein The method further includes receiving second configuration information, wherein the second configuration information includes an identity of the third resource set. The method of claim 13, wherein The third resource set is the same as the second resource set, and a mapping relationship between a beam index and the second resource set is different from a mapping relationship between a beam index and the third resource set. The method according to any one of claims 12-14, characterized in that The third resource set is different from the second resource set. The second configuration information further includes fourth indication information, wherein the fourth indication information is used to indicate, to a second device, at least one of the following: a beam index of a first beam, the first beam being a receiving beam used for predicting the second beam set; a beam type of the first beam; the prediction result and the second measurement result; a report identity corresponding to the prediction result; or The method of claim 9, wherein a relationship between the report identity and the third resource set. The method of claim 16, wherein The method further includes receiving third configuration information, wherein the third configuration information includes an identity of the first resource set, an identity of the second resource set, and an identity of the third resource set. The method according to claim 16 or 17, characterized in that The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. The third configuration information further includes fifth indication information, wherein the fifth indication information is used to indicate, to a second device, at least one of the following: a beam index of a first beam, the first beam being a receiving beam used for predicting the second beam set; a beam type of the first beam; the prediction result and the second measurement result; a report identity corresponding to the prediction result; or The method according to any one of claims 1 to 18, characterized in that a relationship between the report identity and the third resource set. The method according to any one of claims 1 to 19, characterized in that The method further includes sending, to a second device, the prediction result and the second measurement result. A method of beam measurement and model performance evaluation, characterized in that, The method further includes determining, according to the prediction result and the second measurement result, a prediction performance of the model. The method is performed by a second device, and includes: obtaining a prediction result, the prediction result being a result of predicting, by a model in the second device, a second beam set according to a first measurement result of a first beam set by a first device; obtaining a second measurement result, the second measurement result being obtained by the first device by measuring the second beam set; determining a prediction performance of the model according to the prediction result and the second measurement result. According to the method in claim 21, wherein: an input of the model includes the first measurement result; The method according to claim 21 or 22, characterized in that an output of the model includes the prediction result. The first measurement result is: quality information of a beam obtained by measuring the first beam set by a specific RX beam; or quality information of beams measured on the first beam set by full RX beam sweeping. The method according to any one of claims 21-23, characterized in that The prediction result is at least one of: quality information of beams predicted on the second beam set by a specific RX beam, or quality information of beams predicted on the second beam set by full RX beam sweeping; wherein the beam index is used to indicate a beam in the second beam set whose quality information meets a preset requirement. The method according to claim 23 or 24, characterized in that The specific RX beam is an RX beam in a preset direction. The method according to any one of claims 21-25, characterized in that The method further comprises: receiving model capability of the model sent by the first device, the model capability being used to indicate input and / or output of the model. The method of claim 26, wherein The model capability is used to indicate that the input of the model is a first input or a second input, and the output of the model is a first output or a second output, wherein, the first input is a first measurement result measured on the first beam set by a specific RX beam; the second input is a first measurement result measured on the first beam set by full RX beam sweeping; the first output is a prediction result predicted on the second beam set by a specific RX beam; the second output is a prediction result predicted on the second beam set by full RX beam. The method of claim 27, wherein The model capability is a first capability, a second capability, a third capability or a fourth capability, wherein, the first capability is used to indicate that the input of the model is the first input, and the output of the model is the first output; the second capability is used to indicate that the input of the model is the first input, and the output of the model is the second output; the third capability is used to indicate that the input of the model is the second input, and the output of the model is the second output; the fourth capability is used to indicate that the input of the model is the second input, and the output of the model is the first output. According to any one of claims 21-28, wherein, the first measurement result is a result of measuring the first beam set in a first resource set; the prediction result is a result of predicting the second beam set in a second resource set; the second measurement result is a result of measuring the second beam set in a third resource set. The method of claim 29, wherein The method further comprises: sending first configuration information, wherein the first configuration information comprises an identifier of the first resource set and an identifier of the second resource set. The method of claim 30, wherein The first configuration information further comprises third indication information, wherein the third indication information is used to indicate that the first device sends a beam index and / or a beam type of a first beam to the second device; wherein the first beam is a receiving beam for predicting the second beam set. The method according to any one of claims 29-31, characterized in that The method further comprises: sending second configuration information, wherein the second configuration information comprises an identifier of the third resource set. The method of claim 32, wherein The third resource set is the same as the second resource set, wherein a mapping relationship between a beam index and the second resource set is different from a mapping relationship between a beam index and the third resource set. The method of claim 33, wherein The third resource set is different from the second resource set. The method according to any one of claims 32-34, characterized in that The second configuration information further includes fourth indication information, and the fourth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set; a beam type of the first beam; the prediction result and the second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set. The method of claim 29, wherein The method further includes: sending third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set. The method of claim 36, wherein The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. The method according to claim 36 or 37, characterized in that The third configuration information further includes fifth indication information, and the fifth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set; a beam type of the first beam; the prediction result and the second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set. The method according to any one of claims 21-38, characterized in that The method further includes: sending third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set. The method according to any one of claims 21-39, characterized in that The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. A first device, characterized in that The third configuration information further includes fifth indication information, and the fifth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set; a beam type of the first beam; A second device, characterized in that the prediction result and the second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set. The method further includes: sending third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set. A communication device, characterized by The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. The third configuration information further includes fifth indication information, and the fifth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set; A communication system characterized by a beam type of the first beam; the prediction result and the second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set. The method further includes: sending third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set. The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. The third configuration information further includes fifth indication information, and the fifth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set; a beam type of the first beam; the prediction result and the second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set. The method further includes: sending third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set. The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. The third configuration information further includes fifth indication information, and the fifth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set; a beam type of the first beam; the prediction result and the second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set. The method further includes: sending third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set. The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. The third configuration information further includes fifth indication information, and the fifth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set; a beam type of the first beam; the prediction result and the second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set. The method further includes: sending third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set. The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. The third configuration information further includes fifth indication information, and the fifth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set; a beam type of the first beam; the prediction result and the second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set. The method further includes: sending third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set. The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. The third configuration information further includes fifth indication information, and the fifth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set; a beam type of the first beam; the prediction result and the second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set. The method further includes: sending third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set. The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. The third configuration information further includes fifth indication information, and the fifth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set; a beam type of the first beam; the prediction result and the second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set. The method further includes: sending third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set. The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. The third configuration information further includes fifth indication information, and the fifth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set; a beam type of the first beam; the prediction result and the second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set. The method further includes: sending third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set. The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. The third configuration information further includes fifth indication information, and the fifth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set; a beam type of the first beam; the prediction result and the second measurement result; a report identifier corresponding to the prediction result; or a relationship between the report identifier and the third resource set. The method further includes: sending third configuration information, the third configuration information including an identifier of the first resource set, an identifier of the second resource set, and an identifier of the third resource set. The first resource set is the same as the second resource set, and / or the second resource set is the same as the third resource set. The third configuration information further includes fifth indication information, and the fifth indication information is used to indicate that the first device sends at least one of the following to the second device: a beam index of a first beam, the first beam being a receiving beam for predicting the second beam set A storage medium storing instructions, the instructions comprising: The program and / or instructions may, when executed by the communication device, cause the communication device to perform the beam measurement and model performance evaluation method of any one of claims 1-20, or the beam measurement and model performance evaluation method of any one of claims 21-40. A computer program product, characterized by The program and / or instructions may, when executed by the communication device, cause the communication device to perform the beam measurement and model performance evaluation method of any one of claims 1-20, or the beam measurement and model performance evaluation method of any one of claims 21-40.

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