Accelerated reliability test method, device, computer equipment, medium and product

Abstract

The application relates to an accelerated reliability test method and device, computer equipment, a medium and a product. The method comprises the following steps: determining device-level activation energy of a target product at each benchmark constant temperature section based on activation energy of all components in the target product; determining a temperature acceleration factor and a vibration acceleration factor based on a benchmark cycle number and the device-level activation energy; determining a comprehensive acceleration factor based on the temperature acceleration factor and the vibration acceleration factor; determining an accelerated reliability test profile of the target product based on a total benchmark test time and the comprehensive acceleration factor; and using the accelerated reliability test profile to perform accelerated reliability test on the target product. The method can improve test efficiency.

Description

Technical Field

[0001] This application relates to the field of reliability testing technology, and in particular to an accelerated reliability testing method, apparatus, computer equipment, medium, and product. Background Technology

[0002] Currently, the reliability indicators of airborne electronic products are mostly required to reach tens of thousands to hundreds of thousands of hours. Due to the lack of sufficient operational / service data, the verification of the reliability indicators of airborne electronic products still needs to be completed through experimental means.

[0003] In related technologies, conventional stress simulating real-world environments is typically used to conduct reliability tests on airborne electronic products, also known as conventional reliability testing. However, for highly reliable and long-life airborne electronic products, conventional reliability testing suffers from long cycles and low efficiency, making it difficult to meet the timeliness requirements of airborne electronic products in terms of development cycle, production delivery, and market launch. Summary of the Invention

[0004] Therefore, it is necessary to provide an accelerated reliability testing method, apparatus, computer equipment, medium, and product that can improve testing efficiency in response to the above-mentioned technical problems.

[0005] In a first aspect, this application provides a method for accelerating reliability testing, including:

[0006] Based on the activation energy of all components in the target product, determine the device-level activation energy of the target product in each reference constant temperature range;

[0007] Based on the baseline number of cycles and the activation energy of each device level, the temperature acceleration factor and vibration acceleration factor are determined.

[0008] Based on the temperature acceleration factor and the vibration acceleration factor, a comprehensive acceleration factor is determined;

[0009] Based on the total benchmark test time and the comprehensive acceleration factor, an accelerated reliability test profile for the target product is determined; the accelerated reliability test profile is used to conduct accelerated reliability tests on the target product.

[0010] In one embodiment, the device-level activation energy of the target product in each reference constant temperature range is determined based on the activation energy of all components in the target product. This includes: for each reference constant temperature range, determining the device-level activation energy based on the activation energy of all components, the reference temperature of the reference constant temperature range, the failure rate of each component at the reference temperature, and the preset temperature under accelerated testing.

[0011] In one embodiment, the temperature acceleration factor and vibration acceleration factor are determined based on a baseline number of cycles and the activation energy of each device level, including:

[0012] For each of the aforementioned constant temperature ranges, a first temperature acceleration factor corresponding to the constant temperature range is determined based on the device-level activation energy, the reference temperature, and the preset temperature under accelerated testing.

[0013] For each reference temperature range, a second temperature acceleration factor is determined based on the reference temperature difference, the reference temperature change rate, the preset temperature difference and the preset temperature change rate under accelerated testing.

[0014] The temperature acceleration factor and the vibration acceleration factor are determined based on the baseline number of cycles, each of the first temperature acceleration factors, and each of the second temperature acceleration factors.

[0015] In one embodiment, determining the temperature acceleration factor and the vibration acceleration factor based on a baseline number of cycles, each of the first temperature acceleration factors, and each of the second temperature acceleration factors includes:

[0016] Based on the baseline number of cycles and each of the second temperature acceleration factors, the initial number of cycles for the accelerated reliability test is determined;

[0017] Based on the baseline number of cycles, the preliminary number of cycles, and each of the first temperature acceleration factors, the single temperature cycle time of the target single temperature cycle in the accelerated test is determined;

[0018] The temperature acceleration factor is determined based on the total time of the benchmark test, the initial number of cycles, and the time of a single temperature cycle.

[0019] The vibration acceleration factor is determined based on the initial number of cycles and the time of a single temperature cycle.

[0020] In one embodiment, the single temperature cycle time of the target single temperature cycle in the accelerated test is determined based on the baseline number of cycles, the initial number of cycles, and each of the first temperature acceleration factors, including:

[0021] Based on the baseline number of cycles and each of the first temperature acceleration factors, the total duration of each first temperature segment in the accelerated test is determined.

[0022] Based on the total duration and the initial number of cycles, determine the target duration of the first temperature segment in the target single temperature cycle;

[0023] The single temperature cycle time is determined based on the target duration, the preset duration of the second temperature segment in the target single temperature cycle, and the preset temperature change time in the target single temperature cycle.

[0024] In one embodiment, the temperature acceleration factor is determined based on the total benchmark test time, the initial number of cycles, and the single temperature cycle time, including:

[0025] The total initial accelerated test time corresponding to the temperature stress is determined based on the initial number of cycles and the time of a single temperature cycle.

[0026] The temperature acceleration factor is determined based on the total time of the baseline test and the total time of the preliminary acceleration test.

[0027] In one embodiment, determining the vibration acceleration factor based on the initial number of cycles and the time of a single temperature cycle includes:

[0028] The target duration of vibration stress in the accelerated test is determined based on the preset application time of vibration stress, the initial number of cycles, and the time of a single temperature cycle.

[0029] The vibration acceleration factor is determined based on the target action time and the reference action time.

[0030] In one embodiment, determining a combined acceleration factor based on the temperature acceleration factor and the vibration acceleration factor includes:

[0031] The first failure ratio corresponding to temperature stress, the second failure ratio corresponding to vibration stress, and the third failure ratio corresponding to combined stress are obtained; the combined stress includes the temperature stress and the vibration stress.

[0032] The comprehensive acceleration factor is determined based on the temperature acceleration factor, the vibration acceleration factor, the first failure ratio, the second failure ratio, and the third failure ratio.

[0033] In one embodiment, the accelerated reliability test profile of the target product is determined based on the total benchmark test time and the comprehensive acceleration factor, including:

[0034] The target number of cycles required for the accelerated test is determined based on the single temperature cycle time, the total time of the baseline test, and the comprehensive acceleration factor.

[0035] The vibration test profile is determined based on the target number of cycles and the target duration.

[0036] The accelerated reliability test profile is determined based on the temperature test profile and the vibration test profile; the temperature test profile includes the single temperature cycle time and the target duration of the first temperature segment in the accelerated test.

[0037] In one embodiment, determining the vibration test profile based on the target number of cycles and the target duration of action includes:

[0038] Based on the target number of cycles and the reference total vibration time corresponding to the maximum vibration power spectral density in the reference reliability test, determine the first vibration time corresponding to the maximum vibration power spectral density in the target single temperature cycle;

[0039] Based on the target action time, the target cycle number, and the first vibration time, determine the second vibration time corresponding to the continuous vibration power spectral density of the target in the accelerated reliability test;

[0040] The target continuous vibration power spectral density is determined based on the reference continuous vibration power spectral density, the reference continuous vibration time, and the second vibration time.

[0041] The vibration test profile is determined based on the maximum vibration power spectral density, the first vibration time, the target continuous vibration power spectral density, and the second vibration time.

[0042] Secondly, this application also provides an accelerated reliability testing apparatus, comprising:

[0043] The first determining module is used to determine the device-level activation energy of the target product in each reference constant temperature range based on the activation energy of all components in the target product.

[0044] The second determining module is used to determine the temperature acceleration factor and the vibration acceleration factor based on the baseline number of cycles and the activation energy of each device level.

[0045] The third determining module is used to determine the comprehensive acceleration factor based on the temperature acceleration factor and the vibration acceleration factor;

[0046] The fourth determining module is used to determine the accelerated reliability test profile of the target product based on the total benchmark test time and the comprehensive acceleration factor; the accelerated reliability test profile is used to conduct accelerated reliability tests on the target product.

[0047] Thirdly, this application also provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the accelerated reliability testing method provided in the first aspect of this application.

[0048] Fourthly, this application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the accelerated reliability testing method provided in the first aspect of this application.

[0049] Fifthly, this application also provides a computer program product, including a computer program that, when executed by a processor, implements the accelerated reliability testing method provided in the first aspect of this application.

[0050] The aforementioned accelerated reliability testing methods, apparatus, computer equipment, computer-readable storage media, and computer program products determine the device-level activation energy of the target product at each reference constant temperature range based on the activation energy of all components in the target product; determine the temperature acceleration factor and vibration acceleration factor corresponding to each reference single temperature cycle based on the reference cycle number and the device-level activation energy; determine the comprehensive acceleration factor based on the temperature acceleration factor and vibration acceleration factor; and determine the accelerated reliability test profile of the target product based on the total reference test time and the comprehensive acceleration factor. The accelerated reliability test profile is used to conduct accelerated reliability tests on the target product. Therefore, the embodiments of this application determine the device-level activation energy based on the activation energy of each component of the target product, and determine the temperature acceleration factor and vibration acceleration factor based on the device-level activation energy. This enables the temperature acceleration factor and vibration acceleration factor to characterize the device-level acceleration effect. Furthermore, the device-level temperature acceleration factor and vibration acceleration factor are coupled to obtain a comprehensive acceleration factor, which more accurately reflects the acceleration effect under the combined action of multiple stresses. Finally, based on the total time of the benchmark test and the comprehensive acceleration factor, an accelerated reliability test profile of the target product is determined for accelerated testing. This profile enables accelerated testing to shorten the test cycle, improve test efficiency, and enhance the reliability of test results while ensuring that the failure mechanism remains unchanged. Attached Figure Description

[0051] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments of this application or related technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0052] Figure 1 This is a diagram illustrating the application environment of an accelerated reliability testing method in one embodiment;

[0053] Figure 2 This is a schematic diagram of the temperature test profile during a baseline single temperature cycle in a conventional reliability test in one embodiment;

[0054] Figure 3This is a schematic diagram of a vibration test profile during a baseline single temperature cycle in a routine reliability test in one embodiment.

[0055] Figure 4 This is a flowchart illustrating an accelerated reliability testing method in one embodiment;

[0056] Figure 5 This is a flowchart illustrating step 402 in one embodiment;

[0057] Figure 6 This is a flowchart illustrating step 503 in one embodiment;

[0058] Figure 7 This is a schematic diagram of the temperature test profile of a target single temperature cycle in an accelerated reliability test in one embodiment.

[0059] Figure 8 This is a flowchart illustrating step 404 in one embodiment;

[0060] Figure 9 This is a schematic cross-sectional view of a vibration test of a target single temperature cycle in an accelerated reliability test in one embodiment;

[0061] Figure 10 This is a flowchart illustrating an accelerated reliability testing method in one example.

[0062] Figure 11 A schematic diagram of the design route for accelerated reliability testing profiles at the product and equipment level, taking into account comprehensive stress.

[0063] Figure 12 This is a structural block diagram of an accelerated reliability testing apparatus in one embodiment;

[0064] Figure 13 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0065] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0066] It should be noted that the terms "first," "second," etc., used in this application may be used to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish the first element from the second element. The terms "comprising" and "having," and any variations thereof, used in this application, are intended to cover non-exclusive inclusion. The term "multiple" used in this application refers to two or more.

[0067] In related technologies, conventional reliability testing suffers from problems such as low efficiency and high cost. For example, if the minimum Mean Time Between Failures (MTBF) for a certain electronic product is 10,000 hours, even using the shortest-time high-risk approach with conventional reliability testing methods would still require 458.3 days, which is difficult to meet the timeliness requirements of product development cycle, production delivery, and market launch. Therefore, accelerated reliability testing can be used to evaluate the reliability of electronic products.

[0068] However, existing accelerated reliability testing techniques for complete-system (equipment-level) electronic products lack accelerated testing methods and evaluation theories due to their complex structure, diverse failure mechanisms and modes, and high development costs. Therefore, there is an urgent need to propose an engineering-feasible and theoretically reliable accelerated reliability testing method for electronic products at the equipment level to solve the challenge of verifying the performance indicators of high-reliability, long-life electronic products.

[0069] To address this, this application proposes an accelerated reliability testing method to solve the following technical problems:

[0070] 1) Incomplete accelerated testing methods for electronic products at the device level: Traditional accelerated testing models (such as the Arrhenius model) are mainly applicable to the component or material level, and their theoretical assumptions are that the failure mechanism is simple and the activation energy is clear at a certain temperature. However, for electronic products composed of various components, materials, and processes, their failure mechanisms and modes are complex and diverse, and no accelerated testing method or evaluation theory has been formed to date. Therefore, the embodiments of this application obtain the device-level activation energy of electronic products through component activation energy, and calculate the acceleration factor based on the device-level activation energy.

[0071] 2) Insufficient coupling in the comprehensive stress acceleration model: Existing accelerated reliability tests typically only address single stresses or simplified interactions between stresses, without considering the mutual influence between multiple stresses. Conventional reliability tests include temperature stress, vibration stress, temperature cycling, humidity stress, and electrical stress. To improve the comprehensiveness and accuracy of the test, this application's embodiment simultaneously applies four types of stress: temperature, vibration, humidity, and electrical stress. This can essentially cover more than 90% of the failure mechanisms and failure modes of electronic products throughout their entire life cycle. Based on the conventional reliability test profile, and comprehensively considering the impact of stresses such as temperature, vibration, and temperature cycling on product failures, an accelerated reliability test method based on device-level comprehensive stress is proposed.

[0072] This application comprehensively considers the effects of temperature, vibration, humidity, and electrical stress on the failure modes of electronic products. Based on a conventional reliability test profile, it constructs a comprehensive acceleration factor at the device level for multi-stress coupling. First, based on the mean time between failures (MTBF) of the electronic product and a pre-determined statistical test scheme, the total test time in the conventional reliability test is calculated. Then, combining the conventional reliability test profile, the acceleration factor corresponding to temperature stress (i.e., the temperature acceleration factor) is calculated using a temperature acceleration model and a temperature cycling acceleration model. Next, based on temperature stress and the temperature test profile determined accordingly, the vibration acceleration factor and its magnitude are calculated using an inverse power law model. Finally, the comprehensive acceleration factor is determined by combining temperature, vibration, and temperature cycling stress, and the matching method for each stress in the comprehensive reliability test stress is studied. Combining the accelerated reliability test results and the conventional reliability test profile, an accelerated reliability test profile under accelerated stress conditions is provided for accelerating reliability testing of products. An exemplary description follows.

[0073] The accelerated reliability testing method provided in this application embodiment can be applied to, for example... Figure 1 In the application environment shown, terminal 102 communicates with server 104 via a network. A data storage system can store the data that server 104 needs to process. The data storage system can be integrated onto server 104, or it can be located in the cloud or on other network servers. Terminal 102 can be, but is not limited to, various personal computers, laptops, smartphones, tablets, drones, low-altitude aircraft, IoT devices, and portable wearable devices. Server 104 can be a standalone physical server, a server cluster or distributed system composed of multiple physical servers, or a cloud server providing cloud computing services.

[0074] This application's embodiments are based on conventional reliability test profiles, but with the design of accelerated reliability test profiles. For ease of understanding, this application's embodiments use... Figure 2 and Figure 3 The following is an example of a conventional reliability test profile. Figure 2 and Figure 3 The diagram illustrates the temperature and vibration test profiles of a baseline single temperature cycle in conventional reliability testing. Temperature cycling refers to the regular, repetitive alternation between high and low temperatures. Each "high temperature → low temperature → high temperature" or "low temperature → high temperature → low temperature" cycle constitutes one temperature cycle, and one temperature cycle corresponds to one complete simulation. (Refer to...) Figure 2 The time for a single temperature cycle is 276 minutes, which includes several temperature segments. The temperature of each temperature segment is either constant or changing (cycle). The temperature segment with constant temperature is called the constant temperature segment, and the temperature segment with changing temperature is called the changing temperature segment. Figure 2In the diagram, the temperatures of each constant temperature range are T1, T2, T3, T4, and T5, and the temperature change rate (temperature variation rate) of each changing temperature range is 5℃ / min. (Refer to...) Figure 3 The vibration stress in a single temperature cycle includes the power spectral density of different vibration magnitudes w1, w2, w3, w4, and w5, in units of (m / s). 2 ) 2 / Hz.

[0075] In one exemplary embodiment, such as Figure 4 As shown, an accelerated reliability testing method is provided, which can be applied to... Figure 1 Taking the server in the example, the explanation includes the following steps 401 to 404. Wherein:

[0076] Step 401: Based on the activation energy of all components in the target product, determine the device-level activation energy of the target product in each reference constant temperature range.

[0077] The target product refers to the electronic product that requires accelerated reliability testing, which can be an airborne electronic product. The reference constant temperature range refers to the constant temperature range within a single temperature cycle in a conventional reliability test (i.e., the baseline reliability test), for example... Figure 3 The temperature range in the figure is T4. Accordingly, a single temperature cycle in a conventional reliability test is used as the baseline temperature cycle, and each temperature variation segment within that single temperature cycle is used as the baseline variation temperature segment for subsequent analysis. The device-level activation energy is the equivalent activation energy parameter used to characterize the overall thermal aging sensitivity of the target product. A single temperature cycle in an accelerated reliability test is referred to as the target single temperature cycle. Conventional reliability tests include multiple identical baseline single temperature cycles, and accelerated reliability tests include multiple identical target single temperature cycles; therefore, this application describes specific implementation methods using a single temperature cycle as an example.

[0078] For example, each constant temperature range in the routine reliability test of the target product is taken as a reference constant temperature range. For each reference constant temperature range, based on the activation energy of each component in the target product and the failure rate of each component in the reference constant temperature range, the device-level activation energy of the target product in the reference constant temperature range is determined, thereby obtaining an equivalent parameter of the target product in each reference constant temperature range: device-level activation energy.

[0079] Step 402: Determine the temperature acceleration factor and vibration acceleration factor based on the baseline number of cycles and the activation energy of each device level.

[0080] Among them, the temperature acceleration factor refers to the acceleration factor corresponding to temperature stress, that is, the ratio of the failure rate of the target product under accelerated high-temperature stress to its failure rate under normal temperature stress (reference temperature stress). The vibration acceleration factor refers to the acceleration factor corresponding to vibration stress, that is, the ratio of the failure rate of the target product under accelerated vibration stress to its failure rate under normal vibration stress (reference vibration stress).

[0081] For example, after obtaining the device-level activation energy for each constant temperature segment in a single reference temperature cycle, the number of cycles in a conventional reliability test is used as the reference cycle number. For each constant temperature segment in the reference temperature cycle, its device-level activation energy is substituted into a device-level temperature stress acceleration model (such as the Arrhenius model) to obtain the first temperature acceleration factor corresponding to that constant temperature segment. The first temperature acceleration factor is used to characterize the acceleration factor corresponding to temperature stress at constant temperature. For each variable temperature segment in the reference temperature cycle, a second temperature acceleration factor corresponding to that variable temperature segment can be determined based on the device-level temperature cycle stress acceleration model. The second temperature acceleration factor is used to characterize the acceleration factor corresponding to temperature stress at variable temperature. Then, based on the reference cycle number, the first temperature acceleration factor, and the second temperature acceleration factor, two acceleration factors corresponding to the reference reliability test are determined: a temperature acceleration factor and a vibration acceleration factor.

[0082] Optionally, the baseline number of cycles is determined based on a conventional reliability test profile. This profile is provided by the main equipment manufacturer and is therefore known; it typically consists of graphs showing the relationship between temperature, vibration, humidity, electrical stress, etc., and time. Figure 2 and Figure 3 .according to Figure 2 The baseline number of cycles N0 for reliability testing under normal stress can be calculated as follows: ,exist Figure 2 The test cycle time was 276 minutes, t 0总 This refers to the total benchmark test time in routine reliability testing. The total benchmark test time is determined as follows: based on the product's reliability index (generally MTBF) and the statistical test plan pre-determined by the supplier and the OEM, the time under normal stress (t) is determined. 0总 It is generally a multiple of MTBF, that is: n1 is greater than 1.

[0083] Step 403: Determine the comprehensive acceleration factor based on the temperature acceleration factor and the vibration acceleration factor.

[0084] For example, the temperature acceleration factor and vibration acceleration factor obtained above are coupled to obtain the comprehensive acceleration factor corresponding to the benchmark reliability test, which takes into account temperature stress, vibration stress and the combined stress of the two.

[0085] Step 404: Based on the total benchmark test time and the comprehensive acceleration factor, determine the accelerated reliability test profile of the target product; the accelerated reliability test profile is used to conduct accelerated reliability tests on the target product.

[0086] For example, after obtaining the comprehensive acceleration factor, the final target total accelerated test time (i.e., the total time of all target single temperature cycles) is first determined based on the total time of the baseline test and the comprehensive acceleration factor. Then, the target total accelerated test time is combined with the temperature test profile in the accelerated reliability test to determine the vibration test profile in the accelerated reliability test. The temperature test profile is obtained during the determination of the temperature acceleration factor and vibration acceleration factor in step 402. After obtaining the temperature test profile and vibration test profile in the accelerated reliability test, other stress matching is performed, such as adding stresses identical to the humidity stress and electrical stress in the conventional reliability test, to complete the design of the accelerated reliability test profile for the entire target product. Accelerated reliability testing is then conducted on the target product based on this reliability test profile to obtain reliability indicators, which are used to quantify and evaluate the reliability of the target product.

[0087] In the aforementioned accelerated reliability testing method, the device-level activation energy of the target product is determined at each reference constant temperature range based on the activation energy of all components in the target product; the temperature acceleration factor and vibration acceleration factor are determined based on the reference cycle number and the activation energy of each device-level component; a comprehensive acceleration factor is determined based on the temperature acceleration factor and vibration acceleration factor; and an accelerated reliability test profile of the target product is determined based on the total reference test time and the comprehensive acceleration factor. This accelerated reliability test profile is used to conduct accelerated reliability tests on the target product. Therefore, this embodiment of the application determines the device-level activation energy based on the activation energy of each component in the target product, and determines the temperature acceleration factor and vibration acceleration factor based on this device-level activation energy. This allows the temperature acceleration factor and vibration acceleration factor to characterize the device-level acceleration effect. Furthermore, the device-level temperature acceleration factor and vibration acceleration factor are coupled to obtain a comprehensive acceleration factor, which more accurately reflects the acceleration effect under the combined action of multiple stresses. Finally, based on the total reference test time and the comprehensive acceleration factor, an accelerated reliability test profile of the target product is determined for accelerated testing. This profile enables accelerated testing to shorten the test cycle, improve test efficiency, and enhance the reliability of test results while ensuring that the failure mechanism remains unchanged.

[0088] The specific implementation methods of the above steps are described below. Before the description, other input parameters required for the accelerated reliability test profile design in this application, such as temperature stress, are first described, that is, the temperature stress in the accelerated reliability test profile is initially determined. Specifically, this may include: determining the temperature stress corresponding to the target single temperature cycle in the accelerated reliability test profile based on the results of the electronic product reliability enhancement test (or based on the pre-test results if no reliability enhancement test has been conducted), including the constant temperature of the constant temperature segment (low temperature segment and high temperature segment) and the temperature change rate and temperature change time of the changing temperature segment. The constant temperature includes the high temperature (i.e., the first preset temperature) and the low temperature (i.e., the second preset temperature). In the accelerated reliability test, the high temperature is determined based on the results of the reliability enhancement test. It can be no less than the upper limit of the target product's operating temperature and no greater than the target product's high temperature operating limit temperature, such as -10℃, denoted as T. 高温 The low-temperature temperature is determined according to the product technical specifications and is kept consistent with the low-temperature ground temperature in the conventional stress test profile, denoted as T. 低温 The preset duration of the constant low-temperature section (i.e., the second temperature section) is consistent with the duration of the low-temperature section in the conventional reliability test, simulating the non-operating and operating states of the target product on a low-temperature ground surface. Based on the maximum temperature change rate in the conventional reliability test profile and the maximum temperature change rate in the temperature and humidity chamber, the temperature change rate of the temperature-changing segment in the target single temperature cycle in the accelerated reliability test profile is determined as the preset temperature change rate in the accelerated test. Optionally, the maximum temperature change rate in the conventional reliability test profile ≤ preset temperature change rate ≤ maximum temperature change rate in the temperature and humidity chamber. In engineering, the preset temperature change rate is often taken as 15℃ / min. The preset temperature change time can be calculated based on the preset temperature change rate, the first preset temperature, and the second preset temperature in the target single temperature cycle.

[0089] In an exemplary embodiment, step 401 includes: for each reference constant temperature range, determining the device-level activation energy based on the activation energy of all components, the reference temperature of the reference constant temperature range, the failure rate of each component at the reference temperature, and the preset temperature under accelerated testing.

[0090] The preset temperature can be the high-temperature range within the constant temperature zone of a single temperature cycle in an accelerated test; this temperature is pre-set. The reference temperature can be, for example... Figure 2 The values ​​T1, T2, T3, T4, and T5 are used in the accelerated testing. In this embodiment, a single temperature cycle in the accelerated test is referred to as the target single temperature cycle.

[0091] For example, for each reference constant temperature range, the activation energy of all components in the target product, the reference temperature (determined through conventional reliability test profiles), the failure rate, and the preset temperature in a single cycle of accelerated testing (i.e., the high temperature T) can be used. 高温The device-level activation energy of the target product is determined using the following formula:

[0092] (1)

[0093] in, The device-level activation energy of the target product is expressed in eV. The activation energy of the i-th component in the target product can be obtained based on component reliability assessment standards and component test values, etc. It is the i-th component at the reference temperature Failure rate under the given conditions; n is the number of components in the target product; and These represent the reference temperature under normal stress and the preset temperature under accelerated stress, respectively, both being absolute temperatures; k is the Boltzmann constant, with a value of 8.6171 × 10⁻⁵ eV / K. Therefore, the device-level activation energy is related not only to the component activation energy but also to temperature stress.

[0094] Therefore, by obtaining the device-level activation energy of the product through the activation energy of the components, and then using it to calculate the device-level temperature acceleration factor, the problem of insufficient calculation methods for the acceleration factor of the entire electronic product is solved, and the reliability of the acceleration factor can be improved.

[0095] In one exemplary embodiment, such as Figure 5 As shown, step 402 includes steps 501 to 503. Wherein:

[0096] Step 501: For each reference constant temperature range, determine the first temperature acceleration factor corresponding to the reference constant temperature range based on the device-level activation energy, the reference temperature, and the preset temperature under accelerated testing.

[0097] For example, after obtaining the device-level activation energy for each reference constant temperature range, for each reference constant temperature range, based on the device-level activation energy, the reference temperature, and the preset temperature under accelerated testing, and in conjunction with the Arrhenius model, the first temperature acceleration factor corresponding to that reference constant temperature range is determined, and the calculation formula is as follows:

[0098] (2)

[0099] Among them, AF sys The first temperature acceleration factor for the target product; and These represent the failure rates of the target product under normal stress and accelerated stress, respectively.

[0100] The first temperature acceleration factor is calculated based on the device-level activation energy, and therefore can represent the temperature acceleration factor at a constant temperature at the device level.

[0101] Step 502: For each reference temperature range, determine the second temperature acceleration factor corresponding to each reference temperature range based on the reference temperature difference, the reference temperature change rate, the preset temperature difference and the preset temperature change rate under the accelerated test.

[0102] The reference temperature difference refers to the difference between the highest and lowest temperatures in a single reference temperature cycle during a routine reliability test (e.g., ...). Figure 2 (T4-T3 in the text) The reference temperature change rate refers to the rate of temperature change within this temperature range (e.g., T4-T3). Figure 2 (5℃ / min). The preset temperature difference refers to the difference between the highest and lowest temperatures in the target single temperature cycle during accelerated reliability testing (i.e., T). 高温 -T 低温 The preset temperature change rate refers to the rate of temperature change within the temperature range (e.g., the 15℃ / min setting mentioned above). Both the preset temperature difference and the preset temperature change rate are set in advance.

[0103] For example, for each reference temperature range, its reference temperature difference, reference temperature change rate, and preset temperature difference and preset temperature change rate under accelerated testing are substituted into the temperature cycling acceleration model to obtain the second temperature acceleration factor for that temperature range under temperature cycling. Optionally, the second temperature acceleration factor corresponding to each reference temperature range is calculated using the following formula:

[0104] (3)

[0105] In the formula, AF TC N0 is the second temperature acceleration factor corresponding to the baseline temperature range; N1 is the target number of cycles after the accelerated test (unknown). This is the reference temperature difference (°C) between the upper and lower limits of the reference temperature range in routine reliability testing. To accelerate the reliability test, a preset temperature difference (°C) between the upper and lower limits of the operating temperature range is set. The baseline temperature change rate (°C / min) is used for routine reliability testing. To accelerate the reliability test, a preset temperature change rate (°C / min) is set, where m is the number of temperature segments in a single temperature cycle during a conventional reliability test, and m is typically taken as 2.5.

[0106] Step 503: Determine the temperature acceleration factor and vibration acceleration factor based on the baseline number of cycles, each first temperature acceleration factor, and each second temperature acceleration factor.

[0107] For example, after obtaining the first temperature acceleration factor corresponding to each constant temperature segment and the second temperature acceleration factor corresponding to each varying temperature segment in a single benchmark temperature cycle, the temperature acceleration factor corresponding to the single benchmark temperature cycle is determined based on the total benchmark test time, the number of benchmark cycles, each second temperature acceleration factor, and each first temperature acceleration factor. This temperature acceleration factor characterizes the acceleration factor at constant and varying temperatures. Simultaneously, the vibration acceleration factor corresponding to the single benchmark temperature cycle is determined based on the number of benchmark cycles, each second temperature acceleration factor, and each first temperature acceleration factor.

[0108] Therefore, in this embodiment, by calculating the first temperature acceleration factor corresponding to temperature stress and the second temperature acceleration factor corresponding to temperature cyclic stress respectively, and combining these two acceleration factors to determine the temperature acceleration factor and the vibration acceleration factor, the coupling between the vibration acceleration factor and the temperature acceleration factor can be achieved, thereby improving the accuracy of the acceleration factor.

[0109] In one exemplary embodiment, such as Figure 6 As shown, step 503 includes steps 601 to 604. Wherein:

[0110] Step 601: Determine the initial number of cycles for the accelerated reliability test based on the baseline number of cycles and each second temperature acceleration factor.

[0111] For example, the baseline number of cycles N0 is converted into the initial number of cycles N1 in the accelerated reliability test based on the baseline number of cycles N0 and each of the second temperature acceleration factors. Optionally, the ratio between the baseline number of cycles and the sum of each of the second temperature acceleration factors is calculated, and the initial number of cycles is determined based on this ratio. It should be noted that, in order to enhance the thermal fatigue response, the target single temperature cycle in the accelerated test profile may include two temperature variation segments (one heating and one cooling), while the reference... Figure 2 Each temperature cycle in a conventional reliability test profile contains only one temperature variation segment (one heating or cooling cycle). Therefore, one temperature cycle in an accelerated reliability profile is equivalent to two temperature cycles in a conventional reliability profile. When calculating the number of cycles, the baseline number of cycles needs to be divided by 2 for correction. Therefore, the initial number of cycles required for accelerated testing can be calculated using the following formula:

[0112] (4)

[0113] in, This represents the second temperature acceleration factor corresponding to the i-th reference temperature range in the conventional reliability test profile.

[0114] Step 602: Based on the baseline number of cycles, the preliminary number of cycles, and each first temperature acceleration factor, determine the single temperature cycle time of the target single temperature cycle in the accelerated test.

[0115] The single temperature cycle time refers to the duration required for a single temperature cycle in an accelerated reliability test, which is also the duration required for each temperature cycle in an accelerated reliability test.

[0116] For example, first, based on the initial number of cycles N1, the baseline number of cycles N0, and each first temperature acceleration factor... Determine the first duration t of the first temperature segment (i.e., the only high-temperature segment) in the target single temperature cycle required for accelerated reliability testing. 高温 Then, based on the first duration t 高温 Determine the single temperature cycle time t corresponding to accelerated reliability testing. 加速（温度） .

[0117] Step 603: Determine the temperature acceleration factor based on the total time of the benchmark test, the initial number of cycles, and the time of a single temperature cycle.

[0118] For example, after obtaining the total time of the baseline test, the initial number of cycles, and the time of a single temperature cycle, the total time t of the initial acceleration test caused by temperature is first determined based on these. 总（温度） The total acceleration test time is the total acceleration test time considering only temperature (constant temperature and cycling temperature). Then, the temperature acceleration factor AF is determined based on the preliminary total acceleration test time. 温度 This temperature acceleration factor takes into account both the types of failures caused to the product by constant temperature and temperature cycle stress.

[0119] Step 604: Determine the vibration acceleration factor based on the initial number of cycles and the time of a single temperature cycle.

[0120] For example, the target duration t of vibration stress required for accelerated testing is first determined based on the initial number of cycles and the time of a single temperature cycle. 加速总 Then, based on the target's duration of action, the vibration acceleration factor AF is determined. 振动 The acceleration factor takes into account the first temperature acceleration factor and the second temperature acceleration factor, which can characterize the equipment-level acceleration effect. Therefore, the vibration acceleration factor can characterize the acceleration factor of the entire target product.

[0121] Therefore, this embodiment first determines the initial number of cycles and the time of a single temperature cycle, and then determines the temperature acceleration factor and the vibration acceleration factor based on the initial number of cycles and the time of a single temperature cycle. It takes into account the mutual influence between temperature and vibration stress, which can improve the accuracy of the acceleration factor.

[0122] In an exemplary embodiment, step 602 includes: determining the total duration of each first temperature segment in the accelerated test based on the baseline number of cycles and each first temperature acceleration factor; determining the target duration of the first temperature segment in the target single temperature cycle based on the total duration and the initial number of cycles; and determining the single temperature cycle time based on the target duration, the preset duration of the second temperature segment in the target single temperature cycle, and the preset temperature change time in the target single temperature cycle.

[0123] The first temperature segment refers to the unique constant high-temperature segment within the target single temperature cycle in the accelerated reliability test. The second temperature segment refers to the unique constant low-temperature segment within the target single temperature cycle in the accelerated reliability test. The preset temperature change time is the duration of the temperature change segment within the target single temperature cycle, calculated based on the first preset temperature of the first temperature segment, the preset temperatures of the second temperature segment, and the preset temperature change rate.

[0124] For example, suppose a conventional reliability test profile consists of m constant temperature segments, and therefore there are m reference constant temperature segments, each with a duration of t. i According to formula (2), the reference temperature T0 of each reference constant temperature range can be equivalent to the high temperature range (first temperature range) T in the accelerated test. 高温 The first temperature acceleration factor is AF sysi First, the duration of each reference constant temperature range is converted to the initial duration t of the first temperature range in the accelerated test. 高温0 The conversion formula is:

[0125] (5)

[0126] The total duration t of the first temperature segment in the accelerated reliability test profile is determined based on the product of the baseline number of cycles and the initial duration. 高温总 for:

[0127] (6)

[0128] Then, based on the ratio of the total duration of the first temperature segment to the initial number of cycles, the target duration t of the first temperature segment in the target single temperature cycle of the accelerated reliability test profile is calculated. 高温 The calculation formula can be:

[0129] (7)

[0130] Finally, based on the target duration t of the first temperature segment (high temperature segment) 高温 The preset duration t of the second temperature segment (low temperature segment) 低温The time of a single temperature cycle in the accelerated test is determined by the preset temperature change time (i.e., the time of the temperature change segment). The preset duration of the second temperature segment is initially set, and the preset temperature change time is calculated based on the preset temperature difference and preset temperature change rate under the initially set accelerated test conditions (i.e., preset temperature difference divided by preset temperature change rate). Optionally, the time of a single temperature cycle t is calculated using the following formula. 加速（温度） :

[0131] (8)

[0132] in, This refers to the preset temperature change time during the heating phase. This refers to the preset temperature change time of the cooling phase.

[0133] For example, the preset duration and low temperature of the second temperature segment are the same as the temperature and duration of the lowest temperature segment in a conventional test profile, such as 60 min. Therefore, the preset duration of the second temperature segment is 60 min. The target duration t of the first temperature segment is then calculated according to formula (7). 高温 The time is 162 min. Based on the preset temperature difference divided by the preset temperature change rate, the two temperature change times are calculated to be 9 min each. Therefore, according to formula (8), the single cycle time is calculated to be 240 min. Thus, the accelerated reliability test profile can be obtained as follows: Figure 7 The temperature test profile shown includes: a single temperature cycle time of 240 min, and a first preset temperature T for the first temperature segment. 高温 The target duration is 162 minutes, and the second preset temperature T for the second temperature segment is... 低温 The preset duration is 60 min, the preset temperature change rate for the heating stage is 15℃ / min, and the preset temperature change rate for the cooling stage is -15℃ / min.

[0134] Therefore, based on the baseline number of cycles, the initial number of cycles, and each first temperature acceleration factor, the single temperature cycle time required for the accelerated test was obtained, which ensures the accuracy of the single temperature cycle time.

[0135] In an exemplary embodiment, step 603 includes: determining the total preliminary accelerated test time corresponding to the temperature stress based on the initial number of cycles and the time of a single temperature cycle; and determining the temperature acceleration factor based on the total time of the baseline test and the total preliminary accelerated test time.

[0136] For example, firstly, the total time of the preliminary accelerated test corresponding to the temperature stress is determined based on the product of the initial number of cycles and the time of a single temperature cycle. Then, the temperature acceleration factor corresponding to the target single temperature cycle in the accelerated test is determined based on the ratio of the total time of the baseline test to the total time of the preliminary accelerated test.

[0137] Optionally, the total initial acceleration test time t due to temperature can be calculated using the following formula. 总（温度） :

[0138] (9)

[0139] Based on the reliability test plan, the total time required for benchmark tests to be carried out during conventional stress testing can be determined. The temperature acceleration factor AF caused by temperature is obtained through the following formula. 温度 :

[0140] (10)

[0141] Therefore, the temperature acceleration factor obtained through this embodiment takes into account both the failure types caused by constant temperature and temperature cycle stress on the target product, thus improving the accuracy of the temperature acceleration factor.

[0142] In an exemplary embodiment, step 604 includes: determining the target application time of the vibration stress in the accelerated test based on the preset application time of the vibration stress, the initial number of cycles, and the time of a single temperature cycle; and determining the vibration acceleration factor based on the target application time and the reference application time.

[0143] The preset application time of vibration stress refers to the moment when the vibration stress begins to be applied in a single temperature cycle of the target test during accelerated testing, such as at the 30th minute. This moment can be preset based on actual needs, historical experience, and test measurements. The reference duration can be the total duration of vibration stress in a conventional reliability test, which can be determined based on the duration of vibration stress in a reference single temperature cycle and the number of reference cycles. For example, a reference... Figure 3 The product of the obtained vibration stress application time and the reference cycle number is determined as the reference application time t. 常规总 The target duration of action refers to the total duration of vibration stress during accelerated testing.

[0144] For example, firstly, the difference between the single cycle time and the preset application time is calculated, and then the product of this difference and the initial number of cycles is calculated. Based on this product, the target application time of the vibration stress is determined. Then, the vibration acceleration factor is determined based on the ratio of the reference application time to the target application time.

[0145] Optionally, in accelerated testing, vibration stress can be applied from the start of cryogenic operation (30 minutes into the profile). The target duration of vibration stress in the accelerated test profile, t, is calculated using the following formula. 加速总 The unit is min:

[0146] (11)

[0147] The vibration acceleration factor is calculated using the following formula:

[0148] (12)

[0149] Therefore, this embodiment determines the vibration acceleration factor based on the initial number of cycles, the single temperature cycle time, and the reference action time, which ensures that the vibration acceleration factor represents the vibration acceleration effect at the product equipment level and improves the accuracy of the vibration acceleration factor.

[0150] After obtaining the temperature acceleration factor and the vibration acceleration factor, the two are coupled to obtain the comprehensive acceleration factor. The following is an example to describe the specific implementation method for determining the comprehensive acceleration factor.

[0151] In one exemplary embodiment, step 403 includes: obtaining a first failure ratio corresponding to temperature stress, a second failure ratio corresponding to vibration stress, and a third failure ratio corresponding to combined stress; the combined stress includes temperature stress and vibration stress; and determining the combined acceleration factor based on the temperature acceleration factor, the vibration acceleration factor, the first failure ratio, the second failure ratio, and the third failure ratio.

[0152] The first failure ratio refers to the proportion of failures caused by temperature stress in the total failure rate during routine reliability testing (i.e., the proportion of the target product failure caused by temperature stress). The second failure ratio refers to the proportion of failures caused by vibration stress in the total failure rate during routine reliability testing (i.e., the proportion of the target product failure caused by vibration stress). The third failure ratio refers to the proportion of failures caused by combined stress in the total failure rate during routine reliability testing (i.e., the proportion of the target product failure caused by combined stress). The sum of the first, second, and third failure ratios is 1.

[0153] For example, in actual use, environmental factors are not singular but often act on the product in combination. Assume the total failure rate of the product under conventional reliability test profile conditions is... It consists of three failure modes: the failure rate caused only by temperature stress is [missing information]. The failure rate caused solely by vibration stress is The failure rate due to the combined effects of temperature and vibration is... Therefore, we have:

[0154] (13)

[0155] If the temperature acceleration factor is AF 温度 The failure rate caused solely by temperature under accelerated conditions is: .

[0156] If the vibration acceleration factor is AF 振动 The failure rate caused solely by this vibration under accelerated conditions is: .

[0157] If both stresses lead to the same failure mode, then the acceleration factor of that failure mode is the product of the acceleration factors of the two stresses. Therefore, the acceleration factor under combined temperature and vibration stress is: The failure rate caused by the combined effects of temperature and vibration under accelerated conditions is: .

[0158] Therefore, the total failure rate of the target product under accelerated conditions is:

[0159] (14)

[0160] Therefore, the overall acceleration factor AF can be calculated using the following formula:

[0161] (15)

[0162] These are the first failure ratio, the second failure ratio, and the third failure ratio, which can be obtained from the supplier's statistics on failures of similar products in the past. Therefore, this embodiment determines the comprehensive acceleration factor based on the product of the acceleration factor corresponding to each stress and the failure ratio. It also considers the influence of constant temperature, temperature cycling, vibration stress, and the combined effect of the above stresses on product failure, thus obtaining a comprehensive acceleration factor for multi-stress coupling effects. This overcomes the shortcomings of previous accelerated product tests that only considered a single stress or simplified the interaction between stresses, and can ensure the accuracy of the comprehensive acceleration factor.

[0163] After obtaining the comprehensive acceleration factor and Figure 7 After the temperature test profile shown, step 404 is executed, which determines the accelerated reliability test profile of the target product based on the total benchmark test time and the comprehensive acceleration factor. An illustrative explanation follows.

[0164] In one exemplary embodiment, such as Figure 8 As shown, step 404 includes steps 801 to 803:

[0165] Step 801: Determine the target number of cycles required for the accelerated test based on the single temperature cycle time, the total time of the baseline test, and the comprehensive acceleration factor.

[0166] For example, the step includes: determining the target total accelerated test time (i.e., the sum of the times of all target single temperature cycles) corresponding to the comprehensive stress required for the accelerated test based on the total time of the benchmark test and the comprehensive acceleration factor; and determining the target number of cycles based on the target total accelerated test time and the time of a single temperature cycle.

[0167] Optionally, the total time t of the target acceleration test can be calculated using the following formula. 加速 :

[0168] (16)

[0169] Therefore, the comprehensive acceleration factor and total acceleration test time for the target product, taking into account temperature, temperature cycling, and vibration stress, were determined, as well as the final target number of acceleration tests. for:

[0170] (17)

[0171] Step 802: Determine the vibration test profile based on the target number of cycles and the target duration of action.

[0172] For example, after obtaining the target number of cycles and the target duration of action, the first vibration time corresponding to the maximum vibration power spectral density in a single target temperature cycle is determined based on the target number of cycles. Then, based on the target duration of action, the target number of cycles, and the first vibration time, the second vibration time corresponding to the target continuous vibration power spectral density in a single target temperature cycle is determined. Based on the second vibration time, a vibration test profile is determined. Here, the target continuous vibration power spectral density refers to the vibration power spectral density value that is continuously applied for a long time in the accelerated reliability test profile and whose magnitude is lower than the maximum vibration power spectral density.

[0173] Step 803: Determine the accelerated reliability test profile based on the temperature test profile and the vibration test profile; the temperature test profile includes the single temperature cycle time and the target duration of the first temperature segment in the accelerated test.

[0174] For example, as described above, the temperature test profile corresponding to the target single temperature cycle can be determined based on the single temperature cycle time, the first preset temperature and target duration of the first temperature segment in the accelerated test, the second preset temperature and preset duration of the second temperature segment, and the preset temperature change rate in the accelerated test. This temperature test profile refers to... Figure 7 The first preset temperature (high temperature) is greater than the second preset temperature (low temperature). Based on the temperature test profile and vibration test profile, and combined with other stresses (the same as in conventional tests), the accelerated reliability test profile can be obtained.

[0175] Therefore, this embodiment determines the vibration test profile based on the temperature test profile of the accelerated reliability test profile, combined with the total time of the benchmark test and the comprehensive acceleration factor, which can ensure the accuracy of the vibration test profile.

[0176] In an exemplary embodiment, step 802 includes: determining a first vibration time corresponding to the maximum vibration power spectral density in a target single temperature cycle based on the target number of cycles and the reference total vibration time corresponding to the maximum vibration power spectral density in the reference reliability test; determining a second vibration time corresponding to the target continuous vibration power spectral density in the accelerated reliability test profile based on the target action time, the target number of cycles, and the first vibration time; determining the target continuous vibration power spectral density based on the reference continuous vibration power spectral density, the reference continuous vibration time, and the second vibration time; and determining the vibration test profile based on the maximum vibration power spectral density, the first vibration time, the target continuous vibration power spectral density, and the second vibration time.

[0177] Among them, the benchmark reliability test profile refers to the conventional reliability test profile (e.g., Figure 3 (The cross-section shown). The reference continuous vibration power spectral density is determined based on the vibration power spectral densities of each vibration in a reference single temperature cycle during conventional reliability testing. The reference total vibration time refers to the total duration corresponding to the maximum vibration power spectral density in conventional reliability testing. The reference continuous vibration time refers to the total duration corresponding to each vibration power spectral density in a reference single temperature cycle. The first vibration time refers to the total duration corresponding to the maximum vibration power spectral density in a target single temperature cycle during accelerated testing, and the second vibration time refers to the total duration corresponding to the target continuous vibration power spectral density in accelerated testing. The vibration stress in the target single temperature cycle includes the maximum vibration power spectral density and the target continuous vibration power spectral density.

[0178] Optionally, a reference continuous vibration power spectral density is determined based on each reference vibration power spectral density. Here, each reference vibration power spectral density is the vibration power spectral density of each vibration in a reference single temperature cycle during a routine reliability test (e.g., ...). Figure 3 The vibration magnitudes w1, w2, w3, w4, and w5 in the data are used to calculate the weighted power spectral density of each reference vibration. The calculated weighted value is used as the reference continuous vibration power spectral density. The time corresponding to each reference vibration power spectral density is added together to obtain the reference continuous vibration time.

[0179] For example, to ensure that the failure mechanism of vibration stress-induced failure in accelerated reliability testing is consistent with that in conventional reliability testing, and to avoid introducing new failure modes, the vibration spectrum in accelerated testing is set to be consistent with that in the conventional reliability test profile. The maximum vibration power spectral density and its total time are kept consistent with those in the conventional reliability test profile. Therefore, based on the maximum vibration power spectral density and its reference total vibration time t in the conventional reliability test profile... max0 (Based on N0 and) Figure 3 The target number of cycles can be obtained, and the first vibration time t corresponding to the maximum vibration power spectral density in a single temperature cycle of the target can be calculated using the following formula. max-单循环 :

[0180] (18)

[0181] Maximum vibration power spectral density W in accelerated reliability test profile max It is consistent with the maximum vibration power spectral density w4 in the conventional reliability test profile.

[0182] The vibration stress in accelerated reliability testing only includes the maximum vibration power spectral density and the continuous vibration power spectral density. Therefore, it can be determined based on the target action time t. 加速总 Target number of loops and the first vibration time t max-单循环 In the accelerated reliability test, calculate the second vibration time t corresponding to the continuous vibration power spectral density of the target. 连续 (That is, the total time of continuous vibration), the calculation formula can be:

[0183] (19)

[0184] After obtaining the second vibration time of the target continuous vibration power spectral density, the target continuous vibration power spectral density in the accelerated test profile is determined based on the baseline continuous vibration power spectral density, the baseline continuous vibration time, and the second vibration time; that is, the continuous vibration magnitude corresponding to the second vibration time. Optionally, the vibration acceleration factor is calculated using an inverse power law model according to relevant standards, i.e.:

[0185] (20)

[0186] in: The target is the continuous vibrational power spectral density; As the reference continuous vibration power spectral density (weighted value), t 基准 The reference continuous vibration time (i.e.) The vibration time), m1 is the vibration stress acceleration constant, and different failure types correspond to different values, generally between 3 and 5.

[0187] Therefore, the target continuous vibration power spectral density can be calculated using the right half of formula (20). That is, the vibration power spectral density other than the maximum vibration power spectral density.

[0188] Thus, the maximum vibration power spectral density and its corresponding first vibration time, and the target continuous vibration power spectral density and its corresponding second vibration time were obtained. Next, the vibration test profile was determined according to the vibration application rules. The vibration application rules are as follows: within a single temperature cycle of the target, at the moment of vibration stress application, for example at the 30th minute, vibration is applied at the maximum vibration power spectral density for half the duration of the first vibration time, then vibration is applied at the target continuous vibration power spectral density for half the duration of the second vibration time, and then the above process is repeated (i.e., vibration is applied at the maximum vibration power spectral density for half the duration of the first vibration time, then vibration is applied at the target continuous vibration power spectral density for half the duration of the second vibration time). The final vibration test profile can be seen as follows. Figure 9 As shown.

[0189] Therefore, based on the target number of cycles and the conventional reliability test profile, this embodiment determines the vibration test profile in the accelerated reliability test profile, thereby obtaining the vibration stress in the accelerated test, which can ensure the accuracy of the vibration stress in the accelerated test profile.

[0190] Through the above steps, we obtained Figure 7 and Figure 9 The temperature and vibration test profiles shown can be used for further stress matching. (Refer to...) Figure 7 The accelerated reliability test profile includes temperature, vibration, humidity, and electrical stress. Temperature stress and vibration stress are determined through the steps described above. (Refer to...) Figure 2 In the conventional reliability test profile, there is a 1-hour humidity control time (dew point temperature greater than or equal to 31℃). To ensure that the failure mechanism of the product caused by the combined stress of temperature and humidity remains unchanged, refer to... Figure 7 In the accelerated reliability test profile, a 1-hour humidity control period (dew point temperature greater than or equal to 31°C) can be set up in the high-temperature section, and can be applied in the first hour of the high-temperature section. (Refer to...) Figure 9 The target product begins operation at the 30-minute mark of each accelerated reliability test profile. The method of applying electrical stress is consistent with that of the conventional reliability test profile.

[0191] Thus, the comprehensive acceleration factor calculation and accelerated reliability test profile design of the target product were completed. Multiple temperature cycling tests were conducted based on this accelerated reliability test profile, which can improve the reliability of the test results.

[0192] The following example illustrates the accelerated reliability testing method.

[0193] like Figure 10 As shown, the accelerated reliability testing method includes the following steps:

[0194] Step 1001: For each reference constant temperature range, determine the device-level activation energy based on the activation energy of all components in the target product, the reference temperature of the reference constant temperature range, the failure rate of each component at the reference temperature, and the preset temperature under accelerated testing.

[0195] Step 1002: For each reference constant temperature range, determine the first temperature acceleration factor corresponding to the reference constant temperature range based on the device-level activation energy, the reference temperature, and the preset temperature under accelerated testing.

[0196] Step 1003: For each reference temperature range, based on the reference temperature difference, the reference temperature change rate, the preset temperature difference and the preset temperature change rate under the accelerated test, determine the second temperature acceleration factor corresponding to each reference temperature range.

[0197] Step 1004: Determine the initial number of cycles based on the baseline number of cycles and each second temperature acceleration factor;

[0198] Step 1005: Based on the baseline number of cycles and the acceleration factor of each first temperature, determine the total duration of each first temperature segment in the accelerated test;

[0199] Step 1006: Determine the target duration of the first temperature segment in a single temperature cycle based on the total duration and the initial number of cycles;

[0200] Step 1007: Determine the single temperature cycle time of the target single temperature cycle in the accelerated test based on the target duration, the preset duration of the second temperature segment in the target single temperature cycle, and the preset temperature change time in the target single temperature cycle.

[0201] Step 1008: Determine the temperature test profile based on the single temperature cycle time, the first preset temperature and target duration of the first temperature segment, the second preset temperature and preset duration of the second temperature segment, and the preset temperature change rate of the variable temperature segment.

[0202] Step 1009: Determine the total initial accelerated test time corresponding to the temperature stress based on the initial number of cycles and the time of a single temperature cycle;

[0203] Step 1010: Determine the temperature acceleration factor based on the total time of the baseline test and the total time of the preliminary accelerated test;

[0204] Step 1011: Determine the target duration of vibration stress in the accelerated test based on the preset application time of vibration stress, the initial number of cycles, and the time of a single temperature cycle in the accelerated test.

[0205] Step 1012: Determine the vibration acceleration factor based on the target action time and the reference action time;

[0206] Step 1013: Determine the comprehensive acceleration factor based on the temperature acceleration factor, vibration acceleration factor, first failure ratio, second failure ratio, and third failure ratio.

[0207] Step 1014: Determine the target number of cycles required for the accelerated test based on the single temperature cycle time, the total time of the baseline test, and the comprehensive acceleration factor;

[0208] Step 1015: Determine the vibration test profile based on the target number of cycles and the target duration of action;

[0209] Step 1016: Determine the accelerated reliability test profile based on the temperature test profile and the vibration test profile.

[0210] like Figure 11 As shown, in this embodiment of the application, the device-level activation energy is determined based on the target product information, and the first temperature acceleration factor AF is calculated based on the device-level activation energy and the Arens model. sys The second temperature acceleration factor AF is calculated based on the equipment-level temperature cyclic stress acceleration model, i.e., formula (3). TC The vibration acceleration factor AF is calculated based on the equipment-level vibration stress acceleration model, i.e., formula (12). 振动 By calculating the equivalent time of each temperature step in the conventional stress test profile to the accelerated test profile, the total time t in the high-temperature section of the accelerated test profile can be obtained. 高温总 Calculate the initial number of cycles N1 required for accelerated testing. When designing the accelerated reliability test profile, first calculate the high-temperature duration t for each cycle in the accelerated test. 高温 The duration t of each cycle in the accelerated test was determined by combining the test profile of conventional stress. 加速（温度） Calculate the total time t of the initial acceleration test. 总（温度） And calculate the temperature acceleration factor AF 温度 Based on the vibration application time and temperature test profile, the target continuous vibration power spectral density W in the accelerated test is calculated. 连续 and its corresponding second vibration time t 连续 Then, the comprehensive acceleration factor AF under multi-stress coupling conditions is calculated, and finally the total time t of the target acceleration test is determined. 加速 Draw a reliability accelerated test profile.

[0211] This application embodiment simultaneously considers the effects of constant temperature, temperature cycling, vibration stress, and the combined effects of these stresses on the failure of the target product, obtaining a comprehensive acceleration factor for multi-stress coupling effects. This overcomes the shortcomings of previous accelerated product testing methods that only considered a single stress or simplified the interaction between stresses. When designing the accelerated reliability test profile, the important principle of not changing the product failure mechanism is fully considered, and the total applied stress is equivalent to that of conventional reliability testing. Therefore, in addition to the aforementioned temperature and vibration stress, the effects of humidity and electrical stress on product failure are retained. A systematic and complete accelerated reliability test profile design process is provided, clarifying the selection of accelerated stress, the calculation of stress values, and the matching of various stresses. This effectively guides how to use the acceleration factor to transform a conventional reliability test profile into an executable accelerated test profile.

[0212] In summary, the embodiments of this application have the following technical effects:

[0213] (1) The device-level activation energy of the product is obtained by the activation energy of the components, and the temperature acceleration factor is calculated based on the device-level activation energy, which solves the problem of insufficient calculation of the acceleration factor of the whole machine of the current electronic products.

[0214] (2) Taking into account the multi-stress coupling effects of temperature, temperature cycling, vibration, etc., and taking into account the influence of humidity and electrical stress, it covers more than 90% of the main failure mechanisms and failure modes of the product. Compared with the single stress acceleration test method, the evaluation results are more comprehensive and more in line with the actual use scenario.

[0215] (3) By scientifically designing accelerated test profiles, the test cycle is significantly shortened and the test cost is reduced while ensuring the consistency of failure mechanisms. Tests that originally required several months can be shortened to a reasonable range, meeting the schedule and cost requirements for the development and delivery of highly reliable and long-life electronic products.

[0216] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages in other steps. It is understood that the steps in different embodiments can be freely combined as needed, and all non-contradictory solutions formed by such combinations are within the scope of protection of this application.

[0217] Based on the same inventive concept, this application also provides an accelerated reliability testing apparatus for implementing the accelerated reliability testing method described above. The solution provided by this apparatus is similar to the solution described in the above method; therefore, the specific limitations in one or more embodiments of the accelerated reliability testing apparatus provided below can be found in the limitations of the accelerated reliability testing method described above, and will not be repeated here.

[0218] In one exemplary embodiment, such as Figure 12 As shown, an accelerated reliability testing apparatus is provided, comprising: a first determining module 1201, a second determining module 1202, a third determining module 1203, and a fourth determining module 1204, wherein:

[0219] The first determining module 1201 is used to determine the device-level activation energy of the target product in each reference constant temperature range based on the activation energy of all components in the target product.

[0220] The second determining module 1202 is used to determine the temperature acceleration factor and vibration acceleration factor based on the reference cycle number and the activation energy of each device level.

[0221] The third determining module 1203 is used to determine the comprehensive acceleration factor based on the temperature acceleration factor and the vibration acceleration factor;

[0222] The fourth determination module 1204 is used to determine the accelerated reliability test profile of the target product based on the total benchmark test time and the comprehensive acceleration factor; the accelerated reliability test profile is used to conduct accelerated reliability tests on the target product.

[0223] In one embodiment, the first determining module 1201 is specifically used to: for each reference constant temperature range, determine the device-level activation energy based on the activation energy of all components, the reference temperature of the reference constant temperature range, the failure rate of each component at the reference temperature, and the preset temperature under accelerated testing.

[0224] In one embodiment, the second determining module 1202 includes:

[0225] The first determining unit is used to determine the first temperature acceleration factor corresponding to each reference constant temperature range based on the device-level activation energy, the reference temperature, and the preset temperature under accelerated testing.

[0226] The second determining unit is used to determine the second temperature acceleration factor corresponding to each reference temperature change segment based on the reference temperature difference, the reference temperature change rate, the preset temperature difference and the preset temperature change rate under the accelerated test for each reference temperature change segment.

[0227] The third determining unit is used to determine the temperature acceleration factor and vibration acceleration factor based on the reference number of cycles, each first temperature acceleration factor and each second temperature acceleration factor.

[0228] In one embodiment, the third determining unit includes:

[0229] The first determining subunit is used to determine the initial number of cycles for the accelerated reliability test based on the baseline number of cycles and each second temperature acceleration factor.

[0230] The second determining subunit is used to determine the single temperature cycle time of the target single temperature cycle in the accelerated test based on the baseline cycle number, the preliminary cycle number and each first temperature acceleration factor.

[0231] The third determination subunit is used to determine the temperature acceleration factor based on the total time of the benchmark test, the initial number of cycles, and the time of a single temperature cycle;

[0232] The fourth determination sub-unit is used to determine the vibration acceleration factor based on the initial number of cycles and the time of a single temperature cycle.

[0233] In one embodiment, the second determining subunit is specifically used to: determine the total duration of each first temperature segment in the accelerated test based on the baseline number of cycles and each first temperature acceleration factor; determine the target duration of the first temperature segment in the target single temperature cycle based on the total duration and the initial number of cycles; and determine the single temperature cycle time based on the target duration, the preset duration of the second temperature segment in the target single temperature cycle, and the preset temperature change time in the target single temperature cycle.

[0234] In one embodiment, the third determining subunit is specifically used to: determine the total time of the preliminary accelerated test corresponding to the temperature stress based on the initial number of cycles and the time of a single temperature cycle; and determine the temperature acceleration factor based on the total time of the baseline test and the total time of the preliminary accelerated test.

[0235] In one embodiment, the fourth determining subunit is specifically used to: determine the target application time of vibration stress in the accelerated test based on the preset application time of vibration stress, the initial number of cycles, and the time of a single temperature cycle; and determine the vibration acceleration factor based on the target application time and the reference application time.

[0236] In one embodiment, the third determining module 1203 is specifically used for:

[0237] Obtain the first failure ratio corresponding to temperature stress, the second failure ratio corresponding to vibration stress, and the third failure ratio corresponding to combined stress; the combined stress includes temperature stress and vibration stress.

[0238] The comprehensive acceleration factor is determined based on the temperature acceleration factor, vibration acceleration factor, first failure ratio, second failure ratio, and third failure ratio.

[0239] In one embodiment, the fourth determining module 1204 includes:

[0240] The fourth determining unit is used to determine the target number of cycles required for the accelerated test based on the single temperature cycle time, the total time of the baseline test, and the comprehensive acceleration factor.

[0241] The fifth determining unit is used to determine the vibration test profile based on the target cycle number and target action time;

[0242] The sixth determining unit is used to determine the accelerated reliability test profile based on the temperature test profile and the vibration test profile; the temperature test profile includes the single temperature cycle time and the target duration of the first temperature segment in the accelerated test.

[0243] In one embodiment, the fifth determining unit is specifically used for:

[0244] Based on the target number of cycles and the reference total vibration time corresponding to the maximum vibration power spectral density in the reference reliability test, determine the first vibration time corresponding to the maximum vibration power spectral density in the target single temperature cycle.

[0245] Based on the target action time, the number of target cycles, and the first vibration time, determine the second vibration time corresponding to the continuous vibration power spectral density of the target in the accelerated reliability test;

[0246] The target continuous vibration power spectral density is determined based on the reference continuous vibration power spectral density, the reference continuous vibration time, and the second vibration time.

[0247] The vibration test profile is determined based on the maximum vibration power spectral density, the first vibration time, the target continuous vibration power spectral density, and the second vibration time.

[0248] Each module in the aforementioned accelerated reliability testing device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in or independent of the processor in a computer device, or stored in the memory of a computer device as software, so that the processor can call and execute the corresponding operations of each module.

[0249] In one exemplary embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as follows: Figure 13As shown, this computer device includes a processor, memory, input / output (I / O) interfaces, and a communication interface. The processor, memory, and I / O interfaces are connected via a system bus, and the communication interface is also connected to the system bus via the I / O interfaces. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and a database. The internal memory provides the environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The database stores accelerated reliability test data. The I / O interfaces are used for exchanging information between the processor and external devices. The communication interface is used for communication with external terminals via a network connection. When the computer program is executed by the processor, it implements an accelerated reliability test method.

[0250] Those skilled in the art will understand that Figure 13 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0251] In one exemplary embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement an accelerated reliability testing method.

[0252] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements a method for accelerating reliability testing.

[0253] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements an accelerated reliability testing method.

[0254] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, artificial intelligence (AI) processors, etc., and are not limited to these.

[0255] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0256] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. An accelerated reliability testing method, characterized in that, The method includes: Based on the activation energy of all components in the target product, determine the device-level activation energy of the target product in each reference constant temperature range; Based on the baseline number of cycles and the activation energy of each device level, the temperature acceleration factor and vibration acceleration factor are determined. Based on the temperature acceleration factor and the vibration acceleration factor, a comprehensive acceleration factor is determined; Based on the total benchmark test time and the comprehensive acceleration factor, an accelerated reliability test profile for the target product is determined; this accelerated reliability test profile is used to conduct accelerated reliability tests on the target product. Based on the activation energy of all components in the target product, the device-level activation energy of the target product in each reference constant temperature range is determined, including: For each of the aforementioned constant temperature ranges, the device-level activation energy is determined based on the activation energy of all components, the reference temperature of the constant temperature range, the failure rate of each component at the reference temperature, and the preset temperature under accelerated testing. The specific calculation formula is as follows: in, The device-level activation energy of the target product is expressed in eV. Let be the activation energy of the i-th component in the target product; It is the i-th component at the reference temperature Failure rate under the given conditions; n is the number of components in the target product; and These are the reference temperature under normal stress and the preset temperature under accelerated stress, respectively, both being absolute temperatures; k is the Boltzmann constant. Based on the baseline number of cycles and the activation energy of each device level, the temperature acceleration factor and vibration acceleration factor are determined, including: For each of the aforementioned constant temperature ranges, based on the device-level activation energy, the reference temperature, and the preset temperature under accelerated testing, a first temperature acceleration factor corresponding to the reference constant temperature range is determined, and the calculation formula is as follows: Among them, AF sys The first temperature acceleration factor for the target product; and These represent the failure rates of the target product under normal stress and accelerated stress, respectively. For each reference temperature range, a second temperature acceleration factor is determined based on the reference temperature difference, the reference temperature change rate, the preset temperature difference and the preset temperature change rate under accelerated testing. Based on the baseline number of cycles, each of the first temperature acceleration factors, and each of the second temperature acceleration factors, the temperature acceleration factor and the vibration acceleration factor are determined. Based on the baseline number of cycles, each of the first temperature acceleration factors, and each of the second temperature acceleration factors, the temperature acceleration factor and the vibration acceleration factor are determined, including: Based on the baseline number of cycles and each of the second temperature acceleration factors, the initial number of cycles for the accelerated reliability test is determined; Based on the baseline number of cycles, the preliminary number of cycles, and each of the first temperature acceleration factors, the single temperature cycle time of the target single temperature cycle in the accelerated test is determined; The temperature acceleration factor is determined based on the total time of the benchmark test, the initial number of cycles, and the time of a single temperature cycle. The vibration acceleration factor is determined based on the initial number of cycles and the time of a single temperature cycle.

2. The method according to claim 1, characterized in that, Based on the baseline number of cycles, the preliminary number of cycles, and each of the first temperature acceleration factors, the single temperature cycle time of the target single temperature cycle in the accelerated test is determined, including: Based on the baseline number of cycles and each of the first temperature acceleration factors, the total duration of each first temperature segment in the accelerated test is determined. Based on the total duration and the initial number of cycles, determine the target duration of the first temperature segment in the target single temperature cycle; The single temperature cycle time is determined based on the target duration, the preset duration of the second temperature segment in the target single temperature cycle, and the preset temperature change time in the target single temperature cycle.

3. The method according to claim 1, characterized in that, The temperature acceleration factor is determined based on the total time of the benchmark test, the initial number of cycles, and the time of a single temperature cycle, including: The total initial accelerated test time corresponding to the temperature stress is determined based on the initial number of cycles and the time of a single temperature cycle. The temperature acceleration factor is determined based on the total time of the baseline test and the total time of the preliminary acceleration test.

4. The method according to claim 1, characterized in that, The vibration acceleration factor is determined based on the initial number of cycles and the time of a single temperature cycle, including: The target duration of vibration stress in the accelerated test is determined based on the preset application time of vibration stress, the initial number of cycles, and the time of a single temperature cycle. The vibration acceleration factor is determined based on the target action time and the reference action time.

5. The method according to any one of claims 1 to 4, characterized in that, Based on the temperature acceleration factor and the vibration acceleration factor, a comprehensive acceleration factor is determined, including: The first failure ratio corresponding to temperature stress, the second failure ratio corresponding to vibration stress, and the third failure ratio corresponding to combined stress are obtained; the combined stress includes the temperature stress and the vibration stress. The comprehensive acceleration factor is determined based on the temperature acceleration factor, the vibration acceleration factor, the first failure ratio, the second failure ratio, and the third failure ratio.

6. The method according to claim 4, characterized in that, Based on the total benchmark test time and the comprehensive acceleration factor, the accelerated reliability test profile of the target product is determined, including: The target number of cycles required for the accelerated test is determined based on the single temperature cycle time, the total time of the baseline test, and the comprehensive acceleration factor. Based on the target number of cycles and the target duration, the vibration test profile is determined; The accelerated reliability test profile is determined based on the temperature test profile and the vibration test profile; the temperature test profile includes the single temperature cycle time and the target duration of the first temperature segment in the accelerated test.

7. The method according to claim 6, characterized in that, Determining the vibration test profile based on the target number of cycles and the target duration includes: Based on the target number of cycles and the reference total vibration time corresponding to the maximum vibration power spectral density in the reference reliability test, determine the first vibration time corresponding to the maximum vibration power spectral density in the target single temperature cycle; Based on the target action time, the target cycle number, and the first vibration time, determine the second vibration time corresponding to the continuous vibration power spectral density of the target in the accelerated reliability test; The target continuous vibration power spectral density is determined based on the reference continuous vibration power spectral density, the reference continuous vibration time, and the second vibration time. The vibration test profile is determined based on the maximum vibration power spectral density, the first vibration time, the target continuous vibration power spectral density, and the second vibration time.

8. An accelerated reliability testing apparatus, characterized in that, The device includes: The first determining module is used to determine the device-level activation energy of the target product in each reference constant temperature range based on the activation energy of all components in the target product. The second determining module is used to determine the temperature acceleration factor and the vibration acceleration factor based on the baseline number of cycles and the activation energy of each device level. The third determining module is used to determine the comprehensive acceleration factor based on the temperature acceleration factor and the vibration acceleration factor; The fourth determining module is used to determine the accelerated reliability test profile of the target product based on the total benchmark test time and the comprehensive acceleration factor; the accelerated reliability test profile is used to conduct accelerated reliability tests on the target product. The first determining module is specifically used to: for each of the reference constant temperature ranges, based on the activation energy of all the components, the reference temperature of the reference constant temperature range, the failure rate of each component at the reference temperature, and the preset temperature under accelerated testing, determine the device-level activation energy, and the specific calculation formula is as follows: in, The device-level activation energy of the target product is expressed in eV. Let be the activation energy of the i-th component in the target product; It is the i-th component at the reference temperature Failure rate under the given conditions; n is the number of components in the target product; and These are the reference temperature under normal stress and the preset temperature under accelerated stress, respectively, both being absolute temperatures; k is the Boltzmann constant. The second determining module includes: The first determining unit is configured to, for each of the reference constant temperature ranges, determine the first temperature acceleration factor corresponding to the reference constant temperature range based on the device-level activation energy, the reference temperature, and the preset temperature under accelerated testing. The calculation formula is as follows: Among them, AF sys The first temperature acceleration factor for the target product; and These represent the failure rates of the target product under normal stress and accelerated stress, respectively. The second determining unit is used to determine the second temperature acceleration factor corresponding to each reference temperature change segment based on the reference temperature difference, the reference temperature change rate, the preset temperature difference and the preset temperature change rate under the accelerated test for each reference temperature change segment. The third determining unit is used to determine the temperature acceleration factor and the vibration acceleration factor based on the reference number of cycles, each of the first temperature acceleration factors, and each of the second temperature acceleration factors. The third determining unit includes: The first determining subunit is used to determine the initial number of cycles for accelerated reliability testing based on the baseline number of cycles and each second temperature acceleration factor. The second determining subunit is used to determine the single temperature cycle time of the target single temperature cycle in the accelerated test based on the baseline cycle number, the preliminary cycle number and each first temperature acceleration factor. The third determination subunit is used to determine the temperature acceleration factor based on the total time of the benchmark test, the initial number of cycles, and the time of a single temperature cycle; The fourth determination sub-unit is used to determine the vibration acceleration factor based on the initial number of cycles and the time of a single temperature cycle.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 7.

11. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 7.

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