A testing device for thermistor chip
By designing a specialized testing device, the problem of difficult clamping in the testing of small NTC thermistor chips was solved, achieving efficient and accurate testing, avoiding chip damage, and improving testing efficiency and accuracy.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-07-31
- Publication Date
- 2026-07-14
AI Technical Summary
Existing technologies are insufficient for efficiently and accurately testing small NTC thermistor chips. Ordinary test fixtures cannot hold them stably, making operation difficult and inefficient, and posing a risk of damaging the chips.
A testing device was designed, comprising a constant temperature chamber, a test oil tank, a support frame, a test board, a test slot, a fixing mechanism, and a limiting mechanism. The test board is fixed by setting a test slot on the test board and fixing the test board by fixing the test board, and the test line and limiting mechanism are used for limiting, which simplifies the operation process and avoids damage to the chip by clamping.
Stable testing of small NTC thermistor chips has been achieved, improving testing efficiency, simplifying the operation process, avoiding chip damage, and ensuring the accuracy of test results.
Smart Images
Figure CN224500719U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of resistor chip testing, specifically relating to a testing device for thermistor chips. Background Technology
[0002] NTC thermistor chips are characterized by their small size, high reliability, and high stability. Their resistance decreases exponentially with increasing temperature, and their excellent temperature sensitivity allows for precise temperature detection. As the core temperature-sensing element of temperature sensors, thermistor chips are widely used in various temperature detection, temperature compensation, and temperature control fields. To ensure measurement accuracy, temperature control in a constant-temperature oil bath is required during NTC thermistor chip performance testing. This is particularly challenging for small thermistor chips, requiring them to be immersed in the oil bath while maintaining a constant temperature. Such operation is difficult and inefficient.
[0003] NTC thermistor chips have an upper and lower electrode structure. The common method for measuring resistance is to use a digital multimeter, connecting the probes to the upper and lower ends of the device under test (DUT), and then using the built-in voltmeter and ammeter to measure the resistance using Ohm's law. This method is generally only suitable for larger products where the product size allows for easy clamping. However, for small thermistor chips (such as 0.32mm*0.32mm*0.25mm), ordinary test fixtures cannot hold them stably in an oil bath, resulting in difficult operation, low testing efficiency, and inaccurate test results. Further improvements are needed. Summary of the Invention
[0004] The purpose of this invention is to overcome the shortcomings of the prior art and provide a testing device for thermistor chips.
[0005] The present invention adopts the following technical solution:
[0006] A testing device for a thermistor chip includes a constant temperature chamber, a test oil tank disposed inside the constant temperature chamber, a support frame supported on the constant temperature chamber and located in the test oil tank, a test board disposed on the support frame, multiple test slots disposed on the test board for placing the thermistor chip, a fixing mechanism for fixing the test board on the support frame, test leads connected to the test board and extending outward to the outside of the test oil tank, and a limiting mechanism disposed on the support frame for limiting the test leads.
[0007] Furthermore, the fixing mechanism includes a positioning post disposed at the bottom of the test plate, a positioning hole disposed on the support frame for the positioning post to be inserted, and a fixing member disposed between the test plate and the support frame.
[0008] Furthermore, the fastener includes two fixing holes disposed opposite to each other on the test plate, two clearance holes disposed on the support frame opposite to the two fixing holes, and fixing bolts that pass through the two clearance holes and are threadedly engaged with the opposite fixing holes.
[0009] Furthermore, the support frame includes a main body section for supporting the test plate, two vertical sections extending upwards on both sides of the main body section, and two support sections arranged perpendicularly to the two vertical sections and supporting the top surface of the constant temperature chamber.
[0010] Furthermore, the top surface of the constant temperature chamber has two downward-extending limiting grooves for the two support sections to be embedded in.
[0011] Furthermore, the limiting mechanism includes a lead wire groove extending from the vertical section to the support section and two limiting clamps respectively disposed on the vertical section and the support section to limit and fix the test wire.
[0012] Furthermore, the limiting clamp includes a rotating seat disposed on the vertical section or support section, a limiting clamp body disposed on the rotating seat that can flip relative to the vertical section or support section, a rotating shaft disposed on the rotating seat and connected to the limiting clamp body, and a reset torsion spring sleeved on the rotating shaft. One end of the reset torsion spring abuts against the top surface of the vertical section or support section, and the other end abuts against the inner wall of the limiting clamp body.
[0013] Furthermore, the limiting clamp body is provided with an operating block that drives the limiting clamp body to rotate outward.
[0014] As can be seen from the above description of the present invention, compared with the prior art, the beneficial effects of the present invention are as follows: By defining the structure of the testing device, the present application opens a test slot on the test plate for placing the thermistor chip, and the test plate is fixed in the test oil tank by a support frame. During testing, there is no need to clamp the thermistor chip. It is simply placed in the test slot, and the test probe on the testing instrument is connected to the thermistor chip to complete the testing of the thermistor chip. The operation is simple and convenient, improves the testing efficiency, effectively solves the problem of the product being too small to be clamped, and is not easy to damage the thermistor chip. Attached Figure Description
[0015] Figure 1 This is a schematic diagram showing the usage status of the testing device;
[0016] Figure 2 This is a schematic diagram of the testing device.
[0017] Figure 3 This is a partial structural diagram of the testing device;
[0018] Figure 4 A partial structural diagram of the testing device. Figure 1 ;
[0019] Figure 5 A partial structural diagram of the testing device. Figure 2 ;
[0020] Figure 6 A partial structural diagram of the testing device. Figure 3 ;
[0021] In the diagram, 1. Constant temperature chamber; 2. Test oil tank; 3. Support frame; 4. Test plate; 5. Test slot; 6. Fixing mechanism; 7. Test line; 8. Limiting mechanism; 11. Limiting slot; 31. Main body section; 32. Vertical section; 33. Supporting section; 61. Positioning post; 62. Positioning hole; 63. Fixing component; 64. Fixing hole; 65. Clearance hole; 66. Fixing bolt; 81. Lead wire slot; 82. Limiting clamp; 83. Rotating seat; 84. Limiting clamp body; 85. Rotating shaft; 86. Reset torsion spring; 87. Operating block. Detailed Implementation
[0022] The present invention will be further described below through specific embodiments.
[0023] Reference Figures 1 to 6 As shown, a testing device for a thermistor chip includes a constant temperature chamber 1, a test oil tank 2 disposed inside the constant temperature chamber 1, a support frame 3 supported on the constant temperature chamber 1 and located in the test oil tank 2, a test plate 4 disposed on the support frame 3, multiple test slots 5 disposed on the test plate 4 for placing the thermistor chip, a fixing mechanism 6 for fixing the test plate 4 to the support frame 3, test wires 7 connected to the test plate 4 and extending outward to the outside of the test oil tank 2, and a limiting mechanism 8 disposed on the support frame 3 for limiting the test wires 7; wherein, the test plate 4 is made of copper plate, and except for the connection with the test wires 7 and the contact part with the thermistor chip in the middle, the exposed part of the test plate 4 is coated with an insulating layer.
[0024] The support frame 3 includes a main body section 31 for supporting the test board 4, two vertical sections 32 extending upward from both sides of the main body section 31, and two support sections 33 arranged perpendicularly to the two vertical sections 32 and supporting the top surface of the constant temperature chamber 1. The top surface of the constant temperature chamber 1 has two downward extending limiting grooves 11 for the two support sections 33 to be inserted into. Through the cooperation of the two support sections 33 and the two limiting grooves 11, the support frame 3 placed in the test oil tank 2 is limited and fixed to prevent the support frame 3 from shifting during the thermistor chip test and affecting the test results.
[0025] The fixing mechanism 6 includes a positioning post 61 at the bottom of the test plate 4, a positioning hole 62 on the main body section 31 into which the positioning post 61 can be inserted, and a fixing member 63 on the test plate 4 between the support frame 3. Specifically, the fixing member 63 includes two fixing holes 64 opposite to each other on the test plate 4, two clearance holes 65 on the main body section 31 opposite to the two fixing holes 64, and fixing bolts 66 that pass through the two clearance holes 65 and are threadedly engaged with the opposite fixing holes 64. When fixing the test plate 4, the positioning post 61 is first inserted into the opposite positioning hole 62 to pre-position the test plate 4, and then the fixing bolts 66 are threadedly engaged with the opposite fixing holes 64 to lock the test plate 4 onto the support frame 3. The positioning post 61 and the positioning hole 62 are engaged to pre-position the test plate 4, so that the fixing bolts 66 and the fixing holes 64 can be quickly engaged and locked.
[0026] The limiting mechanism 8 includes a lead wire groove 81 extending from the vertical section 32 to the support section 33 and limiting clamps 82 respectively disposed on the vertical section 32 and the support section 33 to limit and fix the test wire 7. The lead wire groove 81, in conjunction with the limiting clamps 82, guides and fixes the outwardly extended test wire 7, preventing it from being touched during testing and affecting the test results. The limiting clamps 82 also facilitate the removal and fixing of the test wire 7. Specifically, the limiting clamps 82 include components disposed on the vertical section 32 or the support section 33. The rotating seat 83, the limiting clamp body 84 which is mounted on the rotating seat 83 and can be flipped relative to the vertical section 32 or the support section 33, the rotating shaft 85 which is mounted on the rotating seat 83 and connected to the limiting clamp body 84, and the reset torsion spring 86 which is sleeved on the rotating shaft 85, wherein one end of the reset torsion spring 86 abuts against the top surface of the vertical section 32 or the support section 33, and the other end abuts against the inner wall of the limiting clamp body 84; furthermore, the limiting clamp body 84 is arc-shaped and is provided with an operating block 87 that drives the limiting clamp body 84 to flip outward.
[0027] During measurement, the test lead 7 is connected to the test board 4 and extends outward through the lead groove 81 to connect with the measuring instrument. Then, the support frame 3 is placed in the test oil tank 2 so that its two support sections 33 are respectively embedded in the two limiting grooves 11 on the top surface of the constant temperature chamber 1, so that the test board 4 is completely inserted into the test oil tank 2. Then, one end electrode of the thermistor chip is placed downward and placed in the test groove 5. Next, the test pen connected to the measuring instrument is placed on the other end electrode of the thermistor chip in the test groove 5. At this time, the result obtained by the measuring instrument can be viewed.
[0028] This application defines the structure of the testing device by creating a test slot 5 on the test board 4 for placing the thermistor chip. The test board 4 is fixed in the test oil tank 2 by the support frame 3. During testing, there is no need to clamp the thermistor chip. Simply place it in the test slot 5, and then the test probe on the testing instrument will connect with the thermistor chip to complete the test. The operation is simple and convenient, improving the testing efficiency and effectively solving the problem of difficulty in clamping due to the small size of the product. It also makes it less likely to damage the thermistor chip.
[0029] The above description is only a preferred embodiment of the present utility model, and therefore cannot be used to limit the scope of the present utility model. All equivalent changes and modifications made in accordance with the scope of the present utility model application and the contents of the specification should still fall within the scope of the present utility model application.
Claims
1. A testing device for a thermistor chip, characterized in that: It includes a constant temperature chamber, a test oil tank inside the constant temperature chamber, a support frame on the constant temperature chamber located in the test oil tank, a test board on the support frame, multiple test slots on the test board for placing the thermistor chip, a fixing mechanism for fixing the test board on the support frame, test wires connected to the test board and extending outward to the outside of the test oil tank, and a limiting mechanism on the support frame for limiting the test wires.
2. The testing device for a thermistor chip according to claim 1, characterized in that: The fixing mechanism includes a positioning post at the bottom of the test plate, a positioning hole on the support frame into which the positioning post can be inserted, and a fixing member between the test plate and the support frame.
3. The testing device for a thermistor chip according to claim 2, characterized in that: The fastener includes two fixing holes that are oppositely disposed on the test plate, two clearance holes that are opposite to the two fixing holes on the support frame, and fixing bolts that pass through the two clearance holes and are threaded into the opposite fixing holes.
4. The testing device for a thermistor chip according to claim 1, characterized in that: The support frame includes a main section for supporting the test plate, two vertical sections extending upwards on both sides of the main section, and two support sections arranged perpendicularly to the two vertical sections and supporting the top surface of the constant temperature chamber.
5. The testing device for a thermistor chip according to claim 4, characterized in that: The top surface of the constant temperature chamber has two downward-extending limiting grooves for the two support sections to be embedded in.
6. The testing device for a thermistor chip according to claim 4, characterized in that: The limiting mechanism includes a lead wire groove extending from the vertical section to the support section and two limiting clamps respectively set on the vertical section and the support section to limit and fix the test wire.
7. The testing device for a thermistor chip according to claim 6, characterized in that: The limiting clamp includes a rotating seat disposed on a vertical section or a support section, a limiting clamp body disposed on the rotating seat that can flip relative to the vertical section or the support section, a rotating shaft disposed on the rotating seat and connected to the limiting clamp body, and a reset torsion spring sleeved on the rotating shaft. One end of the reset torsion spring abuts against the top surface of the vertical section or the support section, and the other end abuts against the inner wall of the limiting clamp body.
8. The testing device for a thermistor chip according to claim 7, characterized in that: The limiting clamp body is provided with an operating block that drives the limiting clamp body to rotate outward.