Communication module detection method and device, equipment and storage medium
By programming a temporary test program into the electronic speed controller and receiver combo product, enabling it to actively transmit radio frequency signals and automatically erase them after the test, the problem of difficulty in early detection of radio frequency performance defects is solved. This achieves pre-screening and integrated testing of radio frequency performance, improving production efficiency and reducing costs.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHENZHEN HOBBYWING TECH CO LTD
- Filing Date
- 2026-01-23
- Publication Date
- 2026-04-24
AI Technical Summary
In the current production process, the radio frequency performance testing of the electronic speed controller and receiver combo product is usually carried out after the program is burned, which makes it difficult to detect radio frequency performance defects in the early stage, increasing the complexity of the production process and material waste.
By programming a temporary test program into the product under test, it can actively emit radio frequency signals and automatically erase them after the test is completed. Combining radio frequency parameter detection with formal program programming, pre-screening and integrated testing of radio frequency performance can be achieved.
Products with substandard RF performance are screened out before the formal programming process, reducing labor time and material waste, simplifying the testing process, reducing equipment costs, and improving production efficiency.
Smart Images
Figure CN121923740A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of wireless communication module testing technology, and in particular to a method, testing apparatus, testing equipment, and non-transitory computer-readable storage medium for testing communication modules. Background Technology
[0002] Electronic speed controllers (ESCs) that combine a speed controller and a receiver are core electronic components widely used in the field of remote-controlled models. The receiver receives the radio frequency (RF) signals transmitted by the remote control, while the ESC adjusts the motor speed according to the received control commands. Since the receiver's RF performance directly affects the reception quality and control distance of the remote control signal, RF signal testing is a crucial step in the manufacturing process of these products.
[0003] In implementing the embodiments of this application, the inventors discovered that: Currently, the existing production process usually adopts the process sequence of first programming and then performing functional testing. After the product completes the programming and is assembled into a semi-finished product, a spectrum analyzer is used to test the radio frequency signal one by one. This process can easily lead to the detection of radio frequency performance defects in the product only after programming, which has already caused a waste of programming time and assembly materials. Furthermore, programming and radio frequency testing are performed as two independent processes, which fails to achieve integration and automation, increasing the complexity of the production process. Summary of the Invention
[0004] The main technical problem solved by the embodiments of this application is to provide a testing method for a communication module. By burning a one-time temporary test program into the product under test, the receiver, which can only passively receive signals, actively transmits signals, thereby realizing active testing of radio frequency performance. After the test is completed, the program is automatically erased without affecting the subsequent formal program burning. This method can screen out products with unqualified radio frequency signals in advance so as not to proceed with subsequent work, and can simultaneously and quickly test the radio frequency signals and program burning of multiple products.
[0005] To address the aforementioned technical problems, one technical solution adopted in this application embodiment is: providing a testing method for a communication module, applied to a testing device. The method includes burning a temporary test program into a product under test (DUT), causing the DUT to execute the temporary test program and then transmit a radio frequency (RF) signal, receiving the RF signal transmitted by the DUT, performing parameter detection on the RF signal to obtain RF parameter detection results, comparing the RF parameter detection results with a preset threshold to determine whether the DUT is qualified, erasing the temporary test program from the DUT after the RF signal detection is completed, and finally burning a formal product program into the DUT that is determined to be qualified.
[0006] Optionally, the testing device is provided with a programming interface. The step of programming a temporary test program into the product under test (DUT) so that the DUT executes the temporary test program and then transmits a radio frequency signal further includes: the testing device establishing a communication connection with the DUT through the programming interface, writing a pre-stored temporary test program into the chip of the DUT through the programming interface, and the DUT executing the temporary test program to transmit a radio frequency signal at a preset frequency.
[0007] Optionally, the step of receiving the radio frequency signal transmitted by the product under test and performing parameter detection on the radio frequency signal to obtain the radio frequency parameter detection result further includes: the test device receiving the radio frequency signal transmitted by the product under test through the radio frequency receiving module, performing parameter detection on the radio frequency signal, wherein the parameter detection includes at least one of transmit power detection, receive power detection, frequency offset detection and packet loss rate detection, and generating the radio frequency parameter detection result based on the detection result.
[0008] Optionally, the step of comparing the radio frequency parameter detection results with preset thresholds to determine whether the product under test is qualified further includes: obtaining the threshold ranges corresponding to each pre-configured radio frequency parameter, comparing each parameter value in the radio frequency parameter detection results with the corresponding threshold range, and determining that the product under test is qualified if all parameter values are within the corresponding threshold range, and determining that the product under test is unqualified if any parameter value exceeds the corresponding threshold range.
[0009] Optionally, the testing device includes multiple testing channels, one of the testing channels is connected to one of the products under test, and the method further includes: the testing device sequentially performs the steps of temporary test program burning, radio frequency signal parameter detection, pass / fail judgment, temporary program erasure and formal product program burning on multiple products under test; Alternatively, the testing device may perform the steps of burning the temporary test program, detecting radio frequency signal parameters, determining pass / fail, erasing the temporary program, and burning the formal product program on multiple products under test in parallel.
[0010] Optionally, the step of erasing the temporary test program in the product under test after the radio frequency signal detection is completed further includes: after the radio frequency parameter detection result is generated, sending an erasure command to the product under test, erasing the temporary test program stored in the chip of the product under test according to the erasure command, verifying the erasure result, and confirming that the temporary test program has been completely erased.
[0011] Optionally, the step of verifying the erasure result and confirming that the temporary test program has been completely erased further includes: reading the storage area in the chip of the product under test where the temporary test program is stored, determining whether the storage area has been restored to a blank state; if the storage area has been restored to a blank state, then the erasure is confirmed to be successful, and the step of burning the formal product program to the product under test that has been determined to be qualified is executed; if the storage area has not been restored to a blank state, then the erasure operation is re-executed or the product under test is marked as abnormal.
[0012] To solve the above-mentioned technical problems, another technical solution adopted in this application embodiment is: providing a testing device, the testing device including: a first programming module, a receiving module, a judgment module, an erasure module and a second programming module, the first programming module being used to program a temporary test program into the product under test, so that the product under test emits a radio frequency signal after executing the temporary test program, the receiving module being used to receive the radio frequency signal emitted by the product under test and perform parameter detection on the radio frequency signal to obtain the radio frequency parameter detection result, the judgment module being used to compare the radio frequency parameter detection result with a preset threshold to determine whether the product under test is qualified, the erasure module being used to erase the temporary test program in the product under test after the radio frequency signal detection is completed, and the second programming module being used to program a formal product program into the product under test that is determined to be qualified.
[0013] To solve the above-mentioned technical problems, another technical solution adopted in this application embodiment is: providing a testing device, including: a base plate, at least one sub-board, a host computer, and a controller. The base plate is used to provide power supply and communication interfaces. At least one sub-board is connected to the base plate. Each sub-board includes a main control chip and an RF chip. The main control chip is used to store temporary test programs and formal product programs, and communicates with the product under test through a programming interface to realize program programming and erasure. The RF chip is used to receive RF signals emitted by the product under test. The host computer is communicatively connected to the base plate and is used to configure test parameters, control the workflow of the sub-board, receive RF parameter detection results, and perform qualification judgment. The controller includes: at least one processor and a memory communicatively connected to the at least one processor. The controller is electrically connected to the base plate, the sub-board, and the host computer respectively. The memory stores instructions that can be executed by the at least one processor. The instructions are executed by the at least one processor to enable the at least one processor to perform the method described above.
[0014] To solve the above-mentioned technical problems, another technical solution adopted in the embodiments of this application is: providing a non-transitory computer-readable storage medium, wherein the non-transitory computer-readable storage medium stores computer-executable instructions, the computer-executable instructions being used to cause a server to perform the method described above.
[0015] This application provides a testing method for communication modules. By first programming a temporary test program onto the product under test (DUT) for radio frequency (RF) performance testing, and then programming the formal product program onto qualified products, the RF testing process is pre-positioned. Products with substandard RF performance can be screened out before the formal program is programmed, avoiding subsequent programming and assembly operations on defective products, effectively reducing time and material waste. Then, by programming the temporary test program, the DUT actively transmits RF signals, which are directly received and parameter detected by the testing device. This eliminates the need for individual testing with external specialized equipment such as spectrum analyzers, simplifying the testing process and reducing equipment costs. Finally, RF signal detection and program programming are integrated into the same testing process. The testing device uniformly completes operations such as temporary program programming, RF parameter detection, pass / fail determination, temporary program erasure, and formal program programming, achieving integrated testing and programming, reducing the number of production steps and improving production efficiency. Attached Figure Description
[0016] To more clearly illustrate the technical solutions in the specific embodiments of this application or the prior art, the accompanying drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. In all the drawings, similar elements or parts are generally identified by similar reference numerals. In the drawings, the elements or parts are not necessarily drawn to scale.
[0017] Figure 1 This is a flowchart of the testing method in the application embodiment; Figure 2 This is a flowchart of a specific implementation of step S101 in the embodiments of this application; Figure 3 This is a flowchart of a specific implementation of step S102 in the embodiments of this application; Figure 4 This is a flowchart of a specific implementation of step S103 in the embodiments of this application; Figure 5 This is a flowchart of a specific implementation of step S104 in the embodiments of this application; Figure 6 This is a flowchart of a specific implementation of step S143 in the embodiments of this application; Figure 7 This is a structural block diagram of the testing device according to an embodiment of this application; Figure 8 This is a schematic diagram of the detection equipment in an embodiment of this application. Detailed Implementation
[0018] To facilitate understanding of this application, a more detailed description is provided below with reference to the accompanying drawings and specific embodiments. It should be noted that when an element is described as "fixed to" another element, it can be directly on the other element, or one or more intermediate elements may exist between them. When an element is described as "connected" to another element, it can be directly connected to the other element, or one or more intermediate elements may exist between them. The terms "upper," "lower," "inner," "outer," "vertical," "horizontal," etc., used in this specification indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application. Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance.
[0019] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of the application. The term "and / or" as used in this specification includes any and all combinations of one or more of the associated listed items.
[0020] Furthermore, the technical features involved in the different embodiments of this application described below can be combined with each other as long as they do not conflict with each other.
[0021] The communication module testing method provided in this application is applied to a testing device, which is used to perform radio frequency performance testing and program burning on a product under test containing a communication module.
[0022] In a typical application scenario, the product under test is a combined electronic speed controller and receiver, widely used in the field of remote-controlled models. The receiver receives the radio frequency (RF) signals transmitted by the remote control, while the RF controller adjusts the motor speed according to the received control commands. Since the receiver's RF performance directly affects the reception quality and control distance of the remote control signal, it is necessary to test the RF signal during the production process.
[0023] The testing setup includes a baseboard, a daughterboard, and a host computer. The baseboard provides power and communication interfaces, receiving power input via a power adapter and establishing a communication connection with the host computer via a USB interface. The daughterboard connects to the baseboard and houses a main control chip and an RF chip. The main control chip stores the program and communicates with the product under test (DUT), while the RF chip receives the RF signals emitted by the DUT. The host computer communicates with the baseboard and is used to configure test parameters, control the daughterboard's workflow, and display test results.
[0024] In actual use, the operator connects the product under test to the daughterboard, starts the test process through the host computer, and the test device automatically completes all operations of RF testing and program burning.
[0025] In this embodiment, the specific implementation of the radio frequency receiving module is described.
[0026] The testing device receives the radio frequency signal emitted by the product under test through the radio frequency receiving module, which can be either wired or wireless.
[0027] In the wired reception method, the test device's RF receiving module has an RF extension cable interface, and the product under test (DUT) has a corresponding RF output port. One end of the RF extension cable connects to the test device's RF extension cable interface, and the other end connects to the DUT's RF output port, forming a wired transmission channel for the RF signal. When the DUT transmits an RF signal, the signal is directly transmitted to the test device's RF receiving module via the RF extension cable. The wired reception method reduces signal attenuation and interference during wireless transmission and is suitable for scenarios requiring high testing accuracy.
[0028] In the wireless reception method, the RF receiving module of the test equipment is equipped with an antenna. The RF signal emitted by the product under test (DUT) propagates wirelessly through space to the test equipment. The antenna of the test equipment receives the RF signal in space and transmits the received RF signal to the RF receiving module for further processing. The wireless reception method can simulate the RF performance of the DUT in a real-world usage environment and is suitable for evaluating the actual communication capabilities of the product.
[0029] The testing device can choose to use wired or wireless receiving methods according to the testing requirements, or it can be configured with both wired and wireless receiving modules, using different receiving methods in different testing stages.
[0030] Figure 1 A flowchart of a test method for a communication module according to this application is shown, as follows: Figure 2 As shown, the detection method includes the following steps: Step S101: Program a temporary test program to the product under test, so that the product under test transmits radio frequency signals after executing the temporary test program; In this step, the testing equipment programs a temporary test program onto the product under test (DUT). This temporary test program is a program specifically designed for the testing phase, and its function is to control the communication module in the DUT to transmit radio frequency (RF) signals. Under normal operating conditions, the receiver in the DUT passively receives external RF signals and cannot actively transmit signals for the testing equipment to detect. By programming the temporary test program, the DUT can actively transmit RF signals, thereby enabling active testing of the RF performance of the communication module. After receiving and executing the temporary test program, the communication module of the DUT begins to transmit RF signals.
[0031] Step S102: Receive the radio frequency signal emitted by the product under test, and perform parameter detection on the radio frequency signal to obtain the radio frequency parameter detection result; The testing equipment receives the radio frequency (RF) signal transmitted by the product under test (DUT) and performs parameter testing on the received RF signal. The purpose of parameter testing is to obtain the RF performance indicators of the DUT's communication module to assess whether it meets product quality requirements. After completing the RF signal parameter testing, the testing equipment generates RF parameter testing results, which include various RF performance data of the DUT's communication module.
[0032] Step S103: Compare the radio frequency parameter detection results with a preset threshold to determine whether the product under test is qualified; The testing device communicates with a host computer, which displays the test status and RF parameter detection results. During the test, the testing device transmits the test data of each product under test to the host computer in real time. The host computer's display interface shows the current test status and parameter detection values of each product under test.
[0033] The host computer's display interface is divided into zones according to test channels, with each test channel corresponding to a display area. The display area shows the test information of the product under test connected to that channel. The displayed information includes the test channel number, the current test step, the measured values of various RF parameters, and the pass / fail result. The measured values of RF parameters include transmit power, receive power, frequency offset, packet loss rate, and quiescent current.
[0034] When the testing device determines that the product under test is qualified in step S103, the host computer displays a qualified indicator in the display area of the corresponding test channel, indicating that the product under test has passed the RF performance test. When the testing device determines that the product under test is unqualified, the host computer displays a unqualified indicator in the display area of the corresponding test channel and triggers an alarm. The alarm can be triggered by methods such as screen flashing, color change, or sound prompts to remind the operator to pay attention to the unqualified product.
[0035] With the test results display and alarm functions, operators can intuitively understand the test status and parameter values of each product under test, promptly identify and handle unqualified products, and improve the controllability of the production process.
[0036] The testing device compares the RF parameter detection results obtained in step S102 with a preset threshold. The preset threshold is a pre-configured standard value used to determine whether a product is qualified or not, and can be set via a host computer. The testing device determines whether the product under test is qualified based on the comparison results. If the RF parameter detection results meet the requirements of the preset threshold, the product under test is deemed qualified; if the RF parameter detection results do not meet the requirements of the preset threshold, the product under test is deemed unqualified.
[0037] In this embodiment, the testing device is communicatively connected to a host computer, which displays the test status and RF parameter detection results. During the test, the testing device transmits the test data of each product under test to the host computer in real time, and the host computer's display interface presents the current test status and parameter detection values of each product under test.
[0038] The host computer's display interface is divided into zones according to test channels, with each test channel corresponding to a display area. The display area shows the test information of the product under test connected to that channel. The displayed information includes the test channel number, the current test step, the measured values of various RF parameters, and the pass / fail result. The measured values of RF parameters include transmit power, receive power, frequency offset, packet loss rate, and quiescent current.
[0039] When the testing device determines that the product under test is qualified in step S103, the host computer displays a qualified indicator in the display area of the corresponding test channel, indicating that the product under test has passed the RF performance test. When the testing device determines that the product under test is unqualified, the host computer displays a unqualified indicator in the display area of the corresponding test channel and triggers an alarm. The alarm can be triggered by methods such as screen flashing, color change, or sound prompts to remind the operator to pay attention to the unqualified product.
[0040] With the test results display and alarm functions, operators can intuitively understand the test status and parameter values of each product under test, promptly identify and handle unqualified products, and improve the controllability of the production process.
[0041] Step S104: After the radio frequency signal detection is completed, erase the temporary test program in the product under test; After the radio frequency signal detection in step S102 is completed, the test device erases the temporary test program stored in the chip under test. The temporary test program is only used during the testing phase and needs to be erased after the test to free up storage space for subsequent programming of the formal product program. After the erasure operation is completed, the corresponding storage area in the chip under test is restored to a blank state.
[0042] Step S105: Burn the official product program into the product to be tested that has been determined to be qualified.
[0043] The testing device programs the official product program to the products under test (DUTs) that passed the initial test in step S103. The official product program is the program that the DUT runs during actual use and contains all the functional codes required for normal product operation. Only DUTs that pass the RF test will proceed to this step for official program programming; DUTs that fail the RF test will be rejected and will not undergo further programming. After programming is complete, the DUTs can proceed to the subsequent production process.
[0044] In this embodiment of the application, a process flow of first performing radio frequency performance testing and then burning the formal program is implemented. This can screen out products with unqualified radio frequency performance before burning the formal program, avoid subsequent burning operations on defective products, reduce the waste of time and materials, and improve production efficiency by integrating radio frequency testing and program burning into the same testing process.
[0045] See Figure 2 , Figure 2 A flowchart illustrating a specific implementation of step S101 in an embodiment of this application is shown. In this embodiment, the testing device is equipped with a programming interface, and step S101 further includes the following sub-steps.
[0046] Step S111: The testing device establishes a communication connection with the product under test through the programming interface; The testing device establishes a communication connection with the product under test (DUT) through its programming interface. The programming interface is the interface on the testing device used for data transmission with the DUT. When the DUT is placed at the testing station and connected to the testing device, the programming interface of the testing device and the corresponding interface of the DUT form an electrical connection, thus establishing a communication link between the testing device and the DUT. After the communication connection is established, the testing device can transmit data to the DUT through this communication link.
[0047] Step S112: Write the pre-stored temporary test program into the chip of the product under test through the programming interface; The testing device writes a pre-stored temporary test program into the chip of the product under test (DUT) via a programming interface. The temporary test program is pre-stored in the testing device. After the communication connection is established in step S111, the testing device reads the pre-stored temporary test program and transmits it to the DUT via the programming interface, writing it into the storage area of the DUT chip. Once the writing operation is complete, the temporary test program is saved in the DUT chip, awaiting execution.
[0048] Step S113: The product under test executes the temporary test procedure to transmit radio frequency signals at a preset frequency.
[0049] The product under test (DUT) executes a temporary test program written into its chip. Once executed, the temporary test program controls the communication module in the DUT to transmit radio frequency (RF) signals at a preset frequency. The preset frequency is the RF signal transmission frequency set in the temporary test program. The DUT continuously transmits RF signals at this preset frequency for the test equipment to receive and detect. By controlling the DUT to transmit RF signals at the preset frequency, the test equipment can accurately receive and analyze the RF performance of the DUT.
[0050] In this embodiment, the product under test transmits radio frequency signals at a preset frequency after executing a temporary test procedure. In one specific embodiment, the preset frequency is the 2.4GHz band. The 2.4GHz band is a commonly used wireless communication band in industrial, scientific, and medical fields, and is widely used in scenarios such as remote control models, wireless networks, and Bluetooth communication.
[0051] The communication module in the product under test is a 2.4G RF chip. The temporary test program controls the 2.4G RF chip to transmit RF signals at a specified frequency point in the 2.4GHz band. The RF receiving module of the test device is correspondingly configured to receive RF signals in the 2.4GHz band. In the wireless receiving method, a 2.4G glue rod antenna can be used as the receiving antenna.
[0052] When performing frequency offset detection, the testing device uses the standard frequency point of the 2.4GHz band as the reference frequency to detect the offset of the radio frequency signal emitted by the product under test relative to the reference frequency.
[0053] Through the above steps S111 to S113, the embodiment of this application realizes the process of burning a temporary test program. After the test device establishes a communication connection with the product under test through the burning interface, it writes the pre-stored temporary test program into the chip of the product under test. After the product under test executes the temporary test program, it transmits radio frequency signals at a preset frequency, providing a signal source for subsequent radio frequency parameter detection.
[0054] See Figure 3 , Figure 3 A flowchart illustrating a specific implementation of step S102 in an embodiment of this application is shown. In this embodiment, step S102 further includes the following sub-steps.
[0055] Step S121: The testing device receives the radio frequency signal emitted by the product under test through the radio frequency receiving module; The testing equipment receives the radio frequency (RF) signals emitted by the product under test (DUT) through an RF receiving module. The RF receiving module is a functional module within the testing equipment used to receive RF signals. When the DUT executes a temporary test program and emits an RF signal, the RF receiving module receives the emitted RF signal. After receiving the RF signal, the RF receiving module converts it into an electrical signal that can be used for subsequent processing, providing a data basis for parameter detection.
[0056] Step S122: Perform parameter detection on the radio frequency signal, wherein the parameter detection includes at least one of transmit power detection, receive power detection, frequency offset detection, and packet loss rate detection; The testing device performs parameter detection on the radio frequency signal received in step S121. The parameter detection includes at least one of the following: transmit power detection, receive power detection, frequency offset detection, and packet loss rate detection. Transmit power detection measures the power intensity of the radio frequency signal transmitted by the product under test (DUT); receive power detection measures the power intensity of the signal received by the radio frequency receiving module; frequency offset detection measures the deviation between the frequency of the radio frequency signal transmitted by the DUT and the standard frequency; and packet loss rate detection measures the proportion of data packets lost during radio frequency signal transmission. The testing device can select to perform one or more of the above parameter detections according to actual testing requirements.
[0057] In this embodiment of the application, the testing device performs parameter detection on the radio frequency signal. In addition to transmitting power detection, receiving power detection, frequency offset detection, and packet loss rate detection, the parameter detection may also include static current detection.
[0058] Static current sensing is used to measure the current consumed by a product under test (DUT) under specific operating conditions. The test equipment supplies power to the DUT via a power interface and includes a current sensing circuit in the power supply loop to monitor the DUT's current consumption in real time. When the DUT is executing a temporary test program and transmitting radio frequency signals, the test equipment acquires the DUT's operating current value. The static current value reflects the circuit operating status of the DUT; abnormally high or low static current values may indicate a circuit fault or component damage in the DUT.
[0059] The testing device incorporates the detected static current value into the RF parameter detection results, and compares the static current value with the corresponding threshold range in the qualification judgment in step S103, as one of the bases for determining whether the product under test is qualified.
[0060] In some preferred embodiments, in the frequency offset detection of step S122, the testing device detects the actual frequency of the radio frequency signal emitted by the product under test, compares the actual frequency with the standard frequency, and calculates the frequency offset value. The frequency offset value represents the deviation between the frequency of the radio frequency signal emitted by the product under test and the standard frequency, and is usually expressed in Hertz.
[0061] When the testing device detects that the frequency offset of the product under test (DUT) exceeds a preset range, it performs frequency offset calibration. The calibration process includes: the testing device calculating a calibration compensation value based on the detected frequency offset; sending a calibration command to the DUT via a communication connection; and writing the calibration compensation value into a designated storage area of the DUT's chip. In subsequent operations, the DUT reads the stored calibration compensation value and adjusts the transmission frequency of its radio frequency signal to bring the actual transmission frequency closer to the standard frequency.
[0062] After frequency offset calibration is completed, the testing device can perform frequency offset detection on the product under test again to verify whether the calibrated frequency offset value is within the acceptable range. If the calibrated frequency offset value still exceeds the preset range, the testing device can re-perform the calibration operation or determine the product under test as unqualified.
[0063] With frequency offset detection and automatic calibration functions, the testing device can automatically correct the frequency deviation of the product under test during the testing process, improve the consistency of RF performance of batch products, and reduce the product defect rate caused by frequency offset.
[0064] Step S123: Generate the radio frequency parameter detection results based on the detection results.
[0065] The testing device generates radio frequency parameter detection results based on the detection results in step S122. The radio frequency parameter detection results include the specific values obtained from the parameter detections performed in step S122, and these results will serve as input data for subsequent pass / fail determination steps.
[0066] See Figure 4 , Figure 4 A flowchart illustrating a specific implementation of step S103 in an embodiment of this application is shown. In this embodiment, the step of comparing the radio frequency parameter detection result with a preset threshold to determine whether the product under test is qualified further includes: step S103 further includes the following sub-steps.
[0067] Step S1221: Obtain the threshold range corresponding to each pre-configured radio frequency parameter; The testing device acquires the pre-configured threshold ranges for various RF parameters. The threshold range is a pass / fail criterion set for each RF parameter, including upper and lower limits. The threshold ranges can be pre-configured via a host computer, and the testing device reads the configured threshold range data when performing pass / fail judgments. Different threshold ranges are set for different RF parameters such as transmit power, receive power, frequency offset, and packet loss rate.
[0068] Step S1222: Compare the values of each parameter in the radio frequency parameter detection result with the corresponding threshold range; The testing device compares the values of each parameter in the RF parameter detection result generated in step S123 with the corresponding threshold ranges obtained in step S1221. The comparison process adopts a parameter-by-parameter comparison method, that is, comparing the transmitted power detection value with the transmitted power threshold range, comparing the received power detection value with the received power threshold range, comparing the frequency offset detection value with the frequency offset threshold range, and comparing the packet loss rate detection value with the packet loss rate threshold range.
[0069] Step S1223: If all parameter values are within the corresponding threshold range, the product to be tested is deemed qualified. The testing device determines the pass / fail status based on the comparison results in step S1222. If all parameter values in the RF parameter detection results are within their respective threshold ranges, that is, the detected value of each parameter is not lower than the lower limit of the corresponding threshold range and not higher than the upper limit of the corresponding threshold range, the testing device determines that the product under test is qualified. The qualified product under test will proceed to the subsequent temporary program erasure and formal program burning steps.
[0070] Step S1224: If any parameter value exceeds the corresponding threshold range, the product to be tested is determined to be unqualified.
[0071] If any parameter value in the RF parameter detection results exceeds the corresponding threshold range—that is, if the detected value of any parameter is lower than the lower limit or higher than the upper limit of the corresponding threshold range—the testing device determines that the product under test is unqualified. Unqualified products under test will be marked and rejected, and will not be subject to subsequent formal programming operations.
[0072] Through the above steps S121 to S123 and steps S1221 to S1224, the embodiments of this application realize the parameter detection and qualification determination process of radio frequency signals. The testing device receives the radio frequency signal transmitted by the product under test through the radio frequency receiving module, detects parameters such as transmit power, receive power, frequency offset, and packet loss rate of the radio frequency signal, and compares the detection results with the pre-configured threshold range item by item. The product under test is determined to be qualified based on whether all parameters are within the threshold range, thus realizing the automated detection and determination of radio frequency performance.
[0073] In this embodiment, the testing device includes multiple testing channels, with each testing channel connected to one product under test. By setting multiple testing channels, the testing device can connect to multiple products under test simultaneously, enabling batch processing of multiple products under test.
[0074] In one specific embodiment, the testing device includes eight testing channels. The eight testing channels are numbered Channel 0 to Channel 7, and each testing channel can be connected to one product under test. The testing device can simultaneously connect eight products under test for batch testing.
[0075] When the testing device sequentially executes the test programming process on 8 products under test, the testing device completes all the steps of temporary test program programming, radio frequency signal parameter detection, pass / fail judgment, temporary program erasure and formal product program programming for each product under test connected to each channel in the order of channel 0 to channel 7.
[0076] When the testing device performs the test programming process on 8 products under test in parallel, the testing device simultaneously performs the same operation steps on the 8 products under test connected to channels 0 to 7, and the 8 products under test complete each test programming step synchronously.
[0077] By setting up 8 test channels, the testing device can achieve batch testing and programming capabilities in 8-in-1, which improves mass production efficiency compared to single-channel testing.
[0078] In one implementation, the testing device sequentially performs the following steps on multiple products under test (DUTs): temporary test program programming, RF signal parameter detection, pass / fail determination, temporary program erasure, and formal product program programming. Specifically, after multiple DUTs are connected to multiple test channels of the testing device, the testing device performs the complete test programming process on each DUT connected to each test channel in sequence. The testing device first performs all steps—temporary test program programming, RF signal parameter detection, pass / fail determination, temporary program erasure, and formal product program programming—on the DUT connected to the first test channel. After all steps for the first DUT are completed, the same steps are performed on the DUT connected to the second test channel, and so on, until all DUTs connected to all test channels have completed the test programming process. This sequential execution method ensures that the test programming process for each DUT is independent, facilitating the tracking and management of test results for individual DUTs.
[0079] In another implementation, the testing device performs the following steps in parallel on multiple products under test (DUTs): temporary test program programming, RF signal parameter detection, pass / fail determination, temporary program erasure, and formal product program programming. Specifically, after multiple DUTs are connected to multiple test channels of the testing device, the device simultaneously performs the same operational steps on the DUTs connected to each test channel. The testing device first simultaneously performs the temporary test program programming step on all DUTs connected to all test channels. After the temporary test programs for all DUTs are programmed, the RF signal parameter detection step is then performed simultaneously on all DUTs, and so on, until all DUTs have completed all steps of the test programming process. This parallel execution method significantly improves test programming efficiency and shortens the overall processing time for batch products.
[0080] The testing device can select either sequential or parallel execution to process multiple products under test based on actual production needs. By setting up multiple test channels and supporting sequential or parallel execution, the embodiments of this application can meet the efficiency requirements of mass production and improve the mass production testing efficiency of products.
[0081] Please see Figure 5 , Figure 5 A flowchart illustrating a specific implementation of step S104 in an embodiment of this application is shown. In this embodiment, the step of erasing the temporary test program in the product under test after the radio frequency signal detection is completed, i.e., step S104, further includes the following sub-steps.
[0082] Step S141: After the RF parameter detection result is generated, send an erasure command to the product under test; After the RF parameter detection results are generated in step S102, the test device sends an erase command to the product under test (DUT). The erase command is a control command issued by the test device to trigger the DUT to perform a program erase operation. The test device transmits the erase command to the DUT through a communication connection, and the DUT prepares to perform the erase operation upon receiving the erase command.
[0083] Step S142: Erase the temporary test program stored in the chip of the product under test according to the erase command; The product under test (DUT) erases the temporary test program stored in its chip according to the erase command received in step S141. The erase operation clears the temporary test program data in the storage area of the DUT chip, thus emptying the data in that storage area. After the erase operation is completed, the storage area that originally stored the temporary test program will no longer retain the data content of the temporary test program.
[0084] Step S143: Verify the erasure result to confirm that the temporary test program has been completely erased.
[0085] The testing device verifies the erasure result of step S142 to confirm that the temporary test program has been completely erased. The purpose of the verification operation is to ensure that the erasure operation was successfully executed and to avoid affecting the subsequent burning of the formal product program due to incomplete erasure. Only after verifying that the temporary test program has been completely erased will the testing device perform the formal product program burning operation on the qualified product under test.
[0086] See Figure 6 , Figure 6 A flowchart illustrating a specific implementation of step S143 in an embodiment of this application is shown. In this embodiment, the step of verifying the erasure result and confirming that the temporary test program has been completely erased, i.e., step S143, further includes the following sub-steps: Step S144: Read the storage area in the chip of the product under test that stores the temporary test program; The testing device reads the storage area in the chip of the product under test (DUT) that stores temporary test programs. Through a communication connection with the DUT, the testing device accesses the storage area in the chip originally used to store temporary test programs and reads the current data status of that storage area. The data obtained during the read operation will be used to subsequently determine whether the erase operation was successfully executed.
[0087] Step S145: Determine whether the storage area has been restored to a blank state; Based on the data read in step S144, the testing device determines whether the storage area has been restored to a blank state. A blank state means that the data in the storage area has been completely cleared, and no temporary test program data content is retained. The testing device analyzes the read data content to determine whether the current state of the storage area meets the characteristics of a blank state.
[0088] Step S146: If the storage area has been restored to a blank state, the erasure is confirmed to be successful, and the step of burning the formal product program to the qualified test product is executed. In this step, if the judgment result of step S145 indicates that the storage area has been restored to a blank state, the testing device confirms that the erasure was successful. Successful erasure means that the temporary test program has been completely cleared, and the chip storage space of the product under test is ready to receive the formal product program. For products under test that are deemed qualified in step S103, after confirming successful erasure, the testing device continues to execute step S105 to program the formal product program onto the product under test.
[0089] Step S147: If the storage area is not restored to a blank state, then the erasure operation is performed again or the product under test is marked as abnormal.
[0090] In this step, if the judgment result of step S145 indicates that the storage area has not been restored to a blank state, the testing device determines that the erasure operation has not been successfully completed. For cases where erasure is unsuccessful, the testing device can adopt two processing methods. The first processing method is to re-execute the erasure operation, that is, return to step S141 to resend the erasure command to the product under test and attempt to erase the temporary test program again. The second processing method is to mark the product under test as abnormal and not perform subsequent formal program burning operations on the product under test; the abnormal product will then be manually handled by an operator. The testing device can select one of the above two processing methods according to the pre-configured processing strategy.
[0091] Through the above steps S141 to S143 and S144 to S147, the embodiments of this application realize the process of erasing temporary test programs and verifying erasure results. After the RF parameter detection is completed, the test device sends an erasure command to the product under test to erase the temporary test program in the chip of the product under test. The erasure result is verified by reading the storage area and judging whether it has been restored to a blank state. This ensures that the temporary test program is completely erased before the formal product program is burned. At the same time, a processing mechanism for re-erasing or marking an anomaly is provided for the case of erasure failure, which ensures the reliability of the test burning process.
[0092] This application provides a testing method for communication modules. By first programming a temporary test program onto the product under test (DUT) for radio frequency (RF) performance testing, and then programming the formal product program onto qualified products, the RF testing process is pre-positioned. Products with substandard RF performance can be screened out before the formal program is programmed, avoiding subsequent programming and assembly operations on defective products, effectively reducing time and material waste. Then, by programming the temporary test program, the DUT actively transmits RF signals, which are directly received and parameter detected by the testing device. This eliminates the need for individual testing with external specialized equipment such as spectrum analyzers, simplifying the testing process and reducing equipment costs. Finally, RF signal detection and program programming are integrated into the same testing process. The testing device uniformly completes operations such as temporary program programming, RF parameter detection, pass / fail determination, temporary program erasure, and formal program programming, achieving integrated testing and programming, reducing the number of production steps and improving production efficiency.
[0093] This application also provides an embodiment of a testing apparatus 20, please refer to [link / reference]. Figure 7 , Figure 7 The diagram shows a functional block diagram of a testing device 20 according to this application. The testing device 10 includes a first programming module 11, a receiving module 12, a judgment module 13, an erasure module 14, and a second programming module 15.
[0094] The first programming module 11 is used to program a temporary test program into the product under test (DUT), enabling the DUT to transmit radio frequency (RF) signals after executing the temporary test program. The first programming module 11 stores the temporary test program. When the DUT is connected to the testing device 10, the first programming module 11 establishes a communication connection with the DUT through the programming interface and writes the temporary test program into the chip of the DUT. After executing the temporary test program, the DUT transmits RF signals at a preset frequency.
[0095] The receiving module 12 is used to receive the radio frequency (RF) signal transmitted by the product under test (DUT) and perform parameter detection on the RF signal to obtain RF parameter detection results. The receiving module 12 includes an RF receiving circuit capable of receiving the RF signal transmitted by the DUT. The receiving module 12 performs parameter detection on the received RF signal, including detection items such as transmit power, receive power, frequency offset, packet loss rate, and quiescent current, and generates RF parameter detection results based on the detection results.
[0096] The judgment module 13 compares the RF parameter detection results with preset thresholds to determine whether the product under test is qualified. The judgment module 13 obtains the pre-configured threshold ranges for each RF parameter and compares each parameter value in the RF parameter detection results with its corresponding threshold range. If all parameter values are within their respective threshold ranges, the judgment module 13 determines that the product under test is qualified; if any parameter value exceeds its corresponding threshold range, the judgment module 13 determines that the product under test is unqualified.
[0097] The erasure module 14 is used to erase the temporary test program in the product under test after the radio frequency signal detection is completed. After the radio frequency parameter detection result is generated, the erasure module 14 sends an erasure command to the product under test, erases the temporary test program stored in the chip of the product under test according to the erasure command, and verifies the erasure result to confirm that the temporary test program has been completely erased.
[0098] The second programming module 15 is used to program the formal product program into the product under test that has been determined to be qualified. The second programming module 15 stores the formal product program. When the product under test is determined to be qualified by the judgment module 13 and the erasure module 14 confirms that the temporary test program has been completely erased, the second programming module 15 writes the formal product program into the chip of the product under test.
[0099] The first programming module 11, receiving module 12, judgment module 13, erasure module 14 and second programming module 15 in the test device 10 cooperate with each other to complete the entire process of temporary program programming, radio frequency parameter detection, pass / fail judgment, temporary program erasure and formal program programming in sequence, realizing the integration of radio frequency testing and program programming.
[0100] See Figure 7 , Figure 7 A schematic diagram of the structure of the testing device provided in an embodiment of this application is shown. The testing device 20 includes a base plate, a sub-board, a host computer, and a controller. The controller includes a processor 201 and a memory 202.
[0101] The baseboard provides power and communication interfaces. It has a power input interface for connecting to an external power source via a power adapter. In one embodiment, the baseboard is powered by a 9V DC power adapter and includes an internal LDO voltage conversion circuit to convert the 9V input voltage to a 3.3V output voltage, providing power to the daughterboard. The baseboard also has a USB communication interface for establishing a communication connection with a host computer. In one embodiment, the baseboard has a USB Type-C interface for connecting to the host computer via a USB cable.
[0102] The daughterboard is connected to the baseboard, which has multiple daughterboard slots, each capable of accommodating one daughterboard. In one specific embodiment, the baseboard has eight daughterboard slots, allowing simultaneous connection of eight daughterboards to form an eight-in-one test architecture. The daughterboard is connected to the baseboard via pin headers, and the baseboard provides 3.3V operating power to the daughterboard through these pin headers and communicates with the daughterboard via data.
[0103] Each daughterboard includes a main control chip and an RF chip. The main control chip stores temporary test programs and final product programs, and communicates with the product under test (DUT) via a programming interface to program and erase data. The daughterboard has a programming interface that interfaces with the DUT's communication interface, allowing the main control chip to write programs to or read data from the DUT. In one embodiment, the programming interface uses an SWS single-wire serial interface. The RF chip receives RF signals transmitted by the DUT. In one embodiment, the RF chip is a 2.4G RF chip. The daughterboard also has an antenna interface for connecting a 2.4G adhesive antenna to receive RF signals wirelessly, or for connecting an RF extension cable to receive RF signals wiredly.
[0104] The daughterboard also features a device under test (DUT) connection interface for establishing an electrical connection with the DUT. This DUT connection interface includes a power supply interface, a reference voltage interface, a communication interface, and a ground interface. The power supply interface provides operating power to the DUT and can be configured with different output voltages depending on the DUT's requirements. The reference voltage interface obtains the I / O level reference voltage from the DUT to match communication signals of different voltage levels. The communication interface is used for programming communication with the DUT. The ground interface is used for grounding the DUT.
[0105] The host computer communicates with the baseboard to configure test parameters, control the workflow of the sub-boards, receive RF parameter test results, and determine pass / fail status. The host computer runs test control software, which operators use to configure threshold ranges for various RF parameters, set test process parameters, and start or stop the test process. During testing, the host computer receives RF parameter test results transmitted from each sub-board, displays the test status and parameter values of each test channel on the screen, and determines the pass / fail status of each product under test based on the threshold range, while issuing alarm prompts for unqualified products.
[0106] The controller includes a processor 201 and a memory 202, with the processor 201 and memory 202 communicatively connected. The controller is electrically connected to the baseboard, daughterboard, and host computer, respectively, and is used to coordinate the operation of each part of the testing device 20. The memory 202 stores instructions executable by the processor 201. When the instructions are executed by the processor 201, the processor 201 is able to perform each step of the communication module testing method described in the foregoing method embodiments.
[0107] When using the testing equipment 20, the operator first connects the power adapter to the power input interface of the base plate to power the base plate; then connects the USB cable between the base plate and the host computer to establish a communication connection; next, inserts each daughter board into the daughter board slot of the base plate; finally, connects each product under test to the product under test connection interface of its respective daughter board. After the connection is completed, the operator starts the test process through the host computer, and the testing equipment 20 automatically performs RF testing and program burning operations on each product under test.
[0108] This application also provides a non-volatile computer-readable storage medium storing computer-executable instructions that are executed by one or more processors, for example, executing the instructions described above. Figures 1 to 6 A method for testing a communication module, and the steps for performing the above. Figure 7 The aforementioned testing device.
[0109] This application also provides a computer program product, including a computing program stored on a non-volatile computer-readable storage medium. The computer program includes program instructions that, when executed by a computer, cause the computer to perform a testing method for a communication module as described in any of the above method embodiments. For example, it may execute the method described above. Figures 1 to 6 The method steps, and the execution of the above Figure 7 The aforementioned testing device.
[0110] The above description is merely an embodiment of this application and does not limit the patent scope of this application. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this application.
Claims
1. A testing method for a communication module, characterized in that, Applied to a testing apparatus, the method includes: A temporary test program is programmed into the product under test, causing the product under test to execute the temporary test program and then transmit radio frequency signals. The radio frequency signal emitted by the product under test is received, and the parameters of the radio frequency signal are detected to obtain the radio frequency parameter detection result; The radio frequency parameter detection results are compared with preset thresholds to determine whether the product under test is qualified. After the radio frequency signal detection is completed, the temporary test program in the product under test is erased; The official product program is burned into the test product that is deemed qualified.
2. The test method according to claim 1, characterized in that, The testing device is equipped with a programming interface. The step of programming a temporary test program onto the product under test (DUT), causing the DUT to execute the temporary test program and then transmit an radio frequency signal, further includes: The testing device establishes a communication connection with the product under test through the programming interface; The pre-stored temporary test program is written into the chip of the product under test through the programming interface; The product under test executes the temporary test procedure to transmit radio frequency signals at a preset frequency.
3. The test method according to claim 1, characterized in that, The step of receiving the radio frequency signal emitted by the product under test and performing parameter detection on the radio frequency signal to obtain the radio frequency parameter detection result further includes: The testing device receives the radio frequency signal emitted by the product under test through the radio frequency receiving module; The radio frequency signal is subjected to parameter detection, which includes at least one of transmit power detection, receive power detection, frequency offset detection, and packet loss rate detection. The radio frequency parameter detection results are generated based on the detection results.
4. The test method according to claim 3, characterized in that, The step of comparing the radio frequency parameter detection results with a preset threshold to determine whether the product under test is qualified further includes: Obtain the threshold range corresponding to each pre-configured radio frequency parameter; The values of each parameter in the radio frequency parameter detection results are compared with their corresponding threshold ranges. If all parameter values are within the corresponding threshold range, the product under test is deemed qualified. If any parameter value exceeds the corresponding threshold range, the product under test is deemed unqualified.
5. The method according to claim 1, characterized in that, The testing device includes multiple testing channels, one of the testing channels is connected to one of the products under test, and the method further includes: The testing device sequentially performs the following steps on multiple products under test: temporary test program burning, radio frequency signal parameter detection, pass / fail determination, temporary program erasure, and formal product program burning; Alternatively, the testing device may perform the steps of burning the temporary test program, detecting radio frequency signal parameters, determining pass / fail, erasing the temporary program, and burning the formal product program on multiple products under test in parallel.
6. The test method according to claim 1, characterized in that, The step of erasing the temporary test program from the product under test after the radio frequency signal detection is completed further includes: After the radio frequency parameter detection results are generated, an erasure command is sent to the product under test; The temporary test program stored in the chip of the product under test is erased according to the erase command; The erasure results were verified to confirm that the temporary test program had been completely erased.
7. The test method according to claim 6, characterized in that, The step of verifying the erasure result and confirming that the temporary test program has been completely erased further includes: Read the storage area in the chip of the product under test that stores the temporary test program; Determine whether the storage area has been restored to a blank state; If the storage area has been restored to a blank state, the erasure is confirmed to be successful, and the step of burning the formal product program to the qualified test product is executed. If the storage area is not restored to a blank state, the erase operation is performed again or the product under test is marked as abnormal.
8. A testing device, characterized in that, The testing apparatus includes: The first programming module is used to program a temporary test program into the product under test, so that the product under test can transmit radio frequency signals after executing the temporary test program. The receiving module is used to receive the radio frequency signal emitted by the product under test, and to perform parameter detection on the radio frequency signal to obtain the radio frequency parameter detection result; The judgment module compares the radio frequency parameter detection results with a preset threshold to determine whether the product under test is qualified. The erasure module is used to erase the temporary test program in the product under test after the radio frequency signal detection is completed; The second programming module is used to program the official product program into the test product that has been determined to be qualified.
9. A testing device, comprising: The base plate provides power and communication interfaces. At least one sub-board is connected to the baseboard. Each sub-board includes a main control chip and an RF chip. The main control chip is used to store temporary test programs and formal product programs, and communicates with the product under test through a programming interface to realize program programming and erasure. The RF chip is used to receive RF signals emitted by the product under test. The host computer is connected to the baseboard and is used to configure test parameters, control the workflow of the sub-board, receive RF parameter detection results and make a pass / fail judgment. The controller includes: at least one processor, and a memory communicatively connected to the at least one processor, the controller being electrically connected to the baseboard, the daughterboard and the host computer respectively; The memory stores instructions that can be executed by the at least one processor to enable the at least one processor to perform the method as described in any one of claims 1 to 7.
10. A non-transitory computer-readable storage medium, characterized in that, The non-transitory computer-readable storage medium stores computer-executable instructions for causing the server to perform the method as described in any one of claims 1 to 7.