Display module, display device, and method and device for evaluating light-emitting effect

Abstract

The invention discloses a display module, a display device and a method and device for evaluating the light emitting effect, a display substrate of the display module comprises a plurality of target light emitting elements arranged in an array, and the target light emitting elements are all light emitting elements with the same light emitting color on the display substrate. The plurality of target light-emitting elements are divided into a plurality of first light-emitting element groups arranged in an array, and each first light-emitting element group comprises a plurality of first sub light-emitting element groups arranged in an array; determining an overall fluctuation parameter of the display substrate, the overall fluctuation parameter being a standard deviation of a first intra-group fluctuation parameter of each first light-emitting element group, the first intra-group fluctuation parameter being a standard deviation of a first mean value corresponding to all first sub-light-emitting element groups in the corresponding first light-emitting element group, and the first sub-light-emitting element groups being a second mean value corresponding to all second sub-light-emitting element groups in the corresponding first light-emitting element group; the first mean value is the mean value of the target optical data of all the target light-emitting elements in the corresponding first light-emitting element sub-group.

Description

Display modules, display devices, methods, apparatus, equipment and media for evaluating luminous effects.

[0001] This application claims priority to Chinese Patent Application No. 202411204433.9, filed on August 29, 2024, entitled “Method, Apparatus, Device and Medium for Transferring Electronic Components”, the entire contents of which are incorporated herein by reference.

[0002] This disclosure relates to the field of display technology, and in particular to a display module, display device, method, apparatus, equipment and medium for evaluating luminous efficacy.

[0003] In the manufacturing process of display devices, multiple light-emitting elements are usually mixed according to certain rules and then transferred onto a substrate to avoid regional concentration of optical parameters (such as wavelength, brightness, etc.) of the light-emitting elements on the substrate, thereby improving the uniformity of the light-emitting effect of these light-emitting elements.

[0004] In related technologies, the uniformity of the light emission effect of the light-emitting elements carried on the substrate is usually evaluated by the overall dispersion of the optical parameters of all light-emitting elements on the substrate, but this evaluation method has low accuracy.

[0005] This disclosure provides a display module, a display device, a method, apparatus, equipment, and medium for evaluating luminous efficacy. The technical solution is as follows:

[0006] In a first aspect, a display module is provided, comprising at least one display substrate and a driving module, the driving module being used to drive the display substrate to display an image; the display substrate comprising a plurality of target light-emitting elements arranged in an array, the plurality of target light-emitting elements being all light-emitting elements on the display substrate having the same emission color; the plurality of target light-emitting elements being divided into M first light-emitting element groups, the M first light-emitting element groups being arranged in an array and each first light-emitting element group comprising a plurality of target light-emitting elements, wherein M is an integer greater than 1, and the first light-emitting element group comprising a plurality of first sub-light-emitting element groups arranged in an array; the overall fluctuation parameter of the display substrate being less than or equal to 0.05; wherein the overall fluctuation parameter is the standard deviation of the fluctuation parameter within a first group of each first light-emitting element group; the fluctuation parameter within a first group is the standard deviation of the first mean of all first sub-light-emitting element groups in the corresponding first light-emitting element group, the first mean being the mean of the target optical data of all target light-emitting elements in the corresponding first sub-light-emitting element group.

[0007] Optionally, all target light-emitting elements on the display substrate are arranged in rows a and columns b, where a and b are both integers greater than 1; all target light-emitting elements in each first sub-light-emitting element group are arranged in rows m and columns n, where m ranges from 5% to 10% of a, n ranges from 5% to 100% of b, a is an integer multiple of m, and b is an integer multiple of n.

[0008] Optionally, the target optical data includes: at least one of the wavelength, brightness, and color coordinates of the light emitted by the target light-emitting element; or mathematical values ​​of at least two of the wavelength, brightness, and color coordinates of the light emitted by the target light-emitting element.

[0009] Secondly, a display device is provided, which includes a power supply and any of the aforementioned display modules.

[0010] Optionally, the display module includes at least two display substrates; the inter-board fluctuation parameter corresponding to the at least two display substrates is less than or equal to 0.25, the inter-board fluctuation parameter is the standard deviation of the second mean corresponding to the X display substrates, and the second mean of each display substrate is the mean of the target optical data of the target light-emitting element corresponding to the display substrate.

[0011] Thirdly, a method for evaluating luminous efficacy is provided. This method includes: acquiring light-emitting element data of a first substrate, the first substrate being used to support a plurality of target light-emitting elements arranged in an array, the plurality of target light-emitting elements being all light-emitting elements with the same luminous color supported on the first substrate; the light-emitting element data including target optical data of the plurality of target light-emitting elements; the plurality of target light-emitting elements being divided into M first light-emitting element groups, the M first light-emitting element groups being arranged in an array, and each first light-emitting element group including a plurality of target light-emitting elements, wherein M is an integer greater than 1; determining a first group-specific fluctuation parameter for each first light-emitting element group based on the light-emitting element data of the first substrate, the first group-specific fluctuation parameter being used to characterize the uniformity of luminous efficacy within the corresponding first light-emitting element group; and determining an overall fluctuation parameter based on the first group-specific fluctuation parameter for each first light-emitting element group, the overall fluctuation parameter being used to characterize the uniformity of luminous efficacy of all target light-emitting elements on the first substrate.

[0012] Optionally, the first group fluctuation parameter of the first light-emitting element group includes the standard deviation of the optical data of the light-emitting elements in the first light-emitting element group; the step of determining the first group fluctuation parameter of each first light-emitting element group based on the light-emitting element data of the first substrate includes: calculating the first mean of the target optical data of all target light-emitting elements in the first light-emitting element group; and using the standard deviation of the first mean corresponding to all first sub-light-emitting element groups as the first group fluctuation parameter of the first sub-light-emitting element group.

[0013] Optionally, all target light-emitting elements on the first substrate are arranged in rows a and columns b, where a and b are both integers greater than 1; all target light-emitting elements in each first sub-light-emitting element group are arranged in rows m and columns n, where m ranges from 5% to 10% of a, n ranges from 5% to 100% of b, a is an integer multiple of m, and b is an integer multiple of n.

[0014] Optionally, the overall fluctuation parameter is the first inter-group fluctuation parameter, which is the standard deviation of the first intra-group fluctuation parameter of each of the first light-emitting element groups.

[0015] Optionally, the plurality of target light-emitting elements are divided into N second light-emitting element groups, the N second light-emitting element groups are arranged in an array and the division method is different from that of the M first light-emitting element groups, each second light-emitting element group includes a plurality of the target light-emitting elements, wherein N is an integer greater than 1; the method further includes: determining a second group intra-group fluctuation parameter for each second light-emitting element group based on the light-emitting element data of the first substrate, the second group intra-group fluctuation parameter being used to characterize the uniformity of the light emission effect within the corresponding second light-emitting element group; determining the overall fluctuation parameter based on the first group intra-group fluctuation parameter of each first light-emitting element group includes: determining the overall fluctuation parameter based on the first group intra-group fluctuation parameter of each first light-emitting element group and the second group intra-group fluctuation parameter of each second light-emitting element group.

[0016] Optionally, determining the overall fluctuation parameter based on the first intra-group fluctuation parameter of each first light-emitting element group and the second intra-group fluctuation parameter of each second light-emitting element group includes: determining a first inter-group fluctuation parameter based on the first intra-group fluctuation parameter of each first light-emitting element group, wherein the first inter-group fluctuation parameter is used to characterize the uniformity of the luminous effect among the M first light-emitting element groups; determining a second inter-group fluctuation parameter based on the second intra-group fluctuation parameter of each second light-emitting element group, wherein the second inter-group fluctuation parameter is used to characterize the uniformity of the luminous effect among the N second light-emitting element groups; and determining the overall fluctuation parameter based on the first inter-group fluctuation parameter and the second inter-group fluctuation parameter.

[0017] Optionally, determining the overall fluctuation parameter based on the first inter-group fluctuation parameter and the second inter-group fluctuation parameter includes: performing a weighted calculation on the first inter-group fluctuation parameter and the second inter-group fluctuation parameter to obtain the overall fluctuation parameter.

[0018] Optionally, the overall fluctuation parameter is determined before the plurality of target light-emitting elements are transferred to the first substrate; or, the overall fluctuation parameter is determined after the plurality of target light-emitting elements are transferred to the first substrate.

[0019] Optionally, obtaining the light-emitting element data of the first substrate includes: obtaining the light-emitting element data of the second substrate, wherein the light-emitting element data of the second substrate includes optical data and position information of a plurality of light-emitting elements located on the second substrate; determining a first correspondence between the first substrate and the second substrate based on a first transfer algorithm, wherein the first transfer algorithm is used to indicate rules for transferring at least a portion of the light-emitting elements on the second substrate to the second substrate; and determining the light-emitting element data of the first substrate according to the light-emitting element data of the second substrate and the first correspondence.

[0020] Optionally, the method further includes: determining whether the uniformity of the luminous effect of the plurality of target light-emitting elements meets the requirements based on the overall fluctuation parameters of the first substrate; if the uniformity meets the requirements, then transferring the plurality of target light-emitting elements from the second substrate to the first substrate according to the first transfer algorithm.

[0021] Optionally, determining whether the uniformity of the luminous effect of the plurality of target light-emitting elements meets the requirements based on the overall fluctuation parameters of the first substrate includes: comparing the overall fluctuation parameters of the first substrate with a first threshold; if the overall fluctuation parameters of the first substrate are greater than the first threshold, then determining that the uniformity of the luminous effect of the plurality of target light-emitting elements does not meet the requirements; if the overall fluctuation parameters of the first substrate are less than or equal to the first threshold, then determining that the uniformity of the luminous effect of the plurality of target light-emitting elements meets the requirements.

[0022] Optionally, the method further includes: adjusting the first transfer algorithm if the uniformity does not meet the requirements.

[0023] Optionally, the method further includes: acquiring light-emitting element data of X first substrates, where X is an integer greater than 1; and determining inter-substrate fluctuation parameters based on the light-emitting element data of the X first substrates, wherein the inter-substrate fluctuation parameters are used to characterize the uniformity of the light-emitting effect among the X first substrates.

[0024] Optionally, determining the inter-board fluctuation parameter based on the light-emitting element data of X first substrates includes: calculating a second mean value of the target optical data of the target light-emitting element corresponding to each first substrate; and determining the inter-board fluctuation parameter based on the second mean value corresponding to each first substrate.

[0025] Optionally, determining the inter-board fluctuation parameter based on the second mean corresponding to each of the first substrates includes: using the standard deviation of the second mean corresponding to X first substrates as the inter-board fluctuation parameter.

[0026] Optionally, the target optical data includes at least one of the wavelength, brightness, and chromaticity coordinates of the light emitted by the target light-emitting element; or, mathematical values ​​of at least two of the wavelength, brightness, and chromaticity coordinates of the light emitted by the target light-emitting element.

[0027] Fourthly, an apparatus for evaluating luminous efficacy is provided. The apparatus includes: a first acquisition module for acquiring luminous element data of a first substrate, the first substrate being used to support a plurality of target luminous elements arranged in an array, the plurality of target luminous elements being all luminous elements with the same luminous color supported on the first substrate, the luminous element data including target optical data of the plurality of target luminous elements, the plurality of target luminous elements being divided into M first luminous element groups, the M first luminous element groups being arranged in an array and each first luminous element group including a plurality of target luminous elements, wherein M is an integer greater than 1; a first determination module for determining a first group-specific fluctuation parameter for each luminous element group based on the luminous element data of the first substrate, the first group-specific fluctuation parameter being used to characterize the uniformity of luminous efficacy within the corresponding luminous element group; and a second determination module for determining an overall fluctuation parameter based on the first group-specific fluctuation parameter for each first luminous element group, the overall fluctuation parameter being used to characterize the uniformity of luminous efficacy of all target luminous elements on the first substrate.

[0028] Fifthly, a computer device is provided, the computer device comprising: a memory and a processor, the memory storing at least one computer program, the at least one computer program being loaded and executed by the processor to implement any of the methods provided in the third aspect above.

[0029] In a sixth aspect, a computer-readable storage medium is provided, wherein at least one computer program is stored therein, the at least one computer program being loaded and executed by a processor to implement any of the methods provided in the third aspect above.

[0030] In a seventh aspect, a computer program product is provided, including a computer program / instructions that, when executed by a processor, implement any of the methods provided in the third aspect above.

[0031] The beneficial effects of the technical solutions provided in this disclosure include at least the following:

[0032] By dividing the multiple light-emitting elements corresponding to the first substrate into M groups of first light-emitting elements arranged in an array, and determining the intra-group fluctuation parameter to characterize the uniformity of the light emission effect within the corresponding first light-emitting element group based on the optical data of these light-emitting elements, and then determining the overall fluctuation parameter to characterize the uniformity of the light emission effect of the multiple light-emitting elements on the first substrate based on the intra-group fluctuation parameter, the uniformity of the light emission effect of the multiple light-emitting elements on the first substrate can be quantitatively described by progressively describing the light emission effect of the light-emitting elements corresponding to the first substrate from small areas to large areas, thus enabling a more accurate evaluation of the uniformity of the light emission effect of the multiple light-emitting elements on the first substrate.

[0033] To more clearly illustrate the technical solutions in the embodiments of this disclosure, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this disclosure. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0034] Figure 1 is a schematic diagram of the structure of a raw substrate, an intermediate substrate, and a product substrate;

[0035] Figure 2 is a flowchart of a method for evaluating luminescence effect provided in an embodiment of this disclosure;

[0036] Figure 3 is a flowchart of another method for evaluating luminescence effect provided in an embodiment of this disclosure;

[0037] Figure 4 is a comparative schematic diagram of the visual effect simulation and the actual visual effect of a first substrate provided in an embodiment of the present disclosure;

[0038] Figure 5 is a flowchart of another method for evaluating luminescence effect provided in an embodiment of this disclosure;

[0039] Figure 6 is a flowchart of a method for transferring a light-emitting element according to an embodiment of this disclosure;

[0040] Figure 7 is a schematic diagram of another method for transferring a light-emitting element provided in an embodiment of this disclosure;

[0041] Figure 8 is a schematic diagram of a method for transferring a light-emitting element according to an embodiment of this disclosure;

[0042] Figure 9 is a schematic diagram of an apparatus for evaluating luminescence effects provided in an embodiment of this disclosure;

[0043] Figure 10 is a schematic diagram of the structure of a computer device provided in an embodiment of this disclosure.

[0044] To make the objectives, technical solutions, and advantages of this disclosure clearer, the embodiments of this disclosure will be described in further detail below with reference to the accompanying drawings.

[0045] To facilitate understanding of the embodiments of this disclosure, the original substrate, intermediate substrate, and product substrate will be briefly introduced below.

[0046] Please refer to Figure 1, which is a schematic diagram of a raw substrate, an intermediate substrate, and a product substrate. The raw substrate A1, intermediate substrate A2, and product substrate A3 each include multiple arrayed light-emitting elements B. The raw substrate A1 can serve as a carrier for manufacturing the light-emitting elements B; it can be a substrate for a wafer. The intermediate substrate A2 can serve as a carrier for temporarily or temporarily supporting the light-emitting elements B; it can be a carrier for sorting sheets (bin sheets), such as blue film or ultraviolet (UV) film. The product substrate A3 can serve as a carrier for fixing the light-emitting elements B to produce a light-emitting device; it can be a display substrate in a display module or display screen.

[0047] Figure 1 shows only a portion of the light-emitting elements B on the original substrate A1, intermediate substrate A2, and product substrate A3. For example, the number of light-emitting elements B on an original substrate A1 can be 500k-650k, the number of light-emitting elements B on an intermediate substrate A2 can be 20k-30k, and the number of light-emitting elements B on a product substrate A3 can be approximately 20k.

[0048] Depending on the fabrication process of the light-emitting element B, the optical data of multiple light-emitting elements B formed on the same original substrate A1 will differ. These optical data include wavelength, brightness, color coordinates, voltage, and current. Typically, the optical data of multiple light-emitting elements B on the same original substrate A1 are randomly distributed. Furthermore, the light-emitting elements B on the original substrate A1 may exhibit optical aggregation, meaning that the optical data of some light-emitting elements B are highly similar in a certain area, as shown in Figure 1, where the numbers on the original substrate A1 are identical. Light-emitting elements B with identical numbers indicate similar optical data. In this case, when transferring the light-emitting elements B from the original substrate A1, it is necessary to mix the light-emitting elements B to prevent areas of excessive concentration of optical data on the intermediate substrate A2 or product substrate A3, thus avoiding image quality defects such as stripes, agglomeration, and color blocks.

[0049] Optionally, the light-emitting element B can be a light-emitting diode (LED), such as a mini light-emitting diode (Mini-LED) or a micro light-emitting diode (Micro-LED), but is not limited thereto.

[0050] This disclosure provides a method for evaluating light-emitting effects, used to accurately evaluate the light-emitting effects of multiple light-emitting elements on a first substrate. Optionally, the first substrate may be the aforementioned product substrate or an intermediate substrate.

[0051] Figure 2 is a flowchart of a method for evaluating luminescence effects provided in an embodiment of this disclosure. As shown in Figure 2, the method includes:

[0052] In step 201, the light-emitting element data of the first substrate is obtained.

[0053] The first substrate is used to carry multiple target light-emitting elements arranged in an array, and the light-emitting element data includes the target optical data of these multiple target light-emitting elements.

[0054] These multiple target light-emitting elements are all light-emitting elements with the same emitting color carried on the first substrate.

[0055] In one possible implementation, all light-emitting elements supported on the first substrate have the same light-emitting color, such as red, blue, green, or white. In this case, the plurality of target light-emitting elements refers to all light-emitting elements on the first substrate.

[0056] In another possible implementation, the light-emitting elements supported on the first substrate have multiple emission colors. For example, the light-emitting elements supported on the first substrate may include a first light-emitting element, a second light-emitting element, and a third light-emitting element, where the first light-emitting element emits blue, the second light-emitting element emits red, and the third light-emitting element emits green. As another example, the light-emitting elements supported on the first substrate may include a first light-emitting element, a second light-emitting element, a third light-emitting element, and a fourth light-emitting element, where the first light-emitting element emits blue, the second light-emitting element emits red, the third light-emitting element emits green, and the fourth light-emitting element emits yellow or white. In this case, the plurality of target light-emitting elements may be all the first light-emitting elements on the first substrate, or all the second light-emitting elements, or all the third light-emitting elements, etc.

[0057] Multiple target light-emitting elements are divided into M first light-emitting element groups. The M first light-emitting element groups are arranged in an array, and each first light-emitting element group includes several target light-emitting elements, where M is an integer greater than 1. Here, dividing multiple target light-emitting elements into M first light-emitting element groups means dividing all target light-emitting elements on the first substrate into M first light-emitting element groups.

[0058] In this embodiment, the value of M can be adjusted according to the total number of target light-emitting elements on the first substrate, and this disclosure does not limit it. For example, M is 4-60.

[0059] The optical data of the light-emitting element can be used to indicate its luminous characteristics. The optical data may include: the wavelength, brightness, and chromaticity coordinates of the light emitted by the light-emitting element, as well as raw data such as the voltage and current of the light-emitting element. The target optical data may include at least one of these raw data, for example, wavelength, brightness, or chromaticity coordinates. Alternatively, the target optical data may include data transformed from these raw data; for example, the target optical data may be the mathematically calculated values ​​of at least two of the wavelength, brightness, and chromaticity coordinates of the light emitted by the target light-emitting element.

[0060] The light-emitting element data also includes position information of multiple light-emitting elements to facilitate grouping the light-emitting elements according to their position. The position information can be used to indicate the location of multiple target light-emitting elements on the first substrate. The position information may include coordinate information of the multiple target light-emitting elements on the first substrate, which may include, but is not limited to, absolute coordinates or relative coordinates. For example, the coordinate information may include the row coordinates and column coordinates of the target light-emitting elements, where the row coordinates indicate the row number of the target light-emitting element on the first substrate, and the column coordinates indicate the column number of the target light-emitting element on the first substrate.

[0061] Optionally, step 201 may include the following three steps.

[0062] In the first step, the light-emitting element data of the second substrate is acquired.

[0063] The light-emitting element data of the second substrate includes the optical data and position information of multiple light-emitting elements on the second substrate.

[0064] For example, the light-emitting element data of the second substrate includes the following two implementation methods:

[0065] (1) When the second substrate is the original substrate, the optical data and position information of multiple light-emitting elements on the original substrate can be tested in practice.

[0066] The optical data can be obtained by testing the optical characteristics of multiple light-emitting elements, or it can be derived from data provided by the manufacturer. The method for testing position information can include: taking a picture of the first substrate, then establishing a coordinate system on the second substrate based on the picture and determining the coordinate information of each first light-emitting element, thereby obtaining the position information.

[0067] The test results can be stored in local memory or a cloud server. The light-emitting element data of the second substrate can be read from the local memory or received from a computer device.

[0068] (2) When the second substrate is an intermediate substrate, the light-emitting element data of the second substrate can be determined based on the optical data and position information of multiple light-emitting elements on the original substrate, as well as the correspondence between the original substrate and the intermediate substrate.

[0069] In addition, when the intermediate substrate is provided by the manufacturer as raw material, the light-emitting element data of the second substrate can also be obtained by referring to the first implementation method.

[0070] In the second step, the first correspondence between the first substrate and the second substrate is determined based on the first transfer algorithm.

[0071] The first transfer algorithm is used to indicate the rules for transferring at least a portion of the light-emitting elements on the second substrate to the first substrate. The first transfer algorithm includes, but is not limited to, a die-picking algorithm, a die-placement / die-bonding algorithm, and a path planning algorithm.

[0072] For example, a chip transfer device can pick up light-emitting elements on a second substrate using transfer elements, and transfer the light-emitting elements to the first substrate according to the movement path of the transfer elements and the target arrangement points on the first substrate. The chip picking algorithm can be used to indicate the picking order of the light-emitting elements on the second substrate. The chip placement / bonding algorithm can be used to indicate the order in which the light-emitting elements are picked up from the target arrangement points on the first substrate. The chip placement algorithm is used in the transfer process from the original substrate to the intermediate substrate, and the chip bonding algorithm is used in the transfer process from the intermediate substrate to the product substrate, or vice versa. A path planning algorithm is used to indicate the movement path of the transfer elements.

[0073] Therefore, the first correspondence determined by the first transfer algorithm can be used to indicate the correspondence between the positions of the light-emitting element to be transferred on the first substrate and the second substrate.

[0074] Optionally, the first transfer algorithm may be a transfer subroutine for the light-emitting element, which may be distributed to one or more transfer devices, thereby enabling one or more transfer devices to transfer the light-emitting element based on the transfer subroutine.

[0075] In the third step, the light-emitting element data of the first substrate is determined based on the light-emitting element data of the second substrate and the first correspondence.

[0076] In step 202, the first group fluctuation parameter of each first light-emitting element group is determined based on the light-emitting element data of the first substrate.

[0077] Among them, the fluctuation parameter in the first group is used to characterize the uniformity of the light emission effect in the corresponding first light-emitting element group.

[0078] In step 203, the overall fluctuation parameter is determined based on the fluctuation parameter within the first group of each first light-emitting element group.

[0079] The overall fluctuation parameter is used to characterize the uniformity of the luminous effect of all target light-emitting elements on the first substrate.

[0080] In one possible implementation, each first light-emitting element group includes a plurality of first sub-light-emitting element groups arranged in an array. The fluctuation parameters within the first group of each first light-emitting element group can be calculated in the following two steps.

[0081] In the first step, the first mean of the target optical data of all target light-emitting elements in each first sub-light-emitting element group is calculated.

[0082] In this way, multiple first averages can be obtained, and the number of first averages obtained is the same as the number of first sub-light-emitting element groups.

[0083] In the second step, the standard deviation of the first mean corresponding to each first sub-light-emitting element group is used as the first group-in-group fluctuation parameter of the first light-emitting element group.

[0084] The standard deviation of the first mean corresponding to each first sub-light-emitting element group can measure the degree of dispersion of the first mean corresponding to each first sub-light-emitting element group in the first light-emitting element group. The larger the standard deviation, the greater the dispersion and the worse the uniformity; conversely, the smaller the standard deviation, the smaller the dispersion and the better the uniformity.

[0085] For example, the standard deviation of the first mean corresponding to each first sub-light-emitting element group within the first light-emitting element group can be calculated according to formula (1).

[0086] In formula (1), σ represents the standard deviation, N represents the number of first sub-light-emitting element groups contained in the first light-emitting element group, and x i Let μ represent the first mean value corresponding to the i-th first sub-light-emitting element group in the first light-emitting element group, and let μ represent the mean value of the first mean value corresponding to each first sub-light-emitting element group.

[0087] In implementation, the first average value corresponding to each first sub-light-emitting element group can be calculated simultaneously or sequentially, and this embodiment of the present disclosure does not impose any restrictions on this. Furthermore, the fluctuation parameters within the first group of each first light-emitting element group can be calculated simultaneously or sequentially, and this embodiment of the present disclosure also does not impose any restrictions on this.

[0088] Since there are a large number of target light-emitting elements on the first substrate, directly calculating the standard deviation of the target optical data of each target light-emitting element in the first light-emitting element group would be computationally intensive. Therefore, each first light-emitting element group is first divided into multiple first sub-light-emitting element groups. After calculating the first mean value corresponding to each first sub-light-emitting element group, the standard deviation of each first mean value is used as the fluctuation parameter within the first group. This can reduce the computational workload while accurately characterizing the uniformity of the light emission effect within each first light-emitting element group.

[0089] Optionally, all target light-emitting elements on the first substrate are arranged in rows a and columns b, where a and b are both integers greater than 1. All target light-emitting elements in each first sub-light-emitting element group are arranged in rows m and columns n, where m ranges from 5% to 10% of a, and n ranges from 5% to 100% of b. a is an integer multiple of m, and b is an integer multiple of n. This arrangement of the first sub-light-emitting element groups ensures that the calculated intra-group fluctuation parameters accurately represent the uniformity of the light-emitting effect of all target light-emitting elements within the first group, thereby enabling subsequent inter-group fluctuation parameters to more accurately characterize the uniformity of the light-emitting effect of all target light-emitting elements on the first substrate.

[0090] In this embodiment, each first sub-light-emitting element group on the first substrate contains the same number of target light-emitting elements. In other embodiments, the number of target light-emitting elements contained in each first sub-light-emitting element group on the first substrate may also be different.

[0091] In one possible implementation, the overall fluctuation parameter is a first inter-group fluctuation parameter, which characterizes the uniformity of the luminous effect among the M first light-emitting element groups. For example, this first inter-group fluctuation parameter is the standard deviation of the first intra-group fluctuation parameter for each first light-emitting element group. The calculation method for the standard deviation of the first intra-group fluctuation parameter for each first light-emitting element group can be the same as the calculation method for the first intra-group fluctuation parameter, and will not be described in detail here.

[0092] The calculation process of the first group of fluctuation parameters is illustrated below with an example. In this example, " / " represents division and "*" represents multiplication.

[0093] Assume that the target light-emitting elements on the first substrate are arranged in rows a and columns b, forming an a*b matrix. Both a and b are positive integers much greater than 1. The target optical data of each target light-emitting element is denoted by the value A.

[0094] The a*b matrix is ​​divided into (a / m)*(b / n) regions by an m*n matrix, where m is divisible by a and n is divisible by b. That is, the target light-emitting elements in each region form an m*n matrix, and each m*n matrix is ​​a first sub-light-emitting element group. There are a total of (a / m)*(b / n) first sub-light-emitting element groups on the first substrate. The mean of all A values ​​in an m*n matrix becomes a B value, which is the aforementioned first mean.

[0095] Divide the (a / m)*(b / n) regions into (a / m / k)*(b / n / j) regions using a k*j rectangle, where k is divisible by a / m and j is divisible by b / n. Within each of the (a / m / k)*(b / n / j) regions, the target light-emitting elements form a (m*k)*(n*j) matrix. This (m*k)*(n*j) matrix constitutes a first group of light-emitting elements, and M equals (a / m / k)*(b / n / j).

[0096] In a matrix of (m*k)*(n*j), the standard deviation of all B values ​​is 1 C value (i.e., the fluctuation parameter within the first group mentioned above), and in a matrix of a*b, there are (a / m / k)*(b / n / j) C values.

[0097] Calculate the standard deviation of all C values ​​to obtain the first group of inter-group fluctuation parameters.

[0098] By selecting appropriate values ​​for m, n, k, and j, the M groups of first light-emitting elements can be arranged in different ways. In some examples, the M groups of first light-emitting elements are arranged in a one-dimensional array, where the row direction of the one-dimensional array is the same as the row or column direction of the light-emitting elements on the first substrate. In other examples, the M groups of first light-emitting elements are arranged in a two-dimensional array, where the row direction of the two-dimensional array is the same as the row or column direction of the light-emitting elements on the first substrate.

[0099] In another possible implementation, the overall fluctuation parameter is a mathematical value of the inter-group fluctuation parameters corresponding to different grouping methods. For example, the inter-group fluctuation parameters corresponding to different grouping methods can be weighted to obtain the overall fluctuation parameter.

[0100] The following description, with reference to Figure 3, uses the weighted average of the inter-group fluctuation parameters corresponding to the two grouping methods as an example to illustrate the method for evaluating luminescence effect provided in this embodiment.

[0101] Figure 3 is a flowchart of another method for evaluating luminescence effects provided in an embodiment of this disclosure. As shown in Figure 3, the method includes:

[0102] In step 301, the light-emitting element data of the first substrate is obtained.

[0103] The first substrate is used to support multiple target light-emitting elements arranged in an array. The light-emitting element data includes the optical data of the multiple target light-emitting elements. The relevant content of the target light-emitting elements and the light-emitting element data is described in step 201 above, and will not be repeated here.

[0104] In this embodiment, the multiple target light-emitting elements are grouped in two ways. The first grouping method is to divide them into the aforementioned M first light-emitting element groups. The second grouping method is to divide them into N second light-emitting element groups. Here, N is an integer greater than 1.

[0105] The N second light-emitting element groups are arranged in an array, and the division method is different from that of the M first light-emitting element groups. The different division methods include the following two types: First, M and N are equal, but the arrangement of the N second light-emitting element groups is different from that of the M first light-emitting element groups; Second, M and N are not equal, in which case the arrangement of the N second light-emitting element groups is also different from that of the M first light-emitting element groups.

[0106] Similar to the value of M, the value of N can also be 4-60.

[0107] In step 302, the first group fluctuation parameter of each first light-emitting element group is determined based on the light-emitting element data of the first substrate.

[0108] See step 202 for related details, which are omitted here.

[0109] In step 303, the inter-group fluctuation parameters are determined based on the intra-group fluctuation parameters of each first light-emitting element group.

[0110] In step 304, the second group fluctuation parameter of each second light-emitting element group is determined based on the light-emitting element data of the first substrate.

[0111] Among them, the fluctuation parameter in the second group is used to characterize the uniformity of the light emission effect in the corresponding second light-emitting element group.

[0112] The calculation method for the fluctuation parameters within the second group of each second light-emitting element group is the same as the calculation method for the fluctuation parameters within the first group of the aforementioned first light-emitting element group, and will not be described in detail here.

[0113] In step 305, the inter-group fluctuation parameters are determined based on the intra-group fluctuation parameters of each second light-emitting element group.

[0114] Among them, the fluctuation parameter between the second group is used to characterize the uniformity of the luminous effect among the N second light-emitting element groups.

[0115] The calculation method for the fluctuation parameters of the second component is the same as that for the fluctuation parameters of the first group, and will not be described in detail here.

[0116] In practice, steps 302-303 and 304-305 can be executed simultaneously or sequentially, and this embodiment does not impose any restrictions on this.

[0117] In step 306, the overall fluctuation parameters are determined based on the fluctuation parameters between the first and second groups.

[0118] For example, step 306 includes: performing a weighted calculation on the first group fluctuation parameters and the second group fluctuation parameters to obtain the overall fluctuation parameters.

[0119] That is, the sum of the product of the first group fluctuation parameter and the first weight and the product of the second group fluctuation parameter and the second weight is taken as the overall fluctuation parameter. The first weight and the second weight can be set empirically, or determined based on the visual simulation diagram of the first substrate (see below for details).

[0120] In this embodiment, the overall fluctuation parameter is related to the inter-group fluctuation parameters corresponding to various grouping methods, which can reduce the calculation deviation of the overall fluctuation parameter due to inappropriate grouping.

[0121] Optionally, the method may further include: obtaining a visual simulation diagram of the first substrate based on the light-emitting element data of the first substrate; and determining the grouping method corresponding to the first substrate according to the visual simulation diagram of the first substrate.

[0122] Based on the light-emitting element data of the first substrate, a visual effect simulation image of the first substrate can be obtained before the target light-emitting element is transferred. The visual effect simulation image of the first substrate can be used to simulate the light-emitting effect of multiple light-emitting elements (which can be all light-emitting elements) located on the first substrate. That is, the visual effect simulation image can combine the optical data and position information of the light-emitting elements to simulate the image quality effect of the final pixel presented on the first substrate.

[0123] In this embodiment of the disclosure, the method for fabricating the visual simulation image of the first substrate may include:

[0124] (1) Construct a visual effect simulation model using optical data and position information as parameters. The optical data may include at least one of the original parameters such as wavelength, brightness, color coordinates, voltage, and current. Alternatively, the optical data may include data after data transformation of these original parameters. Data transformation refers to the calculation of several original parameters through mathematical relationships. For example, the visual effect simulation model uses wavelength parameters and coordinate information as parameters.

[0125] (2) The visual effect simulation diagram of the first substrate is obtained by simulating the light-emitting element data of the first substrate through a visual effect simulation model. For example, the light-emitting element data of the first substrate may include the wavelength and coordinate information of multiple target light-emitting elements to be transferred. Then, the light emission color at each position on the first substrate can be simulated through the visual effect simulation model, thereby simulating the image quality effect of the final pixel presented on the first substrate.

[0126] Please refer to Figure 4, which is a comparative schematic diagram of the visual effect simulation and the actual visual effect of a first substrate provided in this embodiment of the present disclosure. In this embodiment, the actual visual effect C1 can be obtained by photographing the target light-emitting element on the first substrate (product substrate) when it is lit using an optical camera. The grayscale visual effect C2 is an image processed in grayscale based on the actual visual effect C1, and the grayscale visual effect C2 can clearly characterize the optical distribution of the target light-emitting element on the second substrate. The visual effect simulation C3 is a visual effect simulation of the first substrate created using the light-emitting element data (target optical data and position information) of the first substrate, and the visual effect simulation C3 can predict the optical distribution of the light-emitting elements on the first substrate. Comparing C1, C2, and C3, it can be seen that the optical distribution in the visual effect simulation C3 provided in this embodiment of the present disclosure is similar to that in the grayscale visual effect, therefore, the visual effect simulation C3 can effectively characterize the actual image quality of the display module.

[0127] On the one hand, visual simulation diagrams can visualize the image quality after transfer, improving the ease of verifying the transfer effect of the transfer method.

[0128] This visual simulation diagram allows for a direct observation of the uniformity of the light emission effect of all target light-emitting elements on the first substrate.

[0129] This embodiment of the disclosure can determine whether the uniformity of the light emission effect of all target light-emitting elements on the first substrate meets the requirements by determining whether there are obvious image quality defects, such as stripes, clusters, color blocks, etc., in the visual effect simulation diagram.

[0130] The embodiments of this disclosure can be directly observed by the human eye to see if there are stripes, clusters, or color blocks, or can be confirmed by scanning using an image recognition algorithm. For example, please refer to Figure 3. The chromaticity of region C32 differs significantly from that of the adjacent regions C31 and C33. Therefore, region C32 is a clear example of poor image quality, with poor uniformity of the luminous effect.

[0131] On the other hand, the grouping method can also be determined based on the visual simulation diagram. This grouping method is used to indicate the arrangement of each group of light-emitting elements.

[0132] For example, if the type of image quality defect observed through the visual effect simulation diagram is color blocks, then the M first light-emitting element groups can be arranged in a two-dimensional matrix; if the type of image quality defect observed through the visual effect simulation diagram is stripes, then the M first light-emitting element groups can be arranged in a one-dimensional matrix, and the length direction of each first light-emitting element group is consistent with the direction of the stripes.

[0133] For example, if the types of poor image quality observed through the visual simulation include stripes and color blocks, then M first light-emitting element groups can be arranged in a one-dimensional matrix, with the length direction of each first light-emitting element group aligned with the direction of the stripes; and N second light-emitting element groups can be arranged in a two-dimensional matrix.

[0134] Furthermore, when multiple grouping methods exist, the weights corresponding to the aforementioned different grouping methods can be determined based on the visual effects simulation diagram. For example, if the visual effects simulation diagram shows that stripe defects are more severe and color block defects are less severe, then the weights corresponding to the M first light-emitting element groups arranged in a one-dimensional matrix are set to be larger, and the weights corresponding to the N second light-emitting element groups arranged in a two-dimensional matrix are set to be smaller. As another example, if the visual effects simulation diagram shows that both stripe defects and color block defects exist and are of similar severity, then the weights corresponding to the M first light-emitting element groups and the N second light-emitting element groups are set to be equal, for example, both equal to 0.5.

[0135] Optionally, the method may further include: determining whether the uniformity of the luminous effect of all target light-emitting elements on the first substrate meets the requirements based on the overall fluctuation parameters of the first substrate.

[0136] The uniformity of the luminous effect of all target light-emitting elements on the first substrate can indicate the similarity of the target optical data of all target light-emitting elements. The higher the similarity of the target optical data, the lower the possibility of optical aggregation, and the better the image quality after transfer.

[0137] Optionally, determining whether the uniformity of the light emission effect meets the requirements can include the following two implementation methods:

[0138] (1) Compare the overall fluctuation parameters of the first substrate with the first threshold.

[0139] If the overall fluctuation parameter of the first substrate is less than or equal to the first threshold, it indicates that the uniformity of the luminous effect of all target light-emitting elements on the first substrate meets the requirements. If the overall fluctuation parameter of the first substrate is greater than the first threshold, it indicates that the uniformity of the luminous effect of all target light-emitting elements on the first substrate does not meet the requirements.

[0140] For example, the first threshold can be set according to actual needs. For instance, when the first substrate is a product substrate, the first threshold can be less than or equal to 0.05. For example, the first threshold can be 0.05, 0.04, 0.03, or 0.02. The smaller the value of the first threshold, the stricter the control over uniformity.

[0141] When the first substrate is an intermediate substrate, the first threshold can be appropriately increased. That is, the first threshold when the first substrate is an intermediate substrate can be greater than the first threshold when the first substrate is a product substrate. In other words, the control standard for sorting sheets can be lower than the control standard for display modules. This is because after the light-emitting elements are transferred to the intermediate substrate, they are transferred to the product substrate. The disorder of the light-emitting element arrangement can also be improved in various ways. Therefore, sorting sheets with poor disorder can also be used to reduce the waste of raw materials.

[0142] (2) The embodiments of this disclosure can combine visual effect simulation diagrams and overall fluctuation parameters to determine whether the uniformity of the light emission effect of all target light-emitting elements on the first substrate meets the requirements.

[0143] For example, the presence of defects can be determined first based on the visual effect simulation diagram. If defects exist, the degree of defects can be quantified by combining the aforementioned overall fluctuation parameters. That is, if defects exist, the first method (1) mentioned above can be used to determine whether the uniformity of the light emission effect of all target light-emitting elements on the first substrate meets the requirements, thereby improving the judgment efficiency. If there are no defects, it can be directly determined that the uniformity of the light emission effect of all target light-emitting elements on the first substrate meets the requirements.

[0144] It should be noted that in the foregoing embodiments, standard deviation was used as the within-group fluctuation parameter and between-group fluctuation parameter for illustration. In other embodiments, the within-group fluctuation parameter and / or between-group fluctuation parameter can be replaced by variance.

[0145] In this embodiment of the disclosure, the overall fluctuation parameter is determined before each target light-emitting element is transferred to the first substrate. Since the overall fluctuation parameter can characterize the uniformity of the light emission effect of all target light-emitting elements on the first substrate, it can be determined in advance, based on the overall fluctuation parameter, whether the uniformity after each target light-emitting element is transferred to the first substrate can meet the requirements.

[0146] If the uniformity of the luminous effect of all target light-emitting elements on the first substrate fails to meet the requirements, the first transfer algorithm can be adjusted, or the second substrate can be replaced, until a first substrate with uniformity that meets the requirements is obtained (i.e., until the overall fluctuation parameter of the first substrate is less than or equal to the first threshold). Then, the target light-emitting elements are transferred from the second substrate to the first substrate. In this way, the display panel can be produced and manufactured according to specific requirements, reducing the possibility of producing products that do not meet the requirements and helping to save costs.

[0147] Once it is confirmed that the uniformity of the light emission effect of all target light-emitting elements on the first substrate meets the requirements, it can be predicted that the image quality after transfer will be good. This indicates that the transfer effect of the first transfer algorithm is good. Therefore, multiple light-emitting elements can be transferred from the second substrate to the first substrate by the transfer equipment according to the first transfer algorithm, thereby effectively reducing the probability of defective products and improving product quality and efficiency.

[0148] In other embodiments, the overall fluctuation parameter can be determined after transferring multiple target light-emitting elements to the first substrate. This allows for strict quality control of the first substrate carrying the light-emitting elements based on the overall fluctuation parameter. When the first substrate is an intermediate substrate, the mixing effect of the target light-emitting elements on the first substrate is guaranteed. When the first substrate is a product substrate, the display effect of the display panel is guaranteed.

[0149] It should be noted that if the overall fluctuation parameters are determined after transferring multiple target light-emitting elements to the first substrate, the light-emitting element data of the first substrate can be obtained through testing. Specifically, the target optical data of the target light-emitting elements can be obtained by testing the optical characteristics of the light-emitting elements. The position information of the target light-emitting elements can be obtained as follows: photograph the first substrate, then establish a coordinate system on the second substrate based on the photograph and determine the coordinate information of each target light-emitting element, thereby obtaining the position information.

[0150] Based on the overall fluctuation parameters of the first substrate, it can be determined whether the uniformity of the luminous effect of all target light-emitting elements on the first substrate meets the requirements. In some scenarios, it is also necessary to determine whether the uniformity of the luminous effect of multiple first substrates meets the requirements. For example, it is necessary to ensure that the difference in the luminous effect of the first substrates in the same batch is small, or it is necessary to ensure that the difference in the luminous effect between multiple first substrates used to manufacture the same display device is small.

[0151] Therefore, this disclosure provides a method for evaluating whether the uniformity of the light emission effect of multiple first substrates meets the requirements using inter-chip fluctuation parameters. The method is described below by way of example.

[0152] Figure 5 is a flowchart of another method for evaluating luminescence effects provided in an embodiment of this disclosure. As shown in Figure 5, the method includes the following steps.

[0153] In step 501, data on the light-emitting elements of X first substrates are obtained.

[0154] Where X is an integer greater than 1.

[0155] In step 502, the inter-board fluctuation parameters are determined based on the light-emitting element data of the X first substrates.

[0156] Among them, the inter-plate fluctuation parameter is used to characterize the uniformity of the light emission effect among the X first substrates.

[0157] Optionally, step 502 includes the following two steps:

[0158] The first step is to calculate the second mean of the target optical data of the target light-emitting element corresponding to each first substrate;

[0159] The second step is to determine the inter-board fluctuation parameters based on the second average value corresponding to each first substrate.

[0160] In this second step, the standard deviation of the second mean corresponding to X first substrates can be used as the inter-substrate fluctuation parameter.

[0161] In other embodiments, the variance of the second mean corresponding to X first substrates can also be used as the inter-substrate fluctuation parameter.

[0162] In this embodiment, the value of X can be set according to actual needs, and data from multiple first substrates' light-emitting elements can be selected for evaluation as much as possible. For example, X is greater than or equal to 30.

[0163] In practice, the method shown in Figure 5 can be determined either before the light-emitting element is transferred to the corresponding first substrate, or after the light-emitting element is transferred to the corresponding first substrate.

[0164] Optionally, the method may further include: determining whether the uniformity of the luminescence effect among the X first substrates meets the requirements based on the inter-chip fluctuation parameters.

[0165] In implementation, the inter-chip fluctuation parameter can be compared with the second threshold.

[0166] If the inter-chip fluctuation parameter is less than or equal to the second threshold, it indicates that the uniformity of the light emission effect among the X first substrates meets the requirements. If the inter-chip fluctuation parameter is greater than the second threshold, it indicates that the uniformity of the light emission effect among the X first substrates does not meet the requirements.

[0167] For example, the second threshold can be set according to actual needs. For instance, when the second substrate is a product substrate and the inter-board fluctuation parameter is the aforementioned standard deviation, the second threshold can be less than or equal to 0.25. For example, the second threshold can be 0.25, 0.20, 0.15, or 0.10, etc. The smaller the value of the second threshold, the stricter the control over uniformity.

[0168] When the first substrate is an intermediate substrate, the second threshold can be appropriately increased. That is, the second threshold when the first substrate is an intermediate substrate can be greater than the second threshold when the first substrate is a product substrate, meaning the control standard for sorting wafers can be lower than the control standard for display modules.

[0169] In summary, the embodiments of this disclosure provide a method for evaluating luminous efficacy. This method determines an overall fluctuation parameter based on the luminous element data of a first substrate, used to characterize the uniformity of the luminous efficacy of all target luminous elements on the first substrate. This allows for the quantification of the uniformity of the luminous efficacy of the first substrate, enabling more stringent control. Furthermore, the overall fluctuation parameter is determined based on the intra-group fluctuation parameter, used to characterize the uniformity of the luminous efficacy within a corresponding first luminous element group. Thus, by progressively describing the uniformity of the luminous efficacy of the target luminous elements on the first substrate from small to large regions, the uniformity of the luminous efficacy of all target luminous elements on the first substrate can be evaluated more accurately.

[0170] Furthermore, the overall fluctuation parameters can characterize the luminescence effect of the target light-emitting element on the first substrate and are determined before transferring the target light-emitting element to the first substrate. This allows for advance prediction of whether the uniformity of the luminescence effect of the transferred target light-emitting element meets the requirements. Thus, this method can verify the effectiveness of the transfer method before the target light-emitting element is transferred, which not only reduces the cost of verifying the effectiveness of the transfer method but also mitigates the risk of poor image quality, effectively avoiding such issues.

[0171] Finally, the inter-chip fluctuation parameter can characterize the uniformity of the light emission effect among multiple first substrates. The inter-chip fluctuation parameter can also be used to quantify the evaluation of the light emission effect among multiple first substrates, thereby enabling more stringent control.

[0172] The method for evaluating luminous efficacy provided in this disclosure can be applied during the manufacturing process of a light-emitting device, specifically during the transfer of a light-emitting element between substrates. Optionally, the method can be performed before transferring the target light-emitting element from the second substrate to the first substrate, or after transferring the target light-emitting element from the second substrate to the first substrate.

[0173] The following describes three exemplary embodiments:

[0174] (1) The second substrate is the original substrate, and the first substrate is the intermediate substrate.

[0175] (2) The second substrate is the original substrate, and the first substrate is the product substrate.

[0176] (3) The second substrate is an intermediate substrate, and the first substrate is a product substrate.

[0177] In the manufacturing process of light-emitting devices, the transfer of light-emitting elements typically involves two processes:

[0178] In the first scenario, the light-emitting element is initially located on the original substrate, and then directly transferred from the original substrate to the product substrate, where other processes are performed to obtain the light-emitting device. Therefore, the second embodiment described above can be the transfer process in this scenario.

[0179] In the second scenario, the light-emitting element is initially located in the original substrate, then transferred from the original substrate to one or more intermediate substrates, and finally transferred from one of the intermediate substrates to the product substrate, where other processes are performed to obtain the light-emitting device. Therefore, the first and third embodiments described above can represent different stages of the transfer process in this scenario.

[0180] The following section, using the light-emitting element transfer method as an example, illustrates the specific application scenarios of this method for evaluating light emission effects.

[0181] Figure 6 is a flowchart of a method for transferring light-emitting elements according to an embodiment of this disclosure. This method is used to transfer multiple light-emitting elements from a second substrate to a first substrate. In this embodiment, the second substrate is an intermediate substrate, and the first substrate is a product substrate. As shown in Figure 6, the method includes:

[0182] In step 601, the light-emitting element data of the second substrate is obtained.

[0183] The light-emitting element data of the second substrate includes optical data and position information of multiple light-emitting elements located on the second substrate.

[0184] The details of step 601 are the same as those of step 201 above, and will not be described in detail here.

[0185] In step 602, the overall fluctuation parameters of the second substrate are determined based on the light-emitting element data of the second substrate.

[0186] The overall fluctuation parameter of the second substrate is used to characterize the light-emitting effect of the multiple light-emitting elements on the second substrate, thus providing a direct visual representation of the quality of the second substrate. A larger overall fluctuation parameter indicates less disorder among the multiple light-emitting elements on the second substrate, resulting in poorer uniformity of the light-emitting effect. Conversely, a smaller overall fluctuation parameter indicates more sufficient disorder among the multiple light-emitting elements on the second substrate, resulting in better uniformity of the light-emitting effect.

[0187] The method for determining the overall fluctuation parameters of the second substrate can refer to the aforementioned process for determining the overall fluctuation parameters of the first substrate, and will not be detailed here.

[0188] On the one hand, the overall fluctuation parameters of the second substrate can be used to predict the image quality of the first substrate, so that measures can be taken in advance to improve the uniformity of the light emission effect of the first substrate. For example, when it is determined from the overall fluctuation parameters that the disorder of the light-emitting elements on the second substrate is poor, the first transfer algorithm can be optimized. For example, the number of transfer devices and sorting sheets can be increased, thereby effectively improving the disorder of the light-emitting elements on the first substrate.

[0189] On the other hand, the overall fluctuation parameters of the second substrate can reflect the quality of the raw materials (sorting wafers or wafers), so as to trace the reasons for the poor image quality of the final product (display module), thereby tightening the control standards at the raw material end.

[0190] In step 603, a first correspondence between the first substrate and the second substrate is determined based on the first transfer algorithm.

[0191] The first transfer algorithm is used to indicate the rules for transferring at least a portion of the light-emitting elements on the second substrate to the first substrate.

[0192] The details of step 603 are as described in step 201 above and will not be elaborated here.

[0193] In step 604, the light-emitting element data of the first substrate is determined based on the light-emitting element data of the second substrate and the first correspondence.

[0194] The details of step 604 are the same as those in step 201 above, and will not be described in detail here.

[0195] In step 605, the overall fluctuation parameters of the first substrate are determined based on the light-emitting element data of the first substrate.

[0196] The overall fluctuation parameter of the first substrate is used to characterize the uniformity of the luminous effect of all target light-emitting elements located on the first substrate.

[0197] For details regarding step 605, please refer to Figure 2 or Figure 3; further details are omitted here.

[0198] In step 606, it is determined whether the overall fluctuation parameter of the first substrate is greater than the first threshold.

[0199] If the overall fluctuation parameter of the first substrate is not greater than the first threshold, it means that the uniformity of the light emission effect of all target light-emitting elements on the first substrate meets the requirements, and then step 607 is executed; if the overall fluctuation parameter of the first substrate is less than the first threshold, it means that the uniformity of the light emission effect of all target light-emitting elements on the first substrate does not meet the requirements, and then step 610 is executed.

[0200] For details regarding the first threshold, please refer to the above text; a detailed description is omitted here.

[0201] In step 607, multiple target light-emitting elements are transferred from the second substrate to the first substrate.

[0202] In step 608, position data of multiple light-emitting elements are acquired.

[0203] The position data of multiple light-emitting elements includes: position information of multiple light-emitting elements on the second substrate, and position information of multiple light-emitting elements on the first substrate. The position data of multiple light-emitting elements can reflect the actual transfer status of multiple light-emitting elements during the transfer process.

[0204] For example, during the transfer process, if some light-emitting elements are in poor condition or damaged, the transfer device can skip these problematic light-emitting elements and pick up the next one. The position information in the light-emitting element data of the first substrate is obtained based on a preset first transfer algorithm. Therefore, the actual position information of multiple light-emitting elements on the first substrate may differ from the position information in the light-emitting element data of the first substrate.

[0205] Optionally, embodiments of this disclosure can receive position data of multiple light-emitting elements from a transfer device used to transfer the multiple light-emitting elements from a second substrate to a first substrate. The transfer device can record the position information of each transferred light-emitting element on the second substrate and its position information on the first substrate during the transfer process. Alternatively, the position data of the multiple light-emitting elements can also be recorded by other computer devices, and embodiments of this disclosure do not impose limitations on this.

[0206] In step 609, the light-emitting element data of the first substrate is updated according to the position data of multiple light-emitting elements, and the updated overall fluctuation parameter of the first substrate is determined based on the updated light-emitting element data of the first substrate.

[0207] The updated overall fluctuation parameters of the first substrate are used to characterize the luminous effect of multiple light-emitting elements after actual transfer. Steps 608 and 609 provide a method for obtaining the updated overall fluctuation parameters of the first substrate, which can facilitate the elimination of variables existing in the transfer process, thereby improving the accuracy of the overall fluctuation parameters.

[0208] In addition, the overall fluctuation parameters of the first substrate before transfer can be compared with the updated overall fluctuation parameters of the first substrate after transfer. If the two are the same, it can be proven that no problem occurred during the transfer process. If the two are different, it is convenient to check whether there is a problem with the transfer process, such as whether there is a problem with the transfer function or the mixing function of the transfer equipment.

[0209] In step 610, the adjusted first transfer algorithm is determined, and step 603 is executed.

[0210] In this embodiment of the disclosure, adjusting the first transfer algorithm may include: optimizing at least one of the crystal picking algorithm, the crystal placement / bonding algorithm, and the path planning algorithm. Through step 609, the first transfer algorithm can be selected through multiple iterations until a better algorithm is found, thereby improving the yield of the final product.

[0211] The optimized crystal-picking algorithm can increase the randomness of picking up light-emitting elements from the second substrate; for example, the number of spaced arrangement points can be increased during picking. The optimized crystal-placement / bonding algorithm can increase the randomness of acquiring light-emitting elements from target arrangement points on the second substrate; for example, the number of spaced target arrangement points can be increased during crystal-placement / bonding. The optimized path planning algorithm can change the path of the transfer element; for example, the path of the transfer element can be changed from an S-shape to a spiral shape.

[0212] In addition, adjusting the first transfer algorithm may also include increasing the number of transfer devices or the number of sorting pieces.

[0213] This disclosure also provides another method for transferring light-emitting elements, which is used to transfer multiple light-emitting elements from a raw substrate to an intermediate substrate, and then from the intermediate substrate to a product substrate.

[0214] Figure 7 is a flowchart of another method for transferring a light-emitting element according to an embodiment of this disclosure. As shown in Figure 7, the method includes:

[0215] In step 701, the light-emitting element data of the original substrate is obtained.

[0216] The light-emitting element data of the original substrate includes optical data and position information of multiple light-emitting elements located on the second substrate.

[0217] In step 702, the first correspondence between the original substrate and the product substrate is determined based on the first transfer algorithm.

[0218] The first transfer algorithm is used to indicate the rules for transferring at least a portion of the light-emitting elements on the original substrate to the intermediate substrate.

[0219] In step 703, the light-emitting element data of the intermediate substrate is determined based on the light-emitting element data of the original substrate and the first correspondence, and the overall fluctuation parameters of the intermediate substrate are obtained based on the light-emitting element data of the intermediate substrate.

[0220] In step 704, based on the overall fluctuation parameters of the intermediate substrate, it is determined whether the uniformity of the light emission effect of the multiple light-emitting elements on the intermediate substrate meets the requirements.

[0221] The overall fluctuation parameter of the intermediate substrate is used to characterize the uniformity of the light emission effect of multiple light-emitting elements located on the intermediate substrate.

[0222] In step 705, after the uniformity of the light emission effect of the multiple light-emitting elements on the intermediate substrate meets the requirements, the multiple light-emitting elements are transferred from the original substrate to the intermediate substrate, and a second transfer algorithm is determined.

[0223] The second transfer algorithm is used to indicate the rules for sequentially transferring each light-emitting element to the product substrate according to the arrangement order of the multiple light-emitting elements on the intermediate substrate.

[0224] This is because once the uniformity of the light-emitting effect of multiple light-emitting elements on the intermediate substrate meets the requirements, it can be determined that the disorder of the arrangement of light-emitting elements on the intermediate substrate is sufficient. During the process of transferring the light-emitting elements from the intermediate substrate to the product substrate, the light-emitting elements do not need to be mixed. Therefore, the transfer equipment does not need to have the function of mixing light-emitting elements. It only needs to transfer them in the order of arrangement, thereby reducing the requirements on the transfer equipment and reducing the difficulty of production.

[0225] In step 706, a second correspondence between the intermediate substrate and the product substrate is determined based on the second transfer algorithm.

[0226] In step 707, the light-emitting element data of the product substrate is determined based on the light-emitting element data of the intermediate substrate and the second correspondence, and the overall fluctuation parameters of the product substrate are obtained based on the light-emitting element data of the product substrate.

[0227] The overall fluctuation parameter of the product substrate is used to characterize the uniformity of the luminous effect of multiple light-emitting elements located on the product substrate.

[0228] In step 708, based on the overall fluctuation parameters of the product substrate, it is determined whether the uniformity of the light emission effect of the multiple light-emitting elements on the product substrate meets the requirements.

[0229] In step 709, after the uniformity of the light emission effect of the multiple light-emitting elements on the product substrate meets the requirements, the multiple light-emitting elements are transferred from the intermediate substrate to the product substrate.

[0230] In step 710, if the uniformity of the light emission effect of the multiple light-emitting elements on the intermediate substrate does not meet the requirements, the multiple light-emitting elements are transferred from the intermediate substrate to the product substrate, and a third transfer algorithm is determined.

[0231] The third transfer algorithm is used to indicate the rules for randomly transferring each light-emitting element to the product substrate according to the random order of multiple light-emitting elements on the intermediate substrate.

[0232] This is because when the uniformity of the light emission effect of multiple light-emitting elements on the intermediate substrate does not meet the requirements, it can be determined that the disorder of the light-emitting element arrangement on the intermediate substrate is insufficient. However, the intermediate substrate is not the final product. Therefore, during the process of transferring the light-emitting elements from the intermediate substrate to the product substrate, a transfer device can be used to mix the light-emitting elements to ensure the image quality of the final product.

[0233] The transfer equipment involved in the embodiments of this disclosure may include, but is not limited to, sorting machines, die bonders, chip mounters, laser mass transfer equipment, etc.

[0234] Optionally, the corresponding third transfer algorithm can be determined by combining the transfer rules of different transfer devices. The following three examples illustrate this:

[0235] In a first exemplary embodiment, the transfer device can be a needle-type die bonder. The principle of transferring light-emitting elements using a needle-type die bonder is as follows: A first substrate is placed on top of a third substrate, and multiple light-emitting elements on the first substrate correspond one-to-one with multiple arrangement points on the third substrate, that is, each light-emitting element on the first substrate corresponds to one arrangement point on the third substrate. During transfer, the needle of the needle-type die bonder pushes the light-emitting elements on the first substrate downwards to the corresponding arrangement point on the third substrate, thereby transferring the light-emitting elements.

[0236] When the needle-type die bonder uses the first mode to transfer light-emitting elements, the first substrate is not moved (or only slightly moved in a limited area to ensure precise alignment and compensate for alignment deviations between the light-emitting elements and their placement points). Therefore, the overall efficiency of transferring light-emitting elements is high, and the first mode can also be called the fast-layout mode. When the needle-type die bonder uses the second mode to transfer light-emitting elements, the first substrate needs to be moved once for each light-emitting element transferred. Compared to the first mode, the efficiency of transferring light-emitting chips in the second mode is lower, and the second mode can also be called the slow-layout mode. Therefore, the third transfer algorithm can be determined based on the transfer rules of the first or second mode.

[0237] In a second exemplary embodiment, the transfer device can be a swing-arm die bonder. The swing-arm die bonder is used to transfer light-emitting elements from one substrate to another. Therefore, the third transfer algorithm can be determined based on the pick-up rules and die-bonding rules of the swing-arm die bonder.

[0238] In a third exemplary embodiment, the transfer device can be a laser mass transfer device. The laser transfer device is used to transfer a large number of light-emitting elements onto a product substrate using laser transfer technology. Therefore, the third transfer algorithm can be determined based on the transfer rules of the laser mass transfer device.

[0239] Since the transfer rules in the three embodiments are different, and the third transfer algorithm determined by them is different, the overall fluctuation parameters of the final product substrate are also different.

[0240] For specific transfer methods, please refer to Chinese Patent Application No. 202410661003.3, entitled "Method for determining the picking order of light-emitting elements, picking method and transfer method of light-emitting elements, device, equipment and medium", and Chinese Patent Application No. 202410600390.X, entitled "Light-emitting element transfer method and light-emitting element transfer system". The embodiments disclosed herein will not be described in detail here.

[0241] In step 711, a second correspondence between the intermediate substrate and the product substrate is determined based on the third transfer algorithm.

[0242] In step 712, the light-emitting element data of the product substrate is determined based on the light-emitting element data of the intermediate substrate and the second correspondence, and the overall fluctuation parameters of the third substrate are obtained based on the light-emitting element data of the product substrate, and step 708 is executed.

[0243] The overall fluctuation parameter of the third substrate is used to characterize the uniformity of the luminous effect of multiple light-emitting elements located on the third substrate.

[0244] In step 713, after the uniformity of the light emission effect of multiple light-emitting elements on the product substrate does not meet the requirements, the adjusted first transfer algorithm is determined and step 702 is executed.

[0245] It should be noted that steps 710 and 713 are related as OR. If the uniformity of the light emission effect of multiple light-emitting elements on the intermediate substrate does not meet the requirements, only one of steps 710 and 713 needs to be selected.

[0246] This disclosure also provides another method for transferring light-emitting elements. Please refer to FIG8, which is a schematic diagram of another method for transferring light-emitting elements provided in this disclosure. This method is used to transfer multiple light-emitting elements from the original substrate A1 to the intermediate substrate A2, and then from the intermediate substrate A2 to the product substrate A3. This method can continuously optimize the first transfer algorithm and the second transfer algorithm.

[0247] The sorting process, which involves transferring multiple light-emitting elements from the original substrate A1 (disc) to the intermediate substrate A2 (sorting plate), can be carried out using the aforementioned transfer method. This transfer method allows for the prediction of the transfer effect based on the overall fluctuation parameters of the intermediate substrate A2 before the transfer, thereby continuously optimizing the first transfer algorithm. This, in turn, increases the disorder of the light-emitting elements' arrangement on the sorting plate after transfer, preventing optical aggregation.

[0248] The die-bonding process, which transfers multiple light-emitting elements from the intermediate substrate A2 (sorting sheet) to the product substrate A3 (display substrate), can refer to the aforementioned transfer method. That is, the sorting and die-bonding processes can also employ the same optimized algorithm. This transfer method allows for the prediction of the transfer effect based on the overall fluctuation parameters of the product substrate A3 before transfer, enabling continuous optimization of the second transfer algorithm. This, in turn, increases the disorder of the light-emitting elements' arrangement on the display substrate after transfer, avoiding optical aggregation and improving image quality.

[0249] In addition, before determining the better first transfer algorithm and second transfer algorithm, the transfer step can be omitted. In this way, if the final product image quality is poor based on the overall fluctuation parameters of the product substrate A3, the first transfer algorithm can be optimized to avoid the possibility that optimizing only the second transfer algorithm may still not achieve a good image quality.

[0250] This disclosure also provides a display module, which includes at least one display substrate and a driving module. The driving module drives the display substrate to display an image. The display substrate includes a plurality of target light-emitting elements arranged in an array. These plurality of target light-emitting elements are all light-emitting elements on the display substrate that have the same emission color. The plurality of target light-emitting elements are divided into M first light-emitting element groups, which are arranged in an array, and each first light-emitting element group includes a plurality of target light-emitting elements, wherein M is an integer greater than 1, and the first light-emitting element group includes a plurality of first sub-light-emitting element groups arranged in an array.

[0251] The overall fluctuation parameter of the display panel is less than or equal to 0.05. The overall fluctuation parameter of the display panel can be determined using any of the aforementioned methods.

[0252] For example, the overall fluctuation parameter is determined using the method shown in Figure 2. In this case, the overall fluctuation parameter is the standard deviation of the fluctuation parameter within the first group of each first light-emitting element group; the fluctuation parameter within the first group is the standard deviation of the first mean of all first sub-light-emitting element groups in the corresponding first light-emitting element group, and the first mean is the mean of the target optical data of all target light-emitting elements in the corresponding first sub-light-emitting element group.

[0253] This disclosure also provides a display device, which includes the aforementioned display module.

[0254] Optionally, the display device also includes a power supply for powering the display module.

[0255] Optionally, the display module includes at least two display substrates, which are arranged in an array and connected together. Here, the at least two display substrates can be all the display substrates in the display device.

[0256] Optionally, the inter-board fluctuation parameter corresponding to the at least two display substrates is less than or equal to 0.25. The inter-board fluctuation parameter is used to characterize the uniformity of the light emission effect among the various display substrates in the display device. The inter-board fluctuation parameter can be determined using the method shown in Figure 5.

[0257] The display device can be any product or component with a display function, such as a laptop, mobile phone, tablet, television, monitor, wearable device, or navigator.

[0258] On the other hand, embodiments of this disclosure provide an apparatus for evaluating luminous efficacy. Figure 9 is a schematic diagram of an apparatus for evaluating luminous efficacy provided in an embodiment of this disclosure. As shown in Figure 9, the apparatus 900 includes: a first acquisition module 901, a first determination module 902, and a second determination module 903.

[0259] The first acquisition module 901 is used to acquire light-emitting element data of a first substrate. The first substrate is used to carry a plurality of target light-emitting elements arranged in an array. The plurality of target light-emitting elements are all light-emitting elements with the same emission color carried on the first substrate. The light-emitting element data includes target optical data of the plurality of target light-emitting elements. The plurality of target light-emitting elements are divided into M first light-emitting element groups. The M first light-emitting element groups are arranged in an array, and each first light-emitting element group includes a plurality of target light-emitting elements, where M is an integer greater than 1. The first determination module 902 is used to determine a first group-specific fluctuation parameter for each light-emitting element group based on the light-emitting element data of the first substrate. The first group-specific fluctuation parameter is used to characterize the uniformity of the emission effect within the corresponding light-emitting element group. The second determination module 903 is used to determine an overall fluctuation parameter based on the first group-specific fluctuation parameter for each first light-emitting element group. The overall fluctuation parameter is used to characterize the uniformity of the emission effect of all target light-emitting elements on the first substrate.

[0260] Optionally, the first light-emitting element group includes a plurality of first sub-light-emitting element groups arranged in an array. The first determining module 902 is used to determine the fluctuation parameter within the first group in the following manner: for any first light-emitting element group, calculate the first mean of the target optical data of all target light-emitting elements in each first sub-light-emitting element group; and take the standard deviation of the first mean corresponding to all first sub-light-emitting element groups in the first sub-light-emitting element group as the first fluctuation parameter within the first group of the first sub-light-emitting element group.

[0261] Optionally, all target light-emitting elements on the first substrate are arranged in rows a and columns b, where a and b are both integers greater than 1; all target light-emitting elements in each first sub-light-emitting element group are arranged in rows m and columns n, where m ranges from 5% to 10% of a, n ranges from 5% to 100% of b, a is an integer multiple of m, and b is an integer multiple of n.

[0262] In one possible implementation, the overall fluctuation parameter is a first inter-group fluctuation parameter, which is the standard deviation of the first intra-group fluctuation parameter of each of the first light-emitting element groups.

[0263] In another possible implementation, the plurality of target light-emitting elements are divided into N second light-emitting element groups. These N second light-emitting element groups are arranged in an array and their division method differs from that of the M first light-emitting element groups. Each second light-emitting element group includes several target light-emitting elements, where N is an integer greater than 1. The first determining module 902 is further configured to determine a second intra-group fluctuation parameter for each second light-emitting element group based on the light-emitting element data of the first substrate. The second intra-group fluctuation parameter characterizes the uniformity of the luminous effect within the corresponding second light-emitting element group. The second determining module 903 is configured to determine the overall fluctuation parameter based on the first intra-group fluctuation parameter of each first light-emitting element group and the second intra-group fluctuation parameter of each second light-emitting element group.

[0264] Optionally, the second determining module 903 is configured to determine a first inter-group fluctuation parameter based on the first intra-group fluctuation parameter of each first light-emitting element group, wherein the first inter-group fluctuation parameter is used to characterize the uniformity of the light emission effect among the M first light-emitting element groups; determine a second inter-group fluctuation parameter based on the second intra-group fluctuation parameter of each second light-emitting element group, wherein the second inter-group fluctuation parameter is used to characterize the uniformity of the light emission effect among the N second light-emitting element groups; and determine the overall fluctuation parameter according to the first inter-group fluctuation parameter and the second inter-group fluctuation parameter.

[0265] Optionally, the second determining module 903 is used to perform a weighted calculation on the first inter-group fluctuation parameters and the second inter-group fluctuation parameters to obtain the overall fluctuation parameters.

[0266] Optionally, the first acquisition module 901 is used to acquire the light-emitting element data of the first substrate in the following manner:

[0267] The process involves acquiring light-emitting element data of a second substrate, which includes optical data and position information of multiple light-emitting elements located on the second substrate; determining a first correspondence between the first substrate and the second substrate based on a first transfer algorithm, which indicates rules for transferring at least a portion of the light-emitting elements on the second substrate to the second substrate; and determining light-emitting element data of the first substrate based on the light-emitting element data of the second substrate and the first correspondence.

[0268] Optionally, the device 900 further includes: a third determining module 904, used to determine whether the uniformity of the light emission effect of the plurality of target light-emitting elements meets the requirements based on the overall fluctuation parameters of the first substrate; if the uniformity does not meet the requirements, to optimize the first transfer algorithm, or to replace the second substrate.

[0269] Optionally, the third determining module 904 is configured to compare the overall fluctuation parameter of the first substrate with a first threshold; if the overall fluctuation parameter of the first substrate is greater than the first threshold, then determine that the uniformity of the luminous effect of the plurality of target light-emitting elements does not meet the requirements; if the overall fluctuation parameter of the first substrate is less than or equal to the first threshold, then determine that the uniformity of the luminous effect of the plurality of target light-emitting elements meets the requirements.

[0270] Optionally, the device 900 further includes a second acquisition module 905 and a fourth determination module 906. The second acquisition module 905 is used to acquire light-emitting element data of X first substrates, where X is an integer greater than 1; the third determination module 906 is used to determine inter-substrate fluctuation parameters based on the light-emitting element data of the X first substrates, wherein the inter-substrate fluctuation parameters are used to characterize the uniformity of the light-emitting effect among the X first substrates.

[0271] Optionally, the fourth determining module 906 is used to calculate the second mean value of the target optical data of the target light-emitting element corresponding to each of the first substrates; and to determine the inter-board fluctuation parameter based on the second mean value corresponding to each of the first substrates.

[0272] Optionally, the fourth determining module 906 is used to take the standard deviation of the second mean corresponding to X first substrates as the inter-board fluctuation parameter.

[0273] It should be noted that the apparatus for evaluating luminous efficacy provided in the above embodiments is only illustrated by the division of the functional modules described above. In practical applications, the functions can be assigned to different functional modules as needed, that is, the internal structure of the apparatus can be divided into different functional modules to complete all or part of the functions described above. Furthermore, the apparatus for evaluating luminous efficacy and the method for evaluating luminous efficacy provided in the above embodiments belong to the same concept, and their specific implementation process is detailed in the method embodiments, which will not be repeated here.

[0274] The module division in this embodiment is illustrative and represents only one logical functional division. In actual implementation, other division methods are possible. Furthermore, the functional modules in the various embodiments of this disclosure can be integrated into a single processor, exist as separate physical entities, or be integrated into a single module. The integrated modules described above can be implemented in hardware or as software functional modules.

[0275] If the integrated module is implemented as a software functional module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this disclosure, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a terminal device (which may be a personal computer, mobile phone, or communication device, etc.) or processor to execute all or part of the steps of the methods of the various embodiments of this disclosure. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0276] On the other hand, this disclosure provides a computer device including a memory and a processor. The memory stores at least one computer program, which is loaded and executed by the processor to implement the method provided in any of the above embodiments.

[0277] Figure 10 is a schematic diagram of the structure of a computer device provided in an embodiment of this disclosure. As shown in Figure 1000, the computer device 1000 includes a processor 1001 and a memory 1002.

[0278] Processor 1001 may include one or more processing cores, such as a quad-core processor, an octa-core processor, etc. Processor 1001 may be implemented using at least one hardware form selected from DSP (Digital Signal Processing), FPGA (Field-Programmable Gate Array), and PLA (Programmable Logic Array). Processor 1001 may also include a main processor and a coprocessor. The main processor, also known as a CPU (Central Processing Unit), is used to process data in the wake-up state; the coprocessor is a low-power processor used to process data in the standby state. In some embodiments, processor 1001 may integrate a GPU (Graphics Processing Unit), which is responsible for rendering and drawing the content to be displayed on the screen. In some embodiments, processor 1001 may also include an AI (Artificial Intelligence) processor, which is used to handle computational operations related to machine learning.

[0279] The memory 1002 may include one or more computer-readable storage media, which may be non-transitory. The memory 1002 may also include high-speed random access memory and non-volatile memory, such as one or more disk storage devices or flash memory devices. In some embodiments, the non-transitory computer-readable storage media in the memory 1002 is used to store at least one instruction, which is executed by the processor 1001 to implement the light-emitting element transfer method provided in the embodiments of this disclosure.

[0280] Those skilled in the art will understand that the structure shown in FIG10 does not constitute a limitation on the computer device 1000, and may include more or fewer components than shown, or combine certain components, or employ different component arrangements.

[0281] On the other hand, embodiments of this disclosure provide a computer-readable storage medium storing at least one computer program, which is loaded and executed by a processor to implement the method provided in any of the above embodiments.

[0282] On the other hand, embodiments of this disclosure provide a computer program product, including a computer program / instructions, which, when executed by a processor, implement the method provided in any of the above embodiments.

[0283] In embodiments of this disclosure, the terms "first," "second," "third," and "fourth" are used for descriptive purposes only and should not be construed as indicating or implying relative importance. The term "multiple" refers to two or more unless otherwise expressly defined. "Belonging to A and / or B" indicates the existence of three cases: A, B, and A and B.

[0284] The above description is merely an optional embodiment of this disclosure and is not intended to limit this disclosure. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this disclosure should be included within the protection scope of this disclosure.

Claims

A display module, characterized in that, The system includes at least one display substrate and a driving module, wherein the driving module is used to drive the display substrate to display an image; the display substrate includes a plurality of target light-emitting elements arranged in an array, wherein the plurality of target light-emitting elements are all light-emitting elements on the display substrate having the same emission color; the plurality of target light-emitting elements are divided into M first light-emitting element groups, the M first light-emitting element groups are arranged in an array and each first light-emitting element group includes a plurality of target light-emitting elements, wherein M is an integer greater than 1, and the first light-emitting element group includes a plurality of first sub-light-emitting element groups arranged in an array; the overall fluctuation parameter of the display substrate is less than or equal to 0.05; wherein the overall fluctuation parameter is the standard deviation of the fluctuation parameter within the first group of each first light-emitting element group; the fluctuation parameter within the first group is the standard deviation of the first mean of all first sub-light-emitting element groups in the corresponding first light-emitting element group, and the first mean is the mean of the target optical data of all target light-emitting elements in the corresponding first sub-light-emitting element group. The display module according to claim 1 is characterized in that, All target light-emitting elements on the display substrate are arranged in rows a and columns b, where a and b are both integers greater than 1; all target light-emitting elements in each first sub-light-emitting element group are arranged in rows m and columns n, where a is an integer multiple of m, b is an integer multiple of n, m ranges from 5% to 10% of a, and n ranges from 5% to 100% of b. The display module according to claim 1 or 2 is characterized in that, The target optical data includes at least one of the wavelength, brightness, and chromaticity coordinates of the light emitted by the target light-emitting element; or, mathematical values ​​of at least two of the wavelength, brightness, and chromaticity coordinates of the light emitted by the target light-emitting element. A display device, characterized in that, It includes a display module and a power supply as described in any one of claims 1 to 3, wherein the power supply is used to supply power to the display module. The display device according to claim 4, characterized in that, The display module includes at least two display substrates; the inter-board fluctuation parameter corresponding to the at least two display substrates is less than or equal to 0.25, and the inter-board fluctuation parameter is the standard deviation of the second mean corresponding to the at least two display substrates; the second mean of each display substrate is the mean of the target optical data of the target light-emitting element corresponding to the display substrate. A method for evaluating luminescence effects, characterized in that, include: The process involves acquiring light-emitting element data from a first substrate. The first substrate carries an array of multiple target light-emitting elements, which are all light-emitting elements with the same emission color carried on the first substrate. The light-emitting element data includes target optical data for the multiple target light-emitting elements. The multiple target light-emitting elements are divided into M first light-emitting element groups, which are arranged in an array, with each first light-emitting element group including several target light-emitting elements, where M is an integer greater than 1. Based on the light-emitting element data from the first substrate, a first-group fluctuation parameter is determined for each first light-emitting element group. This first-group fluctuation parameter characterizes the uniformity of the emission effect within the corresponding first light-emitting element group. Based on the fluctuation parameters within the first group of each of the first light-emitting element groups, an overall fluctuation parameter is determined, which is used to characterize the uniformity of the light-emitting effect of all target light-emitting elements on the first substrate. The method according to claim 6, characterized in that, The first light-emitting element group includes a plurality of first sub-light-emitting element groups arranged in an array; the step of determining the first intra-group fluctuation parameter of each first light-emitting element group based on the light-emitting element data of the first substrate includes: for any first light-emitting element group, calculating the first mean of the target optical data of all target light-emitting elements in each first sub-light-emitting element group; and taking the standard deviation of the first mean corresponding to all first sub-light-emitting element groups in the first sub-light-emitting element group as the first intra-group fluctuation parameter of the first sub-light-emitting element group. The method according to claim 7, characterized in that, All target light-emitting elements on the first substrate are arranged in rows a and columns b, where a and b are both integers greater than 1; all target light-emitting elements in each first sub-light-emitting element group are arranged in rows m and columns n, where m ranges from 5% to 10% of a, n ranges from 5% to 100% of b, a is an integer multiple of m, and b is an integer multiple of n. The method according to any one of claims 6 to 8, characterized in that, The overall fluctuation parameter is the first inter-group fluctuation parameter, which is the standard deviation of the first intra-group fluctuation parameter of each of the first light-emitting element groups. The method according to any one of claims 6 to 8, characterized in that, The plurality of target light-emitting elements are divided into N second light-emitting element groups. The N second light-emitting element groups are arranged in an array and the division method is different from that of the M first light-emitting element groups. Each second light-emitting element group includes a plurality of the target light-emitting elements, where N is an integer greater than 1. The method further includes: determining a second group fluctuation parameter for each second light-emitting element group based on the light-emitting element data of the first substrate. The second group fluctuation parameter is used to characterize the uniformity of the light emission effect within the corresponding second light-emitting element group. Determining the overall fluctuation parameter based on the first group fluctuation parameter of each first light-emitting element group includes: determining the overall fluctuation parameter based on the first group fluctuation parameter of each first light-emitting element group and the second group fluctuation parameter of each second light-emitting element group. The method according to claim 10, characterized in that, The step of determining the overall fluctuation parameter based on the first intra-group fluctuation parameter of each first light-emitting element group and the second intra-group fluctuation parameter of each second light-emitting element group includes: determining a first inter-group fluctuation parameter based on the first intra-group fluctuation parameter of each first light-emitting element group, wherein the first inter-group fluctuation parameter is used to characterize the uniformity of the luminous effect among the M first light-emitting element groups; determining a second inter-group fluctuation parameter based on the second intra-group fluctuation parameter of each second light-emitting element group, wherein the second inter-group fluctuation parameter is used to characterize the uniformity of the luminous effect among the N second light-emitting element groups; and determining the overall fluctuation parameter based on the first inter-group fluctuation parameter and the second inter-group fluctuation parameter. The method according to claim 11, characterized in that, Determining the overall fluctuation parameter based on the first inter-group fluctuation parameter and the second inter-group fluctuation parameter includes: performing a weighted calculation on the first inter-group fluctuation parameter and the second inter-group fluctuation parameter to obtain the overall fluctuation parameter. The method according to any one of claims 6 to 9 and claims 11 to 12, characterized in that, The overall fluctuation parameter is determined before the plurality of target light-emitting elements are transferred to the first substrate; or, the overall fluctuation parameter is determined after the plurality of target light-emitting elements are transferred to the first substrate. The method according to any one of claims 6 to 9 and claims 11 to 12, characterized in that, The step of obtaining the light-emitting element data of the first substrate includes: obtaining the light-emitting element data of the second substrate, wherein the light-emitting element data of the second substrate includes optical data and position information of a plurality of light-emitting elements located on the second substrate; determining a first correspondence between the first substrate and the second substrate based on a first transfer algorithm, wherein the first transfer algorithm is used to indicate rules for transferring at least a portion of the light-emitting elements on the second substrate to the second substrate; and determining the light-emitting element data of the first substrate based on the light-emitting element data of the second substrate and the first correspondence. The method according to claim 14, characterized in that, The method further includes: determining whether the uniformity of the light emission effect of the plurality of target light-emitting elements meets the requirements based on the overall fluctuation parameters of the first substrate; if the uniformity meets the requirements, then transferring the plurality of target light-emitting elements from the second substrate to the first substrate according to the first transfer algorithm. The method according to claim 15, characterized in that, The step of determining whether the uniformity of the luminous effect of the plurality of target light-emitting elements meets the requirements based on the overall fluctuation parameters of the first substrate includes: comparing the overall fluctuation parameters of the first substrate with a first threshold; if the overall fluctuation parameters of the first substrate are greater than the first threshold, then determining that the uniformity of the luminous effect of the plurality of target light-emitting elements does not meet the requirements; or, if the overall fluctuation parameters of the first substrate are less than or equal to the first threshold, then determining that the uniformity of the luminous effect of the plurality of target light-emitting elements meets the requirements. The method according to claim 15 is characterized by, The method further includes: if the uniformity does not meet the requirements, adjusting the first transfer algorithm. The method according to any one of claims 6 to 9, 11 to 12, and 15 to 17, is characterized in that, The method further includes: acquiring light-emitting element data of X first substrates, where X is an integer greater than 1; and determining inter-substrate fluctuation parameters based on the light-emitting element data of the X first substrates, wherein the inter-substrate fluctuation parameters are used to characterize the uniformity of the light-emitting effect among the X first substrates. The method according to claim 18, characterized in that, The step of determining the inter-board fluctuation parameter based on the light-emitting element data of X first substrates includes: calculating the second mean of the target optical data of the target light-emitting element corresponding to each first substrate; and using the standard deviation of the second mean corresponding to X first substrates as the inter-board fluctuation parameter. The method according to any one of claims 6 to 9, claims 11 to 12, claims 15 to 17, and claim 19, is characterized in that, The target optical data includes: at least one of the wavelength, brightness, and chromaticity coordinates of the light emitted by the target light-emitting element; or mathematical values ​​of at least two of the wavelength, brightness, and chromaticity coordinates of the light emitted by the target light-emitting element. A device for evaluating luminescence effects, characterized in that, The apparatus includes: a first acquisition module, configured to acquire light-emitting element data of a first substrate, the first substrate being used to carry an array of multiple target light-emitting elements, the multiple target light-emitting elements being all light-emitting elements with the same emission color carried on the first substrate, the light-emitting element data including target optical data of the multiple target light-emitting elements, the multiple target light-emitting elements being divided into M first light-emitting element groups, the M first light-emitting element groups being arrayed and each first light-emitting element group including a plurality of target light-emitting elements, wherein M is an integer greater than 1; a first determination module, configured to determine a first group-specific fluctuation parameter for each light-emitting element group based on the light-emitting element data of the first substrate, the first group-specific fluctuation parameter being used to characterize the uniformity of the emission effect within the corresponding light-emitting element group; and a second determination module, configured to determine an overall fluctuation parameter based on the first group-specific fluctuation parameter for each first light-emitting element group, the overall fluctuation parameter being used to characterize the uniformity of the emission effect of all target light-emitting elements on the first substrate. A computer device, characterized in that, The computer device includes a memory and a processor, wherein the memory stores at least one computer program, which is loaded and executed by the processor to implement the method of any one of claims 6 to 20. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores at least one computer program, which is loaded and executed by a processor to implement the method of any one of claims 6 to 20.

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