Backboard power supply calibration method and system based on multi-channel dynamic compensation

Abstract

The invention discloses a backboard power supply calibration method and system based on multi-channel dynamic compensation, and relates to the technical field of backboard power supply calibration. When an error between a real-time output voltage value corresponding to a far-end load point of the backboard power supply and a standard voltage value is greater than a preset precision threshold value, synchronously performing data acquisition on each channel port, and calculating a real-time local temperature, a reference temperature, a real-time output current value and a resistance temperature coefficient to obtain a line resistance voltage drop; calculating the historical operation parameters and the real-time local temperature in the historical calibration record based on a preset rule to obtain an aging compensation amount; adding the line resistance voltage drop, the aging compensation amount and the standard voltage value, converting the initial target set voltage value into a calibration instruction, and sending the calibration instruction to a corresponding channel port for compensation adjustment; and after the compensation adjustment is completed, verifying the adjusted output value of each channel port. By implementing the technical scheme provided by the invention, the output precision of the backboard power supply in various working conditions is improved.

Description

Technical Field

[0001] This application relates to the field of backplane power supply calibration technology, specifically to a backplane power supply calibration method and system based on multi-channel dynamic compensation. Background Technology

[0002] Backplane power supplies are core power supply units for large electronic systems such as data centers, communication base stations, and high-performance computing. The stability and accuracy of their output voltage directly affect the performance and reliability of the entire system. With the continuous improvement of device integration and power density, increasingly higher requirements are being placed on the refined voltage control and long-term stability maintenance of multi-channel, high-current backplane power supplies.

[0003] In existing technologies, some automatic calibration schemes compensate for voltage drops by deploying voltage sampling at remote load points and combining it with real-time measured current values. These methods typically calculate line voltage drops based on a preset, fixed line resistance model and then superimpose the calculated voltage drop compensation value onto the power supply's output settings, thereby correcting for voltage dips caused by load variations to some extent. In terms of the calibration process, some schemes complete the entire backplane calibration task by sequentially calibrating multiple channels.

[0004] While the aforementioned existing technologies can address the line voltage drop issue, they generally overlook the irreversible aging effects on components and wiring connections caused by the combined effects of continuous electrical stress, thermal stress, and time accumulation during long-term service. This aging causes slow and continuous drift in the equivalent resistance of the line and the parameters of power devices, leading to the gradual failure of compensation models based solely on instantaneous states over time. Consequently, these models cannot effectively compensate for voltage errors caused by long-term cumulative degradation, affecting the accuracy of the backplane power supply output voltage. Summary of the Invention

[0005] This application provides a backplane power supply calibration method and system based on multi-channel dynamic compensation. This method not only solves the problem that traditional fixed compensation models cannot cope with long-term degradation, but also improves the output accuracy of multi-channel backplane power supplies under various operating conditions.

[0006] Firstly, this application provides a backplane power supply calibration method based on multi-channel dynamic compensation. The method includes: real-time voltage monitoring of the remote load points corresponding to multiple channel ports of the backplane power supply; when the error between the monitored real-time output voltage value and the standard voltage value is greater than a preset accuracy threshold, synchronous data acquisition is performed on each channel port to obtain the real-time output current value and acquire the real-time local temperature corresponding to each channel port; a target channel port is obtained from the multiple channel ports, and preset parameters of the target channel port are retrieved, including a reference temperature, a reference resistance value, and a resistance temperature coefficient; the real-time local temperature, reference temperature, reference resistance value, and resistance temperature coefficient are calculated to obtain the line resistance at the current temperature; the line resistance is multiplied by the real-time output current value to obtain the line resistance voltage drop; and the method further includes acquiring the real-time output current value. The historical calibration records of the target channel ports are used to calculate the aging compensation amount based on the historical operating parameters, real-time local temperature, and operating time in the historical calibration records according to preset rules. The line resistance voltage drop is added to the aging compensation amount to obtain the total compensation voltage value. The standard voltage value is added to the total compensation voltage value to obtain the initial target setting voltage value. After completing the calculation of the initial target setting voltage value for all channel ports, the initial target setting voltage value corresponding to each channel port is converted into a calibration command and sent to the corresponding channel port to drive the adjustment circuit of the channel port to perform compensation adjustment. After the compensation adjustment is completed, the adjusted output value of each channel port is collected for verification. If the verification is successful, the historical calibration record is updated and a calibration success message is output. If the verification fails, a calibration failure message is output.

[0007] By adopting the above technical solution, real-time monitoring is performed at the remote load point of the backplane power supply. When the voltage error exceeds the accuracy threshold, multi-channel synchronous data acquisition is triggered to obtain the real-time current and local temperature information of each channel. In terms of line compensation, based on the preset reference temperature, resistance value, and temperature coefficient, combined with the real-time measured local temperature, the actual line resistance under the current operating state is dynamically calculated and multiplied with the real-time current to obtain an accurate line resistance voltage drop. In terms of aging compensation, by analyzing the operating parameters, temperature changes, and cumulative operating time in the historical calibration records, the voltage deviation caused by device and line aging is calculated. The compensation amounts of these two dimensions are superimposed on the standard voltage value to obtain a more accurate target set voltage. A synchronous calibration mode is adopted, and the calibration command is uniformly issued after the compensation calculation of all channels is completed, avoiding the mutual interference between channels that may be caused by traditional sequential calibration. At the same time, the output value after compensation is verified to ensure that the calibration result meets the accuracy requirements, and the accuracy of compensation is continuously optimized by updating the historical records. The above-mentioned dynamic adaptive compensation scheme not only solves the problem that the traditional fixed compensation model cannot cope with long-term degradation, but also improves the output accuracy of the multi-channel backplane power supply under various operating conditions.

[0008] Optionally, based on preset rules, the aging compensation amount is calculated from the historical operating parameters, real-time local temperature, and operating time in the historical calibration records. Specifically, this includes: obtaining the last calibration time and cumulative operating time from the historical calibration records; when the cumulative operating time is less than the predicted activation time threshold, calculating the operating time by comparing the current time with the last calibration time; performing exponential calculations on the real-time local temperature, reference temperature, and temperature acceleration coefficient to obtain the temperature acceleration factor; retrieving the reference current value corresponding to the target channel port, and calculating the current stress factor by comparing the real-time current value and the reference current value; multiplying the basic aging rate, temperature acceleration factor, and current stress factor to obtain the comprehensive aging rate; multiplying the comprehensive aging rate by the operating time to obtain the aging compensation increment; obtaining the historical cumulative aging compensation value from the historical calibration records, and algebraically summing the cumulative aging compensation value and the aging compensation increment to obtain the aging compensation amount.

[0009] By adopting the above technical solution, the actual operating status of the equipment is tracked based on historical calibration records. The accumulated operating time is compared with the predicted activation time threshold to select an appropriate compensation strategy. When calculating the aging compensation amount, the accelerating effect of temperature on device aging is accurately quantified through exponential calculation of real-time temperature and reference temperature. The impact of current stress on equipment lifespan is assessed through comparative analysis of real-time current and reference current. Combining these two factors yields a comprehensive aging rate that better reflects actual aging patterns. The newly added aging compensation increment is reasonably superimposed with historical accumulated values ​​to ensure that the compensation amount accurately reflects the actual degree of equipment degradation. This aging compensation mechanism based on multi-factor coupling not only improves the voltage accuracy of the backplane power supply during long-term operation but also effectively extends the effective service life of the equipment.

[0010] Optionally, after obtaining the last calibration time and cumulative runtime from historical calibration records, the method further includes: when the cumulative runtime is greater than or equal to the predicted activation duration threshold, retrieving the historical local temperature value sequence and historical comprehensive aging rate sequence of the target channel port within a preset time; analyzing the historical local temperature value sequence to obtain the temperature change rate; multiplying the temperature change rate by the calibration time interval to obtain the predicted temperature deviation; multiplying the predicted temperature deviation, resistance temperature coefficient, reference resistance value, and real-time output current value to obtain the temperature prediction compensation component; analyzing the historical comprehensive aging rate sequence to obtain the aging acceleration factor; multiplying the aging acceleration factor, basic aging rate, and calibration time interval to obtain the aging prediction compensation component; weighted summing of the temperature prediction compensation component and the aging prediction compensation component to obtain the prediction compensation increment; and algebraically summing the cumulative aging compensation value, the aging compensation increment, and the prediction compensation increment to obtain the aging compensation amount.

[0011] By adopting the above technical solution, when the equipment's cumulative operating time reaches the predicted activation threshold, trend analysis of historical temperature sequences yields the dynamic characteristics of temperature changes. This is combined with temperature deviation prediction based on the calibration cycle, and the effects of the resistance temperature coefficient, reference resistance value, and real-time current are considered. By analyzing the historical comprehensive aging rate sequence, the acceleration characteristics of the aging process are extracted and combined with the basic aging rate and calibration time interval. Weighted fusion of the temperature prediction compensation component and the aging prediction compensation component ensures both prediction accuracy and a smooth compensation transition. Finally, the predicted compensation increment is integrated with the real-time calculated aging compensation value to form a complete aging compensation amount. This compensation mechanism, based on historical data analysis and trend prediction, can proactively address potential performance deviations in the equipment.

[0012] Optionally, the current stress factor is calculated from the real-time current value and the reference current value. Specifically, this includes: dividing the real-time output current value by the reference current value to obtain the current ratio; determining the current stress index based on the device type of the backplane power supply, and calculating the current ratio and current stress index using a first formula to obtain the basic current stress component; extracting the historical current value sequence within a preset acquisition period from historical calibration records, and calculating the standard deviation and average value of the historical current value sequence; dividing the standard deviation by the average value to obtain the current fluctuation coefficient, and calculating the current fluctuation coefficient using a second formula to obtain the current fluctuation stress component; obtaining the temperature difference between the real-time local temperature and the reference temperature, multiplying the temperature difference by the thermoelectric coupling coefficient, and then performing an exponential calculation to obtain the temperature correction factor; and extracting the historical current value sequence from historical calibration records. Extract the cumulative runtime and historical average current value of the target channel port from the quasi-record; calculate the ratios of the cumulative runtime and historical average current value to the reference runtime and reference current value, respectively, to obtain the runtime ratio and historical current ratio; raise the historical current ratio to the power of the current accumulation exponent to obtain the current accumulation term; raise the runtime ratio to the power of the time accumulation exponent to obtain the time accumulation term; multiply the current accumulation term and the time accumulation term to obtain the load accumulation factor; calculate the load accumulation factor using the third formula to obtain the load historical stress component; multiply the base current stress component and the current fluctuation stress component to obtain the current base term; and perform a weighted summation of the current base term, the temperature correction factor, and the load historical stress component to obtain the current stress factor.

[0013] By employing the above technical solution, the direct impact of current load on the device is reflected based on the stress index related to the current ratio and device characteristics. Analysis of the fluctuation characteristics of historical current sequences effectively captures the impact of load fluctuations on device reliability. Simultaneously, the temperature correction factor reflects the nonlinear accelerating effect of temperature on the device aging rate. By reasonably weighting and combining these stress components, a current stress factor that accurately reflects the actual operating state is obtained, thereby improving the accuracy of backplane power supply aging prediction.

[0014] Optionally, the line resistance at the current temperature is calculated by taking the real-time local temperature, the reference temperature, the reference resistance value, and the temperature coefficient of resistance. Specifically, this includes: calculating the difference between the real-time local temperature and the reference temperature to obtain the temperature difference; multiplying the temperature difference by the temperature coefficient of resistance to obtain the resistance change rate; summing the resistance change rate with the value 1 to obtain the resistance correction factor; and multiplying the resistance correction factor by the reference resistance value to obtain the line resistance at the current temperature.

[0015] By employing the above technical solution, the difference between the real-time temperature and the reference temperature is calculated, accurately reflecting the degree of deviation of the current operating temperature from the standard state. Multiplying this temperature difference by the temperature coefficient of resistance yields the relative rate of change of resistance with temperature, reflecting the sensitivity of temperature to line resistance. By summing the rate of change of resistance with a reference value of 1, a resistance correction factor reflecting the temperature effect is constructed, maintaining the continuity of correction while ensuring the physical meaning of the calculation results. Multiplying the correction factor by the reference resistance value yields the actual line resistance value under the current temperature conditions. This dynamic resistance calculation method based on the temperature effect improves the accuracy of line resistance voltage drop compensation.

[0016] Optionally, the adjusted output values ​​of each channel port are collected for verification. If the verification passes, the historical calibration record is updated, and a calibration success message is output. If the verification fails, a calibration failure message is output. Specifically, this includes: retrieving the initial target setting voltage value sent during the last compensation adjustment of the channel port, and setting the initial target setting voltage value as the reference voltage value for the current iteration cycle; collecting voltage data from the remote load point of the channel port to obtain the calibrated output voltage value; calculating the difference between the calibrated output voltage value and the standard voltage value to obtain the voltage error value; if the absolute value of the voltage error value is less than or equal to a preset accuracy threshold, the verification is considered successful, and the calibration time and initial target setting voltage value are updated to the historical calibration record. The calibration record is updated, and a calibration success message is output. If the absolute value of the voltage error is greater than the preset voltage accuracy threshold, iterative calibration of the backplane power supply is initiated, and the iteration count is obtained from the iterative calibration counter. When the iteration count is greater than the preset iteration count, the verification is deemed to have failed, and calibration failure information containing the target channel port is output. When the iteration count is less than or equal to the preset iteration count, the difference between the reference voltage value and the voltage error value is calculated to obtain the corrected target set voltage value. The corrected target set voltage value is converted into a new calibration command, and the new calibration command is sent to the corresponding channel port to drive the adjustment current to perform a new round of compensation adjustment until the output value after the new round of compensation adjustment is verified.

[0017] By adopting the above technical solution, the target voltage value set during the previous calibration is used as the reference starting point. The output voltage of the remote load point is collected in real time, and the error between the target voltage value and the standard voltage value is calculated. When the error is within the preset accuracy range, the calibration record is updated in a timely manner and the calibration is confirmed to be successful, ensuring the traceability of the calibration process. When the error exceeds the threshold, iterative calibration is initiated, and the target voltage value is dynamically adjusted through error feedback. The corrected calibration command is then reissued to the corresponding channel. Simultaneously, the iteration limit ensures the convergence of the calibration process while avoiding system instability that may result from excessive iteration. This adaptive iterative calibration method based on error feedback not only improves the accuracy of voltage regulation but also enhances the robustness and reliability of the calibration process, effectively improving the overall operation quality and maintenance efficiency of the power supply system.

[0018] Optionally, the initial target setting voltage value corresponding to each target channel port is converted into a calibration command and sent to the corresponding channel port. Specifically, this includes: calculating the initial target setting voltage value according to the preset voltage resolution and data bit width of the target channel port to obtain a digital quantization value; retrieving the device address of the target channel port and obtaining the register address; encapsulating the device address, register address, and digital quantization value according to a preset communication protocol to obtain a data frame; outputting the data frame as a calibration command; and sending the calibration command to the device address of the target channel port based on the internal communication bus of the backplane power supply so that the target channel port can receive and parse the calibration command.

[0019] By adopting the above technical solution, the problems of instruction addressing and data transmission in multi-channel backplane power systems are effectively solved, the execution efficiency and reliability of the calibration process are improved, and a reliable hardware foundation is provided for achieving precise voltage regulation.

[0020] A second aspect of this application provides a backplane power supply calibration system based on multi-channel dynamic compensation. The device includes an acquisition unit, a calculation unit, a transmission unit, and a verification unit. The acquisition unit performs real-time voltage monitoring on the remote load points corresponding to multiple channel ports of the backplane power supply. When the error between the monitored real-time output voltage value and the standard voltage value exceeds a preset accuracy threshold, data is synchronously acquired for each channel port to obtain the real-time output current value and the real-time local temperature corresponding to each channel port. A target channel port is selected from the multiple channel ports, and preset parameters of the target channel port are retrieved. The preset parameters include a reference temperature, a reference resistance value, and a resistance temperature coefficient. The calculation unit calculates the line resistance at the current temperature based on the real-time local temperature, reference temperature, reference resistance value, and resistance temperature coefficient. The line resistance is compared with the real-time output current value. The process involves: multiplying the line resistance voltage drop to obtain the line resistance voltage drop; acquiring the historical calibration record of the target channel port and calculating the aging compensation amount based on the historical operating parameters, real-time local temperature, and operating time in the historical calibration record according to preset rules; adding the line resistance voltage drop to the aging compensation amount to obtain the total compensation voltage value; adding the standard voltage value to the total compensation voltage value to obtain the initial target setting voltage value; the sending unit, after completing the calculation of the initial target setting voltage value for all channel ports, converts the initial target setting voltage value corresponding to each channel port into a calibration command and sends it to the corresponding channel port to drive the adjustment circuit of the channel port to perform compensation adjustment; and the verification unit, after completing the compensation adjustment, collects the adjusted output value of each channel port for verification. If the verification passes, the historical calibration record is updated and a calibration success message is output; if the verification fails, a calibration failure message is output.

[0021] In a third aspect, this application provides an electronic device including a processor, a memory, a user interface, and a network interface. The memory is used to store instructions, the user interface and the network interface are used to communicate with other devices, and the processor is used to execute the instructions stored in the memory, causing the electronic device to perform any of the methods described above in this application.

[0022] In a fourth aspect, this application provides a computer-readable storage medium storing instructions that, when executed, perform any of the methods described above in this application.

[0023] In summary, one or more technical solutions provided in the embodiments of this application have at least the following technical effects or advantages: 1. Real-time monitoring is performed at the remote load point of the backplane power supply. When the voltage error exceeds the accuracy threshold, multi-channel synchronous data acquisition is triggered to obtain real-time current and local temperature information for each channel. For line compensation, based on preset reference temperature, resistance value, and temperature coefficient, combined with the real-time measured local temperature, the actual line resistance under the current operating state is dynamically calculated and multiplied by the real-time current to obtain an accurate line resistance voltage drop. For aging compensation, by analyzing the operating parameters, temperature changes, and cumulative operating time in historical calibration records, the voltage deviation caused by device and line aging is calculated. The compensation amounts from these two dimensions are superimposed on the standard voltage value to obtain a more accurate target voltage setting. A synchronous calibration mode is adopted, and calibration commands are uniformly issued after the compensation calculations for all channels are completed, avoiding the mutual interference between channels that may be caused by traditional sequential calibration. Simultaneously, the compensated output value is verified to ensure that the calibration results meet the accuracy requirements, and the accuracy of compensation is continuously optimized by updating historical records. This dynamic adaptive compensation scheme not only solves the problem that traditional fixed compensation models cannot cope with long-term degradation but also improves the output accuracy of multi-channel backplane power supplies under various operating conditions. Attached Figure Description

[0024] Figure 1 This is a schematic flowchart of a backplane power supply calibration method based on multi-channel dynamic compensation provided in an embodiment of this application; Figure 2 This is a schematic diagram of a backplane power supply calibration system based on multi-channel dynamic compensation provided in an embodiment of this application; Figure 3 This is a schematic diagram of the structure of an electronic device disclosed in an embodiment of this application.

[0025] Explanation of reference numerals in the attached drawings: 201, acquisition unit; 202, calculation unit; 203, transmission unit; 204, verification unit; 300, electronic device; 301, processor; 302, memory; 303, user interface; 304, network interface; 305, communication bus. Detailed Implementation

[0026] To enable those skilled in the art to better understand the technical solutions in this specification, the technical solutions in the embodiments of this specification will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments.

[0027] In the description of the embodiments of this application, the words "for example" or "for instance" are used to indicate examples, illustrations, or explanations. Any embodiment or design that is described as "for example" or "for instance" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design options. Rather, the use of the words "for example" or "for instance" is intended to present the relevant concepts in a specific manner.

[0028] In the description of the embodiments of this application, the term "multiple" means two or more. For example, multiple systems means two or more systems, and multiple screen terminals means two or more screen terminals. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the indicated technical features. Thus, a feature defined with "first" or "second" may explicitly or implicitly include one or more of that feature. The terms "comprising," "including," "having," and variations thereof all mean "including but not limited to," unless otherwise specifically emphasized.

[0029] Therefore, how to address the inability of traditional fixed compensation models to cope with long-term degradation is a pressing issue. This application provides a backplane power supply calibration method based on multi-channel dynamic compensation. Figure 1 This is a flowchart illustrating a backplane power supply calibration method based on multi-channel dynamic compensation provided in an embodiment of this application. (Refer to...) Figure 1 The method includes the following steps S101-S108.

[0030] S101: Real-time voltage monitoring of the remote load points corresponding to multiple channel ports of the backplane power supply. When the error between the monitored real-time output voltage value and the standard voltage value is greater than the preset accuracy threshold, data is synchronously collected from each channel port to obtain the real-time output current value and the real-time local temperature corresponding to each channel port.

[0031] In S101 above, a high-precision ADC / DAC array is integrated at each channel port of the backplane power supply. The ADC acquires the output voltage of the remote load point of each channel port in real time. Simultaneously, high-precision digital temperature sensors are arranged around each channel port, corresponding one-to-one with the channel port, to capture real-time temperature changes in each channel. Taking a server backplane power supply with 32 channel ports as an example, a 24-bit high-precision ADC is first deployed at the remote load point of each channel port for real-time output voltage acquisition. The standard voltage value is preset to 12V, and the preset accuracy threshold is ±0.5%, i.e., ±60mV. A high-precision digital temperature sensor TMP117 is arranged around each channel port, with the sensor no more than 10mm from the port connector to ensure accurate capture of the local temperature of the channel.

[0032] By continuously comparing the error between the real-time output voltage value acquired by the ADC and the preset standard voltage value, a multi-channel synchronous sampling mechanism is immediately triggered when the voltage error of any channel exceeds a preset accuracy threshold, thus initiating the calibration process. This mechanism simultaneously acquires data from all channel ports through the ADC array, obtaining the real-time output current value of each channel, and synchronously reads the corresponding temperature sensor data to obtain the real-time local temperature. For example, when the output voltage of a certain channel is detected to drop to 11.92V, synchronous sampling is immediately performed, recording the real-time output current value of that channel as 20A and the corresponding real-time local temperature as 45.6℃, while simultaneously acquiring the corresponding data from the other 31 channels.

[0033] This threshold-triggered synchronous sampling scheme not only detects voltage deviations promptly but also ensures temporal consistency of data across all channels through parallel acquisition. Simultaneously, the distributed temperature sensor network accurately captures local temperature differences across channels, which is crucial for accurately assessing the impact of temperature on line resistance, thereby improving the accuracy of voltage compensation. This approach overcomes the limitations of traditional single-channel sequential sampling, achieving true parallel calibration and significantly improving calibration efficiency. S102: Obtain the target channel port from multiple channel ports and retrieve the preset parameters of the target channel port.

[0034] In step S102 above, based on the voltage error of each channel port, it is determined whether the channel port requires compensation calibration. Then, the target channel port is identified from the channel ports. At this point, the target channel port can be understood as the target channel port that needs compensation calibration. For each target channel port, its corresponding preset parameters are retrieved from a pre-established parameter database.

[0035] These preset parameters include a reference temperature measured under standard operating conditions (e.g., 25°C), reference resistance values ​​for the backplane power PCB wiring and connectors, and the temperature coefficient of resistance determined by the conductor material properties, with a range of 0.0035-0.004 / °C. These preset parameters form the basis for subsequent temperature compensation and line loss calculations. A database indexing mechanism ensures that each target channel port can quickly retrieve its dedicated set of preset parameters. This parameter management method, based on independent channel configuration, fully considers the parameter differences caused by factors such as physical location, wiring length, and connector type, effectively improving the accuracy of compensation calculations and enabling more precise calibration and adjustment for the characteristics of each target channel port.

[0036] It is important to note that the key parameters involved in this embodiment are determined as follows: the basic aging rate can be determined through accelerated aging experiments, with a value ranging from 10 to 50 ppm / kh; the temperature acceleration coefficient can be determined through device activation energy data, with a value ranging from 0.6 to 0.8 eV; the current fluctuation sensitivity coefficient can be determined based on experimental calibration or historical data, with a value ranging from 0.1 to 0.5; the thermoelectric coupling coefficient is obtained by measuring the slope of the temperature rise versus voltage deviation curve at different currents, with a value ranging from 0.008 to 0.012. These parameters should be adjusted according to the backplane power supply specifications and device type of the actual application; the accelerated aging experiment conditions are: 1.5 times the rated current, 85°C environment, for 1000 hours.

[0037] S103: Calculate the real-time local temperature, reference temperature, reference resistance value, and resistance temperature coefficient to obtain the line resistance at the current temperature; multiply the line resistance by the real-time output current value to obtain the line resistance voltage drop.

[0038] In S103 above, the real-time local temperature, reference temperature, reference resistance value, and resistance temperature coefficient are calculated to obtain the line resistance at the current temperature. Specifically, this includes: calculating the difference between the real-time local temperature and the reference temperature to obtain the temperature difference; multiplying the temperature difference by the resistance temperature coefficient to obtain the resistance change rate; summing the resistance change rate with the value 1 to obtain the resistance correction factor; and multiplying the resistance correction factor by the reference resistance value to obtain the line resistance at the current temperature.

[0039] Specifically, the difference between the real-time local temperature obtained from the temperature sensor and the preset reference temperature is first calculated. This calculation subtracts the reference temperature from the real-time local temperature to obtain a temperature difference value that reflects the degree of deviation of the current operating temperature from the standard operating temperature. Taking the aforementioned 32-channel server backplane power supply as an example, when the real-time local temperature of a certain channel port is detected to be 45.6℃, the preset reference temperature of 25℃ for that channel is retrieved, and the temperature difference is obtained by subtracting the values.

[0040] Furthermore, the calculated temperature difference is multiplied by the temperature coefficient of resistance to obtain the rate of change of resistance. This converts temperature change into a relative change in resistance, reflecting the variation of the conductor material's resistance characteristics at different temperatures. The rate of change of resistance is then added to the value 1 to obtain the resistance correction factor. This calculation method ensures that the correction factor is 1 at the reference temperature, greater than 1 as the temperature increases, and less than 1 as the temperature decreases, guaranteeing the continuity and physical meaning of the correction. This correction mechanism based on 1 ensures that the resistance correction reflects the impact of temperature changes while maintaining the physical rationality of the calculation results. The resistance correction factor is then multiplied by the reference resistance value to obtain the actual line resistance at the current temperature. This step dynamically adjusts the reference resistance value under standard conditions according to real-time temperature conditions to obtain a line resistance value that conforms to actual operating conditions.

[0041] For example, multiplying the calculated temperature difference of 20.6℃ by the temperature coefficient of resistance of the channel (e.g., 0.00393 / ℃ for copper conductors) yields a resistance change rate of 0.081. Adding this resistance change rate of 0.081 to the value 1 gives a resistance correction factor of 1.081. Then, multiplying this resistance correction factor of 1.081 by the reference resistance value of the channel retrieved from the parameter database (e.g., 10mΩ) yields the actual line resistance value of 10.81mΩ at the current temperature of 45.6℃.

[0042] After obtaining the actual line resistance value at the current temperature, the calculated line resistance value is multiplied by the real-time output current value of the target channel port to obtain the actual line resistance voltage drop value. This real-time parameter-based line resistance voltage drop calculation method overcomes the limitations of traditional fixed-parameter compensation. Through real-time temperature correction and dynamic current calculation, it accurately assesses voltage loss under different operating conditions. This calculation process fully considers the influence of temperature on line resistance and the voltage drop fluctuations caused by changes in load current.

[0043] S104: Obtain the historical calibration record of the target channel port, and calculate the aging compensation amount based on the historical operating parameters, real-time local temperature and operating time in the historical calibration record according to the preset rules.

[0044] In step S104 above, the historical calibration records of the target channel port are first retrieved from the historical database. These records contain data such as cumulative runtime, historical average current value, and historical temperature change curves from historical operating parameters. By analyzing the cumulative runtime, a suitable compensation strategy is selected to determine the aging compensation amount. Since temperature prediction compensation mainly addresses short-term temperature fluctuations (hourly level), while aging prediction compensation addresses long-term performance degradation (hundred-hour level), the two have different time scales and therefore require different compensation strategies to determine the aging compensation amount.

[0045] The first method for determining the aging compensation amount involves calculating the aging compensation amount based on preset rules using historical operating parameters, real-time local temperature, and operating time from historical calibration records. Specifically, this includes: obtaining the last calibration time and cumulative operating time from historical calibration records; calculating the operating time by comparing the current time with the last calibration time when the cumulative operating time is less than the predicted activation time threshold; performing exponential calculations on the real-time local temperature, reference temperature, and temperature acceleration coefficient to obtain the temperature acceleration factor; retrieving the reference current value corresponding to the target channel port and calculating the current stress factor by comparing the real-time current value with the reference current value; multiplying the basic aging rate, temperature acceleration factor, and current stress factor to obtain the comprehensive aging rate; multiplying the comprehensive aging rate by the operating time to obtain the aging compensation increment; and obtaining the historical cumulative aging compensation value from historical calibration records and algebraically summing the cumulative aging compensation value with the aging compensation increment to obtain the aging compensation amount.

[0046] Specifically, the last calibration time and cumulative runtime of the target channel port are first obtained. The cumulative runtime is compared with a preset predicted activation duration threshold, such as 1000 hours. When the cumulative runtime is less than the predicted activation duration threshold, the current aging compensation only needs to consider the current device wear. The time difference between the current time and the last calibration time is then calculated to obtain the actual runtime. This step establishes a time reference for subsequent aging compensation calculations. Next, a temperature acceleration calculation module is constructed based on the Arrhenius acceleration model. The real-time local temperature, reference temperature, and temperature acceleration coefficient determined by material properties are substituted into the exponential equation for calculation, yielding a temperature acceleration factor reflecting the accelerating effect of temperature on device aging. This physical model-based calculation method accurately quantifies the nonlinear influence of temperature on device aging. For example, the real-time local temperature of 45.6℃, the reference temperature of 25℃, and the temperature acceleration coefficient of 0.7eV determined by material properties are substituted into the exponential equation for calculation, yielding a temperature acceleration factor reflecting the accelerating effect of temperature on device aging.

[0047] In addition, the reference current value of the target channel port is retrieved from the parameter database, and the current stress factor is calculated by comparing the real-time current value and the reference current value. Specifically, this includes: dividing the real-time output current value by the reference current value to obtain the current ratio; determining the current stress index based on the device type of the backplane power supply, and calculating the current ratio and current stress index using the first formula to obtain the basic current stress component; extracting the historical current value sequence within the preset acquisition period from the historical calibration records, and calculating the standard deviation and average value of the historical current value sequence; dividing the standard deviation by the average value to obtain the current fluctuation coefficient, and calculating the current fluctuation coefficient using the second formula to obtain the current fluctuation stress component; obtaining the temperature difference between the real-time local temperature and the reference temperature, multiplying the temperature difference by the thermoelectric coupling coefficient, and then performing an exponential operation to obtain the temperature... The process involves: 1. Degree correction factor; 2. Extracting the cumulative runtime and historical average current value of the target channel port from historical calibration records; 3. Ratioing the cumulative runtime and historical average current value to the reference runtime and reference current value, respectively, to obtain the runtime ratio and historical current ratio; 4. Exposing the historical current ratio to the power of the current accumulation exponent to obtain the current accumulation term; 5. Exposing the runtime ratio to the power of the time accumulation exponent to obtain the time accumulation term; 6. Multiplying the current accumulation term by the time accumulation term to obtain the load accumulation factor; 7. Calculating the load accumulation factor using the third formula to obtain the historical load stress component; 8. Multiplying the basic current stress component by the current fluctuation stress component to obtain the basic current term; 9. Weighted summing of the basic current term, temperature correction factor, and historical load stress component to obtain the current stress factor.

[0048] Specifically, the real-time output current value is first divided by the reference current value to obtain the current ratio. Then, the corresponding current stress index is retrieved from the preset database by monitoring the device type of the backplane power supply. The current ratio and current stress index are substituted into the first formula for exponentiation to obtain the basic current stress component reflecting the basic current load state. The first formula is as follows: k1 = (Ib) n Where k1 represents the basic current stress component, Ib represents the current ratio, and n represents the current stress exponent; for example, when the real-time output current is 20A, the reference current is 10A, and the current ratio is 2.0, by consulting the characteristics of the MOSFET device used in the backplane power supply, the current stress exponent is determined to be 2.5. Substituting the current ratio and the current stress exponent into the first formula above, the basic current stress component is obtained as 5.66.

[0049] After obtaining the basic current stress component using the first formula, the historical current value sequence within a preset acquisition period is extracted from the historical calibration records. The standard deviation and average value of the historical current value sequence are calculated, and the current fluctuation coefficient is obtained by dividing the standard deviation by the average value. The current fluctuation coefficient and the preset current fluctuation sensitivity coefficient are substituted into the second formula for linear calculation to obtain the current fluctuation stress component reflecting the influence of current fluctuations. This fluctuation assessment method quantifies the impact of current fluctuations on device reliability. The second formula is as follows: k2=1+ka*C, where k2 represents the current fluctuation stress component, ka represents the current fluctuation sensitivity coefficient, the value of ka ranges from 0.1 to 0.5, and C represents the current fluctuation coefficient. For example, if the preset acquisition period is 24 hours, the historical current value sequence within 24 hours is extracted, and the historical current value sequence is calculated to obtain a standard deviation of 2A and an average value of 15A. The standard deviation is then divided by the average value to obtain a current fluctuation coefficient of 0.133. A current fluctuation sensitivity coefficient of 0.3 is selected and substituted into the above second formula to calculate the current fluctuation stress component of 1.04.

[0050] Next, the temperature difference between the real-time local temperature and the reference temperature is obtained. This temperature difference is multiplied by the thermoelectric coupling coefficient and then exponentially calculated to obtain the temperature correction factor. Considering that the operating temperature is directly measured by a real-time temperature sensor, there is no need to calculate the effect of current self-heating. The difference between the measured real-time local temperature and the reference temperature is used as the temperature offset ΔT. Combined with the thermoelectric coupling coefficient kth (typically 0.01), the temperature correction factor is calculated using the exponential function exp(kth×ΔT). The temperature correction factor reflects the nonlinear accelerating effect of temperature on the device aging rate.

[0051] For example, if the real-time local temperature is 45.6℃, calculate the difference of 20.3℃ between the real-time local temperature and the reference temperature of 25℃. Multiply the difference of 20.3℃ by the thermoelectric coupling coefficient of 0.01 and perform an exponential function calculation exp(0.203) = 1.225.

[0052] The cumulative operating time and historical average current value are extracted from historical calibration records. These are then compared with the reference operating time and reference current value to obtain the operating time ratio and historical current ratio, respectively. These ratios are then raised to the power of the current accumulation exponent and the power of the time accumulation exponent, respectively, to obtain the current accumulation term and the time accumulation term. Multiplying these two terms yields the load accumulation factor, which is then substituted into the third formula for logarithmic calculation to obtain the historical load stress component reflecting the influence of historical load. The third formula is as follows: k3 = 1 + k * ln(1 + La), where k3 represents the historical load stress component, k represents the historical load weighting coefficient, and La represents the load accumulation factor. For example, a cumulative operating time of 5000 hours and a historical average current value of 18A are compared with a reference operating time of 1000 hours and a reference current value of 10A, respectively, to obtain an operating time ratio of 5.0 and a historical current ratio of 1.8. The historical current ratio is raised to the power of the current accumulation exponent of 1.5 to obtain a current accumulation term of 2.41, and the runtime ratio is raised to the power of the time accumulation exponent of 0.5 to obtain a time accumulation term of 2.236. Multiplying the two yields a load accumulation factor of 5.389. Substituting this value into the fourth formula above, and setting the historical load weighting coefficient to 0.2, the historical load stress component is calculated to be 1.431. This historical load assessment method effectively considers the impact of long-term use on device performance.

[0053] Finally, the basic current stress component is multiplied by the current fluctuation stress component to obtain the basic current term. This term is then weighted and summed with the thermoelectric coupling factor and the load history stress component according to preset weights to obtain the final current stress factor. In the example above, the basic current stress component is 5.66, the current fluctuation stress component is 1.04, the temperature correction factor is 1.225, and the load history stress component is 1.431. First, the basic current stress component is multiplied by the current fluctuation stress component to obtain the basic current term 5.886. Then, the weights of the basic current term, the temperature correction factor, and the load history stress component are assigned to 0.5, 0.3, and 0.2 respectively, and finally, a weighted sum is performed to obtain the current stress factor 3.6057. This multi-factor comprehensive evaluation method, by considering the influence of multiple dimensions such as current magnitude, fluctuation characteristics, thermal effects, and historical load, achieves a comprehensive quantitative evaluation of current stress.

[0054] Furthermore, after calculating the current stress factor through the above steps, the pre-calibrated base aging rate is multiplied by the calculated temperature acceleration factor and current stress factor to obtain the comprehensive aging rate under the current operating conditions. The base aging rate is selected according to the device type; for MOSFET power devices, a typical value is 10-50 ppm / 1000h. Accelerated aging is calibrated by running the device at 1.5 times the rated current and 85℃ for 1000 hours, measuring the parameter drift rate. This multi-factor comprehensive evaluation method achieves precise quantification of the impact on actual operating conditions. Then, the comprehensive aging rate is multiplied by the running time through the aging increment calculation module to obtain the aging compensation increment within the current calibration cycle. This increment calculation method accurately assesses the degree of impact of the current operating cycle on device performance. The historical aging compensation cumulative value is read from the historical calibration record, and the historical aging compensation cumulative value is algebraically summed with the aging compensation increment calculated in the compensation accumulation module to obtain the final aging compensation amount. This cumulative calculation method achieves continuous tracking and dynamic updating of aging effects.

[0055] The second method for determining the aging compensation amount involves retrieving the historical local temperature value sequence and historical comprehensive aging rate sequence of the target channel port within a preset time period when the cumulative runtime is greater than or equal to the predicted activation duration threshold. The historical local temperature value sequence is analyzed to obtain the temperature change rate. This rate is multiplied by the calibration time interval to obtain the predicted temperature deviation. The predicted temperature deviation, resistance temperature coefficient, reference resistance value, and real-time output current value are multiplied together to obtain the temperature prediction compensation component. The historical comprehensive aging rate sequence is analyzed to obtain the aging acceleration factor. This acceleration factor, the basic aging rate, and the calibration time interval are multiplied together to obtain the aging prediction compensation component. The temperature prediction compensation component and the aging prediction compensation component are weighted and summed to obtain the prediction compensation increment. Finally, the cumulative aging compensation value, the aging compensation increment, and the prediction compensation increment are algebraically summed to obtain the aging compensation amount.

[0056] Specifically, when the cumulative runtime exceeds a preset prediction activation time threshold, a prediction compensation mechanism is activated. First, historical local temperature value sequences and historical comprehensive aging rate sequences for the target channel port within a preset time range are retrieved from the historical database. This historical data provides the basis for subsequent prediction analysis. Linear regression analysis is performed on the historical local temperature value sequences using the time-series analysis module to calculate the temperature change trend over time and obtain the temperature change rate. This rate value is multiplied by the current calibration time interval to obtain the possible temperature deviation in the next calibration cycle. This temperature trend prediction method based on historical data can assess the impact of temperature changes on system performance in advance. The predicted temperature deviation is continuously multiplied by the device's resistance temperature coefficient, reference resistance value, and real-time output current value to obtain the temperature prediction compensation component reflecting the impact of temperature changes. This prediction compensation calculation method considers the comprehensive impact of temperature changes on circuit parameters.

[0057] For example, historical local temperature value sequences and historical comprehensive aging rate sequences from the most recent 168 hours are retrieved, with a sampling interval of 1 hour, yielding 168 sets of temperature data and aging rate data respectively. The least squares method is used to calculate the temperature change rate of the historical local temperature value sequences, resulting in a rate of change of 0.02℃ / hour. Multiplying this rate by the current calibration time interval of 24 hours yields a possible temperature deviation of 0.48℃ for the next calibration cycle. Continuous multiplication of the resistance temperature coefficient (0.0035 / ℃), the reference resistance value (0.1Ω), and the real-time output current value (20A) yields a temperature prediction compensation component of 3.36 × 10⁻⁶. -4 Ω.

[0058] Simultaneously, trend analysis is performed on the historical comprehensive aging rate sequence. By calculating the ratio of aging rates at adjacent time points and performing a weighted average, an aging acceleration factor reflecting the accelerated characteristics of the aging process is obtained. An Exponential Weighted Moving Average (EWMA) algorithm is used, with a weighting coefficient α = 0.3. The calculation formula is: f = α × (Rn / Rn-1) + (1-α) × f1, where f represents the current acceleration factor, Rn represents the current resistance value, Rn-1 represents the previous resistance value, f1 represents the smoothed acceleration factor calculated in the previous time step, and α represents the weighting coefficient. When there are fewer than 10 historical data points, a simple arithmetic average is used. The aging acceleration factor is multiplied by the pre-calibrated baseline aging rate and calibration time interval to obtain the aging prediction compensation component reflecting the aging acceleration effect. This aging prediction method can accurately assess the nonlinear characteristics of device performance degradation. Based on the preset temperature influence weight and aging influence weight, the temperature prediction compensation component and the aging prediction compensation component are weighted and summed to obtain the comprehensive prediction compensation increment. This multi-factor weighted prediction method balances the impact of temperature changes and aging acceleration on system performance.

[0059] For example, with a smoothing coefficient of 0.3 and an aging acceleration factor of 1.15, multiplying the aging acceleration factor by the pre-calibrated baseline aging rate of 0.01% / 1000 hours and the calibration time interval of 24 hours yields an aging prediction compensation component of 2.76 × 10⁻⁶. -6 With a preset weighting of 0.6 for temperature influence and 0.4 for aging influence, the temperature prediction compensation component and the aging prediction compensation component are weighted and summed to obtain a comprehensive prediction compensation increment of 2.016 × 10⁻⁴. 4 .

[0060] Finally, the historically accumulated aging compensation value, the current cycle's aging compensation increment, and the predicted compensation increment are algebraically summed to obtain the final aging compensation amount. This compensation mechanism, encompassing historical, current, and predicted dimensions, achieves comprehensive tracking and predictive compensation of device performance changes. For example, the historically accumulated aging compensation value of 0.002Ω and the current cycle's aging compensation increment of 1.5 × 10⁻⁶Ω are used to calculate the final aging compensation amount. -4 The Ω and the predicted compensation increment are algebraically summed to obtain the final aging compensation amount of 0.002352Ω.

[0061] S105: Add the line resistance voltage drop to the aging compensation amount to obtain the total compensation voltage value.

[0062] In step S105 above, the calculated line resistance voltage drop is obtained from the previous steps. This line resistance voltage drop reflects the voltage loss caused by line resistance. Simultaneously, the calculated aging compensation amount is obtained from the previous steps. This aging compensation amount reflects the performance deviation caused by device aging and temperature changes. A high-precision adder is used to perform algebraic summation on the line resistance voltage drop and the aging compensation amount to obtain the total compensation voltage value reflecting various influencing factors. This voltage compensation calculation method comprehensively considers the physical characteristics of the line itself and the performance degradation during long-term use, achieving a more accurate compensation effect.

[0063] For example, when the line resistance voltage drop is 0.15V and the voltage corresponding to the aging compensation is 0.05V, the total compensation voltage value of 0.20V is obtained through addition. This compensation mechanism can more accurately adjust the output voltage, effectively improving the output accuracy and long-term stability of the backplane power supply.

[0064] S106: Add the standard voltage value to the total compensation voltage value to obtain the initial target set voltage value.

[0065] In step S106 above, a pre-set standard voltage value is retrieved from the parameter database. This value represents the desired output voltage under ideal operating conditions. Simultaneously, the calculated total compensation voltage value is obtained from the previous steps. This value comprehensively reflects the effects of factors such as line losses and component aging. A high-precision calculation unit performs an algebraic summation operation on the standard voltage value and the total compensation voltage value to obtain the initial target voltage setting value that takes into account actual operating conditions. This voltage setting method achieves more accurate voltage output control by combining the standard value under ideal conditions with the compensation value under actual operating conditions.

[0066] For example, when the standard voltage is 12V and the total compensation voltage is 0.20V, the initial target voltage setting value of 12.20V is obtained through addition. This setting mechanism enables the system to accurately set the output target based on various practical influencing factors.

[0067] S107: After completing the calculation of the initial target setting voltage value for all channel ports, the initial target setting voltage value corresponding to each channel port is converted into a calibration command and sent to the corresponding channel port so as to drive the adjustment circuit of the channel port to perform compensation adjustment.

[0068] In S107 above, it is confirmed that the initial target setting voltage values ​​for all channel ports have been calculated, and the integrity and validity of the data are verified by the data inspection module. The initial target setting voltage values ​​corresponding to each target channel port are converted into calibration instructions and sent to the corresponding channel ports. Specifically, this includes: calculating the initial target setting voltage values ​​according to the preset voltage resolution and data bit width of the target channel port to obtain digital quantization values; retrieving the device address of the target channel port and obtaining the register address; encapsulating the device address, register address, and digital quantization values ​​according to the preset communication protocol to obtain a data frame; outputting the data frame as a calibration instruction; and sending the calibration instruction to the device address of the target channel port based on the internal communication bus of the backplane power supply so that the target channel port can receive and parse the calibration instruction.

[0069] Specifically, the initial target voltage setting value in floating-point format first needs to be converted into a digital value that meets the hardware requirements. The preset voltage resolution (e.g., 0.1mV / LSB) and data bit width (e.g., 16 bits) of the target channel port are retrieved from the parameter configuration library. The initial target voltage setting value is then divided by the voltage resolution and rounded down by the numerical calculation unit to obtain the corresponding digital quantization value. For example, when the initial target voltage setting value is 12.20V, the calculated digital quantization value is 122000 (corresponding to 12.20V / 0.1mV). This quantization process ensures that the voltage setting value can be accurately recognized and executed by the hardware.

[0070] The system retrieves the device address (e.g., 0x32) of the target channel port from the device configuration table and obtains the corresponding register address (e.g., 0x4A) based on the function type. The system organizes this information according to a preset communication protocol (e.g., Modbus-RTU), arranging the device address, register address, digital quantization value, and verification information sequentially according to the protocol requirements to construct a complete data frame. Specifically, it first fills in the frame start flag, then sequentially adds the device address, function code (e.g., 0x06 indicates writing to a single register), high byte of register address, low byte of register address, high byte of data, and low byte of data. Finally, it calculates and adds a CRC checksum to form a complete calibration command. For example, when the initial target voltage setting value of a channel port is 12.20V, it is converted into a 16-bit precision digital value and encapsulated into an instruction packet containing the channel port address information. This standardized instruction encapsulation method ensures the reliability and compatibility of data transmission. The converted calibration command is sent sequentially to the adjustment circuits of each channel port according to a preset priority order through the communication interface module, which refers to the internal communication bus such as the RS485 bus. After receiving the calibration command, the adjustment circuit performs the actual compensation adjustment operation through internal digital-to-analog converters and operational amplifiers. This command conversion and transmission mechanism ensures that the compensation data is accurately transmitted to the execution end and effectively executed.

[0071] When sending calibration commands to each channel port, the idle state of the communication bus is checked first, and then the bit stream in the data frame is sent sequentially according to a preset baud rate (e.g., 115200bps). During transmission, the communication status is monitored and response information is recorded to ensure that the command is correctly received. When the target channel port receives the calibration command, its internal communication processing unit performs a CRC check and determines whether a response is needed based on the device address. If the check passes and the address matches, the command content is parsed and the digital quantization value is written to the corresponding control register, thereby achieving voltage adjustment. This command transmission mechanism based on a standard communication bus enables reliable multi-channel parallel control.

[0072] S108: After the compensation adjustment is completed, the adjusted output values ​​of each channel port are collected for verification. If the verification is successful, the historical calibration record is updated and the calibration success message is output; if the verification fails, the calibration failure message is output.

[0073] In S108 above, all channel ports undergo compensation adjustment based on calibration instructions. After confirming that the compensation adjustment has been completed, the calibration results need to be verified to ensure the effectiveness of the compensation adjustment. The adjusted output values ​​of each channel port are collected for verification. If the verification passes, the historical calibration record is updated and calibration success information is output. If the verification fails, calibration failure information is output. Specifically, this includes: retrieving the initial target setting voltage value sent when the channel port was last compensated and adjusted, and determining the initial target setting voltage value as the reference voltage value for the current iteration cycle; collecting the voltage at the remote load point of the channel port to obtain the calibrated output voltage value; calculating the difference between the calibrated output voltage value and the standard voltage value to obtain the voltage error value; if the absolute value of the voltage error value is less than or equal to the preset accuracy threshold, the verification is deemed to have passed, the calibration time and the initial target setting voltage value are updated in the historical calibration record, and calibration success information is output.

[0074] Specifically, the current target set voltage value is obtained as the reference voltage value. If the current target set voltage value is for the first calibration, the reference voltage value is the initial target set voltage value calculated for the first time; if the current target set voltage value is for iterative calibration, the reference voltage value is the initial target set voltage value of the previous compensation adjustment. If it is determined to be iterative calibration, the initial target set voltage value sent during the previous compensation adjustment is retrieved from the historical data cache and used as the reference voltage value for the current iteration cycle. This reference value setting method provides an initial reference point for subsequent iterative optimization. For example, when the previous voltage value of a certain channel was 12.20V, it is set as the reference voltage value for the current iteration cycle. High-precision voltage acquisition is performed on the remote load point of the channel port through a remote sampling circuit. The sampling circuit uses a 24-bit ADC with a sampling rate set to 10kHz, continuously acquiring 1000 data points for each channel. Sampling noise is eliminated through a Kalman filter algorithm, and the calibrated output voltage value is finally obtained. The difference between this output value and the preset standard voltage value is calculated to obtain the voltage error value reflecting the calibration effect. The calibration verification is considered successful when the absolute value of the calculated voltage error is less than or equal to the preset accuracy threshold. For example, if the standard voltage value is 12V, the currently acquired standard output voltage value is 11.99V, and the preset accuracy threshold is set to 0.01V, the absolute value of the voltage error is less than the preset accuracy threshold, and the calibration verification is considered successful.

[0075] The current timestamp and initial target voltage setting value are written into the historical calibration record table in the non-volatile memory, and a calibration success message containing information such as channel number and calibration result is sent to the control terminal through the communication interface.

[0076] Furthermore, if the absolute value of the voltage error is greater than the preset voltage accuracy threshold, iterative calibration of the backplane power supply is initiated, and the iteration count is obtained from the iterative calibration counter. When the iteration count is greater than the preset iteration count, the verification is deemed to have failed, and calibration failure information containing the target channel port is output. When the iteration count is less than or equal to the preset iteration count, the difference between the reference voltage value and the voltage error value is calculated to obtain the corrected target set voltage value. The corrected target set voltage value is converted into a new calibration command, and the new calibration command is sent to the corresponding channel port to drive the adjustment current to perform a new round of compensation adjustment until the output value after the new round of compensation adjustment is verified.

[0077] Specifically, if the absolute value of the voltage error exceeds a preset accuracy threshold, an iterative calibration process will be initiated. First, the current iteration count is read from the iterative calibration counter and compared with the preset maximum iteration count. The preset iteration count can be set to 5. When the iteration count exceeds the preset limit, calibration is deemed a failure, and a calibration failure report containing detailed information such as the channel number, reason for failure, and error value is generated. When the iteration count does not exceed the preset limit, the difference between the reference voltage value and the voltage error value is calculated to obtain the corrected target voltage setting value. For example, when the reference voltage value is 12.20V and the voltage error value is 0.05V, the corrected target voltage setting value is 12.15V. Then, the instruction conversion module is called to convert the corrected target voltage setting value into a new calibration instruction according to a preset communication protocol. The conversion process includes digital quantization, protocol encapsulation, and CRC verification steps to ensure the accuracy and reliability of the instruction.

[0078] The newly generated calibration command is sent to the corresponding channel port via the internal communication bus, driving its adjustment circuit to perform a new round of compensation adjustment. After adjustment, the output is resampled and verified, and this cycle continues until verification is successful or the preset number of iterations is reached. This iterative calibration system achieves high-precision control of the voltage output through accurate error assessment and dynamic parameter adjustment. High-precision sampling and advanced filtering algorithms ensure the accuracy of the measurement results.

[0079] This application also provides a backplane power supply calibration system based on multi-channel dynamic compensation. Figure 2 This is a schematic diagram of a backplane power supply calibration system based on multi-channel dynamic compensation provided in an embodiment of this application. (Refer to...) Figure 2 The device includes an acquisition unit 201, a calculation unit 202, a transmission unit 203, and a verification unit 204. The acquisition unit 201 performs real-time voltage monitoring on the remote load points corresponding to multiple channel ports of the backplane power supply. When the error between the monitored real-time output voltage value and the standard voltage value is greater than the preset accuracy threshold, data is synchronously acquired for each channel port to obtain the real-time output current value and the real-time local temperature corresponding to each channel port. The target channel port is obtained from the multiple channel ports, and the preset parameters of the target channel port are retrieved. The preset parameters include reference temperature, reference resistance value and resistance temperature coefficient. The calculation unit 202 calculates the line resistance at the current temperature based on the real-time local temperature, reference temperature, reference resistance value, and resistance temperature coefficient; multiplies the line resistance by the real-time output current value to obtain the line resistance voltage drop; acquires the historical calibration record of the target channel port, and calculates the aging compensation amount based on the historical operating parameters, real-time local temperature, and operating time in the historical calibration record according to preset rules; adds the line resistance voltage drop to the aging compensation amount to obtain the total compensation voltage value; and adds the standard voltage value to the total compensation voltage value to obtain the initial target setting voltage value. After completing the calculation of the initial target setting voltage value for all channel ports, the transmitting unit 203 converts the initial target setting voltage value corresponding to each channel port into a calibration command and sends it to the corresponding channel port so as to drive the adjustment circuit of the channel port to perform compensation adjustment. After the compensation adjustment is completed, the verification unit 204 collects the adjusted output values ​​of each channel port for verification. If the verification is successful, the historical calibration record is updated and the calibration success information is output; if the verification fails, the calibration failure information is output.

[0080] In one possible implementation, the acquisition unit 201 is used to acquire the last calibration time and cumulative runtime from historical calibration records. When the cumulative runtime is less than the predicted activation duration threshold, the current time and the last calibration time are calculated to obtain the runtime. The calculation unit 202 is used to perform exponential calculation on the real-time local temperature, reference temperature, and temperature acceleration coefficient to obtain the temperature acceleration factor. The reference current value corresponding to the target channel port is retrieved, and the real-time current value and the reference current value are calculated to obtain the current stress factor. The basic aging rate, temperature acceleration factor, and current stress factor are multiplied to obtain the comprehensive aging rate. The comprehensive aging rate is multiplied by the runtime to obtain the aging compensation increment. The historical aging compensation cumulative value is acquired from historical calibration records, and the aging compensation cumulative value and the aging compensation increment are algebraically summed to obtain the aging compensation amount.

[0081] In one possible implementation, the acquisition unit 201 is used to retrieve the historical local temperature value sequence and historical comprehensive aging rate sequence of the target channel port within a preset time when the cumulative runtime is greater than or equal to the predicted activation duration threshold; the calculation unit 202 is used to analyze the historical local temperature value sequence to obtain the temperature change rate; multiply the temperature change rate by the calibration time interval to obtain the predicted temperature deviation; multiply the predicted temperature deviation, the resistance temperature coefficient, the reference resistance value, and the real-time output current value to obtain the temperature prediction compensation component; analyze the historical comprehensive aging rate sequence to obtain the aging acceleration factor; multiply the aging acceleration factor, the basic aging rate, and the calibration time interval to obtain the aging prediction compensation component; perform a weighted summation of the temperature prediction compensation component and the aging prediction compensation component to obtain the prediction compensation increment; and perform algebraic summation of the cumulative aging compensation value, the aging compensation increment, and the prediction compensation increment to obtain the aging compensation amount.

[0082] In one possible implementation, the calculation unit 202 is used to divide the real-time output current value by the reference current value to obtain the current ratio; determine the current stress index according to the device type of the backplane power supply, and calculate the current ratio and current stress index using a first formula to obtain the basic current stress component; the acquisition unit 201 is used to extract the historical current value sequence within a preset acquisition period from the historical calibration record, and calculate the standard deviation and average value of the historical current value sequence; the calculation unit 202 is used to divide the standard deviation by the average value to obtain the current fluctuation coefficient, and calculate the current fluctuation coefficient using a second formula to obtain the current fluctuation stress component; acquire the temperature difference between the real-time local temperature and the reference temperature, multiply the temperature difference by the thermoelectric coupling coefficient, and perform an exponential operation to obtain the temperature correction factor; from historical The calibration record extracts the cumulative runtime and historical average current value of the target channel port; the cumulative runtime and historical average current value are compared with the reference runtime and reference current value respectively to obtain the runtime ratio and historical current ratio; the historical current ratio is raised to the power of the current accumulation exponent to obtain the current accumulation term; the runtime ratio is raised to the power of the time accumulation exponent to obtain the time accumulation term; the current accumulation term is multiplied by the time accumulation term to obtain the load accumulation factor; the load accumulation factor is calculated using the third formula to obtain the load historical stress component; the base current stress component is multiplied by the current fluctuation stress component to obtain the current base term; the current base term, temperature correction factor, and load historical stress component are weighted and summed to obtain the current stress factor.

[0083] In one possible implementation, the calculation unit 202 is used to calculate the difference between the real-time local temperature and the reference temperature to obtain the temperature difference; multiply the temperature difference by the resistance temperature coefficient to obtain the resistance change rate; sum the resistance change rate with the value 1 to obtain the resistance correction factor; and multiply the resistance correction factor by the reference resistance value to obtain the line resistance at the current temperature.

[0084] In one possible implementation, the acquisition unit 201 is used to retrieve the initial target setting voltage value sent during the last compensation adjustment of the channel port, and determine the initial target setting voltage value as the reference voltage value for the current iteration cycle; to collect voltage data at the remote load point of the channel port to obtain the calibrated output voltage value; the calculation unit 202 is used to calculate the difference between the calibrated output voltage value and the standard voltage value to obtain the voltage error value; the verification unit 204 is used to determine that the verification is successful if the absolute value of the voltage error value is less than or equal to a preset accuracy threshold, update the calibration time and the initial target setting voltage value to the historical calibration record, and output calibration success information. If the absolute value of the voltage error is greater than the preset voltage accuracy threshold, iterative calibration of the backplane power supply is initiated, and the iteration count is obtained from the iterative calibration counter. When the iteration count is greater than the preset iteration count, the verification is deemed to have failed, and calibration failure information containing the target channel port is output. When the iteration count is less than or equal to the preset iteration count, the difference between the reference voltage value and the voltage error value is calculated to obtain the corrected target set voltage value. The corrected target set voltage value is converted into a new calibration command, and the new calibration command is sent to the corresponding channel port to drive the adjustment current to perform a new round of compensation adjustment until the output value after the new round of compensation adjustment is verified.

[0085] In one possible implementation, the calculation unit 202 is used to calculate the initial target set voltage value according to the preset voltage resolution and data bit width of the target channel port to obtain a digital quantization value; retrieve the device address of the target channel port and obtain the register address; encapsulate the device address, register address and digital quantization value according to a preset communication protocol to obtain a data frame; and output the data frame as a calibration instruction. The sending unit 203 is used to send the calibration instruction to the device address of the target channel port based on the internal communication bus of the backplane power supply so that the target channel port can receive and parse the calibration instruction.

[0086] It should be noted that the system provided in the above embodiments is only illustrated by the division of the above functional modules. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. In addition, the system and method embodiments provided in the above embodiments belong to the same concept, and the specific implementation process can be found in the method embodiments, which will not be repeated here.

[0087] This application also discloses an electronic device. (See reference...) Figure 3 , Figure 3 This application provides a schematic diagram of the structure of an electronic device. The electronic device 300 may include: at least one processor 301, at least one network interface 304, a user interface 303, a memory 302, and at least one communication bus 305.

[0088] The communication bus 305 is used to enable communication between these components.

[0089] The user interface 303 may include a display screen and a camera. Optionally, the user interface 303 may also include a standard wired interface and a wireless interface.

[0090] The network interface 304 may optionally include a standard wired interface or a wireless interface (such as a Wi-Fi interface).

[0091] The processor 301 may include one or more processing cores. The processor 301 connects to various parts of the server using various interfaces and lines, and performs various server functions and processes data by running or executing instructions, programs, code sets, or instruction sets stored in memory 302, and by calling data stored in memory 302. Optionally, the processor 301 may be implemented using at least one hardware form of Digital Signal Processing (DSP), Field-Programmable Gate Array (FPGA), or Programmable Logic Array (PLA). The processor 301 may integrate one or a combination of several of the following: Central Processing Unit (CPU), Graphics Processing Unit (GPU), and modem. The CPU primarily handles the operating system, user interface, and application requests; the GPU is responsible for rendering and drawing the content required for display; and the modem handles wireless communication. It is understood that the modem may also not be integrated into the processor 301 and may be implemented as a separate chip.

[0092] The memory 302 may include random access memory (RAM) or read-only memory. Optionally, the memory 302 may include a non-transitory computer-readable storage medium. The memory 302 may be used to store instructions, programs, code, code sets, or instruction sets. The memory 302 may include a program storage area and a data storage area. The program storage area may store instructions for implementing an operating system, instructions for at least one function (such as touch functionality, sound playback functionality, image playback functionality, etc.), instructions for implementing the various method embodiments described above, etc. The data storage area may store data involved in the various method embodiments described above. Optionally, the memory 302 may also be at least one storage device located remotely from the aforementioned processor 301.

[0093] like Figure 3 As shown, the memory 302, which serves as a computer storage medium, may include an operating system, a network communication module, a user interface module, and an application program for backplane power calibration based on multi-channel dynamic compensation.

[0094] exist Figure 3In the electronic device 300 shown, the user interface 303 is mainly used to provide an interface for users to input data and obtain user input data; while the processor 301 can be used to call the application program based on multi-channel dynamic compensation backplane power calibration stored in the memory 302. When executed by one or more processors, the electronic device performs one or more of the methods described in the above embodiments.

[0095] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that this application is not limited to the described order of actions, as some steps may be performed in other orders or simultaneously according to this application. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions and modules involved are not necessarily essential to this application.

[0096] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0097] In the several embodiments provided in this application, it should be understood that the disclosed apparatus can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the displayed or discussed mutual couplings, direct couplings, or communication connections may be through some service interfaces; indirect couplings or communication connections between devices or units may be electrical or other forms.

[0098] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0099] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0100] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage device (CMD). Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a memory and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned memory includes various media capable of storing program code, such as USB flash drives, portable hard drives, magnetic disks, or optical disks.

[0101] The above description is merely an exemplary embodiment of this disclosure and should not be construed as limiting the scope of this disclosure. Any equivalent changes and modifications made in accordance with the teachings of this disclosure shall still fall within the scope of this disclosure. Those skilled in the art will readily conceive of other embodiments of this disclosure upon considering the specification and the disclosure of practical truths. This application is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not described in this disclosure.

Claims

1. A backplane power supply calibration method based on multi-channel dynamic compensation, characterized in that, The method includes: Real-time voltage monitoring is performed on the remote load points corresponding to multiple channel ports of the backplane power supply. When the error between the monitored real-time output voltage value and the standard voltage value is greater than the preset accuracy threshold, data is synchronously collected for each channel port to obtain the real-time output current value and the real-time local temperature corresponding to each channel port. Obtain the target channel port from the plurality of channel ports, and retrieve the preset parameters of the target channel port, the preset parameters including reference temperature, reference resistance value and resistance temperature coefficient; The line resistance at the current temperature is obtained by calculating the real-time local temperature, the reference temperature, the reference resistance value, and the resistance temperature coefficient. Multiply the line resistance by the real-time output current value to obtain the line resistance voltage drop; Obtain the historical calibration record of the target channel port, and calculate the aging compensation amount based on the historical operating parameters, real-time local temperature and operating time in the historical calibration record according to the preset rules; Add the line resistance voltage drop to the aging compensation amount to obtain the total compensation voltage value; The standard voltage value is added to the total compensation voltage value to obtain the initial target voltage setting value; After calculating the initial target setting voltage value for all the channel ports, the initial target setting voltage value corresponding to each of the channel ports is converted into a calibration command and sent to the corresponding channel port to drive the adjustment circuit of the channel port to perform compensation adjustment. After the compensation adjustment is completed, the adjusted output values ​​of each channel port are collected for verification. If the verification is successful, the historical calibration record is updated and calibration success information is output; if the verification fails, calibration failure information is output.

2. The method according to claim 1, characterized in that, The calculation of the aging compensation amount based on the historical operating parameters, real-time local temperature, and operating time in the historical calibration record according to preset rules specifically includes: The last calibration time and cumulative runtime are obtained from the historical calibration records. When the cumulative runtime is less than the predicted activation duration threshold, the current time and the last calibration time are calculated to obtain the runtime. The real-time local temperature, the reference temperature, and the temperature acceleration coefficient are exponentially calculated to obtain the temperature acceleration factor. The reference current value corresponding to the target channel port is retrieved, and the current stress factor is obtained by calculating the real-time current value and the reference current value. The comprehensive aging rate is obtained by multiplying the base aging rate, the temperature acceleration factor, and the current stress factor. Multiply the overall aging rate by the running time to obtain the aging compensation increment; The historical aging compensation cumulative value is obtained from the historical calibration record, and the aging compensation amount is obtained by algebraically summing the aging compensation cumulative value and the aging compensation increment.

3. The method according to claim 2, characterized in that, After obtaining the last calibration time and cumulative runtime from the historical calibration records, the method further includes: When the cumulative runtime is greater than or equal to the predicted activation duration threshold, retrieve the historical local temperature value sequence and historical comprehensive aging rate sequence of the target channel port within a preset time. The rate of temperature change is obtained by analyzing the historical local temperature value sequence. Multiplying the rate of temperature change by the calibration time interval yields the predicted temperature deviation. The predicted temperature deviation, the temperature coefficient of resistance, the reference resistance value, and the real-time output current value are multiplied to obtain the temperature prediction compensation component. The historical comprehensive aging rate sequence was analyzed to obtain the aging acceleration factor; The aging acceleration factor, the base aging rate, and the calibration time interval are multiplied to obtain the aging prediction compensation component. The predicted compensation component of temperature and the predicted compensation component of aging are weighted and summed to obtain the predicted compensation increment. The aging compensation amount is obtained by algebraically summing the cumulative aging compensation value, the incremental aging compensation, and the predicted incremental compensation.

4. The method according to claim 2, characterized in that, The calculation of the current stress factor based on the real-time current value and the reference current value specifically includes: Divide the real-time output current value by the reference current value to obtain the current ratio. The current stress index is determined based on the device type of the backplane power supply. The current ratio and the current stress index are calculated using the first formula to obtain the basic current stress component. Extract the historical current value sequence within the preset acquisition period from the historical calibration record, and calculate the standard deviation and average value of the historical current value sequence; divide the standard deviation by the average value to obtain the current fluctuation coefficient, and calculate the current fluctuation stress component by the second formula; The temperature difference between the real-time local temperature and the reference temperature is obtained, and the temperature difference is multiplied by the thermoelectric coupling coefficient and then exponentially calculated to obtain the temperature correction factor. Extract the cumulative runtime and historical average current value of the target channel port from the historical calibration records; calculate the ratio of the cumulative runtime and the historical average current value to the reference runtime and the reference current value, respectively, to obtain the runtime ratio and the historical current ratio; The historical current ratio is raised to the power of the current accumulation exponent to obtain the current accumulation term; The runtime ratio is raised to the power of the time accumulation exponent to obtain the time accumulation term; Multiply the current accumulation term by the time accumulation term to obtain the load accumulation factor. Calculate the load accumulation factor using the third formula to obtain the load history stress components. Multiplying the basic current stress component by the current fluctuation stress component yields the basic current term; The current stress factor is obtained by weighted summing of the current base term, the temperature correction factor, and the load history stress components.

5. The method according to claim 1, characterized in that, The calculation of the line resistance at the current temperature based on the real-time local temperature, the reference temperature, the reference resistance value, and the temperature coefficient of resistance specifically includes: The temperature difference is calculated by comparing the real-time local temperature with the reference temperature. Multiplying the temperature difference by the temperature coefficient of resistance yields the rate of change of resistance; The resistance change rate is summed with the value 1 to obtain the resistance correction factor; The line resistance at the current temperature is obtained by multiplying the resistance correction factor by the reference resistance value.

6. The method according to claim 1, characterized in that, The adjusted output values ​​of each of the channel ports are collected and verified. If the verification is successful, the historical calibration record is updated and calibration success information is output. If the verification fails, a calibration failure message will be output, including: Retrieve the initial target setting voltage value sent during the last compensation adjustment of the channel port, and determine the initial target setting voltage value as the reference voltage value for the current iteration cycle; Voltage is acquired at the remote load point of the channel port to obtain a calibrated output voltage value; the difference between the calibrated output voltage value and the standard voltage value is calculated to obtain a voltage error value. If the absolute value of the voltage error is less than or equal to the preset accuracy threshold, the verification is deemed successful, the calibration time and the initial target voltage value are updated in the historical calibration record, and the calibration success information is output. If the absolute value of the voltage error is greater than the preset voltage accuracy threshold, then iterative calibration of the backplane power supply is initiated, and the number of iterations is obtained from the iterative calibration counter. When the number of iterations exceeds the preset number of iterations, the verification is deemed to have failed, and calibration failure information containing the target channel port is output. When the number of iterations is less than or equal to the preset number of iterations, the difference between the reference voltage value and the voltage error value is calculated to obtain the corrected target set voltage value; The corrected target set voltage value is converted into a new calibration command, and the new calibration command is sent to the corresponding channel port to drive the adjustment current to perform a new round of compensation adjustment until the output value after the new round of compensation adjustment is verified.

7. The method according to claim 1, characterized in that, The step of converting the initial target setting voltage value corresponding to each of the target channel ports into a calibration command and sending it to the corresponding channel port specifically includes: The initial target set voltage value is calculated based on the preset voltage resolution and data bit width of the target channel port to obtain a digital quantization value; The device address of the target channel port is retrieved, and the register address is obtained. The device address, the register address, and the digital quantization value are encapsulated according to a preset communication protocol to obtain a data frame. The data frame is then output as the calibration command. The calibration command is sent to the device address of the target channel port via the internal communication bus of the backplane power supply, so that the target channel port can receive and parse the calibration command.

8. A backplane power supply calibration system based on multi-channel dynamic compensation, characterized in that, The device includes an acquisition unit, a calculation unit, a transmission unit, and a verification unit. The acquisition unit performs real-time voltage monitoring on the remote load points corresponding to multiple channel ports of the backplane power supply. When the error between the monitored real-time output voltage value and the standard voltage value is greater than a preset accuracy threshold, data is synchronously collected from each of the channel ports to obtain the real-time output current value and the real-time local temperature corresponding to each channel port. The target channel port is obtained from the multiple channel ports, and the preset parameters of the target channel port are retrieved. The preset parameters include reference temperature, reference resistance value and resistance temperature coefficient. The calculation unit calculates the line resistance at the current temperature based on the real-time local temperature, the reference temperature, the reference resistance value, and the resistance temperature coefficient; and multiplies the line resistance by the real-time output current value to obtain the line resistance voltage drop. Obtain the historical calibration record of the target channel port, and calculate the aging compensation amount based on the historical operating parameters, real-time local temperature and operating time in the historical calibration record according to the preset rules; Add the line resistance voltage drop to the aging compensation amount to obtain the total compensation voltage value; The standard voltage value is added to the total compensation voltage value to obtain the initial target voltage setting value; After completing the calculation of the initial target setting voltage value for all the channel ports, the transmitting unit converts the initial target setting voltage value corresponding to each of the channel ports into a calibration command and sends it to the corresponding channel port so as to drive the adjustment circuit of the channel port to perform compensation adjustment. After completing the compensation adjustment, the verification unit collects the adjusted output values ​​of each channel port for verification. If the verification passes, the historical calibration record is updated and calibration success information is output; if the verification fails, calibration failure information is output.

9. An electronic device, characterized in that, The device includes a processor, a memory, a user interface, and a network interface. The memory is used to store instructions, the user interface and the network interface are used to communicate with other devices, and the processor is used to execute the instructions stored in the memory to cause the electronic device to perform the method as described in any one of claims 1-7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores instructions that, when executed, perform the method as described in any one of claims 1-7.

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