High-speed cable error code testing machine

Abstract

The invention provides a high-speed cable error code testing machine, and relates to the technical field of high-speed cable testing. A first test board of the test box is used for generating and / or receiving a high-speed test signal, a first signal connector of the MCB device is electrically connected with a second signal connector through a second test board, and the second signal connector is connected with a to-be-tested piece. The high-speed cable module is provided with a plurality of signal channels and comprises a cable body, a third signal connector and a fourth signal connector, the third signal connector is connected with the first test board, and the fourth signal connector is connected with the first signal connector. According to the technical scheme, multi-channel and high-density high-speed signal transmission is realized by adopting the high-speed cable module with a plurality of signal channels, and the MCB device is arranged to switch and match the high-speed signal, so that the multi-channel high-speed signal can be reliably accessed to the to-be-tested piece. When the MCB device reaches the service life or breaks down, only the MCB device needs to be replaced, cost is low, and operation is easy.

Description

Technical Field

[0001] This invention relates to the field of high-speed cable testing technology, and in particular to a high-speed cable bit error rate tester. Background Technology

[0002] Bit Error Rate Testers (BERTs) are currently mainly used in testing scenarios for high-speed passive devices and optical modules, and the number of channels tested is relatively small.

[0003] With the development of artificial intelligence technology, the demand for high-speed interconnects in computing centers and data centers continues to grow. Influenced by factors such as energy consumption, cost, and port density, short-distance high-speed signal transmission is gradually showing a trend of replacing optical fibers with copper cables. In the production and testing of passive high-speed cables, to meet the testing requirements of multi-channel, high-speed operations, error rate testing equipment with high channel density and high transmission rate capabilities is needed to perform error rate testing on high-speed cables.

[0004] In existing technologies, there are two main methods for bit error rate testing of high-speed cables: The first method involves fanning out high-speed signals using high-speed cables. One end of the high-speed cable is connected to a bit error rate tester (BERT), and the other end is connected to the connector of the device under test (DUT). Signal matching is achieved through jumpers. In this method, the cable manufacturing and testing process is relatively complex, and different high-speed cables with different wiring sequences need to be customized for different DUTs, resulting in a high unit price for the cables and significantly increasing production and testing costs as consumables.

[0005] The second method uses a coaxial board-to-board connector to achieve high-speed signal fan-out. However, this method suffers from significant signal transmission loss and requires high precision in the machining of the PCB board frame and related structural components. After assembly, the positional accuracy of each component must be highly consistent, and strict control over the deformation of the board frame and structural components is required, thus increasing the difficulty of machining and assembly.

[0006] Therefore, existing high-speed cable bit error rate testing solutions still have room for improvement in terms of channel scalability, cost control, and assembly tolerance. Summary of the Invention

[0007] One objective of this invention is to provide a high-speed cable bit error rate tester that solves the technical problems of complex test schemes, high consumable costs, and difficulty in high-density expansion of signal channels in the existing high-speed cable bit error rate test process.

[0008] A further objective of this invention is to improve the mating accuracy between the first signal connector of the MCB device and the fourth signal connector of the high-speed cable.

[0009] Specifically, the present invention provides a high-speed cable bit error rate tester, comprising: A test box, the test box including a box body and at least one first test board installed in the box body, the first test board being used to generate and / or receive high-speed test signals; The MCB device includes a second test board, at least one first signal connector and at least one second signal connector, wherein the first signal connector and the second signal connector are electrically connected through the second test board to realize signal conversion, and the second signal connector is connected to the device under test; At least one high-speed cable module, the high-speed cable module having multiple signal channels, and including a cable body, and a third signal connector and a fourth signal connector connected to both ends of the cable body, the third signal connector being connected to the first test board, and the fourth signal connector being connected to the first signal connector.

[0010] Optionally, each of the first test boards is connected to the third signal connector of one of the high-speed cable modules.

[0011] Optionally, the number of the fourth signal connectors of all the high-speed cable modules is the same as the number of the first signal connectors, and each fourth signal connector corresponds to one first signal connector.

[0012] Optionally, the high-speed cable module is installed inside the enclosure, and the test enclosure further includes: The mounting component is installed on one side of the housing and has at least one mounting slot, each mounting slot being used to install one of the fourth signal connectors; and the insertion interface of the fourth signal connector is exposed on the outside of the housing.

[0013] Optionally, the mounting element is configured to be movable and deflectable relative to the housing in the X, Y, and Z directions.

[0014] Optionally, the test chamber further includes: A carrier is mounted on the outside of the housing and has a mounting cavity; the MCB device is configured to be inserted into the mounting cavity from the opening of the mounting cavity and to connect the first signal connector to the fourth signal connector.

[0015] Optionally, the test chamber further includes: At least one floating component is disposed on the mounting member and connected to the housing; the floating component is configured to adaptively float during the mating of the first signal connector and the fourth signal connector, thereby adjusting the relative position of the mounting member and the fourth signal connector.

[0016] Optionally, the mounting component is provided with at least one countersunk hole, and each of the floating components includes: A connecting rod, which passes through the countersunk hole and is connected to the housing at its tail end, with a gap between the outer wall of the connecting rod and the inner wall of the countersunk hole; An elastic element is sleeved on the connecting rod, with one end abutting against the stepped surface of the countersunk hole and the other end abutting against the head of the connecting rod. During the mating process between the first signal connector and the fourth signal connector, the elastic element is compressed to adjust the position of the mounting member in the mating direction; and the mounting member floats on a first plane perpendicular to the mating direction, thereby adjusting the position of the mounting member on the first plane.

[0017] Optionally, there may be multiple floating components, which are respectively installed on opposite sides of the mounting component.

[0018] Optionally, the fourth signal connector is provided with a positioning post, and the first signal connector is provided with a positioning hole; During the mating process between the first signal connector and the fourth signal connector, the positioning post passes through the positioning hole to position the first signal connector and the fourth signal connector.

[0019] In this invention, the first test board of the test box is used to generate and / or receive high-speed test signals. The first signal connector and the second signal connector of the MCB device are electrically connected through the second test board to realize signal conversion. The second signal connector is connected to the device under test (DUT). The high-speed cable module has multiple signal channels and includes a cable body and a third signal connector and a fourth signal connector connected to both ends of the cable body. The third signal connector is connected to the first test board, and the fourth signal connector is connected to the first signal connector. The above technical solution achieves multi-channel, high-density high-speed signal transmission by using a high-speed cable module with multiple signal channels. By setting up an MCB device to convert and match high-speed signals, the high-speed signals of multiple channels can be reliably connected to the DUT. By designing corresponding MCB devices for different DUTs to achieve high-speed signal fan-out and matching, the need for differentiated customization of high-speed cable modules is avoided, improving the tester's adaptability to different DUTs. When the MCB device reaches the end of its service life or fails, maintenance can be completed simply by replacing the MCB device. Compared to replacing the high-speed cable module, the cost is lower and the operation is simpler.

[0020] Furthermore, the test chamber also includes at least one floating component, which is mounted on the mounting component and connected to the chamber body. The floating component is configured to adaptively float during the mating process of the first signal connector and the fourth signal connector, thereby adjusting the position of the mounting component and the fourth signal connector to compensate for assembly deviations between the first signal connector and the fourth signal connector, reduce mating resistance, and improve the mating accuracy of the first signal connector and the fourth signal connector.

[0021] The above and other objects, advantages and features of the present invention will become more apparent to those skilled in the art from the following detailed description of specific embodiments of the invention in conjunction with the accompanying drawings. Attached Figure Description

[0022] The following sections will describe some specific embodiments of the invention in detail by way of example and not limitation, with reference to the accompanying drawings. The same reference numerals in the drawings denote the same or similar parts or portions. Those skilled in the art should understand that these drawings are not necessarily drawn to scale. In the drawings: Figure 1 This is a schematic structural diagram of a high-speed cable bit error rate tester according to an embodiment of the present invention, taken at one angle. Figure 2 This is a schematic structural diagram of a high-speed cable bit error rate tester according to an embodiment of the present invention from another angle; Figure 3 This is a schematic structural diagram of the first signal connector and the fourth signal connector before they are plugged in, according to an embodiment of the present invention. Figure 4 This is a schematic structural diagram of the first signal connector and the fourth signal connector after being plugged in according to an embodiment of the present invention; Figure 5 This is a schematic cross-sectional view of a high-speed cable bit error rate tester according to an embodiment of the present invention.

[0023] Figure label: 100-High-speed cable bit error rate tester, 10-MCB device, 20-Test box, 30-High-speed cable module, 40-Floating component, 11-First signal connector, 12-Second signal connector, 13-Second test board, 21-First test board, 22-Carrier, 23-Mounting cavity, 24-Mounting component, 25-Box, 31-Third signal connector, 32-Fourth signal connector, 33-Cable body, 321-Positioning post, 41-Connecting rod, 42-Elastic component, 421-Head. Detailed Implementation

[0024] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the present invention, and should not be construed as limiting the present invention.

[0025] In the description of this invention, it should be understood that the terms "upper" and "lower" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limiting this invention.

[0026] The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature, that is, include one or more of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified. When a feature "includes or contains" one or more of the features it encompasses, unless otherwise specifically stated, this indicates that other features are not excluded and may be further included.

[0027] Unless otherwise expressly specified and limited, the terms "connection," "installation," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art should be able to understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0028] Unless otherwise specified, all terms (including technical and scientific terms) used in the description of this embodiment have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains.

[0029] Figure 1 This is a schematic structural diagram of a high-speed cable bit error rate tester 100 according to an embodiment of the present invention, taken at one angle. Figure 2 This is a schematic structural diagram of a high-speed cable bit error rate tester 100 according to an embodiment of the present invention from another angle. Figure 3 This is a schematic structural diagram of the first signal connector 11 and the fourth signal connector 32 before they are plugged in, according to an embodiment of the present invention. Figure 4This is a schematic structural diagram of the first signal connector 11 and the fourth signal connector 32 after being plugged in according to an embodiment of the present invention. Figures 1 to 4 As shown, in a specific embodiment, the high-speed cable bit error rate tester 100 includes a test box 20, an MCB device 10, and at least one high-speed cable module 30. The test box 20 includes a housing 25 and at least one first test board 21 installed within the housing 25. The first test board 21 is used to generate and / or receive high-speed test signals. The MCB device 10 includes a second test board 13, at least one first signal connector 11, and at least one second signal connector 12. The first signal connector 11 and the second signal connector 12 are electrically connected through the second test board 13 to achieve signal conversion. The second signal connector 12 is connected to the device under test (DUT). The high-speed cable module 30 has multiple signal channels and includes a cable body 33, and a third signal connector 31 and a fourth signal connector 32 connected to both ends of the cable body 33. The third signal connector 31 is connected to the first test board 21, and the fourth signal connector 32 is connected to the first signal connector 11. Here, the first test board 21 is a BERT or PCBA, and the second test board 13 is an MCB or PCBA. The MCB device 10 can be understood as an adapter.

[0030] This embodiment achieves multi-channel, high-density high-speed signal transmission by employing a high-speed cable module 30 with multiple signal channels. The MCB device 10 is used to transfer and match high-speed signals, ensuring reliable access of multi-channel high-speed signals to the device under test (DUT). By designing corresponding MCB devices 10 for different DUTs to achieve high-speed signal fan-out and matching, customized high-speed cable modules 30 are avoided, improving the tester's adaptability to different DUTs. When the MCB device reaches the end of its service life or fails, maintenance can be completed simply by replacing the MCB device 10, which is less costly and simpler to operate compared to replacing the high-speed cable module 30.

[0031] In some embodiments, each first test board 21 is connected to a third signal connector 31 of a high-speed cable module 30. This embodiment connects each first test board 21 to a high-speed cable module 30 in a one-to-one correspondence, realizing independent transmission and management of test signals and improving the reliability and stability of the testing process.

[0032] In some embodiments, the number of fourth signal connectors 32 of all high-speed cable modules 30 is the same as the number of first signal connectors 11, and each fourth signal connector 32 corresponds to one first signal connector 11. This embodiment achieves accurate matching and stable insertion of high-speed signals by assigning each fourth signal connector 32 to one first signal connector 11.

[0033] In some embodiments, there are multiple first test boards 21, which are installed side-by-side inside the housing 25. This embodiment, by installing multiple first test boards 21 side-by-side inside the housing 25, can support high-speed signal testing for more channels, thereby improving the channel expansion capability and testing efficiency of the test system.

[0034] In some embodiments, the high-speed cable module 30 is installed inside the housing 25. The test housing 20 also includes a mounting member 24 for mounting on one side of the housing 25. The mounting member 24 has at least one mounting slot, and each mounting slot mounts a fourth signal connector 32, with the interface of the fourth signal connector 32 exposed on the outside of the housing 25. This embodiment uses a single mounting member 24 to mount all the fourth signal connectors 32, which can improve the consistency of the fourth signal connector 32 installation.

[0035] In some embodiments, the test chamber 20 further includes a carrier 22 mounted on the outside of the chamber 25 and having a mounting cavity 23. The MCB device 10 is configured to be inserted into the mounting cavity 23 from the opening of the mounting cavity 23 and to engage the first signal connector 11 with the fourth signal connector 32.

[0036] In existing technologies, the high-speed signal connection methods between the tester and the device under test (DUT) in high-speed bit error rate testing equipment mainly include wire-to-wire connections, board-to-board connections, and board-to-wire connections. Among these, wire-to-wire connections have relatively low requirements for installation accuracy, but require a high level of operational proficiency in practical applications. Cables must be properly secured to avoid affecting the stability of high-speed signal transmission under vibration or motion, which is detrimental to long-term stable use in high-density, multi-channel testing scenarios. Board-to-board connections require higher assembly accuracy, typically necessitating high-precision machining of the PCB board frame and related structural components to ensure consistent relative positions after installation. Even slight positional deviations can easily lead to tilted or offset contact between connector spring terminals, causing impedance to deviate from design expectations and adversely affecting high-speed signal quality. This is especially problematic when there are many pins and high channel density, leading to poor consistency between channels. For board-to-wire applications, some high-speed connector manufacturers provide standard mounting brackets for fixing connectors and guide structures on male and female connectors to improve mating alignment. However, these solutions typically only rigidly fix one end. Since the other end still requires installation via structural components, even with high machining precision, it's difficult to guarantee that the overall dimensional accuracy of the assembled components will consistently meet design requirements. Assembly deviations may still occur between connectors due to factors such as component machining errors, differences in assembly methods, and vibrations during actual use. Improving the machining and assembly precision of all relevant components to eliminate these problems would significantly increase manufacturing and assembly costs, hindering large-scale applications. Furthermore, existing connector fasteners are mostly standard parts with relatively fixed structures and dimensions, which imposes certain limitations on the overall structural layout and usage scenarios in specific applications.

[0037] Figure 5 This is a schematic cross-sectional view of a high-speed cable bit error rate tester 100 according to an embodiment of the present invention. Figure 5 As shown, to address the aforementioned issues, in some embodiments, the test chamber 20 further includes at least one floating component 40, which is disposed on the mounting member 24 and connected to the chamber body 25. The floating component 40 is configured to adaptively float during the mating process of the first signal connector 11 and the fourth signal connector 32, thereby adjusting the relative positions of the mounting member 24 and the fourth signal connector 32.

[0038] This embodiment, by incorporating a floating component 40 within the test chamber 20, allows the mounting component 24 and the fourth signal connector 32 connected to it to adaptively float during the mating process of the first signal connector 11 and the fourth signal connector 32. This compensates for mating deviations caused by part machining errors, assembly errors, and installation position deviations. Furthermore, by adjusting the position of the fourth signal connector 32 through the floating component 40, the mating resistance during connector mating is reduced, avoiding tilted contact or localized stress concentration caused by rigid assembly, thus improving the mating accuracy and contact reliability of the first signal connector 11 and the fourth signal connector 32.

[0039] In high-speed connection scenarios with multiple channels and high-density pins, the aforementioned floating component 40 helps improve the contact consistency between signal channels and reduce impedance fluctuations caused by assembly deviations, thereby improving the stability and consistency of high-speed signal transmission. Furthermore, by compensating for assembly deviations with the floating component 40, reliable high-speed signal connections can be achieved without significantly increasing the requirements for component machining and assembly accuracy, effectively reducing overall manufacturing costs and improving the applicability and design flexibility of the test equipment in different application scenarios.

[0040] In some embodiments, the mounting member 24 is configured to be movable and deflectable relative to the housing 25 in the X, Y, and Z directions. Here, the mounting member 24 is manufactured with high precision and is capable of slight movement and deflection in the three directions, thereby ensuring that each MCB device 10 is inserted into the fourth signal connector 32 in the same way, ensuring consistent impedance of each link, and ensuring consistent signal loss at the mating position.

[0041] In some embodiments, the mounting member 24 is provided with at least one countersunk hole. Each floating assembly 40 includes a connecting rod 41 and an elastic member 42. The connecting rod 41 passes through the countersunk hole and its tail is connected to the housing 25. There is a gap between the outer wall of the connecting rod 41 and the inner wall of the countersunk hole. The elastic member 42 is sleeved on the connecting rod 41, with one end abutting against the stepped surface of the countersunk hole and the other end abutting against the head 421 of the connecting rod 41. During the mating process of the first signal connector 11 and the fourth signal connector 32, the elastic member 42 is compressed to adjust the position of the mounting member 24 in the mating direction; and the mounting member 24 floats in a first plane perpendicular to the mating direction, thereby adjusting the position of the mounting member 24 in the first plane. Here, the elastic member 42 can be a spring, and the connecting rod 41 can be a plug bolt. In other embodiments, the elastic member 42 can also be a component with the same properties as a spring.

[0042] In this embodiment, during the insertion process of the first signal connector 11 and the fourth signal connector 32, the design of the connecting rod 41 and the elastic element 42 allows the fourth signal connector 32 to float not only in the insertion direction but also in a plane perpendicular to the insertion direction. This achieves non-rigid constraint on the mounting component 24, thereby improving the accuracy of the fourth signal connector's position adjustment and preventing damage to both the fourth and first signal connectors. The elastic element 42 absorbs the impact kinetic energy generated during insertion, acting as a buffer and extending the service life of both the first and fourth signal connectors 11 and 32. Here, the insertion direction can be understood as the Z-direction, and the plane perpendicular to the insertion direction is the XY plane, meaning the fourth signal connector 32 can float slightly in both the X and Y directions.

[0043] In some embodiments, there are multiple floating components 40, which are respectively installed on opposite sides of the mounting member 24, so that the position of the entire mounting member 24 can be adjusted, thereby realizing the overall floating of multiple fourth signal connectors 32.

[0044] In some embodiments, the fourth signal connector 32 is provided with a positioning post 321, and the first signal connector 11 is provided with a positioning hole. During the mating process between the first signal connector 11 and the fourth signal connector 32, the positioning post 321 passes through the positioning hole, thereby positioning the first signal connector 11 and the fourth signal connector 32. This embodiment, by providing a positioning post 321 on the fourth signal connector 32 and a positioning hole on the first signal connector 11, achieves precise positioning of the signal connectors during the mating process, improving the accuracy and reliability of multi-channel high-speed signal access.

[0045] Therefore, those skilled in the art should recognize that although numerous exemplary embodiments of the present invention have been shown and described in detail herein, many other variations or modifications conforming to the principles of the present invention can be directly determined or derived from the disclosure of the present invention without departing from the spirit and scope of the invention. Thus, the scope of the present invention should be understood and construed as covering all such other variations or modifications.

Claims

1. A high-speed cable bit error rate tester, characterized in that, include: A test box, the test box including a box body and at least one first test board installed in the box body, the first test board being used to generate and / or receive high-speed test signals; The MCB device includes a second test board, at least one first signal connector and at least one second signal connector, wherein the first signal connector and the second signal connector are electrically connected through the second test board to realize signal conversion, and the second signal connector is connected to the device under test. At least one high-speed cable module, the high-speed cable module having multiple signal channels, and including a cable body, and a third signal connector and a fourth signal connector connected to both ends of the cable body, the third signal connector being connected to the first test board, and the fourth signal connector being connected to the first signal connector.

2. The high-speed cable bit error rate tester according to claim 1, characterized in that, Each of the first test boards is connected to the third signal connector of one of the high-speed cable modules.

3. The high-speed cable bit error rate tester according to claim 2, characterized in that, The number of fourth signal connectors in all the high-speed cable modules is the same as the number of first signal connectors, and each fourth signal connector corresponds to one first signal connector.

4. The high-speed cable bit error rate tester according to any one of claims 1-3, characterized in that, The high-speed cable module is installed inside the enclosure, and the test enclosure also includes: The mounting component is installed on one side of the housing and has at least one mounting slot, each mounting slot being used to install one of the fourth signal connectors; and the insertion interface of the fourth signal connector is exposed on the outside of the housing.

5. The high-speed cable bit error rate tester according to claim 4, characterized in that, The mounting component is configured to be movable and deflectable relative to the housing in the X, Y, and Z directions.

6. The high-speed cable bit error rate tester according to claim 5, characterized in that, The test chamber also includes: A carrier is mounted on the outside of the housing and has a mounting cavity; the MCB device is configured to be inserted into the mounting cavity from the opening of the mounting cavity and to connect the first signal connector to the fourth signal connector.

7. The high-speed cable bit error rate tester according to claim 6, characterized in that, The test chamber also includes: At least one floating component is disposed on the mounting member and connected to the housing; the floating component is configured to adaptively float during the mating of the first signal connector and the fourth signal connector, thereby adjusting the relative positions of the mounting member and the fourth signal connector.

8. The high-speed cable bit error rate tester according to claim 7, characterized in that, The mounting component is provided with at least one countersunk hole, and each floating component includes: A connecting rod, which passes through the countersunk hole and is connected to the housing at its tail end, with a gap between the outer wall of the connecting rod and the inner wall of the countersunk hole; An elastic element is sleeved on the connecting rod, with one end abutting against the stepped surface of the countersunk hole and the other end abutting against the head of the connecting rod. During the mating process between the first signal connector and the fourth signal connector, the elastic element is compressed to adjust the position of the mounting member in the mating direction; and the mounting member floats on a first plane perpendicular to the mating direction, thereby adjusting the position of the mounting member on the first plane.

9. The high-speed cable bit error rate tester according to claim 7, characterized in that, The number of floating components is multiple, and the multiple floating components are respectively installed on opposite sides of the mounting component.

10. The high-speed cable bit error rate tester according to any one of claims 1-3, characterized in that, The fourth signal connector is provided with a positioning post, and the first signal connector is provided with a positioning hole; During the mating process between the first signal connector and the fourth signal connector, the positioning post passes through the positioning hole to position the first signal connector and the fourth signal connector.

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