External testing device of computer interface equipment

Abstract

The invention relates to an external testing device of computer interface equipment, and relates to the technical field of data processing, the external testing device of the computer interface equipment comprises an environment simulation module, and the environment simulation module is electrically connected with a mainboard to obtain electrical parameters and simulate the electrical environment of the mainboard; the environment simulation module is provided with an extension plug, a golden finger interface of the network card to be tested is connected with the extension plug, the network card to be tested is provided with a test socket, and the test device is connected with the test socket through a test interface. Intermediate switching and environment simulation are realized through the environment simulation module, the to-be-tested network card is prevented from being directly plugged into and pulled out of a mainboard core interface, and the mainboard is protected; and meanwhile, connection stability is guaranteed through limiting structures such as a positioning base and an elastic abutting plate, and universality and adaptability of lifting devices such as an adjustable structure and a cooling base are achieved. Testing can be completed without disassembling and assembling the case, batch testing and research and development debugging scenes are adapted, and the effects of reducing the testing cost and risk and improving the testing efficiency are achieved.

Description

Technical Field

[0001] This application relates to the field of data processing technology, and in particular to an external testing device for a computer interface device. Background Technology

[0002] With the advancement of computer technology towards higher speeds and smaller sizes, M.2 interface network cards have become a core component of mainstream computer equipment due to their advantages such as small size, high transmission speed, and low power consumption. The performance stability and compatibility of M.2 network cards directly affect the quality of computer network communication. Therefore, during their production and motherboard integration development, rigorous testing is essential to verify their various functional indicators. The testing phase requires completing multiple checks, including data throughput, link stability, and protocol compatibility, and is a crucial step in ensuring product quality.

[0003] In existing technologies, M.2 network card testing often involves directly plugging the card into the motherboard's native M.2 interface, requiring the testing process to be completed inside the computer case. Testers must first secure the motherboard inside the case, then insert the M.2 network card under test directly into the motherboard's M.2 interface, and subsequently connect the power supply to the test host for data exchange testing. This testing method relies on the motherboard's native interface for power supply and signal transmission, requiring no additional adapters, and is commonly used in small-scale R&D and debugging.

[0004] However, existing testing methods have many shortcomings, severely restricting testing efficiency and safety. On one hand, the M.2 interface inside the motherboard is a core precision interface; frequent insertion and removal of the network card under test can cause interface wear and oxidation of the gold fingers, leading to poor contact. This not only affects the accuracy of test data but can also damage expensive motherboards, significantly increasing R&D and production costs. On the other hand, testing must be completed inside the chassis, where the operating space is limited. Especially in mass production line testing scenarios, the process of disassembling and assembling the chassis and repeatedly inserting and removing network cards is cumbersome, severely reducing testing efficiency. Furthermore, direct plug-in testing lacks targeted electrical protection mechanisms. If voltage fluctuations or signal abnormalities occur during testing, both the motherboard and the network card can be damaged simultaneously, further increasing testing risks. These problems are particularly prominent in large-scale production line testing and the R&D and debugging of high-value motherboards, urgently requiring a safer and more efficient testing solution. Summary of the Invention

[0005] In order to improve the situation in the above-mentioned technology, this application provides an external testing device for computer interface devices.

[0006] The external testing device for a computer interface equipment provided in this application adopts the following technical solution: An external testing device for a computer interface device includes an environment simulation module electrically connected to a motherboard to obtain the motherboard's electrical parameters; the environment simulation module is provided with an external connector, the network card under test is provided with a gold finger interface for connecting to the external connector, and the network card under test is provided with a test socket for connecting to a testing device, the testing device being connected to the test socket via a test interface.

[0007] By adopting the above technical solution, during operation, the environment simulation module is first electrically connected to the motherboard, enabling the environment simulation module to obtain the motherboard's native electrical parameters and accurately reproduce the motherboard's electrical environment, providing the network card under test with test conditions consistent with the actual assembly scenario. Then, the gold finger interface of the network card under test is connected to the external plug on the environment simulation module to realize signal and power transmission between the network card under test and the environment simulation module, thereby placing the network card under test in the simulated motherboard electrical environment. Finally, the test interface of the test equipment is precisely connected to the test socket of the network card under test to ensure that a stable signal transmission path is established between the two. The test equipment can send test commands to the network card under test and collect test data through the test socket to complete various functional tests of the M.2 network card. Throughout the entire process, the environment simulation module plays a dual role of "intermediate connection + environment simulation." On the one hand, by cooperating with the gold finger interface of the network card under test through the external connector, it avoids the network card under test from being directly plugged and unplugged from the motherboard core interface, reducing the risk of mechanical wear and damage to the motherboard core interface and effectively protecting the expensive motherboard. On the other hand, by simulating the motherboard electrical environment, it ensures the accuracy and reliability of test data. At the same time, the network card under test is directly connected to the test equipment through the test socket, and the test can be completed without disassembling the chassis, which improves the convenience of test operation and adapts to batch testing on the production line and R&D debugging scenarios. Ultimately, it achieves the overall technical effect of reducing test costs and risks and improving test efficiency.

[0008] Optionally, the network card under test may be detachably connected to at least two opposing positioning seats, and the two sides of the line of the test interface shall respectively abut against at least one of the positioning seats.

[0009] By adopting the above technical solution, the initial connection between the test equipment and the network card under test (NIC) is first completed according to the test procedure. This involves precisely connecting the test interface of the test equipment to the test socket of the NIC under test to ensure a stable signal transmission path is established. Then, at least two opposing positioning seats are installed on the NIC under test, ensuring that the installation positions of the positioning seats precisely correspond to the two sides of the test interface lines. Ultimately, both sides of the test interface lines abut against at least one positioning seat. The positioning seats, through their abutting action, form a bidirectional limiting constraint on the connected test interface. During subsequent testing, this effectively prevents the test interface from shifting, loosening, or even falling off due to external force, equipment vibration, or frequent operations during batch testing. This ensures that the test interface and test socket maintain a stable connection, thereby guaranteeing the continuity and accuracy of test command transmission and test data acquisition. The entire working process, through the logical design of "connect first, then limit", not only avoids the interference of the positioning seat on the docking process between the test interface and the test socket, ensuring docking accuracy, but also makes up for the lack of stability of relying solely on plug-and-play connection through the limiting function of the positioning seat. This reduces the risk of test interruption, data distortion, or even equipment damage caused by loose connection, further improving the stability and adaptability of the testing process, and better meeting the usage requirements of high-frequency connection and multi-device adaptation in batch testing on the production line.

[0010] Optionally, the network card under test is provided with a card socket, and the card socket has a first engagement slot for inserting the edge of the network card under test; the card socket is movably provided with two opposing first abutment plates, and the card socket is provided with an elastic element, which is used to drive the two first abutment plates to move to abut against the two sides of the line of the test interface respectively.

[0011] By adopting the above technical solution, when connecting the card socket to the network card under test (NIC), firstly, insert the edge of the NIC under test into the first engagement slot on the card socket. Then, connect the test interface of the test equipment to the test socket on the NIC under test. During the connection process, slightly move the two first abutment plates so that they are positioned on both sides of the test interface's lines. After the test interface of the test equipment is connected to the test socket on the NIC under test, the elastic element on the card socket drives the two opposing first abutment plates to move towards the test interface's lines until the two first abutment plates are respectively engaged with the test interface's lines. The two sides of the interface lines are tightly abutted, and the elastic force of the elastic element ensures that the first abutment plate always forms a stable clamping limit on the test interface lines. During subsequent testing, this elastic clamping structure not only effectively prevents the test interface from shifting or loosening due to external force or equipment vibration, but also absorbs vibration energy through the buffering effect of the elastic element, avoiding mechanical damage to the test interface lines caused by rigid contact. Furthermore, for test interfaces of different specifications (with slight differences in line width), the elastic element can drive the first abutment plate to adaptively adjust the spacing, achieving limit adaptation for various test interface specifications. The entire working process, through the logical design of "NIC positioning first - interface then docking - elastic automatic limit," ensures the positioning stability of the NIC under test through the first locking slot of the connector, and achieves adaptive elastic limit of the test interface through the first abutment plate driven by the elastic element. This eliminates the need for manual locking of the first abutment plate, simplifying the operation process while simultaneously ensuring connection stability, interface protection, and compatibility, further reducing the operational difficulty and testing risks in batch testing.

[0012] Optionally, each of the two first abutting plates is provided with a first magnetic block, and the two first magnetic blocks are magnetic blocks of the same name and are arranged opposite to each other.

[0013] By adopting the above technical solution, when the test interface of the test equipment is not connected to the test socket on the network card under test, the two first magnetic blocks repel each other, generating an outward repulsive force. This repulsive force overcomes the initial elastic driving force of the elastic element, pushing the two opposing first abutment plates to move away from each other and remain stable. This naturally leaves sufficient space between the two first abutment plates for the test interface lines to enter. Without the need for manual adjustment of the first abutment plates, the test interface can be directly aligned with the test socket for connection, greatly simplifying the pre-connection preparation and improving testing efficiency. When the test interface is connected to the test socket, the test interface lines will be positioned between the two first abutment plates, forming a physical obstruction to the two first magnetic blocks. This obstruction disrupts the original relative repulsion state of the two first magnetic blocks, creating a magnetic attraction isolation effect. This prevents the repulsive force between the first magnetic blocks from being effectively transmitted to the first abutment plate. At this point, the elastic driving force of the elastic element is no longer canceled out by the repulsive force of the first magnetic blocks and is fully released, driving the two first abutment plates to move towards the line of the test interface until the first abutment plates are tightly abutted against both sides of the line of the test interface. The elastic element continues to provide stable elastic force, ensuring that the first abutment plates always maintain the clamping and limiting state of the test interface line, effectively preventing the test interface from shifting or loosening due to vibration or contact during the test, and ensuring the continuity and accuracy of test data transmission. After the test is completed, the test interface is unplugged from the test socket, the blocking effect of the test interface line on the first magnetic blocks disappears, the two first magnetic blocks return to a relative repulsive state, and the repulsive force pushes the first abutment plates to reset, re-leaving connection space and preparing for the next test. The entire working process is precisely controlled by the first magnetic block, which "repels and makes way when not connected, and is isolated and helps elastically abut after connection". This makes the connection operation of the test interface convenient and the abutment limit stable. No additional manual adjustment of the structure is required, which is suitable for the high-frequency operation requirements of batch testing. At the same time, it avoids the tedious operation of manually opening the first abutment plate before connection under the single elastic component structure, and also solves the positioning deviation problem that may be caused by manual adjustment.

[0014] Optionally, the mounting base is provided with a movable rod, and a fixed sleeve rod is slidably connected to the movable rod on the same axis. The end of the fixed sleeve rod away from the movable rod is detachably connected to the environmental simulation module. The movable rod is provided with a plurality of first positioning holes spaced apart along its length, and the fixed sleeve rod is provided with a second positioning hole. A first positioning rod passes through the second positioning hole, and the first positioning rod passes through any one of the first positioning holes simultaneously.

[0015] By adopting the above technical solution, during the assembly and adjustment phase, the operator can drive the card holder to slide the movable rod along the axial direction of the fixed sleeve rod according to the actual size of the network card under test, thereby adjusting the distance between the card holder and the environmental simulation module. During the sliding process, multiple first positioning holes spaced along the length of the movable rod move synchronously with the movable rod. When the card holder is adjusted to the target position suitable for the installation of the network card under test, the second positioning hole on the fixed sleeve rod will align with any corresponding first positioning hole on the movable rod. At this time, the first positioning rod is simultaneously inserted into the aligned second positioning hole and the first positioning hole. The cooperation between the first positioning rod and the two positioning holes forms a rigid limiting structure, locking the movable rod and the fixed sleeve rod relative to each other, thereby... The locking structure effectively limits the relative sliding between the fixed card connector and the environmental simulation module during testing, ensuring the stability of the card connector position and preventing spacing deviation due to vibration, contact, or other external forces. This ensures that the contact plate, magnetic block, and other structures on the card connector are always precisely aligned with the network card under test and the test interface, maintaining a stable connection between the test interface and the test socket. Furthermore, the adjustable spacing design allows the same device to accommodate network cards of different lengths, improving its versatility and adaptability. When replacing network cards of different sizes, simply pull out the first positioning rod and repeat the above sliding adjustment, positioning hole alignment, and positioning rod insertion operations to reset the spacing. The entire process, through the coordinated logic of "axial sliding adjustment—positioning hole alignment—positioning rod locking," achieves flexible adjustment and stable locking of the card connector position. This solves the problem that a single fixed spacing cannot accommodate multiple network card specifications and ensures the reliability of the adjusted structural positioning, providing adaptable structural support for stable testing of network cards of different sizes.

[0016] Optionally, a first connecting bracket is included, wherein the network card under test is provided with a first connecting foot, and the first connecting bracket is provided with a first slot for inserting the first connecting foot; two opposing second abutment plates are movably provided in the first slot, and the two second abutment plates can respectively abut against the two sides of the first connecting foot; and a driving member is provided in the first slot for driving the second abutment plates to move in the direction toward the first connecting foot.

[0017] By adopting the above technical solution, during the pre-test assembly stage, the operator first aligns the first connecting pin on the network card under test (NIC) with the first slot on the first connecting bracket and inserts it, completing the initial positioning of the NIC and the first connecting bracket. After the first connecting pin is inserted, the driving component in the first slot starts working, driving the two second abutment plates to move synchronously in the direction towards the first connecting pin until the two second abutment plates are tightly abutted against the two sides of the first connecting pin respectively. The driving component continuously provides driving force, so that the second abutment plates form a stable bidirectional clamping limit on the first connecting pin, firmly fixing the first connecting pin in the first slot, thereby achieving a stable assembly of the NIC and the first connecting bracket, avoiding displacement or shaking of the NIC due to vibration, contact, etc. during the test. This stable assembly state provides a stable benchmark for the precise docking of the test socket and test interface on the NIC, ensuring that the connection relationship between the two does not shift during the test, and avoiding poor contact between the gold finger interface and the external plug caused by displacement of the NIC, ensuring the stability of signal transmission and power supply, and ultimately improving the overall reliability of the test. The entire working process achieves rapid assembly and stable positioning of the network card under test through the logic of "first connecting foot insertion and positioning - driving component driving second abutment plate clamping and fixing". It is convenient to operate and accurate in positioning, adapting to the high-frequency assembly and disassembly requirements of network cards under test in batch testing, while solving the problem of unstable positioning and easy displacement caused by relying solely on plugging and unplugging.

[0018] Optionally, the driving component includes a first spring disposed in the first slot, one end of the first spring being connected to the first slot, and the other end being connected to the side of the second abutment plate opposite to the first connecting leg; a pushing block is movably disposed in the first slot, and a second magnetic block is disposed on both the first connecting leg and the pushing block, the two second magnetic blocks being opposite magnetic blocks and partially or completely attached, and the cross-section of the pushing block being larger than the cross-section of the first connecting leg along the insertion direction of the first slot; the bottom ends of the pushing block and the second abutment plate are both provided with mutually abutting inclined surfaces.

[0019] By adopting the above technical solution, when the first connecting leg is not inserted into the first slot, the pushing block is naturally located between the two second abutment plates. Under the support of its own structure, it pushes the two second abutment plates open to both sides, so that the cross-section of the entrance of the first slot is larger than that of the first connecting leg. This enlarged diameter can effectively reduce the alignment difficulty when inserting the first connecting leg, avoid insertion jamming caused by the small diameter of the first slot, and facilitate the quick and smooth insertion of the first connecting leg into the first slot. During the insertion of the first connecting leg into the first slot, the bottom end of the first connecting leg contacts the pushing block and applies a downward pushing force, driving the pushing block to move towards the bottom end along the axial direction of the first slot. When the first connecting leg is fully inserted into the first slot, the pushing block is pushed to the bottom end of the first slot and remains stable. The inclined surface on the pushing block abuts against the inclined surface at the bottom end of the abutment plate, ensuring the pushing block... The block will not completely detach from the second abutment plate, ensuring the stability of the structural fit. At this time, the first connecting leg and the two second magnetic blocks on the push block are in contact with each other. The magnetic attraction force of the opposite magnetic blocks achieves the stable positioning of the first connecting leg and the push block, thus firmly fixing the first connecting leg in the first slot and preventing the first connecting leg from axial movement or loosening due to vibration during the test. When the test is completed and the first connecting leg needs to be removed from the first slot, pull the first connecting leg upward. At this time, the first connecting leg drives the push block to move upward synchronously through the in contact with the second magnetic blocks. At the same time, the inclined surfaces that abut against each other produce a guiding and linkage effect, ensuring that the push block moves upward smoothly with the first connecting leg. Finally, the push block returns to the two second abutment plates, opening the two second abutment plates again to form an enlarged diameter, preparing for the next insertion of the first connecting leg. The entire working process is designed through a collaborative workflow of "opening the guide when not inserted - inclined plane guiding and positioning when inserted - magnetic fixation after insertion - linkage reset when removed". It can achieve convenient insertion, stable fixation and automatic reset of the first connecting pin without any manual adjustment of the structure, which greatly improves the assembly and disassembly efficiency in batch testing scenarios of the network card under test. At the same time, the dual protection of inclined plane cooperation and magnetic positioning effectively avoids structural jamming or positioning deviation during assembly and disassembly, ensuring that the network card under test can maintain accurate positioning after each assembly and disassembly, providing a reliable foundation for the stability of subsequent tests.

[0020] Optionally, it includes a mounting base with a mounting groove, a first mounting block on the first connecting support, and a second mounting block on the environment simulation module, wherein both the first mounting block and the second mounting block are inserted into the mounting groove.

[0021] By adopting the above technical solution, during the assembly stage, the mounting base is first placed as a unified assembly benchmark for the first connecting support and the environmental simulation module. Then, the first mounting block on the first connecting support and the second mounting block on the environmental simulation module are aligned with the mounting slots on the mounting base and inserted. Through the insertion and engagement of the mounting slots with the first and second mounting blocks, the first connecting support and the environmental simulation module are quickly positioned and initially fixed on the mounting base. Since the first connecting support is used to assemble and fix the network card under test (NIC), and the environmental simulation module is used to provide a simulated electrical environment for the NIC, their integrated assembly via the mounting base ensures... The system ensures a precise relative position between the slot on the first connecting bracket and the signal interface (such as an external plug) of the environmental simulation module. This allows the network card under test (NIC) inserted into the slot to accurately establish a signal connection with the environmental simulation module, preventing poor connection due to positional deviations. During testing, the mounting slot's limiting effect on the first and second mounting blocks effectively restricts the displacement or shaking of the first connecting bracket and the environmental simulation module, ensuring stable relative positions and continuous stable signal transmission between the NIC under test and the environmental simulation module. The integrated assembly design also enhances the overall compactness of the device, facilitating transport and layout for batch testing scenarios. The entire process, through the logic of "mounting base providing a reference—dual mounting block insertion and positioning—integrated stable assembly," achieves rapid and precise assembly of the first connecting bracket and the environmental simulation module. This simplifies the assembly process and ensures the relative positional accuracy of key components through a unified reference, preventing test anomalies caused by component misalignment and providing a reliable structural foundation for stable testing of the NIC under test.

[0022] Optionally, a second connecting bracket is included, wherein the network card under test is provided with a second connecting foot, and the second connecting bracket is provided with a second slot for the second connecting foot to be inserted; the second connecting bracket is provided with a first insertion hole, and the second connecting foot is provided with a second insertion hole, and a second positioning rod is simultaneously inserted into the first insertion hole and the second insertion hole.

[0023] By adopting the above technical solution, when assembling the network card under test (NIC), the operator first aligns the second connecting pin on the NIC with the second slot on the second connecting bracket and inserts it. The insertion and removal of the second connecting pin and the second slot achieves initial positioning of the NIC and the second connecting bracket, ensuring approximate accuracy in their assembly positions. When the second connecting pin is inserted to the preset position, the first socket on the second connecting bracket and the second socket on the second connecting pin will automatically align. At this time, the second positioning rod is simultaneously inserted into the aligned first and second sockets. The second positioning rod forms a rigid locking structure through a tight fit with the two sockets, securing the second connecting pin to the second... The connecting bracket is firmly locked into one unit, thus achieving stable assembly of the network card under test (NIC). During testing, this rigid locking structure effectively restricts the axial movement and radial rotation of the second connecting leg within the second slot, completely preventing displacement of the NIC due to external vibration or touch during testing. This ensures that key connection points on the NIC, such as the test socket and test interface, the gold finger interface and the external plug, maintain a stable fit, guaranteeing the continuity and accuracy of signal transmission and test data acquisition. After testing, simply pull out the second positioning rod to release the locking state of the second connecting leg and the second connecting bracket, easily removing the NIC and completing disassembly. The entire process, through the simple logic of "initial slot positioning—hole alignment—second positioning rod locking," achieves rapid assembly and disassembly of the NIC and precise, stable positioning. It is convenient to operate and reliably locked, adapting to the high-frequency assembly and disassembly requirements of NICs in batch testing. It also solves the problem of insecure positioning and easy displacement relying solely on plug-and-play, further improving the stability and reliability of the testing device.

[0024] Optionally, a cooling base is provided, wherein a second engaging groove is provided on the cooling base for inserting the edge of the network card under test, a cooling hole is provided on the cooling base along the edge of the network card under test, and a cooling cavity is provided inside the cooling base that communicates with the cooling hole, and the cooling cavity is connected to an external air source through a pipe.

[0025] By adopting the above technical solution, during the pre-test assembly stage, the staff aligns the edge of the network card under test with the second locking slot on the cooling base and inserts it. The limiting effect of the second locking slot ensures that the network card under test and the cooling base fit precisely, ensuring that the cooling holes on the cooling base can cover the heat-generating area of ​​the network card under test. Before testing, the pipeline connection between the cooling cavity and the external air source is completed to form a cold air circulation path. During the test, the external air source is activated, and cold air enters the cooling cavity in the cooling base through the pipeline. The cooling cavity acts as a buffer and distribution space for the cold air, allowing the cold air to be evenly distributed before entering the multiple cooling holes connected to it. The cooling holes are opened along the edge of the network card under test, which can directly guide the cold air to the network card under test. The system effectively cools the heat-generating areas of the network card under test by using forced convection heat exchange to remove the heat generated. Simultaneously, the close fit of the second locking slot not only ensures the alignment accuracy between the cooling holes and the heat-generating areas but also enhances heat transfer efficiency, aiding in heat dissipation. The entire cooling process requires no additional manual adjustment. Through the coordinated logic of "locking positioning - cold air introduction - heat diversion," the operating temperature of the network card under test can be controlled in real time, avoiding overheating issues caused by prolonged high-load testing. This ensures the network card remains within a stable operating temperature range, thereby guaranteeing the authenticity and reliability of the test data, and is particularly suitable for long-term stability testing scenarios of high-power M.2 network cards.

[0026] In summary, this application includes at least one of the following beneficial technical effects: 1. The environment simulation module enables the dual functions of 'intermediate transfer + environment simulation', avoiding direct plugging and unplugging of the network card under test into the motherboard core interface, reducing motherboard wear and tear, and lowering testing costs and risks; 2. By using positioning seats, elastic abutment plates, magnetic blocks and other limiting structures, a stable connection between the test interface and the network card under test is ensured, avoiding loosening of the connection due to vibration or contact, and improving the accuracy of test data; 3. With its adjustable spacing structure, multiple types of connection supports, and cooling base design, it can adapt to network cards under test of different sizes and power consumption, thus improving the device's versatility and adaptability; 4. The integrated assembly design simplifies the testing process, allowing testing to be completed without disassembling the chassis, adapting to batch testing on production lines and R&D debugging scenarios, and significantly improving testing efficiency. Attached Figure Description

[0027] Figure 1 This is a schematic diagram of the overall structure of an external testing device for a computer interface device according to Embodiment 1 of this application; Figure 2 This is a schematic diagram of the network interface card under test in Embodiment 1 of this application; Figure 3 This is a schematic diagram of the other side of the network card under test in Embodiment 1 of this application; Figure 4This is a schematic diagram of the overall structure of an external testing device for a computer interface device according to Embodiment 2 of this application; Figure 5 This is a schematic diagram of the network interface card under test in Embodiment 2 of this application; Figure 6 This is a sectional side view of Embodiment 2 of this application; Figure 7 yes Figure 6 Enlarged view of section A; Figure 8 This is a schematic diagram of the card connector in Embodiment 2 of this application; Figure 9 This is a schematic diagram of the interaction between the snap-fit ​​seat, the movable rod, the fixed sleeve rod, and the first positioning rod in Embodiment 2 of this application; Figure 10 This is a schematic diagram of the overall structure of an external testing device for a computer interface device according to Embodiment 3 of this application; Figure 11 This is a schematic diagram of the overall structure of an external testing device for a computer interface device according to Embodiment 4 of this application; Figure 12 yes Figure 11 Enlarged view of section B.

[0028] Explanation of reference numerals in the attached diagram: 1. Environmental simulation module; 2. External connector; 3. Network card under test; 4. Gold finger interface; 5. Test socket; 6. Test interface; 7. Positioning seat; 71. Positioning screw; 8. Snap-fit ​​seat; 9. First snap-fit ​​groove; 10. First abutment plate; 11. Elastic element; 111. Second spring; 112. First telescopic rod; 12. First magnet; 13. Movable rod; 14. Fixed sleeve rod; 15. First positioning hole; 17. First positioning rod; 18. First connecting support 19. First connecting leg; 20. First slot; 21. Second abutment plate; 22. First spring; 23. Push block; 24. Inclined surface; 25. Mounting base; 26. Mounting groove; 27. First mounting block; 28. Second mounting block; 29. ​​Second connecting support; 30. Second connecting leg; 31. Second slot; 32. Second positioning rod; 33. Cooling seat; 34. Second engaging groove; 35. Cooling hole; 36. Slide groove; 37. Slider; 38. Second telescopic rod. Detailed Implementation

[0029] The following is in conjunction with the appendix Figure 1 -Appendix Figure 12 This application will be described in further detail.

[0030] Example 1 Embodiment 1 of this application discloses an external testing device for a computer interface device. (See also...) Figures 1-3The external testing device for computer interface equipment includes an environment simulation module 1, which is electrically connected to the motherboard to obtain the electrical parameters of the motherboard; the environment simulation module 1 is provided with an external plug 2, the network card under test 3 is provided with a gold finger interface 4 for connecting to the external plug 2, the network card under test 3 is provided with a test socket 5 for connecting to the testing equipment, and the testing equipment is connected to the test socket 5 through a test interface 6.

[0031] The environment simulation module 1 connects to the motherboard via a data cable. It incorporates an electrical parameter acquisition unit, a parameter processing unit, and an environment reproduction unit. The process of acquiring motherboard electrical parameters and simulating the environment is as follows: When electrically connected to the motherboard, the environment simulation module 1 uses a multi-channel probe from the acquisition unit to connect to the power supply, signal, and ground pins of the motherboard's M.2 interface. It acquires core electrical parameters such as the power supply voltage (e.g., 3.3V main power supply, 1.8V auxiliary power supply), current threshold, bus timing, and impedance matching provided by the motherboard for the M.2 device. After filtering and noise reduction by the parameter processing unit and comparison and calibration with the built-in motherboard M.2 interface standard parameter library, a standardized simulation parameter set is generated. Subsequently, the environment reproduction unit, through components such as a programmable power supply and timing generator, accurately outputs power supply, signal timing, and impedance characteristics consistent with the motherboard, reproducing the motherboard's real electrical environment. Simultaneously, it dynamically calibrates the output parameters through a real-time feedback loop to ensure the stability and consistency of the simulated environment, providing the network card under test (NIC 3) with test conditions that perfectly match the actual installation scenario.

[0032] During operation, the environment simulation module 1 is first electrically connected to the motherboard, enabling it to acquire the motherboard's native electrical parameters and accurately reproduce its electrical environment, providing the network card under test (NIC 3) with test conditions consistent with the actual computer installation scenario. Then, the gold finger interface 4 of NIC 3 is connected to the external connector 2 on the environment simulation module 1, enabling signal and power transmission between NIC 3 and the environment simulation module 1, thus placing NIC 3 in a simulated motherboard electrical environment. Finally, the test interface 6 of the test equipment is precisely connected to the test socket 5 of NIC 3, ensuring a stable signal transmission path is established. The test equipment can then send test commands and collect test data to NIC 3 through the test socket 5, completing various functional tests of the M.2 network card.

[0033] Reference Figures 1-3 The network card under test 3 has at least two opposing positioning seats 7 that can be detachably connected, and the two sides of the line of the test interface 6 abut against at least one positioning seat 7 respectively.

[0034] Reference Figures 1-3In Embodiment 1 of this application, two positioning seats 7 are provided. The positioning seats 7 are selected as positioning screws 71. The network card under test 3 has two threaded holes arranged opposite to each other. The two positioning screws 71 are respectively threaded into the corresponding threaded holes.

[0035] First, complete the initial connection between the test equipment and the network card under test (NIC 3) according to the test procedure. That is, accurately connect the test interface 6 of the test equipment to the test socket 5 of the NIC 3 to ensure that a stable signal transmission path is established between the two. Then, thread the two positioning screws 71 into the corresponding threaded holes. The side ends of the two positioning screws 71 abut against the two sides of the line of the test interface 6, and the end of the positioning screw 71 abuts against the front end of the line of the test interface 6. The rear end of the line of the test interface 6 contacts the NIC 3 under test. This ensures that the test interface 6 and the test socket 5 always maintain a stable connection state, effectively preventing the test interface 6 from being offset, loosened or even detached due to external force, equipment vibration or frequent operation in batch testing.

[0036] The implementation principle of the external testing device for computer interface equipment in Embodiment 1 of this application is as follows: The environment simulation module 1 plays a dual role of "intermediate transfer + environment simulation". On the one hand, it cooperates with the gold finger interface 4 of the network card under test 3 through the extension plug 2, avoiding the direct plugging and unplugging of the network card under test 3 to the motherboard core interface, reducing the risk of mechanical wear and damage to the motherboard core interface, and effectively protecting the expensive motherboard; on the other hand, by simulating the electrical environment of the motherboard, it ensures the accuracy and reliability of the test data. At the same time, the network card under test 3 is directly connected to the test equipment through the test socket 5, and the test can be completed without disassembling the chassis, which improves the convenience of the test operation, adapts to the batch testing of the production line and the R&D debugging scenario, and ultimately achieves the overall technical effect of reducing test costs and risks and improving test efficiency.

[0037] Example 2 The difference between Embodiment 2 and Embodiment 1 of this application is that: (Refer to...) Figures 4-9The network card under test 3 is provided with a card socket 8, and the card socket 8 has a first engagement slot 9 for the side end of the network card under test 3 to be inserted; the card socket 8 is movably provided with two opposing first abutment plates 10, and the card socket 8 is provided with an elastic element 11, which is used to drive the two first abutment plates 10 to move to abut against the two sides of the line of the test interface 6 respectively. When connecting the card connector 8 to the network card under test 3, first insert the edge of the network card under test 3 into the first engaging slot 9 on the card connector 8. Then, connect the test interface 6 of the test equipment to the test socket 5 on the network card under test 3. During the connection process, slightly move the two first abutting plates 10 so that the two first abutting plates 10 are respectively located on both sides of the line of the test interface 6. After the test interface 6 of the test equipment is connected to the test socket 5 on the network card under test 3, the elastic element 11 on the card connector 8 drives the two opposing first abutting plates 10 to move towards the line of the test interface 6 until the two first abutting plates 10 are tightly abutted against both sides of the line of the test interface 6. The elastic force of the elastic element 11 makes the first abutting plates 10 always form a stable clamping limit on the line of the test interface 6.

[0038] Reference Figures 4-9 Each of the two first abutment plates 10 has a slider 37 at the end furthest from the network card 3 under test. The card holder 8 has a groove 36 along the sliding direction of the first abutment plate 10. The groove 36 is horizontally arranged. Each slider 37 is located in a groove 36 and is slidably connected to the corresponding groove 36. Each groove 36 has a first telescopic rod 112. The fixed end of the first telescopic rod 112 is fixedly connected to the corresponding groove 36, and the movable end is fixedly connected to the corresponding slider 37. The elastic element 11 includes a plurality of second springs 111. Each groove 36 has a second spring 111. The second spring 111 is wound around the first telescopic rod 112 in the corresponding groove 36. One end of the second spring 111 is fixedly connected to the corresponding groove 36, and the other end is fixedly connected to the corresponding slider 37.

[0039] Reference Figures 4-9Each of the two opposing first abutment plates 10 has a first magnetic block 12 fixedly embedded on its close-to-each end face. The two first magnetic blocks 12 correspond one-to-one and their opposite end faces are magnetic poles of the same name, so that the two first magnetic blocks 12 form a magnetic repulsion engagement. The position of the two first magnetic blocks 12 corresponds to the line entry path of the test interface 6, and the repulsive force of the first magnetic blocks 12 is greater than the initial driving force of the second spring 111. When the test interface 6 is not connected to the test socket 5, the repulsive force of the two first magnetic blocks 12 can drive the two first abutment plates 10 away from each other, so as to form a space between the two first abutment plates 10 for the line of the test interface 6 to enter. When the test interface 6 is connected to the test socket 5, the line of the test interface 6 is located between the two first magnetic blocks 12 and forms a block against the two first magnetic blocks 12, isolating the repulsive force transmission between the two first magnetic blocks 12, so that the second spring 111 can drive the two first abutment plates 10 to approach each other and continuously abut against both sides of the line of the test interface 6.

[0040] Reference Figures 4-9 A movable rod 13 is fixedly connected to the mounting base 8, and a fixed sleeve rod 14 is slidably connected to the movable rod 13 on the same axis. Both the movable rod 13 and the fixed sleeve rod 14 are cylindrical structures. The end of the fixed sleeve rod 14 away from the movable rod 13 is detachably connected to the environmental simulation module 1. The distance between the mounting base 8 and the environmental simulation module 1 is adjusted by the relative sliding of the movable rod 13 and the fixed sleeve rod 14. A plurality of first positioning holes 15 are evenly spaced along the length of the movable rod 13, and the diameter of each first positioning hole 15 is the same. A second positioning hole is provided on the fixed sleeve rod 14 (Figure). (Not shown in the figure) The diameter of the second positioning hole is adapted to the diameter of the first positioning hole 15; a first positioning rod 17 is inserted into the second positioning hole, and the diameter of the first positioning rod 17 is adapted to the diameter of the second positioning hole and the first positioning hole 15. When the locking seat 8 is adjusted to the target position, the first positioning rod 17 can be simultaneously inserted into the aligned second positioning hole and any corresponding first positioning hole 15 to achieve relative locking between the movable rod 13 and the fixed sleeve rod 14; one end of the first positioning rod 17 is provided with an annular anti-detachment protrusion (not shown in the figure) to prevent the first positioning rod 17 from falling off after being inserted.

[0041] In Embodiment 2 of this application, a vacuum suction cup (not shown in the figure) is provided at the bottom of the fixing sleeve 14. The fixing sleeve 14 is adsorbed and fixed on the environmental simulation module 1 by the vacuum suction cup, and the connection method is quick and simple.

[0042] Reference Figures 4-9The device also includes a first connecting support 18. The network card under test 3 has a first connecting foot 19 integrally formed on it. The first connecting support 18 has a first slot 20 for inserting the first connecting foot 19. One end of the network card under test 3 is inserted into the extension plug 2 of the environment simulation module 1 through the gold finger interface 4, and the other end is inserted into the second connecting support 29 through the first connecting foot 19. Two opposing second abutment plates 21 are movably arranged in the first slot 20. Anti-slip pads (not shown in the figure) are provided on the opposite side of the two second abutment plates 21. The two second abutment plates 21 can abut against the two sides of the first connecting foot 19 respectively. The first slot 20 is provided with a driving component for driving the second abutment plates 21 to move in the direction toward the first connecting foot 19.

[0043] Reference Figures 4-9 The driving component includes a first spring 22 disposed in the first slot 20. One end of the first spring 22 is fixedly connected to the inner sidewall of the first slot 20, and the other end is fixedly connected to the side of the second abutment plate 21 away from the first connecting leg 19. The elastic extension and contraction direction of the first spring 22 is towards the first connecting leg 19. A second telescopic rod 38 is also disposed in the first slot 20. The fixed end of the second telescopic rod 38 is fixedly connected to the inner sidewall of the first slot 20, and the movable end is fixedly connected to the side of the second abutment plate 21 away from the first connecting leg 19. The first spring 22 is wound around the second telescopic rod 38, thereby making the movement of the first spring 22 more stable.

[0044] Reference Figures 4-9The bottom end of the second abutment plate 21 is provided with a slope 24. A push block 23 is movably provided in the first slot 20 along its insertion direction. The push block 23 is provided with a slope 24 that fits and conforms to the slope 24 at the bottom end of the second abutment plate 21. When the first connecting leg 19 is not inserted into the first slot 20, the push block 23 is located between the two second abutment plates 21 under the pre-tightening force of the first spring 22 and the support of its own structure, which pushes the two second abutment plates 21 to both sides, so that the entrance of the first slot 20 forms an insertion diameter with a cross-sectional dimension larger than that of the first connecting leg 19. When the first connecting leg 19 is inserted into the first slot 20, the bottom end of the first connecting leg 19 pushes the push block 23 to move towards the bottom end along the axial direction of the first slot 20. After the first connecting leg 19 is fully inserted into the first slot 20, the push block 23 is pushed to the bottom of the first slot 20 and remains stable. The inclined surface 24 on the push block 23 abuts against the inclined surface 24 at the bottom of the abutment plate, ensuring that the push block 23 will not completely detach from the second abutment plate 21. The bottom end of the first connecting leg 19 and the top end of the push block 23 are both fixedly embedded with second magnetic blocks (not shown in the figure). The opposite end faces of the two second magnetic blocks are opposite magnetic poles and adhere to each other. When the first connecting leg 19 moves out of the first slot 20, the magnetic attraction force of the two second magnetic blocks provides a linkage pulling force. With the guiding effect of the abutting inclined surface 24, the push block 23 moves upward synchronously with the first connecting leg 19. Finally, the push block 23 is repositioned between the two second abutment plates 21 and opens them up.

[0045] To further improve the stability of the push block 23 in the first slot 20, the size of the slot opening of the first slot 20 is smaller than the cross-section of the push block 23 so that the push block 23 will not detach from the first slot 20. At the slot opening of the first slot 20, a magnetic block is also provided that is magnetically attracted to the second magnetic block on the push block 23. The second magnetic block on the push block 23 is set upward, and the magnetic block on the first slot 20 is set downward. The second magnetic block on the first connecting leg 19 is also set downward. This ensures that the magnetic block at the slot opening of the first slot 20 will not interfere with the movement of the first connecting leg 19.

[0046] Reference Figures 4-9 The device also includes a mounting base 25, on which a mounting groove 26 is provided. A first mounting block 27 is provided on the first connecting support 18, and a second mounting block 28 is provided on the environmental simulation module 1. Both the first mounting block 27 and the second mounting block 28 are inserted into the mounting groove 26.

[0047] The implementation principle of Embodiment 2 of this application is as follows: During the assembly stage, the mounting base 25 is first placed as a unified assembly reference for the first connecting support 18 and the environmental simulation module 1; then, the first mounting block 27 on the first connecting support 18 and the second mounting block 28 on the environmental simulation module 1 are aligned with the mounting slots 26 on the mounting base 25 and inserted. Through the insertion and cooperation of the mounting slots 26 with the first mounting block 27 and the second mounting block 28, the first connecting support 18 and the environmental simulation module 1 are quickly positioned and initially fixed on the mounting base 25; since the first connecting support 18 is used to assemble and fix the network card under test 3, and the environmental simulation module 1 is used to provide a simulated electrical environment for the network card under test 3, the two are connected by the mounting base 25. After integrated assembly, it can ensure that the slot on the first connecting support 18 and the signal interface (such as the extension plug 2) of the environment simulation module 1 maintain a precise relative position, thereby enabling the network card under test 3 inserted into the slot to accurately establish a signal connection with the environment simulation module 1, avoiding poor docking caused by positional deviation between the two; during the test, the limiting effect of the mounting slot 26 on the first mounting block 27 and the second mounting block 28 can effectively limit the displacement or shaking of the first connecting support 18 and the environment simulation module 1, ensuring the stability of their relative positions, ensuring the continuous and stable signal transmission between the network card under test 3 and the environment simulation module 1, and the integrated assembly design also improves the compactness of the overall structure of the device, making it easier to transport and arrange in batch testing scenarios. The entire working process follows the logic of "installation base 25 provides a reference - double installation block insertion and positioning - integrated stable assembly", which realizes the rapid and accurate assembly of the first connecting support 18 and the environmental simulation module 1. This simplifies the assembly process of the device and ensures the relative position accuracy of key components through a unified reference, avoiding test anomalies caused by component misalignment, and providing a reliable structural foundation for the stable testing of the network card under test 3.

[0048] Example 3 The difference between Embodiment 3 and Embodiment 2 of this application is that: (Refer to...) Figure 10The device also includes a second connecting bracket 29 for assembling and positioning the network card under test (NIC 3). The NIC 3 is provided with a second connecting pin 30. The second connecting bracket 29 has a second slot 31 that matches the shape and size of the second connecting pin 30. The second slot 31 allows the second connecting pin 30 to be inserted for initial positioning. One end of the NIC 3 is connected to the outer plug 2 of the environment simulation module 1 through the gold finger interface 4, and the other end is connected to the second connecting bracket 29 through the second connecting pin 30. The second connecting bracket 29 has a second connecting pin 30 along the insertion direction perpendicular to the second slot 31. A first socket (not shown in the figure) is provided. A second socket (not shown in the figure) is provided on the second connecting leg 30 corresponding to the first socket. The diameters of the first socket and the second socket are adapted to each other and are aligned when the second connecting leg 30 is inserted into the second slot 31 to a preset position. A second positioning rod 32 is simultaneously inserted into the first socket and the second socket to fix the second connecting leg 30 and the second connecting support 29 relative to each other. The cross-sectional shape of the second positioning rod 32 is adapted to the first socket and the second socket. One end of the second positioning rod 32 is provided with an anti-dislodgement cap (not shown in the figure) to prevent the second positioning rod 32 from falling off after insertion.

[0049] The implementation principle of Embodiment 3 of this application is as follows: When assembling the network card under test 3, the operator first aligns the second connecting leg 30 on the network card under test 3 with the second slot 31 on the second connecting support 29 and inserts it. The insertion and removal of the second connecting leg 30 and the second slot 31 achieves the initial positioning of the network card under test 3 and the second connecting support 29, ensuring the approximate accuracy of their assembly positions. When the second connecting leg 30 is inserted to the preset position, the first socket on the second connecting support 29 and the second socket on the second connecting leg 30 will automatically align. At this time, the second positioning rod 32 is simultaneously inserted into the aligned first and second sockets. The second positioning rod 32 forms a rigid locking structure through a tight fit with the two sockets, securing the second connecting leg. The second connecting leg 30 is firmly locked to the second connecting bracket 29, thereby achieving stable assembly of the network card under test 3. During the test, this rigid locking structure can effectively limit the axial movement and radial rotation of the second connecting leg 30 in the second slot 31, completely preventing the network card under test 3 from being displaced due to external vibration, test operation touch, etc., ensuring that the test socket 5 and test interface 6, gold finger interface 4 and external plug 2 and other key connection parts on the network card under test 3 always maintain a stable cooperation relationship, ensuring the continuity and accuracy of signal transmission and test data acquisition. After the test is completed, simply pull out the second positioning rod 32 to release the locking state of the second connecting leg 30 and the second connecting bracket 29, and easily remove the network card under test 3 to complete the disassembly. The entire working process follows a simple logic of "slot initial positioning - socket alignment - second positioning rod 32 locking", which enables the rapid installation and removal of the network card under test 3 and precise and stable positioning. The operation is convenient and the locking is reliable. It is suitable for the high-frequency installation and removal needs of the network card under test 3 in batch testing. At the same time, it solves the problem of unstable positioning and easy displacement by relying solely on plugging and unplugging, further improving the stability and reliability of the testing device.

[0050] Example 4 The difference between Embodiment 4 and Embodiment 2 of this application is that: (Refer to...) Figures 11-12 The device also includes a cooling seat 33 for cooling the network card 3 under test to ensure test stability. The cooling seat 33 has a second engagement groove 34 for inserting the edge of the network card 3 under test. The shape and size of the second engagement groove 34 are adapted to the edge of the network card 3 under test, and an elastic anti-slip pad is provided in the groove to ensure that the edge of the network card 3 under test is precisely fitted and positioned with the cooling seat 33 after insertion. Multiple cooling holes 35 are evenly spaced along the extension direction of the edge of the network card 3 under test. The opening position of the cooling holes 35 corresponds to the heat-generating area of ​​the network card 3 under test. A cooling cavity (not shown in the figure) is opened in the cooling seat 33. Each cooling hole 35 is connected to the cooling cavity. The cooling cavity is provided with a flow divider to achieve uniform distribution of cold air. The cooling cavity is connected to an external cold air source through a sealed pipe. The cold air generated by the external cold air source can enter the cooling cavity through the pipe, and after being divided, it is guided through each cooling hole 35 to the heat-generating area of ​​the network card 3 under test to achieve convective heat transfer and cooling.

[0051] The external cold air source uses a miniature industrial air cooler, with an output cold air temperature range of 15-25℃ and an adjustable air speed (0.5-2m / s). It connects to the cooling chamber via sealed silicone tubing to ensure no cold air leakage. The applicable scenario is further explained: "This embodiment is suitable for long-term stability testing of high-power M.2 network cards. Precise cooling ensures the network card remains within a stable operating temperature range, avoiding data distortion caused by high temperatures."

[0052] The implementation principle of Embodiment 4 of this application is as follows: During the pre-test assembly stage, the staff aligns the edge of the network card under test 3 with the second engagement slot 34 on the cooling base 33 and inserts it. The limiting effect of the second engagement slot 34 ensures that the network card under test 3 and the cooling base 33 are precisely fitted, ensuring that the cooling holes 35 on the cooling base 33 can cover the heat-generating area of ​​the network card under test 3. Before the test, the pipeline connection between the cooling cavity and the external air source is completed to form a cold air circulation path. During the test, the external air source is started, and the cold air enters the cooling cavity in the cooling base 33 through the pipeline. The cooling cavity, as a buffer and diversion space for the cold air, allows the cold air to be evenly distributed before entering the multiple cooling holes 35 connected to it. The cooling holes 35 are opened along the edge of the network card under test 3, which can divert the cold air. The heat is directly directed to the heat-generating area of ​​the network card under test (NIC 3), and the heat generated by the NIC 3 is dissipated through forced convection heat exchange, achieving targeted cooling. At the same time, the fit of the second locking slot 34 not only ensures the alignment accuracy between the cooling hole 35 and the heat-generating area, but also enhances the heat conduction efficiency and assists in heat dissipation. The entire cooling process does not require additional manual adjustment. Through the coordinated logic of "locking positioning - cold air introduction - heat diversion", the operating temperature of the NIC 3 under test can be controlled in real time, avoiding the problem of excessive temperature caused by long-term high-load testing, ensuring that the NIC 3 under test is always in a stable operating temperature range, thereby ensuring the authenticity and reliability of the test data, especially suitable for long-term stability testing scenarios of high-power M.2 NICs.

[0053] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. An external testing device for a computer interface equipment, characterized in that: The system includes an environment simulation module (1), which is electrically connected to the motherboard to obtain the electrical parameters of the motherboard; the environment simulation module (1) is provided with an external plug (2); the network card under test (3) is provided with a gold finger interface (4) for connecting with the external plug (2); the network card under test (3) is provided with a test socket (5) for connecting with the test equipment; and the test equipment is connected to the test socket (5) through a test interface (6).

2. The external testing device for a computer interface device according to claim 1, characterized in that: The network card under test (3) is detachably connected to at least two opposing positioning seats (7), and the two sides of the line of the test interface (6) respectively abut against at least one of the positioning seats (7).

3. The external testing device for a computer interface device according to claim 1, characterized in that: The network card under test (3) is provided with a card holder (8), and the card holder (8) has a first engagement groove (9) for inserting the edge of the network card under test (3); the card holder (8) is movably provided with two opposing first abutment plates (10), and the card holder (8) is provided with an elastic element (11), which is used to drive the two first abutment plates (10) to move to abut against the two sides of the line of the test interface (6) respectively.

4. The external testing device for a computer interface device according to claim 3, characterized in that: Each of the two first abutting plates (10) is provided with a first magnetic block (12), and the two first magnetic blocks (12) are magnetic blocks with the same name and are arranged opposite each other.

5. The external testing device for a computer interface device according to claim 3, characterized in that: The card holder (8) is provided with a movable rod (13), and a fixed sleeve rod (14) is slidably connected to the movable rod (13) on the same axis. The end of the fixed sleeve rod (14) away from the movable rod (13) is detachably connected to the environment simulation module (1). The movable rod (13) is provided with a plurality of first positioning holes (15) spaced apart along the length direction. The fixed sleeve rod (14) is provided with a second positioning hole. A first positioning rod (17) passes through the second positioning hole. The first positioning rod (17) passes through any one of the first positioning holes (15) simultaneously.

6. The external testing device for a computer interface device according to claim 1, characterized in that: The device includes a first connecting bracket (18), and the network card under test (3) is provided with a first connecting foot (19). The first connecting bracket (18) is provided with a first slot (20) for inserting the first connecting foot (19). Two opposing second abutment plates (21) are movably provided in the first slot (20). The two second abutment plates (21) can abut against the two sides of the first connecting foot (19) respectively. The first slot (20) is provided with a driving member for driving the second abutment plates (21) to move in the direction toward the first connecting foot (19).

7. The external testing device for a computer interface device according to claim 6, characterized in that: The driving component includes a first spring (22) disposed in the first slot (20), one end of the first spring (22) being connected to the first slot (20), and the other end being connected to the side of the second abutment plate (21) away from the first connecting leg (19); a push block (23) is movably disposed in the first slot (20), and a second magnetic block is disposed on both the first connecting leg (19) and the push block (23), the two second magnetic blocks being opposite magnetic blocks and partially or completely attached, and along the insertion direction of the first slot (20), the cross-section of the push block (23) being larger than the cross-section of the first connecting leg (19); the bottom ends of the push block (23) and the second abutment plate (21) are both provided with mutually abutting inclined surfaces (24).

8. An external testing device for a computer interface device according to claim 6, characterized in that: The system includes a mounting base (25) with a mounting groove (26), a first mounting block (27) on the first connecting support (18), and a second mounting block (28) on the environment simulation module (1). Both the first mounting block (27) and the second mounting block (28) are inserted into the mounting groove (26).

9. An external testing device for a computer interface device according to claim 1, characterized in that: The device includes a second connecting support (29), and the network card under test (3) is provided with a second connecting foot (30). The second connecting support (29) has a second slot (31) for the second connecting foot (30) to be inserted. The second connecting support (29) has a first insertion hole, and the second connecting foot (30) has a second insertion hole. A second positioning rod (32) is inserted into the first insertion hole and the second insertion hole simultaneously.

10. An external testing device for a computer interface device according to claim 1, characterized in that: It includes a cooling base (33), on which a second engaging groove (34) is provided for the edge of the network card (3) to be tested to be inserted. The cooling base (33) has a cooling hole (35) along the edge of the network card (3) to be tested. A cooling cavity communicating with the cooling hole (35) is provided in the cooling base (33). The cooling cavity is connected to an external air source through a pipe.

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