Chip detection method and device, electronic equipment and storage medium
By using programmable integrated circuit chips to simulate the functions of analog-to-digital chips, raw analog data is obtained and operational indicators are collected, solving the problem of inaccurate detection in existing detection methods and achieving higher detection accuracy.
CN122068898APending Publication Date: 2026-05-19BEIJING TSINGTENG MICROSYSTEM CO LTD
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Patent Information
- Application Number
- CN202610119793.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-28
- Publication Date
- 2026-05-19
AI Technical Summary
Technical Problem
Existing chip testing methods cannot accurately reflect the relevant functions of digital and analog chips, resulting in inaccurate testing.
Method used
The current version of the chip under test is simulated using a programmable integrated circuit chip to obtain raw simulation data, run the target test chip, collect operating indicators, and determine the test results.
Benefits of technology
This improves the detection accuracy of the chip under test, making the detection results more consistent with the actual operating conditions.
✦ Generated by Eureka AI based on patent content.
Abstract
The embodiment of the invention discloses a chip detection method and device, electronic equipment and a storage medium, and can solve the problem that the detection of a digital-analog chip is not accurate enough due to the fact that an existing chip possibly cannot reflect related functions in the digital-analog chip very accurately. Obtaining original simulation data of the to-be-tested chip; based on the original simulation data, a target test chip is run, the target test chip is a chip obtained after the programmable integrated circuit chip simulates the function of the current version of the chip to be tested, and the current version is a version after version iteration; in the running process of the target test chip, running indexes are collected, and the detection result of the to-be-tested chip is determined according to the running indexes.
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