A general calibration circuit for high-speed serdes chip and working method thereof

Abstract

This invention provides a universal calibration circuit and its operating method for high-speed SerDes chips. The calibration circuit includes a central calibration controller and multiple calibration operation units. Each calibration operation unit has a calibration core module configured to execute a preset calibration algorithm. At least one calibration operation unit executes a different calibration algorithm than another. The central calibration controller is configured to acquire calibration request information and select one of the multiple calibration operation units as the target calibration operation unit based on the calibration request information, setting the calibration parameters for the current calibration operation of the target calibration operation unit. After the target calibration operation unit completes its current calibration operation, the calibration result output by the target calibration operation unit is acquired and output. This invention also provides a method for operating the above-mentioned calibration circuit. The universal calibration circuit of this invention can calibrate various electronic modules or deviations, has good versatility, and each calibration operation unit has high reusability.

Description

Technical Field

[0001] This invention relates to the technical field of digital circuit calibration, specifically to a universal calibration circuit for high-speed SerDes chips and a method for operating such a calibration circuit. Background Technology

[0002] Currently, data centers and high-performance computing systems widely use electronic modules such as SerDes (Serializer / Deserializer) chips, analog-to-digital converters (ADCs), and phase-locked loops (PLLs). During the integrated circuit manufacturing process, various electronic modules may experience performance degradation due to factors such as manufacturing process deviations, temperature variations in the operating environment, voltage fluctuations, and device aging. Therefore, calibration of electronic modules is necessary.

[0003] Currently, the common calibration method involves setting up calibration circuits for various types of electronic modules. Common calibration circuits include... Figure 1 As shown, a conventional calibration circuit includes a calibration counting logic module 11 and a calibration control state machine 12. The calibration counting logic module 11 receives a calibration result feedback signal, performs calibration counting based on the received calibration result feedback, and outputs the calibration result. The calibration control state machine 12 is used to control the operation of the calibration counting logic module 11, including implementing step size control, start and end condition judgment, etc.

[0004] However, current calibration methods typically involve designing a dedicated calibration control state machine and counting logic for a specific electronic module or a particular type of deviation. This approach has the following drawbacks: First, the calibration logic is highly coupled with the specific circuit, making it difficult to match with other circuits and resulting in poor reusability of the calibration circuit. Second, different calibration tasks require independently designed corresponding control state machines, leading to long development cycles for the calibration circuit. Third, if the calibration process or parameters of the calibration circuit need to be modified, the hardware of the calibration circuit must be redesigned, resulting in insufficient flexibility. Fourth, the calibration resources of the calibration circuit cannot be shared between different modules or at different times, resulting in a waste of integrated circuit area and power consumption. Summary of the Invention

[0005] The primary objective of this invention is to provide a universal calibration circuit for high-speed SerDes chips that is compatible with various electronic modules or various deviation calibrations.

[0006] A second objective of this invention is to provide a method for operating a universal calibration circuit for high-speed SerDes chips that can calibrate a variety of different circuits or deviations.

[0007] To achieve the first objective of this invention, the universal calibration circuit for high-speed SerDes chips provided by this invention includes a central calibration controller and at least two calibration operation units. Each calibration operation unit has a calibration core module, which is configured to execute a preset calibration algorithm. The calibration algorithm executed by at least one calibration operation unit is different from the calibration algorithm executed by another calibration operation unit. The central calibration controller is configured to acquire calibration request information and select one of the multiple calibration operation units as the target calibration operation unit based on the calibration request information, and set the calibration parameters for the current calibration operation of the target calibration operation unit. After the current calibration operation of the target calibration operation unit is completed, the calibration result output by the target calibration operation unit is acquired and output.

[0008] As can be seen from the above scheme, the universal calibration circuit contains multiple calibration operation units, and these units can run various different calibration algorithms. Therefore, the universal calibration circuit can perform calculations for multiple different calibration algorithms. Thus, when calibrating different electronic modules or different deviations, different calibration operation units within the universal calibration circuit can be used for calibration calculations, thereby achieving the universality and compatibility of the calibration circuit.

[0009] In addition, the central calibration controller can control the collaborative work of multiple calibration calculation units, enabling multiple calibration calculation units to perform calibration calculations on different calibration quantities at different times. This allows a single calibration calculation unit to calibrate different electronic modules or different deviations, effectively improving the reusability of the calibration circuit.

[0010] A preferred embodiment is that the central calibration controller is equipped with a task scheduling module, which controls the start and stop of each calibration operation unit according to the calibration request information, and enables at least two calibration operation units to be running at the same time.

[0011] Therefore, by setting multiple calibration calculation units to operate simultaneously, the general calibration circuit can perform calibration calculations on multiple calibration quantities at the same time, thereby improving the calibration efficiency of the general calibration circuit.

[0012] A preferred embodiment is that the central calibration controller is also equipped with an interrupt and status feedback module, which is used to acquire interrupt signals sent by the calibration calculation unit and control the operation of the calibration calculation unit according to the interrupt signals.

[0013] Therefore, when the calibration calculation unit completes the current calibration calculation, it will output an interrupt request signal to the central calibration controller. The central calibration controller will determine the operating status of each calibration calculation unit based on the interrupt request signal, such as stopping the operation of the calibration calculation unit or enabling the calibration calculation unit to perform calibration calculation for the next calibration quantity.

[0014] A further approach is to include an input preprocessing module in the calibration calculation unit, which is used to select the input signal and obtain the initial value required for the calibration calculation, and then output the initial value to the calibration core module.

[0015] As can be seen, the calibration calculation unit obtains the initial values ​​required for calibration calculation through the input preprocessing module, and can also perform preprocessing operations such as injection format conversion. In addition, it can also receive control signals such as start and stop calibration sent by the central calibration controller.

[0016] A further improvement is that the calibration calculation unit is also equipped with an output post-processing module, which is used to convert the format of the calibration results of the calibration core module and mark the calibration completion status.

[0017] Therefore, after the calibration core module outputs the calibration results, the output post-processing module can convert the format of the calibration results to meet the requirements of subsequent analog circuits. In addition, the output post-processing module can also mark the calibration completion status of the calibration operation units, thus allowing the central calibration controller to understand the working status of each calibration operation unit.

[0018] To achieve the second objective mentioned above, the operating method of the universal calibration circuit for high-speed SerDes chips provided by the present invention includes: a central calibration controller of the universal calibration circuit acquires calibration request information, and selects one of the multiple calibration operation units of the universal calibration circuit as the target calibration operation unit according to the calibration request information; wherein, each calibration operation unit has a calibration core module, the calibration core module is configured to execute a preset calibration algorithm, and the calibration algorithm executed by at least one calibration operation unit is different from the calibration algorithm executed by another calibration operation unit; the central calibration controller sets the calibration parameters for the current calibration operation of the target calibration operation unit, the target calibration operation unit applies the calibration parameters to perform the calibration operation, and after the current calibration operation is completed, outputs the calibration result to the central calibration controller, and the central calibration controller outputs the calibration result.

[0019] As can be seen from the above scheme, the present invention controls the operation of multiple calibration operation units through a central calibration controller of a universal calibration circuit. These multiple calibration operation units can support a variety of different calibration algorithms, thereby meeting the calibration requirements of different electronic modules or deviations. This achieves the universality and compatibility of the universal calibration circuit, avoiding the need to develop a specific calibration circuit for each electronic module or each deviation, reducing calibration costs and improving calibration flexibility.

[0020] A further approach is that after the central calibration controller obtains multiple calibration request messages, it determines whether there is a dependency relationship between the calibration operations corresponding to the multiple calibration request messages. If a dependency relationship exists, it controls the calibration operation unit to execute the corresponding calibration operation according to the dependency order.

[0021] Therefore, when dealing with multiple dependent calibration request messages, the central calibration controller coordinates the processing order of each calibration request message, ensuring that each calibration quantity is calibrated sequentially according to a pre-set order, thereby ensuring the rationality and accuracy of the calibration calculation.

[0022] A further approach is that, after the central calibration controller acquires multiple calibration request messages, if it confirms that the multiple calibration request messages can be executed by at least two calibration operation units, it controls at least two calibration operation units to run their respective calibration algorithms simultaneously.

[0023] As can be seen, multiple calibration operation units can execute their respective calibration algorithms simultaneously, enabling the general calibration circuit to perform calibration processing on multiple different calibration quantities at the same time, thereby improving the efficiency of calibration operations.

[0024] A further approach is that after the target calibration calculation unit completes the current calibration calculation, it sends an interrupt request signal to the central calibration controller and determines whether there are any calibration quantities that need to be calibrated. If so, it obtains the next calibration quantity and performs the calibration calculation.

[0025] Therefore, after the calibration calculation unit completes the current calibration calculation, the central calibration controller can reasonably control the operation of the calibration calculation unit, such as stopping the calibration calculation unit or performing calibration calculation for the next calibration quantity, so that the calibration calculation unit can run continuously.

[0026] A further approach is to have the calibration calculation unit calculate the calibration result, determine whether the calibration result needs to be formatted, and if so, output the calibration result after formatting.

[0027] Therefore, when the subsequent analog circuit has special requirements for the format of the calibration results, the calibration operation unit can also perform format conversion processing on the calibration results, so that the subsequent analog circuit can receive calibration results that meet the format requirements. Attached Figure Description

[0028] Figure 1 This is a block diagram of the existing calibration circuit.

[0029] Figure 2 This is a structural block diagram of an embodiment of the general calibration circuit for high-speed SerDes chips according to the present invention.

[0030] Figure 3 This is a flowchart illustrating an embodiment of the working method of the universal calibration circuit for high-speed SerDes chips according to the present invention.

[0031] Figure 4 This is a flowchart illustrating the calibration operation performed by the target calibration unit in an embodiment of the working method of the universal calibration circuit for high-speed SerDes chips according to the present invention.

[0032] Figure 5 This is a flowchart for generating the top-level configuration of the universal calibration circuit for high-speed SerDes chips according to the present invention.

[0033] The present invention will be further described below with reference to the accompanying drawings and embodiments. Detailed Implementation

[0034] The universal calibration circuit for high-speed SerDes chips of this invention is used to calibrate electronic modules or various signal deviations. During the manufacturing process of integrated circuits such as SerDes chips, by setting multiple calibration operation units within the universal calibration circuit, and these multiple calibration operation units being able to implement various different calibration algorithms, the universal calibration circuit can be compatible with the calibration operations of various different electronic modules or deviations, thereby achieving the universality and compatibility of the universal calibration circuit. In this way, only one universal calibration circuit needs to be set within the chip to meet the calibration requirements of various different electronic modules or deviations, avoiding the need for a large number of calibration circuits within the chip. This effectively reduces the hardware complexity of the chip and also reduces the chip area, thus contributing to chip miniaturization.

[0035] Example of a general calibration circuit for high-speed SerDes chips: See Figure 2 This embodiment includes a central calibration controller 20 and four calibration calculation units, including a first calibration calculation unit 30, a second calibration calculation unit 40, a third calibration calculation unit 50, and a fourth calibration calculation unit 60. The central calibration controller 20 can send control signals to the first calibration calculation unit 30, the second calibration calculation unit 40, the third calibration calculation unit 50, and the fourth calibration calculation unit 60 to control the operation of the four calibration calculation units. For example, it can start one or more calibration calculation units, or stop the operation of one calibration calculation unit, and can also send the calibration parameters required for calibration calculation to each calibration calculation unit.

[0036] The central calibration controller 20 includes a task scheduling module 21 and an interrupt and status feedback module 22. The task scheduling module 21 primarily acquires external calibration request information and determines which calibration calculation unit should be used for calibration based on the received request. After determining which unit to use, it also controls the start or stop of that unit. The interrupt and status feedback module 22 receives interrupt request signals from each calibration calculation unit and acquires the calibration results output by each module. Furthermore, it records the operating status of each calibration calculation unit. For example, when a unit returns a calibration result, it determines whether the unit needs to continue calibrating other quantities, thus deciding whether to stop or proceed with the next calibration. The interrupt and status feedback module 22 also needs to determine whether the calibration processing of each calibration calculation unit has timed out, for example, if the preset running time has been exceeded. If a timeout occurs, a stop signal needs to be sent to the calibration calculation unit so that the calibration calculation unit stops the current calibration calculation and outputs the calibration result, thus avoiding the calibration calculation unit from running for a long time and causing low calibration efficiency.

[0037] In this embodiment, the internal structures of the first calibration calculation unit 30, the second calibration calculation unit 40, the third calibration calculation unit 50, and the fourth calibration calculation unit 60 are the same. For example, the first calibration calculation unit 30 is provided with a first input preprocessing module 31, a first calibration core module 32, and a first output postprocessing module 33; the second calibration calculation unit 40 is provided with a second input preprocessing module 41, a second calibration core module 42, and a second output postprocessing module 43; the third calibration calculation unit 50 is provided with a third input preprocessing module 51, a third calibration core module 52, and a third output postprocessing module 53; and the fourth calibration calculation unit 60 is provided with a fourth input preprocessing module 61, a fourth calibration core module 62, and a fourth output postprocessing module 63.

[0038] The following description uses the first calibration operation unit 30 as an example. The first input preprocessing module 31 is used to select the input signal, perform format conversion on the received input signal, and load the initial calibration value. Specifically, the first input preprocessing module 31 can select the signal output by the first calibration core module 32 after calibration, and use the calibrated output signal as the input for the next calibration, thereby realizing iterative calibration operations. Furthermore, the first input preprocessing module 31 can also perform input signal format conversion, for example, converting the format of the signal output by the analog circuit into a format that the first calibration core module 32 can recognize, thereby facilitating the first calibration core module 32 to process the input signal. In addition, the first input preprocessing module 31 also obtains the initial value used for calibration from the central calibration controller 20 and sends the obtained initial value to the first calibration core module 32 for calibration operations.

[0039] The first calibration core module 32 is used to run specific calibration algorithms. In this embodiment, the calibration core modules of multiple calibration operation units run at least two calibration algorithms. For example, the calibration algorithm run by the first calibration core module 32 is a binary search algorithm, the calibration algorithm run by the second calibration core module 42 of the second calibration operation unit 40 is a linear step method, the calibration algorithm run by the third calibration core module 52 of the third calibration operation unit 50 is the golden section method, and the calibration algorithm run by the fourth calibration core module 62 of the fourth calibration operation unit 60 is the historical record backtracking method. In this way, the multiple calibration operation units of the general calibration circuit can support a variety of different calibration algorithms. The general calibration circuit can select a suitable calibration operation unit from the multiple calibration operation units to perform calibration processing on the current calibration quantity according to the type and deviation type of the electronic module that needs to be calibrated.

[0040] The first output post-processing module 33 can acquire the calibration result output by the first calibration core module 32 and perform format conversion on the calibration result. It should be noted that format conversion of the calibration result is not mandatory, but depends on the requirements of the subsequent analog circuit. If the subsequent analog circuit requires a specific signal format, the format of the calibration result needs to be converted to the format required by the subsequent analog circuit; if the subsequent analog circuit does not require a special format, format conversion is not necessary. In addition, the first output post-processing module 33 is also used to enable the output of the calibration result, that is, to control whether the first calibration operation unit 30 outputs the calibration result. Furthermore, the first output post-processing module 33 is also used to implement the status flag of the first calibration operation unit 30, that is, to mark whether the current calibration operation is completed, and whether the current calibration operation is a single calibration or requires repeated calibration.

[0041] Since multiple calibration processing units can operate independently, the central calibration controller 20 needs to control the operation of each unit separately. Specifically, the task scheduling module 21 needs to determine which calibration processing unit to use for calibration based on the current calibration request information and control the start and stop of the corresponding unit. Furthermore, multiple calibration processing units can operate synchronously. For example, while the first calibration processing unit 30 is running, if another calibration request can be processed by the second calibration processing unit 40, the central calibration controller 20 can still send a start command to the second calibration processing unit 40 to start it, even if the first unit is still running. If multiple calibration requests need to be processed by the same unit, the central calibration controller 20 uses the task scheduling module 21 to rationally schedule the execution order of these requests.

[0042] Furthermore, the task scheduling module 21 also needs to enable the collaborative operation of multiple calibration calculation units. For example, if the central calibration controller 20 receives multiple calibration request messages, and the calibration quantities required by these multiple collimation request messages are dependent on each other (e.g., calibration quantity B depends on the calibration result of calibration quantity A), then the task scheduling module 21 needs to coordinate with multiple calibration budget units to first calibrate calibration quantity A. After calibration quantity A is processed, calibration quantity B is processed based on the calibration result of calibration quantity A. In this way, the accuracy of the calibration result of calibration quantity B can be ensured.

[0043] Example of operation method for a general calibration circuit for high-speed SerDes chips: The following is combined Figure 3 The working method of the general calibration circuit is introduced. First, in step S11, the central calibration controller obtains calibration request information. Typically, the calibration request information includes the calibration quantity that needs to be calibrated, which electronic module or deviation needs to be calibrated, and other information. After obtaining the calibration request information, the central calibration controller needs to analyze the received calibration request information and execute step S12 to determine one calibration operation unit as the target calibration operation unit from multiple calibration operation units. For example, if the current calibration request information requires calibration operation of the calibration quantity using a binary search algorithm, then it can be determined that the calibration request information needs to be processed by the first calibration operation unit, and the first calibration operation unit will be the target calibration operation unit for the current calibration operation.

[0044] Next, the central calibration controller executes step S13, sending the calibration parameters required for the current calibration operation to the target calibration calculation unit, such as calibration step size, maximum calibration value, minimum calibration value, and calibration mode. Then, the target calibration calculation unit executes step S14, applying the acquired calibration parameters to perform the calibration operation. Since the calibration algorithm executed by the calibration core module of each calibration operation unit is fixed, the calibration operation of the target calibration calculation unit for the current calibration quantity is performed based on the calibration algorithm supported by that calibration core module.

[0045] After the calibration core module completes the calibration processing of the calibration quantity, it executes step S15 to output the calibration result to the output post-processing module. The output post-processing module determines whether the calibration result needs to be format converted. If format conversion is required, the calibration result is converted into a preset format according to the actual needs of the subsequent analog circuit. If format conversion is not required, an interrupt request signal is sent directly to the central calibration processor to inform the central calibration controller that the current calibration operation has been completed.

[0046] Finally, the central calibration controller executes step S16, receiving the calibration result output by the target calibration calculation unit. It also needs to determine the operating status of the target calibration calculation unit. For example, if there are no further calibration quantities that the target calibration calculation unit needs to process, it sends a stop command to the target calibration calculation unit, causing it to exit the operating state. Simultaneously, the central calibration controller needs to record the operating status of each calibration calculation unit, marking whether each unit is in the running or stopped state. If, after completing the current calibration calculation, the target calibration calculation unit still needs to process other calibration quantities (e.g., another calibration request message requiring calibration processing), the central calibration controller sends the next calibration quantity to the target calibration calculation unit, which then performs the calibration calculation for that quantity.

[0047] See Figure 4 When the target calibration calculation unit runs, it first executes step S21 to set the initial parameters of the target calibration calculation unit. The initial parameters can be pre-set initialization parameters, such as the initial calibration step size, the initial calibration maximum value, and the initial calibration minimum value. During subsequent calibration calculations, the parameters required for calibration can be adjusted according to the actual calibration situation. However, if the central calibration controller does not adjust the calibration parameters during subsequent calibration calculations, the calibration calculation unit directly uses the initial parameters as the parameters for calibration calculations.

[0048] For a given calibration request, the central calibration controller will send the calibration parameters required for the current calibration operation. Therefore, the target calibration operation unit will execute step S22 to obtain the calibration parameters for the current calibration operation, thereby updating the calibration parameters. Then, step S23 is executed, whereby the current calibration value is calibrated according to the instructions received from the central calibration controller. The parameters during the calibration operation are strictly executed according to the calibration parameters obtained in step S22.

[0049] Then, the target calibration calculation unit executes step S24 to determine whether the termination condition of the calibration calculation has been reached. The central calibration controller can set the termination condition for each calibration calculation and send it to the target calibration calculation unit. The termination condition may include the calibration amount not changing for multiple consecutive times, reaching a preset number of iterations, reaching a preset calibration calculation duration, etc. If the preset termination condition has not been reached, the execution returns to step S23, and the target calibration calculation unit continues to perform the calibration calculation; if the preset termination condition has been reached, step S25 is executed, and the calibration result is output to the central calibration controller. Of course, if the subsequent analog circuits have special requirements for the format of the calibration result, the calibration result needs to be format converted before output.

[0050] Before the target calibration calculation unit outputs the calibration result to the central calibration controller, it needs to output an interrupt request signal to the central calibration controller. After receiving the interrupt request signal, the central calibration controller needs to determine whether the target calibration calculation unit still has calibration quantities to process, i.e., execute step S26. If there are no calibration quantities to process, it sends a stop operation command to the target calibration calculation unit, and the target calibration calculation unit will stop running. If the target calibration calculation unit still has calibration quantities to process, it executes step S27 to obtain the next calibration quantity to be processed, and returns to execute step S22 to obtain the calibration parameters for the next calibration quantity to be processed, and then performs the calibration calculation again.

[0051] Preferably, after receiving multiple calibration request messages, the central calibration controller determines the calibration quantities that need to be processed for each request and identifies which calibration processing unit should perform the calibration for each request. Furthermore, for each calibration processing unit, the central calibration controller can create a calibration quantity queue, which records the multiple calibration quantities that the unit needs to process. The central calibration controller then instructs the calibration processing units to sequentially perform calibration calculations on each calibration quantity according to the order of the calibration queue.

[0052] Thus, in step S26, the central calibration controller can determine whether there are any unprocessed calibration quantities in the calibration quantity queue corresponding to the target calibration operation unit. If there are any unprocessed calibration quantities, then step S27 is executed to obtain the next calibration quantity from the calibration quantity queue and perform the corresponding calibration operation.

[0053] Because different calibration operation units have their own corresponding calibration quantity queues, each calibration operation unit can operate independently. This means that multiple calibration operation units can run simultaneously, thereby improving the efficiency of the general-purpose calibration circuit in processing calibration operations. For example, when two calibration operation units need to run, they can be started sequentially or randomly, and both units will be in calibration mode simultaneously.

[0054] The universal calibration circuit of this invention can be customized according to the actual needs of the chip. In other words, during integrated circuit manufacturing, this invention can generate the number of cores in the top-level configuration of the universal calibration circuit based on calibration requirements. These calibration requirements are determined early in the chip design process based on actual needs, such as determining the required number of calibration core modules and the reuse status of these modules.

[0055] For details, see Figure 5 In the early stages of developing a chip calibration scheme, designers need to execute step S31 to obtain a calibration requirement table for the general calibration circuit, which is also the configuration table for the general calibration circuit. This configuration table contains the chip's calibration requirements, such as which electronic modules or deviations need to be calibrated, and the quantity of each calibration quantity. Then, step S32 is executed to obtain the top-level configuration generation script for the general calibration circuit. This script is a pre-defined program used to generate the top-level configuration of the general calibration circuit. Finally, step S33 is executed to apply the top-level configuration generation script to generate the top-level configuration of the general calibration circuit based on the configuration table. This determines the number of calibration operation units in the general calibration circuit, the calibration algorithm to be run, and the configuration information of each calibration operation unit.

[0056] Compared to some existing general-purpose calibration circuits that use a single calibration algorithm to calibrate multiple different analog circuits, this embodiment sets up multiple calibration operation units to run various different calibration algorithms. It can select a calibration operation unit that can implement a specific calibration algorithm from multiple calibration operation units according to actual usage requirements to calibrate the current circuit. Therefore, the general-purpose calibration circuit of this embodiment can be applied to the calibration of circuits with different calibration algorithm requirements and has good compatibility.

[0057] Furthermore, this embodiment coordinates the work of multiple calibration operation units through a central calibration controller, and in particular, enables multiple calibration operation units to run simultaneously, that is, multiple different calibration algorithms can be performed at the same time. In this way, the calibration processing efficiency of various types of circuits can be greatly improved.

[0058] Furthermore, since the multiple calibration operation units of the universal calibration circuit of this invention can run various different calibration algorithms, the universal calibration circuit can perform calibration operations on various different electronic modules or deviations. Thus, during chip design, only one universal calibration circuit needs to be set within the chip to meet the calibration requirements of various different electronic modules and deviations. Moreover, since each calibration operation unit can operate in a time-division multiplexing manner, meaning that the same calibration operation unit can perform calibration operations on the calibration values ​​of multiple electronic modules, the calibration logic can be reused. This avoids the problem that a single calibration core module can only meet the calibration needs of an electronic module with a specific structure or a specific deviation, giving the universal calibration circuit high versatility and compatibility, and high reusability of the calibration operation units. Because only one universal calibration circuit needs to be set within the chip, instead of a large number of dedicated calibration circuits, the number of components on the chip can be effectively reduced, thereby reducing the area occupied by the universal calibration circuit, which is beneficial for chip miniaturization and can also reduce chip production costs.

[0059] Furthermore, during chip design, after determining the chip's calibration requirements, a top-level configuration generation script can be used to generate the top-level configuration of a general calibration circuit based on a configuration table. This allows for flexible configuration of each calibration operation unit; for example, the number and type of calibration operation units can be flexibly configured according to the requirements of the calibration algorithm and the required calibration amount, thus enabling flexible addition and removal of calibration operation units. This method allows for flexible adjustment of the number of calibration operation units in different chips to meet the design requirements of different types of chips, and makes the design of general calibration circuits for chips very convenient and flexible.

[0060] Finally, it should be emphasized that the above are merely preferred embodiments of the present invention and are not intended to limit the present invention. For those skilled in the art, the present invention can have various changes and modifications. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A universal calibration circuit for high-speed SerDes chips, characterized in that, include: The system includes a central calibration controller and at least two calibration calculation units, each having a calibration core module configured to execute a preset calibration algorithm, wherein at least one of the calibration calculation units executes a calibration algorithm different from that executed by the other calibration calculation unit. The central calibration controller is configured to acquire calibration request information, select one of the multiple calibration calculation units as the target calibration calculation unit according to the calibration request information, set the calibration parameters of the target calibration calculation unit for the current calibration calculation, and acquire and output the calibration result output by the target calibration calculation unit after the current calibration calculation of the target calibration calculation unit is completed.

2. The universal calibration circuit for high-speed SerDes chips according to claim 1, characterized in that: The central calibration controller is equipped with a task scheduling module, which controls the start and stop of each calibration operation unit according to the calibration request information, so that at least two calibration operation units are running at the same time.

3. The universal calibration circuit for high-speed SerDes chips according to claim 2, characterized in that: The central calibration controller is also equipped with an interrupt and status feedback module, which is used to acquire the interrupt signal sent by the calibration calculation unit and control the operation of the calibration calculation unit according to the interrupt signal.

4. The universal calibration circuit for high-speed SerDes chips according to any one of claims 1 to 3, characterized in that: The calibration calculation unit is also provided with an input preprocessing module, which is used to select the input signal and obtain the initial value required for the calibration calculation, and output the initial value to the calibration core module.

5. The universal calibration circuit for high-speed SerDes chips according to claim 4, characterized in that: The calibration calculation unit is also equipped with an output post-processing module, which is used to convert the format of the calibration results of the calibration core module and mark the calibration completion status.

6. A method for operating a universal calibration circuit for high-speed SerDes chips, characterized in that, include: The central calibration controller of the general calibration circuit acquires calibration request information and selects one of the multiple calibration operation units of the general calibration circuit as the target calibration operation unit according to the calibration request information; wherein, each calibration operation unit has a calibration core module, the calibration core module is configured to execute a preset calibration algorithm, and the calibration algorithm executed by at least one calibration operation unit is different from the calibration algorithm executed by another calibration operation unit; The central calibration controller sets the calibration parameters for the current calibration operation of the target calibration operation unit. The target calibration operation unit applies the calibration parameters to perform the calibration operation. After the current calibration operation is completed, the calibration result is output to the central calibration controller, which then outputs the calibration result.

7. The method of operating the universal calibration circuit for high-speed SerDes chips according to claim 6, characterized in that: After the central calibration controller acquires multiple calibration request messages, it determines whether there is a dependency relationship between the calibration operations corresponding to the multiple calibration request messages. If there is a dependency relationship, it controls the calibration operation unit to execute the corresponding calibration operation according to the dependency relationship and the dependency order.

8. The method of operating the universal calibration circuit for high-speed SerDes chips according to claim 6, characterized in that: After the central calibration controller acquires multiple calibration request messages, if it confirms that the multiple calibration request messages can be executed by at least two of the calibration calculation units, it controls at least two of the calibration calculation units to run their respective calibration algorithms simultaneously.

9. The method of operating a universal calibration circuit for a high-speed SerDes chip according to any one of claims 6 to 8, characterized in that: After completing the current calibration operation, the target calibration calculation unit sends an interrupt request signal to the central calibration controller and determines whether there are any calibration values ​​that need to be calibrated. If so, it obtains the next calibration value and performs the calibration operation.

10. The method of operating a universal calibration circuit for a high-speed SerDes chip according to any one of claims 6 to 8, characterized in that: After the calibration calculation unit calculates the calibration result, it determines whether the calibration result needs to be format converted. If so, it outputs the calibration result after format conversion.

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