A method, apparatus and computer-readable storage medium for testing power line performance.

By simplifying the PLC testing environment and connecting the device under test (DUT) and the host computer respectively, and using throughput as a metric, the problems of high cost and low coverage in existing PLC testing are solved, achieving low-cost and efficient power line performance testing.

CN122092902APending Publication Date: 2026-05-26YISHENG (WUHAN) TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
YISHENG (WUHAN) TECH CO LTD
Filing Date
2026-02-06
Publication Date
2026-05-26

AI Technical Summary

Technical Problem

Existing PLC testing equipment is expensive and operates in complex environments, making it difficult to effectively test power line data transmission performance, resulting in high testing costs and low coverage.

Method used

By connecting the communication ports of the device under test (DUT) and the host computer respectively, and connecting them to the same power socket using network cables and power cords, and setting them to transmit and receive modes respectively, the transmit and receive indicators of the DUT are judged by throughput and preset thresholds, simplifying the test environment and reducing dependence on specific equipment.

Benefits of technology

It enables low-cost and simple power line performance testing, improves testing efficiency and effectiveness, reduces equipment and manpower investment, and simplifies the testing process.

✦ Generated by Eureka AI based on patent content.

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Abstract

This invention discloses a power line performance testing method, device, and computer-readable storage medium. The method involves connecting the communication ports of the device under test (DUT) and the receiver to a host computer via network cables, and connecting their power ports to the same power outlet via power cables. On one hand, the DUT and the receiver are respectively set to transmit and receive modes. The DUT's compliance with preset transmit parameters is determined based on a first throughput of the receiver and a preset first threshold. On the other hand, the DUT and the receiver are respectively set to receive and transmit modes. The DUT's compliance with preset receive parameters is determined based on a second throughput of the receiver and a preset second threshold. This invention provides a lower-cost and simpler power line performance testing solution, eliminating the need for specific testing equipment and effectively improving testing efficiency and results.
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Description

Technical Field

[0001] This invention relates to the field of wireless communication device testing, and more particularly to a power line performance testing method, device, and computer-readable storage medium. Background Technology

[0002] With the diversification of wireless products, the market has launched PLC (Power Line Communication) carrier communication products that support broadband MIMO (Multiple Input Multiple Output), which transmit wireless data through PLCs.

[0003] Currently, PLC testing involves expensive equipment, complex networking environments, and existing testing solutions that cannot directly measure relevant indicators of data transmission over power lines.

[0004] Therefore, how to reduce PLC testing costs, increase coverage, and effectively test PLC transmission performance has become an urgent technical problem to be solved. Summary of the Invention

[0005] In order to overcome the shortcomings of the prior art, the present invention aims to provide a power line performance testing method, equipment and computer-readable storage medium to solve the problems of high cost, low coverage and inability to effectively detect PLC transmission performance in current PLC testing.

[0006] This invention proposes a power line performance testing method applied to a host computer, wherein the communication ports of the device under test (DUT) and the receiver are respectively connected to the host computer via network cables, and the power ports of the DUT and the receiver are respectively connected to the same power socket via power cords. The method includes: The device under test and the gold machine are respectively set to transmit mode and receive mode. The device under test is determined to meet the preset transmission index based on the first throughput of the gold machine and the preset first threshold. The device under test (DUT) and the gold device are respectively set to receiving mode and transmitting mode. The device under test is determined to meet the preset receiving index based on the second throughput of the DUT and the preset second threshold.

[0007] Optionally, the step of setting the device under test and the gold device to transmit mode and receive mode respectively includes: The power line functions of the device under test and the gold-plated machine are activated respectively; Based on the serial number of the device under test (DUT), powerline domain names are created for the DUT and the gold device, so that the DUT and the gold device can perform powerline networking.

[0008] Optionally, the step of setting the device under test and the gold device to transmit mode and receive mode respectively includes: A steady-state rate query command is sent to the device under test to obtain the transmit and receive rates of the device under test when there is no data throughput in the power line network. When the transmit / receive rate meets the preset third threshold, the transmit / receive test of the device under test is performed when the power line network has data throughput.

[0009] Optionally, setting the device under test and the gold device to transmit mode and receive mode respectively specifically includes: Send a first instruction to the device under test, and set the throughput mode of the device under test to the sending mode through the first instruction, so that the device under test sends a first preset number of traffic packets; After receiving the readiness feedback from the device under test, a second instruction is sent to the gold machine to set the throughput mode of the gold machine to the receiving mode.

[0010] Optionally, determining whether the device under test meets the preset transmission indicators based on the first throughput of the gold machine and a preset first threshold specifically includes: After receiving the readiness feedback from the gold machine, a first throughput query command is sent to the gold machine, and the first throughput obtained from the query is printed. If the first throughput exceeds the first threshold, the device under test is determined to meet the transmission index; if the first throughput does not exceed the first threshold, the device under test is determined to not meet the transmission index.

[0011] Optionally, setting the device under test and the gold device to receive mode and transmit mode respectively specifically includes: Send a third instruction to the device under test, and set the throughput mode of the device under test to the receiving mode through the third instruction; After receiving the readiness feedback from the device under test, a fourth instruction is sent to the gold device to set the throughput mode of the gold device to the sending mode, so that the gold device can send a second preset number of data packets.

[0012] Optionally, determining whether the device under test (DUT) meets the preset reception index based on the second throughput of the DUT and a preset second threshold specifically includes: After receiving the readiness feedback from the gold machine, a second throughput query command is sent to the machine under test, and the queried second throughput is printed. If the second throughput exceeds the second threshold, the device under test is determined to meet the reception criteria; if the second throughput does not exceed the second threshold, the device under test is determined to not meet the reception criteria.

[0013] Optionally, the method further includes: Send automatic gain control query commands to the device under test and the gold-plated machine respectively; Obtain statistical test values ​​of batch data, and determine the link status of the device under test based on the range of the statistical test values.

[0014] The present invention also proposes a power line performance testing device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the computer program is executed by the processor, it implements the steps of the power line performance testing method as described in any of the preceding claims.

[0015] The present invention also proposes a computer-readable storage medium storing a power line performance test program, wherein when the power line performance test program is executed by a processor, the steps of the power line performance test method as described in any of the preceding claims are implemented.

[0016] The present invention provides a power line performance testing method, device, and computer-readable storage medium. The communication ports of the device under test (DUT) and the receiver are connected to a host computer via network cables, and the power ports of the DUT and the receiver are connected to the same power outlet via power cables. On one hand, the DUT and the receiver are respectively set to transmit mode and receive mode. Whether the DUT meets preset transmit indicators is determined based on a first throughput of the receiver and a preset first threshold. On the other hand, the DUT and the receiver are respectively set to receive mode and transmit mode. Whether the DUT meets preset receive indicators is determined based on a second throughput of the receiver and a preset second threshold. This invention provides a lower-cost and simpler power line performance testing scheme, eliminating the need for specific testing equipment and improving testing efficiency and effectiveness. Attached Figure Description

[0017] The present invention will be further described below with reference to the accompanying drawings and embodiments. In the accompanying drawings: Figure 1 This is a flowchart of the first embodiment of the power line performance testing method of the present invention; Figure 2 This is a flowchart of the second embodiment of the power line performance testing method of the present invention; Figure 3 This is a flowchart of the third embodiment of the power line performance testing method of the present invention; Figure 4This is a flowchart of the fourth embodiment of the power line performance testing method of the present invention; Figure 5 This is a flowchart of the fifth embodiment of the power line performance testing method of the present invention; Figure 6 This is a flowchart of the sixth embodiment of the power line performance testing method of the present invention; Figure 7 This is a flowchart of the seventh embodiment of the power line performance testing method of the present invention; Figure 8 This is a flowchart of the eighth embodiment of the power line performance testing method of the present invention; Figure 9 This is a schematic diagram of the first connection relationship in the power line performance testing method of the present invention; Figure 10 This is a schematic diagram of the second connection relationship in the power line performance testing method of the present invention. Detailed Implementation

[0018] It should be understood that the specific embodiments described herein are for illustrative purposes only and are not intended to limit the scope of the invention.

[0019] In the following description, the use of suffixes such as "module," "part," or "unit" to denote elements is solely for the purpose of illustrative purposes and has no specific meaning in itself. Therefore, "module," "part," or "unit" may be used interchangeably.

[0020] Example 1 Figure 1 This is a flowchart of the first embodiment of the power line performance testing method of the present invention. A power line performance testing method is applied to a host computer, wherein the communication ports of the device under test (DUT) and the receiver are respectively connected to the host computer via network cables, and the power ports of the DUT and the receiver are respectively connected to the same power socket via power cords. The method includes: S1. Set the device under test and the gold machine to transmit mode and receive mode respectively, and determine whether the device under test meets the preset transmission index based on the first throughput of the gold machine and the preset first threshold. S2. Set the device under test and the gold device to receive mode and transmit mode respectively, and determine whether the device under test meets the preset receiving index based on the second throughput of the device under test and the preset second threshold.

[0021] In this embodiment, the equipment used includes a fixture, a gold testing machine, a network cable, a power cord, and a host computer; wherein the fixture is a power filtering and isolation fixture, the gold testing machine is a test gold testing machine, and the host computer has a multi-network port card.

[0022] In this embodiment, the aforementioned fixture is used to isolate and filter the mains power, providing a stable 220V AC power environment for the testing of the product under test, thereby avoiding the influence of mains power noise and instability on the test data of the product under test; please refer to the following for specific design details. Figure 9 The power input port is connected to a leakage current protection switch, which is connected to a first filter. The first filter is connected to a first magnetic ring, which is connected to a second filter. The second filter is connected to a second magnetic ring, which is connected to a ferrite coil. The ferrite coil is connected to a third magnetic ring, which is connected to a third filter. The third filter is connected to a fourth magnetic ring, which is connected to a socket. It should be noted that this embodiment has high requirements for the AC power environment, ensuring its stability and reliability. Potential voltage instability, high-voltage pulses, AC frequency fluctuations, and wire noise can all cause deviations in PLC networking and TXRX flow interaction tests between products. Therefore, the aforementioned fixture is needed to filter the AC power. It is easy to see that through the fixture structure, the AC power is input through the fixture's AC 220V power supply interface, passes through AC power isolation circuits such as filters, magnetic rings, and coils, and after passing through the PLC fixture, the AC 220V AC power in the test environment is completely isolated from the mains power, providing sufficient conditions for networking in the test environment.

[0023] In this embodiment, a high-performance prototype is used as a PLC test companion device to form a PLC MIMO network with the machine under test, enabling data transmission, reception, querying, and verification to test the product's power line data transmission performance. The test companion device is controlled by separate software and is assigned a separate IP address to receive control commands from the host computer. When the network is established, the host computer can control both the test companion device and the machine under test separately.

[0024] In this embodiment, the host computer establishes communication with the device under test and the gold machine through its own multi-network interface card, and issues corresponding control commands to the two machines. The host computer can be a computer or other devices.

[0025] In this embodiment, please refer to Figure 10 The connection diagram shown indicates that the communication ports of the device under test (DUT) and the gold machine are connected to the host computer via network cables, and the power ports of the DUT and the gold machine are connected to the power socket of the same fixture via power cords.

[0026] It should be noted that existing methods for testing the carrier communication performance of PLC products often require equipment such as large isolated power supplies, active filters, and programmable signal attenuators. These methods result in complex networking environments, high costs, low parallel efficiency, large line space requirements, and high equipment investment. This embodiment appropriately utilizes the aforementioned test structure. On one hand, the device under test (DUT) and the receiver are respectively set to transmit and receive modes. The DUT's compliance with preset transmit indicators is determined based on the receiver's first throughput and a preset first threshold. On the other hand, the DUT and the receiver are respectively set to receive and transmit modes. The DUT's compliance with preset receive indicators is determined based on the receiver's second throughput and a preset second threshold. Therefore, compared to existing methods, this approach provides more... The improvements include: First, the aforementioned test fixture was implemented for isolated and filtered mains power (220V AC), providing a stable 220V AC power environment for the testing of the product under test (DUT) and avoiding the influence of mains power noise and instability on the DUT's test data. Second, by networking the test unit and the DUT together for mutual transmission and reception, the test environment is simplified, related instruments are saved, and the cost of the test solution is reduced. Third, without relying on specific equipment, multi-port communication enables parallel testing of multiple devices, saving on test equipment costs, improving test efficiency, and reducing manpower input. Fourth, the simplified solution allows for workstation merging, integration of testing of other complete machine functions, and a smaller test environment footprint, achieving the merging of the entire machine test environment, streamlining the test line, manpower, and test time, and minimizing manufacturing costs.

[0027] The beneficial effects of this embodiment are as follows: The communication ports of the device under test (DUT) and the receiver are connected to the host computer via network cables, and their power ports are connected to the same power outlet via power cables. On one hand, the DUT and the receiver are respectively set to transmit and receive modes, and the DUT's compliance with preset transmit indicators is determined based on the receiver's first throughput and a preset first threshold. On the other hand, the DUT and the receiver are respectively set to receive and transmit modes, and the DUT's compliance with preset receive indicators is determined based on the receiver's second throughput and a preset second threshold. This achieves a lower-cost and simpler power line performance testing scheme, eliminating the need for specific testing equipment and improving testing efficiency and effectiveness.

[0028] Example 2 Figure 2 This is a flowchart of the second embodiment of the power line performance testing method of the present invention. Based on the above embodiment, the step of setting the device under test and the gold device to transmit mode and receive mode respectively includes: S01. Activate the power line function of the device under test and the gold machine respectively; S02. Create powerline domain names for the device under test and the gold machine based on the serial number of the device under test, so that the device under test and the gold machine can perform powerline networking.

[0029] In this embodiment, firstly, the device under test (DUT), the main unit, the host computer (multi-port NIC), and the power supply (clamp) are connected in sequence. On one hand, the DUT and the main unit are placed in the clamp and fixed, and connected to the same power strip via a 220V power cord to power them on. On the other hand, the DUT and the main unit are connected to the multi-port NIC of the host computer via network cables, and fixed IP addresses in different network segments are assigned to the DUT and the main unit, such as 192.168.1.10 for the DUT and 192.168.3.1 for the main unit, thus facilitating the host computer to assign them different IP addresses. Commands are issued to both devices to avoid disorder and mutual interference during the command issuance process. Then, after the above test environment is ready, the test program on the host computer is run to start the test. On one hand, the host computer issues a command to the device under test to enable the PLC function and sets a PLC domain name based on the last 6 characters of the serial number to enable it to support PLC networking. On the other hand, the host computer issues a command to the main unit to enable the main unit's PLC function and sets the same domain name for the PLC main unit based on the PLC domain name already set on the device under test. Finally, PLC networking starts automatically.

[0030] The beneficial effects of this embodiment are that by networking the gold tester and the test device under test (DUT) and sending and receiving tests to each other, the test environment is simplified, related instruments are saved, and the cost of the test scheme is reduced. Furthermore, by assigning different IP addresses to different DUTs and gold testers through multiple network interface cards, multi-station parallel operation can be supported, which further improves the test efficiency.

[0031] Example 3 Figure 3 This is a flowchart of the third embodiment of the power line performance testing method of the present invention. Based on the above embodiment, the step of setting the device under test and the gold device to transmit mode and receive mode respectively includes: S03. Send a stable state rate query command to the device under test to obtain the transmit and receive rate of the device under test when there is no data throughput in the power line network. S04. When the transmit / receive rate meets the preset third threshold, perform the transmit / receive test of the device under test when the power line network has data throughput.

[0032] In this embodiment, the host computer sends a command to the device under test (DUT) to perform zero-crossing detection and confirm that the circuit environment meets the preset conditions, namely, stable voltage and a mutually compatible current-carrying environment. The host computer then sends a command to the DUT to query the online MAC addresses of the PLCs of both the DUT and the main unit. After finding the MAC addresses, the host computer confirms successful network formation. Further, the host computer sends PLC network status queries to both the DUT and the main unit. After confirming stable status, the PLC current-carrying test is initiated. Further, the host computer sends a PLC stable state rate query command to the DUT to detect the DUT's plc_rx and plc_tx rates when not running throughput under PLC network conditions. When both rates meet their respective thresholds, the throughput TXRX transmit / receive test is initiated. Optionally, the relevant control commands of the main unit are encapsulated in the host computer's software version to achieve PLC network formation and current-carrying between the two devices, directly completing the broadband PLC TXRX transmit / receive flow test.

[0033] Example 4 Figure 4 This is a flowchart of the fourth embodiment of the power line performance testing method of the present invention. Based on the above embodiment, the step of setting the device under test and the gold device to transmit mode and receive mode respectively specifically includes: S11. Send a first instruction to the device under test, and set the throughput mode of the device under test to the sending mode through the first instruction, so that the device under test sends a first preset number of traffic packets; S12. After receiving the readiness feedback from the device under test, a second instruction is sent to the gold machine to set the throughput mode of the gold machine to the receiving mode.

[0034] In this embodiment, the host computer test program sends an instruction to the device under test (DUT) to set the DUT PLC throughput mode to plc_Tx. At this time, the DUT sends a fixed number of flow packets by default. After the DUT returns a ready status, the host computer sends an instruction to the hardware terminal to set the hardware PLC throughput mode to plc_Rx.

[0035] Example 5 Figure 5 This is a flowchart of the fifth embodiment of the power line performance testing method of the present invention. Based on the above embodiment, the step of determining whether the device under test meets the preset transmission index according to the first throughput of the device and the preset first threshold specifically includes: S13. After receiving the readiness feedback from the gold machine, send a first throughput query command to the gold machine and print the queried first throughput. S14. If the first throughput exceeds the first threshold, the device under test is determined to meet the transmission index; if the first throughput does not exceed the first threshold, the device under test is determined to not meet the transmission index.

[0036] In this embodiment, after the gold machine returns a ready status, the host computer sends a throughput query command to the gold machine, prints the queried throughput value, and performs a threshold judgment to determine whether the throughput PLC_TX index of the machine under test meets the test requirements.

[0037] Example 6 Figure 6 This is a flowchart of the sixth embodiment of the power line performance testing method of the present invention. Based on the above embodiment, the step of setting the device under test and the gold device to receiving mode and transmitting mode respectively specifically includes: S21. Send a third instruction to the device under test, and set the throughput mode of the device under test to the receiving mode through the third instruction; S22. After receiving the readiness feedback from the device under test, a fourth instruction is sent to the gold device to set the throughput mode of the gold device to the sending mode, so that the gold device sends a second preset number of data packets.

[0038] In this embodiment, the host computer sends an instruction to the device under test (DUT) to set the DUT's PLC throughput mode to plc_Rx. After the DUT returns a ready status, the host computer sends an instruction to the main unit to set the main unit's PLC throughput mode to plc_Tx. At this time, the main unit sends a fixed number of flow packets by default.

[0039] Example 7 Figure 7 This is a flowchart of the seventh embodiment of the power line performance testing method of the present invention. Based on the above embodiment, it determines whether the device under test meets the preset reception index according to the second throughput of the device under test and the preset second threshold, specifically including: S23. After receiving the readiness feedback from the gold machine, a second throughput query command is sent to the machine under test, and the queried second throughput is printed. S24. If the second throughput exceeds the second threshold, the device under test is determined to meet the reception criteria; if the second throughput does not exceed the second threshold, the device under test is determined to not meet the reception criteria.

[0040] In this embodiment, after the machine feedback status is ready, the host computer sends a throughput query command to the machine under test, prints the queried throughput value, and performs a threshold judgment to determine whether the throughput PLC_RX index of the machine under test meets the test requirements.

[0041] Example 8 Figure 8 This is a flowchart of the eighth embodiment of the power line performance testing method of the present invention. Based on the above embodiment, the method further includes: S31. Send automatic gain control query commands to the device under test and the gold machine respectively; S32. Obtain the statistical test values ​​of the batch data, and determine the link status of the machine under test based on the range of the statistical test values.

[0042] In this embodiment, on the one hand, the host computer sends an automatic gain control query command to the product under test (PUT) and determines whether there are any device abnormalities, such as short circuits, open circuits, or solder bridging, based on the range of test values ​​from the batch data statistics. On the other hand, the host computer sends an automatic gain control query command to the gold machine and determines whether there are any device abnormalities, such as short circuits, open circuits, or solder bridging, based on the range of test values ​​from the batch data statistics.

[0043] Example 9 This embodiment is a specific implementation scheme for PLC networking.

[0044] In this embodiment, the same PLC domain name is set for both the main unit and the device under test (DUT), and they are matched and networked. After networking, the AC power is input to the zero-crossing detection circuit of the DUT. Furthermore, in this embodiment, considering that AC 220V AC power is essentially a sine wave, when the voltage crosses zero from the positive half-cycle to the negative half-cycle, the zero-crossing detection circuit will generate a high-level pulse signal that can be detected by the PLC chip input module. After processing by the PLC chip drive algorithm, based on the zero-crossing point of the AC power (50 / 60Hz) at a fixed frequency, the zero-crossing point is used as the synchronization point for data modulation during current testing, providing a precise time synchronization signal for the PLC network system, thereby improving the reliability of communication and anti-interference capability. Furthermore, the DUT system can query the zero-crossing detection result by invoking the PLC drive. Furthermore, in the normal testing process, the host computer can confirm whether the time synchronization signal of the current PLC network system has been synchronized by issuing the encapsulated zero-crossing detection query command.

[0045] In this embodiment, after zero-crossing detection is completed in the manner described above, the PLC system of the device under test (DUT) has achieved time synchronization. Based on the specific heartbeat signal sent between the DUT and the mainframe, the PLC signal detection circuit and chip driver algorithm calculate the heartbeat signal packet loss rate. If the rate is stable at ≥99%, the network is considered stable. Furthermore, the DUT system encapsulates the drive query interface into a test instruction issued by the equipment to the product. Based on this, if the query is normal, the instruction returns "success"; otherwise, the instruction returns "fail". Further, in the normal test process, the host computer confirms the network status based on the return value by issuing the encapsulated network stability query instruction.

[0046] In this embodiment, after the network is stabilized as described above, the application layer of the device under test (DUT) encapsulates the data, modulates it with OFDM, performs digital-to-analog conversion, and then sends the current signal through the product's PLC coupling circuit. The signal passes through the power line network and is received by the PLC coupling circuit of the mainframe. After further processing such as fuzzy signal processing, frequency offset compensation, and OFDM demodulation, the transmitted data is finally obtained. Furthermore, the PLC packet sending and receiving instructions provided by the PLC chip manufacturer are encapsulated into test instructions issued by the equipment to the product. Based on this, in the normal testing process, the host computer sets the corresponding channel, bandwidth, and number of packets by issuing the encapsulated PLC_Tx / Rx instructions. This completes the PLC packet sending of the DUT, the receiving query of the mainframe, and the PLC packet sending of the mainframe, as well as the receiving query of the DUT. The system then determines whether the PLC function is normal based on the query current value results.

[0047] The advantages of this embodiment are that it eliminates the dependence on specific equipment and instruments compared to traditional testing schemes, resulting in lower testing costs, a simpler testing environment, and a higher degree of automation in the testing process.

[0048] Example 10 This embodiment is a specific control scheme for PLC networking.

[0049] In this embodiment, relevant instruction control is implemented on the PLCs of the gold machine and the machine under test, such as setting the PLC domain name, controlling product packaging, package receiving query, zero-crossing detection, etc. Through the code instructions related to the underlying PLC chip, the control instructions can be encapsulated into control instructions that can be directly issued by the equipment, thereby providing sufficient conditions for automated testing.

[0050] In this embodiment, the instructions sent from the host computer to the device under test are encapsulated instructions. After the host computer establishes a Telnet protocol connection with the product via a network cable, it sends the instructions directly to the product via the Telnet protocol and performs automatic testing based on the printed information returned by the product.

[0051] In this embodiment, the specific implementation process of packet transmission and reception in the PLC network is as follows: First, the device under test (DUT) loads data onto the 220V AC power supply using OFDM modulation, performs fuzzy signal processing (such as filtering and signal amplification), and performs digital-to-analog conversion on the processed signal. Then, the analog data after digital-to-analog conversion is transmitted through the power line, enabling the hardware coupling circuit to receive the analog data and separate it from the 220V AC power supply, perform fuzzy signal processing (such as filtering and signal amplification), and perform analog-to-digital conversion on the processed signal. Finally, the processed electrical signal undergoes symbol synchronization and frame synchronization, frequency offset compensation, OFDM demodulation, and channel equalization to enable the hardware to read the received data.

[0052] Example 11 Based on the above embodiment eight, by using the networked device under test (DUT) and the master unit, the presence of a physical fault in the TX / RX link of the DUT's PLC circuit is determined by querying the PLC's automatic gain value. In this embodiment, to resist the interference of pulse noise signals from AC power on the PLC communication, a pulse noise detection module and a programmable gain amplifier are designed in the PLC product. When the signal enters the product's PLC coupling circuit through the power line, it is processed by the programmable gain amplifier, which quickly adjusts the amplification factor according to the strength of the input signal. This prevents the subsequent analog-to-digital converter from saturating and distorting due to excessively strong signals or having excessively large errors due to excessively weak signals, achieving higher precision gain fine-tuning and ensuring that the signal amplitude finally delivered to the demodulator is stable within the optimal range. Furthermore, when no severe pulse noise is detected, the AGC (Automatic Gain Control) function is activated. Automatic gain control (AGC) uses efficient algorithms to quickly estimate signal power and smoothly adjust the gain. Furthermore, when a sudden impulse noise with an amplitude far exceeding the useful signal is detected, the gain amplifier will immediately trigger a special protection mechanism, thereby significantly reducing the gain. Based on this, this embodiment can determine whether there is impulse noise in the current network environment based on the gain value automatically adjusted by the amplifier. Furthermore, based on the above-mentioned mains isolation circuit design, it is assumed that there is no abnormal impulse noise in the environment. Therefore, the environment will not cause a significant change in the product gain. If the product's PLC performance is consistent, then the PLC automatic gain value should be within a reasonable range. However, if the automatic gain value of the PLC of the product under test is found to be too large or too small, then the product's PLC circuit itself may be abnormal.

[0053] In this embodiment, based on the above-mentioned judgment logic, the current gain value of the product under test is queried by controlling the gain amplifier of the product system, and then the product PLC circuit is inferred to have any abnormalities, such as abnormal device model, short circuit, open circuit, solder bridging, etc.

[0054] In this embodiment, the specific application of the above-mentioned gain value is to statistically analyze batch data to determine the distribution of the overall gain data value. Further, based on the distribution of the overall gain data value, a predetermined threshold is first preset. At the same time, fault simulations are performed on the devices in the PLC link of the product under test, such as short circuit, open circuit, solder joint, etc., and the automatic gain index under the fault scenarios is measured in sequence to obtain the automatic gain value of the electronic components in the PLC link under various abnormal scenarios. Then, combined with the distribution of the gain value of the batch test, a threshold that can intercept PLC circuit abnormalities can be determined.

[0055] In this embodiment, the product driver query gain value instruction is encapsulated, thereby enabling the host computer program to directly issue test instructions to the product. On the one hand, during normal testing, the host computer program issues gain query instructions to the device under test and the main unit respectively, and prints the feedback results. On the other hand, based on the thresholds established above, it determines whether the PLC circuit test has passed.

[0056] The beneficial effect of this embodiment is that it automatically tests and determines the TX and RX throughput values ​​directly from the device under test and the gold machine through instructions. At the same time, it checks whether there are hardware faults in the PLC related links of the PLC automatic gain detection product, thereby ensuring the normal operation of the product hardware circuit and ensuring that the product PLC has strong performance and good consistency.

[0057] Example 12 Based on the above embodiments, the present invention also proposes a power line performance testing device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the computer program is executed by the processor, it implements the steps of the power line performance testing method as described in any of the above embodiments.

[0058] It should be noted that the above-described device embodiments and method embodiments belong to the same concept. The specific implementation process can be found in the method embodiments, and the technical features in the method embodiments are also applicable to the device embodiments, which will not be repeated here.

[0059] Example 13 Based on the above embodiments, the present invention also proposes a computer-readable storage medium storing a power line performance test program, wherein when the power line performance test program is executed by a processor, the steps of the power line performance test method as described in any of the above claims are implemented.

[0060] It should be noted that the above-described medium embodiments and method embodiments belong to the same concept. The specific implementation process can be found in the method embodiments, and the technical features in the method embodiments are also applicable to the medium embodiments, which will not be repeated here.

[0061] The power line performance testing method, equipment, and computer-readable storage medium of this invention connect the communication ports of the device under test (DUT) and the receiver to a host computer via network cables, and connect the power ports of the DUT and the receiver to the same power socket via power cables. On one hand, the DUT and the receiver are respectively set to transmit mode and receive mode, and the DUT's compliance with preset transmit indicators is determined based on a first throughput of the receiver and a preset first threshold. On the other hand, the DUT and the receiver are respectively set to receive mode and transmit mode, and the DUT's compliance with preset receive indicators is determined based on a second throughput of the receiver and a preset second threshold. This achieves a lower-cost and simpler power line performance testing scheme, eliminating the need for specific testing equipment and improving testing efficiency and effectiveness.

[0062] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0063] The sequence numbers of the above embodiments of the present invention are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0064] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal (which may be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in the various embodiments of the present invention.

[0065] The embodiments of the present invention have been described above with reference to the accompanying drawings. However, the present invention is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of the present invention without departing from the spirit and scope of the claims. All of these forms are within the protection scope of the present invention.

Claims

1. A power line performance testing method, applied to a host computer, characterized in that, The communication ports of the device under test (DUT) and the gold-plated machine are respectively connected to the host computer via network cables, and the power ports of the DUT and the gold-plated machine are respectively connected to the same power socket via power cords. The method includes: The device under test and the gold machine are respectively set to transmit mode and receive mode. The device under test is determined to meet the preset transmission index based on the first throughput of the gold machine and the preset first threshold. The device under test (DUT) and the gold device are respectively set to receiving mode and transmitting mode. The device under test is determined to meet the preset receiving index based on the second throughput of the DUT and the preset second threshold.

2. The power line performance testing method according to claim 1, characterized in that, The step of setting the device under test and the gold device to transmit mode and receive mode respectively includes: The power line functions of the device under test and the gold-plated machine are activated respectively; Based on the serial number of the device under test (DUT), powerline domain names are created for the DUT and the gold device, so that the DUT and the gold device can perform powerline networking.

3. The power line performance testing method according to claim 2, characterized in that, The step of setting the device under test and the gold device to transmit mode and receive mode respectively includes: A steady-state rate query command is sent to the device under test to obtain the transmit and receive rates of the device under test when there is no data throughput in the power line network. When the transmit / receive rate meets the preset third threshold, the transmit / receive test of the device under test is performed when the power line network has data throughput.

4. The power line performance testing method according to claim 1, characterized in that, Setting the device under test and the gold device to transmit mode and receive mode respectively specifically includes: Send a first instruction to the device under test, and set the throughput mode of the device under test to the sending mode through the first instruction, so that the device under test sends a first preset number of traffic packets; After receiving the readiness feedback from the device under test, a second instruction is sent to the gold machine to set the throughput mode of the gold machine to the receiving mode.

5. The power line performance testing method according to claim 4, characterized in that, The step of determining whether the device under test meets the preset transmission indicators based on the first throughput of the gold machine and the preset first threshold specifically includes: After receiving the readiness feedback from the gold machine, a first throughput query command is sent to the gold machine, and the first throughput obtained from the query is printed. If the first throughput exceeds the first threshold, the device under test is determined to meet the transmission index; if the first throughput does not exceed the first threshold, the device under test is determined to not meet the transmission index.

6. The power line performance testing method according to claim 1, characterized in that, Setting the device under test and the gold machine to receive mode and transmit mode respectively specifically includes: Send a third instruction to the device under test, and set the throughput mode of the device under test to the receiving mode through the third instruction; After receiving the readiness feedback from the device under test, a fourth instruction is sent to the gold device to set the throughput mode of the gold device to the sending mode, so that the gold device can send a second preset number of data packets.

7. The power line performance testing method according to claim 6, characterized in that, The step of determining whether the device under test (DUT) meets the preset reception criteria based on the second throughput of the DUT and a preset second threshold specifically includes: After receiving the readiness feedback from the gold machine, a second throughput query command is sent to the machine under test, and the queried second throughput is printed. If the second throughput exceeds the second threshold, the device under test is determined to meet the reception criteria; if the second throughput does not exceed the second threshold, the device under test is determined to not meet the reception criteria.

8. The power line performance testing method according to claim 1, characterized in that, The method further includes: Send automatic gain control query commands to the device under test and the gold-plated machine respectively; Obtain statistical test values ​​of batch data, and determine the link status of the device under test based on the range of the statistical test values.

9. A power line performance testing device, characterized in that, The device includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the steps of the power line performance testing method as described in any one of claims 1 to 8.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores an application power line performance test program, which, when executed by a processor, implements the steps of the power line performance test method as described in any one of claims 1 to 8.