A high-stability current probe testing device

Abstract

The application relates to the technical field of current probe testing, and specifically discloses a high-stability current probe testing device, which comprises a testing table, a rectangular through groove is arranged in the testing table, a placing plate is rotatably arranged in the rectangular through groove, a plurality of stand columns are arranged on the top of the testing table, a moving frame is arranged among the plurality of stand columns, a first testing mechanism is arranged at the bottom end of the moving frame and the bottom end of the testing table, a second testing mechanism is arranged at the bottom end of the moving frame, and an auxiliary feeding mechanism is arranged on the top of the testing table. In the application, the auxiliary feeding mechanism can automatically and accurately place a plurality of probes in corresponding first placing grooves and second placing grooves in the moving plate and the placing plate, the plurality of testing components of the first testing mechanism can simultaneously test the current resistance performance of the plurality of probes, the efficiency of testing the plurality of probes by the device is improved, the utilization rate of the testing device is improved, and the overall testing period is shortened.

Description

Technical Field

[0001] This invention relates to the field of current probe testing technology, and more specifically to a highly stable current probe testing device. Background Technology

[0002] A current probe is a specialized testing tool used to measure current in a circuit. It forms an electrical connection with the circuit under test, converting the current signal into an observable or recordable physical quantity such as voltage or light, thereby achieving accurate current measurement. After manufacturing, current probes need to undergo current withstand performance testing to verify whether they meet the design requirements for current carrying capacity. This testing also exposes potential defects such as poor contact, insulation damage, and overheating of internal components, allowing for repair or rejection of substandard products before shipment, thus improving overall product quality.

[0003] In existing technologies, testing the current withstand performance of current probes requires manually placing multiple current probes sequentially at designated positions on the testing device. Each probe needs to be independently fixed, wired, and have its contact pressure adjusted. This process is highly repetitive, time-consuming, and prone to errors due to fatigue. Moreover, the testing device is typically designed as a single-channel or low-parallelism device, capable of testing only 1-2 probes at a time, making it impossible to simultaneously evaluate the current withstand performance of multiple probes. This results in insufficient utilization of the testing equipment and prolongs the overall testing cycle. Summary of the Invention

[0004] The purpose of this invention is to overcome the shortcomings of the prior art and to propose a highly stable current probe testing device.

[0005] To achieve the above objectives, the present invention adopts the following technical solution: A high-stability current probe testing device includes a test platform with a rectangular through slot inside. A placement plate for placing probes to be tested is rotatably mounted inside the rectangular through slot. Multiple columns are mounted on the top of the test platform, and a movable frame is mounted between the columns. A first testing mechanism for testing the current withstand performance of the probes is provided at the bottom of the movable frame and the bottom of the test platform. A second testing mechanism for testing the mechanical life of the probes is also provided at the bottom of the movable frame. An auxiliary feeding mechanism for quickly placing multiple probes onto the placement plate is provided on the top of the test platform.

[0006] Optionally, a first motor is installed on one outer wall of the test platform. The output end of the first motor is connected to the rotating part of one end of the placement plate. Multiple telescopic rods are installed inside the placement plate. Each of the multiple telescopic rods has a first spring installed inside. The telescopic ends of the multiple telescopic rods are connected to a moving plate. A base is installed at the bottom of the test platform.

[0007] Optionally, the movable plate and the placement plate are respectively provided with a first placement slot and a second placement slot of different sizes, and two rotating plates are rotatably installed inside the movable plate.

[0008] Optionally, a first sliding groove is provided on one side of the outer wall of each of the multiple columns, a first slider is installed inside the multiple first sliding grooves, and the end of each of the multiple first sliders away from the first sliding groove is connected to the movable frame.

[0009] Optionally, the first testing mechanism includes two second slides and a fourth slide, which are opened at the bottom of the test platform and the bottom of the moving frame. A second slider and a fourth slider are respectively installed inside the two second slides and the fourth slide. A moving rod is installed at the bottom of each of the two second sliders. A fifth slide is opened on the outer wall of the side of the two moving rods that are close to each other. A fifth slider is installed inside each of the two fifth slides. An installation rod is installed between the two fifth sliders. A plurality of connecting sleeves that are adapted to the probe tip are installed at the top of the installation rod.

[0010] Optionally, the bottom ends of the two fourth sliders are jointly mounted with a mounting bracket. The mounting bracket has two circular grooves inside, and a second spring is installed inside each of the two circular grooves. The bottom ends of the two second springs are jointly mounted with a mounting plate, and the bottom end of the mounting plate is equipped with multiple abutment rods that are adapted to the tip of the probe.

[0011] Optionally, two electromagnets are installed at the bottom of the mounting bracket, and the two electromagnets are magnetically attracted and fixed to the mounting plate when energized.

[0012] Optionally, the second testing mechanism includes a second motor installed at the bottom of the mounting frame. An eccentric wheel is installed at the output end of the second motor. The outer wall of the eccentric wheel abuts against the top of the mounting plate. Two rotating frames are rotatably installed at the bottom of the mounting plate. After the two rotating frames rotate to a vertical position, they can block the bottom ends of multiple abutment rods.

[0013] Optionally, the auxiliary feeding mechanism includes a third slide groove opened on the top of the test bench, a third slider installed inside the third slide groove, a first electric push rod installed at the top of the third slider, a mounting seat installed at the telescopic end of the first electric push rod, a rotating block rotatably installed inside the mounting seat, and a sleeve plate rotatably installed at the end of the rotating block away from the mounting seat.

[0014] Optionally, multiple sixth sliding grooves are provided on both inner walls of the sleeve plate, and a sixth slider is installed inside each of the multiple sixth sliding grooves. A clamping plate is installed at the end of each of the multiple sixth sliders away from the sixth sliding groove via a second electric push rod. A cover plate is rotatably installed on the top of the sleeve plate, and a pipe is installed on the top of the cover plate. A spray pipe extending into the inside of the cover plate is installed on the outer wall of the pipe.

[0015] The beneficial effects of this invention are: 1. In this invention, by setting an auxiliary feeding mechanism, multiple probes can be automatically and accurately placed in the corresponding first and second placement slots inside the moving plate and the placement plate. In conjunction with the multiple testing components of the first testing mechanism, multiple probes can be tested for current resistance at the same time, which improves the efficiency of the device in testing multiple probes, increases the utilization rate of the testing device, and shortens the overall testing cycle.

[0016] 2. In this invention, before testing the current withstand performance of the probes, the second driving device can be controlled to rotate the sleeve plate 180 degrees. Then, the output end of the externally preset delivery device is connected to the pipeline through a hose, so that the external delivery device can deliver ethanol into the pipeline and spray it downwards onto the corresponding probe surfaces through multiple nozzles, which can automatically clean the surfaces of multiple probes. Subsequently, the second driving device can be controlled to continuously rotate the sleeve plate to throw off excess ethanol. Combined with the volatile properties of ethanol, the residual ethanol on the surfaces of multiple probes is quickly dried and removed, without affecting the subsequent current withstand performance test.

[0017] 3. In this invention, in order to ensure that the probes used for current withstand testing are of good quality, after cleaning the surfaces of multiple probes, the upper sixth sliders inside the control plate are continuously moved up and down in their corresponding sixth slide grooves. This causes multiple sets of clamping plates that are fixed to the probe sleeves to move up and down together, so that the multiple sleeves move up and down on the corresponding probe surfaces. This is to detect the smoothness of the sliding of the sleeves on the multiple probe surfaces and whether the springs can extend and retract flexibly.

[0018] 4. In this invention, after the testing of multiple probes is completed, both rotating plates are positioned above the moving plate, limiting and fixing the tops of the probes. Then, the operator places the relevant collection container between the top of the base and the bottom of the test platform. The first motor is controlled to rotate the placement plate and the moving plate 180 degrees together. Then, the two rotating plates are controlled to rotate downwards in an inclined state. At this time, the probes located in the multiple first and second placement slots can fall downwards onto the top of the two rotating plates. Guided by the two inclined rotating plates, they fall into the collection container for automatic collection. This achieves the effect of automatically unloading and collecting multiple probes after testing, facilitating the device to quickly begin testing subsequent probes and improving the efficiency of testing large batches of probes. Attached Figure Description

[0019] To facilitate understanding by those skilled in the art, the present invention will be further described below with reference to the accompanying drawings.

[0020] Figure 1This is a schematic diagram of the overall structure of a high-stability current probe testing device proposed in this invention. Figure 2 for Figure 1 A structural diagram from another angle; Figure 3 This is a schematic diagram of the test bench in this invention; Figure 4 This is a schematic diagram of the structure of the placement plate in this invention; Figure 5 This is a schematic diagram of the structure in this invention where the moving plate and the placement plate are separated; Figure 6 This is a cross-sectional view of the telescopic rod in this invention; Figure 7 This is a schematic diagram of the structure of the first testing mechanism in this invention; Figure 8 for Figure 7 A schematic diagram showing the separation of the mounting frame from the movable frame, and the mounting rod from the two movable rods; Figure 9 This is a schematic diagram of the structure of the second testing mechanism in this invention; Figure 10 This is a schematic diagram of the structure at the bottom of the mounting bracket in this invention; Figure 11 This is a schematic diagram of the auxiliary feeding mechanism in this invention; Figure 12 This is a schematic diagram of the structure after the cover plate is rotated and opened in this invention; Figure 13 This is a cross-sectional view of the sleeve plate in this invention; Figure 14 This is a schematic diagram of the structure in which two clamping plates are used in conjunction in this invention.

[0021] In the diagram: 1. Test bench; 2. Base; 3. Column; 4. Movable frame; 5. First motor; 6. First slide groove; 7. Second slide groove; 8. Third slide groove; 9. Sleeve plate; 10. Rectangular through groove; 11. Placement plate; 12. Movable plate; 13. Rotating plate; 14. Telescopic rod; 15. First placement slot; 16. Second placement slot; 17. First spring; 18. First slider; 19. Second slider; 20. Mounting plate; 21. Abutment rod; 22. Movable rod; 23. Mounting rod; 24. Connecting sleeve; 25. Fourth slide groove; 26. Fourth slider; 27. Mounting bracket; 28. Fifth slide groove; 29. ​​Fifth slider; 30. Second motor; 31. Eccentric wheel; 32. Second spring; 33. Rotating frame; 34. Electromagnet; 35. Third slider; 36. First electric push rod; 37. Mounting base; 38. Rotating block; 39. Cover plate; 40. Pipe; 41. Nozzle; 42. Clamping plate; 43. Sixth slide groove; 44. Sixth slider; 45. Second electric push rod. Detailed Implementation

[0022] The technical solution of the present invention will be clearly and completely described below with reference to the embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0023] Reference Figures 1-14 A high-stability current probe testing device includes a test platform 1. The test platform 1 has a rectangular through slot 10 inside. A placement plate 11 for placing the probe to be tested is rotatably installed inside the rectangular through slot 10. Multiple columns 3 are installed on the top of the test platform 1. A movable frame 4 is installed between the multiple columns 3. The bottom end of the movable frame 4 and the bottom end of the test platform 1 are provided with a first testing mechanism for testing the current withstand performance of the probe. The bottom end of the movable frame 4 is also provided with a second testing mechanism for testing the mechanical life of the probe. An auxiliary feeding mechanism is provided on the top of the test platform 1 for quickly placing multiple probes on the placement plate 11.

[0024] As a technical optimization of the present invention, a first motor 5 is installed on one outer wall of the test platform 1. The output end of the first motor 5 is connected to the rotating part of one end of the placement plate 11. Multiple telescopic rods 14 are installed inside the placement plate 11, and a first spring 17 is installed inside each of the multiple telescopic rods 14. A movable plate 12 is installed at the telescopic ends of the multiple telescopic rods 14. A base 2 is installed at the bottom of the test platform 1. After the first motor 5 is started, it can drive the placement plate 11 and the movable plate 12 to rotate and adjust inside the rectangular through groove 10.

[0025] As a technical optimization of the present invention, the movable plate 12 and the placement plate 11 are respectively provided with a first placement groove 15 and a second placement groove 16 of different sizes. Two rotating plates 13 are rotatably installed inside the movable plate 12. When the probe is placed inside the movable plate 12 and the placement plate 11, the probe tip will enter the second placement groove 16 with a smaller diameter, and the top of the probe will enter the first placement groove 15 with a larger diameter. Two driving devices are preset inside the movable plate 12. The output ends of the two driving devices are respectively connected to the rotating parts of one end of the two rotating plates 13, so as to drive the two rotating plates 13 to rotate and adjust on the movable plate 12. After the two rotating plates 13 rotate and the top of the movable plate 12 is reached, the tip of the probe can be limited.

[0026] As a technical optimization of the present invention, a first sliding groove 6 is provided on one outer wall of each of the multiple columns 3, and a first slider 18 is installed inside each of the multiple first sliding grooves 6. The end of each of the multiple first sliders 18 away from the first sliding groove 6 is connected to the movable frame 4. A first linear motor is preset inside each of the multiple first sliding grooves 6. The multiple first linear motors can drive the multiple first sliders 18 to move up and down inside the corresponding first sliding grooves 6, thereby driving the movable frame 4 to move up and down on the top of the test platform 1 for adjustment.

[0027] As a technical optimization of the present invention, the first testing mechanism includes two second slide grooves 7 and a fourth slide groove 25 opened at the bottom of the test platform 1 and the bottom of the movable frame 4. The second slide grooves 7 and the fourth slide groove 25 are respectively installed inside the second slide grooves 7 and the fourth slide groove 25. The bottom end of each of the two second slide grooves 19 is installed with a movable rod 22. The outer wall of the side of the two movable rods 22 that are close to each other is provided with a fifth slide groove 28. The inside of each of the two fifth slide grooves 28 is installed with a fifth slide groove 29. The two fifth slide grooves 29 are connected by a mounting rod 23. The top end of the mounting rod 23 is equipped with a plurality of connecting sleeves 24 that are adapted to the probe tip. A second linear motor and a fourth linear motor are respectively installed inside the two second slide grooves 7 and the fourth slide groove 25. The two second linear motors and the fourth linear motor can drive the corresponding second slider 19 and the fourth slider 26 to move back and forth inside the corresponding second slide grooves 7 and the fourth slide groove 25, thereby driving the two moving rods 22 to move and adjust at the bottom of the test platform 1. A fifth linear motor is installed inside the two fifth slide grooves 28. The two fifth linear motors can drive the two fifth sliders 29 to move up and down inside the corresponding fifth slide grooves 28, thereby driving the mounting rod 23 and multiple connecting sleeves 24 to move up and down together for adjustment.

[0028] As a technical optimization of the present invention, a mounting bracket 27 is jointly installed at the bottom ends of the two fourth sliders 26. Two circular grooves are formed inside the mounting bracket 27, and a second spring 32 is installed inside each of the two circular grooves. A mounting plate 20 is jointly installed at the bottom ends of the two second springs 32. Multiple abutment rods 21 adapted to the tip of the probe are installed at the bottom end of the mounting plate 20. After the mounting plate 20 moves downward, it can cause the two second springs 32 to be in a stretched state. After the limitation on the mounting plate 20 is released, it can be synchronously reset by means of the elastic reset of the two second springs 32.

[0029] As a technical optimization of the present invention, two electromagnets 34 are installed at the bottom of the mounting bracket 27, and the two electromagnets 34 are magnetically attracted and fixed to the mounting plate 20 when energized.

[0030] As a technical optimization of the present invention, the second testing mechanism includes a second motor 30 installed at the bottom of the mounting frame 27. An eccentric wheel 31 is installed at the output end of the second motor 30. The outer wall of the eccentric wheel 31 abuts against the top of the mounting plate 20. Two rotating frames 33 are rotatably installed at the bottom of the mounting plate 20. After the two rotating frames 33 rotate to a vertical state, they can block the bottom ends of multiple abutment rods 21. After the second motor 30 is started, it can drive the eccentric wheel 31 to rotate. When the eccentric wheel 31 rotates eccentrically, it pushes the mounting plate 20 to move downward and upward to reset, so as to drive the mounting plate 20 to move up and down repeatedly. The interior of each of the two rotating frames 33 is equipped with a magnetic strip, so that after it rotates upward to a horizontal state, it can be magnetically attracted to the bottom of the mounting plate 20 to limit its rotation state.

[0031] As a technical optimization of the present invention, the auxiliary feeding mechanism includes a third slide groove 8 opened on the top of the test bench 1. A third slider 35 is installed inside the third slide groove 8. A first electric push rod 36 is installed at the top of the third slider 35. A mounting base 37 is installed at the telescopic end of the first electric push rod 36. A rotating block 38 is rotatably installed inside the mounting base 37. A sleeve plate 9 is rotatably installed at the end of the rotating block 38 away from the mounting base 37. A third linear motor is preset inside the third slide groove 8, which can drive the third slider 35 to move back and forth inside the third slide groove 8. A first driving device is preset on one side of the outer wall of the mounting base 37. The output end of the first driving device is connected to the rotating part of one end of the rotating block 38, thereby driving the rotating block 38 to rotate and adjust inside the mounting base 37. A second driving device is preset inside the rotating block 38. The output end of the second driving device is connected to the rotating part of the sleeve plate 9, thereby driving the sleeve plate 9 to rotate and adjust.

[0032] As a technical optimization of the present invention, multiple sixth sliding grooves 43 are provided on both inner walls of the sleeve plate 9. A sixth slider 44 is installed inside each of the multiple sixth sliding grooves 43. A clamping plate 42 is installed at the end of each of the multiple sixth sliders 44 away from the sixth sliding groove 43 through a second electric push rod 45. A cover plate 39 is rotatably installed on the top of the sleeve plate 9. A pipe 40 is installed on the top of the cover plate 39. A nozzle 41 extending into the inside of the cover plate 39 is installed on the outer wall of the pipe 40. Each of the multiple sixth slide grooves 43 is equipped with a sixth linear motor. These motors can drive multiple sixth sliders 44 to move and adjust within their respective sixth slide grooves 43, thereby moving and adjusting the corresponding second electric push rods 45 and clamping plates 42. During the extension and retraction of the second electric push rods 45, the corresponding clamping plates 42 can be moved and adjusted so that the two mating clamping plates 42 can hold and fix the probe. A third driving device is pre-installed on one side of the outer wall of the sleeve plate 9. The output end of the third driving device is connected to the rotating part of one end of the cover plate 39, thereby driving the cover plate 39 to rotate and adjust.

[0033] In this invention, when the user uses the device, the auxiliary feeding mechanism's sleeve 9 and other components are in a state of... Figure 1 In the state shown, the pre-set robotic arm located at the rear of the device can sequentially place multiple probes to be tested between four clamping plates 42 positioned vertically in a straight line, ensuring that the probe tips are facing upwards. Then, the telescopic ends of the four second electric push rods 45 are extended together, driving the four clamping plates 42 (two sets of cooperating clamping plates 42) to clamp and fix the upper and lower ends of the probes. Once all the clamping plates 42 inside the sleeve 9 have clamped the probes, multiple first sliders 18 can be controlled to move upwards together within their corresponding first slide grooves 6, driving the moving frame 4 and other components to move upwards for adjustment. Then, the rotating block 38 can be controlled inside the mounting base 37 to rotate the sleeve 9 and other components 180 degrees, causing the sleeve 9 to rotate directly above the moving plate 12. With the help of the third slider 35 moving within the third slide groove 8, the sleeve 9 is ensured to move to a position aligned with the moving plate 12 and the placement... Above one of the first placement slots 15 and the second placement slot 16 inside the plate 11, the telescopic end of the first electric push rod 36 is first controlled to retract downwards to return to its original position, causing the sleeve plate 9 to abut against the top of the moving plate 12. Then, the multiple sixth sliders 44 inside the sleeve plate 9 are controlled to move downwards together in the corresponding sixth sliding grooves 43, causing the tips of multiple probes to pass through the corresponding first placement slots 15. Then, the telescopic ends of multiple second electric push rods 45 are controlled to retract, releasing the clamping and fixing of multiple probes, so that multiple probes fall into the corresponding first placement slots 15 and the second placement slots 16 for insertion, thereby assisting in placing the probes inside the moving plate 12 and the placement plate 11. After repeating the above steps multiple times, until multiple first placement slots 15 and the second placement slots 16 are filled with probes, the preparation work before testing multiple probes is completed.

[0034] Subsequently, the two second sliders 19 can be controlled to move and adjust the two moving rods 22, the mounting rod 23, and the multiple connecting sleeves 24 within the corresponding second slide grooves 7. The two fourth sliders 26 can be controlled to move and adjust the mounting frame 27, the mounting plate 20, and the multiple abutting rods 21 within the corresponding fourth slide grooves 25, ensuring that the multiple connecting sleeves 24 and the abutting rods 21 move together to a position that matches the top and bottom of one set of probes. Then, the moving frame 4 can be controlled to move the multiple abutting rods 21 downwards, and the mounting rod 23 can move the multiple connecting sleeves 24 upwards until the multiple abutting rods 21 abut against the top of the multiple probes. After the multiple connecting sleeves 24 are fitted onto the tip surface of the multiple probes, the mounting rod 23 and the mounting plate 20 are connected to external current, so that the current withstand performance test of one set of multiple probes can be performed simultaneously. By repeating the above steps multiple times, the current withstand performance test of multiple probes can be completed quickly, improving the efficiency of the current withstand performance test of multiple probes.

[0035] Before performing the current withstand performance test on the probes, it is necessary to ensure that the probe surfaces are clean to avoid impurities affecting the test results. This can be achieved by placing multiple probes inside the sleeve 9 and clamping them securely with the corresponding two sets of clamping plates 42. Figure 1 As shown, the second drive device inside the controllable rotating block 38 drives the sleeve 9 to rotate 180 degrees, so that the sleeve 9 rotates to... Figure 11 As shown in the diagram, the output end of the externally preset delivery device is then connected to the pipe 40 via a hose, allowing the external delivery device to deliver ethanol into the pipe 40. The ethanol is then sprayed downwards onto the corresponding probe surfaces through multiple nozzles 41, enabling automatic cleaning of multiple probe surfaces. Subsequently, the second drive device can be controlled to continuously rotate and adjust the sleeve 9 to fling excess ethanol outwards. Combined with the volatile nature of ethanol, the residual ethanol on the multiple probe surfaces is quickly dried and removed, without affecting subsequent current withstand performance testing.

[0036] Meanwhile, to ensure the probes used for current withstand testing are of good quality, multiple probe surfaces can be cleaned, such as... Figure 13 and Figure 14 As shown, multiple sixth sliders 44 located at the top inside the control sleeve 9 move up and down continuously in the corresponding sixth slide grooves 43, which in turn drive multiple sets of clamping plates 42 that are fixed to the probe needle sleeve to move up and down together, causing multiple needle sleeves to move up and down continuously on the corresponding probe surface, so as to detect the smoothness of the sliding of the needle sleeves on the multiple probe surfaces and whether the spring can extend and retract flexibly. If the needle sleeve and spring on some probe surfaces cannot slide or extend smoothly during movement, then the sleeve 9 is... Figure 1 In the indicated state, with the cover plate 39 located below the sleeve plate 9, the third drive device can be controlled to rotate the cover plate 39 downwards to an inclined state. This controls the two sets of second electric push rods 45 corresponding to the probe with quality problems to retract and return to their original positions, causing the two sets of clamping plates 42 to release the clamping and fixing of the probe. This allows the probe, now unrestrained, to fall from the bottom of the sleeve plate 9 onto the top of the cover plate 39 and automatically slide out along the lower end of the cover plate 39. This achieves the effect of automatically detecting and removing probes with substandard quality, preventing probes with substandard quality from continuing to undergo subsequent current withstand performance tests, which could affect the accuracy of the test results.

[0037] After the current withstand performance test of multiple probes is completed, the control moving frame 4 is moved upward to reset. At this time, the two rotating plates 13 can be pushed to rotate together and be placed on top of the moving plate 12, which can limit the top of multiple probes. During the process of placing the probes inside the moving plate 12 and the placement plate 11, the needle sleeves on the probe surfaces will abut against the top of the placement plate 11. Then, the two rotating frames 33 can be rotated downward to a vertical state, so that they can block and protect the bottom of multiple abutment rods 21. Then, the magnetic attraction limit of the two electromagnets 34 on the mounting plate 20 is released. The moving frame 4 drives the mounting plate 20 and the two rotating frames 33 and other components to move downward together until they are aligned with the two rotating plates 12. After the three phases are in contact, the second motor 30 can be controlled to drive the eccentric wheel 31 to rotate. As the eccentric wheel 31 drives the mounting plate 20 and the two rotating frames 33 to move up and down repeatedly, the bottom ends of the two rotating frames 33 can push the two rotating plates 13 and the moving plate 12 to move up and down synchronously on the top of the placement plate 11. With the up and down adjustment of the moving plate 12 and the two rotating plates 13, the tops of multiple probes can be pressed and reset. This achieves the effect of synchronously testing the mechanical life of the needle sleeves and springs of multiple probes, ensuring that the needle sleeves and springs on the surface of multiple probes can still have good performance after multiple sliding and stretching.

[0038] After testing multiple probes, both rotating plates 13 are positioned above the moving plate 12, limiting and fixing the tops of the probes. Then, the two second sliders 19 are moved to one end within their corresponding second grooves 7 to avoid obstructing the rotation of the placement plate 11. The relevant collection container is then placed between the top of the base 2 and the bottom of the test platform 1. The first motor 5 is then controlled to rotate the placement plate 11 and the moving plate 12 180 degrees together. Subsequently, the two rotating plates 13 are rotated downwards to an inclined state. The probes located in the multiple first placement grooves 15 and second placement grooves 16 fall downwards onto the tops of the two rotating plates 13 and are guided by the inclined rotating plates 13 to fall into the collection container for automatic collection. This achieves the effect of automatically unloading and collecting multiple probes after testing, facilitating the rapid deployment of the device for subsequent multi-probe testing and improving the efficiency of testing large batches of probes.

[0039] The preferred embodiments of the present invention disclosed above are merely illustrative of the invention. These preferred embodiments do not exhaustively describe all details, nor do they limit the invention to the specific implementations described. Clearly, many modifications and variations can be made based on the content of this specification. This specification selects and specifically describes these embodiments to better explain the principles and practical applications of the invention, thereby enabling those skilled in the art to better understand and utilize the invention. The invention is limited only by the claims and their full scope and equivalents.

Claims

1. A high-stability current probe testing device, comprising a test stage (1), characterized in that, The test bench (1) has a rectangular through slot (10) inside. A placement plate (11) for placing the probe to be tested is rotatably installed inside the rectangular through slot (10). Multiple columns (3) are installed on the top of the test bench (1). A movable frame (4) is installed between the multiple columns (3). A first test mechanism for testing the current withstand performance of the probe is provided at the bottom of the movable frame (4) and the bottom of the test bench (1). A second test mechanism for testing the mechanical life of the probe is also provided at the bottom of the movable frame (4). An auxiliary feeding mechanism for quickly placing multiple probes on the placement plate (11) is provided on the top of the test bench (1).

2. The high-stability current probe testing device according to claim 1, characterized in that, A first motor (5) is installed on one side of the outer wall of the test bench (1). The output end of the first motor (5) is connected to the rotating part of one end of the placement plate (11). Multiple telescopic rods (14) are installed inside the placement plate (11). A first spring (17) is installed inside each of the multiple telescopic rods (14). A moving plate (12) is installed at the telescopic end of the multiple telescopic rods (14). A base (2) is installed at the bottom of the test bench (1).

3. The high-stability current probe testing device according to claim 2, characterized in that, The movable plate (12) and the placement plate (11) are respectively provided with a first placement slot (15) and a second placement slot (16) of different sizes. The movable plate (12) has two rotating plates (13) rotatably installed inside.

4. The high-stability current probe testing device according to claim 1, characterized in that, Each of the columns (3) has a first groove (6) on one side of its outer wall. Each of the first grooves (6) has a first slider (18) installed inside it. The ends of the first sliders (18) away from the first grooves (6) are connected to the movable frame (4).

5. The high-stability current probe testing device according to claim 1, characterized in that, The first testing mechanism includes two second slide grooves (7) and a fourth slide groove (25) opened at the bottom of the test table (1) and the bottom of the moving frame (4). The second slide groove (7) and the fourth slide groove (25) are respectively installed inside the two second slide grooves (7) and the fourth slide groove (26). The bottom end of the two second slide grooves (19) is equipped with a moving rod (22). The outer wall of the two moving rods (22) that are close to each other is provided with a fifth slide groove (28). The inside of the two fifth slide grooves (28) is equipped with a fifth slide groove (29). The two fifth slide grooves (29) are connected by a mounting rod (23). The top of the mounting rod (23) is equipped with a plurality of connecting sleeves (24) that are adapted to the probe tip.

6. The high-stability current probe testing device according to claim 5, characterized in that, The bottom ends of the two fourth sliders (26) are jointly mounted with a mounting bracket (27). The mounting bracket (27) has two circular grooves inside, and a second spring (32) is installed inside each of the two circular grooves. The bottom ends of the two second springs (32) are jointly mounted with a mounting plate (20). The bottom end of the mounting plate (20) is equipped with multiple abutment rods (21) that are adapted to the top part of the probe.

7. A high-stability current probe testing device according to claim 6, characterized in that, Two electromagnets (34) are installed at the bottom of the mounting bracket (27). When the two electromagnets (34) are energized, they are magnetically attracted and fixed to the mounting plate (20).

8. A high-stability current probe testing device according to claim 6, characterized in that, The second testing mechanism includes a second motor (30) installed at the bottom of the mounting frame (27). An eccentric wheel (31) is installed at the output end of the second motor (30). The outer wall of the eccentric wheel (31) abuts against the top of the mounting plate (20). Two rotating frames (33) are rotatably installed at the bottom of the mounting plate (20). After the two rotating frames (33) rotate to a vertical state, they can block the bottom of multiple abutment rods (21).

9. A high-stability current probe testing device according to claim 1, characterized in that, The auxiliary feeding mechanism includes a third slide (8) opened on the top of the test bench (1), a third slider (35) is installed inside the third slide (8), a first electric push rod (36) is installed at the top of the third slider (35), a mounting seat (37) is installed at the telescopic end of the first electric push rod (36), a rotating block (38) is rotatably installed inside the mounting seat (37), and a sleeve plate (9) is rotatably installed at the end of the rotating block (38) away from the mounting seat (37).

10. A high-stability current probe testing device according to claim 9, characterized in that, The inner walls of both sides of the sleeve (9) are provided with a plurality of sixth sliding grooves (43), and a sixth slider (44) is installed inside the plurality of sixth sliding grooves (43). The ends of the plurality of sixth sliders (44) away from the sixth sliding grooves (43) are all fitted with clamps (42) through a second electric push rod (45). A cover plate (39) is rotatably installed on the top of the sleeve (9). A pipe (40) is installed on the top of the cover plate (39). A nozzle (41) extending into the cover plate (39) is installed on the outer wall of the pipe (40).

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